An AC / DC analog test system for a capacitor

Abstract

The present application provides an AC / DC analog test system for capacitors, belonging to the technical field of capacitor testing. The system includes: a parameter configuration module configured to obtain the image information of the capacitor to be tested and determine the initial test strategy of the capacitor to be tested; a test module configured to perform multi-type tests on the capacitor to be tested in the first test cycle according to the initial test strategy to obtain the test data of the first test cycle; an optimization module configured to construct the target test feedback model of the capacitor to be tested and determine the optimized test strategy of the capacitor to be tested; the test module is further configured to obtain the test data of the second test cycle according to the optimized test strategy; an evaluation module configured to determine the analog test result of the capacitor to be tested according to the test data of multiple test cycles. The purpose of the present application is to solve the problem that the existing capacitor test scheme cannot meet the test requirements of capacitors in the rail transit system.

Description

Technical Field

[0001] This application relates to the technical field of capacitor testing, and particularly to an AC / DC simulation testing system for capacitors. Background Art

[0002] In rail transit systems, capacitors play an important role in critical applications, especially in areas such as traction power supply systems, signal systems, and energy recovery systems. These capacitors need to withstand extreme operating conditions, such as high voltage, large current, and drastic temperature changes. Therefore, the testing of capacitors in rail transit applications is particularly strict.

[0003] The current capacitor testing solutions cannot meet the testing requirements of capacitors in rail transit systems. Summary of the Invention

[0004] An embodiment of this application provides an AC / DC simulation testing system for capacitors. This application adopts the following technical solutions:

[0005] In a first aspect, an AC / DC simulation testing system for capacitors is provided. A parameter configuration module is configured to, after obtaining a capacitor testing request, acquire the image information of the capacitor to be tested, and determine an initial testing strategy for the capacitor to be tested based on the image information of the capacitor to be tested. The initial testing strategy includes multiple test configuration parameters;

[0006] A testing module is configured to perform multiple types of tests on the capacitor to be tested in a first test cycle according to the initial testing strategy to obtain the test data of the first test cycle;

[0007] An optimization module is configured to construct a target test feedback model for the capacitor to be tested based on the test data of the first test cycle, and optimize the initial testing strategy according to the target test feedback model to determine an optimized testing strategy for the capacitor to be tested;

[0008] The testing module is further configured to perform multiple types of tests on the capacitor to be tested in a second test cycle according to the optimized testing strategy to obtain the test data of the second test cycle;

[0009] An evaluation module is configured to determine the simulation test result of the capacitor to be tested based on the test data of multiple test cycles.

[0010] In a feasible embodiment, the parameter configuration module includes:

[0011] A label determination sub-module for determining the type label of the capacitor to be tested based on the image information of the capacitor to be tested;

[0012] A matching sub-module, which uses the type label of the capacitor to be tested as an index to match the initial test strategy that matches the type label.

[0013] In a feasible implementation manner, the label determination sub-module includes:

[0014] A query unit, which is configured to determine whether there is a first type label that matches the capacitor to be tested according to the model features in the image information, where the first type label is used to characterize the type of capacitor with historical test records;

[0015] A first determination unit, which is configured to determine the first type label as the type label of the capacitor to be tested when there is a first type label that matches the model features;

[0016] A second determination unit, which is configured to determine the second type label as the type label of the capacitor to be tested when there is no first type label that matches the capacitor to be tested, where the second type label is used to characterize the type of capacitor without historical test records.

[0017] In a feasible implementation manner, the matching sub-module includes:

[0018] A first matching unit, which is configured to determine the initial test strategy of the capacitor to be tested according to the historical test record corresponding to the first type label when the type label of the capacitor to be tested is the first type label;

[0019] A second matching unit, which is configured to determine the initial test strategy of the capacitor to be tested according to the performance parameters of the capacitor to be tested when the type label of the capacitor to be tested is the second type label.

[0020] In a feasible implementation manner, the test module includes:

[0021] A first test sub-module, which is configured to perform a DC test on the capacitor to be tested according to the initial test strategy to obtain DC test data;

[0022] A second test sub-module, which is configured to perform an AC test on the capacitor to be tested according to the initial test strategy to obtain AC test data.

[0023] In a feasible implementation manner, the first test sub-module includes:

[0024] A DC power supply unit, which is configured to apply a DC voltage to the capacitor to be tested according to the initial test strategy;

[0025] A first capacitance measurement unit, which is configured to measure the electrical feedback parameters of the capacitor when applying the DC voltage;

[0026] A first temperature measurement unit for measuring the temperature feedback parameter of a capacitor when a DC voltage is applied;

[0027] A first data integration unit for integrating the electrical feedback parameter and the temperature feedback parameter to construct DC test data.

[0028] In a feasible implementation manner, the second test sub-module includes:

[0029] An AC power supply unit for applying an AC ripple current to the capacitor to be tested according to the initial test strategy;

[0030] A second capacitance measurement unit for measuring the electrical feedback parameter of the capacitor when the AC ripple current is applied;

[0031] A second temperature measurement unit for measuring the temperature feedback parameter of the capacitor when the AC ripple current is applied;

[0032] A second data integration unit for integrating the electrical feedback parameter and the temperature feedback parameter to construct AC test data.

[0033] In a feasible implementation manner, the optimization module includes:

[0034] A first model construction sub-module for constructing a first test feedback model according to the correspondence between the initial test strategy and the DC test data;

[0035] A second model construction sub-module for constructing a second test feedback model according to the correspondence between the initial test strategy and the AC test data;

[0036] A third model construction sub-module for performing model fusion based on the first test feedback model and the second test feedback model to obtain a target test feedback model;

[0037] A strategy optimization sub-module for optimizing the initial test strategy of the capacitor according to the target test feedback model.

[0038] In a feasible implementation manner, the first model construction sub-module includes:

[0039] A first model construction unit for constructing an electrical feedback parameter model according to the correspondence between the electrical feedback parameter and the initial test strategy;

[0040] A second model construction unit for constructing a temperature feedback parameter model according to the correspondence between the temperature feedback parameter and the initial test strategy;

[0041] Taking the electrical feedback parameter model as the first optimization target and the temperature feedback parameter model as the second optimization target, determine the first test feedback model according to the optimization results of the first optimization target and the second optimization target.

[0042] In a feasible implementation manner, the evaluation module includes:

[0043] A first evaluation sub-module, configured to determine the evaluation score of the capacitor to be tested in each test cycle according to the test data of multiple test cycles, and determine the comprehensive evaluation result of the capacitor to be tested according to the evaluation coefficient corresponding to each test cycle;

[0044] A second evaluation sub-module, configured to generate a test evaluation report for the capacitor to be tested according to the comprehensive evaluation result.

[0045] In summary, the AC-DC simulation test system for the above-mentioned capacitor has the following technical effects:

[0046] A kind of AC-DC simulation test system for capacitors provided by an embodiment of the present application, after the parameter configuration module obtains a capacitor test request, by acquiring the image information of the capacitor, it can intelligently identify the type and specific characteristics of the capacitor to be tested. This way of determining the initial test strategy based on image information ensures the accuracy and pertinence of the test strategy. Multiple test configuration parameters in the initial test strategy can be set for different types of capacitors, ensuring that the system can handle capacitors of different specifications and models in the rail transit system and adapt to complex test requirements.

[0047] Secondly, the test module conducts multi-type tests in the first test cycle, covering multi-dimensional performance tests of direct current and alternating current. Especially in rail transit, high-order harmonics have a greater impact on the performance of capacitors. This test module can apply an AC ripple current to fully evaluate the performance of capacitors in the actual working environment and ensure that they can withstand the high-order harmonic environment. By acquiring the test data of the first test cycle, the system can comprehensively understand the performance of the capacitor under the initial test conditions, especially the data in aspects such as electrical feedback parameters and temperature feedback parameters, providing a basis for subsequent optimization.

[0048] The optimization module further constructs a target test feedback model according to the test data of the first test cycle, and optimizes the initial test strategy by analyzing the actual performance of the capacitor. This adaptive optimization mechanism can adjust the test strategy according to the individual differences of each capacitor, ensuring that the test plan is flexible and accurate, and meeting the requirements for high reliability of capacitors in the rail transit system. The optimized test strategy can further improve the effectiveness of the test, especially for the performance of capacitors under high-frequency applications.

[0049] Finally, the evaluation module comprehensively evaluates the simulation test results of the capacitor based on the test data from multiple test cycles. This multi-cycle test can fully detect the performance of the capacitor under different test conditions and at different stages, ensuring its performance stability. Through gradual optimization and multiple tests, the system can provide a more accurate performance evaluation of the capacitor for rail transit applications, ensuring its long-term reliability and operational stability. In this way, the high requirements for capacitors in the rail transit field are met, overcoming the limitations of existing test schemes in complex environments and ensuring the performance stability of capacitors under high-order harmonics and complex temperature conditions. Description of the Drawings

[0050] Figure 1 FIG. is a schematic structural diagram of an AC-DC simulation test system for a capacitor provided by an embodiment of the present application. Detailed Embodiments

[0051] The technical solutions in the present application will be described below with reference to the drawings.

[0052] For the purpose of making the objectives, technical solutions and advantages of the present application clearer, the following further Figure 1 describes the present application in detail. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0053] The terms "first", "second", etc. involved in the embodiments of the present application are only used for the purpose of distinguishing the same type of features and should not be construed as indicating relative importance, quantity, order, etc.

[0054] The terms "exemplary" or "for example" and the like used in the embodiments of the present application are used to represent examples, illustrations or explanations. Any embodiment or design solution described as "exemplary" or "for example" in the present application should not be construed as being more preferred or more advantageous than other embodiments or design solutions. Exactly speaking, the use of the terms "exemplary" or "for example" and the like is intended to present relevant concepts in a specific manner.

[0055] The terms "coupled" and "connected" involved in the embodiments of the present application should be understood in a broad sense. For example, it can refer to a direct physical connection or an indirect connection realized through electronic devices, such as a connection realized through resistors, inductors, capacitors or other electronic devices.

[0056] The electrical environment in which capacitors in the field of rail transit are located is extremely harsh, usually facing complex working conditions such as high voltage, large current, frequent voltage fluctuations, pulse shocks, and extreme temperature changes and mechanical vibrations. However, existing capacitor test schemes are mostly based on standard industrial or consumer electronics applications and cannot fully simulate the special working conditions in rail transit. These test schemes usually lack effective evaluation of the performance of capacitors under large current shocks, dynamic load changes, and high-frequency operation. Due to these deficiencies, existing tests cannot provide an accurate assessment of the true performance of capacitors in rail transit applications, which may lead to unforeseen failures or performance degradation of capacitors during actual operation, increasing the risks in system operation.

[0057] Referring to Figure 1 , this application provides an AC / DC simulation test system for capacitors, including:

[0058] A parameter configuration module 101, configured to, after obtaining a capacitor test request, obtain the image information of the capacitor to be tested, and determine the initial test strategy of the capacitor to be tested according to the image information of the capacitor to be tested.

[0059] In this embodiment, after the user issues a test request and it is received by the AC-DC simulation test system, it is first necessary to determine the type of the capacitor to be tested. An image acquisition device can be set on the AC-DC simulation test system to obtain the image information of the capacitor to be tested, and based on the image information of the capacitor to be tested, its specific type can be determined. Finally, according to the specific type of the capacitor to be tested, different initial test strategies can be assigned to it. The initial test strategy includes multiple test configuration parameters, which are used to guide the specific test process of the capacitor to be tested. By way of example, the content of capacitor testing can include several aspects: First is the capacitance test, which is used to determine the energy storage capacity of the capacitor and ensure that it provides a stable capacitance value within the specified voltage range; second is the measurement of the equivalent series resistance, which reflects the internal loss situation of the capacitor, especially the energy loss situation in high-frequency applications; the leakage current test is also crucial, and the insulation performance and reliability of the capacitor are evaluated by measuring the leakage current of the capacitor at a specific voltage; in addition, the loss factor and dielectric loss of the capacitor will also be tested to evaluate its power loss situation in an alternating electric field. In order to ensure its performance in harsh environments, the withstand voltage test is used to verify whether the capacitor can work for a long time under the rated voltage or even overvoltage conditions without breakdown or failure. Environmental simulation tests such as high-temperature and high-humidity tests and temperature cycle tests also need to be carried out to evaluate the stability and life performance of the capacitor in extreme temperature and humidity environments. Through these tests, the electrical performance, thermal stability, and service life of the capacitor can be comprehensively understood, thereby ensuring its reliability in different application scenarios. It should be noted that when conducting tests, multiple capacitors can be tested simultaneously, and the test process of each capacitor to be tested is completely independent.

[0060] In a feasible embodiment, the parameter configuration module includes:

[0061] A label determination sub-module, which is used to determine the type label of the capacitor to be tested according to the image information of the capacitor to be tested.

[0062] In this embodiment, the system obtains the image information of the capacitor to be tested through the image acquisition device. The label determination sub-module will analyze the acquired image and identify the appearance features of the capacitor, such as size, shape, package form, and the model number marked on the surface of the capacitor. Then, based on these features, the system compares them with the pre-stored capacitor type library to determine the specific type and corresponding type label of the capacitor. The type label can accurately indicate the key information such as the model number, rated voltage, and capacity of the capacitor, thereby providing basic support for the subsequent test process. Through the label determination sub-module, the test system can automatically identify the capacitor type and assign a suitable initial test strategy to it without manual input, thereby improving the efficiency and accuracy of the test.

[0063] In a feasible implementation manner, the label determination sub-module includes:

[0064] A query unit, configured to determine whether there is a first type of label that matches the capacitor to be tested according to the model features in the image information;

[0065] A first determination unit, configured to, when there is a first type of label that matches the model features, determine the first type of label as the type label of the capacitor to be tested;

[0066] A second determination unit, configured to, when there is no first type of label that matches the capacitor to be tested, determine the second type of label as the type label of the capacitor to be tested.

[0067] In this implementation manner, the label determination sub-module includes the following functional units. The query unit is configured to determine whether there is a first type of label that matches the capacitor to be tested according to the model features in the image information. The first type of label refers to the type of capacitor that has historical test records in the system. By analyzing and comparing the model features, the query unit can quickly identify whether a capacitor of the same model has been tested before. The first determination unit, when the query unit finds that there is a first type of label that matches the model features of the capacitor to be tested, the first determination unit will directly determine the first type of label as the type label of the capacitor to be tested. The type label can effectively characterize the key characteristics of the capacitor, such as model, rated voltage, capacity, and working environment, etc. In this way, the system can call the historical test strategy according to the type label, quickly generate the test process, and reduce the time of repeated configuration. The second determination unit, when the query unit fails to find a first type of label that matches the model features of the capacitor to be tested, the system divides the capacitor into a new second type through the second determination unit. The second type of label is used to mark the capacitor as a new type of capacitor without historical records in the system. At this time, the system needs to allocate a new test strategy for the capacitor to ensure that it can still perform a comprehensive performance test without historical test data.

[0068] A matching sub-module, configured to use the type label of the capacitor to be tested as an index to match the initial test strategy that matches the type label.

[0069] In this embodiment, after determining the corresponding type label for each capacitor to be tested, the initial test strategy matching the label can be quickly retrieved from the preset database based on the type label. Therefore, using the type label for retrieval can ensure that the selected test strategy highly matches the actual application scenario of the capacitor. The initial test strategy includes a series of test configuration parameters, such as but not limited to test voltage, current range, frequency, temperature conditions, load characteristics, etc., which can provide detailed guidance for the subsequent test process. This greatly reduces the workload of manual configuration and improves the test efficiency.

[0070] In a feasible embodiment, the matching sub-module includes:

[0071] The first matching unit is configured to determine the initial test strategy for the capacitor to be tested according to the historical test records corresponding to the first type label when the type label of the capacitor to be tested is the first type label;

[0072] The second matching unit is configured to determine the initial test strategy for the capacitor to be tested according to the performance parameters of the capacitor to be tested when the type label of the capacitor to be tested is the second type label.

[0073] In this embodiment, when the type label of the capacitor to be tested is determined to be the first type label, the first matching unit automatically generates the initial test strategy for the capacitor according to the historical test records corresponding to the type label. The historical test records include the test configurations, test results, and related performance performances of the previous capacitors of the same type. Therefore, based on the historical test records, the test strategy applicable to the capacitor can be quickly determined, eliminating the need for reconfiguration and ensuring the efficiency and accuracy of the test strategy. When the type label of the capacitor to be tested is determined to be the second type label, since there are no historical test records related to this type of capacitor in the system, the second matching unit generates an adapted initial test strategy according to the actual performance parameters of the capacitor (such as rated voltage, capacitance, operating frequency, environmental requirements, etc.). This strategy generation method ensures that even for a brand-new capacitor type, the system can formulate a reasonable test configuration based on its basic performance indicators, ensuring that the performance of the capacitor can be fully evaluated and providing precise guidance for subsequent performance tests. This method can flexibly handle different situations with or without historical test records, ensuring the system's comprehensive testing ability for new and old capacitors.

[0074] The test module 102 is configured to perform multiple types of tests on the capacitor to be tested in the first test cycle according to the initial test strategy to obtain the test data of the first test cycle.

[0075] In this embodiment, the test module 102 is configured to perform multiple types of tests on the capacitor under test according to the initial test strategy within the first test cycle, so as to obtain the test data of the capacitor under test in the first test cycle.

[0076] In a feasible embodiment, the test module includes:

[0077] The first test sub-module is configured to perform a DC test on the capacitor under test according to the initial test strategy to obtain DC test data.

[0078] The second test sub-module is configured to perform an AC test on the capacitor under test according to the initial test strategy to obtain AC test data.

[0079] In this embodiment, in the DC test, the system applies a constant DC voltage to the capacitor, measures its capacitance, leakage current, and withstand voltage performance, and evaluates its energy storage capacity, insulation characteristics, and stability under DC operating conditions. The DC test can detect the leakage current, withstand voltage ability, and long-term DC performance of the capacitor to ensure its reliability in DC circuits.

[0080] In the AC test, the system applies an alternating voltage or alternating current to the capacitor and tests the changes in its equivalent series resistance, loss factor, and capacitance under AC conditions. The AC test can simulate the behavior of the capacitor in a high-frequency signal environment, evaluate its dynamic response under an alternating electric field, especially the losses, thermal effects, and stability in high-frequency applications. Through the combined DC and AC tests, the system can comprehensively analyze the performance of the capacitor under different power environments, thereby obtaining the comprehensive test data for the first test cycle. This test method can cover various operating conditions that the capacitor may encounter in actual use to ensure its reliability and stability in complex application scenarios.

[0081] In a feasible embodiment, the first test sub-module includes:

[0082] A DC power supply unit for applying a DC voltage to the capacitor under test according to the initial test strategy;

[0083] The first capacitance measurement unit for measuring the electrical feedback parameters of the capacitor when the DC voltage is applied;

[0084] The first temperature measurement unit for measuring the temperature feedback parameters of the capacitor when the DC voltage is applied;

[0085] The first data integration unit for integrating the electrical feedback parameters and temperature feedback parameters to construct DC test data.

[0086] In this embodiment, in a feasible implementation, the first test sub-module includes the following components: a DC power supply unit, which is used to apply a DC voltage to the capacitor under test according to the initial test strategy. This unit can precisely control the voltage value to ensure that the capacitor operates under the specified DC working conditions to evaluate its DC performance. A first capacitance measurement unit, which is used to measure the electrical feedback parameters of the capacitor while applying the DC voltage. These electrical feedback parameters include capacitance, leakage current, equivalent series resistance, etc., which can help the system understand the basic electrical characteristics and performance of the capacitor under DC voltage. A first temperature measurement unit, which is used to monitor the temperature feedback parameters of the capacitor in real time during the application of the DC voltage. This unit can evaluate the thermal effect generated by the capacitor during operation to ensure that it can still operate stably when the temperature rises. A first data integration unit, which is responsible for integrating the electrical feedback parameters and temperature feedback parameters to construct complete DC test data. Through the comprehensive analysis of the electrical performance and thermal performance, the system can more comprehensively evaluate the operating state of the capacitor in the DC environment to ensure its reliability and stability in practical applications.

[0087] The electrical feedback parameters directly reflect the core electrical performance of the capacitor. Common electrical parameters include capacitance, equivalent series resistance, leakage current, etc. Measuring these parameters helps to understand the energy storage capacity, loss situation, insulation performance, etc. of the capacitor under specific working conditions. For example, changes in capacitance can indicate the health status of the capacitor, can reveal its energy loss in a high-frequency environment, while leakage current reflects its insulation performance. These electrical feedback parameters can help determine whether the capacitor meets the design specifications and whether it can work properly in practical applications.

[0088] The capacitor will generate heat due to the flow of current during operation. Excessive temperature may cause the performance of the capacitor to decline or even fail. Therefore, it is very important to monitor the temperature feedback parameters. The increase in temperature may affect the electrical characteristics of the capacitor, especially capacitance and leakage current, and these parameters will fluctuate with the change of temperature, affecting the stability of the capacitor. By measuring the temperature feedback parameters, the thermal stability of the capacitor and its working performance at different temperatures can be evaluated to ensure that it can still maintain reliability under high temperature or extreme conditions.

[0089] In a feasible implementation, the second test sub-module includes:

[0090] An AC power supply unit, which is used to apply an AC ripple current to the capacitor under test according to the initial test strategy;

[0091] A second capacitance measurement unit, which is used to measure the electrical feedback parameters of the capacitor when applying the AC ripple current;

[0092] A second temperature measurement unit, configured to measure the temperature feedback parameter of the capacitor when applying an alternating ripple current;

[0093] A second data integration unit, configured to integrate the electrical feedback parameter and the temperature feedback parameter to construct alternating current test data.

[0094] In this embodiment, the second test sub-module includes the following components: an alternating current power supply unit, configured to apply an alternating ripple current to the capacitor to be tested according to an initial test strategy. It can accurately control the frequency and amplitude of the alternating current, simulating the conditions of high-frequency ripple or alternating current power supply that the capacitor faces in actual applications. By applying such an alternating ripple current, the dynamic performance and response characteristics of the capacitor in a high-frequency working environment can be evaluated. A second capacitance measurement unit, configured to measure the electrical feedback parameter of the capacitor when applying an alternating ripple current. These electrical feedback parameters include the equivalent series resistance, loss factor, and the change of capacitance under alternating current conditions, etc. A second temperature measurement unit, configured to measure the temperature feedback parameter of the capacitor when applying an alternating ripple current. The capacitor will generate more heat due to current fluctuations under high-frequency alternating current, so the monitoring of temperature can help evaluate its thermal stability under such high-voltage and high-frequency conditions. By measuring the temperature feedback parameter, the system can understand the thermal management ability of the capacitor and judge its safety under high-temperature environments. A second data integration unit, responsible for integrating the electrical feedback parameter and the temperature feedback parameter to construct complete alternating current test data. By integrating these data, the system can comprehensively analyze the performance of the capacitor under alternating current conditions, especially its working state under different frequencies and load conditions.

[0095] In the field of rail transit, due to the operation of complex power systems and high-power equipment, a large amount of high-order harmonics are often generated. These high-order harmonics are current or voltage components with higher frequencies, which will be superimposed on the basic waveform of the main power supply, forming an irregular waveform. Such high-order harmonics have a greater impact on electronic components such as capacitors. Therefore, alternating ripple current needs to be used during AC testing. The alternating ripple current can simulate the characteristics of such high-order harmonics in the rail transit environment. By applying this alternating current, the performance of the capacitor in the actual working environment can be tested. Especially under high-frequency or high-order harmonic conditions, the equivalent series resistance and loss factor of the capacitor will change, thereby affecting its energy conversion efficiency and thermal stability in the power system. By applying the alternating ripple current, the complex power environment in which the capacitor is located can be more realistically simulated, so as to evaluate its response ability to high-order harmonics, power loss and its reliability in the high-frequency environment. The test using the alternating ripple current can effectively identify possible performance degradation problems of the capacitor at high-order harmonic frequencies, ensure that the capacitor can work stably for a long time in the rail transit system, and reduce the risks of overheating, excessive loss or capacitor failure caused by harmonics. This test method helps to improve the overall performance and reliability of power equipment in the rail transit system.

[0096] The optimization module 103 is configured to construct a target test feedback model of the capacitor to be tested according to the test data of the first test cycle, and optimize the initial test strategy according to the target test feedback model to determine the optimized test strategy of the capacitor to be tested.

[0097] In this embodiment, even for capacitors of the same model, under the same test conditions, due to the slight differences in the properties of the capacitors themselves, the test data generated in the first test cycle will also be different. Therefore, the initial test strategy cannot always be the sole guiding basis for subsequent tests. This is because although the initial test strategy can provide a basic test framework for the capacitor, it is set based on the general characteristics of the capacitor type and cannot accurately reflect the specific performance differences of each capacitor.

[0098] To ensure the accuracy and personalization of the test, the system needs to dynamically adjust and optimize the subsequent test strategy according to the specific test data of each capacitor in the first test cycle. By analyzing the electrical feedback parameters and temperature feedback parameters of the capacitor in the first test cycle, the system can identify the performance of each capacitor, possible abnormalities and the deviation between it and the expected standard. This analysis can help the system customize an optimized test strategy suitable for its actual performance for each capacitor.

[0099] The optimized test strategy will be more targeted and can be adjusted according to the specific characteristics of the capacitor, such as test voltage, frequency, load conditions, etc. This process of strategy optimization ensures that subsequent tests can more accurately evaluate the true performance of each capacitor, improving the reliability and consistency of test results. At the same time, it also helps to discover potential performance problems and ensure the long-term stability of the capacitor in complex application scenarios.

[0100] In a feasible implementation, the optimization module includes:

[0101] The first model construction sub-module is used to construct the first test feedback model according to the correspondence between the initial test strategy and the DC test data;

[0102] The second model construction sub-module is used to construct the second test feedback model according to the correspondence between the initial test strategy and the AC test data;

[0103] The third model construction sub-module is used to perform model fusion based on the first test feedback model and the second test feedback model to obtain the target test feedback model;

[0104] The strategy optimization sub-module is used to optimize the initial test strategy of the capacitor according to the target test feedback model.

[0105] In this embodiment, the first model construction sub-module is used to construct a first test feedback model according to the correspondence between the initial test strategy and the DC test data. This model forms a systematic understanding of the performance of the capacitor under DC test by analyzing the electrical feedback parameters and temperature feedback parameters collected during the initial test strategy and the DC test process. This model can reveal the response characteristics and performance of the capacitor under DC operating conditions. The second model construction sub-module is used to construct a second test feedback model according to the correspondence between the initial test strategy and the AC test data. Similar to the DC test, the second model construction sub-module will form a performance model of the capacitor under AC conditions based on the data of the AC test. This model can help understand the dynamic characteristics of the capacitor in an alternating current environment, especially its response to high-frequency signals. The third model construction sub-module is used to perform model fusion based on the first test feedback model and the second test feedback model to obtain the final target test feedback model. By combining the performance of the capacitor in DC and AC tests, the third model can comprehensively evaluate the overall performance of the capacitor in complex application scenarios. This model fusion can generate a more comprehensive test feedback, covering the performance of the capacitor in various power environments, making the evaluation more accurate and reliable. The strategy optimization sub-module is used to optimize the test strategy of the capacitor based on the target test feedback model. By analyzing the data in the target test feedback model, the strategy optimization sub-module can identify the personalized needs and performance differences of the capacitor, and adjust and optimize the subsequent test strategy accordingly. The optimized test strategy is more adaptable to the actual working conditions of each capacitor, ensuring its performance stability and reliability in different application scenarios.

[0106] By establishing the correspondence between the initial test strategy and the DC test data, a first test feedback model reflecting the performance of the capacitor under DC conditions is constructed. This allows for in-depth analysis of the specific performance of the capacitor in the DC test, especially the mutual influence of the electrical feedback and temperature feedback data. Focusing on the relationship between the initial test strategy and the AC test data, a second test feedback model is formed by modeling the high-frequency performance and loss characteristics of the capacitor in the AC test. In this way, the complex characteristics of the AC test can also be fully analyzed. By fusing the first and second test feedback models, a comprehensive target test feedback model is generated. This fusion process can effectively combine the different performance of the capacitor under DC and AC conditions to generate a more comprehensive and accurate performance evaluation model. Through this fusion model, the possible complex behaviors and interactions of the capacitor in actual applications can be better captured.

[0107] In a feasible embodiment, the first model construction sub-module includes:

[0108] A first model construction unit for constructing an electrical feedback parameter model according to the correspondence between electrical feedback parameters and an initial test strategy;

[0109] A second model construction unit for constructing a temperature feedback parameter model according to the correspondence between temperature feedback parameters and an initial test strategy;

[0110] Taking the electrical feedback parameter model as the first optimization target and the temperature feedback parameter model as the second optimization target, determine a first test feedback model according to the optimization results of the first optimization target and the second optimization target.

[0111] In this embodiment, the first model construction unit is used to construct an electrical feedback parameter model according to the correspondence between electrical feedback parameters and an initial test strategy. This model can capture the core electrical performance of the capacitor under DC conditions and help the system evaluate the electrical characteristics of the capacitor. The second model construction unit constructs a temperature feedback parameter model according to the correspondence between temperature feedback parameters and an initial test strategy. This model is mainly used to reflect the thermal effect of the capacitor during DC testing and the impact of temperature changes on its performance, and evaluate the thermal stability and working reliability of the capacitor under different temperature conditions. During the optimization process, the system first takes the electrical feedback parameter model as the first optimization target to ensure that the electrical performance of the capacitor meets the expected standards. Then, the system takes the temperature feedback parameter model as the second optimization target to ensure that the thermal performance of the capacitor meets the test requirements. Finally, according to the optimization results of the first optimization target and the second optimization target, the system combines the comprehensive evaluation of electrical performance and thermal performance to determine the complete first test feedback model. This test feedback model can more comprehensively reflect the actual performance of the capacitor during DC testing, ensure the precise optimization of subsequent test strategies, and improve the accuracy and reliability of testing.

[0112] It should be noted that the process of constructing the electrical feedback parameter model according to the correspondence between electrical feedback parameters and an initial test strategy includes performing corresponding analysis on the electrical feedback parameters and each condition in the initial test strategy. By statistically analyzing the performance of each electrical parameter under different test conditions, the system can find out the mutual relationship between the parameters. For example, the change trend of capacitance under different DC voltages, or the change law of equivalent series resistance within different leakage current ranges, etc. By establishing a mathematical model of electrical feedback parameters, the mapping relationship between electrical parameters and test conditions is described.

[0113] It should be noted that the architecture of the second model construction sub-module is the same as that of the first model construction sub-module, so this application will not elaborate further.

[0114] Top of form

[0115] Bottom of form

[0116] The test module is also configured to perform multiple types of tests on the capacitor under test in the second test cycle according to the optimized test strategy to obtain the test data for the second test cycle.

[0117] In this embodiment, in the second test cycle, multiple types of tests are performed on the capacitor under test to obtain the test data for the second test cycle. In the second test cycle, the test module no longer relies solely on the initial test strategy, but instead based on the test data and feedback results of the first test cycle, further tests are carried out through the optimized test strategy. This optimized strategy fully considers the individual differences of the capacitors and the electrical and temperature feedback parameters shown in the first cycle, so it can set the test conditions more precisely and make the test results more in line with the actual performance of the capacitors.

[0118] In the multiple types of tests, the test module will simultaneously perform DC tests and AC tests to more comprehensively evaluate the performance of the capacitor. By applying the optimized DC voltage and AC ripple current, the test module can measure the electrical feedback parameters and temperature feedback parameters of the capacitor under these conditions again. These test data are not only used to verify the results in the first test cycle, but also can be used to further adjust and improve the model to enhance the accuracy and pertinence of the test.

[0119] The test data of the second test cycle will be used to evaluate the performance of the capacitor under the optimized test strategy, so as to determine whether it meets the expected application requirements. Through this multi-cycle and multi-type test method, the stability and reliability of the capacitor under different working conditions can be ensured, providing stronger guarantee for its long-term use in actual applications.

[0120] The evaluation module 104 is configured to determine the simulation test result of the capacitor under test according to the test data of multiple test cycles.

[0121] In this embodiment, determining the simulation test result of the capacitor under test according to the test data of multiple test cycles is a comprehensive evaluation process, aiming to comprehensively understand the performance of the capacitor under different conditions.

[0122] In a feasible embodiment, the evaluation module includes:

[0123] The first evaluation sub-module is used to determine the evaluation score of the capacitor under test in each test cycle according to the test data of multiple test cycles, and determine the comprehensive evaluation result of the capacitor under test according to the evaluation coefficient corresponding to each test cycle;

[0124] The second evaluation sub-module is used to generate a test evaluation report for the capacitor under test according to the comprehensive evaluation result.

[0125] In this embodiment, the first evaluation sub-module is used to determine the evaluation score of the capacitor to be tested in each test cycle according to the test data of multiple test cycles. Specifically, the first evaluation sub-module analyzes the data of each test cycle, especially the electrical feedback parameters and temperature feedback parameters, and gives the evaluation score of each test cycle through the set indicators and weights. These evaluation scores reflect the performance of the capacitor under different test conditions, covering the key performance indicators in DC and AC tests. In addition, the first evaluation sub-module also determines the comprehensive evaluation result of the capacitor according to the evaluation coefficient corresponding to each test cycle. The evaluation coefficient is set based on the weights of different test cycles, reflecting the importance of different test stages to the final evaluation. For example, some test cycles may focus more on the high-frequency performance of the capacitor, while others may pay more attention to the impact of temperature on its performance. By combining the evaluation coefficients of these different cycles, the first evaluation sub-module can generate a comprehensive evaluation result, which more comprehensively reflects the overall performance of the capacitor.

[0126] The second evaluation sub-module then generates a test evaluation report for the capacitor to be tested based on the comprehensive evaluation result. The report includes the specific performance of the capacitor in each test cycle, the detailed records of key performance parameters, the abnormalities or non-compliance situations during the test, and gives the final test conclusion of the capacitor according to the comprehensive evaluation result. Such a test evaluation report can provide a reliable basis for subsequent quality control, production optimization and application decision-making, ensuring the long-term stability and reliability of the capacitor in complex application scenarios. After completing the test of one type of capacitor, a corresponding historical test record can be generated based on its test evaluation report.

[0127] A DC and AC simulation test system for capacitors provided by an embodiment of the present application can intelligently identify the type and specific characteristics of the capacitor to be tested by obtaining the image information of the capacitor after obtaining a capacitor test request through the parameter configuration module. This way of determining the initial test strategy based on image information ensures the accuracy and pertinence of the test strategy. Multiple test configuration parameters in the initial test strategy can be set for different types of capacitors to ensure that the system can handle capacitors of different specifications and models in the rail transit system and adapt to complex test requirements.

[0128] Secondly, the testing module conducts multi-type tests in the first test cycle, covering multi-dimensional performance tests of direct current and alternating current. Especially in rail transit, higher harmonics have a greater impact on the performance of capacitors. This testing module can apply alternating ripple current to fully evaluate the performance of capacitors in the actual working environment and ensure that they can withstand the higher harmonic environment. By obtaining the test data of the first test cycle, the system can comprehensively understand the performance of capacitors under the initial test conditions, especially the data in terms of electrical feedback parameters and temperature feedback parameters, providing a basis for subsequent optimization.

[0129] The optimization module further constructs a target test feedback model based on the test data of the first test cycle and optimizes the initial test strategy by analyzing the actual performance of the capacitors. This adaptive optimization mechanism can adjust the test strategy according to the individual differences of each capacitor, ensuring that the test plan is flexible and accurate to meet the requirements of high reliability of capacitors in the rail transit system. The optimized test strategy can further improve the effectiveness of the test, especially for the performance of capacitors under high-frequency applications.

[0130] Finally, the evaluation module comprehensively evaluates the simulation test results of the capacitors through the test data of multiple test cycles. This multi-cycle test can fully detect the performance of capacitors under different test conditions and different stages, ensuring their performance stability. Through gradual optimization and multiple tests, the system can provide a more accurate performance evaluation of capacitors for rail transit applications, ensuring their long-term reliability and working stability. In this way, the high requirements for capacitors in the rail transit field are met, overcoming the limitations of existing test schemes in complex environments and ensuring the performance stability of capacitors under higher harmonics and complex temperature conditions.

[0131] The above embodiments can be implemented in whole or in part by software, hardware (such as circuits), firmware, or any combination thereof. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer programs are loaded or executed on a computer, the processes or functions according to the embodiments of the present application are generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable systems. The computer program or instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another. For example, the computer program or instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center by wired (such as infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device such as a server or data center that contains one or more collections of available media. The available media can be magnetic media (such as floppy disks, hard disks, magnetic tapes), optical media (such as DVDs), or semiconductor media. The semiconductor media can be a solid-state drive.

[0132] It should be understood that the term "and / or" in this document is merely a description of the association relationship between associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. Here, A and B can be singular or plural. In addition, the character " / " in this document generally represents an "or" relationship between the associated objects before and after, but it may also represent an "and / or" relationship, which can be specifically understood with reference to the context.

[0133] In the present application, "at least one" means one or more, and "a plurality" means two or more. "At least one of the following" or its similar expressions refer to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b, or c can represent: a, b, c, a - b, a - c, b - c, or a - b - c, where a, b, and c can be single or multiple.

[0134] It should be understood that in various embodiments of the present application, the magnitudes of the sequence numbers of the above processes do not mean the order of execution. The order of execution of each process should be determined by its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

[0135] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in connection with the embodiments disclosed herein can be implemented in electronic hardware, or in a combination of computer software and electronic hardware. Whether these functions are executed in hardware or software depends on the specific application and design constraints of the technical solution. A person skilled in the art can use different methods for each specific application to implement the described functions, but such implementation should not be considered to exceed the scope of this application.

[0136] Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working processes of the systems, systems, and units described above can refer to the corresponding processes in the foregoing method embodiments, and will not be described herein again.

[0137] In several embodiments provided in this application, it should be understood that the disclosed systems, systems, and methods can be implemented in other ways. For example, the system embodiments described above are merely illustrative. For example, the division of units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections of systems or units can be electrical, mechanical, or other forms.

[0138] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they can be located in one place, or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0139] In addition, the functional units in each embodiment of this application can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit.

[0140] If a function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art or a part of this technical solution can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods of various embodiments of this application. The aforementioned storage medium includes: various media that can store program codes such as USB flash drives, mobile hard disks, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical discs.

[0141] The above is only the specific implementation manner of this application, but the protection scope of this application is not limited thereto. Any person skilled in the art within the technical scope disclosed by this application can easily think of changes or substitutions, which should all be covered by the protection scope of this application. Therefore, the protection scope of this application should be subject to the protection scope of the claims.

Claims

1. An AC / DC analog test system for a capacitor, characterized in that, The system includes: A parameter configuration module, configured to obtain image information of a capacitor to be tested after receiving a capacitor test request, and determine an initial test strategy for the capacitor to be tested according to the image information of the capacitor to be tested, where the initial test strategy includes multiple test configuration parameters; A test module, configured to perform multiple types of tests on the capacitor to be tested in a first test cycle according to the initial test strategy to obtain test data for the first test cycle; An optimization module, configured to construct a target test feedback model for the capacitor to be tested according to the test data for the first test cycle, and optimize the initial test strategy according to the target test feedback model to determine an optimized test strategy for the capacitor to be tested; The test module is further configured to perform multiple types of tests on the capacitor to be tested in a second test cycle according to the optimized test strategy to obtain test data for the second test cycle; An evaluation module, configured to determine a simulated test result of the capacitor to be tested according to the test data for multiple test cycles; The parameter configuration module includes: A label determination sub-module, configured to determine a type label of the capacitor to be tested according to the image information of the capacitor to be tested; A matching sub-module, configured to match an initial test strategy that matches the type label with the type label of the capacitor to be tested as an index; The test module includes: A first test sub-module, configured to perform a DC test on the capacitor to be tested according to the initial test strategy to obtain DC test data; A second test sub-module, configured to perform an AC test on the capacitor to be tested according to the initial test strategy to obtain AC test data; The optimization module includes: A first model construction sub-module, configured to construct a first test feedback model according to the correspondence between the initial test strategy and the DC test data; A second model construction sub-module, configured to construct a second test feedback model according to the correspondence between the initial test strategy and the AC test data; A third model construction sub-module, configured to perform model fusion according to the first test feedback model and the second test feedback model to obtain the target test feedback model; A strategy optimization sub-module, configured to optimize the initial test strategy of the capacitor according to the target test feedback model.

2. The AC-DC analog test system for a capacitor according to claim 1, wherein The label determination sub-module includes: A query unit, configured to determine whether there is a first type label that matches the capacitor to be tested according to the model characteristics in the image information, where the first type label is used to characterize the type of capacitor with a historical test record; A first determination unit, configured to determine the first type label as the type label of the capacitor to be tested when there is a first type label that matches the model characteristics; A second determination unit, configured to determine a second type label as the type label of the capacitor to be tested when there is no first type label that matches the capacitor to be tested, where the second type label is used to characterize the type of capacitor without a historical test record.

3. The AC / DC analog test system for the capacitor according to claim 1, characterized in that The matching sub-module includes: A first matching unit, configured to determine an initial test strategy for the capacitor to be tested according to the historical test records corresponding to the first type label when the type label of the capacitor to be tested is the first type label; A second matching unit, configured to determine an initial test strategy for the capacitor to be tested according to the performance parameters of the capacitor to be tested when the type label of the capacitor to be tested is the second type label.

4. The AC / DC analog test system for a capacitor according to claim 1, characterized in that The first test sub-module includes: A DC power supply unit, configured to apply a DC voltage to the capacitor to be tested according to the initial test strategy; A first capacitance measurement unit, configured to measure the electrical feedback parameters of the capacitor when applying the DC voltage; A first temperature measurement unit, configured to measure the temperature feedback parameters of the capacitor when applying the DC voltage; A first data integration unit, configured to integrate the electrical feedback parameters and the temperature feedback parameters to construct the DC test data.

5. The AC / DC analog test system for a capacitor according to claim 1, wherein The second test sub-module includes: An AC power supply unit, configured to apply an AC ripple current to the capacitor to be tested according to the initial test strategy; A second capacitance measurement unit, configured to measure the electrical feedback parameters of the capacitor when applying the AC ripple current; A second temperature measurement unit, configured to measure the temperature feedback parameters of the capacitor when applying the AC ripple current; A second data integration unit, configured to integrate the electrical feedback parameters and the temperature feedback parameters to construct the AC test data.

6. The AC / DC analog test system for a capacitor according to claim 1, characterized in that, The first model construction sub-module includes: A first model construction unit, configured to construct an electrical feedback parameter model according to the corresponding relationship between the electrical feedback parameters and the initial test strategy; A second model construction unit, configured to construct a temperature feedback parameter model according to the corresponding relationship between the temperature feedback parameters and the initial test strategy; Taking the electrical feedback parameter model as the first optimization target and the temperature feedback parameter model as the second optimization target, determine the first test feedback model according to the optimization results of the first optimization target and the second optimization target.

7. The AC / DC analog test system for a capacitor according to claim 1, wherein The evaluation module includes: A first evaluation sub-module, configured to determine the evaluation score of the capacitor to be tested in each test cycle according to the test data of multiple test cycles, and determine the comprehensive evaluation result of the capacitor to be tested according to the evaluation coefficient corresponding to each test cycle; A second evaluation sub-module, configured to generate a test evaluation report for the capacitor to be tested according to the comprehensive evaluation result.

Images