A multi-device fault analysis and evaluation system based on data display diagram

Abstract

The present invention relates to the technical field of power equipment fault analysis, and specifically discloses a multi-device fault analysis and evaluation system based on a data display diagram, which specifically includes: a fault data acquisition and processing module: acquiring the fault data of the power equipment through the data display diagram, and processing it to calculate the fault evaluation value; a high fault degree area evaluation module: comparing the fault evaluation value with the fault evaluation threshold to obtain the high fault degree area. After acquiring the high-degree fault equipment in the analysis sub-area, the present invention calculates the proportion of high-degree fault equipment and the proportion of the number of faulty equipment, calculates the fault evaluation value based on the proportion of high-degree fault equipment and the proportion of the number of faulty equipment, compares the fault evaluation value with the fault evaluation threshold, and obtains the high fault degree area, thereby being able to carry out targeted processing on the high fault degree area, and to carry out more targeted inspection and maintenance, thereby avoiding the waste of resources caused by blind inspection.

Description

Technical Field

[0001] The present invention relates to the technical field of power equipment fault analysis, and in particular to a multi-equipment fault analysis and evaluation system based on a data display diagram. Background Art

[0002] With the rapid development of the power industry, the safe and stable operation of power equipment is crucial to ensuring power supply and maintaining the stability of the power grid. However, various faults are inevitable in the operation of power equipment. If these faults are not discovered and handled in time, they may have a serious impact on the power grid and even cause large-scale power outages. Therefore, with the continuous development of technologies such as big data, cloud computing and artificial intelligence, a multi-device fault analysis and evaluation system based on data display diagrams has emerged, providing a new solution for power equipment fault analysis.

[0003] The Chinese invention patent with publication number CN107222339A discloses a fault analysis method and device for a power information communication system based on a graph database. The method performs in-depth analysis based on retrieval in the graph database, and can effectively and quickly process the status monitoring of power information communication equipment, confirm the scope of fault impact, and provide auxiliary support for evaluating the fault level and confirming the operation and maintenance inspection object.

[0004] However, after the data display diagram displays the warning of equipment failure, some existing systems can usually only provide basic information and fault types of the faulty equipment, but cannot further analyze the faulty equipment, and cannot carry out targeted processing of areas with higher fault levels, which leads to low management efficiency;

[0005] In view of this, we propose a multi-device fault analysis and evaluation system based on data display graph. Summary of the invention

[0006] The purpose of the present invention is to provide a multi-device fault analysis and evaluation system based on data display diagrams to solve the technical problems in the above background.

[0007] The purpose of the present invention can be achieved by the following technical solutions:

[0008] The present invention provides a multi-device fault analysis and evaluation system based on a data display diagram, which specifically includes: a fault data acquisition and processing module: acquiring the fault data of the power equipment through the data display diagram, processing it, and calculating the fault evaluation value; a high fault degree area evaluation module: comparing the fault evaluation value with the fault evaluation threshold, and acquiring the high fault degree area; a high fault degree area optimization module: based on the acquired high fault degree area, optimizing the inspection cycle of the high fault degree area; an inspection allocation planning module: acquiring the value of the newly established inspection cycle, analyzing it, and planning the inspection process.

[0009] As a further solution of the present invention: the process of obtaining the fault assessment value is:

[0010] Obtain the percentage of devices with high degree of failure and the percentage of the number of failed devices;

[0011] Substitute into the formula The fault assessment value PG is calculated, where CD represents the proportion of high-level faulty devices, GS represents the proportion of the number of faulty devices, and s1 and s2 are preset proportional coefficients.

[0012] As a further solution of the present invention: the process of obtaining the percentage of high-level faulty devices and the percentage of the number of faulty devices is as follows:

[0013] In the analysis sub-area, the number of devices with a high degree of failure is obtained, and the number of devices with a high degree of failure is ratioed to the total number of failed devices to obtain the ratio of devices with a high degree of failure;

[0014] In the analysis sub-area, the value of the number of faulty devices is ratioed to the value of the total number of devices to obtain the percentage of the number of faulty devices.

[0015] As a further solution of the present invention: the process of obtaining the numerical value of the high-level fault devices is as follows:

[0016] Get the number of single failures and the average proportion of single failure duration;

[0017] Substitute into the formula The fault performance value BX is calculated, where SZ represents the number of single faults, SC represents the average proportion of single fault duration, and a1 and a2 are preset proportional coefficients;

[0018] The fault performance value is compared with the fault performance threshold. If the fault performance value is greater than the fault performance threshold, the device is marked as a high-level fault device.

[0019] As a further solution of the present invention: the process of obtaining the average value of the number of single faults and the proportion of the single fault duration is as follows:

[0020] Divide the power equipment into several analysis sub-areas according to geographical location;

[0021] Preset a monitoring period, and obtain the faulty equipment of the power equipment in each analysis sub-area through a data display diagram, wherein the faulty equipment is the power equipment that fails during the monitoring period;

[0022] In the analysis sub-area, the number of faults of the faulty equipment is obtained and marked as a single fault number;

[0023] In the analysis sub-area, the fault duration value of each faulty device is obtained and marked as a single fault duration value. The single fault duration value is ratioed with the monitoring period to obtain a single fault duration ratio value. All single fault duration ratio values ​​of the faulty devices are summed and averaged to obtain the average single fault duration ratio value.

[0024] As a further solution of the present invention: the process of obtaining the high fault degree area is:

[0025] Obtaining a fault assessment value of each analysis sub-area, and comparing the fault assessment value with a fault assessment threshold;

[0026] If the fault assessment value is greater than the fault assessment threshold, a sub-region high fault degree signal is generated;

[0027] Based on the generated high fault level signals, these analysis sub-areas are marked as high fault level areas.

[0028] As a further solution of the present invention: the process of optimizing the inspection cycle of the area with high fault degree is:

[0029] The original inspection cycle corresponding to the area with a high degree of fault is obtained, the original inspection cycle is multiplied by the control ratio to obtain the inspection cycle adjustment value, the difference between the original inspection cycle and the inspection cycle adjustment value is calculated to obtain the newly set inspection cycle value.

[0030] As a further solution of the present invention: the process of obtaining the control ratio is:

[0031] Obtain all high-fault-degree areas and the fault assessment values ​​corresponding to the high-fault-degree areas, perform difference calculation on the fault assessment value and the fault assessment threshold to obtain a fault assessment deviation value, perform ratio calculation on the fault assessment deviation value and the fault assessment value to obtain a control ratio.

[0032] As a further solution of the present invention: the process of planning the inspection process is:

[0033] The total analysis time is subtracted from the newly set inspection cycles corresponding to other areas with high fault severity to obtain a time deviation value, and the time deviation value is compared with zero;

[0034] If the time deviation value is less than or equal to zero, a signal to be integrated is generated;

[0035] Obtain the high-fault area corresponding to the generated signal to be integrated, extract the high-fault area corresponding to the maximum value of the time deviation value, merge the high-fault area with the priority merging area, and mark it as the integration area, calculate the total analysis time of the integration area, and perform iterative calculation until it cannot be merged. The inspection route of the inspector is all the analysis sub-areas of the integration area.

[0036] As a further solution of the present invention: the acquisition process of the total analysis time is:

[0037] Obtain the newly set inspection cycle values ​​corresponding to all high-fault-degree areas, extract the smallest newly set inspection cycle, mark it as the minimum newly set inspection cycle value, and mark the high-fault-degree area corresponding to the minimum newly set inspection cycle value as the priority merging area;

[0038] The total analysis time is obtained by summing up the minimum value of the newly set inspection cycle, the time required for inspection, and the travel time between areas with high fault levels.

[0039] Beneficial effects of the present invention:

[0040] (1) The present invention obtains faulty devices in the analysis sub-area, analyzes the number of faults and fault duration of the faulty devices in the monitoring period, calculates the average of the number of single faults and the proportion of single fault duration, calculates the fault performance value based on the average of the number of single faults and the proportion of single fault duration, compares the fault performance value with the fault performance threshold, and marks it as a high-level fault device if the fault performance value is greater than the fault performance threshold, so that the faulty devices in the analysis sub-area can be analyzed and obtained, and the high-level fault devices can be timely understood and further analyzed and processed;

[0041] (2) After obtaining the high-degree fault devices in the analysis sub-area, the present invention calculates the proportion of high-degree fault devices and the proportion of the number of faulty devices, calculates the fault assessment value based on the proportion of high-degree fault devices and the proportion of the number of faulty devices, compares the fault assessment value with the fault assessment threshold, and thus can carry out targeted processing on the high-degree fault area, conduct more targeted inspection and maintenance, and avoid waste of resources caused by blind inspection;

[0042] (3) After obtaining the high-fault-degree area, the present invention calculates the control ratio by the ratio of the deviation value between the fault assessment value corresponding to the high-fault-degree area and the fault assessment threshold to the fault assessment value, and calculates the new inspection cycle value based on the control ratio. The new inspection cycle is smaller than the original inspection cycle, so that the high-fault-degree area can be inspected frequently, and the hidden faults can be discovered in time. When a fault occurs, the frequent inspection can be used to handle the fault more timely, thereby improving the management efficiency of the high-fault-degree area;

[0043] (4) When arranging staff to inspect areas with high fault levels, the present invention plans the inspection routes in advance, and obtains the total analysis time by summing the newly established inspection cycle, the inspection time and the travel time between areas with high fault levels. The total analysis time is subtracted from the newly established inspection cycles corresponding to other areas with high fault levels to obtain a time deviation value, and based on the time deviation value, it is compared with zero to determine whether a signal that cannot be integrated or a signal to be integrated is generated. The area with high fault levels corresponding to the maximum value of the time deviation value is extracted from the signal to be integrated, and an initial merger is performed to obtain an integrated area, and iterative calculations are performed until the merger cannot be performed. The analysis sub-area within the integrated area is the inspection route area corresponding to the inspection personnel, and all areas with high fault levels are integrated and assigned corresponding inspection personnel, so that the total number of inspection personnel can be reduced and the management cost can be reduced by merging and integrating without affecting the inspection time result. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] The present invention will be further described below in conjunction with the accompanying drawings.

[0045] Figure 1 It is a flow chart of a multi-device fault analysis and evaluation system based on a data display diagram of the present invention;

[0046] Figure 2 It is a flowchart of a process for obtaining a fault performance value in a multi-device fault analysis and evaluation system based on a data display diagram of the present invention;

[0047] Figure 3 The invention is a flowchart of the process of obtaining fault evaluation values ​​in a multi-device fault analysis and evaluation system based on a data display diagram. DETAILED DESCRIPTION

[0048] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0049] Embodiment 1:

[0050] See also Figure 1 - Figure 3 As shown, a multi-device fault analysis and evaluation system based on a data display diagram according to an embodiment of the present invention specifically includes the following modules:

[0051] Fault data acquisition and processing module: obtains fault data of power equipment through data display diagram, processes it, and calculates fault assessment value;

[0052] In some embodiments, the total area where the power equipment is located is divided into a number of analysis sub-areas according to the power equipment groups;

[0053] It should be noted that there is one power device group in one analysis sub-area, each power device group contains multiple power devices, and the power devices in each power device group are the same;

[0054] Preset monitoring period, which is set by technicians in this field based on their work experience;

[0055] Obtain the faulty equipment of the power equipment in each analysis sub-area through the data display diagram, wherein the faulty equipment is the power equipment that fails during the monitoring period;

[0056] In the analysis sub-area, the number of faults of the faulty equipment is obtained and marked as a single fault number;

[0057] In the analysis sub-area, the fault duration value of each faulty device is obtained and marked as a single fault duration value. The single fault duration value is ratioed with the monitoring period to obtain a single fault duration ratio value. All single fault duration ratio values ​​of the faulty device are summed and averaged to obtain the average single fault duration ratio value.

[0058] Substitute into the formula The fault performance value BX is calculated, where SZ represents the number of single faults, SC represents the average proportion of single fault duration, and a1 and a2 are preset proportional coefficients;

[0059] It should be explained that the meaning reflected by the fault performance value is: the fault performance value is calculated by the single fault number value and the average value of the single fault duration ratio, wherein the single fault number value is the number of faults that occur in the faulty device during the monitoring period, that is, the larger the single fault number value, the larger the fault performance value, and the higher the fault degree of the corresponding faulty device; the average value of the single fault duration ratio is the average fault duration of multiple faults of the faulty device, that is, the larger the average value of the single fault duration ratio, the larger the fault performance value, and the higher the fault degree of the corresponding faulty device;

[0060] Compare the fault performance value with the fault performance threshold, wherein the fault performance threshold is a critical value used to judge the fault degree of the faulty device and is set by technicians in this field based on historical experimental data;

[0061] If the fault performance value is less than or equal to the fault performance threshold, it means that the faulty device has a small number of faults during the monitoring period and the average fault duration is not high, and is marked as a low-level fault device;

[0062] If the fault performance value is greater than the fault performance threshold, it means that the faulty device has a large number of faults or a high average fault duration during the monitoring period, and is marked as a high-level fault device;

[0063] In the analysis sub-area, the number of devices with a high degree of failure is obtained, and the number of devices with a high degree of failure is ratioed to the total number of failed devices to obtain the ratio of devices with a high degree of failure;

[0064] In the analysis sub-area, the value of the number of faulty devices is compared with the value of the total number of devices to obtain the percentage of the number of faulty devices;

[0065] Substitute into the formula The fault assessment value PG is calculated, where CD represents the proportion of devices with high degree of faults, GS represents the proportion of the number of faulty devices, and s1 and s2 are preset proportional coefficients;

[0066] It should be explained that the meaning reflected by the fault assessment value is: the fault assessment value is calculated by the ratio of high-level fault devices and the ratio of the number of fault devices, wherein the ratio of high-level fault devices represents the ratio of high-level fault devices to all fault devices, and the more high-level fault devices there are, the higher the fault degree of the analysis sub-area, and the ratio of the number of fault devices represents the ratio of fault devices to all fault devices in the analysis sub-area, and the more fault devices there are, the higher the fault degree of the analysis sub-area;

[0067] High fault degree area assessment module: compares the fault assessment value with the fault assessment threshold to obtain the high fault degree area;

[0068] In some embodiments, a fault assessment value of each analysis sub-region is obtained, and the fault assessment value is compared with a fault assessment threshold, wherein the fault assessment threshold is a critical value used to judge the degree of fault in the analysis sub-region, and is summarized and set by a person skilled in the art based on historical multiple experimental data;

[0069] If the fault assessment value is less than or equal to the fault assessment threshold, it means that the fault degree of the analyzed sub-region is low, and a sub-region low fault degree signal is generated;

[0070] If the fault assessment value is greater than the fault assessment threshold, it means that the fault degree of the analyzed sub-region is high, and a sub-region high fault degree signal is generated;

[0071] Based on the generated high fault degree signals, these analysis sub-areas are marked as high fault degree areas;

[0072] The technical solution of the embodiment of the present invention is mainly as follows: by acquiring the faulty equipment in the analysis sub-area, analyzing the number of faults and the fault duration of the faulty equipment in the monitoring period, calculating the average of the number of single faults and the proportion of the single fault duration, calculating the fault performance value based on the average of the number of single faults and the proportion of the single fault duration, comparing the fault performance value with the fault performance threshold, if the fault performance value is greater than the fault performance threshold, marking it as a high-degree fault device, so that the faulty equipment in the analysis sub-area can be analyzed and acquired, and the high-degree fault devices can be timely understood and further analyzed and processed;

[0073] After obtaining the high-level fault devices in the analysis sub-area, calculate the proportion of high-level fault devices and the proportion of the number of faulty devices, calculate the fault assessment value based on the proportion of high-level fault devices and the proportion of the number of faulty devices, compare the fault assessment value with the fault assessment threshold, and identify areas with high fault levels. This allows targeted processing of areas with high fault levels, more targeted inspections and maintenance, and avoids waste of resources caused by blind inspections.

[0074] Embodiment 2:

[0075] On the basis of Example 1, a multi-device fault analysis and evaluation system based on a data display diagram according to an embodiment of the present invention further includes the following modules:

[0076] High-fault-degree area optimization module: Based on the acquired high-fault-degree areas, the inspection cycle of the high-fault-degree areas is optimized;

[0077] In some embodiments, all high-fault-degree areas and the fault assessment values ​​corresponding to the high-fault-degree areas are obtained, the fault assessment value is calculated to be different from the fault assessment threshold to obtain a fault assessment deviation value, and the fault assessment deviation value is calculated to be a ratio of the fault assessment value to the fault assessment value to obtain a control ratio;

[0078] Obtain the original inspection cycle corresponding to the area with a high degree of faults, multiply the original inspection cycle by the control ratio to obtain the inspection cycle adjustment value, calculate the difference between the original inspection cycle and the inspection cycle adjustment value to obtain the newly set inspection cycle value;

[0079] Based on the newly set inspection cycle value, inspections are carried out on areas with high fault levels, so that more frequent inspections can timely discover potential faults, improve the efficiency of discovering and responding to faults, and improve management efficiency.

[0080] Inspection allocation planning module: obtains the value of the newly set inspection cycle, analyzes it, and plans the inspection process;

[0081] In some embodiments, the newly set inspection cycle values ​​corresponding to all high-fault-degree areas are obtained, the smallest newly set inspection cycle is extracted, marked as the minimum newly set inspection cycle value, and the high-fault-degree area corresponding to the minimum newly set inspection cycle value is marked as a priority merging area;

[0082] The new minimum inspection cycle, the inspection time, and the travel time between the areas with high fault levels are summed to obtain the total analysis time.

[0083] It should be noted that the time required for inspection is obtained by evaluating the historical work status and historical working time of the assigned inspection personnel;

[0084] The travel time between high-fault-degree areas is the total time required for the assigned inspection personnel to travel from the current high-fault-degree area to another high-fault-degree area;

[0085] The total analysis time is subtracted from the newly set inspection cycles corresponding to other areas with high fault severity to obtain a time deviation value, and the time deviation value is compared with zero;

[0086] If the time deviation value is greater than zero, it means that the total analysis time is less than the newly set inspection cycle corresponding to other high-fault-degree areas. The inspector cannot inspect these two high-fault-degree areas at the same time, generating an unintegrated signal;

[0087] If the time deviation value is less than or equal to zero, it means that the total analysis time is greater than or equal to the newly established inspection cycle corresponding to other high-fault-degree areas. The inspector can inspect these two high-fault-degree areas at the same time to generate a signal to be integrated;

[0088] Obtain the high-fault area corresponding to the generated signal to be integrated, extract the high-fault area corresponding to the maximum value of the time deviation value, merge the high-fault area with the priority merging area, and mark it as the integration area, calculate the total analysis time of the integration area, and perform iterative calculation until it cannot be merged. Then the inspection route of the inspector is all the analysis sub-areas of the integration area;

[0089] Before each merger, obtain the numerical value of the number of analysis sub-regions contained in the integrated area, and compare the numerical value of the number of analysis sub-regions contained in the integrated area with the threshold value of the number of integrated sub-regions, wherein the threshold value of the number of integrated sub-regions is the maximum workload that the inspector can bear, and is evaluated and set based on the historical maximum workload of the inspector;

[0090] If the value of the number of analysis sub-regions contained in the integrated region is less than or equal to the threshold of the number of integrated sub-regions, the merging can continue. If the value of the number of analysis sub-regions contained in the integrated region is greater than the threshold of the number of integrated sub-regions, the merging needs to be stopped.

[0091] The above comparison process can avoid the situation where the number of analysis sub-areas in the integrated area exceeds the maximum workload limit of the inspection personnel, resulting in low work efficiency and substandard inspection results;

[0092] According to the above process, all the areas with high fault degree are integrated, so that the management cost can be reduced by integrating the areas with high fault degree, optimizing the inspection route and reducing the number of inspection personnel;

[0093] The technical solution of the embodiment of the present invention is mainly as follows: after obtaining the area with a high degree of fault, the control ratio is calculated by the ratio of the deviation value between the fault assessment value corresponding to the area with a high degree of fault and the fault assessment threshold to the fault assessment value, and the newly set inspection cycle value is calculated based on the control ratio. The newly set inspection cycle is smaller than the original inspection cycle, so that the high degree of fault area can be inspected frequently, and the hidden faults can be discovered in time. Frequent inspections can be used to handle the fault more timely when a fault occurs, thereby improving the management efficiency of the area with a high degree of fault;

[0094] When arranging staff to inspect areas with high fault levels, plan their inspection routes in advance, and obtain the total analysis time by summing the newly established inspection cycle, the time required for inspection, and the travel time between areas with high fault levels. The total analysis time is subtracted from the newly established inspection cycles corresponding to other areas with high fault levels to obtain the time deviation value. The time deviation value is compared with zero to determine whether a signal that cannot be integrated or a signal to be integrated is generated. The high fault level area corresponding to the maximum value of the time deviation value is extracted from the signal to be integrated, and the integrated area is obtained by initial merging. It is then iterated until it cannot be merged. The analysis sub-area within the integrated area is the inspection route area corresponding to the inspector. All areas with high fault levels are integrated and assigned corresponding inspectors. Thus, the total number of inspectors can be reduced and management costs can be reduced by merging and integrating without affecting the inspection time results.

[0095] The size of the above threshold is set to facilitate comparison. The size of the threshold depends on the amount of sample data and the cardinality set by the technicians in this field for each group of sample data. For example, in the actual process, there are many groups of single fault times and single fault duration ratio averages. Many groups of single fault times and single fault duration ratio averages are processed to obtain the fault performance values ​​of the corresponding groups. The staff evaluates the fault degree of the faulty equipment based on so many groups of fault performance values, thereby obtaining a corresponding relationship between the fault performance value and the fault degree of the faulty equipment. Then, the threshold of the fault performance value is derived and divided according to the fault degree of the faulty equipment, thereby obtaining a fault performance threshold. The obtained fault performance value is compared with the fault performance threshold, that is, the fault degree of the faulty equipment corresponding to the fault performance value is identified.

[0096] The above is a detailed description of an embodiment of the present invention, but the content is only a preferred embodiment of the present invention and cannot be considered to limit the scope of implementation of the present invention. All equivalent changes and improvements made within the scope of the present invention should still fall within the scope of the patent coverage of the present invention.

Claims

1. A multi-device fault analysis and evaluation system based on data display diagram, characterized in that: Specifically include: Fault data acquisition and processing module: obtains fault data of power equipment through data display diagram, processes it, and calculates fault assessment value; High fault degree area assessment module: compares the fault assessment value with the fault assessment threshold to obtain the high fault degree area; High-fault-degree area optimization module: Based on the acquired high-fault-degree areas, the inspection cycle of the high-fault-degree areas is optimized; Inspection allocation planning module: obtains the value of the newly set inspection cycle, analyzes it, and plans the inspection process; The process of planning the inspection process is as follows: The total analysis time is subtracted from the newly set inspection cycles corresponding to other areas with high fault severity to obtain a time deviation value, and the time deviation value is compared with zero; If the time deviation value is less than or equal to zero, a signal to be integrated is generated; Obtain the high-fault area corresponding to the generated signal to be integrated, extract the high-fault area corresponding to the maximum value of the time deviation value, merge the high-fault area with the priority merging area, and mark it as the integration area, calculate the total analysis time of the integration area, and perform iterative calculation until it cannot be merged. Then the inspection route is all the analysis sub-areas of the integration area. The process of optimizing the inspection cycle for areas with high fault severity is as follows: Obtain the original inspection cycle corresponding to the area with a high degree of faults, multiply the original inspection cycle by the control ratio to obtain the inspection cycle adjustment value, calculate the difference between the original inspection cycle and the inspection cycle adjustment value to obtain the newly set inspection cycle value; The total analysis time and the acquisition process of the priority merge area are as follows: Obtain the newly set inspection cycle values ​​corresponding to all high-fault-degree areas, extract the smallest newly set inspection cycle, mark it as the minimum newly set inspection cycle value, and mark the high-fault-degree area corresponding to the minimum newly set inspection cycle value as the priority merging area; The total analysis time is obtained by summing up the minimum value of the newly set inspection cycle, the time required for inspection, and the travel time between areas with high fault levels.

2. A multi-device fault analysis and evaluation system based on data display diagram according to claim 1, characterized in that: The process of obtaining the fault assessment value is as follows: Obtain the percentage of devices with high degree of failure and the percentage of the number of failed devices; Substitute into the formula , the fault assessment value PG is calculated, where CD represents the proportion of high-level faulty devices, GS represents the proportion of the number of faulty devices, and s1 and s2 are preset proportional coefficients.

3. A multi-device fault analysis and evaluation system based on data display diagram according to claim 2, characterized in that: The process of obtaining the percentage of high-level faulty devices and the percentage of the number of faulty devices is as follows: In the analysis sub-area, the number of devices with a high degree of failure is obtained, and the number of devices with a high degree of failure is ratioed to the total number of failed devices to obtain the ratio of devices with a high degree of failure; In the analysis sub-area, the value of the number of faulty devices is ratioed to the value of the total number of devices to obtain the percentage of the number of faulty devices.

4. The multi-device fault analysis and evaluation system based on data display diagram according to claim 2 is characterized in that: The process of obtaining the numerical value of the high-level fault devices is as follows: Get the number of single failures and the average proportion of single failure duration; Substitute into the formula , calculate the fault performance value BX, where SZ represents the number of single faults, SC represents the average proportion of single fault duration, and a1 and a2 are preset proportional coefficients; The fault performance value is compared with the fault performance threshold. If the fault performance value is greater than the fault performance threshold, the device is marked as a high-level fault device.

5. The multi-device fault analysis and evaluation system based on data display diagram according to claim 4 is characterized in that: The process of obtaining the average value of the number of single faults and the proportion of single fault duration is as follows: Divide the power equipment into several analysis sub-areas according to geographical location; Preset a monitoring period, and obtain the faulty equipment of the power equipment in each analysis sub-area through a data display diagram, wherein the faulty equipment is the power equipment that fails during the monitoring period; In the analysis sub-area, the number of faults of the faulty equipment is obtained and marked as a single fault number; In the analysis sub-area, the fault duration value of each faulty device is obtained and marked as a single fault duration value. The single fault duration value is ratioed with the monitoring period to obtain a single fault duration ratio value. All single fault duration ratio values ​​of the faulty devices are summed and averaged to obtain the average single fault duration ratio value.

6. The multi-device fault analysis and evaluation system based on data display diagram according to claim 1 is characterized in that: The process of obtaining the high fault degree area is as follows: Obtaining a fault assessment value of each analysis sub-area, and comparing the fault assessment value with a fault assessment threshold; If the fault assessment value is greater than the fault assessment threshold, a sub-region high fault degree signal is generated; Based on the generated high fault level signals, these analysis sub-areas are marked as high fault level areas.

7. The multi-device fault analysis and evaluation system based on data display diagram according to claim 1 is characterized in that: The process of obtaining the control ratio is as follows: Obtain all high-fault-degree areas and the fault assessment values ​​corresponding to the high-fault-degree areas, perform difference calculation on the fault assessment value and the fault assessment threshold to obtain a fault assessment deviation value, perform ratio calculation on the fault assessment deviation value and the fault assessment value to obtain a control ratio.

Images