Performance testing device

Abstract

The invention relates to the technical field of server performance testing, and discloses a performance testing device which comprises a conveying mechanism, a vibrating mechanism, a heating mechanism and a testing mechanism. The conveying mechanism is provided with a testing groove; the vibration mechanism is arranged in the test groove; a to-be-tested board card is suitable for being placed on the vibration mechanism; the heating mechanism is arranged above the vibration mechanism and is suitable for carrying out temperature environment simulation on the board card to be tested; the testing mechanism is adjacent to the conveying mechanism; the to-be-tested board card is suitable for being pushed by the conveying mechanism to enter the testing mechanism; the testing mechanism is provided with a testing probe, and the testing probe is suitable for carrying out performance testing on the board card to be tested, the environment simulation can be provided for the performance testing of the board card to be tested, the testing effect is improved, the influence of the environment simulation on the testing probe is reduced, and the accuracy of the testing result is ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of server performance testing, and in particular to a performance testing device. Background Art

[0002] In order to ensure the continuous stability and reliability of server performance, it is crucial to conduct detailed performance testing of server motherboards and other boards before the server assembly process. At present, the testing process of server motherboards and other boards generally adopts direct probe contact to perform performance testing. Although this method is convenient, it ignores the potential impact of environmental factors on the performance of server motherboards and other boards to a certain extent, and fails to fully simulate the extreme conditions that server motherboards and other boards may encounter in the actual operating environment. Potential fault hazards are difficult to be discovered in time during the testing stage, which may pose risks to the long-term stable operation of the server. Summary of the invention

[0003] In view of this, the present invention provides a performance testing device to solve the problem that the performance test of server motherboards and other boards fails to fully simulate the extreme conditions that may be encountered in the actual operating environment, and potential fault hazards are difficult to be discovered in time during the detection stage.

[0004] The present invention provides a performance testing device, comprising a conveying mechanism, a vibrating mechanism, a heating mechanism and a testing mechanism; the conveying mechanism is provided with a testing slot; the vibrating mechanism is arranged in the testing slot; a board to be tested is suitable for being placed on the vibrating mechanism; a heating mechanism is installed above the vibrating mechanism, and is suitable for simulating the temperature environment of the board to be tested; the testing mechanism is arranged adjacent to the conveying mechanism; the board to be tested is suitable for entering the testing mechanism under the push of the conveying mechanism; a testing probe is provided on the testing mechanism, and the testing probe is suitable for performing a performance test on the board to be tested.

[0005] By setting up a vibration mechanism and a heating mechanism, the vibration environment and high temperature environment of the board to be tested can be simulated, and the performance of the board to be tested under different conditions can be evaluated more accurately. By constructing a test scenario close to the actual operating environment, the performance of the board to be tested can be comprehensively evaluated, thereby ensuring the accuracy of the performance evaluation and improving the comprehensiveness and accuracy of the performance test. Moreover, since the vibration mechanism is arranged in the test slot, the heating mechanism is installed above the vibration mechanism, and the test mechanism is arranged adjacent to the conveying mechanism, that is, the vibration mechanism and the heating mechanism are both arranged adjacent to the test mechanism, not only the independent environment simulation of the board to be tested is realized, but also the influence of temperature fluctuation or vibration interference on the performance of the test probe is effectively reduced by physically separating the environmental simulation from the test mechanism, thereby ensuring the accuracy of the performance test results of the board to be tested.

[0006] In an optional embodiment, the conveying mechanism includes a first driving component and a rotating disk, the rotating disk is provided with at least two test slots, and the at least two test slots are arranged in sequence around the circumference of the rotating disk; the rotating disk is arranged adjacent to the test mechanism and is connected to the first driving component, and under the drive of the first driving component, at least two test slots rotate to the test mechanism in sequence.

[0007] By setting up at least two test slots, when one test slot is performing environmental simulation and performance testing on a board to be tested, the other test slot can be used to install and pre-set the next board to be tested, making full preparations for subsequent tests, ensuring the continuity and smoothness of the test process, significantly reducing the test waiting time, and thus greatly improving the performance testing efficiency of the board to be tested.

[0008] In an optional embodiment, the vibration mechanism includes a containing box, a support frame, a support plate, a first power mechanism and a placement tray; the containing box is installed in the test slot; the support frame is fixed in the containing box; the support plate is movably connected to the support frame; the first power mechanism is fixedly connected to the support plate; the placement tray is installed on the top of the support plate, and the board to be tested is suitable for being placed in the placement tray.

[0009] By movably connecting the support plate and the support frame, the support plate is both stable and movable, which helps to achieve the vibration of the support plate under the action of the first power mechanism; and because the placement plate is installed on the top of the support plate, when the support plate vibrates under the action of the first power mechanism, the synchronous vibration of the placement plate can be achieved, thereby realizing the vibration environment simulation of the board to be tested in the placement plate.

[0010] In an optional embodiment, the support frame includes a support block and a accommodating hole, the support block is fixed in the accommodating box, and the accommodating hole is arranged at the top of the support block; the support plate includes a plate body and a support rod, one end of the support rod is fixed to the bottom of the plate body, and the other end is movably arranged in the accommodating hole.

[0011] By movably arranging the support rod in the receiving hole, not only a close fit between the support rod and the receiving hole is ensured, but also the freedom of movement of the support rod within a certain range is ensured, thereby achieving a flexible and stable connection between the support plate and the support frame.

[0012] In an optional embodiment, the vibration mechanism further includes a shock-absorbing pad, and the shock-absorbing pad is arranged between the accommodating hole and the support rod.

[0013] By setting the shock-absorbing pad, when the support plate vibrates, the shock-absorbing pad can absorb and disperse most of the vibration energy, reducing the transmission of vibration energy to the support block and the containing box, thereby ensuring that the support block and the containing box remain relatively still or only produce slight vibrations, effectively avoiding equipment damage caused by excessive vibrations, and enhancing the stability and durability of the entire vibration mechanism.

[0014] In an optional embodiment, the heating mechanism includes a heating cover and a heating element; the heating cover is arranged on the top of the containing box, and the placement plate is located in the heating cover; the heating element is fixed in the heating cover.

[0015] By arranging the heating cover on the top of the containing box and arranging the placing plate in the heating cover, the board to be tested can obtain vibration and heating environmental simulation at the same time, and the consistency of the environmental simulation can be guaranteed; and the setting of the heating cover can isolate the simulation area from the external environment, reduce the interference of external factors on the simulation results, thereby improving the accuracy and reliability of the test, and can ensure that the temperature in the simulation area is stable and controllable, while preventing high temperature from causing damage to the surrounding environment or equipment; through the setting of the heating element, the temperature in the heating cover can be increased to reach the temperature required for simulating the high temperature environment, thereby realizing the high temperature environment simulation of the board to be tested.

[0016] In an optional embodiment, the heating mechanism further includes a fan, a ventilation hole is provided on the side wall of the heating cover, the fan is installed in the ventilation hole, and an air outlet of the fan is arranged toward the heating element.

[0017] By arranging the fan in the ventilation hole, the air circulation in the heating hood can be enhanced. Since the fan outlet is toward the heating element, the fan blows air toward the heating element to disturb the airflow in the heating hood, so that the hot air fills the heating hood, ensuring that the temperature in the heating hood is evenly distributed. The temperature in the heating hood can be quickly reached and maintained within a preset range, providing a more stable and controllable test environment for the board to be tested, and significantly improving the accuracy and reliability of the test.

[0018] In an optional embodiment, the conveying mechanism also includes a rotating disk and a pushing assembly; the rotating disk is arranged adjacent to the test mechanism; the pushing assembly includes a second driving assembly and a pushing rod, the second driving assembly is arranged on the rotating disk, and is located on the side of the test slot close to the center of the rotating disk; the pushing rod is transmission-connected to the second driving assembly; the placement disk is arranged protruding from the top of the rotating disk, and the first and second clearance holes are respectively provided on the opposite side walls of the placement disk, and the third and fourth clearance holes are respectively provided on the opposite side walls of the heating cover, the pushing rod passes through the third and first clearance holes in turn to abut against the board to be tested, and under the drive of the second driving assembly, pushes the board to be tested to pass through the second and fourth clearance holes in turn to reach the test mechanism.

[0019] The second drive assembly and the push rod are provided to automatically push the board to be tested in the placement tray after environmental simulation into the test mechanism without manual handling, and the staff will not be burned by the high temperature of the board to be tested. The third clearance hole and the first clearance hole are provided to help the push rod pass through the heating cover and the placement tray to abut against the side board, ensuring smooth and unobstructed movement of the push rod; the second clearance hole and the fourth clearance hole are provided to help the board to be tested pass through the placement tray and the heating cover under the push of the push rod to enter the test mechanism, ensuring smooth and unobstructed movement of the board to be tested, and realizing the automatic pushing of the board to be tested from environmental simulation to the test mechanism.

[0020] In an optional embodiment, the testing mechanism includes a testing bench and a mounting frame; the testing bench is arranged adjacent to the conveying mechanism; the mounting frame includes a first fixed block and a second fixed block, the first fixed block is arranged adjacent to the testing bench, the second fixed block is located above the testing bench and connected to the first fixed block; the testing probe is slidably arranged on the second fixed block along the vertical direction.

[0021] Since the test probe is arranged on the second fixed block, it is ensured that the test probe is located above the test bench, which provides an ideal spatial position and operational convenience for subsequent test operations; and the test probe is slidably arranged in the vertical direction, so as to realize contact and separation operations with the board to be tested, thereby avoiding any form of interference or collision with the test probe during the process of moving the board to be tested to the test bench, thereby effectively protecting the integrity of the test probe and the board to be tested, and improving the reliability and stability of the test.

[0022] In an optional embodiment, the testing mechanism also includes a first workbench and a second workbench, the first workbench and the second workbench are respectively arranged at two ends of the testing platform, and the conveying mechanism is located between the first workbench and the second workbench; a conveying component is provided on the testing platform, and the performance testing device also includes a control system, the control system is used to receive the test data of the test probe, and control the conveying component according to the test data to convey the tested board card that has passed the test to the first workbench, and convey the tested board card that has failed the test to the second workbench.

[0023] Through the setting of the first workbench and the second workbench, the control system can accurately send the boards to be tested that have passed the test to the first workbench and send the boards to be tested that have failed the test to the second workbench according to the test results of the boards to be tested, thereby realizing automatic classification and eliminating the tedious process of manually screening the boards to be tested one by one according to the test results. The boards to be tested can be sent to the corresponding workbench immediately after the test is completed without the need for additional waiting time, thereby realizing seamless connection and efficient operation of the test process, improving work efficiency and having a high degree of automation.

[0024] In an optional embodiment, the conveying assembly includes a conveyor belt, a second power mechanism, a test fixture and a third power mechanism; the conveyor belt is arranged on the test bench; the second power mechanism is fixed on the test bench; the power output end of the second power mechanism is connected to the conveyor belt through a transmission structure; the test fixture includes a base plate, a first baffle, two second baffles and a positioning plate; the base plate is arranged on the conveyor belt; the first baffle is fixed on the side of the base plate away from the conveying mechanism; the two second baffles are arranged adjacent to the first baffle and are arranged on both sides of the base plate opposite to each other; the base plate, the first baffle and the two second baffles are combined to form a receiving groove, and the board to be tested is located in the receiving groove; a fifth clearance hole is provided on the first baffle, and the positioning plate is located The third power mechanism is fixed on the positioning plate; and the power output end of the third power mechanism passes through the fifth clearance hole and abuts against the board to be tested; the first workbench and the second workbench are both arranged on the side of the test bench close to the conveying mechanism, and are both arranged adjacent to the test bench; wherein the second power mechanism and the third power mechanism are both communicatively connected with the control system; the power output end of the second power mechanism rotates forward to push the test fixture onto the first workbench, or the power output end of the second power mechanism rotates reversely to push the test fixture onto the second workbench, and the power output end of the third power mechanism pushes the board to be tested onto the first workbench or the second workbench.

[0025] By arranging the test jig on the conveyor belt, when the second power mechanism rotates forward, the conveyor belt can convey the test jig to the position of the first workbench, and when the second power mechanism rotates reversely, the conveyor belt can convey the test jig to the position of the second workbench; by arranging the third power mechanism on the test jig, the board to be tested placed in the test jig can be pushed to the first workbench or the second workbench, thereby realizing the automation of the test process.

[0026] In an optional embodiment, a first in-place sensor is provided at one end of the test bench close to the first workbench, and a second in-place sensor is provided at one end of the test bench close to the second workbench; when the in-place plate contacts the first in-place sensor or the second in-place sensor, the control system controls the second power mechanism to stop rotating.

[0027] By setting a first in-position sensor and a second in-position sensor, when the in-position plate contacts the first in-position sensor or the second in-position sensor, the control system controls the second power mechanism to stop rotating, which not only achieves precise control of the position of the test fixture, but also ensures the stability and safety of the test fixture during the transportation process, and realizes automatic positioning and stopping of the test fixture on the transportation path. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the related technologies, the drawings required for use in the specific embodiments or the related technical descriptions will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0029] Figure 1 It is a front view of a performance testing device according to an embodiment of the present invention;

[0030] Figure 2 It is a schematic structural diagram of another viewing angle of the performance testing device according to an embodiment of the present invention;

[0031] Figure 3 for Figure 2 A is a partial enlarged schematic diagram;

[0032] Figure 4 is a schematic structural diagram of a first driving assembly according to an embodiment of the present invention;

[0033] Figure 5 It is a schematic structural diagram of a vibration mechanism and a heating mechanism according to an embodiment of the present invention;

[0034] Figure 6 A schematic diagram of the structure of a testing mechanism according to an embodiment of the present invention;

[0035] Figure 7 for Figure 6 A partial enlarged schematic diagram of B in the figure.

[0036] Description of reference numerals:

[0037] 1. Conveying mechanism; 11. First driving assembly; 111. First driving motor; 112. First bevel gear; 113. Second bevel gear; 114. First synchronous wheel; 115. Second synchronous wheel; 116. Synchronous belt; 117. Bearing; 118. Driving shaft; 12. Rotating plate; 13. Pushing assembly; 1311. Lead screw; 1312. Second driving motor; 1313. Sliding block; 1314. Limiting rod; 132. Pushing rod; 21. Accommodating box; 211. Slot; 221. Support block; 23. Support plate; 231. Plate body; 232. Support rod; 24. First power mechanism; 25. Placing plate; 251. First clearance hole; 252. Second clearance hole; 3. Add Thermal mechanism; 31. Heating cover; 311. Ventilation hole; 312. Third clearance hole; 313. Fourth clearance hole; 314. Insert rod; 32. Heating element; 33. Fan; 4. Testing mechanism; 41. Testing probe; 42. Testing table; 43. Mounting frame; 431. First fixing block; 432. Second fixing block; 44. Lifting electric cylinder; 45. Fixing plate; 46. First workbench; 47. Second workbench; 48. Conveying assembly; 481. Conveying belt; 482. Testing fixture; 4821. First baffle plate; 4822. Second baffle plate; 4823. In-position plate; 4824. Fifth clearance hole; 483. Third power mechanism; 49. First in-position sensor; 5. Mounting plate. DETAILED DESCRIPTION

[0038] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0039] Combine the following Figures 1 to 7 , describing an embodiment of the present invention.

[0040] According to an embodiment of the present invention, on the one hand, a performance testing device is provided, including a conveying mechanism 1, a vibration mechanism, a heating mechanism 3 and a testing mechanism 4; the conveying mechanism 1 is provided with a test slot; the vibration mechanism is arranged in the test slot; the board to be tested is suitable for being placed on the vibration mechanism; the heating mechanism 3 is installed above the vibration mechanism, suitable for simulating the temperature environment of the board to be tested; the testing mechanism 4 is arranged adjacent to the conveying mechanism 1; the board to be tested is suitable for entering the testing mechanism 4 under the push of the conveying mechanism 1; the testing mechanism 4 is provided with a test probe 41, and the test probe 41 is suitable for performing a performance test on the board to be tested.

[0041] By setting up a vibration mechanism and a heating mechanism 3, the vibration environment and high temperature environment of the board to be tested can be simulated, and the performance of the board to be tested under different conditions can be evaluated more accurately. By constructing a test scenario close to the actual operating environment, the performance of the board to be tested can be comprehensively evaluated, thereby ensuring the accuracy of the performance evaluation and improving the comprehensiveness and accuracy of the performance test. Moreover, since the vibration mechanism is arranged in the test slot, the heating mechanism 3 is installed above the vibration mechanism, and the test mechanism 4 is arranged adjacent to the conveying mechanism 1, that is, the vibration mechanism and the heating mechanism 3 are both arranged adjacent to the test mechanism 4, not only the independent environment simulation of the board to be tested is realized, but also by physically separating the environmental simulation from the test mechanism 4, the influence of temperature fluctuations or vibration interference on the performance of the test probe 41 is effectively reduced, thereby ensuring the accuracy of the performance test results of the board to be tested.

[0042] In a specific embodiment, the performance testing device also includes a mounting plate 5, and the conveying mechanism 1 and the testing mechanism 4 are both arranged on the mounting plate 5, ensuring the compactness and uniformity of the overall structure of the performance testing device, optimizing the space occupancy of the performance testing device, and improving the transportation convenience and installation flexibility of the performance testing device.

[0043] In a specific implementation manner, the board to be tested may be a mainboard of a server, a network communication board, a graphics processing board, a data storage board, a data acquisition board, etc.

[0044] In one embodiment, the conveying mechanism 1 includes a first driving component 11 and a rotating disk 12, and the rotating disk 12 is provided with at least two test slots, and at least two of the test slots are arranged in sequence around the circumference of the rotating disk 12; the rotating disk 12 is arranged adjacent to the testing mechanism 4 and is connected to the first driving component 11, and under the drive of the first driving component 11, at least two of the test slots rotate to the testing mechanism 4 in sequence.

[0045] By setting up at least two test slots, when one test slot is performing environmental simulation and performance testing on a board to be tested, the other test slot can be used to install and pre-set the next board to be tested, making full preparations for subsequent tests, ensuring the continuity and smoothness of the test process, significantly reducing the test waiting time, and thus greatly improving the performance testing efficiency of the board to be tested.

[0046] In one implementation of this embodiment, two test slots are provided, and the two test slots are arranged in sequence and spaced around the circumference of the rotating disk 12. In another implementation of this embodiment, three test slots may be provided, and the three test slots are arranged in sequence and spaced around the circumference of the rotating disk 12. Specifically, the number of test slots may be set according to actual working conditions.

[0047] In a specific embodiment, the first drive assembly 11 includes a first drive motor 111, a first bevel gear 112, a second bevel gear 113, a first synchronous wheel 114, a second synchronous wheel 115, a synchronous belt 116 and a bearing 117; the first drive motor 111 is fixed on the mounting plate 5; the first bevel gear 112 is fixed on the power output end of the first drive motor 111; the second bevel gear 113 is rotatably arranged on the mounting plate 5 and meshes with the first bevel gear 112. Under the drive of the first drive motor 111, the first bevel gear 112 drives the second bevel gear 113 to rotate; the first synchronous wheel 114 is arranged on the second bevel gear 113 along the axial direction, and rotates synchronously with the second bevel gear 113; the bearing 11 7 is arranged at an interval with the second bevel gear 113, and the outer ring of the bearing 117 is fixed on the mounting plate 5; the inner ring of the bearing 117 is fixedly mounted with a driving shaft 118, the second synchronous wheel 115 is fixed on the driving shaft 118, and the rotating disk 12 is fixed on the top of the driving shaft 118, and the synchronous belt 116 is arranged around the outer periphery of the first synchronous wheel 114 and the second synchronous wheel 115; when the second bevel gear 113 is driven by the first driving motor 111 to rotate, the first synchronous wheel 114 rotates synchronously with the second bevel gear 113, and drives the second synchronous wheel 115 to rotate through the synchronous belt 116, and the driving shaft 118 rotates synchronously with the second synchronous wheel 115, thereby realizing the rotation of the rotating disk 12 fixed on the driving shaft 118.

[0048] In a specific implementation, since the heating mechanism 3 is arranged on the vibration mechanism, the board to be tested can obtain vibration and heating environmental simulations at the same time during the rotation of the rotating disk 12, thereby ensuring the consistency of the environmental simulation; specifically, the first drive motor 111 is a reduction motor, which regulates the rotation speed of the rotating disk 12 so that the rotating disk 12 can rotate slowly, ensuring that the board to be tested can be tested after independent environmental simulation for a period of time, so that the performance test results of the board to be tested are more authentic.

[0049] In one embodiment, the vibration mechanism includes a containing box 21, a support frame, a support plate 23, a first power mechanism 24 and a placement tray 25; the containing box 21 is installed in the test slot; the support frame is fixed in the containing box 21; the support plate 23 is movably connected to the support frame; the first power mechanism 24 is fixedly connected to the support plate 23; the placement tray 25 is installed on the top of the support plate 23, and the board to be tested is suitable for being placed in the placement tray 25.

[0050] By movably connecting the support plate 23 with the support frame, the support plate 23 is both stable and movable, which helps to achieve the vibration of the support plate 23 under the action of the first power mechanism 24; and because the placement plate 25 is installed on the top of the support plate 23, when the support plate 23 vibrates under the action of the first power mechanism 24, the placement plate 25 can be vibrated synchronously, thereby realizing the vibration environment simulation of the board to be tested in the placement plate 25.

[0051] In a specific implementation, the vibration frequency of the first power mechanism 24 can be adjusted according to the specific application scenario and test requirements of the board to be tested to simulate a variety of complex vibration environments, thereby comprehensively evaluating the performance of the board to be tested under different vibration conditions.

[0052] In a specific embodiment, the first power mechanism 24 is a vibration motor.

[0053] In one embodiment, the support frame includes a support block 221 and a receiving hole, the support block 221 is fixed in the receiving box 21, and the receiving hole is arranged at the top of the support block 221; the support plate 23 includes a plate body 231 and a support rod 232, one end of the support rod 232 is fixed to the bottom of the plate body 231, and the other end is movably arranged in the receiving hole.

[0054] By movably setting the support rod 232 in the receiving hole, not only the close fit between the support rod 232 and the receiving hole is ensured, but also the freedom of movement of the support rod 232 within a certain range is guaranteed, thereby achieving a flexible and stable connection between the support plate 23 and the support frame.

[0055] In a specific embodiment, the first power mechanism 24 is fixed to the bottom of the support plate 23; a plurality of support blocks 221 are provided, and the plurality of support blocks 221 are arranged at intervals from each other; a plurality of support rods 232 are also provided, and the plurality of support rods 232 are respectively arranged in one-to-one correspondence with the plurality of support blocks 221. Specifically, the plate body 231 is a rectangular plate, and four support rods 232 and four support blocks 221 are provided, and the four support rods 232 are respectively arranged at the four corner ends of the plate body 231, which can ensure the stability of the support for the plate body 231.

[0056] In one embodiment, the vibration mechanism further includes a shock-absorbing pad, which is disposed between the receiving hole and the support rod 232 .

[0057] By providing the shock-absorbing pad, when the support plate 23 vibrates, the shock-absorbing pad can absorb and disperse most of the vibration energy, reducing the transmission of vibration energy to the support block 221 and the containing box 21, thereby ensuring that the support block 221 and the containing box 21 remain relatively still or only produce slight vibrations, effectively avoiding equipment damage caused by excessive vibrations, and enhancing the stability and durability of the entire vibration mechanism.

[0058] In a specific embodiment, the shock-absorbing pad can be an annular rubber pad, which surrounds the end of the support rod 232.

[0059] In one embodiment, the heating mechanism 3 includes a heating cover 31 and a heating element 32 ; the heating cover 31 is disposed on the top of the receiving box 21 , and the placement plate 25 is located in the heating cover 31 ; the heating element 32 is fixed in the heating cover 31 .

[0060] By setting the heating cover 31 on the top of the containing box 21 and the placing plate 25 in the heating cover 31, the board to be tested can obtain vibration and heating environmental simulation at the same time, and the consistency of the environmental simulation can be guaranteed; and the setting of the heating cover 31 can isolate the simulation area from the external environment, reduce the interference of external factors on the simulation results, thereby improving the accuracy and reliability of the test, and can ensure that the temperature in the simulation area is stable and controllable, while preventing high temperature from causing damage to the surrounding environment or equipment; through the setting of the heating element 32, the temperature in the heating cover 31 can be increased to reach the temperature required for simulating a high-temperature environment, thereby realizing a high-temperature environment simulation of the board to be tested.

[0061] In a specific embodiment, the height of the containing box 21 is less than or equal to the depth of the test slot, and the top of the containing box 21 is open, and the placement plate 25 is protruding from the containing box 21; and a slot 211 is provided at the top of the containing box 21, and a rod 314 is provided at the bottom end of the heating cover 31. By inserting the rod 314 into the slot 211, the heating cover 31 can be installed.

[0062] In a specific implementation, when assembling the vibration mechanism and the heating mechanism 3, first place the containing box 21 in the test slot, then insert the support rod 232 into the corresponding containing hole, and confirm that the bottom end of the support rod 232 is wrapped by the shock-absorbing pad, and then the installation of the rotating mechanism is completed; then insert the insertion rod 314 at the bottom of the heating cover 31 into the corresponding slot 211, so that the heating cover 31 and the containing box 21 are connected, and the installation of the heating mechanism 3 is completed. The assembly is simple and convenient.

[0063] In a specific embodiment, the heating element 32 is an electric heating rod.

[0064] In a specific implementation, the heating temperature of the heating element 32 can be adjusted according to the specific application scenario and test requirements of the board to be tested.

[0065] In one embodiment, the heating mechanism 3 further includes a fan 33 . A ventilation hole 311 is provided on the side wall of the heating cover 31 . The fan 33 is installed in the ventilation hole 311 , and an air outlet of the fan 33 is arranged toward the heating element 32 .

[0066] By arranging the fan 33 in the ventilation hole 311, the air circulation in the heating cover 31 can be enhanced. Since the outlet of the fan 33 is toward the heating element 32, the fan 33 blows air toward the heating element 32 to disturb the airflow in the heating cover 31, so that the hot air fills the heating cover 31, ensuring that the temperature in the heating cover 31 is evenly distributed, so that the temperature in the heating cover 31 can quickly reach and be maintained within a preset range, providing a more stable and controllable test environment for the board to be tested, and significantly improving the accuracy and reliability of the test.

[0067] In one embodiment, the conveying mechanism 1 also includes a rotating disk 12 and a pushing assembly 13; the rotating disk 12 is arranged adjacent to the test mechanism 4; the pushing assembly 13 includes a second driving assembly and a push rod 132, the second driving assembly is arranged on the rotating disk 12, and is located on the side of the test slot close to the center of the rotating disk 12; the push rod 132 is transmission-connected with the second driving assembly; the placement disk 25 is arranged protruding from the top of the rotating disk 12, and the first and second clearance holes 251 and 252 are respectively provided on the opposite side walls of the placement disk 25, and the third and fourth clearance holes 312 and 313 are respectively provided on the opposite side walls of the heating cover 31, and the push rod 132 passes through the third and first clearance holes 312 and 251 in turn to abut against the board to be tested, and under the drive of the second driving assembly, pushes the board to be tested to pass through the second and fourth clearance holes 252 and 313 in turn to reach the test mechanism 4.

[0068] The second drive assembly and the push rod 132 are provided to automatically push the board to be tested in the placement tray 25 after environmental simulation into the test mechanism 4, without the need for manual removal, and the staff will not be burned by the high temperature of the board to be tested. The third clearance hole 312 and the first clearance hole 251 are provided to help the push rod 132 pass through the heating cover 31 and the placement tray 25 to abut against the side board, ensuring that the push rod 132 is smooth and unobstructed during the movement; the second clearance hole 252 and the fourth clearance hole 313 are provided to help the board to be tested pass through the placement tray 25 and the heating cover 31 under the push of the push rod 132 to enter the test mechanism 4, ensuring that the board to be tested is smooth and unobstructed during the movement, and realizing the automatic pushing of the board to be tested from environmental simulation to the test mechanism 4.

[0069] In a specific embodiment, the second drive assembly includes a lead screw 1311, a second drive motor 1312 and a slider 1313. The second drive motor 1312 is fixed on the rotating disk 12; the lead screw 1311 is connected to the power output end of the second drive motor 1312; the slider 1313 is fixed on the push rod 132, and the slider 1313 is provided with a threaded hole, and the lead screw 1311 is threadedly connected to the slider 1313 through the threaded hole; the second drive motor 1312 drives the lead screw 1311 to rotate, and under the drive of the lead screw 1311, the slider 1313 drives the push rod 132 to move synchronously.

[0070] Specifically, a limiting groove is provided on the side of the push rod 132 close to the rotating disk 12, and a limiting rod 1314 is fixed on the rotating disk 12, and the limiting rod 1314 is located in the limiting groove, thereby realizing a slidable connection between the push rod 132 and the limiting rod 1314, and the limiting groove constrains the limiting rod 1314, thereby guiding the moving direction of the push rod 132.

[0071] In a specific implementation, two test slots are provided, each of which is provided with a set of vibration mechanisms and a set of heating mechanisms 3; two sets of pushing components 13 are provided, and each set of pushing components 13 corresponds to one test slot.

[0072] In a specific embodiment, the lead screw 1311 and the push rod 132 of the first group of pushing components 13 are cross-arranged with the lead screw 1311 and the push rod 132 of the second group of pushing components 13; the lead screw 1311 of the first group of pushing components 13 is located above the push rod 132, and the push rod 132 of the first group of pushing components 13 includes a first connecting rod, a second connecting rod and a third connecting rod, and the first connecting rod is spaced apart from the rotating disk 12; the second connecting rod is provided with a limiting groove and is slidably connected to the limiting rod 1314, the third connecting rod extends in a vertical direction, and the two ends are respectively connected to the first connecting rod and the second connecting rod; the lead screw 1311 and the push rod 132 of the second group of pushing components 13 are located between the first connecting rod and the rotating disk 12, thereby avoiding interference between the two groups of pushing components 13.

[0073] In a specific implementation, the second drive motor 1312 is a servo motor.

[0074] In a specific implementation, when a board to be tested in one test slot is being tested, another board to be tested can be placed in the placement tray 25 of another test slot for preparation. In one implementation of this embodiment, the heating cover 31 can be opened, and the board to be tested can be placed in the placement tray 25, and then the heating cover 31 can be installed on the receiving box 21; in another implementation of this embodiment; the board to be tested can be placed in the placement tray 25 through the fourth clearance hole 313 and the second clearance hole 252 in sequence, without opening the heating cover 31, and the operation is simple and convenient.

[0075] In one embodiment, the testing mechanism 4 includes a testing table 42 and a mounting frame 43; the testing table 42 is arranged adjacent to the conveying mechanism 1; the mounting frame 43 includes a first fixed block 431 and a second fixed block 432, the first fixed block 431 is arranged adjacent to the testing table 42, the second fixed block 432 is located above the testing table 42 and is connected to the first fixed block 431; the testing probe 41 is slidably arranged on the second fixed block 432 along the vertical direction.

[0076] Since the test probe 41 is arranged on the second fixed block 432, it is ensured that the test probe 41 is located above the test table 42, which provides an ideal spatial position and operational convenience for subsequent test operations; and the test probe 41 is slidably arranged in the vertical direction, so as to realize contact and separation operations with the board to be tested, thereby avoiding any form of interference or collision with the test probe 41 during the process of moving the board to be tested to the test table 42, thereby effectively protecting the integrity of the test probe 41 and the board to be tested, and improving the reliability and stability of the test.

[0077] In a specific embodiment, a lifting electric cylinder 44 is fixed on the second fixed block 432, and the power output end of the lifting electric cylinder 44 passes through the second fixed block 432 and is connected to the fixed plate 45, and the test probe 41 is fixed on the fixed plate 45, so that the lifting electric cylinder 44 drives the test probe 41 to rise and fall; specifically, the position of the test probe 41 corresponds to the position to be tested on the board to be tested. During the test process, when the board to be tested is moved above the test table 42, the test probe 41 descends and accurately contacts the position to be tested on the board to be tested, so as to perform a performance test. When the test is completed, the test probe 41 rises to separate from the board to be tested.

[0078] In one embodiment, the testing mechanism 4 also includes a first workbench 46 and a second workbench 47, the first workbench 46 and the second workbench 47 are respectively arranged at the two ends of the testing platform 42, and the conveying mechanism 1 is located between the first workbench 46 and the second workbench 47; a conveying component 48 is provided on the testing platform 42, and the performance testing device also includes a control system, the control system is used to receive the test data of the test probe 41, and control the conveying component 48 according to the test data to convey the tested board card that has passed the test to the first workbench 46, and convey the tested board card that has failed the test to the second workbench 47.

[0079] Through the setting of the first workbench 46 and the second workbench 47, the control system can accurately send the boards to be tested that have passed the test to the first workbench 46 and send the boards to be tested that have failed the test to the second workbench 47 according to the test results of the boards to be tested, thereby realizing automatic classification and eliminating the tedious process of manually screening the boards to be tested one by one according to the test results. The boards to be tested can be sent to the corresponding workbench immediately after the test is completed without the need for additional waiting time, thereby realizing seamless connection and efficient operation of the test process, improving work efficiency and having a high degree of automation.

[0080] In a specific implementation, the boards to be tested transported to the first workbench 46 and the second workbench 47 can be directly removed manually, or the transport structure can automatically transport the boards to be tested to the next station for further processing or analysis. The independent setting of the first workbench 46 and the second workbench 47 also provides great convenience for subsequent board processing; boards that pass the test can be further packaged or put into storage on the first workbench 46, while boards that fail the test can be analyzed for failure or reworked on the second workbench 47; this design not only optimizes the test process, but also improves the flexibility and response speed of the entire production line.

[0081] Preferably, a detection sensor, such as an RFID (radio frequency identification) reader, a weight sensor or an optical recognition device, is arranged in the placement tray 25 to automatically identify the model of the board to be tested. When the board to be tested is accurately identified, the control system will automatically match the test parameters required by the test board of the corresponding model according to a preset database, and intelligently adjust the vibration frequency of the vibration mechanism and the heating temperature of the heating mechanism 3 according to the specific test requirements of the test boards of different models, thereby ensuring that the test environment can accurately simulate the vibration and temperature conditions faced by the board to be tested in the actual application scenario, thereby maximizing the accuracy and reliability of the test.

[0082] In one embodiment, the conveying assembly 48 includes a conveyor belt 481, a second power mechanism, a test fixture 482 and a third power mechanism 483; the conveyor belt 481 is arranged on the test bench 42; the second power mechanism is fixed on the test bench 42; the power output end of the second power mechanism is connected to the conveyor belt 481 through a transmission structure; the test fixture 482 includes a bottom plate, a first baffle 4821, two second baffles 4822 and a positioning plate 4823; the bottom plate is arranged on the conveyor belt 481; the first baffle 4821 is fixed on the side of the bottom plate away from the conveying mechanism 1; the two second baffles 4822 are both arranged adjacent to the first baffle 4821 and are relatively arranged on both sides of the bottom plate; the bottom plate, the first baffle 4821 and the two second baffles 4822 are enclosed to form a receiving groove, and the board to be tested is located in the receiving groove; the first baffle 4821 is provided with a fifth clearance hole 4824, the The positioning plate 4823 is located below the fifth clearance hole 4824 and is fixedly connected to the first baffle 4821; the third power mechanism 483 is fixed on the positioning plate 4823; and the power output end of the third power mechanism 483 passes through the fifth clearance hole 4824 and abuts against the board to be tested; the first workbench 46 and the second workbench 47 are both arranged on the side of the test bench 42 close to the conveying mechanism 1, and are both arranged adjacent to the test bench 42; wherein the second power mechanism and the third power mechanism 483 are both communicatively connected with the control system; the power output end of the second power mechanism rotates forward to push the test fixture 482 onto the first workbench 46, or the power output end of the second power mechanism rotates reversely to push the test fixture 482 onto the second workbench 47, and the power output end of the third power mechanism 483 pushes the board to be tested onto the first workbench 46 or the second workbench 47.

[0083] By setting the test jig 482 on the conveyor belt 481, when the second power mechanism rotates forward, the conveyor belt 481 can convey the test jig 482 to the position of the first workbench 46, and when the second power mechanism rotates reversely, the conveyor belt 481 can convey the test jig 482 to the position of the second workbench 47; by setting the third power mechanism 483 on the test jig 482, the board to be tested placed in the test jig 482 can be pushed to the first workbench 46 or the second workbench 47, thereby realizing the automation of the test process.

[0084] In a specific embodiment, the conveyor belt 481 is composed of multiple conveyor rollers, and the multiple conveyor rollers are arranged in sequence along the length direction of the test bench 42; a synchronous gear is connected to the rotating shaft of the conveyor roller, and the second power mechanism is installed at the side position of the test bench 42. The power output end of the second power mechanism is connected to the synchronous gears of the multiple conveyor rollers through a synchronous toothed belt, thereby driving the multiple conveyor rollers to rotate synchronously at the same speed and direction.

[0085] In a specific embodiment, the second power mechanism is a rotary motor.

[0086] In one embodiment, a first in-place sensor 49 is provided at one end of the test bench 42 close to the first workbench 46, and a second in-place sensor is provided at one end of the test bench 42 close to the second workbench 47; when the in-place plate 4823 contacts the first in-place sensor 49 or the second in-place sensor, the control system controls the second power mechanism to stop rotating.

[0087] By setting the first in-position sensor 49 and the second in-position sensor, when the in-position plate 4823 contacts the first in-position sensor 49 or the second in-position sensor, the control system controls the second power mechanism to stop rotating, which not only realizes the precise control of the position of the test fixture 482, but also ensures the stability and safety of the test fixture 482 during the transportation process, and realizes the automatic positioning and stopping of the test fixture 482 on the transportation path.

[0088] In a specific implementation, when the test of the board to be tested is qualified, the test probe 41 sends the test data to the background control system, and the control system controls the power output end of the lifting cylinder 44 to rise, so that the test probe 41 is separated from the board to be tested, and then the control system controls the second power mechanism to rotate forward, so that the conveyor belt 481 conveys the test fixture 482 in the direction of the first workbench 46. When the in-position plate 4823 contacts the first in-position sensor 49, the control system controls the second power mechanism to stop rotating, and controls the power output end of the third power mechanism 483 to extend to push the board to be tested onto the first workbench 46; when the second power mechanism stops rotating for a preset time, the control system controls the power output end of the third power mechanism 483 to retract, and controls the second power mechanism to rotate in the opposite direction for the same number of turns as the forward rotation, so that the test fixture 482 is reset.

[0089] In a specific implementation, when the test of the board to be tested fails, the test probe 41 sends the test data to the background control system, and the control system controls the power output end of the lifting cylinder 44 to rise, so that the test probe 41 is separated from the board to be tested, and then the control system controls the second power mechanism to rotate in the opposite direction, so that the conveyor belt 481 conveys the test fixture 482 in the direction of the second workbench 47. When the in-position plate 4823 contacts the second in-position sensor, the control system controls the second power mechanism to stop rotating, and controls the power output end of the third power mechanism 483 to extend to push the board to be tested onto the second workbench 47; when the second power mechanism stops rotating for a preset time, the control system controls the power output end of the third power mechanism 483 to retract, and controls the second power mechanism to rotate forward and reverse for the same number of turns, so that the test fixture 482 is reset.

[0090] Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations are all within the scope defined by the appended claims.

Claims

1. A performance testing device, characterized in that: include: The conveying mechanism (1) is provided with a test slot; A vibration mechanism, disposed in the test slot; The board to be tested is suitable for being placed on the vibration mechanism; A heating mechanism (3), installed above the vibration mechanism, suitable for simulating the temperature environment of the board to be tested; A testing mechanism (4) is arranged adjacent to the conveying mechanism (1); the board to be tested is suitable for entering the testing mechanism (4) under the push of the conveying mechanism (1); a testing probe (41) is provided on the testing mechanism (4), and the testing probe (41) is suitable for performing a performance test on the board to be tested.

2. The performance testing device according to claim 1, characterized in that: The conveying mechanism (1) comprises a first driving component (11) and a rotating disk (12); the rotating disk (12) is provided with at least two test slots, and the at least two test slots are arranged in sequence around the circumference of the rotating disk (12); the rotating disk (12) is arranged adjacent to the test mechanism (4) and is connected to the first driving component (11); under the drive of the first driving component (11), the at least two test slots rotate in sequence to the test mechanism (4).

3. The performance testing device according to claim 1 or 2, characterized in that: The vibration mechanism comprises: A containing box (21), installed in the test slot; A support frame, fixed in the containing box (21); A support plate (23) movably connected to the support frame; A first power mechanism (24) fixedly connected to the support plate (23); A placement plate (25) is installed on the top of the support plate (23), and the board to be tested is suitable for being placed in the placement plate (25).

4. The performance testing device according to claim 3, characterized in that: The support frame comprises a support block (221) and a receiving hole, the support block (221) is fixed in the receiving box (21), and the receiving hole is arranged at the top end of the support block (221); The support plate (23) comprises a plate body (231) and a support rod (232); one end of the support rod (232) is fixed to the bottom of the plate body (231), and the other end is movably arranged in the receiving hole; The vibration mechanism also includes a shock-absorbing pad, which is arranged between the accommodating hole and the supporting rod (232).

5. The performance testing device according to claim 3, characterized in that: The heating mechanism (3) comprises: A heating cover (31) is arranged on the top of the containing box (21), and the placing plate (25) is located inside the heating cover (31); A heating element (32) is fixed inside the heating cover (31).

6. The performance testing device according to claim 5, characterized in that: The heating mechanism (3) further comprises a fan (33); a ventilation hole (311) is provided on the side wall of the heating cover (31); the fan (33) is installed in the ventilation hole (311), and an air outlet of the fan (33) is arranged toward the heating element (32); And / or, the conveying mechanism (1) further comprises a rotating disk (12) and a pushing assembly (13); the rotating disk (12) is arranged adjacent to the testing mechanism (4); the pushing assembly (13) comprises a second driving assembly and a pushing rod (132); the second driving assembly is arranged on the rotating disk (12) and is located on a side of the testing slot close to the center of the rotating disk (12); the pushing rod (132) is in transmission connection with the second driving assembly; The placement plate (25) is arranged to protrude from the top of the rotating plate (12), and the placement plate (25) is provided with a first clearance hole (251) and a second clearance hole (252) on two opposite side walls, and the heating cover (31) is provided with a third clearance hole (312) and a fourth clearance hole (313) on two opposite side walls, respectively. The push rod (132) sequentially passes through the third clearance hole (312) and the first clearance hole (251) to abut against the board to be tested, and under the drive of the second driving component, pushes the board to be tested to sequentially pass through the second clearance hole (252) and the fourth clearance hole (313) to reach the testing mechanism (4).

7. The performance testing device according to any one of claims 1 or 2 or 4 to 6, characterized in that: The testing mechanism (4) comprises: A test bench (42) is arranged adjacent to the conveying mechanism (1); A mounting frame (43), comprising a first fixing block (431) and a second fixing block (432), wherein the first fixing block (431) is arranged adjacent to the test bench (42), and the second fixing block (432) is located above the test bench (42) and connected to the first fixing block (431); The test probe (41) is slidably arranged on the second fixing block (432) along a vertical direction.

8. The performance testing device according to claim 7, characterized in that: The testing mechanism (4) further comprises a first workbench (46) and a second workbench (47), wherein the first workbench (46) and the second workbench (47) are respectively arranged at two ends of the testing platform (42), and the conveying mechanism (1) is located between the first workbench (46) and the second workbench (47); The test bench (42) is provided with a conveying component (48), and the performance testing device further comprises a control system, wherein the control system is used for receiving the test data of the test probe (41), and controlling the conveying component (48) according to the test data to convey the tested boards and cards that have passed the test to the first workbench (46), and convey the tested boards and cards that have failed the test to the second workbench (47).

9. The performance testing device according to claim 8, characterized in that: The conveying assembly (48) comprises: A conveyor belt (481) is arranged on the test bench (42); A second power mechanism is fixed on the test bench (42); a power output end of the second power mechanism is transmission-connected to the conveyor belt (481) via a transmission structure; A test fixture (482), comprising a base plate, a first baffle (4821), two second baffles (4822) and a positioning plate (4823); the base plate is arranged on the conveyor belt (481); the first baffle (4821) is fixed to a side of the base plate away from the conveying mechanism (1); the two second baffles (4822) are arranged adjacent to the first baffle (4821) and are arranged oppositely on both sides of the base plate; the base plate, the first baffle (4821) and the two second baffles (4822) are combined to form a receiving groove, and the board to be tested is located in the receiving groove; The first baffle plate (4821) is provided with a fifth clearance hole (4824), and the positioning plate (4823) is located below the fifth clearance hole (4824) and is fixedly connected to the first baffle plate (4821); The third power mechanism (483) is fixed on the positioning plate (4823); and the power output end of the third power mechanism (483) passes through the fifth clearance hole (4824) and abuts against the board to be tested; The first workbench (46) and the second workbench (47) are both arranged on a side of the test bench (42) close to the conveying mechanism (1), and are both arranged adjacent to the test bench (42); Wherein, the second power mechanism and the third power mechanism (483) are both connected to the control system for communication; the power output end of the second power mechanism rotates forward to push the test fixture (482) onto the first workbench (46), or the power output end of the second power mechanism rotates backward to push the test fixture (482) onto the second workbench (47), and the power output end of the third power mechanism (483) pushes the board to be tested onto the first workbench (46) or the second workbench (47).

10. The performance testing device according to claim 9, characterized in that: A first in-place sensor (49) is provided at one end of the test bench (42) close to the first workbench (46), and a second in-place sensor is provided at one end of the test bench (42) close to the second workbench (47); when the in-place plate (4823) contacts the first in-place sensor (49) or the second in-place sensor, the control system controls the second power mechanism to stop rotating.

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