On-board relay rapid screening circuit and method
By designing the on-board relay rapid screening circuit and using contact resistance value detection technology, the problem of contact reliability in the existing technology cannot be accurately detected during relay aging, and more reliable and accurate screening results are achieved.
Patent Information
- Application Number
- CN202411693144.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-25
- Publication Date
- 2025-03-11
AI Technical Summary
The prior art cannot accurately detect the reliability of contacts during the aging of the onboard relay, and cannot judge the reliability of the relay operation.
Design a fast screening circuit for onboard relays. By detecting the size of the contact resistance value during the operation of the relay to be tested, the main control unit, auxiliary test circuit, driving circuit and resistance test interface circuit are used to achieve accurate and fast detection of the contact status of the relay.
It improves the reliability of the test results during the relay aging test, and records the change process of contact resistance in detail, providing strong data support for the test results and improving the accuracy of the screening results.
Smart Images
Figure CN119596128A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of onboard relay screening, and in particular relates to a circuit and method for rapid screening of onboard relays. Background Art
[0002] During the development process and after the assembly process, the on-board relay needs to undergo a specified number of aging tests to verify the reliability of the relay contacts during operation and the tightness of the various structural components. The stress of each structural component should be released during the aging process to ensure that the test of the relay's electrical characteristics is not affected by factors such as structural component jamming and loose contact.
[0003] At present, the detection method used in relay aging test is generally to connect one end of the relay contact to the monitoring point of the main control unit with a pull-up resistor, and the other end of the relay contact to the ground point. During the operation of the relay, the state change of the relay contact is detected by detecting the change of the high and low levels of the monitoring point of the main control unit. However, in actual applications, although this method can detect the state change of the relay contact, it cannot detect the reliability of the contact and cannot accurately judge the reliability of the operation of the relay. Summary of the invention
[0004] In view of the problem that the prior art cannot accurately and quickly detect the contact status of an onboard relay during the aging process, the technical problem to be solved by the present invention is to provide an onboard relay rapid screening circuit and an implementation method, which utilizes the size of the contact resistance value during the operation of the relay to be tested to ensure accurate and quick detection of the relay contact status.
[0005] In order to achieve the above object, the main technical solutions adopted by the present invention include: A fast screening circuit for on-board relays comprises a main control unit, an auxiliary test circuit, a drive circuit and a resistance test interface circuit. The main control unit is connected to the auxiliary test circuit and the drive circuit. The main control unit is connected to the resistance test interface circuit for communication. When the main control unit in the fast screening circuit for on-board relays starts to work, the input state of an I / O input port of the main control unit determines the address of the main control unit, and its output I / O port performs high and low level conversion according to the relay model, so that the drive circuit drives the relay to be tested to operate. The resistance test interface circuit is connected to the contact of the relay to be tested through the auxiliary test circuit, and the main control unit is connected to the communication port in the resistance test interface circuit through the communication interface to read the resistance test result.
[0006] Furthermore, the I / O input ports RA0, RA1, RA2, RA3, RA5, and RE0 of the main control unit are respectively connected to one end of resistors R14, R15, R5, R6, R7, and R8, and the other ends of the resistors R14, R15, R5, R6, R7, and R8 are connected to the positive electrode of the power supply VCC to form an I / O port pull-up effect; the pull-up resistor is connected in parallel with the short-circuit blocks JP5, JP6, JP7, JP8, JP9, and JP10, and the other end of the short-circuit block is connected to the negative electrode of the power supply; the I / O output ports RC0 and RC1 of the main control unit are connected to the Darling The input end of the Darlington tube IC1 is connected, the output end of the Darlington tube IC1 is connected to CZ3 in the auxiliary test circuit, and CZ5 in the auxiliary test circuit is connected to 24V+; the communication interfaces SCL and SDA of the main control unit are connected to the communication points in the J1 and J2 wiring terminals in the resistance test interface circuit, and the test pins on the wiring terminals JP1, JP2, JP3, and JP4 in the resistance test interface circuit are connected to the corresponding test points on the terminals CZ4 and CZ6 in the auxiliary test circuit, so that the auxiliary test equipment is connected through the resistance test interface circuit and the auxiliary test circuit.
[0007] A screening method using the on-board relay rapid screening circuit comprises the following steps: Step 1, the main control unit controls the output state of the IO port to drive the relay to be tested according to the model of the relay to be tested; Step 2, connecting each contact of the relay to be tested to the resistance test interface circuit through the auxiliary test circuit, and connecting the auxiliary test equipment to each contact of the relay to be tested through the resistance test interface circuit; Step 3, the main control unit communicates with the resistance test circuit through the communication interface, reads the measured value of the resistance of the relay contact to be tested, and determines whether the test result is within the qualified range; Step 4: The main control unit detects whether the specified number of actions has been reached; Step 5: One detection process is completed.
[0008] Furthermore, in step 3, the main control unit automatically determines whether the contact resistance value of the relay contact to be tested is qualified after each action, and screens out onboard relays with unqualified contact resistance values.
[0009] The beneficial effects of the present invention are: 1. The present invention provides a fast screening circuit and method for on-board relays, which solves the conventional detection method in the previous relay aging test process and makes the detection result more reliable; 2. The method of the present invention can ensure that the change process of the contact resistance is recorded in detail during the aging process of the relay, providing strong data support for the test results and improving the accuracy of the screening results. BRIEF DESCRIPTION OF THE DRAWINGS
[0010] Figure 1 This is a schematic diagram of the structure of the onboard relay quick screening circuit of the present invention; Figure 2 It is a principle block diagram of the main control circuit in the onboard relay rapid screening circuit of the present invention; Figure 3 It is a schematic diagram of an auxiliary test circuit in a fast screening circuit for an onboard relay of the present invention; Figure 4 It is a schematic diagram of a driving circuit in a fast screening circuit for an onboard relay of the present invention; Figure 5 It is a schematic diagram of a resistance test interface circuit in a fast screening circuit for a board-mounted relay of the present invention; Figure 6 It is a schematic diagram of the contact position of the onboard relay of the present invention; Figure 7 This is a flow chart of the onboard relay quick screening circuit and implementation method of the present invention. DETAILED DESCRIPTION
[0011] In order to better explain the present invention and facilitate understanding, the present invention is described in detail below through specific implementation modes in conjunction with the accompanying drawings.
[0012] like Figure 1 As shown, in order to make the result of the relay aging screening test more accurate and the test result supported by the test data, the present invention provides a board-mounted relay rapid screening circuit, including a main control unit, an auxiliary test circuit, a drive circuit and a resistance test interface circuit. When the main control unit in the board-mounted relay rapid screening circuit starts to work, the input state of its I / O input port determines the address of the main control unit, and its output I / O port performs high and low level conversion according to the relay model, so that the drive circuit drives the relay to be tested to operate, the resistance test interface circuit is connected to the contact of the relay to be tested through the auxiliary test circuit, and the main control unit is connected to the communication port in the resistance test interface circuit through the communication interface to read the resistance test result.
[0013] The I / O input ports RA0, RA1, RA2, RA3, RA5, and RE0 of the main control unit are connected to one end of the resistors R14, R15, R5, R6, R7, and R8 respectively, and the other ends of the resistors R14, R15, R5, R6, R7, and R8 are connected to the positive electrode of the power supply VCC to form an I / O port pull-up effect. At the same time, the pull-up resistor is connected in parallel with the short-circuit blocks JP5, JP6, JP7, JP8, JP9, and JP10, and the other end of the short-circuit block is connected to the negative electrode of the power supply. By setting whether the short-circuit block is connected, the purpose of setting the address of the main control unit is achieved. For example, Figure 2As shown; the I / O output ports RC0 and RC1 of the main control unit are connected to the input end of the Darlington tube IC1, the output end of the Darlington tube IC1 is connected to CZ3 in the auxiliary test circuit, and CZ5 in the auxiliary test circuit is connected to 24V+, as shown Figure 3 , Figure 4 As shown; the communication interfaces SCL and SDA of the main control unit are connected to the communication points in the J1 and J2 wiring terminals in the resistance test interface circuit, and the test pins on the wiring terminals JP1, JP2, JP3, and JP4 in the resistance test interface circuit are connected to the corresponding test points on the terminals CZ4 and CZ6 in the auxiliary test circuit, so that the auxiliary test equipment is connected through the resistance test interface circuit and the auxiliary test circuit to achieve the purpose of testing the resistance value of the relay contact to be tested, as shown in FIG. Figure 3 , Figure 5 As shown; The onboard relay quick screening circuit can realize the onboard relay quick screening method of the present invention. Figure 2 , Attachment Figure 3 , Attachment Figure 4 , Attachment Figure 5 This article explains how the onboard relay quick screening circuit can achieve quick screening of relays to be tested.
[0014] Taking JY-B105 onboard relay as an example, the judgment steps of the present invention are described: JY-B105 onboard relay is a 6-group contact relay, which is divided into 1 group of normally closed contacts and 5 groups of normally open contacts. The contact distribution positions are shown in the attached figure. Figure 6As shown in the figure, the distribution positions of 1 group of normally closed contacts on the relay are 21 and 22, and the distribution positions of 5 groups of normally open contacts on the relay are 13 and 14; 33 and 34; 43 and 44; 53 and 54; 63 and 64. During the relay aging test, pin 21 of the relay to be tested is connected to pin 9 and pin 10 of the wiring terminal CZ6 of the auxiliary test circuit, pin 22 of the relay to be tested is connected to pin 11 and pin 12 of the wiring terminal CZ6 of the auxiliary test circuit, pin 13 of the relay to be tested is connected to pin 5 and pin 6 of the wiring terminal CZ6 of the auxiliary test circuit, pin 14 of the relay to be tested is connected to pin 7 and pin 8 of the wiring terminal CZ6 of the auxiliary test circuit, pin 33 of the relay to be tested is connected to pin 1 and pin 2 of the wiring terminal CZ4 of the auxiliary test circuit, and pin 16 of the relay to be tested is connected to pin 2 of the wiring terminal CZ6 of the auxiliary test circuit. Pin 34 of the electrical appliance is connected to pin 3 and pin 4 of the auxiliary test circuit terminal CZ4, pin 43 of the relay to be tested is connected to pin 5 and pin 6 of the auxiliary test circuit terminal CZ4, pin 44 of the relay to be tested is connected to pin 7 and pin 8 of the auxiliary test circuit terminal CZ4, pin 53 of the relay to be tested is connected to pin 1 and pin 2 of the auxiliary test circuit terminal CZ6, pin 54 of the relay to be tested is connected to pin 3 and pin 4 of the auxiliary test circuit terminal CZ6, if the contact resistance value of the front contact of the test relay is measured, pin 63 of the relay to be tested is connected to pin 9 and pin 10 of the auxiliary test circuit terminal CZ4, pin 64 of the relay to be tested is connected to pin 11 and pin 12 of the auxiliary test circuit terminal CZ4, corresponding to Figure 3 As shown in ; the corresponding test points on the wiring terminals CZ4 and CZ6 of the auxiliary test circuit are connected to the corresponding test points on the wiring terminals JP1, JP2, JP3, and JP4 in the resistance test interface circuit. The main control unit controls the input state of the output I / O port RC0 through the drive circuit to make the relay to be tested operate at a fixed frequency. During the operation of the relay to be tested, the main control unit completes communication with the auxiliary test equipment through the communication interfaces SCL and SDA, reads the result of the resistance test, and determines whether the contact resistance value is within the qualified range, thereby completing the screening of the onboard relay aging test process.
[0015] like Figure 7 As shown, in order to complete the rapid screening of onboard relays, the present invention provides a method for rapid screening circuits of onboard relays, comprising the following steps: 1) The main control unit controls the output state of the IO port according to the model of the relay to be tested to drive the relay to be tested; 2) Connecting each contact of the relay to be tested to the resistance test circuit interface through the auxiliary test circuit, and connecting the resistance test circuit to each contact of the relay to be tested through the resistance test circuit interface; 3) The main control unit communicates with the resistance test circuit through the communication interface, reads the measured value of the resistance of the relay contact to be tested, and determines whether the test result is within the qualified range; 4) The main control unit detects whether the specified number of actions has been reached; 5) A detection process is completed.
[0016] The present invention adopts a method of reading the contact resistance value during the operation of the relay to be tested to replace the conventional level change detection method during the previous relay aging test, so that the detection result is more reliable, provides strong data support for the test result, and improves the accuracy of the screening result.
[0017] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are illustrative and are not to be construed as limitations on the present invention. Alterations, modifications, substitutions and variations of the above embodiments by a person skilled in the art are all within the scope of the present invention.
Claims
1. A board-mounted relay rapid screening circuit, characterized in that: The invention comprises a main control unit, an auxiliary test circuit, a drive circuit and a resistance test interface circuit. The main control unit is connected with the auxiliary test circuit and the drive circuit. The main control unit is connected with the resistance test interface circuit in communication. When the main control unit in the onboard relay fast screening circuit starts to work, the input state of the I / O input port of the main control unit determines the address of the main control unit, and the output I / O port thereof performs high and low level conversion according to the relay model, so that the drive circuit drives the relay to be tested to operate. The resistance test interface circuit is connected with the contact of the relay to be tested through the auxiliary test circuit, and the main control unit is connected with the communication port in the resistance test interface circuit through the communication interface to read the resistance test result.
2. The on-board relay rapid screening circuit according to claim 1, characterized in that: The I / O input ports RA0, RA1, RA2, RA3, RA5, and RE0 of the main control unit are respectively connected to one end of resistors R14, R15, R5, R6, R7, and R8, and the other ends of the resistors R14, R15, R5, R6, R7, and R8 are connected to the positive electrode VCC of the power supply to form an I / O port pull-up effect; the pull-up resistors are connected in parallel with short-circuit blocks JP5, JP6, JP7, JP8, JP9, and JP10, and the other ends of the short-circuit blocks are connected to the negative electrode of the power supply; the I / O output ports RC0 and RC1 of the main control unit are connected to the Darlington transistors The input end of IC1 is connected, the output end of Darlington tube IC1 is connected to CZ3 in the auxiliary test circuit, and CZ5 in the auxiliary test circuit is connected to 24V+; the communication interfaces SCL and SDA of the main control unit are connected to the communication points in the J1 and J2 wiring terminals in the resistance test interface circuit, and the test pins on the wiring terminals JP1, JP2, JP3, and JP4 in the resistance test interface circuit are connected to the corresponding test points on the terminals CZ4 and CZ6 in the auxiliary test circuit, so that the auxiliary test equipment is connected through the resistance test interface circuit and the auxiliary test circuit.
3. A screening method using the on-board relay rapid screening circuit according to any one of claims 1-2, characterized in that: The steps include: Step 1, the main control unit controls the output state of the IO port to drive the relay to be tested according to the model of the relay to be tested; Step 2, connecting each contact of the relay to be tested to the resistance test interface circuit through the auxiliary test circuit, and connecting the auxiliary test equipment to each contact of the relay to be tested through the resistance test interface circuit; Step 3, the main control unit communicates with the resistance test circuit through the communication interface, reads the measured value of the contact resistance of the relay to be tested, and determines whether the test result is within the qualified range; Step 4: The main control unit detects whether the specified number of actions has been reached; Step 5: One detection process is completed.
4. The screening method according to claim 3, characterized in that: In step 3, the main control unit automatically determines whether the contact resistance value of the relay contact to be tested is qualified after each action, and selects the onboard relays with unqualified contact resistance values.