Test system and test method of vehicle-mounted chip

Abstract

The invention discloses a test system and a test method for a vehicle-mounted chip, and belongs to the technical field of chip test.The test system for the vehicle-mounted chip comprises a chip slot module, a main control module, a load module and a power supply module, and the chip slot module is used for insertion of the vehicle-mounted chip; the main control module is connected with the chip slot module and is configured to send a test signal to the vehicle-mounted chip, so that the vehicle-mounted chip sends a control signal according to the test signal; the load module is connected with the chip slot module and is configured to receive the control signal and send a first feedback signal to the vehicle-mounted chip, the vehicle-mounted chip sends a second feedback signal to the main control module according to the first feedback signal, and the main control module outputs a test result according to the second feedback signal; and the power supply module is connected with the chip slot module, the main control module and the load module and is configured to supply power to the chip slot module, the main control module and the load module, so that the test period is shortened, the test efficiency is improved, and the safety in practical application is ensured.

Description

Technical Field

[0001] The present invention relates to the field of chip testing technology, and in particular to a testing system and a testing method for an on-board chip. Background Art

[0002] With the rapid development of the domestic chip industry, the replacement application of domestic chips in vehicles has gradually increased. However, the rapid development of the industry has led to uneven quality of domestic chips, and the functional indicators of domestic chips are difficult to meet the nominal requirements. In actual use, some performance indicators of domestic chips have deviations, and some functions have usage failures, which poses a high safety risk.

[0003] In the related art, the testing of vehicle-mounted chips is usually performed manually, which has the defects of long testing cycle and low testing efficiency. Summary of the invention

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention proposes a vehicle chip test system, which is conducive to shortening the test cycle, improving the test efficiency, and ensuring the safety in practical applications.

[0005] The invention also provides a testing method.

[0006] According to the first aspect of the present invention, the test system for the vehicle-mounted chip includes: a chip slot module for the vehicle-mounted chip to be plugged in; a main control module, connected to the chip slot module, configured to send a test signal to the vehicle-mounted chip, so that the vehicle-mounted chip sends a control signal according to the test signal; a load module, connected to the chip slot module, configured to receive the control signal and send a first feedback signal to the vehicle-mounted chip, the vehicle-mounted chip sends a second feedback signal to the main control module according to the first feedback signal, and the main control module outputs the test result according to the second feedback signal; a power supply module, connected to the chip slot module, the main control module and the load module, and configured to supply power to the chip slot module, the main control module and the load module.

[0007] According to the vehicle chip test system of the embodiment of the present invention, there are at least the following beneficial effects: the power supply module is used to supply power to the chip slot module, the main control module and the load module; the chip slot module can be plugged in for the vehicle chip to be tested, and the main control module and the load module are both connected to the chip slot module to realize the interaction between the main control module and the load module and the vehicle chip; the main control module is configured to send a test signal to the vehicle chip so that the vehicle chip sends a control signal according to the test signal, and the load module receives the control signal and sends a first feedback signal to the vehicle chip; the vehicle chip sends a second feedback signal to the main control module according to the first feedback signal; the load module can simulate the application scenario of the vehicle chip on the vehicle to improve the accuracy and authenticity of the test; the main control module outputs the test result according to the second feedback signal to facilitate testing whether the various functional indicators of the vehicle chip are normal, and realize automatic testing of the vehicle chip, which is conducive to shortening the test cycle of the vehicle chip and improving the test efficiency to ensure the safety of the vehicle chip in actual scene applications.

[0008] According to some embodiments of the present invention, the test system for the vehicle-mounted chip further includes an indication module, which is connected to the main control module and is configured to send a qualified signal or a failed signal to a user according to the test result.

[0009] Specifically, in order to facilitate users to intuitively understand the test results of the vehicle-mounted chip, the test system of the vehicle-mounted chip also includes an indication module, which is connected to the main control module and is configured to send a qualified signal or a failed signal to the user based on the test results. That is, the test results can be intuitively fed back to the user through the indication module, and the user does not need to monitor the test results of the vehicle-mounted chip at all times, which is conducive to assisting designers to complete the testing of the vehicle-mounted chip.

[0010] The testing method according to the second aspect of the present invention is applied to the testing system of the vehicle-mounted chip shown in the first aspect; the testing method comprises:

[0011] Insert the vehicle-mounted chip into the chip slot module;

[0012] Control the main control module to send a test signal to the on-board chip, and control the on-board chip to send a control signal according to the test signal;

[0013] Control the load module to send a first feedback signal to the on-board chip according to the control signal, and control the on-board chip to send a second feedback signal to the main control module according to the first feedback signal;

[0014] The main control module is controlled to output the test result according to the second feedback signal.

[0015] According to the testing method of the embodiment of the present invention, at least the following beneficial effects are achieved: the testing method is applied to the testing system of the vehicle-mounted chip shown in the first aspect, the main control module and the load module are both connected to the chip slot module, specifically, after the vehicle-mounted chip to be tested is plugged into the chip slot module, the interaction between the main control module and the load module and the vehicle-mounted chip is realized; the testing method can control the main control module to send a test signal to the vehicle-mounted chip according to the functional indicator to be tested, and control the vehicle-mounted chip to send a control signal according to the test signal, control the load module to send a first feedback signal to the vehicle-mounted chip according to the control signal, and control the vehicle-mounted chip to send a second feedback signal to the main control module according to the first feedback signal; the load module can simulate the application scenario of the vehicle-mounted chip on the vehicle to improve the accuracy and authenticity of the test, control the main control module to output the test result according to the second feedback signal, so as to test whether the various functional indicators of the vehicle-mounted chip are normal, and realize automatic testing of the vehicle-mounted chip, which is conducive to shortening the test cycle of the vehicle-mounted chip and improving the test efficiency, so as to ensure the safety of the vehicle-mounted chip in actual scene application.

[0016] According to some embodiments of the present invention, controlling the main control module to send a test signal to the on-board chip, and controlling the on-board chip to send a control signal according to the test signal includes:

[0017] Control the main control module to send a first signal to the on-board chip, and control the on-board chip to send a second signal that is the same as the first signal, wherein the test signal includes the first signal, and the control signal includes the second signal;

[0018] Controlling the load module to send a first feedback signal to the on-board chip according to the control signal, and controlling the on-board chip to send a second feedback signal to the main control module according to the first feedback signal, including:

[0019] The load module is controlled to receive the second signal and send a third signal identical to the second signal, and the on-board chip is controlled to send a fourth signal identical to the third signal to the main control module. The first feedback signal includes the third signal, and the second feedback signal includes the fourth signal.

[0020] Specifically, the test method controls the main control module to send a first signal to the on-board chip, and controls the on-board chip to send a second signal identical to the first signal, that is, controls the on-board chip to reprint the first signal, controls the load module to receive the second signal and send a third signal identical to the second signal, that is, controls the load module to feed back the same third signal to the on-board chip, and after the on-board chip receives the third signal, it feeds back a fourth signal identical to the third signal to the main control module, that is, the test method reprints the same signal to facilitate testing whether the functional indicators of the on-board chip such as the working mode, network communication, and electrical characteristics are abnormal, and realizes automatic testing of the on-board chip, which is conducive to shortening the test cycle of the on-board chip and improving test efficiency, so as to ensure the safety of the on-board chip in actual application scenarios.

[0021] According to some embodiments of the present invention, controlling the main control module to output a test result according to the second feedback signal includes:

[0022] Controlling the main control module to check the matching degree between the first signal and the fourth signal, and comparing the matching degree with a first preset range to complete a communication test;

[0023] When the matching degree is within the first preset range, it is determined that the communication test of the on-board chip has passed.

[0024] The test method controls the main control module to verify the matching degree between the first signal and the fourth signal, and compares the matching degree with the first preset range, that is, determines whether the first signal is consistent with the fourth signal, so as to complete a communication test, that is, the test method can automatically test whether the communication function of the vehicle-mounted chip is abnormal, so as to ensure the normal communication of the vehicle-mounted chip in actual scene applications, and ensure that the upper and lower level components of the vehicle-mounted chip can operate normally.

[0025] According to some embodiments of the present invention, controlling the main control module to output a test result according to the second feedback signal includes:

[0026] Controlling the main control module to measure the bit time of a plurality of fields in the fourth signal, and comparing the bit time with a second preset range;

[0027] When the bit time meets the second preset range, it is determined that the bit time test of the on-board chip has passed.

[0028] After the on-board chip sends the fourth signal to the main control module, the test method can control the main control module to measure the bit time of multiple fields in the fourth signal, and compare the bit time with the second preset range to complete a bit time test. When the bit time meets the second preset range, it is determined that the bit time test of the on-board chip has passed. This test method passes the bit time test, which is beneficial to ensuring the data transmission rate of the on-board chip when used in the vehicle, and can verify whether the on-board chip can accurately generate and receive synchronization signals, which is beneficial to avoiding communication failures and data loss problems, and can more accurately evaluate the performance of the on-board chip to determine whether the performance of the on-board chip meets the nominal requirements.

[0029] According to some embodiments of the present invention, controlling the main control module to output a test result according to the second feedback signal includes:

[0030] Control the main control module to measure the duty cycle of the dominant level and the recessive level in the fourth signal, and compare the duty cycle with a third preset range;

[0031] When the duty cycle meets the third preset range, it is determined that the duty cycle test of the on-board chip has passed.

[0032] Specifically, after the on-board chip sends the fourth signal to the main control module, the test method can control the main control module to measure the duty cycle of the explicit level and the invisible level in the fourth signal, and compare the duty cycle with the third preset range to complete a duty cycle test. When the duty cycle is in line with the third preset range, the duty cycle test of the on-board chip is determined to have passed. Through the duty cycle test, the test method can verify the accuracy and stability of the on-board chip when generating signals, which helps to evaluate the performance of the on-board chip in energy management, helps to promptly discover potential faults or problems, and avoid serious safety accidents in actual applications. It can more accurately evaluate the performance of the on-board chip to determine whether the performance of the on-board chip meets the nominal requirements.

[0033] According to some embodiments of the present invention, controlling the main control module to output a test result according to the second feedback signal includes:

[0034] Controlling the main control module to verify whether the message attribute of the fourth signal meets the preset standard;

[0035] When the message attributes meet the preset standards, it is determined that the message attribute test of the on-board chip has passed.

[0036] Specifically, after the on-board chip sends the fourth signal to the main control module, the test method can control the main control module to verify whether the message attributes of the fourth signal meet the preset standards, that is, to verify whether the message attributes of the signal sent by the on-board chip meet expectations. By testing the message attributes, it is helpful to ensure the correct transmission and parsing of information, while ensuring signal integrity, reducing or avoiding the impact of communication delays or interruptions on the safety and performance of the vehicle, and can more accurately evaluate the performance of the on-board chip to determine whether the performance of the on-board chip meets the nominal requirements.

[0037] According to some embodiments of the present invention, the testing method further comprises:

[0038] Conduct multiple communication tests on the vehicle-mounted chips;

[0039] In multiple communication tests, the throughput of multiple first signals increases until the matching degree verified by the main control module exceeds the first preset range, and it is determined that the current communication test of the on-board chip fails, and the throughput of the first signal of the current communication test is used as the maximum bus communication bandwidth.

[0040] The test method performs multiple communication tests on the vehicle-mounted chip, and in the multiple communication tests, the throughput of multiple first signals increases successively until the matching degree verified by the main control module exceeds the first preset range, that is, the throughput of the first signal is too large and causes the current communication test of the vehicle-mounted chip to fail. The throughput of the first signal of the current communication test is used as the maximum bus communication bandwidth. The test method is beneficial to measure whether the transmission capacity of the vehicle-mounted chip meets the nominal requirements through the test of the maximum bus communication bandwidth, and can objectively evaluate the chip's ability in data transmission. During the application of the vehicle-mounted chip, it is ensured that the maximum bus communication bandwidth of the chip matches other components in the vehicle to ensure the stability and reliability of data transmission.

[0041] According to some embodiments of the present invention, the testing method further comprises:

[0042] Controlling the power supply module to increase or decrease the power supply of the vehicle-mounted chip in units of the first voltage;

[0043] When the power supply increases or decreases by the first voltage, multiple communication tests are performed on the vehicle chip, and when multiple communication tests are passed, the power supply module is controlled to continue to increase or decrease the power supply;

[0044] Until the communication test of the on-board chip fails, the power supply module is controlled to stop increasing or decreasing the power supply, and the power supply of the current communication test is used as the limit voltage of the on-board chip.

[0045] The test method can control the power supply module to increase or decrease the power supply to the on-board chip with the first voltage as the potential, and each time the power supply increases or decreases by the first voltage, the on-board chip is subjected to multiple communication tests, that is, whether the communication test is passed is judged to determine whether the on-board chip is close to the limit voltage for maintaining stable operation. When multiple communication tests are passed, the power supply module is controlled to continue to increase or decrease the power supply until the communication test of the on-board chip fails, and the power supply module is controlled to stop increasing or decreasing the power supply, and the power supply of the current communication test is used as the limit voltage of the on-board chip to understand the voltage tolerance limit of the chip, which helps to avoid exceeding the voltage tolerance range of the on-board chip in actual applications, so as to ensure the safety of the on-board chip in vehicle applications.

[0046] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] The present invention will be further described below with reference to the accompanying drawings and embodiments, wherein:

[0048] Figure 1 A schematic diagram of the structure of a vehicle chip testing system according to an embodiment of the present invention;

[0049] Figure 2 A flow chart of a testing method according to an embodiment of the present invention;

[0050] Figure 3 A flow chart of transmission of a first signal, a second signal, a third signal and a fourth signal of a test method according to an embodiment of the present invention;

[0051] Figure 4 A flow chart of a communication test of a test method according to an embodiment of the present invention;

[0052] Figure 5 A flowchart of a bit time test of a test method according to an embodiment of the present invention;

[0053] Figure 6 A flow chart of a duty cycle test of a test method according to an embodiment of the present invention;

[0054] Figure 7 A flowchart of a message attribute test of a test method according to an embodiment of the present invention;

[0055] Figure 8 A flowchart of a maximum bus communication bandwidth test of a test method according to an embodiment of the present invention;

[0056] Fig. 9 The present invention is a flowchart of a limit voltage test of a test method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0057] Embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0058] In the description of the present invention, it should be understood that descriptions involving orientation, such as orientation or positional relationship indicated as up, down, etc., are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0059] In the description of the present invention, "a plurality" means more than two. If there is a description of "first" or "second", it is only used for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0060] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0061] Reference Figure 1 As shown, a vehicle-mounted chip testing system according to an embodiment of the present invention includes: a chip slot module, a main control module, a load module and a power supply module.

[0062] Reference Figure 1 As shown, the power supply module is connected to the chip slot module, the main control module and the load module, and is configured to supply power to the chip slot module, the main control module and the load module. The chip slot module can be plugged into the vehicle-mounted chip. The main control module and the load module are both connected to the chip slot module to realize the interaction between the main control module and the load module and the vehicle-mounted chip.

[0063] Reference Figure 1 As shown, the main control module is configured to send a test signal to the on-board chip, so that the on-board chip sends a control signal according to the test signal; the load module is configured to receive the control signal and send a first feedback signal to the on-board chip, the on-board chip sends a second feedback signal to the main control module according to the first feedback signal, and the main control module outputs the test result according to the second feedback signal.

[0064] Reference Figure 1 As shown, the load module can simulate the application scenario of the vehicle-mounted chip in the vehicle to improve the accuracy and authenticity of the test. The main control module outputs the test result according to the second feedback signal to facilitate the test of whether the various functional indicators of the vehicle-mounted chip are normal and realize automatic testing of the vehicle-mounted chip, which is conducive to shortening the test cycle of the vehicle-mounted chip and improving the test efficiency to ensure the safety of the vehicle-mounted chip in actual application scenarios.

[0065] Reference Figure 1 As shown, specifically, the power supply module includes a transformer and a low dropout regulator (Low Dropout Regulator, LDO) step-down chip, so as to provide stable power output for the main control module, the chip slot module and the load module, so that the power supply module is suitable for use in miniaturized, low-power scenarios with high requirements on power supply stability, that is, simulating vehicle use scenarios.

[0066] Reference Figure 1 As shown, specifically, the power supply module provides 12V, 5V and 3.3V power supply voltages to the main control module, chip slot module and load module respectively to meet the voltage requirements for normal operation of the main control module, chip slot module and load module. The on-board chip can be a local interconnect network (LIN) chip.

[0067] Reference Figure 1 As shown, it can be understood that in order to facilitate users to intuitively understand the test results of the vehicle-mounted chip, the test system of the vehicle-mounted chip also includes an indication module, which is connected to the main control module and is configured to send a qualified signal or a failed signal to the user according to the test results. That is, the test results can be intuitively fed back to the user through the indication module, and the user does not need to monitor the test results of the vehicle-mounted chip at all times, which is conducive to assisting designers to complete the testing of the vehicle-mounted chip.

[0068] Reference Figure 1 As shown, specifically, the indication module can be an indicator light. When the test result of the main control module is that the on-board chip test is qualified, the indicator light lights up, which sends a qualified signal to the user; when the test result of the main control module is that the on-board chip test is unqualified, the indicator light goes out or lights up a light of another color, which sends a unqualified signal to the user. That is, the test result can be intuitively fed back to the user through the indication module, and the user does not need to monitor the test results of the on-board chip all the time, which is beneficial for assisting designers to complete the test of the on-board chip.

[0069] Reference Figure 1 As shown, it can be understood that the main control module uses a microcontroller unit (MCU) as the main control unit, thereby providing an automated test program for the vehicle chip to be tested, so as to automatically send a test signal to the vehicle chip, so that the vehicle chip automatically traverses the test program.

[0070] Reference Figure 1 As shown, after the vehicle-mounted chip to be tested is plugged into the chip slot module, the main control module can interact with the vehicle-mounted chip through interfaces such as the serial port, general purpose input / output port (GPIO), and universal asynchronous receiver / transmitter (UART) to realize automatic testing of the vehicle-mounted chip.

[0071] Reference Figures 1 to 9 As shown, a testing method according to an embodiment of the present invention is applied to a testing system for a vehicle-mounted chip according to any of the above embodiments. The testing method comprises the following steps:

[0072] Step S100, plugging the vehicle-mounted chip into the chip slot module;

[0073] Step S200, controlling the main control module to send a test signal to the on-board chip, and controlling the on-board chip to send a control signal according to the test signal;

[0074] Step S300, controlling the load module to send a first feedback signal to the vehicle-mounted chip according to the control signal, and controlling the vehicle-mounted chip to send a second feedback signal to the main control module according to the first feedback signal;

[0075] Step S400: controlling the main control module to output a test result according to the second feedback signal.

[0076] Reference Figure 1 and Figure 2 As shown, in step S100, the main control module and the load module are both connected to the chip slot module. Specifically, after the vehicle-mounted chip is plugged into the chip slot module, the main control module and the load module interact with the vehicle-mounted chip.

[0077] Reference Figure 1 and Figure 2 As shown, in step S200, the testing method can control the main control module to send a test signal to the on-board chip according to the functional indicator to be tested, and control the on-board chip to send a control signal according to the test signal.

[0078] Reference Figure 1 and Figure 2 As shown, in step S300, the load module is controlled to send a first feedback signal to the on-board chip according to the control signal, and the on-board chip is controlled to send a second feedback signal to the main control module according to the first feedback signal. The load module can simulate the application scenario of the on-board chip in the vehicle to improve the accuracy and authenticity of the test.

[0079] Reference Figure 1 and Figure 2 As shown, in step S400, the test method controls the main control module to output the test results according to the second feedback signal, so as to test whether the various functional indicators of the vehicle-mounted chip are normal, and realize automatic testing of the vehicle-mounted chip, which is conducive to shortening the test cycle of the vehicle-mounted chip and improving the test efficiency, so as to ensure the safety of the vehicle-mounted chip in actual application scenarios.

[0080] Reference Figure 1 and Figure 3 As shown, it can be understood that the test method, in step S200, controls the main control module to send a test signal to the vehicle chip, and controls the vehicle chip to send a control signal according to the test signal, including the following steps:

[0081] Step S210, controlling the main control module to send a first signal to the vehicle-mounted chip, and controlling the vehicle-mounted chip to send a second signal that is the same as the first signal, the test signal includes the first signal, and the control signal includes the second signal;

[0082] Reference Figure 1 and Figure 3As shown, the test method controls the main control module to send a first signal to the on-board chip, and controls the on-board chip to send a second signal that is the same as the first signal, that is, controls the on-board chip to reprint the first signal.

[0083] Reference Figure 1 and Figure 3 As shown, in step S300, the test method controls the load module to send a first feedback signal to the vehicle chip according to the control signal, and controls the vehicle chip to send a second feedback signal to the main control module according to the first feedback signal, including the following steps:

[0084] Step S310, control the load module to receive the second signal and send a third signal identical to the second signal, and control the on-board chip to send a fourth signal identical to the third signal to the main control module, the first feedback signal includes the third signal, and the second feedback signal includes the fourth signal.

[0085] Reference Figure 1 and Figure 3 As shown, the test method controls the load module to receive the second signal and send a third signal identical to the second signal, that is, controls the load module to feed back the same third signal to the on-board chip. After the on-board chip receives the third signal, it reprints the fourth signal identical to the third signal to the main control module. That is, the test method reprints the same signal to test whether the functional indicators such as the working mode, network communication, and electrical characteristics of the on-board chip are normal, and realizes automatic testing of the on-board chip, which is conducive to shortening the test cycle of the on-board chip and improving the test efficiency, so as to ensure the safety of the on-board chip in actual application scenarios.

[0086] Reference Figure 1 and Figure 2 As shown, it can be understood that the test method, in step S200, controls the main control module to send a test signal to the vehicle chip, and controls the vehicle chip to send a control signal according to the test signal, including the following steps:

[0087] Step S220, controlling the main control module to pull down the sleep / wake-up pin of the vehicle-mounted chip to be tested through the GPIO port, so that the vehicle-mounted chip enters the sleep mode;

[0088] Step S230, after the first preset time has passed, the main control module is controlled to read the pin status of the vehicle-mounted chip to determine whether the vehicle-mounted chip enters the sleep mode normally.

[0089] Reference Figure 1 and Figure 2 As shown, the sleep function allows the on-board chip to reduce power consumption and enter a low-power state when no operation is required, which helps save energy, especially in scenarios where the vehicle is battery-powered, and can significantly extend the life of the on-board battery.

[0090] Reference Figure 1and Figure 2 As shown, this test method can verify the power management capability of the vehicle chip in different working modes (such as standby mode, sleep mode, etc.) through the sleep function test, ensuring that the vehicle chip can correctly enter and maintain a low power consumption state.

[0091] Reference Figure 1 and Figure 2 As shown, it can be understood that the test method, in step S200, controls the main control module to send a test signal to the vehicle chip, and controls the vehicle chip to send a control signal according to the test signal, including the following steps:

[0092] Step S240, controlling the main control module to send a wake-up message to the vehicle chip through the UART port;

[0093] Step S250, after the second preset time, the main control module is controlled to pull up the sleep / wake-up pin of the vehicle chip, and read the pin status of the vehicle chip to determine whether the vehicle chip enters the preset standard mode normally.

[0094] Reference Figure 1 and Figure 2 As shown, the test method also performs a wake-up function test on the vehicle-mounted chip. The wake-up function test verifies the ability of the vehicle-mounted chip to quickly recover from a low-power state (such as sleep mode) to a normal working state, which directly affects the response speed of the device and the user experience. A fast and reliable wake-up function allows users to experience a smoother operating experience during use.

[0095] Reference Figure 1 and Figure 2 As shown, the test method can also verify the power management and signal processing capabilities of the on-board chip during the wake-up process through the wake-up function test, including verifying whether the on-board chip can correctly receive the wake-up signal, adjust the power supply, and restore the previous working state, etc., to ensure that the chip will not have power fluctuations, signal interference and other problems during the wake-up process.

[0096] It should be noted that the first preset time and the second preset time can be adjusted according to actual needs. For example, the first preset time and the second preset time can be set to 5s, 6s, 7s, etc.

[0097] Reference Figure 1 and Figure 4 As shown, it can be understood that in step S400, the test method controls the main control module to output the test result according to the second feedback signal, including the following steps:

[0098] Step S410, controlling the main control module to check the matching degree between the first signal and the fourth signal, and comparing the matching degree with a first preset range to complete a communication test;

[0099] Step S420: When the matching degree meets the first preset range, it is determined that the communication test of the vehicle-mounted chip has passed.

[0100] Reference Figure 1 and Figure 4 As shown, the test method controls the main control module to check the matching degree of the first signal and the fourth signal, and compares the matching degree with the first preset range, that is, determines whether the first signal and the fourth signal are consistent, so as to complete a communication test.

[0101] When the matching degree meets the first preset range, that is, the matching degree falls within the interval of the first preset range, it can be determined that the communication test of the vehicle chip has passed. When the matching degree exceeds the interval of the first preset range, the test method determines that the communication test of the vehicle chip has failed.

[0102] That is, the test method can automatically test the communication function of the vehicle-mounted chip to ensure the normal communication of the vehicle-mounted chip in actual application.

[0103] Reference Figure 1 and Figure 5 As shown, it can be understood that in step S400, the test method controls the main control module to output the test result according to the second feedback signal, including the following steps:

[0104] Step S430, controlling the main control module to measure the bit time of multiple fields in the fourth signal, and comparing the bit time with a second preset range;

[0105] Step S440: When the bit time meets the second preset range, it is determined that the bit time test of the vehicle-mounted chip has passed.

[0106] Reference Figure 1 and Figure 5 As shown, after the on-board chip sends the fourth signal to the main control module, the test method can control the main control module to measure the bit time of multiple fields in the fourth signal, and compare the bit time with the second preset range to complete a bit time test.

[0107] When the bit time meets the second preset range, that is, the bit time falls within the interval of the first preset range, the bit time test of the on-board chip is determined to have passed. When the bit time exceeds the second preset range, the test method determines that the bit time test of the on-board chip has failed.

[0108] This test method ensures the data transmission rate of the vehicle chip when it is used in the vehicle through bit time testing. It can verify whether the vehicle chip can accurately generate and receive synchronization signals, which helps to avoid communication failures and data loss. It can more accurately evaluate the performance of the vehicle chip to determine whether the performance of the vehicle chip meets the nominal requirements.

[0109] Reference Figure 1 and Figure 5As shown, specifically, the test method can control the main control module to test the bit time of multiple fields in the fourth signal, and the multiple bit times include but are not limited to: a synchronization field, an identifier field, a data field, and a checksum field.

[0110] Reference Figure 1 and Figure 6 As shown, it can be understood that in step S400, the test method controls the main control module to output the test result according to the second feedback signal, including the following steps:

[0111] Step S450, controlling the main control module to measure the duty ratio of the dominant level and the recessive level in the fourth signal, and comparing the duty ratio with a third preset range;

[0112] Step S460: When the duty cycle meets the third preset range, it is determined that the duty cycle test of the vehicle-mounted chip has passed.

[0113] Reference Figure 1 and Figure 6 As shown, specifically, after the on-board chip sends the fourth signal to the main control module, the test method can control the main control module to measure the duty cycle of the explicit level and the invisible level in the fourth signal, and compare the duty cycle with the third preset range to complete a duty cycle test.

[0114] When the duty cycle meets the third preset range, that is, the duty cycle falls within the interval of the third preset range, the duty cycle test of the vehicle chip is determined to have passed. When the duty cycle exceeds the third preset range, the test method determines that the duty cycle test of the vehicle chip has failed.

[0115] This test method can verify the accuracy and stability of the on-board chip when generating signals through duty cycle testing, which helps to evaluate the performance of the on-board chip in energy management, helps to promptly discover potential faults or problems, and avoid serious safety accidents in actual applications. It can more accurately evaluate the performance of the on-board chip to determine whether the performance of the on-board chip meets the nominal requirements.

[0116] It should be noted that the first preset range, the second preset range and the third preset range can be adjusted according to factors such as the actual application scenario, the type and specification of the vehicle-mounted chip, and will not be elaborated here.

[0117] Reference Figure 1 and Figure 7 As shown, it can be understood that in step S400, the test method controls the main control module to output the test result according to the second feedback signal, including the following steps:

[0118] Step S470, the main control module verifies whether the message attribute of the fourth signal meets the preset standard;

[0119] Step S480: When the message attribute meets the preset standard, it is determined that the message attribute test of the vehicle-mounted chip has passed.

[0120] Reference Figure 1 and Figure 7 As shown, specifically, after the on-board chip sends the fourth signal to the main control module, the test method can control the main control module to verify whether the message attributes of the fourth signal meet the preset standards, that is, to verify whether the message attributes of the signal sent by the on-board chip meet expectations. By testing the message attributes, it is helpful to ensure the correct transmission and parsing of information, while ensuring signal integrity, reducing or avoiding the impact of communication delays or interruptions on the safety and performance of the vehicle, and being able to more accurately evaluate the performance of the on-board chip to determine whether the performance of the on-board chip meets the nominal requirements.

[0121] Reference Figure 1 and Figure 8 As shown, it can be understood that the test method also includes the following steps:

[0122] Step S500, performing multiple communication tests on the vehicle-mounted chip;

[0123] Step S600, in multiple communication tests, the throughput of multiple first signals increases until the matching degree verified by the main control module exceeds the first preset range, and it is determined that the current communication test of the on-board chip fails, and the throughput of the first signal of the current communication test is used as the maximum bus communication bandwidth.

[0124] Reference Figure 1 and Figure 8 As shown, the test method performs multiple communication tests on the on-board chip, and in the multiple communication tests, the throughput of multiple first signals increases successively until the matching degree verified by the main control module exceeds the first preset range, that is, the throughput of the first signal is too large and causes the current communication test of the on-board chip to fail, and the throughput of the first signal of the current communication test is used as the maximum bus communication bandwidth.

[0125] The test method is helpful to measure whether the transmission capacity of the vehicle-mounted chip meets the nominal requirements through the test of the maximum bus communication bandwidth. It can objectively evaluate the chip's ability in data transmission. During the application of vehicle-mounted chips, it is ensured that the chip's maximum bus communication bandwidth matches other components in the vehicle to ensure the stability and reliability of data transmission.

[0126] Reference Figure 1 and Fig. 9 As shown, it can be understood that the test method also includes the following steps:

[0127] Step S700, controlling the power supply module to increase or decrease the power supply to the vehicle-mounted chip in units of a first voltage;

[0128] Step S800, when the power supply increases or decreases by the first voltage, multiple communication tests are performed on the vehicle-mounted chip, and when multiple communication tests are passed, the power supply module is controlled to continue to increase or decrease the power supply;

[0129] Step S900, until the communication test of the on-board chip fails, the power supply module is controlled to stop increasing or decreasing the power supply, and the power supply of the current communication test is used as the limit voltage of the on-board chip.

[0130] Reference Figure 1 and Fig. 9 As shown, the test method can control the power supply module to increase or decrease the power supply to the on-board chip with the first voltage as the potential, and each time the power supply increases or decreases by the first voltage, the on-board chip is subjected to multiple communication tests, that is, whether the communication test is passed is judged to determine whether the on-board chip is close to the limit voltage for maintaining stable operation. When multiple communication tests are passed, the power supply module is controlled to continue to increase or decrease the power supply until the communication test of the on-board chip fails, and the power supply module is controlled to stop increasing or decreasing the power supply, and the power supply of the current communication test is used as the limit voltage of the on-board chip to understand the voltage tolerance limit of the chip, which helps to avoid exceeding the voltage tolerance range of the on-board chip in actual applications, so as to ensure the safety of the on-board chip in vehicle applications.

[0131] Reference Figure 1 and Fig. 9 As shown below, the test method is described by taking 0.01V as the first voltage and four groups of limit voltage test groups as an example:

[0132] ① The main control module controls the power supply module to gradually increase the 12V power supply voltage of the on-board chip to be tested in units of 0.01V, and simultaneously performs a communication test on the on-board chip. The on-board chip is tested for communication three times each time 0.01V is increased. If the three communication tests are correct, the power supply voltage continues to be increased until the communication test fails.

[0133] ② The main control module controls the power supply module to gradually reduce the 12V power supply voltage of the on-board chip to be tested in units of 0.01V, and simultaneously performs a communication test on the on-board chip. The on-board chip is tested for communication three times each time the voltage is reduced by 0.01V. If all three communication tests are correct, the power supply voltage continues to be reduced until the communication test fails.

[0134] ③ The main control module controls the power supply module to gradually increase the 5V power supply voltage of the on-board chip to be tested in units of 0.01V, and simultaneously performs a communication test on the on-board chip. The on-board chip is tested for communication three times each time 0.01V is increased. If the three communication tests are correct, the power supply voltage continues to be increased until the communication test fails.

[0135] ④ The main control module controls the power supply module to gradually reduce the 5V power supply voltage of the on-board chip to be tested in units of 0.01V, and simultaneously performs a communication test on the on-board chip. The on-board chip is tested for communication three times each time the voltage is reduced by 0.01V. If all three communication tests are correct, the power supply voltage continues to be reduced until the communication test fails.

[0136] It is understandable that in order to facilitate users to intuitively understand the test results of the vehicle-mounted chip, the vehicle-mounted chip test system also includes an indication module, which is connected to the main control module and is configured to send a qualified signal or a failed signal to the user according to the test results, that is, the test results can be intuitively fed back to the user through the indication module, without the user having to monitor the test results of the vehicle-mounted chip at all times, which is conducive to assisting designers to complete the test of the vehicle-mounted chip. Specifically, the indication module is an indicator light.

[0137] The test method further comprises the following steps:

[0138] When the on-board chip passes the communication test, the bit time test, the duty cycle test, and the message attribute test, the control indicator light turns on to send a qualified signal to the user;

[0139] When the on-board chip passes the communication test, the bit time test, the duty cycle test, and any one of the message attribute tests fails, the control indicator light remains off to send a failure signal to the user;

[0140] That is, the test method can intuitively feed back the test results to the user through the indication module, without the need for the user to monitor the test results of the vehicle-mounted chip all the time, which is helpful for assisting designers to complete the test of the vehicle-mounted chip.

[0141] Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0142] The present invention is described by flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0143] The embodiments of the present invention are described in detail above with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge scope of ordinary technicians in the relevant technical field without departing from the purpose of the present invention.

Claims

1. The vehicle chip test system is characterized by: include: Chip slot module for plugging in vehicle-mounted chips; A main control module, connected to the chip slot module, and configured to send a test signal to the vehicle-mounted chip, so that the vehicle-mounted chip sends a control signal according to the test signal; a load module, connected to the chip slot module, configured to receive the control signal and send a first feedback signal to the on-board chip, the on-board chip sends a second feedback signal to the main control module according to the first feedback signal, and the main control module outputs a test result according to the second feedback signal; The power supply module is connected to the chip slot module, the main control module and the load module, and is configured to supply power to the chip slot module, the main control module and the load module.

2. The vehicle-mounted chip testing system according to claim 1, characterized in that: The vehicle-mounted chip test system further includes an indication module, which is connected to the main control module and is configured to send a qualified signal or a failed signal to a user according to the test result.

3. A test method, characterized in that: A test system for the vehicle-mounted chip as claimed in claim 1 or 2; The testing method comprises: Inserting the vehicle-mounted chip into the chip slot module; Controlling the main control module to send the test signal to the on-board chip, and controlling the on-board chip to send the control signal according to the test signal; Controlling the load module to send the first feedback signal to the on-board chip according to the control signal, and controlling the on-board chip to send the second feedback signal to the main control module according to the first feedback signal; Control the main control module to output a test result according to the second feedback signal.

4. The testing method according to claim 3, characterized in that: The controlling the main control module to send the test signal to the on-board chip, and controlling the on-board chip to send the control signal according to the test signal, comprises: Control the main control module to send a first signal to the vehicle-mounted chip, and control the vehicle-mounted chip to send a second signal that is the same as the first signal, wherein the test signal includes the first signal, and the control signal includes the second signal; The controlling the load module to send the first feedback signal to the vehicle-mounted chip according to the control signal, and controlling the vehicle-mounted chip to send the second feedback signal to the main control module according to the first feedback signal, comprises: The load module is controlled to receive the second signal and send a third signal identical to the second signal, and the on-board chip is controlled to send a fourth signal identical to the third signal to the main control module, wherein the first feedback signal includes the third signal, and the second feedback signal includes the fourth signal.

5. The testing method according to claim 4, characterized in that: The controlling the main control module to output a test result according to the second feedback signal comprises: Controlling the main control module to check the matching degree between the first signal and the fourth signal, and comparing the matching degree with a first preset range to complete a communication test; When the matching degree meets the first preset range, it is determined that the communication test of the on-board chip passes.

6. The testing method according to claim 4, characterized in that: The controlling the main control module to output a test result according to the second feedback signal comprises: Controlling the main control module to measure the bit time of a plurality of fields in the fourth signal, and comparing the bit time with a second preset range; When the bit time is within the second preset range, it is determined that the bit time test of the on-board chip has passed.

7. The testing method according to claim 4, characterized in that: The controlling the main control module to output a test result according to the second feedback signal comprises: Controlling the main control module to measure the duty cycle of the dominant level and the recessive level in the fourth signal, and comparing the duty cycle with a third preset range; When the duty cycle meets the third preset range, it is determined that the duty cycle test of the on-board chip passes.

8. The testing method according to claim 4, characterized in that: The controlling the main control module to output a test result according to the second feedback signal comprises: Controlling the main control module to verify whether the message attribute of the fourth signal meets the preset standard; When the message attribute meets the preset standard, it is determined that the message attribute test of the on-board chip has passed.

9. The testing method according to claim 5, characterized in that: The test method also includes: Performing the communication test on the vehicle-mounted chip multiple times; In multiple communication tests, the throughput of multiple first signals increases until the matching degree verified by the main control module exceeds the first preset range, and it is determined that the current communication test of the on-board chip fails, and the throughput of the first signal of the current communication test is used as the maximum bus communication bandwidth.

10. The testing method according to claim 5, characterized in that: The test method also includes: Controlling the power supply module to supply power to the vehicle-mounted chip in increments or decrements in units of a first voltage; When the power supply increases or decreases by the first voltage, the communication test is performed on the vehicle chip multiple times, and when multiple communication tests are passed, the power supply module is controlled to continue to increase or decrease the power supply; Until the communication test of the on-board chip fails, the power supply module is controlled to stop increasing or decreasing the power supply, and the power supply of the current communication test is used as the limit voltage of the on-board chip.

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