Testing device

Abstract

The invention discloses a testing device. The test device comprises: a test cavity, in which a test cavity is arranged, the test cavity being used for accommodating a device to be tested; the radio frequency module is used for outputting a radio frequency signal; the antenna assembly is electrically connected with the radio frequency module, and the antenna assembly is used for feeding the radio frequency signal into the test cavity; and the wave absorbing layer is arranged on the side wall of the test cavity. According to the testing device, the side wall of the testing cavity is provided with the wave absorbing layer, so that radio frequency signals reflected and refracted by the side wall of the testing cavity can be reduced or avoided in the testing process, and the accuracy of a testing result is further improved.

Description

Technical Field

[0001] The present invention relates to the technical field of equipment detection, and in particular to a testing device. Background Art

[0002] When working, electronic devices will be affected by nearby electromagnetic waves. If the electromagnetic interference resistance of the electronic device does not meet the requirements, the electronic device is prone to failure. Therefore, it is necessary to perform electromagnetic interference resistance (EMS) testing on the electronic device. However, during the test process, the accuracy of the test results needs to be guaranteed in order to accurately evaluate the electromagnetic interference resistance of the electronic device. Summary of the invention

[0003] An embodiment of the present invention provides a testing device.

[0004] A testing device according to an embodiment of the present invention comprises:

[0005] A test cavity, wherein a test cavity is provided in the test cavity, and the test cavity is used to accommodate the device to be tested;

[0006] A radio frequency module, wherein the radio frequency module is used to output a radio frequency signal;

[0007] An antenna assembly, the antenna assembly being electrically connected to the radio frequency module, and the antenna assembly being used to feed the radio frequency signal into the test cavity;

[0008] A wave absorbing layer is arranged on a side wall of the test cavity.

[0009] In the above-mentioned test device, the side wall of the test cavity is provided with an absorbing layer, which can reduce or avoid the radio frequency signal reflected or refracted by the side wall of the test cavity during the test process, thereby improving the accuracy of the test result.

[0010] In some embodiments, the side wall of the test cavity includes a first side wall and a second side wall that are opposite to each other, and the absorbing layer is disposed on at least one of the first side wall and the second side wall.

[0011] In some embodiments, the side wall of the test chamber includes a third side wall and a fourth side wall opposite to each other, the third side wall connects the first side wall and the second side wall, and the fourth side wall connects the first side wall and the second side wall;

[0012] The wave absorbing layer is disposed on at least one of the first side wall, the second side wall, the third side wall and the fourth side wall.

[0013] In some embodiments, the side wall of the test chamber includes an opposite fifth side wall and a sixth side wall, the fifth side wall connects the first side wall, the second side wall, the third side wall and the fourth side wall, and the sixth side wall connects the first side wall, the second side wall, the third side wall and the fourth side wall;

[0014] The wave absorbing layer is disposed on at least one of the first side wall, the second side wall, the third side wall, the fourth side wall, the fifth side wall and the sixth side wall.

[0015] In some embodiments, the area of ​​the absorbing layer is equal to the area of ​​the side wall of the test cavity where the absorbing layer is located.

[0016] In some embodiments, the absorbing layer includes a base layer and a plurality of cones, wherein the base layer is disposed on a side wall of the test cavity, and the plurality of cones are disposed on a surface of the base layer away from the side wall of the test cavity.

[0017] In some embodiments, the absorption rate characteristics of the absorbing layer meet the following requirements: the absorption rate of 30MHz to 1GHz is not less than 5dB, and the reflection coefficient of the antenna in the cavity state is not higher than -5dB.

[0018] In some embodiments, the testing device includes an electrical chamber and a heat dissipation assembly, the electrical chamber is located outside the testing cavity, the heat dissipation assembly and the RF module are located in the electrical chamber, and the heat dissipation assembly is used to dissipate heat from the RF module.

[0019] In some embodiments, the heat dissipation assembly includes an air guide and a heat dissipation fan, the air guide covers the RF module, the air guide is provided with an air inlet and an air outlet, and the air inlet is arranged corresponding to the heat dissipation fan.

[0020] In some embodiments, the testing device further includes a power supply module, which is electrically connected to the RF module and the heat dissipation fan, and the power supply module is located above the air guide member and is thermally connected to the air guide member.

[0021] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0023] Figure 1 is an exploded schematic diagram of a testing device according to an embodiment of the present invention;

[0024] Figure 2 is a schematic diagram of the distribution of the side wall of the test cavity of the test device according to the embodiment of the present invention;

[0025] Figure 3 is a schematic diagram of the distribution of the absorbing layer on the side wall of the test cavity according to an embodiment of the present invention;

[0026] Figure 4 Schematic diagram of the structure of the wave absorbing layer according to the embodiment of the present invention.

[0027] Component Symbols:

[0028] Test device 100, test cavity 12, RF module 14, antenna assembly 16, absorbing layer 18, test cavity 20, antenna 22, base 24, control panel 26, door 28, opening 30, first side wall 32, second side wall 34, third side wall 36, fourth side wall 38, fifth side wall 40, sixth side wall 42, base layer 44, cone 46, electrical room 48, heat dissipation assembly 50, air guide 52, heat dissipation fan 54, air inlet 56, air outlet 58, air inlet end 60, air outlet end 62, power supply module 64. DETAILED DESCRIPTION

[0029] The embodiments of the present invention are described in detail below, and the embodiments of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0030] In the description of the embodiments of the present invention, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0031] In the description of the embodiments of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, an electrical connection, or can communicate with each other; it can be directly connected, or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present invention can be understood according to specific circumstances.

[0032] The disclosure below provides many different embodiments or examples for realizing different structures of embodiments of the present invention. In order to simplify the disclosure of embodiments of the present invention, the components and settings of specific examples are described below. Of course, they are merely examples, and the purpose is not to limit the present invention. In addition, embodiments of the present invention may repeat reference numbers and / or reference letters in different examples, and such repetition is for the purpose of simplification and clarity, and does not itself indicate the relationship between the various embodiments and / or settings discussed. In addition, embodiments of the present invention provide examples of various specific processes and materials, but those of ordinary skill in the art may appreciate the application of other processes and / or the use of other materials.

[0033] See also Figures 1 to 3 A test device 100 according to an embodiment of the present invention includes a test cavity 12, a radio frequency module 14, an antenna assembly 16 and an absorbing layer 18. A test cavity 20 is provided in the test cavity 12, and the test cavity 20 is used to accommodate the device to be tested. The radio frequency module 14 is used to output radio frequency signals. The antenna assembly 16 is electrically connected to the radio frequency module 14, and the antenna assembly 16 is used to feed the radio frequency signal into the test cavity 20. The absorbing layer 18 is provided on the side wall of the test cavity 20.

[0034] In the above-mentioned testing device 100 , the side wall of the testing cavity 20 is provided with an absorbing layer 18 , which can reduce or avoid the RF signal reflected or refracted by the side wall of the testing cavity 20 during the testing process, thereby improving the accuracy of the testing result.

[0035] Specifically, in Figure 1 In the figure, the test cavity 12 is in the shape of a rectangular parallelepiped, and the test cavity 20 is also in the shape of a rectangular parallelepiped, and the device to be tested can be accommodated in the test cavity 20. The RF signal output by the RF module 14 can form electromagnetic radiation, and the antenna assembly 16 feeds the RF signal into the test cavity 20 to form an electromagnetic interference environment in the test cavity 20 to test the electromagnetic susceptibility (EMS) of the device to be tested. It can be understood that the shapes of the test cavity 12 and the test cavity 20 are not limited to rectangular parallelepiped, and can also be other regular or irregular shapes, which are not specifically limited here.

[0036] Optionally, the test cavity 12 is made of a material having the ability to shield radio frequency signals, such as a metal cavity. Further, the test cavity 12 may include a plastic body and a metal layer covering the surface of the body to reduce manufacturing costs and reduce weight.

[0037] In one embodiment, the device to be tested may include but is not limited to a control board, a display screen, a chip, a circuit board or an electronic device, which is not specifically limited herein.

[0038] In one example, the size of the test cavity 12 of the embodiment of the present invention is within 3 meters * 3 meters * 3 meters (length * width * height). The reflection and refraction of electromagnetic waves in a closed small cavity will deteriorate the test results. Therefore, an absorbing layer 18 can be set on the side wall of the test cavity 20 to enhance the absorption of electromagnetic waves, which is equivalent to a far-field effect. The test cavity 20 can form a microwave darkroom.

[0039] The absorbing layer 18 may be made of absorbing materials, including but not limited to ferrite, foam, etc., which are not specifically limited here.

[0040] In one embodiment, the radio frequency signal includes but is not limited to a radio frequency signal in the microwave frequency band. The radio frequency module 14 may include a signal generating circuit, an incident power detection circuit, and a reflected power detection circuit. The signal generating circuit may include components such as a crystal oscillator, an amplifier, a circulator, and a phase shifter. The incident power detection circuit is used to detect the power of the radio frequency signal incident into the test cavity 20. The radio frequency module 14 may adjust the radio frequency signal output by the signal generating circuit according to the data fed back by the incident power detection circuit, so that the power of the radio frequency signal incident into the test cavity 20 is close to the target power (set power) or equal to the target power.

[0041] The reflected power detection circuit is used to detect the power of the RF signal reflected by the test cavity 20. The RF module 14 can determine the energy of the RF signal absorbed by the device under test based on the data fed back by the incident power detection circuit and the reflected power detection circuit.

[0042] Please refer to Figure 1 The antenna assembly 16 may include an antenna 22 and a base 24, the base 24 being mounted on a side plate (such as a top plate) of the test cavity 12, and the antenna 22 being mounted on the base 24. Optionally, the antenna 22 may extend into the test cavity 20 in whole or in part. The antenna 22 may be an array antenna 22 or other types of antennas 22, which are not specifically limited herein. The number of antennas 22 may be one, two, or more than two, which are not specifically limited herein. Optionally, the antenna 22 is a broadband antenna 22.

[0043] exist Figure 1 In the embodiment, the test device 100 further includes a control panel 26 mounted on the test cavity 12, and the control panel 26 is electrically connected to the RF module 14. The control panel 26 may include operating components such as buttons and a touch screen, and an operator may set parameters of the RF signal through the operating components, such as the frequency, phase, power, etc. of the RF signal, so as to generate a variety of RF signals within a certain frequency band, and to simulate complex electromagnetic interference scenarios of the device under test in an actual environment.

[0044] The test device 100 further includes a door body 28. An opening 30 is provided on one side of the test chamber 20. The door body 28 is rotatably mounted at the opening 30 to open or close the opening 30. When the door body 28 opens the opening 30, an operator can take and place the device to be tested. When the door body 28 is closed, testing can be performed. The door body 28 is used to prevent the radio frequency signal from leaking from the test chamber 20 to the outside of the test chamber 12, thereby improving the safety of the test process. The side wall of the test chamber 20 may include a side wall where the door body 28 is located.

[0045] The RF module 14 generates a corresponding RF signal according to the set RF signal parameters, and the antenna assembly 16 feeds the RF signal into the test cavity 20 to generate electromagnetic interference to the device under test.

[0046] The testing device 100 may also include a detection module. During the test, the detection module determines whether the working state of the device under test is normal or abnormal by collecting information of the device under test. Specifically, the detection module can make a judgment by collecting at least one of an image of the device under test, a sound emitted by the device under test, and a temperature of the device under test. For example, the detection module can collect an image of the device under test through a camera, and identify whether the device under test has abnormal phenomena such as a flickering screen, a flowery screen, or a black screen through image recognition technology. The detection module can collect the sound emitted by the device under test through a sound sensor to determine whether the device under test has abnormal phenomena such as component cracking. The detection module can collect the temperature of the device under test through a temperature sensor to determine whether the device under test has an abnormal phenomenon of over-temperature.

[0047] exist Figure 2 In the embodiment, the test cavity 20 is in a rectangular parallelepiped shape, and the side walls of the test cavity 20 include a first side wall 32, a second side wall 34, a third side wall 36, a fourth side wall 38, a fifth side wall 40, and a sixth side wall 42. The first side wall 32 is opposite to the second side wall 34, the third side wall 36 is opposite to the fourth side wall 38, and the fifth side wall 40 is opposite to the sixth side wall 42. The third side wall 36 connects the first side wall 32 and the second side wall 34, the fourth side wall 38 connects the first side wall 32 and the second side wall 34, the fifth side wall 40 connects the first side wall 32, the second side wall 34, the third side wall 36, and the fourth side wall 38, and the sixth side wall 42 connects the first side wall 32, the second side wall 34, the third side wall 36, and the fourth side wall 38. The absorbing layer 18 may be provided on at least one of the first side wall 32, the second side wall 34, the third side wall 36, the fourth side wall 38, the fifth side wall 40, and the sixth side wall 42.

[0048] Specifically, the wave absorbing layer 18 may be disposed on one of the first side wall 32, the second side wall 34, the third side wall 36, the fourth side wall 38, the fifth side wall 40, and the sixth side wall 42. The wave absorbing layer 18 may also be disposed on two, three, four, five, or six of the first side wall 32, the second side wall 34, the third side wall 36, the fourth side wall 38, the fifth side wall 40, and the sixth side wall 42. Figure 3 In the embodiment, the wave absorbing layer 18 is disposed on the first side wall 32 , the second side wall 34 , the third side wall 36 and the fourth side wall 38 .

[0049] exist Figure 2 In the embodiment, the first side wall 32 is the upper side wall of the test cavity 20, the second side wall 34 is the lower side wall of the test cavity 20, the third side wall 36 is the left side wall of the test cavity 20, the fourth side wall 38 is the right side wall of the test cavity 20, the fifth side wall 40 is the front side wall of the test cavity 20, and the sixth side wall 42 is the rear side wall of the test cavity 20. It can be understood that in other embodiments, the first side wall 32, the second side wall 34, the third side wall 36, the fourth side wall 38, the fifth side wall 40 and the sixth side wall 42 can also be side walls in other directions of the test cavity 20, and are not limited to being upper, lower, left, right, front and back side walls respectively, wherein the first side wall 32 and the second side wall 34 are opposite side walls, such as upper and lower side walls, left and right side walls or front and back side walls. The third side wall 36 and the fourth side wall 38 are opposite side walls, such as upper and lower side walls, left and right side walls or front and back side walls. The fifth side wall 40 and the sixth side wall 42 are opposite side walls, such as upper and lower side walls, left and right side walls or front and back side walls.

[0050] In other embodiments, the absorbing layer 18 is disposed on at least one of the first side wall 32 and the second side wall 34 .

[0051] In other embodiments, the absorbing layer 18 is disposed on at least one of the first side wall 32 , the second side wall 34 , the third side wall 36 , and the fourth side wall 38 .

[0052] In some embodiments, the area of ​​the absorbing layer 18 is equal to the area of ​​the side wall of the test cavity 20 where the absorbing layer 18 is located.

[0053] In this way, the absorption of radio frequency signals (electromagnetic waves) can be enhanced.

[0054] Specifically, the area of ​​the absorbing layer 18 is equal to the area of ​​the side wall of the test cavity 20 where the absorbing layer 18 is located, so that the absorbing layer 18 can basically fully cover the side wall of the test cavity 20, which can minimize the reflection and refraction of electromagnetic waves on the side wall of the test cavity 20 where the absorbing layer 18 is provided.

[0055] In one embodiment, the absorbing layer 18 is disposed on the first side wall 32 , the area of ​​the absorbing layer 18 is equal to the area of ​​the first side wall 32 , and the absorbing layer 18 substantially fully covers the first side wall 32 .

[0056] In one embodiment, the absorbing layer 18 is disposed on the third side wall 36 and the fifth side wall 40 , and the area of ​​the absorbing layer 18 is equal to the area of ​​the third side wall 36 and the area of ​​the fifth side wall 40 . The absorbing layer 18 substantially completely covers the third side wall 36 and the fifth side wall 40 .

[0057] In certain embodiments, see Figure 4 The absorbing layer 18 includes a base layer 44 and a plurality of cones 46 . The base layer 44 is disposed on the side wall of the test cavity 20 , and the plurality of cones 46 are disposed on a surface of the base layer 44 away from the side wall of the test cavity 20 .

[0058] In this way, the electromagnetic wave absorption effect is good.

[0059] Specifically, the absorbing layer 18 may be made of a foam material (such as polyurethane). In one embodiment, the base layer 44 may be fixed to the side wall of the test cavity 20 by adhesive.

[0060] The plurality of cones 46 may be arranged in an M*N array on the surface of the base layer 44 away from the side wall of the test cavity 20. The cones 46 may be in the shape of a cone, a triangular pyramid, a quadrangular pyramid, a pentagonal pyramid, etc., which are not specifically limited here.

[0061] When a radio frequency signal is incident on the multiple cones 46 , a portion of the radio frequency signal is absorbed by the cones 46 , and another portion of the radio frequency signal is reflected and consumed between the multiple cones 46 . The multiple cones 46 have a good absorption effect on electromagnetic waves.

[0062] In some embodiments, the absorption rate characteristics of the absorbing layer 18 meet the following requirements: the absorption rate at 30 MHz to 1 GHz is not less than 5 dB, and the reflection coefficient of the antenna 22 in the cavity state is not higher than -5 dB.

[0063] In this way, the absorption rate characteristics of the absorbing layer 18 meet the test requirements.

[0064] Specifically, in one embodiment, the test frequency band for the device to be tested is 30MHz to 1GHz, and multiple frequency points can be selected within the test frequency band for testing. After selecting a frequency point, the power and phase corresponding to the frequency point are set, and the RF module 14 can output the RF signal according to the set frequency, power, and phase.

[0065] The empty state refers to a state when no device to be tested is placed in the test cavity 20. In the empty state, the antenna 22 receives the radio frequency signal reflected in the test cavity 20, which is basically the radio frequency signal reflected by the side wall of the test cavity 20.

[0066] The absorption rate characteristics of the absorbing layer 18 meet the requirements: the absorption rate of 30MHz~1GHz is not less than 5dB, and the reflection coefficient of the antenna 22 in the cavity state is not higher than -5dB, so that in the test frequency band of 30MHz~1GHz, the absorption effect of electromagnetic waves meets the design requirements, ensuring the accuracy of the test results.

[0067] In some embodiments, the testing device 100 includes an electrical chamber 48 and a heat dissipation assembly 50 . The electrical chamber 48 is located outside the testing cavity 20 . The heat dissipation assembly 50 and the RF module 14 are located inside the electrical chamber 48 . The heat dissipation assembly 50 is used to dissipate heat for the RF module 14 .

[0068] In this way, it is possible to avoid the temperature of the RF module 14 increasing and thus reducing the accuracy of the RF module 14 in adjusting the RF signal.

[0069] Specifically, the RF module 14 needs to output RF signals when it is working, and its temperature rises quickly. When the temperature of the RF module 14 is high, the internal components of the RF module 14 are affected by the high temperature, and the accuracy of regulating the RF signal will be reduced. By setting the heat dissipation component 50, when the RF module 14 is working, the heat dissipation component 50 can be started to dissipate heat for the RF module 14, thereby ensuring the accuracy of regulating the RF signal by the RF module 14. At the same time, it can also prevent the components of the RF module 14 from aging too quickly due to excessive temperature, thereby reducing its failure rate and extending the service life of the RF module 14.

[0070] In one embodiment, the heat dissipation component 50 can use liquid cooling to dissipate heat from the RF module 14. In one embodiment, the heat dissipation component 50 can use air cooling to dissipate heat from the RF module 14. In one embodiment, the heat dissipation component 50 can use liquid cooling and air cooling to dissipate heat from the RF module 14.

[0071] The antenna assembly 16 may also be at least partially disposed in the electrical chamber 48, and the heat dissipation assembly 50 may also dissipate heat for the antenna assembly 16. It is understood that the heat dissipation assembly 50 may dissipate heat for other components in the electrical chamber 48 in addition to dissipating heat for the RF module 14 and the antenna assembly 16.

[0072] In some embodiments, the heat dissipation assembly 50 includes an air guide 52 and a heat dissipation fan 54 . The air guide 52 covers the RF module 14 . The air guide 52 is provided with an air inlet 56 and an air outlet 58 . The air inlet 56 is provided corresponding to the heat dissipation fan 54 .

[0073] In this way, the heat dissipation component 50 can dissipate heat from the RF module 14 by air cooling.

[0074] Specifically, the heat dissipation fan 54 can provide wind when working. The wind blown by the heat dissipation fan 54 enters the interior of the air guide 52, and can take away the heat of the RF module 14 to cool it down. The air inlet 56 of the air guide 52 is correspondingly arranged with the heat dissipation fan 54 so that the heat dissipation fan 54 can send the generated wind into the air guide 52. After the wind takes away the heat of the RF module 14, it can be discharged from the air outlet 58 of the air guide 52, thereby reducing the temperature of the RF module 14 and the electrical room 48.

[0075] exist Figure 1 In the figure, the air guide 52 includes an air inlet end 60 and an air outlet end 62. The air inlet end 60 is provided with an air inlet 56, and the air outlet end 62 is provided with an air outlet 58. The area of ​​the air inlet 56 is larger than the area of ​​the air outlet 58. Along the direction from the air inlet end 60 to the air outlet end 62, the internal flow channel of the air guide 52 is in a gradually contracting shape, so that the wind can be accelerated in the air guide 52, so as to speed up the removal of the heat of the RF module 14 and improve the heat dissipation efficiency.

[0076] In some embodiments, the testing device 100 further includes a power supply module 64 , which is electrically connected to the RF module 14 and the heat dissipation fan 54 . The power supply module 64 is located above the air guide 52 and is thermally connected to the air guide 52 .

[0077] In this way, the power supply module 64 can be cooled to ensure that the power supply module 64 operates within a normal temperature range.

[0078] Specifically, the power supply module 64 can be connected to the air guide member 52 via thermal conductive adhesive. The power supply module 64 can transfer heat to the air guide member 52 via the thermal conductive adhesive. The heat is dissipated from the surface of the air guide member 52 and the wind in the internal flow channel of the air guide member 52 is used to take the heat away, thereby improving the heat dissipation efficiency of the power supply module 64.

[0079] The power supply module 64 is electrically connected to various components and parts of the test device 100, including but not limited to the RF module 14, the control panel 26, the heat dissipation component 50, etc. A socket is also provided in the test cavity 20, and the power supply module 64 can also be electrically connected to the socket in the test cavity 20. The power supply plug of the device under test can be inserted into the socket, so that the power supply module 64 provides the device under test with the power required for operation (DC and / or AC), so that the device under test can work, thereby testing the anti-electromagnetic interference capability of the device under test.

[0080] In summary, in the related art, the floor area of ​​a conventional microwave darkroom ranges from 3 meters * 3 meters to 10 meters * 10 meters. The cavity is too large, the floor area is too large, and it cannot be moved. The cost is expensive. Not all users have the conditions to build the required microwave darkroom, and the microwave darkroom cannot be popularized. The test device 100 of the embodiment of the present invention can form a micro darkroom, which is easy to move and cheap, equivalent to the price of general laboratory instruments, and the floor area can be controlled within 3 meters * 3 meters. The test device 100 of the embodiment of the present invention can achieve a test effect equivalent to or close to that of a conventional microwave darkroom. Moreover, the test device 100 of the present invention is cheaper, easy to move, and suitable for large-scale equipment of test personnel, and even one can be done for each person. An absorbing layer 18 is provided on the side wall of the test cavity 20, and the absorbing characteristics of the absorbing layer 18 are used to eliminate the reflection and refraction effect, so that the near-field test of the antenna 22 is equivalent to the far-field or open test effect, ensuring the accuracy of the test results.

[0081] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples" or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0082] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A testing device, characterized in that: include: A test cavity, wherein a test cavity is provided in the test cavity, and the test cavity is used to accommodate the device to be tested; A radio frequency module, wherein the radio frequency module is used to output a radio frequency signal; An antenna assembly, the antenna assembly being electrically connected to the radio frequency module, and the antenna assembly being used to feed the radio frequency signal into the test cavity; A wave absorbing layer is arranged on a side wall of the test cavity.

2. The testing device according to claim 1, characterized in that: The side wall of the test cavity includes a first side wall and a second side wall that are opposite to each other, and the wave absorbing layer is disposed on at least one of the first side wall and the second side wall.

3. The testing device according to claim 2, characterized in that: The side wall of the test cavity comprises a third side wall and a fourth side wall opposite to each other, the third side wall connects the first side wall and the second side wall, and the fourth side wall connects the first side wall and the second side wall; The wave absorbing layer is disposed on at least one of the first side wall, the second side wall, the third side wall and the fourth side wall.

4. The testing device according to claim 3, characterized in that: The side wall of the test cavity comprises a fifth side wall and a sixth side wall opposite to each other, the fifth side wall connects the first side wall, the second side wall, the third side wall and the fourth side wall, and the sixth side wall connects the first side wall, the second side wall, the third side wall and the fourth side wall; The wave absorbing layer is disposed on at least one of the first side wall, the second side wall, the third side wall, the fourth side wall, the fifth side wall and the sixth side wall.

5. The testing device according to claim 1, characterized in that: The area of ​​the wave absorbing layer is equal to the area of ​​the side wall of the test cavity where the wave absorbing layer is located.

6. The testing device according to claim 1, characterized in that: The wave absorbing layer comprises a base layer and a plurality of cones, wherein the base layer is arranged on the side wall of the test cavity, and the plurality of cones are arranged on a surface of the base layer away from the side wall of the test cavity.

7. The testing device according to claim 1, characterized in that: The absorption rate characteristics of the absorbing layer meet the following requirements: the absorption rate of 30MHz to 1GHz is not less than 5dB, and the reflection coefficient of the antenna in the cavity state is not higher than -5dB.

8. The testing device according to claim 1, characterized in that: The testing device comprises an electrical room and a heat dissipation assembly, wherein the electrical room is located outside the testing cavity, the heat dissipation assembly and the radio frequency module are located in the electrical room, and the heat dissipation assembly is used for dissipating heat for the radio frequency module.

9. The testing device according to claim 8, characterized in that: The heat dissipation component includes an air guide and a heat dissipation fan. The air guide covers the radio frequency module. The air guide is provided with an air inlet and an air outlet. The air inlet is arranged corresponding to the heat dissipation fan.

10. The testing device according to claim 9, characterized in that: The testing device also includes a power supply module, which is electrically connected to the radio frequency module and the heat dissipation fan. The power supply module is located above the air guide and is thermally connected to the air guide.

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