A memory card testing system and a testing method

Abstract

The present invention relates to the technical field of memory cards, and specifically to a memory card testing system and a testing method. The system includes a server, a switch, a display screen, a test board, and a test machine. The server is communicatively connected to the switch, and the switch is communicatively connected to the test machine and the display screen respectively. A plurality of test boards are arranged on the test machine, and the test boards are used for installing the memory cards to be tested. The server has testing software. The server controls the test machine to test the memory cards through the testing software and displays the test results on the display screen. The system further includes a base. The test machine is installed on the surface of the base, and a transportation component is installed on the base. A connection block is installed on the transportation component. The purpose of the present invention is to solve the problem that a memory card testing system is needed, which can process multiple memory card tests in parallel and shorten the test cycle.

Description

Technical Field

[0001] The present invention relates to the technical field of memory cards, and particularly to a memory card testing system and a testing method. Background Art

[0002] Memory cards are widely used in the fields of consumer electronics, automotive electronics, security monitoring, and industrial control, and can be used to store data and programs. In order to ensure that memory cards can maintain high performance and stability in various usage scenarios, it is necessary to conduct tests on memory cards such as read and write speed tests, capacity verification, durability tests, and error rate detection. Existing memory card testing systems need to meet the testing requirements for large-scale and rapid production of memory cards to meet market demands.

[0003] For example, Publication No.: CN101604272B discloses a memory card testing device for performing automated operations to test memory cards. The memory card testing device includes a host, a database, a processing unit, and an interface. The host is used to access a memory card. The database maintains multiple test script files. The processing unit is coupled to the database and selects a test item from a test script file according to a device identification value corresponding to a device under test and a communication protocol associated with the memory card. The interface is connected to the processing unit and the host and is used to cause the host to execute at least one memory card command on the memory card according to the test item.

[0004] In today's technological development environment, the production scale of memory cards is becoming increasingly large. Manufacturers produce a large number of memory cards every day. The traditional single-card testing method is extremely inefficient and can no longer adapt to the rhythm of large-scale production. In order to ensure that each memory card put on the market meets the quality standards, it is necessary to test each memory card. The traditional single-card testing method often takes a lot of time. Therefore, a memory card testing system that can process multiple memory card tests in parallel and shorten the testing cycle is needed. Summary of the Invention

[0005] The purpose of the present invention is to provide a memory card testing system and a testing method to solve the problem of needing a memory card testing system that can process multiple memory card tests in parallel and shorten the testing cycle.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] A memory card testing system includes a server, a switch, a display screen, test boards and a test machine. The server is communicatively connected to the switch. The switch is respectively communicatively connected to the test machine and the display screen. A plurality of test boards are arranged on the test machine. The test boards are used to install the memory cards to be tested. The server has test software. The server controls the test machine to test the memory cards through the test software and displays the test results on the display screen.

[0008] Preferably, it further includes a base. The test machine is installed on the surface of the base. A transportation component is installed on the base. A connecting block is installed on the transportation component. An electric gripper for clamping the memory card is installed at the bottom end of the connecting block.

[0009] Preferably, a collection box is installed on the left side of each test board. A sensor is installed on the surface of the connecting block. The sensor is communicatively connected to the electric gripper.

[0010] Preferably, a T-shaped slider is fixedly connected to the top end of the electric gripper. A T-shaped chute for the T-shaped slider to slide leftward is cooperatively opened at the bottom end of the connecting block. A first spring is fixedly connected between the T-shaped slider and the wall of the T-shaped chute.

[0011] Preferably, a lifting column is movably inserted into the top end of the test machine. A lifting groove for the lifting column to be vertically inserted is cooperatively opened on the top surface of the test machine. The lifting column is located on the right side of the test board, and the number of the lifting columns corresponds to the slots on the test board one by one. A third electric push rod is installed on the surface of each lifting column.

[0012] Preferably, a docking rod is fixedly connected to the right end of each electric gripper. A docking chute for the docking rod to move left and right is cooperatively opened at the top of each lifting column. A docking block that can slide left and right is connected in each docking chute. The docking block and the docking rod are detachably connected.

[0013] Preferably, a control module is arranged in each lifting column. The control module is used to control the installation and disassembly between the docking block and the docking rod. The control module is communicatively connected to the server. The control module is communicatively connected to the sensor.

[0014] A memory card testing method is carried out by using the above-mentioned memory card testing system. The specific steps are as follows:

[0015] A. Drive the connecting block to move through the transportation component. The movement of the connecting block drives the electric gripper holding the memory card to move and transport. During the transportation process, it passes through the test machine until the memory card stops moving after aligning with the position of the slot on the test board. Then, when the transportation component drives the connecting block and the electric gripper to move downward, the memory card is inserted into the test board to prepare for testing;

[0016] B. The server sends the configuration parameters required for testing through the test software to send a control signal. The signal is sent to the test machine through the switch. The test machine sends the obtained test configuration parameter information control signal to the test board. The test board performs corresponding configuration test item operations according to the test configuration parameters.

[0017] C. When the test system completes the test of the storage card, the feedback data signal is transmitted back to the test board, then to the test machine, and finally transmitted to the server through the switch for storage, analysis, and processing. The test results generated by the server are displayed to the user through the display.

[0018] D. The server analyzes and processes the information of the problematic storage card and sends it to the control module in the lifting column at its corresponding position. The control module connects the docking rod and the docking block.

[0019] E. After the test, the transport component drives the connecting block and the electric gripper to move upward. Among them, the electric gripper clamping the defective card will drive the lifting column to move upward through the docking rod. When the storage card is pulled out of the test board, the third electric push rod on the moving lifting column is started to extend, pushing the defective card to move sideways. As the defective card moves, its corresponding electric gripper also moves. When the sensor on the connecting block senses that the defective card moves above the collection box, it transmits the information to the electric gripper, causing the electric gripper to release the clamping of the defective card, and the defective card falls into the collection box for collection.

[0020] F. After the electric gripper releases the clamping of the defective card, the electric gripper is reset. At the same time, the control module separates the docking rod and the docking block. At this time, the lifting column has no restriction and will automatically drop and reset.

[0021] G. The transport component drives the remaining good storage cards to move for transportation.

[0022] Compared with the prior art, the beneficial effects of the present invention are:

[0023] 1. The test system can be internally provided with multiple test boards. Each test board has its own independent circuit design and sensors, and can independently and simultaneously test multiple storage cards. This parallel processing ability is particularly important when processing a large number of samples, and can significantly improve the test efficiency and test ability, as well as shorten the test cycle.

[0024] 2. The independent modular design of the test board makes maintenance and upgrading easier, greatly enhancing the flexibility of the test system. It can not only be quickly adjusted or replaced according to market dynamics and customers' customized requirements, but also measures such as replacing the test board for testing different types of memory cards can be taken. This independently designed test board can make the test part relatively independent, facilitating the later maintenance process and reducing the maintenance cost. When a certain test board fails, it can be quickly replaced without affecting the normal operation of other test boards.

[0025] 3. The test system has the ability of automated testing. It can be set according to the configuration parameters issued by the server, execute the scripts of the test software, collect data related to the test results, and automatically feedback them back to the server through the switch, enabling the server to analyze the test results and generate test reports. This automated testing function not only reduces the workload of the test personnel, but also improves the efficiency and accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 is the structural schematic diagram of the whole invention;

[0027] Figure 2 for the present invention Figure 1 is the enlarged view of part A in;

[0028] Figure 3 is the structural schematic diagram of the vertical section of the connection block of the present invention;

[0029] Figure 4 is the structural schematic diagram of the partial vertical section of the lifting column of the present invention;

[0030] Figure 5 is the structural schematic diagram of the partial horizontal section of the lifting column of the present invention;

[0031] Figure 6 is the structural schematic diagram of the docking block of the present invention;

[0032] Figure 7 is the structural schematic diagram of the connection between the docking rod and the docking block of the present invention;

[0033] Figure 8 is the structural schematic diagram of the test board of the present invention.

[0034] In the figure: 1, base; 2, support frame; 3, limit track; 4, suspension plate; 5, connecting rod; 6, electric conveyor; 7, guide track; 8, limit strut; 9, first electric push rod; 10, connecting block; 11, T-shaped chute; 12, first spring; 13, T-shaped slider; 14, electric gripper; 15, docking rod; 16, embedding groove; 17, embedding block; 18, docking block; 19, limit slide plate; 20, limit chute; 21, second spring; 22, lifting column; 23, second electric push rod; 24, limit baffle; 25, sliding groove; 26, third electric push rod; 27, lifting chute; 28, collection box; 29, test board card; 30, test machine platform; 31, docking chute. Detailed implementation manner

[0035] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0036] Please refer to Figures 1 to 8 , the present invention provides a technical solution.

[0037] A storage card testing system includes a server, a switch, a display screen, a test board card 29 and a test machine platform 30. The server is communicatively connected to the switch. The switch is communicatively connected to the test machine platform 30 and the display screen respectively. A plurality of test board cards 29 are arranged on the test machine platform 30. The test machine platform 30 is communicatively connected to the test board card 29. The test board card 29 is used to install the storage card to be tested. Each test board card 29 has an independent power supply to avoid power interference between different test board cards 29. The input and output signals of each test board card 29 communicate with the test machine platform 30 through independent interfaces to avoid signal crosstalk. The server has test software for controlling the test machine platform 30 to test the storage card and displaying the test results on the display screen. For example, the test software can adopt a graphical interface to display the status and test progress of each test board card 29 on the display. The user can operate by clicking the corresponding icons or menus on the display.

[0038] The test system can be built-in with multiple test boards 29. Each test board 29 has its own independent circuit design and sensors, and can independently and simultaneously test multiple memory cards. This parallel processing ability is particularly important when dealing with a large number of samples, which can significantly improve the test efficiency and test capacity, as well as shorten the test cycle. Moreover, the independent modular design of the test board 29 makes maintenance and upgrade easier, greatly enhancing the flexibility of the test system. It can not only be quickly adjusted or replaced according to market dynamics and customers' customized requirements, but also take measures such as replacing the test board 29 for testing different types of memory cards. This independently designed test board 29 can make the test part relatively independent, facilitating the later maintenance process and reducing the maintenance cost. When a certain test board 29 fails, it can be quickly replaced without affecting the normal operation of other test boards 29;

[0039] The test system has the ability of automated testing. It can be set according to the configuration parameters sent by the server, execute the scripts of the test software, collect the data related to the test results, and automatically feedback them back to the server through the switch, enabling the server to analyze the test results and generate test reports. This automated testing function not only reduces the workload of the test personnel, but also improves the test efficiency and accuracy.

[0040] Furthermore, the server has a data management and analysis function module, which can obtain the test result data from the test machine 30 and centrally store it in the log database of the server. Through the data management and analysis function module inside the server, in-depth analysis and mining of the data are carried out, which helps to discover potential problems and trends, providing strong support for the optimization and improvement of the memory card.

[0041] As the control center of the test system, the server is used to remotely configure the test items of the test machine 30, as well as receive, process and analyze the test result data. The server transmits the information to the switch, and the test machine 30 obtains the configuration parameter information from the switch, etc., to achieve the control of the test process by the server.

[0042] The test software mainly uses test software such as program card opening, H2 test, and H5 test to detect relevant test parameter information such as the capacity size, read speed, and number of bad blocks of the memory card, ensuring the quality assurance of memory card production.

[0043] It also includes a base 1. The test machine 30 is installed on the surface of the base 1. A transportation component is installed on the base 1, and a connecting block 10 is installed on the transportation component. An electric gripper 14 for clamping the memory card is installed at the bottom of the connecting block 10. The memory card is clamped by the electric gripper 14 and then transported by the transportation component, which can carry the memory card and move it to the test machine 30 for testing. After testing, it can carry the memory card and move it away.

[0044] Further, the transportation component includes a limit track 3, a suspension plate 4, a connecting rod 5, an electric transporter 6 and a guiding track 7. A support frame 2 is fixedly installed at the top end of the base 1. Both the limit track 3 and the guiding track 7 are fixedly connected to the support frame 2. The guiding track 7 is located above the limit track 3. A limit guide rail for the sliding of the suspension plate 4 is cooperatively provided on the inner surface of the limit track 3. The connecting rod 5 is fixedly installed at the center position of the top end of the suspension plate 4. The top end of the connecting rod 5 is rotatably connected to the center position of the bottom end of the electric transporter 6. The guiding track 7 is used for the electric transporter 6 to move along its surface. By starting the electric transporter 6 to move along the track of the guiding track 7, the connecting rod 5 is driven to move. The movement of the connecting rod 5 drives the suspension plate 4 to move along the track of the limit track 3. The connecting block 10 is connected to the suspension plate 4, so that the transportation component can move the connecting block 10. A limit support rod 8 is fixedly installed at the inner corner of the turning point on the guiding track 7. The limit support rod 8 is used to support the electric transporter 6 when the electric transporter 6 turns. By providing the limit support rod 8 on the inner side of the corner of the guiding track 7, the electric transporter 6 can be supported when the electric transporter 6 turns, preventing the electric transporter 6 from tilting when turning.

[0045] Further, a plurality of vertically arranged first electric push rods 9 are fixedly installed at the bottom end of the suspension plate 4. The telescopic end of each first electric push rod 9 is fixedly connected to a connecting block 10. By providing the first electric push rods 9 and starting the first electric push rods 9 to expand and contract, the connecting block 10 is driven to move up and down. The up and down movement of the connecting block 10 drives the electric gripper 14 to move up and down, so that the storage card can be driven to move up and down, which is beneficial to realizing the automatic plugging and unplugging of the storage card to the test board card 29.

[0046] A collection box 28 is installed on the left side of each test board card 29. The collection box 28 is used to catch the storage card dropped from the electric gripper 14. A sensor is installed on the surface of the connecting block 10. The sensor is communicatively connected to the electric gripper 14. When the sensor detects that the electric gripper 14 moves a certain distance to the left, this distance is the distance for the storage card to move above the collection box 28. At this time, the sensor sends a signal to the electric gripper 14. After receiving this signal, the electric gripper 14 releases the clamping of the storage card, so that the storage card falls into the collection box 28. By setting like this, when the test result of the storage card clamped under the electric gripper 14 is a bad card, the interface moves to the left through the electric gripper 14 and throws the bad card into the collection box 28, which is beneficial to saving the step of screening out the bad card.

[0047] Further, a T-shaped slider 13 is fixedly connected to the top end of the electric gripper 14. A T-shaped chute 11 for the T-shaped slider 13 to slide leftward is cooperatively provided at the bottom end of the connecting block 10. The sensor is an infrared sensor. When the T-shaped slider 13 moves below the infrared sensor, the infrared rays emitted by the infrared sensor will produce a specific change when reflected back, so that it can be determined that the T-shaped slider 13 has moved below the sensor. At this time, the moving distance of the electric gripper 14 is the distance for the storage card to move above the collection box 28. A first spring 12 is fixedly connected between the T-shaped slider 13 and the wall of the T-shaped chute 11. By providing the first spring 12, when the external force on the surface of the electric gripper 14 is lost, under the elastic force of the first spring 12, it can automatically move rightward to reset.

[0048] A lifting column 22 is movably inserted at the top end of the testing machine table 30. A lifting groove 27 for the lifting column 22 to be vertically inserted is cooperatively provided on the top surface of the testing machine table 30. The lifting column 22 is located on the right side of the test board 29, and the number of the lifting columns 22 corresponds to the slots on the test board 29 one by one. A third electric push rod 26 is installed on the surface of each lifting column 22. When the storage card is moved upward and pulled out, by moving the lifting column 22 upward as well, and then after the storage card is completely pulled out, by starting the third electric push rod 26 to extend, the storage card and the electric gripper 14 are pushed to move leftward.

[0049] A docking rod 15 is fixedly connected to the right end of each electric gripper 14. A docking chute 31 for the docking rod 15 to move left and right is cooperatively provided at the top of each lifting column 22. A slidable docking block 18 is connected in each docking chute 31. The docking block 18 and the docking rod 15 are detachably connected. By providing the docking rod 15 and the docking block 18, when the docking block 18 slides and connects with the docking rod 15, when the electric gripper 14 moves upward, through the connection between the docking rod 15 and the docking block 18, the lifting column 22 is also driven to move upward, which is beneficial to keeping the movement consistency of the lifting column 22 and the electric gripper 14 and eliminating the need for setting complex control programs.

[0050] Further, a control module is provided in each lifting column 22. The control module is used to control the installation and disassembly between the docking block 18 and the docking rod 15. The control module is communicatively connected to the server and communicatively connected to the sensor. The control module is used to receive the bad card result signal in the test result sent by the server. When the control module receives the bad card result signal, it will issue a control instruction to control the connection between the docking rod 15 and the docking block 18. The control module is used to receive the signal sent by the sensor, that is, after the sensor detects that the electric gripper 14 has moved a certain distance leftward, it sends a signal to the electric gripper 14 and also sends a signal to the control module. When the control module receives this signal, it will issue a control instruction to control the separation between the docking rod 15 and the docking block 18.

[0051] Furthermore, an embedding block 17 is fixedly connected to the right side of the docking block 18, and an embedding groove 16 for the horizontal embedding of the embedding block 17 is cooperatively provided on the left side of the docking rod 15;

[0052] Limit slide plates 19 are fixedly connected to both the front and rear ends of the docking block 18, a limit sliding groove 20 for the left and right movement of the limit slide plate 19 is cooperatively provided on the surface of the lifting column 22, and a second spring 21 is fixedly connected between the groove wall of the limit sliding groove 20 and the limit slide plate 19;

[0053] A vertically arranged second electric push rod 23 is installed in the lifting column 22, a limit baffle 24 is fixedly connected to the telescopic end of the second electric push rod 23, a sliding groove 25 for the up and down movement of the limit baffle 24 is cooperatively provided in the lifting column 22, the sliding groove 25 is communicated with the limit sliding groove 20, and the limit baffle 24 can block the limit slide plate 19. At this time, the docking rod 15 can continue to move to the right along the track of the docking sliding groove 31, so that the embedding block 17 is removed from the embedding groove 16, ensuring the separation of the docking block 18 and the docking rod 15;

[0054] The control module is used to send a control instruction to the second electric push rod 23. When the control module receives the server signal, it sends a control instruction to start contracting the second electric push rod 23, driving the limit baffle 24 to move downward. When the control module receives the sensor signal, it sends a control instruction to start extending the second electric push rod 23, driving the limit baffle 24 to move upward. By moving the limit baffle 24 downward and away from the limit slide plate 19, please refer to Figure 5 And Figure 7 , without the restriction of the limit slide plate 19, under the elastic force of the second spring 21, it moves in the direction of the docking rod 15, and the embedding block 17 can be embedded into the embedding groove 16, enabling the connection between the docking block 18 and the docking rod 15. When the docking rod 15 moves to the left, it will drive the docking block 18 to move together. Then when the sensor transmits the information to the electric gripper 14, it also transmits the information to the control module. The control module controls the second electric push rod 23 to start extending, making the limit baffle 24 move upward to reset. At this time, when the docking rod 15 and the docking block 18 move to the right to reset, they will stop moving first because they are blocked by the limit baffle 24. At this time, the docking rod 15 will continue to reset and move with the electric gripper 14, and then the embedding block 17 will be removed from the embedding groove 16, separating the docking block 18 and the docking rod 15. At this time, without the restriction of the lifting column 22, it will automatically drop and reset.

[0055] The specific solution of this scheme is as follows: By controlling the movement of the electric conveyor 6 along the track of the guiding track 7, the connecting rod 5 is driven to move. The movement of the connecting rod 5 drives the suspension plate 4 to move along the track of the limiting track 3. When the electric conveyor 6 moves and turns, the suspension plate 4 is restricted by the limiting track 3 and will not rotate, causing rotation between the connecting rod 5 and the electric conveyor 6. The movement of the suspension plate 4 drives the first electric push rod 9 to move. The movement of the first electric push rod 9 drives the electric gripper 14 holding the storage card to move until the storage card moves to the position aligned with the slot on the test board 29 and then stops moving. Then, by starting the first electric push rod 9 to extend, the electric gripper 14 holding the storage card is driven to move downward until the storage card is inserted into the test board 29. The pins in the test board 29 are in close contact with the gold fingers of the storage card to establish an electrical connection. These pins are responsible for transmitting various test signals generated by the test board 29 to the storage card and transmitting the data signals fed back by the storage card back to the test board 29;

[0056] During the downward movement of the electric gripper 14, the docking rod 15 is also driven to move downward. When the storage card is inserted into the test board 29, the docking rod 15 is also inserted into the docking chute 31 on the lifting column 22.

[0057] Test parameters are set on the display screen, such as parameters like storage capacity size, read / write speed, number of bad blocks, etc. The test parameters input by the user on the display are transmitted to the server through the switch. Then, the server sends control signals through the test software for the configuration parameters required for the test. The signals are sent down to the test machine 30 through the switch. The test machine 30 obtains the control signal of the test configuration parameter information from the switch and then sends a control signal to the test board 29 to start the corresponding test function. The test board 29 performs the corresponding configuration test item operations according to the test configuration parameters. When the test system completes the test of the storage card, the fed-back data signal is transmitted back to the test board 29, then to the test machine 30, and finally transmitted to the server through the switch for storage, analysis, and processing. The server will analyze the data using various data analysis methods. For example, by calculating statistical indicators such as the average value, standard deviation, maximum value, and minimum value of the read / write speed to evaluate the stability of the read / write performance of the storage card; by analyzing the distribution and type of error data to determine whether there are quality problems such as bad blocks in the storage card. The test results generated by the server will also be displayed to the user through the display. The user can intuitively see the running state of the test system and the test results of the storage card through the display interface.

[0058] When there is a problematic storage card in the test results, the server sends the information of the problematic storage card to the control module in the corresponding lifting column 22. The control module receives the information and controls the second electric push rod 23 to start contracting, pulling the limiting baffle 24 downward until the limiting baffle 24 moves away from the limiting slide plate 19. Please refer toFigure 5 With Figure 7 , when the limit baffle 24 moves away from the limit slide plate 19, the limit slide plate 19 is no longer restricted. Under the elastic force of the second spring 21, it moves towards the docking rod 15 until the embedding block 17 is embedded into the embedding groove 16, so that the docking block 18 is connected to the docking rod 15.

[0059] After the test is over, by starting the first electric push rod 9 to drive the electric gripper 14 and the docking rod 15 to move, both the good and bad memory cards are pulled out from the test board 29. However, since the docking rod 15 corresponding to the bad memory card has been connected to its corresponding docking block 18, when the docking rod 15 moves upward, it will pull the corresponding lifting column 22 upward. That is, when the bad card is pulled out, its corresponding lifting column 22 will also move upward, and the good card is normally pulled out.

[0060] The upward movement of the lifting column 22 will drive the third electric push rod 26 to move upward. After the bad card is pulled out, by starting the third electric push rod 26 to extend, the extended third electric push rod 26 contacts the bad card and pushes the bad card to move sideways. As the bad card moves, its corresponding electric gripper 14 also moves, so that the T-shaped slider 13 moves along the track of the T-shaped chute 11 and compresses the first spring 12. When the bad card moves above the collection box 28, the T-shaped slider 13 also moves to the position where the sensor on the connecting block 10 senses. Then the sensor transmits the information to the electric gripper 14, so that the electric gripper 14 releases the clamping of the bad card, and the bad card falls into the collection box 28 for collection.

[0061] When the third electric push rod 26 pushes the bad card to move and the electric gripper 14 also moves, it will drive the docking rod 15 to move sideways. The sideways movement of the docking rod 15 will drive the docking block 18 to move sideways. The sideways movement of the docking block 18 will drive the limit slide plate 19 to move sideways and stretch the second spring 21 to store elastic potential energy. When the sensor transmits the information to the electric gripper 14, it also transmits the information to the control module at the same time. The control module controls the second electric push rod 23 to start extending and pushes the limit baffle 24 to move upward to reset. Then, after the electric gripper 14 releases the clamping of the bad card, the third electric push rod 26 is started to contract at the same time. At this time, the electric gripper 14 has no restriction and will automatically reset under the elastic force of the first spring 12. The reset movement of the electric gripper 14 will drive the docking rod 15 to also reset. At this time, the docking block 18 will also reset under the elastic force of the second spring 21. The movement of the docking block 18 will drive the limit slide plate 19 to move. When the limit slide plate 19 moves to be blocked by the limit baffle 24 and stops moving, at this time the docking rod 15 will continue to reset and move, so that the embedding block 17 moves out of the embedding groove 16. At this time, the lifting column 22 has no restriction and will automatically fall and reset.

[0062] Finally, the electric transporter 6 drives the electric gripper 14 holding the good card to move into the next process.

[0063] Although embodiments of the present invention have been shown and described, it will be understood by those of ordinary skill in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A memory card testing system, comprising a server, a switch, a display screen, a test board (29) and a test machine (30), characterized in that: The server is communicatively connected to the switch, and the switch is respectively communicatively connected to the test station (30) and the display screen. A plurality of test boards (29) are arranged on the test station (30), and the test boards (29) are used for installing the storage cards to be tested. The server has test software, and the server controls the test station (30) to test the storage cards through the test software and displays the test results on the display screen; A lifting column (22) is movably inserted at the top of the test station (30). A lifting groove (27) for vertically inserting the lifting column (22) is formed in the top surface of the test station (30) in a matching manner. The lifting column (22) is located on the right side of the test board (29), and the number of the lifting columns (22) corresponds to the slots on the test board (29) one by one. A third electric push rod (26) is installed on the surface of each lifting column (22).

2. The storage card testing system according to claim 1, wherein It further includes a base (1). The test station (30) is installed on the surface of the base (1). A transportation component is installed on the base (1), and a connecting block (10) is installed on the transportation component. An electric gripper (14) for clamping the storage card is installed at the bottom end of the connecting block (10).

3. The storage card testing system according to claim 2, wherein, A collection box (28) is installed on the left side of each test board (29). A sensor is installed on the surface of the connecting block (10), and the sensor is communicatively connected to the electric gripper (14).

4. The storage card testing system according to claim 3, wherein The top end of the electric gripper (14) is fixedly connected to a T-shaped slider (13). A T-shaped chute (11) for the T-shaped slider (13) to slide leftward is formed in the bottom end of the connecting block (10) in a matching manner. A first spring (12) is fixedly connected between the T-shaped slider (13) and the inner wall of the T-shaped chute (11).

5. The memory card testing system according to claim 4, wherein, A docking rod (15) is fixedly connected to the right end of each electric gripper (14). A docking chute (31) for the docking rod (15) to move left and right is formed in the top of each lifting column (22) in a matching manner. A docking block (18) that can slide left and right is connected in each docking chute (31), and the docking block (18) and the docking rod (15) are detachably connected.

6. The storage card testing system according to claim 5, wherein, A control module is arranged in each lifting column (22). The control module is used for controlling the installation and disassembly between the docking block (18) and the docking rod (15). The control module is communicatively connected to the server and the sensor.

7. A method for testing a memory card, characterized in that, Using the storage card test system described in claim 6, the specific steps are as follows: A. Drive the connecting block (10) to move through the transportation component. The movement of the connecting block (10) drives the electric gripper (14) clamping the storage card to move and transport. During the transportation process, it passes through the test station (30) until the storage card moves to the position aligned with the slot on the test board (29) and then stops moving. Then, drive the connecting block (10) and the electric gripper (14) to move downward through the transportation component so that the storage card is inserted into the test board (29) to prepare for the test; B. The server sends control signals through the test software with the configuration parameters required for testing. The signals are sent to the test station (30) via a switch. The test station (30) sends the obtained test configuration parameter information control signals to the test board (29), and the test board (29) performs corresponding configuration test item operations according to the test configuration parameters. C. When the test system finishes testing the storage card, the feedback data signals are transmitted back to the test board (29), then to the test station (30), and finally transmitted to the server through the switch for storage, analysis, and processing. The test results generated by the server are displayed to the user through the monitor. D. The server analyzes and processes the information of the problematic storage card and sends it to the control module in the lifting column (22) at its corresponding position. The control module connects the docking rod (15) with the docking block (18). E. After the test is completed, the transport component drives the connecting block (10) and the electric gripper (14) to move upward. The electric gripper (14) holding the defective card will also drive the lifting column (22) to move upward through the docking rod (15). After the storage card is pulled out from the test board (29), the third electric push rod (26) on the moving lifting column (22) extends, pushing the defective card to move sideways. As the defective card moves, its corresponding electric gripper (14) also moves. When the sensor on the connecting block (10) senses that the defective card has moved above the collection box (28), it transmits the information to the electric gripper (14), causing the electric gripper (14) to release the grip on the defective card, and the defective card falls into the collection box (28) for collection. F. After the electric gripper (14) releases the grip on the defective card, the electric gripper (14) is reset. At the same time, the control module separates the docking rod (15) and the docking block (18). At this time, the lifting column (22) is no longer restricted and will automatically fall back to its original position. G. The transport component drives the remaining good storage cards to move for transportation.

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