Processing method of air interface test data and electronic equipment

Abstract

The embodiment of the invention provides an air interface test data processing method and electronic equipment, relates to the field of data processing, and can improve the precision of air interface test data on the premise of not increasing the duration of OTA test. The method comprises the following steps: acquiring first data; and determining an associated sampling point of each interpolation point according to the lobe width, the air interface test data and the position data of each interpolation point. And determining the radio frequency parameter of the interpolation point according to the associated sampling point of the interpolation point, the sphere center angle corresponding to the interpolation point and the radio frequency parameter of the associated sampling point of the interpolation point. Wherein the radio frequency parameter of the interpolation point is positively correlated to the radio frequency parameter of the correlation point of the interpolation point, and is negatively correlated to the correlation sampling point of the interpolation point and the sphere center angle corresponding to the interpolation point.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of data processing, and in particular to a method and electronic device for processing air interface test data. Background Art

[0002] In the field of communication testing, OTA (over the air) testing is a commonly used method for testing antenna communication performance. In OTA testing, the test instrument and the device under test (DUT) are connected through an air interface. The test instrument tests the DUT to obtain air interface test data that can reflect the overall radiation performance and reception performance of the DUT. Exemplarily, the OTA test can set sampling points on a three-dimensional spherical surface with the DUT as the center, and the test instrument determines the air interface test data by detecting the RF parameters of the sampling points. It should be understood that the more sampling points there are, the smaller the sampling interval is, and the higher the accuracy of the air interface test data is.

[0003] However, the duration of the OTA test is proportional to the number of sampling points, and the number of sampling points is proportional to the square of the sampling interval. Therefore, when the sampling accuracy is improved, that is, the sampling interval is reduced, the duration of the OTA test will increase significantly. For example, if the sampling interval is reduced from 5° to 1°, the duration of the OTA test will become about 25 times the original time. In this way, the battery of the DUT may not be able to support a complete high-precision 0TA test.

[0004] Therefore, how to improve the accuracy of air interface test data without increasing the duration of OTA testing has become an urgent problem to be solved. Summary of the invention

[0005] To solve the above problems, the embodiments of the present application provide a method for processing air interface test data and an electronic device, which can improve the accuracy of air interface test data without increasing the duration of OTA testing.

[0006] In order to achieve the above purpose, the embodiment of the present application adopts the following technical solution:

[0007] In a first aspect, a method for processing air interface test data is provided, comprising: obtaining first data. The first data at least includes air interface test data of the antenna under test, position data of each interpolation point, and the beam width of the antenna under test. The air interface test data includes position data of each sampling point on the sampling sphere, and RF parameters of the antenna under test at each sampling point. The center of the sampling sphere is the antenna under test. Each interpolation point is located on the sampling sphere. The associated sampling point of each interpolation point is determined according to the beam width, the air interface test data, and the position data of each interpolation point. Among them, the sphere center angle corresponding to any associated sampling point of the interpolation point and the interpolation point is less than or equal to the sphere center angle corresponding to half of the beam width and the sphere center angle corresponding to the adjacent sampling point in the air interface test data. According to the sphere center angle corresponding to the interpolation point and the interpolation point of the associated sampling point of the interpolation point, and the RF parameters of the interpolation point of the associated sampling point, the RF parameters of the interpolation point are determined. Among them, the RF parameters of the interpolation point are positively correlated with the RF parameters of the associated point of the interpolation point, and negatively correlated with the sphere center angle corresponding to the associated sampling point of the interpolation point and the interpolation point.

[0008] Based on this solution, by interpolating the area between the sampling points on the sampling sphere and more accurately estimating the RF parameters of the interpolation point based on the RF parameters of the sampling points near the interpolation point, the interpolation point can be used as a new sampling point, thereby increasing the density of the sampling points on the sampling sphere and improving the accuracy of the air interface test data without increasing the duration of the OTA test.

[0009] In some possible implementations, the first data also includes the radius of the darkroom during air interface testing, the antenna aperture of the antenna under test, and the wavelength of the electromagnetic wave received and sent by the antenna under test. Determine the associated sampling point of each interpolation point based on the lobe width, the air interface test data, and the position data of each interpolation point, including: when it is determined that the prior conditions are met, determine the associated sampling point of each interpolation point based on the lobe width, the air interface test data, and the position data of each interpolation point. The prior conditions at least include: the spherical center angles corresponding to adjacent sampling points in the air interface test data are equal. The spherical center angles corresponding to adjacent sampling points in the air interface test data are less than the spherical center angle corresponding to half of the lobe width and 7.5 degrees. The product of half of the darkroom radius and the electromagnetic wave wavelength is greater than twice the square of the antenna aperture.

[0010] In some possible implementations, obtaining the first data includes: performing an air interface test on the antenna under test according to a preset sampling rule to obtain air interface test data; performing a simulation test on the antenna under test to obtain a lobe width; and uniformly interpolating an area between each sampling point according to a preset interpolation rule to obtain position data of each interpolation point.

[0011] In some possible implementations, the associated sampling point of each interpolation point is determined according to the beam width, air interface test data, and the position data of each interpolation point, including: determining a first spherical center angle. The first spherical center angle is the smaller value of the spherical center angle corresponding to the adjacent sampling point and the spherical center angle corresponding to half of the beam width. The associated area of ​​each interpolation point is determined according to the first spherical center angle and the position data of each interpolation point. The spherical center angle corresponding to any sampling point and the interpolation point in the associated area of ​​the interpolation point is less than or equal to the first spherical center angle. The associated sampling points of the interpolation point are determined according to the associated area of ​​the interpolation point. Among them, the sampling points in the associated area of ​​the interpolation point are the associated sampling points of the interpolation point.

[0012] In some possible implementations, the position data of the sampling point refers to the coordinates of the sampling point in a rectangular coordinate system. The horizontal axis of the rectangular coordinate system is the azimuth of the sampling point in a spherical coordinate system with the measured antenna as the center, and the vertical axis of the rectangular coordinate system is the elevation angle of the sampling point in the spherical coordinate system. The position data of the interpolation point refers to the coordinates of the interpolation point in the rectangular coordinate system.

[0013] In some possible implementations, determining the associated sampling points of the interpolation points according to the associated regions of the interpolation points includes: determining an analytical function of a boundary of the associated regions of the interpolation points in a rectangular coordinate system. Determining the associated sampling points of the interpolation points according to the position data of the interpolation points and the analytical function. The associated sampling points of the interpolation points satisfy: after the position data of the interpolation points, the first sphere center angle, and the position data of the associated sampling points of the interpolation points are substituted into the analytical function, the function value of the analytical function is greater than 0.

[0014] In some possible implementations, determining the radio frequency parameters of the interpolation points according to the spherical center angles corresponding to the associated sampling points of the interpolation points and the interpolation points, and the radio frequency parameters of the associated sampling points of the interpolation points, includes: determining the weights of the associated sampling points according to the spherical center angles corresponding to the associated sampling points of the interpolation points. The weights of the associated sampling points of the interpolation points are negatively correlated to the spherical center angles corresponding to the associated sampling points of the interpolation points. Based on the weights of the associated sampling points of the interpolation points, the weighted average of the radio frequency parameters of the associated sampling points is calculated to obtain the radio frequency parameters of the interpolation points.

[0015] In a second aspect, an electronic device is provided, comprising: one or more processors and one or more memories. The one or more memories are coupled to the one or more processors, and the one or more memories store a computer program. When the one or more processors execute the computer program, the electronic device executes the method for processing air interface test data of any one of the first aspects.

[0016] In a third aspect, a computer-readable storage medium is provided, in which a computer program is stored. When the computer program is executed by a processor, the method for processing air interface test data of any one of the first aspects is implemented.

[0017] According to a fourth aspect, a computer program product is provided, including a computer program, which, when executed by a processor, implements the method for processing air interface test data of any one of the first aspects.

[0018] It should be understood that the technical solutions provided in the above-mentioned second, third and fourth aspects and their technical features can all correspond to the method for processing air interface test data provided in the first aspect and its possible design, so the beneficial effects that can be achieved are similar and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A schematic diagram of an air interface test device provided in an embodiment of the present application;

[0020] Figure 2 A schematic diagram of the composition of an electronic device provided in an embodiment of the present application;

[0021] Figure 3 A flowchart of a method for processing air interface test data provided in an embodiment of the present application;

[0022] Figure 4 A schematic diagram of the distribution of some sampling points and interpolation points on a sampling sphere provided in an embodiment of the present application;

[0023] Figure 5 A schematic diagram of the distribution of some sampling points and interpolation points in a rectangular coordinate system provided in an embodiment of the present application;

[0024] Figure 6 A schematic diagram of the lobe width of an antenna under test provided in an embodiment of the present application;

[0025] Figure 7 A flow chart of a method for determining associated sampling points of interpolation points provided in an embodiment of the present application;

[0026] Figure 8 A schematic diagram of an associated area provided in an embodiment of the present application;

[0027] Fig. 9 A schematic diagram of another associated area provided in an embodiment of the present application;

[0028] Fig.10 A schematic diagram of the distance between an interpolation point and an associated sampling point provided in an embodiment of the present application. DETAILED DESCRIPTION

[0029] The words "first", "second" and "third" in the embodiments of the present application are used to distinguish different objects rather than to limit a specific order. In addition, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a concrete way.

[0030] To facilitate understanding of the method for processing air interface test data provided in the embodiment of the present application, the process of obtaining air interface test data, that is, the process of OTA testing, is first introduced below.

[0031] Please refer to Figure 1 , is a schematic diagram of an air interface test device provided in an embodiment of the present application. Figure 1 As shown, the device includes a test meter 101, a darkroom 102, and a plurality of sampling probes 103, and the sampling probes 103 are communicatively connected to the test meter 101. During an over-the-air test, a device under test 104 (i.e., DUT) is disposed in the darkroom 102. The plurality of sampling probes 103 are evenly distributed on a spherical surface in the darkroom 102 with the device under test 104 as the center, and the sampling probes 103 are disposed at each sampling point in the OTA test.

[0032] During the air interface test, the darkroom 102 is used to shield external electromagnetic interference, and is a test environment for OTA testing that is electromagnetically isolated from the outside world. The sampling probe 103 is used to collect the RF parameters of the device under test 104 at the sampling point. Among them, the RF parameters refer to parameters that can reflect the radiation performance and / or receiving performance of the device under test 104, such as transmission power, effective isotropic radiated power (EIRP), total radiated power (TRP), receiving sensitivity, etc. The test instrument 101 is used to record the RF parameters of the device under test 104 at each sampling point, that is, the RF parameters collected by each sampling probe 103. Among them, the data recorded by the test instrument 101 is the air interface test data.

[0033] In an embodiment of the present application, the air interface test data may include the coordinates of each sampling point, the RF parameters of each sampling point, etc. Among them, the coordinates of each sampling point may refer to the coordinates of each sampling point in a spherical coordinate system with the device under test as the center, or the coordinates of each sampling point in a rectangular coordinate system with the azimuth angle of the spherical coordinate system with the device under test as the center as the horizontal coordinate and the pitch angle as the vertical coordinate. In an embodiment of the present application, the coordinates of each sampling point may also be referred to as the position data of each sampling point. Among them, the angle formed by the line between one sampling point and the device under test and the line between another sampling point and the device under test in adjacent sampling points may be referred to as a sampling interval, which is used to identify the sampling density during the air interface test. It should be understood that the smaller the sampling interval, the more sampling points there are on the spherical surface with the device under test as the center, the smaller the sampling interval, the greater the sampling density, and the higher the accuracy of the obtained air interface test data.

[0034] The test duration of air interface test data is greatly affected by the sampling interval. For example, if the sampling interval is reduced by 5 times, the test duration of air interface test data will increase by about 25 times. However, in OTA testing, the device under test is usually the antenna in electronic devices such as mobile phones and tablets. The battery power of electronic devices is relatively limited and cannot support a complete high-precision OTA test.

[0035] In order to solve the above problems, an embodiment of the present application provides a method for processing air interface test data, which can improve the accuracy of air interface test data without increasing the test time.

[0036] The method for processing air interface test data provided in the embodiment of the present application is applied to electronic devices. The electronic device can be a test instrument, or a mobile phone, a computer, a notebook, a tablet, etc., without limitation. Among them, the air interface test data refers to the air interface test data of the DUT, and the DUT can be an electronic device with an antenna, such as a mobile phone, a tablet, a watch, a notebook, a computer, etc.

[0037] As an example, see Figure 2 , is a schematic diagram of the composition of an electronic device provided in an embodiment of the present application. The method for processing air interface test data provided in an embodiment of the present application can be applied to Figure 2 In the electronic device 200 shown in FIG. 1 , the DUT in the embodiment of the present application may also be composed as follows: Figure 2 The electronic device 200 is shown.

[0038] like Figure 2 As shown, the electronic device 200 may include a processor 201, a communication module 202 and an antenna module 203. The processor 201 may be connected to the communication module 202, and the communication module 202 may also be connected to the antenna module 203.

[0039] The processor 201 may include one or more processing units. Exemplarily, the processing unit may be an application processor (AP), a modem processor, a graphics processing unit (GPU), an image signal processor (ISP), a controller, a memory, a video stream codec, a digital signal processor (DSP), a baseband processor, a neural-network processing unit (NPU), etc. Different processing units may be independent devices or integrated in one or more processors 201.

[0040] In some possible implementations, the method for processing air interface test data provided in the embodiments of the present application may be applied to the processor 201 in the electronic device 200 .

[0041] The communication module 202 may include at least one filter, a switch, a power amplifier, a low noise amplifier (LNA), a modem, etc. ( Figure 2 The communication module 202 is mainly used to provide communication solutions for electronic devices, such as wireless communication solutions.

[0042] The antenna module 203 may include one or more antennas. The antenna is used to transmit and receive electromagnetic waves. Each antenna can be used to cover a single or multiple communication frequency bands. Different antennas can also be reused to improve the utilization of the antenna.

[0043] like Figure 2 As shown, in some possible implementations, the processor 201 may further include an internal memory 211. The internal memory 211 may be used to store computer executable program codes, and the executable program codes include instructions. The processor 201 executes various functional applications and data processing of the electronic device 200 by running the instructions stored in the internal memory 211, such as executing the method for processing air interface test data provided in the embodiment of the present application.

[0044] It should be understood that the structure illustrated in this embodiment does not constitute a specific limitation on the electronic device 200. In other embodiments, the electronic device 200 may include more or fewer components than shown in the figure, or combine some components, or split some components, or arrange the components differently. The components shown in the figure may be implemented in hardware, software, or a combination of software and hardware.

[0045] Based on the above description of the composition of the electronic device, the following describes the method for processing the air interface test data provided by the embodiment of the present application. It should be noted that the embodiment of the present application can be applied to the test instrument in the air interface test device, and can also be applied to electronic devices such as mobile phones, computers, notebooks, and cloud servers. For example, the electronic device can obtain the air interface test data through the test instrument in the air interface test device, and execute the method for processing the air interface test data provided by the embodiment of the present application.

[0046] Please refer to Figure 3 , is a flow chart of a method for processing air interface test data provided by an embodiment of the present application. Figure 3 As shown, the process may include the following steps.

[0047] S301: Obtain first data.

[0048] The first data includes at least the air interface test data of the device under test, the position data of each interpolation point, the lobe width of the device under test, etc. In the embodiment of the present application, the device under test may include but is not limited to the antenna under test, and the device under test may also be referred to as DUT or other names, etc., which will not be repeated in the subsequent embodiments. Taking the device under test as the antenna under test as an example, the first data may include at least the air interface test data of the antenna under test, the position data of each interpolation point of the antenna under test, the lobe width of the antenna under test, etc.

[0049] Among them, the position data of each interpolation point of the antenna under test is used to indicate the position of each interpolation point on the sampling sphere, such as coordinates. The sampling sphere refers to a three-dimensional sphere with the antenna under test as the center in the OTA test. The interpolation points are located on the sampling sphere and are distributed between the sampling points. The lobe width of the antenna under test can be obtained by passively testing or simulating the antenna under test before the OTA test, which is used to indicate the angle width of the antenna radiation pattern that is 3dB lower than the main lobe peak. That is to say, in an embodiment of the present application, the lobe width of the antenna under test can be the lobe width determined by actual measurement or the simulated lobe width. In addition, when the antenna under test is passively tested or simulated in advance, other information of the antenna under test can also be obtained, such as the style of the antenna under test. Among them, the style of the antenna under test is used to determine the polarization characteristics of the antenna under test, the approximate lobe direction, etc.

[0050] In some possible implementations, when the antenna under test is a directional antenna, the first data may also include the approximate lobe direction of the antenna under test. The approximate lobe direction is used to indicate the direction in which the directional antenna radiates and receives signals. In this way, the approximate lobe direction of the antenna under test can be tested in subsequent OTA tests, thereby saving test resources. It should be understood that in the air interface test data obtained by performing OTA testing on the approximate lobe direction of the directional antenna, the sampling points are distributed in the approximate lobe direction of the directional antenna on the sampling sphere. The sampling sphere refers to a three-dimensional sphere with the antenna under test as the center in the OTA test.

[0051] In some other possible implementations, the first data may also include the polarization mode of the antenna under test, so that the OTA test measures the component of the RF parameters of the antenna under test at the sampling point in a certain polarization direction. For example, if the first data indicates that the antenna under test is horizontally polarized, then only the horizontal polarization component of the RF parameters of the antenna under test at the sampling point may be measured in the subsequent OTA test. This is conducive to saving test resources.

[0052] In the embodiment of the present application, the lobe width, pattern, polarization characteristics, approximate lobe direction, etc. of the antenna under test can be collectively referred to as the prior information of the antenna under test.

[0053] The air interface test data of the antenna under test may be data obtained by pre-OTA testing the antenna under test. For example, the air interface test data of the antenna under test may be obtained by pre-sampling the RF parameters of the antenna under test at each sampling point on the sampling sphere to obtain the air interface test data of the antenna under test. The sampling sphere refers to a three-dimensional sphere with the antenna under test as the center in the OTA test, and the sampling points on the sampling sphere are determined according to a preset sampling rule. For example, the preset sampling rule is: uniform sampling at a sampling interval of 6° in the sampling sphere. Then each sampling point satisfies: the angle between the adjacent sampling points and the center of the sampling sphere is 6°.

[0054] In the embodiment of the present application, the air interface test data of the antenna under test needs to meet the prior conditions. Among them, the prior conditions include at least the following three conditions: the sampling interval in the air interface test data is less than the spherical center angle corresponding to the half-lobe width and 7.5°; the sampling points in the air interface test data are evenly distributed; the air interface test data is far-field data. The following is a detailed description.

[0055] Half-lobe width refers to half of the lobe width of the antenna under test. The center angle corresponding to the half-lobe width refers to the angle between the line connecting two points on the sampling sphere that are half the lobe width apart and the center of the sphere. For example, if the center angle corresponding to the lobe width of the antenna under test is 15°, then the center angle corresponding to the half-lobe width is 7.5°. In an embodiment of the present application, when the sampling interval in the air interface test data is less than the center angle corresponding to the half-lobe width and 7.5°, it can also be referred to as high-precision air interface test data.

[0056] Uniform distribution of sampling points in air interface test data means that the angles between the lines connecting adjacent sampling points in the air interface test data and the center of the sampling sphere are equal, that is, the sampling interval is a fixed interval; in other words, the distances between adjacent sampling points are equal. In other words, the sampling intervals in the above-mentioned preset sampling rules are fixed. In some possible implementations, when an OTA test adopts multiple sampling rules, the data with uniform distribution of sampling points in the air interface test data obtained by the OTA test can be selected, and the method for processing air interface test data provided in the embodiments of the present application can be applied.

[0057] The air interface test data is far-field data, which means that in the OTA test, the radius R of the darkroom, the antenna aperture D of the antenna under test, and the electromagnetic wavelength λ satisfy the following formula (1).

[0058]

[0059] The antenna aperture is a parameter used to indicate the effective area of ​​the antenna for absorbing electromagnetic waves, and may also be referred to as the effective area of ​​the antenna. In some possible implementations, the antenna aperture may be included in the prior information of the antenna under test. The darkroom radius R and the electromagnetic wavelength λ are known parameters in OTA testing and are not described in detail here.

[0060] In the embodiment of the present application, after obtaining the first data, it can be determined whether the air interface test data in the first data meets the prior condition. If so, the subsequent steps are executed. If not, it means that the air interface test data is not applicable to the air interface test data processing method provided in the embodiment of the present application, so the subsequent steps can be stopped, and it is prompted that the air interface test data is not applicable or cannot be used.

[0061] The position data of each interpolation point can be determined according to a preset interpolation rule to indicate the position of each interpolation point on the sampling sphere. Among them, the interpolation point is located on the sampling sphere. Unlike the sampling point, the above-mentioned air interface test data does not include the RF parameters of the antenna under test at the interpolation point. In other words, in the OTA test, only the sampling points are tested to obtain the air interface test data, and then the RF parameters of the antenna under test at each interpolation point are determined by the actual measured RF parameters of the antenna under test at each sampling point, thereby reducing the sampling interval in the air interface test data without increasing the test time, thereby improving the accuracy of the air interface test data.

[0062] Exemplarily, the preset sampling rule is: uniform sampling is performed at a first sampling interval in the sampling sphere. The first sampling interval is the sampling interval of the sampling points. The preset interpolation rule is to uniformly interpolate the positions without sampling points at the first interpolation interval as the interpolation interval in the sampling sphere. The first interpolation interval is the interpolation interval of the interpolation points. In some possible implementations, the first sampling interval is 6°, the first interpolation interval is 3°, and in a spherical coordinate system with the antenna under test as the sphere center, the distribution of some sampling points and interpolation points on the sampling sphere can be as follows: Figure 4 As shown. Figure 4 It can be seen that the sampling points are evenly distributed on the sampling sphere, and the interpolation points are evenly distributed between the sampling points. The angle between the two closest sampling points and the center of the sphere is 6°, the angle between the two adjacent interpolation points and the center of the sphere is 3°, and the angle between the adjacent sampling points and the interpolation points and the center of the sphere is 3°.

[0063] For another example, the preset sampling rule is: uniform sampling at a first sampling interval in the expanded surface of the sampling sphere. The preset interpolation rule is to uniformly interpolate positions without sampling points at a first interpolation interval in the expanded surface of the sampling sphere. The expanded surface of the sampling sphere refers to a rectangular coordinate system with the azimuth angle as the horizontal coordinate and the pitch angle as the vertical coordinate in a spherical coordinate system with the measured antenna as the center of the sphere. When the first sampling interval is 6° and the first interpolation interval is 3°, the distribution of some sampling points and interpolation points in the expanded surface of the sampling sphere can be as follows: Figure 5 As shown. Figure 5 It can be seen that the sampling points are evenly distributed on the expanded surface of the sampling sphere, and the interpolation points are evenly distributed between the sampling points. Among them, the pitch angle difference between the two closest sampling points is 6°, and the azimuth angle difference is 6°. The pitch angle difference between the two adjacent interpolation points is 3°, and the azimuth angle difference is 3°. The pitch angle difference between adjacent sampling points and interpolation points is 3°, and the azimuth angle difference is 3°.

[0064] It should be noted that Figure 4 The sampling sphere shown is Figure 5 The expanded surface of the sampling sphere shown is not corresponding. Figure 4 The sampling points and interpolation points on the sampling sphere shown in the figure are converted to the expanded surface of the sampling sphere. The sampling points and interpolation points are not evenly distributed. Figure 5 Different. Figure 5 The sampling points and interpolation points on the expanded surface of the sampling sphere shown in FIG. 3 are converted to the sampling sphere. The distribution of the sampling points and interpolation points is also not uniform, which is different from Figure 4 Not the same.

[0065] In the embodiment of the present application, it is possible to use Figure 4 The corresponding interpolation rules and sampling rules can also be used Figure 5Corresponding interpolation rules and sampling rules. Among them, if we use Figure 5 The corresponding interpolation rules and sampling rules will be Figure 5 When the sampling points and interpolation points on the expanded surface of the sampling sphere shown are converted to the sampling sphere, the distribution of the sampling points and interpolation points on the sampling sphere should be denser as they are closer to the poles.

[0066] Based on the above Figure 4 and Figure 5 It can be seen that if the RF parameters of the antenna under test at the interpolation point can be obtained, the sampling interval in the air interface test data can be reduced, and the accuracy of the air interface test data can be improved without increasing the test time. The following introduces the process of obtaining the RF parameters of the antenna under test at the interpolation point.

[0067] S302: Determine a sampling point associated with each interpolation point according to the beam width, air interface test data, and position data of each interpolation point.

[0068] The spherical center angle between any associated sampling point of the interpolation point and the interpolation point is less than or equal to the sampling interval of the air test data and the spherical center angle corresponding to half the beam width. The spherical center angle between any associated sampling point of the interpolation point and the interpolation point refers to the angle between the line connecting the interpolation point to the center of the sampling sphere and the line connecting any of the above associated sampling points to the center of the sampling sphere. The spherical center angle corresponding to half the beam width refers to the angle between the line connecting two points on the sampling sphere with a distance of half the beam width and the center of the sphere.

[0069] The half lobe width refers to half the lobe width of the antenna under test, and can also be called the half lobe width. For example, when the antenna under test is a standard half-wave dipole, the lobe width can be as follows: Figure 6 As shown in the figure. Among them, the spherical center angle corresponding to the half lobe width is Figure 6 ρ in .

[0070] Please refer to Figure 7 , is a method for determining the associated sampling points of an interpolation point provided in an embodiment of the present application. Figure 7 As shown, the method may include the following steps.

[0071] S701 , determining a smaller value between a sampling interval and a spherical center angle corresponding to a half-lobe width as a first spherical center angle.

[0072] Exemplarily, the sampling interval is 3°, and the spherical center angle corresponding to the half-lobe width is 5°. Then, the embodiment of the present application can use 3° as the first spherical center angle.

[0073] S702: Determine a correlation point of the interpolation point according to the position data of the interpolation point and the first sphere center angle.

[0074] In the embodiment of the present application, the associated area of ​​the interpolation point can be first determined according to the position data of the interpolation point, and then the sampling points in the associated area are used as the associated points of the interpolation point.

[0075] The associated region is an area on the sampling sphere, and the spherical center angle corresponding to the sampling point and the interpolation point in the associated region is less than or equal to the first spherical center angle. In other words, the angle between the line connecting the sampling point in the associated region to the spherical center of the sampling sphere and the line connecting the interpolation point to the spherical center of the sampling sphere is less than or equal to the first spherical center angle.

[0076] For example, if Figure 4 Corresponding sampling rules and interpolation rules, on the sampling sphere, the associated area can be as follows Figure 8 Please refer to Figure 8 , is a schematic diagram of an associated region provided by the present application. It can be seen that the associated region 802 corresponding to the first interpolation point 801 on the sampling sphere can be a spherical cap region centered on the interpolation point on the sampling sphere. The sampling points in the spherical cap region are the associated sampling points of the first interpolation point 801. It can be seen that Figure 8 There are 6 associated sampling points of the first interpolation point 801 in total.

[0077] For example, if we use Figure 5 Corresponding sampling rules and interpolation rules, the distribution of interpolation points and sampling points on the sampling sphere is denser the closer to the poles. To facilitate electronic equipment calculations, the sampling sphere can be expanded, that is, the azimuth angle in the spherical coordinate system with the antenna under test as the sphere center is used as the horizontal axis, and the pitch angle is used as the vertical axis to establish a rectangular coordinate system, and the sampling points and interpolation points on the sampling sphere are mapped to the rectangular coordinate system. In this way, the associated area can be as follows Fig. 9 The irregular area shown is for illustration only. Please refer to Fig. 9 , is a schematic diagram of another associated region provided in an embodiment of the present application. It can be seen that the associated region 902 corresponding to the second interpolation point 901 in the rectangular coordinate system includes 6 sampling points. It should be noted that, Fig. 9 The irregular region shown is only a schematic diagram and does not represent the actual shape of the irregular region. In the embodiment of the present application, the boundary of the irregular region should meet the requirements of the analytical function shown in the following formula (2).

[0078] Define the elevation angle in the spherical coordinate system with the antenna under test as the sphere center as ψ, the azimuth angle as θ, the first sphere center angle as η, the elevation angle of the interpolation point in the above spherical coordinate system as β, and the azimuth angle as α. Then the analytical function F(θ, ψ) of the curve formed by the boundary of the associated area of ​​the interpolation point in the above rectangular coordinate system (i.e., the rectangular coordinate system with the azimuth angle in the spherical coordinate system with the antenna under test as the sphere center as the horizontal coordinate and the elevation angle as the vertical coordinate) is as shown in the following formula (2).

[0079]

[0080] For ease of explanation, the present embodiment refers to the above analytical function F(θ, ψ) as a boundary function. It should be understood that when the coordinates of the interpolation point (α, β) and the first sphere center angle η are known, if the coordinates of a certain sampling point (θ i , ψ i ) makes the boundary function F(θ, ψ) greater than 0, indicating that the sampling point (θ i , ψ i ) is in the associated region of the interpolation point (α, β), the sampling point (θ i , ψ i ) is the associated sampling point of the interpolation point (α, β). Conversely, if the coordinates of a sampling point (θ i , ψ i ) makes the boundary function F(θ, ψ) less than 0, indicating that the sampling point (θ i , ψ i ) is outside the associated region of the interpolation point (α, β), the sampling point (θ i , ψ i ) is not the associated sampling point of the interpolation point (α, β).

[0081] In an embodiment of the present application, the electronic device that executes the method for processing air interface test data can also input the position data of a certain interpolation point, the coordinates of each sampling point (contained in the air interface test data), and the first sphere center angle into the above formula (2) to obtain all sampling points that satisfy F(θ, ψ) greater than 0, that is, all associated sampling points of the interpolation point.

[0082] S303: Determine the radio frequency parameters of the interpolation point according to the sampling point associated with the interpolation point and the sphere center angle corresponding to the interpolation point, and the radio frequency parameters of the sampling point associated with the interpolation point.

[0083] Among them, the RF parameters of the interpolation point are positively correlated with the RF parameters of the associated points of the interpolation point, and negatively correlated with the spherical center angle between the associated sampling points of the interpolation point and the interpolation point. In other words, when other conditions remain unchanged, the larger the RF parameters of the associated points of the interpolation point, the larger the RF parameters of the interpolation point; the larger the spherical center angle between the associated sampling points of the interpolation point and the interpolation point, the smaller the RF parameters of the interpolation point.

[0084] For example, the weight of each associated sampling point can be determined according to the spherical center angle corresponding to each associated sampling point of the interpolation point. For example, the coordinates of the interpolation point are (α, β), and the coordinates of any associated sampling point of the interpolation point are (θ i , ψ i ), then the weight of the sampling point w i It can be determined by the following formula (3).

[0085] wi =-ln(arccos(sinβcosαsinψ i cosθ i +sinβsinαsinψ i sinθ i +cosβcosψ i )) Formula (3).

[0086] In the above formula (3), the weight is negatively correlated with the associated sampling point (θ i , ψ i ) is the spherical center angle corresponding to the interpolation point (α, β). In other words, the associated sampling point (θ i , ψ i ) The larger the sphere center angle corresponding to the interpolation point (α, β), the greater the weight w i On the contrary, the associated sampling point (θ i , ψ i ) The smaller the sphere center angle corresponding to the interpolation point (α, β), the greater the weight w i The bigger it is.

[0087] It should be understood that the larger the spherical center angle between the associated sampling point of the interpolation point and the interpolation point, the farther the distance between the associated sampling point of the interpolation point and the interpolation point. Fig.10 As shown, the spherical center angle corresponding to the second interpolation point 901 and the first associated sampling point 1001 is greater than the spherical center angle corresponding to the second interpolation point 901 and the second associated sampling point 1002, so the distance L1 between the second interpolation point 901 and the first associated sampling point 1001 is also greater than the distance L2 between the second interpolation point 901 and the second associated sampling point 1002. Since the RF parameters of the antenna change smoothly in space, the farther the distance between the associated sampling point of the interpolation point and the interpolation point, the greater the difference in RF parameters between the associated sampling point of the interpolation point and the interpolation point. Therefore, the weight is negatively correlated to the spherical center angle corresponding to the associated sampling point of the interpolation point and the interpolation point, which can make the RF parameters of the interpolation point calculated subsequently closer to the actual RF parameters of the interpolation point, which is conducive to improving the accuracy of interpolation.

[0088] In the embodiment of the present application, the electronic device that executes the method for processing air interface test data can determine the radio frequency parameters of the interpolation point by using the following formula (4).

[0089]

[0090] Among them, K is the associated sampling point data of the interpolation point, w i is the weight of the sampling point, P i is the RF parameter of the sampling point, and P0 is the RF parameter of the interpolation point.

[0091] Through the above formula (3) and formula (4), it can be achieved that the RF parameters of the interpolation point are positively correlated with the RF parameters of the associated points of the interpolation point, and negatively correlated with the spherical center angle corresponding to the associated sampling points of the interpolation point and the interpolation point, so that the calculated RF parameters of the interpolation point are closer to the actual RF parameters of the interpolation point, thereby improving the accuracy of interpolation.

[0092] After experimental testing, the interpolation accuracy of the air interface test data processing method provided in the embodiment of the present application is relatively high. Taking the radio frequency parameter TRP as an example, after experimental testing, the difference between the TRP of the interpolation point calculated by the air interface test data processing method provided in the embodiment of the present application and the TRP obtained by the actual test of the interpolation point is less than or equal to the darkroom measurement fluctuation range (1dB), and the difference is small.

[0093] Based on the above description, it can be seen that the method for processing air interface test data provided in the embodiment of the present application interpolates the area between the sampling points on the sampling sphere, and more accurately estimates the RF parameters of the interpolation point based on the RF parameters of the sampling points near the interpolation point, so that the interpolation point can be used as a new sampling point, thereby increasing the density of the sampling points on the sampling sphere, and improving the accuracy of the air interface test data without increasing the duration of the OTA test.

[0094] Further optionally, the RF parameters of the interpolation points obtained in S303 and the air interface test data included in the first data in S301 are used as the test data of the antenna under test; and the performance of the antenna under test is evaluated based on the test data of the antenna under test. It should be understood that the new air interface test data obtained by combining the RF parameters of the interpolation points obtained in S303 and the air interface test data included in the first data in S301 has a higher accuracy than the air interface test data included in the first data in S301. Therefore, evaluating the performance of the antenna under test based on the new air interface test data is conducive to improving the accuracy of the evaluation.

[0095] An embodiment of the present application also provides a computer storage medium, in which computer instructions are stored. When the computer instructions are executed on an electronic device, the electronic device executes the above-mentioned related method steps to implement the method in the above-mentioned embodiment.

[0096] The embodiments of the present application also provide a computer program product. When the computer program product is run on a computer, the computer is caused to execute the above-mentioned related steps to implement the method in the above-mentioned embodiments.

[0097] In addition, the embodiments of the present application also provide a device, which may be a chip, a component or a module, and the device may include a connected processor and a memory; wherein the memory is used to store computer-executable instructions, and when the device is running, the processor may execute the computer-executable instructions stored in the memory, so that the chip executes the methods in the above-mentioned method embodiments. It should be noted that all relevant contents of each step involved in the above-mentioned method embodiments can be referred to the functional description of the corresponding functional module, and will not be repeated here.

[0098] Among them, the electronic device, computer storage medium, computer program product or chip provided in the embodiments of the present application are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be repeated here.

[0099] The above mainly introduces the solution provided by the embodiment of the present application from the perspective of electronic equipment. In order to realize the above functions, it includes hardware structures and / or software modules corresponding to the execution of each function. It should be easily appreciated by those skilled in the art that, in combination with the units and algorithm steps of each example described in the embodiments disclosed herein, the present application can be implemented in the form of hardware or a combination of hardware and computer software. Whether a function is executed in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present application.

[0100] The embodiment of the present application can divide the functional modules of the devices involved therein according to the above method examples. For example, each functional module can be divided corresponding to each function, or two or more functions can be integrated into one processing module. The above integrated modules can be implemented in the form of hardware or in the form of software functional modules. It should be noted that the division of modules in the embodiment of the present application is schematic and is only a logical function division. There may be other division methods in actual implementation.

[0101] The functions or actions or operations or steps in the above embodiments can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented using a software program, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions may be transmitted from a website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) mode to another website site, computer, server or data center. The computer-readable storage medium may be any available medium that a computer can access or may include one or more servers, data centers and other data storage devices that can be integrated with the medium. The available medium may be a magnetic medium (eg, a floppy disk, a hard disk, a magnetic tape), an optical medium (eg, a DVD), or a semiconductor medium (eg, a solid state disk (SSD)).

[0102] Although the present application has been described in conjunction with specific features and embodiments thereof, it is obvious that various modifications and combinations may be made thereto without departing from the spirit and scope of the present application. Accordingly, this specification and the drawings are merely exemplary illustrations of the present application as defined by the appended claims, and are deemed to have covered any and all modifications, variations, combinations or equivalents within the scope of the present application. Obviously, those skilled in the art may make various modifications and variations to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.

Claims

1. A method for processing air interface test data, characterized in that: include: Acquire first data; the first data at least includes air interface test data of the antenna under test, position data of each interpolation point, and lobe width of the antenna under test; the air interface test data includes position data of each sampling point on a sampling sphere, and radio frequency parameters of the antenna under test at each sampling point; the center of the sampling sphere is the antenna under test; and each interpolation point is located on the sampling sphere; Determine the associated sampling point of each interpolation point according to the lobe width, the air test data, and the position data of each interpolation point; wherein the spherical center angle corresponding to any associated sampling point of the interpolation point and the interpolation point is less than or equal to the spherical center angle corresponding to half of the lobe width and the spherical center angle corresponding to the adjacent sampling point in the air test data; The radio frequency parameters of the interpolation point are determined according to the spherical center angle corresponding to the interpolation point and the associated sampling point of the interpolation point, and the radio frequency parameters of the associated sampling point of the interpolation point; wherein the radio frequency parameters of the interpolation point are positively correlated with the radio frequency parameters of the associated point of the interpolation point, and negatively correlated with the spherical center angle corresponding to the associated sampling point of the interpolation point and the interpolation point.

2. The method according to claim 1, characterized in that The first data also includes the radius of the darkroom during air interface testing, the antenna aperture of the antenna under test, and the wavelength of the electromagnetic wave received and sent by the antenna under test; Determining the associated sampling point of each interpolation point according to the lobe width, the air interface test data, and the position data of each interpolation point includes: When it is determined that the priori condition is met, determining the associated sampling point of each interpolation point according to the lobe width, the air interface test data, and the position data of each interpolation point; The prior conditions include at least: the spherical center angles corresponding to adjacent sampling points in the air interface test data are equal; the spherical center angles corresponding to adjacent sampling points in the air interface test data are less than the spherical center angle corresponding to half of the lobe width and 7.5 degrees; the product of half of the darkroom radius and the wavelength of the electromagnetic wave is greater than twice the square of the antenna aperture.

3. The method according to any one of claims 1 to 2, characterized in that: The obtaining of the first data comprises: Performing an air interface test on the antenna under test according to a preset sampling rule to obtain the air interface test data; Performing a simulation test on the antenna under test to obtain the lobe width; The area between the sampling points is uniformly interpolated according to a preset interpolation rule to obtain the position data of each interpolation point.

4. The method according to any one of claims 1 to 3, characterized in that Determining the associated sampling point of each interpolation point according to the lobe width, the air interface test data, and the position data of each interpolation point includes: Determine a first spherical center angle; the first spherical center angle is the smaller value of the spherical center angle corresponding to the adjacent sampling points and the spherical center angle corresponding to half of the lobe width; Determine the associated area of ​​each interpolation point according to the first spherical center angle and the position data of each interpolation point; the spherical center angle corresponding to any sampling point in the associated area of ​​the interpolation point and the interpolation point is less than or equal to the first spherical center angle; Determine the associated sampling points of the interpolation point according to the associated area of ​​the interpolation point; wherein the sampling points in the associated area of ​​the interpolation point are the associated sampling points of the interpolation point.

5. The method according to claim 4, characterized in that The position data of the sampling point refers to the coordinates of the sampling point in a rectangular coordinate system; the horizontal axis of the rectangular coordinate system is the azimuth of the sampling point in a spherical coordinate system with the measured antenna as the sphere center, and the vertical axis of the rectangular coordinate system is the pitch angle of the sampling point in the spherical coordinate system; The position data of the interpolation point refers to the coordinates of the interpolation point in a rectangular coordinate system.

6. The method according to claim 5, characterized in that The step of determining the associated sampling point of the interpolation point according to the associated area of ​​the interpolation point comprises: Determine an analytical function of the boundary of the associated region of the interpolation point in the rectangular coordinate system; Determine the associated sampling points of the interpolation points according to the position data of the interpolation points and the analytical function; the associated sampling points of the interpolation points satisfy: after the position data of the interpolation points, the first sphere center angle, and the position data of the associated sampling points of the interpolation points are substituted into the analytical function, the function value of the analytical function is greater than 0.

7. The method according to any one of claims 1 to 6, characterized in that: The determining the radio frequency parameters of the interpolation point according to the spherical center angle corresponding to the interpolation point and the associated sampling point of the interpolation point, and the radio frequency parameters of the associated sampling point of the interpolation point, comprises: Determine the weight of each associated sampling point according to the sphere center angle corresponding to each associated sampling point of the interpolation point and the interpolation point; the weight of the associated sampling point of the interpolation point is negatively correlated to the sphere center angle corresponding to the associated sampling point of the interpolation point and the interpolation point; Based on the weights of the sampling points associated with the interpolation point, a weighted average value of the radio frequency parameters of the associated sampling points is calculated to obtain the radio frequency parameters of the interpolation point.

8. An electronic device, characterized in that: include: One or more processors, one or more memories; the one or more memories are coupled to the one or more processors, and the one or more memories store a computer program; When the one or more processors execute the computer program, the electronic device executes the method for processing air interface test data according to any one of claims 1 to 7.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method for processing air interface test data according to any one of claims 1 to 7 is implemented.

10. A computer program product, characterized in that The invention comprises a computer program, which, when executed by a processor, implements the method for processing air interface test data as described in any one of claims 1 to 7.

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