Quality determination method and device

Abstract

The invention relates to the technical field of computers, in particular to a quality determination method and device. The quality determination method comprises the following steps: sending a query request to the universal flash memory; an original equipment manufacturer identifier sent by the universal flash memory for the query request is received, and the original equipment manufacturer identifier comprises an information set; under the condition that the information set comprises failure record information corresponding to the universal flash memory, it is determined that the quality of the universal flash memory does not meet the quality requirement, and the failure record information is used for indicating that the universal flash memory does not pass the quality test. By the adoption of the method and device, the performability and accuracy of quality determination of the universal flash memory can be improved, and the probability that bad universal flash memories flow out is reduced.

Description

Technical Field

[0001] The present disclosure relates to the field of computer technology, and in particular to a quality determination method and device. Background Art

[0002] With the development of science and technology, flash memory technology has been applied to the electronic field. In order to ensure the quality of the memory chip, the memory chip can be tested for quality, and the quality test results are stored in the general partition of the whole machine. When the data in the general partition is erased, the bad record of the memory chip will also be cleared, making it impossible to identify the bad memory chip. Summary of the invention

[0003] The present disclosure provides a quality determination method and device to improve the feasibility and accuracy of quality determination of universal flash memory and reduce the probability of outflow of bad universal flash memory. The technical solution of the present disclosure is as follows:

[0004] According to a first aspect of an embodiment of the present disclosure, a quality determination method is provided, including:

[0005] Sending a query request to the universal flash memory;

[0006] receiving an original equipment manufacturer identifier sent by the universal flash memory in response to the query request, wherein the original equipment manufacturer identifier includes an information set;

[0007] In a case where the information set includes failure record information corresponding to the universal flash memory, it is determined that the quality of the universal flash memory does not meet the quality requirement, wherein the failure record information is used to indicate that the universal flash memory has failed a quality test.

[0008] According to some embodiments, the method further comprises:

[0009] When the electronic device to which the universal flash memory belongs is in a whole-machine testing phase, performing an acceptance test on the universal flash memory to obtain an acceptance test result;

[0010] When the acceptance test result indicates that the universal flash memory acceptance test fails, a first result identifier and a first storage identifier corresponding to the acceptance test result are stored in a preset partition of the electronic device, wherein the first storage identifier is used to indicate that the acceptance test result has not been tested.

[0011] According to some embodiments, the method further comprises:

[0012] When the electronic device is in a test and inspection phase, obtaining the acceptance test result and the first storage identifier in the preset partition;

[0013] When the first result identifier is an acceptance failure identifier and the first storage identifier is a preset storage identifier, obtaining read and write information of an original equipment manufacturer identifier corresponding to the universal flash memory;

[0014] In a case where the read-write information indicates that the universal flash memory supports a write operation, failure record information is written into an original equipment manufacturer identifier of the universal flash memory, wherein the failure record information includes the acceptance test result.

[0015] According to some embodiments, after writing the acceptance test result into the original equipment manufacturer identification of the universal flash memory, the method further includes:

[0016] The first storage identifier is set as a second storage identifier, wherein the second storage identifier is used to indicate that the test inspection for the acceptance test result is completed, and the failure record information is stored in the original equipment manufacturer identifier of the universal flash memory.

[0017] According to some embodiments, after acquiring the read and write information of the original equipment manufacturer identification corresponding to the universal flash memory, the method further includes:

[0018] When the read-write information indicates that the universal flash memory does not support write operations, the first storage identifier is set to a third storage identifier, wherein the third storage identifier is used to indicate that the test inspection for the acceptance test result is completed and the failure record information is not stored in the original equipment manufacturer identifier of the universal flash memory.

[0019] According to some embodiments, sending a query request to the universal flash memory includes:

[0020] When data of a preset partition in the universal flash memory is cleared, sending a first query request to the universal flash memory;

[0021] and / or

[0022] When the universal flash memory and the electronic device are in a power-on stage, a second query request is sent to the universal flash memory.

[0023] According to some embodiments, after determining that the quality of the universal flash memory does not meet the quality requirement, the method further includes:

[0024] A warning message is issued, wherein the warning message is used to indicate that the quality of the universal flash memory does not meet the quality requirement.

[0025] According to a second aspect of an embodiment of the present disclosure, there is provided a quality determination device, including:

[0026] A request sending unit, used for sending a query request to the universal flash memory;

[0027] an identification receiving unit, configured to receive an original equipment manufacturer identification sent by the universal flash memory in response to the query request, wherein the original equipment manufacturer identification includes an information set;

[0028] A quality determination unit is used to determine that the quality of the universal flash memory does not meet the quality requirements when the information set includes failure record information corresponding to the universal flash memory, wherein the failure record information is used to indicate that the universal flash memory has not passed the quality test.

[0029] According to a third aspect of an embodiment of the present disclosure, there is provided an electronic device, including:

[0030] processor;

[0031] a memory for storing instructions executable by the processor;

[0032] The processor is configured to execute the instructions to implement the quality determination method described in any one of the aforementioned aspects.

[0033] According to a fourth aspect of the present application, a storage medium is provided. When instructions in the storage medium are executed by a processor of an electronic device, the electronic device can execute the quality determination method described in any one of the preceding aspects.

[0034] According to a fifth aspect of the present application, a computer program product is provided, comprising a computer program, wherein the computer program implements any one of the methods described in the preceding aspects when executed by a processor.

[0035] The technical solution provided by the embodiments of the present disclosure brings at least the following beneficial effects:

[0036] In some or related embodiments, a query request is sent to the universal flash memory; an OEM identifier sent by the universal flash memory in response to the query request is received, wherein the OEM identifier includes an information set; and when the information set includes failure record information corresponding to the universal flash memory, it is determined that the quality of the universal flash memory does not meet the quality requirements, wherein the failure record information is used to indicate that the universal flash memory has not passed the quality test. The data in the OEM identifier will not be cleared due to the erasure of data in the whole machine partition. Therefore, by determining whether the quality of the universal flash memory meets the quality requirements based on the information set in the OEM identifier, the situation where the quality of the universal flash memory cannot be determined by erasing partition data can be reduced, the feasibility and accuracy of the quality determination of the universal flash memory can be improved, the probability of the outflow of bad universal flash memory can be reduced, and the safety of device use can be improved.

[0037] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] The drawings herein are incorporated into and constitute a part of the specification, illustrate embodiments consistent with the present disclosure, and together with the description are used to explain the principles of the present disclosure, and do not constitute improper limitations on the present disclosure.

[0039] Figure 1 A background schematic diagram showing a quality determination method according to an embodiment of the present disclosure;

[0040] Figure 2 is a flow chart showing a quality determination method according to an exemplary embodiment;

[0041] Figure 3 is a flow chart showing a quality determination method according to an exemplary embodiment;

[0042] Figure 4 is a flow chart showing a quality determination method according to an exemplary embodiment;

[0043] Figure 5 is a block diagram of a quality determination device according to an exemplary embodiment;

[0044] Figure 6 is a block diagram of a quality determination device according to an exemplary embodiment;

[0045] Figure 7 is a block diagram of a quality determination device according to an exemplary embodiment;

[0046] Figure 8It is a block diagram of an electronic device according to an exemplary embodiment. DETAILED DESCRIPTION

[0047] In order to enable ordinary persons in the art to better understand the technical solutions of the present disclosure, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings.

[0048] The embodiments of the present disclosure propose quality determination methods and devices. In some embodiments, the terms such as quality determination method, information processing method, communication method, etc. can be replaced with each other, the terms such as quality determination device, information processing device, communication device, etc. can be replaced with each other, and the terms such as information processing system, communication system, etc. can be replaced with each other.

[0049] The embodiments of the present disclosure are not exhaustive, but are only illustrative of some embodiments, and are not intended to be a specific limitation on the scope of protection of the present disclosure. In the absence of contradiction, each step in a certain embodiment can be implemented as an independent embodiment, and the steps can be arbitrarily combined. For example, a solution after removing some steps in a certain embodiment can also be implemented as an independent embodiment, and the order of the steps in a certain embodiment can be arbitrarily exchanged. In addition, the optional implementation methods in a certain embodiment can be arbitrarily combined; in addition, the embodiments can be arbitrarily combined, for example, some or all of the steps of different embodiments can be arbitrarily combined, and a certain embodiment can be arbitrarily combined with the optional implementation methods of other embodiments.

[0050] In each embodiment of the present disclosure, unless otherwise specified or there is a logical conflict, the terms and / or descriptions between the embodiments are consistent and can be referenced to each other, and the technical features in different embodiments can be combined to form a new embodiment based on their internal logical relationships.

[0051] The terms used in the embodiments of the present disclosure are only for the purpose of describing specific embodiments and are not intended to limit the present disclosure.

[0052] In the embodiments of the present disclosure, unless otherwise specified, elements expressed in the singular form, such as "a", "an", "the", "above", "said", "aforementioned", "this", etc., may mean "one and only one", or "one or more", "at least one", etc. For example, when using articles such as "a", "an", "the" in English in translation, the noun after the article may be understood as a singular expression or a plural expression.

[0053] In the embodiments of the present disclosure, “plurality” refers to two or more.

[0054] In some embodiments, the terms “at least one,” “one or more,” “a plurality of,” “multiple,” etc. may be used interchangeably.

[0055] In some embodiments, "at least one of A and B", "A and / or B", "A in one case, B in another case", "in response to one case A, in response to another case B", etc., may include the following technical solutions according to the situation: in some embodiments, A (A is executed independently of B); in some embodiments, B (B is executed independently of A); in some embodiments, execution is selected from A and B (A and B are selectively executed); in some embodiments, A and B (both A and B are executed). When there are more branches such as A, B, C, etc., the above is also similar.

[0056] In some embodiments, the recording method of "A or B" may include the following technical solutions according to the situation: in some embodiments, A (A is executed independently of B); in some embodiments, B (B is executed independently of A); in some embodiments, execution is selected from A and B (A and B are selectively executed). When there are more branches such as A, B, C, etc., the above is also similar.

[0057] The prefixes such as "first" and "second" in the embodiments of the present disclosure are only used to distinguish different description objects, and do not constitute restrictions on the position, order, priority, quantity or content of the description objects. The statement of the description object refers to the description in the context of the claims or embodiments, and should not constitute unnecessary restrictions due to the use of prefixes. For example, if the description object is a "field", the ordinal number before the "field" in the "first field" and the "second field" does not limit the position or order between the "fields", and the "first" and "second" do not limit whether the "fields" they modify are in the same message, nor do they limit the order of the "first field" and the "second field". For another example, if the description object is a "level", the ordinal number before the "level" in the "first level" and the "second level" does not limit the priority between the "levels". For another example, the number of description objects is not limited by the ordinal number, and can be one or more. Taking the "first device" as an example, the number of "devices" can be one or more. In addition, the objects modified by different prefixes may be the same or different. For example, if the description object is "device", then the "first device" and the "second device" may be the same device or different devices, and their types may be the same or different. For another example, if the description object is "information", then the "first information" and the "second information" may be the same information or different information, and their contents may be the same or different.

[0058] In some embodiments, “including A”, “comprising A”, “used to indicate A”, and “carrying A” can be interpreted as directly carrying A or indirectly indicating A.

[0059] In some embodiments, terms such as "in response to ...", "in response to determining ...", "in the case of ...", "at the time of ...", "when ...", "if ...", "if ...", etc. can be used interchangeably.

[0060] In some embodiments, terms such as "greater than", "greater than or equal to", "not less than", "more than", "more than or equal to", "not less than", "higher than", "higher than or equal to", "not lower than", and "above" can be replaced with each other, and terms such as "less than", "less than or equal to", "not greater than", "less than", "less than or equal to", "no more than", "lower than", "lower than or equal to", "not higher than", and "below" can be replaced with each other.

[0061] In some embodiments, devices and equipment may be interpreted as physical or virtual, and their names are not limited to the names recorded in the embodiments. In some cases, they may also be understood as "equipment", "device", "circuit", "network element", "node", "function", "unit", "section", "system", "network", "chip", "chip system", "entity", "subject", etc.

[0062] In some embodiments, "network" can be interpreted as devices included in the network, such as access network equipment, core network equipment, etc.

[0063] In some embodiments, "access network device (AN device)" may also be referred to as "radio access network device (RAN device)", "base station (BS)", "radio base station (radio base station)", "fixed station (fixed station)", and in some embodiments may also be understood as "node (node)", "access point (access point)", "transmission point (TP)", "reception point (reception point, RP)", "transmission and / or reception point (transmission / reception point, TRP)"", "panel (panel)", "antenna panel (antenna panel)", "antenna array (antenna array)"", "cell (cell)", "macro cell (macro cell)", "small cell (small cell)", "femto cell (femto cell)", "pico cell (pico cell)", "sector (sector)", "cell group (cell group)", "serving cell (serving cell)", "carrier (carrier)", "component carrier (component carrier)", "bandwidth part (bandwidth part, BWP)" and the like.

[0064] In some embodiments, "terminal" or "terminal device" can be referred to as "user equipment (UE)", "user terminal" "mobile station (MS)", "mobile terminal (MT)", subscriber station, mobile unit, subscriber unit, wireless unit, remote unit, mobile device, wireless device, wireless communication device, remote device, mobile subscriber station, access terminal, mobile terminal, wireless terminal, remote terminal, handset, user agent, mobile client, client, etc.

[0065] In some embodiments, data, information, etc. may be obtained with the user's consent.

[0066] In addition, each element, each row, or each column in the table of the embodiments of the present disclosure may be implemented as an independent embodiment, and the combination of any elements, any rows, and any columns may also be implemented as an independent embodiment.

[0067] It should be noted that the terms "first", "second", etc. in the specification and claims of the present disclosure and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present disclosure described herein can be implemented in an order other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0068] In some embodiments, to ensure the quality of the storage chip, the embedded universal flash storage (UFS) will perform storage particle quality inspection before leaving the factory. Storage particle quality inspection does not refer to particle inspection in a narrow sense. For example, it can refer to the quality inspection of storage devices (such as UFS), including but not limited to whether there is obvious damage on the appearance, read and write stress testing, scanning electron microscopy, etc., to determine whether the storage particles can be reliably read, written and stored.

[0069] According to some embodiments, Figure 1 A background diagram showing a quality determination method according to an embodiment of the present disclosure is shown as follows: Figure 1 As shown in the figure, after the memory chip leaves the factory, the electronic manufacturer can assemble the memory chip into the embedded machine. After the embedded machine is assembled, other quality tests can be performed on the embedded machine. However, the test results are only stored in the common partition of the machine. Once the partition data is erased, the bad record of the device will also be cleared, and the bad device cannot be identified, causing the bad device to flow out.

[0070] Figure 2 is a flow chart of a quality determination method according to an exemplary embodiment. Figure 2 As shown, the quality determination method can be used in a quality determination scenario, comprising the following steps:

[0071] In step S11, a query request is sent to the universal flash memory;

[0072] According to some embodiments, the technical solution of the embodiments of the present disclosure may be applied to an embedded universal flash memory (UFS). The UFS may be provided on an electronic device, including but not limited to a smart phone, a smart watch, a television, a computer device, etc. The UFS may also be provided on a server.

[0073] According to some embodiments, the execution subject of the embodiments of the present disclosure may be, for example, a host end of an electronic device, specifically, for example, a processor.

[0074] In some embodiments, the universal flash memory may be, for example, a device for flash memory storage. The universal flash memory of the embodiments of the present disclosure does not specifically refer to a fixed memory. For example, when the device identification corresponding to the universal flash memory changes, the universal flash memory may also change accordingly. For example, when the electronic device or processor changes, the corresponding universal flash memory may also change accordingly.

[0075] The query request may be, for example, a request for obtaining information stored in a universal flash memory. The query request does not specifically refer to a fixed request. For example, when the sending time point corresponding to the query request changes, the query request may also change accordingly. For example, when the specific request information corresponding to the query request changes, the query request may also change accordingly.

[0076] According to some embodiments, when performing the quality determination method, a query request may be sent to the universal flash memory.

[0077] In step S12, receiving the original equipment manufacturer identifier sent by the universal flash memory in response to the query request, wherein the original equipment manufacturer identifier includes an information set;

[0078] According to some embodiments, the original equipment manufacturer identifier (Original Equipment Manufacturer ID) may be, for example, an OEM ID. Since the OEM ID is specified according to the UFS protocol, the data in the OEM ID cannot be cleared or modified at will after being written. Therefore, quality determination based on the information in the OEM ID may improve the accuracy of quality determination.

[0079] In some embodiments, the information set may be, for example, a collection of at least one information. The information set does not specifically refer to a fixed set. For example, when any information in the information set changes, the information set may also change accordingly. For example, when the number of information corresponding to the information set changes, the information set may also change accordingly. Among them, the information set may include, for example, the device identification of the universal flash memory, the storage information of the universal flash memory, and the failure record information for the universal flash memory.

[0080] According to some embodiments, after sending a query request to the universal flash memory, for example, an original equipment manufacturer identifier sent by the universal flash memory in response to the query request may be received, wherein the original equipment manufacturer identifier includes an information set.

[0081] In step S13, when the information set includes failure record information corresponding to the universal flash memory, it is determined that the quality of the universal flash memory does not meet the quality requirement, wherein the failure record information is used to indicate that the universal flash memory has failed the quality test.

[0082] According to some embodiments, the failure record information is used to indicate that the universal flash memory has not passed the quality test, wherein the quality test is used to determine whether the quality of the universal flash memory meets the quality requirements and can be used in the operation of the electronic device. The failure record information can be, for example, a failure flag.

[0083] In some embodiments, the quality requirement may be, for example, a requirement that can be used for UFS. The quality requirement does not specifically refer to a fixed requirement. For example, when the specific quality detection content corresponding to the quality requirement changes, the quality requirement may also change accordingly. For example, when the threshold information corresponding to the quality requirement changes, the quality requirement may also change accordingly.

[0084] According to some embodiments, after sending a query request to the universal flash memory, for example, an original equipment manufacturer identifier sent by the universal flash memory in response to the query request may be received, wherein the original equipment manufacturer identifier includes an information set. When the information set is obtained, it may be detected whether the information set includes failure record information corresponding to the universal flash memory, wherein the failure record information is used to indicate that the universal flash memory has not passed the quality test. In the case where the information set includes the failure record information corresponding to the universal flash memory, it is determined that the quality of the universal flash memory does not meet the quality requirements.

[0085] In some or related embodiments, a query request is sent to a universal flash memory; an OEM identifier sent by the universal flash memory in response to the query request is received, wherein the OEM identifier includes an information set; and when the information set includes failure record information corresponding to the universal flash memory, it is determined that the quality of the universal flash memory does not meet the quality requirements, wherein the failure record information is used to indicate that the universal flash memory has not passed the quality test. The data in the OEM identifier will not be cleared due to the erasure of data in the whole machine partition, so determining whether the quality of the universal flash memory meets the quality requirements based on the information set in the OEM identifier can reduce the situation where the quality of the universal flash memory cannot be determined due to the erasure of partition data, can improve the executability and accuracy of the quality determination of the universal flash memory, reduce the probability of the outflow of bad universal flash memory, and improve the safety of device use.

[0086] Figure 3 is a flow chart of a quality determination method according to an exemplary embodiment. Figure 2 As shown, the quality determination method can be used in a quality determination scenario, comprising the following steps:

[0087] In step S21, when the electronic device to which the universal flash memory belongs is in the whole machine test stage, an acceptance test is performed on the universal flash memory to obtain an acceptance test result;

[0088] According to some embodiments, according to some embodiments, Figure 4 is a flow chart of a quality determination method according to an exemplary embodiment. Figure 4 As shown, the technical solution of the present disclosure may include, for example:

[0089] In some embodiments, the electronic device to which the universal flash memory belongs may be, for example, an electronic device in which the universal flash memory is installed. The whole device test phase may be, for example, a test performed when the electronic device is installed but has not yet been shipped.

[0090] In some embodiments, the acceptance test may be, for example, a synchronous acceptance operation performed after the electronic device is assembled. For example, a test tool may be used to perform the acceptance test on the electronic device. If the acceptance test result indicates that the electronic device has passed the test, that is, the universal flash memory has passed the test, no operation may be performed. At this time, the storage identifier corresponding to the acceptance test result may be set to a default value, wherein the default value may be, for example, 0.

[0091] The failure record information may be, for example, a first result identifier, and the first result identifier may be, for example, an acceptance failure identifier. After the data in the preset partition has been cleared, the acceptance failure identifier may be set to a default value and the storage identifier may be set to a default value. The default value may be, for example, 0. For example, when the acceptance failure identifier is set to a default value, the storage identifier is also set to a default value.

[0092] The failure record information may be, for example, an acceptance failure flag. After the electronic device fails to pass the test or passes the test, the acceptance failure flag may be set to a default value and the storage flag may be set to a default value. The default value may be, for example, 0. For example, when the acceptance failure flag is set to a default value, the storage flag is also set to a default value.

[0093] According to some embodiments, when the electronic device to which the universal flash memory belongs is in a whole-machine testing phase, an acceptance test is performed on the universal flash memory to obtain an acceptance test result.

[0094] The performing of an acceptance test on the universal flash memory and obtaining the acceptance test result may, for example, be performing an acceptance test on the electronic device to which the universal flash memory belongs and obtaining the acceptance test result.

[0095] In step S22, when the acceptance test result indicates that the universal flash memory acceptance test fails, a first result identifier and a first storage identifier corresponding to the acceptance test result are stored in a preset partition of the electronic device;

[0096] According to some embodiments, the first storage flag is used to indicate that no test verification has been performed on the acceptance test result.

[0097] The preset partition may be, for example, a preset partition, which may be a data partition set in an electronic device for storing the results and identification of the test phase. The preset partition does not specifically refer to a fixed partition. For example, when the partition size corresponding to the preset partition changes, the preset partition may also change accordingly. The preset partition may be, for example, a 2MB data partition.

[0098] According to some embodiments, when the acceptance test result indicates that the universal flash memory acceptance test fails, a first result identifier and a first storage identifier corresponding to the acceptance test result are stored in a preset partition of the electronic device.

[0099] In some embodiments, the first result flag may be, for example, a failure flag, and the failure flag may be, for example, 1. In this case, the first storage flag may be, for example, 0.

[0100] In step S23, when the electronic device is in the test and inspection stage, the acceptance test result and the first storage identifier in the preset partition are obtained;

[0101] According to some embodiments, when the electronic device is in the test and inspection stage, the acceptance test result can be inspected. At this time, the acceptance test result and the first storage identifier in the preset partition can be obtained, for example, the data in the preset partition can be read. After the data in the preset partition is obtained, the data can be used to make a judgment. Among them, the acceptance test result can be, for example, the first result identifier. It can be judged whether the first result identifier indicates that the acceptance test result is an acceptance failure.

[0102] In some embodiments, when the first result indicator is an acceptance success indicator, no operation may be performed. The acceptance success indicator may be 0, for example.

[0103] In step S24, when the first result identifier is an acceptance failure identifier and the first storage identifier is a preset storage identifier, read and write information of the original equipment manufacturer identifier corresponding to the universal flash memory is obtained;

[0104] According to some embodiments, the acceptance failure flag is used to indicate the acceptance failure of the acceptance test result for the universal flash memory. The preset storage flag is used to indicate that the acceptance test result has not been tested. The read-write information is used to indicate whether the universal flash memory supports the reading and writing of the original equipment manufacturer's logo. For example, it can be whether the information in the original equipment manufacturer's logo is supported to be modified.

[0105] In some embodiments, when the first result identifier is an acceptance failure identifier and the first storage identifier is a preset storage identifier, a QUERY REQUEST command may be used to query whether the UFS supports OEM ID writing.

[0106] In step S25, when the read-write information indicates that the universal flash memory supports the write operation, the failure record information is written into the original equipment manufacturer identifier of the universal flash memory;

[0107] According to some embodiments, when the read / write information indicates that the universal flash memory supports the write operation, the failure record information is written into the original equipment manufacturer identifier of the universal flash memory. That is, when the partition data is cleared, the data in the original equipment manufacturer identifier will not be cleared. The failure record information includes an acceptance test result, and the acceptance test result is used to indicate that the universal flash memory has not passed the quality test.

[0108] According to some embodiments, after writing the acceptance test result into the OEM logo of the universal flash memory, the method further includes:

[0109] The first storage identifier is set to the second storage identifier, wherein the second storage identifier is used to indicate that the test inspection for the acceptance test result is completed, and the failure record information is stored in the original equipment manufacturer identifier of the universal flash memory. Therefore, the modification of the storage identifier can improve the accuracy of data storage, make it clear that the test inspection of the acceptance test result has been completed, and can reduce the time and resources consumed by retesting the acceptance test result, which can reduce resource waste and save time.

[0110] The second storage identifier is different from the first storage identifier. The first storage identifier may be 0, for example, and the second storage identifier may be 1, for example.

[0111] According to some embodiments, after obtaining the read and write information of the original equipment manufacturer identification corresponding to the universal flash memory, the method further includes:

[0112] When the read / write information indicates that the universal flash memory does not support write operations, the first storage identifier is set to the third storage identifier, wherein the third storage identifier is used to indicate that the test inspection for the acceptance test result is completed, and the failure record information is not stored in the original equipment manufacturer identifier of the universal flash memory. Therefore, setting the first storage identifier to the third storage identifier can reduce the situation where repeated detection of the universal flash memory causes waste of resources, and can improve resource utilization efficiency.

[0113] The second storage identifier, the first storage identifier and the third storage identifier are different from each other. The first storage identifier may be 0, the second storage identifier may be 1, and the third storage identifier may be 2, for example.

[0114] In step S26, a query request is sent to the universal flash memory;

[0115] The specific process is as described above and will not be repeated here.

[0116] According to some embodiments, sending a query request to a universal flash memory includes:

[0117] When data of a preset partition in the universal flash memory is cleared, sending a first query request to the universal flash memory;

[0118] and / or

[0119] When the universal flash memory electronic device is in the booting stage, a second query request is sent to the universal flash memory.

[0120] The first query request is used to indicate a request sent when data in a preset partition in the universal flash memory is cleared. The first in the first query request is only used to distinguish the second query request. For example, the requests sent are different in different situations.

[0121] In some embodiments, the quality determination scheme of the present disclosure may be executed before each electronic device is powered on, and the execution of the scheme is independent of whether the partition data in the UFS is erased and cleared. For example, each time the electronic device is powered on, a second query request may be sent to the universal flash memory.

[0122] The technical solution of the present disclosure may also include, for example, determining whether the universal flash memory meets the quality requirements according to the acceptance test results in the preset partition before the data in the preset partition is erased or cleared.

[0123] In step S27, receiving the original equipment manufacturer identifier sent by the universal flash memory in response to the query request, wherein the original equipment manufacturer identifier includes an information set;

[0124] The specific process is as described above and will not be repeated here.

[0125] In step S28, when the information set includes the failure record information corresponding to the universal flash memory, it is determined that the quality of the universal flash memory does not meet the quality requirement.

[0126] The specific process is as described above and will not be repeated here.

[0127] The failure record information is used to indicate that the universal flash memory fails the quality test.

[0128] According to some embodiments, after determining that the quality of the universal flash memory does not meet the quality requirement, the method further includes:

[0129] A warning message is issued, wherein the warning message is used to indicate that the quality of the universal flash memory does not meet the quality requirements. The warning message does not specifically refer to a fixed message. The warning message includes but is not limited to a voice warning message, a vibration warning message, a flash light warning message, etc.

[0130] According to some embodiments, after determining that the quality of the universal flash memory does not meet the quality requirement, the universal flash memory may be intercepted to reduce the probability of outflow of the universal flash memory.

[0131] In some or related embodiments, when the electronic device to which the universal flash memory belongs is in the whole machine test stage, the universal flash memory is subjected to an acceptance test to obtain the acceptance test result; when the acceptance test result indicates that the acceptance test of the universal flash memory fails, the first result identifier and the first storage identifier corresponding to the acceptance test result are stored in the preset partition of the electronic device; when the electronic device is in the test inspection stage, the acceptance test result and the first storage identifier in the preset partition are obtained; when the first result identifier is an acceptance failure identifier and the first storage identifier is a preset storage identifier, the read-write information of the original equipment manufacturer identifier corresponding to the universal flash memory is obtained; when the read-write information indicates that the universal flash memory supports write operations, the failure record information is written into the original equipment manufacturer identifier of the universal flash memory. Therefore, the failure record information can be written into the original equipment manufacturer identifier according to the read-write information of the original equipment manufacturer identifier, and can be directly determined according to the failure record information when the quality inspection of the universal flash memory is performed, thereby reducing the probability of the universal flash memory flowing out in a bad situation, and increasing the safety of the universal flash memory being installed in the electronic device and the use of the electronic device.

[0132] Figure 5 is a block diagram of a quality determination device according to an exemplary embodiment. Figure 5 , the device comprises:

[0133] A request sending unit 501, used for sending a query request to a universal flash memory;

[0134] The identification receiving unit 502 is used to receive the original equipment manufacturer identification sent by the universal flash memory in response to the query request, wherein the original equipment manufacturer identification includes an information set;

[0135] The quality determination unit 503 is used to determine that the quality of the universal flash memory does not meet the quality requirement when the information set includes failure record information corresponding to the universal flash memory, wherein the failure record information is used to indicate that the universal flash memory has failed the quality test.

[0136] According to some embodiments, Figure 6is a block diagram of a quality determination device according to an exemplary embodiment. Figure 6 The device 500 further includes a storage unit 504, which is used to:

[0137] When the electronic device to which the universal flash memory belongs is in a whole-machine testing phase, performing an acceptance test on the universal flash memory and obtaining an acceptance test result;

[0138] When the acceptance test result indicates that the universal flash memory acceptance test fails, a first result identifier and a first storage identifier corresponding to the acceptance test result are stored in a preset partition of the electronic device, wherein the first storage identifier is used to indicate that the acceptance test result has not been tested.

[0139] According to some embodiments, the storage unit 504 is further configured to:

[0140] When the electronic device is in the testing and inspection stage, obtaining the acceptance test result and the first storage identifier in the preset partition;

[0141] When the first result identifier is an acceptance failure identifier and the first storage identifier is a preset storage identifier, obtaining read and write information of an original equipment manufacturer identifier corresponding to the universal flash memory;

[0142] When the read-write information indicates that the universal flash memory supports the write operation, the failure record information is written into the original equipment manufacturer identifier of the universal flash memory, wherein the failure record information includes the acceptance test result.

[0143] According to some embodiments, the storage unit 504 is further configured to, after writing the acceptance test result into the OEM identifier of the universal flash memory:

[0144] The first storage identifier is set to a second storage identifier, wherein the second storage identifier is used to indicate that the test inspection for the acceptance test result is completed, and the failure record information is stored in the original equipment manufacturer identifier of the universal flash memory.

[0145] According to some embodiments, the storage unit 504 is further configured to, after obtaining the read and write information of the original equipment manufacturer identification corresponding to the universal flash memory:

[0146] When the read-write information indicates that the universal flash memory does not support write operations, the first storage identifier is set to the third storage identifier, wherein the third storage identifier is used to indicate that the test inspection for the acceptance test results is completed and the failure record information is not stored in the original equipment manufacturer identifier of the universal flash memory.

[0147] According to some embodiments, the request sending unit 501, when used to send a query request to the universal flash memory, is specifically used to:

[0148] When data of a preset partition in the universal flash memory is cleared, sending a first query request to the universal flash memory;

[0149] and / or

[0150] When the universal flash memory electronic device is in the booting stage, a second query request is sent to the universal flash memory.

[0151] According to some embodiments, according to some embodiments, Figure 7 A block diagram of a quality determination device is shown according to an exemplary embodiment. Figure 7 The device 500 further includes an information sending unit 505, which is used to: after determining that the quality of the universal flash memory does not meet the quality requirement:

[0152] A warning message is issued, wherein the warning message is used to indicate that the quality of the universal flash memory does not meet the quality requirement.

[0153] Regarding the device in the above embodiment, the specific manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be elaborated here.

[0154] In some or related embodiments, a request sending unit is used to send a query request to a universal flash memory; an identification receiving unit is used to receive an OEM identification sent by the universal flash memory in response to the query request, wherein the OEM identification includes an information set; and a quality determination unit is used to determine that the quality of the universal flash memory does not meet the quality requirements when the information set includes failure record information corresponding to the universal flash memory, wherein the failure record information is used to indicate that the universal flash memory has not passed the quality test. The data in the OEM identification will not be cleared due to the erasure of data in the whole machine partition. Therefore, by determining whether the quality of the universal flash memory meets the quality requirements based on the information set in the OEM identification, the situation where the quality of the universal flash memory cannot be determined due to the erasure of partition data can be reduced, the feasibility and accuracy of the quality determination of the universal flash memory can be improved, the probability of the outflow of bad universal flash memory can be reduced, and the safety of device use can be improved.

[0155] Figure 8A schematic block diagram of an example electronic device 800 that can be used to implement an embodiment of the present disclosure is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable electronic devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present disclosure described and / or required herein.

[0156] like Figure 8 As shown, the electronic device 800 includes a computing unit 801, which can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) 802 or a computer program loaded from a storage unit 808 into a random access memory (RAM) 803. In the RAM 803, various programs and data required for the operation of the electronic device 800 can also be stored. The computing unit 801, the ROM 802, and the RAM 803 are connected to each other via a bus 804. An input / output (I / O) interface 805 is also connected to the bus 804.

[0157] A number of components in the electronic device 800 are connected to the I / O interface 805, including: an input unit 806, such as a keyboard, a mouse, etc.; an output unit 807, such as various types of displays, speakers, etc.; a storage unit 808, such as a disk, an optical disk, etc.; and a communication unit 809, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 809 allows the electronic device 800 to exchange information / data with other electronic devices through a computer network such as the Internet and / or various telecommunication networks.

[0158] The computing unit 801 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the computing unit 801 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, digital signal processors (DSPs), and any appropriate processors, controllers, microcontrollers, etc. The computing unit 801 performs the various methods and processes described above, such as the quality determination method. For example, in some embodiments, the quality determination method may be implemented as a computer software program, which is tangibly contained in a machine-readable medium, such as a storage unit 808. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 800 via the ROM 802 and / or the communication unit 809. When the computer program is loaded into the RAM 803 and executed by the computing unit 801, one or more steps of the quality determination method described above may be performed. Alternatively, in other embodiments, the computing unit 801 may be configured to perform the quality determination method in any other appropriate manner (e.g., by means of firmware).

[0159] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0160] The program code for implementing the method of the present disclosure may be written in any combination of one or more programming languages. These program codes may be provided to a processor or controller of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that the program code, when executed by the processor or controller, enables the functions / operations specified in the flow chart and / or block diagram to be implemented. The program code may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0161] In the context of the present disclosure, a machine-readable medium may be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, device, or equipment. A machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or equipment, or any suitable combination of the foregoing. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0162] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user can provide input to the computer. Other types of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0163] The systems and techniques described herein can be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), the Internet, and a blockchain network.

[0164] A computer system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The relationship between the client and the server is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services ("Virtual Private Server", or "VPS" for short). The server may also be a server of a distributed system, or a server combined with a blockchain.

[0165] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps recorded in this disclosure can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solutions disclosed in this disclosure can be achieved, and this document does not limit this.

[0166] The above specific implementations do not constitute a limitation on the protection scope of the present disclosure. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present disclosure shall be included in the protection scope of the present disclosure.

Claims

1. A quality determination method, characterized in that include: Sending a query request to the universal flash memory; receiving an original equipment manufacturer identifier sent by the universal flash memory in response to the query request, wherein the original equipment manufacturer identifier includes an information set; In a case where the information set includes failure record information corresponding to the universal flash memory, it is determined that the quality of the universal flash memory does not meet the quality requirement, wherein the failure record information is used to indicate that the universal flash memory has failed a quality test.

2. The method according to claim 1, characterized in that The method further comprises: When the electronic device to which the universal flash memory belongs is in a whole-machine testing phase, performing an acceptance test on the universal flash memory to obtain an acceptance test result; When the acceptance test result indicates that the universal flash memory acceptance test fails, a first result identifier and a first storage identifier corresponding to the acceptance test result are stored in a preset partition of the electronic device, wherein the first storage identifier is used to indicate that the acceptance test result has not been tested.

3. The method according to claim 2, characterized in that The method further comprises: When the electronic device is in a test and inspection phase, obtaining the acceptance test result and the first storage identifier in the preset partition; When the first result identifier is an acceptance failure identifier and the first storage identifier is a preset storage identifier, obtaining read and write information of an original equipment manufacturer identifier corresponding to the universal flash memory; In a case where the read-write information indicates that the universal flash memory supports a write operation, failure record information is written into an original equipment manufacturer identifier of the universal flash memory, wherein the failure record information includes the acceptance test result.

4. The method according to claim 3, characterized in that After writing the acceptance test result into the original equipment manufacturer identification of the universal flash memory, the method further includes: The first storage identifier is set as a second storage identifier, wherein the second storage identifier is used to indicate that the test inspection for the acceptance test result is completed, and the failure record information is stored in the original equipment manufacturer identifier of the universal flash memory.

5. The method according to claim 3, characterized in that: After acquiring the read and write information of the original equipment manufacturer identification corresponding to the universal flash memory, the method further includes: When the read-write information indicates that the universal flash memory does not support write operations, the first storage identifier is set to a third storage identifier, wherein the third storage identifier is used to indicate that the test inspection for the acceptance test result is completed and the failure record information is not stored in the original equipment manufacturer identifier of the universal flash memory.

6. The method according to claim 1, characterized in that The sending of the query request to the universal flash memory comprises: When data of a preset partition in the universal flash memory is cleared, sending a first query request to the universal flash memory; and / or When the universal flash memory and the electronic device are in a power-on stage, a second query request is sent to the universal flash memory.

7. The method according to claim 1, characterized in that After determining that the quality of the universal flash memory does not meet the quality requirement, the method further includes: A warning message is issued, wherein the warning message is used to indicate that the quality of the universal flash memory does not meet the quality requirement.

8. A quality determination device, characterized in that include: A request sending unit, used for sending a query request to the universal flash memory; an identification receiving unit, configured to receive an original equipment manufacturer identification sent by the universal flash memory in response to the query request, wherein the original equipment manufacturer identification includes an information set; A quality determination unit is used to determine that the quality of the universal flash memory does not meet the quality requirements when the information set includes failure record information corresponding to the universal flash memory, wherein the failure record information is used to indicate that the universal flash memory has not passed the quality test.

9. An electronic device, characterized in that: include: processor; a memory for storing instructions executable by the processor; The processor is configured to execute the instructions to implement the quality determination method according to any one of claims 1 to 7. 10 . A storage medium, when instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to execute the quality determination method according to any one of claims 1 to 7.

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