Low-level sweep current test system and low-level sweep current test method

Abstract

The present application relates to a low-level swept current test system and a low-level swept current test method. The low-level swept current test system includes a computer device, a signal analyzer and a transceiver device; the signal analyzer is used to send a low-level swept frequency signal to the transceiver device based on multiple output frequency points under the control of the computer device; the transceiver device is used to radiate electromagnetic waves based on the low-level swept frequency signal, and detect the induced current of the cable in the electronic device under test under the electromagnetic wave to obtain multiple target current signals; the signal analyzer is also used to automatically follow the output frequency point to receive multiple target current signals; the computer device is used to obtain the target current signal and determine the target transfer function value of the cable based on the target current signal. In the embodiment of the present application, the output and received signals in the signal analyzer are synchronized through a phase-locked loop, and automatically follow the output frequency point to receive the target current signal, which can avoid frequency deviation errors between the output frequency point and the receiving frequency point.

Description

Technical Field

[0001] The present application relates to the technical field of electromagnetic wave testing, and in particular to a low-level swept current testing system and a low-level swept current testing method. Background Art

[0002] The increasingly harsh electromagnetic environment created by human activities exposes electronic equipment to high-intensity radiated fields (HIRF) during normal operation. External electromagnetic fields can couple to electronic equipment through cables or directly radiate, posing a risk of failure and impacting the safe operation of electronic equipment. To protect the effective operation of electronic equipment, radiation sensitivity testing in HIRF environments is necessary. For example, electronic equipment can be aircraft, aircraft, ships, etc.

[0003] Taking aircraft as an example, due to the high electric field strength in HIRF environments, testing is difficult. Currently, a low-level sweep method is used to obtain the transfer function of the entire aircraft in HIRF environments. Low-level sweep methods are categorized into low-level swept current, low-level swept field, and low-level direct drive, depending on the test frequency band.

[0004] Currently, in low-level sweep current test program control, the signal source can only output a single frequency. The computer can only control the signal source output frequency, then control the spectrum analyzer to receive the same frequency, and then switch to the next frequency to achieve the purpose of frequency sweep. However, this method has the problem of frequency offset error. Summary of the Invention

[0005] Based on this, it is necessary to provide a low-level swept current test system and a low-level swept current test method to solve the above technical problems and improve test efficiency.

[0006] In a first aspect, the present application provides a low-level swept current test system, the system comprising a computer device, a signal analyzer, and a transceiver device; the signal analyzer is connected to the computer device and the transceiver device respectively;

[0007] The signal analyzer is used to send a low-level frequency sweep signal to the transceiver device based on multiple output frequency points under the control of the computer device;

[0008] The transceiver is configured to radiate electromagnetic waves based on the low-level sweep frequency signal and detect induced currents of cables in the electronic device under test under the electromagnetic waves to obtain a plurality of target current signals;

[0009] The signal analyzer is further configured to automatically follow the output frequency point to receive a plurality of target current signals;

[0010] The computer device is configured to obtain the target current signal and determine a target transfer function value of the cable based on the target current signal.

[0011] In one embodiment, the transceiver device includes a transmitting antenna and a current clamp, and the current clamp is connected to the cable;

[0012] The transmitting antenna is configured to radiate the electromagnetic wave based on the low-level frequency sweep signal; the electromagnetic wave includes electromagnetic waves radiated by the transmitting antenna at multiple radiation angles in each polarization direction;

[0013] The current caliper is used to detect the induced current of the cable under the electromagnetic wave to obtain the multiple target current signals.

[0014] In one embodiment, the transceiver device further includes a receiving antenna;

[0015] The receiving antenna is used to receive the electromagnetic wave to obtain an initial electric field signal, and send the initial electric field signal to the signal analyzer; the initial electric field signal is used to calibrate the electric field at each test position in the test area to obtain a calibration electric field signal, and the calibration electric field signal is used to determine the target transfer function value of the cable with the target current signal.

[0016] In one embodiment, the computer device is used to determine the multipath reflection result of the test area and the first electric field strength of each test position based on the electric field strength spectrum curve corresponding to the initial electric field signal of each test position, and to use any of the initial electric field signals as the calibration electric field signal when the multipath reflection result indicates that there is no multipath reflection phenomenon in the test area and the difference in the first electric field strength of each test position is less than a preset strength difference.

[0017] In one embodiment, the computer device is used to determine the time domain gate start time and the time domain gate end time of the signal analyzer based on a first time when the direct wave of the electromagnetic wave reaches the signal analyzer and a second time when the reflected wave of the electromagnetic wave reaches the signal analyzer, when the multipath reflection junction indicates the presence of a multipath reflection phenomenon in the test area; the first time and the second time are determined by the signal analyzer based on the initial electric field signal and sent to the computer device;

[0018] The signal analyzer is used to filter the electric field signal corresponding to the reflected wave in each of the initial electric field signals according to the start time and the end time of the time domain gate to obtain each intermediate electric field signal;

[0019] The computer device is used to determine the second electric field strength of each test position based on the electric field strength spectrum curve corresponding to each intermediate electric field signal, and when the difference between the second electric field strengths is less than the preset strength difference, use any of the intermediate electric field signals as the calibration electric field signal.

[0020] In one embodiment, the computer device is used to obtain the maximum induced current at the same output frequency for each of the polarization directions based on the induced current test curves corresponding to the multiple target current signals, and determine the initial transfer function value corresponding to each of the output frequencies at the same polarization direction based on the maximum induced current and the third electric field strength at the same output frequency; and use the maximum value of each of the initial transfer function values at different polarization directions as the target transfer function value of the cable at each of the output frequencies; wherein the third electric field strength is determined based on the electric field strength spectrum curve corresponding to the calibration electric field signal.

[0021] In one embodiment, the system further comprises a power amplifier; the power amplifier is connected to the signal analyzer and the transmitting antenna;

[0022] The power amplifier is used to amplify the low-level swept-frequency signal output by the signal analyzer and send the amplified low-level swept-frequency signal to the transmitting antenna.

[0023] In one embodiment, the system further includes an optical fiber transmission device, the optical fiber transmission device including an optical fiber transmitting end and an optical fiber receiving end, the optical fiber transmitting end is connected to the receiving antenna or the current caliper, and the optical fiber receiving end is connected to the signal analyzer;

[0024] The optical fiber transmitting end is used to convert the target current signal sent by the current caliper and the initial electric field signal sent by the receiving antenna into an optical signal;

[0025] The optical fiber receiving end is used to convert the optical signal into an electrical signal and send it to a signal analyzer, so as to send the target current signal and the initial electric field signal to the signal analyzer.

[0026] In one embodiment, the electronic device under test includes a plurality of cables, the transceiver device includes a plurality of current clamps, and the cables and the current clamps are connected in a one-to-one correspondence; the optical fiber transmitting end includes a plurality of input channels, and the plurality of input channels are connected to corresponding current clamps, and the optical fiber receiving end is connected to the computer device;

[0027] The computer device is further configured to control the optical fiber receiving end to switch the input channel, thereby determining a target current caliper from the plurality of current calipers.

[0028] In a second aspect, the present application provides a low-level sweep current testing method, comprising:

[0029] Control the signal analyzer to send a low-level frequency sweep signal to the transceiver based on multiple output frequency points;

[0030] Receive multiple target current signals sent by the signal analyzer, and determine the target transfer function value of the cable in the electronic device under test based on the multiple target current signals; wherein the multiple target current signals are obtained by the transceiver radiating electromagnetic waves based on the low-level swept frequency signal and detecting the induced current signal of the cable under the electromagnetic waves, and the signal analyzer automatically receives the signals from the transceiver according to the output frequency point.

[0031] In a third aspect, the present application further provides a low-level swept current testing device, comprising:

[0032] A control module, used to control the signal analyzer to send a low-level sweep frequency signal to the transceiver device based on multiple output frequency points;

[0033] A receiving module is configured to receive a plurality of target current signals sent by the signal analyzer and determine a target transfer function value of a cable in the electronic device under test based on the plurality of target current signals; wherein the plurality of target current signals are electromagnetic waves radiated by the transceiver based on the low-level swept-frequency signal and the induced current signals of the cable under the electromagnetic waves are detected, and the signal analyzer automatically receives the signals from the transceiver according to the output frequency point.

[0034] In a fourth aspect, the present application further provides a computer device comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the method steps of the second aspect when executing the computer program.

[0035] In a fifth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which implements the method steps of the second aspect when the computer program is executed by a processor.

[0036] In a sixth aspect, the present application further provides a computer program product, comprising a computer program, which implements the method steps of the second aspect when executed by a processor.

[0037] The above-mentioned low-level swept current test system and low-level swept current test method, the low-level swept current test system includes a computer device, a signal analyzer and a transceiver device; the signal analyzer is connected to the computer device and the transceiver device respectively; the signal analyzer is used to send a low-level swept frequency signal to the transceiver device based on multiple output frequency points under the control of the computer device; the transceiver device is used to radiate electromagnetic waves based on the low-level swept frequency signal and detect the induced current of the cable in the electronic device under test under the electromagnetic wave to obtain multiple target current signals; the signal analyzer is also used to automatically follow the output frequency point to receive multiple target current signals; the computer device is used to obtain the target current signal and determine the target transfer function value of the cable based on the target current signal. Since the existing signal source and spectrum analyzer are two independent devices, it is necessary to control the signal source to output a certain frequency point signal and set the spectrum analyzer to receive the same frequency point signal at the same time, and it is inevitable that there will be frequency deviation errors between the two devices. In the embodiment of the present application, a signal analyzer is used to send a low-level sweep frequency signal and receive a target current signal. The output and received signals in the signal analyzer are synchronized through a phase-locked loop, and the target current signal is automatically received following the output frequency. When the computer equipment is controlled, only multiple output frequencies need to be set to automatically complete the test, which can avoid frequency deviation errors in the output frequency and the receiving frequency. There is no need to control two instruments for each frequency point, and wait for the two instruments to switch and respond before switching to the next frequency point, thereby improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following briefly introduces the drawings required for use in the embodiments of the present application or related technical descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying any creative work.

[0039] Figure 1 is a first structural schematic diagram of a low-level swept current testing system in one embodiment;

[0040] Figure 2 is a second structural schematic diagram of a low-level swept current testing system in one embodiment;

[0041] Figure 3 is a third structural schematic diagram of a low-level swept current testing system in one embodiment;

[0042] Figure 4 1 is a flow chart of a low-level sweep current testing method according to an embodiment;

[0043] Figure 5 is a first schematic diagram of a test area in one embodiment;

[0044] Figure 6 is a second schematic diagram of a test area in one embodiment;

[0045] Figure 7 is a first schematic diagram of an electric field intensity spectrum curve in one embodiment;

[0046] Figure 8 is a second schematic diagram of an electric field intensity spectrum curve in one embodiment;

[0047] Figure 9 is a third schematic diagram of a test area in one embodiment;

[0048] Figure 10 is a time domain signal diagram of a direct wave and a reflected wave in one embodiment;

[0049] Figure 11 is a third schematic diagram of an electric field intensity spectrum curve in one embodiment;

[0050] Figure 12 is a fourth schematic diagram of an electric field intensity spectrum curve in one embodiment;

[0051] Figure 13 1 is a flow chart of a low-level sweep current testing method according to another embodiment;

[0052] Figure 14 is a structural block diagram of a low-level swept current testing device in one embodiment;

[0053] Figure 15 FIG. 1 is a diagram showing the internal structure of a computer device in one embodiment.

[0054] Description of reference numerals:

[0055] 100. Low-level swept current test system; 11. Computer equipment;

[0056] 12. Signal analyzer; 13. Transceiver equipment;

[0057] 200. Electronic equipment under test; 21. Cable;

[0058] 131. Transmitting antenna; 132. Current clamp; 133. Receiving antenna;

[0059] 14. Power amplifier; 15. Optical fiber transmission equipment; 151. Optical fiber transmitter;

[0060] 152. Fiber optic receiving end. DETAILED DESCRIPTION

[0061] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0062] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0063] In this application, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include at least one of such features. In the description of this application, "plurality" means at least two, for example, two, three, etc., unless otherwise specifically defined.

[0064] In this application, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two elements or interaction between two elements, unless otherwise specified. Those skilled in the art will understand the specific meanings of the above terms in this application based on specific circumstances.

[0065] In this application, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0066] Electronic equipment is exposed to HIRF radiation during normal operation. External electromagnetic fields can couple to cables or radiate directly onto electronic equipment, posing a risk of failure. For example, during normal aircraft operation, especially during takeoff and landing, external electromagnetic fields can couple to cables or radiate directly onto aircraft electronic equipment, posing a risk of failure and potentially impacting aircraft safety. In 2006, the Civil Aviation Administration of my country issued regulation AC-21-1317, "Aircraft High-Intensity Radiated Field (HIRF) Protection Requirements," clarifying that HIRF testing is a necessary part of aircraft airworthiness compliance certification. To protect aircraft electronic equipment, radiation sensitivity testing in HIRF environments is required.

[0067] Due to the high electric field intensity and high power in the HIRF environment, the current high-level radiation sensitivity tests include the reverberation chamber method and the outdoor high-power direct irradiation method. The reverberation chamber is a closed cavity composed of well-conductive walls and equipped with a stirrer. It has the characteristics of generating high field strength with low power and statistically uniform field strength. However, the operating frequency of the reverberation chamber is related to its size. Due to the limited size, it is difficult to conduct low-frequency (below 100MHz) radiation sensitivity tests, and it is impossible to carry out full-aircraft-level tests. The outdoor high-power direct irradiation method uses a power amplifier to amplify the output signal of the signal source and directly irradiate the test object through an antenna. This method is simple and direct, but it has high requirements for the power amplifier, high test costs, inconvenient transportation, and serious electromagnetic pollution. Therefore, this application conducts radiation sensitivity tests based on low levels.

[0068] Figure 1 FIG. 1 is a first structural diagram of a low-level swept current test system in one embodiment. Figure 1 As shown, the low-level swept current test system 100 includes a computer device 11, a signal analyzer 12 and a transceiver device 13; the signal analyzer 12 is connected to the computer device 11 and the transceiver device 13 respectively; the signal analyzer 12 is used to send a low-level swept frequency signal to the transceiver device 13 based on multiple output frequency points under the control of the computer device 11; the transceiver device 13 is used to radiate electromagnetic waves based on the low-level swept frequency signal, and detect the induced current of the cable 21 in the electronic device 200 under test under the electromagnetic wave to obtain multiple target current signals; the signal analyzer 12 is also used to automatically follow the output frequency points to receive multiple target current signals; the computer device 11 is used to obtain the target current signal and determine the target transfer function value of the cable based on the target current signal.

[0069] In the embodiment of the present application, the computer device 11 is communicatively connected to the signal analyzer 12 , the signal analyzer 12 is connected to the transceiver device 13 , and the transceiver device 13 is connected to the cable 21 in the electronic device 200 under test.

[0070] The purpose of the low-level swept current test is to determine the transfer function relationship between the external radiated field and the induced current in the cable of the electronic device under test. Under the control of a computer, signal analyzer 12 sweeps its output port to output low-level swept-frequency signals at multiple output frequencies. Transceiver 13 radiates electromagnetic waves based on the low-level swept-frequency signals and detects the induced current in cable 21 of electronic device under test 200 under these electromagnetic waves, generating multiple target current signals. Computer 11 then determines the target transfer function value for cable 21 at each output frequency based on the target current signals and a pre-calibrated calibration electric field signal.

[0071] Optionally, signal analyzer 12 can be a vector network analyzer. Signal analyzer 12 comprises two modules: a signal source and a receiver. The signal source and receiver share the same frequency range, typically covering 100 kHz to 18 GHz. During the receiver's frequency sweep test, a phase-locked loop (PLL) ensures frequency synchronization with the signal source. Optionally, the signal source can output both point-frequency and sweep-frequency low-level sweep signals, with an output amplitude of -60 dBm to 10 dBm. The receiver typically uses a tuned receiver to achieve good test sensitivity and dynamic range, and also includes signal analysis windowing and time-domain gating capabilities.

[0072] Optionally, the multiple output frequency points can be multiple independent output frequencies or frequency intervals. In existing tests based on signal sources and spectrum analyzers, the signal source can only output a single frequency point, and the computer device can only control the signal source output frequency point and then control the spectrum analyzer to receive the same frequency point. The computer device then controls the signal source to switch to the next output frequency point to achieve the purpose of frequency sweeping. During the frequency sweeping process, each frequency point requires programming of two instruments (signal source and spectrum analyzer), and then switching to the next frequency point after waiting for the two instruments to respond, resulting in low test efficiency. The output and reception of the signal analyzer of the present application are integrated into one machine, which does not require repeated programming, has a fast frequency sweeping speed, high test efficiency, and a short residence time for each output frequency point, thereby reducing spatial electromagnetic pollution.

[0073] Since the output and reception of the signal analyzer 12 of the present application are integrated, and the output circuit and the receiving circuit share a common ground, the anti-electromagnetic interference performance can be improved, and the measurement results can be prevented from being affected by the radiation interference of the transmitting antenna under unshielded external field conditions.

[0074] Optionally, the transceiver device 13 may be a transmitting antenna and a current clamp, the transmitting antenna radiates electromagnetic waves based on a low-level sweep frequency signal, the current clamp detects the induced current of the electronic device under test under electromagnetic wave radiation, and sends the induced current signal to the signal analyzer 12.

[0075] Optionally, the electronic device under test 200 may be a large device such as an aircraft, a car, or a ship, or a small device such as a mobile phone. That is, the embodiment of the present application does not specifically limit the electronic device under test 200.

[0076] In an embodiment of the present application, a low-level swept current test system includes a computer device, a signal analyzer, and a transceiver device; the signal analyzer is connected to the computer device and the transceiver device respectively; the signal analyzer is used to send a low-level swept frequency signal to the transceiver device based on multiple output frequency points under the control of the computer device; the transceiver device is used to radiate electromagnetic waves based on the low-level swept frequency signal and detect the induced current of the cable in the electronic device under test under the electromagnetic wave to obtain multiple target current signals; the signal analyzer is also used to automatically follow the output frequency point to receive multiple target current signals; the computer device is used to obtain the target current signal and determine the target transfer function value of the cable based on the target current signal. Since the existing signal source and spectrum analyzer are two independent devices, it is necessary to control the signal source to output a certain frequency point signal and set the spectrum analyzer to receive the same frequency point signal at the same time, and it is inevitable that there will be frequency deviation errors between the two devices. In the embodiment of the present application, a signal analyzer is used to send a low-level sweep frequency signal and receive a target current signal. The output and received signals in the signal analyzer are synchronized through a phase-locked loop, and the target current signal is automatically received following the output frequency. When the computer equipment is controlled, only multiple output frequencies need to be set to automatically complete the test, which can avoid frequency deviation errors in the output frequency and the receiving frequency. There is no need to control two instruments for each frequency point, and wait for the two instruments to switch and respond before switching to the next frequency point, thereby improving test efficiency.

[0077] Figure 2 FIG. 1 is a second structural diagram of a low-level swept current test system in one embodiment. Figure 2 As shown, the transceiver device 13 includes a transmitting antenna 131 and a current clamp 132, and the current clamp 132 is connected to the cable 21; the transmitting antenna 131 is used to radiate electromagnetic waves based on a low-level sweep frequency signal; the current clamp 132 is used to detect the induced current of the cable 21 under the electromagnetic wave to obtain multiple target current signals; the electromagnetic waves include electromagnetic waves radiated by the transmitting antenna 131 at multiple radiation angles in each polarization direction.

[0078] Transmitting antenna 131 is used to convert a low-level swept-frequency signal into an electric field signal, radiating electromagnetic waves. Current caliper 132 is a coupling device that proportionally converts the current flowing through cable 21 into a voltage. Essentially, it is a broadband transformer with a toroidal core, typically made of ferrite. It is used to measure the induced current in the cables within the electronic device under test 200. Current caliper 132 has a frequency range of 10 kHz to 400 MHz and a flat frequency response within its passband.

[0079] Optionally, the transmitting antenna 131 may include a low-frequency transmitting antenna and a high-frequency transmitting antenna. The low-frequency transmitting antenna has a frequency range of 500 kHz to 30 MHz. Due to the long wavelength and large size of the low-frequency transmitting antenna, the low-frequency transmitting antenna can be divided into vertically polarized antennas (monopole antennas) and horizontally polarized antennas (dipole antennas). A matching balun is used to ensure that the low-frequency transmitting antenna transmits at maximum efficiency. The high-frequency transmitting antenna has a frequency range of 30 MHz to 1 GHz.

[0080] Move the electronic device under test 200 into the designated test area. Clamp the cable 21 with the current clamp 132 (5 cm from the port of the electronic device under test 200). The output port of the current clamp 132 can be connected to the signal analyzer 12 via an RF cable. The position and height of the transmitting antenna 131 are consistent with those used during the electric field calibration. The signal analyzer 12 outputs the same electric field strength as during the electric field calibration, sweeping the output at the same output frequency and power. The current clamp 132 is used to obtain the induced current in the cable 21 to obtain the induced current spectrum curve corresponding to the target current signal.

[0081] The polarization direction of the transmitting antenna 131 is changed, the frequency is scanned again, and the induced current of the cable under two polarization directions is obtained. The induced current of the two polarizations is measured for all cables 21.

[0082] Optionally, the output port of the current clamp 132 is connected to the transmitting end of the optical fiber transmission device 15 through a radio frequency line that is as short as possible. The optical fiber transmission device 15 is adjusted to a suitable gain to ensure measurement accuracy while also ensuring that the target current signal input to the signal analyzer 12 is not too large to damage the signal analyzer.

[0083] In an embodiment of the present application, considering that the high-intensity radiation field HIRF environment to which the electronic device under test 200 is subjected during application is irradiated in more than one direction, it is necessary to perform irradiation tests at multiple radiation angles, rotate the electronic device under test 200 or move the position of the transmitting antenna 131, irradiate the electronic device under test 200 at multiple angles, obtain the induced current of the cable at multiple radiation angles, and obtain multiple target current signals. The target current signal includes current signals in multiple polarization directions and multiple radiation angles.

[0084] In an embodiment of the present application, the transmitting antenna is used to radiate electromagnetic waves based on a low-level sweep frequency signal, and the current caliper is used to detect the induced current of the cable under the electromagnetic wave to obtain multiple target current signals, laying the foundation for subsequently determining the target transfer function value based on the induced current test curve corresponding to the target current signal.

[0085] Figure 3 FIG. 3 is a third structural diagram of a low-level swept current test system according to an embodiment of the present invention. Figure 3As shown, the transceiver device 13 also includes a receiving antenna 133; the receiving antenna 133 is used to receive electromagnetic waves to obtain an initial electric field signal, and send the initial electric field signal to the signal analyzer; the initial electric field signal is used to calibrate the electric field at each test position in the test area to obtain a calibration electric field signal, and the calibration electric field signal is used to determine the target transfer function value of the cable with the target current signal.

[0086] When performing a low-level swept current test, a uniform low-intensity electric field is first generated using a signal analyzer 12 in the test area where the electronic device under test 200 is pre-placed. The electric field strength at each test location is measured using a receiving antenna 133 to calibrate the electric field in the test area. The electronic device under test 200 is then moved to a designated test location where the electric field has been calibrated. The same electric field used during the calibration is applied, and the induced current in the cables within the electronic device under test is measured to obtain the target transfer function value of the cables. Therefore, after determining the test area where the electronic device under test 200 is pre-placed, the transmitting antenna 131 is raised to the center height of the electronic device under test 200. The transmitting antenna 131 is then moved sufficiently far away from the test area. The receiving antenna 133 is then placed in the center of the test area and raised to the same height as the transmitting antenna 131. The receiving antenna 133 is then connected to the signal analyzer 12 via a RF cable that is as short as possible. Optionally, the distance is at least 1.5 times the length of the electronic device 200 under test. This distance places the test area in the far field of the transmitting antenna 131, ensuring that when the transmitting antenna 131 transmits electromagnetic waves, the first electric field strength of each test position point in the test area differs by no more than 6dB, indicating that the electric field calibration is completed.

[0087] Among them, the receiving antenna 133 is used to receive electromagnetic waves and convert the electromagnetic waves into initial electric field signals; optionally, the receiving antenna 133 includes a low-frequency receiving antenna and a high-frequency receiving antenna, the low-frequency receiving antenna adopts an active biconical antenna, and the high-frequency receiving antenna adopts a passive biconical antenna. The frequency range of the low-frequency receiving antenna and the high-frequency receiving antenna covers 500kHz~400MHz, the size is as small as possible, and horizontal polarization and vertical polarization can be switched.

[0088] In one embodiment, a computer device is used to determine the multipath reflection result of the test area and the first electric field strength of each test position based on the electric field strength spectrum curve corresponding to the initial electric field signal of each test position, and to use any initial electric field signal as a calibration electric field signal when the multipath reflection result indicates that there is no multipath reflection phenomenon in the test area and the difference in the first electric field strength of each test position is less than a preset strength difference.

[0089] like Figure 4 As shown, Figure 4This is a flow chart of a low-level swept current testing method in one embodiment. The polarization directions of the receiving antenna and the transmitting antenna are set. A computer device controls a signal analyzer to output a swept frequency test at multiple output frequency points to obtain an electric field strength spectrum curve at the current position. The position and height of the receiving antenna are changed, and the swept frequency test is continued to obtain electric field strength spectrum curves at the center and edge positions of the test area.

[0090] Then, the polarization directions of the receiving antenna and the transmitting antenna are changed to obtain the electric field intensity spectrum curve at each test position, so as to obtain the electric field intensity spectrum curve at each test position under different polarization directions.

[0091] Compare the electric field intensity spectrum curves at each test location. If the electric field intensity spectrum curve fluctuates and the frequencies of the peaks and troughs at each test location are inconsistent, multipath reflection is present. If there are no frequency inconsistencies and / or fluctuations, multipath reflection is not present.

[0092] Directly based on the initial electric field strength spectrum curve, the first electric field strength of each test position is obtained. If the difference between the first electric field strengths is less than the preset strength, it proves that the electric field in the test area is uniform. Any initial electric field signal is used as a calibration electric field signal, that is, any initial electric field signal is a calibration electric field strength.

[0093] Furthermore, if the difference between the first electric field strengths is not less than the preset strength, it is necessary to inspect the test site conditions and the test system in the test area, and then obtain the electric field strength spectrum curve of each test position under each polarization direction.

[0094] In an embodiment of the present application, a computer device is used to determine the multipath reflection result of the test area and the first electric field strength of each test position based on the initial electric field strength spectrum curve of each test position, and when the multipath reflection result indicates that there is no multipath reflection phenomenon in the test area and the difference in the first electric field strength of each test position is less than a preset strength difference, any initial electric field signal is used as a calibration electric field signal, thereby laying a foundation for subsequent low-level swept current testing of the electronic device under test based on the electric field strength spectrum curve corresponding to the calibration electric field signal, thereby improving the accuracy of the low-level swept current test.

[0095] In one embodiment, a computer device is used to determine a time domain gate start time and a time domain gate end time of a signal analyzer based on a first time when a direct wave of an electromagnetic wave reaches the signal analyzer and a second time when a reflected wave of the electromagnetic wave reaches the signal analyzer when a multipath reflection phenomenon exists in a test area characterized by a multipath reflection junction; the first time and the second time are determined by the signal analyzer based on an initial electric field signal and sent to the computer device; the signal analyzer is used to filter the electric field signal corresponding to the reflected wave in each initial electric field signal based on the time domain gate start time and the time domain gate end time to obtain each intermediate electric field signal; the computer device is used to determine a second electric field strength of each test position based on an electric field strength spectrum curve corresponding to each intermediate electric field signal, and when a difference between the second electric field strengths is less than a preset strength difference, use any intermediate electric field signal as a calibration electric field signal.

[0096] In the embodiments of this application, Figure 5 and Figure 6 As shown, when performing low-level swept current testing, the test area is typically selected in an area free of reflective objects such as large buildings and trees. However, in actual testing, due to the placement and ease of use of the electronic equipment under test, some reflective objects are unavoidable, and ground reflections are always present and cannot be eliminated. Therefore, when performing electric field calibration, if the path difference between the direct path and the reflected path is greater than the wavelength of the electromagnetic wave, multipath effects will occur, affecting the electric field calibration results. Therefore, when the antenna height is high, the test distance must be very long, or additional methods must be used to eliminate multipath effects.

[0097] When the phase difference between the reflected wave and the direct wave in the electromagnetic wave is 180°, the measured electric field is minimum, and a trough phenomenon is shown in the spectrum curve. Figure 7 This is an electric field intensity spectrum curve under 1MHz~30MHz vertical polarization in a low-level sweep current test in one embodiment. Due to the presence of nearby factory buildings, the electric field intensity spectrum curve fluctuates, that is, Figure 5 The electric field intensity spectrum curve under the corresponding test environment. Figure 8 The electric field intensity spectrum curve under horizontal polarization from 30MHz to 400MHz in a low-level swept current test in one embodiment is shown. Due to the high height and short distance between the transmitting antenna and the receiving antenna, the path difference between the ground reflected wave and the direct wave is large. The trough frequency point of the superposition falls within the test frequency band, resulting in a trough phenomenon, i.e. Figure 6 The electric field intensity spectrum curve under the corresponding test environment.

[0098] Time domain gate technology is a function that mathematically eliminates unnecessary responses in the time domain. This function performs time domain transformation, selects an area within the time domain, deletes responses outside the area, and then transforms back to the frequency domain after deletion. The signal analyzer has a time domain mode measurement function. In the time domain mode measurement, since the reflected wave and the direct wave take different paths and have different distances, there is a time delay in reaching the receiving port of the signal analyzer. You can clearly see the first time the direct wave arrives and the second time the reflected wave arrives. Set the appropriate time domain gate start time and time domain gate end time according to the first time and the second time. Open the time domain gate according to the time domain gate start time and the time domain gate end time to eliminate the reflected wave and allow only the direct wave to pass. The electric field intensity spectrum curve obtained by opening the time domain gate is the electric field intensity spectrum curve of the direct wave. For example Figure 9 Schematic diagram of a test area in one embodiment.

[0099] The initial electric field signal received by the signal analyzer can obtain the vector intensity of each output frequency point within the entire frequency band. If there are multiple signals of direct waves and reflected waves in the test frequency band, the electric field intensity spectrum curve corresponding to the initial electric field signal is the result of the combined effect of multiple signals, and it is impossible to distinguish between direct waves and reflected waves. The electric field intensity spectrum curve corresponding to the initial electric field signal is subjected to inverse Fourier transform to the time domain. Several peak signals can be clearly seen in the time domain. Usually, the first peak has the largest amplitude, which is the direct wave. The subsequent peaks are reflected waves, and the peaks are lower than the direct wave amplitude, such as Figure 10 As shown, Figure 10 It is a time domain signal diagram of the direct wave and the reflected wave in one embodiment. This is because the direct wave has the shortest path and arrives the fastest, and is displayed as the first peak in the time domain mode. The reflected wave has a longer path than the direct wave and arrives later than the direct wave, and is displayed as a subsequent peak. In addition, due to spatial attenuation and the medium of the reflective material, the amplitude of the subsequent peak will be lower than the peak of the direct wave. Therefore, in the time domain, the direct wave and the reflected wave can be clearly distinguished. In order to achieve the purpose of filtering out the reflected wave, a "gate" is added to the time domain mode of the signal analyzer to allow the electric field signal corresponding to the direct wave to pass through and the electric field signal corresponding to the reflected wave to be filtered out, similar to a bandpass filter, which only allows the specified signal to pass through. In mathematical calculations, the time domain signal can be multiplied by a "gate" function. After opening the time domain gate, Fourier transform is performed to the frequency domain to obtain a spectrum curve with only the direct wave signal. Figure 11 This is the electric field intensity spectrum curve when the time domain gate mode is not turned on (the electric field intensity spectrum curve corresponding to the initial electric field signal). Figure 12 This is the electric field intensity spectrum curve with the time domain gate mode turned on (the electric field intensity spectrum curve corresponding to the intermediate electric field signal). It can be seen that the electric field intensity spectrum curve has become smooth without fluctuation, and the reflected waves in the electromagnetic waves have been filtered out.

[0100] Specifically, the time domain gate parameters only need to set the time domain gate start time and the time domain gate end time. Assuming that in the time domain mode, the first time when the direct wave arrives is T0 and the second time when the reflected wave arrives is T1, then the time domain gate start time T begin and the time domain gate end time T end The calculation is as follows:

[0101] ;

[0102] ;

[0103] Furthermore, the computer device is used to determine the second electric field strength of each test position based on the electric field strength spectrum curve corresponding to the intermediate electric field signal. If the difference between the second electric field strengths is less than the preset strength, any intermediate electric field signal is used as the calibration electric field signal, that is, the electric field strength corresponding to any intermediate electric field signal is used as the calibration electric field strength.

[0104] It should be noted that during the low-level swept current test, the cable is measured inside the electronic device under test. The interior of the electronic device under test is a reverberant environment, and the internal electric field itself is obtained after multiple reflections in the cavity. The cable coupling current is also the result of the combined action of multiple signals. There is no need to open the time domain gate to eliminate the reflected wave. A normal swept frequency test can be used to obtain the induced current test curve.

[0105] In an embodiment of the present application, a computer device is used to determine the time domain gate start time and the time domain gate end time of the signal analyzer according to the first time when the direct wave of the electromagnetic wave arrives at the signal analyzer and the second time when the reflected wave of the electromagnetic wave arrives at the signal analyzer when a multipath reflection phenomenon exists in the multipath reflection junction characterization test area; the signal analyzer is used to filter the electric field signals corresponding to the reflected waves in each initial electric field signal according to the time domain gate start time and the time domain gate end time to obtain each intermediate electric field signal; the computer device is used to determine the second electric field intensity of each test position based on the electric field intensity spectrum curve corresponding to each intermediate electric field signal, and when the difference between the second electric field intensities is less than a preset intensity difference, any intermediate electric field signal is used as a calibration electric field signal. In an embodiment of the present application, the arrival time of the direct wave and the reflected wave is obtained by using the signal analyzer to obtain the time domain gate start time and the time domain gate end time, which can eliminate the superposition effect of various reflected waves during electric field calibration, reduce the influence of the surrounding environment of the test area on the test results, and improve the accuracy of the electric field calibration.

[0106] In one embodiment, a computer device is used to obtain, for each polarization direction, a maximum induced current at the same output frequency based on induced current test curves corresponding to multiple target current signals, and determine, based on the maximum induced current and a third electric field strength at the same output frequency, an initial transfer function value corresponding to each output frequency under the same polarization direction; and use the maximum value of each initial transfer function value under different polarization directions as the target transfer function value of the cable at each output frequency; wherein the third electric field strength is determined based on an electric field strength spectrum curve corresponding to a calibration electric field signal.

[0107] In this embodiment of the present application, the induced current test curve is a curve with frequency on the horizontal axis and current amplitude on the vertical axis. Based on the induced current test curves at multiple radiation angles under the same polarization direction, the maximum induced current corresponding to each output frequency can be obtained. The sum of the electric field intensity spectrum curve corresponding to the calibration electric field signal is a curve with frequency on the horizontal axis and electric field intensity amplitude on the vertical axis. Based on the electric field intensity spectrum curve corresponding to the calibration electric field signal, the third electric field intensity at each output frequency can be obtained.

[0108] Due to the radiation in multiple polarization directions and multiple angles, a cable has multiple groups of induced currents, that is, target current signals of multiple radiation angles under multiple polarization directions are obtained. First, for each output frequency point under each polarization direction, the ratio of the maximum induced current to the third electric field strength is used as the initial transfer function value of the output frequency point under the same polarization direction. For example, the transmitting antenna and the receiving antenna include two polarization directions, horizontal polarization and vertical polarization, then for each output frequency point, two initial transfer function values will be obtained. Furthermore, the maximum transfer function value is obtained from the two initial transfer function values as the target transfer function value at the output frequency point, thereby obtaining the target transfer function value of each cable at each output frequency point. Target transfer function value F use It can be expressed in the following ways:

[0109]

[0110] Among them, E H is the third electric field strength under polarization direction H, E V is the third electric field strength under polarization direction V, n is the number of radiation angles, and I is the induced current under each radiation angle.

[0111] In an embodiment of the present application, the maximum induced current at the same output frequency is obtained based on the induced current test curves corresponding to multiple target current signals; the initial transfer function value corresponding to each output frequency under the same polarization direction is determined based on the maximum induced current and the third electric field strength at the same output frequency; the maximum value of each initial transfer function value under different polarization directions is used as the target transfer function value of the cable at each output frequency. In the embodiment of the present application, the induced current test curves of multiple radiation angles are first processed to obtain the initial transfer function value, and then the initial transfer function values of different polarization directions are processed to obtain the target transfer function value, so that the obtained target transfer function value can cope with the most severe radiation environment, thereby improving the reliability of the low-level swept current test.

[0112] Continue as above Figure 2 and Figure 3 As shown, the low-level swept current test system also includes a power amplifier 14; the power amplifier 14 is connected to the signal analyzer 12 and the transmitting antenna 131; the power amplifier 14 is used to amplify the low-level swept frequency signal output by the signal analyzer 11 and send the amplified low-level swept frequency signal to the transmitting antenna 131.

[0113] In this embodiment of the present application, the input end of the power amplifier 14 is connected to the signal analyzer 12, and the output end is connected to the transmitting antenna 131. The power amplifier 14 is used to amplify the amplitude of the low-level swept-frequency signal output by the signal analyzer 12 and send the amplified low-level swept-frequency signal to the transmitting antenna 131.

[0114] Optionally, the power amplifier 14 may be a broadband radio frequency power amplifier. For example, the power amplifier 14 may have a gain of 50 dB, a maximum input of 0 dBm, and a frequency range of 10 kHz to 400 MHz.

[0115] In an embodiment of the present application, a power amplifier is used to amplify the low-level swept-frequency signal output by the signal analyzer and send the amplified low-level swept-frequency signal to the transmitting antenna, thereby avoiding the situation where the transmitting antenna cannot detect the low-level swept-frequency signal output by the signal analyzer when the amplitude is small, thereby ensuring the reliability of the low-level swept current test.

[0116] Continue as above Figure 2 and Figure 3As shown, the low-level swept current test system also includes an optical fiber transmission device 15, which includes an optical fiber transmitting end 151 and an optical fiber receiving end 152. The optical fiber transmitting end 151 is connected to the receiving antenna 133 or the current clamp 132, and the optical fiber receiving end 152 is connected to the signal analyzer 12; the optical fiber transmitting end 151 is used to convert the target current signal sent by the current clamp 132 and the initial electric field signal sent by the receiving antenna 133 into an optical signal; the optical fiber receiving end 152 is used to convert the optical signal into an electrical signal and send it to the signal analyzer 12, so as to send the target current signal and the initial electric field signal to the signal analyzer 12.

[0117] In the embodiment of the present application, the optical fiber transmission device 15 includes an optical fiber transmitting end 151 and an optical fiber receiving end 152. When performing electric field calibration, as described above, Figure 3 As shown, the optical fiber transmitting end 151 converts the initial electric field signal generated by the receiving antenna into an optical signal and transmits it using an optical fiber. The optical fiber receiving end 152 converts the optical signal into an electrical signal and transmits it to the signal analyzer 12.

[0118] When performing a low level sweep current test, as described above Figure 2 As shown, the current clamp 132 detects the induced current of the cable 21 to obtain a target current signal, the optical fiber transmitting end 151 converts the target current signal into an optical signal, transmits it using optical fiber, and the optical fiber receiving end 152 converts the optical signal into an electrical signal and transmits it to the signal analyzer 12.

[0119] Optionally, the optical fiber transmission device 15 has a frequency response of 50 Hz to 1.5 GHz, a gain range of -60 dB to +55 dB, and a dynamic range of 150 dB at a 1 Hz bandwidth.

[0120] In an embodiment of the present application, a fiber optic transmission device includes a transmitter and a receiver. The transmitter is used to convert the target current signal transmitted by the current caliper and the initial electric field signal transmitted by the receiving antenna into an optical signal. The receiver is used to convert the optical signal into an electrical signal and transmit it to a signal analyzer, thereby transmitting the target current signal and the initial electric field signal to the signal analyzer. In this embodiment of the present application, the fiber optic transmission device is used for signal transmission. The fiber optic transmission signal has strong anti-interference capabilities and low insertion loss, making it suitable for long-distance signal transmission in large test sites.

[0121] In one embodiment, the electronic device under test includes multiple cables, the transceiver device includes multiple current calipers, and the cables and current calipers are connected one-to-one; the optical fiber transmitting end includes multiple input channels, the multiple input channels are connected to corresponding current calipers, and the optical fiber receiving end is connected to a computer device; the computer device is also used to determine the target current caliper from the multiple current calipers by controlling the optical fiber receiving end to switch the input channels.

[0122] In this embodiment of the present application, the transmitter includes multiple input channels, i.e., the optical fiber transmitter has multiple electrical inputs and one optical output, with the input channels, cables, and current clamps connected in a one-to-one correspondence. A computer device is communicatively connected to the optical fiber receiver, and software controls the optical fiber receiver to select a target input channel, determine a target current clamp from among multiple current clamps, and determine a target cable from among multiple cables.

[0123] In an embodiment of the present application, the computer device is also used to switch the input channel through the optical fiber receiving end, determine the target current clamp from multiple current clamps, and determine the target cable from multiple cables. When the electronic device under test includes multiple cables, there is no need to frequently connect the current clamps and cables, which improves the efficiency of low-level swept current testing.

[0124] In an exemplary embodiment, Figure 13 As shown, a low-level sweep current test method is provided, which is applied to Figure 1 The computer device in the example is used to illustrate, and the following steps are included: S301, controlling the signal analyzer to send a low-level swept frequency signal to the transceiver device based on multiple output frequency points; S302, receiving multiple target current signals sent by the signal analyzer, and determining the target transfer function value of the cable in the electronic device under test according to the multiple target current signals; wherein the multiple target current signals are electromagnetic waves radiated by the transceiver device based on the low-level swept frequency signal, and the induced current signals of the cable under the electromagnetic wave are detected, and the signal analyzer automatically receives them from the transceiver device following the output frequency points.

[0125] Since the existing signal source and spectrum analyzer are two independent devices, it is necessary to control the signal source to output a certain frequency signal and set the spectrum analyzer to receive the same frequency signal at the same time. In addition, there will inevitably be frequency deviation errors between the two devices. In the embodiment of the present application, a signal analyzer is used to send a low-level sweep signal and receive a target current signal. The output and received signals in the signal analyzer are synchronized through a phase-locked loop, and the target current signal is automatically received following the output frequency. When the computer device is controlled, only multiple output frequencies need to be set to automatically complete the test. This can avoid frequency deviation errors in the output and receiving frequencies, and there is no need to control two instruments for each frequency point, waiting for the two instruments to switch and respond before switching to the next frequency point, thereby improving test efficiency.

[0126] It should be understood that, although the steps in the flowcharts of the above embodiments are shown in sequence as indicated by the arrows, these steps are not necessarily performed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be performed in other orders. Moreover, at least a portion of the steps in the flowcharts of the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily performed at the same time, but can be performed at different times. The execution order of these steps or stages is not necessarily to be performed in sequence, but can be performed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0127] Based on the same inventive concept, embodiments of the present application also provide a low-level swept current testing device for implementing the aforementioned low-level swept current testing method. The solution provided by this device is similar to the solution described in the aforementioned method. Therefore, the specific limitations of one or more embodiments of the low-level swept current testing device provided below can be found in the above-described limitations of the low-level swept current testing method and will not be further elaborated here.

[0128] In an exemplary embodiment, Figure 14 As shown, a low-level sweep current test device is provided, including: a control module 41 and a receiving module 42, wherein:

[0129] The control module 41 is used to control the signal analyzer to send a low-level frequency sweep signal to the transceiver device based on multiple output frequency points;

[0130] The receiving module 42 is used to receive multiple target current signals sent by the signal analyzer and determine the target transfer function value of the cable in the electronic device under test based on the multiple target current signals; wherein the multiple target current signals are electromagnetic waves radiated by the transceiver based on a low-level sweep frequency signal and the induced current signals of the cable under the electromagnetic waves are detected, and the signal analyzer automatically receives them from the transceiver according to the output frequency point.

[0131] Each module in the low-level swept current test device can be implemented in whole or in part through software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in hardware form, or can be stored in a memory in the computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0132] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG. Figure 15As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O) and a communication interface. The processor, memory and input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and computer program in the non-volatile storage medium. The database of the computer device is used to store data related to low-level sweep current testing. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a low-level sweep current testing method is implemented.

[0133] Those skilled in the art will understand that Figure 15 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0134] In an exemplary embodiment, a computer device is provided, including a memory and a processor. The memory stores a computer program, and the processor implements the steps of any of the above method embodiments when executing the computer program.

[0135] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above method embodiments are implemented.

[0136] In one embodiment, a computer program product is provided, comprising a computer program, which implements the steps of any of the above method embodiments when executed by a processor.

[0137] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0138] Those skilled in the art will understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. In particular, any reference to memory, database, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The databases involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the various embodiments provided herein may be, but are not limited to, general-purpose processors, central processing units (CPUs), graphics processing units (GPUs), digital signal processors (DSPs), programmable logic devices (PLDs), quantum computing-based data processing logic devices, artificial intelligence (AI) processors, and the like.

[0139] The technical features of the above embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0140] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A low-level swept current test system, characterized in that: The system includes a computer device, a signal analyzer and a transceiver device; the signal analyzer is connected to the computer device and the transceiver device respectively; the transceiver device includes a transmitting antenna, a current clamp and a receiving antenna, and the current clamp is connected to a cable in the electronic device under test; The signal analyzer is used to send a low-level frequency sweep signal to the transceiver device based on multiple output frequency points under the control of the computer device; The transmitting antenna is configured to radiate electromagnetic waves based on the low-level frequency sweep signal; the electromagnetic waves include electromagnetic waves radiated by the transmitting antenna at multiple radiation angles in each polarization direction; The current caliper is used to detect the induced current of the cable under the electromagnetic wave to obtain multiple target current signals; The receiving antenna is used to receive the electromagnetic wave to obtain an initial electric field signal, and send the initial electric field signal to the signal analyzer; The signal analyzer is further configured to automatically follow the output frequency point to receive a plurality of target current signals; The computer device is configured to determine a multipath reflection result of the test area and a first electric field strength at each test location within the test area based on an electric field strength spectrum curve corresponding to the initial electric field signal at each test location within the test area, and to use any of the initial electric field signals as a calibration electric field signal if the multipath reflection result indicates that no multipath reflection phenomenon exists within the test area and a difference in the first electric field strength at each test location is less than a preset strength difference. The computer device is configured to determine a time domain gate start time and a time domain gate end time of the signal analyzer based on a first time when the direct wave of the electromagnetic wave reaches the signal analyzer and a second time when the reflected wave of the electromagnetic wave reaches the signal analyzer, when the multipath reflection junction indicates that a multipath reflection phenomenon exists in the test area; the first time and the second time are determined by the signal analyzer based on the initial electric field signal and sent to the computer device; The signal analyzer is used to filter the electric field signal corresponding to the reflected wave in each of the initial electric field signals according to the start time and the end time of the time domain gate to obtain each intermediate electric field signal; The computer device is configured to determine the second electric field strength of each of the test positions based on the electric field strength spectrum curve corresponding to each of the intermediate electric field signals, and use any of the intermediate electric field signals as the calibration electric field signal when a difference between the second electric field strengths is less than a preset strength difference; The computer device is configured to obtain the target current signal and determine a target transfer function value of the cable based on the target current signal and the calibration electric field signal.

2. The system according to claim 1, wherein: The computer device is configured to obtain, for each of the polarization directions, a maximum induced current at the same output frequency point based on the induced current test curves corresponding to the multiple target current signals, and determine, based on the maximum induced current and the third electric field strength at the same output frequency point, an initial transfer function value corresponding to each of the output frequencies at the same polarization direction; The maximum value of each of the initial transfer function values under different polarization directions is used as the target transfer function value of the cable at each of the output frequency points; wherein the third electric field strength is determined according to the electric field strength spectrum curve corresponding to the calibration electric field signal.

3. The system according to claim 1 or 2, characterized in that The system further includes a power amplifier; the power amplifier is connected to the signal analyzer and the transmitting antenna; The power amplifier is used to amplify the low-level swept-frequency signal output by the signal analyzer and send the amplified low-level swept-frequency signal to the transmitting antenna.

4. The system according to claim 1 or 2, characterized in that The system further includes an optical fiber transmission device, which includes an optical fiber transmitting end and an optical fiber receiving end, wherein the optical fiber transmitting end is connected to the receiving antenna or the current clamp, and the optical fiber receiving end is connected to the signal analyzer; The optical fiber transmitting end is used to convert the target current signal sent by the current caliper and the initial electric field signal sent by the receiving antenna into an optical signal; The optical fiber receiving end is used to convert the optical signal into an electrical signal and send it to a signal analyzer, so as to send the target current signal and the initial electric field signal to the signal analyzer.

5. The system according to claim 4, characterized in that The electronic device under test includes a plurality of cables, the transceiver device includes a plurality of current clamps, and the cables and the current clamps are connected in a one-to-one correspondence; the optical fiber transmitting end includes a plurality of input channels, and the plurality of input channels are connected to corresponding current clamps, and the optical fiber receiving end is connected to the computer device; The computer device is further configured to control the optical fiber receiving end to switch the input channel, thereby determining a target current caliper from the plurality of current calipers.

6. A low-level sweep current test method, characterized in that: The method is applied to a computer device in a low-level swept current test system according to any one of claims 1 to 5, and the method comprises: Control the signal analyzer to send a low-level sweep frequency signal to the transceiver based on multiple output frequency points; Receive multiple target current signals and initial electric field signals at each test position in the test area sent by the signal analyzer; wherein the multiple target current signals are obtained by the transmitting antenna radiating electromagnetic waves based on the low-level swept frequency signal, the current caliper detecting the induced current of the cable in the electronic device under test under the electromagnetic waves, and the signal analyzer automatically following the output frequency point to receive the signals from the current caliper; the initial electric field signals are obtained by the receiving antenna receiving the electromagnetic waves and sending them to the signal analyzer; determining, based on an electric field intensity spectrum curve corresponding to the initial electric field signal at each of the test positions, a multipath reflection result of the test area and a first electric field intensity at each of the test positions; and using any of the initial electric field signals as a calibration electric field signal if the multipath reflection result indicates that no multipath reflection phenomenon exists within the test area and a difference in the first electric field intensity at each of the test positions is less than a preset intensity difference; In a case where the multipath reflection junction indicates that a multipath reflection phenomenon exists in the test area, determining a time domain gate start time and a time domain gate end time of the signal analyzer according to a first time when the direct wave of the electromagnetic wave reaches the signal analyzer and a second time when the reflected wave of the electromagnetic wave reaches the signal analyzer; the first time and the second time are determined by the signal analyzer according to the initial electric field signal and sent to the computer device; Determining the second electric field strength of each test position based on an electric field strength spectrum curve corresponding to each intermediate electric field signal, and using any of the intermediate electric field signals as the calibration electric field signal when a difference between the second electric field strengths is less than a preset strength difference; the intermediate electric field signal is obtained by filtering the electric field signal corresponding to the reflected wave in each of the initial electric field signals by the signal analyzer according to the start time and the end time of the time domain gate; A target transfer function value of a cable in the electronic device under test is determined according to the plurality of target current signals and the calibration electric field signal.

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