Calibration system and method

Abstract

The invention discloses a calibration system and method. According to the system, a simulated optical waveguide tool penetrates through a first side and a second side to form a plurality of through holes, so that a first opening is formed in the first side, and a second opening is formed in the second side; the through hole is determined according to the test position and the test angle of the optical waveguide eye box to be tested; the cube-corner prism is arranged on the first opening, and the center of the cube-corner prism is located on the axis of the through hole; the diaphragm is arranged on the lens of the test camera, and the optical axis of the diaphragm is located on the optical axis of the lens of the test camera; the test camera is located on the first side of the simulated optical waveguide tool; the light transmitting and receiving device is used for transmitting light and receiving reflected light and is located on the second side of the simulated optical waveguide tool; at least one of the test camera, the simulated optical waveguide tool and the light receiving and transmitting device can adjust the pose, so that the test camera and the light receiving and transmitting device are located on the extension line of one of the through holes. Accurate positioning of different positions and angles of the optical waveguide Eyebox is achieved, and then evaluation of optical performance is carried out.

Description

Technical Field

[0001] The present disclosure generally relates to the field of optical testing. More specifically, the present disclosure relates to a calibration system and method. Background Art

[0002] Today, optical waveguide technology has been used in augmented reality (AR) devices. Through optical waveguide technology, image information can be guided to the user's retina, thereby achieving a light and thin display effect with a wide field of view.

[0003] For optical waveguides, the optical performance of the image observed in its eyebox (e.g., field of view, size, dispersion, etc.) is an important indicator for evaluating the design process of optical waveguides. Therefore, the test and evaluation of the optical performance of the image observed in the optical waveguide eyebox is crucial. At present, the conventional test and evaluation scheme is to test the optical waveguide eyebox at a fixed position and angle, which does not conform to the actual use scenario of the human eye. In order to conform to the actual use scenario of the human eye, it is necessary to test and evaluate the optical performance of the image observed at different positions and angles of the optical waveguide eyebox.

[0004] Therefore, there is an urgent need to provide a calibration system and method to achieve accurate positioning of the optical waveguide Eyebox at different positions and angles, and then use the calibrated system to test and evaluate the optical performance of images observed at different positions and angles of the optical waveguide Eyebox. Summary of the invention

[0005] In order to at least solve one or more of the above-mentioned technical problems, the present disclosure proposes a calibration system and method in multiple aspects.

[0006] In a first aspect, the present disclosure provides a calibration system, which is applied to the optical performance test of the image observed in the optical waveguide eye box to be tested, and the system comprises: a test camera, an aperture, a corner cube prism, an optical waveguide emulation tooling and an optical transceiver; wherein the optical waveguide emulation tooling is provided with a plurality of through holes through a first side and a second side, so as to form a first opening on the first side and a second opening on the second side; the through holes are determined according to the test position and the test angle of the optical waveguide eye box to be tested; each through hole corresponds to a test position and a test angle of the optical waveguide eye box to be tested; the corner cube prism is removably arranged on the first opening, and the center of the corner cube prism is The diaphragm is removably arranged on the lens of the test camera, and the optical axis of the diaphragm is on the optical axis of the lens of the test camera; the test camera is located on the first side of the emulating optical waveguide tooling; the optical transceiver is used to emit light and receive reflected light, and is located on the second side of the emulating optical waveguide tooling; at least one of the test camera, the emulating optical waveguide tooling and the optical transceiver can adjust the posture so that the test camera and the optical transceiver are located on the extension line of one of the through holes, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole.

[0007] In some embodiments, the system is calibrated based on the posture of the test camera, and the system also includes: a first adjustment device and a second adjustment device; wherein the first adjustment device is connected to the emulation optical waveguide tooling to adjust the posture of the emulation optical waveguide tooling; the second adjustment device is connected to the optical transceiver to adjust the posture of the optical transceiver.

[0008] In some embodiments, the rotation center of the first adjustment device is consistent with the rotation center of the second adjustment device; the first adjustment device is an electric adjustment device; and the second adjustment device is a manual adjustment device.

[0009] In some embodiments, the system is calibrated based on the posture of the simulated optical waveguide tooling, and the system also includes: a second adjustment device and a third adjustment device; wherein the second adjustment device is connected to the optical transceiver device and is used to adjust the posture of the optical transceiver device; the third adjustment device is connected to the test camera and is used to adjust the posture of the test camera.

[0010] In some embodiments, the rotation center of the second adjustment device is consistent with the rotation center of the third adjustment device; the second adjustment device and the third adjustment device are both electric adjustment devices.

[0011] In some embodiments, the height of the emulated optical waveguide tooling is greater than a specified height.

[0012] In some embodiments, the diameter of the aperture is the same as the diameter of the through hole.

[0013] In some embodiments, the light emitted by the optical transceiver device includes: a first light and a second light; wherein the first light is a collimated laser; and the second light is a cross parallel light.

[0014] In a second aspect, the present disclosure provides a method for calibrating a system using the first aspect or any embodiment of the first aspect, comprising: setting a corner cube prism at at least one first opening; for a through hole provided with a corner cube prism at any first opening, controlling an optical transceiver to emit a first light ray to the through hole and receiving a reflected light ray from the corner cube prism; adjusting the posture of the optical transceiver based on a first position of the reflected light ray on the optical transceiver; when the corner cube prism is removed, controlling the optical transceiver to emit a first light ray through the through hole and passing through the aperture to reach the test camera; adjusting the position of the test camera based on a second position and a second shape formed by the first light ray on the test camera; when the corner cube prism, the aperture and the simulated optical waveguide tooling are removed, controlling the optical transceiver to emit a second light ray to the test camera; and adjusting the angle of the test camera based on a third position formed by the second light ray on the test camera.

[0015] In some embodiments, after adjusting the angle of the test camera, the method further includes: controlling the optical transceiver to emit a first light ray through the through hole and passing through the aperture to reach the test camera while removing the corner cone prism; and adjusting the position of the test camera based on a fourth position and a fourth shape formed by the first light ray on the test camera.

[0016] In some embodiments, the method further includes: controlling the optical transceiver and the test camera to rotate in the same rotation direction by a specified angle; and repeating the step of controlling the optical transceiver to emit a first light ray toward a through hole provided with a corner cube prism.

[0017] In a third aspect, the present disclosure provides a method for calibration using the system of the first aspect or any embodiment of the first aspect, comprising: setting a corner cube prism at at least one first opening; for a through hole provided with a corner cube prism at any first opening, controlling an optical transceiver to emit a first light ray through the aperture to reach the test camera when the emulation waveguide tooling and the corner cube prism are removed; adjusting the position of the optical transceiver based on a fifth position and a fifth form formed by the first light ray on the test camera; controlling the optical transceiver to emit a second light ray to the test camera when the emulation waveguide tooling, the corner cube prism and the aperture are removed; adjusting the angle of the optical transceiver based on a sixth position of the second light ray on the test camera; controlling the optical transceiver to emit a first light ray to the through hole and receiving a reflected light ray from the corner cube prism; and adjusting the posture of the emulation waveguide tooling based on a seventh position of the reflected light ray on the optical transceiver.

[0018] In some embodiments, the method further includes: controlling the emulating light waveguide tooling to rotate a specified angle; and repeatedly executing the step of controlling the optical transceiver device to emit a first light beam when the emulating light waveguide tooling and the corner cube prism are removed.

[0019] Through the calibration system and method provided above, the disclosed embodiment realizes system calibration by punching a through hole corresponding to the test position and test angle of the optical waveguide eye box to be tested on the optical waveguide emulation tooling, and then adjusting the position and posture of at least one of the test camera, the optical waveguide emulation tooling, and the optical transceiver for each through hole, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole based on the calibrated system, and accurately evaluate the optical performance of the image observed at different test positions and test angles of the optical waveguide eye box. Furthermore, by replacing different optical waveguide emulation tooling, it is possible to be compatible with the optical performance evaluation of multiple optical waveguide eye boxes at different positions and angles. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] By reading the detailed description below with reference to the accompanying drawings, the above and other objects, features and advantages of the exemplary embodiments of the present disclosure will become readily understood. In the accompanying drawings, several embodiments of the present disclosure are shown in an exemplary and non-limiting manner, and the same or corresponding reference numerals represent the same or corresponding parts, wherein:

[0021] Figure 1 A schematic diagram showing a calibration system according to an embodiment of the present disclosure is shown;

[0022] Figure 2 A schematic diagram showing the formation of through holes on an optical waveguide-like tooling according to some embodiments of the present disclosure;

[0023] Figure 3 A schematic diagram showing calibration based on the pose of a test camera in some embodiments of the present disclosure is shown;

[0024] Figure 4 A schematic diagram showing calibration based on the posture of an optical waveguide emulation tooling according to some embodiments of the present disclosure is shown;

[0025] Figure 5 An exemplary flow chart showing a calibration method according to some embodiments of the present disclosure is shown;

[0026] Figure 6 An exemplary flow chart of another calibration method according to some embodiments of the present disclosure is shown.

[0027] Description of reference numerals:

[0028] Test camera (10); aperture (20); corner cube prism (30); optical waveguide imitation tooling (40);

[0029] Optical transceiver (50); first opening (60); second opening (70);

[0030] A first adjusting device (80); a second adjusting device (90); and a third adjusting device (100). DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of the present disclosure to clearly and completely describe the technical solutions in the embodiments of the present disclosure. Obviously, the described embodiments are part of the embodiments of the present disclosure, not all of the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present disclosure.

[0032] It should be understood that the terms "include" and "comprising" used in the specification and claims of the present disclosure indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or collections thereof.

[0033] It should also be understood that the terms used in this disclosure are only for the purpose of describing specific embodiments and are not intended to limit the disclosure. As used in this disclosure and claims, the singular forms of "a", "an", and "the" are intended to include the plural forms unless the context clearly indicates otherwise. It should also be further understood that the term "and / or" used in this disclosure and claims refers to any combination of one or more of the associated listed items and all possible combinations, including these combinations.

[0034] As used in this specification and claims, the term "if" may be interpreted as "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" may be interpreted as meaning "upon determination" or "in response to determining" or "upon detection of [described condition or event]" or "in response to detecting [described condition or event]," depending on the context.

[0035] The specific implementation of the present disclosure is described in detail below with reference to the accompanying drawings.

[0036] The disclosed embodiment provides a calibration system, which is applied to the optical performance test of an image observed in an optical waveguide eye box to be tested.

[0037] See also Figure 1 , Figure 1 is a schematic diagram of a calibration system according to an embodiment of the present disclosure. Figure 1 As shown, in the disclosed embodiment, the calibration system includes: a test camera (10), an aperture (20), a corner cube prism (30), an emulating optical waveguide tool (40) and an optical transceiver (50); wherein the emulating optical waveguide tool (40) is provided with a plurality of through holes through a first side and a second side, thereby forming a first opening (60) on the first side and a second opening (70) on the second side; the through holes are determined according to a test position and a test angle of the optical waveguide eye box to be tested; each through hole corresponds to a test position and a test angle of the optical waveguide eye box to be tested; the corner cube prism (30) is removably arranged on the first opening (60), and the center of the corner cube prism (30) is located on the axis of the through hole; the aperture (20 ) is removably arranged on the lens of the test camera (10), and the optical axis of the diaphragm (20) is on the optical axis of the lens of the test camera (10); the test camera (10) is located on a first side of the emulating optical waveguide tooling (40); the optical transceiver (50) is used to emit light and receive reflected light, and is located on a second side of the emulating optical waveguide tooling (40); at least one of the test camera (10), the emulating optical waveguide tooling (40) and the optical transceiver (50) can adjust the position so that the test camera (10) and the optical transceiver (50) are located on the extension line of one of the through holes, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole.

[0038] For example, in this embodiment, the optical waveguide emulation tool (40) is arranged on a device specially used for setting up the optical waveguide to be measured, and the optical waveguide emulation tool is consistent with the appearance of the optical waveguide to be measured, but the height of the optical waveguide emulation tool (40) is greater than the specified height. Here, the specified height can be 10 mm or 12 mm, which is not specifically limited in the present disclosure embodiment, and the present disclosure embodiment can be described by taking 10 mm as an example.

[0039] By setting the height of the optical waveguide emulating tooling (40) to be greater than the specified height, it is possible to avoid the situation where the positions of the through holes corresponding to different positions and different angles of the optical waveguide eye box to be tested overlap when drilling through holes on the optical waveguide emulating tooling (40).

[0040] Specifically, participate in Figure 2 , Figure 2 A schematic diagram showing the formation of through holes on the light guide imitation tooling (40) of some embodiments of the present disclosure is shown, such as Figure 2 As shown, the height from the bottom of the emulating optical waveguide tooling (40) to the center of the eyebox of the optical waveguide to be measured is E, and the distance from the top of the emulating optical waveguide tooling (40) to the center of the eyebox of the optical waveguide to be measured is defined as D. Thus, the height of the emulating optical waveguide tooling (40) is: E-D. Based on the above description, E-D is greater than 10 mm.

[0041] A plurality of through holes are formed on the imitation optical waveguide tooling (40) through the first side and the second side. Here, the first side and the second side can be two opposite sides or two adjacent sides. The disclosed embodiment does not specifically limit this. The disclosed embodiment is described only by taking the first side and the second side as two opposite sides as an example.

[0042] like Figure 2 As shown, Figure 2 AA1 and OO1 are through holes formed on the emulating optical waveguide tooling (40). For through hole AA1, a first opening (60) A is formed on the first side of the emulating optical waveguide tooling (40), and a second opening (70) A1 is formed on the second side; for through hole OO1, a first opening (60) O is formed on the first side of the emulating optical waveguide tooling (40), and a second opening (70) O1 is formed on the second side.

[0043] In this embodiment, the through holes AA1 and OO1 are determined according to the test position and test angle of the optical waveguide eyebox to be tested; each through hole corresponds to a test position and test angle of the optical waveguide eyebox to be tested. For example, if the center of the optical waveguide eyebox to be tested is the test position, and the direction perpendicular to the optical waveguide eyebox to be tested is the test angle, then the position mapped on the first side of the optical waveguide emulation tooling (40) is point O, and the position mapped on the second side of the optical waveguide emulation tooling (40) is point O1, and the line of OO1 is punched into a through hole, that is, the test position is the center of the optical waveguide eyebox to be tested, and the test angle is the through hole corresponding to the direction perpendicular to the optical waveguide eyebox to be tested is OO1. For another example, if the center of the optical waveguide Eyebox to be tested is taken as the test position, and the angle θ with the direction perpendicular to the optical waveguide Eyebox to be tested is taken as the test angle, then the position mapped on the first side of the optical waveguide emulation tooling (40) is point A, and the position mapped on the second side of the optical waveguide emulation tooling (40) is point A1, and the line connecting AA1 is punched into a through hole, where AO=Dtanθ, A1O1=Etanθ, that is, the through hole corresponding to the test position being the center of the optical waveguide Eyebox to be tested and the test angle being the angle θ with the direction perpendicular to the optical waveguide Eyebox to be tested is AA1. By analogy, multiple through holes corresponding to different test positions and test angles of the optical waveguide Eyebox to be tested are formed in the optical waveguide emulation tooling (40).

[0044] Here, the diameter of the through hole can be any value, for example, 1 mm, 0.5 mm, etc. The embodiment disclosed herein does not specifically limit the diameter of the through hole, and it can be determined based on actual conditions.

[0045] Exemplarily, in this embodiment, the corner cube prism (30) can be arranged in affixed with the light waveguide imitation tooling (40), specifically, it can be removably arranged on the first opening (60), and the center of the corner cube prism (30) is located on the axis of the through hole. Here, the corner cube prism (30) is not affected by the alignment, and after the light is incident on the corner cube prism (30), the light is reflected back to the original direction through three reflections.

[0046] In this embodiment, when deploying the corner cube prism (30), only one corner cube prism (30) may be deployed, and it may be deployed at any first opening (60) on the emulating light waveguide tooling (40). During actual calibration, the corner cube prism (30) may be set at the first opening (60) of the through hole that needs to be calibrated. When deploying the corner cube prism (30), multiple corner cube prisms (30) may also be deployed. Specifically, the corner cube prism (30) may be deployed at multiple first openings (60) on the emulating light waveguide tooling (40) according to the actual calibration situation, or one corner cube prism (30) may be deployed at each first opening (60) on the emulating light waveguide tooling (40). This disclosed embodiment does not specifically limit this.

[0047] Based on the above description of the optical waveguide imitation tooling (40), as Figure 1 As shown, the test camera (10) is located on a first side of the emulating optical waveguide tooling (40); and the optical transceiver (50) is located on a second side of the emulating optical waveguide tooling (40).

[0048] In this embodiment, the test camera (10) includes but is not limited to an imaging colorimeter with an aperture front lens, a black and white or color camera with an aperture front lens, a black and white or color camera with an industrial lens, etc. The disclosed embodiment does not specifically limit the test camera (10) and can be determined according to actual conditions.

[0049] Regarding the deployment of the test camera (10), if the test camera (10) is an ordinary camera, the test camera (10) can be close to the simulated optical waveguide tooling (40) during deployment; if the test camera (10) is a camera with an aperture (20), the test camera (10) needs to be deployed to ensure that the test camera (10) can capture the optical waveguide to be tested, and the center of the test camera (10) lens needs to coincide with the center of the eyebox of the optical waveguide to be tested.

[0050] Exemplarily, in this embodiment, the diaphragm (20) is removably disposed on the lens of the test camera (10), and the optical axis of the diaphragm (20) is on the optical axis of the lens of the test camera (10). Here, the diaphragm (20) is an aperture diaphragm, and its diameter can be set according to actual conditions, for example, 1 mm, 0.5 mm, etc. In order to ensure better transmission of light, the diameter of the diaphragm (20) is set to be the same as the diameter of the through hole. As for the length of the diaphragm (20), it can be as long as possible while avoiding interference with the simulated optical waveguide tooling (40).

[0051] The optical transceiver (50) is used to emit light and receive reflected light. Specifically, the optical transceiver (50) can be an autocollimator. The light emitted by the optical transceiver (50) includes: a first light and a second light. The first light is a collimated laser. The second light is a cross parallel light. The light emitted by the optical transceiver (50) can be switched manually or automatically. Here, the first light and the second light have the same optical axis and the same angle reference.

[0052] Exemplarily, in this embodiment, at least one of the test camera (10), the simulated optical waveguide tooling (40) and the optical transceiver (50) can adjust its position so that the test camera (10) and the optical transceiver (50) are located on the extension line of one of the through holes, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole.

[0053] Specifically, if the position and posture of the optical waveguide imitation tooling (40) is to be adjusted, as Figure 3 As shown, the calibration system may further include: a first adjustment device (80), the first adjustment device (80) being connected to the light guide imitation tooling (40) and used to adjust the posture of the light guide imitation tooling (40); if the posture of the optical transceiver (50) is to be adjusted, as shown in FIG. Figure 4 As shown, the calibration system may further include: a second adjustment device (90), the second adjustment device (90) being connected to the optical transceiver (50) and used to adjust the position and posture of the optical transceiver (50); if the position and posture of the test camera (10) is to be adjusted, as shown in FIG. Figure 4 As shown, the calibration system may further include: a third adjustment device (100), the third adjustment device (100) being connected to the test camera (10) and being used to adjust the posture of the test camera (10).

[0054] In this embodiment, at least one of the test camera (10), the optical waveguide emulating fixture (40) and the optical transceiver (50) can adjust its position and posture, so that the test camera (10) and the optical transceiver (50) are located on the extension line of one of the through holes, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole. Specifically, the position and posture of the test camera (10) can be used as a calibration reference to adjust the position and posture of the optical waveguide emulating fixture (40) and the optical transceiver (50), and the position and posture of the test camera (10) and the optical transceiver (50) can also be used as a calibration reference to adjust the position and posture of the test camera (10) and the optical transceiver (50), which is not specifically limited in the disclosed embodiment.

[0055] During specific calibration, if the test camera (10) is relatively small (for example, the test camera (10) is an industrial camera) and is easy to change its position and angle, the position of the simulated optical waveguide tooling (40) can be used as a calibration reference, and the position of the optical transceiver (50) and the position of the test camera (10) can be calibrated using a first light beam emitted by the optical transceiver (50), the simulated optical waveguide tooling (40), the aperture (20) and the corner cube prism (30), and the angle of the test camera (10) can be calibrated using a second light beam emitted by the optical transceiver (50).

[0056] If the test camera (10) is relatively large (for example, the test camera (10) is an imaging colorimeter) and is difficult to move in position and angle, the position of the test camera (10) can be used as a calibration reference, and the position of the optical transceiver (50) and the position of the simulated optical waveguide tooling (40) can be calibrated using a first light beam emitted by the optical transceiver (50), an aperture (20) and a corner cube prism (30), and the angle of the optical transceiver (50) can be calibrated using a second light beam emitted by the optical transceiver (50).

[0057] As an optional embodiment of the present disclosure, if the calibration system is calibrated based on the posture of the test camera (10), the calibration system further includes: a first adjustment device (80) and a second adjustment device (90); wherein the first adjustment device (80) is connected to the emulation optical waveguide tooling (40) and is used to adjust the posture of the emulation optical waveguide tooling (40); and the second adjustment device (90) is connected to the optical transceiver (50) and is used to adjust the posture of the optical transceiver (50).

[0058] Exemplarily, in the present embodiment, the rotation center of the first adjustment device (80) is consistent with the rotation center of the second adjustment device (90), that is, the first adjustment device (80) and the second adjustment device (90) rotate around the same rotation point when rotating. Here, the rotation centers of the first adjustment device (80) and the second adjustment device (90) can be set arbitrarily. In the present embodiment, the first adjustment device (80) can be a manual adjustment device (for example, a 6-axis manual adjustment device) or an automatic adjustment device (for example, a 6-axis electric adjustment device). Similarly, the second adjustment device (90) can also be a manual adjustment device (for example, a 6-axis manual adjustment device) or an automatic adjustment device (for example, a 6-axis electric adjustment device). The present disclosed embodiment does not specifically limit this.

[0059] Preferably, when the calibration system is calibrated based on the position of the test camera (10), during the calibration process, the positions of the optical transceiver (50) and the test camera (10) remain unchanged, and only the simulated optical waveguide tooling (40) needs to be rotated to different angles to calibrate different through holes. Therefore, in order to save resources, the first adjustment device (80) is set as an electric adjustment device, and the second adjustment device (90) is set as a manual adjustment device.

[0060] As an optional embodiment of the present disclosure, if the calibration system is calibrated based on the posture of the simulated optical waveguide tooling (40), the calibration system further includes: a second adjustment device (90) and a third adjustment device (100); wherein the second adjustment device (90) is connected to the optical transceiver (50) and is used to adjust the posture of the optical transceiver (50); and the third adjustment device (100) is connected to the test camera (10) and is used to adjust the posture of the test camera (10).

[0061] Exemplarily, the rotation center of the second adjustment device (90) is consistent with the rotation center of the third adjustment device (100); that is, the second adjustment device (90) and the third adjustment device (100) rotate around the same rotation point when rotating. Here, the rotation centers of the second adjustment device (90) and the third adjustment device (100) can be set arbitrarily. In this embodiment, the second adjustment device (90) can be a manual adjustment device (for example, a 6-axis manual adjustment device) or an automatic adjustment device (for example, a 6-axis electric adjustment device). Similarly, the third adjustment device (100) can also be a manual adjustment device (for example, a 6-axis manual adjustment device) or an automatic adjustment device (for example, a 6-axis electric adjustment device). The disclosed embodiment does not specifically limit this.

[0062] Preferably, when the calibration system is calibrated based on the position and posture of the emulating optical waveguide tooling (40), during the calibration process, it is necessary to continuously adjust the position and posture of the optical transceiver (50) and the test camera (10) to calibrate different through holes on the emulating optical waveguide tooling (40). Therefore, in order to improve the calibration efficiency, the second adjustment device (90) and the third adjustment device (100) are both configured as electric adjustment devices.

[0063] It should be noted that, in the disclosed embodiment, the calibration system may simultaneously include: a first adjustment device (80), a second adjustment device (90) and a third adjustment device (100), and the rotation centers of the first adjustment device (80), the second adjustment device (90) and the third adjustment device (100) are consistent, and the first adjustment device (80), the second adjustment device (90) and the third adjustment device (100) are automatic adjustment devices or manual adjustment devices, which can be set according to actual conditions.

[0064] Through the calibration system provided above, the disclosed embodiment realizes system calibration by punching through holes corresponding to the test positions and test angles of the optical waveguide eye box to be tested on the optical waveguide emulation tooling, and then adjusting the position and posture of at least one of the test camera, the optical waveguide emulation tooling, and the optical transceiver for each through hole, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole based on the calibrated system, and accurately evaluate the optical performance of the image observed at different test positions and test angles of the optical waveguide eye box. Furthermore, by replacing different optical waveguide emulation tooling, it is possible to be compatible with the optical performance evaluation of multiple optical waveguide eye boxes at different positions and angles.

[0065] Based on the above description of the calibration system, Figure 5 An exemplary flow chart of a calibration method according to some embodiments of the present disclosure is shown. Figure 5As shown, the calibration method 500 is calibrated based on the posture of the emulated optical waveguide tooling, and the calibration method 500 includes: S510: setting a corner cube prism at at least one first opening; S520: for a through hole with a corner cube prism at any first opening, controlling the optical transceiver to emit a first light to the through hole, and receiving a reflected light from the corner cube prism; S530: adjusting the posture of the optical transceiver based on the first position of the reflected light on the optical transceiver; S540: in the case of removing the corner cube prism, controlling the optical transceiver to emit a first light through the through hole, and passing through the aperture to reach the test camera; S550: adjusting the position of the test camera based on the second position and second shape formed by the first light on the test camera; S560: in the case of removing the corner cube prism, the aperture and the emulated optical waveguide tooling, controlling the optical transceiver to emit a second light to the test camera; S570: adjusting the angle of the test camera based on the third position formed by the second light on the test camera.

[0066] Exemplarily, the disclosed embodiment is explained by taking the calibration system including: a test camera, a third adjustment device, an aperture, a corner cube prism, an imitation optical waveguide tooling, a first adjustment device, an optical transceiver device, and a second adjustment device as an example. In this embodiment, the setting method of the corner cube prism refers to the description of the above system embodiment, which will not be repeated here.

[0067] If the position and posture of the simulating optical waveguide tooling is used as a reference for calibration, specifically, first, the simulating optical waveguide tooling and the first adjustment device are leveled using a micrometer, so that the height difference of the simulating optical waveguide tooling in the X direction and the Y direction in the specified coordinate system is less than a specified value (for example, 20um). Here, the specified coordinate system is established in advance according to actual conditions, for example, the coordinate system is established with the center of the simulating optical waveguide tooling as the origin, the horizontal direction as the X direction, the direction perpendicular to the X direction on the horizontal plane as the Y direction, and the vertical direction as the Z direction, or other establishment methods are used to establish the coordinate system. The disclosed embodiment does not specifically limit the establishment method of the specified coordinate system.

[0068] The positions mentioned below are all positions in the specified coordinate system, and the angles below are all angles with the specified direction. Here, the specified direction is also called the 0deg direction, which is set in advance. For example, it can be the X direction of the specified coordinate system, or the Y direction of the specified coordinate system, etc., which is not specifically limited in the disclosed embodiments.

[0069] The specific calibration process is as follows:

[0070] For any through hole with a corner cube prism at the first opening (referred to as the first through hole), the test camera in the calibration system and the aperture set on the test camera lens are moved away, and the optical transceiver is controlled to emit a first light (i.e., a collimated laser) to the above-mentioned first through hole. The first light passes through the first through hole to reach the corner cube prism, and the reflected light from the corner cube prism is received. The reflected light reaches the CCD board of the optical transceiver, and the second adjustment device is controlled based on the first position of the reflected light on the CCD board to adjust the posture of the optical transceiver until the angle between the line connecting the first position of the reflected light on the CCD board and the origin of the specified coordinate system and the specified direction is less than the specified angle (for example, 0.02deg, 0.01deg, etc.), and the adjustment is stopped to obtain the posture of the optical transceiver.

[0071] Move the test camera and the aperture back, and remove the corner cube prism. When the corner cube prism is removed, control the optical transceiver to emit a first light beam through the first through hole and through the aperture to reach the test camera. Based on the second position and second form formed by the first light beam on the test camera, control the third adjustment device to adjust the position of the test camera. Specifically, the second form refers to the shape of the light spot of the first light beam on the test camera and the shape of the halo. When making specific adjustments, when the distance between the second position and the center of the optical axis of the test camera is less than or equal to a specified distance (e.g., 20 μm), and the second form is that the light spot is circular and the halo is symmetrical, stop adjusting and determine the position of the test camera.

[0072] The aperture and the simulating light waveguide fixture are removed, and when the corner cube prism, the aperture and the simulating light waveguide fixture are removed, the optical transceiver is controlled to emit a second light (i.e., a cross parallel light) to the test camera, and based on the third position formed by the second light on the test camera, the third adjustment device is controlled to adjust the angle of the test camera. When adjusting specifically, when the angle between the line connecting the third position of the second light on the test camera and the origin of the specified coordinate system and the specified direction is less than or equal to a preset angle (e.g., 0.02 degrees), the adjustment is stopped and the angle of the test camera is determined.

[0073] Based on the above description, the system calibration at the test position and test angle corresponding to the above-mentioned first through hole is completed, and the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the first through hole is tested based on the adjusted position and angle of the test camera and the adjusted position and angle of the emulating optical waveguide tooling.

[0074] As an optional implementation of the disclosed embodiment, the above adjustment of the position of the test camera is a coarse adjustment. Furthermore, the calibration method further includes: when the corner cube prism is removed, controlling the optical transceiver to emit a first light beam through the first through hole and passing through the aperture to reach the test camera; adjusting the position of the test camera based on the fourth position and fourth form formed by the first light beam on the test camera, that is, fine adjustment of the position of the test camera to obtain a more accurate position of the test camera. Based on the position of the finely adjusted test camera, the angle of the adjusted test camera, and the adjusted position and angle of the simulated optical waveguide tooling, the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the first through hole is tested.

[0075] As an optional implementation of the disclosed embodiment, after completing the test of the optical performance of the image observed at the test position and test angle corresponding to the first through hole, the optical performance of the image observed at the test position and test angle corresponding to other through holes can also be tested. Based on this, the calibration method also includes:

[0076] The optical transceiver and the test camera are controlled to rotate in the same rotation direction to a specified angle; and the step of controlling the optical transceiver to emit a first light beam to a through hole provided with a corner cube prism is repeatedly executed.

[0077] For example, in this embodiment, Figure 4 As shown, after controlling the optical transceiver and the test camera to rotate in the same rotation direction by a specified angle (for example, angle θ), the step of controlling the optical transceiver to emit the first light to the through hole provided with the corner cube prism is repeated to complete the calibration at the test position and test angle corresponding to the next through hole (recorded as the second through hole), and the optical performance of the optical waveguide eye box to be tested at the test position and test angle corresponding to the second through hole is tested. The specific implementation method refers to the calibration process at the first through hole mentioned above, which will not be repeated here.

[0078] Through the calibration method provided above, the disclosed embodiment realizes system calibration by punching a through hole corresponding to the test position and test angle of the optical waveguide eye box to be tested on the optical waveguide emulating tooling, and then adjusting the position and posture of at least one of the test camera, the optical waveguide emulating tooling, and the optical transceiver for each through hole, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole based on the calibrated system, and accurately evaluate the optical performance of the image observed at different test positions and test angles of the optical waveguide eye box. Furthermore, by replacing different optical waveguide emulating tooling, it is possible to be compatible with the optical performance evaluation of multiple optical waveguide eye boxes at different positions and angles.

[0079] Based on the above description of the calibration system, Figure 6An exemplary flow chart of another calibration method according to some embodiments of the present disclosure is shown. Figure 6 As shown, the calibration method 600 is calibrated based on the posture of the test camera, and the calibration method 600 includes: S610: setting a corner cube prism at at least one first opening; S620: for any through hole with a corner cube prism at the first opening, when the emulating light waveguide tooling and the corner cube prism are removed, controlling the optical transceiver to emit a first light ray, which passes through the aperture to reach the test camera; S630: adjusting the position of the optical transceiver based on the fifth position and the fifth shape formed by the first light ray on the test camera; S640: when the emulating light waveguide tooling, the corner cube prism and the aperture are removed, controlling the optical transceiver to emit a second light ray to the test camera; S650: adjusting the angle of the optical transceiver based on the sixth position of the second light ray on the test camera; S660: controlling the optical transceiver to emit the first light ray to the through hole, and receiving the reflected light ray from the corner cube prism; S670: adjusting the posture of the emulating light waveguide tooling based on the seventh position of the reflected light ray on the optical transceiver.

[0080] Exemplarily, the disclosed embodiment is explained by taking the calibration system including: a test camera, a third adjustment device, an aperture, a corner cube prism, an imitation optical waveguide tooling, a first adjustment device, an optical transceiver device, and a second adjustment device as an example. In this embodiment, the setting method of the corner cube prism refers to the description of the above system embodiment, which will not be repeated here.

[0081] If calibration is performed based on the test camera's posture, specifically, first, use a micrometer to level the test camera and the third adjustment device, so that the height difference of the third adjustment device in the X direction and the Y direction of the specified coordinate system is less than a specified value (e.g., 20um). Here, the specified coordinate system is established in advance according to actual conditions, for example, a coordinate system is established with the center of the test camera as the origin, the horizontal direction as the X direction, the direction perpendicular to the X direction on the horizontal plane as the Y direction, and the vertical direction as the Z direction, or other methods are used to establish the coordinate system. The disclosed embodiment does not specifically limit the method for establishing the specified coordinate system.

[0082] The positions mentioned below are all positions in the specified coordinate system, and the angles below are all angles with the specified direction. Here, the specified direction is also called the 0deg direction, which is set in advance. For example, it can be the X direction of the specified coordinate system, or the Y direction of the specified coordinate system, etc., which is not specifically limited in the disclosed embodiments.

[0083] The specific calibration process is as follows:

[0084] For any through hole with a corner cube prism at the first opening (referred to as the third through hole), the emulating light waveguide tooling and the corner cube prism are removed. When the emulating light waveguide tooling and the corner cube prism are removed, the optical transceiver is controlled to emit a first light ray (i.e., a collimated laser) which passes through an aperture to reach a test camera. Based on a fifth position and a fifth form formed by the first light ray on the test camera, the second adjustment device is controlled to adjust the position of the optical transceiver. Specifically, the fifth form refers to the shape of the light spot and the shape of the halo of the first light ray on the test camera. During the specific adjustment, when the distance between the fifth position and the center of the optical axis of the test camera is less than or equal to a specified distance (e.g., 20 μm), and the fifth form is that the light spot is circular and the halo is symmetrical, the adjustment is stopped to determine the position of the optical transceiver.

[0085] Move the aperture away, and when the simulated light waveguide tooling, the corner cube prism and the aperture are removed, control the optical transceiver to emit a second light (i.e., a cross parallel light) to reach the test camera, and control the second adjustment device to adjust the angle of the optical transceiver based on the sixth position of the second light on the test camera. When adjusting, when the angle between the line connecting the sixth position of the second light on the test camera and the origin of the specified coordinate system and the specified direction is less than or equal to a preset angle (e.g., 0.02 degrees), stop adjusting and determine the angle of the optical transceiver.

[0086] The test camera is moved away and the emulating optical waveguide tooling and the corner cube prism are moved back, and the optical transceiver is controlled to emit a first light to the third through hole. The first light passes through the first through hole to reach the corner cube prism, and the reflected light from the corner cube prism is received. The reflected light reaches the CCD board of the optical transceiver, and the first adjustment device is controlled to adjust the posture of the emulating optical waveguide tooling based on the seventh position of the reflected light on the CCD board, until the angle between the line connecting the seventh position of the reflected light on the CCD board and the origin of the specified coordinate system and the specified direction is less than a preset angle (for example, 0.02deg, 0.01deg, etc.), and the adjustment is stopped to obtain the posture of the emulating optical waveguide tooling.

[0087] Based on the above description, the system calibration at the test position and test angle corresponding to the above-mentioned first through hole is completed, and the optical performance of the test position and test angle of the optical waveguide eye box to be tested corresponding to the third through hole is tested based on the position and angle of the test camera and the adjusted position and angle of the simulated optical waveguide tooling.

[0088] As an optional implementation of the disclosed embodiment, after completing the test of the optical performance at the test position and test angle corresponding to the third through hole, the optical performance at the test position and test angle corresponding to other through holes can also be tested. Based on this, the calibration method also includes: controlling the emulating optical waveguide tooling to rotate a specified angle; repeatedly executing the step of controlling the optical transceiver to emit the first light when the emulating optical waveguide tooling and the corner cube prism are removed.

[0089] For example, the above-mentioned specified angle may be, for example, an angle θ, and the present disclosure does not specifically limit the specified angle. Figure 3 As shown, the emulating optical waveguide fixture is controlled to rotate a specified angle, and the step of controlling the optical transceiver to emit the first light beam is repeatedly performed when the emulating optical waveguide fixture and the corner cube prism are removed, so as to complete the calibration at the test position and test angle corresponding to the next through hole (recorded as the fourth through hole), and the optical performance of the optical waveguide eye box to be tested at the test position and test angle corresponding to the fourth through hole is tested. The specific implementation method refers to the calibration process at the third through hole above, which will not be repeated here.

[0090] Through the calibration method provided above, the disclosed embodiment realizes system calibration by punching a through hole corresponding to the test position and test angle of the optical waveguide eye box to be tested on the optical waveguide emulating tooling, and then adjusting the position and posture of at least one of the test camera, the optical waveguide emulating tooling, and the optical transceiver for each through hole, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole based on the calibrated system, and accurately evaluate the optical performance of the image observed at different test positions and test angles of the optical waveguide eye box. Furthermore, by replacing different optical waveguide emulating tooling, it is possible to be compatible with the optical performance evaluation of multiple optical waveguide eye boxes at different positions and angles.

[0091] Although multiple embodiments of the present disclosure have been shown and described herein, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Those skilled in the art may think of many changes, modifications, and alternatives without departing from the thought and spirit of the present disclosure. It should be understood that in the process of practicing the present disclosure, various alternatives to the embodiments of the present disclosure described herein may be adopted. The attached claims are intended to define the scope of protection of the present disclosure, and therefore cover equivalents or alternatives within the scope of these claims.

Claims

1. A calibration system, characterized in that: The system is applied to the optical performance test of the image observed in the optical waveguide eye box to be tested, and the system comprises: a test camera, an aperture, a corner cube prism, an optical waveguide imitation tooling and an optical transceiver; The optical waveguide imitation tooling has a plurality of through holes formed through the first side and the second side, thereby forming a first opening on the first side and a second opening on the second side; the through holes are determined according to the test position and test angle of the optical waveguide eye box to be tested; each through hole corresponds to a test position and test angle of the optical waveguide eye box to be tested; The corner cube prism is removably disposed on the first opening, and the center of the corner cube prism is located on the axis of the through hole; The aperture is removably disposed on the lens of the test camera, and the optical axis of the aperture is on the optical axis of the lens of the test camera; The test camera is located on the first side of the imitation optical waveguide tooling; The optical transceiver is used to transmit light and receive reflected light, and is located on the second side of the imitation optical waveguide tooling; At least one of the test camera, the emulating optical waveguide tooling and the optical transceiver device can adjust the position so that the test camera and the optical transceiver device are located on the extension line of one of the through holes, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole.

2. The system according to claim 1, characterized in that The system is calibrated based on the posture of the test camera, and the system further includes: a first adjustment device and a second adjustment device; Wherein, the first adjustment device is connected to the optical waveguide emulating tooling and is used to adjust the posture of the optical waveguide emulating tooling; The second adjustment device is connected to the optical transceiver device and is used to adjust the position and posture of the optical transceiver device.

3. The system according to claim 2, characterized in that The rotation center of the first adjustment device is consistent with the rotation center of the second adjustment device; the first adjustment device is an electric adjustment device; and the second adjustment device is a manual adjustment device.

4. The system according to claim 1, characterized in that The system is calibrated based on the posture of the optical waveguide imitation tooling, and the system further includes: a second adjustment device and a third adjustment device; Wherein, the second adjustment device is connected to the optical transceiver device and is used to adjust the posture of the optical transceiver device; The third adjustment device is connected to the test camera and is used to adjust the posture of the test camera.

5. The system according to claim 4, characterized in that The rotation center of the second adjusting device is consistent with the rotation center of the third adjusting device; the second adjusting device and the third adjusting device are both electric adjusting devices.

6. The system according to claim 1, characterized in that The height of the optical waveguide imitation tooling is greater than the specified height.

7. The system according to claim 1, characterized in that The diameter of the aperture is the same as the diameter of the through hole.

8. The system according to claim 1, characterized in that The light emitted by the optical transceiver device includes: a first light and a second light; The first light is a collimated laser, and the second light is a cross parallel light.

9. A method for calibration using the system of any one of claims 1 to 8, characterized in that include: A corner cube is disposed in at least one first opening; For any through hole with a corner cube prism disposed at the first opening, controlling the optical transceiver to emit a first light beam to the through hole and receive a reflected light beam from the corner cube prism; Adjusting the posture of the optical transceiver device based on the first position of the reflected light on the optical transceiver device; When the corner cube prism is removed, controlling the optical transceiver to emit a first light beam through the through hole and passing through the aperture to reach the test camera; adjusting the position of the test camera based on a second position and a second shape formed by the first light on the test camera; When the corner cube prism, the aperture and the imitation optical waveguide tooling are removed, controlling the optical transceiver device to emit a second light beam to the test camera; as well as The angle of the test camera is adjusted based on a third position formed by the second light on the test camera.

10. The method according to claim 9, characterized in that After adjusting the angle of the test camera, the method further includes: When the corner cube prism is removed, controlling the optical transceiver to emit a first light beam through the through hole and passing through the aperture to reach the test camera; The position of the test camera is adjusted based on a fourth position and a fourth shape formed by the first light on the test camera.

11. The method according to claim 9 or 10, characterized in that: The method further comprises: Controlling the optical transceiver and the test camera to rotate in the same rotation direction by a specified angle; The step of controlling the optical transceiver device to emit the first light to the through hole provided with the corner cube prism is repeatedly performed.

12. A method for calibration using the system of any one of claims 1 to 8, characterized in that include: A corner cube is disposed in at least one first opening; For any through hole with a corner cube prism at the first opening, when the light waveguide imitation tooling and the corner cube prism are removed, the optical transceiver is controlled to emit a first light beam through the aperture to reach the test camera; adjusting the position of the optical transceiver based on a fifth position and a fifth shape formed by the first light on the test camera; When the imitation optical waveguide tooling, the corner cube prism and the aperture are removed, controlling the optical transceiver to emit a second light beam to the test camera; adjusting the angle of the optical transceiver based on a sixth position of the second light on the test camera; Controlling the optical transceiver to emit a first light beam to the through hole and receive a reflected light beam from the corner cube prism; The posture of the optical waveguide emulating tooling is adjusted based on the seventh position of the reflected light on the optical transceiver.

13. The method according to claim 12, characterized in that The method further comprises: Controlling the optical waveguide imitation tooling to rotate at a specified angle; Repeat the step of controlling the optical transceiver to emit the first light when the simulating optical waveguide tooling and the corner cube prism are removed.

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