Sensing measurement device and method, storage medium and program product

Abstract

The embodiment of the invention provides a sensing measurement device and method, a storage medium and a program product, relates to the technical field of sensing, and solves the technical problems of low sensitivity and low response speed when an optical fiber sensor measures an external physical quantity. The device comprises a signal modulation unit, a sensing unit and a detection unit, wherein the signal modulation unit is configured to obtain an optical signal and a first microwave signal, modulate the optical signal based on the first microwave signal, and determine a first microwave photon signal; the sensing unit is configured to receive the first microwave photon signal and send a second microwave photon signal to the amplitude phase detection unit; the detection unit is configured to determine a second spectral response parameter of the sensing unit for the second microwave photon signal; determining a first spectral response parameter of the sensing unit for the third microwave photon signal; and determining the external physical quantity measured by the sensing unit based on the first spectral response parameter and the second spectral response parameter.

Description

Technical Field

[0001] The present disclosure relates to the field of sensing technology, and in particular to a sensing measurement device, method, storage medium and program product. Background Art

[0002] Optical fiber sensors have the advantages of small mass, small size and resistance to electromagnetic interference, and can be used to measure external physical quantities such as temperature, stress, angular velocity, humidity and current. In the related art, when analyzing the measurement results of optical fiber sensors, the intensity spectrum of the optical signal output by the optical fiber sensor is usually measured based on the spectrum analyzer to determine the change in the optical signal, and then the physical quantity measured by the optical fiber sensor is determined based on the change in the optical signal. However, the spectrum analyzer has problems such as slow scanning speed and low resolution, which leads to low sensitivity and response speed when determining the external physical quantity measured by the optical fiber sensor. Summary of the invention

[0003] The embodiments of the present disclosure provide a sensing measurement device, method, storage medium and program product, which solve the technical problems of low sensitivity and low response speed when optical fiber sensors measure external physical quantities.

[0004] In a first aspect, a sensing measurement device is provided, comprising: a signal modulation unit, a sensing unit, and a detection unit; wherein the signal modulation unit is configured to: obtain an optical signal and a first microwave signal, modulate the optical signal based on the first microwave signal, and determine a first microwave photon signal; send the first microwave photon signal to the sensing unit; the sensing unit is configured to: receive the first microwave photon signal, and

[0005] The detection unit sends a second microwave photon signal; wherein the second microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit and is affected by the external physical quantity of the sensing unit; the detection unit is configured to: receive the second microwave photon signal, and determine the second spectral response parameter of the sensing unit for the second microwave photon signal; and determine the first spectral response parameter of the sensing unit for the third microwave photon signal; based on the first spectral response parameter and the second spectral response parameter, determine the external physical quantity measured by the sensing unit; wherein the third microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit when the external physical quantity of the sensing unit does not change.

[0006] In an embodiment of the present application, the sensing and measuring device modulates the optical signal based on the microwave signal to obtain a microwave photon signal, and then determines the change in the external physical quantity of the sensing unit based on the amplitude and phase changes of the microwave photon signal after passing through the sensor. Since the demodulation accuracy and demodulation speed of the microwave photon signal are higher than those of the optical signal, the sensing and measuring device provided by the present application can more accurately and quickly determine the change in the external physical quantity of the sensing unit.

[0007] In combination with the above-mentioned first aspect, in a possible implementation, the detection unit also includes: a photoelectric detection unit, an amplitude phase detection unit, and a processing unit; wherein the photoelectric detection unit is configured to: receive a second microwave photon signal, convert the second microwave photon signal into a second microwave signal; and send the second microwave signal to the amplitude phase detection unit; the amplitude phase detection unit is configured to: receive the second microwave signal, detect the amplitude and phase of the second microwave signal to obtain a second spectral response parameter; send the second spectral response parameter to the processing unit; the processing unit is configured to: obtain the second spectral response parameter, and obtain the first spectral response parameter; based on the first spectral response parameter and the second spectral response parameter, determine the external physical quantity measured by the sensing unit.

[0008] Based on this, after the microwave photon signal passes through the sensing unit, the external physical quantity of the sensing unit will affect the microwave photon signal, causing the amplitude and / or phase of the microwave photon signal to change. At this time, by converting the microwave photon signal into a microwave signal and performing phase and amplitude detection on the microwave signal, the change in the amplitude and / or phase of the microwave photon signal can be detected more quickly and accurately, thereby determining the external physical quantity of the sensing unit.

[0009] In combination with the above-mentioned first aspect, in a possible implementation, the sensing and measuring device also includes: a light source and a polarization controller; wherein the light source is configured to: send an optical signal; and the polarization controller is configured to: modulate the polarization state of the optical signal so that the optical signal is transmitted to the signal modulation unit.

[0010] Based on this, after the light source of the sensing and measuring device sends an optical signal, the optical signal is polarized to the signal modulation unit based on the polarization controller, so that the optical signal can accurately enter the signal modulation unit for modulation.

[0011] In combination with the above first aspect, in a possible implementation manner, the sensing and measuring device further includes: a microwave source; and the microwave source is further configured to: send a first microwave signal to the signal modulation unit.

[0012] Based on this, the signal modulation unit can modulate the optical signal sent by the light source based on the first microwave signal to obtain a modulated microwave photon signal.

[0013] In combination with the first aspect above, in a possible implementation manner, the first spectral response parameter Satisfies the following formula:

[0014]

[0015] Where, Ω is the frequency of the optical signal, ω is the frequency of the second microwave signal, is the amplitude spectrum of the sensing unit for the third microwave photon signal, is the phase spectrum of the sensing unit for the third microwave photon signal, j is a constant, η is a constant, and i0(ω) is used to characterize the frequency domain expression of the third microwave photon signal; i system (ω) is the frequency domain expression used to characterize the first microwave photon signal.

[0016] In combination with the first aspect above, in a possible implementation manner, the second spectral response parameter Satisfies the following formula:

[0017]

[0018] in, is the amplitude spectrum of the second microwave photon signal of the sensing unit, is the phase spectrum of the sensing unit for the second microwave photon signal, and i1(ω) is used to characterize the frequency domain expression of the second microwave photon signal.

[0019] In combination with the first aspect above, in a possible implementation manner, the external physical quantity measured by the sensing unit includes a first physical quantity ΔΤ and a second physical quantity ΔL, and the first physical quantity and the second physical quantity satisfy the following formula:

[0020]

[0021] Among them, κ is a constant, A0 is the initial value of the first physical quantity, is the initial value of the second physical quantity,

[0022] Based on this, the sensing and measuring device can determine the first spectral response parameter and the second spectral response parameter based on the above formula, and further determine the first physical quantity and the second physical quantity based on the first spectral response parameter and the second spectral response parameter.

[0023] In a second aspect, a sensing measurement method is provided, including: acquiring a second microwave photon signal, and determining a second spectral response parameter of a sensing unit for the second microwave photon signal; wherein the second microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit and is affected by an external physical quantity of the sensing unit; determining a first spectral response parameter of the sensing unit for a third microwave photon signal; wherein the third microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit when the external physical quantity of the sensing unit does not change; based on the first spectral response parameter and the second spectral response parameter, determining the external physical quantity measured by the sensing unit.

[0024] In combination with the above second aspect, in a possible implementation, determining a second spectral response parameter of the sensing unit to a second microwave photon signal includes: converting the second microwave photon signal into a second microwave signal; and detecting the amplitude and phase of the second microwave signal to obtain the second spectral response parameter.

[0025] In combination with the above-mentioned second aspect, in a possible implementation method, obtaining a second microwave photon signal includes: obtaining an optical signal and a first microwave signal; modulating the optical signal based on the first microwave signal to determine the first microwave photon signal; inputting the first microwave signal into a sensing unit, and determining that the signal output by the sensing unit is the second microwave photon signal.

[0026] In combination with the above second aspect, in a possible implementation manner, the first spectral response parameter Satisfies the following formula:

[0027]

[0028] Where, Ω is the frequency of the optical signal, ω is the frequency of the second microwave signal, is the amplitude spectrum of the sensing unit for the third microwave photon signal, is the phase spectrum of the sensing unit for the third microwave photon signal, j is a constant, η is a constant, and i0(ω) is used to characterize the frequency domain expression of the third microwave photon signal; i system (ω) is the frequency domain expression used to characterize the first microwave photon signal.

[0029] In combination with the above second aspect, in a possible implementation manner, the second spectral response parameter Satisfies the following formula:

[0030]

[0031] in, is the amplitude spectrum of the second microwave photon signal of the sensing unit, is the phase spectrum of the sensing unit for the second microwave photon signal, and i1(ω) is used to characterize the frequency domain expression of the second microwave photon signal.

[0032] In combination with the above second aspect, in a possible implementation manner, the external physical quantity measured by the sensing unit includes a first physical quantity ΔT and a second physical quantity ΔL, and the first physical quantity and the second physical quantity satisfy the following formula:

[0033]

[0034] Among them, κ is a constant, A0 is the initial value of the first physical quantity, is the initial value of the second physical quantity,

[0035] In a third aspect, a sensor measurement device is provided, comprising: a processor and a memory; the memory is used to store computer instructions, and when the processor executes the instructions, the sensor measurement device executes any of the above methods.

[0036] In a fourth aspect, a sensor measurement device is provided, comprising: a processor and a communication interface; the communication interface is used to communicate with a module outside the sensor measurement device; the processor is used to execute a computer program or instruction so that the sensor measurement device executes any of the above methods.

[0037] In a fifth aspect, a sensor measurement device is provided, comprising: at least one processor; the processor is used to execute a computer program or instruction stored in a memory so that the sensor measurement device performs the method of any of the above aspects. The memory may be coupled to the processor, or may be independent of the processor. The sensor measurement device may be a sensor measurement device in any of the above aspects or any implementation, or a device including the sensor measurement device, or a device included in the sensor measurement device, such as a chip.

[0038] In a sixth aspect, a computer-readable storage medium is provided, in which a computer program or instruction is stored. When the computer-readable storage medium is run on a sensor measuring device, the sensor measuring device can execute any of the above aspects or any of its implementation methods.

[0039] In a seventh aspect, a computer program product comprising instructions is provided, which, when executed on a sensor measuring device, enables the sensor measuring device to execute any of the above-mentioned aspects or any of its implementation methods.

[0040] In an eighth aspect, a sensor measuring device (for example, the sensor measuring device may be a chip or a chip system) is provided, wherein the sensor measuring device includes a processor for implementing the functions involved in any of the above aspects or any of its implementation methods.

[0041] In some possible designs, the sensor measurement device includes a memory, which is used to store necessary program instructions and data.

[0042] In some possible designs, when the device is a chip system, it can be composed of a chip or include a chip and other discrete devices.

[0043] It can be understood that when the sensing and measuring device provided in any one of the third aspect to the eighth aspect is a chip, the above-mentioned sending action / function can be understood as output, and the above-mentioned receiving action / function can be understood as input.

[0044] In a ninth aspect, a sensor measurement system is provided, which includes the sensor measurement device according to the above aspect.

[0045] In a tenth aspect, a computer program product is provided, which, when executed on a sensor measuring device, enables the sensor measuring device to execute the method of any of the above aspects or any of its implementation modes.

[0046] Among them, the technical effects brought about by any implementation method from the second aspect to the tenth aspect can refer to the technical effects brought about by the corresponding implementation method of the first aspect, and will not be repeated here.

[0047] Among them, various possible implementation methods of any one of the above aspects can be combined under the premise that the solutions are not contradictory. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] Figure 1 A schematic diagram of the structure of a sensor measurement device provided in an embodiment of the present disclosure;

[0049] Figure 2 A schematic diagram of the structure of another sensor measurement device provided in an embodiment of the present disclosure;

[0050] Figure 3 A schematic diagram of a flow chart of a sensing measurement method provided in an embodiment of the present disclosure;

[0051] Figure 4 A schematic diagram of a flow chart of another sensing measurement method provided in an embodiment of the present disclosure;

[0052] Figure 5 A schematic diagram of the structure of another sensor measurement device provided in an embodiment of the present disclosure;

[0053] Figure 6 A schematic diagram of the hardware structure of a sensor measurement device provided in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0054] The following will be combined with the drawings in the embodiments of the present disclosure to clearly and completely describe the technical solutions in the embodiments of the present disclosure. Obviously, the described embodiments are only part of the embodiments of the present disclosure, rather than all of the embodiments. Based on the embodiments in the embodiments of the present disclosure, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the embodiments of the present disclosure.

[0055] It should be noted that, in the embodiments of the present disclosure, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present disclosure should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0056] In the following, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features.

[0057] In the description of the embodiments of the present disclosure, unless otherwise specified, " / " means "or", for example, A / B can mean A or B. "And / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, "at least one" means one or more, and "plurality" means two or more.

[0058] To facilitate understanding, the technical terms involved in the embodiments of the present disclosure are first described below.

[0059] 1. Microwave Photonics (MWP)

[0060] Microwave photonics integrates microwave technology and photon technology. Microwave photon signals based on microwaves and photons have the advantages of large bandwidth, low loss, anti-electromagnetic interference and flexible reconfiguration. They can be widely used in optical wireless communication, radar and electronic countermeasures, optical fiber sensing and other fields.

[0061] In the field of fiber optic sensing, microwave photon technology is used to map optical domain information to the microwave domain. Measuring the microwave domain through microwave equipment can improve demodulation accuracy and demodulation speed, and can reduce the cost of sensing equipment. Optical vector analysis technology based on microwave photons uses microwave photon technology to convert low-resolution optical domain wavelengths into ultra-high-resolution microwave frequencies, scan the microwave frequencies and perform high-precision amplitude and phase detection to determine the measurement results of optical devices, thereby achieving ultra-high-resolution measurement of optical devices. Optical vector analysis technology based on microwave photons can achieve Hz-level measurements. For example, optical vector analysis technology based on microwave photons can achieve 334Hz ultra-high resolution, greater than 90dB and 1.075THz measurements.

[0062] At present, common microwave photon-based sensing technologies include optoelectronic oscillator (OEO)-based sensing technology, microwave photonic filter (MPF)-based sensing technology, OEO relative humidity sensing technology based on phase-shifted Bragg grating microwave photonic filter, and multi-core fiber curvature sensing demodulation technology based on microwave photonic filter. In the OEO relative humidity sensing scheme based on phase-shifted Bragg grating microwave photonic filter, by coating the phase-shifted grating with humidity-sensitive material, the narrowband depression in the reflection spectrum of the phase-shifted grating is used for frequency selection. When the relative humidity of the outside changes, the center frequency of the narrowband depression drifts, thereby changing the center frequency of the microwave photonic filter. Correspondingly, the frequency of the OEO oscillation signal will also change. At this time, the relative humidity of the outside can be determined by monitoring the frequency change of the microwave signal. In the multi-core fiber curvature sensing demodulation technology based on microwave photon filter, by writing fiber grating (FBG) in 7-core optical fiber at the same time, any two FBG reflection signals symmetrical to the central core are selected to form a double-tap microwave photon filter. When the multi-core optical fiber is bent, the inner and outer FBGs will be subjected to compressive stress and tensile stress respectively, and the wavelength will move in opposite directions. After the two FBG reflection signals enter the dispersion compensation optical fiber, their delay difference changes, causing the response spectrum of the microwave photon filter to change accordingly. At this time, curvature demodulation can be achieved by detecting the frequency shift of the notch frequency point.

[0063] The technical terms involved in the embodiments of the present application are explained above.

[0064] In the related art, optical fiber sensors have the advantages of small mass, small size and resistance to electromagnetic interference, and can be used to measure external physical quantities such as temperature, stress, angular velocity, humidity and current. Therefore, optical fiber sensors can be widely used in aerospace, power systems, civil engineering and biomedicine. In the related art, when analyzing the measurement results of optical fiber sensors, the intensity spectrum of the optical signal output by the optical fiber sensor is usually measured based on the spectrum analyzer to determine the change in the optical signal, and then the physical quantity measured by the optical fiber sensor is determined based on the change in the optical signal. However, the spectrum analyzer has problems such as slow scanning speed and low resolution, which leads to the shortcomings of the optical fiber sensor in measuring external physical quantities, such as low sensitivity and low response speed.

[0065] In order to solve the above technical problems, the present disclosure provides a sensor measuring device, such as Figure 1 As shown, the sensing and measuring device includes: a signal modulation unit 101 , a sensing unit 102 , and a detection unit 103 .

[0066] The signal modulation unit 101 is configured to: obtain the optical signal and the first microwave signal, modulate the optical signal based on the first microwave signal, and determine the first microwave photon signal; and send the first microwave photon signal to the sensing unit 102;

[0067] The sensing unit 102 is configured to: receive the first microwave photon signal, and send the second microwave photon signal to the detection unit 103; wherein the second microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit 102 and is affected by the external physical quantity of the sensing unit 102;

[0068] The detection unit 103 is configured to: receive the second microwave photon signal, and determine the second spectral response parameter of the sensing unit 102 for the second microwave photon signal; and determine the first spectral response parameter of the sensing unit 102 for the third microwave photon signal; based on the first spectral response parameter and the second spectral response parameter, determine the external physical quantity measured by the sensing unit 102; wherein the third microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit 102 when the external physical quantity of the sensing unit 102 does not change.

[0069] As an example, the signal modulation unit 101 is a lithium niobate modulator or an equivalent silicon-based optoelectronic integrated device, and the signal modulation unit 101 can implement optical single-sideband or double-sideband modulation.

[0070] As an example, the sensing unit 102 may use a phase-shifted Bragg grating, Mach-Zehnder interferometer or an all-fiber interferometer to measure changes in external physical quantities (the external physical quantity may be temperature, stress, humidity, magnetic field or a combination of multiple physical quantities).

[0071] In the embodiment of the present application, the sensing and measuring device modulates the optical signal based on the microwave signal to obtain a microwave photon signal, and then determines the change of the external physical quantity of the sensing unit 102 based on the amplitude and phase changes of the microwave photon signal after passing through the sensor. Since the demodulation accuracy and demodulation speed of the microwave photon signal are higher than those of the optical signal, the sensing and measuring device provided by the present application can determine the change of the external physical quantity of the sensing unit 102 more accurately and quickly.

[0072] In some embodiments, in combination Figure 1 ,like Figure 2 As shown, the detection unit 103 further includes: a photoelectric detection unit 201 , an amplitude and phase detection unit 202 , and a processing unit 203 .

[0073] The photoelectric detection unit 201 is configured to: receive the second microwave photon signal, convert the second microwave photon signal into a second microwave signal; and send the second microwave signal to the amplitude and phase detection unit 202 .

[0074] The amplitude and phase detection unit 202 is configured to: receive the second microwave signal, detect the amplitude and phase of the second microwave signal to obtain a second spectral response parameter; and send the second spectral response parameter to the processing unit 203 .

[0075] The processing unit 203 is configured to: obtain the second spectral response parameter and the first spectral response parameter; and determine the external physical quantity measured by the sensing unit 102 based on the first spectral response parameter and the second spectral response parameter.

[0076] Based on this, after the microwave photon signal passes through the sensing unit, the external physical quantity of the sensing unit will affect the microwave photon signal, causing the amplitude and / or phase of the microwave photon signal to change. At this time, by converting the microwave photon signal into a microwave signal and performing phase and amplitude detection on the microwave signal, the change in the amplitude and / or phase of the microwave photon signal can be detected more quickly and accurately, thereby determining the external physical quantity of the sensing unit.

[0077] In some embodiments, Figure 2 As shown, the sensing and measuring device further includes: a light source 204 and a polarization controller 205 .

[0078] The light source 204 is configured to send a light signal.

[0079] The polarization controller 205 is configured to modulate the polarization state of the optical signal so that the optical signal is transmitted to the signal modulation unit 101 .

[0080] As an example, the light source 204 may be a narrow line width continuous laser capable of continuously emitting laser signals. The polarization controller 205 may be a general polarization controller.

[0081] Based on this, after the light source of the sensing and measuring device sends an optical signal, the optical signal is polarized to the signal modulation unit based on the polarization controller, so that the optical signal can accurately enter the signal modulation unit for modulation.

[0082] In some embodiments, Figure 2 As shown, the sensing and measuring device further includes: a microwave source 206;

[0083] The microwave source 206 is further configured to send a first microwave signal to the signal modulation unit 101 .

[0084] As an example, the microwave source 206 can perform frequency sweeping to send a plurality of microwave signals with different frequencies. For example, the microwave source 206 can perform frequency sweeping under the control of the processing unit 103 to send a plurality of microwave signals with different frequencies.

[0085] Based on this, the signal modulation unit can modulate the optical signal sent by the light source based on the first microwave signal to obtain a modulated microwave photon signal.

[0086] As an example, the light source, the signal modulation unit 101, the photoelectric detection unit 201, the amplitude phase detection unit 202 and the processing unit 203 form a microwave photon optical vector network analyzer, which can test the spectral response of the sensing unit 102. The sensing unit 102 can be a plurality of sensing units or a combination of a plurality of sensing units for measuring different physical quantities.

[0087] In some embodiments, the first spectral response parameter Satisfies the following formula:

[0088]

[0089] Where, Ω is the frequency of the optical signal, ω is the frequency of the second microwave signal, is the amplitude spectrum of the third microwave photon signal of the sensing unit 102, is the phase spectrum of the sensing unit 102 for the third microwave photon signal, j is a constant, η is a constant, and i0(ω) is used to characterize the frequency domain expression of the third microwave photon signal; i system (ω) is the frequency domain expression used to characterize the first microwave photon signal.

[0090] In some embodiments, the second spectral response parameter Satisfies the following formula:

[0091]

[0092] in, is the amplitude spectrum of the second microwave photon signal of the sensing unit 102, is the phase spectrum of the second microwave photon signal of the sensing unit 102 , and i1(ω) is used to represent the frequency domain expression of the second microwave photon signal.

[0093] In some embodiments, the external physical quantity measured by the sensing unit 102 includes a first physical quantity ΔΤ and a second physical quantity ΔL, and the first physical quantity and the second physical quantity satisfy the following formula:

[0094]

[0095] Among them, κ is a constant, A0 is the initial value of the first physical quantity, is the initial value of the second physical quantity,

[0096] Based on this, the sensing and measuring device can determine the first spectral response parameter and the second spectral response parameter based on the above formula, and further determine the first physical quantity and the second physical quantity based on the first spectral response parameter and the second spectral response parameter.

[0097] Optionally, the process of the sensing and measuring device measuring the external physical quantity of the sensing unit includes: the light source 204 aligns the polarization controller 205 to send an optical signal, the polarization controller 205 adjusts the polarization state of the optical signal so that the optical signal is aligned with the main axis of the signal modulation unit 101, and the polarization controller outputs the optical signal to the signal modulation unit 101. The microwave source 206 periodically generates a microwave signal and inputs it to the signal modulation unit 101. After receiving the optical signal and the microwave signal, the signal modulation unit 101 modulates the microwave signal onto the optical signal to obtain a microwave photon signal. The signal modulation unit 101 inputs the microwave photon signal to the sensing unit 102. After the microwave photon signal is input to the sensing unit 102, the sensing unit 102 detects that the change of the external physical quantity affects the spectrum of the microwave photon signal, causing the spectral response of the microwave photon signal to change with the change of the external physical quantity of the sensing unit 102. After passing through the sensing unit 102, the microwave photon signal is input to the photoelectric detection unit 201, and the photoelectric detection unit 201 converts the microwave photon signal into a microwave signal, and inputs the microwave signal to the amplitude phase detection unit 202. The amplitude phase detection unit 202 determines the second spectral response parameter based on the relevant calculation formula given in the above embodiment. The processing unit 203 obtains the second spectral response parameter determined by the amplitude phase detection unit 202, and determines the first spectral response parameter based on the third microwave photon signal when the external physical quantity of the sensing unit does not change. The processing unit 203 determines the external physical quantity measured by the sensing unit 102 based on the first spectral response parameter and the second spectral response parameter.

[0098] As an example, after the microwave photon signal is input to the sensing unit 102, affected by the thermal expansion effect, the change in the external temperature of the sensing unit 102 will change the grating pitch of the phase-shift Bragg grating of the microwave photon signal, thereby changing the spectral response of the microwave photon signal. The amplitude phase detection unit 202 can accurately measure the change in the spectral response of the microwave signal through the optical network vector analyzer, thereby establishing a relationship between the spectral response change and the temperature change, and then determining the change in the external temperature of the sensing unit 102 according to the change in the spectral response of the microwave signal.

[0099] The above describes in detail the sensing measurement method provided in the embodiment of the present application in combination with specific examples.

[0100] In another possible implementation, the embodiment of the present disclosure further provides a sensing measurement method, which can be applied to the above-mentioned sensing measurement device, such as Figure 3 As shown, the sensing measurement method includes:

[0101] Step 301: A sensing and measuring device acquires a second microwave photon signal.

[0102] The second microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit and is affected by the external physical quantity of the sensing unit.

[0103] In a possible implementation, the sensing and measuring device obtains an optical signal generated by a light source and a microwave signal generated by a microwave source, and modulates the optical signal based on the microwave signal to obtain a first microwave photon signal. After the sensing and measuring device inputs the first microwave photon signal into the sensing unit, it determines that the microwave photon signal output by the sensing unit is a second microwave photon signal.

[0104] Step 302: The sensing and measuring device determines a second spectral response parameter of the sensing unit to a second microwave photon signal.

[0105] In some embodiments, the second spectral response parameter Satisfies the following formula:

[0106]

[0107] in, is the amplitude spectrum of the second microwave photon signal of the sensing unit, is the phase spectrum of the sensing unit for the second microwave photon signal, and i1(ω) is used to characterize the frequency domain expression of the second microwave photon signal.

[0108] In a possible implementation manner, the sensing and measuring device may also determine the second spectral response parameter according to other methods, which is not limited in the present disclosure.

[0109] Step 303: The sensing and measuring device determines a first spectral response parameter of the sensing unit to the third microwave photon signal.

[0110] The third microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit when the external physical quantity of the sensing unit does not change.

[0111] In some embodiments, the first spectral response parameter Satisfies the following formula:

[0112]

[0113] Where, Ω is the frequency of the optical signal, ω is the frequency of the second microwave signal, is the amplitude spectrum of the sensing unit for the third microwave photon signal, is the phase spectrum of the sensing unit for the third microwave photon signal, j is a constant, η is a constant, and i0(ω) is used to characterize the frequency domain expression of the third microwave photon signal; i system (ω) is the frequency domain expression used to characterize the first microwave photon signal.

[0114] In a possible implementation manner, the sensing and measuring device may also determine the second spectral response parameter according to other methods, which is not limited in the present disclosure.

[0115] Step 304: The sensing and measuring device determines the external physical quantity measured by the sensing unit based on the first spectral response parameter and the second spectral response parameter.

[0116] In some embodiments, the external physical quantity measured by the sensing unit 102 includes a first physical quantity ΔΤ and a second physical quantity ΔL, and the first physical quantity and the second physical quantity satisfy the following formula:

[0117]

[0118] Among them, κ is a constant, A0 is the initial value of the first physical quantity, is the initial value of the second physical quantity,

[0119] As an example, the first physical quantity ΔT is the change in the physical quantity of the external temperature, and the second physical quantity ΔL is the change in the physical quantity of the external humidity. In addition, the first physical quantity and the second physical quantity may also be other types of physical quantities, which are not limited in the present disclosure.

[0120] It should be noted that the sensing and measuring device determines more or fewer external physical quantities measured by the sensing unit based on the first spectral response parameter and the second spectral response parameter, for example, only one external physical quantity is determined, or three or more external physical quantities are determined, which is not limited in the present disclosure.

[0121] In an embodiment of the present application, the sensing and measuring device modulates the optical signal based on the microwave signal to obtain a microwave photon signal, and then determines the change in the external physical quantity of the sensing unit based on the amplitude and phase changes of the microwave photon signal after passing through the sensor. Since the demodulation accuracy and demodulation speed of the microwave photon signal are higher than those of the optical signal, the sensing and measuring device provided by the present application can more accurately and quickly determine the change in the external physical quantity of the sensing unit.

[0122] In one possible implementation, combining Figure 3 ,like Figure 4 As shown, in the above step 301 , the process of the sensing and measuring device acquiring the second microwave photon signal can be specifically implemented by the following steps 401 , 402 and 403 .

[0123] Step 401: A sensing and measuring device acquires an optical signal and a first microwave signal.

[0124] In a possible implementation, the optical signal is an optical signal sent by a light source, and the first microwave signal is a microwave signal sent by a microwave source.

[0125] As an example, in the embodiment of the present application, the light source may be a laser that can transmit optical signals continuously by continuously emitting laser light. Optionally, the light source may be a narrow line width continuous laser.

[0126] As another example, in an embodiment of the present application, the microwave source may be a commercial microwave source, which may be frequency-sweeped under the control of an external signal. For example, the microwave source may be frequency-sweeped under the control of a processing unit, thereby achieving the effect of sending a plurality of microwave sources of different frequencies. Based on microwave sources of different frequencies, the optical signal sent by the light source may be modulated at different frequencies to obtain a plurality of microwave photon signals. In addition, the sensing and measuring device may more accurately determine the external physical quantity of the sensing unit based on the spectral response of the plurality of microwave photon signals in the sensing unit.

[0127] Optionally, the microwave source can sweep the frequency between 1 GHz and 3 GHz (it can also be other frequencies, which is not limited in the present disclosure) to generate a plurality of microwave signals of different frequencies between 1 GHz and 3 GHz. The signal modulation unit modulates the optical signal continuously transmitted by the laser based on these microwave signals of different frequencies to obtain a plurality of microwave photon signals of different frequencies. The sensing and measuring device can more accurately determine the external physical quantity of the sensing unit based on the spectral response of the microwave photon signals of different frequencies in the sensing unit.

[0128] Step 402: The sensing and measuring device modulates the optical signal based on the first microwave signal to determine a first microwave photon signal.

[0129] In some embodiments, the sensing and measuring device acquires the optical signal sent by the light source and the first microwave signal sent by the microwave source, and modulates the optical signal based on the first microwave signal to obtain the above-mentioned first microwave photon signal.

[0130] Step 403: The sensing and measuring device inputs the first microwave signal into the sensing unit, and determines that the signal output by the sensing unit is the second microwave photon signal.

[0131] In some embodiments, the sensing and measuring device inputs the first microwave signal into the sensing unit. Under the influence of changes in external physical quantities, the sensing unit affects the phase and / or amplitude of the first microwave signal to obtain a second microwave photon signal. The signal output from the output end of the sensing unit is the second microwave photon signal.

[0132] Based on this, the signal modulation unit can modulate the optical signal sent by the light source based on the first microwave signal to obtain a modulated microwave photon signal, and then detect the external physical quantity of the sensing unit based on the microwave photon signal, so that the change result of the detected external physical quantity is more accurate.

[0133] In one possible implementation, Figure 4 As shown, in the above step 302 , the process of the sensing and measuring device determining the second spectral response parameter of the sensing unit to the second microwave photon signal can be specifically implemented by the following steps 404 and 405 .

[0134] Step 404: The sensing and measuring device converts the second microwave photon signal into a second microwave signal.

[0135] In some embodiments, the sensing and measuring device performs photoelectric conversion on the second microwave photon signal to obtain the second microwave signal. Alternatively, the sensing and measuring device may also convert the second microwave photon signal into the second microwave signal based on other methods, which is not limited in the present disclosure.

[0136] Step 405: The sensing and measuring device detects the amplitude and phase of the second microwave signal to obtain a second spectral response parameter.

[0137] The above scenarios and methods can be combined, and the embodiments of the present disclosure are not limited to this.

[0138] It is understandable that the sensing and measuring device includes hardware structures and / or software modules corresponding to the execution of each function in order to realize the above functions. It should be easily appreciated by those skilled in the art that the embodiments of the present disclosure can be implemented in the form of hardware or a combination of hardware and computer software in combination with the algorithm steps of each example described in the embodiments of the present disclosure. Whether a function is executed in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the embodiments of the present disclosure.

[0139] The disclosed embodiment can divide the sensor measurement device into functional modules according to the above method embodiment. For example, each functional module can be divided corresponding to each function, or two or more functions can be integrated into one functional module. The above integrated module can be implemented in the form of hardware or software. It should be noted that the division of modules in the disclosed embodiment is schematic and is only a logical function division. There may be other division methods in actual implementation. The following is an example of dividing each functional module corresponding to each function.

[0140] Figure 5 is a schematic diagram of the structure of a sensor measurement device 500 provided in an embodiment of the present disclosure. The sensor measurement device 500 can execute the sensor measurement method performed by the first node provided in the above method embodiment. Figure 5 As shown, the sensing and measuring device includes: a processing unit 501 and a communication unit 502 .

[0141] The communication unit 502 is used to obtain a second microwave photon signal and determine a second spectral response parameter of the sensing unit for the second microwave photon signal; wherein the second microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit and is affected by an external physical quantity of the sensing unit; the processing unit 501 is used to determine a first spectral response parameter of the sensing unit for a third microwave photon signal; wherein the third microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit when the external physical quantity of the sensing unit does not change; the processing unit 501 is also used to determine the external physical quantity measured by the sensing unit based on the first spectral response parameter and the second spectral response parameter.

[0142] In a possible implementation, the processing unit 501 is further configured to convert the second microwave photon signal into a second microwave signal; and detect the amplitude and phase of the second microwave signal to obtain a second spectral response parameter.

[0143] In a possible implementation, the processing unit 501 is further used to obtain an optical signal and a first microwave signal; modulate the optical signal based on the first microwave signal to determine a first microwave photon signal; input the first microwave signal to the sensing unit to determine that the signal output by the sensing unit is a second microwave photon signal.

[0144] In a possible implementation, the first spectral response parameter Satisfies the following formula:

[0145]

[0146] Where, Ω is the frequency of the optical signal, ω is the frequency of the second microwave signal, is the amplitude spectrum of the sensing unit for the third microwave photon signal, is the phase spectrum of the sensing unit for the third microwave photon signal, j is a constant, η is a constant, and i0(ω) is used to characterize the frequency domain expression of the third microwave photon signal; i system (ω) is the frequency domain expression used to characterize the first microwave photon signal.

[0147] In a possible implementation, the second spectral response parameter Satisfies the following formula:

[0148]

[0149] in, is the amplitude spectrum of the second microwave photon signal of the sensing unit, is the phase spectrum of the sensing unit for the second microwave photon signal, and i1(ω) is used to characterize the frequency domain expression of the second microwave photon signal.

[0150] In a possible implementation, the external physical quantity measured by the sensing unit includes a first physical quantity ΔT and a second physical quantity ΔL, and the first physical quantity and the second physical quantity satisfy the following formula:

[0151]

[0152] Among them, κ is a constant, A0 is the initial value of the first physical quantity, is the initial value of the second physical quantity,

[0153] In the case of implementing the functions of the above-mentioned integrated modules in the form of hardware, the embodiments of the present disclosure provide another possible structure of the sensor measurement device involved in the above-mentioned embodiments. Figure 6 As shown, the sensor measurement device 60 includes: a processor 602 and a bus 604. Optionally, the sensor measurement device may further include a memory 601; optionally, the sensor measurement device may further include a communication interface 603.

[0154] The processor 602 may be a processor that implements or executes various exemplary logic blocks, modules, and circuits described in conjunction with the embodiments of the present disclosure. The processor 602 may be a central processing unit, a general-purpose processor, a digital signal processor, an application-specific integrated circuit, a field programmable gate array, or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It may implement or execute various exemplary logic blocks, modules, and circuits described in conjunction with the embodiments of the present disclosure. The processor 602 may also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like.

[0155] The communication interface 603 is used to connect with other devices via a communication network, such as Ethernet, wireless access network, wireless local area network (WLAN), etc.

[0156] The memory 601 may be a read-only memory (ROM) or other types of static storage devices that can store static information and instructions, a random access memory (RAM) or other types of dynamic storage devices that can store information and instructions, or an electrically erasable programmable read-only memory (EEPROM), a disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store desired program codes in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto.

[0157] As a possible implementation, the memory 601 may exist independently of the processor 602, and the memory 601 may be connected to the processor 602 via a bus 604 to store instructions or program codes. When the processor 602 calls and executes the instructions or program codes stored in the memory 601, the encoding method or decoding method provided in the embodiment of the present disclosure can be implemented.

[0158] In another possible implementation, the memory 601 may also be integrated with the processor 602 .

[0159] The bus 604 may be an extended industry standard architecture (EISA) bus, etc. The bus 604 may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 6 Only one thick line is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0160] Some embodiments of the present disclosure provide a computer-readable storage medium (e.g., a non-transitory computer-readable storage medium), which stores computer program instructions. When the computer program instructions are executed on a computer, the computer executes the encoding method or decoding method as described in any of the above embodiments.

[0161] Exemplarily, the above-mentioned computer-readable storage media may include, but are not limited to: magnetic storage devices (e.g., hard disks, floppy disks or magnetic tapes, etc.), optical disks (e.g., compact disks (CD), digital versatile disks (DVD), etc.), smart cards and flash memory devices (e.g., erasable programmable read-only memory (EPROM), cards, sticks or key drives, etc.). The various computer-readable storage media described in the embodiments of the present disclosure may represent one or more devices and / or other machine-readable storage media for storing information. The term "machine-readable storage medium" may include, but is not limited to, wireless channels and various other media capable of storing, containing and / or carrying instructions and / or data.

[0162] An embodiment of the present disclosure provides a computer program product including instructions. When the computer program product is run on a computer, the computer is enabled to execute the sensing measurement method described in any one of the above embodiments.

[0163] The above is only a specific implementation of the embodiment of the present disclosure, but the protection scope of the embodiment of the present disclosure is not limited thereto. Any changes or substitutions within the technical scope disclosed in the embodiment of the present disclosure should be included in the protection scope of the embodiment of the present disclosure. Therefore, the protection scope of the embodiment of the present disclosure should be based on the protection scope of the claims.

Claims

1. A sensor measuring device, characterized in that: include: A signal modulation unit, a sensing unit, and a detection unit; The signal modulation unit is configured to: acquire an optical signal and a first microwave signal, modulate the optical signal based on the first microwave signal, and determine a first microwave photon signal; and send the first microwave photon signal to the sensing unit; The sensing unit is configured to: receive the first microwave photon signal, and send a second microwave photon signal to the detection unit; wherein the second microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit and is affected by an external physical quantity of the sensing unit; The detection unit is configured to: receive the second microwave photon signal, and determine the second spectral response parameter of the sensing unit for the second microwave photon signal; and determine the first spectral response parameter of the sensing unit for the third microwave photon signal; based on the first spectral response parameter and the second spectral response parameter, determine the external physical quantity measured by the sensing unit; wherein the third microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit when the external physical quantity of the sensing unit does not change.

2. The device according to claim 1, characterized in that The detection unit further includes: a photoelectric detection unit, an amplitude and phase detection unit, and a processing unit; Wherein, the photoelectric detection unit is configured to: receive the second microwave photon signal, convert the second microwave photon signal into a second microwave signal; and send the second microwave signal to the amplitude phase detection unit; The amplitude and phase detection unit is configured to: receive the second microwave signal, detect the amplitude and phase of the second microwave signal to obtain the second spectral response parameter; and send the second spectral response parameter to the processing unit; The processing unit is configured to: obtain the second spectral response parameter and the first spectral response parameter; and determine the external physical quantity measured by the sensing unit based on the first spectral response parameter and the second spectral response parameter.

3. The device according to claim 2, characterized in that The sensing and measuring device also includes: a light source and a polarization controller; Wherein, the light source is configured to: send the light signal; The polarization controller is configured to modulate the polarization state of the optical signal so that the optical signal is transmitted to the signal modulation unit.

4. The device according to claim 3, characterized in that The sensing and measuring device further comprises: a microwave source; The microwave source is further configured to send a first microwave signal to the signal modulation unit.

5. The device according to any one of claims 2 to 4, characterized in that: The first spectral response parameter Satisfies the following formula: Wherein, Ω is the frequency of the optical signal, ω is the frequency of the second microwave signal, is the amplitude spectrum of the third microwave photon signal of the sensing unit, is the phase spectrum of the sensing unit for the third microwave photon signal, j is a constant, η is a constant, and i0(ω) is used to characterize the frequency domain expression of the third microwave photon signal; i system (ω) is a frequency domain expression used to characterize the first microwave photon signal.

6. The device according to claim 5, characterized in that The second spectral response parameter Satisfies the following formula: in, is the amplitude spectrum of the sensing unit for the second microwave photon signal, is the phase spectrum of the sensing unit for the second microwave photon signal, and i1(ω) is used to characterize the frequency domain expression of the second microwave photon signal.

7. The device according to claim 6, characterized in that The external physical quantity measured by the sensing unit includes a first physical quantity ΔΤ and a second physical quantity ΔL, and the first physical quantity and the second physical quantity satisfy the following formula: Among them, κ is a constant, A0 is the initial value of the first physical quantity, is the initial value of the second physical quantity, 8. A sensing measurement method, characterized in that: include: Acquire a second microwave photon signal, and determine a second spectral response parameter of the sensing unit for the second microwave photon signal; wherein the second microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit and is affected by an external physical quantity of the sensing unit; Determining a first spectral response parameter of the sensing unit for a third microwave photon signal; wherein the third microwave photon signal is a signal obtained after the first microwave photon signal passes through the sensing unit when the external physical quantity of the sensing unit does not change; Based on the first spectral response parameter and the second spectral response parameter, an external physical quantity measured by the sensing unit is determined.

9. The method according to claim 8, characterized in that The determining a second spectral response parameter of the sensing unit to the second microwave photon signal comprises: converting the second microwave photon signal into a second microwave signal; The amplitude and phase of the second microwave signal are detected to obtain the second spectral response parameter.

10. The method according to claim 8 or 9, characterized in that: The step of acquiring the second microwave photon signal comprises: acquiring an optical signal and a first microwave signal; modulating the optical signal based on the first microwave signal to determine a first microwave photon signal; The first microwave signal is input to the sensing unit, and a signal output by the sensing unit is determined to be the second microwave photon signal.

11. A sensor measuring device, characterized in that: include: Memory and processor; Memory and processor coupling; The memory is used to store instructions executable by the processor; When the processor executes the instructions, the method according to any one of claims 8 to 10 is performed.

12. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and when the computer instructions are executed on a computer, the computer is enabled to execute the method according to any one of claims 8 to 10.

13. A computer program product, characterized in that The computer program product comprises computer program instructions, which implement the method according to any one of claims 8 to 10 when executed by a processor.

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