Alpha particle measurement apparatus, method, device, storage medium and program product

Abstract

The application relates to an alpha particle measuring device, method, apparatus, storage medium and program product. The device comprises a cavity surrounded by a side wall, a cavity top and a cavity bottom; a collector and a cathode are arranged in the cavity; the collector is arranged on the cavity top and the cathode is arranged on the cavity bottom; the collector is parallel to the cathode; the distance between the collector and the cathode satisfies a first preset distance; the collector comprises a plurality of first anode filaments arranged in a first direction and a plurality of second anode filaments arranged in a second direction; the distance between each first anode filament and each second anode filament in a third direction is a second preset distance; the distance between two adjacent first anode filaments in the first direction is a third preset distance; and the distance between two adjacent second anode filaments in the second direction is a fourth preset distance. The method can improve the accuracy of alpha particle measurement results.

Description

Technical Field

[0001] This application relates to the field of materials detection technology, and in particular to an alpha particle measurement device, method, apparatus, storage medium, and program product. Background Technology

[0002] With the development of materials detection technology, alpha particle measurement technology has emerged. Alpha particle measurement technology is an indispensable tool in fields such as radiation protection, nuclear material characterization, and radioactive waste management. As the requirements for radiation environment monitoring and radioactive material detection increase, higher demands are now being placed on the accuracy of alpha particle measurement results.

[0003] Current alpha particle measurement techniques typically utilize an alpha particle ionization chamber as the alpha particle measurement device to measure alpha particles in a sample. However, in the measurement process, the collecting electrode of the existing alpha particle measurement device is usually integrated; for example, current alpha particle measurement devices typically employ a flat or cylindrical collecting electrode. Clearly, this integrated collecting electrode is detrimental to improving the spatial resolution of the alpha particle measurement device, thus leading to a decrease in the accuracy of the alpha particle measurement results. Summary of the Invention

[0004] Therefore, it is necessary to provide an alpha particle measurement device, method, apparatus, computer-readable storage medium, and computer program product that can improve the accuracy of alpha particle measurement results in response to the above-mentioned technical problems.

[0005] In a first aspect, this application provides an alpha particle measurement device, comprising:

[0006] The cavity is formed by the side walls, top, and bottom of the equipment.

[0007] The cavity contains a collecting electrode and a cathode; the collecting electrode is located at the top of the cavity, and the cathode is located at the bottom of the cavity; the collecting electrode and the cathode are parallel; the distance between the collecting electrode and the cathode satisfies a first preset distance; the collecting electrode includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction; the distance between each first anode wire and each second anode wire in the third direction is a second preset distance, the distance between two adjacent first anode wires in the first direction is a third preset distance, and the distance between two adjacent second anode wires in the second direction is a fourth preset distance;

[0008] The collecting electrode is used to collect electrons generated by the ionization of the gas by alpha particles and to generate an induced signal; the cathode is used to hold the sample to be tested.

[0009] Secondly, this application also provides an alpha particle measurement method, applied in the alpha particle measurement device as provided in the first aspect of this application, comprising:

[0010] Place the sample to be tested on the cathode;

[0011] A gas is introduced between the collector and the cathode to ionize alpha particles, and a voltage difference is created between the collector and the cathode so that multiple alpha particles contained in the cavity ionize the gas.

[0012] During the ionization process, multiple sensing signals generated by the collecting electrode after each alpha particle ionizes the working gas are acquired;

[0013] By analyzing the various sensing signals, at least one target α particle in the sample to be tested can be identified.

[0014] Thirdly, this application also provides an alpha particle measuring device, applied in the alpha particle measuring equipment as provided in the first aspect of this application, comprising:

[0015] The placement module is used to place the sample to be tested onto the cathode;

[0016] An ionization module is used to fill the space between the collector and the cathode with a gas that interacts with alpha particles, and to create a voltage difference between the collector and the cathode so that multiple alpha particles contained in the cavity ionize the gas.

[0017] The acquisition module is used to acquire multiple sensing signals generated by the collecting electrode for the electrons produced by each alpha particle after ionizing the working gas during the ionization process.

[0018] The analysis module is used to analyze the various sensing signals and identify at least one target alpha particle in the sample to be tested.

[0019] Fourthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, implements some or all of the steps described in any method of the first aspect of the embodiments of this application.

[0020] Fifthly, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, implements some or all of the steps described in any method of the first aspect of the embodiments of this application.

[0021] The aforementioned alpha particle measuring device, method, apparatus, computer-readable storage medium, and computer program product include: a cavity surrounded by the sidewalls, top, and bottom of the device; a collecting electrode and a cathode are disposed within the cavity; the collecting electrode is disposed at the top of the cavity, and the cathode is disposed at the bottom of the cavity; the collecting electrode and the cathode are parallel; the distance between the collecting electrode and the cathode satisfies a first preset distance; the collecting electrode includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction; the distance between each first anode wire and each second anode wire in a third direction is a second preset distance, the distance between two adjacent first anode wires in the first direction is a third preset distance, and the distance between two adjacent second anode wires in the second direction is a fourth preset distance; wherein, the collecting electrode is used to collect electrons generated by the ionization of the reacting gas by alpha particles and generate an induction signal; the cathode is used to place the sample to be measured. Since the alpha particle measuring device provided in this application embodiment has a collecting electrode composed of an array of anode wires consisting of multiple first anode wires and multiple second anode wires, the spatial resolution can be improved by presenting the collecting electrode as an array of anode wires, thereby improving the accuracy of the induced signal generated on the collecting electrode by electrons generated after alpha particles ionize the working gas, and further improving the accuracy of alpha particle measurement results. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a schematic diagram of the structure of an alpha particle measuring device in one embodiment;

[0024] Figure 2 This is a flowchart illustrating an alpha particle measurement method in one embodiment;

[0025] Figure 3 This is a schematic diagram of the structure of a two-dimensional geometric coordinate region in one embodiment;

[0026] Figure 4 This is a waveform diagram of the pulse signal corresponding to the α particles emitted from the sample under test in one embodiment;

[0027] Figure 5 The signal waveform of an alpha particle emitted from the top of the cavity (or from the collecting electrode);

[0028] Figure 6 This is a structural block diagram of an alpha particle measuring device in one embodiment;

[0029] Figure 7 This is an internal structural diagram of a computer device in one embodiment;

[0030] Figure 8 This is a diagram of the internal structure of a computer device in another embodiment. Detailed Implementation

[0031] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0032] like Figure 1 As shown, this application provides an alpha particle measurement device, such as... Figure 1 Image (a) shows a front view of the alpha particle measuring device, as shown below. Figure 1 (b) shows a side view of the alpha particle measuring device. Figure 1 The alpha particle measuring device shown in (a) is described in detail. The alpha particle measuring device includes a cavity surrounded by the side walls of the device, the top of the cavity, and the bottom of the cavity.

[0033] The cavity contains a collecting electrode and a cathode; the collecting electrode is located at the top of the cavity, and the cathode is located at the bottom of the cavity; the collecting electrode and the cathode are parallel; the distance between the collecting electrode and the cathode satisfies a first preset distance; the collecting electrode includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction; the distance between each first anode wire and each second anode wire in the third direction is a second preset distance, the distance between two adjacent first anode wires in the first direction is a third preset distance, and the distance between two adjacent second anode wires in the second direction is a fourth preset distance;

[0034] The collecting electrode is used to collect electrons generated by the ionization of the gas by alpha particles and to generate an induced signal; the cathode is used to hold the sample to be tested.

[0035] The alpha particle measurement device is an ionization chamber used to measure alpha particles in the sample. Alpha particles are radioactive particles. When an electric field exists between the collector and the cathode, the alpha particles ionize the gas along their trajectory, causing the gas to produce electron-ion pairs. The electrons in the electron-ion pairs produced by the gas move towards the collector under the influence of the electric field.

[0036] The working gas is used to ionize alpha particles in the cavity when an electric field exists between the collector and the cathode. This ionization of the working gas by the alpha particles generates electrons that move towards the collector. Optionally, the working gas can be an inert gas, P10 gas (90% argon + 10% methane), or other gases.

[0037] Specifically, by applying a voltage to the collecting electrode, a voltage difference can be formed between the collecting electrode and the cathode. The parallel collecting electrode and cathode form a uniform electric field through the voltage difference, which enables alpha particles to ionize the working gas in the cavity.

[0038] The sidewalls are the vertical components of the cavity, located on either side of the collecting electrode and cathode. They are perpendicular to the top, collecting electrode, cathode, and bottom of the cavity. In alpha particle measurement equipment, the sidewalls support and enclose the internal space of the cavity, and also block external interference from outside the ionization chamber to ensure the stability of the internal environment.

[0039] The top of the cavity is the upper cover that constitutes the cavity. The top of the cavity corresponds to the collecting electrode and is parallel to the collecting electrode, cathode, and bottom of the cavity. In alpha particle measurement devices, the top of the cavity is used to ensure the uniformity of the electric field formed within the cavity.

[0040] The bottom of the chamber is the lower part that constitutes the chamber, corresponding to the cathode. The design of the bottom of the chamber needs to ensure that the sample to be tested can be placed stably on the cathode and that alpha particles emitted from the sample can smoothly enter the measurement range. The measurement range is the collectable region where electrons generated after alpha particles ionize the reacting gas can be collected. Simply put, the measurement range is a portion of the chamber, namely the space between the plane of the collecting electrode and the plane of the cathode. The volume corresponding to the measurement range is called the sensitive volume.

[0041] like Figure 1 As shown, the first preset distance is denoted as D. Optionally, the first preset distance can be a sufficiently large distance, such that there is a sufficiently large distance between the collecting electrode and the cathode to ensure that the collecting electrode can accurately collect the electrons generated by the ionization of the working gas by the alpha particles generated by the cathode. For example, the first preset distance can be a first preset multiple of the maximum range of the highest energy alpha particle within the measurement range, and the first preset multiple can be 3 times, 4 times, or other multiples.

[0042] Specifically, since the collecting electrode includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction, the collecting electrode is an array of anode wires.

[0043] Optionally, the first direction can be a horizontal direction, and the second and third directions can intersect the first direction respectively. When the first direction is horizontal, the second direction can be a direction perpendicular to the first direction on the horizontal plane, and the third direction can be a vertical direction perpendicular to the horizontal plane. In other words, the first, second, and third directions can be perpendicular to each other. For ease of understanding, the first direction can be the length direction of the alpha particle measuring device, the second direction can be the width direction of the alpha particle measuring device, and the third direction can be the height direction of the alpha particle measuring device.

[0044] Optionally, the third preset distance and the fourth preset distance can be the same or different.

[0045] like Figure 1 As shown in (a), the second preset distance is denoted as σ, and the third preset distance is denoted as δ1, as follows. Figure 1 As shown in (b), the fourth preset distance is denoted as δ2. Optionally, the magnitudes of the second, third, and fourth preset distances can be determined based on the area of ​​the collecting electrode. For example, when the area of ​​the collecting electrode is 40cm*40cm, the second preset distance can be 0.5cm, the third preset distance can be 0.5cm, and the fourth preset distance can be 0.5cm. The magnitudes of the third and fourth preset distances are negatively correlated with the spatial resolution of the collecting electrode; that is, the smaller the distance between two adjacent and parallel first anode wires, the higher the spatial resolution of the collecting electrode. Similarly, the smaller the distance between two adjacent and parallel second anode wires, the higher the spatial resolution of the collecting electrode.

[0046] Optionally, each first anode wire can be positioned closer to the cathode on the collecting electrode side, and each second anode wire can be positioned closer to the cathode side. It is only necessary to ensure that the distance between each first anode wire and each second anode wire in the third direction is a second preset distance, and there are no restrictions here.

[0047] The sample to be tested refers to the substance that needs to be measured for radioactivity, materials analysis, or other purposes using an alpha particle measurement device. Optionally, the sample can be in the form of a solid, liquid, or encapsulated gas, depending on the alpha particle measurement requirements and the properties of the sample. The size and shape of the sample should be suitable for placement on the cathode to facilitate accurate measurement.

[0048] The aforementioned alpha particle measuring device includes: a cavity surrounded by the sidewalls, top, and bottom of the device; a collecting electrode and a cathode are disposed within the cavity; the collecting electrode is disposed at the top of the cavity, and the cathode is disposed at the bottom of the cavity; the collecting electrode and the cathode are parallel; the distance between the collecting electrode and the cathode satisfies a first preset distance; the collecting electrode includes multiple first anode wires laid along a first direction and multiple second anode wires laid along a second direction; the distance between each first anode wire and each second anode wire in a third direction is a second preset distance, the distance between two adjacent first anode wires in the first direction is a third preset distance, and the distance between two adjacent second anode wires in the second direction is a fourth preset distance; wherein, the collecting electrode is used to collect electrons generated by the ionization of the gas by alpha particles and generate an induction signal; the cathode is used to place the sample to be measured. Since the alpha particle measuring device provided in this application embodiment has a collecting electrode composed of an array of anode wires consisting of multiple first anode wires and multiple second anode wires, the spatial resolution can be improved by presenting the collecting electrode as an array of anode wires, thereby improving the accuracy of the induced signal generated on the collecting electrode by electrons generated after alpha particles ionize the working gas, and further improving the accuracy of alpha particle measurement results.

[0049] In an exemplary embodiment, a protective electrode is also provided inside the cavity; the protective electrode is located at the top of the cavity; the protective electrode is parallel to the cathode, and the collecting electrode and the protective electrode are at the same potential; the protective electrode is arranged around the collecting electrode, and the width of the protective electrode in the first direction and the second direction is greater than the maximum range of the highest energy α particle within the measurement range; the protective electrode is used to collect electrons generated by the α particles generated by the sidewall after ionizing the working gas.

[0050] In this design, the area of ​​the collecting electrode is much larger than that of the protective electrode, and there is a certain distance between the collecting electrode and the protective electrode. This means there is no electrical short circuit between them. The distance ensures a clear separation between the electric fields of the collecting electrode and the protective electrode, thus avoiding interference between the different induced signals collected by the two electric fields. Optionally, the distance between the collecting electrode and the protective electrode can be 1 cm.

[0051] Specifically, a guard electrode is arranged around the collecting electrode. The width of the guard electrode in the first and second directions is greater than the maximum range of the highest-energy alpha particle within the measurement range. Therefore, during alpha particle measurement, even if alpha particles are emitted from the sidewall and move towards the collecting electrode, these particles will first pass through the area covered by the guard electrode. Due to the width of the guard electrode in the first and second directions, the range of the alpha particles emitted from the sidewall cannot exceed the area covered by the guard electrode. Thus, the electrons generated after the alpha particles emitted from the sidewall ionize the working gas are collected by the guard electrode, not the collecting electrode. Based on this, since the electrons generated after the alpha particles emitted from the sidewall ionize the working gas will not generate an induction signal on the collecting electrode, the presence of the guard electrode ensures that the alpha particles emitted from the sidewall will not affect the alpha particle measurement results of the sample.

[0052] Optionally, when there is an electric field between the collector and the cathode, the guard electrode can also be used to correct the degree of distortion of the electric field between the collector and the cathode.

[0053] Specifically, the collecting electrode and the protective electrode are located at the top of the cavity, meaning they are positioned on the side of the top of the cavity facing the cathode, and there is a certain distance between the collecting electrode and the protective electrode. Similarly, the cathode is located at the bottom of the cavity, meaning it is positioned on the side of the bottom of the cavity facing the collecting electrode, and there is a certain distance between the cathode and the bottom of the cavity. Optionally, the collecting electrode and the protective electrode are located at the top of the cavity but do not have physical contact with the top of the cavity.

[0054] Specifically, having the collector and guard at the same potential means that they are connected to independent output ports of the same voltage source or output ports of different voltage sources at the same potential. The collector and guard have the same voltage relative to other parts of the cavity (e.g., the cathode). Having the collector and guard at the same potential ensures that the guard can effectively collect electrons generated by the ionization of the working gas by alpha particles produced by the sidewalls, while avoiding the generation of an additional electric field between the collector and guard that might interfere with the alpha particle measurement process.

[0055] Specifically, the alpha particles within the cavity may include those generated by the sample under test, sidewalls, cathode, top of the cavity, and collecting electrode. It should be noted that the sample under test, placed on the cathode, is typically an electronic material. Due to the sample's thickness and density, alpha particles emitted from the cathode portion covered by the sample cannot penetrate it. Therefore, the background alpha particles in the cathode portion covered by the sample have negligible impact on the alpha particle measurement results obtained in this embodiment. Simultaneously, since the guard electrode collects alpha particles generated by the sidewalls, the collecting electrode can collect electrons generated after the alpha particles from the sample under test, the cathode portion not covered by the sample, the top of the cavity, and the collecting electrode ionize the working gas, thus generating an inductive signal.

[0056] Electrons generated by the ionization of the reacting gas by alpha particles within the measurement range (or sensitive volume range) can induce a signal on the collecting electrode. The maximum range of the highest-energy alpha particle within the measurement range refers to the farthest distance that an alpha particle can penetrate within the measurement range and in a specific reacting gas. The maximum range is determined based on the energy of the alpha particle at emission and the type of reacting gas. For example, for an alpha particle with a maximum energy of 10 MeV within the measurement range, the maximum range in argon gas does not exceed 5 cm. In this case, the width of the guard electrode in both the first and second directions should be set to 5 cm or more, so that the electrons generated by the ionization of the reacting gas by alpha particles emitted from the sidewall will not induce a signal on the collecting electrode, thereby significantly reducing the measurement background of alpha particles generated by the sidewall.

[0057] Specifically, since the collecting electrode is parallel to the cathode, each of the first anode wires and each of the second anode wires is parallel to the cathode; similarly, since the collecting electrode and the protective electrode are at the same potential, each of the first anode wires and each of the second anode wires is at the same potential as the protective electrode.

[0058] In this embodiment, since a protective electrode is also provided in the cavity, and the width of the protective electrode surrounding the collecting electrode in the first and second directions is greater than the maximum range of the highest energy α particle in the measurement range, the protective electrode can fully collect the electrons generated by the α particles generated by the sidewall after ionizing the working gas, thus avoiding the α particles generated by the sidewall from affecting the α particle measurement results, thereby improving the accuracy of the α particle measurement results.

[0059] In one exemplary embodiment, the cavity is provided with a hatch;

[0060] With the hatch open, the sample to be tested is placed on the cathode through the hatch.

[0061] With the hatch closed, a gas is introduced between the collector and the cathode to ionize alpha particles.

[0062] The door is a component in the alpha particle measurement device used to close or open the ionization chamber, thereby protecting the internal environment from external factors during alpha particle measurement and facilitating the placement or replacement of the sample. Optionally, the door can be located at the bottom or top of the chamber.

[0063] Based on such Figure 1 The alpha particle measurement device shown in this application provides an alpha particle measurement method. In an exemplary embodiment, such as... Figure 2 As shown, an alpha particle measurement method is provided, which can be applied to... Figure 1 The following steps, 202 to 208, are used as an example to illustrate the process of measuring alpha particles.

[0064] Step 202: Place the sample to be tested on the cathode.

[0065] The cathode may include a placement area, so that placing the sample to be tested on the cathode is actually equivalent to setting the sample to be tested on the placement area of ​​the cathode.

[0066] Specifically, during the process of placing the sample to be tested on the cathode, the cleanliness of the side of the cathode on which the sample is placed should be ensured to avoid the presence of excess impurities on the cathode that could affect the accuracy of the alpha particle measurement results.

[0067] Step 204: A reaction gas for ionizing alpha particles is introduced between the collecting electrode and the cathode, and a voltage difference is formed between the collecting electrode and the cathode so that the multiple alpha particles contained in the cavity ionize the reaction gas.

[0068] During the process of filling the space between the collector and the cathode with the gas used to ionize alpha particles, it is essential to ensure that the gas is pure, meaning it does not contain any excess impurities such as oxygen, air, or water vapor. This ensures the gas is in a stable state and thus guarantees the accuracy of the alpha particle measurement results.

[0069] Specifically, the cavity contains multiple alpha particles, including alpha particles generated by the sidewalls, the top of the cavity, the collecting electrode, the cathode, and alpha particles generated by the sample to be tested.

[0070] Specifically, during the process of forming a voltage difference between the collector and the cathode, it is necessary to ensure the stability of the operating state of the voltage source used to form the voltage difference between the collector and the cathode, and to avoid the adverse effects of the voltage source lacking stability due to temperature changes, vibration, or other environmental factors. In order to ensure the reliability of the ionization process by ensuring the stability of the electric field between the collector and the cathode, thereby ensuring the accuracy of the alpha particle measurement results.

[0071] Step 206: During the ionization process, acquire multiple sensing signals generated by the collecting electrode for the electrons produced after each α particle ionizes the acting gas.

[0072] Among them, multiple sensing signals are generated by the collecting electrode through the ionization of the working gas by alpha particles generated from the sample under test, the cathode area not covered by the sample under test, the sidewall, and the top of the cavity.

[0073] It should be noted that, during radioactive decay, an atomic nucleus decays into another atomic nucleus through alpha decay and emits an alpha particle. Each alpha decay involves only one alpha particle. Therefore, although the sample to be tested contains multiple alpha particles, the emission of the alpha particles in the sample is carried out individually. In other words, among the multiple induction signals generated at the same time, there is only one induction signal corresponding to the alpha particle of the sample to be tested.

[0074] In an exemplary embodiment, when the collecting electrode includes a plurality of first anode wires laid along a first direction and a plurality of second anode wires laid along a second direction, the sensing signal generated by the collecting electrode for the electrons generated after each alpha particle ionizes the working gas is generated jointly by each first anode wire and each second anode wire.

[0075] The induced signal is obtained by digitally integrating and summing the signals of all anode wires, including multiple first anode wires and multiple second anode wires, in chronological order. For example, the signal on the i-th first anode wire of the α particle is represented as a. i The signal on the j-th second anode wire of the α particle is represented as a j Let m be the total number of the first anode wires, n be the total number of the second anode wires, and M be the energy value of the induced signal generated by the electrons produced after the ionization of the gas by a certain α particle. Then, the formula for calculating M can be expressed as:

[0076]

[0077] Step 208: Analyze each sensing signal to identify at least one target α particle in the sample to be tested.

[0078] Here, the target α particle is an α particle generated by the sample to be tested, that is, the target α particle is an α particle whose emission position is located in the sample to be tested.

[0079] It is easy to understand that during the ionization process in step 206, the multiple sensing signals obtained from the collecting electrode are multiple sensing signals at different times. Therefore, the multiple sensing signals include the sensing signals corresponding to at least one target α particle emitted by the sample under test at different times. Therefore, in step 208, at least one target α particle in the sample under test can be determined by analyzing each sensing signal.

[0080] In an exemplary embodiment, the above-described analysis of each sensing signal to determine at least one target α particle in the sample to be tested includes: filtering each sensing signal to obtain filtered sensing signals; and analyzing each filtered sensing signal to determine at least one target α particle in the sample to be tested.

[0081] Optionally, the sensing signals can be filtered based on filters, such as low-pass filters, high-pass filters, band-pass filters, or other filters. Filtering the sensing signals can remove noise and obtain more accurate filtered signals, thereby ensuring the accuracy of the alpha particle measurement results.

[0082] In an exemplary embodiment, the above-described analysis of each sensing signal to determine at least one target α particle in the sample to be tested includes: analyzing each sensing signal to determine at least one target sensing signal that satisfies a preset amplitude condition; determining the number and energy value of at least one target α particle in the sample to be tested based on the at least one target sensing signal; and obtaining the energy spectrum of at least one target α particle based on the number and energy value of the at least one target α particle.

[0083] Among them, the energy spectrum of the target alpha particle is used to characterize the number of alpha particles at each energy value in the sample to be tested.

[0084] In the above-described alpha particle measurement method, applied to any of the alpha particle measurement devices provided in the embodiments of this application, the sample to be measured is placed on the cathode; an ionizing gas is introduced between the collecting electrode and the cathode to create a voltage difference between the collecting electrode and the cathode, causing the multiple alpha particles contained in the cavity to ionize the ionizing gas; during the ionization process, multiple induction signals generated by the collecting electrode in response to the electrons produced by each alpha particle after ionization of the ionizing gas are acquired; the induction signals are analyzed to determine at least one target alpha particle in the sample to be measured. Using the alpha particle measurement method provided in the embodiments of this application, based on an alpha particle measurement device with a specific structure and high spatial resolution, multiple induction signals with high accuracy generated by the collecting electrode can be acquired. Furthermore, by analyzing each induction signal, accurate measurement of alpha particles in the sample to be measured can be achieved, thereby improving the accuracy of the alpha particle measurement results.

[0085] In one exemplary embodiment, the method further includes:

[0086] Electrons generated by the ionization of the gas by alpha particles produced by alpha particles generated from the sidewall are collected through the protective electrode of the alpha particle measuring device.

[0087] In this embodiment, since the electrons generated by the ionization of the working gas by alpha particles generated on the sidewall are collected by the protective electrode, the multiple induction signals generated by the collecting electrode for the electrons generated by the ionization of the working gas by each alpha particle during the ionization process do not include the induction signals corresponding to the alpha particles generated on the sidewall. That is to say, under the action of the protective electrode, the multiple induction signals generated by the collecting electrode only include the induction signals generated by the electrons generated by the ionization of the working gas by alpha particles generated on the sample under test, the cathode region not covered by the sample under test, and the top of the cavity.

[0088] In this embodiment, the electrons generated by the ionization of the working gas by alpha particles generated by the sidewalls are collected by the protective electrode of the alpha particle measuring device. Therefore, by using the alpha particle measuring method provided in this application embodiment, it is possible to avoid including alpha particles generated by the sidewalls in at least one target alpha particle in the determined sample to be tested, thereby improving the accuracy of the alpha particle measuring results.

[0089] In an exemplary embodiment, the above-described analysis of the sensing signals to determine at least one target α particle in the sample to be tested includes:

[0090] Amplitude and time analysis were performed on each sensing signal to determine the emission position of the alpha particle corresponding to each sensing signal.

[0091] At least one α particle whose projection point along the third direction of the launch position is located in the two-dimensional geometric coordinate region is identified as at least one target α particle.

[0092] The two-dimensional geometric coordinate region refers to the planar area within the cathode used for locating and analyzing the sample under test. Since the sample corresponds to this two-dimensional geometric coordinate region, its position can be determined using image optical recognition algorithms.

[0093] Specifically, amplitude and time analyses are performed on each induced signal to determine the emission position of the alpha particle corresponding to each induced signal. Specifically, amplitude analysis is first performed on each induced signal to determine the position of the electron corresponding to the alpha particle in the first direction and the position in the second direction. Then, the speed of the electron in the cavity is determined by the electric field strength and the type of gas. Combined with time analysis of each induced signal, the travel time of the electron corresponding to each induced signal from emission to reaching the collecting electrode is determined. Thus, since the electron is generated under the ionization of the alpha particle, and based on the position of the electron in the first direction, the position in the second direction, the speed, and the travel time, the emission position of the alpha particle corresponding to each induced signal can be determined by kinematic principles.

[0094] Specifically, when the third direction is vertical, the projection point of the emission position along the third direction refers to the projection point of the alpha particle's emission position in the vertical direction (i.e., the third direction) when observed by the human eye from the top down from the alpha particle measuring device. An alpha particle whose projection point in the vertical direction is located above the two-dimensional geometric coordinate region is considered to have an alpha particle emission position located as shown in the image. Figure 1 In the three-dimensional geometric coordinate region shown, since the sample to be tested is located in the two-dimensional geometric coordinate region, it is easy to understand that the alpha particles whose vertical projection point is located in the two-dimensional geometric coordinate region are target alpha particles emitted from the sample to be tested. Based on this, the alpha particles in the sample to be tested can be identified more accurately. In other words, by analyzing the vertical projection point position of the alpha particles, we can determine whether the alpha particles originate from the sample to be tested, thus enabling a more precise analysis of the alpha particles in the sample.

[0095] In this embodiment, by performing amplitude and time analysis on each sensing signal, the emission position of the alpha particle corresponding to each sensing signal is determined. Thus, the target alpha particle with the emission position in the sample under test can be determined more accurately. In this way, the background of alpha particles generated by the cathode part not covered by the sample under test is avoided from affecting the alpha particle measurement results.

[0096] In an exemplary embodiment, placing the sample to be tested on the cathode includes:

[0097] Image data of the sample to be tested is acquired using a camera device;

[0098] The sample to be tested is placed on the cathode, and the two-dimensional geometric coordinate region corresponding to the sample is determined based on the image data of the sample.

[0099] The camera device can be located outside the alpha particle measuring device, and the camera device can be a camera.

[0100] For example, such as Figure 3 As shown, this is a top view from the collector towards the cathode. The sample to be tested is placed on the cathode, and the two-dimensional geometric coordinate region corresponding to the sample to be tested is determined based on the image data of the sample to be tested. The two-dimensional geometric coordinate region can be understood as the area where the sample to be tested is located.

[0101] Optionally, the image data of the sample to be tested may include the size and shape of the sample.

[0102] In this embodiment, image data of the sample to be tested is acquired by a camera device. After the sample to be tested is placed on the cathode, the two-dimensional geometric coordinate region corresponding to the sample to be tested is determined based on the image data of the sample to be tested. Therefore, when determining the emission position of the alpha particle to determine whether it is the target alpha particle in the sample to be tested, the judgment accuracy can be higher, thereby improving the accuracy of the alpha particle measurement results.

[0103] Based on the above embodiments, it can be seen that the collecting electrode, in response to the alpha particles generated by the sample under test, the top of the cavity, and the collecting electrode itself, will ionize the gas and generate electrons, and these electrons will generate an induced signal on the collecting electrode. Figure 1 It can be seen that in the working gas, the distance that electrons generated after being ionized by alpha particles located in the sample to the collecting electrode travel to the collecting electrode is different from the distance that electrons generated after being ionized by alpha particles located at the top of the cavity (or at the collecting electrode) travel to the collecting electrode. The former is much greater than the latter.

[0104] Based on this, it is easy to understand that the rise time and amplitude of the pulse signal generated by the electrons produced by the ionization of the working gas by the alpha particles of the test sample on the collecting electrode will be much greater than the rise time and amplitude of the pulse signal generated by the electrons produced by the ionization of the working gas by the alpha particles at the top of the cavity and the collecting electrode on the collecting electrode.

[0105] like Figure 1 As shown, α particles located at the top of the cavity and emitted from the top of the cavity, and α particles located at the collecting electrode and emitted from the collecting electrode, are denoted as α. c An α particle located in the sample but emitted from it is denoted as α. sα particles will be ejected from the top of the cavity. c and the α particles located at the collecting pole and emitted from the collecting pole. c The rise time of the pulse signal is expressed as t c α particles will be ejected from the top of the cavity. c and the α particles located at the collecting pole and emitted from the collecting pole. c The signal amplitude is represented by S cMax α particles emitted from the sample to be tested s The rise time of the pulse signal is expressed as t s α particles emitted from the sample to be tested s The signal amplitude is represented by S sMax Let the sensitive volume be denoted as V, the distance between the collector and the cathode as D, and the electron mobility in the interacting gas as μ. e Let N represent the number of electrons produced by ionization in the ionization trajectory, and let e represent the charge of the electron, where e = 1.6 × 10⁻⁶. -19 C represents the capacitance within the cavity. f This will interact with α particles emitted from the top of the cavity (or from the collecting pole). c The corresponding distance the electron moves to the collecting electrode is denoted as d. c α particles emitted from the sample to be tested s The corresponding distance the electron moves to the collecting electrode is denoted as d. s Based on electromagnetic principles and the principles of motion, it can be known that the α particles emitted from the top of the cavity... c and the α particles located at the collecting pole and emitted from the collecting pole. c The rise time t of the pulse signal c The calculation formula is as follows:

[0106]

[0107] Alpha particles emitted from the top of the cavity c and the α particles located at the collecting pole and emitted from the collecting pole. c signal amplitude S cMax The calculation formula is as follows:

[0108]

[0109] Alpha particles emitted from the sample to be tested. s The rise time t of the pulse signal s The calculation formula is as follows:

[0110]

[0111] Alpha particles emitted from the sample to be tested. ssignal amplitude S sMax The calculation formula is as follows:

[0112]

[0113] Based on the above calculation formula, it can be seen that the rise time and amplitude of the pulse signal generated by the electrons produced after the alpha particles of the test sample ionize the gas at the collecting electrode are much greater than those of the pulse signal generated by the electrons produced after the alpha particles at the top of the cavity ionize the gas at the collecting electrode. Next, the difference between the rise time and amplitude of the pulse signals of the two will be visually identified by using the induced signal of the reference guard electrode. Figure 4 The image shows the induced signal generated at the collecting electrode by electrons produced after the alpha particles of the sample ionize the reacting gas. Figure 5 The image shows the induced signal generated at the collecting electrode by electrons produced after the alpha particles at the top of the cavity ionize the working gas. Figure 4 and Figure 5 The horizontal axis represents the time axis (μs) and the vertical axis represents the signal amplitude of the pulse signal. Figure 4 and Figure 5 Curve A in the figure represents the induced signal at the collector. Figure 4 and Figure 5 Curve B in the figure represents the induction signal of the guard electrode used as a comparison reference. It can be seen that by analyzing the rise time and amplitude of the alpha particle pulse signal, alpha particles emitted from the sample can be identified and distinguished from a large number of pulse signals. Therefore, by filtering out the alpha particles emitted from the sample, the interference effects of the alpha particle background emitted from the top of the cavity and the alpha particle background emitted from the collecting electrode on the alpha ion measurement results can be significantly reduced.

[0114] Based on this, in order to reduce the interference of alpha particle background emitted from the top of the cavity and alpha particle background emitted from the collecting electrode on the alpha ion measurement results, in an exemplary embodiment, the above-mentioned analysis of each sensing signal to determine at least one target alpha particle in the sample to be tested includes:

[0115] Amplitude and time analysis are performed on each inductive signal to determine the signal amplitude and pulse rise time of each inductive signal.

[0116] The α particle corresponding to the induction signal whose signal amplitude meets the preset threshold condition and whose pulse signal rise time meets the preset time condition is identified as at least one target α particle.

[0117] Among them, signal amplitude refers to the peak value of the induced signal in terms of amplitude, which is the maximum intensity value of the induced signal.

[0118] A signal amplitude meeting a preset amplitude condition can mean that the signal amplitude is greater than or equal to a preset amplitude threshold. Therefore, only alpha particles corresponding to inductive signals with a signal amplitude greater than or equal to the preset amplitude threshold and a pulse signal rise time meeting a preset time condition will be identified as target alpha particles in the sample to be tested. The magnitude of the preset amplitude threshold should be sufficient to distinguish alpha particles emitted from the top of the cavity, alpha particles emitted from the collecting electrode, and alpha particles emitted from the sample to be tested. In other words, the magnitude of the preset amplitude threshold should be between the signal amplitude of the pulse signal corresponding to the alpha particle emitted from the top of the cavity (or the alpha particle emitted from the collecting electrode) and the signal amplitude of the pulse signal corresponding to the alpha particle emitted from the sample to be tested.

[0119] For example, based on Figure 4 It can be seen that the signal amplitude of the pulse signal corresponding to the alpha particles emitted from the sample is greater than 4700, based on Figure 5 It can be seen that the signal amplitude of the pulse signal corresponding to the alpha particle emitted from the top of the cavity (or the alpha particle emitted from the collecting electrode) is approximately 3700. Therefore, the preset amplitude threshold can be determined as a value between [3700, 4700].

[0120] The rise time of a pulse signal refers to the time required for the induced signal to reach its amplitude from its initial appearance. The rise time reflects the time required for electrons to travel from the generation point to the collecting electrode under the influence of an electric field.

[0121] The pulse signal rise time must meet a preset time condition, which means the pulse signal rise time is greater than or equal to a preset time threshold. Therefore, only alpha particles corresponding to inductive signals whose signal amplitude meets the preset threshold condition and whose pulse signal rise time is greater than or equal to the preset time threshold will be identified as target alpha particles in the sample to be tested. The magnitude of the preset time threshold should be sufficient to distinguish alpha particles emitted from the top of the cavity, alpha particles emitted from the collecting electrode, and alpha particles emitted from the sample to be tested. In other words, the magnitude of the preset time threshold should be between the pulse signal rise time corresponding to alpha particles emitted from the top of the cavity (or alpha particles emitted from the collecting electrode) and the pulse signal rise time corresponding to alpha particles emitted from the sample to be tested.

[0122] In this embodiment, by performing amplitude and time analysis on each sensing signal, at least one α particle of the sensing signal whose signal amplitude meets a preset amplitude condition and whose pulse signal rise time meets a preset time condition is identified as at least one target α particle in the sample to be tested. Thus, α particles emitted from the top of the cavity, α particles emitted from the collecting electrode, and α particles emitted from the sample to be tested can be accurately distinguished from each sensing signal by the signal amplitude and the pulse signal rise time. Furthermore, α particles emitted from the top of the cavity and α particles emitted from the collecting electrode can be filtered out by the signal amplitude and the pulse signal rise time, further ensuring that the identified at least one target α particle is an α particle in the sample to be tested, thereby further improving the accuracy of the α particle measurement results.

[0123] In an exemplary embodiment, determining at least one α-particle whose projection point along a third direction lies in a two-dimensional geometric coordinate region as at least one target α-particle includes:

[0124] The α particle corresponding to the induction signal whose projection point along the third direction is located in the two-dimensional geometric coordinate region, whose signal amplitude meets the preset threshold condition, and whose pulse signal rise time meets the preset time condition is determined as at least one target α particle.

[0125] In this embodiment, after performing amplitude and time analysis on each sensing signal to determine the emission position of the α particle corresponding to each sensing signal, among at least one α particle whose projection point along the third direction of the emission position is located in the two-dimensional geometric coordinate region, at least one α particle corresponding to the sensing signal whose signal amplitude meets the preset threshold condition and whose pulse signal rise time meets the preset time condition is further identified as at least one target α particle. Thus, α particles generated in the cathode part of the sample not covered by the emission position can be filtered out, further ensuring that the identified at least one target α particle is an α particle in the sample to be tested, thereby further improving the accuracy of the α particle measurement results.

[0126] In an exemplary embodiment, the above-described amplitude and time analysis of each sensed signal to determine the emission position of the alpha particle corresponding to each sensed signal includes:

[0127] Amplitude and time analysis were performed on each induced signal to determine the emission positions of multiple electrons generated after each alpha particle ionizes the gas.

[0128] Based on the exit positions of multiple electrons generated after each alpha particle ionizes the acting gas, the exit positions of the alpha particles corresponding to each induced signal are determined.

[0129] After identifying at least one α-particle whose projection point along a third direction lies within a two-dimensional geometric coordinate region as at least one target α-particle, the above method further includes:

[0130] By connecting the exit positions of multiple electrons generated after each target alpha particle ionizes the gas, the trajectory of at least one target alpha particle within the cavity can be obtained.

[0131] Specifically, time analysis of each induced signal involves measuring the time taken for multiple electrons to reach different first or second anode wires to infer the exit positions of the multiple electrons generated after the alpha particles of each induced signal ionize the acting gas. Therefore, based on the exit positions of the multiple electrons generated after the alpha particles ionize the acting gas, the exit positions of the alpha particles corresponding to each induced signal can be further determined based on kinematic principles.

[0132] In this embodiment, after determining at least one target α particle based on the emission position, the emission positions of multiple electrons generated after the target α particle ionizes the working gas are connected to obtain the trajectory of at least one target α particle in the cavity. This allows researchers to better study and understand the motion law of at least one target α particle in the electromagnetic field of the cavity.

[0133] In an exemplary embodiment, during the ionization process described above, acquiring multiple sensing signals generated by the collecting electrode for the electrons produced after each alpha particle ionizes the acting gas includes:

[0134] During the ionization process, the collector generates multiple initial sensing signals for the electrons produced by each alpha particle after ionizing the gas.

[0135] Each initial induction signal is amplified to obtain multiple induction signals.

[0136] In this process, each initial induction signal can be amplified using a signal amplifier to obtain multiple induction signals. The signal amplifier can be a linear amplifier, a logarithmic amplifier, or other amplifiers capable of amplifying signals.

[0137] In this embodiment, by amplifying the multiple initial sensing signals generated by the collector electrode after each alpha particle ionizes the working gas, the multiple sensing signals obtained can have high signal quality. This avoids problems such as unclear signals caused by small output signals in the collector electrode, and ensures that at least one target alpha particle in the sample can be accurately determined based on high-quality sensing signals when analyzing each sensing signal.

[0138] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0139] Based on the same inventive concept, this application also provides an alpha particle measuring device for implementing the alpha particle measuring method described above. The solution provided by this device is similar to the solution described in the above method; therefore, the specific limitations in one or more alpha particle measuring device embodiments provided below can be found in the limitations of the alpha particle measuring method described above, and will not be repeated here.

[0140] In one exemplary embodiment, such as Figure 6 As shown, an alpha particle measuring device is provided, which can be applied in any of the alpha particle measuring devices provided in the embodiments of this application, including: a placement module 602, an ionization module 604, an acquisition module 606, and an analysis module 608, wherein:

[0141] The placement module 602 is used to place the sample to be tested on the cathode.

[0142] The ionization module 604 is used to fill the space between the collector and the cathode with a gas that interacts with alpha particles, and to create a voltage difference between the collector and the cathode so that the multiple alpha particles contained in the cavity ionize the gas.

[0143] The acquisition module 606 is used to acquire multiple sensing signals generated by the collector electrode in response to the electrons produced by each alpha particle after ionizing the working gas during the ionization process.

[0144] Analysis module 608 is used to analyze each sensing signal to determine at least one target α particle in the sample to be tested.

[0145] In an exemplary embodiment, the acquisition module 606 is further configured to collect electrons generated by the ionization of the working gas by alpha particles generated by the sidewall through the protective electrode of the alpha particle measuring device.

[0146] In an exemplary embodiment, the analysis module 608 is further configured to perform amplitude analysis and time analysis on each sensing signal to determine the emission position of the α particle corresponding to each sensing signal; and to determine at least one α particle whose projection point along the third direction of the emission position is located in the two-dimensional geometric coordinate region as at least one target α particle.

[0147] In an exemplary embodiment, the placement module 602 is further configured to acquire image data of the sample to be tested based on the camera device; place the sample to be tested on the cathode; and determine a two-dimensional geometric coordinate region based on the image data of the sample to be tested.

[0148] In an exemplary embodiment, the analysis module 608 is further configured to perform amplitude analysis and time analysis on each sensing signal to determine the emission positions of multiple electrons generated after each alpha particle ionizes the acting gas; based on the emission positions of multiple electrons generated after each alpha particle ionizes the acting gas, determine the emission position of the alpha particle corresponding to each sensing signal; after determining at least one alpha particle whose projection point along the third direction is located in the two-dimensional geometric coordinate region as at least one target alpha particle, connect the emission positions of multiple electrons generated after each target alpha particle ionizes the acting gas to obtain the motion trajectory of at least one target alpha particle in the cavity.

[0149] In an exemplary embodiment, the analysis module 608 is further configured to perform amplitude analysis and time analysis on each sensing signal to determine the signal amplitude and pulse signal rise time corresponding to each sensing signal; and to determine the α particle corresponding to the sensing signal whose signal amplitude meets a preset threshold condition and whose pulse signal rise time meets a preset time condition as at least one target α particle.

[0150] Each module in the aforementioned alpha particle measuring device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of a computer device in software form, so that the processor can call and execute the operations corresponding to each module.

[0151] In one exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 7As shown, this computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The database stores data of the sample to be measured. The I / O interfaces are used for exchanging information between the processor and external devices. The communication interface is used for communicating with external terminals via a network connection. When the computer program is executed by the processor, it implements an alpha particle measurement method.

[0152] In one exemplary embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 8 As shown, the computer device includes a processor, memory, input / output interfaces, a communication interface, a display unit, and an input device. The processor, memory, and input / output interfaces are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The input / output interfaces are used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, Near Field Communication (NFC), or other technologies. When the computer program is executed by the processor, it implements an alpha particle measurement method. The display unit is used to form a visually visible image and can be a display screen, a projection device, or a virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0153] Those skilled in the art will understand that Figure 8The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0154] In one exemplary embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0155] In one exemplary embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above-described method embodiments.

[0156] In one exemplary embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0157] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0158] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0159] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0160] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. An alpha particle measuring device, characterized by, The device comprises: a cavity surrounded by a side wall, a cavity top and a cavity bottom of the device; a collection electrode and a cathode are arranged in the cavity; the collection electrode is arranged on the cavity top, and the cathode is arranged on the cavity bottom; the collection electrode is parallel to the cathode; the distance between the collection electrode and the cathode satisfies a first preset distance; the collection electrode comprises a plurality of first anode filaments arranged in a first direction and a plurality of second anode filaments arranged in a second direction; the distance between each first anode filament and each second anode filament in a third direction is a second preset distance; the distance between two adjacent first anode filaments in the first direction is a third preset distance; the distance between two adjacent second anode filaments in the second direction is a fourth preset distance; the second direction and the third direction are perpendicular to the first direction; wherein the cathode is used for placing a sample to be measured; and the collection electrode is used for collecting electrons generated after the sample to be measured ionizes the working gas and generating an induced signal; a protection electrode is arranged in the cavity; the protection electrode is arranged on the cavity top; the protection electrode is parallel to the cathode, and the collection electrode and the protection electrode are at the same potential; the protection electrode is arranged around the collection electrode; the width of the protection electrode in the first direction and the second direction is greater than the maximum range of the highest energy alpha particle in the measurement range; and the protection electrode is used for collecting electrons generated after the alpha particles generated by the side wall ionize the working gas.

2. A method of measuring alpha particles, characterized by, The alpha particle measurement device of claim 1 is used in a method comprising: placing the sample to be measured on the cathode; filling a working gas for ionization with alpha particles between the collection electrode and the cathode, and forming a voltage difference between the collection electrode and the cathode to make a plurality of alpha particles included in the cavity ionize the working gas; in the ionization process, acquiring a plurality of induced signals generated by the collection electrode for electrons generated after the working gas is ionized by each alpha particle; analyzing each induced signal to determine at least one target alpha particle in the sample to be measured.

3. The method of claim 2, wherein, The method further comprises: The alpha particle measurement device is provided with a protection electrode, and the protection electrode collects electrons generated after the alpha particles generated by the side wall ionize the working gas.

4. The method of claim 2, wherein, The analysis of each induced signal to determine at least one target alpha particle in the sample to be measured comprises: amplitude analysis and time analysis of each induced signal to determine the emission position of the alpha particle corresponding to each induced signal; determining at least one alpha particle whose projection point along the third direction in the two-dimensional geometric coordinate region as at least one target alpha particle.

5. The method of claim 4, wherein, The placing of the sample to be measured on the cathode comprises: acquiring image data of the sample to be measured based on a camera device; placing the sample to be measured on the cathode and determining the two-dimensional geometric coordinate region based on the image data of the sample to be measured.

6. The method of claim 4, wherein, The amplitude analysis and the time analysis on each of the induction signals are performed to determine the emission position of the alpha particle corresponding to each of the induction signals, including: The amplitude analysis and the time analysis on each of the induction signals are performed to determine the emission position of the alpha particle corresponding to each of the induction signals, including: The amplitude analysis and the time analysis on each of the induction signals are performed to determine the emission position of the alpha particle corresponding to each of the induction signals, including: After the at least one alpha particle with the projection point of the emission position along the third direction located in the two-dimensional geometric coordinate region is determined as the at least one target alpha particle, the method further includes: The emission positions of the multiple electrons generated after the at least one target alpha particle ionizes the working gas are connected to obtain a movement track of the at least one target alpha particle in the cavity.

7. The method of claim 2, wherein, The analysis on each of the induction signals is performed to determine the at least one target alpha particle in the sample to be tested, including: The amplitude analysis and the time analysis on each of the induction signals are performed to determine the signal amplitude and the pulse signal rise time corresponding to each of the induction signals; The alpha particle corresponding to the induction signal with the signal amplitude satisfying a preset threshold condition and the pulse signal rise time satisfying a preset time condition is determined as the at least one target alpha particle.

8. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to implement the steps of the method in any one of claims 2 to 7.

9. A computer program product comprising a computer program, characterized in that, The computer program is executed by the processor to implement the steps of the method in any one of claims 2 to 7.

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