Time measurement target plate, delay detection device and imaging equipment detection system

Abstract

The invention relates to a time measurement target plate, a delay detection device and an imaging equipment detection system. The time measurement target plate comprises a point light source array unit and a point light source driving unit connected with the point light source array unit; the point light source array unit comprises point light sources which are arranged in sequence; the point light source driving unit independently drives a single point light source, and the point light source driving unit can control the point light source to be lightened at a preset frequency. Through independent control of the point light source, the control efficiency of the point light source is improved, the lightening delay is reduced, and the time measurement target plate has stronger expansibility.

Description

Technical Field

[0001] The present application relates to the field of optical technology, and in particular to a time measurement target plate, a time delay detection device, and an imaging device detection system. Background Art

[0002] As a basic physical quantity, time is a very important concept in human society. In modern science and technology and industrial production, accurate time measurement is critical to many applications, such as communication, navigation, astronomical observation, physical experiments, etc.

[0003] In related technologies, especially in the field of optical imaging, target equipment is a tool used to measure time. For example, in the measurement of camera exposure time, a number of LED lights are arranged on the panel of the existing target equipment. The LED lights are connected in series as a whole and are controlled as a whole by a control module. Each LED light lights up in turn at a fixed time interval. After a certain period of time, the total number of LED lights that light up can be counted, and the image of the target equipment is captured by the camera. The time can be calculated by the total number of LED lights that light up.

[0004] However, the above-mentioned LED lights in series that are controlled as a whole have poor expansion and large delay, resulting in inaccurate time calculation. Therefore, it is difficult to apply them in the field of delay measurement that requires higher time measurement accuracy. Summary of the invention

[0005] Based on this, it is necessary to provide a time measurement target, a delay detection device and an imaging device detection system that can improve the accuracy of time measurement in order to solve the above technical problems.

[0006] In a first aspect, the present application provides a time measurement target plate for measuring time, comprising a point light source array unit and a point light source driving unit connected to the point light source array unit;

[0007] The point light source array unit comprises point light sources arranged in sequence;

[0008] The point light source driving unit drives a single point light source separately, and the point light source driving unit can control the point light source to light up at a preset frequency.

[0009] In one embodiment, the point light sources are arranged in a linear arrangement, a two-dimensional array arrangement, or a ring arrangement.

[0010] In one of the embodiments, the point light sources are lit up in sequence at the same frequency.

[0011] In a second aspect, the present application provides a time delay detection device for measuring the time delay data of an imaging device to be tested, comprising a first image acquisition device, a second image acquisition device, a signal control and processing system, and the time measurement target plate described in any one of the first aspects above;

[0012] The first image acquisition device and the second image acquisition device are arranged opposite to the time measurement target plate; wherein the first image acquisition device is aligned with the display module of the imaging device to be tested, so that the first image acquisition device can capture the image of the point light source array unit displayed by the imaging device to be tested to obtain a first time delay measurement image; and the second image acquisition device can directly capture the point light source array unit in the real environment to obtain a second time delay measurement image;

[0013] The signal control and processing system is connected to the first image acquisition device, the second image acquisition device and the time measurement target plate, and is used to control the first image acquisition device, the second image acquisition device and the time measurement target plate, and receive the first delay measurement image and the second delay measurement image, and calculate the delay data of the imaging device to be measured based on the first delay measurement image and the second delay measurement image.

[0014] In one of the embodiments, the signal control and processing system includes a fault testing module;

[0015] The fault testing module is connected to the point light source driving unit to drive all the point light sources to light up;

[0016] The fault test module is also connected to the second image acquisition device, and controls the second image acquisition device to capture all the lighted point light source array units to obtain a fault test image;

[0017] The fault testing module is used to compare the fault testing image with a preset full-brightness image to identify the point light source with a fault.

[0018] In one of the embodiments, the signal control and processing system further includes a synchronization signal generator;

[0019] The synchronization signal generator is connected to the first image acquisition device, the second image acquisition device and the time measurement target plate, and is used to send a synchronization signal to control the simultaneous triggering of the first image acquisition device, the second image acquisition device and the time measurement target plate.

[0020] In a third aspect, the present application provides a time delay detection device for measuring the time delay data of an imaging device to be tested, comprising a first image acquisition device, a signal control and processing system, and the time measurement target plate described in any one of the above aspects;

[0021] The first image acquisition device is arranged opposite to the time measurement target plate; wherein the first image acquisition device is aligned with the display module of the imaging device to be tested, so that the first image acquisition device can capture the image of the point light source array unit displayed by the imaging device to be tested, and obtain a first delay measurement image;

[0022] The time measurement target plate further comprises a pulse signal sending unit; the pulse signal sending unit is connected to the signal control and processing system and is used to send a pulse signal to the signal control and processing system when the point light source is lit;

[0023] The signal control and processing system is connected to the first image acquisition device, and is used to receive the first delay measurement image and the pulse signal when the point light source is lit; and calculate the delay data of the imaging device to be tested based on the first delay measurement image and the pulse signal.

[0024] In a fourth aspect, the present application provides an imaging device detection system, comprising a depth detection target plate and a time-delay detection device as described in any one of the second aspect or the third aspect above;

[0025] The depth detection target plate is arranged opposite to the first image acquisition device; wherein the first image acquisition device is a binocular camera.

[0026] In one of the embodiments, the imaging device detection system further includes: an image quality measurement module; the image quality measurement module includes an image quality detection target plate.

[0027] In one of the embodiments, the imaging device detection system further comprises: a target plate support mechanism;

[0028] The depth detection target plate, the image quality detection target plate and the time measurement target plate are detachably mounted on the target plate supporting mechanism; the target plate supporting mechanism is movable relative to the image acquisition device; wherein the image acquisition device comprises a first image acquisition device and a second image acquisition device.

[0029] In one of the embodiments, the imaging device detection system further includes an imaging device fixing bracket;

[0030] The imaging device fixing bracket is arranged between the image acquisition device and the target plate supporting mechanism; the imaging device to be tested is installed on the imaging device fixing bracket; the imaging device fixing bracket is connected to the signal control and processing system, and the display module of the imaging device to be tested is moved into or out of the field of view of the image acquisition device according to the control signal of the signal control and processing system.

[0031] In one of the embodiments, the imaging device to be tested is a head mounted display device with a video see-through mode turned on.

[0032] The above-mentioned time measurement target, delay detection device and imaging device detection system include a point light source array unit and a point light source driving unit connected to the point light source array unit; the point light source array unit includes point light sources arranged in sequence; the point light source driving unit drives a single point light source separately, and the point light source driving unit can control the point light source to light up at a preset frequency. By controlling the point light source separately, the control efficiency of the point light source is improved, the lighting delay is reduced, and the time measurement target has stronger expansibility. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0034] Figure 1 A schematic diagram of the structure of a time measurement target plate in one embodiment;

[0035] Figure 2 It is a schematic structural diagram of a point light source array unit of a time measurement target plate in one embodiment;

[0036] Figure 3 A schematic diagram of the structure of a delay detection device in one embodiment;

[0037] Figure 4 FIG. 4 is a schematic diagram of the structure of an imaging device detection system in an embodiment.

[0038] Figure numerals: 110, time measurement target plate; 111, point light source array unit; 112, point light source driving unit; 120, first image acquisition device; 130, second image acquisition device; 140, signal control and processing system; 141, fault testing module; 142, synchronization signal generator; 150, depth detection target plate; 160, image quality detection target plate; 170, target plate supporting mechanism; 180, imaging device fixing bracket; 190, display device. DETAILED DESCRIPTION

[0039] In order to make the purpose, technical solutions and advantages of the present application clearer, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application. Based on the embodiments provided in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application.

[0040] Obviously, the drawings described below are only some examples or embodiments of the present application. For ordinary technicians in this field, the present application can also be applied to other similar scenarios based on these drawings without creative work. In addition, it can also be understood that although the efforts made in this development process may be complicated and lengthy, for ordinary technicians in this field related to the content disclosed in this application, some changes in design, manufacturing or production based on the technical content disclosed in this application are just conventional technical means, and should not be understood as the content disclosed in this application is insufficient.

[0041] Reference to "embodiments" in this application means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those of ordinary skill in the art that the embodiments described in this application may be combined with other embodiments without conflict.

[0042] Unless otherwise defined, the technical terms or scientific terms involved in this application should be understood by people with ordinary skills in the technical field to which this application belongs. The words "one", "a", "a", "the" and the like involved in this application do not indicate a quantitative limitation, and may represent the singular or plural. The terms "include", "comprise", "have" and any of their variations involved in this application are intended to cover non-exclusive inclusions; for example, a process, method, system, product or device that includes a series of steps or modules (units) is not limited to the listed steps or units, but may also include steps or units that are not listed, or may also include other steps or units inherent to these processes, methods, products or devices. The words "connect", "connected", "coupled" and the like involved in this application are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The "multiple" involved in this application refers to two or more. "And / or" describes the association relationship of associated objects, indicating that there may be three relationships, for example, "A and / or B" can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the objects before and after are in an "or" relationship. The terms "first", "second", "third", etc. involved in this application are only used to distinguish similar objects and do not represent a specific ordering of the objects.

[0043] In this embodiment, a time measurement target plate 110 is provided for measuring time. Figure 1As shown, the time measurement target plate 110 includes a point light source array unit 111 and a point light source driving unit 112 connected to the point light source array unit 111; the structure of the point light source array unit 111 is as shown in Figure 2 As shown, the point light source array unit 111 includes point light sources arranged in sequence; the point light source driving unit 112 drives a single point light source separately, and the point light source driving unit 112 can control the point light source to light up at a preset frequency. Preferably, the point light sources are lit up in sequence at the same frequency, and a preset number of point light sources are lit up each time. The preset number can be a fixed number, only one point light source is lit each time, or multiple point light sources are lit at the same time; the preset number can also be different numbers.

[0044] Specifically, the point light source of the time measurement mark 110 is a light emitting diode LED or a laser; and, according to different application scenarios and requirements, the point light source can choose to use different light-emitting bands (such as visible light bands or infrared bands, etc.), different quantities, and different distribution arrangements; according to test requirements, the brightness of the point light source can be adjusted; according to the delay time range of different devices, the time difference between the lighting of two adjacent point light sources can be adjusted. The point light sources are arranged in a linear arrangement, a two-dimensional array arrangement, or a ring arrangement. Preferably, the point light sources are arranged in a horizontal arrangement, so that the time measurement mark 110 has a simple structure and fewer adjacent point light sources to reduce the mutual influence between the point light sources, and the lighting situation is more intuitive. Exemplarily, 100 LEDs are arranged horizontally.

[0045] In a preferred embodiment, the point light sources are lit up in sequence at the same time interval, and only one point light source is lit up at a time. When the camera collects the image of the time measurement target, due to the exposure time, the collected image may contain multiple point light sources that are lit up at the same time after the point light source that is lit up at the moment is collected. At this time, the first point light source is taken as the measurement result for calculation, and accurate time information can be calculated. The specific timing principle is: see Figure 2 , when there are N point light sources, the Xth light in the captured image is lit, or X is the first light among the lit lights, and the measured time is t=T×X, where T is the preset time interval between the lighting of each point light source. In this way, the time interval between the lighting of X lights can be calculated to obtain accurate time information. And a single point light source is driven separately to ensure the minimum lighting delay.

[0046] The above-mentioned time measurement target plate 110, through the point light source array unit 111 and the point light source driving unit 112 connected to the point light source array unit 111, the point light source driving unit 112 can independently control the point light sources to light up at a preset frequency. By independently controlling the point light sources, the control efficiency of the point light sources is improved, the lighting delay is reduced, and the time measurement target plate 110 has stronger expandability.

[0047] In this embodiment, a delay detection device is also provided for measuring the delay data of the imaging device to be tested. Figure 3 As shown, the time delay detection device includes a first image acquisition device 120, a second image acquisition device 130, a signal control and processing system 140 and the time measurement target plate 110 in the above embodiment.

[0048] The first image acquisition device 120 and the second image acquisition device 130 are arranged opposite to the time measurement target plate 110; wherein the first image acquisition device 120 is aligned with the display module of the imaging device to be measured, so that the first image acquisition device 120 can capture the point light source array unit 111 through the imaging device to be measured to obtain a first delay measurement image; and the second image acquisition device 130 can directly capture the point light source array unit 111 in the real environment to obtain a second delay measurement image.

[0049] The signal control and processing system 140 is connected to the first image acquisition device 120, the second image acquisition device 130 and the time measurement target plate 110, and is used to control the first image acquisition device 120, the second image acquisition device 130 and the time measurement target plate 110, and receive the first delay measurement image and the second delay measurement image, and calculate the delay data of the imaging device to be measured based on the first delay measurement image and the second delay measurement image.

[0050] Specifically, the first image acquisition device 120 and the second image acquisition device each include at least one camera, and the frame rate, exposure and other parameters of each camera are controlled to be the same through the signal control and processing system 140. Depending on the type of the imaging device to be tested, the first image acquisition device 120 and the second image acquisition device 130 can use a monocular camera or a binocular camera.

[0051] Specifically, when measuring the delay data of the imaging device to be tested, the imaging device to be tested is placed between the first image acquisition device 120 and the time measurement mark 110, the point light source array unit 111 of the time measurement mark 110 is located within the field of view of the imaging device to be tested, the display unit of the imaging device to be tested is within the field of view of the first image acquisition device 120, and at the same time, the point light source array unit 111 is located within the field of view of the second image acquisition device 130.

[0052] Specifically, the delay of the imaging device to be tested refers to the time interval between the time when the imaging device to be tested captures the real-world scene and the time when the corresponding image is presented on its display unit. The first delay measurement image of this embodiment can record the time when the corresponding image is presented on its display unit, and the second delay measurement image can record the time when the real-world scene is captured. By identifying the lighting status of the point light source in the first delay measurement image and the second delay measurement image, the delay data of the imaging device to be tested can be calculated based on the different lighting status in the two images.

[0053] Exemplarily, when a lighting method is used in which point light sources are lit in sequence at the same time interval and only one light is lit each time, the method for calculating the delay data of the imaging device to be tested based on the different lighting states in the two images is: the Mth point light source in the first delay measurement image is identified to be lit, the Nth point light source in the second delay measurement image is identified to be lit, and the delay time △t=T×(MN) is calculated based on the position information of the lit point light sources identified in the two images. In addition, when other lighting methods are used, the corresponding matching algorithm can be used to calculate the delay time.

[0054] With the development of science and technology, imaging equipment has become an indispensable part of daily life, including picture equipment such as cameras, video equipment such as camcorders, special application equipment such as infrared cameras and virtual reality cameras, and imaging delay time is one of the important parameters in imaging equipment. Too long delay time will affect the user experience. For example, too long delay of virtual reality camera will cause user dizziness, and too long delay of roadside camera will lose timeliness. In order to reduce the delay of equipment, the delay time of the equipment must be accurately known first. In the prior art, there is a device that measures the delay by using a gyroscope and a photosensitive device connected to a processor. Specifically, a gyroscope is used to record the first moment when the virtual reality device goes from static to motion, and a photosensitive device is used to identify the second moment when the screen switches. The left delay of the virtual reality display device is obtained according to the first moment and the second moment. However, the above-mentioned delay measurement equipment is complex in design, and the gyroscope and other devices need to be calibrated before use, resulting in a large error in delay measurement.

[0055] Through the delay detection device of this embodiment, the first image acquisition device 120 is used to capture the point light source array unit 111 through the imaging device to be tested, and a first delay measurement image is obtained; the second image acquisition device 130 can directly capture the point light source array unit 111 in the real environment to obtain a second delay measurement image, and the signal control and processing system 140 is used to identify and analyze the lighting status of the point light sources in the first delay measurement image and the second delay measurement image, so as to calculate the delay data of the device to be tested. The delay measurement can be completed independently without relying on other systems, and the structure is simple and the measurement accuracy is high.

[0056] In this embodiment, another time delay detection device is provided for measuring the time delay data of an imaging device to be tested. The time delay detection device includes a first image acquisition device 120 , a signal control and processing system 140 and the above-mentioned time measurement target plate 110 .

[0057] The first image acquisition device 120 is arranged opposite to the time measurement mark 110; wherein the first image acquisition device 120 is aligned with the display module of the imaging device to be tested, so that the first image acquisition device 120 can capture the image of the point light source array unit displayed by the imaging device to be tested, and obtain the first delay measurement image.

[0058] The time measurement target plate 110 further includes a pulse signal sending unit; the pulse signal sending unit is connected to the signal control and processing system 140 and is used to send a pulse signal to the signal control and processing system 140 when the light source is turned on.

[0059] The signal control and processing system 140 is connected to the first image acquisition device 120, and is used to receive the first delay measurement image and the pulse signal sent by the pulse signal sending unit when the light source is turned on; and calculate the delay data of the imaging device to be tested based on the first delay measurement image and the pulse signal.

[0060] Specifically, the signal control and processing system 140 identifies the first position information of the illuminated point light source in the first delay measurement image, and identifies the second position information reflecting the actual position of the illuminated point light source in the pulse signal emitted by the time measurement mark 110, and calculates the delay data based on the first position information and the second position information.

[0061] In this way, the structure of the delay detection device is simpler, and more accurate delay data can be calculated.

[0062] In one embodiment, the signal control and processing system 140 includes a fault test module 141; the fault test module 141 is connected to the point light source driving unit 112 to drive all the point light sources to light up; the fault test module 141 is also connected to the second image acquisition device 130 to control the second image acquisition device 130 to capture all the lighted point light source array units 111 to obtain a fault test image; the fault test module 141 is used to compare the fault test image with a preset full-brightness image to identify the point light source with a fault.

[0063] Specifically, a reference image of all the point light sources being lit is pre-stored in the signal control and processing system 140. The signal control and processing system 140 sends a full-brightness mode command to the point light source driving unit 112 to drive all the point light source array units 111 to light up. The second image acquisition device 130 or any camera shoots the point light source array unit 111 to obtain and store a fault image. For example, if the 11th point light source and the 25th point light source are faulty, the reference image is compared with the fault image to determine whether any point light source is damaged, and the signal control and processing system 140 outputs the fault detection result. If no fault is detected, the signal control and processing system 140 sends a delay detection signal to simultaneously trigger the first image acquisition device 120, the second image acquisition device 130 and the time measurement target plate 110 to start delay measurement.

[0064] In this way, the fault condition of the point light source array unit 111 is discovered through the fault testing module 141, thereby avoiding the influence of the fault on the accuracy of delay measurement and ensuring the reliability of the delay detection device.

[0065] In one embodiment, the signal control and processing system 140 further includes a synchronization signal generator 142; the synchronization signal generator 142 is connected to the first image acquisition device 120, the second image acquisition device 130 and the time measurement target plate 110, and is used to control the simultaneous triggering of the first image acquisition device 120, the second image acquisition device 130 and the time measurement target plate 110.

[0066] In this way, the reliability of synchronous triggering of the first image acquisition device 120, the second image acquisition device 130 and the time measurement target plate 110 is ensured by the synchronization signal generator 142, so that the delay measurement result is more accurate.

[0067] In this embodiment, an imaging device detection system is also provided. Figure 4 As shown, it includes a depth detection target plate 150 and the above-mentioned delay detection equipment; the depth detection target plate 150 is arranged opposite to the first image acquisition device 120; wherein the first image acquisition device 120 is a binocular camera.

[0068] Specifically, the depth detection mark 150 is in front of the first image acquisition device 120, and the position of the imaging device to be tested is changed so that the depth detection mark 150 appears in the center of the preview screen of the first image acquisition device 120. At the same time, the focal length, exposure time and other properties of the first image acquisition device 120 are adjusted to make the depth detection mark 150 image clear. At the same time, the hard trigger mode of the first image acquisition device 120 is turned on, and the trigger instruction is waited for. The frequency and signal waveform of the hard trigger signal of the synchronization signal generator 142 are set. When the signal control and processing system 140 issues an acquisition instruction, data acquisition of the imaging device to be tested begins. After completion, the position of the imaging device to be tested is changed to move it out of the field of view of the first image acquisition device 120, and the acquisition instruction is issued again to collect data in the real space.

[0069] After completion, the depth detection target plate 150 is changed to a new position, and the above data collection steps are repeated. The collected data is input into the evaluation algorithm for evaluation, and the detection results are visualized on the display device 190 connected to the host computer.

[0070] In this way, the depth detection target plate 150 is integrated into the time delay detection device to obtain an imaging device detection system, so that the depth measurement and time delay measurement functions are integrated together to improve the detection efficiency.

[0071] In one embodiment, the imaging device detection system further includes an image quality measurement module; the image quality measurement module includes an image quality detection target plate 160 .

[0072] Specifically, the image quality detection target plate 160 is used for image quality detection of the imaging device to be tested, including: field of view FOV, geometric distortion, dispersion, binocular image, multi-scale structural similarity MS-SSIM, contrast, brightness and color consistency, color deviation, saturation, clarity, signal-to-noise ratio, dynamic range, white balance, grayscale, low illumination, etc. It is only necessary to replace a different image quality detection target plate 160 and repeat the detection process.

[0073] Specifically, the first image acquisition device 120 can be used to detect image quality. The first image acquisition device 120 is turned on and the position of the first image acquisition device 120 is adjusted, so that the image quality detection mark 160 is located at the center of the preview interface of the first image acquisition device 120, and the autofocus function of the first image acquisition device 120 is turned on so that the image quality detection mark 160 can be clearly seen in the preview interface of the first image acquisition device 120. The signal control and processing system 140 issues an acquisition instruction, and the image quality detection mark 160 is photographed through the imaging device to be tested, completing the image quality data acquisition of the imaging device to be tested. The collected image quality data is input into the evaluation algorithm to start the evaluation, and the image quality detection results are visualized on the display device 190 connected to the host computer.

[0074] In this way, the image quality detection target plate 160 is also integrated in the time-delay detection device, so that the imaging device detection system integrates depth measurement, time-delay measurement and image quality measurement functions, enriches the functions of the imaging device detection system, and improves the comprehensiveness and convenience of detection.

[0075] In one embodiment, the imaging device detection system also includes a target plate support mechanism 170; the depth detection target plate 150, the image quality detection target plate 160 and the time measurement target plate 110 are detachably mounted on the target plate support mechanism 170; the target plate support mechanism 170 can be moved relative to the image acquisition device; wherein the image acquisition device includes a first image acquisition device 120, a second image acquisition device 130 and a first image acquisition device 120.

[0076] Specifically, when performing delay measurement, the time measurement target plate 110 is installed and fixed on the target plate supporting mechanism 170; after completing the delay measurement, the time measurement target plate 110 is replaced by the depth detection target plate 150, and the target plate supporting mechanism 170 is used to change the position of the depth detection target plate 150 to perform multiple data collections; after completing the depth measurement, the depth detection target plate 150 is removed, and the image quality detection target plate 160 is installed on the target plate supporting mechanism 170, and different types of image quality detection target plates 160 can be replaced to perform multiple rounds of testing.

[0077] In this way, when performing inspections of different items, it is convenient to replace, fix and adjust the positions of the depth inspection target plate 150 , the image quality inspection target plate 160 and the time measurement target plate 110 .

[0078] In one embodiment, the imaging device detection system also includes an imaging device fixing bracket 180; the imaging device fixing bracket 180 is arranged between the image acquisition device and the target plate supporting mechanism 170; the imaging device to be tested is installed on the imaging device fixing bracket 180; the imaging device fixing bracket 180 is connected to the signal control and processing system 140, and the display module of the imaging device to be tested is moved into or out of the field of view of the image acquisition device according to the control signal of the signal control and processing system 140.

[0079] In this way, when performing inspections of different items, it is convenient to switch between two shooting methods: shooting through an image acquisition device and shooting in a real scene.

[0080] In one of the embodiments, the imaging device to be tested is a head mounted display device with a video see-through mode turned on.

[0081] Specifically, in recent years, the virtual reality (VR) industry has experienced explosive growth, and its consumer-level mass-produced products have achieved an annual sales volume of nearly 10 million, driving the rapid development of upstream basic hardware and downstream software ecology. At the same time, the augmented reality (AR) industry has a wider application scenario, and people have a stronger demand for it. As a result, leading companies in the industry have added the video see-through (ST) function, namely VST, to their hot-selling VR products, expanding the functions of VR products while realizing the exploration of VR devices in AR functions. However, this technology is essentially a digital video processing technology, including image calibration, perspective change, scene reconstruction, rendering, etc. The processing process is highly complex, and some errors may be introduced in the process of video image processing. At the same time, this technology is greatly affected by the external environment such as the scene, light, and the performance of the VST camera. The VST delay and poor image quality that may be caused by this are very unfriendly to the user experience.

[0082] Based on the above problems, the imaging device detection system proposed in this embodiment can be applied to the detection of imaging effects in the VST mode of a VR head display device, and to objectively evaluate the VST function of the VR head display device.

[0083] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties.

[0084] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0085] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0086] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A time measurement target plate, used for measuring time, characterized in that: It comprises a point light source array unit and a point light source driving unit connected to the point light source array unit; The point light source array unit comprises point light sources arranged in sequence; The point light source driving unit drives a single point light source separately, and the point light source driving unit can control the point light source to light up at a preset frequency.

2. The time measurement target according to claim 1, characterized in that: The point light sources are arranged in a linear arrangement, a two-dimensional array arrangement or a ring arrangement.

3. The time measurement target according to claim 1, characterized in that: The point light sources are lit in sequence at the same frequency.

4. A delay detection device, used to measure the delay data of an imaging device to be tested, characterized in that: The device comprises a first image acquisition device, a second image acquisition device, a signal control and processing system, and the time measurement target plate as claimed in any one of claims 1 to 3; The first image acquisition device and the second image acquisition device are arranged opposite to the time measurement target plate; wherein the first image acquisition device is aligned with the display module of the imaging device to be tested, so that the first image acquisition device can capture the image of the point light source array unit displayed by the imaging device to be tested to obtain a first time delay measurement image; and the second image acquisition device can directly capture the point light source array unit in the real environment to obtain a second time delay measurement image; The signal control and processing system is connected to the first image acquisition device, the second image acquisition device and the time measurement target plate, and is used to control the first image acquisition device, the second image acquisition device and the time measurement target plate, and receive the first delay measurement image and the second delay measurement image, and calculate the delay data of the imaging device to be measured based on the first delay measurement image and the second delay measurement image.

5. The time delay detection device according to claim 4, characterized in that: The signal control and processing system includes a fault testing module; The fault testing module is connected to the point light source driving unit to drive all the point light sources to light up; The fault test module is also connected to the second image acquisition device, and controls the second image acquisition device to capture all the lighted point light source array units to obtain a fault test image; The fault testing module is used to compare the fault testing image with a preset full-brightness image to identify the point light source with a fault.

6. The time delay detection device according to claim 4, characterized in that: The signal control and processing system also includes a synchronization signal generator; The synchronization signal generator is connected to the first image acquisition device, the second image acquisition device and the time measurement target plate, and is used to send a synchronization signal to control the simultaneous triggering of the first image acquisition device, the second image acquisition device and the time measurement target plate.

7. A delay detection device for measuring the delay data of an imaging device to be tested, characterized in that: The device comprises a first image acquisition device, a signal control and processing system and a time measurement target plate as claimed in any one of claims 1 to 3; The first image acquisition device is arranged opposite to the time measurement target plate; wherein the first image acquisition device is aligned with the display module of the imaging device to be tested, so that the first image acquisition device can capture the image of the point light source array unit displayed by the imaging device to be tested, and obtain a first delay measurement image; The time measurement target plate further comprises a pulse signal sending unit; the pulse signal sending unit is connected to the signal control and processing system and is used to send a pulse signal to the signal control and processing system when the point light source is lit; The signal control and processing system is connected to the first image acquisition device, and is used to receive the first delay measurement image and the pulse signal when the point light source is lit; and calculate the delay data of the imaging device to be tested based on the first delay measurement image and the pulse signal.

8. An imaging device detection system, characterized in that: It comprises a depth detection target plate and a time delay detection device as described in any one of claims 4 to 7; The depth detection target plate is arranged opposite to the first image acquisition device; wherein the first image acquisition device is a binocular camera.

9. The imaging device detection system according to claim 8, characterized in that: Also includes: Image quality measurement module: The image quality measurement module includes an image quality detection target plate.

10. The imaging device detection system according to claim 9, characterized in that: Also includes: Standard plate support mechanism; The depth detection target plate, the image quality detection target plate and the time measurement target plate are detachably mounted on the target plate supporting mechanism; the target plate supporting mechanism is movable relative to the image acquisition device; wherein the image acquisition device comprises a first image acquisition device and a second image acquisition device.

11. The imaging device detection system according to claim 10, characterized in that: Also included is an imaging device fixing bracket; The imaging device fixing bracket is arranged between the image acquisition device and the target plate supporting mechanism; the imaging device to be tested is installed on the imaging device fixing bracket; the imaging device fixing bracket is connected to the signal control and processing system, and the display module of the imaging device to be tested is moved into or out of the field of view of the image acquisition device according to the control signal of the signal control and processing system.

12. The imaging device detection system according to claim 8, characterized in that: The imaging device to be tested is a head-mounted display device with a video perspective mode turned on.

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