Testing device for USB chip

Abstract

The invention relates to the technical field of USB chip testing, and particularly discloses a USB chip testing device which comprises a base, a placing table and a testing table, the placing table is connected to the base, the testing table is connected to the base, a USB plug is placed on the placing table, the testing table is used for testing whether a USB plug chip can be normally used or not, a plurality of testing ports are formed in the testing table, and the testing ports are used for testing whether the USB plug chip can be normally used or not. A plurality of test ports are arranged on the test board, test chips are arranged in the test ports, the automatic test assembly is connected to the test board and connected with the test chips, the automatic test assembly is used for testing USB chips, and the test chips may be worn and damaged after being used for a long time. Therefore, the automatic test assembly can detect whether the test chip is damaged or not while testing the USB chip, so that the condition of detection errors is prevented, and the quality condition of the USB chip can be ensured to be accurately tested.

Description

Technical Field

[0001] The invention relates to the technical field of USB chip testing, in particular to a testing device for a USB chip. Background Art

[0002] USB chip is an integrated circuit used to realize USB communication function and is widely used in various electronic devices. USB chips can be divided into three categories according to their functions and uses: USB host controller chip, USB hub chip and USB functional device chip. The USB plug is the physical part of the interface, and the USB chip is built into the device to handle USB communication. The USB chip and USB plug complement each other and jointly realize the communication and function of USB devices.

[0003] The production of USB plugs is a complex process that integrates multiple disciplines such as precision machinery, material science, and electronic engineering. The testing process in the production process of USB plugs is crucial. It ensures the electrical performance, mechanical strength, durability, and safety of the product, thereby meeting market demand and regulatory requirements. However, when the tester tests the USB plug, the USB plug will be repeatedly plugged in and out, which may wear out the test chip in the tester and affect the test results of the USB plug. For this reason, we propose a test device for USB chips. Summary of the invention

[0004] The purpose of the present invention is to provide a test device for a USB chip to solve the problem that when the above-mentioned tester tests the USB plug, the USB plug will be repeatedly inserted and removed, which may wear out the test chip in the tester and affect the test result of the USB plug.

[0005] To achieve the above object, the present invention provides the following technical solutions: a test device for a USB chip, comprising: a base, a placement table and a test table, the placement table is connected to the base, the test table is connected to the base, a USB plug is placed on the placement table, the test table is used to test whether the USB plug chip can be used normally, and a plurality of test ports are provided on the test table, and test chips are arranged in the plurality of test ports;

[0006] Also includes:

[0007] The adjusting component is connected to the base and the adjusting component is connected to the test bench. The adjusting component is used to move the test bench, so that the adjusting component can automatically align the USB plug.

[0008] An automatic test component, the automatic test component is connected to the test bench and is connected to the test chip, and the automatic test component is used to test the USB chip;

[0009] The alarm component is connected to the base, and is used to prompt the staff when the USB plug or the automatic test component fails.

[0010] The adjustment component includes two grooves, the two grooves are opened on the base, and the two grooves are opened at two ends of the test bench respectively, and a motor 1 is installed in one of the grooves.

[0011] Among them, a lead screw is connected to the output shaft of the motor one, the other end of the lead screw is rotatably connected to the inner wall of the groove, and a sliding rod is fixedly connected in another groove.

[0012] Wherein, both ends of the test bench are connected with moving blocks, one of the moving blocks is threadedly connected to the lead screw, and the other moving block is slidably connected to the slide rod.

[0013] The automatic test component includes a placement slot, which is arranged on the test bench and corresponds to the test port, and a driving member is connected in the placement slot.

[0014] Among them, the driving part includes motor 2, which is connected in the placement groove. A connecting rod is connected to the output shaft of motor 2, a threaded groove is opened on the connecting rod, a movable plate is threadedly connected to the threaded groove, and the movable plate is slidably connected to the placement groove.

[0015] Among them, a driving plate is clamped on the movable plate, a spring is connected to the driving plate, the other end of the spring is connected to a rectangular plate, the rectangular plate is connected in the placement groove, an electromagnet is provided on one side of the driving plate, and the electromagnet is connected to the inner wall of the placement groove.

[0016] Among them, a sliding hole is opened on the placement groove, and the sliding hole connects the placement groove and the test port. A sliding block is slidably connected in the sliding hole, and the sliding block is connected to the test chip. The sliding block is connected to an electric telescopic rod, and the electric telescopic rod is connected in the placement groove.

[0017] The alarm component includes a horizontal plate, which is connected in the placement slot and corresponds to the driving plate. A switch is arranged in the placement slot and corresponds to the horizontal plate.

[0018] Wherein, an alarm light is arranged on the base, and a switch on the horizontal plate is used for controlling the alarm light.

[0019] The present invention has at least the following beneficial effects: by setting an adjustment component and an automatic test component, the adjustment component is connected to the base, and the adjustment component is connected to the test bench, the adjustment component is used to move the test bench, and then the adjustment component can automatically align the USB plug, when the USB plugs are placed on the placement table, the adjustment component can automatically move the position of the test bench, and then automatically test the USB plug, making it more convenient to detect the USB plug and saving test time, the automatic test component is connected to the test bench, and the automatic test component is connected to the test chip, the automatic test component is used to test the USB chip, the test chip may be worn and damaged after long-term use, and then the automatic test component can detect whether the test chip is damaged while testing the USB chip, thereby preventing detection errors and ensuring that the quality of the USB chip can be accurately tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0021] Figure 2 This is a schematic diagram of the structure of the regulating component of the present invention;

[0022] Figure 3 It is a schematic diagram of the local structure of the regulating component of the present invention;

[0023] Figure 4 This is a schematic diagram of the structure of the test bench of the present invention;

[0024] Figure 5 It is a schematic diagram of the local structure of the test bench of the present invention;

[0025] Figure 6 for Figure 5 A magnified schematic diagram of the middle A area;

[0026] Figure 7 This is a schematic diagram of the structure of the automatic test component of the present invention;

[0027] Figure 8 It is a schematic diagram of the structure of the driving member of the present invention;

[0028] Fig. 9 for Figure 8 Enlarged schematic diagram of area B in the middle.

[0029] In the figure: 1. base; 2. placement table; 3. USB plug; 4. test table; 5. test port; 6. test chip; 7. adjustment component; 71. groove; 8. screw rod; 9. slide rod; 10. moving block; 11. motor one; 12. automatic test component; 121. placement slot; 13. drive member; 14. connecting rod; 15. electromagnet; 16. spring; 17. motor two; 18. drive plate; 19. threaded groove; 20. slide hole; 21. sliding block; 22. rectangular plate; 23. electric telescopic rod; 24. torsion spring; 25. switch; 26. horizontal plate; 27. moving plate; 28. alarm component; 29. ​​alarm light. DETAILED DESCRIPTION

[0030] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0031] Embodiment 1

[0032] See also Figures 1 to 9 The present invention provides a technical solution: a test device for a USB chip, comprising: a base 1, a placement table 2 and a test table 4, the placement table 2 is connected to the base 1, the test table 4 is connected to the base 1, a USB plug 3 is placed on the placement table 2, the test table 4 is used to test whether the USB plug 3 chip can be used normally, a plurality of test ports 5 are opened on the test table 4, and a test chip 6 is arranged in each of the plurality of test ports 5, and the placement table 2 is set to place the USB plug 3, so as to detect whether the USB plug 3 can be used and whether the production quality meets the standard;

[0033] Also includes:

[0034] The adjusting component 7 is connected to the base 1 and the adjusting component 7 is connected to the test bench 4. The adjusting component 7 is used to move the test bench 4, so that the adjusting component 7 can automatically align the USB plug 3. When the placement holes on the placement table 2 are all filled with USB plugs 3, the adjusting component 7 can automatically move the position of the test bench 4, so as to automatically test the USB plug 3, making it more convenient to detect the USB plug 3 and saving test time.

[0035] An automatic test component 12, the automatic test component 12 is connected to the test bench 4, and the automatic test component 12 is connected to the test chip 6. The automatic test component 12 is used to test the USB chip. The test chip 6 may be worn and damaged after long-term use. The automatic test component 12 can detect whether the test chip 6 is damaged while testing the USB chip, thereby preventing detection errors and ensuring that the quality of the USB chip can be accurately tested;

[0036] The alarm component 28 is connected to the base 1. When the USB plug 3 or the automatic test component 12 fails, the alarm component 28 is used to remind the staff. When the automatic test component 12 detects that there is a problem with the test bench 4, the alarm component 28 can sound an alarm so that the staff can replace and repair the test bench 4 in time.

[0037] The adjustment component 7 includes two grooves 71, the two grooves 71 are opened on the base 1, and the two grooves 71 are respectively opened at both ends of the test bench 4, and a motor 11 is installed in one of the grooves 71. By setting the grooves 71, the motor 11 can be protected, thereby extending the service life of the motor 11. An infrared sensor is provided on the placement table 2. When the USB plugs 3 are placed in the placement holes on the placement table 2, the motor 11 will be triggered to start.

[0038] A screw rod 8 is connected to the output shaft of the motor 11, and the other end of the screw rod 8 is rotatably connected to the inner wall of the groove 71. A sliding rod 9 is fixedly connected in the other groove 71. When the motor 11 is started, the motor 11 drives the screw rod 8 to rotate. Both ends of the test bench 4 are connected with moving blocks 10, one of which is threadedly connected to the screw rod 8, and the other moving block 10 is slidably connected to the sliding rod 9. When the screw rod 8 rotates forward, the screw rod 8 drives one of the moving blocks 10 to move, and then the other moving block 10 moves on the sliding rod 9. The two moving blocks 10 can be used together to drive the test bench 4 to move, so that the USB plug 3 is inserted into the test port 5, and then the chip in the USB plug 3 can be tested. Ten seconds after the USB plug 3 is inserted into the test port 5, the motor 11 reverses, thereby driving the screw rod 8 to reverse, and the reversal of the screw rod 8 drives the moving block 10 to reverse, thereby driving the test bench 4 to move and return to its original position.

[0039] The automatic test component 12 includes a placement slot 121, which is opened on the test bench 4 and corresponds to the test port 5. A driver 13 is connected to the placement slot 121. By setting the placement slot 121, the driver 13 can be protected, thereby extending the service life of the driver 13. By setting the driver 13, it can be automatically tested whether there is a fault in the chip in the USB plug 3 or the test chip 6.

[0040] The driving member 13 includes a second motor 17, which is connected to the placement groove 121. The output shaft of the second motor 17 is connected to a connecting rod 14, and a threaded groove 19 is provided on the connecting rod 14. A movable plate 27 is threadedly connected to the threaded groove 19, and the movable plate 27 is slidably connected to the placement groove 121. When the USB plug 3 is inserted into the test port 5 and there is no power supply, the second motor 17 is started, and the second motor 17 drives the connecting rod 14 to rotate, so that the movable plate 27 can move vertically on the threaded groove 19. The second motor 17 is automatically turned off after being started and rotating one circle.

[0041] A driving plate 18 is clamped on the movable plate 27. The driving plate 18 is made of metal. A spring 16 is connected to the driving plate 18. The other end of the spring 16 is connected to a rectangular plate 22. The rectangular plate 22 is connected to the placement groove 121. An electromagnet 15 is provided on one side of the driving plate 18, and the electromagnet 15 is connected to the inner wall of the placement groove 121. When the USB plug 3 is inserted into the test port 5 without power, the electromagnet 15 is turned on, and the corresponding positions of the electromagnet 15 and the driving plate 18 are opposite poles, so that the driving plate 18 is clamped with the movable plate 27, and the movable plate 27 moves vertically on the threaded groove 19. If it is within three, when a normal USB plug 3 is detected, the electromagnet 15 is closed, and the driving plate 18 can be restored to its original position by the elastic force of the spring 16, and then it is tested that the chip of the USB plug 3 is faulty.

[0042] A sliding hole 20 is provided on the placement groove 121, and the sliding hole 20 connects the placement groove 121 and the test port 5. A sliding block 21 is slidably connected in the sliding hole 20, and the sliding block 21 is connected to the test chip 6. An electric telescopic rod 23 is connected to the sliding block 21, and the electric telescopic rod 23 is connected to the placement groove 121. When the third USB plug 3 is tested and still has a fault, the electric telescopic rod 23 is started, and the electric telescopic rod 23 drives the sliding block 21 to move vertically in the sliding hole 20, so that the test chip 6 can be moved, thereby ensuring that the chip of the USB plug 3 is still tested.

[0043] Embodiment 2

[0044] The alarm component 28 includes a transverse plate 26, which is connected to the placement groove 121 and corresponds to the drive plate 18. A torsion spring 24 is connected between the transverse plate 26 and the placement groove 121. A switch 25 is provided in the placement groove 121 and corresponds to the transverse plate 26. When the third USB plug 3 in the first test is tested to be still faulty, the drive plate 18 triggers the switch 25, and then the switch 25 can start the electric telescopic rod 23 to adjust the position of the test chip 6. After the position of the test chip 6 is adjusted, when the third USB plug 3 in the second test is tested to be still faulty, the drive plate 18 triggers the switch 25 again, and then it can be tested that the test bench 4 has a fault. When the drive plate 18 is separated from the transverse plate 26, the torsion spring 24 can make the transverse plate 26 automatically recover.

[0045] An alarm light 29 is provided on the base 1, and the switch 25 on the horizontal plate 26 is used to control the alarm light 29. When the drive plate 18 triggers the switch 25 again, the alarm light 29 is started, thereby reminding the staff to replace the test bench 4 in time.

[0046] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0047] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A test device for a USB chip, comprising: A base (1), a placement table (2) and a test table (4), wherein the placement table (2) is connected to the base (1), the test table (4) is connected to the base (1), a USB plug (3) is placed on the placement table (2), the test table (4) is used to test whether the chip of the USB plug (3) can be used normally, and a plurality of test ports (5) are provided on the test table (4), and a test chip (6) is provided in each of the plurality of test ports (5); It is characterized by: also including: An adjustment component (7), the adjustment component (7) is connected to the base (1), and the adjustment component (7) is connected to the test bench (4), the adjustment component (7) is used to move the test bench (4), and the adjustment component (7) can automatically align with the USB plug (3), An automatic test component (12), the automatic test component (12) is connected to a test bench (4), and the automatic test component (12) is connected to a test chip (6), and the automatic test component (12) is used to test a USB chip; An alarm component (28) is connected to the base (1) and is used to alert a staff member when a failure occurs in the USB plug (3) or the automatic test component (12).

2. The USB chip testing device according to claim 1, wherein: The adjustment component (7) comprises two grooves (71), the two grooves (71) are formed on the base (1), and the two grooves (71) are formed at two ends of the test bench (4), respectively, and a motor 1 (11) is installed in one of the grooves (71).

3. The USB chip testing device according to claim 2, characterized in that: A screw rod (8) is connected to the output shaft of the motor 1 (11), and the other end of the screw rod (8) is rotatably connected to the inner wall of the groove (71), and a sliding rod (9) is fixedly connected in another groove (71).

4. The USB chip testing device according to claim 3, characterized in that: Both ends of the test bench (4) are connected to moving blocks (10), one of the moving blocks (10) is threadedly connected to the screw rod (8), and the other moving block (10) is slidably connected to the slide rod (9).

5. The USB chip testing device according to claim 1, wherein: The automatic test component (12) comprises a placement groove (121), the placement groove (121) is arranged on the test bench (4), the placement groove (121) corresponds to the test port (5), and a driving member (13) is connected in the placement groove (121).

6. The USB chip testing device according to claim 5, characterized in that: The driving member (13) comprises a second motor (17), the second motor (17) is connected in the placement groove (121), the output shaft of the second motor (17) is connected to a connecting rod (14), a thread groove (19) is provided on the connecting rod (14), a movable plate (27) is threadedly connected to the thread groove (19), and the movable plate (27) is slidably connected to the placement groove (121).

7. The USB chip testing device according to claim 6, characterized in that: The movable plate (27) is clamped with a driving plate (18), the driving plate (18) is connected to a spring (16), the other end of the spring (16) is connected to a rectangular plate (22), the rectangular plate (22) is connected in a placement groove (121), one side of the driving plate (18) is provided with an electromagnet (15), and the electromagnet (15) is connected to the inner wall of the placement groove (121).

8. The USB chip testing device according to claim 7, characterized in that: The placement groove (121) is provided with a sliding hole (20), and the sliding hole (20) is connected to the placement groove (121) and the test port (5); a sliding block (21) is slidably connected in the sliding hole (20), and the sliding block (21) is connected to the test chip (6); an electric telescopic rod (23) is connected to the sliding block (21), and the electric telescopic rod (23) is connected in the placement groove (121).

9. The USB chip testing device according to claim 5, characterized in that: The alarm component (28) comprises a transverse plate (26), the transverse plate (26) is connected in the placement groove (121), and the transverse plate (26) corresponds to the driving plate (18), and a switch (25) is provided in the placement groove (121), and the switch (25) corresponds to the transverse plate (26).

10. The USB chip testing device according to claim 9, characterized in that: The base (1) is provided with an alarm light (29), and the switch (25) on the horizontal plate (26) is used to control the alarm light (29).

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