Uplink error correction method, apparatus and computer-readable storage medium

Abstract

A method, device, and computer-readable storage medium for improving uplink bit errors. The method comprises: for each PON interface of an OLT device, determining a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period from the ONUs connected to the PON interface; for each target ONU, determining a range of parameters to be measured; determining a target parameter for improving the uplink bit error rate of the target ONU from the range of parameters to be measured; and configuring the uplink receiving parameters corresponding to the target ONU based on the target parameter. The present application solves the uplink bit error problem by automatically adjusting the receiving parameters on the OLT side, effectively reducing the expenditure of manpower and material resources and improving efficiency; in addition, for each target ONU, appropriate uplink receiving parameters are configured on the OLT side, thereby enhancing the adaptability and compatibility of the OLT with different target ONUs.

Description

Technical Field

[0001] This application relates to the field of optical communication technology, specifically to an uplink bit error rate improvement method, apparatus, and computer-readable storage medium. Background Technology

[0002] In the field of optical communication, a PON (Passive Optical Network) system consists of an OLT (Optical Line Terminal), an ODN (Optical Distribution Network), and an ONU (Optical Network Unit).

[0003] As a central office device, the OLT (Optical Line Terminal) needs to manage a large number of ONUs (Optical Network Units) on each of its PON ports. However, due to some adverse factors, uplink bit error rates from ONUs to the OLT in the PON system can occur. These adverse factors include:

[0004] The current optical link environment is complex, requiring the use of multiple levels of optical splitters and connectors, which can easily lead to fiber end-face contamination or fiber bending, resulting in optical link degradation. There are various models of ONUs in the current network, and the optical modules or optical transmitter and receiver components used have different performance. After long-term operation, ONUs and OLTs and other equipment will age to a certain extent.

[0005] For the uplink bit error problem from ONU to OLT in a PON system, the existing solution is mainly to have maintenance personnel analyze the bit error statistics of the PON interface to locate the specific ONU with serious bit error problems, and then arrange for maintenance personnel to check the optical link environment where the ONU is located or replace the equipment until the bit error problem is improved.

[0006] The above solutions require manual intervention to adjust the optical path environment or equipment, and they start from the ODN or ONU side, attempting to resolve uplink bit error rate issues by adjusting the optical link environment. However, due to the complexity of the existing network environment and the diversity of ONU types, the above methods are extremely resource-intensive and inefficient. Summary of the Invention

[0007] This application provides an uplink error correction method, apparatus, and computer-readable storage medium, which can solve the technical problem that the solutions used in the prior art to solve the uplink error problem require a lot of manpower and material resources and are inefficient.

[0008] In a first aspect, embodiments of this application provide an uplink error rate improvement method, the uplink error rate improvement method comprising:

[0009] For each PON interface of the OLT device, identify the target ONU whose uplink bit error rate is greater than the first bit error rate within the statistical period from the ONUs connected to the PON interface;

[0010] For each target ONU, determine the range of parameters to be measured;

[0011] Determine the target parameters for improving the uplink bit error rate of the target ONU from the range of parameters to be tested;

[0012] Configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

[0013] In conjunction with the first aspect, in one implementation, before determining the target parameter for improving the uplink bit error rate of the target ONU from the range of parameters to be tested, the method further includes:

[0014] For each target ONU, check whether the transmitted optical power of the target ONU is within the preset range;

[0015] If it is not within the preset range, the transmit optical power of the target ONU will be adjusted to the preset range.

[0016] In conjunction with the first aspect, in one implementation, determining the target parameter from the range of parameters to be tested for improving the uplink bit error rate of the target ONU includes:

[0017] Select a set of unselected parameters from the range of parameters to be tested, and adjust the uplink receiving parameters based on the selected set of parameters to be tested;

[0018] Multiple test authorization data frames are sent to the target ONU so that the target ONU can send back an uplink data frame containing a specific data code within the time slot window specified in each test authorization data frame;

[0019] The bit error rate of the uplink data frames fed back by the target ONU is statistically analyzed to obtain the bit error rate corresponding to a set of parameters to be tested.

[0020] By analogy, we can iterate through all the parameters to be tested within the range of the parameters to be tested and obtain the bit error rate corresponding to each group of parameters to be tested.

[0021] If the minimum bit error rate among multiple bit error rates is less than the second bit error rate, then the parameter to be tested corresponding to the minimum bit error rate is taken as the target parameter, wherein the second bit error rate is less than or equal to the first bit error rate.

[0022] In conjunction with the first aspect, in one implementation, determining the target parameter for improving the uplink bit error rate of the target ONU from the range of parameters to be tested further includes:

[0023] Select a set of unselected parameters from the range of parameters to be tested, and adjust the uplink receiving parameters based on the selected set of parameters to be tested;

[0024] Multiple test authorization data frames are sent to the target ONU so that the target ONU can send back an uplink data frame containing a specific data code within the time slot window specified in each test authorization data frame;

[0025] The bit error rate of the uplink data frames fed back by the target ONU is statistically analyzed to obtain the bit error rate corresponding to a set of parameters to be tested.

[0026] Detect whether the bit error rate is less than a third bit error rate, wherein the third bit error rate is less than the second bit error rate;

[0027] If it is less than the third bit error rate, then the selected set of test parameters shall be used as the target parameters;

[0028] If it is not less than the third bit error rate, then check whether all the parameters to be tested included in the range of the parameters to be tested have been traversed.

[0029] If the traversal is not completed, return to the step of selecting a set of unselected test parameters from the range of test parameters, and adjust the uplink receiving parameters based on the selected set of test parameters.

[0030] In conjunction with the first aspect, in one implementation, after determining whether all parameters to be tested within the range of parameters to be tested have been traversed if the error rate is not less than the third bit error rate, the method further includes:

[0031] If the traversal has been completed, determine the minimum bit error rate from the multiple bit error rates;

[0032] If the minimum bit error rate is less than the second bit error rate, then the parameter to be tested corresponding to the minimum bit error rate is used as the target parameter.

[0033] In conjunction with the first aspect, in one implementation, the test authorization data frame is sent by reusing reserved fields in the standard protocol or expanding the range of standard field data values ​​in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0034] In conjunction with the first aspect, in one implementation, after determining the range of parameters to be measured for each target ONU, the method further includes:

[0035] When there are no target parameters in the range of parameters to be tested that can be used to improve the uplink bit error rate of the target ONU, an operation and maintenance message is sent to the operation and maintenance terminal. The operation and maintenance message contains the identity information of the target ONU.

[0036] In conjunction with the first aspect, in one implementation, determining the range of parameters to be measured for each target ONU includes:

[0037] Determine the optical module type of the target ONU and the optical module type of the OLT equipment;

[0038] The range of parameters to be measured is determined based on the optical module type of the target ONU and the optical module type of the OLT device.

[0039] Secondly, embodiments of this application provide an uplink bit error rate improvement device, the uplink bit error rate improvement device comprising:

[0040] The first determination module is used to determine, for each PON interface of the OLT device, the target ONU whose uplink bit error rate is greater than the first bit error rate from the ONUs connected to the PON interface.

[0041] The second determination module is used to determine the range of parameters to be measured for each target ONU;

[0042] The third determination module is used to determine the target parameters for improving the uplink bit error rate of the target ONU from the range of parameters to be tested;

[0043] The configuration module is used to configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

[0044] Thirdly, embodiments of this application provide a computer-readable storage medium storing an uplink error correction program, wherein when the uplink error correction program is executed by a processor, it implements the steps of the uplink error correction method as described in the first aspect.

[0045] The beneficial effects of the technical solutions provided in this application include:

[0046] In this embodiment, for each PON interface of the OLT device, a target ONU with an uplink bit error rate greater than a first bit error rate within a statistical period is determined from the ONUs connected to the PON interface. For each target ONU, a range of parameters to be tested is determined. From the range of parameters to be tested, target parameters for improving the uplink bit error rate of the target ONU are determined. Based on the target parameters, the uplink receiving parameters corresponding to the target ONU are configured. Through this embodiment, the target parameters for improving the uplink bit error rate of the target ONU are automatically determined, thereby configuring the uplink receiving parameters corresponding to the target ONU. That is, the uplink bit error problem is solved by adjusting the receiving parameters on the OLT side, effectively reducing the expenditure of human and material resources and improving the efficiency of problem solving. In addition, for each target ONU, appropriate uplink receiving parameters are configured on the OLT side, enhancing the adaptability and compatibility of the OLT with different target ONUs. Attached Figure Description

[0047] Figure 1This is a flowchart illustrating an embodiment of the uplink error correction method of this application;

[0048] Figure 2 for Figure 1 A detailed flowchart of step S30 in the middle section;

[0049] Figure 3 for Figure 1 A schematic diagram of the second detailed process of step S30;

[0050] Figure 4 This is a functional module diagram of an embodiment of the uplink error correction device of this application;

[0051] Figure 5 This is a schematic diagram of the hardware structure of the uplink error correction device involved in the embodiments of this application. Detailed Implementation

[0052] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present application.

[0053] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0054] Firstly, embodiments of this application provide an uplink error rate improvement method.

[0055] In one embodiment, reference is made to Figure 1 , Figure 1 This is a flowchart illustrating the first embodiment of the uplink error correction method of this application. Figure 1 As shown, the methods for improving uplink bit error rate include:

[0056] Step S10: For each PON interface of the OLT device, determine the target ONU whose uplink bit error rate is greater than the first bit error rate from the ONUs connected to the PON interface.

[0057] In this embodiment, an OLT device often has multiple PON interfaces. Here, we will take one PON interface as an example for explanation.

[0058] For example, in GPON (Gigabit-Capable PON), 64 ONUs are connected to one PON port of the OLT equipment, labeled ONU1 to ONU64. The uplink bit error rate (BER) of each ONU is calculated within a statistical period to identify the target ONUs whose BER is greater than a first BER within that period. For instance, if the BER of ONU1 to ONU8 is greater than the first BER within the statistical period, then ONU1 to ONU8 are identified as the target ONUs.

[0059] In the telecommunications industry, the bit error rate (BER) is commonly used to determine the ratio of erroneous to normal bits in a given channel. A high BER indicates poor channel quality, impacting service transmission quality. BER statistics for ONUs are typically implemented in hardware; the specific implementation method depends on the hardware and can be referenced from conventional techniques, which are not limited here.

[0060] The first bit error rate is set based on actual needs and can be flexibly set according to different usage scenarios and requirements. For example, it can be set lower for dedicated line services and higher for ordinary Internet services or scenarios that are not sensitive to latency.

[0061] It is easy to understand that the above description is for one PON interface. Each PON interface of the OLT device can be processed in the same way, that is, to determine the target ONU among the ONUs connected to each PON interface.

[0062] Step S20: For each target ONU, determine the range of parameters to be measured;

[0063] Step S30: Determine the target parameter for improving the uplink bit error rate of the target ONU from the range of parameters to be tested;

[0064] Step S40: Configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

[0065] In this embodiment, if ONU1 to ONU8 are determined as target ONUs based on step S10, then steps S20 to S40 are executed for each target ONU. For example, the range of parameters to be tested corresponding to ONU1 is determined, then target parameters for improving the uplink bit error rate of ONU1 are determined from the range of parameters to be tested, and finally, the uplink receiving parameters corresponding to ONU1 are configured based on the target parameters. Improving the uplink bit error rate of ONU1 means reducing the uplink bit error rate of ONU1 to the expected value or below.

[0066] In engineering, the data output pins of the OLT optical module are generally directly connected to the PON Serdes pins of the PON MAC chip. The uplink receiving parameters referred to in this embodiment take the receiving parameters of PON Serdes as an example. Commonly used receiving parameters include: DC Offset Calibration, CTLE Peaking, and CTLE Bandwidth. Under different combinations of ONU and OLT optical modules, the types and ranges of parameters that need to be adjusted are flexible and can be determined according to the characteristics of the optical module and historical adaptation experience values.

[0067] Further, in one embodiment, step S20 includes:

[0068] Determine the optical module type of the target ONU and the optical module type of the OLT device; determine the range of the parameters to be measured based on the optical module type of the target ONU and the optical module type of the OLT device.

[0069] In this embodiment, the range of parameters to be measured corresponding to different combinations of optical module types of ONUs and optical module types of OLT devices are preset; based on this, the range of parameters to be measured can be determined according to the optical module type of the target ONU and the optical module type of the OLT device in combination with the preset correspondence.

[0070] In this embodiment, for each PON interface of the OLT device, a target ONU with an uplink bit error rate greater than a first bit error rate within a statistical period is determined from the ONUs connected to the PON interface. For each target ONU, a range of parameters to be tested is determined. From the range of parameters to be tested, target parameters for improving the uplink bit error rate of the target ONU are determined. Based on the target parameters, the uplink receiving parameters corresponding to the target ONU are configured. Through this embodiment, the target parameters for improving the uplink bit error rate of the target ONU are automatically determined, thereby configuring the uplink receiving parameters corresponding to the target ONU. That is, the uplink bit error problem is solved by adjusting the receiving parameters on the OLT side, effectively reducing the expenditure of human and material resources and improving the efficiency of problem solving. In addition, for each target ONU, appropriate uplink receiving parameters are configured on the OLT side, enhancing the adaptability and compatibility of the OLT with different target ONUs.

[0071] Furthermore, in one embodiment, before step S30, the method further includes:

[0072] For each target ONU, check whether the transmitted optical power of the target ONU is within the preset range;

[0073] If it is not within the preset range, the transmit optical power of the target ONU will be adjusted to the preset range.

[0074] In this embodiment, after determining the target ONU, the optical module type used by the PON interface to which the target ONU belongs is obtained, and the normal range of transmit optical power corresponding to the optical module type used by the PON interface is determined as the preset range. For each target ONU, the transmit optical power of the target ONU is read, and it is detected whether the transmit optical power of the target ONU is within the preset range; if it is not within the preset range, the transmit optical power of the target ONU is adjusted to the preset range.

[0075] In this embodiment, eliminating the impact of abnormal transmitted optical power on the uplink bit error rate before step S30 is beneficial for determining more suitable target parameters for the target ONU, thereby better reducing the uplink bit error rate of the target ONU.

[0076] Furthermore, in one embodiment, reference is made to Figure 2 , Figure 2 for Figure 1 A detailed flowchart of step S30. (See diagram below.) Figure 2 As shown, step S30 includes:

[0077] Step S3011: Select a set of unselected parameters from the range of parameters to be tested, and adjust the uplink receiving parameters based on the selected set of parameters to be tested.

[0078] In this embodiment, referring to the above embodiment regarding step S20, it can be seen that the combination of the optical module type of the ONU and the optical module type of the OLT device corresponds to the range of parameters to be measured. That is, the range of parameters to be measured is different in different scenarios.

[0079] For example, in one scenario, the parameter to be measured is DC Offset Calibration, and the corresponding range of the parameter to be measured is offset_a to offset_b. In this case, an unselected value offset_i is chosen from offset_a to offset_b as a set of parameters to be measured, and the DC offset calibration of the PON Serdes is set to offset_i.

[0080] In another scenario, the parameters to be measured are DC Offset Calibration, CTLE Peaking, and CTLE Bandwidth, corresponding to the ranges of offset_c~offset_d, peaking_c~peaking_d, and bw_a~bw_b. In this case, a value is selected from offset_c~offset_d, peaking_c~peaking_d, and bw_a~bw_b, namely offset_i, peaking_i, and bw_i, respectively, where offset_i, peaking_i, and bw_i are a combination that has not been selected before. The DC offset calibration of PON Serdes is set to offset_i, the CTLE peaking of PON Serdes is set to peaking_i, and the CTLE bandwidth of PON Serdes is set to bw_i.

[0081] In another scenario, the parameters to be measured are DC Offset Calibration and CTLE Peaking, with the corresponding ranges being offset_c to offset_d and peaking_c to peaking_d.

[0082] At this point, select one value from offset_c to offset_d and peaking_c to peaking_d respectively, namely offset_i and peaking_i, where offset_i and peaking_i are a combination that has not been selected before, and set the DC bias calibration of PON Serdes to offset_i and set the continuous-time linear equalizer peak of PON Serdes to peaking_i.

[0083] Step S3012: Send multiple test authorization data frames to the target ONU so that the target ONU can send back an uplink data frame containing a specific data code within the time slot window specified in each test authorization data frame;

[0084] Step S3013: Perform bit error rate statistics on the uplink data frames fed back by the target ONU to obtain the bit error rate corresponding to a set of parameters to be tested.

[0085] By analogy, return to step S3011 until all the parameters to be tested within the range of the parameters to be tested are traversed to obtain the bit error rate corresponding to each group of parameters to be tested.

[0086] In this embodiment, after adjusting the uplink receiving parameters based on a selected set of test parameters, multiple test grant data frames are sent to the target ONU. Each time the target ONU receives a test grant data frame, it sends back an uplink data frame containing a specific data code pattern within the time slot window specified by that test grant data frame. The specific data code pattern is set according to actual needs, for example, a data code pattern that facilitates bit error rate statistics. The number of data codes ("multiple") is set according to actual needs, for example, 8000.

[0087] The bit error rate of the uplink data frames fed back by the target ONU can be statistically analyzed by using BIP verification, thereby obtaining the bit error rate corresponding to a set of parameters to be tested.

[0088] By performing the same processing on each set of test parameters, the bit error rate corresponding to each set of test parameters within the range of test parameters can be obtained.

[0089] Step S3014: When the minimum bit error rate among multiple bit error rates is less than the second bit error rate, the parameter to be tested corresponding to the minimum bit error rate is taken as the target parameter, wherein the second bit error rate is less than or equal to the first bit error rate.

[0090] In this embodiment, assuming there are 10,000 sets of parameters to be tested, 10,000 bit error rates can be obtained. The minimum bit error rate is determined from the 10,000 bit error rates.

[0091] If the minimum bit error rate is less than the second bit error rate, then the parameter to be tested corresponding to the minimum bit error rate is used as the target parameter.

[0092] Furthermore, in one embodiment, reference is made to Figure 3 , Figure 3 for Figure 1 A schematic diagram of the second detailed process in step S30. (See diagram below.) Figure 3 As shown, step S30 includes:

[0093] Step S3021: Select a set of unselected parameters from the range of parameters to be tested, and adjust the uplink receiving parameters based on the selected set of parameters to be tested.

[0094] Step S3022: Send multiple test authorization data frames to the target ONU so that the target ONU can send back an uplink data frame containing a specific data code within the time slot window specified in each test authorization data frame;

[0095] Step S3023: Perform bit error rate statistics on the uplink data frames fed back by the target ONU to obtain the bit error rate corresponding to a set of parameters to be tested.

[0096] In this embodiment, the specific implementation of steps S3021 to S3023 can be referred to the implementation of steps S3011 to S3013 above, and will not be repeated here.

[0097] Step S3024: Detect whether the bit error rate is less than the third bit error rate, wherein the third bit error rate is less than the second bit error rate;

[0098] Step S3025: If it is less than the third bit error rate, then the selected set of parameters to be tested is used as the target parameters.

[0099] Step S3026: If it is not less than the third bit error rate, then check whether all the parameters to be tested included in the range of the parameters to be tested have been traversed.

[0100] If the traversal is not completed, return to step S3021.

[0101] In this embodiment, the bit error rate obtained in step S3023 is directly compared with the third bit error rate. If it is less than the third bit error rate, it means that the bit error problem is very minor under the current receiving parameter configuration. Then, the parameter to be tested corresponding to the currently obtained bit error rate is used as the target parameter.

[0102] Conversely, if the error rate is not less than the third bit error rate, then if all the test parameters included in the range of test parameters have not been traversed, return to step S3021, that is, continue to search for test parameters that can make the bit error rate less than the third bit error rate.

[0103] Furthermore, in one embodiment, after step S3026, the method further includes:

[0104] If the traversal has been completed, determine the minimum bit error rate from the multiple bit error rates;

[0105] If the minimum bit error rate is less than the second bit error rate, then the parameter to be tested corresponding to the minimum bit error rate is used as the target parameter.

[0106] In this embodiment, if all bit error rates are not less than the third bit error rate, the target parameters can be determined with reference to the embodiment of step S3014, which will not be elaborated here.

[0107] Furthermore, in one embodiment, the test authorization data frame is sent by reusing reserved fields in the standard protocol or expanding the range of standard field data values ​​in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0108] In this embodiment, different standard protocols are used in different scenarios, and the range of values ​​for the reused reserved fields or the standard fields in the extended standard protocols also differs.

[0109] For example, in a GPON scenario, where the OLT device and the target ONU use the standard GPON protocol, the reserved field of the flag field in the GPON Allocation Structure is reused to send test authorization data frames, while maintaining compatibility with the standard GPON protocol. Here, a value of 'x' in the reserved field indicates a bit error rate test authorization (i.e., the reserved field value in the test authorization data frame is 'x'), and a value of 'y' indicates a regular authorization. This explanation of the values ​​is merely to indicate that the values ​​corresponding to bit error rate test authorization and regular authorization differ. The sending of test authorization data frames here is achieved by reusing the reserved fields in the standard protocol used between the OLT device and the target ONU.

[0110] For example, in an XG(S)-PON scenario, the OLT device and the target ONU use the XG(S)PON standard protocol. To achieve test authorization data frame distribution while maintaining compatibility with the XG(S)PON standard protocol, the StartTime field in the XG(S)PON Allocation Structure is expanded with different values. Since the XG(S)PON standard protocol specifies that the StartTime range for normal authorization is 0–9719 and 0xffff, this embodiment uses a StartTime value of x (where x is not within the range of 0–9719 and 0xffff) to represent error test authorization (i.e., the reserved field in the test authorization data frame has a value of x). Here, the test authorization data frame distribution is achieved by expanding the range of standard field data values ​​in the standard protocol based on compatibility with the standard protocol used between the OLT device and the target ONU.

[0111] For example, in an EPON scenario, where the OLT device and the target ONU use the EPON standard protocol, the test authorization data frame is sent by adding a Pad field (bytes 13-39) to the EPON Gate MPCP message while maintaining compatibility with the existing EPON standard protocol. Since the EPON standard protocol specifies that unused Pad fields in the EPON Gate MPCP message are filled with 0s, this embodiment uses a Pad field value of x (x not equal to 0) to represent the error test authorization (i.e., the reserved field in the test authorization data frame has a value of x). Here, the test authorization data frame is sent by expanding the range of standard field data values ​​in the standard protocol while maintaining compatibility with the standard protocol used between the OLT device and the target ONU.

[0112] Furthermore, in one embodiment, after step S20, the method further includes:

[0113] When there are no target parameters in the range of parameters to be tested that can be used to improve the uplink bit error rate of the target ONU, an operation and maintenance message is sent to the operation and maintenance terminal. The operation and maintenance message contains the identity information of the target ONU.

[0114] In this embodiment, when no target parameter exists within the range of parameters to be tested that can be used to improve the uplink bit error rate of the target ONU, it indicates that the uplink bit error rate of the target ONU cannot be improved by adjusting the uplink receiving parameters. In this case, an operation and maintenance message is sent to the operation and maintenance terminal. The operation and maintenance terminal can be a mobile terminal provided to operation and maintenance personnel, who can then manually maintain the target ONU based on the operation and maintenance message, such as replacing the target ONU.

[0115] Secondly, embodiments of this application also provide an uplink error correction device.

[0116] In one embodiment, reference is made to Figure 4 , Figure 4 This is a functional module diagram of an embodiment of the uplink error correction device of this application. Figure 4 As shown, the uplink error correction device includes:

[0117] The first determining module 10 is used to determine, for each PON interface of the OLT device, the target ONU whose uplink bit error rate is greater than the first bit error rate from the ONUs connected to the PON interface.

[0118] The second determining module 20 is used to determine the range of parameters to be measured for each target ONU;

[0119] The third determining module 30 is used to determine the target parameters for improving the uplink bit error rate of the target ONU from the range of parameters to be tested;

[0120] Configuration module 40 is used to configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

[0121] Furthermore, in one embodiment, the uplink error correction device further includes an optical power adjustment module, used for:

[0122] For each target ONU, check whether the transmitted optical power of the target ONU is within the preset range;

[0123] If it is not within the preset range, the transmit optical power of the target ONU will be adjusted to the preset range.

[0124] Furthermore, in one embodiment, the third determining module 30 is used for:

[0125] Select a set of unselected parameters from the range of parameters to be tested, and adjust the uplink receiving parameters based on the selected set of parameters to be tested;

[0126] Multiple test authorization data frames are sent to the target ONU so that the target ONU can send back an uplink data frame containing a specific data code within the time slot window specified in each test authorization data frame;

[0127] The bit error rate of the uplink data frames fed back by the target ONU is statistically analyzed to obtain the bit error rate corresponding to a set of parameters to be tested.

[0128] By analogy, we can iterate through all the parameters to be tested within the range of the parameters to be tested and obtain the bit error rate corresponding to each group of parameters to be tested.

[0129] If the minimum bit error rate among multiple bit error rates is less than the second bit error rate, then the parameter to be tested corresponding to the minimum bit error rate is taken as the target parameter, wherein the second bit error rate is less than or equal to the first bit error rate.

[0130] Furthermore, in one embodiment, the third determining module 30 is used for:

[0131] Select a set of unselected parameters from the range of parameters to be tested, and adjust the uplink receiving parameters based on the selected set of parameters to be tested;

[0132] Multiple test authorization data frames are sent to the target ONU so that the target ONU can send back an uplink data frame containing a specific data code within the time slot window specified in each test authorization data frame;

[0133] The bit error rate of the uplink data frames fed back by the target ONU is statistically analyzed to obtain the bit error rate corresponding to a set of parameters to be tested.

[0134] Detect whether the bit error rate is less than a third bit error rate, wherein the third bit error rate is less than the second bit error rate;

[0135] If it is less than the third bit error rate, then the selected set of test parameters shall be used as the target parameters;

[0136] If it is not less than the third bit error rate, then check whether all the parameters to be tested included in the range of the parameters to be tested have been traversed.

[0137] If the traversal is not completed, return to the step of selecting a set of unselected test parameters from the range of test parameters, and adjust the uplink receiving parameters based on the selected set of test parameters.

[0138] Furthermore, in one embodiment, the third determining module 30 is also used for:

[0139] If the traversal has been completed, determine the minimum bit error rate from the multiple bit error rates;

[0140] If the minimum bit error rate is less than the second bit error rate, then the parameter to be tested corresponding to the minimum bit error rate is used as the target parameter.

[0141] Furthermore, in one embodiment, the test authorization data frame is sent by reusing reserved fields in the standard protocol or expanding the range of standard field data values ​​in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0142] Furthermore, in one embodiment, the uplink error correction device further includes an operation and maintenance module, used for:

[0143] When there are no target parameters in the range of parameters to be tested that can be used to improve the uplink bit error rate of the target ONU, an operation and maintenance message is sent to the operation and maintenance terminal. The operation and maintenance message contains the identity information of the target ONU.

[0144] Furthermore, in one embodiment, the second determining module is used for:

[0145] Determine the optical module type of the target ONU and the optical module type of the OLT equipment;

[0146] The range of parameters to be measured is determined based on the optical module type of the target ONU and the optical module type of the OLT device.

[0147] The functions of each module in the aforementioned uplink error correction device correspond to the steps in the aforementioned uplink error correction method embodiment, and their functions and implementation processes will not be described in detail here.

[0148] Thirdly, embodiments of this application provide an uplink error correction device, which may be an OLT.

[0149] Reference Figure 5 , Figure 5 This is a schematic diagram of the hardware structure of the uplink error correction device involved in the embodiments of this application. In the embodiments of this application, the uplink error correction device may include a processor, a memory, a communication interface, and a communication bus.

[0150] The communication bus can be of any type and is used to interconnect the processor, memory, and communication interface.

[0151] The communication interface includes input / output (I / O) interfaces, physical interfaces, and logical interfaces used for interconnecting internal components of the uplink error correction device, as well as interfaces used for interconnecting the uplink error correction device with other devices (such as other computing devices or user equipment). Physical interfaces can be Ethernet interfaces, fiber optic interfaces, ATM interfaces, etc.; user equipment can be displays, keyboards, etc.

[0152] Memory can be various types of storage media, such as random access memory (RAM), read-only memory (ROM), non-volatile RAM (NVRAM), flash memory, optical storage, hard disk, programmable ROM (PROM), erasable PROM (EPROM), electrically erasable PROM (EEPROM), etc.

[0153] The processor can be a general-purpose processor, which can call up the uplink error correction program stored in memory and execute the uplink error correction method provided in the embodiments of this application. For example, the general-purpose processor can be a central processing unit (CPU). The method executed when the uplink error correction program is called can be referred to in the various embodiments of the uplink error correction method of this application, and will not be repeated here.

[0154] Those skilled in the art will understand that Figure 5 The hardware structure shown does not constitute a limitation of this application and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0155] Fourthly, embodiments of this application also provide a computer-readable storage medium.

[0156] The present application provides a computer-readable storage medium storing an uplink error correction program, wherein when the uplink error correction program is executed by a processor, it implements the steps of the uplink error correction method described above.

[0157] The method implemented when the uplink error correction procedure is executed can be referred to in various embodiments of the uplink error correction method of this application, and will not be repeated here.

[0158] It should be noted that the sequence numbers of the embodiments in this application are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0159] The terms "comprising" and "having," and any variations thereof, in the specification, claims, and accompanying drawings of this application are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to such process, method, product, or apparatus. The terms "first," "second," and "third," etc., are used to distinguish different objects, etc., and do not indicate a sequence, nor do they limit "first," "second," and "third" to different types.

[0160] In the description of the embodiments of this application, terms such as "exemplary," "for example," or "for instance" are used to indicate examples, illustrations, or explanations. Any embodiment or design described as "exemplary," "for example," or "for instance" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of terms such as "exemplary," "for example," or "for instance" is intended to present the relevant concepts in a concrete manner.

[0161] In the description of the embodiments of this application, unless otherwise stated, " / " means "or". For example, A / B can mean A or B. The "and / or" in the text is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist simultaneously, and B exists alone. In addition, in the description of the embodiments of this application, "multiple" means two or more.

[0162] In some processes described in the embodiments of this application, multiple operations or steps are included in a specific order. However, it should be understood that these operations or steps may not be executed in the order they appear in the embodiments of this application, or they may be executed in parallel. The sequence number of the operation is only used to distinguish different operations, and the sequence number itself does not represent any execution order. In addition, these processes may include more or fewer operations, and these operations or steps may be executed sequentially or in parallel, and these operations or steps may be combined.

[0163] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes several instructions to cause a terminal device to execute the methods described in the various embodiments of this application.

[0164] The above are merely preferred embodiments of this application and do not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A method for improving uplink bit error rate, characterized in that, The uplink error correction method includes: For each PON interface of the OLT device, identify the target ONU whose uplink bit error rate is greater than the first bit error rate within the statistical period from the ONUs connected to the PON interface; For each target ONU, determine the range of parameters to be measured; Determine the target parameters for improving the uplink bit error rate of the target ONU from the range of parameters to be tested; Configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

2. The uplink error correction method as described in claim 1, characterized in that, Before determining the target parameter for improving the uplink bit error rate of the target ONU from the range of parameters to be tested, the method further includes: For each target ONU, check whether the transmitted optical power of the target ONU is within the preset range; If it is not within the preset range, the transmit optical power of the target ONU will be adjusted to the preset range.

3. The uplink error correction method as described in claim 1, characterized in that, The target parameters for improving the uplink bit error rate of the target ONU, determined from the range of parameters to be tested, include: Select a set of unselected parameters from the range of parameters to be tested, and adjust the uplink receiving parameters based on the selected set of parameters to be tested; Multiple test authorization data frames are sent to the target ONU so that the target ONU can send back an uplink data frame containing a specific data code within the time slot window specified in each test authorization data frame; The bit error rate of the uplink data frames fed back by the target ONU is statistically analyzed to obtain the bit error rate corresponding to a set of parameters to be tested. By analogy, we can iterate through all the parameters to be tested within the range of the parameters to be tested and obtain the bit error rate corresponding to each group of parameters to be tested. If the minimum bit error rate among multiple bit error rates is less than the second bit error rate, then the parameter to be tested corresponding to the minimum bit error rate is taken as the target parameter, wherein the second bit error rate is less than or equal to the first bit error rate.

4. The uplink error correction method as described in claim 1, characterized in that, The determination of the target parameters for improving the uplink bit error rate of the target ONU from the range of parameters to be tested also includes: Select a set of unselected parameters from the range of parameters to be tested, and adjust the uplink receiving parameters based on the selected set of parameters to be tested; Multiple test authorization data frames are sent to the target ONU so that the target ONU can send back an uplink data frame containing a specific data code within the time slot window specified in each test authorization data frame; The bit error rate of the uplink data frames fed back by the target ONU is statistically analyzed to obtain the bit error rate corresponding to a set of parameters to be tested. Detect whether the bit error rate is less than a third bit error rate, wherein the third bit error rate is less than the second bit error rate; If it is less than the third bit error rate, then the selected set of test parameters shall be used as the target parameters; If it is not less than the third bit error rate, then check whether all the parameters to be tested included in the range of the parameters to be tested have been traversed. If the traversal is not completed, return to the step of selecting a set of unselected test parameters from the range of test parameters, and adjust the uplink receiving parameters based on the selected set of test parameters.

5. The uplink error correction method as described in claim 4, characterized in that, After determining whether all parameters within the range of parameters to be tested have been traversed if the error rate is not less than the third bit error rate, the process further includes: If the traversal has been completed, determine the minimum bit error rate from the multiple bit error rates; If the minimum bit error rate is less than the second bit error rate, then the parameter to be tested corresponding to the minimum bit error rate is used as the target parameter.

6. The uplink error correction method as described in claim 3 or 4, characterized in that, The test authorization data frame is sent by reusing reserved fields in the standard protocol or expanding the range of standard field data values ​​in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

7. The uplink error correction method as described in claim 1, characterized in that, After determining the range of parameters to be measured for each target ONU, the process also includes: When there are no target parameters in the range of parameters to be tested that can be used to improve the uplink bit error rate of the target ONU, an operation and maintenance message is sent to the operation and maintenance terminal. The operation and maintenance message contains the identity information of the target ONU.

8. The uplink error correction method as described in claim 1, characterized in that, The determination of the range of parameters to be measured for each target ONU includes: Determine the optical module type of the target ONU and the optical module type of the OLT equipment; The range of parameters to be measured is determined based on the optical module type of the target ONU and the optical module type of the OLT device.

9. An uplink error correction device, characterized in that, The uplink error correction device includes: The first determination module is used to determine, for each PON interface of the OLT device, the target ONU whose uplink bit error rate is greater than the first bit error rate from the ONUs connected to the PON interface. The second determination module is used to determine the range of parameters to be measured for each target ONU; The third determination module is used to determine the target parameters for improving the uplink bit error rate of the target ONU from the range of parameters to be tested; The configuration module is used to configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores an uplink error correction program, wherein when the uplink error correction program is executed by a processor, it implements the steps of the uplink error correction method as described in any one of claims 1 to 8.

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