PCB chip testing equipment

Abstract

The invention discloses a device for testing a PCB chip, relates to the field of devices for testing a PCB chip, solves the problem that it is difficult for an existing PCB chip testing device to automatically clamp and detect chips in different placement states when in use, comprises a machine body, a conveying mechanism, a testing mechanism and an opening and closing mechanism, wherein a first detection frame and a second detection frame are arranged in the machine body, the conveying mechanism comprises a supporting plate and a conveyor belt, and the testing mechanism comprises a testing probe. The invention inputs a PCB chip to a set position for testing through a conveyor belt, drives the first detection frame to move downward through the testing mechanism, so that the testing probe on the upper side tests the top surface of the PCB chip, and when no detection is possible, continues to push the PCB chip and the supporting plate to move downward, controls the supporting plate to slide and open to both sides, and stops continuing to open after the PCB chip slides to the edge position of the supporting plate, until the bottom surface of the PCB chip is detected by the testing probe on the second detection frame, thereby improving the testing efficiency.

Description

Technical Field

[0001] The invention relates to the technical field of equipment for PCB chip testing, in particular to equipment for PCB chip testing. Background Art

[0002] PCB, also known as printed circuit board, is an important electronic component, a support for electronic components, and a carrier for electrical connection of electronic components. Because it is made by electronic printing, it is called a "printed" circuit board. After the PCB chip is produced, its operating performance and functional integrity need to be tested. The upper and lower surface structures of the PCB chip are different, so during the test, one end of its pin needs to be connected to the power supply.

[0003] The detection position of the existing PCB chip testing equipment is relatively fixed. When in use, there are certain requirements for the placement direction of the PCB chip. The PCB chips placed in a fixed direction need to be transported to the inside of the equipment in an orderly manner for detection operations. When the direction is opposite, the detection equipment cannot directly perform chip testing. It is necessary to flip the equipment or manually assist in flipping before continuing the detection. This greatly reduces the efficiency of the test and also increases the requirements for the placement of the chip during the input process. The use is not convenient and efficient enough. Summary of the invention

[0004] The purpose of the present invention is to provide a PCB chip testing device that is convenient for improving the efficiency of PCB chip placement, transportation and detection, so as to solve the problems raised in the above-mentioned background technology.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a device for testing PCB chips, comprising a machine body, a conveying mechanism, a testing mechanism and an opening and closing mechanism, wherein a first detection frame and a second detection frame are arranged in the machine body, the first detection frame is located above the second detection frame, the conveying mechanism comprises two groups of support plates installed in the machine body, the two groups of support plates are respectively connected with conveyor belts for driving, and are used to input PCB chips to the middle position between the first detection frame and the second detection frame through the conveyor belts for subsequent testing operations, and the testing mechanism comprises a plurality of groups of test probes installed on the bottom surface of the first detection frame and the top surface of the second detection frame, and are used to move the first detection frame downward, The test probe on the upper side tests the top surface of the PCB chip. When detection is impossible, the PCB chip and the support plate are continuously pushed downward until the bottom surface of the PCB chip contacts and detects the test probe on the second detection frame. The opening and closing mechanism is installed in the body and is used to gradually control the support plate to slide and open to both sides when the support plate moves downward, and stop opening after the PCB chip slides to the edge of the support plate, so as to avoid the test point being blocked by the support plate when testing the bottom surface of the PCB chip. At the same time, it can also ensure stable support and transportation of PCB chips of different sizes, so as to improve the efficiency of PCB chip placement, transportation and detection.

[0006] Preferably, the conveying mechanism also includes two groups of mounting frames fixedly installed inside the machine body, the mounting frames are fixedly connected with fixed tubes, a lifting tube is slidably connected inside the fixed tube along the vertical direction, a control tube is fixedly connected to the bottom of the lifting tube, the bottom end of the control tube is connected to the first pipeline, the outer wall of the first pipeline is fixedly connected with a lifting frame, the support plate is slidably connected to the inner wall of the lifting frame along the horizontal direction, and the top surface of the control tube is fixedly connected with a first tension spring fixedly connected to the outer wall of the top end of the fixed tube, so as to stably maintain the support plates on both sides in a position between the first detection frame and the second detection frame, and can also move downward as the PCB chip moves downward.

[0007] Preferably, the opening and closing mechanism also includes a first spring fixedly mounted on a side surface of the lifting frame, one end of the first spring is fixedly connected to a side surface of the support plate, a second pipe connected to the first pipe is fixedly connected to the side surface of the support plate, an outer wall of the second pipe is slidably connected to an inner wall of the first pipe in a horizontal direction, and a control member for controlling the connection state between the lifting pipe and the first pipe is provided in the control pipe, so that when the support plate moves downward, the support plate is gradually controlled to slide and open to both sides, and the continued opening state is stopped after the PCB chip slides to the edge position of the support plate, so as to avoid the test point being blocked by the support plate when testing the bottom surface of the PCB chip, and at the same time, it can also ensure stable support and transportation of PCB chips of different sizes.

[0008] Preferably, the control member includes a rotating column rotatably connected to the inner wall of the control tube, the rotating column is provided with a through hole that can be connected to the lifting tube and the first pipeline, the side of the rotating column is coaxially fixedly connected with a gear column, the support plate is fixedly connected with a device box, a sliding groove is provided in the device box, a rack meshing with the gear column is slidably connected in the sliding groove along the vertical direction, the bottom end of the rack is fixedly connected to the second tension spring fixedly connected to the sliding groove, and the support plate is provided with a trigger member for controlling the lifting state of the rack, so as to control the connection state of the lifting tube and the first pipeline.

[0009] Preferably, the trigger member includes a trigger rod installed on the upper side of the edge position of the support plate, a lifting groove is provided on the support plate, the trigger rod is slidably connected to the inner wall of the lifting groove along the vertical direction, and a second spring fixedly connected to the lifting groove is fixedly connected to the bottom surface of the trigger rod, and a third pipe for connecting the lifting groove and the sliding groove is provided on the support plate and the device box, and a reset member is provided on the device box for assisting the support plate to reset to the bottom position of the PCB chip for transportation when the device box moves upward, so as to facilitate controlling the lifting state of the rack.

[0010] Preferably, the reset member includes a slope block fixedly mounted on the mounting frame, and the upper side of the device box is provided with an inclined surface that can slide in accordance with the slope position of the slope block, so as to assist the support plate in resetting to the bottom position of the PCB chip for transportation when the device box moves upward.

[0011] Preferably, the testing mechanism also includes two groups of sliding boxes which are respectively connected to the inner walls of the first detection frame and the second detection frame in a horizontal direction for sliding sliding, and the sliding boxes are fixedly connected with test cards for replacement and use for different chips and different test items, and the sides of the sliding boxes are fixedly connected with docking plugs which can be docked with the first detection frame and the second detection frame so that the test card is electrically connected to the test probe, so that the first detection frame can be moved downward so that the test probe on the upper side can test the top surface of the PCB chip. When detection is impossible, the PCB chip and the support plate are continued to be pushed downward until the bottom surface of the PCB chip is detected by the test probe on the second detection frame.

[0012] Preferably, a scissor lift is fixedly connected to the top of the inner wall of the body, and the lifting end of the scissor lift is fixedly connected to the top surface of the first detection frame, so as to drive the first detection frame to rise and fall while lowering the overall height of the equipment.

[0013] Preferably, the conveying mechanism also includes a driving motor fixedly mounted on the support plate, and two groups of driving rollers are rotatably connected to the support plate. The inner wall of the conveyor belt is transmission-connected to the outer walls of the two groups of driving rollers, and the output end of the driving motor is coaxially and fixedly connected to any group of the driving rollers, so as to facilitate the input of the PCB chip into the middle position between the first detection frame and the second detection frame for subsequent testing operations.

[0014] Preferably, a conveying port for inputting and outputting PCB chips is opened on the side of the machine body, so as to facilitate the inputting and outputting of PCB chips.

[0015] Compared with the prior art, the present invention has the following beneficial effects:

[0016] The present invention provides a PCB chip testing device, which solves the problem that the existing PCB chip testing device is difficult to automatically clamp and detect chips in different placement states when in use. The PCB chip is input to the middle position of the first detection frame and the second detection frame through a conveyor belt for subsequent testing operations, and the first detection frame is driven to move downward by a testing mechanism so that the test probe on the upper side tests the top surface of the PCB chip. When the test fails, the PCB chip and the support plate are continuously pushed downward until the bottom surface of the PCB chip contacts the test probe on the second detection frame for detection. When the support plate moves downward, the support plate is gradually controlled to slide to both sides through an opening and closing mechanism. The device is automatically opened, and stops opening after the PCB chip slides to the edge of the support plate, so as to avoid the test point being blocked by the support plate when testing the bottom surface of the PCB chip. At the same time, it can also ensure the stable support and transportation of PCB chips of different sizes. When in use, the device gives priority to controlling the interference test on the upper side of the PCB chip. When the test can be completed, the test is directly completed and output is performed without subsequent flipping and lifting operations, which greatly improves the test efficiency. When the surface to be tested is on the lower side of the PCB chip, the PCB chip can be pushed down to complete the test without flipping, and the detection is efficient and convenient. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0018] Figure 2 It is a schematic diagram of the internal structure of the machine body of the present invention;

[0019] Figure 3 It is a schematic diagram of the local structure of the testing mechanism of the present invention;

[0020] Figure 4 It is a schematic diagram of the local structure of the conveying mechanism of the present invention;

[0021] Figure 5 It is a partial structural schematic diagram of the opening and closing mechanism of the present invention;

[0022] Figure 6 for Figure 5 A magnified image of the middle A area;

[0023] Figure 7 It is a partial structural cross-sectional view of the opening and closing mechanism of the present invention;

[0024] Figure 8 for Figure 7 Enlarged view of area B;

[0025] Fig. 9 It is an exploded view of the local structure of the testing mechanism of the present invention.

[0026] In the figure: 1, machine body; 2, first detection frame; 3, second detection frame; 4, support plate; 5, conveyor belt; 6, test probe; 7, mounting frame; 8, fixed tube; 9, lifting tube; 10, control tube; 11, first pipeline; 12, lifting frame; 13, first tension spring; 14, first spring; 15, second pipeline; 16, rotating column; 17, through hole; 18, gear column; 19, device box; 20, sliding groove; 21, rack; 22, trigger rod; 23, lifting groove; 24, second spring; 25, third pipeline; 26, slope block; 27, inclined plane; 28, sliding box; 29, test card; 30, docking plug; 31, scissor lift; 32, drive motor; 33, drive roller; 34, conveying port; 35, second tension spring; 36, PCB chip. DETAILED DESCRIPTION

[0027] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0028] Example 1: Please refer to Figure 1-Figure 9 The PCB chip testing device shown in the figure includes a body 1, a conveying mechanism, a testing mechanism and an opening and closing mechanism. A first detection frame 2 and a second detection frame 3 are arranged in the body 1, and the first detection frame 2 is located above the second detection frame 3. The conveying mechanism includes two groups of support plates 4 installed in the body 1, and the two groups of support plates 4 are respectively connected with conveyor belts 5 for transmitting the PCB chip 36 to the middle position of the first detection frame 2 and the second detection frame 3 through the conveyor belt 5 for subsequent testing operations. The testing mechanism includes multiple groups of test probes 6 installed on the bottom surface of the first detection frame 2 and the top surface of the second detection frame 3, which are used to move the first detection frame 2 downward so that the upper detection frame 2 is opened. The side test probe 6 tests the top surface of the PCB chip 36. When it cannot be detected, the PCB chip 36 and the support plate 4 are continued to be pushed downward until the bottom surface of the PCB chip 36 is detected by the test probe 6 on the second detection frame 3. The opening and closing mechanism is installed in the body 1, and is used to gradually control the support plate 4 to slide and open to both sides when the support plate 4 moves downward, and stop continuing to open after the PCB chip 36 slides to the edge position of the support plate 4, so as to avoid the test point being blocked by the support plate 4 when testing the bottom surface of the PCB chip 36, and at the same time, it can also ensure stable support and transportation of PCB chips 36 of different sizes.

[0029] The conveying mechanism also includes two sets of mounting frames 7 fixedly installed inside the machine body 1, a fixed tube 8 is fixedly connected to the mounting frame 7, a lifting tube 9 is slidably connected in the fixed tube 8 along the vertical direction, a control tube 10 is fixedly connected to the bottom of the lifting tube 9, the bottom end of the control tube 10 is connected to the first pipeline 11, a lifting frame 12 is fixedly connected to the outer wall of the first pipeline 11, the support plate 4 is slidably connected to the inner wall of the lifting frame 12 along the horizontal direction, and the top surface of the control tube 10 is fixedly connected to the first tension spring 13 fixedly connected to the outer wall of the top end of the fixed tube 8.

[0030] The testing mechanism also includes two sets of sliding boxes 28 that are respectively connected to the inner walls of the first detection frame 2 and the second detection frame 3 in a horizontal direction for sliding. A test card 29 that is replaced and used for different test items of different chips is fixedly connected inside the sliding box 28. A docking plug 30 that can be docked with the first detection frame 2 and the second detection frame 3 so that the test card 29 is electrically connected to the test probe 6 is fixedly connected to the side of the sliding box 28. A scissor lift 31 is fixedly connected to the top of the inner wall of the body 1, and the lifting end of the scissor lift 31 is fixedly connected to the top surface of the first detection frame 2.

[0031] The conveying mechanism also includes a driving motor 32 fixedly mounted on the support plate 4. The driving motor 32 is preferably a LD60 micro motor. Two groups of driving rollers 33 are rotatably connected to the support plate 4. The inner wall of the conveyor belt 5 is transmission-connected to the outer walls of the two groups of driving rollers 33. The output end of the driving motor 32 is coaxially fixedly connected to any group of driving rollers 33. A conveying port 34 for inputting and outputting PCB chips 36 is provided on the side of the body 1.

[0032] In this embodiment, a suitable test card 29 is selected according to the type of PCB chip and the test items to be tested, the sliding box 28 is pulled out, and the test card 29 is installed in the sliding boxes 28 on the upper and lower sides respectively, and the sliding box 28 is pushed in so that the docking plug 30 on the upper side is docked with the first detection frame 2, and the docking plug 30 on the lower side is docked with the second detection frame 3, and the installation preparation work of the equipment is completed. Conversely, the test card 29 can be replaced by pulling out the sliding box 28, and the operation is convenient and efficient.

[0033] The PCB chip 36 to be tested is conveyed to the conveyor belt 5 in the conveying port 34 through existing mechanisms such as a conveyor belt or a robotic arm. The bottom surfaces of both ends of the PCB chip 36 are placed on the conveyor belts 5 on both sides. The driving motor 32 drives the driving roller 33 to rotate, so that the conveyor belt 5 transfers the PCB chip 36 to the middle position, and the scissor lift 31 is started to push the first detection frame 2 on the upper side to move downward. The bottom end of the test probe 6 on the upper side contacts the top surface of the PCB chip 36 for detection. When the test surface of the PCB chip 36 faces upward, the detection can be completed directly at this time, and the support plate 4 will not be pushed down further. After the test is completed, the conveyor belt 5 can output the PCB chip 36.

[0034] When the test surface of the PCB chip 36 is facing downward at this time, the test probe 6 on the upper side cannot detect the corresponding value, and the scissor lift 31 will be controlled to push the first detection frame 2 to continue to move downward, and the PCB chip 36 and the support plate 4 will be pushed downward synchronously, triggering the operation of the opening and closing mechanism, so that the support plate 4 opens to both sides, the first tension spring 13 is stretched, and the lifting tube 9 moves downward in the fixed tube 8 until the bottom surface of the PCB chip 36 conflicts with the test probe 6 on the lower side, and the performance of the PCB chip 36 is tested by the test probe 6 on the lower side. The opening and closing mechanism will control the PCB chip 36 to stop continuing to open after sliding to the edge position of the support plate 4, so as to avoid the test point being blocked by the support plate 4 when testing the bottom surface of the PCB chip 36, and at the same time, it can also ensure stable support and transportation of PCB chips 36 of different sizes.

[0035] After the test is completed, the scissor lift 31 is controlled to drive the first detection frame 2 to move up and reset. At the same time, under the action of the first tension spring 13, the control tube 10 is driven to make the first pipe 11, the lifting frame 12 and the support plate 4 move up together, so that the PCB chip 36 can be lifted up to the conveying position again for output. When in use, the device gives priority to controlling the interference test on the upper side of the PCB chip 36. When the test can be completed, the test is directly completed and the output is completed without subsequent flipping and lifting operations, which greatly improves the test efficiency. When the surface to be tested is on the lower side of the PCB chip 36, the PCB chip 36 can be pushed down to complete the test without flipping operations. The detection is efficient and convenient.

[0036] Example 2: Please refer to Figure 1-Figure 8 This embodiment further illustrates the first embodiment. The opening and closing mechanism shown in the figure also includes a first spring 14 fixedly installed on the side of the lifting frame 12. One end of the first spring 14 is fixedly connected to the side of the support plate 4. The side of the support plate 4 is fixedly connected with a second pipe 15 connected to the first pipe 11. The outer wall of the second pipe 15 is slidably connected to the inner wall of the first pipe 11 in the horizontal direction. A control member for controlling the communication state between the lifting pipe 9 and the first pipe 11 is provided in the control pipe 10.

[0037] The control component includes a rotating column 16 rotatably connected to the inner wall of the control tube 10, and a through hole 17 that can communicate with the lifting tube 9 and the first pipeline 11 is opened on the rotating column 16. A gear column 18 is coaxially fixedly connected to the side of the rotating column 16. A device box 19 is fixedly connected to the support plate 4, and a sliding groove 20 is opened in the device box 19. A rack 21 meshing with the gear column 18 is slidably connected in the sliding groove 20 along the vertical direction. The bottom end of the rack 21 is fixedly connected to the second tension spring 35 fixedly connected to the sliding groove 20, and a trigger component for controlling the lifting state of the rack 21 is provided on the support plate 4.

[0038] The trigger member includes a trigger rod 22 installed on the upper side of the edge position of the support plate 4, a lifting groove 23 is provided on the support plate 4, the trigger rod 22 is slidably connected to the inner wall of the lifting groove 23 along the vertical direction, and the bottom surface of the trigger rod 22 is fixedly connected to a second spring 24 fixedly connected to the lifting groove 23, and a third pipe 25 for connecting the lifting groove 23 and the sliding groove 20 is provided on the support plate 4 and the device box 19. A reset member is provided on the device box 19 for assisting the support plate 4 to reset to the bottom position of the PCB chip 36 for transportation when the device box 19 moves up, and the reset member includes a slope block 26 fixedly installed on the mounting frame 7, and an inclined surface 27 that can slide in accordance with the slope position of the slope block 26 is provided on the upper side of the device box 19.

[0039] In this embodiment, when the first detection frame 2 pushes the PCB chip 36 to move downward, the PCB chip 36 pushes the support plate 4 to move downward, the support plate 4 drives the lifting frame 12 to move downward, and the lifting tube 9 slides down in the fixed tube 8, so that the space on the upper side of the control tube 10 increases, the air pressure decreases, and the linkage causes the air pressure in the first pipe 11 and the second pipe 15 to decrease, and the second pipe 15 is pulled toward the first pipe 11, thereby driving the support plate 4 to slide in the horizontal direction, so that the support plate 4 slides horizontally and opens during the downward movement until the contact position between the PCB chip 36 and the support plate 4 reaches the trigger rod 22. When the PCB chip 36 is on the upper side, the PCB chip 36 presses the trigger rod 22 downward, so that the gas in the lifting groove 23 is transported to the sliding groove 20 through the third pipe 25, pushing the rack 21 to move upward, and the rack 21 drives the gear column 18 to rotate, so that the through hole 17 on the rotating column 16 rotates to the side position, and the connection between the through hole 17 and the first pipe 11 and the lifting pipe 9 is released. After that, the support plate 4 continues to move downward. At this time, only the air pressure in the fixed pipe 8 is reduced, and the air pressure in the first pipe 11 below remains unchanged, then the support plate 4 will not continue to be pulled to the side, and the support plate 4 will only move vertically.

[0040] The device can automatically identify the edge position of the PCB chip 36. When the PCB chip 36 is supported by the trigger rod 22 of the support plate 4, it means that only the edge position of the bottom surface of the PCB chip 36 is supported, and the remaining middle position can be detected by the test probe 6 below. At the same time, the horizontal movement states of the support plates 4 on both sides are relatively independent. That is to say, when the position of the PCB chip 36 on the two groups of support plates 4 is not centered, the support plates 4 on both sides can be controlled to open and provide limited support after reaching the edge position.

[0041] When the detection is completed, the first detection frame 2 moves up to release the downward pressure on the top surface of the PCB chip 36. Under the pull of the first tension spring 13, the lifting frame 12 moves up, the air pressure in the fixed tube 8 is reduced, and after the support plate 4 moves to the set position, the position of the inclined surface 27 on the side of the device box 19 will conflict with the bottom surface of the slope block 26, pushing the device box 19 and the support plate 4 to slide horizontally and close. When the lifting frame 12 moves to the highest point, the PCB chip 36 is reset. At the same time, the support plates 4 on both sides also slide to the bottom of the PCB chip 36 again, and the PCB chip 36 falls on the conveyor belt 5 again, and the transmission output can be carried out through the rotation of the conveyor belt 5.

[0042] When the ramp block 26 pushes the device box 19 to slide horizontally and close, the PCB chip 36 gradually moves to the support plate 4, releasing the downward pressure on the top surface of the trigger rod 22. With the rebound of the second spring 24 and the pullback of the second tension spring 35, the rack 21 moves down and resets, and the rack 21 drives the gear column 18 to rotate in the opposite direction, so that the through hole 17 on the rotating column 16 rotates to a vertical state again, connecting the bottom end of the lifting tube 9 with the top end of the first pipe 11, so that the air pressure in the lifting tube 9 and the first pipe 11 is restored to balance.

[0043] It is worth noting that: by setting the gear column 18, during the horizontal sliding of the support plate 4 and the device box 19, the rack 21 can always mesh with the gear column 18 as the device box 19 moves horizontally, and the rack 21 is only raised and lowered when the trigger rod 22 is pressed down, driving the gear column 18 to rotate. This structure is stable in operation and easy to operate. In order to increase the driving force, the fixed tube 8 and the lifting groove 23 can be filled with hydraulic oil, and the above-mentioned pneumatic drive can be replaced by hydraulic drive.

[0044] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0045] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. PCB chip testing equipment, characterized in that, include: A machine body (1), wherein a first detection frame (2) and a second detection frame (3) are provided in the machine body (1), and the first detection frame (2) is located above the second detection frame (3); Also includes: A conveying mechanism, the conveying mechanism comprising two groups of support plates (4) installed in the machine body (1), the two groups of support plates (4) being respectively connected to a conveyor belt (5) for conveying the PCB chip to a middle position between the first detection frame (2) and the second detection frame (3) via the conveyor belt (5) for subsequent testing operations; A testing mechanism, the testing mechanism comprising a plurality of test probes (6) mounted on the bottom surface of the first detection frame (2) and the top surface of the second detection frame (3), and used to move the first detection frame (2) downward so that the test probes (6) on the upper side test the top surface of the PCB chip, and when the test fails, continue to push the PCB chip and the support plate (4) downward until the bottom surface of the PCB chip and the test probes (6) on the second detection frame (3) are in contact with each other for detection; An opening and closing mechanism is installed in the body (1) and is used to gradually control the support plate (4) to slide and open to both sides when the support plate (4) moves downward, and to stop the continued opening state after the PCB chip slides to the edge position of the support plate (4), so as to avoid the test point being blocked by the support plate (4) when testing the bottom surface of the PCB chip, and at the same time ensure stable support and transportation of PCB chips of different sizes.

2. The device for testing PCB chips according to claim 1, characterized in that: The conveying mechanism further comprises two groups of mounting frames (7) fixedly mounted inside the machine body (1); a fixing tube (8) is fixedly connected to the mounting frame (7); a lifting tube (9) is slidably connected inside the fixing tube (8) in a vertical direction; a control tube (10) is fixedly connected to the bottom of the lifting tube (9); the bottom end of the control tube (10) is connected to a first pipeline (11); a lifting frame (12) is fixedly connected to the outer wall of the first pipeline (11); the support plate (4) is slidably connected to the inner wall of the lifting frame (12) in a horizontal direction; and a first tension spring (13) fixedly connected to the outer wall of the top end of the fixing tube (8) is fixedly connected to the top surface of the control tube (10).

3. The device for testing PCB chips according to claim 2, characterized in that: The opening and closing mechanism further comprises a first spring (14) fixedly mounted on a side surface of the lifting frame (12); one end of the first spring (14) is fixedly connected to a side surface of the support plate (4); a second pipe (15) connected to the first pipe (11) is fixedly connected to the side surface of the support plate (4); an outer wall of the second pipe (15) is slidably connected to an inner wall of the first pipe (11) in a horizontal direction; and a control member for controlling the connection state between the lifting pipe (9) and the first pipe (11) is provided in the control pipe (10).

4. The device for testing PCB chips according to claim 3, characterized in that: The control member comprises a rotating column (16) rotatably connected to the inner wall of the control tube (10); a through hole (17) capable of communicating with the lifting tube (9) and the first pipe (11) is formed on the rotating column (16); a gear column (18) is coaxially fixedly connected to the side of the rotating column (16); a device box (19) is fixedly connected to the support plate (4); a sliding groove (20) is formed in the device box (19); a rack (21) meshing with the gear column (18) is slidably connected in the sliding groove (20) in a vertical direction; a second tension spring (35) fixedly connected to the sliding groove (20) is fixedly connected to the bottom end of the rack (21); and a trigger member for controlling the lifting state of the rack (21) is provided on the support plate (4).

5. The device for testing PCB chips according to claim 4, characterized in that: The trigger member comprises a trigger rod (22) mounted on the upper side of the edge of the support plate (4); a lifting groove (23) is provided on the support plate (4); the trigger rod (22) is slidably connected to the inner wall of the lifting groove (23) in a vertical direction; a second spring (24) fixedly connected to the lifting groove (23) is fixedly connected to the bottom surface of the trigger rod (22); a third pipe (25) for connecting the lifting groove (23) and the sliding groove (20) is provided on the support plate (4) and the device box (19); and a reset member for assisting the support plate (4) to reset to the bottom position of the PCB chip for conveying when the device box (19) moves upward is provided on the device box (19).

6. The device for testing PCB chips according to claim 5, characterized in that: The resetting member comprises a slope block (26) fixedly mounted on the mounting frame (7), and an upper side of the device box (19) is provided with an inclined surface (27) capable of slidingly fitting with the slope position of the slope block (26).

7. The device for testing PCB chips according to claim 1, characterized in that: The test mechanism further comprises two sets of sliding boxes (28) respectively connected to the inner walls of the first detection frame (2) and the second detection frame (3) in a horizontal sliding direction, wherein a test card (29) for replacing and using different chips and different test items is fixedly connected inside the sliding box (28), and a docking plug (30) capable of docking with the first detection frame (2) and the second detection frame (3) is fixedly connected to the side of the sliding box (28).

8. The device for testing PCB chips according to claim 1, characterized in that: A scissor lift (31) is fixedly connected to the top of the inner wall of the machine body (1), and a lifting end of the scissor lift (31) is fixedly connected to the top surface of the first detection frame (2).

9. The device for testing PCB chips according to claim 1, characterized in that: The conveying mechanism further comprises a driving motor (32) fixedly mounted on the support plate (4); two groups of driving rollers (33) are rotatably connected to the support plate (4); the inner wall of the conveyor belt (5) is drivingly connected to the outer walls of the two groups of driving rollers (33); and the output end of the driving motor (32) is coaxially fixedly connected to any one group of the driving rollers (33).

10. The device for testing PCB chips according to claim 1, characterized in that: A conveying port (34) for inputting and outputting PCB chips is provided on the side of the machine body (1).

Images