Method for calibrating inertial navigation and optical axis zero position in optoelectronic platform

Abstract

The present invention relates to the field of inertial measurement technology, and in particular to a method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform, comprising the following steps: S1. Mounting the heading direction of the inertial navigation system perpendicularly to a mounting surface. S2. Calibration of the three axes of the inertial navigation system. S3. Attaching a first reflector to the mounting surface. S4. Placing a theodolite in front of the first reflector so that the outgoing light of the theodolite coincides with the reflected light. S5. Attaching a second reflector to the inertial navigation mounting surface of the optoelectronic platform. S6. The second reflector can be perpendicular to the optical axis of the theodolite. S7. The imaging center of the optical system is aligned with the outgoing light of the theodolite. S8. Installing the inertial navigation system inside the optoelectronic platform, keeping it consistent with the position and direction when calibrated on the inertial navigation zero position tooling. The advantage of the present invention is that, by adding a boss and its mounting surface to the hexahedral tooling, the axial direction determined by the inertial navigation system during calibration is associated with the optical system of the optoelectronic platform through the reflection effect of the reflector, thereby completing the calibration.

Description

Technical Field

[0001] The present invention relates to the field of inertial measurement technology, and in particular to a method for calibrating an inertial guide and an optical axis zero position in a photoelectric platform. Background Art

[0002] In the field of high-precision aerial remote sensing mapping and reconnaissance, installing inertial navigation inside the optoelectronic platform can effectively avoid the transmission error between the shock absorber deformation and the aircraft inertial navigation, provide higher-precision navigation information for the optical system, and effectively improve the observation accuracy of the optical imaging system.

[0003] Currently, in actual use, inertial navigation can output navigation information after alignment is completed. However, to maintain a high-precision output, it is necessary to enter the combined navigation state. The inertial navigation carrier needs to be in motion and generate linear motion to change the position. Then, based on the satellite navigation information, the accumulated error of the pure inertial solution is eliminated. Otherwise, it is easy to drift after a period of time and deviate from the true value, especially the heading angle drift is more serious. The calibration of the optical system usually needs to be completed in the laboratory using high-precision optical detection equipment, and a high level of static conditions must be maintained. On the other hand, the data output by the inertial navigation are all abstract and conceptual regulations. For example, the attitude angle is the angle relative to the horizontal plane, and the heading angle is the angle between the forward axis of the inertial navigation and the north direction in the geographic coordinates. The measurement of true north is more abstract and cumbersome, and it is difficult to directly connect it with the optical system.

[0004] Therefore, in actual use, if the inertial navigation output information is directly used to calibrate the optical system, the effect of improving the measurement accuracy in actual use will be limited; and the calibration and alignment of the inertial navigation and optical system belongs to the category of cross-industry fields, there is little related research, and the theoretical feasibility is not high. Summary of the Invention

[0005] In light of this, the present invention aims to provide a method for calibrating the zero position of the inertial navigation system and the optical axis within an optoelectronic platform. This method uses an inertial navigation zero position calibration tool, combined with a reflector and an autocollimation theodolite, to materialize the geometric relationship. Furthermore, the mounting surface within the optoelectronic platform is utilized to achieve the zero position calibration of the inertial navigation system and the optical axis.

[0006] To achieve the above objectives, the technical solution created by the present invention is implemented as follows: a method for calibrating the zero position of the inertial navigation system and the optical axis in an optoelectronic platform, based on an inertial navigation zero position calibration tool, which associates the inertial navigation system with the optical system. The inertial navigation zero position calibration tool includes: a hexahedron tool and a boss, the boss is arranged on the hexahedron tool, and the side of the boss facing the heading of the inertial navigation system serves as the mounting surface. The method for calibrating the zero position of the inertial navigation system and the optical axis in the optoelectronic platform includes the following steps:

[0007] S1. Align the heading direction of the inertial navigation system vertically with the mounting surface of the boss, ensure that the mounting surface of the inertial navigation system fits the mounting surface of the boss, and fasten the inertial navigation system to the inertial navigation zero position calibration fixture.

[0008] S2. Use the inertial navigation zero-position calibration tool to calibrate the pitch, yaw, and roll axes of the inertial navigation.

[0009] S3. Remove the inertial navigation system and attach the first reflector to the mounting surface of the boss.

[0010] S4. Place a theodolite at a preset position in front of the first reflector, ensuring that the optical axis of the theodolite is perpendicular to the mirror surface of the first reflector; adjust the theodolite so that the outgoing light of the theodolite coincides with the reflected light.

[0011] S5. Place the optoelectronic platform between the first reflector and the theodolite, and attach the second reflector to the inertial navigation mounting surface of the optoelectronic platform.

[0012] S6. Adjust the axis system of the optoelectronic platform so that the second reflector is perpendicular to the optical axis of the theodolite. At this time, the forward axis of the inertial navigation system during the calibration phase is in the direction of the optical axis.

[0013] S7. Ensure that the base of the optoelectronic platform remains stationary. Rotate the optoelectronic platform's axis system so that the imaging center of the optoelectronic platform's optical system is aligned with the output light of the theodolite, completing the alignment of the optical axis of the optical system with the optical axis of the theodolite. At this point, set the angle of the optoelectronic platform to zero, thereby completing the zero-position alignment and calibration of the optical system and the inertial navigation system.

[0014] S8. Install the inertial navigation system inside the optoelectronic platform so that the inertial navigation system fits against the inertial navigation system mounting surface of the optoelectronic platform to ensure that the installation position and direction of the inertial navigation system on the optoelectronic platform are consistent with the position and direction of the inertial navigation system calibrated in step S2.

[0015] Furthermore, the height of the boss is greater than or equal to a first preset height.

[0016] Furthermore, the first preset height is 5 mm.

[0017] Furthermore, the perpendicularity between the mounting surface of the boss and the surface on which the inertial navigation calibration zero position tooling is mounted on the boss is smaller than a first preset angle.

[0018] Furthermore, the first preset angle is 30″.

[0019] Furthermore, the parallelism between the mounting surface of the boss and a surface in the inertial navigation calibration zero position tooling that is parallel to the mounting surface is less than a first preset value.

[0020] Furthermore, the first preset value is 0.015 mm.

[0021] Furthermore, the optoelectronic platform is an optoelectronic stabilized platform, an optoelectronic pod, an optoelectronic turret, or a gimbal.

[0022] Furthermore, the theodolite includes an emitting light tube and a lens tube for observing incident light.

[0023] Compared to existing technologies, this invention achieves the following beneficial effects: by adding a boss and its mounting surface to the hexahedral tooling, the axial direction determined by the inertial navigation system during calibration is concretely represented by a mechanical mounting surface, thus making the previously artificially defined abstract concept visible to the naked eye. While the optical system will also have installation errors when installed inside the spacecraft, the reflective effect of the reflector allows it to be associated with the optical system of the optoelectronic platform, thus completing the calibration. This method is simple to operate and easy to implement. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] The accompanying drawings, which constitute part of the present invention, are intended to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are intended to explain the present invention and do not constitute an undue limitation of the present invention. In the accompanying drawings:

[0025] Figure 1 2. It is a structural diagram of the installation of an inertial navigation system and an inertial navigation system calibration zero position tooling provided in an embodiment of the present invention;

[0026] Figure 2 2 is a schematic structural diagram of the installation of a reflector and an inertial navigation calibration zero position tooling according to an embodiment of the present invention;

[0027] Figure 3 2 is a schematic structural diagram of an autocollimation theodolite provided by an embodiment of the present invention and a mirror surface of a reflector being perpendicular to the latter;

[0028] Figure 4 2 is a schematic structural diagram of an optical system of an optoelectronic stabilization platform provided according to an embodiment of the present invention being aligned with an autocollimation theodolite.

[0029] The reference numerals include: 1. hexahedral tooling; 2. boss; 3. mounting surface; 4. inertial navigation; 5. first reflector; 6. autocollimation theodolite; 7. optoelectronic platform; 8. optical system. DETAILED DESCRIPTION

[0030] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and do not constitute a limitation of the present invention.

[0031] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0032] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second" and the like are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, features defined as "first", "second" and the like may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0033] In the description of the present invention, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to internal connections between two components. Those skilled in the art can understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0034] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments.

[0035] An embodiment of the present invention provides a method for calibrating an inertial navigation system (INS) and an optical axis zero position within an optoelectronic platform. Inertial navigation system (INS) calibration is completed using an INS calibration zero position tool. The INS mounting surface within the optoelectronic platform (7) is utilized to associate the calibrated INS zero position (INS) with the optical system (8) of the optoelectronic platform (7) via a first reflector (5), a second reflector (5), and an autocollimation theodolite (6). This allows for calibration of the INS zero position (INS) and the optical axis zero position.

[0036] like Figure 1 As shown, the inertial navigation calibration zero position fixture includes: a hexahedron fixture 1 and a boss 2, and the boss 2 is arranged on the hexahedron fixture 1. The hexahedron fixture 1 and the boss 2 are formed in one piece.

[0037] When calibrating the inertial navigation system 4, the inertial navigation system 4 is placed on the hexahedron fixture 1 and adjusted according to the heading of the inertial navigation system 4 so that the boss 2 is perpendicular to the heading of the inertial navigation system 4. Figure 1The arrow on the upper surface of the inertial navigation system 4 indicates the heading of the inertial navigation system 4. The side of the boss 2 facing the heading of the inertial navigation system 4 serves as the mounting surface 3. The height of the boss 2 is greater than or equal to a first predetermined height. The perpendicularity between the mounting surface 3 of the boss 2 and the surface of the inertial navigation system zero position calibration fixture used to mount the boss 2 is less than a first predetermined angle. The parallelism error between the mounting surface 3 of the boss 2 and the surface of the inertial navigation system zero position calibration fixture parallel to the mounting surface 3 is less than a first predetermined value.

[0038] During the production of high-precision inertial navigation units, calibration is primarily performed for measurement accuracy, temperature drift, and axis orthogonality. Axis orthogonality calibration primarily involves attaching the unit to a rigid hexahedron fixture 1, whose six faces are all highly flat and orthogonal to each other. Rotating on a rotating table, the angle between the plane perpendicular to the inertial navigation unit's current rotation axis and the horizontal plane is measured. Correction is then made to ensure that the corresponding rotation plane is horizontal. The internal gyroscope in that direction uses this plane as a reference when sensing rotation.

[0039] Since the inertial navigation system 4 and the hexahedral fixture 1 are installed in two-dimensional surface contact during the calibration process, only two directions of relative movement between the inertial navigation system 4 and the calibration fixture can be limited. For the inertial navigation system 4 with a three-axis gyroscope inside, there is still a lack of limitation in the third dimension, that is, the inertial navigation system 4 can have a certain degree of horizontal rotation relative to the calibration fixture during the process of being installed on the calibration fixture. Even if corrections are made during the calibration process, after the calibration is completed, during the actual use process of being installed inside the optoelectronic platform 7, installation errors due to rotation within the contact surface are still likely to occur, resulting in poor accuracy in subsequent use.

[0040] Although a mounting support surface 3 can be designed on the inertial navigation system 4 during production, if the calibration fixture still uses a traditional fixture, even if the fixture is mounted on a calibration turntable or platform with a support surface, the support surface will not be effective. The parallelism between the axis of the inertial navigation system 4 and the fixture in that direction cannot be guaranteed. Since the calibration process essentially corrects the axis of the fixture, orthogonality errors still exist in the inertial navigation system 4. Furthermore, the inertial navigation system 4 (including calibration) and the optical system 8 are typically installed independently. After the optical system 8 and the inertial navigation system 4 are installed together within the optoelectronic platform 7, the installation position, mounting reference surface, and installation method of the optical system 8 differ from those of the inertial navigation system 4. This can also lead to installation errors between the optical system 8 and the inertial navigation system 4. Eliminating these installation errors is particularly difficult, especially the error between the heading zero position of the inertial navigation system 4 (i.e., the direction of the forward axis of the inertial navigation system 4) and the azimuth zero position of the optical axis.

[0041] In order to solve the above problems, the present invention provides a method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform.

[0042] The present invention defines the direction in which the X-axis extends as the forward axis of the inertial navigation system 4. Since the clockwise angle between the inertial navigation system 4 and true north in the horizontal plane is the heading angle, the forward axis is also called the heading axis. The method for calibrating the zero position of the inertial navigation system 4 and the optical axis in the optoelectronic platform 7 includes the following steps:

[0043] S1. Align the heading direction of the inertial navigation system 4 vertically with the mounting surface 3 of the boss 2, ensure that the mounting surface of the inertial navigation system 4 fits the mounting surface 3 of the boss 2, and fasten the inertial navigation system 4 to the inertial navigation zero position calibration fixture. Figure 1 shown.

[0044] INS-4 is the abbreviation of Inertial Navigation System, an autonomous navigation system that does not rely on external information and does not radiate energy to the outside.

[0045] Inertial navigation system 4 can also be an inertial measurement unit. The working principle includes a combination of micro-electromechanical system (MEMS), fiber optic or laser gyroscope and accelerometer. The circuit that realizes the solution function can be separated from the inertial measurement unit, that is, inertial navigation system 4 can also be the measurement part of the split inertial navigation system.

[0046] Inertial navigation system 4 includes three gyros and three accelerometers: a heading gyro, a pitch gyro, and a roll gyro, along with corresponding heading accelerometers, pitch accelerometers, and roll accelerometers. The planes measured by the heading gyro, pitch gyro, and roll gyro are orthogonal to each other, and the accelerometers in the three directions are also orthogonal to each other.

[0047] S2. Using the inertial navigation zero calibration fixture, calibrate the pitch, yaw, and roll axes of Inertial Navigation System 4. After calibration, each axis (pitch, yaw, and roll) of Inertial Navigation System 4 (INS 4) achieves high-precision perpendicularity and parallelism with the inertial navigation zero calibration fixture. Furthermore, the pitch and roll angles of INS 4 are both horizontal, ensuring calibration accuracy.

[0048] The calibration steps are as follows:

[0049] S21. Obtain the gyro angular rate along each of the three orthogonal axes of the inertial navigation calibration zero position fixture when the inertial navigation system 4 rotates along them. To obtain the gyro angular rate along each of the three orthogonal axes (pitch, yaw, and roll) of the inertial navigation calibration zero position fixture, directly collect the gyro output data and average the data along each axis.

[0050] S22. Based on the gyro angular rate and environmental parameters, calculate the coupling error coefficient and scale factor of the gyro on each axis to calculate the orthogonality error, where the environmental parameters include the earth's rotation angular rate and the geographic latitude in the current calibration environment.

[0051] S23. Obtain the position measurement values ​​of the gyro outputs and the accelerometer outputs on each axis corresponding to the inertial navigation system 4 at the preset rotation position of the inertial navigation calibration zero position fixture.

[0052] Rotation refers to the process of flipping a regular hexahedron during position calibration, so that the three orthogonal axes of the inertial navigation system (INS) are oriented differently on the platform. Preset rotation refers to presetting the position of the flipped hexahedron. Position measurement refers to the output values ​​of the gyroscope and accelerometer on each axis after the hexahedron is placed on the platform and allowed to rest.

[0053] S24. Based on the angular velocity measurements from the gyro output, combined with the known coupling error coefficient (used to describe the mutual influence between different axes) and the scale factor (used to convert the gyro output signal to the actual angular velocity value), and taking into account other factors that may affect the zero deviation (such as temperature and vibration), the zero deviation of the gyroscope along each axis is calculated.

[0054] S25. Calculate the coupling error coefficient, scale factor, and zero deviation of the accelerometer along each axis based on the position measurement value output by the accelerometer.

[0055] S3. Remove the inertial navigation system 4 and fit the first reflector 5 tightly onto the mounting surface 3 of the boss 2. Figure 2 shown.

[0056] S4. Place an autocollimation theodolite 6 at a preset position in front of the first reflector 5, ensuring that the autocollimation theodolite 6 is perpendicular to the mirror surface of the first reflector 5. Adjust the autocollimation theodolite 6 so that the emitted light from the autocollimation theodolite 6 coincides with the reflected light (i.e., adjust the autocollimation theodolite 6 so that the light it emits returns along the original path after passing through the first reflector 5). This step ensures that the forward axis of the inertial navigation system 4 during the calibration phase is consistent with the optical axis of the autocollimation theodolite 6. Figure 3 shown.

[0057] In this embodiment, the autocollimation theodolite 6 is placed at a preset position in front of the first reflector 5 . In other embodiments, a light pipe may also be placed at the preset position in front of the first reflector 5 .

[0058] S5. Place the photoelectric platform 7 between the first reflector 5 and the autocollimation theodolite 6, and fit the second reflector tightly against the inertial navigation mounting surface of the photoelectric platform 7. Figure 4 shown.

[0059] A convex block is provided inside the photoelectric platform 7 , and the surface of the convex block on which the inertial navigation system 4 is mounted is defined as the inertial navigation system mounting surface.

[0060] S6. Adjust the axis system of optoelectronic platform 7 so that the second reflector is perpendicular to the optical axis of autocollimator 6. At this point, the forward axis of inertial navigation system 4 during the calibration phase is the direction of the optical axis. However, due to factors such as installation and adjustment, the optical axis of optoelectronic platform 7's optical system 8 and the optical axis of autocollimator 6 will often not coincide or align. Record the angle values ​​(α, β, γ) output by optoelectronic platform 7 at this point.

[0061] S7. Ensure the base of optoelectronic platform 7 remains stationary. Rotate the axis system of optoelectronic platform 7 so that the imaging center of optical system 8 of optoelectronic platform 7 is aligned with the output light of autocollimation theodolite 6, completing the alignment of the optical axis of optical system 8 with the optical axis of autocollimation theodolite 6. At this point, set the angle of optoelectronic platform 7 to zero, completing the zero-position alignment and calibration of optical system 8 and inertial navigation system 4. The angle values ​​(α, β, γ) are the error angles between optical system 8 and inertial navigation system 4, which can be substituted into calculations during subsequent observations.

[0062] The axis system of the optoelectronic platform 7 generally includes a pitch axis, a yaw axis, and a roll axis. However, some optoelectronic platforms 7 have a two-axis axis system, including only a pitch axis and a yaw axis.

[0063] The aforementioned error angle is calculated using the aircraft or geographic system as the reference. Another error calibration method can use the optoelectronic platform's base system as the reference. In this case, the optoelectronic platform's axis system can be referred to as the pitch, azimuth, and roll axes. For a two-axis optoelectronic platform, only the pitch and azimuth axes exist. Therefore, only the rotations of the azimuth and pitch axes can be calibrated, meaning only the angle values ​​(α, β) are recorded as the error.

[0064] S8. Install the inertial navigation system 4 inside the optoelectronic platform 7 according to actual usage requirements. During installation, ensure that the inertial navigation system 4 fits closely to the inertial navigation system mounting surface inside the optoelectronic platform 7 and secures it to ensure that the installation position and orientation of the inertial navigation system 4 on the optoelectronic platform 7 are consistent with the position and orientation when calibrated on the inertial navigation system zero position tooling.

[0065] Furthermore, the first preset height is 5 mm.

[0066] Furthermore, the first preset angle is 30″.

[0067] Furthermore, the first preset value is 0.015 mm.

[0068] Furthermore, the optoelectronic platform 7 includes one or more of an optoelectronic stabilized platform, an optoelectronic pod, an optoelectronic turret and a gimbal.

[0069] Furthermore, the autocollimation theodolite 6 includes an emitting light tube and a lens tube for observing incident light.

[0070] The above specific embodiments do not limit the scope of protection of the present invention. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention are intended to be included within the scope of protection of the present invention.

Claims

1. A method for calibrating the zero position of an inertial navigation system and an optical axis in an optoelectronic platform, based on an inertial navigation zero position calibration tool, which associates the inertial navigation system with the optical system. The inertial navigation zero position calibration tool includes: A hexahedral tooling and a boss, wherein the boss is arranged on the hexahedral tooling, and a side of the boss facing the heading of the inertial navigation system serves as a mounting surface; the method for calibrating the zero position of the inertial navigation system and the optical axis in the optoelectronic platform comprises the following steps: S1. Align the heading direction of the inertial navigation system vertically with the mounting surface of the boss, ensure that the mounting surface of the inertial navigation system fits into the mounting surface of the boss, and fasten the inertial navigation system to the inertial navigation system zero calibration tooling; S2. Using the inertial navigation calibration zero position tooling, calibrate the pitch axis, yaw axis and roll axis of the inertial navigation; S3. Remove the inertial navigation system and attach the first reflector to the mounting surface of the boss; S4. Place a theodolite at a preset position in front of the first reflector, ensuring that the optical axis of the theodolite is perpendicular to the mirror surface of the first reflector; adjust the theodolite so that the outgoing light of the theodolite coincides with the reflected light; S5. The photoelectric platform is placed between the first reflector and the theodolite, and the second reflector is attached to the inertial navigation mounting surface of the photoelectric platform; S6. Adjust the axis system of the optoelectronic platform so that the second reflector is perpendicular to the optical axis of the theodolite. At this time, the forward axis of the inertial navigation system during the calibration phase is in the direction of the optical axis. S7. Ensure that the base of the optoelectronic platform remains stationary, rotate the optoelectronic platform's axis system so that the imaging center of the optoelectronic platform's optical system aligns with the output light of the theodolite, and align the optical axis of the optical system with the optical axis of the theodolite. At this point, set the angle of the optoelectronic platform to zero, thereby completing the zero-position alignment and calibration of the optical system and the inertial navigation system. S8. Install the inertial navigation system inside the optoelectronic platform so that the inertial navigation system fits against the inertial navigation system mounting surface of the optoelectronic platform to ensure that the installation position and direction of the inertial navigation system on the optoelectronic platform are consistent with the position and direction of the inertial navigation system calibrated in step S2.

2. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 1, characterized in that: The height of the boss is greater than or equal to a first preset height.

3. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 2, characterized in that: The first preset height is 5 mm.

4. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 1, characterized in that: The verticality between the mounting surface of the boss and the surface of the inertial navigation calibration zero position fixture on which the boss is mounted is less than a first preset angle.

5. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 4, characterized in that: The first preset angle is 30″.

6. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 4, characterized in that: The parallelism between the mounting surface of the boss and a surface of the inertial navigation calibration zero position tooling that is parallel to the mounting surface is less than a first preset value.

7. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 6, characterized in that: The first preset value is 0.015 mm.

8. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 1, characterized in that: The optoelectronic platform is an optoelectronic stabilized platform, an optoelectronic pod, an optoelectronic turret, or a pan / tilt platform.

9. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 1, characterized in that: The theodolite comprises an emitting light tube and a lens tube for observing incident light.

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