Device detection method, device, computer equipment, storage medium and program product

Abstract

The present invention relates to the field of quantum computing technology, and discloses a device detection method, apparatus, computer equipment, storage medium and program product, wherein the device detection method comprises: identifying electronic devices in a target circuit of a quantum chip; classifying the electronic devices based on the device type of the electronic devices to obtain a device set corresponding to each device type; detecting electronic devices in the same or different device sets to obtain overlapping devices, and determining a target device based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in a partial area of ​​the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit. The present invention realizes the automation of device overlap judgment in a quantum chip, and meets the requirements for efficiency and accuracy of overlap judgment in the chip design process.

Description

Technical Field

[0001] The present invention relates to the field of quantum computing technology, and in particular to a device detection method, apparatus, computer equipment, storage medium and program product. Background Art

[0002] In electronic design automation and integrated circuit layout design, device overlap is an issue that needs to be focused on. Device overlap may not only cause circuit failures, such as short circuits and signal interference, but may also affect the performance and stability of the circuit board, and even cause the circuit to burn out. Therefore, it is particularly important to detect overlap of devices in the circuit.

[0003] Different from the device judgment method in traditional layout design tools, in quantum layout design, the layout design data structure and the traditional layout design data structure are not consistent, which makes the traditional device judgment method unable to be applied to overlap detection in quantum chips. Automatically judging device overlap based on the unique quantum layout data structure is an urgent problem that needs to be solved. Summary of the invention

[0004] In view of this, the present invention provides a device detection method, apparatus, computer equipment, storage medium and program product to solve the problem that the quantum map data structure cannot automatically determine the device overlap.

[0005] In a first aspect, the present invention provides a device detection method, the method comprising:

[0006] Identify electronic devices in the target circuit of the quantum chip;

[0007] Classifying the electronic devices based on device types of the electronic devices to obtain a device set corresponding to each device type;

[0008] Electronic devices in the same or different device sets are detected to obtain overlapping devices, and target devices are determined based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target devices are electronic devices that affect the normal operation of the target circuit.

[0009] In an optional implementation, electronic devices are classified based on their device types to obtain device sets corresponding to each device type, including:

[0010] Obtaining the type identification of the electronic device;

[0011] Classifying the electronic devices based on the type identification to obtain a composite polygonal device and a polygonal device, wherein the composite polygonal device includes a plurality of polygonal devices;

[0012] A first set of components is determined based on the compound polygonal components, and a second set of components is determined based on the polygonal components.

[0013] In an optional implementation, determining the first component set based on the complex polygonal component and determining the second component set based on the polygonal component includes:

[0014] Obtain the one-dimensional coordinates corresponding to each polygon in the composite polygon device, and determine the nested array according to the one-dimensional coordinates;

[0015] Based on the nested data, generating a first device set corresponding to the compound polygon device;

[0016] The one-dimensional coordinates corresponding to the polygonal device are obtained, and based on the one-dimensional coordinates, a second device set corresponding to the polygonal device is generated.

[0017] In an optional implementation, the electronic devices are classified based on their device types to obtain device sets corresponding to each device type, further comprising:

[0018] Get custom identification of electronic devices;

[0019] Determine the device type of the electronic device with the custom identifier as the target value as a custom device, wherein the custom device is used to indicate that a quantum device in the target circuit is designed according to specific requirements;

[0020] A third device set is determined based on the custom device.

[0021] In an optional implementation, the device set includes a second device set corresponding to the polygonal device, wherein the second device set includes: a rectangular device set and a non-rectangular device set;

[0022] Detect electronic devices in the same or different device sets to obtain overlapping devices, including:

[0023] Perform detection based on each non-rectangular device in the non-rectangular device set to obtain a first overlapping device;

[0024] Obtain a second overlapping device based on overlapping detection between the non-rectangular device in the non-rectangular device set and the rectangular device in the rectangular device set;

[0025] Performing overlap detection based on each rectangular device in the rectangular device set to obtain a third overlapping device;

[0026] Based on the first overlapping device, the second overlapping device, and the third overlapping device, an overlapping device is determined.

[0027] In an optional implementation, the device set includes a first device set corresponding to the complex polygon device;

[0028] Detecting electronic devices in the same or different device sets to obtain overlapping devices, further comprising:

[0029] Obtain a fourth overlapping device based on overlapping detection between the non-rectangular device in the non-rectangular device set and the complex polygonal device in the first device set;

[0030] Obtain a fifth overlapping device based on overlapping detection between the rectangular device in the rectangular device set and the complex polygonal device in the first device set;

[0031] Based on the fourth overlapping device and the fifth overlapping device, an overlapping device is determined.

[0032] In an optional implementation, detecting electronic devices in the same or different device sets to obtain overlapping devices further includes:

[0033] Obtaining the one-dimensional coordinates corresponding to the polygonal device in the second device set;

[0034] Based on the one-dimensional coordinates, polygonal devices in the second device set whose coordinate points are located in other polygonal devices are determined to obtain overlapping devices.

[0035] In an optional implementation, the device set includes a first device set corresponding to the complex polygon device;

[0036] Detecting electronic devices in the same or different device sets to obtain overlapping devices, further comprising:

[0037] Get the nested array corresponding to the composite polygonal device in the first device set;

[0038] Based on the one-dimensional coordinates corresponding to each polygon of the composite polygonal device in the nested array, detection is performed to obtain overlapping devices whose coordinate points are located in other composite polygons.

[0039] In an optional embodiment, the device set includes a custom device set;

[0040] Detecting electronic devices in the same or different device sets to obtain overlapping devices, further comprising:

[0041] Traversing the custom devices in the custom device set, obtaining device combinations that overlap with each other and whose quantity exceeds a preset threshold, and determining the device combination as a custom air bridge;

[0042] Determine overlapping devices based on custom air bridges.

[0043] In an alternative embodiment, the overlapping device comprises a custom air bridge;

[0044] Determine the target device based on overlapping devices, including:

[0045] Identify bridge pier components and bridge deck components in custom air bridges;

[0046] The distance data from the bridge pier component to each bridge deck component are determined respectively, and when the distance data are not equal, the custom air bridge is determined as the target component.

[0047] In an optional embodiment, identifying bridge pier components and bridge deck components in a custom air bridge includes:

[0048] Custom components in the custom air bridge that overlap with all remaining custom components are identified to obtain bridge pier components, and all remaining custom components are determined as bridge deck components.

[0049] In an optional embodiment, the method further includes:

[0050] Acquire device information corresponding to the target device, wherein the device information includes at least one of the following: location information, device type, and device name of the target device;

[0051] Marking the target device in the target circuit to obtain marking content;

[0052] In response to a trigger operation on the annotation, device information is displayed.

[0053] In a second aspect, the present invention provides a device detection apparatus, the device comprising:

[0054] An identification module for identifying electronic devices in a target circuit of a quantum chip;

[0055] A classification module, used for classifying electronic devices based on device types of the electronic devices to obtain a device set corresponding to each device type;

[0056] A determination module is used to detect electronic devices in the same or different device sets to obtain overlapping devices, and determine target devices based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit.

[0057] In a third aspect, the present invention provides a computer device, comprising: a memory and a processor, the memory and the processor being communicatively connected to each other, the memory storing computer instructions, and the processor executing the device detection method of the first aspect or any corresponding embodiment thereof by executing the computer instructions.

[0058] In a fourth aspect, the present invention provides a computer-readable storage medium having computer instructions stored thereon, the computer instructions being used to enable a computer to execute the device detection method of the first aspect or any corresponding embodiment thereof.

[0059] In a fifth aspect, the present invention provides a computer program product, comprising computer instructions for causing a computer to execute the device detection method of the first aspect or any corresponding embodiment thereof.

[0060] In an embodiment of the present invention, the electronic devices in the target circuit of the quantum chip can be first identified, and the electronic devices can be classified based on the device type of the electronic devices to obtain a device set corresponding to each device type. Then, the electronic devices in the same or different device sets can be detected to obtain overlapping devices, and the target device can be determined based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit, thereby realizing the automation of device overlap judgment in the quantum chip, and meeting the requirements for efficiency and accuracy of overlap judgment in the chip design process. BRIEF DESCRIPTION OF THE DRAWINGS

[0061] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0062] Figure 1 is a schematic flow chart of a device detection method according to an embodiment of the present invention;

[0063] Figure 2 is a flow chart of another device detection method according to an embodiment of the present invention;

[0064] Figure 3 is a flow chart of another device detection method according to an embodiment of the present invention;

[0065] Figure 4 is a schematic diagram of overlapping electronic devices according to an embodiment of the present invention;

[0066] Figure 5 is a schematic diagram of non-overlapping electronic devices according to an embodiment of the present invention;

[0067] Figure 6 is a schematic diagram of a custom air bridge with unequal distance data according to an embodiment of the present invention;

[0068] Figure 7 is a schematic diagram showing a quantum device superposition anomaly prompt according to an embodiment of the present invention;

[0069] Figure 8 is a structural block diagram of a device detection apparatus according to an embodiment of the present invention;

[0070] Fig. 9 It is a schematic diagram of the hardware structure of a computer device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0071] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0072] In conjunction with the application scenarios on which the execution of the device detection method depends, the application scenarios are described here.

[0073] In electronic design automation and integrated circuit layout design, device overlap is an issue that needs to be focused on. Device overlap may not only cause circuit failures, such as short circuits and signal interference, but may also affect the performance and stability of the circuit board, and even cause the circuit to burn out. Therefore, it is particularly important to detect the overlap of devices in the circuit.

[0074] Different from the device judgment method in traditional layout design tools, in quantum layout design, the layout design data structure and the traditional layout design data structure are not consistent, which makes the traditional device judgment method unable to be applied to overlap detection in quantum chips. Judging device overlap based on the unique quantum layout data structure is an urgent problem that needs to be solved.

[0075] Specifically, the electronic devices in quantum chips may no longer be electronic components in the traditional sense, but quantum bits (qubits) or other quantum system components. The states and interactions of these components are governed by the laws of quantum mechanics, so different methods are needed to describe and analyze them.

[0076] In order to solve the problem of overlap detection in quantum layout design, researchers have developed some specialized tools and methods. For example, using quantum circuit simulators to simulate the behavior of quantum circuits, judging whether there is overlap by observing the output results, or using quantum algorithms to optimize the layout to reduce the possibility of overlap. However, this device detection method often cannot meet the accuracy and efficiency requirements for overlap judgment in the quantum chip design process.

[0077] Based on this, an embodiment of the present invention provides a device detection method, which can first identify the electronic devices in the target circuit of the quantum chip, and classify the electronic devices based on the device type of the electronic devices to obtain a device set corresponding to each device type. Then, the electronic devices in the same or different device sets can be detected to obtain overlapping devices, and the target device can be determined based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit, thereby realizing the automation of device overlap judgment in the quantum chip, and meeting the requirements for efficiency and accuracy of overlap judgment in the chip design process.

[0078] According to an embodiment of the present invention, an embodiment of a device detection method is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0079] In this embodiment, a device detection method is provided, which can be used for the above-mentioned quantum chip. Figure 1 is a flow chart of a device detection method according to an embodiment of the present invention. Figure 1 As shown, the process includes the following steps:

[0080] Step S101, identifying electronic devices in a target circuit of a quantum chip.

[0081] In the embodiment of the present invention, the quantum chip is a core component that uses quantum mechanics principles such as quantum entanglement and quantum superposition to process information. The target circuit is a design circuit diagram of the quantum chip. When designing the target circuit, the electronic devices in the target circuit can be checked to quickly discover and solve possible design problems of the device, avoiding major modifications and adjustments in the later stages of the design. This not only saves time for circuit design, but also improves the overall efficiency of the design process.

[0082] Specifically, when inspecting the electronic devices in the target circuit, the electronic devices in the target circuit can be identified first, wherein the electronic devices can include basic devices, quantum devices, custom devices, etc. Here, the basic devices can include transistors, resistors, capacitors, etc., the quantum devices can include quantum dots, superconducting Josephson junctions, etc., and the custom devices are quantum devices or basic devices designed according to specific requirements in the target circuit.

[0083] Step S102: classify the electronic devices based on their device types to obtain device sets corresponding to each device type.

[0084] In the embodiment of the present invention, the device type can be used to indicate the form of the electronic device, for example, whether the electronic device is a single closed figure device or a composite device including multiple single closed figures. After the electronic devices are classified, the device set corresponding to the electronic devices of each device type can be determined according to the classification results.

[0085] Here, the device collection may include device model information corresponding to each electronic device. Here, the device model may be defined as including the name (name), device type (type), custom device type (figureType), device coordinates (List <datapoint>data), device parameters (attributenames), etc.

[0086] Step S103, detecting electronic devices in the same or different device sets to obtain overlapping devices, and determining target devices based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target devices are electronic devices that affect the normal operation of the target circuit.

[0087] In the embodiment of the present invention, during the process of performing overlap detection on electronic devices, an overlap detection rule may be firstly obtained, wherein the overlap detection rule is used to instruct to detect electronic devices in the same or different device sets to obtain overlapping devices.

[0088] For example, if the above-mentioned electronic devices include polygonal devices and compound polygonal devices, wherein the compound polygonal devices are composed of multiple single polygonal devices, then the device set includes a polygonal device set, a compound polygonal device set and a custom device set, wherein the polygonal devices include a rectangular device set and a non-rectangular device set, and the rectangular devices include custom devices, then the custom device set can be determined based on the rectangular device set.

[0089] Based on this, corresponding overlap detection rules can be formulated for the above polygon device set, compound polygon device set and custom device set. Specifically, the overlap detection rules may include: compound polygon and compound polygon overlap detection rules, non-rectangular polygon and rectangular polygon overlap detection rules, non-rectangular polygon and compound polygon overlap detection rules, rectangular polygon and rectangular polygon overlap detection rules, rectangular polygon and compound polygon overlap detection rules, rectangular polygon and rectangular polygon overlap detection rules, and custom device detection rules.

[0090] When electronic device detection is performed based on the above-mentioned overlap detection rules, taking the composite polygon and composite polygon overlap detection rules as an example, the electronic devices in the above-mentioned composite polygon device set can be detected. Specifically, overlap detection can be performed pairwise between the composite polygons in the composite polygon device set to obtain overlapping devices.

[0091] For another example, when performing electronic device detection based on the above-mentioned non-rectangular polygon and rectangular polygon overlap detection rules, the electronic devices in different device sets can be compared one by one. Specifically, the electronic devices in the non-rectangular polygon set can be overlapped with the electronic devices in the rectangular polygon set one by one to obtain overlapping devices, thereby performing real-time overlap checks during the design process and immediately providing feedback on the inspection results for the target devices, allowing designers to discover and solve problems in a timely manner and avoid major modifications and adjustments in the later stages of the design.

[0092] After determining the overlapping devices in the target circuit, illegal overlaps in the overlapping devices may be identified to obtain the target device. Here, illegal overlaps are overlapping devices that do not meet circuit design specifications and may cause the target circuit to fail to operate normally.

[0093] It can be seen from the above description that in an embodiment of the present invention, the electronic devices in the target circuit of the quantum chip can be first identified, and the electronic devices can be classified based on the device type of the electronic devices to obtain a device set corresponding to each device type. Then, the electronic devices in the same or different device sets can be detected to obtain overlapping devices, and the target device can be determined based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit, thereby realizing the automation of device overlap judgment in the quantum chip, and meeting the requirements for efficiency and accuracy of overlap judgment in the chip design process.

[0094] In this embodiment, another device detection method is provided, which can be used for the above-mentioned quantum chip. Figure 2 is a flow chart of another device detection method according to an embodiment of the present invention. Figure 2 As shown, the process includes the following steps:

[0095] Step S201, identifying electronic devices in the target circuit of the quantum chip. Figure 1 Step S101 of the illustrated embodiment will not be described in detail here.

[0096] Step S202: classify the electronic devices based on their device types to obtain device sets corresponding to each device type.

[0097] Specifically, the above step S202 includes:

[0098] Step S2021, obtaining the type identification of the electronic device.

[0099] Step S2022, classifying the electronic devices based on the type identification to obtain compound polygonal devices and polygonal devices, wherein the compound polygonal device includes a plurality of polygonal devices.

[0100] Step S2023, determining a first component set based on the complex polygonal component, and determining a second component set based on the polygonal component.

[0101] In the embodiment of the present invention, the device model information of the electronic device can be first obtained. Here, the device model information can be defined as including the name (name), device type (type), custom device type (figureType), device coordinates (List <datapoint>data), device parameters (attributenames), etc.

[0102] Then, the electronic devices can be classified based on the type identification in the device type, where the device type can include compound polygon devices and polygon devices. For example, a polygon can include a pad, and a compound polygon can include a resonant cavity and an Xmon. Specifically, the device model information can be parsed to obtain the type identification of the device type, and the devices marked as compound polygons can be classified to obtain a first device set. Similarly, the devices marked as polygons can be classified to obtain a second device set.

[0103] Step S203, detect the electronic devices in the same or different device sets to obtain overlapping devices, and determine the target device based on the overlapping devices, wherein the overlapping devices are used to indicate that there are overlapping electronic devices in some areas of the quantum chip, and the target device is the electronic device that affects the normal operation of the target circuit. For details, please refer to Figure 1 Step S103 of the illustrated embodiment will not be described in detail here.

[0104] In an embodiment of the present invention, electronic devices can be classified according to device types to obtain a first device set corresponding to complex polygonal devices and a second device set corresponding to polygonal devices, thereby formulating corresponding overlap detection rules based on the device sets to improve the inspection efficiency of the overlap check algorithm, reduce the computational complexity, and make large-scale layout design possible.

[0105] In some optional implementations, the above step S2023 includes:

[0106] Step a1, obtaining the one-dimensional coordinates corresponding to each polygon in the complex polygon device, and determining the nested array according to the one-dimensional coordinates.

[0107] Step a2: generating a first device set corresponding to the complex polygonal device based on the nested data.

[0108] Step a3, obtaining the one-dimensional coordinates corresponding to the polygonal device, and generating a second device set corresponding to the polygonal device based on the one-dimensional coordinates.

[0109] In the embodiment of the present invention, the one-dimensional coordinates corresponding to the polygonal device can be defined as the horizontal coordinate (x) and the vertical coordinate (y), that is, [(x1, y1), (x2, y2), ... (xn, yn)], where (x1, y1), (x2, y2), ... (xn, yn) can be used to indicate the position coordinates of each vertex in the polygon in the quantum chip. Specifically, the one-dimensional coordinates can be expressed as (List <datapoint>data).

[0110] In addition, the nested array corresponding to the composite polygon device may contain the one-dimensional coordinates corresponding to each polygon device, that is, {[(x1, y1), (x2, y2)], ..., [(xn-1, yn-1), (xn, yn)]}. Specifically, the nested array can be expressed as (List <List <datapoint>>data).

[0111] When determining the first device set, you can obtain the name (name), device type (type), custom device type (figureType), device coordinates (List <datapoint>data) and device parameters to generate the first device set. Similarly, when determining the second device set, the name (name), device type (type), custom device type (figureType), device coordinates (List <List <datapoint>>data) and device parameters to generate a second device set.

[0112] In the embodiment of the present invention, a device set may be generated based on the coordinates of the electronic devices, thereby providing a calculation basis for performing overlap detection between electronic devices based on the coordinates in the device set and improving the reliability of overlap detection.

[0113] In some optional implementations, the above step S102, classifying the electronic devices based on the device types of the electronic devices to obtain device sets corresponding to each device type, further includes:

[0114] Step S11, obtaining a custom identification of the electronic device.

[0115] Step S12: determining the device type of the electronic device with the custom identifier as the target value as a custom device, wherein the custom device is used to indicate that a quantum device in the target circuit is designed according to specific requirements.

[0116] Step S13, determining a third component set according to the custom components.

[0117] In an embodiment of the present invention, a custom identifier can be obtained based on a custom device type in the device model information of the electronic device, where the custom identifier can include a custom value. It should be understood that when designing an electronic device, the developer can set a custom identifier according to the device type of the electronic device.

[0118] After obtaining the custom identifier, the custom identifier can be compared with the target value to obtain a custom device. Here, the target value can be empty, that is, the electronic device with an empty custom identifier is determined as a custom device, wherein the custom device can be a polygonal device or a composite polygonal device composed of multiple polygonal devices.

[0119] In an embodiment of the present invention, custom devices in electronic devices can be identified to determine a third device set based on the custom devices. Therefore, on the basis of the overlap judgment of standard polygonal and compound polygonal devices, overlap judgment can also be performed on the custom devices, thereby achieving comprehensive coverage of all types of devices in the quantum layout.

[0120] In this embodiment, another device detection method is provided, which can be used for the above-mentioned quantum chip. Figure 3 is a flow chart of another device detection method according to an embodiment of the present invention. Figure 3 As shown, the process includes the following steps:

[0121] Step S301, identify the electronic devices in the target circuit of the quantum chip. Figure 1 Step S101 of the illustrated embodiment will not be described in detail here.

[0122] Step S302: Classify the electronic devices based on their device types to obtain device sets corresponding to each device type. Figure 1 Step S102 of the illustrated embodiment will not be described in detail here.

[0123] Step S303, detecting electronic devices in the same or different device sets to obtain overlapping devices, and determining target devices based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target devices are electronic devices that affect the normal operation of the target circuit.

[0124] Specifically, the device set includes a second device set corresponding to the polygonal device, wherein the second device set includes: a rectangular device set and a non-rectangular device set, and the step S303 includes:

[0125] Step S3031 , performing detection based on each non-rectangular device in the non-rectangular device set to obtain a first overlapping device.

[0126] Step S3032 , performing overlap detection on the non-rectangular devices in the non-rectangular device set and the rectangular devices in the rectangular device set to obtain second overlapping devices.

[0127] Step S3033: Perform overlap detection based on each rectangular device in the rectangular device set to obtain a third overlapping device.

[0128] Step S3034: determining overlapping components based on the first overlapping components, the second overlapping components, and the third overlapping components.

[0129] In the embodiment of the present invention, generally speaking, the non-rectangular device may include a quantum device and a basic device, and the rectangular device may include a custom device. When detecting the electronic devices in the second device set, overlapping detection may be performed based on the electronic devices in the rectangular device set and the non-rectangular device set.

[0130] Here, corresponding overlap detection rules can be formulated for the above-mentioned non-rectangular device set and rectangular device set. For example, when performing detection based on each non-rectangular device in the non-rectangular device set, the overlap detection rules of non-rectangular polygons and non-rectangular polygons can be used. When performing detection on non-rectangular devices in the non-rectangular device set and rectangular devices in the rectangular device set, the overlap detection rules of non-rectangular polygons and rectangular polygons can be used. When performing detection on each rectangular device in the rectangular device set, the overlap detection rules of rectangular polygons and rectangular polygons can be used.

[0131] Specifically, the electronic devices in the rectangular device set and the non-rectangular device set are detected to obtain overlapping devices, and the method further includes:

[0132] Step S21, obtaining the one-dimensional coordinates corresponding to the polygonal device in the second device set.

[0133] Step S22, based on the one-dimensional coordinates, determine the polygonal devices in the second device set whose coordinate points are located in other polygonal devices to obtain overlapping devices.

[0134] In the embodiment of the present invention, it can be seen from the above that the one-dimensional coordinate corresponding to the polygonal device is in the form of [(x1, y1), (x2, y2), ... (xn, yn)], wherein the coordinate points (x1, y1), (x2, y2), ... (xn, yn) can be used to indicate the position coordinates of each vertex in the polygon in the quantum chip.

[0135] When determining overlapping devices based on one-dimensional coordinates, the corresponding overlap detection algorithm can obtain the coordinate points of two polygonal devices respectively, and determine whether each coordinate point of one device is inside the other device. If one coordinate point takes you inside the other device, it means that the two polygonal devices are overlapping devices. If the coordinate point of one device is not inside the other device, it is determined whether each coordinate point of the other device is inside the other device. If the coordinate points passing through the two devices are not inside the other device, it means that the two polygonal devices do not overlap, otherwise the two polygonal devices are overlapping devices.

[0136] Here, the algorithm for determining whether a point is inside a polygon (including the border) can be implemented by using the ray casting algorithm. Specifically, the ray casting algorithm can emit a ray from the point to be determined in any direction (usually horizontally to the right), and then count the number of intersections between the ray and the polygon border. Here, if the number of intersections is an odd number, the point is inside the polygon; if it is an even number, the point is outside the polygon. It should be understood that a point located on a vertex or edge of a polygon will also be counted as being inside the polygon.

[0137] Specifically, Figure 4 A schematic diagram of overlapping electronic devices is shown, showing the poses of overlapping devices when overlap occurs between polygonal device pads.

[0138] In an embodiment of the present invention, the polygonal device set can be further divided into a rectangular device set and a non-rectangular device set, so as to determine a custom device set based on the rectangular device set. At the same time, the overlap algorithm is optimized, and unnecessary calculations are reduced through the overlap rules of rectangular devices and non-rectangular devices, thereby improving the efficiency of overlap checking.

[0139] In some optional implementations, the device set includes a first device set corresponding to the complex polygon device, and the step S103 of detecting electronic devices in the same or different device sets to obtain overlapping devices further includes:

[0140] Step S31, obtaining a nested array corresponding to the composite polygonal device in the first device set.

[0141] Step S32 , performing detection based on the one-dimensional coordinates corresponding to each polygon of the composite polygonal device in the nested array, and obtaining overlapping devices whose coordinate points are located in other composite polygons.

[0142] In an embodiment of the present invention, it can be seen from the above that the nested array corresponding to the composite polygonal device may contain the one-dimensional coordinates corresponding to each polygonal device, namely, {[(x1, y1), (x2, y2)], …, [(xn-1, yn-1), (xn, yn)]}, wherein [(x1, y1), (x2, y2)], …, [(xn-1, yn-1), (xn, yn)] are the coordinate points corresponding to polygonal devices 1 to polygonal devices n in the composite polygonal device.

[0143] When determining overlapping devices based on nested arrays, the composite polygon devices in the composite polygon device collection can be compared in pairs to obtain overlapping devices. Specifically, the coordinate points of the composite polygon devices on both sides can be obtained based on the nested arrays to determine whether all polygons included in one composite polygon overlap with all polygons included in the other side. If the polygons included in one composite polygon overlap with the polygons included in the other side, the two composite polygons overlap. If all polygons included in one composite polygon do not overlap with all polygons included in the other side, the composite polygons do not overlap.

[0144] Here, when comparing whether two composite polygonal devices overlap, each of the polygonal devices may be compared in turn to see whether they overlap. The specific overlap determination method is the ray method in the above steps S21-S22, which will not be described in detail here.

[0145] Specifically, Figure 4 FIG. 1 is a schematic diagram of overlapping electronic devices, which shows the position of overlapping devices when overlapping occurs between the composite polygon device resonant cavity and Xmon. Figure 5 Shown is a schematic diagram of non-overlapping electronic devices, which shows the position when there is no overlap between the composite polygonal device resonant cavity and Xmon.

[0146] In the embodiment of the present invention, overlapping components in compound polygon components can be detected based on compound polygons and compound polygon overlap detection rules, thereby optimizing the overlap algorithm, reducing unnecessary calculations, and improving the efficiency of overlap detection.

[0147] In some optional implementations, the device set includes a first device set corresponding to the complex polygon device, and the step S103 of detecting electronic devices in the same or different device sets to obtain overlapping devices further includes:

[0148] Step S31 , performing overlap detection on the non-rectangular components in the non-rectangular component set and the complex polygonal components in the first component set to obtain a fourth overlapping component.

[0149] Step S32 , performing overlap detection on the rectangular components in the rectangular component set and the complex polygonal components in the first component set to obtain a fifth overlapping component.

[0150] Step S33: determining overlapping components based on the fourth overlapping component and the fifth overlapping component.

[0151] In the embodiment of the present invention, it can be seen from the above that the nested array corresponding to the compound polygonal device can contain the one-dimensional coordinates corresponding to each polygonal device. Therefore, when determining overlapping devices based on the first device set and the polygonal device set corresponding to the compound polygonal device, the compound polygonal devices and the polygonal devices can be compared pairwise to obtain overlapping devices.

[0152] Specifically, the coordinate points of the composite polygon device can be obtained based on the nested array, and the coordinate points of the polygon device can be obtained based on the one-dimensional array. Then, based on the coordinate points, it is determined whether all polygons contained in the composite polygon overlap with the polygon. If so, the composite polygon device and the polygon device are overlapping devices. If not, the composite polygon device and the polygon device do not overlap.

[0153] It should be understood that, based on the above non-rectangular polygon and compound polygon overlap detection rules, the non-rectangular devices in the non-rectangular device set and the compound polygon devices in the first device set can be overlapped to obtain a fourth overlapping device. Based on the above rectangular polygon and compound polygon overlap detection rules, the rectangular devices in the rectangular device set and the compound polygon devices in the first device set can be overlapped to obtain a fifth overlapping device.

[0154] Here, if Figure 4 Shown is a schematic diagram of the overlap of electronic devices, which shows the posture of overlapping devices when overlap occurs between the polygonal device pad and the complex polygonal device Xmon, and when overlap occurs between the complex polygonal devices Xmon.

[0155] In the embodiment of the present invention, overlapping devices between compound polygonal devices and polygonal devices can be determined by overlapping rules, thereby further optimizing the overlapping algorithm, reducing unnecessary calculations, and improving the efficiency of overlapping checking.

[0156] In some optional implementations, the device set includes a custom device set, and the step S103 of detecting electronic devices in the same or different device sets to obtain overlapping devices further includes:

[0157] Step S41 , traversing the custom components in the custom component set to obtain component combinations that overlap with each other and whose number exceeds a preset threshold, and determining the component combination as a custom air bridge.

[0158] Step S42, determining overlapping components according to the customized air bridge.

[0159] In an embodiment of the present invention, the custom air bridge may be a legal overlapping device, and the custom air bridge may be composed of three or more overlapping rectangles, one of which is a bridge deck, and the bridge deck intersects with the remaining rectangles to form a bridge-type device.

[0160] When traversing the custom devices in the custom device set, a combination of devices that overlap each other and whose number exceeds a preset threshold can be obtained, where the preset threshold can be 2. Specifically, the custom devices in the custom collection can be identified as the current device and the traversal device through an index algorithm, and the current device is used as an identifier to search for overlapping custom devices in the traversal device, and the index set is initialized before each traversal. If an overlapping device of the current device is found in the traversal device, the overlapping device is added to the index set. When the number of overlapping devices in the index set reaches or exceeds 2, it means that the combination of the current device and the overlapping device is a custom air bridge.

[0161] In an embodiment of the present invention, a custom air bridge can be determined based on a custom device set, wherein the custom air bridge can be a legal overlapping device. Therefore, it is necessary to further judge the custom air bridge to determine whether the custom air bridge is a target device, thereby implementing special judgment processing for the custom air bridge to achieve comprehensive coverage of all types of devices in the quantum layout and improve the accuracy of overlapping judgment.

[0162] In some optional embodiments, the overlapping device includes a custom air bridge, and the step S103 of determining the target device based on the overlapping device includes:

[0163] Step S51, identifying bridge pier components and bridge deck components in the custom air bridge.

[0164] Step S52, respectively determining the distance data from the bridge pier component to each bridge deck component, and when the distance data are not equal, determining the custom air bridge as the target component.

[0165] In the embodiment of the present invention, the pier component intersects with one side of the bridge deck component to form a custom air bridge. Specifically, the above step S51, identifying the pier component and the bridge deck component in the custom air bridge, includes:

[0166] The custom components in the custom air bridge that overlap with all remaining custom components are identified to obtain the bridge pier components, and all remaining custom components are determined as bridge deck components.

[0167] In the embodiment of the present invention, the bridge deck device should overlap with all the bridge pier devices, so the index set corresponding to each electronic device in the custom air bridge can be obtained. If the number of electronic devices in the custom air bridge is N, the electronic device with an overlapping device of 1 in the index set can be determined as the bridge pier device, and the electronic device with an overlapping device of N-1 in the index set can be determined as the bridge deck device.

[0168] Next, it can be further determined whether the structure of the custom air bridge is legal. If it is not legal, it is a target device. Here, if the horizontal distance and vertical distance from the bridge deck device to each bridge pier device are equal, the custom air bridge is a legal overlapping device. If not, the custom air bridge is a target device.

[0169] Specifically, the coordinate points of each electronic device in the custom air bridge can be obtained based on the above custom device set, so as to calculate the horizontal distance and vertical distance from the center point of the bridge deck device to the center point of each pier device based on the coordinate points, and determine whether they are equal.

[0170] Here, if Figure 6 The diagram shows a custom air bridge with unequal distance data, where the distance data from the bridge pier component to the two bridge deck components are unequal, and therefore the custom air bridge is a target component.

[0171] In an embodiment of the present invention, the pier devices and bridge deck devices in a custom air bridge can be identified to determine whether the custom air bridge is evenly distributed based on the distance data from the pier devices to each bridge deck device. If the distance data are equal, it indicates a uniform distribution, otherwise it indicates an uneven distribution, thereby intelligently expanding the traditional overlap check algorithm to adapt to the judgment of whether the custom air bridge meets the design specifications.

[0172] In some optional embodiments, the above Figure 1 The corresponding embodiments also include:

[0173] Step S61, obtaining device information corresponding to the target device, wherein the device information includes at least one of the following: location information, device type and device name of the target device.

[0174] Step S62, marking the target device in the target circuit to obtain the marking content.

[0175] Step S63, in response to the triggering operation on the annotation, display the device information.

[0176] In an embodiment of the present invention, the location information of the target device may include a one-dimensional coordinate and a nested array, and the device type may include a compound polygon device, a polygon device, and a custom device. Specifically, the device model information may be obtained based on the device set, and the above-mentioned location information, device type, and device name may be obtained based on the device model information.

[0177] For example, if the target device is two pad devices, the device type can be a polygonal device, where the one-dimensional coordinate corresponding to pad1 can be [(-1191.6666666666665, -1223.33333333333335), (-1411.6666666666665, -1373.3333333333335)], and the one-dimensional coordinate corresponding to pad2 can be [(-1123.2142857142858, -1461.904761904762), (-1343.2142857142858, -1611.904761904762)].

[0178] Next, the target device in the target circuit can be marked in the layout interface, for example, by displaying the target device in a key color. Specifically, the target device can be located in the target circuit based on the device information to mark the target device, and an overlap exception prompt can be generated based on the marked content. Then, in the layout interface, the designer can trigger the overlap exception prompt, for example, by clicking on the marked content to display the device information of the target device.

[0179] Here, if Figure 7 Shown is a schematic diagram showing the overlap anomaly prompt of a quantum device, wherein the target device includes overlapping pads and pads, overlapping resonant cavities and resonant cavities, overlapping pads and resonant cavities, overlapping pads and Xmon, and overlapping resonant cavities and resonant cavities.

[0180] In an embodiment of the present invention, the target device in the target circuit can be marked and the device information of the target device can be output to prompt the designer to modify the design layout of the target circuit in a timely manner, avoiding major modifications and adjustments due to overlapping problems in the later stage of the design, and improving the overall efficiency of the design process.

[0181] In summary, in an embodiment of the present invention, the electronic devices in the target circuit of the quantum chip can be first identified, and the electronic devices can be classified based on the device type of the electronic devices to obtain a device set corresponding to each device type. Then, the electronic devices in the same or different device sets can be detected to obtain overlapping devices, and the target device can be determined based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit, thereby realizing the automation of device overlap judgment in the quantum chip, and meeting the requirements for efficiency and accuracy of overlap judgment in the chip design process.

[0182] In this embodiment, a device detection device is also provided, which is used to implement the above-mentioned embodiments and preferred implementation modes, and the descriptions that have been made will not be repeated. As used below, the term "module" can implement a combination of software and / or hardware of a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceivable.

[0183] This embodiment provides a device detection apparatus, such as Figure 8 As shown, including:

[0184] An identification module 801 is used to identify electronic devices in a target circuit of a quantum chip;

[0185] A classification module 802 is used to classify electronic devices based on device types of the electronic devices to obtain device sets corresponding to each device type;

[0186] The determination module 803 is used to detect electronic devices in the same or different device sets to obtain overlapping devices, and determine the target device based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in some areas of the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit.

[0187] In some optional implementations, the classification module 802 is further configured to:

[0188] Obtaining the type identification of the electronic device;

[0189] Classifying the electronic devices based on the type identification to obtain a composite polygonal device and a polygonal device, wherein the composite polygonal device includes a plurality of polygonal devices;

[0190] A first set of components is determined based on the compound polygonal components, and a second set of components is determined based on the polygonal components.

[0191] In some optional implementations, the classification module 802 is further configured to:

[0192] Obtain the one-dimensional coordinates corresponding to each polygon in the composite polygon device, and determine the nested array according to the one-dimensional coordinates;

[0193] Based on the nested data, generating a first device set corresponding to the compound polygon device;

[0194] The one-dimensional coordinates corresponding to the polygonal device are obtained, and based on the one-dimensional coordinates, a second device set corresponding to the polygonal device is generated.

[0195] In some optional implementations, the classification module 802 is further configured to:

[0196] Get custom identification of electronic devices;

[0197] Determine the device type of the electronic device with the custom identifier as the target value as a custom device, wherein the custom device is used to indicate that a quantum device in the target circuit is designed according to specific requirements;

[0198] A third device set is determined based on the custom device.

[0199] In some optional implementations, the device set includes a second device set corresponding to the polygonal device, wherein the second device set includes: a rectangular device set and a non-rectangular device set; the determination module 803 is further used to:

[0200] Perform detection based on each non-rectangular device in the non-rectangular device set to obtain a first overlapping device;

[0201] Obtain a second overlapping device based on overlapping detection between the non-rectangular device in the non-rectangular device set and the rectangular device in the rectangular device set;

[0202] Performing overlap detection based on each rectangular device in the rectangular device set to obtain a third overlapping device;

[0203] Based on the first overlapping device, the second overlapping device, and the third overlapping device, an overlapping device is determined.

[0204] In some optional implementations, the component set includes a first component set corresponding to the complex polygonal component; the determination module 803 is further used to:

[0205] Obtain a fourth overlapping device based on overlapping detection between the non-rectangular device in the non-rectangular device set and the complex polygonal device in the first device set;

[0206] Obtain a fifth overlapping device based on overlapping detection between the rectangular device in the rectangular device set and the complex polygonal device in the first device set;

[0207] Based on the fourth overlapping device and the fifth overlapping device, an overlapping device is determined.

[0208] In some optional implementations, the determination module 803 is further configured to:

[0209] Obtaining the one-dimensional coordinates corresponding to the polygonal device in the second device set;

[0210] Based on the one-dimensional coordinates, polygonal devices in the second device set whose coordinate points are located in other polygonal devices are determined to obtain overlapping devices.

[0211] In some optional implementations, the component set includes a first component set corresponding to the complex polygonal component; the determination module 803 is further used to:

[0212] Obtain a nested array corresponding to the composite polygonal device in the first device set;

[0213] Based on the one-dimensional coordinates corresponding to each polygon of the composite polygonal device in the nested array, detection is performed to obtain overlapping devices whose coordinate points are located in other composite polygons.

[0214] In some optional implementations, the device set includes a custom device set; the determination module 803 is further configured to:

[0215] Traversing the custom devices in the custom device set, obtaining device combinations that overlap with each other and whose quantity exceeds a preset threshold, and determining the device combination as a custom air bridge;

[0216] Determine overlapping devices based on custom air bridges.

[0217] In some optional embodiments, the overlapping device includes a custom air bridge; the determination module 803 is further configured to:

[0218] Identify bridge pier components and bridge deck components in custom air bridges;

[0219] The distance data from the bridge pier component to each bridge deck component are determined respectively, and when the distance data are not equal, the custom air bridge is determined as the target component.

[0220] In some optional implementations, the determination module 803 is further configured to:

[0221] The custom components in the custom air bridge that overlap with all remaining custom components are identified to obtain the bridge pier components, and all remaining custom components are determined as bridge deck components.

[0222] In some optional embodiments, the device is also used for:

[0223] Acquire device information corresponding to the target device, wherein the device information includes at least one of the following: location information, device type, and device name of the target device;

[0224] Marking the target device in the target circuit to obtain marking content;

[0225] In response to a trigger operation on the annotation, device information is displayed.

[0226] The further functional description of each of the above modules and units is the same as that of the above corresponding embodiments and will not be repeated here.

[0227] The device detection apparatus in this embodiment is presented in the form of a functional unit, where the unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and memory that executes one or more software or fixed programs, and / or other devices that can provide the above functions.

[0228] The embodiment of the present invention also provides a computer device having the above Figure 8 The device detection device shown.

[0229] See also Fig. 9 , Fig. 9 is a schematic diagram of the structure of a computer device provided by an optional embodiment of the present invention, such as Fig. 9 As shown, the computer device includes: one or more processors 10, a memory 20, and interfaces for connecting various components, including high-speed interfaces and low-speed interfaces. Various components are connected to each other using different buses for communication, and can be installed on a common mainboard or installed in other ways as needed. The processor can process the instructions executed in the computer device, including instructions stored in or on the memory to display the graphical information of the GUI on an external input / output device (such as, a display device coupled to the interface). In some optional embodiments, if necessary, multiple processors and / or multiple buses can be used together with multiple memories and multiple memories. Similarly, multiple computer devices can be connected, and each device provides some necessary operations (for example, as a server array, a group of blade servers, or a multi-processor system). Fig. 9 A processor 10 is taken as an example.

[0230] The processor 10 may be a central processing unit, a network processor or a combination thereof. The processor 10 may further include a hardware chip. The hardware chip may be a dedicated integrated circuit, a programmable logic device or a combination thereof. The programmable logic device may be a complex programmable logic device, a field programmable gate array, a general purpose array logic or any combination thereof.

[0231] The memory 20 stores instructions executable by at least one processor 10, so that at least one processor 10 executes the method shown in the above embodiment.

[0232] The memory 20 may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required for at least one function; the data storage area may store data created according to the use of the computer device, etc. In addition, the memory 20 may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some optional embodiments, the memory 20 may optionally include a memory remotely arranged relative to the processor 10, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0233] The memory 20 may include a volatile memory, such as a random access memory; the memory may also include a non-volatile memory, such as a flash memory, a hard disk or a solid state drive; the memory 20 may also include a combination of the above types of memory.

[0234] The computer device further comprises a communication interface 30 for the computer device to communicate with other devices or a communication network.

[0235] The embodiment of the present invention also provides a computer-readable storage medium. The method according to the embodiment of the present invention can be implemented in hardware, firmware, or can be implemented as a computer code that can be recorded in a storage medium, or can be implemented as a computer code that is originally stored in a remote storage medium or a non-temporary machine-readable storage medium and will be stored in a local storage medium through a network download, so that the method described herein can be stored in such software processing on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only storage memory, a random access memory, a flash memory, a hard disk or a solid-state hard disk, etc.; further, the storage medium can also include a combination of the above types of memories. It can be understood that a computer, a processor, a microprocessor controller, or programmable hardware includes a storage component that can store or receive software or computer code. When the software or computer code is accessed and executed by a computer, a processor, or hardware, the method shown in the above embodiment is implemented.

[0236] A part of the present invention may be applied as a computer program product, such as a computer program instruction, which, when executed by a computer, can call or provide the method and / or technical solution according to the present invention through the operation of the computer. Those skilled in the art should understand that the existence of the computer program instruction in a computer-readable medium includes, but is not limited to, a source file, an executable file, an installation package file, etc., and accordingly, the way in which the computer program instruction is executed by the computer includes, but is not limited to: the computer directly executes the instruction, or the computer compiles the instruction and then executes the corresponding compiled program, or the computer reads and executes the instruction, or the computer reads and installs the instruction and then executes the corresponding installed program. Here, the computer-readable medium may be any available computer-readable storage medium or communication medium accessible to the computer.

[0237] Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations are all within the scope defined by the appended claims.< / datapoint> < / datapoint> < / datapoint> < / datapoint> < / datapoint> < / datapoint>

Claims

1. A device detection method, characterized in that: The method comprises: Identify electronic devices in the target circuit of the quantum chip; Classifying the electronic devices based on device types of the electronic devices to obtain device sets corresponding to each device type; Detecting electronic devices in the same or different device sets to obtain overlapping devices, and determining a target device based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices overlapping each other in a partial area of ​​the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit; Wherein, the overlapping device includes a custom air bridge, and determining the target device based on the overlapping device includes: Identifying bridge pier components and bridge deck components in the custom air bridge; respectively determining the distance data from the bridge pier device to each of the bridge deck devices, and determining the custom air bridge as the target device when the distance data are not equal; The electronic devices are classified based on the device types of the electronic devices to obtain a device set corresponding to each device type, including: Obtaining a type identification of the electronic device; Classifying the electronic devices based on the type identification to obtain a complex polygonal device and a polygonal device, wherein the complex polygonal device includes a plurality of polygonal devices; Determine a first set of components based on the complex polygonal component, and determine a second set of components based on the polygonal component; The device set includes a custom device set; The detecting of the electronic devices in the same or different device sets to obtain overlapping devices further includes: Traversing the custom devices in the custom device set to obtain a combination of devices that overlap with each other and whose number exceeds a preset threshold, and determining the combination of devices as a custom air bridge; The overlapping device is determined based on the custom air bridge.

2. The method according to claim 1, characterized in that The determining of the first component set based on the complex polygonal component and the determining of the second component set based on the polygonal component include: Obtaining the one-dimensional coordinates corresponding to each polygon in the composite polygon device, and determining a nested array according to the one-dimensional coordinates; Based on the nested array, generating a first device set corresponding to the complex polygon device; The one-dimensional coordinates corresponding to the polygonal device are acquired, and based on the one-dimensional coordinates, a second device set corresponding to the polygonal device is generated.

3. The method according to claim 1, characterized in that The classifying the electronic devices based on the device types of the electronic devices to obtain a device set corresponding to each device type also includes: Obtaining a custom identification of the electronic device; Determine the device type of the electronic device with the custom identifier as the target value as a custom device, wherein the custom device is used to indicate that a quantum device in the target circuit is designed according to specific requirements; A third component set is determined according to the custom components.

4. The method according to claim 1, characterized in that: The device set includes a second device set corresponding to polygonal devices, wherein the second device set includes: a rectangular device set and a non-rectangular device set; The detecting of electronic devices in the same or different device sets to obtain overlapping devices includes: Perform detection based on each non-rectangular device in the non-rectangular device set to obtain a first overlapping device; Obtaining a second overlapping device based on overlapping detection between the non-rectangular devices in the non-rectangular device set and the rectangular devices in the rectangular device set; Performing overlap detection based on each rectangular device in the set of rectangular devices to obtain a third overlapping device; The overlapping device is determined based on the first overlapping device, the second overlapping device, and the third overlapping device.

5. The method according to claim 4, characterized in that The device set includes a first device set corresponding to the complex polygon device; The detecting of the electronic devices in the same or different device sets to obtain overlapping devices further includes: Obtain a fourth overlapping device based on overlapping detection between the non-rectangular device in the non-rectangular device set and the complex polygonal device in the first device set; Obtain a fifth overlapping device based on overlapping detection between the rectangular device in the rectangular device set and the complex polygonal device in the first device set; The overlapping device is determined based on the fourth overlapping device and the fifth overlapping device.

6. The method according to claim 4, characterized in that The detecting of the electronic devices in the same or different device sets to obtain overlapping devices further includes: Obtaining the one-dimensional coordinates corresponding to the polygonal device in the second device set; Based on the one-dimensional coordinates, polygonal devices in the second device set whose coordinate points are located in other polygonal devices are determined to obtain the overlapping devices.

7. The method according to claim 1, characterized in that The device set includes a first device set corresponding to the complex polygon device; The detecting of the electronic devices in the same or different device sets to obtain overlapping devices further includes: Obtain a nested array corresponding to the composite polygonal device in the first device set; Based on the one-dimensional coordinates corresponding to each polygon of the compound polygonal device in the nested array, detection is performed to obtain overlapping devices whose coordinate points are located in other compound polygons.

8. The method according to claim 1, characterized in that The identifying of the bridge pier components and the bridge deck components in the custom air bridge includes: The custom components in the custom air bridge that overlap with all remaining custom components are identified to obtain bridge pier components, and all remaining custom components are determined as the bridge deck components.

9. The method according to claim 1, characterized in that: The method further comprises: Acquire device information corresponding to the target device, wherein the device information includes at least one of the following: location information, device type, and device name of the target device; Marking the target device in the target circuit to obtain marking content; In response to a triggering operation on the annotation, the device information is displayed.

10. A device detection apparatus, characterized in that: The device comprises: An identification module for identifying electronic devices in a target circuit of a quantum chip; A classification module, used for classifying the electronic devices based on the device types of the electronic devices to obtain a device set corresponding to each device type; A determination module, used to detect electronic devices in the same or different device sets to obtain overlapping devices, and determine the target device based on the overlapping devices, wherein the overlapping devices are used to indicate that there are electronic devices that overlap each other in a partial area of ​​the quantum chip, and the target device is an electronic device that affects the normal operation of the target circuit, wherein the overlapping devices include a custom air bridge, and the determination of the target device based on the overlapping devices includes: identifying the pier device and the bridge deck device in the custom air bridge; respectively determining the distance data from the pier device to each of the bridge deck devices, and when the distance data are not equal, determining the custom air bridge as the target device; The classification module is specifically used to obtain the type identification of the electronic device; Classifying the electronic devices based on the type identification to obtain a complex polygonal device and a polygonal device, wherein the complex polygonal device includes a plurality of polygonal devices; Determine a first set of components based on the complex polygonal component, and determine a second set of components based on the polygonal component; The device set includes a custom device set; The determination module is further used to traverse the custom devices in the custom device set to obtain a combination of devices that overlap with each other and whose number exceeds a preset threshold, and determine the combination of devices as a custom air bridge; The overlapping device is determined based on the custom air bridge.

11. A computer device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the device detection method according to any one of claims 1 to 9 by executing the computer instructions.

12. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a computer to execute the device detection method according to any one of claims 1 to 9.

13. A computer program product, characterized in that The device comprises computer instructions, wherein the computer instructions are used to cause a computer to execute the device detection method according to any one of claims 1 to 9.

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