A voltage transformer testing method, system, storage medium and electronic device

Abstract

The application provides a voltage transformer testing method, system, storage medium and electronic equipment, and relates to the technical field of voltage transformers. The technical scheme provided by the application selects corresponding test items according to the to-be-put-in-scene of the voltage transformer, simultaneously divides multiple test items into a first test item combination that can share the same simulation working condition for testing and a second test item that needs to be simulated separately, avoids the inefficient situation of repeatedly constructing a complex simulation environment, and greatly improves the testing efficiency. The target simulation working condition is obtained through parameter updating of each first test item, so that the testing result is more accurate. Finally, the first test item and the second test item are tested under different simulation working conditions, so that the testing efficiency of the voltage transformer can be improved on the basis of ensuring the testing accuracy.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of voltage transformers, and particularly relates to a voltage transformer testing method and system, a storage medium and an electronic device. BACKGROUND

[0002] As a key device in a power system, the performance and precision of a voltage transformer directly affect the safe and stable operation of the power grid, so it is crucial to comprehensively and accurately test the voltage transformer. The voltage transformer is a device that converts high voltage into low voltage in proportion, and is mainly used in measurement, protection and control systems. Its working principle is based on the law of electromagnetic induction, and through the magnetic coupling between the primary winding and the secondary winding, the high voltage is reduced to a measurable level while the voltage phase relationship remains basically unchanged. The voltage transformer not only isolates the high-voltage loop and the low-voltage measurement device, but also transforms the high voltage into standard low voltage in proportion, facilitating the use of instruments and relay protection devices.

[0003] In the related art, the testing method for the voltage transformer is to construct a simulated working condition according to each test item, such as voltage ratio error testing, phase angle error testing, insulation performance testing, etc. Since a complex simulated working condition needs to be constructed each time a certain test item is performed, the testing efficiency is low. SUMMARY

[0004] The present application provides a voltage transformer testing method and system, a storage medium and an electronic device, which can improve the testing efficiency while ensuring the testing precision of the voltage transformer.

[0005] In a first aspect, the present application provides a voltage transformer testing method, which comprises:

[0006] obtaining a to-be-put-in scene of a voltage transformer, and determining a plurality of test items corresponding to the to-be-put-in scene;

[0007] determining, from the plurality of test items, a first test item combination for which the same simulated working condition is used for testing, and a second test item for which an independent simulated working condition is used for testing, the first test item combination comprising a plurality of first test items;

[0008] updating a standard simulated working condition corresponding to the first test item combination into a target simulated working condition using test environment parameters corresponding to each of the first test items;

[0009] testing the first test items of the voltage transformer under the target simulated working condition, and the second test item of the voltage transformer under the independent simulated working condition, to obtain a comprehensive test result.

[0010] By adopting the technical solutions, corresponding test items are selected according to the to-be-put-in-scene of the voltage transformer, and meanwhile, multiple test items are divided into a first test item combination that can share the same simulation working condition for testing and a second test item that needs to be simulated separately, thereby avoiding the inefficient situation of repeatedly constructing a complex simulation environment and greatly improving the test efficiency. The target simulation working condition is obtained through parameter updating of each first test item, so that the test result is more accurate. Finally, the first test item and the second test item are tested under different simulation working conditions, so that the test efficiency of the voltage transformer can be improved on the basis of ensuring the test accuracy.

[0011] Optionally, the obtaining of the to-be-put-in-scene of the voltage transformer and the determination of the multiple test items corresponding to the to-be-put-in-scene comprise:

[0012] Obtaining the to-be-put-in-scene of the voltage transformer and a special environment index of the to-be-put-in-scene;

[0013] Determining a standard scene type corresponding to the to-be-put-in-scene, the standard scene type corresponding to multiple standard test items;

[0014] Adjusting the standard test items of the scene type according to the special environment index to obtain the multiple test items corresponding to the to-be-put-in-scene.

[0015] By adopting the technical solutions, the special environment factors of the scene are considered on the basis of obtaining the to-be-put-in-scene, and these special environment indexes can more comprehensively reflect the actual use conditions of the voltage transformer. On this basis, the standard test items are adjusted differently, so that the finally determined test items are more suitable for the characteristics of the specific scene and the actual test requirements of the voltage transformer. In this way, it is helpful to plan the test scheme specifically and improve the accuracy of the test.

[0016] Optionally, the updating of the standard simulation working condition corresponding to the first test item combination to the target simulation working condition using the test environment parameters corresponding to each first test item comprises:

[0017] Constructing a digital twin model corresponding to the standard voltage transformer according to the standard simulation working condition corresponding to the first test item combination and standard characteristic parameters of the standard voltage transformer;

[0018] Inputting the test environment parameters of each first test item into the digital twin model respectively to obtain an output result influence value between each first test item;

[0019] Updating the standard simulation working condition to the target simulation working condition according to the output result influence value.

[0020] By adopting the technical solutions, the performance of the standard voltage transformer is virtually simulated by means of the digital twin technology, the interaction of different test environment parameters is analyzed, and the target simulation working condition is generated, so that the working state of the voltage transformer in a complex actual environment can be accurately simulated. Compared with a single standard simulation working condition, the test result of the target simulation working condition is more accurate and reliable.

[0021] Optionally, the digital twin model comprises a mathematical model and a dynamic simulation model, and the digital twin model corresponding to the standard voltage transformer is constructed according to the standard simulation working condition corresponding to the first test item combination and the standard characteristic parameters of the standard voltage transformer, comprising:

[0022] The standard characteristic parameters of the standard voltage transformer are acquired, and the mathematical model of the correlation between the output result of the standard voltage transformer in the working state and the actual value of the measured object is determined;

[0023] The dynamic simulation model of the standard voltage transformer is constructed according to the standard simulation working condition corresponding to the first test item combination and the mathematical model.

[0024] By adopting the technical solutions, the dynamic simulation model of the standard voltage transformer is constructed on the basis of the mathematical model and in combination with the standard simulation working condition corresponding to the first test item combination. The dynamic simulation model can simulate and calculate the dynamic response behavior of the standard voltage transformer under various changing test environment conditions in real time. Compared with single theoretical analysis or experimental test, the digital twin technology adopted in this technical solution can maximize the restoration of the real working state of the standard voltage transformer, fully considers the coupling effect of various environment conditions, and avoids the analysis deviation caused by simplification assumptions or test condition limitations.

[0025] Optionally, the test environment parameters of each first test item are respectively input into the digital twin model to obtain the output result influence value between the first test items, comprising:

[0026] The test environment parameters of each first test item are respectively input into the digital twin model to obtain the dynamic error of each first test item after simulating the dynamic response under the influence of other first test items, and the test environment parameters comprise frequency, magnetic field strength, temperature and humidity, phase and noise signal;

[0027] The output result influence value between the first test items is obtained according to the dynamic error and the standard characteristic parameters of the standard voltage transformer.

[0028] By adopting the technical scheme, firstly, the dynamic running state of the standard voltage transformer under various single and composite test environment conditions is simulated by using the digital twin model, and the real-time deviation from the ideal output value, i.e., the dynamic error, is recorded. These dynamic error data comprehensively reflect the comprehensive influence of different test environment parameters on the performance of the voltage transformer. Then, the dynamic error data and the known standard characteristic parameters (such as rated transformation ratio, phase error, frequency response characteristic, etc.) of the standard voltage transformer are analyzed and processed, and the final output result deviation caused by the mutual influence between each first test item, i.e., the output result influence value, is calculated. The influence degree of the interaction of each test environment condition on the performance of the voltage transformer can be quantitatively analyzed with high precision, laying a solid data foundation for subsequent optimization of the target simulation working condition. The target simulation working condition comprehensively considers the coupling effect of multiple environment conditions, and can more truly reflect the working state of the voltage transformer under actual complex working conditions, ensuring the accuracy and reliability of the final test result.

[0029] Optionally, before obtaining the comprehensive test result by testing the first test item of the voltage transformer under the target simulation working condition and the second test item of the voltage transformer under the independent simulation working condition, the method further includes:

[0030] respectively acquiring a first time length for the voltage transformer to recover to a normal state after the target simulation working condition and a second time length for the voltage transformer to recover to the normal state after the independent simulation working condition;

[0031] comparing the first time length and the second time length to determine the test sequence of the first test item and the second test item.

[0032] By adopting the technical scheme, the time efficiency of the entire test process is optimized by comparing and analyzing the influence degree of different test working conditions on the voltage transformer. Reasonable test sequence arrangement can avoid unnecessary waiting, maximize the use of limited test time resources, and significantly improve the test efficiency.

[0033] Optionally, after obtaining the comprehensive test result by testing the first test item of the voltage transformer under the target simulation working condition and the second test item of the voltage transformer under the independent simulation working condition, the method further includes:

[0034] determining whether there is a test item with a test result not meeting the test standard in the comprehensive test result;

[0035] if there is a test item with a test result not meeting the test standard in the comprehensive test result, determining the test item with the test result not meeting the test standard as a target test result, and determining an improvement parameter of the voltage transformer according to the target test result.

[0036] By adopting the above technical solutions and providing analysis and feedback on unqualified results, we can provide targeted guidance for product design improvements, achieve a virtuous cycle of testing, evaluation and optimization, and continuously improve product quality.

[0037] In a second aspect, the present application provides a voltage transformer testing system, the system comprising:

[0038] A test item determination module is used to obtain a scenario for the voltage transformer to be deployed and determine multiple test items corresponding to the scenario to be deployed;

[0039] a simulation working condition division module, configured to determine, from the plurality of test items, a first test item combination to be tested using the same simulation working condition, and a second test item to be tested using independent simulation working conditions, wherein the first test item combination includes a plurality of first test items;

[0040] a simulation working condition updating module, configured to update the standard simulation working condition corresponding to the first test item combination to a target simulation working condition using the test environment parameters corresponding to each of the first test items;

[0041] The testing module is used to test the first test item of the voltage transformer under the target simulation working condition and the second test item of the voltage transformer under the independent simulation working condition to obtain a comprehensive test result.

[0042] In a third aspect, the present application provides a computer storage medium, which stores a plurality of instructions, and the instructions are suitable for being loaded by a processor and executing any one of the above methods.

[0043] In a fourth aspect, the present application provides an electronic device comprising a processor, a memory and a transceiver, wherein the memory is used to store instructions, the transceiver is used to communicate with other devices, and the processor is used to execute the instructions stored in the memory so that the electronic device performs any one of the above methods.

[0044] In summary, the beneficial effects brought about by the technical solution of this application include:

[0045] By adopting the technical scheme, corresponding test items are selected according to the to-be-put-in-scenarios of the voltage transformer, and meanwhile, multiple test items are divided into a first test item combination that can share the same simulation working condition for testing and a second test item that needs to be simulated separately, so as to avoid the inefficient situation of repeatedly constructing a complex simulation environment, and greatly improve the test efficiency. The target simulation working condition is obtained through parameter updating of each first test item, so that the test result is more accurate. Finally, the first test item and the second test item are tested under different simulation working conditions, so as to improve the test efficiency of the voltage transformer on the basis of ensuring the test accuracy. BRIEF DESCRIPTION OF DRAWINGS

[0046] Figure 1 is a flowchart of a voltage transformer test method according to an embodiment of the present application;

[0047] Figure 2 is a structural schematic diagram of a voltage transformer test system according to an embodiment of the present application;

[0048] Figure 3 is a structural schematic diagram of an electronic device according to an embodiment of the present application.

[0049] Legend of reference signs: 300, electronic device; 301, processor; 302, communication bus; 303, user interface; 304, network interface; 305, memory. DETAILED DESCRIPTION

[0050] In order to enable personnel in the technical field to better understand the technical solutions in the present specification, the technical solutions in the present specification will be clearly and completely described below in conjunction with the drawings in the present specification. Obviously, the described embodiments are only some of the embodiments of the present application, not all the embodiments.

[0051] In the description of the embodiments of the present application, the words such as "exemplary", "for example", or "for instance" are used to mean example, illustration or description. Any embodiment or design scheme described as "exemplary", "for example", or "for instance" in the embodiments of the present application should not be interpreted as more preferred or more advantageous than other embodiments or design schemes. Rather, the words such as "exemplary", "for example", or "for instance" are intended to present the relevant concept in a specific way.

[0052] In the description of the embodiments of the present application, the term "a plurality of" means two or more. For example, a plurality of systems means two or more systems, and a plurality of screen terminals means two or more screen terminals. In addition, the terms "first", "second", etc. are used only for the purpose of description and should not be understood as indicating or implying relative importance or implying the indicated technical features. Therefore, the features defined as "first", "second", etc. can be explicitly or implicitly included one or more of the features. The terms "include", "contain", "have" and their variants mean "include but are not limited to", unless otherwise specifically emphasized.

[0053] Please refer to Figure 1 A flowchart of a voltage transformer testing method provided by the embodiments of the present application is shown. The method can be implemented by relying on a computer program, relying on a single-chip microcomputer, or running on a voltage transformer testing system based on the von Neumann system. The computer program can be integrated in an application or run as an independent tool application. The specific steps of the voltage transformer testing method are described in detail below.

[0054] S101: Obtain a to-be-put-in scene of the voltage transformer, and determine a plurality of test items corresponding to the to-be-put-in scene.

[0055] The to-be-put-in scene refers to a specific type of power system environment to which the voltage transformer is to be applied. In the embodiments of the present application, it can be understood as a microgrid scene, a power grid operation scene, a new energy access scene, and the like. The to-be-put-in scene includes but is not limited to a microgrid scene, a power grid operation scene, a new energy access scene, a smart grid scene, a power distribution network automation scene, and a power system protection scene. In the embodiments of the present application, the significance of the to-be-put-in scene is to clarify the application environment, determine the test focus, and guide the working condition simulation. By clearly defining a specific type of to-be-put-in scene, a targeted testing scheme can be developed according to the characteristics and requirements of different scenes.

[0056] The test item refers to the specific detection content for evaluating the performance and characteristics of the voltage transformer. In the embodiments of the present application, it can be understood as a series of special tests for different performance aspects of the voltage transformer, such as precision testing, linearity testing, stability testing, dynamic response testing, etc. The test item is used to evaluate the performance indicators of the voltage transformer under a specific to-be-put-in scene, to ensure that it meets the actual application requirements of the scene.

[0057] In implementation, the system obtains the to-be-put-in scene information of the voltage transformer through a preset scene database or a user input interface. The scene database stores a plurality of typical application scenes, such as a micro-grid scene, a power grid operation scene, a new energy access scene, and the like, and key characteristic parameters of each scene. The system automatically matches a test item set most suitable for the to-be-put-in scene according to the obtained scene information. For example, for the power grid operation scene, the system can select the precision test, the stability test, and the dynamic response test; and for the new energy access scene, the system can increase the linearity test, and can reduce some test items with a relatively low correlation with the scene.

[0058] On the basis of the above embodiment, as an optional implementation, step S101 specifically further includes S201-S203.

[0059] S201: Obtain a to-be-put-in scene of the voltage transformer and a special environment index of the to-be-put-in scene.

[0060] The special environment index refers to a non-standard environmental factor or condition that affects the performance of the voltage transformer and the test result. In the embodiments of the present application, it can be understood as a specific environmental parameter or working condition related to the to-be-put-in scene and possibly having a significant impact on the performance of the voltage transformer. It is used to more accurately simulate the complex environment that the voltage transformer may encounter in actual application, so as to determine more targeted test items and improve the accuracy and practicality of the test. The special environment index includes but is not limited to temperature range, humidity level, altitude, electromagnetic interference intensity, vibration and impact level, pollution degree, power grid characteristics, and load characteristics, and the like.

[0061] In implementation, the system can obtain the to-be-put-in scene information through a plurality of ways. First, a preset scene database can be accessed, which stores various typical application scenes, such as a micro-grid scene, a power grid operation scene, a new energy access scene, and the like. Second, the system can receive specific scene information through a user input interface. While obtaining the basic scene information, the system also collects the special environment index related thereto. In order to obtain more accurate special environment index, the system can combine a plurality of data sources. For example, for meteorological data such as temperature and humidity, a meteorological database can be connected or historical statistical data can be used; for power grid characteristics, power system monitoring data can be obtained.

[0062] S202: Determine a standard scene type corresponding to the to-be-put-in scene, and the standard scene type corresponds to a plurality of standard test items.

[0063] Among them, the standard scene type refers to the classification of common and typical application environments and working conditions of voltage transformers. In the embodiments of the present application, it can be understood as a series of pre-defined and representative power system operating scenarios, which cover most common situations that voltage transformers may encounter in actual application. A standardized reference framework is provided for testing voltage transformers, which helps to quickly determine basic test items and parameter ranges.

[0064] Specifically, the standard scene type can include power grid operating scenarios, micro-grid scenarios, new energy access scenarios, industrial power consumption scenarios, distribution network scenarios, etc. Each standard scene type has its specific electrical characteristics, load characteristics and environmental conditions. For example, the power grid operating scenario may focus on voltage stability and harmonic content, while the new energy access scenario may focus more on voltage fluctuation and frequency change.

[0065] Among them, the standard test item refers to a series of basic test contents and methods for evaluating the performance and reliability of voltage transformers. In the embodiments of the present application, it can be understood as a set of pre-defined tests covering the main performance parameters of voltage transformers, which are based on national standards, industry specifications and actual application requirements. It is used to comprehensively evaluate the basic performance indicators of voltage transformers to ensure that they meet the basic application requirements and provide basic data support for subsequent specific scene testing. Standard test items usually include but are not limited to accuracy test, insulation performance test, temperature rise test, partial discharge test, ferroresonance test, frequency response test, etc. These test items cover the core performance indicators of voltage transformers, such as measurement accuracy, insulation strength, thermal stability, electromagnetic compatibility, etc. Each standard test item has its specific test method, test condition and evaluation standard, which are based on relevant standards and specifications.

[0066] In implementation, the system first analyzes the acquired scene information to be put into the scene, including the basic characteristics of the scene and special environmental indicators. Then, the system matches these information with predefined standard scene types. Standard scene types may include power grid operation scene, microgrid scene, new energy access scene, industrial electricity scene, distribution network scene, etc. The matching process uses intelligent algorithms, considering multiple factors such as voltage level, load characteristics, power grid topology, environmental conditions, etc. For example, if the information of the scene to be put into shows that it is located in an area containing a large number of wind power and photovoltaic power generation equipment, the system may match it to the new energy access scene type. After determining the standard scene type, the system automatically associates the standard test item set corresponding to the type. Each standard scene type has its specific test focus and requirements, so the corresponding standard test items will also be different. For example, for new energy access scene, the standard test items may pay more attention to voltage fluctuation adaptability test, frequency response test and harmonic test; while for industrial electricity scene, it may focus more on temperature rise test and partial discharge test.

[0067] S203: Adjust the standard test items of the scene type according to the special environmental indicators, to obtain a plurality of test items corresponding to the scene to be put into.

[0068] In implementation, the system first analyzes the previously acquired special environmental indicators, which may include temperature range, humidity level, altitude, electromagnetic interference strength, vibration and impact level, power grid characteristics and load characteristics, etc. Then, the system compares and analyzes these special environmental indicators with the standard test items corresponding to the standard scene type. Through this comparison, the system can identify which standard test items need to be adjusted and which additional test items need to be added. For example, if the special environmental indicators show that the scene to be put into is located in a high altitude area, the system may adjust the parameters of the insulation performance test and add the insulation strength test under low air pressure. If the special environmental indicators indicate that there is high electromagnetic interference in the area, the system may add more stringent electromagnetic compatibility tests. For scenes with temperature ranges beyond the normal range, the system may adjust the test conditions of the temperature rise test to ensure that the voltage transformer can work normally under extreme temperature.

[0069] S102: From a plurality of test items, determine a first test item combination for testing under the same simulated working condition, and a second test item for testing under an independent simulated working condition, the first test item combination comprising a plurality of first test items.

[0070] Among them, the simulation working condition refers to various conditions and states artificially created in the laboratory or test environment to simulate the actual operating environment of the voltage transformer. In the embodiments of the present application, it can be understood as a test environment and operating condition that can simulate the characteristics of the scene to be put into operation, which covers electrical parameters, environmental factors, and possible abnormal conditions. The simulation working condition is the process of converting the characteristics of the scene to be put into operation into controllable and repeatable test conditions. It includes electrical parameter simulation, environmental condition simulation, load characteristic simulation, fault and abnormal condition simulation, and long-term operation simulation, etc. For example, electrical parameter simulation includes simulating voltage level, current size, power factor, frequency change, etc.; environmental condition simulation involves simulating environmental factors such as temperature, humidity, air pressure, vibration, electromagnetic interference, etc.; load characteristic simulation simulates different types of loads, such as linear load, nonlinear load, dynamic load, etc.

[0071] Among them, the first test item combination refers to a set composed of multiple test items that can share the same simulation working condition. In the embodiments of the present application, it can be understood as a group of core test items that can be continuously or in parallel performed in the same or highly similar simulation environment after being screened and optimized for specific standard scene types and special environmental indicators. It is used to efficiently and systematically evaluate the basic performance and key characteristics of the voltage transformer in a specific application scene.

[0072] Among them, the second test item refers to a special test item that needs to be tested separately in a specially constructed simulation working condition. In the embodiments of the present application, it can be understood as a test item that cannot share the same simulation working condition with other test items due to its uniqueness, complexity, or special environmental requirements, and must be tested separately in a specially set test environment. It is used to evaluate the performance of the voltage transformer under specific extreme conditions or special working states, and to verify its reliability and stability in unconventional environments.

[0073] In the embodiments, in the test process of the voltage transformer, in order to improve the test efficiency and ensure the accuracy of the test, the purposes of each test item, the required environmental conditions, the test equipment requirements, and the mutual correlation of the test results are comprehensively considered. Through this analysis, it can be identified which test items can be performed in the same or highly similar simulation working condition, thereby forming the first test item combination. For example, voltage ratio error test, phase error test, and temperature rise test, etc. can be classified as the first test item because they can be performed under similar temperature, humidity, and voltage conditions. At the same time, the system also identifies those items that require special environment or equipment and cannot share the simulation working condition with other tests, which are classified as the second test item, such as electromagnetic compatibility test or partial discharge test.

[0074] In implementation, the system will preliminarily screen all test items according to the pre-set standard scene types and special environmental indicators. Then, by analyzing the specific requirements and characteristics of each test item, it determines which items can share simulation conditions. These test items that can share simulation conditions are combined into a first test item combination. Those items that cannot share simulation conditions with other tests are determined as a second test item.

[0075] S103: Update the standard simulation conditions corresponding to the first test item combination to target simulation conditions using the test environment parameters corresponding to each first test item.

[0076] The test environment parameters refer to various physical and electrical conditions that need to be controlled and monitored during the voltage transformer test process. In the embodiments of the present application, they can be understood as a set of key variables used to simulate the actual working environment of the voltage transformer, which can accurately describe and control the environmental state during the test process.

[0077] The standard simulation conditions are a set of test environment parameter combinations used to simulate various working conditions that the voltage transformer may encounter in typical application scenarios. The construction of these conditions is based on in-depth analysis and comprehensive consideration of power system operation characteristics, voltage transformer application environment, and relevant standard specifications. The design process of the standard simulation conditions involves the determination of multiple key environmental factors and the setting of parameter value ranges, such as temperature, humidity, electromagnetic interference intensity, power supply voltage fluctuation, and harmonic content, etc. In the embodiments of the present application, the standard simulation conditions are mainly used for testing of the first test item combination.

[0078] The target simulation conditions refer to the comprehensive test environment conditions set for multiple related test items during the voltage transformer test process. In the embodiments of the present application, they can be understood as simulation conditions that are closer to the actual use environment obtained by optimizing and adjusting the standard simulation conditions by considering the mutual influence between multiple test items. They are used to evaluate the performance of the voltage transformer on multiple related test items under a single test environment.

[0079] In this embodiment, the standard simulation conditions are usually designed for a single test item and cannot fully reflect the complex situations that the voltage transformer faces in the actual use environment. In actual applications, the voltage transformer is often affected by multiple environmental factors, and these factors may interact with each other. Therefore, by updating to the target simulation conditions, we can create a test condition that is closer to the actual use environment.

[0080] In implementation, first, the test environment parameters corresponding to each first test item need to be obtained. These parameters may include but are not limited to temperature, humidity, electromagnetic interference intensity, vibration amplitude, etc., which reflect the specific environmental conditions simulated by each test item. Then, the mutual relationship and possible interaction between these parameters are analyzed, considering their comprehensive influence on the performance of the voltage transformer. Based on the analysis results, the standard simulation working condition is adjusted and optimized to form a target simulation working condition that can reflect the influence of multiple environmental factors at the same time.

[0081] Based on the above embodiment, as an optional implementation, the step of updating the target simulation working condition in step S103 specifically further includes S301-S303.

[0082] S301: According to the standard simulation working condition corresponding to the first test item combination and the standard characteristic parameters of the standard voltage transformer, a digital twin model corresponding to the standard voltage transformer is constructed.

[0083] The standard voltage transformer refers to a high-precision voltage transformer that has been strictly calibrated and certified, and its performance parameters and measurement errors meet the requirements of relevant national or international standards. In the embodiments of the present application, it can be understood as an idealized voltage transformer model with known and stable characteristic parameters, including but not limited to rated transformation ratio, phase error, frequency response characteristics, etc. It is used as a reference for testing and calibrating other voltage transformers.

[0084] The standard characteristic parameters refer to a series of key indicators and values that describe the performance and behavior of the standard voltage transformer. In the embodiments of the present application, they can be understood as various performance indicators of the standard voltage transformer under ideal conditions. These indicators are obtained through strict testing and calibration, and have high accuracy and reliability. Standard characteristic parameters usually include but are not limited to rated transformation ratio, phase error, frequency response characteristics, linearity, temperature coefficient, load characteristics, etc.

[0085] The digital twin model corresponding to the standard voltage transformer refers to a virtual simulation model constructed based on the characteristic parameters and behavior characteristics of the standard voltage transformer. It is used to simulate and predict the performance of the standard voltage transformer under various test conditions in a virtual environment, providing theoretical basis and data support for optimizing the target simulation working condition. This digital twin model can receive various test environment parameters as input, and through simulation calculation, it can obtain the expected output and error of the standard voltage transformer under these conditions, thereby helping to analyze the mutual influence between different test items.

[0086] In this embodiment, in order to create a virtual, highly accurate standard voltage transformer model for simulating and predicting performance under various test conditions. In practice, first, collect the comprehensive standard characteristic parameters of the standard voltage transformer, including rated transformation ratio, phase error, frequency response characteristic, linearity, temperature coefficient and load characteristic, etc. At the same time, obtain the standard simulation working conditions corresponding to the first test item combination, which reflects the standard test environment of each test item. Next, based on these data, a mathematical model is constructed, which describes the correlation between the output results of the standard voltage transformer in the working state and the actual values of the measured object. Then, combined with the standard simulation working conditions, a dynamic simulation model is developed, which can simulate the dynamic response of the standard voltage transformer under different environmental conditions. Finally, the mathematical model and the dynamic simulation model are integrated to form a complete digital twin model.

[0087] Based on the above embodiment, as an optional implementation, the digital twin model specifically includes a mathematical model and a dynamic simulation model, and step S301 specifically further includes S3011-S3012.

[0088] S3011: Obtain the standard characteristic parameters of the standard voltage transformer, and determine the mathematical model of the correlation between the output results of the standard voltage transformer in the working state and the actual values of the measured object.

[0089] In practice, first, obtain the standard characteristic parameters of the standard voltage transformer from its calibration certificate or technical specification, including rated transformation ratio, phase error, frequency response characteristic, linearity, temperature coefficient and load characteristic, etc. These parameters are usually obtained by strict calibration procedures by national metrology institutions, with high accuracy and reliability. Then, based on these parameters, a mathematical model of the standard voltage transformer is established. The model usually includes an ideal transformation ratio equation, an error compensation term and an environmental factor influence term. The ideal transformation ratio equation describes the ideal relationship between the input voltage and the output voltage, the error compensation term considers the deviation between the actual transformation ratio and the ideal transformation ratio, and the environmental factor influence term reflects the influence of temperature, frequency and other external conditions on the measurement results. By integrating these factors, a complete mathematical model can be obtained, which can accurately describe the correlation between the output results of the standard voltage transformer and the actual values of the measured object.

[0090] S3012: According to the standard simulation working conditions corresponding to the first test item combination and the mathematical model, construct a dynamic simulation model of the standard voltage transformer.

[0091] The dynamic simulation model refers to a computer model that can simulate and predict the dynamic behavior of a system at different time points and environmental conditions. In the embodiments of the present application, it can be understood as a virtual simulation system constructed based on the mathematical model of the standard voltage transformer and the standard simulation working conditions, which can simulate the dynamic response and performance of the standard voltage transformer in various changing test environments in real time. It is used to simulate the transient and steady-state behavior of the standard voltage transformer under different test conditions, predict its performance changes in complex environments, analyze the influence of various test parameters on the output of the voltage transformer, and evaluate the interaction between different test items.

[0092] In the embodiments, in order to create a virtual simulation system that can simulate the dynamic response of the standard voltage transformer in various complex environments in real time, thereby providing a reliable theoretical basis for subsequent test optimization. In specific implementation, first, the standard simulation working conditions corresponding to the first test item combination are collected, which include the standard environmental parameters of each test item, such as frequency, magnetic field strength, temperature and humidity, phase and noise signal, etc. Then, combine these standard simulation working conditions with the mathematical model established in the previous step, and use computer simulation software (such as MATLAB Simulink or LabVIEW) to construct a dynamic simulation model. In the construction process, the parameters and relationships in the mathematical model need to be converted into modules and connections in the simulation software, and at the same time, appropriate solvers and simulation steps are set to ensure the calculation accuracy and efficiency of the model. Next, set the parameters in the standard simulation working conditions as the input variables of the model, so that the model can calculate the output response of the standard voltage transformer in real time according to these inputs. Finally, through multiple iterations and verifications, debug and optimize the dynamic simulation model to ensure that it can accurately reflect the dynamic behavior of the standard voltage transformer under various conditions.

[0093] S302: input the test environment parameters of each first test item into the digital twin model respectively to obtain the output result influence value between each first test item.

[0094] Among them, the output result influence value refers to the quantitative influence of one test item on the measurement results of another test item when multiple test items are performed at the same time. In the embodiments of the present application, it can be understood as the deviation of the output results of the voltage transformer caused by the interaction between each first test item, which reflects the influence degree of the interaction effect between different test environment factors on the measurement results. It is used to quantitatively evaluate the mutual influence between different test items.

[0095] In this embodiment, in order to quantitatively evaluate the mutual influence between different test items, data support is provided for creating target simulation working conditions closer to the actual use environment. In specific implementation, first, the test environment parameters of each first test item are collected, which can include temperature, humidity, frequency, magnetic field strength, phase, etc. Then, these parameters are input one by one into the digital twin model constructed in the previous step. The digital twin model will simulate the performance of the standard voltage transformer under various test conditions according to the input parameters. By comparing the simulation results of single test item and multiple test items at the same time, the output result influence value between each first test item can be calculated. This process needs to run the model multiple times to simulate each test item separately and multiple test items in combination. By comparing these simulation results, the influence degree of each test item on the measurement results of other items can be obtained.

[0096] On the basis of the above embodiment, as an optional implementation, step S302 specifically further includes S3021-S3022.

[0097] S3021: input the test environment parameters of each first test item into the digital twin model respectively, to obtain the dynamic error of each first test item after simulating the dynamic response under the influence of other first test items, and the test environment parameters include frequency, magnetic field strength, temperature and humidity, phase, and noise signal.

[0098] In specific implementation, first, the test environment parameters of each first test item are collected, including frequency, magnetic field strength, temperature and humidity, phase, and noise signal. These parameters comprehensively reflect various conditions that the voltage transformer may face in the actual use environment. Then, these parameters are input into the digital twin model constructed in the previous step according to different combination modes. The digital twin model will simulate the dynamic response of the standard voltage transformer under various complex test conditions according to the input parameter combination. By comparing the difference between the simulation output result and the ideal output result, the dynamic error of each test item under the influence of other test items can be calculated. This process needs to run the model multiple times to simulate various possible test environment combinations to obtain comprehensive dynamic error data. In the simulation process, special attention is paid to the interaction between different environment parameters, such as the influence of temperature on frequency response, or the influence of magnetic field strength on phase error, etc.

[0099] S3022: according to the dynamic error and the standard characteristic parameters of the standard voltage transformer, the output result influence value between each first test item is obtained.

[0100] The dynamic error refers to the real-time deviation of the output of the standard voltage transformer from the ideal output value when multiple test items are performed simultaneously. This deviation reflects the performance of the voltage transformer in a complex and dynamic test environment. It is used to evaluate the measurement accuracy of the voltage transformer under actual working conditions, analyze the mutual influence between different test items, and optimize the test scheme and improve the design of the voltage transformer. The calculation of the dynamic error takes into account the comprehensive influence of the environmental parameters of each test item on the performance of the standard voltage transformer, and it can reflect the response characteristics of the voltage transformer when facing rapidly changing test conditions.

[0101] In specific implementation, first, the dynamic error data of each first test item under the influence of other first test items obtained in the previous step are utilized. These dynamic error data reflect the performance deviation of the voltage transformer in a complex test environment. Then, combined with the standard characteristic parameters of the standard voltage transformer, such as rated transformation ratio, phase error, frequency response characteristics, etc., data analysis and processing are performed. This process needs to consider the relationship between dynamic error and standard characteristic parameters, as well as the interaction effect between different test items. By comparing the ideal output of a single test item with the actual output under the influence of other test items, the influence degree of each test item on other items can be calculated. This calculation needs to consider the reference value provided by the standard characteristic parameters to ensure that the obtained influence value accurately reflects the deviation relative to the standard performance.

[0102] S303: Update the standard simulation working condition to the target simulation working condition according to the output result influence value.

[0103] In specific implementation, first, the output result influence values between each first test item obtained in the previous step are analyzed. These influence values quantitatively reflect the degree of interaction between different test items. Then, the standard simulation working condition is adjusted according to these influence values. During the adjustment process, attention needs to be paid to those test item combinations with significant mutual influence, and their test parameters need to be optimized. For example, if it is found that there is a large mutual influence between frequency and temperature, both factors need to be considered in the target simulation working condition. During the adjustment, the actual adjustable range of each test parameter and the equipment limit need to be considered to ensure that the updated working condition is achievable. In addition, new test parameters may need to be introduced or the test order may need to be adjusted to better simulate the complex situation in the actual use environment. Through these adjustments, the standard simulation working condition is optimized to become a more realistic target simulation working condition.

[0104] S104: Test the first test item of the voltage transformer under the target simulation working condition, and the second test item of the voltage transformer under the independent simulation working condition, to obtain the comprehensive test result.

[0105] In this embodiment, in order to comprehensively evaluate the performance of the voltage transformer under complex actual environment and specific single condition, and to obtain comprehensive and accurate test data. In specific implementation, first, set the test environment according to the optimized target simulation working condition, and test the voltage transformer for the first test item. These test items may include frequency response, phase error, temperature influence and other aspects, which are carried out at the same time under the target simulation working condition to simulate the working state of the voltage transformer in the actual complex environment. During the test process, the parameters need to be accurately controlled to ensure that the test conditions are consistent with the target simulation working condition. At the same time, the second test item needs to be tested, which is carried out under an independent simulation working condition, and each test item is carried out independently without being affected by other factors. The second test item may include insulation performance, mechanical strength and other items that need to be evaluated independently under specific conditions. In this way, the comprehensive performance of the voltage transformer under complex environment is evaluated, and the independent performance data of the voltage transformer under specific conditions is obtained. During the test process, high-precision measuring equipment needs to be used, and the operation needs to be carried out according to the standardized test process, so as to ensure the accuracy and reliability of the data. After the test is completed, all the test data is analyzed to obtain the comprehensive test result.

[0106] In an optional implementation, step S104 further includes steps S401-S402.

[0107] S401: respectively acquire a first duration for the voltage transformer to recover to a normal state after the target simulation working condition, and a second duration for the voltage transformer to recover to the normal state after the independent simulation working condition.

[0108] The first duration refers to the time required for the voltage transformer to recover to the initial normal state after the target simulation working condition test. In the embodiments of the present application, it can be understood as the recovery time required for the voltage transformer to return to the stable initial state after completing the first test item under the target simulation working condition. This duration is used to ensure that the voltage transformer has completely eliminated the influence of the previous test condition before the next test or before being put into actual use, and returns to the original performance state.

[0109] The second duration refers to the duration of the second test item of the voltage transformer under the independent simulation working condition. In the embodiments of the present application, it can be understood as the test duration of the voltage transformer under a single specific test condition. This duration is used to ensure that each test item under the independent simulation working condition can be fully and accurately evaluated without being disturbed by other factors.

[0110] Separately capturing the first time it takes for the voltage transformer to recover to normal after undergoing the target simulated operating condition and the second time it takes for the voltage transformer to recover to normal after undergoing an independent simulated operating condition is a key step in ensuring test accuracy while improving overall test efficiency. The primary purpose of this step is to determine the optimal test sequence by comparing the recovery times under these two different test conditions, thereby maximizing the time efficiency of the testing process. In practice, preliminary testing is first required to obtain these two time measurements. For the first time measurement, immediately after completing the comprehensive test under the target simulated operating condition, the time required for the voltage transformer to recover to normal is recorded. This is achieved by continuously monitoring key parameters (such as voltage ratio and phase angle) until they return to a predetermined normal range. Similarly, for the second time measurement, the recovery time is also recorded after completing the individual tests under the independent simulated operating condition.

[0111] S402: Compare the first duration and the second duration to determine a testing sequence of the first test item and the second test item.

[0112] By properly arranging the test sequence, waiting time during the test can be minimized, thereby improving test time efficiency. In specific implementation, the first and second duration data acquired previously need to be compared. If the first duration is less than the second duration, the first test item under the target simulated operating condition is scheduled to be performed first, followed by the second test item under the independent simulated operating condition. Conversely, if the second duration is less than the first duration, the second test item under the independent simulated operating condition is performed first, followed by the first test item under the target simulated operating condition. This sequencing method is based on placing test items with longer recovery times later, allowing the next test to begin immediately after the previous test completes, without having to wait for the voltage transformer to fully recover. For example, if the second duration is shorter, preparations for the target simulated operating condition test can begin immediately after completing the independent simulated operating condition test, without having to wait for the long recovery time. This test sequencing arrangement not only improves test efficiency but also ensures that the voltage transformer is in the proper state before each test begins, thereby ensuring the accuracy of the test results.

[0113] Based on the above embodiment, as an optional implementation, it is determined whether there are test items in the comprehensive test results whose test results do not meet the test standards;

[0114] If there are test items in the comprehensive test results whose test results do not meet the test standards, the test items whose test results do not meet the test standards are determined as target test results, and the improvement parameters of the voltage transformer are determined according to the target test results.

[0115] In implementation, first, the results of each test item are compared with the pre-set test standards. These standards usually include the allowed ranges of key parameters such as voltage ratio error, phase angle error, and insulation performance. By using professional data analysis software or manual review, the results of each test item are compared with the corresponding standards one by one. If the results of one or more test items are found to be out of the allowed range, these items are marked as not meeting the test standards. Subsequently, these test items that do not meet the standards are determined as target test results. These target test results become the focus of attention for subsequent improvement work. By checking and analyzing these factors one by one, the key parameters that affect the performance of the voltage transformer can be determined, which are called improvement parameters. The improvement parameters may include the type of insulation material, the size and material of the magnetic core, the number of turns and layout of the coil, etc. After determining these improvement parameters, the design or manufacturing process of the voltage transformer can be adjusted to improve its performance.

[0116] The following is an embodiment of the system of the present application, which can be used to execute the method embodiments of the present application. For details not disclosed in the system embodiments of the present application, please refer to the method embodiments of the present application.

[0117] Please refer to Figure 2 , which shows a structural schematic diagram of a voltage transformer test system provided by an exemplary embodiment of the present application. The system can be realized by software, hardware, or a combination of both to become all or part of the system. The voltage transformer test system includes:

[0118] A test item determination module is configured to obtain a to-be-put-into-scene of the voltage transformer and determine a plurality of test items corresponding to the to-be-put-into-scene;

[0119] A simulation condition division module is configured to determine, from the plurality of test items, a first test item combination for testing by using the same simulation condition and a second test item for testing by using an independent simulation condition, the first test item combination including a plurality of first test items;

[0120] A simulation condition updating module is configured to update a standard simulation condition corresponding to the first test item combination to a target simulation condition by using test environment parameters corresponding to each first test item;

[0121] A test module is configured to test the first test items of the voltage transformer under the target simulation condition and the second test item of the voltage transformer under the independent simulation condition, and obtain a comprehensive test result.

[0122] On the basis of the above-mentioned embodiments, as an optional embodiment, the test item determination module is further configured to obtain a to-be-put-into-service scenario of the voltage transformer and a special environment index of the to-be-put-into-service scenario; determine a standard scenario type corresponding to the to-be-put-into-service scenario, the standard scenario type corresponding to a plurality of standard test items; and adjust the standard test items of the scenario type according to the special environment index, to obtain a plurality of test items corresponding to the to-be-put-into-service scenario.

[0123] On the basis of the above-mentioned embodiments, as an optional embodiment, the simulation condition updating module is further configured to construct a digital twin model corresponding to the standard voltage transformer according to the standard simulation condition corresponding to the first test item combination and the standard characteristic parameter of the standard voltage transformer; input the test environment parameters of each first test item into the digital twin model respectively, to obtain an output result influence value between the first test items; and update the standard simulation condition to the target simulation condition according to the output result influence value.

[0124] On the basis of the above-mentioned embodiments, as an optional embodiment, the simulation condition updating module is further configured to obtain the standard characteristic parameter of the standard voltage transformer, determine a mathematical model of the correlation relationship between the output result of the standard voltage transformer in the working state and the actual value of the measured object; and construct a dynamic simulation model of the standard voltage transformer according to the standard simulation condition corresponding to the first test item combination and the mathematical model.

[0125] On the basis of the above-mentioned embodiments, as an optional embodiment, the simulation condition updating module is further configured to input the test environment parameters of each first test item into the digital twin model respectively, to obtain a dynamic error of each first test item after simulating a dynamic response under the influence of other first test items, the test environment parameters including frequency, magnetic field strength, temperature and humidity, phase and noise signal; and obtain an output result influence value between the first test items according to the dynamic error and the standard characteristic parameter of the standard voltage transformer.

[0126] On the basis of the above-mentioned embodiments, as an optional embodiment, the test module is further configured to obtain a first time length for the voltage transformer to recover to a normal state after the target simulation condition, and a second time length for the voltage transformer to recover to the normal state after the independent simulation condition; compare the first time length with the second time length, to determine a test sequence of the first test item and the second test item.

[0127] On the basis of the above-mentioned embodiments, as an optional embodiment, the test module is further configured to determine whether there is a test item with a test result not meeting a test standard in the comprehensive test result; if there is a test item with a test result not meeting a test standard in the comprehensive test result, determine the test item with a test result not meeting a test standard as a target test result, and determine an improvement parameter of the voltage transformer according to the target test result.

[0128] The embodiment of the present application further provides a computer storage medium, which can store a plurality of instructions, and the instructions are suitable for being loaded and executed by a processor to implement the voltage transformer test method of the above embodiment. The specific implementation process can be referred to the specific description of the above embodiment, and will not be repeated here.

[0129] Please refer to Figure 3 The embodiment of the present application provides a structural schematic diagram of an electronic device. As shown in the figure, Figure 3 The electronic device 300 can include at least one processor 301, at least one network interface 304, a user interface 303, a memory 305, and at least one communication bus 302.

[0130] The communication bus 302 is used to realize the connection and communication between the components.

[0131] The user interface 303 can include a standard wired interface and a wireless interface.

[0132] The network interface 304 can optionally include a standard wired interface and a wireless interface (such as a WI-FI interface).

[0133] The processor 301 can include one or more processing cores. The processor 301 connects various parts of the server through various interfaces and lines, executes various functions of the server and processes data by running or executing instructions, programs, code sets or instruction sets stored in the memory 305, and calling data stored in the memory 305. Optionally, the processor 301 can be realized in at least one of the following hardware forms: digital signal processing (Digital Signal Processing, DSP), field programmable gate array (Field-Programmable Gate Array, FPGA), and programmable logic array (Programmable Logic Array, PLA). The processor 301 can integrate a combination of one or several of the following: central processing unit (Central Processing Unit, CPU), graphics processing unit (Graphics Processing Unit, GPU), and modem. The CPU is mainly used to process operating systems, user interfaces, and application programs. The GPU is used to render and draw the content to be displayed on the display screen. The modem is used to process wireless communication. It can be understood that the above-mentioned modem can also not be integrated into the processor 301, but can be realized by a separate chip.

[0134] The memory 305 can include a random access memory (RAM) and can also include a read-only memory (ROM). Optionally, the memory 305 includes a non-transitory computer-readable storage medium. The memory 305 can be used to store instructions, programs, codes, code sets, or instruction sets. The memory 305 can include a program storage area and a data storage area, where the program storage area can store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playing function, an image playing function, etc.), instructions for implementing the various method embodiments described above, etc.; the data storage area can store data involved in the various method embodiments described above, etc. The memory 305 can also optionally be at least one storage device located away from the aforementioned processor 301. As shown in Figure 3 The memory 305, as a computer storage medium, can include an operating system, a network communication module, a user interface module, and an application program of a voltage transformer testing method.

[0135] In the electronic device 300 shown in Figure 3 In the electronic device 300 shown in

[0136] An electronic device readable storage medium stores instructions. When executed by one or more processors, the electronic device performs the method of one or more of the above embodiments.

[0137] It should be noted that, for the above-mentioned method embodiments, in order to simply describe, they are all expressed as a series of action combinations, but those skilled in the art should know that the application is not limited by the described action sequence, because according to the application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should know that the embodiments described in the specification all belong to preferred embodiments, and the actions and modules involved are not necessarily required by the application.

[0138] In the above embodiments, the description of each embodiment has its own emphasis, and the parts not described in detail in a certain embodiment can be referred to the related description of other embodiments.

[0139] In several embodiments provided in the present application, it should be understood that the disclosed apparatus can be implemented in other manners. For example, the division of the apparatus embodiments is merely illustrative, and the units can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed mutual couplings or direct couplings or communication connections can be indirect couplings or communication connections through some interfaces, devices or units, and can be in electrical, mechanical or other forms.

[0140] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one place, or distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

[0141] In addition, the functional units in each embodiment of the present application can be integrated into a processing unit, or each unit can be physically present separately, or two or more units can be integrated into one unit. The integrated unit can be realized in the form of hardware or in the form of a software functional unit.

[0142] If the integrated unit is realized in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the present application essentially or the part that contributes to the prior art or the whole or part of the technical solutions can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server or a network device, etc.) to execute all or part of the steps of the methods in the embodiments. The aforementioned storage medium includes: U disk, mobile hard disk, magnetic disk or optical disk, and various program codes that can be stored.

[0143] The above are only exemplary embodiments of the present disclosure, and cannot limit the scope of the present disclosure. That is, any equivalent changes and modifications made in accordance with the teachings of the present disclosure are still within the scope of the present disclosure. Other embodiments of the present disclosure will be readily apparent to those skilled in the art upon considering the specification and practicing the true principles of the present disclosure. The present application is intended to cover any variations, uses or adaptive changes of the present disclosure that follow the general principles of the present disclosure and include common knowledge or conventional techniques in the art that are not described in the present disclosure.

Claims

1. A voltage transformer testing method, characterized by, The method comprises: acquiring a to-be-put-into-service scene of a voltage transformer, and determining a plurality of test items corresponding to the to-be-put-into-service scene; determining, from the plurality of test items, a first test item combination that adopts a same simulation working condition for testing, and a second test item that adopts an independent simulation working condition for testing, the first test item combination comprising a plurality of first test items; updating a standard simulation working condition corresponding to the first test item combination into a target simulation working condition using test environment parameters corresponding to each of the first test items; the updating of the standard simulation working condition corresponding to the first test item combination into the target simulation working condition using the test environment parameters corresponding to each of the first test items comprises: constructing a digital twin model corresponding to a standard voltage transformer according to the standard simulation working condition corresponding to the first test item combination and standard characteristic parameters of the standard voltage transformer; inputting test environment parameters of each of the first test items into the digital twin model respectively to obtain an output result influence value between each of the first test items; and updating the standard simulation working condition into the target simulation working condition according to the output result influence value; the digital twin model comprises a mathematical model and a dynamic simulation model, and the constructing of the digital twin model corresponding to the standard voltage transformer according to the standard simulation working condition corresponding to the first test item combination and the standard characteristic parameters of the standard voltage transformer comprises: acquiring the standard characteristic parameters of the standard voltage transformer, determining the mathematical model of the correlation between the output result of the standard voltage transformer in a working state and an actual value of a measured object; constructing the dynamic simulation model of the standard voltage transformer according to the standard simulation working condition corresponding to the first test item combination and the mathematical model, the dynamic simulation model being capable of simulating the dynamic response of the standard voltage transformer under different environmental conditions; and integrating the mathematical model and the dynamic simulation model to form a complete digital twin model; the inputting of the test environment parameters of each of the first test items into the digital twin model respectively to obtain the output result influence value between each of the first test items comprises: inputting the test environment parameters of each of the first test items into the digital twin model respectively according to different combination modes, the digital twin model simulating the dynamic response of the standard voltage transformer under various complex test conditions according to the input parameter combination; obtaining a dynamic error of each of the first test items after a simulation dynamic response under the influence of other first test items by comparing the difference between a simulation output result and an ideal output result, the test environment parameters comprising frequency, magnetic field strength, temperature and humidity, phase and noise signal; and obtaining the output result influence value between each of the first test items according to the dynamic error and the standard characteristic parameters of the standard voltage transformer; testing the first test items of the voltage transformer under the target simulation working condition and the second test item of the voltage transformer under the independent simulation working condition to obtain a comprehensive test result.

2. The method of claim 1, wherein, The obtaining the to-be-put-into-scene of the voltage transformer, determining a plurality of test items corresponding to the to-be-put-into-scene, comprises: Obtaining the to-be-put-into-scene of the voltage transformer, and a special environment index of the to-be-put-into-scene; Determine the standard scene type corresponding to the to-be-put-into-scene, the standard scene type corresponds to a plurality of standard test items; According to the special environment index, the standard test items of the scene type are adjusted to obtain a plurality of test items corresponding to the to-be-put-into-scene.

3. The method of claim 1, wherein, The test of the voltage transformer under the target simulation working condition and the second test item of the voltage transformer under the independent simulation working condition, before obtaining the comprehensive test result, further comprises: Respectively obtaining the first time length of the voltage transformer after the target simulation working condition and returning to the normal state, and the second time length of the voltage transformer after the independent simulation working condition and returning to the normal state; Compare the first time length with the second time length, and determine the test order of the first test item and the second test item.

4. The method of claim 1, wherein, The test of the voltage transformer under the target simulation working condition and the second test item of the voltage transformer under the independent simulation working condition, after obtaining the comprehensive test result, further comprises: Determine whether there is a test item in the comprehensive test result that does not meet the test standard; If there is a test item in the comprehensive test result that does not meet the test standard, the test item that does not meet the test standard is determined as the target test result, and the improvement parameter of the voltage transformer is determined according to the target test result.

5. A voltage transformer testing system characterized in that, The system comprises: Test item determination module, for obtaining the to-be-put-into-scene of the voltage transformer, determining a plurality of test items corresponding to the to-be-put-into-scene; Simulation working condition division module, for determining a first test item combination for testing by using the same simulation working condition and a second test item for testing by using the independent simulation working condition from a plurality of test items, the first test item combination comprises a plurality of first test items; The simulation condition updating module is configured to update a standard simulation condition corresponding to the first test item combination to a target simulation condition using test environment parameters corresponding to each of the first test items. The test module is configured to test the first test item of the voltage transformer under the target simulation condition and a second test item of the voltage transformer under the independent simulation condition, and obtain a comprehensive test result.

6. A computer storage medium, characterized in that The computer storage medium stores a plurality of instructions, which are suitable for being loaded and executed by the processor to perform the method of any one of claims 1-4.

7. An electronic device, comprising: An electronic device comprising a processor, a memory for storing instructions, and a transceiver for communicating with other devices, the processor configured to execute the instructions stored in the memory to cause the electronic device to perform the method of any one of claims 1-4.

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