Server test system, method and device, computer equipment and storage medium

Abstract

The invention relates to the technical field of servers, and discloses a server test system, method and device, computer equipment and a storage medium, the system comprises a server case, a load box and a test module, the server case comprises a server adapter plate and a power supply; the power supply is connected with the server adapter plate, the server adapter plate is connected with the load equipment, and the power supply is used for providing first preset voltage for the load equipment through the server adapter plate; the test module is connected with the load equipment and used for controlling the load equipment to operate at a first preset load based on a first preset voltage; the test module is connected with the load box, the load box is connected with the server adapter plate, and the test module is used for determining an additional load and controlling the load box to increase the additional load for the server adapter plate; the test module is used for performing a first preset test on the server. The problem that the electromagnetic compatibility test and the safety test cannot be carried out on the server under the condition that part of GPU modules are lacked is solved.

Description

Technical Field

[0001] The present invention relates to the technical field of servers, and in particular to a server testing system, method, device, computer equipment and storage medium. Background Art

[0002] Electromagnetic radiation is a serious and growing form of environmental pollution. Its impact ranges from the annoying crackling sound produced when receiving broadcasts to life accidents caused by interference with control systems. Electromagnetic radiation directly radiates electromagnetic energy in the form of electromagnetic waves, causing harm and interference to the human body and other equipment. Therefore, it is necessary to perform electromagnetic compatibility testing on servers, including electromagnetic radiation testing. The electromagnetic radiation of a server is related to the server's overall power or the expected load of the entire machine. The greater the load, the greater the electromagnetic radiation generated. In addition, in order to determine whether the server meets safety standards and ensure the product safety of the server, it is also necessary to perform safety testing on the server.

[0003] Currently, the expected load of a server depends on the load of all running devices in the server, such as GPU (graphics processing unit) module, central processing unit, memory, RAID (Redundant Array of Independent Disks, independent disk redundant array) cards, hard disks, fans, etc. Taking the load as power as an example, the power of the GPU module in the server will range from 2000W to 17000W, and the power deviation of the whole machine of the server with different GPU modules will be particularly large. After the server design is completed, it is not necessarily possible to get all the required GPU modules. At present, for GPU modules that cannot be obtained, they are directly certified without testing, or after all GPU modules are obtained, the server is retested. However, if the retest finds a problem, because the server product design has been finalized, it will have a greater impact on the server development cycle and development costs.

[0004] Therefore, the related technology has the problem that it is impossible to perform electromagnetic compatibility testing and safety testing on the server when some GPU modules are missing. Summary of the invention

[0005] In view of this, the present invention provides a server testing system, method, apparatus, computer equipment and storage medium to solve the problem that it is impossible to perform electromagnetic compatibility testing and safety testing on the server when some GPU modules are missing.

[0006] In a first aspect, the present invention provides a server testing system, which includes: a server chassis, a load box and a testing module, wherein the server chassis includes: a server adapter board and a power supply; the server adapter board is used to access a load device;

[0007] The power supply is connected to the server adapter board, and the power supply is used to provide a first preset voltage to the load device through the server adapter board;

[0008] The test module is used to connect to the load device and control the load device to operate with a first preset load based on a first preset voltage;

[0009] The test module is connected to the load box, which is connected to the server adapter board. The test module is used to determine the additional load and control the load box to add the additional load to the server adapter board.

[0010] The test module is used to perform a first preset test on the server when the load of the server adapter board is the sum of the first preset load and the additional load.

[0011] The server testing system provided in this embodiment has a testing module that controls the load device to run at a first preset load based on a first preset voltage, controls the load box to add an additional load to the server adapter board, combines the additional load with the first preset load, and implements a pull-load test. By changing the size of the additional load, various load conditions of the load device can be fully covered, and the first preset test can be performed on the server under various load conditions. In addition, by combining the additional load with the first preset load, the existing GPU module reaches the load of the missing GPU module, and the server is tested. This solves the problem of being unable to perform electromagnetic compatibility testing and safety testing on the server when some GPU modules are missing.

[0012] In an optional embodiment, the server adapter plate includes: a first preset number of load device connectors, a second preset number of power connectors, and a second preset number of ground holes;

[0013] The load device connector is used to connect to the load device and provide a first preset voltage to the load device;

[0014] The power connector is connected to the load box via a first cable, the ground hole is connected to the load box via a second cable, and the power connector, the first cable, the load box, the second cable and the ground hole form a current path;

[0015] The load bank is used to pass the current path to add additional load to the server adapter board.

[0016] In this embodiment, the power connector is connected to the load box through the first cable, and the ground hole is connected to the load box through the second cable, so that the load box, the first cable, the second cable, the power connector and the ground hole form a current path. The load box can add an additional load to the server adapter board through the current path, and the additional load is combined with the first preset load to implement a load test.

[0017] In an optional embodiment, the power connector includes: a first through hole, wherein the first through hole is used to weld one end of the first cable, and the diameter of the first through hole is proportional to the safe current carrying capacity of the current path;

[0018] The ground hole comprises: a second through hole and a preset area, wherein the second through hole is used to weld one end of the second cable, the diameter of the second through hole is proportional to the safe current carrying capacity of the current path, and the preset area is used to fix one end of the second cable;

[0019] The first cable includes: a first shielding layer and a first magnetic ring, wherein the first shielding layer and the first magnetic ring are used to eliminate interference signals of the load box, and the thickness of the first cable is proportional to the safe current carrying capacity of the current path;

[0020] The second cable includes: a second shielding layer and a second magnetic ring, wherein the second shielding layer and the second magnetic ring are used to eliminate interference signals of the load box, and the thickness of the second cable is proportional to the safe current carrying capacity of the current path.

[0021] In this embodiment, a first through hole is provided for the power connector and welded to one end of the first cable, a second through hole is provided for the ground hole and welded to one end of the second cable, and a preset area is provided to fix one end of the second cable to ensure the stability of the current path. In addition, the cable diameter and through hole diameter are adjusted according to the safe current carrying capacity of the current path to ensure circuit safety. Finally, a shielding layer and a magnetic ring are provided for the cable to eliminate interference signals from the load box and ensure the accuracy of the server test.

[0022] In an optional implementation, the test module is further used to:

[0023] Control the load box to stop adding additional load to the server adapter board;

[0024] Adjusting the load device to operate at a second preset load, wherein the second preset load is smaller than the first preset load;

[0025] Run the second preset test on the server.

[0026] In this embodiment, the load box is controlled to stop adding additional load to the server adapter board, and the load device is adjusted to operate at the second preset load to reduce the server load. The second preset test is performed without requiring the server to operate at the maximum load to avoid the server operating at the maximum load and damaging the load device.

[0027] In a second aspect, the present invention provides a server testing method, which is applied to a testing module, and the method comprises:

[0028] Obtaining the load of the device in the server, and determining a first preset load and an expected load of the entire server according to the load of the device;

[0029] Controlling the load device to operate at a first preset load based on a first preset voltage;

[0030] Determine an additional load according to the first preset load and the expected load of the whole machine, and control the load box to add the additional load to the server adapter board of the server, wherein the power supply in the server is used to provide the first preset voltage to the load device through the server adapter board;

[0031] When the load of the server adapter board is the sum of the first preset load and the additional load, a first preset test is performed on the server.

[0032] In the server testing method provided in this embodiment, the test module controls the load device to run at the first preset load based on the first preset voltage, controls the load box to add an additional load to the server adapter board, combines the additional load with the first preset load, and implements a pull-load test. By changing the size of the additional load, various load conditions of the load device can be fully covered, and the first preset test can be performed on the server under various load conditions. In addition, by combining the additional load with the first preset load, the existing GPU module reaches the load of the missing GPU module, and the server is tested. The problem of being unable to perform electromagnetic compatibility testing and safety testing on the server in the absence of some GPU modules is solved.

[0033] In an optional implementation, determining the additional load according to the first preset load and the expected load of the entire machine, and controlling the load box to add the additional load to the server adapter board of the server includes:

[0034] obtaining a third preset number of load banks;

[0035] Determine a load difference between an expected load of the whole machine and a first preset load, and use the load difference as an additional load;

[0036] determining a sub-load of the load bank according to the additional load and a third preset number;

[0037] Obtaining a second preset voltage of a load device connector in the server adapter board;

[0038] Determining a target value of a configuration parameter of the load box according to the sub-load and the second preset voltage;

[0039] The load box is started and the configuration parameters of the load box are modified to target values, wherein when the configuration parameters are the target values, the load box adds an additional load to the server adapter board of the server.

[0040] In this embodiment, the additional load of the load box and the target value of the configuration parameters of the load box are determined, and the configuration parameters of the load box are modified to the target value to control the load box to add an additional load to the server adapter board of the server. The additional load is used to perform a pull test to achieve the power of mainstream GPU devices, thereby solving the problem of conducting an electromagnetic compatibility test with full coverage of components and avoiding problems in product certification.

[0041] In an optional implementation, performing a first preset test on the server includes:

[0042] Acquire measurement data and reference data corresponding to a first preset test;

[0043] The measured data and the reference data are compared, and a test result corresponding to the first preset test is determined according to the comparison result.

[0044] In a third aspect, the present invention provides a server testing device, applied to a testing module, comprising:

[0045] An acquisition unit, configured to acquire a load of a device in the server, and determine a first preset load and an expected load of the entire server according to the load of the device;

[0046] A first control unit, configured to control the load device to operate at a first preset load based on a first preset voltage;

[0047] a second control unit, configured to determine an additional load according to the first preset load and the expected load of the entire machine, and control the load box to add the additional load to a server adapter board of the server, wherein the power supply in the server is configured to provide a first preset voltage to the load device through the server adapter board;

[0048] The test unit is used to perform a first preset test on the server when the load of the server adapter board is the sum of the first preset load and the additional load.

[0049] In a fourth aspect, the present invention provides a computer device, comprising: a memory and a processor, the memory and the processor being communicatively connected to each other, the memory storing computer instructions, and the processor executing the server testing method of the first aspect or any corresponding embodiment thereof by executing the computer instructions.

[0050] In a fifth aspect, the present invention provides a computer-readable storage medium having computer instructions stored thereon, the computer instructions being used to enable a computer to execute the server testing method of the first aspect or any corresponding embodiment thereof.

[0051] In a sixth aspect, the present invention provides a computer program product, comprising computer instructions for causing a computer to execute the server testing method of the first aspect or any corresponding embodiment thereof. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0053] Figure 1 is a schematic diagram of a decoupled development mode according to an embodiment of the present invention;

[0054] Figure 2 is a schematic diagram of a coupled development mode according to an embodiment of the present invention;

[0055] Figure 3 is a schematic diagram of a server power supply circuit according to an embodiment of the present invention;

[0056] Figure 4 is a schematic diagram of the structure of a server testing system according to an embodiment of the present invention;

[0057] Figure 5 is a structural schematic diagram of a server adapter board according to an embodiment of the present invention;

[0058] Figure 6 is a schematic diagram of the structure of a ground hole on a server adapter board according to an embodiment of the present invention;

[0059] Figure 7 is a flow chart of a server testing method according to an embodiment of the present invention;

[0060] Figure 8 is a flow chart of a server electromagnetic compatibility alternative testing method according to an embodiment of the present invention;

[0061] Fig. 9 is a flow chart of a server safety regulation replacement test method according to an embodiment of the present invention;

[0062] Fig.10 is a structural block diagram of a server testing device according to an embodiment of the present invention;

[0063] Fig.11 It is a schematic diagram of the hardware structure of a computer device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0064] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0065] Safety (Production Compliance) refers to the compliance of products with product safety standards from design to sales to end users, throughout the entire life cycle of the product. This product safety standard not only includes product safety in the ordinary sense, but also includes requirements for electromagnetic compatibility and radiation, energy conservation and environmental protection, food hygiene, and so on. In the design process of AI (artificial intelligence) servers, commonly used components include central processing units, memory, RAID cards, hard drives, fans, GPU modules, etc. The actual parts list contains a wide variety of components, and there are many manufacturers for the main components, and each manufacturer has many types and models. Therefore, in the server design process, a decoupled development model is adopted. The decoupled development model can be divided into a motherboard platform and an infrastructure platform, such as Figure 1 and Figure 2 As shown, Figure 1 It is a schematic diagram of the decoupled development model. Figure 2 It is a schematic diagram of the coupled development model, in which decoupling and coupling are concepts in computer science, involving the relationship between modules or components. Decoupling refers to reducing or eliminating the dependencies between modules or components so that they can be modified or replaced independently. Decoupling can improve the flexibility and maintainability of the system and reduce the impact of one module or component on other modules or components. Coupling refers to the degree of dependency between modules or components. If there is a high degree of coupling between modules or components, modifying one module or component may affect the functions of other modules or components, making the system difficult to modify, expand or test. Therefore, highly coupled systems usually reduce maintainability and testability. In the actual development process, with the development of server technology, the decoupling and coupling development model will be a mainstream development model. Decoupling is to divide the product design platform into the mainboard platform and the infrastructure platform. The mainboard platform is responsible for the mainboard development, and the infrastructure platform is responsible for the small board development, cable development and structural parts development. Finally, the mainboard platform and the infrastructure platform can form a product through coupling. The biggest advantage of this development model is that many combinations can be completed in one development, and many project developments can be completed in the end. However, in the case of decoupling, how to complete the electromagnetic compatibility test in the parts list is a problem that needs to be solved at present.

[0066] In the process of developing servers, there are many types of GPU modules in the parts list of the server and some GPU modules are not available at any time, such as some high-end GPU models. However, the developed servers need to be equipped with these high-end GPUs to pass the test and be sold. However, in the later stage of design, the product design has been finalized or the mold has been opened. If there is a problem at this time, it will have a great impact on the development cycle and development costs. In view of the problem of the wide variety of GPU modules in the parts list, the current test plan is to conduct full electromagnetic compatibility tests for the GPU models that can be obtained, and for the GPU models that cannot be obtained temporarily, they will be directly certified without testing or re-tested when high-end GPUs can be obtained, and then product certification will be carried out after the problem is solved. However, in view of the wide variety of GPU modules in the parts list, if the GPU models that can be obtained are tested, full electromagnetic compatibility tests will be carried out. Because there are at least 20-30 types of mainstream GPUs now, each of which undergoes 11 electromagnetic compatibility tests, it will incur high testing costs and time costs. Secondly, for the problem that high-end GPU models are temporarily unavailable, if you directly conduct certification or conduct supplementary testing before product certification when you can get a high-end GPU, because the product development has been completed when the GPU is obtained, direct certification may cause failures (bugs), resulting in failure of product certification. If you conduct supplementary testing before certification, because the product design has been finalized or the mold has been opened, if problems occur at this time, it will have a greater impact on the development cycle and development costs. Therefore, in the process of server design, how to quickly and effectively cover the list of components in the infrastructure to complete the electromagnetic compatibility test and solve the problem of conducting initial testing when the high-end GPU is not available is a problem that needs to be solved at present.

[0067] In addition, the power of GPU modules from different manufacturers ranges from 2000W to 17000W, and the power consumption of AI server systems is mainly determined by GPU modules. When using different GPU modules, the system power deviation will be particularly large. In the decoupled development mode, how to conduct a comprehensive test on all GPU modules in the parts list is a major problem at present. The conventional test method is to test the actual power according to the power of the server, but as the server power increases, the conventional EMC / safety test method will not be able to test the components.

[0068] Figure 3 This is a schematic diagram of the AI ​​server power supply circuit. Figure 3As shown in the figure, the current mainstream servers are composed of 54V power supply and 12V power supply. The GPU and fan are powered by 54V PSU (uninterruptible power supply), and the host system is powered by 12VPSU. The power of the host system is mainly composed of the CPU, memory, hard disk, network card and RAID card on the motherboard, and the fan is mainly composed of server fans. The GPU has the greatest impact on the server. The power of different GPUs varies greatly. A large GPU is generally composed of 8 small GPUs. The power of a single small GPU ranges from 250W to 1500W, so the power of a large GPU ranges from 2000W to 12000W. From the above analysis, it can be seen that the main factor that determines the power of AI servers is the type of installed GPU.

[0069] Based on the above content, an embodiment of the present invention provides a server testing system, which includes a load device and a load box. A decoupled development mode is adopted, a mainstream GPU is selected for load-pulling testing, the load device is controlled to run with a first preset load and the load box is controlled to increase an additional load. By changing the size of the additional load, various load conditions of the components can be fully covered, and electromagnetic compatibility tests can be performed under various load conditions. In addition, some GPU models are temporarily unavailable, and the additional load can be adjusted so that the sum of the first preset load and the additional load reaches the load of the mainstream GPU device, thereby performing electromagnetic compatibility testing under a simulated state. In the case of not getting a mainstream GPU, under the load power condition, electromagnetic compatibility problems that may occur in other components of the whole machine can be identified in advance.

[0070] In this embodiment, a server test system is provided, which includes: a server chassis, a load box and a test module, the server chassis includes: a server adapter board and a power supply; the server adapter board is used to access the load device;

[0071] The power supply is connected to the server adapter board, and the power supply is used to provide a first preset voltage to the load device through the server adapter board;

[0072] The test module is used to connect to the load device and control the load device to operate with a first preset load based on a first preset voltage;

[0073] The test module is connected to the load box, which is connected to the server adapter board. The test module is used to determine the additional load and control the load box to add the additional load to the server adapter board.

[0074] The test module is used to perform a first preset test on the server when the load of the server adapter board is the sum of the first preset load and the additional load.

[0075] Specifically, when the load device and the load box reach corresponding powers, a corresponding load will be generated on the server or the server adapter board of the server. Therefore, in this embodiment, the load can be represented by power.

[0076] Electromagnetic compatibility testing can be divided into electromagnetic radiation and electromagnetic tolerance. Electromagnetic radiation can be divided into radiated disturbance, conducted disturbance, harmonic current disturbance, voltage fluctuation and flicker. Electromagnetic tolerance can be divided into electrostatic discharge immunity test, radio frequency electromagnetic field radiation immunity test, radio frequency field conducted disturbance immunity test, surge immunity test, electrical fast transient pulse group immunity test, voltage sag, short interruption and voltage change immunity, power frequency magnetic field immunity test. By analyzing the test standards, electromagnetic radiation needs to be tested at maximum power, but the electromagnetic tolerance regulations do not mandate testing at maximum power, and the power does not affect the energy size of the electromagnetic tolerance project, so when the power is large, it can be tested by reducing the load, for example: no pressure is run, the fan speed is reduced, and the current is reduced to the range that the test equipment can withstand.

[0077] Table 1 Schematic diagram of server system power consumption

[0078]

[0079] As can be seen from Table 1, the current AI server system power consumption is mainly determined by the GPU module. If the power of a single GPU module is from 250W to 1500W, the power of a large GPU will be from 2000W to 12000W, and the power of the AI ​​server will be between 8287.2W and 18287.2W. Because there are many GPU manufacturers now, there may be a GPU every 100W from 250W to 1500W. When different GPUs are used, the system power deviation will be particularly large. In the decoupled development mode, how to fully test multiple GPUs is the current problem. Therefore, this embodiment takes the GPU as an example for explanation.

[0080] like Figure 5 As shown, the server test system includes: a server chassis, a load box and a test module. The server chassis includes: a server adapter board (i.e., a motherboard adapter board), a load device and a power supply (i.e., a 54V power backplane). In addition, the server chassis may also include a fan adapter board, which may be connected to a fan board (connecting a fan). The server adapter board is, for example, an NVGPU BOX / UBB OAM BOX board.

[0081] The power supply is connected to the server adapter board, and the server adapter board is connected to the load device. The power supply is used to provide a first preset voltage to the load device through the server adapter board. The load devices include: central processing unit, memory, RAID card, hard disk, fan, GPU module, etc. It can be seen from the above content that the expected load of the whole server is mainly determined by the GPU. This embodiment is explained by taking the load device as an example of GPU. The first preset voltage is, for example, 54V. The test module is connected to the load device, and is used to control the load device to run with a first preset load based on the first preset voltage. The first preset load is the maximum load of the load device, for example: 4000W, 5000W. The specific value is set according to actual needs.

[0082] The test module is connected to the load box, which is connected to the server adapter board. The test module is used to determine the additional load and control the load box to add the additional load to the server adapter board. The server's expected load is adjusted by the additional load to achieve the load test. For example, in the decoupled development mode, there will be 20-30 types of AI server GPU models. The test items can be classified by regulations, and a mainstream GPU can be selected for load test. That is, the first preset load remains unchanged. By changing the additional load of the load box, the server's expected load is adjusted, thereby solving the problem of electromagnetic compatibility testing under the condition of comprehensive coverage of components and avoiding problems in product certification. In addition, for the situation where some high-end GPU models are temporarily unavailable, the first preset load and the additional load can be superimposed to achieve the power of the mainstream GPU device, thereby simulating the electromagnetic compatibility test. In the case of not getting the mainstream GPU, the electromagnetic compatibility problems that may occur in other parts of the whole machine can be identified in advance.

[0083] The first preset test is, for example, a conducted emission test, a radiated emission test, a harmonic current emission test, a voltage fluctuation and flicker test, an input test, a temperature rise test, a short circuit test, etc. When the load of the server adapter board is the sum of the first preset load and the additional load, the control module performs the first preset test on the server, including: the control module obtains measurement data and reference data corresponding to the first preset test; compares the measurement data and the reference data, and determines the test result corresponding to the first preset test according to the comparison result.

[0084] It should be noted that this embodiment introduces the field of electromagnetic compatibility, in which safety test items can also be classified by type. Test items not related to power are directly reported in the report, and test items related to power can be tested directly by loading, thereby completing the safety certification report.

[0085] The server testing system provided in this embodiment has a testing module that controls the load device to run at a first preset load based on a first preset voltage, controls the load box to add an additional load to the server adapter board, combines the additional load with the first preset load, and implements a pull-load test. By changing the size of the additional load, various load conditions of the load device can be fully covered, and the first preset test can be performed on the server under various load conditions. In addition, by combining the additional load with the first preset load, the existing GPU module reaches the load of the missing GPU module, and the server is tested. This solves the problem of being unable to perform electromagnetic compatibility testing and safety testing on the server when some GPU modules are missing.

[0086] In some optional embodiments, the server adapter plate includes: a first preset number of load device connectors, a second preset number of power connectors, and a second preset number of ground holes;

[0087] The load device connector is used to connect to the load device and provide a first preset voltage to the load device;

[0088] The power connector is connected to the load box via a first cable, the ground hole is connected to the load box via a second cable, and the power connector, the first cable, the load box, the second cable and the ground hole form a current path;

[0089] The load bank is used to pass the current path to add additional load to the server adapter board.

[0090] Specifically, this embodiment is described by taking the load device being a GPU as an example. Therefore, the load device connector is a GPU connector. Figure 5 As shown, the server adapter board includes: a first preset number of load device connectors, a second preset number of power connectors, and a second preset number of ground holes (GNDVIA). The first preset number is, for example, 8, and the second preset number is, for example, 8. The specific values ​​of the first preset number and the second preset number are set according to actual needs. The power connector is, for example, a 54V power connector. The function of the ground hole is to connect the 54V on the surface of the server adapter board with the 54V on the inner layer. The number of ground holes depends on the size of the required current return. The load device connector is connected to the load device and is used to provide the load device with a first preset voltage.

[0091] The power connector is connected to the load box through the first cable, and the ground hole is connected to the load box through the second cable. The load box, the first cable, the second cable, the power connector and the ground hole constitute a current path. In addition, in order to ensure that the 54V power connector and GNDVIA have a good current path, it is necessary to weld cables of appropriate thickness. The thickness of the welded cables depends on the value of the current. The load box is used to pass the current path to add additional load to the server adapter board.

[0092] In this embodiment, the power connector is connected to the load box through the first cable, and the ground hole is connected to the load box through the second cable, so that the load box, the first cable, the second cable, the power connector and the ground hole form a current path. The load box can add an additional load to the server adapter board through the current path, and the additional load is combined with the first preset load to implement a load test.

[0093] In some optional embodiments, the power connector includes: a first through hole, wherein the first through hole is used to weld one end of the first cable, and the diameter of the first through hole is proportional to the safe current carrying capacity of the current path;

[0094] The ground hole comprises: a second through hole and a preset area, wherein the second through hole is used to weld one end of the second cable, the diameter of the second through hole is proportional to the safe current carrying capacity of the current path, and the preset area is used to fix one end of the second cable;

[0095] The first cable includes: a first shielding layer and a first magnetic ring, wherein the first shielding layer and the first magnetic ring are used to eliminate interference signals of the load box, and the thickness of the first cable is proportional to the safe current carrying capacity of the current path;

[0096] The second cable includes: a second shielding layer and a second magnetic ring, wherein the second shielding layer and the second magnetic ring are used to eliminate interference signals of the load box, and the thickness of the second cable is proportional to the safe current carrying capacity of the current path.

[0097] Specifically, Figure 5 As shown, the power connector is, for example, a 54V power connector. In order to ensure the flow of current and facilitate welding of external cables, the 54V power connector should be provided with a through hole, namely, the first through hole. The first through hole is used to weld one end of the first cable, and the diameter of the first through hole is proportional to the safe current carrying capacity of the current path. For example, the through hole diameter of the first through hole is 0.5mm, which can pass 1A current; the through hole diameter is 1mm, which can pass 4A current... The specific proportional relationship is set according to actual needs.

[0098] like Figure 6As shown, the ground hole includes: a metallized through hole, i.e., a second through hole, and a preset area. The diameter of the second through hole is proportional to the safe current carrying capacity of the current path. For example, the through hole diameter of the second through hole is 0.5mm, which can pass 1A current; the through hole diameter is 1mm, which can pass 4A current... The specific proportional relationship is set according to actual needs. In order to ensure stable cable welding, a preset area is set around the ground hole. For example, the preset area is: when the welding hole is firmly fixed, the soldermask_top (top solder mask layer) at the top of the screw hole TOP layer and the soldermask_bot (bottom solder mask layer) of the bot layer are not sprayed with green oil. In this way, while ensuring good current flow at the 54V point, fixing one end of the second cable ensures the stability of the cable fixation and ensures good grounding of GND.

[0099] In order to ensure that the 54V power connector and GNDVIA have a good current path, it is necessary to weld cables of appropriate thickness. In addition, in order to prevent the interference signal of the load box from affecting the test of the server, a shielding structure needs to be set for the cable to shield the interference signal. For example, a shielding layer needs to be wrapped around the cable. The shielding layer is generally wrapped with conductive cloth or copper foil, and a magnetic ring needs to be added to prevent the interference signal of the load box from entering the server.

[0100] The first cable includes: a first shielding layer and a first magnetic ring, and the first shielding layer and the first magnetic ring are used to eliminate interference signals from the load box. The thickness of the first cable is proportional to the safe current carrying capacity of the current path. For example, the thickness of the first cable depends on the magnitude of the current in the current path. The conversion relationship between the square number of wires of the first cable and the safe current carrying capacity of the current path is: the safe current carrying capacity corresponding to a 2.5 square millimeter copper power line is 28A; the safe current carrying capacity corresponding to a 4 square millimeter copper power line is 35A; the safe current carrying capacity corresponding to a 6 square millimeter copper power line is 48A; the safe current carrying capacity corresponding to a 10 square millimeter copper power line is 65A... The specific proportional relationship is set according to actual needs. The second cable includes: a second shielding layer and a second magnetic ring, wherein the second shielding layer and the second magnetic ring are used to eliminate interference signals from the load box, the thickness of the second cable is proportional to the safe current carrying capacity of the current path, the thickness of the second cable depends on the value of the current in the current path, and the conversion relationship between the square number of wires of the second cable and the safe current carrying capacity of the current path is: the safe current carrying capacity of a 2.5 square millimeter copper power line is 28A; the safe current carrying capacity of a 4 square millimeter copper power line is 35A; the safe current carrying capacity of a 6 square millimeter copper power line is 48A; the safe current carrying capacity of a 10 square millimeter copper power line is 65A... The specific proportional relationship is set according to actual needs. Figure 4 As shown, the cable is wrapped with a shield and a magnetic ring is added.

[0101] In this embodiment, a first through hole is provided for the power connector and welded to one end of the first cable, a second through hole is provided for the ground hole and welded to one end of the second cable, and a preset area is provided to fix one end of the second cable to ensure the stability of the current path. In addition, the cable diameter and through hole diameter are adjusted according to the safe current carrying capacity of the current path to ensure circuit safety. Finally, a shielding layer and a magnetic ring are provided for the cable to eliminate interference signals from the load box and ensure the accuracy of the server test.

[0102] In some optional implementations, the test module is further used to:

[0103] Control the load box to stop adding additional load to the server adapter board;

[0104] Adjusting the load device to operate at a second preset load, wherein the second preset load is smaller than the first preset load;

[0105] Run the second preset test on the server.

[0106] Specifically, the second preset test is, for example, an electromagnetic tolerance test. Electromagnetic tolerance tests include, for example, electrostatic discharge immunity test, radio frequency electromagnetic field radiation immunity test, radio frequency field conducted disturbance immunity test, surge immunity test, electrical fast transient pulse group immunity test, voltage sag, short interruption and voltage change immunity test, power frequency magnetic field immunity test, etc.

[0107] According to the above content, it can be known that the relevant standards and regulations do not have mandatory provisions that the second preset test, namely the electromagnetic tolerance test, needs to be performed under the maximum load of the server, and the server load does not affect the electromagnetic tolerance capability of the server. Because the current load device is running at the first preset load, the load box adds an additional load to the server adapter board. At this time, the server load is large. Before performing the second preset test on the server, the server load can be reduced, for example: do not run the load box, reduce the load of the load device, such as reducing the fan speed, and reduce the current to the range that the load device can withstand for testing.

[0108] Therefore, the load box is controlled to stop adding additional load to the server adapter board; the load device is adjusted to run at a second preset load, which may be 0 or other smaller values, and on this basis, a second preset test is performed on the server.

[0109] In this embodiment, the load box is controlled to stop adding additional load to the server adapter board, and the load device is adjusted to operate at the second preset load to reduce the server load. The second preset test is performed without requiring the server to operate at the maximum load to avoid the server operating at the maximum load and damaging the load device.

[0110] In some optional implementations, the specific process of performing the second preset test on the server, ie, performing the electromagnetic tolerance test on the server, includes steps A1 to A4.

[0111] Step A1: perform a radiation emission test on a server among multiple servers in a test environment and collect a radiation signal generated by the server.

[0112] Specifically, the radiation signal collection device is used to collect the radiation signal generated during the operation of the server.

[0113] Step A2: Perform waveform analysis on the radiation signal to determine the signal type.

[0114] Step A3: determining the test frequency based on the signal type and the radiation signal.

[0115] Specifically, in response to the signal type of the radiation signal being a narrowband signal, the peak frequency of the radiation signal is used as the test frequency; in response to the signal type of the radiation signal being a broadband signal, the three frequencies corresponding to the leftmost, rightmost and middle positions of the radiation signal are used as test frequencies.

[0116] Step A4, simulating a signal with a frequency equal to the test frequency in the test environment, and detecting whether the remaining servers are operating normally.

[0117] In this embodiment, a radiation emission signal test is performed on a server in the test environment and the radiation signal generated by the collector is collected. Then, a waveform analysis is performed on the collected radiation signal to determine the signal type. Then, the test frequency is determined based on the signal type and the collected radiation signal. Finally, the radiation signal of the test frequency is simulated and it is detected whether the remaining servers are operating normally. This enriches the selection of test frequencies during anti-radiation testing, and achieves more efficient and accurate electromagnetic tolerance testing of servers, ensuring that the servers can meet the requirements of radiation immunity and that the servers can operate normally without being affected by electromagnetic radiation in complex electromagnetic environments such as computer rooms.

[0118] According to an embodiment of the present invention, a server testing embodiment is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer device with data processing capabilities, such as a computer, a server, etc., and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0119] In this embodiment, a server testing method is provided, which is applied to a testing module. Figure 7 is a flow chart of a server testing method according to an embodiment of the present invention. Figure 7 As shown, the process includes the following steps:

[0120] Step S701, obtaining the load of the device in the server, and determining a first preset load and an expected load of the entire server according to the load of the device.

[0121] Specifically, when the load device and the load box reach corresponding powers, a corresponding load will be generated on the server or the server adapter board of the server. Therefore, in this embodiment, the load can be represented by power. This embodiment is described by taking the GPU as an example.

[0122] In the decoupled development mode, determine all GPU models that are matched to the server and record the load. According to the server GPU load, determine the expected load of the server as a whole, and select a GPU as the benchmark test device. For example, use the GPU with the largest power currently as the benchmark test device, and use the load of the benchmark test device as the first preset load. The first preset load is the maximum load of the load device, for example: 400W, 500W, and the specific value is set according to actual needs.

[0123] Step S702: Control the load device to operate at a first preset load based on a first preset voltage.

[0124] Step S703, determining an additional load according to the first preset load and the expected load of the whole machine, and controlling the load box to add an additional load to the server adapter board of the server, wherein the power supply in the server is used to provide a first preset voltage to the load device through the server adapter board.

[0125] Specifically, the additional load is determined according to the first preset load and the expected load of the whole machine, for example, the first preset load is 4000 W. The expected load of the whole machine is, for example, 5000 W, then the additional load is 1000 W, that is, the load box needs to supplement an additional load of 1000 W.

[0126] Solder the appropriate cables to the corresponding power supply P54V and GND on the server adapter board, and use the load box to connect P54V and GND respectively for load testing. Control the load box to add additional load to the server adapter board of the server.

[0127] Step S704: When the load of the server adapter board is the sum of the first preset load and the additional load, perform a first preset test on the server.

[0128] Specifically, the first preset test is, for example: Conducted Emission Test, Radiated Emission Test, Harmonic Current Emission Test, Voltage Fluctuation and Flicker Test, Input Test, Temperature Rise Test, Short Circuit Test, etc. When the load of the server adapter board is the sum of the first preset load and the additional load, the control module performs the first preset test on the server, including: the control module obtains measurement data and reference data corresponding to the first preset test; compares the measurement data and the reference data, and determines the test result corresponding to the first preset test according to the comparison result.

[0129] In the server testing method provided in this embodiment, the test module controls the load device to run at the first preset load based on the first preset voltage, controls the load box to add an additional load to the server adapter board, combines the additional load with the first preset load, and implements a pull-load test. By changing the size of the additional load, various load conditions of the load device can be fully covered, and the first preset test can be performed on the server under various load conditions. In addition, by combining the additional load with the first preset load, the existing GPU module reaches the load of the missing GPU module, and the server is tested. The problem of being unable to perform electromagnetic compatibility testing and safety testing on the server in the absence of some GPU modules is solved.

[0130] In some optional implementations, determining the additional load according to the first preset load and the expected load of the entire machine, and controlling the load box to add the additional load to the server adapter board of the server includes:

[0131] obtaining a third preset number of load banks;

[0132] Determine a load difference between an expected load of the whole machine and a first preset load, and use the load difference as an additional load;

[0133] determining a sub-load of the load bank according to the additional load and a third preset number;

[0134] Obtaining a second preset voltage of a load device connector in the server adapter board;

[0135] Determining a target value of a configuration parameter of the load box according to the sub-load and the second preset voltage;

[0136] The load box is started and the configuration parameters of the load box are modified to target values, wherein when the configuration parameters are the target values, the load box adds an additional load to the server adapter board of the server.

[0137] Specifically, a first preset number of load devices and a third preset number of load boxes are obtained, for example, the first preset number is 8, and the third preset number is 2.

[0138] Determine the load difference between the expected load of the whole machine and the first preset load, for example, if the first preset load is 4000 W and the expected load of the whole machine is 8000 W, then the load difference is 4000 W. The load difference is taken as the additional load, and therefore, the additional load is 4000 W.

[0139] The sub-load of the load box is determined according to the additional load and the third preset number, for example, the sub-load is 4000÷2=2000W.

[0140] Obtain a second preset voltage of the load device connector in the server adapter board, for example, 54 V. Determine a target value of the configuration parameter of the load box according to the sub-load and the second preset voltage, for example, if the configuration parameter is resistance, the target value is 54×54÷2000=1.458Ω.

[0141] The load box is started and the configuration parameters of the load box are modified to target values, wherein when the configuration parameters are the target values, the load box adds an additional load to the server adapter board of the server.

[0142] In this embodiment, the additional load of the load box and the target value of the configuration parameters of the load box are determined, and the configuration parameters of the load box are modified to the target value to control the load box to add an additional load to the server adapter board of the server. The additional load is used to perform a pull test to achieve the power of mainstream GPU devices, thereby solving the problem of conducting an electromagnetic compatibility test with full coverage of components and avoiding problems in product certification.

[0143] In some optional implementations, performing a first preset test on the server includes:

[0144] Acquire measurement data and reference data corresponding to a first preset test;

[0145] The measured data and the reference data are compared, and a test result corresponding to the first preset test is determined according to the comparison result.

[0146] Specifically, the first preset test includes, for example, a conducted emission test, a radiated emission test, a harmonic current emission test, a voltage fluctuation and flicker test, an input test, a temperature rise test, a short circuit test, and the like.

[0147] Acquire measurement data and reference data corresponding to the first preset test; compare the measurement data and the reference data, and determine a test result corresponding to the first preset test according to the comparison result.

[0148] For example: The first preset test is the conducted interference test. The conducted interference test is to evaluate the electromagnetic interference (EMI) level conducted by the device through the power line or signal line to ensure that the device does not interfere with other devices through the power line or signal line. Use appropriate test equipment, such as a spectrum analyzer, current probe, and power line filter to measure the interference level on the power line within the specified frequency range (usually 150kHz to 30MHz), that is, the measurement data. Compare the measurement data with the standard limit (i.e., reference data) to obtain the test results. The first preset test is the radiated emission test. The radiated emission test is to evaluate the electromagnetic interference (EMI) level radiated by the device through space to ensure that the device does not interfere with other devices through space radiation. Use appropriate test equipment, such as an antenna, a spectrum analyzer, and an electromagnetic field strength meter to measure the radiated emission level of the device within the specified frequency range (usually 30MHz to 1GHz), that is, the measurement data. Compare the measurement data with the standard limit (i.e., reference data) to obtain the test results. The first preset test is the harmonic current disturbance test. The harmonic current disturbance test is to evaluate the harmonic current level generated by the device under a nonlinear load. Ensure that the equipment does not generate excessive harmonic currents on the power grid, affecting the quality and stability of the power grid. Use appropriate test equipment, such as harmonic analyzers and current probes, to measure the harmonic current level on the power line within the specified frequency range (usually the 2nd to 40th harmonics), i.e., the measurement data. Compare the measurement data with the standard limit (i.e., the reference data) to obtain the test results. The first preset test is the voltage fluctuation and flicker test, which evaluates the impact of the equipment on the grid voltage during startup and operation, especially the voltage fluctuation and flicker phenomenon. Ensure that the equipment does not cause significant fluctuations and flickers in the grid voltage, affecting the normal operation of other equipment. Use appropriate test equipment, such as a voltage fluctuation and flicker meter, to measure the changes in grid voltage during the startup and operation of the equipment, and record the voltage fluctuation and flicker phenomenon, i.e., the measurement data. Compare the measurement data with the standard limit (i.e., the reference data) to obtain the test results.

[0149] In some optional embodiments, Figure 8 is a flow chart of a server electromagnetic compatibility alternative test method according to an embodiment of the present invention. Figure 8As shown, the method includes: classifying the electromagnetic compatibility test items of the AI ​​server according to the test regulations, one type is the test items that affect power, and the other type is the test items that have no effect on power. In the decoupled development mode, determine all GPU models that are equipped with the server and record the power. Determine the power of the entire machine based on the GPU power of the server and select a GPU as the benchmark test device. Solder the appropriate cables to the corresponding power supplies P54V and GND on the server adapter board. Use a load box to connect P54V and GND respectively for load testing. Test the radiation, conduction, harmonics, and flicker items that affect power separately in the system case. Quickly complete the electromagnetic compatibility test in the decoupled development mode.

[0150] Fig. 9 FIG. 1 is a flow chart of a server safety regulation replacement test method according to an embodiment of the present invention. Fig. 9 As shown, the method includes: classifying AI server safety test items according to test regulations, one type is test items that affect power, and the other type is test items that have no effect on power. In the decoupled development mode, determine all GPU models that are equipped with the server and record the power. Determine the power of the entire machine based on the GPU power of the server and select a GPU as the benchmark test device. Weld appropriate cables to the corresponding power supplies P54V and GND on the server adapter board. Use a load box to connect P54V and GND respectively for load testing. In the system case, test the input test, temperature rise test, input and short circuit test items that affect power separately. Quickly complete safety testing and certification work in the decoupled development mode. Combining the server safety alternative test method and the server electromagnetic compatibility alternative test method, the same technical problems in steps S701 to S704 can be solved.

[0151] In this implementation, under the decoupled development mode, a mainstream GPU is selected for load testing, thereby solving the problem of conducting an electromagnetic compatibility test under the condition of comprehensive coverage of components and avoiding problems in product certification. For some high-end GPU models that are temporarily unavailable, mainstream GPU models can be used for alternative testing. By loading, the power of mainstream GPU devices can be reached, thereby simulating electromagnetic compatibility testing. In the case of not getting a mainstream GPU, possible electromagnetic compatibility problems of other components of the whole machine can be identified in advance, greatly improving the pass rate of the design.

[0152] In this embodiment, a server testing device is also provided, which is used to implement the above-mentioned embodiments and preferred implementation modes, and the descriptions that have been made will not be repeated. As used below, the term "module" can implement a combination of software and / or hardware of a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceivable.

[0153] This embodiment provides a server testing device, which is applied to a testing module. The testing module is used to connect to a component slot in a server testing system in any of the above embodiments, such as Fig.10 As shown, including:

[0154] The acquisition unit 1001 is used to acquire the load of the device in the server, and determine the first preset load and the expected load of the server according to the load of the device;

[0155] A first control unit 1002, configured to control the load device to operate at a first preset load based on a first preset voltage;

[0156] The second control unit 1003 is used to determine the additional load according to the first preset load and the expected load of the whole machine, and control the load box to add the additional load to the server adapter board of the server, wherein the power supply in the server is used to provide the first preset voltage to the load device through the server adapter board;

[0157] The testing unit 1004 is used to perform a first preset test on the server when the load of the server adapter board is the sum of the first preset load and the additional load.

[0158] In some optional implementations, the second control unit 1003 determines the additional load according to the first preset load and the expected load of the whole machine, and controls the load box to add the additional load to the server adapter board of the server, including:

[0159] obtaining a third preset number of load banks;

[0160] Determine a load difference between an expected load of the whole machine and a first preset load, and use the load difference as an additional load;

[0161] determining a sub-load of the load bank according to the additional load and a third preset number;

[0162] Obtaining a second preset voltage of a load device connector in the server adapter board;

[0163] Determining a target value of a configuration parameter of the load box according to the sub-load and the second preset voltage;

[0164] The load box is started and the configuration parameters of the load box are modified to target values, wherein when the configuration parameters are the target values, the load box adds an additional load to the server adapter board of the server.

[0165] In some optional implementations, the testing unit 1004 performs a first preset test on the server, including:

[0166] Acquire measurement data and reference data corresponding to a first preset test;

[0167] The measured data and the reference data are compared, and a test result corresponding to the first preset test is determined according to the comparison result.

[0168] The further functional description of each of the above modules and units is the same as that of the above corresponding embodiments and will not be repeated here.

[0169] The server testing device in this embodiment is presented in the form of a functional unit, where the unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and memory that executes one or more software or fixed programs, and / or other devices that can provide the above functions.

[0170] The embodiment of the present invention also provides a computer device having the above Fig.10 The server test setup is shown.

[0171] See also Fig.11 , Fig.11 is a schematic diagram of the structure of a computer device provided by an optional embodiment of the present invention, such as Fig.11 As shown, the computer device includes: one or more processors 10, a memory 20, and interfaces for connecting various components, including high-speed interfaces and low-speed interfaces. Various components are connected to each other using different buses for communication, and can be installed on a common mainboard or installed in other ways as needed. The processor can process the instructions executed in the computer device, including instructions stored in or on the memory to display the graphical information of the GUI on an external input / output device (such as, a display device coupled to the interface). In some optional embodiments, if necessary, multiple processors and / or multiple buses can be used together with multiple memories and multiple memories. Similarly, multiple computer devices can be connected, and each device provides some necessary operations (for example, as a server array, a group of blade servers, or a multi-processor system). Fig.11 A processor 10 is taken as an example.

[0172] The processor 10 may be a central processing unit, a network processor or a combination thereof. The processor 10 may further include a hardware chip. The hardware chip may be a dedicated integrated circuit, a programmable logic device or a combination thereof. The programmable logic device may be a complex programmable logic device, a field programmable gate array, a general purpose array logic or any combination thereof.

[0173] The memory 20 stores instructions executable by at least one processor 10, so that at least one processor 10 executes the method shown in the above embodiment.

[0174] The memory 20 may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required for at least one function; the data storage area may store data created according to the use of the computer device, etc. In addition, the memory 20 may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some optional embodiments, the memory 20 may optionally include a memory remotely arranged relative to the processor 10, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0175] The memory 20 may include a volatile memory, such as a random access memory; the memory may also include a non-volatile memory, such as a flash memory, a hard disk or a solid state drive; the memory 20 may also include a combination of the above types of memory.

[0176] The computer device further comprises a communication interface 30 for the computer device to communicate with other devices or a communication network.

[0177] The embodiment of the present invention also provides a computer-readable storage medium. The method according to the embodiment of the present invention can be implemented in hardware, firmware, or can be implemented as a computer code that can be recorded in a storage medium, or can be implemented as a computer code that is originally stored in a remote storage medium or a non-temporary machine-readable storage medium and will be stored in a local storage medium through a network download, so that the method described herein can be stored in such software processing on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only storage memory, a random access memory, a flash memory, a hard disk or a solid-state hard disk, etc.; further, the storage medium can also include a combination of the above types of memories. It can be understood that a computer, a processor, a microprocessor controller, or programmable hardware includes a storage component that can store or receive software or computer code. When the software or computer code is accessed and executed by a computer, a processor, or hardware, the method shown in the above embodiment is implemented.

[0178] A part of the present invention may be applied as a computer program product, such as a computer program instruction, which, when executed by a computer, can call or provide the method and / or technical solution according to the present invention through the operation of the computer. Those skilled in the art should understand that the existence of the computer program instruction in a computer-readable medium includes, but is not limited to, a source file, an executable file, an installation package file, etc., and accordingly, the way in which the computer program instruction is executed by the computer includes, but is not limited to: the computer directly executes the instruction, or the computer compiles the instruction and then executes the corresponding compiled program, or the computer reads and executes the instruction, or the computer reads and installs the instruction and then executes the corresponding installed program. Here, the computer-readable medium may be any available computer-readable storage medium or communication medium accessible to the computer.

[0179] Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations are all within the scope defined by the present invention.

Claims

1. A server testing system, characterized in that: The system comprises: a server chassis, a load box and a test module, wherein the server chassis comprises: a server adapter board and a power supply; the server adapter board is used to access the load device; The power supply is connected to the server adapter board, and the power supply is used to provide a first preset voltage to the load device through the server adapter board; The test module is used to connect to the load device and control the load device to operate with a first preset load based on the first preset voltage; The test module is connected to the load box, which is connected to the server adapter board. The test module is used to determine the additional load and control the load box to add the additional load to the server adapter board. The test module is used to perform a first preset test on the server when the load of the server adapter board is the sum of the first preset load and the additional load.

2. The system according to claim 1, characterized in that The server adapter plate includes: a first preset number of load device connectors, a second preset number of power connectors, and a second preset number of ground holes; The load device connector is used to be connected to the load device to provide the first preset voltage to the load device; The power connector is connected to the load box via a first cable, the ground hole is connected to the load box via a second cable, and the power connector, the first cable, the load box, the second cable and the ground hole constitute a current path; The load box is used to add the additional load to the server adapter board through the current path.

3. The system according to claim 2, characterized in that The power connector comprises: a first through hole, wherein the first through hole is used for welding one end of the first cable, and the diameter of the first through hole is proportional to the safe current carrying capacity of the current path; The ground hole comprises: a second through hole and a preset area, wherein the second through hole is used to weld one end of the second cable, the diameter of the second through hole is proportional to the safe current carrying capacity of the current path, and the preset area is used to fix one end of the second cable; The first cable comprises: a first shielding layer and a first magnetic ring, wherein the first shielding layer and the first magnetic ring are used to eliminate interference signals of the load box, and the thickness of the first cable is proportional to the safe current carrying capacity of the current path; The second cable includes: a second shielding layer and a second magnetic ring, wherein the second shielding layer and the second magnetic ring are used to eliminate interference signals of the load box, and the thickness of the second cable is proportional to the safe current carrying capacity of the current path.

4. The system according to claim 1, characterized in that The test module is also used to: Controlling the load box to stop adding the additional load to the server adapter board; adjusting the load device to operate at a second preset load, wherein the second preset load is smaller than the first preset load; A second preset test is performed on the server.

5. A server testing method, characterized in that: Applied to the test module, the method comprises: Obtaining a load of a device in the server, and determining a first preset load and an expected load of the entire server according to the load of the device; Controlling the load device to operate at the first preset load based on a first preset voltage; Determine an additional load according to the first preset load and the expected load of the whole machine, and control the load box to add the additional load to the server adapter board of the server, wherein the power supply in the server is used to provide a first preset voltage to the load device through the server adapter board; When the load of the server adapter board is the sum of the first preset load and the additional load, a first preset test is performed on the server.

6. The method according to claim 5, characterized in that The determining the additional load according to the first preset load and the expected load of the whole machine, and controlling the load box to add the additional load to the server adapter board of the server, comprises: obtaining a third preset number of the load boxes; Determine a load difference between the expected load of the whole machine and the first preset load, and use the load difference as the additional load; Determining a sub-load of the load box according to the additional load and the third preset number; Obtaining a second preset voltage of a load device connector in the server adapter board; Determining a target value of a configuration parameter of the load box according to the sub-load and the second preset voltage; The load box is started and a configuration parameter of the load box is modified to a target value, wherein when the configuration parameter is the target value, the load box adds the additional load to the server adapter board of the server.

7. The method according to claim 5, characterized in that The performing a first preset test on the server includes: Acquiring measurement data and reference data corresponding to the first preset test; The measurement data and the reference data are compared, and a test result corresponding to the first preset test is determined according to the comparison result.

8. A server testing device, characterized in that: The device comprises: An acquisition unit, configured to acquire a load of a device in the server, and determine a first preset load and an expected load of the entire server according to the load of the device; A first control unit, configured to control the load device to operate at the first preset load based on a first preset voltage; a second control unit, configured to determine an additional load according to the first preset load and the expected load of the whole machine, and control the load box to add the additional load to the server adapter board of the server, wherein the power supply in the server is configured to provide a first preset voltage to the load device through the server adapter board; The testing unit is used to perform a first preset test on the server when the load of the server adapter board is the sum of the first preset load and the additional load.

9. A computer device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the server testing method according to any one of claims 5 to 7 by executing the computer instructions.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a computer to execute the server testing method according to any one of claims 5 to 7.

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