Test data processing method and device, electronic equipment and storage medium

By determining the interface to be sampled and the sampling time period in the test data processing, and filtering and sampling the test data, the problem of conversion time and slow generation of test report due to the large amount of test data in the prior art is solved, and the improvement is achieved Test the effectiveness of efficiency.

CN119473815APending Publication Date: 2025-02-18PEOPLE'S INSURANCE COMPANY OF CHINA
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Patent Information

Application Number
CN202411554917.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-01
Publication Date
2025-02-18

AI Technical Summary

Technical Problem

In the prior art, the large number of test data results in a long time conversion, slow generation of test reports, and low testing efficiency.

Method used

By obtaining the operation log information of the production server, the interface to be sampled and the sampling time period of the server to be tested is determined, and the test data is filtered and sampled according to the interface to be sampled, the sampling time period and the preset sampling interval to obtain the sampled test data. Then, data processing operations are performed on the sampled test data to generate a test report.

Benefits of technology

It reduces the time for data conversion and the time for testing report generation, and improves the efficiency of testing report generation and testing efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention provides a test data processing method and device, electronic equipment and a storage medium, and belongs to the technical field of testing. The method comprises the steps of obtaining operation log information of a production server, and determining a to-be-sampled interface of a tested server according to the operation log information; executing a stability test on the tested system to generate test data; when the tested system executes a stability test, acquiring processor occupancy rate information of the tested server, and determining a time period when the processor occupancy rate is higher than a preset occupancy rate threshold as a sampling time period according to the processor occupancy rate information; filtering and sampling the test data according to the to-be-sampled interface, the sampling time period and a preset sampling interval to obtain sampled test data; and performing data processing operation on the sampling test data to obtain a test report of the tested system. The method is used for reducing data conversion time consumption, improving the generation rate of the test report and further improving the test efficiency.
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Citation Information

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