Object scanning

Abstract

The present disclosure relates to an inspection system (1) for inspecting an object (102) passing through an inspection area (104), the inspection area (104) being divided into a plurality of elongate inspection zones (104a, 104b) having a longitudinal extension, the inspection system (1) comprising: at least one detector (2) and a scanning element (136), and a scanning element (136) adapted to redirect the field of view of the detector (2) to any one of the plurality of elongated inspection zones (104a, 104b), where the scanning element is adapted to rotate about a first axis of rotation (R) and (136) comprises at least two reflective surfaces (136a, 136b) that redirect the field of view of the detector (2) to different inspection zones (104a, 104b) of the inspection area (104). A method (S0) for inspecting an object (102) passing through an inspection area (104) by means of an inspection system (1) is also disclosed.

Description

Technical Field

[0001] The inventive concepts described herein generally relate to an apparatus and system for inspecting an object and a method of inspecting an object.

[0002] Background and Summary of the Invention

[0003] There is a general growth and interest in automated analysis of objects that can be classified and sorted according to predetermined criteria. Hyperspectral imaging (or hyperspectral analysis) is a common technique that enables information from across the electromagnetic spectrum to be collected and processed when analyzing an object.

[0004] An example of a hyperspectral imaging system is shown in WO 2021 / 249698 A1, in which a polygonal mirror redirects the field of view of at least one detector in a direction orthogonal to the transport of the material in order to inspect the full width or part of the width of a material flow conveyed on a conveyor belt. If WO 2021 / 249698 A1 only inspects, for example, a quarter of the flow, four identical systems can be used in parallel to cover the entire flow.

[0005] There is always an interest in improving the accuracy of sorting systems working at high speeds while ensuring a cost-effective solution. Often times, a material will be sorted in at least two different directions or to two different destinations, according to a set of predetermined properties, such as in the case where the material has, for example, an acceptable amount of surface irregularities (Group I) or an unacceptable amount of surface irregularities (Group II). The accuracy of the sorting can be improved, for example, by improving the accuracy of the analysis step, thereby reducing the number of objects that actually belong to Group I but are classified as Group II, and vice versa; and / or by improving the accuracy of the ejection step, so that the objects are ejected in the correct direction or reach the correct destination.

[0006] In view of the above, it is an object of the present invention to provide a cost-effective inspection system which enables a higher sorting accuracy to be achieved while preferably maintaining or improving the throughput capability. In order to achieve this object and / or other objects that will be apparent from the following description, there is provided according to the present invention an inspection system having the features defined in claim 1. Preferred embodiments of the inspection system will be apparent from the dependent claims.

[0007] According to one aspect, the present invention relates to an inspection system for inspecting an object passing through an inspection area, the inspection area being divided into or comprising a plurality of elongated inspection zones having a longitudinal extension. The inspection system comprises:

[0008] a detector system having at least one detector and an optical arrangement for receiving optical radiation originating from an object disposed in at least one of the plurality of inspection zones and redirecting the optical radiation toward the at least one detector and providing a corresponding field of view for the at least one detector;

[0009] A scanning element configured to rotate about a first rotation axis and comprising:

[0010] a plurality of reflective surfaces arranged one after another about the first rotation axis, the plurality of reflective surfaces comprising a group of reflective surfaces, wherein each reflective surface of the group of reflective surfaces is associated with a respective one of the elongated inspection zones;

[0011] wherein the scanning element is configured and / or adapted in size and shape to redirect the field of view of the at least one detector to each of the plurality of elongated inspection zones upon each revolution of the scanning element, and each of the reflective surfaces in the set of reflective surfaces is configured to redirect the field of view of the at least one detector to a corresponding elongated inspection zone of the plurality of elongated inspection zones upon at least each revolution of the scanning element, and

[0012] The axis of rotation is arranged such that upon rotation of the scanning element, each of the reflective surfaces in the set of reflective surfaces redirects the field of view along a longitudinal extension of a respective elongated inspection zone.

[0013] According to a first aspect, the invention relates to an inspection system for inspecting an object passing through an inspection area, the inspection area being divided into or comprising a plurality of elongated inspection zones having a longitudinal extension. The inspection system comprises:

[0014] a detector system having at least one detector and an optical arrangement for receiving optical radiation originating from an object disposed in at least one of the plurality of inspection zones and redirecting the optical radiation toward the at least one detector and providing a corresponding field of view for the at least one detector;

[0015] A scanning element configured to rotate about a first rotation axis and comprising:

[0016] A plurality of reflective surfaces are arranged one after another around the first rotation axis, the plurality of reflective surfaces comprising a set of reflective surfaces, wherein

[0017] Wherein, the scanning element or each of the multiple reflective surfaces is suitable in size, shape and orientation to redirect the field of view of the at least one detector to each of the multiple elongated inspection zones each time the scanning element rotates once, and each of the reflective surfaces in the group of reflective surfaces is configured to redirect the field of view of the at least one detector to a corresponding elongated inspection zone among the multiple elongated inspection zones and redirect the field of view along the corresponding elongated inspection zone each time the scanning element rotates once.

[0018] According to an alternative aspect, there is provided an inspection system for inspecting an object passing through an inspection area, wherein the inspection system is configured for passing the object through the inspection area in a main conveying direction. The inspection area is divided into a plurality of elongated inspection zones, which preferably have a longitudinal extension. The inspection system comprises a detector system having at least one detector and an optical device for receiving optical radiation originating from an object arranged in at least one of the plurality of inspection zones, and redirecting the optical radiation towards the at least one detector and providing a corresponding field of view for the at least one detector; the inspection system further comprises a first scanning element, the first scanning element being configured to rotate about a first rotation axis orthogonal or substantially orthogonal to the main transport direction, and the scanning element comprising a reflective surface, wherein the first rotation axis is arranged such that when the first scanning element rotates, the reflective surface of the first scanning element redirects the field of view of the at least one detector to a corresponding one of the plurality of elongated inspection zones. According to this aspect, the first scanning element comprises one or only one reflective surface for redirecting the field of view to different scanning zones. According to one embodiment, the scanning element rotates back and forth between two end positions preferably associated with two outer scanning zones. According to an alternative embodiment, the scanning element rotates continuously in the same direction, wherein the reflective surface redirects the field of view during a portion of each revolution of the scanning element. The use of one reflective surface is advantageous because the element for redirecting the field of view is less complex than the scanning element described with respect to this first aspect. Optionally, the first scanning element comprises more than one reflective surface for redirecting the field of view to the respective scanning partitions. Another advantage is that the solution easily allows a large number of inspection partitions, for example at least 30 inspection partitions, or at least 60 inspection partitions, or at least 100 inspection partitions, or at least 300 inspection partitions, or at least 500 inspection partitions, or at least 1000 inspection partitions. The field of view can cover at least one inspection partition at a time.

[0019] According to an exemplary embodiment, the inspection system according to the above alternative aspect further comprises a second scanning element, which is configured to rotate about a second axis of rotation and comprises at least one reflective surface, wherein the second axis of rotation is arranged such that when the second scanning element rotates, the reflective surface of the second scanning element redirects the field of view of the at least one detector along the longitudinal extension of the corresponding elongated inspection partition. This solution is advantageous because the element for redirecting the field of view is less complex than the scanning element described with respect to the first aspect. According to an example, the second scanning element is a polygonal mirror. The polygonal mirror comprises a set of reflective surfaces, each of which has a central surface normal, wherein all surface normals are preferably orthogonal to the axis of rotation of the scanning element. Optionally, the second scanning element comprises only one reflective surface for redirecting the field of view, which one reflective surface rotates back and forth between two end positions preferably associated with two outer scanning partitions. According to an alternative embodiment, the scanning element rotates continuously in the same direction, wherein the reflective surface redirects the field of view during a portion of each revolution of the scanning element.

[0020] According to an exemplary embodiment, the first scanning element and / or the second scanning element is a galvanometer scanner.

[0021] The first scanning element and / or the second scanning element can be tilted or rotated back and forth at the same speed in both directions. Optionally, the second scanning element can be redirected twice along the same inspection partition, once when rotating clockwise and once when rotating counterclockwise. Optionally, the second scanning element can be redirected along one inspection partition when rotating clockwise, and redirected along an adjacent inspection partition when rotating counterclockwise. In addition or alternatively, the first scanning element and / or the second scanning element can be tilted or rotated back and forth faster in one direction than in the other direction. For example, the scanning element can be redirected more slowly in the clockwise direction to allow the detector to record optical radiation originating from the detection partition, and redirected significantly faster in the counterclockwise direction because this is only used to reposition the scanning element to the starting point of the inspection partition without recording any spectral information.

[0022] According to an exemplary embodiment, the inspection system is configured to pass the object through the inspection area in a main conveying direction, and the first axis of rotation is preferably orthogonal or substantially orthogonal to the main conveying direction. When passing through the inspection area, each object can have a nonlinear conveying direction extending instantaneously in almost any direction, while the net flow of the object stream has a main conveying direction, such as downward or along a free throw parabola in a free fall path, or in line with the conveying direction of the conveyor. The main conveying direction may also be referred to herein as the conveying direction.

[0023] According to an exemplary embodiment, the rotation axis is arranged so that when the scanning element rotates, each of the multiple reflective surfaces redirects the field of view along the longitudinal extension of an associated inspection zone, and the associated inspection zone may coincide with an inspection zone among the multiple elongated inspection zones, or may not coincide with the inspection zone, or may partially overlap with the inspection zone.

[0024] The number of reflective surfaces in the plurality of reflective surfaces may be an even number or an odd number. Additionally or alternatively, the number of reflective surfaces in the set of reflective surfaces may be an even number or an odd number.

[0025] According to an example, the scanning element has a first number of reflective surfaces, for example 12, arranged one after another around the first rotation axis. In other words, there are a first number (for example, 12) of reflective surfaces in the plurality of reflective surfaces. In addition, there are a second number (for example, 2, 6 or 12) of reflective surfaces in the group of reflective surfaces; and the number of elongated inspection zones in the inspection area is the same as the number of reflective surfaces in the plurality or group of reflective surfaces. In addition, all or a plurality of or all but not a single number (such as one, two or three) of the reflective surfaces in the plurality of reflective surfaces redirect light to a corresponding one of the plurality of elongated inspection zones in the inspection area. Alternatively, all or a plurality of or all but not a single number (such as one, two or three) of the reflective surfaces in the plurality of reflective surfaces redirect light to an elongated inspection zone that at least partially overlaps with a corresponding one of the plurality of elongated inspection zones in the inspection area. The scanning element may, for example, include a first group of reflective surfaces and a second group of reflective surfaces, wherein the reflective surfaces in the first group of reflective surfaces and the second group of reflective surfaces together constitute the plurality of reflective surfaces. The number of reflective surfaces in the first group of reflective surfaces and the second group of reflective surfaces may be the same or different. In other words, the plurality of reflective surfaces may consist of a first group of reflective surfaces and a second group of reflective surfaces, wherein each reflective surface in the plurality of reflective surfaces is preferably associated with a respective one of the plurality of elongated inspection zones. When each reflective surface in the group of reflective surfaces is associated with a respective one of the plurality of elongated inspection zones, there are two reflective surfaces associated with each elongated inspection zone. According to an example, the scanning element may include additional reflective surfaces in addition to the first group of reflective surfaces and / or the second group of reflective surfaces.

[0026] By configuring the scanning element to redirect the field of view of the at least one detector to each of the plurality of elongated inspection zones, the inspection area is increased compared to when the scanning element as described in WO 2021 / 249698 A1 repeatedly scans the same surface. In addition, a higher accuracy is achieved compared to using two separate scanning elements in parallel, as the reflective surfaces are arranged on the same scanning element and therefore have fixed positions relative to each other.

[0027] The inspection system can also be configured so that the rotational speed of the scanning element and / or the object conveying speed can be adapted so that the at least one detector inspects the object to be inspected for a sufficient time to allow the at least one detector to capture image data and / or spectral data having a predetermined level of resolution and / or clarity and / or information content.

[0028] The rotational speed of the scanning element can be selected within the range of 10rpm to 100rpm, 100rpm to 200rpm, 200rpm to 300rpm, 300rpm to 400rpm, 400rpm to 500rpm, 500rpm to 600rpm, 600rpm to 700rpm, 700rpm to 800rpm, 800rpm to 900rpm or 900rpm to 1000rpm, 100rpm to 10000rpm or higher, or within the range formed by any combination of the above-specified rotational speed ranges.

[0029] The object conveying speed through the inspection area in the conveying direction can be selected in the interval of 0.2 m / s to 20 m / s, and preferably in the interval of 0.4 m / s to 20 m / s. The objects can be conveyed through the inspection area in a free fall or by a conveyor. If there is a conveying system for conveying the objects, the object conveying speed can be understood as the conveyor belt speed. According to an exemplary embodiment, the inspection system includes at least one of a conveyor and a free fall path. The inspection system can include a conveying device, which can include at least one of a conveyor and a free fall path.

[0030] According to an exemplary embodiment, the inspection system comprises a conveyor, and the inspection area corresponds to the surface of the conveyor. Optionally, the inspection system further comprises a free fall path, and the inspection area corresponds to the free fall path.

[0031] The objects passing through the inspection area may be provided in a continuous or intermittent manner. The objects passing through the inspection area may be provided sequentially or in parallel or as an overall flow. Thus, single objects and / or parts of objects and / or multiple objects may be present in the inspection area at the same time. Whether the objects pass through the inspection area one at a time or several at a time, for example in one, two or more ordered lines or in a less structured manner (for example, as a mass of material carried by a conveyor or in free fall), the passing objects may be referred to as a flow of objects.

[0032] The size and / or extension direction of one, two, a group or all of the inspection zones may be selected based on, for example, the type of objects to be inspected, the expected number of objects, the size of the objects and / or the flow rate of the objects. The size of the inspection zone may be defined by the length and width of the inspection zone, wherein the length of the inspection zone is the distance over which the associated reflective surface redirects the field of view during a rotation of the scanning element, and the width of the inspection zone is the extension of the field of view in a direction orthogonal to the length of the inspection zone. In the case where the detector system has an active state (spectral information is recorded from the inspection area) and an inactive state (spectral information is not recorded from the inspection area, for example due to a shutter being closed or the detector being in an inactive state), assuming that the detector is in its active state during a rotation of the scanning element, the length and extension of the inspection zone may correspond to the area covered by the redirection of the field of view of at least one detector.

[0033] The inspection area may correspond to an area extending above or below the flow of objects or through the flow of objects or through the expected middle of the flow of objects. For example, if the objects passing through are a row of bananas arranged on a flat surface (such as a conveyor belt), the inspection area may coincide with the flat surface or the expected middle of these fruits, but some small fruits may pass below the expected middle or pass through the area just above these fruits. If the objects passing through are a large amount of grain in free fall, the inspection area may extend through the expected middle of the grain flow or into the grain flow. The inspection area is preferably parallel to the conveying direction.

[0034] The inspection area may cover or include the entire width of the object flow. Alternatively, the inspection area may cover or include one or more portions of the entire width of the material flow, and optionally also cover or include an area directly adjacent to the object flow, within which one or more portions of the field of view of at least one detector may be redirected by means of a scanning element. In more detail, the inspection area covers only the portion of the target flow path that is in the conveying direction of the target flow, but may cover a portion or the entire width of the target flow path that is in the lateral extension of the target flow. Regardless of whether the inspection area covers a portion or the entire width of the object flow path, it may also cover an area directly adjacent to the object travel path, i.e., one side of the object travel path. The inspection area is typically a 2D area.

[0035] According to one example, when the objects pass through the inspection area, each object extends across at least 3 inspection zones simultaneously, or extends across at least 4 inspection zones simultaneously. With respect to the inventive concept, the expression "when the objects are conveyed through the inspection area, the objects extend across X inspection zones simultaneously" means that there is at least one time point when the objects extend across X inspection zones. Preferably, the objects extend across this number of inspection zones during at least 50% of the time it takes them to pass through the inspection area.

[0036] According to an exemplary embodiment, the inspection system includes a conveyor, the conveyor being one of: a conveyor belt and a conveyor provided with a set of compartments for conveying at least one object through the inspection area, wherein when the object conveying surface of the conveyor is arranged in the inspection area, the object conveying surface extends over at least 3 inspection zones. When the object conveying surface is arranged in the inspection area, the object conveying surface may extend over at least 60% of the inspection zones, or over at least 75%, or over all of the inspection zones except two, or over all of the inspection zones.

[0037] In connection with the inventive concept, the term "object conveying surface" is to be understood as a surface of a conveyor which comes into contact with objects during conveyance or which carries objects.

[0038] According to an exemplary embodiment, the objects are conveyed by means of a conveyor provided with a set of compartments, each compartment having the ability to convey at least one object through the inspection area; wherein the at least one object extends simultaneously over at least 3 inspection subareas when conveyed through the inspection area by one of the compartments. Each compartment may, for example, have the ability to convey only one object, or at least 1 or at least 2 objects, or between 2 and 5 objects, or at least 5 or at least 10 objects, or between 2 and 50 objects, or more than 20 or more than 50 objects of a predetermined size or type through the inspection area. A compartment may, for example, have the ability to convey an object the size of 1 apple through the inspection area, or be designed or configured to convey the object through the inspection area; or the compartment may, for example, have the ability to convey 20 objects each the size of a grape through the inspection area, or be designed or configured to convey the object through the inspection area. When a compartment has the ability to convey 20 grapes through the inspection area, the 20 grapes may simultaneously extend across, for example, at least 3 or 4 inspection subareas.

[0039] According to an exemplary embodiment, when an object passes through the inspection area, it is partially located in different inspection zones.

[0040] According to an example, the objects arranged in the inspection area and / or the conveyor surface or the object transporting conveyor surface may each be located partially in different inspection zones.

[0041] The inspection area is usually divided into a plurality of elongated inspection zones with longitudinal extensions, which are preferably arranged side by side. Each of the plurality of elongated inspection zones extends in a main direction. The inspection zones may have substantially the same shape, such as a substantially rectangular shape. The inspection zones may be arranged parallel to each other, and the corresponding main directions of each elongated inspection zone may be arranged substantially in parallel, for example. Alternatively, all or some of the inspection zones may be arranged in a divergent or converging configuration in the direction of field of view movement. In addition, all or some of the inspection zones may be arranged parallel or non-parallel or may be parallel or non-parallel. The number of inspection zones may be adjusted according to the overall size of the inspection area and the number of reflective surfaces provided by the scanning element. For example, the number of inspection zones may be 2, 3, 4, 5, 6, 7, 8, 9, 10, at least 12, or at least 16, or at least 20 or more. The number of inspection zones may be an even number. The number of inspection zones may be an odd number. The shape of the inspection zone depends on the geometry and size of the reflective surface of the scanning element, and sometimes also on the distance to the inspection area.

[0042] According to one example, the inspection area includes two or more inspection zones that overlap each other, and the inspection system can integrate the captured data from the corresponding zones associated with the same zone of the inspected object. For example, zone A of the object can be within the first inspection zone and also within the second overlapping inspection zone. The captured data about the zone A of the object can be integrated with the inspection data, thereby improving the quality of the representation provided by the captured data about the zone A of the object.

[0043] Additionally or alternatively, the inspection area includes two or more inspection subareas that are directly adjacent to each other, which may mean that they do not overlap. Thus, the scanning element can redirect the field of view of at least one detector along a larger inspection area that extends continuously. This can be beneficial for increasing the total field of view and / or object throughput. Additionally or alternatively, the inspection area includes two or more adjacent inspection subareas that are arranged at a certain distance from each other, which enables tracking of how an object moves and / or changes between two separated inspection subareas. This can be beneficial for motion tracking, determining object trajectories and / or objects changing between two separate inspection subareas. The spacing distance between two adjacent inspection subareas can be, for example, at least 1 mm, at least 5 mm, at least 1 cm, at least 5 cm, at least 1 dm or at least 5 dm.

[0044] Additionally or alternatively, the inspection area includes a number of overlapping, directly adjacent and / or adjacent inspection zones that are arranged at substantially the same center-to-center distance, which can allow the inspection to determine how individual objects move within the inspection area. This can enable the inspection system to identify whether objects rotate in the inspection area and how much they rotate. In addition, this can enable the inspection system to identify how objects within the bulk flow move relative to the bulk flow. This can also enable the inspection system to track individual objects as they move along the inspection area, for example, thereby determining one or more trajectories of the corresponding one or more objects. This can also enable height measurements of objects within the inspection area and enable processing of improved geometry compensation by taking into account the height information of the objects.

[0045] As an example, the reflective surface is oriented such that the longitudinal extension of the elongated inspection partition is substantially parallel to the object conveying direction. Thereby, the field of view of the at least one detector can be moved together with the object to be inspected, thereby facilitating the inspection and / or improving the clarity. Alternatively, the longitudinal extension of the elongated inspection partition is oriented substantially orthogonal to the object conveying direction. Thereby, the field of view can be moved in a transverse direction of the object conveying path, which may be preferred for increasing the number of objects that can be inspected per unit time.

[0046] According to an example, the scanning element is configured such that it is adapted to redirect the field of view of the at least one detector along equidistant scan lines or non-equidistant scan lines.

[0047] According to one example, the longitudinal extension of each elongated inspection zone deviates from the conveying direction of the conveyor by an angle within the angular interval of 0° to ±90°, or by an angle within the angular interval of 0° to ±50°, or by an angle within the angular interval of 0° to ±25°, or by an angle within the angular interval of 0° to ±5°, or by an angle within the angular interval of 0° to ±4.4° or less, or by an angle within the angular interval of 0° to ±2.2° or less. The deviation angle may be selected as a compromise between the resolution of the optics and the distance between the optics and the zones.

[0048] Alternatively, the longitudinal extension of each elongated inspection zone deviates from an angle within an angular interval of ±30° to ±90°, or from an angle within an angular interval of ±40° to ±90°, or from an angle within an angular interval of ±60° to ±90°, relative to the conveying direction of the conveyor. Alternatively, the corresponding longitudinal extensions of most of the elongated inspection zones deviate from an angle within an angular interval of 0° to ±90°, or from an angle within an angular interval of 0° to ±50°, or from an angle within an angular interval of 0° to ±25°, or from an angle within an angular interval of 0° to ±5°, relative to the conveying direction of the conveyor. Alternatively, the corresponding longitudinal extensions of most of the elongated inspection zones deviate from an angle within an angular interval of ±30° to ±90°, or from an angle within an angular interval of ±40° to ±90°, or from an angle within an angular interval of ±60° to ±90°, relative to the conveying direction of the conveyor.

[0049] The inspection area may correspond to the surface and / or free fall path of the conveyor. The inspection area may extend in a first direction and in a second direction at right angles to the first direction. The first direction may be parallel to the conveying direction of the conveyor. The second direction may be parallel to the transverse axis of the conveyor. The inspection area may be elongated in one direction, for example, of the first direction and the second direction.

[0050] The scanning element is configured to rotate about a first rotation axis. The scanning element may be rotatably arranged, and the first rotation axis may be arranged to substantially cross the path of travel of the object to be inspected and / or to one side of the path of travel. Alternatively, the scanning element may be rotatably arranged, and the first rotation axis may be arranged to substantially parallel to the path of travel of the object to be inspected, and to be arranged above the path of travel and / or to one side of the path of travel.

[0051] According to one example, the scanning element comprises a plurality of reflective surfaces, which are preferably arranged one after another around the first rotation axis. Some or most or all of the reflective surfaces are used to inspect the objects passing through and can be referred to as reflective inspection surfaces. These reflective surfaces (i.e., reflective inspection surfaces) redirect the field of view of the at least one detector to one of the inspection partitions of the inspection area. Each of the reflective inspection surfaces can redirect the field of view of the at least one detector to different elongated inspection partitions, alternatively, two or more of the reflective inspection surfaces can redirect the field of view of the at least one detector to the same or partially the same elongated inspection partition. According to one example, for all inspection partitions, there are at least two reflective inspection surfaces that redirect the field of view of the at least one detector to the same elongated inspection partition. In addition to the reflective inspection surface, the scanning element can also include, for example, one, two or more reflective reference surfaces. The reflective reference surface is configured to redirect the field of view of the at least one detector to one, two or more references for calibration purposes. According to this example, the plurality of reflective surfaces include a plurality of reflective inspection surfaces and at least one reflective reference surface. In addition, the plurality of reflective inspection surfaces may include the group of reflective surfaces. The scanning element may be adapted in shape and size such that at least two reflecting surfaces of the set of reflecting surfaces redirect a field of view of at least one detector to the same inspection zone of the inspection area.

[0052] The inspection system may be provided with a device adapted to compile information about the objects and / or the classification of the objects in at least the first and second categories. The inspection system may comprise a housing for accommodating at least some of the components of the inspection system. The housing may be adapted to be arranged above and / or to one side of a predetermined path of travel of the objects to be inspected. The path of travel may be achieved at least in part by means of a conveyor system.

[0053] The apparatus may include an ejection device disposed downstream of the inspection area. The ejection device may be adapted to eject and sort the objects into at least two different destinations. The at least two different destinations may depend on the object classification.

[0054] The apparatus may include a control cabinet. The control cabinet may include equipment for controlling the apparatus and / or the inspection system. The equipment may include a processing unit or a control unit for controlling the conveying system, the ejection device and / or the inspection system. The processing unit may be used to determine one or more properties of the object based on measurements performed by the inspection system. The inspection system may include a control unit configured to estimate the movement of the object and / or track the trajectory of the object as the object passes through the inspection partition. Specifically, the ejection device may be adapted to operate operably with the processing unit or the control unit to provide improved ejection and sorting accuracy due to the analysis and processing of the detected motion information.

[0055] According to one example, the optical radiation originating from the object is one, two or all of emission by the object, reflection and scattering and / or transmission through the object. The inspection system may include an illumination device adapted to provide an illumination beam for at least partially illuminating the inspection partition. The inspection system may include at least one illumination device adapted to emit optical radiation towards the inspection area and / or the object, preferably by the optical radiation reflected by the scanning element. The at least one illumination device preferably comprises an illumination / irradiation source selected from the group comprising LEDs, halogen lamps and / or lasers. Scanning or redirecting the illumination using the same surface that scans or redirects the field of view is advantageous compared to scanning the illumination using a different surface because it provides improved coordination between the illumination and the field of view.

[0056] According to an example, the scanning element has a set of surface normals, wherein each of the surface normals is a central surface normal of a respective one of the set of reflective surfaces, and wherein each of the surface normals in the set of surface normals has a different tilt angle relative to the rotation axis compared to other surface normals in the set of surface normals. In general, the respective tilt angles may be selected within an interval of ±1°, ±2°, ±3°, ±4°, ±5°, ±6°, ±7°, ±8°, ±9°, ±10°, ±12°, ±15°, ±20° or ±40°. The interval in which the respective tilt angle may be selected may optionally exclude 0°, or may optionally exclude ±0.1°, or may optionally exclude ±0.4°, or may optionally exclude ±1°.

[0057] In general, the scanning element comprises at least two reflective surfaces having different inclination angles, respectively. Thus, the field of view of the detector can be oriented toward at least two different inspection subareas of the inspection area. The scanning element may comprise a plurality of reflective surfaces, all of which are inclined at the same inclination angle. The scanning element may comprise one, two or more reflective surfaces, wherein each reflective surface is at a first inclination angle with the first rotation axis. The scanning element may comprise one, two or more reflective surfaces, wherein each reflective surface is at a second inclination angle with the first rotation axis, the second inclination angle being different from the first inclination angle.

[0058] Thereby, the scanning element can redirect the field of view of the detector to at least two different inspection zones of the inspection area.The number of inspection zones to which the scanning element can redirect the field of view of the detector depends for example on the number of unique tilt angles presented by the reflecting surface of the scanning element.

[0059] According to an example, each reflective surface in the set of reflective surfaces is flat or substantially flat.

[0060] According to one example, each of the reflective surfaces in the group of reflective surfaces comprises a reflective surface that is at least partially flat, and the reflective surface represents at least 80% of the surface area of ​​the entire surface area of ​​each of the reflective surfaces in the group of reflective surfaces. The at least partially flat reflective surface may represent at least 40%, or 40% to 50%, 50% to 60%, 60% to 70%, 70% to 80%, 80% to 90%, or 90% to 100% of the entire surface area of ​​each reflective surface. The remaining surfaces (i.e., surfaces that are not locally flat) are curved outward to increase the field of view, and are preferably arranged at the edge portions of the reflective surfaces.

[0061] According to one example, all reflective surfaces have substantially the same shape and surface area. This can facilitate the scanning element to redirect the field of view of the detector to the inspection partition of substantially the same shape and optionally the longitudinal extension. In addition, this can also produce a more mass-balanced scanning element, thereby preventing the scanning element from swinging when rotating around the first rotation axis. The scanning element optionally includes an even number of flat reflective surfaces, and wherein each flat reflective surface has a corresponding flat reflective surface arranged on the opposite side of the scanning element, and wherein the corresponding surface normals of the flat reflective surface and the corresponding flat reflective surface are substantially parallel. In other words, the scanning element includes a pair of the group of reflective surfaces, preferably arranged in relative devices. Thus, if each reflective surface is also arranged at substantially the same distance from the first rotation axis, each pair of reflective surfaces provides a centroid that can be substantially coincident with a point along the first rotation axis. Therefore, all pairs of reflective surfaces provide a centroid that can be substantially coincident with a point along the first rotation axis. Therefore, the scan can rotate without swinging.

[0062] According to one example, the at least one detector system comprises at least one spectrometer for analyzing the spectral characteristics of the object. The at least one spectrometer may be adapted to be able to cope with a desired repetition rate. The repetition rate may mean a frequency that depends on the rotation speed of the scanning element. One or more or each spectrometer of the detector system may be configured to analyze optical radiation within a wavelength interval of 100nm to 1000nm, or within a wavelength interval of 400nm to 1100nm, or within a wavelength interval of 1100nm to 1900nm. One, two or all spectrometers may be adapted to analyze visible light and / or UV light. Additionally or alternatively, one, two or all spectrometers may be adapted to analyze NIR light. Additionally or alternatively, one, two or all spectrometers may be adapted to analyze IR light. Different types of spectrometers may be used depending on the expected characteristics of the object to be inspected. Each of the at least one spectrometer is configured to detect electromagnetic radiation selected from a group comprising UV, visible light and NIR or a combination thereof.

[0063] According to one example, the inspection system further comprises a processing circuit system configured to perform:

[0064] a data collection function configured to collect spectral data associated with spectral characteristics of the object based on the signal from the spectrometer, the spectral data relating to the optical radiation originating from the object when the object is arranged in at least one of the first number of inspection zones,

[0065] a data processing function configured to provide an object representation based on the spectral data, and

[0066] An output function is configured to output object information based on the object representation.

[0067] According to one example, the inspection system includes a conveying device configured to convey an object through an inspection area. The conveying device can be a conveyor system suitable for moving the object to be inspected along a travel path that starts, ends or passes through the inspection area. Additionally or alternatively, the travel path can include a motion sequence involving horizontal sliding, sliding along an inclined surface, free fall.

[0068] The transport device may be configured to provide rotational movement of the object, and for example at least a full rotation of the object. When a full rotation is provided, the detector system may establish a 360° spectral representation of the object. Preferably a full rotation of the object is provided within the inspection region.

[0069] According to an example, the conveying device may be configured to rotate the object in a first direction around a first object rotation axis, the rotation being provided, for example, by a first rotation device. The first object rotation axis may be arranged substantially orthogonal to the object conveying direction, or may be arranged transversely to (e.g., at 45 degrees transversely to) the object conveying direction.

[0070] Additionally or alternatively, the conveying device may be configured to rotate the object in a second direction about a second object rotation axis, the second rotation being provided, for example, by the first rotation device or the second rotation device. The second object rotation axis may be arranged substantially orthogonal to the first object rotation axis and / or the object conveying direction. Additionally or alternatively, the second object rotation axis may be arranged transversely to (e.g., at 30 degrees, 45 degrees, or 60 degrees transversely to) the object conveying direction.

[0071] According to one example, the first object rotation axis may be substantially transverse to (eg, at 30 degrees, 45 degrees, or 60 degrees transverse to) the second object rotation axis.

[0072] The first rotating device and / or the second rotating device may be one or more rollers or belts arranged to enable the rotation of the object. Additionally or alternatively, the first rotating device and / or the second rotating device may be a support or fixture for holding the one or more objects while rotating the one or more objects. The first rotating device and / or the second rotating device may be arranged to enable the rotation within the inspection area.

[0073] This can facilitate the inspection system to create a 360° spectral representation of the object.

[0074] According to an example, the transport device is configured to transport the object through the inspection area in a direction substantially along a longitudinal extension of the first number of elongated inspection zones, and wherein the first rotation axis is arranged transversely to the direction.

[0075] According to one example, the inspection system includes a conveyor provided with a group of compartments or support devices, wherein each compartment or support device is configured for or has the ability to transport only one object, or at least 1 or at least 2 objects, or between 2 and 5 objects, or at least 5 or at least 10 objects, or between 2 and 50 objects, or more than 20 or more than 50 objects through the inspection area; and wherein each compartment or support device is preferably arranged to rotate the object carried by the compartment or support device when passing through the inspection area.

[0076] According to one example, the inspection system comprises a control unit configured to estimate the motion of the object and / or track the trajectory of the object as it passes through the inspection zone. Thereby, the inspection system can easily associate the surface of the object that has been inspected by the inspection system. Thereafter, the inspection system can estimate whether the object must be rotated in any specific direction.

[0077] According to one example, each of the at least one detector is configured to detect electromagnetic radiation selected from the group consisting of UV, visible light, and NIR, or a combination thereof. For example, the first detector may be adapted to analyze UV ​​light or primarily analyze UV ​​light. The second detector may be adapted to analyze visible light or primarily analyze visible light. The third detector may be adapted to analyze NIR light. The inspection system may be adapted to multiple detectors of any one type of each type of detector.

[0078] According to one example, the inspection system includes

[0079] at least one illumination device adapted to emit optical radiation towards an inspection area and / or the object, preferably by means of the optical radiation being reflected by the scanning element,

[0080] Therein, the at least one illumination device preferably comprises an illumination source selected from the group consisting of LEDs, halogen lamps and / or lasers.

[0081] Thereby, the inspection system can illuminate the inspection area, and in particular any of the respective inspection zones, in a controlled manner.Additionally or alternatively, at least one illumination source is arranged such that radiation leaves the object in the inspection area after being transmitted through the object and / or scattered within the object.

[0082] According to one example, the plurality of reflective surfaces comprises at least a first group of reflective surfaces associated with a corresponding at least a first group of elongated inspection zones, wherein the at least first group of elongated inspection zones comprises at least two elongated inspection zones overlapping, or directly adjacent, or adjacent and separated by a distance.

[0083] According to one example, the number of elongated inspection zones in the inspection area is between 4 and 24 or between 8 and 12.

[0084] According to one aspect, the invention relates to a method for inspecting an object passing through an inspection area by means of an inspection system, the inspection area being divided into a plurality of elongated inspection zones having a longitudinal extension, wherein the inspection system comprises a scanning element arranged to rotate about a first rotation axis and comprising a first set of reflecting surfaces arranged one behind the other about the first rotation axis, the inspection system further comprising at least one detector having a field of view for receiving optical radiation, the method comprising:

[0085] receiving, by at least one detector, optical radiation originating from an object disposed in at least one of the first number of inspection zones;

[0086] The scanning element is rotated such that each of the surfaces redirects the field of view of the detector to a different one of the first number of elongated inspection zones and such that each of the surfaces redirects the field of view along the extension of a respective elongated inspection zone.

[0087] According to a second aspect, the invention relates to a method for inspecting an object passing through an inspection area by means of an inspection system, the inspection area being divided into a plurality of elongated inspection zones having a longitudinal extension, wherein the inspection system comprises at least one detector having a field of view for receiving optical radiation, and

[0088] A scanning element is arranged to rotate about a first rotation axis and comprises a first set of reflective surfaces arranged one after another about the first rotation axis, wherein each reflective surface is adapted in size, shape and orientation.

[0089] The method includes:

[0090] receiving, by at least one detector, optical radiation originating from an object disposed in at least one of the first number of inspection zones;

[0091] The scanning element is rotated such that each of the surfaces redirects the field of view of the detector to a different one of the first number of elongated inspection zones and such that each of the surfaces redirects the field of view along the extension of a respective elongated inspection zone.

[0092] According to one example, the method further includes

[0093] conveying the objects through the inspection zone in a direction transverse to or substantially parallel to the longitudinal extension of the inspection zone, and

[0094] The object is rotated as it is conveyed through the inspection area.

[0095] The object can be transported by the transport device discussed above. The object can be rotated by the first rotating device and / or the second rotating device discussed above.

[0096] According to one example, the method includes:

[0097] The spectral characteristics of the object passing through the inspection zone are measured.

[0098] Thereby, additional properties of the object can be determined, rather than purely visual properties.

[0099] According to one example, the method includes:

[0100] measuring the spectral properties of the object at different sides of the object passing through the inspection zone, and preferably

[0101] Create a 360° spectral representation of an object.

[0102] Thereby, it may be possible to build such a 360° spectral representation in a reliable manner with high throughput capabilities.

[0103] Spectral features can be identified with the help of spectral processing.

[0104] According to one example, the illumination device for illuminating the object may emit optical radiation in one or a combination of the ultraviolet, visible, near infrared and infrared wavelength ranges.

[0105] According to an exemplary embodiment, the receiving of optical radiation reflected, scattered and / or emitted by the object in the first inspection zone comprises receiving optical radiation in one or a combination of ultraviolet, visible, near infrared and infrared wavelength ranges.

[0106] According to an exemplary embodiment, the sensor device comprises at least a first sensor configured to detect optical radiation in the ultraviolet and / or visible wavelength range and a second sensor configured to detect optical radiation in the near infrared and / or infrared wavelength range.

[0107] According to an exemplary embodiment, the scanning element and optionally the optical element are further configured to simultaneously receive optical radiation from at least the second and third inspection zones at least during the second and third time intervals and to redirect the optical radiation towards the sensor device.

[0108] The sensor device preferably comprises at least one sensor array, wherein each of the at least one sensor array has a plurality of sensor pixels, wherein the at least one sensor array is arranged such that optical radiation reflected, scattered and / or emitted by the object in the corresponding inspection zone is received at a corresponding group of sensor pixels of the at least one sensor array, wherein the pixels of the corresponding group of sensor pixels are different or only partially overlap.

[0109] At least one detector system may include at least one spectrometer and / or at least one charge coupled device (CCD) for analyzing the spectral characteristics of the object. Alternatively or in addition, at least one detector system may include a camera-based sensor device for analyzing an image of the object. The camera-based sensor device may, for example, include at least one 2D camera.

[0110] The inspection system may also include a processing unit coupled to the spectral system and the camera-based sensor device, wherein the processing unit is configured to determine a first set of attributes related to the objects in the inspection area based on the output signal of at least one detector, and wherein the processing unit is configured to optionally determine a second set of attributes related to the objects in the inspection area based on the output signal of at least one detector, the at least one detector may be a spectrometer or a camera-based sensor device. Providing a processing unit coupled to the spectral system and / or the camera-based sensor device enables the processing unit to determine one or more attributes of the objects in the inspection area. Therefore, the processing unit may receive signals from the spectral system and / or the camera-based sensor device. The received signals may be based on analysis of light received by the spectral system and / or the camera-based sensor device, respectively. It should be noted that in the context of the present application, the term processing unit may be any unit, system or device capable of receiving one or more signals or data from other entities and processing the received signals or data. The processing may, for example, include calculating one or more attributes based on the received signals or data, forwarding the received signals or data, and changing the received signals or data. The processing unit may be a single unit, or may be distributed over multiple devices (such as multiple PCs), each of which has processing capabilities. The processing unit may be implemented in hardware or software. It should be noted that in the context of the present application, the term attribute set may be any data set including any type of data. An attribute set may include any number of attributes (including 0). Thus, an attribute set may be an empty set, which may, for example, indicate that an object does not exist.

[0111] The first set of attributes may indicate at least one of a spectral response of an object, a material type of an object, a color of an object, a fluorescence of an object, a phosphorescence of an object, a maturity of an object, a dry matter content of an object, a water content of an object, a fat content of an object, an oil content of an object, a calorific value of an object, the presence of bones or fish bones of an object, the presence of pests, a mineral type of an object, an ore type of an object, a defect level of an object, detection of harmful biological materials of an object, the presence of an object, the absence of an object, detection of multiple layers of materials of an object, detection of fluorescent and / or phosphorescent markers of an object, a color marker of an object, a quality grade of an object, a physical structure of a surface of an object, a 3D surface of an object, and a molecular structure of an object.

[0112] Examples of relevant harmful biological materials that can be detected are mycotoxins.

[0113] The above-mentioned features of the first attribute set can be determined in a specific combination, which can be useful for detecting articles in the inspection area. Examples of applications for which such a combination is useful are the sorting of pet food, the detection of fish bones in fish fillets, paper sorting using visible light and NIR spectra, the removal of foreign matter and shells in pistachios, the recycling of polymers, product grading or quality inspection in packaging processes, just to give a few non-limiting examples. The second attribute set can indicate at least one of the height of an object, the height profile of an object, a 3D map of an object, the intensity profile of reflected and / or scattered light, the volume center of an object, the estimated center of mass of an object, the estimated weight of an object, the estimated material of an object, the presence of an object, the absence of an object, the detection of isotropic and anisotropic light scattering of an object, the structure and quality of wood, the surface roughness and texture of an object, and the indication of the presence of a fluid in an object. Examples of related fluids are oil and water in food.

[0114] Examples of applications for which such a combination is useful are glass sorting and quartz sorting, to give just a few non-limiting examples. The processing unit may also be configured to receive an input indicative of a viewing angle of the camera-based sensor arrangement relative to the inspection area, and to compensate for the viewing angle of the camera-based sensor arrangement when determining the second set of properties, which is advantageous because a more accurate subsequent sorting or ejection of the objects may be achieved. The ejector may be configured with a valve image processing step for reducing or minimizing compressed air consumption and energy consumption while maintaining optimal sorting yield and sorting losses.

[0115] The objects to be classified can be provided as a stream of objects and the inspection system illuminates the objects to be classified with optical radiation, for example in the UV wavelength range, designed to induce fluorescence events and / or phosphor responses from the illuminated objects. Since the stream of objects is moving and there is a delay before phosphorescence occurs, it is difficult to determine the spectrum, especially the rise and decay times, with high accuracy.

[0116] According to an exemplary embodiment, data from the inspection zone is collected by the scanning element during one or more scans, and the data is representative of at least a first spectrum, and wherein classifying the object includes determining the wavelength distribution of the first spectrum and optionally determining at least one property related to the shape of the first spectrum, such as peak height, peak width and / or peak area of ​​one or more peaks.

[0117] According to an exemplary embodiment, the classification of the object includes determining a rise time and / or a decay time of one or both of a phosphorescence event and a fluorescence event, for example, to determine a type of object.

[0118] According to an exemplary embodiment, the classification of the object may include classifying the object based on at least one attribute related to a corresponding one of the color, transmittance, reflectance, phosphor response, and fluorescence of the object. These attributes may be compared, for example, to one, two, or all of a threshold, a lookup table, and a reference.

[0119] According to an exemplary embodiment, the classification includes: determining whether the object is provided with a phosphor marker by means of at least one of image processing and spectral processing; and / or identifying one or more materials constituting the object, for example by means of spectral processing; and / or determining whether a combination of multiple materials constituting an object is acceptable or unacceptable when determining multiple materials constituting an object.

[0120] The phosphorus marker may be identified, for example, based on its shape, the outline of which may be identified by image processing. Additionally or alternatively, the phosphorus marker may be identified, for example, based on its spectrum or spectral signature emitted in response to being illuminated.

[0121] According to one example, the inspection system can be calibrated by placing a target calibration device in the inspection area, wherein the size and shape of the target calibration device are suitable for providing a calibration surface provided with a geometric shape and / or pattern. The inspection system can be configured to inspect the target calibration device to calibrate itself according to the detector settings. The detector settings can include setting the focus of at least one detector, calibrating the acquisition geometry, setting the color settings, assigning bins of the spectrometer to different wavelengths, and assigning a set of pixels to each inspection partition. The calibration surface can provide a textured surface. The textured surface can reduce the occurrence of specular reflections detected by at least one detector.

[0122] Additionally or alternatively, the inspection system may include one, two or more spectral calibration partitions for enabling a repetitive calibration of the spectral data of the inspection system, the at least one spectral calibration partition being preferably arranged downstream of the scanning element and optionally upstream of the inspection area as seen in the direction of the irradiation illumination. Preferably, a repetitive calibration is performed once per reflective surface of the scanning element or at least a plurality of repetitive calibrations are performed per revolution of the scanning element.

[0123] In particular, one advantage of the inventive concept is that it enables a solution with scanning interior lighting and thus provides higher energy efficiency compared to solutions with exterior lighting, since the interior lighting requires orders of magnitude less energy. BRIEF DESCRIPTION OF THE DRAWINGS

[0124] The above and additional objects, features and advantages of the inventive concept will be better understood through the following illustrative and non-limiting detailed description with reference to the accompanying drawings. In the accompanying drawings, the same reference numerals will be used for the same elements unless otherwise specified.

[0125] Figure 1 shows a schematic diagram of an apparatus including a testing system according to one embodiment of the present invention;

[0126] Figure 2a to Figure 2b Two respective orientations of the inspection area relative to the conveying system are schematically shown;

[0127] Figure 3 Schematically illustrates some components of an inspection system according to one embodiment of the present invention;

[0128] Figure 4 Schematically illustrates some components of an inspection system according to one embodiment of the present invention;

[0129] Figure 5 Schematically illustrates some components of an inspection system according to one embodiment of the present invention;

[0130] Figure 6 Schematically illustrates a scanning element of an inspection system according to one embodiment of the present invention;

[0131] Figure 7 Schematically illustrates a scanning element of an inspection system according to one embodiment of the present invention;

[0132] Figures 8a to 8c Schematically illustrates an inspection system according to one embodiment of the present invention;

[0133] Figure 8d schematically shows an inspection area divided into a plurality of elongated inspection zones;

[0134] Figure 9a shows a set of inspection images captured by an inspection system according to one embodiment;

[0135] Figure 9b shows a set of ordered inspection images captured by an inspection system according to one embodiment;

[0136] Figures 10a to 10c shows how the reflective surface of the scanning element can be adjusted according to the tilt angle;

[0137] Fig.11 A testing system according to one embodiment of the present invention is shown;

[0138] Figures 12a to 12cAn aspect of speed matching of an inspection system according to an embodiment of the present invention is shown;

[0139] Fig.13 A flow chart showing a method according to one embodiment of the present invention;

[0140] Fig.14a Fruit is shown being transported by a conveyor in separate compartments;

[0141] Fig.14b Shows when Fig.14a a representation of the output of spectral and / or image processing of data collected as the object shown in passes through the inspection area;

[0142] Fig.15 Shows Fig.14a The differences in spectral distribution of different fruits are shown in;

[0143] Fig.16a , Fig.16b A target calibration device according to an embodiment of the present invention is shown;

[0144] Fig.17a , Fig.17b , Fig.17c Different structures are shown for keeping passing objects separated and / or in different channels when, for example, passing through an inspection area.

[0145] Fig.17d An inspection system having a conveyor provided with a structure for dividing a flow of objects into separate lanes is shown;

[0146] Fig.18a , Fig.18b shows a side view and a top view of the same inspection system having a polygonal mirror and a rotatable reflective surface for redirecting the field of view;

[0147] Fig.19a , Fig.19b shows a side view and a top view of the same inspection system having two separate rotatable reflective surfaces for redirecting the field of view;

[0148] Fig.20a , Fig.20b Shown are side and top views of the same inspection system with only one rotatable reflective surface for redirecting the field of view. DETAILED DESCRIPTION

[0149] The inventive concept will now be described more fully below with reference to the accompanying drawings, in which currently preferred variations of the inventive concept are shown. However, the inventive concept can be implemented in many different forms and should not be construed as limited to the variations set forth herein; on the contrary, these variations are provided for the sake of thoroughness and completeness and to fully convey the scope of the inventive concept to those skilled in the art.

[0150] Figure 1 A schematic diagram of a device or sorting system 100 provided with an inspection system 1 according to an embodiment of the invention is shown. The device or sorting system 100 is adapted to compile information about objects 102 and / or to sort objects 102 into at least a first class and a second class.

[0151] The inspection system 1 is adapted to inspect an object 102 within an inspection area 104. The inspection system 1 may be adapted to inspect the object 102 within the inspection area 104 while the object 102 is stationary or moving. In a preferred embodiment, the inspection system 1 is adapted to inspect the object 102 within the inspection area 104 while the object 102 is continuously moving. In a preferred embodiment, the inspection system 1 is adapted to inspect the object 102 within the inspection area 104 while the object 102 is rotating. The object 102 to be inspected may move along a predetermined path of travel that begins, ends, or passes through the inspection area 104. Figure 1 In the depicted apparatus 100, the object 102 travels along a path of travel or a main conveying direction (direction T indicated by the arrow) through the inspection area 104 by means of a conveyor system 108. The object 102 to be inspected may be moved along the path of travel by other means, some non-limiting examples of which include, for example, by means of sliding (along a horizontal or inclined plane) or free fall. Figure 1 The conveyor system 102 is optional. The objects may be moved continuously or intermittently along the travel path. Figure 1 , the inspection system 1 is shown as being arranged to inspect objects that are generally located below the inspection system 1. However, the inspection system 1 is not limited to being arranged only to inspect objects that are generally moving below the inspection system 1; alternatively, the inspection system 1 can be arranged and / or oriented to be able to inspect objects that generally pass by one side of the inspection system 1.

[0152] The inspection system 1 may include a housing 110 for housing at least some of the components of the inspection system 1. The inspection system 1 may be at least partially disposed in the housing 110. The housing 110 may be disposed above or to one side of a predetermined travel path of an object to be inspected. Figure 1In the embodiment, the housing 110 is arranged above the conveyor system 108. The inspection system 1 is adapted to receive and analyze optical radiation that is at least one of emitted, reflected and scattered by the object and / or transmitted through the object. The inspection system 1 is discussed in more detail with reference to, for example, FIG. 2 and other figures below.

[0153] Figure 1 The depicted apparatus or sorting system 100 further comprises an ejection device 112 disposed downstream of the inspection area 104. The ejection device 112 is adapted to eject and sort the objects 102 into at least two different destinations. However, the ejection device 112 is optional.

[0154] Figure 1 The depicted apparatus 100 may also include a control cabinet 111. The control cabinet 111 may be arranged above the conveyor system 108. The control cabinet 111 includes equipment for controlling the apparatus 100. The equipment typically includes a processing unit 113 or a control unit for controlling the conveyor system 108, the ejection device 112, and the equipment in the housing 110. The processing unit 113 is typically used to determine properties of the object 102 based on measurements performed by the equipment in the housing 110.

[0155] The inspection system 1 may include a control unit configured to estimate the motion of the object and / or track the trajectory of the object as it passes through the inspection zone 104. This may facilitate inspection of the object being inspected by the inspection system 1.

[0156] According to one example, the inspection system may include a conveyor provided with a structure for dividing the flow of objects into separate lanes, such as Fig.17a and Fig.17d These figures are two different views of the same machine according to one operating mode. Fig.17b A conveyor is shown having structures for conveying objects in separate lanes and separate containers. Fig.17c Also shown is a conveyor provided with structure for conveying objects in separate lanes, the surface on which the objects rest may be configured to prevent the objects from rolling, for example by means of high friction or by separate compartments or cups for each object.

[0157] The inspection system 1 comprises means for inspecting different inspection zones of the inspection area 104. The inspection zone may be characterized by a predetermined length and width. The predetermined length and width may be selected according to object inspection parameters such as object type, object size, desired and / or expected object throughput.

[0158] like Figure 2a and Figure 2bAs shown in , the inspection area 104 can be divided into a plurality of inspection zones 104a, 104b, 104i, 104j arranged side by side. The inspection zones of the inspection area 104 can have the same size or the inspection zones can have different sizes and are characterized by an extension along a first direction L1 and an extension along a second direction L2 at right angles to the first direction L1. The inspection area 104 can be divided into a plurality of inspection zones 104a, 104b, 104i, 104j, wherein the inspection zones extend in parallel along the first direction L1. The inspection zones can each have a longitudinal extension along the first direction L1. The inspection zones can be elongated inspection zones 104a, 104b, 104i, 104j, for example, substantially rectangular, and extend longitudinally along the first direction L1.

[0159] The inspection area 104 can be divided into any suitable number of inspection zones. For example, the inspection area 104 can be divided into 2, 3, 4, 5, 6, 7, 8, 9, 10 or more inspection zones.

[0160] Figure 2a An inspection region 104 is depicted that includes ten parallel and elongated inspection zones 104a, 104b, 104i, 104j and is oriented such that the inspection zones extend longitudinally along L1 , substantially parallel to the direction of travel T of objects moving through the inspection region.

[0161] at the same time, Figure 2b An inspection zone 104 is depicted, the inspection zone comprising ten parallel and elongated inspection zones 104a, 104b, 104i, 104j and oriented such that the inspection zones extend longitudinally along L1 , substantially orthogonal to the direction of travel T of an object moving through the inspection zone.

[0162] The inspection system 1 is adapted to be able to inspect each individual inspection zone 104a, 104b, 104i, 104j. Thus, objects arranged in the inspection area 104 and / or a conveyor surface for transporting objects may be partially located in different inspection zones 104a, 104b, 104i, 104j, so that parts of the object can be inspected separately, for example by using different reflective surfaces of a scanning element.

[0163] In addition, if Figure 2a , Figure 2bAs illustrated in , the inspection zone may be divided into inspection sub-zones or a 2D and / or 3D arrangement of inspection zones, each inspection sub-zone 1040 or inspection zone 1040 preferably corresponding to the field of view of one of the at least one detector. The number of inspection zones in one inspection sub-zone may be, for example, 2, 3, 4, 6, 8, 9, 12, 16 or more than 16. Specifically, in Figure 2a , Figure 2b , the inspection subregion 1040 is divided into a 2D arrangement of 16 detection subregions. The inspection system 1 may be adapted such that each detection subregion corresponds to one 2D pixel of image data or spectral data obtained by means of a detector of the inspection system 1. In case of a 3D arrangement of detection subregions, each detection subregion may correspond to a 3D pixel or voxel of image data or spectral data obtained by means of a detector of the inspection system 1.

[0164] exist Figure 3 At least some components of the inspection system 1 are schematically shown in FIG. The at least some components may be suitable for being arranged in Figure 1 In the housing 110 shown in .

[0165] The inspection system 1 comprises a detector system 120. The detector system 120 is provided with at least one detector 131, 132, which is arranged and oriented such that it can receive optical radiation originating from an object 102 arranged in an inspection area 104. The inspection system 1 further comprises a scanning element 136 for receiving optical radiation originating from an object arranged in the inspection area 104 and redirecting the optical radiation towards the at least one detector 131, 132 directly or by means of further optional optical devices 123, 128, 129, thereby providing the at least one detector 131, 132 with a field of view of at least a portion of the inspection area.

[0166] The inspection system 1 may comprise an illumination device adapted to provide an illumination beam for at least partially illuminating the inspection zone 104. The inspection system 1 comprises at least one illumination device adapted to emit optical radiation towards the inspection zone 104 and / or the object 102, preferably by the optical radiation being reflected by the scanning element 136. The at least one illumination device preferably comprises an illumination source selected from the group comprising an LED, a halogen lamp and / or a laser.

[0167] By operating the scanning element 136, the illumination beam of optical radiation can be swept across the inspection area along the first direction L1. The first direction L1 can be orthogonal to the second direction L2. The first direction L1 and the second direction L2 can together define a plane spanned by the inspection area. The plane can be substantially parallel to the surface of the inspection area and / or the conveyor surface (if present). The inspection system 1 can be adapted to provide an illumination beam so that it can illuminate the object 102 in the inspection area at an angle that is non-orthogonal to the second direction L2. Alternatively, the illumination beam is provided so that it can intersect the object 102 at an angle orthogonal to the second direction L2.

[0168] The inspection system 1 may further include a first optical device 134. The first optical device 134 is adapted to direct and optionally converge the at least one illumination beam toward a scanning element 136. The scanning element 136 is adapted to redirect the at least one illumination beam along an illumination direction toward the inspection area 104 and an illumination area that is movable relative to the inspection area by operating the scanning element 136. The first optical device 134 is preferably configured to focus the at least one illumination beam in or near the inspection area 104.

[0169] if Figure 3 If the scanning element 136 is in the form of a rotating polygonal mirror rotatably arranged to rotate about a first rotation axis R, the rotation of the rotating polygonal mirror will redirect at least one illumination beam in the inspection area 104, and a shift of the illumination area within the inspection area 104 will occur. Therefore, at each rotation of the polygonal mirror, the redirection of at least one illumination beam will be repeated along the inspection area. Figure 4 The scanning element 136 is discussed in more detail in the other figures below.

[0170] The inspection system 1 is adapted to receive and analyze optical radiation that is at least one of emitted by, reflected and scattered by, and / or transmitted through, the object 102 within the inspection region 104. Radiation emitted by, reflected and scattered by, and / or transmitted through, the object 102 will impinge on a scanning element 136 (i.e., a polygonal mirror) before reaching the at least one detector, from which the optical element 121 of the inspection system receives the optical radiation. Optionally, the optical path from the polygonal mirror 136 to the detector includes additional optical elements, such as, for example, a fixed folding mirror that redirects radiation reflected by the polygonal mirror toward an optional housing 121. The fixed folding mirror may be located near the location where at least one illumination beam leaves the first optical device 134.

[0171] At least one detector system may include at least one spectrometer or CCD for analyzing the spectral characteristics of the object. One or more spectrometers may be included in the aforementioned detectors, or represent the detectors. At least one detector system may include at least one 2D camera.

[0172] The detector system may include one, two or more sensors, such as a first sensor 131 and a second sensor 132. Preferably, each of the one, two or more sensors is an array or matrix sensor including a plurality of pixels. Figure 2a , Figure 2b As shown in , each pixel can be associated with a corresponding detection sub-region. In addition, each sensor 131, 132 is preferably associated with a corresponding diffractive element 128, 129 such as a grating, and these pairs of sensors and diffractive elements are arranged at different positions and are arranged to receive corresponding parts of the optical radiation 122, wherein different parts of the optical radiation 122 are directed toward the first diffractive element 128 and the second diffractive element 129, respectively. The optical radiation 122 can be divided into two different parts, for example, by means of a beam splitting element 123.

[0173] More than one spectrometer may be used in the device 100. For example, the detector system may include a first sensor 131 adapted to analyze light in a first wavelength interval and a second sensor 132 adapted to analyze light in a second wavelength interval. As an example, the first spectrometer may be adapted to analyze light in the wavelength interval 450nm to 800nm, and the second spectrometer may be adapted to analyze optical radiation in the wavelength interval 1500nm to 1900nm. For example, a spectrometer for analyzing visible light may be used in combination with a NIR spectrometer.

[0174] Similarly, two, three or more spectrometers may be included in the detector system 120. Thus, three or more spectrometers may be used. For example, one spectrometer may be adapted to analyze visible light and may be used in combination with two NIR detectors. (e.g., 400nm to 700nm, 700nm to 1100nm, 1100nm to 1800nm)

[0175] The inspection system also includes a processing circuit system configured to perform: a data collection function configured to collect spectral data associated with spectral characteristics of the object based on a signal from the spectrometer, the spectral data relating to the optical radiation originating from the object when the object is arranged in at least one of the first number of inspection partitions; a data processing function configured to provide an object representation based on the spectral data; and an output function configured to output object information based on the object representation.

[0176] For example, spectral analysis can be used to determine the characteristics of the object being inspected. The characteristics of the object can include the presence of specific substances and / or component components, which can be used to infer the condition of the object, such as the maturity and / or dryness of food; temperature, oxidation, etc.

[0177] Figure 4 An inspection system 1 according to one embodiment is shown. The object 102 is rotated while being conveyed along the object travel path and is rotated by means of a rotation device arranged at the inspection zone. In the exemplary embodiment shown, the rotation device is provided as a plurality of rollers adapted to rotate about respective rotation axes parallel to the second direction L2. Thus, the object 102 is rotated while passing through the inspection zone. This enables a larger portion of the object 102 to be exposed for inspection by the inspection system 1, for example, a 360° comprehensive inspection of the object.

[0178] Figure 5 An inspection system 1 according to one embodiment is shown. Objects 102 are provided by holding means for holding the respective object to be inspected. This allows for accurate orientation of the object as it is conveyed through the inspection area. Each holding means may be provided with a space or compartment for holding the object 102. The holding means may include a rotating means for rotating the object. Although in Figure 5 It is not shown in the drawing, but the holding device may be adapted to rotate about an axis of rotation C, which is substantially orthogonal to the first direction L1 and / or the second direction L2. The holding device may be a holder, a container or the like.

[0179] Now it will be from Figure 6 Let's start by discussing the scanning element 136 in more detail. The scanning element 136 includes a set of reflective surfaces 136a, 136b, ..., 136j arranged one after another around a first rotation axis R, and the scanning element 136 is configured to rotate around the first rotation axis. Therefore, by rotating the scanning element 136 around the first rotation axis R, the field of view of the detector can be moved in a sweeping motion within the inspection area 104 in a direction substantially parallel or anti-parallel to the first direction L1. The scanning element 136 has a set of surface normals na, nb, ..., which describe the orientation of the corresponding reflective surfaces 136a, 136b, ..., 136j in the set of reflective surfaces 136a, 136b, ..., 136j of the scanning element 136. The surface normals na, nb, ... can be corresponding center surface normals, meaning surface normals at the corresponding center of each reflective surface. The orientation of each reflective surface can be described using the relative angle between each surface normal and a corresponding nominal surface normal, which is defined as being substantially orthogonal to the first axis of rotation; such relative angle is hereinafter referred to as the tilt angle α, see Figure 7For a surface normal that is orthogonal to the axis of rotation in all directions, the tilt angle α is 0 degrees.

[0180] Generally speaking, the corresponding tilt angle can be selected from the range of ±1°, ±2°, ±3°, ±4°, ±5°, ±6°, ±7°, ±8°, ±9°, ±10°, ±15°, ±20° or ±40°.

[0181] At least two reflecting surfaces 136a, 136f of the set of reflecting surfaces 136a, 136b, ... of the scanning element 136 are arranged so that the corresponding surface normals na, nf of the at least two reflecting surfaces 136a, 136f are at different inclination angles αa, αf relative to the first rotation axis R. Figure 5 , which shows a schematic side view of a scanning element 136 according to one embodiment of the present invention. Thus, when the scanning element 136 is rotated to change the reflective surface of the at least two reflective surfaces 136a, 136f in the set of reflective surfaces 136a, 136b, ... that redirects the field of view of the detector to the inspection area 104, the field of view of the detector can be shifted in a second direction L2 that is different from the first direction L1.

[0182] As previously described, the inspection area 104 can be divided into a plurality of parallel inspection zones. The tilt angles of the respective reflective surfaces can be selected so that each reflective surface redirects the field of view of the detector to a specific and optionally unique inspection zone 104a, 104b, ... of the inspection area 104. The number of inspection zones 104a, 104b, ... that can be inspected by the inspection system 1 can be determined by the number of unique tilt angles represented by the reflective surfaces in the set of reflective surfaces 136a, 136b, ... of the scanning element 136.

[0183] For example, two reflective surfaces of the scanning element 136 may be at a first inclination angle to the first rotation axis R, and the other two reflective surfaces of the scanning element 136 may be at a second inclination angle to the first rotation axis that is different from the first inclination angle. Thus, the scanning element 136 includes four reflective surfaces, but assuming that all four reflective surfaces have the same shape, only two inspection zones of the inspection area will be inspected.

[0184] In a preferred embodiment, each reflective surface in the set of reflective surfaces 136a, 136b, ... has the same shape and is arranged at different (i.e., unique) inclination angles relative to the first rotation axis R. This makes it possible to inspect a plurality of substantially identical elongated inspection partitions arranged in parallel in the inspection area. As an example, the scanning element 136 includes ten reflective surfaces. If each of these reflective surfaces is at a different angle relative to the first rotation axis R at a corresponding inclination angle, the inspection area 104 divided into ten parallel inspection partitions can be inspected when the scanning element rotates.

[0185] All or most of the reflective surfaces of the group of reflective surfaces 136a, 136b, ... may have substantially the same shape and surface area. For example, the shape of the reflective surface may be flat. Additionally or alternatively, they may have a shape that is at least partially or completely concave or convex. The scanning element may be adapted so that each of the reflective surfaces in the group of reflective surfaces includes an at least partially flat reflective surface, which represents a surface area of ​​at least 80% of the entire surface area of ​​each of the reflective surfaces in the group of reflective surfaces. Optionally, surfaces other than the locally flat reflective surfaces are convex so as to increase the field of view of the detector. Preferably, the surfaces on the corresponding lateral sides of the locally flat reflective surfaces are convex. The lateral side is arranged on one side of the locally flat surface in a direction parallel to the axis of rotation.

[0186] The scanning element 136 may include an even number of reflective surfaces 136a, 136b, ... Each reflective surface 136a, 136b, ... may have a corresponding reflective surface arranged on an opposite side of the scanning element 136, thereby forming a scanning element 136 having an even number of reflective surfaces 136a, 136b, ... Figure 4 and Figure 5 , wherein all reflective surfaces and, for example, 136a and 136f form a corresponding pair of opposing reflective surfaces. The reflective surfaces in each pair of opposing reflective surfaces can be oriented such that their corresponding surface normals are substantially parallel. For a pair of reflective surfaces having surface normals orthogonal to the first rotation axis in all directions, both reflective surfaces redirect the field of view to the same inspection zone, which can be referred to as an intermediate inspection zone. Figure 6 Of the reflective surfaces shown in , none of the reflective surfaces redirects the field of view to such an intermediate inspection partition. Figure 6In a pair of opposing reflective surfaces having substantially parallel center normals, each reflective surface redirects the field of view to a separate or different inspection zone, the two inspection zones being arranged on respective lateral sides of the center line in the inspection area. According to a non-limiting example, the scanning element has 5 pairs of opposing reflective surfaces, wherein the surface normals of the reflective surfaces deviate from the orthogonal surface normal by 0.9°, -2.7°, 4.4°, 6.2°, 8°, -0.9°, 2.7°, -4.4°, 6.2°, -8° when viewed clockwise around the scanning element.

[0187] Figure 7 Two reflecting surfaces are shown, whose surface normals na, nf have opposite inclination angles, which means that the deviations αa, αf relative to the first rotation axis are the same, but the projections of the surface normals na, nf along the first rotation axis R are directed to opposite directions. The reflecting surfaces in each pair of reflecting surfaces can be oriented so that their corresponding surface normals are substantially parallel, and the projections of the surface normals along the first rotation axis R are oriented in opposite directions along the first rotation axis. According to one example, the scanning element may include two reflecting surfaces, the surface normals of which have opposite inclinations. The two reflecting surfaces may be arranged opposite to each other, or arranged close to each other, or have any other positioning around the rotation axis. The reflecting surface may be provided by a mirror. The mirror may be able to rotate around a rotation point to adjust the inclination angle. The rotation point of the mirror may be substantially located at the center of mass of the mirror. Thus, the opposing pairs of mirrors can be balanced in terms of mass.

[0188] Figures 8a to 8c It is schematically shown how the field of view of the detector 2 can be swept across the inspection zones 104e, 104h of the inspection area 104 by rotating the scanning element 136 about the first rotation axis R. Figure 8a In the embodiment, the field of view of the detector 2 is redirected to the inspection area 104 via the first reflective surface 136e of the scanning element 136. When the scanning element 136 is rotated relative to the first rotation axis R to Figure 8b When positioned as shown in FIG. 1 , the field of view of the detector is swept along the inspection zone 104e along the first direction L1. When the scanning element 136 is further rotated, the field of view of the detector 2 will eventually be redirected to the inspection zone 104 by the second reflective surface 136h, as shown in FIG. Figure 8c Assuming that the second reflective surface 136h is at a different angle to the first rotation axis R than the first reflective surface 136e, the field of view of the detector 2 will be shifted along the second direction L2 so that the detector 2 is inspecting another inspection zone 104h. The scanning effect of the inspection area 104 is Figure 8d Visualization.

[0189] Figure 9a and Figure 9b Images captured from different inspection zones within the inspection area are shown, wherein two objects, specifically apples, are positioned. Since the reflective surfaces are arranged in a specific order, for example arranged to keep the beneficial center of gravity substantially intersecting the first rotation axis, the captured images can be provided in an unordered manner. Figure 9b shows the situation when the images are rearranged in a continuous order. As the object is conveyed through the inspection area, Figure 9a The apples shown in each extend simultaneously across the four inspection zones.

[0190] Furthermore, a full 360° spectral representation of the object can be obtained when the inspected object 102 is rotated within the inspection area 104. Assuming that at least one full rotation of the object is provided within the inspection area, a full 360° spectral representation can also be obtained when the object is transported through the inspection area, which is also possible when the longitudinal extension of the inspection partition is parallel to the conveying direction. In principle, this is possible for any direction of the longitudinal extension of the inspection partition relative to the conveying direction, as long as the conveying speed and the object rotation speed are suitable for the current situation.

[0191] This may require a conveying system that not only enables the object to be conveyed within the inspection zone, but also enables rotational movement of the object. Thus, the inspection system may include a carrier, holder, bracket, fixture and / or support for conveying the object within the inspection zone, wherein the conveying device is also configured to provide rotational movement of the object. This enables the detector system 1 to establish a 360° spectral representation of the object.

[0192] The conveying device may be configured to convey the object 102 through the inspection area 104 in a direction L1 substantially along, transversely or orthogonal to the longitudinal extension of the first number of elongated inspection zones 104a, 104b, ..., and wherein the first axis of rotation R is arranged transverse to the direction L1. Alternatively, the conveying device is configured to convey the object 102 through the inspection area 104 in a direction along, transversely or orthogonal to the longitudinal extension of the first number of elongated inspection zones, and wherein the first axis of rotation is arranged substantially parallel to the direction L1. The conveying device may be a conveying system having means for providing this rotational movement of the object to be inspected.

[0193] The scanning element may also include a plurality of base members, and each reflective surface may be attached to a respective one of the plurality of base members.

[0194] According to one embodiment, the scanning element comprises a plurality of mirror elements, each mirror element comprising a respective one of the reflective surfaces.Preferably, each base member comprises a support element having a shape and size adapted to hold the mirror element at a desired tilt angle.

[0195] Figures 10a to 10c A scanning element 136 is shown according to one embodiment. Fig.10a In the embodiment, the reflective surface 136a is provided by a mirror element which is attached to a base member 1360 of the scanning element 136 by a fixing means. The fixing means may be glue or an adhesive. Alternatively or in addition, the fixing means 1360 may include a bracket element 1360a for fixing the mirror element to the base member. The bracket member may include a fastening means 1361a. In Figures 10a to 10c , the fastening means are exemplified as screw elements. Alternatively, the fastening means may be, for example, a clamp adapted to securely clamp the mirror element in place, or a pin adapted to extend into a recess provided in the mirror element. The support element is adapted to be attached to the base member via respective fastening means 1363a, 1364a. The fastening means 1363a, 1364a may be screw elements.

[0196] According to one embodiment, the support element 1360a is pivotally attached to the base member 1360. The support element 1360a may be pivotally attached to the base member 1360 via an axis element 1362, which is adapted to be fixedly attached to the support element 1360a and extends into a corresponding axial opening arranged on a receiving member 1361 provided by the base member 1360. The shape and size of the receiving member 1361 may be adapted to define a guide groove for receiving at least a portion of the support element and for guiding the support element to pivot around the pivot axis defined by the axis element 1362. By operating the fastening devices 1363a, 1364a, the inclination angle of the reflective surface may be adjusted. One of the fastening devices 1363a may be adapted to interact with a fastening device opening provided in the base member 1360. The support element 1360a may be adapted to fasten a device receiving portion 1362a, which provides a guide groove for receiving the fastening device 1363a. Therefore, the tilt angle of the reflective surface can be adjusted depending on how the fastening device 1363a is configured. Fig.10b The reflective surface 136a is shown to be configured at a first tilt angle, and Fig.10c A case where the reflective surface 136b is arranged at a second inclination angle different from the first inclination angle is shown.

[0197] Fig.11An inspection system 1 according to an embodiment of the present invention is shown. The embodiment includes a reflective member 135, which is arranged and oriented to redirect the field of view of the detector system 120 to a reference surface member 137 having a reference surface 137a. The reflective member 135 may include a mirror providing the reflective surface 135a and a support element 135b for holding the reflective mirror. By means of the reflective member 135, each time the scanning element 136 rotates, the detector system 1 will be redirected towards the reference surface 137a so that subsequent reflective surfaces redirect the field of view of the detector system 120, for example, once per reflective surface and before the field of view is redirected to the beginning of an inspection partition. When the reference surface 137a is detected in the captured image data, the reference surface can be used when matching image data from different inspection areas. In addition, in Fig.11 , the field of view of the detector system 120 is represented by the slightly transparent area between the dashed arrows that sweep across the inspection partition 104a. The dashed arrow 104a and the line arrow schematically indicate the extension of the inspection partition, and the dashed arrow indicates the direction in which the field of view is redirected along the inspection partition. The reference surface 137a can be a surface that provides a specific pattern or color. In one example, the reference surface 137a is a full-color white reference and / or a black reference.

[0198] Additionally or alternatively, reference element 138 may be provided after the end of the inspection zone. Fig.11 If the reference element is implemented in , the inspection partition will be shortened.

[0199] exist Fig.11 In the embodiment shown in , the target calibration devices 137 , 138 are arranged downstream of the scanning element and upstream of the test area, viewed in the direction of the illumination.

[0200] According to one embodiment, the spectral data S can be normalized as follows: S' = (SD) / (WD), where W is the white spectrum detected in 137 and 138, and D is the black spectrum. This method compensates for temperature fluctuations of the optics, detectors, and electronics, as well as lighting aging effects caused by the spectral data.

[0201] Fig.12aThe invention according to one embodiment is shown, in which the objects are transported one after another by a carrier or holding device, which has a separate compartment for each object. Each compartment comprises a rotating device for rotating the objects, here apples. The holding device is suitable for being transported through the inspection area by means of a conveyor system. The inspection system is optionally suitable for detecting and tracking the conveying speed and / or the rotation speed of the objects. The inspection system can be adapted to enable information about the conveying speed and / or the rotation speed to be used in order to correlate image data from different inspection zones so that these image data can be correctly matched. This may be referred to as speed compensation hereinafter.

[0202] Figure 12b Indicates image data obtained when inspecting a rotating apple as it is conveyed through an inspection area. The image data represents multiple snapshots of the apple, ordered in chronological order from top left to bottom right, wherein each snapshot includes image data from a different inspection zone, each snapshot being similar to the image data of Figure 9b Without incorporating speed compensation, for each snapshot, the image data from the corresponding inspection partitions are not aligned. By incorporating speed compensation, for each snapshot, the image data from the corresponding inspection partitions can be aligned. Figure 12a to Figure 12b A number of snapshots are shown, but velocity compensation may be performed continuously throughout the inspection of objects within the inspection area.

[0203] Fig.13 A flow chart of a method S0 for inspecting an object 102 passing through an inspection area 104 by means of an inspection system 1, the inspection area 104 being divided into a plurality of elongated inspection zones 104a, 104b, ... having a longitudinal extension, wherein the inspection system 1 comprises a scanning element 136, the scanning element being arranged to rotate about a first rotation axis R and comprising a first set of reflecting surfaces 136a, 136b, ... arranged one after another about the first rotation axis R, the inspection system 1 further comprising at least one detector 2 having a field of view for receiving optical radiation, the method S0 comprising the following steps: A step S1 in which a detector 2 receives optical radiation originating from an object 102 arranged in at least one of the first number of inspection partitions 104a, 104b, ...; a step S2 in which the scanning element 136 is rotated so that each of the surfaces 136a, 136b, ... redirects the field of view of the detector 2 to a different inspection partition among the first number of elongated inspection partitions 104a, 104b, ... and so that each of the surfaces 136a, 136b, ... redirects the field of view along an extension of the corresponding elongated inspection partition 104a, 104b of the inspection area 104.

[0204] Method S0 further comprises a step S3 of conveying the object 102 through the inspection area 104 in a direction transverse to or substantially parallel to the longitudinal extension of the inspection zones 104a, 104b, . . . and a step S4 of rotating the object 102 as it is conveyed through the inspection area 104.

[0205] The method S0 further comprises a step S5 of measuring spectral properties of the object 102 passing through the inspection zones 104a, 104b, ... of the inspection area 104. The measurement may be performed by means of a spectrometer as discussed above.

[0206] The method S0 further comprises a step S6 of measuring spectral properties of the object 102 at different sides of the object 102 passing through the inspection zones 104a, 104b, . . . and a step S7 of preferably creating a 360° spectral representation of the object 102.

[0207] FIG. 14 shows objects 102a to 102d arranged in corresponding compartments of a conveyor system. Each corresponding compartment is formed at least in part by a corresponding rotating device interacting with different sides of the object 102a to 102d. The corresponding rotating device is exemplified here as a wheel member that can rotate around an axis, but can alternatively be a roller or the like. The conveyor system is adapted so that the rotating device can be transported along the conveyor system, and the compartments formed thereby are therefore also transported along the conveyor system. Each compartment can be adapted to accommodate individual objects to be inspected. Specifically, objects 102a to 102d are fruits.

[0208] Fig.15 Inspection scans of corresponding fruits 102a to 102d are shown, in which different regions of interest have been identified. In the leftmost set of vertical scans, a first attribute within the region of interest has been identified. The region is illustrated in yellow. In another set of vertical scans, corresponding attributes in the detected region of interest have been identified, and these regions are indicated by blue, red, purple and green, respectively.

[0209] The detected region of interest can be determined from the spectral data, see Fig.15, where each line is associated with each region of interest detected by color. The wavelength range on the x-axis is 775nm to 1090nm, and the intensity on the y-axis is 0.51 to 1.5. Through the peak response in the spectrum of various wavelengths, one or more attributes of the fruit can be determined, and more generally, one or more attributes of any object being inspected can be determined. One of these attributes can be the maturity of the fruit, or whether the fruit contains a certain amount of moisture, or whether it is exposed to various chemicals and / or substances such as pesticides. The fruit can then be sorted based on the detected attributes. For example, fruits that are not suitable for consumption can be classified based on the identified attributes and can be sorted to be discarded. Fruits that are suitable for consumption can also be sorted according to maturity and can be classified accordingly.

[0210] Fig.16a , Fig.16b A target calibration device 200 according to one embodiment of the present invention is shown. The target calibration device 200 is sized and shaped to provide a calibration surface 201 having a geometric shape and / or pattern.

[0211] exist Fig.16a , Fig.16b In the exemplary target calibration device 200 shown in , the pattern includes two black edge areas extending along opposite surface edges of the calibration surface 201. Three separate black center areas are provided between the two black edge areas. The three separate black center areas are spaced apart from each other and are arranged substantially in series in the lateral direction between the two black edge areas. The outer center areas extend in corresponding longitudinal directions, which are at non-orthogonal angles to each other. The middle center area of ​​the three center areas extends in the longitudinal direction substantially pointing between the two edge areas. The pattern is an exemplary pattern that enables inspection to inspect the target calibration device to provide calibration data on how to calibrate the inspection system according to detector settings, such as the focus of the detector, color settings, assigning the beam of the spectrometer to different wavelengths, assigning each inspection partition to a group of pixels, etc.

[0212] The target calibration device 200 may also include a body 202 to which a calibration surface is provided. The target calibration device 200 may also include attachment devices 203a, 203b for attaching the target calibration device 200 to the conveying system 108. The attachment devices 203a, 203b may be provided on a support member (e.g., a leg) by which the target calibration device 200 may be placed to lift it from a surface. One or more of the attachment devices 203a, 203b may be provided as a structure 203a having a shape and size suitable for defining an opening for receiving a member of the conveying system 200. One or more of the attachment devices 203a, 203b may be a flange structure for stabilizing the calibration device 200 to the conveying system 108.

[0213] Fig.16b The target calibration device 200 is shown to have been arranged to the conveying system 108, wherein the protruding member extends through an opening associated with one of the attachment means 203a. The conveying system 108 comprises a rotating device in the form of a wheel member. Adjacent pairs of wheel members arranged along respective rotation axes define respective compartments for holding individual objects to be inspected.

[0214] Fig.20a shows a side view of the same inspection system, and Fig.18b A top view of the inspection system is shown, the inspection system having only one rotatable reflective surface for redirecting the field of view. The inspection system preferably comprises a detector having a field of view covering at least one inspection zone in both the x-direction and the y-direction. The inspection system is arranged for inspecting objects passing through an inspection area (104), the inspection area (104) being divided into a plurality of elongated inspection zones (104a, 104b, 104c) having a longitudinal extension, the inspection system (1) comprising:

[0215] A detector system having at least one detector (2) and an optical device for receiving optical radiation originating from an object arranged in at least one of the plurality of inspection zones (104a, 104b, 104c) and redirecting the optical radiation towards the at least one detector (2) and providing a corresponding field of view for the at least one detector (2);

[0216] a first scanning element (236) configured to rotate about a first axis of rotation (C) and comprising a reflective surface (237),

[0217] wherein the first rotation axis (C) is arranged such that when the first scanning element (236) rotates, the reflective surface (237) of the first scanning element (236) redirects the field of view of the at least one detector (2) to a respective one of the plurality of elongated inspection zones (104a, 104b, 104c). In other words, when the reflective surface (237) is rotated or tilted about the first rotation axis, the field of view is redirected in the x-direction. The rotation or tilting of the reflective surface may be continuous or intermittent. Fig.20a , Fig.20b The main difference between the embodiment shown in and the embodiments shown in the previous figures is that the scanning element (136) with multiple reflective surfaces is replaced by one or only one reflective surface.

[0218] Fig.19a shows a side view of the same inspection system, and Fig.19b A top view of the inspection system is shown, which has two separate rotatable reflective surfaces (237, 247) for redirecting the field of view. In other words, Fig.19a The embodiment shown in Fig.20a The embodiment is the same as that shown in , except that a second scanning element (246) is also provided, the second scanning element being configured to rotate about a second rotation axis (R) and comprising at least one reflective surface, wherein the second rotation axis (R) is arranged such that when the second scanning element (136) rotates, the reflective surface of the second scanning element redirects the field of view of the at least one detector (2) along the longitudinal extension of the corresponding elongated inspection partition (104a, 104b). The second rotation axis (R) is preferably arranged to be orthogonal or substantially orthogonal to the first rotation axis (C).

[0219] According to this embodiment, the field of view covers only a part of the inspection partition in the y direction and is redirected along each inspection partition by the second scanning element.Therefore, the rotation or tilting speed of the second scanning element is higher than that of the first scanning element.

[0220] Fig.18a shows a side view of the same inspection system, and Fig.18b A top view of the inspection system is shown having two separate rotatable reflective surfaces (237, 247) for redirecting the field of view, wherein the second scanning element (246) is a polygonal mirror.

[0221] Fig.18a , Fig.18b Shown are side and top views of the same inspection system having a polygonal mirror and a rotatable reflective surface for redirecting the field of view.

[0222] Itemized list of implementation methods

[0223] Item 1. An inspection system (1) for inspecting an object (102) passing through an inspection area (104), the inspection area (104) being divided into a plurality of elongated inspection zones (104a, 104b) having longitudinal extensions, the inspection system (1) comprising:

[0224] A detector system having at least one detector (2) and an optical device for receiving optical radiation originating from an object (102) arranged in at least one of the plurality of inspection zones (104a, 104b) and redirecting the optical radiation towards the at least one detector (2) and providing a corresponding field of view for the at least one detector (2);

[0225] A scanning element (136) configured to rotate about a first rotation axis (R) and comprising:

[0226] a plurality of reflective surfaces arranged one behind the other about the first rotation axis (R), the plurality of reflective surfaces comprising a set of reflective surfaces (136a, 136b), wherein each reflective surface of the set of reflective surfaces is associated with a respective one of the elongated inspection zones;

[0227] wherein the scanning element (136) is configured to redirect the field of view of the at least one detector (2) to each of the plurality of elongated inspection zones (104a, 104b) each time the scanning element (136) rotates once, and each of the reflecting surfaces (136a, 136b) is configured to redirect the field of view of the at least one detector (2) to a corresponding elongated inspection zone (104a, 104b) each time the scanning element (136) rotates once, and

[0228] The axis of rotation (R) is arranged such that upon rotation of the scanning element (136), each of the reflective surfaces (136a, 136b) redirects a field of view along a longitudinal extension of a respective elongated inspection zone (104a, 104b).

[0229] Item 2. The inspection system (1) according to Item 1 also includes a rotating device, which is suitable in size and shape to provide rotation to the object so that the object rotates when passing through the inspection area, wherein the rotating device is preferably selected from a rotating device group including a moving belt, a rotatable wheel, a rotatable roller, a rotatable platform, etc., wherein the rotating device is preferably provided by a conveying system.

[0230] Item 3. An inspection system (1) according to Item 1 or 2, wherein the inspection system also includes a conveyor provided with a group of compartments or support devices, wherein each compartment or support device is configured to transport only one object, or between 2 and 10 objects, or between 2 and 50 objects, or more objects through the inspection area; and wherein each compartment or support device is preferably arranged to rotate the object carried by the compartment or support device when passing through the inspection area.

[0231] Item 4. An inspection system (1) according to any preceding item, wherein the optical radiation originating from the object (102) is at least one of emitted, reflected and scattered by the object (102) and / or transmitted through the object.

[0232] Item 5. An inspection system (1) according to any of the preceding items, wherein the scanning element (136) has a set of surface normals (na, nb), wherein each of the surface normals (na, nb) is a central surface normal of a corresponding one of the set of reflective surfaces (136a, 136b), and wherein each of the surface normals (na, nb) in the set of surface normals has a different inclination angle (αa, αb) relative to the rotation axis (R) compared to other surface normals (na, nb) in the set of surface normals.

[0233] Item 6. An inspection system (1) according to any of the preceding items, wherein each of the reflective surfaces in the group of reflective surfaces (136a, 136b) includes an at least partially flat reflective surface, and the at least partially flat reflective surface represents a surface area of ​​at least 80% of the entire surface area of ​​each of the reflective surfaces in the group of reflective surfaces (136a, 136b).

[0234] Item 7. The inspection system (1) of any of the preceding items, wherein the reflective surfaces (136a, 136b) have substantially the same shape and surface area, and

[0235] The scanning element (136) optionally includes an even number of reflective surfaces (136a, 136b), and wherein each reflective surface (136a, 136b) has a corresponding reflective surface arranged on an opposite side of the scanning element (136), and wherein respective surface normals of the reflective surface and the corresponding reflective surface are substantially parallel.

[0236] Item 8. The inspection system (1) according to any one of the preceding items, wherein the at least one detector system comprises at least one spectrometer for analyzing the spectral characteristics of the object.

[0237] Item 9. The inspection system (1) according to Item 8, wherein the inspection system (1) further comprises a processing circuit system configured to perform:

[0238] a data collection function configured to collect spectral data associated with spectral characteristics of the object (102) based on the signal from the spectrometer, the spectral data relating to the optical radiation originating from the object when the object (102) is arranged in at least one of the first number of inspection zones (104a, 104b),

[0239] data processing functionality configured to provide a representation of the object (102) based on the spectral data, and

[0240] An output function is configured to output object information based on the object representation.

[0241] Item 10. The inspection system (1) according to any one of the preceding items, wherein the inspection system (1) comprises a conveying device (108) configured to convey the object (102) through the inspection area (104).

[0242] Item 11. An inspection system (1) according to Item 10 when subordinate to any one of Items 8 to 9, wherein the conveying device (108) is configured to provide rotational movement of the object (102) and wherein the detector system (1) is configured to establish a 360° spectral representation of the object (102).

[0243] Item 12. An inspection system (1) according to any one of Items 10 to 11, wherein the conveying device (108) is configured to convey the object (102) through the inspection area (104) in a direction substantially along the longitudinal extension of the first number of elongated inspection partitions (104a, 104b), and wherein the first rotation axis (R) is arranged transverse to this direction.

[0244] Item 13. An inspection system (1) according to any one of Items 10 to 11, wherein the conveying device (108) is configured to convey the object (102) through the inspection area in a direction transverse to the longitudinal extension of the first number of elongated inspection partitions (104a, 104b), and wherein the first rotation axis (R) is arranged to be substantially parallel to this direction.

[0245] Item 14. An inspection system (1) according to any of the preceding items, wherein the inspection system (1) includes a control unit configured to estimate the movement of the object (102) and / or track the trajectory of the object (102) when the object (102) passes through the inspection partitions (104a, 104b).

[0246] Item 15. An inspection system (1) according to any of the preceding items, wherein each of the at least one detector (2) is configured to detect electromagnetic radiation selected from the group consisting of UV, visible light and NIR or a combination thereof.

[0247] Item 16. The inspection system (1) according to any one of the preceding claims, wherein the inspection system (1) comprises

[0248] at least one illumination device adapted to emit optical radiation towards an inspection area and / or the object (102), preferably by reflection of the optical radiation by the scanning element (136),

[0249] Therein, the at least one illumination device preferably comprises an illumination source selected from the group consisting of LEDs, halogen lamps and / or lasers.

[0250] Item 17. The inspection system (1) according to any one of the preceding claims, wherein the elongated inspection zone comprises at least two elongated inspection zones, and the at least two elongated inspection zones overlap, and / or are directly adjacent, and / or are separated by a distance.

[0251] Item 18. The inspection system (1) according to any one of the preceding claims, wherein the number of elongated inspection zones in the plurality of elongated inspection zones is selected from the interval of 4 to 24, preferably from the interval of 8 to 16.

[0252] Item 19. An inspection system (1) according to any one of the preceding claims, comprising a target calibration device (200) which is suitable in size and shape for providing a calibration surface (201) provided with a geometric shape and / or pattern, and / or

[0253] One, two or more spectral calibration partitions (137, 138) are included, which are used to enable repeated calibration of spectral data of the inspection system (1).

[0254] Item 20. A method (S0) for inspecting an object (102) passing through an inspection area (104) by means of an inspection system (1), the inspection area (104) being divided into a plurality of elongated inspection zones (104a, 104b) having a longitudinal extension, wherein the inspection system (1) comprises a scanning element (136) arranged to rotate about a first rotation axis (R) and comprising a first set of reflecting surfaces (136a, 136b) arranged one after another about the first rotation axis (R), the inspection system (1) further comprising at least one detector (2), the at least one detector having a field of view for receiving optical radiation, the method (S0) comprising:

[0255] A step (S1) of receiving, by the at least one detector (2), optical radiation originating from an object (102) arranged in at least one of the first number of inspection zones (104a, 104b);

[0256] A step (S2) of rotating the scanning element (136) so that each of the surfaces (136a, 136b) redirects the field of view of the detector (2) to a different inspection zone among the first number of elongated inspection zones (104a, 104b), and so that each of the surfaces (136a, 136b) redirects the field of view along an extension of the corresponding elongated inspection zone (104a, 104b).

[0257] Item 21. The method (S0) according to claim 20, wherein the method (S0) further comprises:

[0258] a step (S3) of conveying the object (102) through the inspection zone (104) in a direction transverse to or substantially parallel to the longitudinal extension of the inspection zones (104a, 104b), and

[0259] A step (S4) of rotating the object (102) as the object (102) is conveyed through the inspection area (104).

[0260] Item 22. The method (S0) according to any one of claims 20 to 21, wherein the method (S0) comprises:

[0261] A step (S5) of measuring spectral characteristics of the object (102) passing through the inspection zones (104a, 104b).

[0262] Item 23. The method (S0) according to claims 21 and 22, wherein the method (S0) comprises:

[0263] a step (S6) of measuring spectral characteristics of the object (102) at different sides of the object (102) passing through the inspection zones (104a, 104b), and preferably

[0264] A step (S7) of creating a 360° spectral representation of the object (102).

[0265] Item 24. An inspection system (1) for inspecting an object (102) passing through an inspection area (104), wherein the inspection system is configured to allow the object to pass through the inspection area in a main conveying direction (T), the inspection area (104) being divided into a plurality of elongated inspection zones (104a, 104b) having a longitudinal extension, the inspection system (1) comprising:

[0266] A detector system having at least one detector (2) and an optical device for receiving optical radiation originating from an object (102) arranged in at least one of the plurality of inspection zones (104a, 104b) and redirecting the optical radiation towards the at least one detector (2) and providing a corresponding field of view for the at least one detector (2);

[0267] a first scanning element (236) configured to rotate about a first rotation axis (C) orthogonal or substantially orthogonal to the main transport direction and comprising a reflective surface (237),

[0268] Wherein, the first rotation axis (C) is arranged so that when the first scanning element (236) rotates, the reflective surface (237) of the first scanning element (236) redirects the field of view of the at least one detector (2) to a corresponding one of the multiple elongated inspection partitions (104a, 104b).

[0269] 25. The inspection system (1) according to claim 24 further includes a second scanning element (246), which is configured to rotate about a second rotation axis (R) and includes at least one reflective surface, wherein the second rotation axis (R) is arranged so that when the second scanning element (246) rotates, the reflective surface of the second scanning element redirects the field of view of the at least one detector (2) along the longitudinal extension of the corresponding slender inspection partition (104a, 104b).

[0270] Item 26. The inspection system (1) of claim 25, wherein the second scanning element (246) is a polygonal mirror.

Claims

1. An inspection system (1) for inspecting an object (102) passing through an inspection area (104), the inspection area (104) being divided into a plurality of elongated inspection zones (104a, 104b) having longitudinal extensions, the inspection system (1) comprising: A detector system having at least one detector (2) and optical means for receiving optical radiation originating from an object (102) arranged in at least one of the plurality of inspection zones (104a, 104b) and redirecting the optical radiation towards the at least one detector (2) and providing a corresponding field of view for the at least one detector (2); A scanning element (136) configured to rotate about a first rotation axis (R) and comprising: a plurality of reflecting surfaces arranged one after another around the first rotation axis (R), the plurality of reflecting surfaces comprising a set of reflecting surfaces (136a, 136b), Wherein, each of the reflective surfaces (136a, 136b) is suitable in size, shape and orientation to redirect the field of view of the at least one detector (2) to each of the multiple elongated inspection partitions (104a, 104b) each time the scanning element (136) rotates once, and each of the reflective surfaces (136a, 136b) is configured to redirect the field of view of the at least one detector (2) to a corresponding one of the multiple elongated inspection partitions (104a, 104b) and redirect the field of view along the corresponding one of the elongated inspection partitions each time the scanning element (136) rotates once.

2. The inspection system (1) according to claim 1, further comprising a rotation device, the rotation device being suitable in size and shape to provide rotation to the object, so that the object rotates when passing through the inspection area, wherein The rotating means is preferably selected from the group of rotating means comprising a moving belt, a rotatable wheel, a rotatable roller, a rotatable platform, etc., wherein the rotating means is preferably provided by a conveyor system.

3. The inspection system (1) according to claim 1 or 2, wherein: The inspection system also includes a conveyor provided with a set of compartments or support devices, wherein each compartment or support device is configured to convey only one object, or between 2 and 10 objects, or between 2 and 50 objects, or more objects through the inspection area; and Therein, each compartment or support means is preferably arranged for rotating the object carried by the compartment or support means when passing through the inspection area.

4. The inspection system (1) according to any one of the preceding claims, further comprising a conveyor, and wherein: The inspection area corresponds to a surface of the conveyor, or the inspection system further comprises a free fall path, and wherein the inspection area corresponds to the free fall path.

5. The inspection system (1) according to any one of the preceding claims, wherein: The objects and / or the conveyor surface in the inspection area are partially located in different inspection zones.

6. The inspection system (1) according to any one of the preceding claims, further comprising a conveyor, the conveyor being one of: a conveyor belt and a conveyor provided with a set of compartments for conveying at least one object through the inspection area, wherein When the object conveying surface of the conveyor is arranged in the inspection area, the object conveying surface extends over at least three inspection zones.

7. The inspection system according to claim 6, wherein: When the object conveying surface is arranged in the inspection area, the object conveying surface extends over at least 60% of the inspection zones, or over at least 75%, or over all but two of the inspection zones, or over all of the inspection zones.

8. A testing system (1) according to any preceding claim, wherein: The optical radiation originating from the object (102) is at least one of emitted by, reflected and scattered by the object (102) and / or transmitted through the object.

9. An inspection system (1) according to any preceding claim, wherein: The scanning element (136) has a set of surface normals (na, nb), wherein each of the surface normals (na, nb) is a central surface normal of a corresponding one of the set of reflective surfaces (136a, 136b), and wherein each of the surface normals (na, nb) in the set of surface normals has a different inclination angle (αa, αb) relative to the rotation axis (R) compared to other surface normals (na, nb) in the set of surface normals.

10. An inspection system (1) according to any preceding claim, wherein: Each of the set of reflective surfaces (136a, 136b) includes an at least partially flat reflective surface, which represents at least 80% of the surface area of ​​the entire surface area of ​​each of the set of reflective surfaces (136a, 136b).

11. The inspection system (1) according to any one of the preceding claims, wherein: The reflective surfaces (136a, 136b) have substantially the same shape and surface area, and The scanning element (136) optionally includes an even number of reflective surfaces (136a, 136b), and wherein each reflective surface (136a, 136b) has a corresponding reflective surface arranged on an opposite side of the scanning element (136), and wherein respective surface normals of the reflective surface and the corresponding reflective surface are substantially parallel.

12. The inspection system (1) according to any one of the preceding claims, wherein: The at least one detector system comprises at least one spectrometer for analyzing spectral properties of the object.

13. The inspection system (1) according to claim 12, wherein: The inspection system (1) further comprises a processing circuit system, wherein the processing circuit system is configured to perform: a data collection function configured to collect spectral data associated with spectral characteristics of the object (102) based on the signal from the spectrometer, the spectral data relating to the optical radiation originating from the object when the object (102) is arranged in at least one of the first number of inspection zones (104a, 104b), a data processing function configured to provide a representation of the object (102) based on the spectral data, and An output function is configured to output object information based on the object representation.

14. The inspection system (1) according to any one of the preceding claims, wherein: The inspection system (1) includes a transport device (108), such as a conveyor or a free-fall path, configured to transport the object (102) through the inspection area (104).

15. A testing system (1) according to claim 14 when dependent on any one of claims 12, 13, wherein: The transport device (108) is configured to provide rotational movement of the object (102), and wherein the detector system (1) is configured to create a 360° spectral representation of the object (102).

16. The inspection system (1) according to any one of claims 14 to 15, wherein: The conveying device (108) is configured to convey the objects (102) through the inspection area (104) in a direction substantially along the longitudinal extension of the first number of elongated inspection zones (104a, 104b), and wherein the first rotation axis (R) is arranged transverse to said direction.

17. Testing system (1) according to any of the preceding claims when dependent on at least one of claims 14 to 15, wherein: The conveying device (108) is configured to convey the objects (102) through the inspection area in a direction transverse to the longitudinal extension of the first number of elongated inspection zones (104a, 104b), and wherein the first rotation axis (R) is arranged substantially parallel to said direction.

18. The inspection system (1) according to any one of the preceding claims, wherein: The inspection system (1) comprises a control unit configured to estimate the movement of the object (102) and / or track the trajectory of the object (102) as the object (102) passes through the inspection zones (104a, 104b).

19. The inspection system (1) according to any one of the preceding claims, wherein: Each of the at least one detector (2) is configured to detect electromagnetic radiation selected from the group consisting of UV, visible light and NIR or a combination thereof.

20. The inspection system (1) according to any one of the preceding claims, wherein: The inspection system (1) comprises: at least one illumination device adapted to emit optical radiation towards an inspection area and / or said object (102), preferably by reflecting said optical radiation by said scanning element (136), Therein, the at least one illumination device preferably comprises an illumination source selected from the group consisting of an LED, a halogen lamp and / or a laser.

21. The inspection system (1) according to any one of the preceding claims, wherein: The elongated inspection section comprises at least two elongated inspection sections, and the at least two elongated inspection sections overlap, and / or are directly adjacent to, and / or are spaced apart by a distance.

22. The inspection system (1) according to any one of the preceding claims, wherein: The number of elongated inspection zones of the plurality of elongated inspection zones is selected from an interval of 4 to 24, preferably from an interval of 8 to 16.

23. Inspection system (1) according to any of the preceding claims, comprising a target calibration device (200) which is suitable in size and shape for providing a calibration surface (201) provided with geometric shapes and / or patterns, and / or One, two or more spectral calibration partitions (137, 138) are included, and the spectral calibration partitions are used to enable repeated calibration of spectral data of the inspection system (1).

24. A method (S0) for inspecting an object (102) passing through an inspection area (104) by means of an inspection system (1), the inspection area (104) being divided into a plurality of elongated inspection zones (104a, 104b) having a longitudinal extension, wherein: The inspection system (1) comprises at least one detector (2) having a field of view for receiving optical radiation and a scanning element (136), the scanning element being arranged to rotate about a first rotation axis (R) and comprising a first set of reflective surfaces (136a, 136b) arranged one after another about the first rotation axis (R), wherein each reflective surface is adapted in size, shape and orientation to redirect the field of view of the at least one detector to a respective one of the elongated inspection zones upon each revolution of the scanning element, the method (S0) comprising: A step (S1) of receiving, by the at least one detector (2), optical radiation originating from an object (102) arranged in at least one of the plurality of inspection zones (104a, 104b); A step (S2) of rotating the scanning element (136) so that each of the reflecting surfaces (136a, 136b) redirects the field of view of the detector (2) to a different one of the plurality of elongated inspection zones (104a, 104b), and so that each of the reflecting surfaces (136a, 136b) redirects the field of view along an extension of the corresponding elongated inspection zone (104a, 104b).

25. The method according to claim 24, wherein: The method (S0) also includes The step (S3) of conveying the objects (102) through the inspection area (104), wherein each of the objects is partially located in a different inspection zone.

26. The method according to claim 25, wherein: The method (S0) also includes a step (S3) of conveying the object (102) through the inspection area (104) in a direction transverse to or substantially parallel to the longitudinal extension of the inspection zones (104a, 104b), In this case, each object extends simultaneously over at least three test subareas while being transported through the test area.

27. The method according to claim 26, wherein: The method (S0) also includes A step (S3) of conveying the object (102) through the inspection area (104) in a direction transverse to or substantially parallel to the longitudinal extension of the inspection zones (104a, 104b) by means of a conveyor, the conveyor being provided with a group of compartments, each compartment in the group of compartments having the ability to convey at least one object through the inspection area, wherein the at least one object extends simultaneously over at least three inspection zones when being conveyed through the inspection area by one of the compartments.

28. The method (S0) according to claims 24 to 27, wherein The step (S3) of conveying the object (102) through the inspection area (104) in a direction transverse to or substantially parallel to the longitudinal extension of the inspection zones (104a, 104b) comprises A step (S4) of rotating the object (102) as the object (102) is conveyed through the inspection area (104).

29. The method (S0) according to any one of claims 20 to 21, wherein: The method (S0) comprises: A step (S5) of measuring spectral characteristics of the object (102) passing through the inspection zones (104a, 104b).

30. The method (S0) according to claim 28 or 29, wherein: The method (S0) comprises: a step (S6) of measuring spectral characteristics of the object (102) at different sides of the object (102) passing through the inspection zones (104a, 104b), and preferably A step (S7) of creating a 360° spectral representation of said object (102).

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