Method, device, electronic device and storage medium for generating design for testability script

Abstract

The present disclosure provides a method, apparatus, electronic device, and storage medium for generating a design for testability script, belonging to the field of design for testability technology. The method comprises: determining a test technology for a target to be tested based on test technology indication information in a test requirement parameter; determining script design information based on the test technology for the target to be tested and target information in the test requirement parameter; and generating an automated script file for testing the target to be tested based on the script design information. The method is capable of automatically generating a test script for a chip hardware circuit.

Description

Technical Field

[0001] The present disclosure relates to the technical field of design for testability, and in particular to a method, device, electronic device, and storage medium for generating a design for testability script. Background Art

[0002] With the continuous increase in chip scale and the continuous advancement of process technology, chip testability design (Design For Test, DFT) is crucial to chip manufacturing and quality assurance. This technology introduces specific logic and structure during the chip design stage to facilitate effective chip testing after chip manufacturing and check for manufacturing defects.

[0003] The existing DFT full process relies on automated testing tools, such as Electronic Design Automation (EDA) tools. Using these automated testing tools requires DFT engineers to gradually write customized script processes according to needs. These scripts are used to complete the insertion, verification, timing convergence and final testing of DFT intellectual property (IP) cores.

[0004] However, manually writing scripts in the DFT process takes a lot of time and reduces development efficiency. Summary of the Invention

[0005] The present disclosure provides a method, device, electronic device and storage medium for generating a design for testability script, which can automatically generate a test script for a chip hardware circuit.

[0006] The technical solution of the present disclosure is achieved as follows:

[0007] In a first aspect, the present disclosure provides a method for generating a testability design script, the method comprising: determining a test technology for a target to be tested based on test technology indication information in a test requirement parameter; determining script design information based on the test technology of the test target and the target information in the test requirement parameter; and generating an automated script file for testing the target to be tested based on the script design information. In this way, a user only needs to provide the test requirement parameter, and an automated script file for testing the target to be tested is automatically generated based on the test requirement parameter. Compared to manually generating automated script files, this method can reduce human error, improve accuracy, and reduce the time spent on manually writing test scripts, thereby improving testing efficiency.

[0008] In some embodiments of the present disclosure, an automated script file for testing a target to be tested is generated based on script design information, including: parsing variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information, and simulation tool information from the script design information; and generating an automated script file based on the variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information, and simulation tool information. In this embodiment, by integrating variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information, and simulation tool information, while ensuring the automatic generation of the script file, a variety of test factors can be comprehensively considered to ensure the comprehensiveness and accuracy of the test.

[0009] In some embodiments, before generating an automated script file for testing a target to be tested based on the script design information, the method further includes: parsing the script design information to obtain a target automated testing tool; and generating an automated script file for testing the target to be tested based on the script design information, including: generating an automated script file that matches the target automated testing tool based on the script design information. In this embodiment, by parsing the script design information to determine the target automated testing tool, a script file compatible with the specific testing tool can be generated, ensuring the smooth progress of the testing process; because the script file is customized for the specific testing tool, the workload required for manual adjustment and adaptation is reduced, further improving testing efficiency.

[0010] In some embodiments, the script design information includes: manufacturing information and test information of the target to be tested. Based on the test technology of the test target and the target information in the test requirement parameters, the script design information is determined, including: obtaining the manufacturing information of the target to be tested based on the target information; and obtaining test information based on the test technology of the test target and the target information. In this embodiment, obtaining manufacturing information and test information not only reduces the amount of data in the subsequent parsing process, thereby improving testing efficiency, but also allows the target information to include different data as needed, allowing users to flexibly select the target information to be input, thereby improving the user experience.

[0011] In some embodiments, the test technology of the target to be tested is determined based on the test technology indication information in the requirement parameters to be tested, including: based on the selection identifier of the test technology, determining the test technology whose selection identifier has the selected value as the test technology of the target to be tested. In this embodiment, the test technology indication information includes a selection identifier indicating whether the test technology is selected, that is, for any test technology selected by the user, only the value corresponding to the selection identifier of the test technology needs to be changed in the requirement parameters to be tested, and the rewriting of the requirement parameters to be tested is less, and the parsing logic remains unchanged, and the test technology whose selection identifier has the selected value is determined as the test technology of the target to be tested. The parsing process is fixed, which makes the entire test process more time-saving.

[0012] In some embodiments, determining script design information based on the test technology of the target to be tested and the target information in the test requirement parameters includes: obtaining initial script design information based on the test technology of the target to be tested and the target information in the test requirement parameters; and converting the initial script design information into script design information in a key-value format. In this embodiment, the obtained initial script design information is stored in the key-value format to enable rapid retrieval and data processing during the process of generating an automated script file for testing the target to be tested based on the script design information, thereby further improving the efficiency of script generation and shortening the testing cycle.

[0013] In some embodiments of the present disclosure, before determining the test technology for the target to be tested based on the test technology indication information in the test requirement parameters, the method further includes: receiving the test requirement parameters input by a user via a graphical user interface. This allows the user to enter the test requirement parameters via the graphical user interface, simplifying the information input process. Furthermore, non-professionals can also perform input operations according to the prompts on the graphical user interface, simplifying the process of generating automated script files.

[0014] In a second aspect, the present disclosure provides a device for generating a testability design script, which includes: a determination part and a generation part; the determination part is configured to determine the test technology of the target to be tested based on the test technology indication information in the requirement parameters to be tested; the determination part is also configured to determine the script design information based on the test technology of the target to be tested and the target to be tested information in the requirement parameters to be tested; the generation part is configured to generate an automated script file for testing the target to be tested based on the script design information.

[0015] In a third aspect, the present disclosure provides an electronic device comprising a processor, a memory, and a program or instruction stored in the memory and executable on the processor, wherein the program or instruction, when executed by the processor, implements the steps of the method for generating a testability design script as described in the first aspect.

[0016] In a fourth aspect, the present disclosure provides a computer-readable storage medium storing a program or instruction. When the program or instruction is executed by a processor, the steps of the method for generating a testability design script as described in the first aspect are implemented.

[0017] In a fifth aspect, the present disclosure provides a computer program product, wherein the computer program product includes a computer program or instructions. When the computer program product runs on a processor, the processor executes the computer program or instructions to implement the steps of the method for generating a testability design script as described in the first aspect.

[0018] In a sixth aspect, the present disclosure provides a chip comprising a processor and a communication interface, wherein the communication interface is coupled to the processor, and the processor is configured to run a program or instruction to implement the method for generating a design for testability script as described in the first aspect.

[0019] The present disclosure provides a method for generating a testability design script, the method comprising: determining a test technology for a target to be tested based on test technology indication information in a test requirement parameter; determining script design information based on the test technology for the target to be tested and the target information in the test requirement parameter; and generating an automated script file for testing the target to be tested based on the script design information. In this way, a user only needs to provide the test requirement parameter, and an automated script file for testing the target to be tested is automatically generated based on the test requirement parameter. Compared to manually generating an automated script file, this method can reduce human errors, improve accuracy, and reduce the time required to manually write test scripts, thereby improving testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 A schematic diagram of an exemplary system architecture provided by the present disclosure;

[0021] Figure 2 One of the flowcharts of the method for generating a testability design script provided by the present disclosure;

[0022] Figure 3 The second flowchart of the method for generating a design for testability script provided by the present disclosure;

[0023] Figure 4 The third flowchart of the method for generating a design for testability script provided by the present disclosure;

[0024] Figure 5 The fourth flowchart of the method for generating a design for testability script provided by the present disclosure;

[0025] Figure 6 A schematic diagram of a graphical user interface provided by the present disclosure;

[0026] Figure 7 A structural block diagram of a device for generating a design for testability script provided by the present disclosure;

[0027] Figure 8 A schematic diagram of the hardware structure of an electronic device provided by the present disclosure. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in this disclosure to clearly describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field are within the scope of protection of this application.

[0029] The present invention provides a method for generating a testability design script. Figure 1 A schematic diagram illustrates a system architecture that can implement the above-described method for generating a design for testability script. System architecture 100 may include a terminal 110 and a server 120. Terminal 110 may be a terminal device such as a smartphone, tablet computer, desktop computer, or laptop computer. Server 120 generally refers to the backend system that generates the design for testability script in this exemplary embodiment and may be a single server or a cluster of multiple servers. Terminal 110 and server 120 may be connected via a wired or wireless communication link to exchange data.

[0030] In one embodiment, the method for generating a design for testability script can be performed by terminal 110. For example, a user uses terminal 110 to import the requirement parameters to be tested, or the user enters the requirement parameters to be tested on a graphical user interface of terminal 110. Terminal 110 then determines the test technology for the target to be tested based on the test technology indication information in the requirement parameters to be tested; determines script design information based on the test technology for the target to be tested and the target information in the requirement parameters to be tested; and generates an automated script file for testing the target to be tested based on the script design information.

[0031] In one embodiment, the method for generating a design for testability script can be executed by server 120. For example, after a user uses terminal 110 to import the test requirement parameters or inputs the test requirement parameters on the graphical user interface of terminal 110, terminal 110 uploads the test requirement parameters to server 120. Server 120 then determines the test technology for the target to be tested based on the test technology indication information in the test requirement parameters; determines script design information based on the test technology for the target to be tested and the target information in the test requirement parameters; generates an automation script file for testing the target to be tested based on the script design information, and returns the automation script file to terminal 110.

[0032] As can be seen from the above, the execution entity of the method for generating a design for testability script in this exemplary embodiment may be the terminal 110 or the server 120 , which is not limited in this disclosure.

[0033] The method for generating a design for testability script provided by the present disclosure will be described in detail below through specific embodiments in conjunction with the accompanying drawings.

[0034] like Figure 2 As shown, the present disclosure provides a method for generating a design for testability script, which may include the following steps S201 to S203.

[0035] In step S201, the test technology of the target to be tested is determined according to the test technology indication information in the test requirement parameters.

[0036] The requirement parameters to be tested are used to indicate the requirement parameters that the DFT test of the target to be tested depends on, including: the target to be tested information, test technology, etc.

[0037] Test technology indicates the test logic inserted into the chip during the chip design phase. Different test technologies add different test logic during the chip design phase. Test technologies include boundary scan (BSCAN), memory built-in self-test (MBIST), and logic test (LTEST). Test target information indicates the manufacturing information of the target during the manufacturing process, as well as the test information relied upon when testing using different test technologies. Test target information can include the target's identifier, the target's corresponding manufacturing information, the storage path for the target's corresponding manufacturing information, and test information.

[0038] Among them, BSCAN mainly tests the input and output ports of the chip. Its principle is to add a register to the input and output ports of the core logic circuit. By connecting the registers on these input and output ports, data can be serially input into the unit under test and serially read out from the corresponding port, thereby realizing testing; MBIST mainly tests the memory. Its principle is to embed some special test circuits in the memory during chip design for self-checking and testing. These test circuits can test all cells in the memory through specific test modes to detect whether there are faults or defects in them; LTEST mainly targets the logic circuits inside the chip. It uses scan testing and automatic generation of test vector technology to realize the testing of logic units in the standard cell library.

[0039] The test technology indication information is used to indicate which test technology is used to test the target to be tested. According to the target to be tested indication information, it is determined that the test technology used for the target to be tested is at least one of BSCAN, MBIST and LTEST.

[0040] In step S202, script design information is determined according to the test technology of the target to be tested and the target to be tested information in the requirement parameters to be tested.

[0041] Script design information specifies the various parameters and settings required for performing DFT testing on the DUT using the DUT's test technology. This includes manufacturing information from the DUT's manufacturing process and test information related to the test technology. Manufacturing information includes DUT design information from planning to production (such as layout, routing, and specification parameters), library files (such as physical libraries and timing libraries), clock information, pin constraints, and redirection information. Test information includes the test description language, DFT-enabled port information, Embedded Deterministic Test (EDT) configuration information, MBIST information, BSCAN information, and LTEST information.

[0042] The data in the script design information is stored according to the correspondence between keywords and information, such as key-value format, dictionary, etc.

[0043] In step S203, an automation script file for testing the target to be tested is generated according to the script design information.

[0044] An automation script file consists of multiple commands, and executing each command in sequence completes the test of the target. Based on the script design information, an automation script file is generated to test the target. This generates a set of commands, each of which relies on different information. The commands are generated based on keyword searches in the script design information, and then generated using programming logic based on the retrieved information.

[0045] After the automation script file is generated, the script is executed, which controls the automation test tool to perform tests according to the commands in the script, generates hardware test circuits and test vectors, and the simulation tool performs simulation according to the commands in the script. The simulation process is to input test vectors into the hardware test circuit to ultimately test the hardware circuit on the chip.

[0046] In this way, the user only needs to provide the test requirement parameters, and the automation script file for testing the target to be tested will be automatically generated according to the test requirement parameters. Compared with manually generating automation script files, it can reduce human errors, improve accuracy, and reduce the time of manually writing test scripts, thereby improving testing efficiency.

[0047] In some embodiments of the present disclosure, Figure 2 ,like Figure 3 As shown, the above step S203 generates an automation script file for testing the target to be tested according to the script design information, which can be specifically implemented through the following steps S203a and S203b.

[0048] In step S203a, variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information are parsed from the script design information.

[0049] Variable information refers to the information of the container used to store data, including the variable name, data type, scope, design name, design identification code, library file path, etc.; import file refers to the description and design of the behavior and structure of digital circuits, such as the connection method and behavior of logic circuits, the declaration and behavior description of registers and memories, etc. Import files can use different design languages ​​(i.e. hardware description languages ​​) such as Verilog and VHDL; initialization environment information refers to the environment and configuration in which the script is running, such as the operating system, programming language, and environment variables that the script depends on; constraint setting information refers to the information used to define test timing parameters and signal properties, such as: clock Period, input delay, bidirectional port delay, probe time and probe width, etc.; the specification document information of testability design refers to a series of standards and guidelines formulated during the design phase to improve the testability of the product, such as design requirements, test methods, test processes, test interface definitions, test signal timing and characteristics, etc.; test vector information refers to a set of specific input signal sequences used to stimulate specific fault modes in integrated circuits so that these faults can be detected during the test process. The test vector includes input stimulus and expected response, usually expressed in binary form, and is directly related to the logic or function of the circuit; simulation tool information is used to indicate the simulation tool used, such as VCS.

[0050] Specifically, variable information of the target to be tested is extracted from the design information and library file information; initialization environment information is extracted from the design file; constraint setting information is extracted from the test technology information (such as BSCAN information, MBIST information and LTEST information) and pin constraint information corresponding to the test technology; import files are extracted from the design information; DFT specification files are extracted from the test information or DFT specification files are created; test vector information is extracted from the test technology information corresponding to the test technology; and simulation tool information is extracted from the test information.

[0051] In step S203b, an automation script file is generated according to the variable information, the import file, the initialization environment information, the constraint setting information, the testability design specification file information, the test vector information and the simulation tool information.

[0052] The automation script file includes multiple commands. Depending on the automation test tool used, the syntax rules of the commands in the generated automation script file are different. Variable setting commands are generated based on variable information, file import commands are generated based on import files, environment initialization commands are generated based on initialization environment information, constraint setting commands are generated based on constraint setting information, commands for importing or creating DFT specification files are generated based on DFT specification file information, test vector generation commands are generated based on test vector information, and simulation commands are generated based on simulation tools.

[0053] In some embodiments, if the user needs log data during the test process in order to obtain detailed information on various faults tested during a test process, the test information may also include log requirement information for recording the test process, parse the log requirement information, obtain log output indication information for indicating which logs to output (such as clock information, DFT signal information, memory instance information, etc.), and generate corresponding automated testing tool commands based on the log output indication information.

[0054] In some embodiments, in order to reuse the automation script file, the test data can also include the output path of the automation script file, parse the test data to obtain the path information, and generate a command for the automation testing tool to store the automation script file in the path according to the path information.

[0055] In this embodiment, by integrating variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information, while ensuring the automatic generation of script files, it can comprehensively consider multiple testing factors to ensure the comprehensiveness and accuracy of the test.

[0056] In some embodiments of the present disclosure, Figure 2 ,like Figure 4As shown, before the above step S203 generates an automation script file for testing the target to be tested according to the script design information, the method further includes the following step S204. The above step S203 can be specifically implemented by the following step S203c.

[0057] In step S204, the target automated testing tool is obtained by parsing the script design information.

[0058] In step S203c, an automation script file matching the target automation test tool is generated according to the script design information.

[0059] Because different test requirements may require different automated testing tools, and different automated testing tools may use different commands to implement the same function, and the syntax rules required to generate commands are also different, in this disclosure, based on the script design information and the target automated testing tool used, the corresponding commands are generated according to the syntax rules of the target automated testing tool.

[0060] Generate an automation script file that matches the target automation testing tool based on the script design information. Specifically, different script generation template engines are set for different automation testing tools. The corresponding script generation template engine is determined according to the target automation testing tool, and then the automation script file is generated through the template engine.

[0061] In this embodiment, by parsing the script design information to determine the target automated testing tool, a script file compatible with the specific testing tool can be generated to ensure the smooth progress of the testing process; since the script file is customized for a specific testing tool, the workload required for manual adjustment and adaptation is reduced, further improving testing efficiency.

[0062] In some embodiments of the present disclosure, the script design information includes: manufacturing information and test information of the target to be tested. The above step S202 determines the script design information based on the test technology of the target to be tested and the target to be tested information in the test requirement parameters, including: obtaining the manufacturing information of the target to be tested based on the target to be tested information; obtaining the test information based on the test technology of the target to be tested and the target to be tested information.

[0063] The target information to be measured is used to indicate the manufacturing information of the target to be measured. The target information to be measured includes at least one of the following: identification information of the target to be measured, a storage path, and manufacturing information. For example, in one case, the target information to be measured includes the identification information of the target to be measured. Based on the identification information of the target to be measured, the storage path of the manufacturing information of the target to be measured is determined from a pre-stored correspondence between the target identification and the storage path, and the corresponding manufacturing information is obtained from the storage path. In another case, the target information to be measured includes the storage path of the manufacturing information of the target to be measured, and the corresponding manufacturing information is obtained from the storage path. In another case, the target information to be measured includes the manufacturing information, and the manufacturing information is directly obtained. In another case, the target information to be measured includes the storage path and partial manufacturing information of partial manufacturing information. The partial manufacturing information is obtained from the storage path and the partial manufacturing information is obtained from the target information to be measured. In another case, the target information to be measured includes the identification information and partial manufacturing information of the target to be measured. Based on the identification information of the target to be measured, the partial manufacturing information is obtained from the corresponding storage path and the partial manufacturing information is obtained from the target information to be measured.

[0064] The target information also indicates test information related to the test technology. Based on the target's test technology and the target information, test information is obtained. In one scenario, if the target information includes the storage path for test information corresponding to each test technology, the storage path corresponding to the target's test technology is determined from the target information and the test information is obtained from that storage path. Alternatively, if the target information includes test information corresponding to each test technology, the test information corresponding to the target's test technology is obtained from the target information.

[0065] In this embodiment, obtaining manufacturing information and test information can not only reduce the amount of data in the subsequent analysis process, thereby improving test efficiency, but also the target information to be tested can include different data as needed, and the user can flexibly select the target information to be tested, thereby improving user experience.

[0066] In some embodiments of the present disclosure, the above-mentioned step S201 determines the test technology of the target to be tested based on the test technology indication information in the test requirement parameter to be tested, including: according to the selection identifier of the test technology, determining the test technology with the selected identifier as the selected value as the test technology of the target to be tested.

[0067] The test technology indication information is a selection flag for each test technology. If the value of the selection flag is a selected value (such as "1"), the test technology is determined to be the test technology of the target to be tested.

[0068] The test requirement parameters are also generated based on user requirements. If each time the user determines a test technology, a corresponding indication information indicating the test technology is generated, then in the subsequent parsing process, the parsing logic needs to adapt to the parsing of the indication information corresponding to different test technologies, increasing the difficulty of parsing. In this embodiment, the test technology indication information includes a selection flag indicating whether the test technology is selected. That is, for any test technology selected by the user, only the value corresponding to the selection flag of the test technology needs to be changed in the test requirement parameters. This reduces the need to rewrite the test requirement parameters, and the parsing logic remains unchanged. The test technology with the selected flag value is determined as the test technology of the target to be tested. The parsing process is fixed, making the entire testing process more time-saving.

[0069] In some embodiments, the above-mentioned step S202 determines the script design information based on the test technology of the target to be tested and the target information to be tested in the test requirement parameters, including: obtaining initial script design information based on the test technology of the target to be tested and the target information to be tested in the test requirement parameters; converting the initial script design information into script design information in a key-value format.

[0070] Since data in key-value format can be directly accessed through the key, data reading and writing operations can be performed very quickly, enabling fast retrieval. Moreover, the key-value format allows the storage of any type of value, including simple strings, complex objects, binary data, etc. Therefore, the present disclosure stores the acquired initial script design information in key-value format, so that when generating the automated script file for testing the target under test based on the script design information, it can be quickly retrieved and the data processing speed is fast, thereby further improving the efficiency of script generation and shortening the testing cycle.

[0071] In some embodiments, combined Figure 1 ,like Figure 5 As shown, before the above step S201 determines the test technology of the target to be tested according to the test technology indication information in the test requirement parameter, the method further includes the following step S205.

[0072] In step S205 , the demand parameters to be tested input by the user on the graphical user interface are received.

[0073] Implement a graphical user interface (GUI) using a software development kit (SDK), such as the standard Python GUI library, the C++-based QT standard GUI library for Linux, or JavaFX. GUI controls include windows, text boxes, drop-down menus, check boxes, labels, sliders, lists, and other components for collecting user input.

[0074] For example, Figure 6The figure shows a graphical user interface provided by the present disclosure. Taking the test technology and test target information included in the test requirement parameters as an example, the test target information includes: automated test tools, library files, configuration information, constraint information, design type (register transfer level (RTL) or netlist can be selected), design language (optional hardware description languages include Verilog or VDHL (Very HighSpeed Integrated Circuit Hardware Description Language)), design hierarchy, design name, and design information. After the user completes the test requirement parameters, click the Start button to generate an automated script file and execute the script file for testing. Clicking the Save button will save the generated automated script file to the default path.

[0075] Through the graphical user interface, users can enter or select the required parameters to be tested, such as test technology and clock information. This simplifies the information input process by allowing users to fill in the required parameters through the graphical user interface. Furthermore, non-professionals can also follow the prompts on the graphical user interface to input operations, simplifying the process of generating automated script files.

[0076] Based on the same concept as the above method for generating a testability design script, the present disclosure also provides a device for generating a testability design script. Figure 7 This is a structural block diagram of a device for generating a testability design script shown in the present disclosure, such as Figure 7 As shown, the device for generating a testability design script includes: a determining part 701 and a generating part 702; the determining part 701 is configured to determine the test technology of the target to be tested based on the test technology indication information in the requirement parameters to be tested; the determining part 701 is also configured to determine the script design information based on the test technology of the target to be tested and the target to be tested information in the requirement parameters to be tested; the generating part 702 is configured to generate an automated script file for testing the target to be tested based on the script design information.

[0077] In some embodiments of the present disclosure, the generation part 702 is specifically configured to parse the script design information to obtain variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information; and generate an automated script file based on the variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information.

[0078] In some embodiments of the present disclosure, the device for generating a testability design script also includes: a parsing part, which is configured to parse the script design information to obtain a target automated testing tool before generating an automated script file for testing the target to be tested based on the script design information; the generating part 702 is specifically configured to generate an automated script file that matches the target automated testing tool based on the script design information.

[0079] In some embodiments of the present disclosure, the script design information includes: manufacturing information and test information of the target to be tested. The determination part 701 is specifically configured to obtain the manufacturing information of the target to be tested based on the target to be tested information; and obtain the test information based on the test technology of the target to be tested and the target to be tested information.

[0080] In some embodiments of the present disclosure, the determining portion 701 is specifically configured to determine, based on a selection identifier of the test technology, a test technology whose selection identifier has a selected value as the test technology of the target to be tested.

[0081] In some embodiments of the present disclosure, the determining part 701 is specifically configured to obtain initial script design information based on the test technology of the test target and the target information to be tested in the test requirement parameters; and convert the initial script design information into script design information in a key-value format.

[0082] In some embodiments of the present disclosure, the device for generating a testability design script also includes: a receiving part, which is configured to receive the test requirement parameters to be tested input by a user on a graphical user interface before determining the test technology of the target to be tested based on the test technology indication information in the test requirement parameters to be tested.

[0083] It should be noted that the above-mentioned device for generating a testability design script can be the electronic device in the above-mentioned method embodiment of this application, or it can be a functional module and / or functional entity in the electronic device that can realize the functions of the device embodiment, and the embodiment of this application is not limited.

[0084] In the embodiment of the present application, each module can implement the device method for generating a testability design script provided by the above method embodiment and can achieve the same technical effect. To avoid repetition, it will not be described here.

[0085] Please refer to Figure 8, which shows a schematic diagram of the hardware structure of an electronic device provided by an exemplary embodiment of the present disclosure. In some examples, the electronic device can be at least one of a smart phone, a smart watch, a desktop computer, a laptop computer, a virtual reality terminal, an augmented reality terminal, a wireless terminal, and a laptop computer. The electronic device has a communication function and can access a wired network or a wireless network. The electronic device can generally refer to one of a plurality of terminals. Those skilled in the art will appreciate that the number of the above-mentioned terminals can be more or less. It can be understood that the electronic device undertakes the calculation and processing work of the technical solution of the present disclosure, and the present disclosure does not limit this.

[0086] like Figure 8 As shown, the electronic device in the present disclosure may include one or more of the following components: a processor 810 and a memory 820 .

[0087] Optionally, the processor 810 utilizes various interfaces and circuits to connect various components within the electronic device. It executes instructions, programs, code sets, or instruction sets stored in the memory 820, as well as accesses data stored in the memory 820, to perform various functions and process data within the electronic device. Optionally, the processor 810 can be implemented in at least one hardware form: a digital signal processing (DSP), a field-programmable gate array (FPGA), or a programmable logic array (PLA). The processor 810 can integrate one or a combination of a central processing unit (CPU), a graphics processing unit (GPU), a neural network processing unit (NPU), and a baseband chip. The CPU primarily handles the operating system, user interface, and application programs; the GPU is responsible for rendering and drawing content displayed on the touchscreen display; the NPU implements artificial intelligence (AI) functions; and the baseband chip handles wireless communications. It is understandable that the above-mentioned baseband chip may not be integrated into the processor 810, but may be implemented by a separate chip.

[0088] The memory 820 may include random access memory (RAM) or read-only memory (ROM). Optionally, the memory 820 includes a non-transitory computer-readable storage medium. The memory 820 may be used to store instructions, programs, codes, code sets, or instruction sets. The memory 820 may include a program storage area and a data storage area. The program storage area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing each of the above method embodiments, and the like. The data storage area may store data generated based on the use of the electronic device, and the like.

[0089] In addition, those skilled in the art will understand that the structures of the electronic devices shown in the above figures do not limit the electronic devices. The electronic devices may include more or fewer components than shown, or may combine certain components or arrange the components differently. For example, the electronic devices may also include a display screen, a camera assembly, a microphone, a speaker, a radio frequency circuit, an input unit, sensors (such as an accelerometer, an angular velocity sensor, a light sensor, etc.), an audio circuit, a WiFi module, a power supply, a Bluetooth module, and other components, which will not be described in detail here.

[0090] The present disclosure also provides a computer-readable storage medium storing at least one instruction, wherein the at least one instruction is configured to be executed by a processor to implement the method for generating a design for testability script as described in the above embodiments.

[0091] The present disclosure also provides a computer program product, which includes computer instructions stored in a computer-readable storage medium; a processor of an electronic device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the electronic device executes to implement the method of generating a testability design script described in each of the above embodiments.

[0092] An embodiment of the present application further provides a chip, which includes a processor and a communication interface, wherein the communication interface is coupled to the processor, and the processor is used to run programs or instructions to implement the various processes of the above-mentioned method embodiment for generating a testability design script, and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0093] It should be understood that the chip mentioned in the embodiments of the present application can also be called a system-level chip, a system chip, a chip system or a system-on-chip chip, etc.

[0094] In the several embodiments provided in the present disclosure, it should be understood that the disclosed systems, devices, servers and methods can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0095] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0096] In addition, the functional units in the various embodiments of the present disclosure may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0097] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, and other media that can store program code.

[0098] Those skilled in the art will appreciate that in one or more of the above examples, the functions described in this disclosure can be implemented using hardware, software, firmware, or any combination thereof. When implemented using software, these functions can be stored in a computer-readable medium or transmitted as one or more instructions or codes on a computer-readable medium. Computer-readable media include computer storage media and communication media, wherein communication media include any media that facilitates the transmission of computer programs from one place to another. The storage medium can be any available medium that can be accessed by a general-purpose or special-purpose computer.

[0099] It should be noted that the technical solutions described in this disclosure can be combined arbitrarily without conflict.

[0100] The above description is only a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any technician familiar with this technical field can easily think of changes or replacements within the technical scope disclosed by the present invention, which should be covered by the scope of protection of the present invention.

Claims

1. A method for generating a design for testability script, characterized in that: The method comprises: Determining the test technology of the target to be tested according to the test technology indication information in the test requirement parameter, wherein the test technology includes boundary scan, memory built-in self-test and logic test; Determining script design information according to the test technology of the target to be tested and the target to be tested information in the test requirement parameters; Generate an automation script file for testing the target to be tested according to the script design information; Generating an automation script file for testing the target to be tested according to the script design information includes: Parsing the script design information to obtain variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information, and simulation tool information, wherein the variable information refers to information of a container for storing data, the import files refer to information describing and designing the behavior and structure of digital circuits, the initialization environment information refers to the environment and configuration in which the script is run, the constraint setting information refers to information used to define test timing parameters and signal properties, the testability design specification file information refers to a series of standards and guidelines developed during the design phase to improve the testability of a product, the test vector information refers to a set of specific input signal sequences used to stimulate specific failure modes in integrated circuits, including input stimuli and expected responses, and the simulation tool information is used to indicate the simulation tool to be used; Generate a variable setting command in the automation script file according to the variable information; Generate a file import command in the automation script file according to the import file; Generate an environment initialization command in the automation script file according to the initialization environment information; Generate a constraint setting command in the automation script file according to the constraint setting information; Generate a command for importing or creating a DFT specification file in the automation script file according to the specification file information of the DFT; A test vector generation command is generated according to the test vector information, and a simulation command in the automation script file is generated according to the simulation tool.

2. The method according to claim 1, characterized in that Before generating an automation script file for testing the target to be tested according to the script design information, the method further includes: Parsing the script design information to obtain a target automated testing tool; Generating an automation script file for testing the target to be tested according to the script design information includes: The automation script file matching the target automation test tool is generated according to the script design information.

3. The method according to claim 1, characterized in that The script design information includes: manufacturing information and test information of the target to be tested. The script design information is determined based on the test technology of the target to be tested and the target to be tested information in the test requirement parameters, including: Acquiring manufacturing information of the target to be measured according to the target to be measured information; Acquire test information according to the test technology of the target to be tested and the information of the target to be tested.

4. The method according to claim 1, wherein The step of determining the test technology for the target to be tested based on the test technology indication information in the test requirement parameter includes: According to the selection identifier of the test technology, the test technology whose selection identifier takes the selected value is determined as the test technology of the target to be tested.

5. The method according to any one of claims 1 to 4, characterized in that Determining the script design information according to the test technology of the target to be tested and the target to be tested information in the test requirement parameters includes: Acquire initial script design information according to the test technology of the target to be tested and the target to be tested information in the test requirement parameters; The initial script design information is converted into the script design information in a key-value format.

6. The method according to any one of claims 1 to 4, characterized in that Before determining the test technology of the target to be tested based on the test technology indication information in the test requirement parameter, the method further includes: Receive the test requirement parameters input by the user on the graphical user interface.

7. A device for generating a design for testability script, characterized in that: The device includes: a determining part and a generating part; The determining part is configured to determine the test technology of the target to be tested according to the test technology indication information in the test requirement parameter, and the test technology includes boundary scan, memory built-in self-test and logic test; The determining part is further configured to determine the script design information according to the test technology of the target to be tested and the target to be tested information in the test requirement parameters; The generating part is configured to generate an automation script file for testing the target to be tested according to the script design information; Generating an automation script file for testing the target to be tested according to the script design information includes: Parsing the script design information to obtain variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information, and simulation tool information, wherein the variable information refers to information of a container for storing data, the import files refer to information describing and designing the behavior and structure of digital circuits, the initialization environment information refers to the environment and configuration in which the script is run, the constraint setting information refers to information used to define test timing parameters and signal properties, the testability design specification file information refers to a series of standards and guidelines developed during the design phase to improve the testability of a product, the test vector information refers to a set of specific input signal sequences used to stimulate specific failure modes in integrated circuits, including input stimuli and expected responses, and the simulation tool information is used to indicate the simulation tool to be used; Generate a variable setting command in the automation script file according to the variable information; Generate a file import command in the automation script file according to the import file; Generate an environment initialization command in the automation script file according to the initialization environment information; Generate a constraint setting command in the automation script file according to the constraint setting information; Generate a command for importing or creating a DFT specification file in the automation script file according to the specification file information of the DFT; A test vector generation command is generated according to the test vector information, and a simulation command in the automation script file is generated according to the simulation tool.

8. An electronic device, characterized in that: The invention comprises a processor, a memory and a program or instruction stored in the memory and executable on the processor, wherein the program or instruction, when executed by the processor, implements the steps of the method for generating a testability design script as claimed in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that The readable storage medium stores a program or instruction, and when the program or instruction is executed by a processor, the steps of the method for generating a design for testability script according to any one of claims 1 to 6 are implemented.

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