Atomic beam generating device, physical package, physical package for optical lattice clock, physical package for atomic clock, physical package for atomic interferometer, physical package for quantum information processing device, and physical package system

Abstract

In a vacuum container (102), a sample container (104) for accommodating a sample (118), a nozzle (106), and an object to be heated (108) are provided. An induction coil (114) is provided on the outside of the vacuum container (102). The body to be heated (108) is provided around the sample container (104) and the nozzle (106). Power is wirelessly supplied from the induction coil (114) to the body to be heated (108), and the body to be heated (108) is heated. The sample container (104) and the nozzle (106) are heated by the heating body (108), and the sample (118) in the sample container (104) is heated. The atomic gas generated by heating the sample (118) is emitted from the nozzle (106).

Description

Technical Field

[0001] The present invention relates to an atomic beam generating device, a physical package, a physical package for an optical lattice clock, a physical package for an atomic clock, a physical package for an atomic interferometer, a physical package for a quantum information processing device, and a physical package system. Background Art

[0002] The optical lattice clock is an atomic clock proposed by Hidetoshi Katori, one of the inventors of this application, in 2001. In the optical lattice clock, atomic groups are enclosed in an optical lattice formed by lasers, and the resonant frequency in the visible light region is measured. Therefore, it is possible to measure with an accuracy of 18 bits, which is far higher than the accuracy of the current cesium clock. Optical lattice clocks are being researched and developed not only by the inventor group, but also by various groups at home and abroad, and are being developed into the next generation of atomic clocks.

[0003] As for the recent technology of optical lattice clocks, for example, the following patent documents 1 to 3 can be cited. Patent document 1 describes the formation of a one-dimensional moving optical lattice inside an optical waveguide having a hollow channel. Patent document 2 describes a scheme for setting an effective magic frequency. In fact, the magic wavelength has been determined theoretically and experimentally using strontium, ytterbium, mercury, cadmium, and magnesium. In addition, patent document 3 describes a radiation shield that reduces the influence of black body radiation emitted from the surrounding walls.

[0004] In an optical lattice clock, time is measured with high precision, so a height difference of 1 cm on the earth based on the general relativity effect of gravity can be detected as a deviation in the time process. Therefore, if the optical lattice clock can be miniaturized and portable and used in the field outside the laboratory, the applicability will be expanded to new geodetic technologies such as underground resource exploration, underground caves, and magma chamber detection. By mass-producing optical lattice clocks and deploying them in various places, it is possible to continuously monitor the time changes of gravitational potential, detect crustal changes, and spatial mapping of gravity fields. In this way, optical lattice clocks are expected to exceed the limits of high-precision time measurement and contribute to society as a new basic technology.

[0005] The physical package of a general atomic clock such as an optical lattice clock has an atomic beam furnace in an ultra-high vacuum chamber. The atomic beam furnace heats a sample (solid or liquid) as an atomic source and emits the atoms evaporated by the heating to a subsequent device. For example, the atomic beam emitted from the atomic beam furnace is output to a magneto-optical trap device (MOT device) via a Zeeman slower.

[0006] Below, refer to Fig.19 The atomic beam furnace of the prior art will be described. Fig.19 A prior art atomic beam furnace is shown.

[0007] The atomic beam furnace 1000 includes a sample container 1002, a nozzle 1004, and a heater 1006. A sample 1008 serving as an atomic source is stored in the sample container 1002. The sample 1008 is heated by the heater 1006 to evaporate atoms. The evaporated atomic gas is emitted as a converged atomic beam.

[0008] The thermometer 1010 is provided in the sample container 1002 to measure the temperature of the sample container 1002. The electric wiring of the heater 1006 and the thermometer 1010 is led out to the outside of the atomic beam furnace 1000 via a terminal 1012.

[0009] The atomic beam furnace 1000 further includes a flange 1014. The flange 1014 is mechanically joined to a flange 1018 provided on the physics package main body, whereby the atomic beam furnace 1000 and the physics package are sealed.

[0010] The sample container 1002 serves to mechanically secure the nozzle 1004 , heater 1006 , sample 1008 , thermometer 1010 , and terminal 1012 to the flange 1014 .

[0011] Since the temperature of the flange 1014 needs to be maintained at room temperature, a heat insulating member 1016 is provided between the heater 1006 heated to a high temperature and the flange 1014 to block heat transfer from the heater 1006 .

[0012] Prior art literature

[0013] Patent Literature

[0014] Patent Document 1: Japanese Patent No. 6206973

[0015] Patent Document 2: Japanese Patent Application No. 2018-510494

[0016] Patent Document 3: Japanese Patent Application Publication No. 2019-129166 Summary of the invention

[0017] Problem that the invention aims to solve

[0018] Next, the miniaturization and weight reduction of the atomic beam furnace and the assembly parts of the physical package body connected thereto will be described.

[0019] If the service life of the device is set, the lower limits of the sizes of the nozzle 1004, the heater 1006, and the sample 1008 are uniquely determined. Based on the life of the device, the weight and volume of the sample 1008 that must be continuously supplied with atomic gas during this period are calculated. When the volume of the sample 1008 is determined, the heat capacity that the heater 1006 should supply is calculated based on its sublimation temperature and the weight of the sample 1008. In addition, the size of the nozzle 1004 is determined based on the atomic beam diameter and atomic flow rate required in the device at the later stage than the atomic beam furnace 1000. For example, when the sample 1008 is strontium and the shape of the sample 1008 is cylindrical, when its life is set to 50 years and the atomic flow rate is set to 10 12 atoms / cm 2 / s, when the atomic beam diameter is set to 10 mm, the diameter of the sample 1008 is The length is equivalent to 10mm.

[0020] The following describes miniaturization and weight reduction with focus on the sample container 1002 , the thermometer 1010 , the terminal 1012 , and the flange 1014 .

[0021] When current is supplied to the heater 1006 in a wired manner as in the conventional method and the sample 1008 is heated by Joule heat, current needs to be supplied to the heater 1006. In this case, a terminal with at least two pins is required for the vacuum-resistant terminal 1012. That is, it is difficult to omit the terminal 1012.

[0022] As the thermometer, a thermometer using the resistance of the heater 1006 itself can be considered. For example, the resistance of a general metal changes linearly with respect to temperature at a temperature near room temperature. Therefore, in principle, the temperature can be calculated based on the potential difference of the terminals of the heater 1006.

[0023] In order to obtain a sufficient heat insulation effect, a material with low thermal conductivity needs to be used for the heat insulation member 1016. In addition, a heat insulation member 1016 with a small cross-sectional area and a minimum necessary length needs to be used. However, if the cross-sectional area is too small, it is difficult to ensure the strength of the heat insulation member 1016.

[0024] The size of the flange 1014 must be larger than the size of the sample container 1002. For example, when a commonly used ConFlat flange (CF flange) is used, when the diameter of the sample container 1002 is When using an inner diameter of The outer diameter is Flange thickness 7.5mm.

[0025] As can be seen from the above, the atomic beam furnace 1000 has a structure whose size is uniquely determined by the service life of the device and a structure whose size increases due to the heating structure regardless of the service life. If the atomic beam furnace 1000 in which electric current is supplied to the heater 1006 by wire and the sample 1008 is heated by Joule heat is taken as an example, the size of the atomic beam furnace 1000 will increase due to the sizes of the terminal 1012, the sample container 1002, and the flange 1014, which are difficult to omit.

[0026] In addition, in an atomic beam furnace set under ultra-high vacuum, it is expected that not only each component will be miniaturized, but also the vacuum performance will be improved by reducing each component or reducing the surface area of ​​each component. This is because the amount of gas released from a component under ultra-high vacuum is proportional to the product of the gas release rate of the component material and the surface area of ​​the component.

[0027] When supplying current to a heater for heating, even if the resistor of the heater is molded from a member such as ceramic or glass, a lead wire of limited length is required, so it is considered that the gas released from the lead wire having a large surface area and heated to a high temperature cannot be ignored.

[0028] In addition, it is considered that the gas released from components such as terminals and heat insulating members cannot be ignored.

[0029] An object of the present invention is to achieve miniaturization of an atomic beam generating device.

[0030] Solutions for solving problems

[0031] One scheme of the present invention is an atomic beam generating device, characterized in that it includes: a vacuum container; a wireless supply unit, which is arranged outside the vacuum container and supplies energy wirelessly; a sample container, which is arranged in the vacuum container and stores an atomic source; a heated body, which is arranged in the vacuum container and heats the atomic source by heating the energy supplied from the wireless supply unit; and a nozzle, which is arranged in the sample container and emits atomic gas generated by heating the atomic source from the sample container.

[0032] The object to be heated may be a magnetic body, and the wireless supply unit may supply electric power to the object to be heated in a wireless manner.

[0033] The heated object may be a magnetic body having a Curie temperature determined based on a target temperature of the atomic source.

[0034] The heated object may be a high-frequency resistor, and the wireless supply unit may supply electric power to the heated object wirelessly.

[0035] The object to be heated may be a resistor included in an LC resonator, and the wireless supply unit may supply electric power to the object to be heated in a wireless manner.

[0036] The atomic beam generating device may further include a heat insulating member for blocking heat transfer from the sample container.

[0037] The heat insulating member may have a cylindrical shape and be provided on the nozzle side of the sample container, and the atomic gas emitted from the nozzle may travel through the inside of the heat insulating member.

[0038] The sample container and the heat insulating member may be integrated and inserted into the vacuum container.

[0039] The atomic beam generating device may include a plurality of heat insulating members, each of which is a rod-shaped member and is provided to surround the sample container at intervals from each other.

[0040] Alternatively, the wireless supply unit is an induction coil.

[0041] The heated body may be provided so as to surround the nozzle.

[0042] The object to be heated may be a member that converts light into heat, and the wireless supply unit may irradiate light toward the object to be heated.

[0043] The heated body may be provided on an end surface of the sample container opposite to an end surface on which the nozzle is provided, and a size of the sample container may be larger than a diameter of light irradiated to the heated body.

[0044] One embodiment of the present invention is a physics package, characterized by comprising: an atomic beam generating device; and a vacuum chamber that surrounds a clock transition space in which atoms are arranged.

[0045] One embodiment of the present invention is a physical package for an optical lattice clock, characterized in that it includes a physical package.

[0046] One embodiment of the present invention is a physical package for an atomic clock, characterized in that it includes a physical package.

[0047] One embodiment of the present invention is a physical package for an atom interferometer, characterized by including a physical package.

[0048] One embodiment of the present invention is a physical package for a quantum information processing device for atoms or ionized atoms, characterized by comprising a physical package.

[0049] One aspect of the present invention is a physical packaging system, including: a physical packaging; and a control device that controls the operation of the physical packaging.

[0050] Effects of the Invention

[0051] According to the present invention, it is possible to miniaturize an atomic beam generating device. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 : is a block diagram showing the overall structure of the optical lattice clock according to the embodiment.

[0053] Figure 2 It is a diagram schematically showing the configuration of the atomic beam generating device according to the first embodiment.

[0054] Figure 3 It is a diagram schematically showing the configuration of an atomic beam generating device according to a second embodiment.

[0055] Figure 4 It is a diagram schematically showing the structure of the atomic beam generating device according to the third embodiment.

[0056] Figure 5A is a diagram showing an example of wireless power supply.

[0057] Figure 5B is a diagram showing an example of wireless power supply.

[0058] Figure 5C is a diagram showing an embodiment of wireless power supply.

[0059] Figure 5D is a diagram showing an embodiment of wireless power supply.

[0060] Figure 5E is a diagram showing an embodiment of wireless power supply.

[0061] Fig. 6A It is a perspective view showing the structure of a specific example of the first embodiment.

[0062] Figure 6B It is a perspective view showing the structure of a specific example of the first embodiment.

[0063] Figure 6C It is a perspective view showing the structure of a specific example of the first embodiment.

[0064] Fig.6D It is a perspective view showing the structure of a specific example of the first embodiment.

[0065] Figure 7 It is a diagram showing the appearance of a physical package according to the first embodiment.

[0066] Figure 8 It is a cross-sectional view showing the physical package of the first embodiment.

[0067] Fig.9A It is a perspective view showing the structure of a specific example of the second embodiment.

[0068] Fig. 9B It is a perspective view showing the structure of a specific example of the second embodiment.

[0069] Fig.10 It is a cross-sectional view showing a physical package of the second embodiment.

[0070] Fig.11 It is a perspective view showing the appearance of a physical package according to the third embodiment.

[0071] Fig.12 It is a cross-sectional view showing the structure of a specific example of the third embodiment.

[0072] Fig.13A It is a diagram showing the configuration of a specific example of the third embodiment.

[0073] Fig. 13B It is a diagram showing the configuration of a specific example of the third embodiment.

[0074] Fig.14 It is a graph showing the time change of temperature.

[0075] Fig.15A It is a perspective view showing the structure of the atomic beam generating device according to the fourth embodiment.

[0076] Fig. 15B It is a perspective view showing the structure of the atomic beam generating device according to the fourth embodiment.

[0077] Fig. 15C It is a perspective view showing a heat insulating member and a heated object according to a fourth embodiment.

[0078] Fig.15D It is a perspective view showing a heat insulating member and a heated object according to a fourth embodiment.

[0079] Fig.15E It is a cross-sectional view showing the structure of the atomic beam generating device according to the fourth embodiment.

[0080] Fig.16A It is a perspective view showing the structure of the atomic beam generating device according to the fifth embodiment.

[0081] Fig. 16B It is a perspective view showing the structure of the atomic beam generating device according to the fifth embodiment.

[0082] Fig. 16C It is a perspective view showing a heat insulating member and a heated object according to a fifth embodiment.

[0083] Fig.16D It is a perspective view showing a heat insulating member and a heated object according to a fifth embodiment.

[0084] Fig.16E It is a cross-sectional view showing the structure of the atomic beam generating device according to the fifth embodiment.

[0085] Fig.17A It is a perspective view showing the structure of the atomic beam generating device according to the sixth embodiment.

[0086] Fig. 17B It is a perspective view showing the structure of the atomic beam generating device according to the sixth embodiment.

[0087] Fig. 17C It is a perspective view showing a heat insulating member and a heated object according to a sixth embodiment.

[0088] Fig.17D It is a perspective view showing a heat insulating member and a heated object according to a sixth embodiment.

[0089] Fig.17E It is a cross-sectional view showing the structure of the atomic beam generating device according to the sixth embodiment.

[0090] Fig.18 This is a cross-sectional view showing the structure of an atomic beam generating device according to a seventh embodiment.

[0091] Fig.19 This is a diagram schematically showing the structure of a conventional atomic beam furnace. DETAILED DESCRIPTION

[0092] <Structure of the optical lattice clock>

[0093] Reference Figure 1 A schematic configuration of an optical lattice clock 10 using the atomic beam generating device according to the embodiment will be described. Figure 1 1 is a block diagram showing the overall structure of the optical lattice clock 10. Here, the optical lattice clock 10 is described as an example of a device using the atomic beam generating device, but the atomic beam generating device of the embodiment can be used for devices other than the optical lattice clock 10.

[0094] The optical lattice clock 10 includes, for example, a physics package 12 , an optical system device 14 , a control device 16 , and a PC (Personal computer) 18 .

[0095] The physical package 12 is a device that captures an atomic group and seals it in an optical lattice to cause a clock transition. The optical system device 14 is a device equipped with optical devices such as a laser source for atom capture, a laser source for clock transition excitation, and a laser frequency control device. In addition to sending laser light to the physical package 12, the optical system device 14 also receives the fluorescence signal released by the atomic group in the physical package 12 and converts it into an electrical signal and feeds it back to the laser source to match the resonant frequency of the atoms. The control device 16 is a device that controls the physical package 12 and the optical system device 14. The control device 16, for example, performs operation control of the physical package 12, operation control of the optical system device 14, and analysis processing such as frequency analysis of the clock transition obtained by measurement. The function of the optical lattice clock 10 is realized by the cooperation of the physical package 12, the optical system device 14, and the control device 16.

[0096] PC18 is a general-purpose computer including a processor and a memory. The functions of PC18 are realized by executing software by hardware including a processor and a memory. An application for controlling the optical lattice clock 10 is installed in PC18. PC18 is connected to the control device 16, and can control not only the control device 16 but also the entire optical lattice clock 10 including the physical package 12 and the optical system device 14. In addition, PC18 provides a UI (User Interface) of the optical lattice clock 10. The user can start the optical lattice clock 10, measure time, and confirm the results through PC18.

[0097] In addition, a system including the physical package 12 and the configuration required for controlling the physical package 12 is sometimes referred to as a "physical package system". The configuration required for control may be included in the control device 16 or the PC 18, or may be included in the physical package 12. In addition, part or all of the functions of the control device 16 may also be included in the physical package 12.

[0098] Hereinafter, an atomic beam generating device of an embodiment will be described in detail. In the atomic beam generating device of the embodiment, a heated body is disposed in a sample container or its surroundings that stores a sample serving as an atomic source. The sample container is disposed in a vacuum container. The heated body is heated by disposing a wireless supply device (such as an induction coil) outside the vacuum container and supplying energy (specifically, electromagnetic waves) from the wireless supply device to the heated body. Specifically, the heated body is heated by supplying power or light from the wireless supply device to the heated body. As the heated body is heated, the sample is heated, thereby generating atomic gas. The heated body is a magnetic body, a high-frequency resistor, a resistor included in an LC resonator, or a photothermal converter, etc.

[0099] <Atomic beam generating device according to first embodiment>

[0100] Reference Figure 2 The structure of the atomic beam generating device according to the first embodiment will be described. Figure 2 It is a diagram schematically showing the configuration of the atomic beam generating device 100 according to the first embodiment.

[0101] The atomic beam generating device 100 includes a vacuum container 102 , a sample container 104 , a nozzle 106 , a heated body 108 , a cover 110 , a heat insulating member 112 , an induction coil 114 , and a flange 116 .

[0102] The sample container 104, the nozzle 106, the heated body 108, the cover 110 and the heat insulating member 112 are stored in the vacuum container 102. The space in the vacuum container 102 is connected to the vacuum part of the physical package 12 and is maintained at an ultra-high vacuum. Thus, the sample container 104, the nozzle 106, the heated body 108, the cover 110 and the heat insulating member 112 are placed under ultra-high vacuum. The sample container 104, the nozzle 106, the heated body 108 and the cover 110 are mechanically supported by a module at a later stage provided in the vacuum part of the physical package 12 via the heat insulating member 112.

[0103] A sample 118 as an atomic source is stored in the sample container 104. Atomic gas is generated by heating the sample 118. As the atomic source, for example, strontium, ytterbium, or the like is used.

[0104] The nozzle 106 has a cylindrical shape, and one end of the nozzle 106 is provided in the sample container 104 . The atomic gas passing through the nozzle 106 is converged to become an atomic beam, and is emitted from the sample container 104 .

[0105] The heated body 108 is disposed in the sample container 104 or its surroundings. Figure 2 In the example shown, the heated body 108 is provided so as to surround the side surface of the nozzle 106 while being in contact with the sample container 104. Thus, the heated body 108 is in thermal contact with the sample container 104 and the nozzle 106. The heated body 108 heats the sample container 104 and the nozzle 106. In addition, the sample 118 contained in the sample container 104 is heated.

[0106] The cap 110 is provided at a portion of the sample container 104 on the opposite side from the nozzle 106. By removing the cap 110, an insertion port is formed at a portion where the cap 110 was originally provided. The sample 118 is inserted into the sample container 104 through the insertion port.

[0107] The heat insulating member 112 is a member that blocks heat transfer from the sample container 104. The heat insulating member 112 is provided on the nozzle 106 side of the sample container 104. The heat insulating member 112 is provided in the direction in which the nozzle 106 extends from the sample container 104 (that is, in the direction in which the atomic beam travels). The heat insulating member 112 may also serve as a member that guides the travel of the atomic beam.

[0108] For example, the heat insulating member 112 has a cylindrical shape, and the atomic beam emitted from the nozzle 106 travels toward a subsequent device (such as a Zeeman reducer) through the heat insulating member 112. As another example, a plurality of heat insulating members may be provided to surround the nozzle 106 and the sample container 104 at intervals.

[0109] The induction coil 114 is an example of a wireless power supply unit (an example of a wireless supply unit), and is provided outside the vacuum container 102 (that is, on the atmosphere side) at a position corresponding to the heated object 108 in the vacuum container 102. Specifically, the induction coil 114 is provided outside the vacuum container 102 in a manner surrounding the heated object 108. When the heated object 108 is provided in a manner surrounding the nozzle 106, the induction coil 114 is provided in a manner surrounding the nozzle 106.

[0110] By supplying power to the induction coil 114 from the power supply device 120 including the control device, an AC magnetic field is generated from the induction coil 114. The AC magnetic field passes through the vacuum container 102 and is transmitted into the vacuum container 102. By transmitting magnetic energy to the heated body 108 in this way, the heated body 108 is heated. The heat generated from the heated body 108 is transferred to the sample container 104, the nozzle 106 and the sample 118, and the sample container 104, the nozzle 106 and the sample 118 are heated. Atomic gas is generated by heating the sample 118, and the atomic gas is emitted from the nozzle 106 to the outside of the sample container 104.

[0111] The flange 116 is provided in the vacuum container 102, and is mechanically joined to the flange 122 provided in the physics package 12. Thus, the atomic beam generating device 100 and the physics package 12 are sealed.

[0112] <Atomic beam generating device according to the second embodiment>

[0113] Reference Figure 3 The structure of the atomic beam generating device according to the second embodiment will be described. Figure 3 It is a diagram schematically showing the configuration of an atomic beam generating device 200 according to the second embodiment.

[0114] The atomic beam generating device 200 includes a vacuum container (not shown), a sample container 204 , a nozzle 206 , a heated body 208 , a cover 210 , a heat insulating member 212 , an induction coil 214 , and a flange 216 .

[0115] The configurations of the vacuum container, sample container 204, nozzle 206, cover 210, and heat insulating member 212 are the same as those of the vacuum container 102, sample container 104, nozzle 106, cover 110, and heat insulating member 112 of the first embodiment. In the sample container 204, a sample 218 as an atomic source is stored.

[0116] The heated body 208 is provided so as to surround the side of the nozzle 206 and the sample container 204. Thus, the heated body 208 is in thermal contact with the sample container 204 and the nozzle 206. The heated body 208 is heated, so that the sample container 204 and the nozzle 206 are heated. In addition, the sample 218 contained in the sample container 204 is heated.

[0117] The induction coil 214 is an example of a wireless power supply unit (an example of a wireless supply unit), and is provided outside the vacuum container (that is, on the atmosphere side). Specifically, the induction coil 214 is provided at a position opposite to the surface of the sample container 204 on the side opposite to the surface on which the nozzle 206 is provided (that is, the surface on which the cover 210 is provided).

[0118] The window 220 is provided on the flange 216. The induction coil 214 is provided at a position facing the sample container 204 across the window 220.

[0119] The heated body 208 is heated by receiving magnetic energy from the induction coil 214 at a surface facing the induction coil 214. Heat generated from the heated body 208 is transferred to the sample container 204 and the nozzle 206 as in the first embodiment, and the sample container 204, the nozzle 206 and the sample 218 are heated.

[0120] The flange 216 is mechanically bonded to a flange 222 provided on the physics package 12. Thus, the atomic beam generating device 200 and the physics package 12 are sealed.

[0121] <Atomic beam generating device according to the third embodiment>

[0122] Reference Figure 4 The structure of the atomic beam generating device according to the third embodiment will be described. Figure 4 It is a diagram schematically showing the structure of an atomic beam generating device 300 according to the third embodiment.

[0123] The atomic beam generating device 300 includes a vacuum container 302 , a sample container 304 , a nozzle 306 , a heated body 308 , a cover 310 , a heat insulating member 312 , and an induction coil 314 .

[0124] The sample container 304, nozzle 306, heated body 308, cover 310 and heat insulating member 312 are respectively configured similarly to the sample container 104, nozzle 106, heated body 108, cover 110 and heat insulating member 112 of the first embodiment. A sample 318 serving as an atomic source is stored in the sample container 304.

[0125] The induction coil 314 is an example of a wireless power supply unit (an example of a wireless supply unit), and is provided outside the vacuum container 302 to surround the heated body 308, similarly to the first embodiment. Similar to the first embodiment, the heated body 308 receives magnetic energy from the induction coil 314 and is heated. As a result, the sample container 304, the nozzle 306, and the sample 318 are heated.

[0126] The vacuum container 302 extends in the direction in which the heat insulating member 312 extends, and is fixed to the physics package 12. In the third embodiment, the atomic beam generating device 300 is fixed to the physics package 12 without using a flange.

[0127] Below, refer to FIG. 5A to FIG. 5E To illustrate a method of wirelessly transferring energy from an induction coil to a heated object. FIG. 5A to FIG. 5E Hereinafter, the heated body 108 is used as an example to represent the heated bodies 108, 208, and 308, and the induction coil 114 is used as an example to represent the induction coils 114, 214, and 314 for explanation, but energy is transferred in the same manner even when the heated body 208 or 308 is used as the heated body and the induction coil 214 or 314 is used as the induction coil.

[0128] exist Figure 5A In the example shown, the heated body 108 is a magnetic body. For example, a ferromagnetic body such as iron or nickel is used. The AC magnetic field generated by the induction coil 114 causes the heated body 108, which is a magnetic body, to generate heat equivalent to the hysteresis loop loss. The heated body 108 converts the AC magnetic field from the induction coil 114 into heat as the hysteresis loop loss. For example, an alternating current of about 100 kHz is used. In order to prevent the vacuum container (such as the vacuum container 102) of each embodiment from blocking the AC magnetic field, an electrical insulator such as glass is used as the material of the vacuum container. When a metal is used as the material of the vacuum container, a vacuum container having a structure that is sufficiently thinner than the thickness of the skin is used.

[0129] If we consider that when the temperature of the magnetic body is higher than the Curie temperature, the property of the magnetic body becomes paramagnetic, and when the temperature of the magnetic body is lower than the Curie temperature, the property of the magnetic body becomes ferromagnetic, then the situation in which energy can be transferred from the induction coil to the heated body refers to the situation in which the temperature of the magnetic body is below the Curie temperature. Therefore, the upper limit temperature of the heated body is the Curie temperature. Therefore, if a magnetic body having a Curie temperature consistent with the target temperature of the sample is used as the heated body, the result is that the temperature of the sample and the nozzle becomes the target temperature or a temperature close to the target temperature. In other words, a magnetic body having a Curie temperature determined based on the target temperature of the sample is used as the heated body.

[0130] exist Figure 5B In the example shown, except Figure 5A In addition to the structure shown, a magnetic circuit 108a formed of a yoke is used. The magnetic flux emitted from the induction coil 114 is bound by the magnetic circuit 108a. As a result, magnetic energy is efficiently transmitted to the heated object 108.

[0131] exist Figure 5C In the example shown, the heated body 108 is a high-frequency resistor. As the high-frequency resistor, copper is used, for example. The heated body 108 composed of the high-frequency resistor receives the high-frequency wave irradiated from the induction coil 114, generates eddy current on the surface of the heated body 108, and converts the loss of the eddy current into heat. For example, a high frequency of 10 MHz or the like is used. In order to prevent the vacuum container (for example, the vacuum container 102) of each embodiment from blocking the alternating magnetic field, an electrical insulator such as glass is used as the material of the vacuum container. In the case of using metal as the material of the vacuum container, a vacuum container having a structure that is sufficiently thinner than the thickness of the skin is used.

[0132] exist Figure 5D In addition to Figure 5C In addition to the structure shown, a high-frequency magnetic shield 108b is used. The surface of the heated body 108 facing the induction coil 114 is not covered by the high-frequency magnetic shield 108b, and the other surfaces are covered by the high-frequency magnetic shield 108b. The high-frequency waves irradiated from the induction coil 114 are blocked by the high-frequency magnetic shield 108b, and the high-frequency resistor close to the high-frequency magnetic shield 108b is efficiently heated by the blocked high-frequency magnetic field.

[0133] exist Figure 5EIn the example shown, the heated body 108 is a resistor included in the LC resonator (tank circuit). The AC magnetic field generates an AC current in the LC resonator as a secondary circuit via a coil. As a result, Joule heat is generated in the heated body 108 on the secondary circuit. The LC resonator has a resonant frequency determined by the secondary coil and the capacitor. The frequency of the oscillator on the primary coil side is made consistent with the resonant frequency. As a result, the LC resonator resonates and a large current can efficiently flow to the heated body 108. In order to prevent the vacuum container (for example, the vacuum container 102) of each embodiment from blocking the AC magnetic field, an electrical insulator such as glass is used as the material of the vacuum container. When a metal is used as the material of the vacuum container, a vacuum container having a structure that is sufficiently thinner than the thickness of the skin is used.

[0134] As in Figure 5A The power source used in the configuration shown may be, for example, a power source used in an IH cooking appliance, etc. As the frequency band, for example, an LF band of 100 kHz is used.

[0135] As in Figure 5E The power source used in the structure shown can be, for example, a power source for wireless charging used in portable terminals such as smartphones and mobile phones. For example, a technology using an AC magnetic field in the frequency band of 100kHz to 200kHz can be used (for example, U.S. Patent Application Publication No. 2021 / 044132).

[0136] According to the first to third embodiments described above, energy can be supplied to the heated object wirelessly, so a terminal for heating is not required. In addition, the induction coil disposed outside the vacuum container (atmospheric side) does not generate heat itself, so the structure disposed on the atmospheric side can be safely used.

[0137] In addition, since energy can be supplied to a local portion, heat insulation is easy and a simple structure can be used as the structure of the container.

[0138] In the wireless dielectric heating method of the embodiment, the nozzle, the sample, and the heated object become the objects of operation, and only the individual can be heated locally. In addition, the process of setting the individual becomes simple. For example, as long as the position and direction of the nozzle are paid attention to, the atomic beam generating device can be fixed to the vacuum part in the physical package. The individual can be disassembled or installed according to each individual, so the operation of taking out and putting in the sample is simple.

[0139] In contrast, in the wired resistance heating method of the prior art, it is necessary to consider the situation that the heater is connected to the connector through wiring. Since it is a wired heating method, the resistance wire generates heat as a whole. In an ultra-high vacuum environment, the wiring operation of the wiring heated to a high temperature generally uses a crimping terminal. In the case of using a crimping terminal, etc., it cannot be said that local energy transfer is achieved. In addition, in the wired heating method, it will cause the design difficulties described below.

[0140] In order to suppress the unnecessary heat generation as much as possible, the wire of the heater should be shortened. On the other hand, for heat insulation, the length of the heat insulator connecting the high temperature part and the room temperature part should be lengthened. Thus, the conditions for improving the effect of suppressing heat generation and the conditions for improving the effect of heat insulation are opposite. Therefore, it is difficult to satisfy these two conditions at the same time in the wired heating method.

[0141] In addition, in order to suppress unnecessary heat as much as possible, the wire of the heater installed near the nozzle should be shortened. On the other hand, in order to facilitate the operation of taking out and putting in the sample, a space should be ensured around the sample insertion port of the sample container. In this way, the conditions for improving the effect of suppressing heat and the conditions for facilitating the taking out and putting in of the sample are opposite. Therefore, it is difficult to meet these two conditions at the same time in the wired heating method.

[0142] Furthermore, according to the first to third embodiments, even if the atomic beam generating device is not modularized, it is easy to assemble it into a device such as an atomic clock. Furthermore, according to the third embodiment, the flange can be omitted.

[0143] When focusing on the flow of atoms in a physical package, the atomic beam generating device is generally located at the most upstream. Therefore, examples of setting an atomic beam generating device at the end of the physical package body can be seen everywhere. Among them, there are many examples in which a flange is set at the end of the physical package body, and a modular atomic beam generating device is inserted into the body through the hole of the flange, and vacuum shielding is achieved by the flange. In an atomic beam generating device using a wired heating method, such a structure has to be adopted from the perspective of the operability of taking out and putting in the sample, the thermal contact between the heater and the sample or the nozzle, and the method of assembling the connector to the flange. However, miniaturization of the device becomes difficult.

[0144] On the other hand, in the first to third embodiments, the atomic beam generating device is formed by mounting the sample, the heated object, the heat insulating member, etc. from the rear stage side of the physical package.

[0145] In addition, in the first to third embodiments, a window for passing infrared light may be provided in a part of the vacuum container, and a sensor for detecting infrared light may be provided outside the vacuum container. By detecting infrared light, the temperature inside the vacuum container can be measured. For example, infrared light emitted from a heated object, a sample, and a nozzle is released to the outside of the vacuum container through a window and detected by a sensor. Thus, the temperature of the heated object, the sample, and the nozzle can be measured. By controlling the current supplied to the induction coil according to the measured temperature, the temperature of the sample and the nozzle can be controlled. For example, the temperature of the sample and the nozzle can be made to be a target temperature.

[0146] Hereinafter, the atomic beam generating apparatuses of the first to third embodiments are compared with an atomic beam generating apparatus using a conventional heating method. Conventional heating methods include Joule heat method, laser method, and electric field emission method.

[0147] An atomic beam furnace using Joule heat is described in CB Lucas, "Atomic and Molecular Beams: Production and Collimation", 2013, CRC press. When Joule heat is applied to a sample and the sample is heated to a temperature higher than the sublimation temperature, evaporated atoms are released from the sample.

[0148] According to the first to third embodiments, compared with the device using the Joule heat method, it is suitable for miniaturization and weight reduction of the atomic beam generating device. In addition, according to the first to third embodiments, local heating can be performed, and the sample can be heated efficiently. In addition, temperature management is easy.

[0149] In addition, U.S. Patent No. 10342113 describes an atomic beam furnace using lasers. In this device, laser light is irradiated on a sample, and the portion irradiated with the laser light is heated. As a result, atoms evaporate. Alternatively, the molecular bonds of the sample compound are dissociated, and molecules with broken bonds are released.

[0150] US Patent No. 10342113 describes the use of a metal containing a target atom as a raw material. Alternatively, it is described that the surface of a metal containing a target atom may be oxidized and an oxide containing the target atom may be used as a raw material.

[0151] Phys. Rev. A 76, 055403 (DR Leibrandt et al.) describes the use of SrTiO 3 as a strontium ion source.

[0152] In the laser method, atoms can be sublimated or dissociated wirelessly through an optical window. This property is the same as the induction heating method, and it can be expected that the device can be miniaturized and the energy transfer can be more efficient. On the other hand, in the laser method, since a highly directional laser is used, alignment adjustment of optical components is required. In addition, it is necessary to note that the transfer of energy depends on the state of the surface of the sample. For example, the surface of the sample is flat right after it is used, and even if its optical properties are good, the surface will be eroded and the optical properties will deteriorate with use. In this case, it is predicted that the flux of the atomic beam will deteriorate over time.

[0153] In addition, as described in Phys. Rev. A 76, 055403 (DR Leibrandt et al), the small amount of ion flux obtained by μm-sized spot irradiation may fully meet the requirements in an atomic clock using the single ion trap method, but it does not meet the requirements in devices such as optical lattice clocks that require a certain degree of flux.

[0154] An atomic beam furnace using an electric field emission method is described in U.S. Patent Application Publication No. 2021 / 257177. In the electric field emission method, a strong electric field is applied to the sample, and neutral atoms are released from the sample in addition to ions. Neutral atoms with a desired energy level and ions with energy levels different therefrom are distinguished, for example, by an electric field. As a result, not only ions but also neutral atoms can be selectively emitted.

[0155] However, although the electric field emission method is suitable for ion beams, it is not necessarily suitable for neutral atom beams.

[0156] In addition, in U.S. Patent No. 7955551, it is recorded that in view of the fact that a commercially available distributor releases a large amount of impurity gas when in use, a receiver for absorbing impurity gas is set around the distributor. As the heating method of the distributor, resistance heating method, induction heating method and laser method can be cited. As the induction heating method, a method of heating the sample by generating eddy current in the sample through the action from the induction coil is adopted. However, the structure recorded in the document cannot be said to be suitable for the atomic beam generating device for the versatility of the sample that requires the directivity of the atomic beam, the flow rate of the controlled atomic beam, the operability of taking out and putting in the sample, and the sample that may not be able to directly feel the alternating magnetic field. In addition, the amount of eddy current generated in the sample depends on the total surface area and surface roughness of the sample. Whenever evaporated atoms are released from the sample, the volume of the sample decreases and the surface of the sample becomes rough. Therefore, the heat transfer brought about by induction heating may deteriorate over time.

[0157] In contrast, according to the first to third embodiments, the sample is heated by supplying magnetic energy to the heated body instead of generating eddy current in the sample. The heating of the sample does not depend on the surface area or surface roughness of the sample, so the heat transfer amount does not deteriorate over time.

[0158] <Specific example of the first embodiment>

[0159] Below, refer to FIG. 6A to FIG. 6D A specific example of the first embodiment will be described. FIG. 6A to FIG. 6D It is a perspective view showing the structure of a specific example of the first embodiment. FIG. 6A to FIG. 6D The composition shown is Figure 2 A specific example of the configuration shown.

[0160] Fig. 6A The appearance of the sample container 104, the nozzle 106, the heat insulating member 112, and the flange 116 are shown.

[0161] The heat insulating member 112 extends from the flange 116 to the sample container 104 to support the sample container 104. To suppress heat conduction, the cross-sectional area of ​​the heat insulating member 112 is reduced, and a plurality of slits 112a are formed in the heat insulating member 112 along the direction in which the heat insulating member 112 extends.

[0162] In order to prevent the magnetic field from leaking to the subsequent stage of the device (that is, the direction in which the atomic beam travels), the electromagnetic shielding member 124 is provided between the sample container 104 and the flange 116. For example, the electromagnetic shielding member 124 is provided near the front end of the nozzle 106. In addition, the electromagnetic shielding member 124 may also have the function of blocking the heat radiation from the sample container 104 and the nozzle 106. For example, the electromagnetic shielding member 124 may also have the function of blocking the heat from being transferred to the subsequent stage of the device through the heat radiation.

[0163] The sample container 104 has an insertion port 104a formed on the opposite side of the nozzle 106. The sample 118 is inserted into the sample container 104 through the insertion port 104a, or is taken out of the sample container 104 to the outside. A screw groove is formed along the side of the insertion port 104a so that the cover 110 can be screwed to the insertion port 104a. For example, the nozzle 106 is pressed into the sample container 104.

[0164] Figure 6B Further, a heated body 108 and a cover 110 are shown. The heated body 108 is provided, for example, in contact with the sample container 104 and surrounds the nozzle 106. For example, the heated body 108 is crimped by a clamp. Here, as an example, the heated body 108 is a magnetic body. In addition, the cover 110 is provided on the sample container 104, and the insertion port 104a is closed by the cover 110.

[0165] Figure 6CThe vacuum container 102 is further shown. The vacuum container 102 is fixed to the flange 116 so as to cover the sample container 104, the nozzle, the heated body 108, the cover 110, and the heat insulating member 112. Here, as an example, glass is used as an example of a material that transmits an electromagnetic field as the material of the vacuum container 102. The vacuum container 102 is maintained in a vacuum state.

[0166] Fig.6D The induction coil 114 is further shown. The induction coil 114 is provided at a position close to the heated object 108 outside the vacuum container 102 (that is, the atmosphere side). For example, the induction coil 114 is a solenoid coil, and is provided outside the vacuum container 102 in a manner surrounding the heated object 108. The induction coil 114 wirelessly transmits an alternating magnetic field of 100 kHz to the heated object 108 made of a magnetic body.

[0167] Furthermore, in order to converge the AC magnetic flux emitted from the induction coil 114 and guide it to the heated object 108 , a soft magnet with low hysteresis loss and high magnetic permeability may be provided between the induction coil 114 and the heated object 108 .

[0168] Figure 7 and Figure 8 The physical package 130 of the first embodiment is shown. Figure 7 is a diagram showing the appearance of the physical package 130 . Figure 8 2 is a cross-sectional view showing the physics package 130 , which is a cross-sectional view taken along a plane including the axis of the atomic beam.

[0169] The physics package 130 includes the atomic beam generating device 100 of the first embodiment, a Zeeman slowdown device 126 , and a magneto-optical trap device (MOT device) 128 , and realizes magneto-optical trap and clock transition.

[0170] The Zeeman slowdown device 126 includes a bore 126a and a magnetic field generator 126b. The magnetic field generator 126b includes, for example, a solenoid coil, which generates a magnetic field along the central axis of the bore 126a. The atomic beam emitted by the atomic beam generating device 100 is irradiated into the bore 126a. The Zeeman slowdown device 126 uses the Zeeman slowdown method to slow down the speed of the atomic beam with a large initial velocity emitted from the atomic beam generating device 100 to a speed that can be captured by the subsequent magneto-optical trap device 128. The high-temperature atomic beam is slowed down according to the Zeeman slowdown method while traveling toward the magneto-optical trap device 128 in the bore 126a. As the Zeeman slowdown device 126, a well-known Zeeman slowdown device is used.

[0171] The magneto-optical trap device 128 includes a vacuum chamber, a magnetic field generating device, and a plurality of optical elements (such as a mirror, a beam splitter, etc.). The vacuum chamber is maintained at an ultra-high vacuum. The interior of the vacuum chamber is connected to the bore 126a of the Zeeman reducer 126 and the vacuum container 102 of the atomic beam generating device 100, and the bore 126a and the vacuum container 102 are maintained at an ultra-high vacuum. In the vacuum chamber, a capture space for capturing atoms is formed.

[0172] Here, the operation of the physical package 130 will be described.

[0173] The interior of the vacuum chamber is evacuated in the physics package 130. The atomic beam emitted from the atomic beam generating device 100 to the Zeeman slowdown device 126 is sufficiently slowed down according to the Zeeman slowdown method and reaches the magneto-optical trap device 128.

[0174] In the magneto-optical trap device 128, a magnetic field with a linear spatial gradient is formed with the capture space for capturing atoms as the center, and MOT light is irradiated. Thus, atoms are captured in the capture space. The low-speed atomic beam that arrives at the magneto-optical trap device 128 is decelerated in the capture space, and thus, the atomic group is captured in the capture space. In addition, the optical lattice beam is incident on the capture space and is reflected by the optical resonator arranged in the vacuum cavity, thereby forming an optical lattice potential formed by standing waves extending in the direction of travel of the optical lattice beam. The atomic group is captured by the optical lattice potential.

[0175] By slightly changing the wavelength, the optical lattice can be moved in the direction of the optical lattice beam. The atomic group is moved to the clock transition spectroscopic region by the moving unit formed by the moving optical lattice. As a result, the clock transition space is deviated from the beam axis of the low-speed atomic beam.

[0176] In the clock transition space, the atoms are irradiated with a frequency-controlled laser to perform high-precision spectrometry of the clock transition (i.e., the resonant transition of the atoms that serve as the reference of the clock) to measure the inherent and unchanging frequency of the atoms. Thus, an accurate atomic clock is achieved. In addition, spectrometry can also be performed in the capture space without moving the atomic group from the capture space to the clock transition space.

[0177] In order to improve the accuracy of atomic clocks, it is necessary to eliminate the disturbances surrounding the atoms and accurately read the frequency. It is particularly important to remove the frequency shift caused by the Doppler effect caused by the thermal motion of the atoms. In an optical lattice clock, the atoms are confined in a space that is sufficiently small compared to the wavelength of the clock laser by using an optical lattice generated by the interference of lasers to freeze the movement of the atoms. On the other hand, within the optical lattice, the frequency of the atoms will shift due to the laser that forms the optical lattice. Therefore, by selecting a specific wavelength and frequency called the "magic wavelength" or "magic frequency" as the optical lattice beam, the influence of the optical lattice on the resonant frequency can be eliminated.

[0178] As a result of the clock transition, the emitted light is received by the optical system device 14 and subjected to spectroscopic processing by the control device 16 to determine the frequency.

[0179] <Specific example of the second embodiment>

[0180] Below, refer to Fig.9A and Fig. 9B A specific example of the second embodiment will be described. Fig.9A and Fig. 9B It is a perspective view showing the structure of a specific example of the second embodiment. Fig.9A and Fig. 9B The composition shown is Figure 3 A specific example of the configuration shown.

[0181] Fig.9A The sample container 204 , the heated body 208 , and the flange 222 are shown. Fig. 9B The sample container 204 , the heated body 208 , the induction coil 214 , the flange 216 , the window 220 , and the flange 222 are shown.

[0182] Here, as an example, the heated body 208 is a magnetic body. In addition, the induction coil 214 is a flat spiral coil.

[0183] The heated body 208 includes heated body portions 208a to 208d. The heated body portion 208a is disposed at a position opposite to the induction coil 214 across the window 220 provided on the flange 216. The heated body portion 208b is disposed at a position on the opposite side of the heated body portion 208a across the sample container 204. The heated body portion 208b is disposed in contact with the nozzle 206. The heated body portions 208c and 208d are components connecting the heated body portion 208a and the heated body portion 208b, and are disposed along the sample container 204. In this way, in the second embodiment, the sample container 204 is covered by the heated body 208. The entire sample container 204 may be covered by the heated body 208, or the heated body 208 may be partially covered by the heated body 208. Fig. 9BAs shown, a portion of the sample container 204 is covered by the heated body 208. The heated body portion 208a facing the induction coil 214 receives magnetic energy from the induction coil 214. Since the heated body portion 208a is connected to the heated body portions 208b, 208c, and 208d, the entire heated body 208 is heated.

[0184] A space is formed between the heated body portion 208a and the induction coil 214, and there is a distance between the heated body portion 208a and the induction coil 214. In order to converge the AC magnetic flux emitted from the induction coil 214 and induce it to the heated body 208, a soft magnet with low hysteresis loss and high magnetic permeability may be provided between the induction coil 214 and the heated body portion 208a.

[0185] Fig.10 A physical package 230 according to the second embodiment is shown. Fig.10 2 is a cross-sectional view showing the physics package 230 , which is a cross-sectional view taken along a plane including the axis of the atomic beam.

[0186] The physics package 230 includes the atomic beam generating device 200 of the second embodiment, a Zeeman slowdown device 226, and a magneto-optical trap device 228. The Zeeman slowdown device 226 includes a bore 226a and a magnetic field generator 226b, similar to the Zeeman slowdown device 126 of the first embodiment. Fig.10 In the example shown, a vacuum container is formed by a flange 222 and the like, and the atomic beam generating device 200 is disposed in the vacuum container.

[0187] <Specific example of the third embodiment>

[0188] Below, refer to Fig.11 , Fig.12 , Fig.13A as well as Fig. 13B A specific example of the third embodiment will be described. Fig.11 It is a perspective view showing the appearance of a physical package according to the third embodiment. Fig.12 It is a cross-sectional view showing the structure of a specific example of the third embodiment. Fig.13A and Fig. 13B It is a diagram showing the configuration of a specific example of the third embodiment.

[0189] like Fig.11 As shown, the physics package 330 includes the atomic beam generating device 300 of the third embodiment, a Zeeman slowdown device 326, and a magneto-optical trap device 328. The Zeeman slowdown device 326 includes a bore and a magnetic field generator 326b (not shown), similar to the Zeeman slowdown device 126 of the first embodiment.

[0190] like Fig.12As shown, the nozzle 306 , the heated body 308 a , and the cover 310 are supported by a heat insulating member 312 from the Zeeman reducer 326 side as a subsequent structure of the physical package 330 , and are disposed in the vacuum container 302 .

[0191] The heated body 308a is mounted on the front end of the heat insulating member 312. As an example, the heated body 308a is a magnetic body. Fig.12 In the example shown, the heated body 308a has both Figure 4 The sample container 304 and the heated body 308 shown in the figure have the functions of both sides. That is, a sample chamber 304a as a space is formed in the heated body 308a, and a sample 318 is stored in the sample chamber 304a. The nozzle 306 and the cover 310 are provided on the heated body 308a. The space in the nozzle 306 is communicated with the sample chamber 304a. The cover 310 is a member that covers the opening of the sample chamber 304a (the opening for taking out the sample from the sample chamber 304a and putting the sample into the sample chamber 304a) at a position on the side opposite to the nozzle 306 across the sample chamber 304a.

[0192] The heat insulating member 312 has a cylindrical shape and has a cavity inside for passing the atomic beam emitted from the nozzle 306. The atomic beam emitted from the nozzle 306 travels through the heat insulating member 312 toward the subsequent Zeeman reducer 326. The heat insulating member 312 is provided in a vacuum in the physics package 330.

[0193] The induction coil 314 is provided outside the vacuum container 302 (that is, on the atmosphere side) so as to surround the heated object 308 a .

[0194] Fig.13A The state before the heat insulating member 312 is installed in the vacuum container 302 is shown. Fig.13A The components of the atomic beam generating device 300 and the magneto-optical trap device 328 are shown, but the Zeeman slowdown device 326 is omitted.

[0195] The vacuum container 302 is, for example, an elongated cylindrical member, and is extended from the magneto-optical trap device 328. The front end of the vacuum container 302 (the front end corresponding to the position where the induction coil 314 is provided) is closed, and the rear end opposite to the front end is open. At the front end of the vacuum container 302, the induction coil 314 is wound around the outside of the vacuum container 302.

[0196] A heated body 308a is mounted at the front end of the heat insulating member 312. A sample 318 is stored in the sample chamber 304a, and the opening of the sample chamber 304a is closed by a cover 310. In this state, the heat insulating member 312 is inserted into the vacuum container 302 from the rear side of the physical package 330 (for example, the magneto-optical trap device 328 side) with the heated body 308a as the front end. Specifically, the heat insulating member 312 is inserted into the vacuum container 302 from the rear end of the vacuum container 302. For example, the heat insulating member 312 is assembled to the structure of the rear side of the physical package 330 (for example, the magneto-optical trap device 328, etc.) by fasteners such as screws.

[0197] Fig. 13B The heat insulating member 312 is shown after being installed in the vacuum container 302. The heated object 308a installed at the front end of the heat insulating member 312 is installed at the front end of the vacuum container 302. Thus, the heated object 308a is installed at a position corresponding to the induction coil 314.

[0198] Fig.14 The results of an experiment using the atomic beam generating apparatus 300 according to the third embodiment are shown. The horizontal axis shows time, and the vertical axis shows the temperature of the magnetic body as the heated body.

[0199] The vacuum container 302 is maintained in a vacuum state, and an alternating current (e.g., 2.0 [A], at which the power applied to the induction coil 314 is 5.3 [W]) is supplied to the induction coil 314. When the current is passed through the induction coil 314, the temperature of the magnetic body, which is the heated body set in the vacuum, reaches 700.5 [K]. The time constant is 13 seconds. If strontium is used as a sample as an atomic source, the temperature of the heated body exceeds the sublimation temperature of the sample in the vacuum, and sufficient heat is obtained.

[0200] <Atomic beam generating device according to fourth embodiment>

[0201] Below, refer to FIG. 15A to FIG. 15E An atomic beam generating device 400 according to a fourth embodiment will be described. Fig.15A and Fig. 15B It is a perspective view showing the structure of the atomic beam generating device 400 . Fig. 15C and Fig.15D It is a perspective view showing a heat insulating member 412a and a heated body 408 according to the fourth embodiment. Fig.15E is a cross-sectional view showing the atomic beam generating device 400 .

[0202] The vacuum container 402 is a cylindrical container, the front end of which is closed and the rear end is open. A flange 416 is provided at the rear end. The heated object 408 and the heat insulating member 412a are inserted into the vacuum container 402 from the rear end of the vacuum container 402.

[0203] The heated body 408 has a cylindrical shape, and a sample chamber as a space is formed inside the heated body 408. The sample as an atomic source is stored in the sample chamber. The heated body 408 may also have the same structure as the heated body 308a of the third embodiment. An induction coil 414 is wound at a position corresponding to the heated body 408 outside the vacuum container 402 (atmosphere side).

[0204] like Fig. 15C and Fig.15D As shown, a plurality of heat insulating members 412a are arranged in a manner to surround the heated body 408 forming the sample chamber. Each heat insulating member 412a is, for example, a rod-shaped member. For example, three heat insulating members 412a are arranged at equal intervals in a manner to surround the heated body 408. Each heat insulating member 412a is extended from the front end side of the vacuum container 402 to the flange 416. A base 412b is provided at one end of the heated body 408 (one end of the front end side of the vacuum container 402). One end of each heat insulating member 412a is assembled to the base 412b, and each heat insulating member 412a is extended to the flange 416. In addition, the number of heat insulating members 412a is only an example, and more than three heat insulating members 412a may be provided, or one or two heat insulating members 412a may be provided.

[0205] The object to be heated and the sample container may be separately configured, and a plurality of heat insulating members 412a may be arranged so as to surround the object to be heated and the sample container.

[0206] <Atomic beam generating device according to the fifth embodiment>

[0207] Below, refer to FIG. 16A to FIG. 16E An atomic beam generating device 500 according to a fifth embodiment will be described. Fig.16A and Fig. 16B It is a perspective view showing the structure of the atomic beam generating device 500 . Fig. 16C and Fig.16D It is a perspective view showing a heat insulating member 512a and a heated body 508 according to the fifth embodiment. Fig.15E 2 is a cross-sectional view showing the atomic beam generating device 500 .

[0208] The vacuum container 502 is a cylindrical container, the front end of which is closed and the rear end is open. A flange 516 is provided at the rear end. The heated object 508 and the heat insulating member 512a are inserted into the vacuum container 502 from the rear end of the vacuum container 502.

[0209] The heated body 508 includes a heated body portion 508a and a plurality of heated body portions 508b. The heated body portion 508a has a cylindrical shape, and a sample chamber as a space is formed inside the heated body portion 508a. The sample is stored in the sample chamber. A plurality of heated body portions 508b (for example, three heated body portions 508b) are arranged on the side of the heated body portion 508a at intervals from each other in the circumferential direction of the heated body portion 508a. On the outside (atmosphere side) of the vacuum container 602, a plurality of induction coils 514 are arranged at positions corresponding to the heated body 508. For example, an induction coil 514 is arranged at a position corresponding to each heated body portion 508b. The heated body portion 508b receives magnetic energy from the induction coil 514 corresponding to itself and is heated, and as a result, the heated body portion 508a is heated. The surface opposite to the induction coil 514 in the heated body portion 508b is formed larger so as to efficiently receive magnetic energy from the induction coil 514. For example, the heated body portion 508 b is formed so that the width of the heated body portion 508 b in the circumferential direction increases as it becomes farther away from the heated body portion 508 a .

[0210] like Fig. 16C and Fig.16D As shown, a plurality of heat insulating members 512a are arranged in a manner to surround the heated body portion 508a. For example, a heat insulating member 512a is arranged between a heated body portion 508b and an adjacent heated body portion 508b. The heat insulating member 512a is the same member as the heat insulating member 412a of the fourth embodiment. Similar to the fourth embodiment, a base 512b is arranged at one end of the heat insulating member 512a (the end on the front end side of the vacuum container 502). One end of each heat insulating member 512a is assembled to the base 512b, and each heat insulating member 512a is extended to the flange 516. In addition, Fig. 16C and Fig.16D Although three heat insulating members 512a are shown, this number is only an example as in the fourth embodiment.

[0211] <Atomic beam generating device according to the sixth embodiment>

[0212] Below, refer to FIG. 17A to FIG. 17E An atomic beam generating device 600 according to the sixth embodiment will be described. Fig.17A and Fig. 17B It is a perspective view showing the structure of the atomic beam generating device 600 . Fig. 17C and Fig.17D It is a perspective view showing a heat insulating member 612a and a heated body 608 according to the sixth embodiment. Fig.17E is a cross-sectional view showing the atomic beam generating device 600 .

[0213] The vacuum container 602 is a cylindrical container with a closed front end and an open rear end. A flange 616 is provided at the rear end. The sample container 604, the heated body 608, and the heat insulating member 612a are inserted into the vacuum container 602 from the rear end side.

[0214] The sample container 604 has a cylindrical shape and contains a sample therein. The heated body 608 has a spiral shape and is wound around the sample container 604. An induction coil 614 is wound at a position corresponding to the heated body 608 outside the vacuum container 602 (atmosphere side).

[0215] like Fig. 17C and Fig.17D As shown, a plurality of heat insulating members 612a are provided in a manner to surround the sample container 604 and the heated body 608. The heat insulating member 612a is the same member as the heat insulating member 412a of the fourth embodiment. As in the fourth embodiment, a base 612b is provided at one end of the heated body 608 (the end on the front end side of the vacuum container 602). One end of each heat insulating member 612a is assembled to the base 612b, and each heat insulating member 612a is extended to the flange 616. In addition, Fig. 17C and Fig.17D Although three heat insulating members 612a are shown, this number is only an example as in the fourth embodiment.

[0216] <Atomic beam generating device according to seventh embodiment>

[0217] Below, refer to Fig.18 An atomic beam generating device 700 according to the seventh embodiment will be described. Fig.18 1 is a diagram schematically showing the configuration of an atomic beam generating device 700 according to the seventh embodiment. In the seventh embodiment, a sample is heated by supplying light to a heated object.

[0218] The atomic beam generating device 700 includes a vacuum container 702 , a sample container 704 , a nozzle 706 , a heated object 708 , a radiation shield 710 , a heat insulating member 712 , and a light source 720 .

[0219] A sample container 704, a nozzle 706, a heated body 708, a radiation shield 710, and a heat insulating member 712 are stored in the vacuum container 702. A sample 714 as an atomic source is stored in the sample container 704. The sample 714 is the same as the sample in each of the above-mentioned embodiments.

[0220] The sample container 704 , the nozzle 706 , and the heat insulating member 712 have the same configuration as those of the above-described embodiments. The radiation shield 710 is provided so as to cover the sample container 704 and the nozzle 706 .

[0221] A heated body 708 is provided on the end surface of the sample container 704 on the side opposite to the end surface on which the nozzle 706 is provided. The heated body 708 is a member that functions as a thermo-optical converter that absorbs light and converts the light into heat. For example, the heated body 708 is formed by applying a light absorbing coating to the end surface of the sample container 704. As an example of the light absorbing coating, black plating can be cited. Specifically, a low-reflection plating film that suppresses the reflection of light and makes the reflectivity of the laser light 718 below a certain value (for example, below 1%) is used as the heated body 708.

[0222] The sample container 704 has a columnar shape such as a cylinder. Its diameter DH is larger than the diameter DL of the laser 718. For example, its diameter DH is The length LH is about 10 mm, but is not limited to these values.

[0223] The vacuum container 702 is provided with a vacuum window 716 at a position opposite to the object to be heated 708. The laser light 718 emitted from the light source 720 passes through the vacuum window 716 and irradiates the object to be heated 708. The radiation shield 710 is provided with an opening 710a at a position corresponding to the object to be heated 708. The laser light 718 passing through the vacuum window 716 irradiates the object to be heated 708 through the opening 710a.

[0224] The light source 720 is an example of a wireless supply unit, and is disposed outside the atomic beam generating device 700 (that is, on the atmospheric side). For example, the diameter DL of the laser 718 is The optical power P is about 5 W. Of course, the characteristics of the laser 718 are not limited to these. As an example of the light source 720, a semiconductor laser diode (for example, a wavelength of 915 nm and an optical power of 10 W) is used, but the light source 720 is not limited to this.

[0225] Next, the operation of the atomic beam generating device 700 according to the seventh embodiment will be described.

[0226] The laser light 718 emitted from the light source 720 passes through the vacuum window 716 and irradiates the heated object 708. The laser light 718 irradiated to the heated object 708 is converted into heat by the heated object 708. The heat generated from the heated object 708 is transferred to the sample container 704. As a result, the sample 714 contained in the sample container 704 is heated to generate atomic gas. The atomic gas passes through the nozzle 706 and is emitted as a directional atomic beam.

[0227] exist Fig.18In the example shown, the heated body 708 is provided on the surface on the opposite side to the nozzle 706 that emits the atomic beam. In addition, the diameter DH of the sample container 704 is larger than the diameter DL of the laser light 718. By adopting such an arrangement and dimensions, the laser light 718 that has traveled to the vacuum container 702 via the vacuum window 716 can be prevented from traveling to a subsequent device that is provided in front of the nozzle 706. For example, the laser light 718 can be prevented from traveling to a subsequent device by diffraction.

[0228] As another example of the heated body 708, in order to absorb light having a specific wavelength range, a fine structure having a size having the wavelength may be formed on the surface of the sample container 704. In this case, laser light having the specific wavelength range is used as the laser light 718. As another example, a device having the fine structure may be provided on the surface of the sample container 704.

[0229] Furthermore, by using the vacuum window 716 through which infrared rays pass, the temperature of the sample container 704 can be measured by detecting the infrared rays that have passed through the vacuum window 716 .

[0230] In addition, as a prior art, an atomic furnace using LIAD (Light-induced atomic desorption) is known (for example, U.S. Patent No. 10342113 and U.S. Patent Application Publication No. 2020 / 0335320). These devices have the following disadvantages 1 and 2.

[0231] Disadvantage 1

[0232] In these conventional devices, the ablation laser is directly irradiated onto the sample surface. Therefore, when the ablation laser is continuously irradiated onto the sample surface for a long time, the optical properties of the sample surface change due to erosion, etc., and the dissociation rate of the atomic gas decreases. To address this problem, it is possible to change the irradiation position of the ablation laser and continue irradiating the laser, but this cannot eliminate the problem of sustainability.

[0233] Disadvantage 2

[0234] In addition, in the device described in the publication of U.S. Patent Application No. 2020 / 0335320, in principle, the incidence of the ablation laser and the emission of the atomic gas are performed through the same opening. Therefore, it is difficult to introduce a structure that efficiently collimates the atomic gas. Although it is possible to consider emitting the atomic gas from the end face on the opposite side of the end face where the ablation laser is incident, in this case, it is difficult to prevent the ablation laser from leaking to the subsequent device at the destination where the atomic beam advances.

[0235] On the other hand, according to the atomic beam generating device 700 of the seventh embodiment, the above-mentioned disadvantages 1 and 2 are solved.

[0236] That is, regarding the disadvantage 1, in the seventh embodiment, the laser beam is irradiated to the heated body 708, but not directly to the sample 714. Thus, the change in the surface of the sample 714 does not affect the heat conversion efficiency of the heated body 708, and the heat conversion efficiency can be maintained.

[0237] Regarding the disadvantage 2, in the seventh embodiment, the irradiation position of the laser 718 and the emission position of the atomic beam are independent of each other, so the laser 718 can be prevented from traveling to the subsequent device by setting the diameter DL of the laser 718 to be less than the diameter DH of the sample container 704. In addition, it is easy to introduce a nozzle for collimating the atomic beam.

[0238] In the seventh embodiment, it is easy to improve the thermal insulation of the sample container 704, and the thermal efficiency of the heated body 708 is high. Therefore, even without using a high-power laser as the laser 718, atomic gas can be generated from the sample 714. For example, a medium-power laser may be used.

[0239] According to the atomic beam generating device of each embodiment described above, energy can be wirelessly transmitted from a wireless supply unit (e.g., an induction coil, a light source) disposed in the atmosphere to a heated object disposed in a vacuum. Therefore, it is not necessary to provide a vacuum-resistant terminal. By omitting the vacuum-resistant module, the atomic beam generating device can be miniaturized.

[0240] In addition, by providing a heated body, it is possible to locally heat an object placed in a vacuum. For example, it is possible to limit the heating to a part that is desired to be heated, such as a nozzle or a sample. In addition, by providing a heat insulating member, it is possible to make the heat generating part (for example, a heated body, a nozzle, a sample container, etc.) independent, thereby improving the heat insulating performance. In addition, since local heating can be performed, the surface area of ​​the heated part becomes smaller, and as a result, it is possible to suppress the release of gas and improve the characteristics of the vacuum.

[0241] In the prior art that uses a wired power supply unit to heat the sample, in principle, the physical package body and the atomic beam generating device need to be connected by at least two elements, namely, a structural support member and an electrical wiring. Considering the convenience of taking out and putting in the sample, in the prior art, it is preferred to provide a flange that can be removed from the physical package body, and to provide the structure of the atomic beam generating device on the flange. That is, it is preferred to provide at least one flange dedicated to the atomic beam generating device in the physical package.

[0242] In contrast, in the atomic beam generating device of the embodiment, since a wireless power supply unit is used, the electrical wiring required in the prior art is no longer required. Therefore, even if the convenience of taking out and putting in the sample is taken into consideration, it is sufficient to use a structure in which the structural support member and the sample are inserted from the flange of the device provided on the rear side of the atomic beam generating device. In other words, it is not necessary to provide a flange dedicated to the atomic beam generating device. As a result, the atomic beam generating device and the physical package can be miniaturized.

[0243] In addition, in the embodiment, since a magnetic body is used to heat the sample, the reached temperature can be managed by the Curie temperature of the magnetic body. A thermometer is not required, and accordingly, the atomic beam generating device can be miniaturized. In addition, even if a malfunction occurs with respect to the temperature control, since there is an upper limit of the temperature, highly reliable temperature management can be achieved. In addition, a window for transmitting infrared light can also be provided, and the temperature of the sample can be measured by measuring the infrared light.

[0244] In the above description, the optical lattice clock is cited as an example. However, if it is a person skilled in the art, the technology of each embodiment can also be applied to other than the optical lattice clock. Specifically, it can also be applied to an atomic clock other than the optical lattice clock or an atom interferometer as an interferometer using atoms. For example, a physical package for an atomic clock including an atomic beam generating device and a vacuum cavity of the embodiment, or a physical package for an atom interferometer can also be constituted. In addition, this embodiment can also be applied to various quantum information processing devices for atoms or ionized atoms. Quantum information processing equipment refers to a device that uses the quantum state of atoms or light for measurement, sensing and information processing. In addition to atomic clocks and atomic interferometers, magnetic field meters, electric field meters, quantum computers, quantum simulators, quantum repeaters, etc. can also be exemplified. In the physical packaging of quantum information processing equipment, by using the technology of the embodiment, miniaturization or portability can be achieved in the same way as the physical packaging of the optical lattice clock. In addition, it should be noted that in such a device, the clock transition space is sometimes not a space for the purpose of time measurement, but is only regarded as a space that causes clock transition spectroscopy.

[0245] In the above description, specific aspects are shown for easy understanding, but these are merely examples of implementation, and various other implementations are possible.

[0246] Description of Reference Numerals

[0247] 100 atomic beam device; 102 vacuum container; 104 sample container; 106 nozzle; 108 heated body; 110 cover; 112 heat insulating member; 114 induction coil; 118 sample.

Claims

1. An atomic beam generating device, characterized in that: Include: Vacuum container; A wireless supply unit, which is arranged outside the vacuum container and supplies energy in a wireless manner; A sample container, which is disposed in the vacuum container and contains an atomic source; a heated body disposed in the vacuum container and heated by the energy supplied from the wireless supply unit to heat the atomic source; and The nozzle is provided in the sample container and emits the atomic gas generated by heating the atomic source from the sample container.

2. The atomic beam generating device according to claim 1, characterized in that: The heated body is a magnetic body, The wireless supply unit supplies electric power to the heated object in a wireless manner.

3. The atomic beam generating device according to claim 2, characterized in that: The heated object is a magnetic body having a Curie temperature determined based on a target temperature of the atomic source.

4. The atomic beam generating device according to claim 1, characterized in that: The heated body is a high-frequency resistor. The wireless supply unit supplies electric power to the heated object in a wireless manner.

5. The atomic beam generating device according to claim 1, characterized in that: The heated body is a resistor included in the LC resonator. The wireless supply unit supplies electric power to the heated object in a wireless manner.

6. The atomic beam generating device according to claim 1, characterized in that: Also included is a heat insulating member for blocking heat transfer from the sample container.

7. The atomic beam generating device according to claim 6, characterized in that: The heat insulating member has a cylindrical shape and is disposed on the nozzle side of the sample container. The atomic gas emitted from the nozzle travels through the inside of the heat insulating member.

8. The atomic beam generating device according to claim 7, characterized in that: The sample container and the heat insulating member are integrated and inserted into the vacuum container.

9. The atomic beam generating device according to claim 6, characterized in that: Contains multiple insulation components, Each heat insulating member is a rod-shaped member and is provided to surround the sample container at intervals from each other.

10. The atomic beam generating device according to claim 1, characterized in that: The wireless supply unit is an induction coil.

11. The atomic beam generating device according to claim 1, characterized in that: The heated body is provided to surround the nozzle.

12. The atomic beam generating device according to claim 1, characterized in that: The heated body is a member that converts light into heat. The wireless supply unit irradiates light toward the heated object.

13. The atomic beam generating device according to claim 12, characterized in that: The heated body is provided on an end surface of the sample container opposite to the end surface on which the nozzle is provided. The size of the sample container is larger than the diameter of the light irradiated to the heated object.

14. A physical package, characterized in that: Include: The atomic beam generating device according to any one of claims 1 to 13; and A vacuum chamber enclosing the clock transition space of the configured atoms.

15. A physical package for an optical lattice clock, characterized in that: Comprising the physical package of claim 14.

16. A physical package for an atomic clock, characterized in that: Comprising the physical package of claim 14.

17. A physical package for an atomic interferometer, characterized in that: Comprising the physical package of claim 14.

18. A physical package for a quantum information processing device for atoms or ionized atoms, characterized in that: Comprising the physical package of claim 14.

19. A physical packaging system, characterized in that: Include: The physical package of claim 14; and A control device controls the actions of the physical package.

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