TCONLESS screen test circuit, method and device and medium

Abstract

The invention discloses a TCONLESS screen testing circuit, method and device and a medium, and relates to the technical field of screen testing, and the disclosed TCONLESS screen testing circuit comprises a signal gating board, embedded equipment, a main controller and information source acquisition equipment; wherein the preset movement, the signal gating board and the TCONLESS screen to be tested are sequentially connected in series, the main controller is connected with the embedded device and the information source acquisition device, and the embedded device and the information source acquisition device are both connected with the signal gating board. The technical scheme of the invention aims to solve the technical problem of how to improve the time sequence test efficiency of the TCONLESS screen.

Description

Technical Field

[0001] The present application relates to the field of screen testing technology, and in particular to a TCONLESS screen testing circuit, method, device and medium. Background Art

[0002] TCONLESS screen testing is a key step in verifying the performance of display devices using the TCONLESS architecture, and it is essential to ensure that the screen displays normally. At present, the TCONLESS screen testing process mainly relies on manual operation, but since TCONLESS screen testing has high professional requirements for testers and the testing process is relatively cumbersome and complicated, it leads to low testing efficiency.

[0003] Therefore, how to improve the efficiency of TCONLESS screen testing is a technical problem that needs to be solved by those skilled in the art. Summary of the invention

[0004] The main purpose of the present application is to provide a TCONLESS screen test circuit, method, device and medium, aiming to solve the technical problem of how to improve the efficiency of TCONLESS screen timing test.

[0005] To achieve the above-mentioned purpose, the present application proposes a TCONLESS screen test circuit, the TCONLESS screen test circuit comprising: a signal gating board, an embedded device, a main controller and a signal source acquisition device;

[0006] Among them, the preset movement, the signal gating board and the TCONLESS screen to be tested are connected in series in sequence, the main controller is connected to the embedded device and the signal source acquisition device, and the embedded device and the signal source acquisition device are both connected to the signal gating board;

[0007] The main controller is used to output test instructions to the embedded device;

[0008] The embedded device is used to convert the test instruction into a level signal, and transmit the level signal to the signal gating board;

[0009] The signal gating board is used to determine a target switch based on the level signal and turn on the target switch;

[0010] The information source acquisition device is used to obtain test data based on the target switch and transmit the test data to the main controller;

[0011] The main controller is also used to analyze the test data and automatically output the test results.

[0012] In addition, to achieve the above purpose, the present application also proposes a TCONLESS screen test method, which is applied to the above TCONLESS screen test circuit, and the TCONLESS screen test method includes:

[0013] Output test instructions to the embedded device through the main controller;

[0014] Converting the test instruction into a level signal through the embedded device, and transmitting the level signal to the signal gating board;

[0015] Determine a target switch based on the level signal through the signal gating board, and close the target switch;

[0016] Acquire test data based on the target switch through a signal source acquisition device, and transmit the test data to the main controller;

[0017] The main controller analyzes the test data and automatically outputs the test results.

[0018] In addition, to achieve the above-mentioned purpose, the present application also proposes a TCONLESS screen testing device, which includes the TCONLESS screen testing circuit as described above.

[0019] In addition, to achieve the above-mentioned purpose, the present application also proposes a storage medium, which is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by the processor, the steps of the TCONLESS screen testing method described above are implemented. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0021] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0022] Figure 1 This is a schematic diagram of a circuit framework corresponding to the first embodiment of the TCONLESS screen test circuit of the present application;

[0023] Figure 2 This is a circuit structure diagram of a specific embodiment of the TCONLESS screen test circuit of the present application;

[0024] Figure 3 This is a flow chart of the first embodiment of the TCONLESS screen testing method of the present application;

[0025] Figure 4 This is a test flow diagram of the TCONLESS screen test method of this application;

[0026] Figure 5 This is a schematic diagram of the module structure of the TCONLESS screen testing device according to an embodiment of the present application.

[0027] Description of Figure Numbers:

[0028] 10, signal selection board; 20, embedded device; 30, main controller; 40, signal source acquisition device; 50, movement; 60, TCONLESS screen.

[0029] The purpose, features and advantages of this application will be further described in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0030] It should be understood that the specific embodiments described herein are only used to explain the technical solutions of the present application and are not used to limit the present application.

[0031] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0032] Please refer to Figure 1 , Figure 1 This is a circuit framework schematic diagram corresponding to the first embodiment of the TCONLESS screen test circuit of the present application.

[0033] In this embodiment, the TCONLESS screen test circuit includes: a signal gating board 10, an embedded device 20, a main controller 30 and a signal source acquisition device 40;

[0034] Among them, the preset movement 50, the signal gating board 10 and the TCONLESS screen 60 to be tested are connected in series in sequence, the main controller 30 is connected to the embedded device 20 and the information source acquisition device 40, and the embedded device 20 and the information source acquisition device 40 are both connected to the signal gating board 10;

[0035] The main controller 30 is used to output test instructions to the embedded device 20;

[0036] The embedded device 20 is used to convert the test instruction into a level signal, and transmit the level signal to the signal gating board 10;

[0037] The signal gating board 10 is used to determine a target switch based on the level signal and turn on the target switch;

[0038] The information source acquisition device 40 is used to obtain test data based on the target switch and transmit the test data to the main controller 30;

[0039] The main controller 30 is also used to analyze the test data and automatically output the test results.

[0040] It is understandable that a plurality of gate nodes are set on the signal gating board, and then the signal can be selectively led out through the gate nodes. Therefore, the above-mentioned target switch is the gate node that needs to be turned on, so that the signal can be output based on the turned-on gate node. In a feasible implementation, the gate node includes: a relay, a MOSFET circuit.

[0041] In a feasible implementation, the above embedded device may be a single chip microcomputer or a switch array controller, etc., which is not limited in the present application. In this embodiment, the embedded device only needs to have the function of converting instructions into levels.

[0042] In a feasible implementation, the above-mentioned information source acquisition device may be an oscilloscope, a logic analyzer, a voltage and current meter, etc. The information source acquisition device may be set based on the test requirements, and this application does not limit this.

[0043] In a feasible implementation, the main controller may be a chip with a control function, or may be a device with a control function, and this application does not impose any limitation on this.

[0044] In a feasible implementation manner, the main controller is connected to the information source acquisition device via a socket, or the main controller is connected in series with the information source acquisition device.

[0045] In this embodiment, if the physical location of the information source acquisition device is close to the physical location of the main controller, the information source acquisition device and the main controller can be connected in a serial manner. If the physical location of the information source acquisition device is far away from the physical location of the main controller, connecting in a serial manner will consume a lot of wires, so at this time, the connection can be made in a socket manner. Therefore, the TCONLESS screen test circuit proposed in this application can be applied to various scenarios. It can be seen that this application improves the versatility of the TCONLESS screen test circuit through a socket connection or a serial connection.

[0046] Please refer to Figure 2 , Figure 2 This is a schematic diagram of the circuit structure of a specific embodiment of the TCONLESS screen test circuit of this application. Figure 2In the test, the operator can convey information to the main controller based on the terminal, and then the automatic test can be realized through the main controller, switch array controller, TCONLESS signal selection board and signal source acquisition equipment. Figure 2 The source signal input direction refers to the connection with the movement, and the Open Cell display (screen OC) signal output direction refers to the connection with the TCONLESS screen. Figure 2 In the example, the main controller controls the switch array through the serial port, thereby indirectly controlling the switch nodes on the TCONLESS signal gating board. Then, based on the closed switch nodes, the signal source acquisition device can collect test data for analysis by the main controller to obtain test results.

[0047] In this embodiment, the main controller is used to output instructions to the embedded controller so that the embedded controller outputs a level to the signal gating board based on the instruction. Then, the signal gating board can close the switch corresponding to the instruction based on the level, so that when the TCONLESS screen is tested, the test data will be transmitted to the signal source acquisition device through the path obtained by closing the switch, and then the signal source acquisition device can transmit the test data to the main controller with data processing function, and then judge the performance of the TCONLESS screen based on the main controller, or judge whether the TCONLESS screen has passed the test. Therefore, the TCONLESS screen test circuit proposed in this application can automatically test the TCONLESS screen, avoid the waste of manpower in the TCONLESS screen test process, and thus improve the efficiency of the TCONLESS screen test.

[0048] In addition, based on the above TCONLESS screen test circuit, the present application also proposes a TCONLESS screen test method applied to the above TCONLESS screen test circuit. Figure 3 , Figure 3 This is a flow chart of the first embodiment of the TCONLESS screen testing method of the present application.

[0049] In this embodiment, the TCONLESS screen testing method includes steps S10 to S50:

[0050] Step S10, outputting a test instruction to the embedded device through the main controller;

[0051] Step S20, converting the test instruction into a level signal through the embedded device, and transmitting the level signal to the signal gating board;

[0052] Step S30, determining a target switch based on the level signal through the signal gating board, and closing the target switch;

[0053] Step S40, acquiring test data based on the target switch through a signal source acquisition device, and transmitting the test data to the main controller;

[0054] Step S50, analyzing the test data through the main controller and automatically outputting the test results.

[0055] In one embodiment, the above step S50 includes:

[0056] Step S501, comparing each value in the test data through each value range in the main controller to obtain a value comparison result;

[0057] It should be noted that different parameters can be set with different numerical ranges. If it is detected that the value in the test data belongs to the numerical range corresponding to the parameter, it indicates that the value is normal; correspondingly, if it is detected that the value in the test data does not belong to the numerical range corresponding to the parameter, it indicates that the value is abnormal. The above numerical comparison results are used to indicate whether each value in the test data is normal.

[0058] Step S502: determining a test result based on the numerical comparison result, and automatically outputting the test result.

[0059] It should be noted that the test result may be a test pass or a test fail. In addition, the test result may also be a test report. This application does not limit the specific content of the test result.

[0060] For example, when there are three values ​​in the test data (parameter 1: a, parameter 2: b, parameter 3: c), for value a, it is necessary to compare value a with the value range corresponding to parameter 1 to determine whether value a is normal; for value b, it is necessary to compare value b with the value range corresponding to parameter 2 to determine whether value b is normal; for value c, it is necessary to compare value c with the value range corresponding to parameter 3 to determine whether value c is normal. Then, the test result is determined based on the comparison results of values ​​a, b and c.

[0061] In this embodiment, the present application can independently output the test instructions and analyze the test data through the main controller, and the embedded device can match the signal gating board to convert the test instructions output by the main controller into the corresponding level, thereby prompting the corresponding switch of the signal gating board to close, forming a path for the flow of signals, and then, the signal source acquisition device can obtain the test data based on the path and transmit it to the main controller. Therefore, through the TCONLESS screen test method proposed in this application, the TCONLESS screen can be automatically tested, thereby improving the efficiency of the TCONLESS screen test.

[0062] Further, based on the above-mentioned first embodiment of the TCONLESS screen testing method of the present application, a second embodiment of the TCONLESS screen testing method of the present application is proposed.

[0063] In this embodiment, before the above step S10, the method further includes:

[0064] Step S100, receiving a test item name through the main controller, and obtaining a preset switch identifier corresponding to the test item name, wherein the switch identifier is used to represent one or more switches;

[0065] Step S200: generating a test instruction according to the switch identifier.

[0066] It is understandable that when testing the TCONLESS screen, multiple test items may be included, and different test items may obtain different test data. Therefore, before outputting the test instruction through the main controller, it is also necessary to receive the test item name output by the user from the interactive page, so that the switch to be turned on can be determined based on the test item name, and then the test instruction can be generated based on the switch to be turned on.

[0067] Exemplarily, it is assumed that there are 5 gating nodes (5 switches, switch 1 to switch 5) on the signal gating board, the switches corresponding to the test item of GOA timing test are switch 1 and switch 2, and the switches corresponding to the test of power-on timing test are switch 3 to switch 5. Thus, when it is detected that the name of the test item is "GOA timing test", the switch identifiers of switch 1 and switch 2 will be obtained, and a test instruction will be generated based on the switch identifiers of switch 1 and switch 2. When it is detected that the name of the test item is "power-on timing test", the switch identifiers of switch 3 to switch 5 will be obtained, and a test instruction will be generated based on the switch identifiers of switch 3 to switch 5. Of course, in a feasible implementation, it is also possible to use identifier 1 to represent switch 1 and switch 2, and use identifier 2 to represent switch 3 to switch 5. Thus, when it is detected that the name of the test item is "GOA timing test", identifier 1 can be obtained. When it is detected that the name of the test item is "power-on timing test", identifier 2 can be obtained.

[0068] In this embodiment, the present application presets the correspondence between the test items and the switches, so that the main controller can quickly determine the test instructions based on the received test item names, thereby improving the working efficiency of the main controller.

[0069] In a feasible implementation manner, before the above step S40, the method further includes:

[0070] Step S300, obtaining preset data acquisition parameters corresponding to the test item name, and transmitting the data acquisition parameters to the information source acquisition device;

[0071] Step S400: Using the data acquisition parameters as working parameters of the information source acquisition device.

[0072] It is understandable that data acquisition parameters refer to the working parameters of the data acquisition device (source acquisition device) when collecting data. During testing, different test items also have certain requirements for the specific parameters of the acquisition device. Therefore, after determining the test item, it is also necessary to configure the working parameters of the source acquisition device according to the test item, so that the working parameters of the source acquisition device meet the requirements of the test item, thereby improving the effectiveness of the collected data.

[0073] In a feasible implementation manner, after the above step S40, the method further includes:

[0074] Step S500, outputting a switch disconnection instruction to the embedded device through the main controller;

[0075] It should be noted that the switch opening instruction is used to control the opening of a closed switch in the signal gating board.

[0076] Step S600, generating a target level signal based on the switch disconnection instruction by the embedded device, and transmitting the target level signal to the signal gating board;

[0077] It should be noted that the target level signal is a level signal corresponding to the switch opening instruction.

[0078] Step S700: disconnecting the target switch based on the target level signal through the signal gating board.

[0079] In this embodiment, after obtaining the test data required for the current test item, it is also necessary to control the closed switch in the signal gating board to be disconnected, so as to restore the signal gating board to a default state and prevent other test items from being affected by the closed switch of the current test item. It can be seen that in this embodiment, the present application improves the accuracy of test data collection by disconnecting the closed switch in the signal gating board after obtaining the test data.

[0080] In a feasible implementation manner, after the above step S50, the method further includes:

[0081] Step S800: Outputting a device reset instruction to the embedded device and the information source acquisition device through the main controller.

[0082] It should be noted that the device reset instruction refers to an instruction used to control the device to restore default settings.

[0083] In this embodiment, the present application avoids the problem of resource waste caused by the embedded device and the source acquisition device continuing to run after the test results are output by controlling the embedded device and the source acquisition device to restore the default settings based on the device reset instruction after the test results are output.

[0084] Based on the first embodiment and the second embodiment of the TCONLESS screen testing method of the present application, a specific embodiment of the TCONLESS screen testing method of the present application is proposed.

[0085] Please refer to Figure 4 , Figure 4 This is a test flow diagram of the TCONLESS screen test method of this application. In this embodiment, the test steps are as follows:

[0086] Step 1: The user determines the project and platform to be tested, confirms that the signal gating board is compatible with the system to be tested (the movement and TCONLESS screen), and that the driver of the signal source acquisition device is ready. This step is intended to confirm the testability of the system to be tested. If the system is not yet compatible, it is necessary to make a gating board and a measuring device driver.

[0087] Step 2: Connect the gate board to the system under test, and connect the switch array controller (embedded device) and the signal source acquisition device to the main controller (such as a PC). This step is intended to establish a complete electrical connection and provide a basis for subsequent automated measurements.

[0088] Step 3: Start the program on the main controller to initialize the switch array controller and the signal source acquisition device, and then enter the standby state after the switch array controller and the signal source acquisition device successfully complete the self-test. This step is intended to allow the software to take over the test process, abstract the corresponding physical devices and methods into objects in the program sense for operation, and provide programmatic testing capabilities.

[0089] Step 4: The user selects the test script to be performed. The test script consists of one or more predefined commands and judgment methods. A typical command execution process may include:

[0090] a. Communicate with the signal source acquisition device and set the acquisition mode of the device to match the signal to be measured.

[0091] b. By communicating with the switch array controller, the switch node (on the gate board) is set to open the path from the signal to be measured to the signal source acquisition device.

[0092] c. Set up the signal source acquisition equipment and perform data acquisition.

[0093] d. Read and save the data in the source acquisition device.

[0094] e. Communicate with the switch array controller, close the path from the signal to be tested to the signal source acquisition device, and reset the switch array controller.

[0095] f. Communicate with the data acquisition device, stop data acquisition, return the device acquisition mode to the initial state, and reset the acquisition device.

[0096] Note: The above steps a to f usually only need to be executed once in order. However, there are also cases where they are executed out of order or multiple times. Regardless of the execution situation, the following principles should be followed:

[0097] 1) Set up the signal source acquisition device first, then input the signal;

[0098] 2) One setting corresponds to at least one reset.

[0099] This step is intended to complete the measurement process and realize the measurement of the signal to be measured.

[0100] Step 5: Execute the judgment process in the script, and finally judge the signal by processing the saved data in a variety of data processing methods including but not limited to quantization, conversion, and prediction. After traversing all test items, the report can be output in a variety of formats. This step is intended to complete the data processing and result judgment of the collected measurement results, and output the judgment results and measurement values ​​in a humanized way.

[0101] Step 6: The program is in standby mode, waiting for the user to enter a new test or exit. If yes, you can return to step 4 to continue the test. Otherwise, proceed to step 7. When this step is executed, the program part has been executed and the device is in standby mode. You can start a new measurement process as needed, or execute the exit program.

[0102] Step 7: The program communicates with the switch array controller and the signal source acquisition device to reset both and return to standby mode. The program then terminates itself. This step is intended to programmatically terminate the measurement so that the operator can safely disconnect electrical connections, shut down the device / computer, etc.

[0103] It should be noted that the above examples are only used to understand the present application and do not constitute a limitation on the TCONLESS screen testing method of the present application. More simple transformations based on this technical concept are all within the protection scope of the present application.

[0104] This application also provides a TCONLESS screen test device, please refer to Figure 5 , the TCONLESS screen testing device includes the above-mentioned TCONLESS screen testing circuit.

[0105] The TCONLESS screen test device provided by the present application adopts the TCONLESS screen test method in the above embodiment, which can solve the technical problem of how to improve the efficiency of TCONLESS screen timing test. Compared with the prior art, the beneficial effects of the TCONLESS screen test device provided by the present application are the same as the beneficial effects of the TCONLESS screen test method provided by the above embodiment, and the other technical features in the TCONLESS screen test device are the same as the features disclosed in the above embodiment method, which will not be repeated here.

[0106] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

[0107] The present application provides a computer-readable storage medium having computer-readable program test instructions (ie, computer programs) stored thereon, the computer-readable program test instructions being used to execute the TCONLESS screen test method in the above-mentioned embodiment.

[0108] The computer-readable storage medium provided in the present application may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM: Random Access Memory), a read-only memory (ROM: Read On ly Memory), an erasable programmable read-only memory (EPROM: Erasable Programmab le Read On ly Memory or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM: CD-Read On ly Memory), an optical storage device, a magnetic storage device, or any suitable combination thereof. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program, which may be used by or in combination with a test instruction execution system, system or device. The program code contained on the computer-readable storage medium may be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency: Radio Frequency), etc., or any suitable combination thereof.

[0109] The computer-readable storage medium may be included in the TCONLESS screen test device; or may exist independently without being assembled into the TCONLESS screen test device.

[0110] The above-mentioned computer-readable storage medium carries one or more programs. When the above-mentioned one or more programs are executed by the TCONLESS screen test device, the TCONLESS screen test device: outputs test instructions to the embedded device through the main controller; converts the test instructions into level signals through the embedded device, and transmits the level signals to the signal selection board; determines the target switch based on the level signal through the signal selection board, and closes the target switch; obtains test data based on the target switch through the signal source acquisition device, and transmits the test data to the main controller; analyzes the test data through the main controller and automatically outputs the test results.

[0111] The computer program code for performing the operation of the present application can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages, such as Java, Smalltalk, C++, and conventional procedural programming languages, such as "C" language or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as an independent software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computer (for example, using an Internet service provider to connect through the Internet).

[0112] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present application. In this regard, each square box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable test instructions for realizing the specified logical function. It should also be noted that in some implementations as replacements, the functions marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two square boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs the specified function or operation, or can be implemented with a combination of dedicated hardware and computer test instructions.

[0113] The modules involved in the embodiments described in this application may be implemented by software or hardware, wherein the name of the module does not constitute a limitation on the unit itself in some cases.

[0114] The readable storage medium provided by the present application is a computer-readable storage medium, which stores computer-readable program test instructions (i.e., computer programs) for executing the above-mentioned TCONLESS screen test method, and can solve the technical problem of how to improve the efficiency of TCONLESS screen timing test. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided by the present application are the same as the beneficial effects of the TCONLESS screen test method provided by the above-mentioned embodiment, and will not be repeated here.

[0115] The above descriptions are only some embodiments of the present application, and are not intended to limit the patent scope of the present application. All equivalent structural changes made using the contents of the present application specification and drawings under the technical concept of the present application, or direct / indirect applications in other related technical fields are included in the patent protection scope of the present application.

Claims

1. A TCONLESS screen test circuit, characterized in that: The TCONLESS screen test circuit includes: a signal gating board, an embedded device, a main controller and a signal source acquisition device; Among them, the preset movement, the signal gating board and the TCONLESS screen to be tested are connected in series in sequence, the main controller is connected to the embedded device and the signal source acquisition device, and the embedded device and the signal source acquisition device are both connected to the signal gating board; The main controller is used to output test instructions to the embedded device; The embedded device is used to convert the test instruction into a level signal, and transmit the level signal to the signal gating board; The signal gating board is used to determine a target switch based on the level signal and turn on the target switch; The information source acquisition device is used to obtain test data based on the target switch and transmit the test data to the main controller; The main controller is also used to analyze the test data and automatically output the test results.

2. The TCONLESS screen test circuit as claimed in claim 1, characterized in that: The main controller is connected to the information source acquisition device via a socket, or the main controller is connected in series with the information source acquisition device.

3. A TCONLESS screen testing method, characterized in that: The TCONLESS screen test method is applied to the TCONLESS screen test circuit according to claim 1 or claim 2, and the TCONLESS screen test method comprises: Output test instructions to the embedded device through the main controller; Converting the test instruction into a level signal through the embedded device, and transmitting the level signal to the signal gating board; Determine a target switch based on the level signal through the signal gating board, and close the target switch; Acquire test data based on the target switch through a signal source acquisition device, and transmit the test data to the main controller; The main controller analyzes the test data and automatically outputs the test results.

4. The TCONLESS screen testing method according to claim 3, characterized in that: Before the step of outputting the test instruction to the embedded device through the main controller, the method further includes: Receiving a test item name through the main controller, and obtaining a preset switch identifier corresponding to the test item name, wherein the switch identifier is used to represent one or more switches; A test instruction is generated according to the switch identifier.

5. The TCONLESS screen testing method according to claim 4, characterized in that: Before the step of acquiring test data based on the target switch by using a signal source acquisition device, the method further includes: Obtaining preset data acquisition parameters corresponding to the test item name, and transmitting the data acquisition parameters to the information source acquisition device; The data acquisition parameters are used as working parameters of the information source acquisition device.

6. The TCONLESS screen testing method according to claim 3, characterized in that: After the step of acquiring test data based on the target switch by using a signal source acquisition device, the method further includes: Outputting a switch disconnection instruction to the embedded device through the main controller; generating a target level signal based on the switch disconnection instruction by the embedded device, and transmitting the target level signal to the signal gating board; The target switch is turned off based on the target level signal by the signal gating board.

7. The TCONLESS screen testing method according to claim 3, characterized in that: After the step of automatically outputting the test results, the method further includes: The main controller outputs a device reset instruction to the embedded device and the information source acquisition device.

8. The TCONLESS screen testing method according to claim 3, characterized in that: The step of analyzing the test data by the main controller and automatically outputting the test results comprises: Compare each value in the test data through each value range in the main controller to obtain a value comparison result; A test result is determined based on the numerical comparison result, and the test result is automatically output.

9. A TCONLESS screen testing device, characterized in that: The TCONLESS screen testing device comprises the TCONLESS screen testing circuit as described in any one of claim 1 or claim 2 above.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the TCONLESS screen testing method according to any one of claims 3 to 8 are implemented.

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