A fast test method for phased array antenna pattern based on vector network segment function

Abstract

The present invention discloses a method for quickly testing the directional pattern of a phased array antenna based on the segment function of a vector network. The system can quickly measure the directional pattern indicators of phased array antennas in the L, S, C, X, Ku, K, and Ka bands, thereby providing relevant evidence for the research and debugging of phased array antennas. The present invention includes modules such as a test turntable, a phased array antenna test fixture, a vector network analyzer, a feed turntable, a standard gain antenna, a radio frequency matrix switch, a timing controller, a computer, and a programmable power supply. During the process of the turntable moving at a constant speed from the starting position to the stop position, the turntable continuously reports the current position; after detecting that the trigger position has been reached, the timing controller automatically controls the phased array antenna to generate a beam and triggers the segment of the vector network to scan and finally complete the directional pattern test.

Description

Technical Field

[0001] The present invention belongs to the field of antenna measurement technology, and specifically relates to a method for quickly testing the radiation pattern of a phased array antenna based on a vector network segment function. Background Art

[0002] A phased array antenna is an array antenna system with multiple antenna elements. By leveraging the phase control capabilities of each antenna element and adjusting the phase difference appropriately, a phased array antenna can precisely control the direction and shape of the radiated beam. A phased array antenna typically consists of a large number of antenna elements arranged in a regular two-dimensional array. Each antenna element can independently adjust the phase of the transmitted or received signal. By properly controlling the phase difference of each antenna element, the antenna system can form a concentrated beam in a specific direction. By adjusting the phase difference, the pointing angle of the beam can be changed, enabling accurate targeting, tracking, or scanning of a target.

[0003] The testing method of multi-frequency and multi-wavelength patterns of phased array antennas is also an urgent problem to be solved. Conventional testing methods take a long time. When testing 56 wavelengths and frequencies, the test time is measured in hours, which cannot support the needs of more efficient testing. In addition, the fast testing function in the current market requires users to configure the FIFO option when purchasing a vector network analyzer to achieve fast testing, which requires additional costs. The present invention is a fast testing method for phased array antenna patterns based on the vector network segment function, which is proposed to address this problem. It can provide support for the testing of multi-frequency and multi-wavelength patterns in phased array antenna testing without the need to purchase the FIFO option.

[0004] Difficulties in testing multi-frequency and multi-wavelength patterns in phased array antenna testing:

[0005] 1) Ordinary testing methods take a long time to test and cannot meet the needs of high-efficiency testing.

[0006] 2) Requires additional purchase of FIFO options, increasing equipment costs. Summary of the Invention

[0007] The purpose of the present invention is to provide a method for quickly testing the radiation pattern of a phased array antenna based on the vector network segment function, so as to solve the problem in the prior art proposed in the background technology that the test time is long and the test time is in hours when testing 56 wave positions and frequency points, which cannot support the demand for higher efficiency testing.

[0008] In order to solve the above technical problems, the technical solution adopted by the present invention is:

[0009] A method for quickly testing the radiation pattern of a phased array antenna based on a vector network segment function, the method comprising the following steps:

[0010] Step S1, setting test parameters in the computer, and configuring the segment according to the set test parameters;

[0011] Step S2, repeat step S1 to set multiple identical segments: set the number of wave positions * the number of vector network acquisition points to the same segment, and save the configuration to the vector network analyzer after setting.

[0012] Step S3, the test turntable moves at a constant speed from the initial position to the end position, and during the constant speed movement, the test turntable reports the current position to the timing controller in real time;

[0013] Step S4: The timing controller receives the position information reported by the test turntable. When the turntable reaches the trigger position, the timing controller issues a beam control instruction to the phased array antenna to control beam formation. The timing controller also sends a pulse signal to the vector network analyzer to trigger the vector network analyzer to perform a segment point scan.

[0014] Step S5, the test turntable repeats step S4 before moving to the end position. When the test turntable moves to the end position, the test is completed and a signal is returned to the computer; the computer reads the spectrum trace data in the vector network analyzer;

[0015] Step S6: the test software analyzes the read test data and generates directional pattern index parameters.

[0016] According to the above technical solution, before testing, it is necessary to calculate the RF link attenuation and air attenuation based on the frequency of the phased array antenna to be tested and then select the appropriate RF link. Specifically:

[0017] Cable attenuation = α × L dB

[0018] Where α is the attenuation constant (in dB / m) and L is the length of the cable.

[0019] According to the above technical solution, the free space electromagnetic wave calculation is specifically as follows:

[0020] FSPL = 20log 10 (d)+20log 10 (f)+20log 10 (4π / c)

[0021] Where: d = distance between antennas (in km); f = frequency (in GHz); c = speed of light in vacuum (in meters per second).

[0022] According to the above technical solution, electromagnetic waves in free space propagate in the form of plane waves, and the propagation loss is proportional to the square of the distance. The attenuation Pr is calculated by the following formula:

[0023] Pr=Pt+Gt-L+Gr

[0024] Where Pt is the transmit power, Gt is the transmit antenna gain, L is the free space loss, and Gr is the receive antenna gain. According to the previous free space loss calculation formula, the higher the frequency, the greater the free space loss.

[0025] According to the above technical solution, before testing, the beam control parameters of the phased array antenna under test must be configured. These parameters include the antenna's transmit and receive mode, theta angle list, and array power-up and downtime. Specifically, beam control commands are sent to the phased array antenna, powering up all antenna units (or elements) in the array and putting them into operation. At this point, the antenna array can receive the control signals and perform tasks such as beam scanning, tracking, or communication based on them.

[0026] According to the above technical solution, before testing, it is also necessary to configure the vector network analyzer parameters, including S parameters, intermediate frequency bandwidth, transmission power and test mode.

[0027] According to the above technical solution, before conducting the test, it is also necessary to configure the test turntable parameters, which include the starting and ending positions of the turntable movement, the movement interval of the azimuth angle, the polarization angle value, the azimuth error correction, and the pitch error correction.

[0028] According to the above technical solution, before conducting the test, a frequency list needs to be configured. The frequencies in the frequency list must meet the following requirements: the subtraction of any two adjacent frequencies among all frequencies is the same value; the frequency list is used for vector network analyzer parameter settings and phased array antenna wave control command settings.

[0029] According to the above technical solution, before conducting the test, other test parameters need to be configured, and the other test parameters are used to calculate some indicator values.

[0030] According to the above technical solution, other test parameters include test type, whether to test cross-polarization, whether to test axial ratio, fluctuation error threshold and test task name.

[0031] Compared with the prior art, the present invention has the following beneficial effects:

[0032] The method described in this invention can be used to rapidly test multi-frequency and multi-wavelength patterns in phased array antenna testing. Transmitter / receiver switching and power amplification can be achieved through an RF switch. This test system enables autonomous measurement, performance calculation, and pattern generation of multi-frequency and multi-wavelength patterns for phased array antennas. This improves work efficiency, accelerates research progress on phased array antenna components, and significantly reduces the time required for testing and verifying phased array antenna pattern performance. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 This is a flow chart of the testing method of the present invention;

[0034] Figure 2 This is a flow chart of setting up a vector network in the test method of the present invention;

[0035] Figure 3 Setting up a timing flow chart for the test method of the present invention;

[0036] Figure 4 Testing software interface for the present invention;

[0037] Figure 5 Testing software interface for the present invention;

[0038] Figure 6 This is a schematic diagram of the radio frequency matrix switch of the present invention;

[0039] Figure 7 This is the test result interface of the present invention. DETAILED DESCRIPTION

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0041] Example 1

[0042] like Figure 1 As shown, a phased array antenna pattern rapid testing method based on the vector network segment function includes the following steps:

[0043] Install the test equipment: The phased array antenna test fixture is used to install and fix the phased array antenna to be tested on the test turntable; the standard gain antenna is used to be installed on the feed turntable and used as a feed in the radiation pattern test; the RF matrix switch is used to switch the RF link through the RF matrix switch in the high-frequency test scenario of the radiation pattern test to compensate for the attenuation of the entire RF link; the computer is used to run the test software and store the test data on the computer, and the test results can be viewed in the data management; the programmable power supply is used to provide high-quality, stable DC or AC power signals through its internal high-precision and stable circuit, providing the necessary power support for antenna testing.

[0044] Step S1, setting test parameters in the computer, and configuring the segment according to the set test parameters;

[0045] Step S2, repeat step S1 to set multiple identical segments: set the number of wave positions * the number of vector network acquisition points to the same segment, and save the configuration to the vector network analyzer after setting.

[0046] Step S3, the test turntable moves at a constant speed from the initial position to the end position, and during the constant speed movement, the test turntable reports the current position to the timing controller in real time;

[0047] Step S4: The timing controller receives the position information reported by the test turntable. When the turntable reaches the trigger position, the timing controller issues a beam control instruction to the phased array antenna to control beam formation. The timing controller also sends a pulse signal to the vector network analyzer to trigger the vector network analyzer to perform a segment point scan.

[0048] Step S5, the test turntable repeats step S4 before moving to the end position. When the test turntable moves to the end position, the test is completed and a signal is returned to the computer; the computer reads the spectrum trace data in the vector network analyzer;

[0049] Step S6: the test software analyzes the read test data and generates directional pattern index parameters.

[0050] The method described in this invention can be used to rapidly test multi-frequency and multi-wavelength patterns in phased array antenna testing. Transmitter / receiver switching and power amplification can be achieved through an RF switch. This test system enables autonomous measurement, performance calculation, and pattern generation of multi-frequency and multi-wavelength patterns for phased array antennas. This improves work efficiency, accelerates research progress on phased array antenna components, and significantly reduces the time required for testing and verifying phased array antenna pattern performance.

[0051] Example 2

[0052] This embodiment is a further refinement of the first embodiment.

[0053] Step 1: Install the phased array antenna test fixture on the mounting platform of the test turntable.

[0054] Step 2: Use an optical alignment device to fix the normal center of the phased array antenna and the normal center of the standard gain antenna on the feed turntable on the same straight line so that their normal directions are aligned.

[0055] It should be noted that the optical alignment device used here is a laser device that can adjust the three-dimensional position. It emits visible light. The light can display the position on the feed turntable after passing through the darkroom environment, and the normal adjustment of the phased array antenna is performed through the optical path.

[0056] Step 3: Open the test software, select the test item as the directional pattern test, click the instrument connection button to connect and control the instrument required for the test, and enter the parameter configuration page to set the parameters for this directional pattern test (such as Figures 4 to 6 After the parameters are set, click Test to start the test.

[0057] It should be noted that:

[0058] 1. The switch parameter card sets the RF link. Users can switch according to the actual test scenario. (For example, the test frequency list in this test is 10 GHz, 10.1 GHz, 10.2 GHz, 10.3 GHz, 10.4 GHz, 10.5 GHz, 10.6 GHz, and 10.7 GHz. Based on the calculation of spatial attenuation and RF link loss, it can be seen that there is no need to select a power amplifier link, so the user needs to select an 18G power amplifier link.)

[0059] 2. In the beam control parameter card, you need to set the phased array antenna's off-axis angle, transmit and receive mode, etc. (This test example uses the transmit mode, so the user needs to select the transmit mode in this parameter module and enter a list of off-axis angles to be tested; this example uses -60°, -30°, -15°, 0°, 15°, 30°, and 60°).

[0060] 3. The intermediate frequency bandwidth, transmission power, etc. need to be set in the vector network analyzer parameter card (such as Figure 2 shown).

[0061] 4. The current, current limit, voltage, voltage limit, etc. need to be set in the power parameter card.

[0062] 5. In the turntable parameter card, you need to set the turntable's motion range, motion interval, polarization axis installation error value, azimuth axis installation error value, pitch axis installation error value, etc. (the turntable's motion range is the minimum and maximum azimuth values ​​scanned by the turntable, such as -90° to +90°. The turntable's motion interval is the angular spacing of each turntable movement, such as 1°).

[0063] 6. In the frequency parameter card, you need to set the frequency list you want to test in the current test (this method only supports frequency lists with regularity, where the regularity means that the difference between any two adjacent frequencies in all frequencies is the same value).

[0064] Step 4: After starting the test, the test software automatically sets the power parameters and moves the test turntable to the test starting position, and compensates for the installation errors of the polarization, pitch, and azimuth axes. (The installation error is the position error that may occur during the installation of the antenna under test. The user enters the compensation value and moves the turntable during the test to achieve error correction. The test software automatically controls the movement of the corresponding axes to the compensated position based on the error values ​​of the polarization, pitch, and azimuth axes.)

[0065] Step 5: The test software searches the vector network analyzer for a corresponding segment parameter configuration file based on the current test parameters. If the corresponding configuration parameters are found, the software directly reads the configuration file. If not, the software configures the segments based on the test parameters, including frequency, beamwidth, and turntable acquisition points. To set segments, configure multiple identical frequency bands. The number of bands is equal to the beamwidth of the phased array antenna under test multiplied by the number of turntable acquisition points. The number of beamwidths is the number of theta angles in the phased array antenna under test (e.g., if the antenna under test requires testing at beamwidths of -60°, -30°, -15°, 0°, 15°, 30°, and 60°, the number of beamwidths is 7). The number of turntable acquisition points is calculated based on the turntable's range and interval (e.g., if the turntable moves from -90° to 90° with a 1° acquisition interval, the turntable has a total of 1267 acquisition points (the absolute value of ((start angle - end angle) / acquisition interval + 1))). Add a segment setting to the vector network analyzer. Set the startFreq parameter to the minimum frequency list value, the stopFreq parameter to the maximum frequency list value, and the sweepPoint parameter to the number of frequency lists (for example, if the frequency list is 10GHz, 10.1GHz, 10.2GHz, 10.3GHz, 10.4GHz, 10.5GHz, 10.6GHz, and 10.7GHz, then set the startFreq parameter to 10GHz, the stopFreq parameter to 10.7GHz, and the sweepPoint parameter to 8). Repeat these steps multiple times to set up multiple identical segments. A total of 7 segments (number of wave positions * number of vector network acquisition points) are required (in the above example, 7 * 181 segments). Once set up, save the configuration to the vector network analyzer's local configuration file and call it directly the next time you perform a test with the same parameters. In this way, all test scanning points are set up on the vector network analyzer. Each point in the vector network segment represents the collection point of the phased array antenna under test at a certain wave position and frequency when the turntable moves to a certain azimuth angle.

[0066] Step 6: Generate a set of beam control instructions based on the antenna beam positions and frequency list to be tested, and send these beam control instructions to the timing controller. For example, if the test beam positions are set to seven angles (-60°, -30°, -15°, 0°, 15°, 30°, and 60°), and the test frequency list is 8 frequencies (10 GHz, 10.1 GHz, 10.2 GHz, 10.3 GHz, 10.4 GHz, 10.5 GHz, 10.6 GHz, and 10.7 GHz), 56 beam control instructions need to be generated and sent to the timing controller's registers for storage.

[0067] Step 7: If Figure 3 As shown in the figure, the test software reads the time required for a single segment scan and automatically calculates the total test duration based on the current test content. For example, if it takes 10µs to set a beam control command for the phased array antenna under test, the timing controller trigger signal pulse width is 10µs, the vector network analyzer trigger signal pulse width (TriggerIn and TriggerOut) is 10µs, the timing controller takes 20µs to issue a command, and the vector network analyzer takes 15µs to scan a single point. The time required for each point measurement (when the turntable is measuring a single beam position and a single frequency at a single azimuth angle) is the beam control command setup time plus the vector network analyzer trigger time (TriggerIn + TriggerOut) plus the timing controller command issuance time plus the vector network analyzer scan time for one point, which is (10 + 10 + 10 * 2 + 20 + 15)µs. The minimum time required for a complete test is calculated by multiplying the single-point measurement time by the number of beam positions, the number of frequency lists, and the number of turntable acquisition points.

[0068] Step 8: The test software selects an appropriate turntable rotation speed based on the total test duration obtained in Step 7, and sets the turntable to move at a constant speed from the initial position to the final position at that speed. The turntable needs to move at a constant speed from the starting position to the final position during the test. For example, if the turntable is set to move from -90° to +90°, and the total test time is calculated to be 180s, then the appropriate speed needs to be set so that the turntable can complete the constant movement of the scanning position within a time greater than 180s. Because the multi-frequency and multi-wavelength phased array antenna pattern test needs to be completed during the constant movement, in order to ensure the time sequence of the test, the turntable movement time needs to be slightly longer than the total test duration calculated in Step 7.

[0069] Step 9: The turntable continuously reports its position information during the uniform movement process. The timing controller automatically checks whether it has reached the trigger position. The trigger position is calculated based on the turntable movement range and the acquisition interval (for example, if the turntable movement range is -90° to +90° and the acquisition interval is 1°, the trigger position is -90°, -89°, -88°...88°, 89°, 90°). If it has reached the trigger position, the timing controller will sequentially send the wave control instruction set in step 6 to the antenna wave control. Each time a wave control instruction is sent, a pulse signal is generated to trigger the vector network analyzer to perform a segment point scanning test. The amplitude and phase values ​​obtained from the test are stored in the vector network analyzer. After the vector network analyzer performs a point scanning test, it will return a trigger signal to the timing controller. After receiving the return signal, the timing controller will send and test the next wave control instruction until the test of all wave control instruction sets set in step 6 is completed.

[0070] Step 10: The timing controller automatically repeats step 9 until it reaches the end position, de-triggering the test and ending the test. After the test, the test software reads the test data from the vector network analyzer. The test results are the spectrum trace data (divided into amplitude and phase data). Because multiple identical segment lists were previously set, the resulting data is the far-field test pattern data.

[0071] Step 11: The test software analyzes the test data, calculates relevant indicators, and generates multi-frequency and multi-wavelength directivity patterns. For example, if the test frequency list is set to 10GHz, 10.1GHz, 10.2GHz, 10.3GHz, 10.4GHz, 10.5GHz, 10.6GHz, and 10.7GHz, the wavelengths are set to -60°, -30°, -15°, 0°, 15°, 30°, and 60°, and the turntable collection points are set to (-90°, -89°…89°, 90°), the first test data obtained is the amplitude and phase data at the antenna frequency of 10GHz and the wavelength of -60° when the turntable is at a -90° azimuth. The second test data is the amplitude and phase data at the antenna frequency of 10.1GHz and the wavelength of -60° when the turntable is at a -90° azimuth. Analyze all test data in sequence to obtain multiple two-dimensional coordinate data graphs with the turntable azimuth angle as the X axis and the test amplitude (or phase) as the Y axis, which are the test direction diagrams. The results are as follows: Figure 7 As shown; (one frequency point and one wave position determine a directional pattern. In the above example, there are 7 wave positions and 8 frequency points, so 56 directional patterns will be obtained in the end).

[0072] The device of the present invention can be used to measure the multi-frequency, multi-wavelength pattern of phased array antennas at normal temperature and pressure. Switching the RF link enables switching between the power amplifier link and the direct link. This test device enables autonomous measurement of multi-frequency, multi-wavelength pattern parameters of phased array antennas, improving work efficiency and accelerating research on phased array antenna components.

[0073] Example 3

[0074] This embodiment is a further refinement of the second embodiment.

[0075] The system consists of a test turntable, phased array antenna test fixture, vector network analyzer, feed turntable, standard gain antenna, RF matrix switch, timing controller, computer, programmable power supply and cabinet. The system layout diagram is shown in Figure 3 .

[0076] 1. Test turntable: used to fix the phased array antenna fixture, to align the phased array antenna fixture with the standard gain antenna of the feed turntable during the test, and to rotate it during the pattern test.

[0077] 2. Phased array antenna test fixture: used to install phased array antenna components. The mounting fixture provides power supply and communication interfaces for the phased array antenna components.

[0078] 3. Vector Network Analyzer: A vector network analyzer (VNA) uses its own signal source to measure scattering parameters of RF microwave components, cables, connectors, and other devices. It combines spectrum analysis, signal generation, and signal separation technologies. It can measure the amplitude and phase of various parameters in single-port and two-port networks, and is used to obtain test results during testing.

[0079] 4. Standard gain antenna: A standard gain antenna is an antenna with known gain characteristics. A linearly polarized horn antenna is often used in engineering projects. It is used to receive or transmit RF signals, and its specifications will also be included in the calculation of the measured phased array antenna specifications in the radiation pattern test.

[0080] 5. RF Matrix Switch: RF matrix switches are essential for phased array antenna pattern testing. Switching between different RF links is accomplished by switching between them. This method uses a far-field anechoic chamber as an example. The test frequency range in this scenario is 1 GHz to 40 GHz and requires support for vector network (VN) or signal source and spectrum analyzer testing.

[0081] like Figure 3 In this example, the switch matrix integrates a 1-18G power amplifier, an 18-40G power amplifier, and a 1-40G low-noise amplifier, allowing users to select appropriate links for signal amplification based on product characteristics when testing different products.

[0082] Take a vector network analyzer as an example (S parameter is S21):

[0083] The user connects ports 1 and 2 of the VN to VN 1 and VN 2 on the switch box, respectively. When the controller receives a link switch to the VN link, switch 1 switches to the VN end. The RF signal emitted by the VN is fed from switch 1 to switch 2. After the user selects an amplified link, the controller switches switches 2 and 3 to the corresponding link. The output signal is amplifier-fed into switch 3 and from there into switch 4. The controller switches switch 4 to the corresponding link based on the user-selected transceiver link (using Transmit 1 as an example). The output signal is fed through switch 4 into switch 5 and then from there into switch 6. From switch 6, the output signal is fed directly into switch 8 and then into Transmit 1 link. (If Transmit 2 link is selected, the signal reaches switch 5 and is fed into switch 7, from switch 7 into switch 9, and finally into Transmit 2 link.)

[0084] The RF signal is transmitted from the transmitter to the receiver, attenuated through air, and captured by the receiver. It is then fed into the switch box from receiver 1. The RF signal is fed from switch 9 into switch 11 and from switch 11 into switch 12 (if the transmitter 2 link is selected, the RF signal will enter receiver 2 and be fed into switch 8, and from switch 8 into switch 11; and from switch 11 into switch 12). The RF signal is fed into switch 13 via switch 12, and then into switch 14 via switch 13. The controller automatically switches switch 14 to the corresponding link based on whether the user has selected a low-noise amplifier link or a direct link. The RF signal is then fed into switch 15, which then feeds into switch 16. From switch 16, the signal is fed into port 2 of the vector network analyzer. From port 2 of the vector network analyzer, the signal is fed into port 2 of the vector network analyzer via the RF line. The signal source plus spectrum analyzer link is essentially the same as the vector network link.

[0085] 6. Timing controller: The timing controller controls the execution order of instructions, the timing of data transmission, and the coordination between various components, ensuring that the various components of the test system perform operations in the correct order and time. By generating, distributing, and synchronizing clock signals, the timing controller ensures that each operation in the system is triggered within the correct clock cycle and that the timing relationships between various components are maintained. The timing controller can ensure that operations are triggered within the correct clock cycle and that the timing relationships between various components are maintained. It can also control delay times to meet the timing requirements between different components.

[0086] 7. Computer: used to store system test software to realize automated testing, data processing and analysis of multi-frequency and multi-wavelength phased array antennas.

[0087] 8. Programmable power supply: used to provide power for phased array antenna devices, and can also be used to calculate some indicators in antenna testing.

[0088] 9. Cabinet: used for integrated test equipment.

[0089] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus.

[0090] Finally, it should be noted that the above descriptions are merely preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art will be able to modify the technical solutions described in the aforementioned embodiments or substitute equivalents for some of the technical features. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A method for rapid testing of phased array antenna patterns based on vector network segmentation, characterized by: The test method includes the following steps: Step S1, setting test parameters in the computer, and configuring the segment according to the set test parameters; Step S2, repeat step S1 to set multiple identical segments: set the number of wave positions * the number of vector network acquisition points to the same segment, and save the configuration to the vector network analyzer after setting. Add a segment setting in the vector network analyzer, set the parameter startFreq to the minimum value of the frequency point list, set the parameter stopFreq to the maximum value of the frequency point list, and set the parameter sweepPoint to the number of frequency point lists. Step S3, the test turntable moves at a constant speed from the initial position to the end position, and during the constant speed movement, the test turntable reports the current position to the timing controller in real time; Step S4: The timing controller receives the position information reported by the test turntable. When the turntable reaches the trigger position, the timing controller issues a beam control instruction to the phased array antenna to control beam formation. The timing controller also sends a pulse signal to the vector network analyzer to trigger the vector network analyzer to perform a segment point scan. Step S5, the test turntable repeats step S4 before moving to the end position. When the test turntable moves to the end position, the test is completed and a signal is returned to the computer; the computer reads the spectrum trace data in the vector network analyzer; Step S6: the test software analyzes the read test data and generates directional pattern index parameters; Before testing, calculate the RF link attenuation and air attenuation based on the frequency of the phased array antenna to be tested and select an appropriate RF link. Specifically: Where α is the attenuation constant in dB / m, and L1 is the cable length.

2. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 1, characterized in that: The free space loss calculation is as follows: Where: d = distance between antennas in km; f = frequency in GHz; c = speed of light in vacuum in meters per second.

3. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 2, characterized in that: Electromagnetic waves in free space propagate in the form of plane waves. The propagation loss is proportional to the square of the distance. The attenuation Pr is calculated by the following formula: Where Pt is the transmit power, Gt is the transmit antenna gain, L2 is the free space loss, and Gr is the receive antenna gain. According to the previous free space loss calculation formula, the higher the frequency, the greater the free space loss.

4. The method for rapid testing of phased array antenna patterns based on vector network segmentation according to claim 3, characterized in that: Before testing, you also need to configure the beam control parameters of the phased array antenna under test. The beam control parameters include the antenna transmit and receive mode, the Theta angle list, and power on and off of the entire array.

5. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 1, characterized in that: Before testing, you also need to configure the vector network analyzer parameters, including S parameters, intermediate frequency bandwidth, transmit power, and test mode.

6. The method for rapidly testing the radiation pattern of a phased array antenna based on a vector network segment function according to claim 1, characterized in that: Before testing, you also need to configure the test turntable parameters, which include the start and end positions of the turntable movement, the azimuth angle movement interval, the polarization angle value, the azimuth error correction, and the pitch error correction.

7. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 1, characterized in that: Before testing, you also need to configure a frequency list. The frequencies in the frequency list must meet the following requirements: the subtraction of any two adjacent frequencies is the same value. The frequency list is used to set vector network analyzer parameters and phased array antenna beam control commands.

8. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 1, characterized in that: Before conducting a test, you also need to configure the test type, whether to test cross-polarization, whether to test the axial ratio, the fluctuation error threshold, and the test task name. These parameters are used to calculate the indicator value.

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