Real-time monitoring method of battery swap cabinet status based on electrical parameter analysis
By analyzing the current and voltage signals of the charging circuit of the battery swap cabinet under a low temperature environment, calculating the degree of abnormality and judging the damage, the problem of inaccurate monitoring of the charging circuit of the battery swap cabinet is solved, and more accurate fault detection is achieved.
Patent Information
- Application Number
- CN202510105083.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-23
- Publication Date
- 2025-04-04
- Estimated Expiration
- 2045-01-23
AI Technical Summary
In low temperature environments, the real-time monitoring of the charging circuit of the battery swap cabinet is inaccurate, resulting in delay in fault detection.
By obtaining the current signal and voltage signal of the battery swap cabinet door during the last switch, analyzing the signal changes in a short time, calculating the abnormality degree of the charging circuit at each moment, and constructing an abnormality degree sequence to judge the damage of the charging circuit.
Improve the accuracy of the damage state test of the charging circuit of the battery swap cabinet in low temperature environments and promptly detect faults.
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Figure CN119556195B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of fault testing of charging circuits of battery swap cabinets, and in particular to a method for real-time monitoring of battery swap cabinet status based on electrical parameter analysis. Background Art
[0002] A battery swap cabinet is a service facility that provides electric vehicle users with quick battery replacement. It provides users with a convenient energy replenishment solution by integrating functions such as battery charging, storage and quick replacement.
[0003] When monitoring the status of a power swap cabinet in real time, existing methods usually monitor the electrical parameters of the power swap cabinet, and determine the specific fault of the power swap cabinet based on the different effects of different faults on the electrical parameters of the power swap cabinet. However, when the power swap cabinet is used normally in a low-temperature environment, the charging circuit of the power swap cabinet may be damaged, and the abnormal performance of the charging circuit of the power swap cabinet is different at different times. If the abnormal performance of the charging circuit is not considered and only the electrical parameters of the power swap cabinet are analyzed, the real-time monitoring of the charging circuit status of the power swap cabinet may be inaccurate, and the fault cannot be discovered in time. Summary of the invention
[0004] In order to solve the problem of inaccurate real-time monitoring of the charging circuit status of a battery swap cabinet in a low-temperature environment, the present invention provides a real-time monitoring method for the status of a battery swap cabinet based on electrical parameter analysis.
[0005] The real-time monitoring method of the battery swap cabinet state based on electrical parameter analysis of the present invention adopts the following technical solutions:
[0006] An embodiment of the present invention provides a method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis, the method comprising the following steps:
[0007] In a low temperature environment, obtain the current signal and voltage signal of the charging circuit when the battery swap cabinet door is last opened and closed;
[0008] According to the changes of current signal and voltage signal in a preset short time, the abnormality degree of the charging circuit of the battery swap cabinet at each moment is obtained;
[0009] According to the abnormality degree of the charging circuit of the battery swap cabinet at all times, an abnormality degree sequence is constructed; in the abnormality degree sequence, a preset abnormality degree sequence after the battery swap cabinet door is closed is obtained, which is recorded as the first abnormality degree sequence; according to the difference change of adjacent abnormality degrees in the first abnormality degree sequence, the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed is obtained; according to the abnormal decrease degree, the abnormality degree of the battery swap cabinet door after closing and the abnormality degree before opening, the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained;
[0010] The damage condition of the charging circuit of the battery swap cabinet is judged based on the correlation and the change in the abnormality degree of the battery swap cabinet door after it is closed.
[0011] Furthermore, the abnormality degree of the charging circuit of the battery swap cabinet at each moment is obtained according to the changes of the current signal and the voltage signal within a preset short time, and the specific steps include the following:
[0012] Get the current signal The average value of all current values in its preset local range is obtained by The average value of all voltage values in the preset local range of the first voltage value is obtained, and the product of the average value of the current value and the average value of the voltage value is used as the average power of the charging circuit in the preset local range, and the average value of the current value and the average power are merged to obtain the first The abnormality degree of the charging circuit of the battery swap cabinet at a certain moment, the average value of the current value, the average power and the abnormality degree are inversely proportional to the abnormality degree, and the abnormality degree is a normalized value.
[0013] Furthermore, the abnormality degree sequence is constructed according to the abnormality degree of the charging circuit of the battery swap cabinet at all times, and the specific steps include the following:
[0014] Obtain the abnormality degree of the charging circuit of the battery swap cabinet at all times, arrange the abnormality degree of the charging circuit of the battery swap cabinet at all times in chronological order, and construct an abnormality degree sequence.
[0015] Furthermore, the specific method for obtaining the first abnormality degree sequence is as follows:
[0016] Get the time when the battery swap cabinet door is closed, record it as the closing time, and start from the closing time in the abnormality degree sequence. The partial abnormality degree sequence determined in hours is recorded as the first abnormality degree sequence. is a preset second value, which is 1.
[0017] Furthermore, the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed is obtained according to the difference change of adjacent abnormal degrees in the first abnormal degree sequence, and the specific steps include the following:
[0018] The first abnormality degree sequence The abnormality level minus Abnormality levels are obtained to obtain a difference change of adjacent abnormality levels, and the average value of the difference changes of all adjacent abnormality levels in the first abnormality level sequence is used as the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed. , is the number of abnormality levels in the first abnormality level sequence.
[0019] Furthermore, the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained according to the abnormality decrease degree and the change of the abnormality degree after the battery swap cabinet door is closed and before it is opened, and the specific steps include the following:
[0020] Obtain a preset abnormality degree sequence of the battery swap cabinet door before it is opened in the abnormality degree sequence, recorded as a second abnormality degree sequence;
[0021] Get the nearest time when the power cabinet door is closed All abnormality levels corresponding to the minute in the abnormality level sequence are recorded as the third abnormality level. is a preset fourth value, the average value of all third abnormality levels is recorded as the first average value, and the average value of all abnormality levels in the second abnormality level sequence is recorded as the second average value;
[0022] According to the abnormal decrease degree, the first average value and the second average value, the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained.
[0023] Furthermore, the specific method for obtaining the second abnormality degree sequence is as follows:
[0024] Get the time when the battery swap cabinet door is opened, record it as the opening time, and start from the opening time in the abnormality degree sequence. The partial abnormality degree sequence determined in hours is recorded as the second abnormality degree sequence. is a preset third value, which is 1.
[0025] Furthermore, the correlation between the abnormality of the charging circuit and the switch of the battery swap cabinet door is obtained according to the abnormality decrease degree, the first average value, and the second average value, and the specific steps include the following:
[0026] The abnormal decrease degree and the difference between the first average value and the second average value are integrated to obtain the correlation between the abnormality of the charging circuit and the switch of the battery exchange cabinet door. The abnormal decrease degree is inversely proportional to the correlation, the difference is directly proportional to the correlation, and the correlation is a normalized value.
[0027] Furthermore, judging the damage of the charging circuit of the battery swap cabinet according to the correlation and the change of the abnormality degree of the battery swap cabinet door after closing includes the following specific steps:
[0028] Multiply the correlation and the average value of all abnormality levels in the first abnormality level sequence to obtain the possibility of damage to the charging circuit of the battery swap cabinet;
[0029] Determine the damage condition of the charging circuit of the battery swap cabinet based on the possibility of damage.
[0030] Furthermore, judging the damage of the charging circuit of the battery swap cabinet according to the possibility of damage includes the following specific steps:
[0031] A first threshold is preset. If the possibility of damage to the charging circuit of the battery swap cabinet is greater than the first threshold, the charging circuit of the battery swap cabinet is damaged. If the possibility of damage to the charging circuit of the battery swap cabinet is less than or equal to the first threshold, the charging circuit of the battery swap cabinet is not damaged.
[0032] The beneficial effect of the technical solution of the present invention is: after obtaining the current signal and voltage signal of the charging circuit when the battery swap cabinet door was most recently opened and closed in a low-temperature environment, the present invention obtains the abnormality degree of the charging circuit of the battery swap cabinet at each moment by analyzing the changes in the current signal and the voltage signal in a short period of time. The abnormality degree takes into account the abnormal performance of the charging circuit of the battery swap cabinet in a low-temperature environment, making subsequent analysis more reasonable, and by analyzing the difference changes in adjacent abnormality degrees in the first abnormality degree sequence, the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed is obtained. The first abnormality degree sequence is a preset abnormality degree sequence after the battery swap cabinet door is closed. The degree of abnormal decline reflects how fast the abnormality level of the battery swap cabinet door tends to the normal abnormality level after it is closed. The slower the decline, the more likely the charging circuit is damaged. The correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained through the change of the abnormality level after the battery swap cabinet door is closed and before it is opened. The relationship analysis makes the subsequent determination of the damage to the charging circuit more accurate. Finally, the damage to the charging circuit of the battery swap cabinet is judged based on the correlation and the change of the abnormality level after the battery swap cabinet door is closed, which improves the accuracy of the damage status test of the charging circuit of the battery swap cabinet in a low temperature environment and timely detects faults. BRIEF DESCRIPTION OF THE DRAWINGS
[0033] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0034] Figure 1 A flowchart of the steps of a method for real-time monitoring of the status of a battery swap cabinet based on electrical parameter analysis provided in one embodiment of the present invention. DETAILED DESCRIPTION
[0035] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined purpose of the invention, the following is a detailed description of the specific implementation method, structure, characteristics and effects of the real-time monitoring method of the state of the battery swap cabinet based on electrical parameter analysis proposed by the present invention in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.
[0036] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
[0037] The specific scheme of the method for real-time monitoring of the status of a battery swap cabinet based on electrical parameter analysis provided by the present invention is described in detail below with reference to the accompanying drawings.
[0038] See also Figure 1 , which shows a flowchart of a method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis provided by an embodiment of the present invention, the method comprising the following steps:
[0039] Step S001: In a low temperature environment, obtain the current signal and voltage signal of the charging circuit when the battery swap cabinet door was last opened and closed.
[0040] It should be noted that the main purpose of this embodiment is to test whether the charging circuit of the power exchange cabinet fails during the time when the user opens and closes the power exchange cabinet door in a low temperature environment. Before starting the analysis, the required data needs to be collected first.
[0041] Specifically, in a low temperature environment, the current signal and voltage signal of the charging circuit are obtained when the battery swap cabinet door is last opened and closed. The current signal includes several moments, each moment corresponds to a current value, as follows:
[0042] In a low temperature environment, the current signal and voltage signal of the charging circuit of the battery swap cabinet are obtained through current sensors and voltage sensors during a period of normal use of the battery swap cabinet by the user; it should be noted that the period of normal use of the battery swap cabinet by the user includes the time when the user completes the opening and closing of the battery swap cabinet door, and both the current signal and the voltage signal are discrete time signals; the current signal contains several moments, each moment corresponds to a current value, that is, each sampling time corresponds to a current value; each moment in the voltage signal corresponds to a voltage value.
[0043] At this point, the current signal and voltage signal of the charging circuit of the battery swap cabinet are obtained.
[0044] Step S002: Obtain the abnormality degree of the charging circuit of the battery swap cabinet at each moment based on the changes in the current signal and the voltage signal within a preset short time.
[0045] It should be noted that when the charging circuit of the battery swap cabinet is in a low temperature environment, the resistance value of the charging circuit will increase, which will cause the current value in the charging circuit to be lower than the normal value. The smaller the current value, the higher the abnormal performance of the charging circuit. In a low temperature environment, the performance of some electronic components may decline, such as the weakening of the dielectric polarization effect of the capacitor and the deterioration of the conduction characteristics of the semiconductor device, which may lead to a decline in the overall performance of the battery swap cabinet equipment, including a reduction in output power. Therefore, the lower the charging power of the charging circuit, the greater the degree of abnormal performance of the charging circuit. For the calculation of the output power, the product of the average output current and the average output voltage in a short period of time before the current moment is used to express it, so as to better analyze the abnormal performance of the charging circuit of the battery swap cabinet at a certain moment.
[0046] Preferably, the abnormality of the charging circuit of the battery swap cabinet at each moment is obtained according to the changes of the current signal and the voltage signal within a preset short time, as follows:
[0047] Get the current signal The average value of all current values in its preset local range is obtained by The average value of all voltage values in the preset local range of the first voltage value is obtained, and the product of the average value of the current value and the average value of the voltage value is used as the average power of the charging circuit in the preset local range, and the average value of the current value and the average power are merged to obtain the first The abnormality degree of the charging circuit of the battery swap cabinet at a certain moment, the average value of the current value, the average power and the abnormality degree are inversely proportional to the abnormality degree, and the abnormality degree is a normalized value.
[0048] As a specific example, the specific method for obtaining the abnormality degree of the charging circuit of the battery swap cabinet at each moment is as follows:
[0049]
[0050] In the formula, The current signal The average value of all current values within a preset local range of current values, The voltage signal The average value of all voltage values within a preset local range of a voltage value, the The specific method for obtaining the preset local range of the current value is as follows: The current value is The current value and Current value before The range determined by the current value is the The local range of current values, is the preset first value. It should be noted that if the local range exceeds the range of the current signal or the voltage signal when the preset local range is obtained, no analysis is performed; a preset local range of voltage values and the first The preset local range of current values has the same corresponding time sequence length; is the linear normalization function, For the The abnormality level of the charging circuit of the battery swap cabinet at a certain moment.
[0051] It should be noted that The smaller it is, the smaller the average current of the charging circuit of the battery swap cabinet is in a short period of time, and the more likely it is that the temperature affects the resistance in the charging circuit. The bigger; The smaller it is, the smaller the average power of the charging circuit of the battery swap cabinet is in a short period of time, and the more likely it is to be affected by the low temperature environment. The bigger.
[0052] At this point, the degree of abnormality of the charging circuit of the battery swap cabinet at each moment is obtained.
[0053] Step S003, construct an abnormality degree sequence according to the abnormality degree of the charging circuit of the battery swap cabinet at all times; obtain a preset abnormality degree sequence after the battery swap cabinet door is closed in the abnormality degree sequence, recorded as the first abnormality degree sequence; according to the difference change of adjacent abnormality degrees in the first abnormality degree sequence, obtain the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed; according to the change of the abnormal decrease degree, the abnormality degree of the battery swap cabinet door after closing and the abnormality degree before opening, obtain the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door.
[0054] It should be noted that since the degree of abnormality of the charging circuit of the battery swap cabinet at each moment varies with the temperature of the low temperature environment, when the temperature is low, the resistance in the charging circuit will increase, the current will decrease, and the power will also decrease; when the battery swap cabinet door is opened, as the temperature inside the battery swap cabinet decreases, the degree of abnormality of the charging circuit increases. When the battery swap cabinet door is closed, as the charging process proceeds, the temperature of the charging compartment of the battery swap cabinet increases. If the charging circuit of the battery swap cabinet is not damaged, as the temperature rises, the degree of abnormality of the charging circuit will decrease until it approaches the degree of abnormality before the battery swap cabinet door is opened. If the charging circuit of the battery swap cabinet is damaged, as the temperature rises, the degree of abnormality of the charging circuit will slowly decrease, and may not approach the degree of abnormality before the battery swap cabinet door is opened. Since the damage is related to the user's use of the battery swap cabinet, by analyzing the decrease in the degree of abnormality within a period of time after the battery swap cabinet door is closed, it can be reflected whether the battery swap cabinet is damaged after the switch, and combined with the degree of abnormality before the battery swap cabinet door is opened, the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is analyzed.
[0055] Specifically, according to the abnormality degree of the charging circuit of the battery swap cabinet at all times, an abnormality degree sequence is constructed, as follows:
[0056] Obtain the abnormality degree of the charging circuit of the battery swap cabinet at all times, arrange the abnormality degree of the charging circuit of the battery swap cabinet at all times in chronological order, and construct an abnormality degree sequence.
[0057] Specifically, a preset abnormality degree sequence after the battery swap cabinet door is closed is obtained in the abnormality degree sequence, which is recorded as the first abnormality degree sequence. The specific method for obtaining the first abnormality degree sequence is as follows: the moment when the battery swap cabinet door is closed is obtained, which is recorded as the closing moment. Starting from the closing moment, the abnormality degree sequence is The partial abnormality degree sequence determined in hours is recorded as the first abnormality degree sequence. is the preset second value. Give a narrative.
[0058] Preferably, according to the difference change of adjacent abnormality levels in the first abnormality level sequence, the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed is obtained, which is specifically as follows:
[0059] The first abnormality degree sequence The abnormality level minus Abnormality levels are obtained to obtain a difference change of adjacent abnormality levels, and the average value of the difference changes of all adjacent abnormality levels in the first abnormality level sequence is used as the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed. , is the number of abnormality levels in the first abnormality level sequence.
[0060] As a specific example, the specific method for obtaining the abnormal decrease degree is as follows:
[0061]
[0062] In the formula, is the number of abnormality levels in the first abnormality level sequence, is the first abnormality degree sequence The degree of abnormality, is the first abnormality degree sequence The degree of abnormality, It is the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed.
[0063] It should be noted that The larger the value, the higher the temperature of the charging compartment of the battery swap cabinet, and the lower the abnormality. The bigger.
[0064] Preferably, the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained according to the degree of abnormal decrease and the change in the abnormality degree after the battery swap cabinet door is closed and before it is opened, as follows:
[0065] In the abnormality degree sequence, a preset abnormality degree sequence of the battery swap cabinet door before opening is obtained, which is recorded as the second abnormality degree sequence. The specific method for obtaining the second abnormality degree sequence is as follows: obtain the moment when the battery swap cabinet door is opened, which is recorded as the opening moment. Starting from the opening moment in the abnormality degree sequence, the previous The partial abnormality degree sequence determined in hours is recorded as the second abnormality degree sequence. is the preset third value. Give a narrative.
[0066] Get the nearest time when the power cabinet door is closed All abnormality levels corresponding to the minute in the abnormality level sequence are recorded as the third abnormality level. is a preset fourth value, the average value of all third abnormality levels is recorded as the first average value, the average value of all abnormality levels in the second abnormality level sequence is recorded as the second average value, the abnormality decrease degree, the difference between the first average value and the second average value are merged to obtain the correlation between the abnormality of the charging circuit and the switch of the battery swap cabinet door, the abnormality decrease degree is inversely proportional to the correlation, the difference is directly proportional to the correlation, and the correlation is a normalized value.
[0067] As a specific example, a specific method for obtaining the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is as follows:
[0068]
[0069] In the formula, It is the abnormal drop degree of the charging circuit after the battery swap cabinet door is closed. The specific method of obtaining is as follows: Get the nearest time after the battery swap cabinet door is closed All abnormality levels corresponding to the minute in the abnormality level sequence are recorded as the third abnormality level. is the preset fourth value. Describe the average value of all third abnormality levels, recorded as ; is the average value of all abnormality levels in the second abnormality level sequence, is the linear normalization function, It is the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door.
[0070] It should be noted that The smaller it is, the more likely the charging circuit is abnormal as the temperature rises after the battery swap cabinet door is closed. The bigger; The larger the value, the greater the difference between the average abnormality in a short period of time after closing the battery swap cabinet door and the average abnormality in a period of time before opening the battery swap cabinet door. The greater the temperature change, the more likely the charging circuit is abnormal. The bigger.
[0071] At this point, the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained.
[0072] Step S004: Determine the damage condition of the charging circuit of the battery swap cabinet based on the correlation and the change in the abnormality degree of the battery swap cabinet door after it is closed.
[0073] It should be noted that the above-mentioned correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is combined with the abnormality level after the battery swap cabinet door is closed to judge the damage of the charging circuit of the battery swap cabinet. The greater the correlation, the greater the possibility of damage to the charging circuit. The greater the abnormality level after the battery swap cabinet door is closed, the greater the possibility of damage to the charging circuit. Therefore, the damage to the charging circuit of the battery swap cabinet is judged by the correlation and the change in the abnormality level after the battery swap cabinet door is closed.
[0074] Specifically, according to the correlation and the change in the abnormality of the battery swap cabinet door after closing, the damage of the charging circuit of the battery swap cabinet is judged, including the following steps:
[0075] First, based on the correlation and the change in the degree of abnormality of the battery swap cabinet door after it is closed, the possibility of damage to the charging circuit of the battery swap cabinet is obtained.
[0076] Secondly, determine the damage condition of the charging circuit of the battery swap cabinet based on the possibility of damage.
[0077] Specifically, based on the correlation and the change in the abnormality of the battery swap cabinet door after closing, the possibility of damage to the charging circuit of the battery swap cabinet is obtained, as follows:
[0078] Multiply the correlation and the average value of all abnormality levels in the first abnormality level sequence to obtain the possibility of damage to the charging circuit of the battery swap cabinet.
[0079] As a specific example, the specific method for obtaining the damage possibility is as follows:
[0080]
[0081] In the formula, The correlation between abnormality of charging circuit and opening and closing of battery exchange cabinet door. is the average value of all abnormality levels in the first abnormality level sequence, The possibility of damage to the charging circuit of the battery swap cabinet.
[0082] It should be noted that The larger the value, the greater the correlation between the abnormality of the charging circuit and the switch of the battery cabinet door. The bigger, The larger the value, the greater the average abnormality of the battery swap cabinet door within a period of time after it is closed. The bigger.
[0083] Furthermore, the damage of the charging circuit of the battery swap cabinet is judged according to the possibility of damage, as follows:
[0084] A first threshold is preset. This embodiment is described with the first threshold being 0.8. If the possibility of damage to the charging circuit of the battery swap cabinet is greater than the first threshold, the charging circuit of the battery swap cabinet is damaged. If the possibility of damage to the charging circuit of the battery swap cabinet is less than or equal to the first threshold, the charging circuit of the battery swap cabinet is not damaged.
[0085] This embodiment further proposes a real-time monitoring device for the status of a battery swap cabinet based on electrical parameter analysis, including: a current sensor, a voltage sensor, and a computer processor. The current sensor is used to obtain the current signal of the charging circuit when the battery swap cabinet door is last opened and closed. The voltage sensor is used to obtain the voltage signal of the charging circuit when the battery swap cabinet door is last opened and closed. The computer processor is used to implement the above steps to determine the damage status of the charging circuit of the battery swap cabinet.
[0086] Through the above steps, the real-time monitoring method of the battery swap cabinet status based on electrical parameter analysis is completed.
[0087] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the principles of the present invention should be included in the protection scope of the present invention.
Claims
1. A real-time monitoring method for the state of a power exchange cabinet based on electrical parameter analysis, characterized in that: The method comprises the following steps: In a low temperature environment, obtain the current signal and voltage signal of the charging circuit when the battery swap cabinet door is last opened and closed; According to the changes of current signal and voltage signal in a preset short time, the abnormality degree of the charging circuit of the battery swap cabinet at each moment is obtained; According to the abnormality degree of the charging circuit of the battery swap cabinet at all times, an abnormality degree sequence is constructed; in the abnormality degree sequence, a preset abnormality degree sequence after the battery swap cabinet door is closed is obtained, which is recorded as the first abnormality degree sequence; according to the difference change of adjacent abnormality degrees in the first abnormality degree sequence, the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed is obtained; according to the abnormal decrease degree, the abnormality degree of the battery swap cabinet door after closing and the abnormality degree before opening, the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained; According to the correlation and the change in the abnormality of the battery swap cabinet door after closing, the damage of the charging circuit of the battery swap cabinet is judged; The correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained according to the abnormality decrease degree and the change of the abnormality degree after the battery swap cabinet door is closed and before it is opened. The specific steps include the following: Obtain a preset abnormality degree sequence of the battery swap cabinet door before it is opened in the abnormality degree sequence, recorded as a second abnormality degree sequence; Get the nearest time when the power cabinet door is closed All abnormality levels corresponding to the minute in the abnormality level sequence are recorded as the third abnormality level. is a preset fourth value, the average value of all third abnormality levels is recorded as the first average value, and the average value of all abnormality levels in the second abnormality level sequence is recorded as the second average value; According to the abnormal decrease degree, the first average value, and the second average value, the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door is obtained; The method of obtaining the correlation between the abnormality of the charging circuit and the opening and closing of the battery swap cabinet door according to the abnormality decrease degree, the first average value, and the second average value includes the following specific steps: The abnormal decrease degree and the difference between the first average value and the second average value are integrated to obtain the correlation between the abnormality of the charging circuit and the switch of the battery exchange cabinet door. The abnormal decrease degree is inversely proportional to the correlation, the difference is directly proportional to the correlation, and the correlation is a normalized value.
2. The method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis according to claim 1 is characterized in that: The specific steps of obtaining the abnormality degree of the charging circuit of the battery swap cabinet at each moment according to the changes of the current signal and the voltage signal within a preset short time are as follows: Get the current signal The average value of all current values within its preset local range is used to obtain the voltage signal. The average value of all voltage values in the preset local range of the first voltage value is obtained, and the product of the average value of the current value and the average value of the voltage value is used as the average power of the charging circuit in the preset local range, and the average value of the current value and the average power are merged to obtain the first The abnormality degree of the charging circuit of the battery swap cabinet at a certain moment, the average value of the current value, the average power and the abnormality degree are inversely proportional to the abnormality degree, and the abnormality degree is a normalized value.
3. The method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis according to claim 1 is characterized in that: The abnormality degree sequence is constructed according to the abnormality degree of the charging circuit of the battery swap cabinet at all times, and the specific steps include the following: Obtain the abnormality degree of the charging circuit of the battery swap cabinet at all times, arrange the abnormality degree of the charging circuit of the battery swap cabinet at all times in chronological order, and construct an abnormality degree sequence.
4. The method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis according to claim 1 is characterized in that: The specific method for obtaining the first abnormality degree sequence is as follows: Get the time when the battery swap cabinet door is closed, record it as the closing time, and start from the closing time in the abnormality degree sequence. The partial abnormality degree sequence determined in hours is recorded as the first abnormality degree sequence. is a preset second value, which is 1.
5. The method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis according to claim 1 is characterized in that: The specific steps of obtaining the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed according to the difference change of adjacent abnormal degrees in the first abnormal degree sequence are as follows: The first abnormality degree sequence The abnormality level minus Abnormality levels are obtained to obtain a difference change of adjacent abnormality levels, and the average value of the difference changes of all adjacent abnormality levels in the first abnormality level sequence is used as the abnormal decrease degree of the charging circuit after the battery swap cabinet door is closed. , is the number of abnormality levels in the first abnormality level sequence.
6. The method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis according to claim 1 is characterized in that: The specific method for obtaining the second abnormality degree sequence is as follows: Get the time when the battery swap cabinet door is opened, record it as the opening time, and start from the opening time in the abnormality degree sequence. The partial abnormality degree sequence determined in hours is recorded as the second abnormality degree sequence. is a preset third value, which is 1.
7. The method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis according to claim 1 is characterized in that: The method of judging the damage of the charging circuit of the battery swap cabinet based on the correlation and the change in the abnormality of the battery swap cabinet door after closing includes the following specific steps: Multiply the correlation and the average value of all abnormality levels in the first abnormality level sequence to obtain the possibility of damage to the charging circuit of the battery swap cabinet; Determine the damage condition of the charging circuit of the battery swap cabinet based on the possibility of damage.
8. The method for real-time monitoring of the state of a power exchange cabinet based on electrical parameter analysis according to claim 7 is characterized in that: The specific steps of judging the damage of the charging circuit of the battery swap cabinet according to the possibility of damage are as follows: A first threshold is preset. If the possibility of damage to the charging circuit of the battery swap cabinet is greater than the first threshold, the charging circuit of the battery swap cabinet is damaged. If the possibility of damage to the charging circuit of the battery swap cabinet is less than or equal to the first threshold, the charging circuit of the battery swap cabinet is not damaged.
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