A fast test method for the voltage standing wave ratio frequency response curve of a radio frequency device

Abstract

The present application proposes a rapid testing method for the voltage standing wave ratio frequency response curve of a radio frequency device. First, a small number of test frequency points are selected according to the detection frequency range for initial testing, and then the information density is accurately calculated using a local standard deviation model to identify key frequency bands; then, the information density and microwave device characteristics of each frequency band are comprehensively evaluated through a weighted allocation model, and the necessary number of test frequency points in each frequency band, that is, the optimal number of test frequency points, is intelligently determined; finally, the output result of the weighted allocation model is used as the input of an equidistant allocation model, the interval between the optimal test frequencies in each frequency band is finely set, and a secondary sampling test is implemented, thereby efficiently and accurately generating the voltage standing wave ratio frequency response curve of the radio frequency device in the test frequency band.

Description

Technical Field

[0001] The present application belongs to the field of radio frequency testing technology, and relates to voltage standing wave ratio testing of microwave devices, and in particular to a rapid testing method for a frequency response curve of voltage standing wave ratio of a radio frequency device. Background Art

[0002] With the rapid development of modern communication technology, RF devices play a vital role in wireless communications, radar systems, satellite communications and other fields. The performance of RF devices directly affects the transmission efficiency, signal quality and stability of the entire communication system. Among them, the Voltage Standing Wave Ratio (VSWR) is a key parameter to measure the port matching status of RF devices. Its frequency response characteristics are of great significance for evaluating the performance of devices in different frequency bands.

[0003] The voltage standing wave ratio reflects the reflection of the RF signal in the transmission line due to impedance mismatch. When the RF signal propagates on the transmission line, if the characteristic impedance of the transmission line does not match the input / output impedance of the RF device, the signal will be reflected at the connection between the transmission line and the device, forming a standing wave. The existence of standing waves will cause the loss of signal energy, increase the noise level of the system, and may even damage the RF device. Therefore, accurately measuring the voltage standing wave ratio frequency response curve of the RF device is crucial to ensure the matching performance of the device, optimize the system design and improve the communication quality.

[0004] The voltage standing wave ratio test method usually relies on high-precision test equipment such as network analyzers. The system controls the signal source to generate an excitation signal according to the test range, test frequency interval and other parameters configured by the user. After the signal acts on the microwave device, the receiver measures and records the relevant data. For example, the test bandwidth is 1GHz-4GHz, and the scanning frequency interval is 10MHz. Then the system first controls the signal source to transmit a 1GHz signal for testing, and then transmits a 1GHz+10MHz signal, a 1GHz+20MHz signal, etc., until the 4GHz signal is transmitted to complete the test, a total of 301 test frequencies. Finally, the system plots the parameters obtained at each test frequency (such as S11, S21) into a frequency response curve. However, although this method is accurate, the test process is cumbersome and time-consuming. With the continuous advancement of communication technology and the increasing complexity of RF devices, the requirements for voltage standing wave ratio test methods are becoming higher and higher, and there is an urgent need to optimize the design of the test method.

[0005] The main problem of the existing scheme in testing the voltage standing wave ratio frequency response curve is that it lacks a differentiated test strategy for the voltage standing wave ratio fluctuation characteristics of different frequency bands within the frequency band, resulting in indiscriminate comprehensive testing, which is not only time-consuming and labor-intensive, but also inefficient. In addition, there is insufficient test data in the key frequency bands with large fluctuations, and its detailed characteristics cannot be fully characterized. In the frequency bands with small fluctuations, the number of test points is redundant, and resources are seriously wasted. In addition, the existing scheme also lacks the ability to adaptively adjust the test strategy according to the real-time fluctuation of the voltage standing wave ratio frequency response curve, making it impossible to improve efficiency while ensuring accuracy during the test process. Summary of the invention

[0006] The purpose of the present application is to solve the problems of the prior art and to provide a method for quickly testing the voltage standing wave ratio frequency response curve of a radio frequency device.

[0007] In order to solve the technical problem, the technical solution of the present application is: a method for quickly testing the voltage standing wave ratio frequency response curve of a radio frequency device, comprising the following steps:

[0008] Step 1, selecting the initial test frequency point according to the detection frequency range for initial test, and obtaining the voltage standing wave ratio of each initial test frequency point; wherein the number of the initial test frequency points is less than the number of the common test frequency points, and two adjacent initial test frequency points form a frequency band;

[0009] Step 2, calculating the information density of the voltage standing wave ratio at each initial test frequency point through a local standard deviation model;

[0010] Step 3, evaluating the information density of each frequency band through a weighted allocation model to obtain the optimal number of test frequency points for each frequency band;

[0011] Step 4, taking the optimal test frequency points in each frequency band as the input of the equidistant allocation model to determine the optimal test frequency point spacing in each frequency band;

[0012] Step 5: Perform secondary sampling test according to the best test frequency interval in each frequency band to generate a voltage standing wave ratio frequency response curve of the RF device in the test frequency band.

[0013] Preferably, the step 1 is specifically:

[0014] Step 1-1, determine the number of initial test frequency points: based on the detection frequency range Select n initial test frequency points at equal intervals and mark them as , … … ; Two adjacent initial test frequency points form a frequency band, with a total of n-1 frequency bands, marked as , … … ;

[0015] Step 1-2, data acquisition: control the signal source to generate an excitation signal according to the detection frequency range and the number of initial test frequencies in step 1-1, apply the excitation signal to the microwave device, and measure and record the voltage standing wave ratio of each initial test frequency through the receiver.

[0016] Preferably, the calculation formula for the frequency points of the initial test is:

[0017]

[0018] Where:

[0019] n represents the number of frequency points in the initial test, pieces;

[0020] Indicates the normal sampling interval, MHz, where 10 3.

[0021] Preferably, the step 2 is specifically:

[0022] Step 2-1, set the window: select the window size according to the frequency of the initial test ;

[0023]

[0024] Step 2-2, calculate the information density: divide the collected VSWR data of each initial test frequency point into multiple subsequences through a sliding window, and then use the local standard deviation model to calculate the standard deviation of the VSWR of each initial test frequency point to express the information density. The formula is as follows:

[0025]

[0026] Where:

[0027] s represents the information density of the frequency point in the initial test;

[0028] Indicates the voltage standing wave ratio at a certain initial test frequency point;

[0029] Indicates the average voltage standing wave ratio of the test frequency point in the corresponding window;

[0030] q represents the window size, dimensionless, where 5 20.

[0031] Preferably, the step 3 is specifically:

[0032] Based on the initial test, the number of test frequency points is increased to obtain the secondary sampling test frequency point number A, where Based on the information density of each initial test frequency point output in step 2, the weighted allocation model is used to redistribute the number of test frequencies to determine the optimal number of test frequencies in each frequency band; the initial test frequency point information density S and the secondary sampling test frequency point number A are used as model inputs, and the optimal test frequency point number Z of each frequency band is used as model output. The formula for the optimal test frequency point number Z is as follows:

[0033]

[0034]

[0035] Where:

[0036] Indicates frequency band The number of optimal test frequency points within, ;

[0037] Indicates the frequency information density of the initial test;

[0038] A represents the number of secondary sampling test frequency points, pieces.

[0039] Preferably, the step 4 is specifically:

[0040] The data processed by the weighted allocation model is used as the input of the equidistant allocation model to calculate the optimal test frequency interval in each frequency band. The formula is as follows:

[0041]

[0042] Where:

[0043] Indicates frequency band The best test frequency interval within, MHz;

[0044] Indicates frequency band The number of optimal test frequency points within, ;

[0045] is the initial test frequency, MHz.

[0046] Preferably, the step 5 is specifically:

[0047] Step 5-1, according to the best test frequency interval in each frequency band in step 4, determine the final test frequency position and number, control the network vector analyzer signal source to transmit the corresponding frequency signal in sequence, complete the test, and measure the voltage standing wave ratio of each final test frequency through the receiver and record it;

[0048] Step 5-2, drawing a frequency response curve of the voltage standing wave ratio based on the voltage standing wave ratio of each final test frequency point collected by the receiver.

[0049] Compared with the prior art, the advantages of this application are:

[0050] (1) The present application discloses a rapid testing method for the voltage standing wave ratio frequency response curve of a radio frequency device. First, a small number of test frequency points are selected according to the detection frequency range for initial testing. Then, the local standard deviation model is used to accurately calculate the information density to identify the key frequency band. Then, the information density and microwave device characteristics of each frequency band are comprehensively evaluated through a weighted allocation model, and the necessary number of test frequency points in each frequency band, that is, the optimal number of test frequency points, is intelligently determined. Finally, the output result of the weighted allocation model is used as the input of the equidistant allocation model, the optimal test frequency point interval in each frequency band is precisely set, and a secondary sampling test is performed, so as to efficiently and accurately generate the voltage standing wave ratio frequency response curve of the radio frequency device in the test frequency band. Compared with the traditional method of uniformly allocating test frequency points, the present application retains a dense frequency point test method in the key frequency band to avoid missing important information, while in the non-key frequency band, the present application adopts a sparse frequency point test method, which compresses the test frequency point data by reducing the number of test points, thereby greatly improving the test efficiency. This differentiated test strategy not only optimizes the allocation of test resources, but also achieves the goal of further improving the test efficiency while ensuring the test accuracy.

[0051] (2) The test method of the present application improves the test efficiency by establishing a voltage standing wave ratio data information density analysis model and analyzing the voltage standing wave ratio of each initial test frequency point. The local standard deviation can evaluate the information density of the voltage standing wave ratio of each initial test frequency point and calculate the discrete degree of the data of each frequency point. The weighted allocation can evaluate the information density of each frequency band and help determine which frequency bands are the key areas for performance changes of RF devices. The equidistant allocation can optimize the distribution of test frequencies and determine the interval that should be maintained at the test frequencies in each frequency band. The rapid test method of the voltage standing wave ratio frequency response curve of the RF device of the present application achieves the purpose of efficient and accurate testing by evaluating the information density and optimizing the distribution of test frequencies.

[0052] (3) The local standard deviation model used in this application can measure the complexity and information content of the signal, and the weighted allocation model can efficiently realize data compression and reduce the sampling of redundant data. The integration of the above model methods can more efficiently obtain the voltage standing wave ratio frequency response curve, thereby improving the test efficiency of the voltage standing wave ratio of RF devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0054] Figure 1 A flowchart of a method for quickly testing the voltage standing wave ratio frequency response curve of a radio frequency device for this application;

[0055] Figure 2 This is the information density curve of Example 1 of the present application;

[0056] Figure 3 This is a frequency distribution diagram of the secondary sampling test in Example 1 of the present application;

[0057] Figure 4 The figure is a comparison chart of the voltage standing wave ratio frequency response curves of the traditional test method and the rapid test method of the present application. DETAILED DESCRIPTION

[0058] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0059] It should be noted that the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned drawings are intended to cover non-exclusive inclusions. For example, a process, method, system, product or server that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0060] like Figure 1 As shown, the present application proposes a rapid testing method for the voltage standing wave ratio frequency response curve of a radio frequency device, comprising the following steps:

[0061] Step 1, selecting the initial test frequency point according to the detection frequency range for initial test, and obtaining the voltage standing wave ratio of each initial test frequency point; wherein the number of the initial test frequency points is less than the number of the common test frequency points, and two adjacent initial test frequency points form a frequency band;

[0062] Step 2, calculating the information density of the voltage standing wave ratio at each initial test frequency point through a local standard deviation model;

[0063] Step 3, evaluating the information density of each frequency band through a weighted allocation model to obtain the optimal number of test frequency points for each frequency band;

[0064] Step 4, taking the optimal test frequency points in each frequency band as the input of the equidistant allocation model to determine the optimal test frequency point spacing in each frequency band;

[0065] Step 5: Perform secondary sampling test according to the best test frequency interval in each frequency band to generate a voltage standing wave ratio frequency response curve of the RF device in the test frequency band.

[0066] The key processes of this application include: 1) using the local standard deviation model to extract the information density features of the voltage standing wave ratio of each initial test frequency point to obtain the information density of each frequency band; 2) evaluating the information density of each frequency band through a weighted allocation model to obtain the optimal number of test frequency points in each frequency band during the secondary sampling process; 3) using the output of the weighted allocation model as the input of the equidistant allocation model to obtain the interval between the optimal test frequency points in each frequency band.

[0067] Preferably, the step 1 is specifically:

[0068] Step 1-1, determine the number of initial test frequency points: based on the detection frequency range Select n initial test frequency points at equal intervals and mark them as , … … ; Two adjacent initial test frequency points form a frequency band, with a total of n-1 frequency bands, marked as , … … ;

[0069] Step 1-2, data acquisition: control the signal source to generate an excitation signal according to the detection frequency range and the number of initial test frequencies in step 1-1, apply the excitation signal to the microwave device, and measure and record the voltage standing wave ratio of each initial test frequency through the receiver.

[0070] Preferably, the calculation formula for the frequency points of the initial test is:

[0071]

[0072] Where:

[0073] n represents the number of frequency points in the initial test, pieces;

[0074] Indicates the normal sampling interval, MHz, where 10 3.

[0075] Preferably, the step 2 is specifically:

[0076] Step 2-1, set the window: select the window size q according to the frequency point of the initial test;

[0077]

[0078] Step 2-2, calculate the information density: divide the collected VSWR data of each initial test frequency point into multiple subsequences through a sliding window, and then use the local standard deviation model to calculate the standard deviation of the VSWR of each initial test frequency point to express the information density. The formula is as follows:

[0079]

[0080] in:

[0081] S represents the information density of the frequency point in the initial test;

[0082] Indicates the voltage standing wave ratio at a certain initial test frequency point;

[0083] Indicates the average voltage standing wave ratio of the test frequency point in the corresponding window;

[0084] q represents the window size, dimensionless, where 5 20.

[0085] Preferably, the step 3 is specifically:

[0086] Based on the initial test, the number of test frequency points is increased to obtain the secondary sampling test frequency point number A, where Based on the information density of each initial test frequency point output in step 2, the weighted allocation model is used to redistribute the number of test frequencies to determine the optimal number of test frequencies in each frequency band; the initial test frequency point information density S and the secondary sampling test frequency point number A are used as model inputs, and the optimal test frequency point number Z of each frequency band is used as model output. The formula for the optimal test frequency point number Z is as follows:

[0087]

[0088]

[0089] in:

[0090] Indicates frequency band The number of optimal test frequency points within, ;

[0091] Indicates the frequency information density of the initial test;

[0092] A represents the number of secondary sampling test frequency points, pieces.

[0093] Preferably, the step 4 is specifically:

[0094] The data processed by the weighted allocation model is used as the input of the equidistant allocation model to calculate the optimal test frequency interval in each frequency band. The formula is as follows:

[0095]

[0096] in:

[0097] Indicates frequency band The best test frequency interval within, MHz;

[0098] Indicates frequency band The number of optimal test frequency points within, ;

[0099] is the initial test frequency, MHz.

[0100] Preferably, the step 5 is specifically:

[0101] Step 5-1, according to the best test frequency interval in each frequency band in step 4, determine the final test frequency position and number, control the network vector analyzer signal source to transmit the corresponding frequency signal in sequence, complete the test, and measure the voltage standing wave ratio of each final test frequency through the receiver and record it;

[0102] Step 5-2, drawing a frequency response curve of the voltage standing wave ratio based on the voltage standing wave ratio of each final test frequency point collected by the receiver.

[0103] Example 1

[0104] like Figure 1 As shown, the present application discloses a method for quickly testing a voltage standing wave ratio frequency response curve of a radio frequency device, comprising the following steps:

[0105] Step 1, select a small number of test frequency points (initial test frequency points) according to the detection frequency range for initial testing, and obtain the voltage standing wave ratio of each initial test frequency point;

[0106] Step 1-1, determine the number of initial test frequency points: test a microwave device with a certain attenuator as the target, detect the voltage standing wave ratio with a bandwidth range of 0-18GHz, select 450 test frequency points at equal intervals, and mark them as , … ; Two adjacent frequency points form a frequency band, with a total of n-1 frequency bands, marked as , … ;

[0107]

[0108] Where:

[0109] n represents the number of frequency points in the initial test, pieces;

[0110] Indicates the normal sampling interval, MHz, where 10 3;

[0111] In this embodiment is 0.01, is 4.

[0112] 2) Data acquisition: Use a network analyzer to collect data, control the signal source to generate an excitation signal according to the detection bandwidth range and the number of initial test frequency points, and sequentially transmit 40MHz signal, 80MHz signal...18GHz signal to act on the microwave device, and measure the voltage standing wave ratio of each initial test frequency point through the receiver and record it;

[0113] Step 2, calculating the information density of the voltage standing wave ratio at each initial test frequency point through a local standard deviation model;

[0114] 1) Set the window: set the window to 3 and the sliding step to 1;

[0115]

[0116] In this embodiment is 6.

[0117] 2) If Figure 2 As shown, calculate the information density: In order to obtain the amount of information contained in the data, the voltage standing wave ratio data of each initial test frequency point collected is divided into multiple subsequences through a sliding window, and then the local standard deviation model is used to calculate the standard deviation of each data to represent the information density. The formula is as follows:

[0118]

[0119] Where:

[0120] S represents the information density of the frequency point in the initial test;

[0121] Indicates the voltage standing wave ratio at a certain initial test frequency point;

[0122] Indicates the average voltage standing wave ratio of the test frequency point in the corresponding window;

[0123] q represents the window size, dimensionless, where 5 20.

[0124] Step 3, evaluating the information density of each frequency band through a weighted allocation model to obtain the optimal number of test frequency points for each frequency band;

[0125] like Figure 3As shown in the figure, the number of resampled test frequency points is increased to 1000, and the entire test frequency band is divided according to step 1. Based on the information density of each frequency point output in step 2, the number of test frequency points is redistributed using a weighted allocation model to determine the number of test frequency points in each frequency band. The test frequency information density S and the number of resampled test frequency points A are the model inputs, and the number of test frequency points Z in each frequency band is the model output. The formula for the optimal number of test frequency points Z is as follows:

[0126]

[0127]

[0128] Where:

[0129] Indicates frequency band The number of optimal test frequency points within, ;

[0130] Indicates the frequency information density of the initial test;

[0131] A represents the number of secondary sampling test frequency points, pieces.

[0132] In this embodiment is 0.01, so the number of normal test frequency points is 1800.

[0133] Step 4, using the data extracted by the weighted allocation model as the input of the equidistant allocation model to determine the optimal test frequency interval within the frequency band;

[0134] The output data obtained from the weighted allocation model mainly includes the number of optimal test frequency points Z in each frequency band. The data processed by the weighted allocation model is used as the input of the equidistant allocation model to calculate the interval between the optimal test frequency points in each frequency band. The formula is as follows:

[0135]

[0136] Where:

[0137] Indicates frequency band The best test frequency interval within, MHz;

[0138] Indicates frequency band The number of optimal test frequency points within, ;

[0139] This is the first test frequency point, .

[0140] Step 5: Perform a secondary sampling test to generate a voltage standing wave ratio frequency response curve of the RF device within the test frequency band.

[0141] According to the optimal test frequency interval of each frequency band output by the equidistant distribution model in step 4, the specific test frequency position and number are determined, and the network vector analyzer signal source is controlled to transmit the corresponding frequency signals in sequence to complete the test, a total of 1000 test frequency points. Finally, the system plots the voltage standing wave ratio obtained at each test frequency point into a frequency response curve.

[0142] This application is evaluated using the following indicators.

[0143] Structural Similarity (SSIM):

[0144]

[0145] Wherein, X is the voltage standing wave ratio data tested by the traditional test method, and y is the voltage standing wave ratio data tested by the fast test method; is the mean value of X, is the mean value of y, is the variance of X, is the variance of y, is the covariance of X and y, It is a constant used to maintain stability. The value of SSIM ranges from -1 to 1. When two images or signals are exactly the same, the value of SSIM is 1; when they are completely different or have very different structures, the value of SSIM is close to -1.

[0146] In addition, if Figure 4 As shown, it is a comparison chart between the traditional test results and the rapid test results of this application. Figure 4 The rapid method of this application is intuitively demonstrated to be significantly optimized in the use of VSWR test frequency points of microwave devices compared to the traditional method. The traditional method uses 1800 test frequency points, while the rapid method of this application, by identifying the fluctuation characteristics of the VSWR curve, retains only dense frequency points in the key frequency band, and uses sparse frequency points in the non-key frequency band. In the end, only 1000 test frequency points are needed to achieve a test effect similar to that of the traditional method. The SSIM value between the two curves is 0.97, and the voltage standing wave ratio frequency response curves obtained by the two test methods are highly similar. It can be seen that this application can quickly, accurately and efficiently test the voltage standing wave ratio frequency response curve of microwave devices.

[0147] The present application discloses a rapid testing method for a voltage standing wave ratio frequency response curve of a radio frequency device. First, a small number of test frequency points are selected according to a detection frequency range for initial testing, and then a local standard deviation model is used to accurately calculate the information density to identify a key frequency band. Then, a weighted allocation model is used to comprehensively evaluate the information density and microwave device characteristics of each frequency band, and the necessary number of test frequency points in each frequency band, that is, the optimal number of test frequency points, is intelligently determined. Finally, the output result of the weighted allocation model is used as the input of an equidistant allocation model, the optimal test frequency point interval in each frequency band is precisely set, and a secondary sampling test is performed, so as to efficiently and accurately generate a voltage standing wave ratio frequency response curve of the radio frequency device in the test frequency band. Compared with the traditional method of evenly allocating test frequency points, the present application retains a dense frequency point test method in the key frequency band to avoid missing important information, while in the non-key frequency band, the present application adopts a sparse frequency point test method, which compresses the test frequency point data by reducing the number of test points, thereby greatly improving the test efficiency. This differentiated test strategy not only optimizes the allocation of test resources, but also achieves the goal of further improving the test efficiency while ensuring the test accuracy.

[0148] The test method of the present application improves the test efficiency by establishing a voltage standing wave ratio data information density analysis model and analyzing the voltage standing wave ratio of each initial test frequency point. The local standard deviation can evaluate the information density of the voltage standing wave ratio of each initial test frequency point and calculate the discreteness of the data of each frequency point. The weighted allocation can evaluate the information density of each frequency band and help determine which frequency bands are key areas for performance changes of RF devices. The equidistant allocation can optimize the distribution of test frequencies and determine the interval that should be maintained at the test frequencies in each frequency band. The rapid test method of the voltage standing wave ratio frequency response curve of the RF device of the present application achieves the purpose of efficient and accurate testing by evaluating information density, optimizing the distribution of test frequencies and other steps.

[0149] This application adopts the local standard deviation model to measure the complexity and information content of the signal, and the weighted allocation model can efficiently realize data compression and reduce the sampling of redundant data. The integration of the above model methods can more efficiently obtain the voltage standing wave ratio frequency response curve, thereby improving the test efficiency of the voltage standing wave ratio of the RF device.

[0150] The above contents are only specific implementation methods of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A rapid test method for the voltage standing wave ratio frequency response curve of a radio frequency device, characterized in that: The following steps are involved: Step 1, selecting the initial test frequency point according to the detection frequency range for initial test, and obtaining the voltage standing wave ratio of each initial test frequency point; The number of initial test frequency points is less than that of common test frequency points, and two adjacent initial test frequency points form a frequency band; Step 2, calculating the information density of the voltage standing wave ratio at each initial test frequency point through a local standard deviation model; Step 3, evaluating the information density of each frequency band through a weighted allocation model to obtain the optimal number of test frequency points for each frequency band; Step 4, taking the optimal test frequency points in each frequency band as the input of the equidistant allocation model to determine the optimal test frequency point spacing in each frequency band; Step 5: Perform secondary sampling test according to the best test frequency interval in each frequency band to generate a voltage standing wave ratio frequency response curve of the RF device in the test frequency band.

2. A rapid test method for the voltage standing wave ratio frequency response curve of a radio frequency device according to claim 1, characterized in that: The step 1 is specifically as follows: Step 1-1, determine the number of initial test frequency points: based on the detection frequency range GHz— GHz equally spaced selection The first test frequency points are marked as , … … ; Two adjacent initial test frequency points form a frequency band. -1 frequency band, marked as , … … ; Step 1-2, data acquisition: control the signal source to generate an excitation signal according to the detection frequency range and the number of initial test frequencies in step 1-1, apply the excitation signal to the microwave device, and measure and record the voltage standing wave ratio of each initial test frequency through the receiver.

3. The rapid testing method of the voltage standing wave ratio frequency response curve of a radio frequency device according to claim 2 is characterized in that: The calculation formula for the frequency points of the initial test is: ； Where: Indicates the number of frequency points in the initial test, in units; Indicates the normal sampling interval, in MHz, where 10 3.

4. The rapid testing method of the voltage standing wave ratio frequency response curve of a radio frequency device according to claim 1 is characterized in that: The step 5 is specifically as follows: Step 5-1, according to the best test frequency interval in each frequency band in step 4, determine the final test frequency position and number, control the network vector analyzer signal source to transmit the corresponding frequency signal in sequence, complete the test, and measure the voltage standing wave ratio of each final test frequency through the receiver and record it; Step 5-2, drawing a frequency response curve of the voltage standing wave ratio based on the voltage standing wave ratio of each final test frequency point collected by the receiver.

Images