Sensor performance test method, system and device and computer equipment

Abstract

The invention relates to a sensor performance testing method, system and device and computer equipment. The method comprises the steps of obtaining an output amplification signal of a sensor to be tested, obtaining a plurality of performance measurement indexes of the sensor to be tested based on the output amplification signal, and determining that a performance test result of the sensor to be tested is test pass under the condition that each performance measurement index meets a preset standard performance condition, and the sensor to be tested is covered by a shielding box. According to the method, in the testing process, the sensor to be tested is covered by the shielding box, so that electromagnetic interference generated in the external environment where the sensor to be tested is located can be isolated, the obtained output amplification signal of the sensor to be tested is a non-electromagnetic signal, the precision of the obtained output amplification signal of the sensor to be tested is improved, and the testing accuracy of the sensor to be tested is improved. And on the basis of high-precision output of the amplification signal, the accuracy of the test performance result of the sensor can be further improved.

Description

Technical Field

[0001] The present application relates to the field of electric power technology, and in particular to a sensor performance testing method, system, device and computer equipment. Background Art

[0002] With the development of power electronics technology, fluxgate sensors are widely used in various fields due to their high precision, high sensitivity, low power consumption, miniaturization and other characteristics. They are used to measure weak magnetic fields, such as geomagnetic measurement, package inspection, weak magnetic field detection, rail transportation, medical field, new energy field, etc.

[0003] Among them, the electronic noise of the internal components of the fluxgate sensor will affect its own measurement quality during operation. Therefore, it is particularly important to test the performance of the fluxgate sensor before it leaves the factory.

[0004] However, in the related art, when testing the performance of the fluxgate sensor, there is a problem of accuracy of the test results. Summary of the invention

[0005] Based on this, it is necessary to provide a sensor performance testing method, system, device and computer equipment to address the above technical problems, which can improve the accuracy of test results during the performance testing of the fluxgate sensor.

[0006] In a first aspect, an embodiment of the present application provides a sensor performance testing method, the method comprising:

[0007] Obtaining an output amplified signal of the sensor to be tested; the output amplified signal is generated after amplifying the output signal of the sensor to be tested, and the sensor to be tested is covered by a shielding box;

[0008] Based on the output amplified signal, multiple performance measurement indicators of the sensor to be tested are obtained;

[0009] When each performance measurement indicator meets the preset standard performance conditions, the performance test result of the sensor to be tested is determined to be a test pass.

[0010] In one embodiment, multiple performance measurement indicators of the sensor to be tested are obtained based on the output amplified signal, including:

[0011] Screening the output amplified signal to determine the screened signal;

[0012] Perform conversion processing on the filtered signal to obtain a corresponding digital signal;

[0013] Based on the digital signal, various performance measurement indicators are determined.

[0014] In one embodiment, screening the output amplified signal to determine a screened signal includes:

[0015] When the intensity of the output amplified signal is greater than a preset intensity threshold, attenuating the output amplified signal to obtain an attenuated signal;

[0016] The attenuated signal is filtered to obtain a screened signal.

[0017] In one embodiment, converting and processing the filtered signal to obtain a corresponding digital signal includes:

[0018] The filtered signal is converted into an intermediate frequency signal, and the intermediate frequency signal is converted into a digital signal.

[0019] In one embodiment, each performance metric includes a signal-to-noise ratio; and determining each performance metric based on the digital signal includes:

[0020] Perform spectrum analysis on digital signals to determine the amplitude and phase information of the output amplified signal at different frequency points;

[0021] The signal-to-noise ratio is determined based on the amplitude and phase information of the output amplified signal at different frequency points.

[0022] In one embodiment, each performance metric includes total harmonic distortion; and determining each performance metric based on the digital signal includes:

[0023] Obtaining a transient noise signal corresponding to the digital signal;

[0024] The transient noise signal is analyzed and processed to obtain the total harmonic distortion.

[0025] In one embodiment, each performance metric includes a signal-to-noise ratio and a total harmonic distortion; and the method further includes:

[0026] If the signal-to-noise ratio is greater than a preset signal-to-noise ratio threshold and the total harmonic distortion is less than a preset distortion threshold, then it is determined that each performance measurement indicator meets the standard performance condition;

[0027] Otherwise, it is determined that each performance measurement indicator does not meet the standard performance condition.

[0028] In one embodiment, the method further comprises:

[0029] When the performance test result of the sensor to be tested is that the test fails, control the replacement of a target component in the sensor to be tested to obtain a replaced sensor; the target component includes at least one of a power adapter, a cable and a connector in the sensor to be tested;

[0030] The performance of the replaced sensor is tested until the performance test result of the replaced sensor is tested as passed.

[0031] In a second aspect, an embodiment of the present application provides a sensor performance test system, the system comprising: a computer device, a sensor to be tested, a signal amplifier, a shielding box and a signal generator;

[0032] The computer device is used to execute the steps of the method of any embodiment in the first aspect above.

[0033] In a third aspect, an embodiment of the present application provides a sensor performance testing device, the device comprising:

[0034] A signal acquisition module is used to acquire an output amplified signal of the sensor to be tested; the output amplified signal is generated after amplifying the output signal of the sensor to be tested, and the sensor to be tested is covered by a shielding box;

[0035] An indicator module, used for obtaining multiple performance measurement indicators of the sensor to be tested based on the output amplified signal;

[0036] The test result determination module is used to determine that the performance test result of the sensor to be tested is a test pass when each performance measurement indicator meets a preset standard performance condition.

[0037] In a fourth aspect, an embodiment of the present application further provides a computer device, the computer device comprising a memory and a processor, the memory storing a computer program, and the processor implementing the steps of the method of any embodiment of the first aspect when executing the computer program.

[0038] In a fifth aspect, an embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the method of any embodiment in the above-mentioned first aspect are implemented.

[0039] In a sixth aspect, an embodiment of the present application further provides a computer program product, the computer program product comprising a computer program, which, when executed by a processor, implements the steps of the method of any embodiment in the first aspect above.

[0040] The embodiment of the present application provides a sensor performance test method, system, device and computer equipment, the method comprising: obtaining an output amplified signal of the sensor to be tested, obtaining multiple performance measurement indicators of the sensor to be tested based on the output amplified signal, and determining that the performance test result of the sensor to be tested is a test pass when each performance measurement indicator meets the preset standard performance conditions, wherein the sensor to be tested is covered by a shielding box. In the above method, during the test process, the sensor to be tested is covered by a shielding box, which can isolate the electromagnetic interference generated in the external environment where the sensor to be tested is located, so that the output amplified signal of the sensor to be tested obtained is an electromagnetic-free signal, which improves the accuracy of the output amplified signal of the sensor to be tested, and on the basis of the high-precision output amplified signal, the accuracy of the sensor test performance results can be further improved; at the same time, the above method does not require human participation, and can greatly improve the accuracy of the sensor test performance results and improve the performance test speed. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 A diagram showing an application environment of a sensor performance testing method in an embodiment;

[0042] Figure 2 A schematic diagram of a flow chart of a sensor performance testing method in one embodiment;

[0043] Figure 3 is a flow chart of a sensor performance testing method in another embodiment;

[0044] Figure 4 is a flow chart of a sensor performance testing method in another embodiment;

[0045] Figure 5 is a flow chart of a sensor performance testing method in another embodiment;

[0046] Figure 6 is a flow chart of a sensor performance testing method in another embodiment;

[0047] Figure 7 is a flow chart of a sensor performance testing method in another embodiment;

[0048] Figure 8 A structural block diagram of a sensor performance testing device in one embodiment;

[0049] Fig. 9 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0050] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0051] In the field of electric power technology, fluxgate sensors are widely used in various fields due to their high precision, high sensitivity, low power consumption, miniaturization and other characteristics. They are used to measure weak magnetic fields, such as geomagnetic measurement, package inspection, weak magnetic field detection, rail transportation, medical, new energy, etc. Among them, during the operation of the fluxgate sensor, the electronic noise of its internal components will affect its own measurement quality. Therefore, it is particularly important to test the performance of the fluxgate sensor before it leaves the factory. However, in the related art, there is a problem of the accuracy of the test results in the process of testing the performance of the fluxgate sensor. Based on this, the embodiment of the present application provides a sensor performance testing method, which can improve the accuracy of the test results in the process of testing the performance of the fluxgate sensor.

[0052] The sensor performance testing method provided in the embodiment of the present application can be applied to Figure 1 The application environment diagram shown. The application environment includes a sensor performance test system, and the sensor performance test system may include a computer device, a sensor to be tested, a signal amplifier, a shielding box and a signal generator. Optionally, the computer device may be, but is not limited to, a personal computer, a desktop computer, a laptop computer, a tablet computer, a smart phone, a smart bracelet, an independent server, or a server cluster composed of multiple servers. This embodiment does not limit the specific form of the computer device. Optionally, the above-mentioned sensor to be tested may be a Hall effect sensor, an induction coil sensor, a magnetoresistive sensor, etc., but in the embodiment of the present application, the sensor to be tested may be a closed-loop fluxgate sensor. Among them, the above-mentioned shielding box is used to shield the electromagnetic interference in the external environment where the sensor to be tested is located, reduce the impact of the external environment electromagnetic interference on the performance test, so as to ensure the purity of the test environment and improve the accuracy of the performance test. Figure 1The shielding box is not shown; the shape of the shielding box can be semicircular, cylindrical, square, rectangular, etc., and the embodiment of the present application does not limit this shape, as long as it can cover the sensor to be tested and the cable interface of the sensor to be tested. In actual applications, the output end of the signal generator is connected to the input end of the sensor to be tested, the output end of the sensor to be tested is connected to the input end of the signal amplifier, and the output end of the signal amplifier is connected to the input end of the computer device, wherein the connection between the two can be a cable connection, and the cable can have a high-performance cable, which can not only ensure the stable transmission of current, but also reduce the noise and error caused by line problems and reduce the quality of performance testing. The specific process of the sensor performance testing method is introduced below using a computer device as the executor of the sensor performance testing method.

[0053] like Figure 2 FIG. 1 is a flow chart of a sensor performance testing method provided in an embodiment of the present application, and the method can be implemented by the following steps:

[0054] S100, obtaining an output amplified signal of the sensor to be tested, wherein the output amplified signal is generated after amplifying the output signal of the sensor to be tested, and the sensor to be tested is covered by a shielding box.

[0055] In the embodiment of the present application, since the intensity of the output signal of the sensor to be tested is relatively high, in order to facilitate subsequent processing, the output signal of the sensor to be tested may be amplified before performing subsequent processing.

[0056] In practical applications, the computer device can receive the corresponding output amplified signal generated by the signal amplifier after amplifying the output signal of the sensor to be tested. It should be noted here that during the test, the sensor to be tested is covered by a shielding box to isolate the electromagnetic interference generated by the external environment in which the sensor to be tested is located, so as to improve the accuracy of the output amplified signal of the sensor to be tested.

[0057] S200: Based on the output amplified signal, obtain multiple performance measurement indicators of the sensor to be tested.

[0058] The computer device may obtain multiple performance measurement indicators of the sensor to be tested based on the output amplified signal of the sensor to be tested obtained in the previous steps. Optionally, the multiple performance measurement indicators of the sensor to be tested may include multiple of the sensitivity, resolution, linearity, hysteresis, stability, response time, accuracy, etc. of the sensor to be tested.

[0059] In one embodiment, the computer device may pre-train an algorithm model, and then input the output amplified signal of the sensor to be tested into the algorithm model, and the algorithm model outputs multiple performance measurement indicators of the sensor to be tested.

[0060] In another embodiment, the computer device can perform at least one of conversion processing, analysis processing, comparison processing, matching processing, etc. on the output amplified signal of the sensor to be tested, and determine multiple performance measurement indicators of the sensor to be tested based on the operation results.

[0061] The following is a description of the process of determining whether each performance measurement indicator of the sensor to be tested meets the standard performance condition. In one embodiment, each performance measurement indicator includes a signal-to-noise ratio and a total harmonic distortion; before executing the step in S300, the method may further include: if the signal-to-noise ratio is greater than a preset signal-to-noise ratio threshold and the total harmonic distortion is less than a preset distortion threshold, then determining that each performance measurement indicator meets the standard performance condition; otherwise, determining that each performance measurement indicator does not meet the standard performance condition.

[0062] In actual applications, the computer device can determine whether the signal-to-noise ratio is greater than a preset signal-to-noise ratio threshold, and determine whether the total harmonic distortion is less than a preset distortion threshold. When it is determined that the signal-to-noise ratio is greater than the preset signal-to-noise ratio threshold and the total harmonic distortion is less than the preset distortion threshold, it can be determined that each performance measurement indicator meets the standard performance condition; otherwise, it is determined that each performance measurement indicator does not meet the standard performance condition.

[0063] Among them, the above-mentioned signal-to-noise ratio threshold and distortion threshold can be determined by the user, or can be determined based on historical experience values, which is not limited in the embodiments of the present application.

[0064] S300: When each performance measurement indicator meets a preset standard performance condition, determine that the performance test result of the sensor to be tested is a test pass.

[0065] Specifically, the computer device may search for each performance measurement indicator of the sensor to be tested in the mapping relationship, and determine whether each performance measurement indicator of the sensor to be tested meets a preset standard performance condition according to the search result.

[0066] Optionally, the mapping relationship may include a plurality of different standard performance measurement indicators, and each standard performance measurement indicator may include a plurality of performance measurement indicators, wherein the standard performance measurement indicator is determined based on performance measurement indicators of different fluxgate sensors that have passed the performance test.

[0067] In addition, the computer device may pre-train a comparison model, and then input each performance measurement index of the sensor to be tested into the comparison model, and the comparison model outputs a result of whether each performance measurement index of the sensor to be tested meets the standard performance condition. Optionally, the comparison model may be implemented by at least one of a convolutional neural network model, a fully connected neural network model, a long short-term memory neural network model, a residual neural network model, a recurrent neural network model, and the like.

[0068] Furthermore, if the various performance measurement indicators of the sensor to be tested meet the standard performance conditions, the performance test result of the sensor to be tested is determined to be a passed test, indicating that the performance of the sensor to be tested meets the factory standards of the sensor to be tested. At this time, the sensor to be tested is a factory-qualified sensor; if the various performance measurement indicators of the sensor to be tested do not meet the standard performance conditions, the performance test result of the sensor to be tested is determined to be a failed test, indicating that the performance of the sensor to be tested does not meet the factory standards of the sensor to be tested.

[0069] In an embodiment of the present application, when each performance measurement indicator of the sensor to be tested meets the preset standard performance conditions, the performance of the sensor to be tested can be tested at least once according to the steps in S100-S300 above to improve the reliability and accuracy of the performance test results of the sensor to be tested that are finally obtained.

[0070] The technical solution in the embodiment of the present application obtains the output amplified signal of the sensor to be tested, and based on the output amplified signal, obtains multiple performance measurement indicators of the sensor to be tested, and when each performance measurement indicator meets the preset standard performance conditions, determines that the performance test result of the sensor to be tested is a test pass, wherein the sensor to be tested is covered by a shielding box; during the test process of the above method, the sensor to be tested is covered by a shielding box, which can isolate the electromagnetic interference generated by the external environment in which the sensor to be tested is located, so that the obtained output amplified signal of the sensor to be tested is an electromagnetic-free signal, thereby improving the accuracy of the obtained output amplified signal of the sensor to be tested, and on the basis of the high-precision output amplified signal, the accuracy of the sensor test performance results can be further improved; at the same time, the above method does not require human participation, and can greatly improve the accuracy of the sensor test performance results and improve the performance test speed.

[0071] The following is an explanation of the process of obtaining multiple performance measurement indicators of the sensor to be tested based on the output amplified signal. Figure 3 As shown, the steps in S200 above can be implemented in the following manner:

[0072] S210: Screening the output amplified signal to determine a screened signal.

[0073] In practical applications, a computer device can pre-train an algorithm model, and then input the output amplified signal of the sensor to be tested into the algorithm model. The algorithm model filters the output amplified signal and outputs a filtered signal.

[0074] In addition, the computer device can also use threshold method, filtering method, principal component analysis method, wavelet transform method, principal component analysis method, etc. to screen and process the output amplified signal of the sensor to be tested to obtain a screened signal.

[0075] S220: Perform conversion processing according to the filtered signal to obtain a corresponding digital signal.

[0076] Among them, the computer equipment can use frequency conversion method, debugging method, etc. to convert and process the filtered signal to obtain the corresponding digital signal.

[0077] In addition, the computer device can send the filtered signal to a third-party device. The third-party device converts and processes the filtered signal to obtain a corresponding digital signal and sends the digital signal to the computer device. Correspondingly, the computer device obtains the corresponding digital signal.

[0078] The process of converting the filtered signal to obtain the corresponding digital signal is described below. In one embodiment, the step in S220 may include: converting the filtered signal into an intermediate frequency signal, and converting the intermediate frequency signal into a digital signal.

[0079] Specifically, the computer device can input the filtered signal into the mixer, instructing the mixer to mix the filtered signal with the swept frequency signal generated by the oscillator to obtain an intermediate frequency signal, and correspondingly, the computer device can receive the intermediate frequency signal sent by the mixer. Alternatively, the computer device can call a signal conversion tool to convert the filtered signal into an intermediate frequency signal.

[0080] It should be noted here that the frequency of the intermediate frequency signal is relatively low. Converting the filtered signal into an intermediate frequency signal makes it easier to achieve high-gain amplification, high-resolution filtering and other fine processing, thereby improving the accuracy and reliability of subsequent spectrum analysis.

[0081] Furthermore, the computer device may perform analog-to-digital conversion on the intermediate frequency signal to convert the intermediate frequency signal into a digital signal.

[0082] S230: Determine various performance measurement indicators according to the digital signal.

[0083] Specifically, the computer device may extract features from the digital signal, and then calculate various performance measurement indicators based on the extracted signal features according to a preset performance measurement indicator calculation strategy.

[0084] In addition, the computer device can also search for the above digital signal in the association relationship between different digital signals and different performance measurement indicators, and determine multiple performance measurement indicators corresponding to the digital signals matching the above digital signal in the association relationship as the performance measurement indicators of the sensor to be tested.

[0085] In one embodiment, if Figure 4 As shown, the step of performing screening processing on the output amplified signal to determine the screened signal in S210 may include:

[0086] S211 . When the intensity of the output amplified signal is greater than a preset intensity threshold, attenuate the output amplified signal to obtain an attenuated signal.

[0087] Specifically, the computer device can use an ammeter or a voltmeter to measure the voltage value or current value of the output amplified signal of the sensor to be tested to obtain the strength of the output amplified signal. In addition, the computer device can also use a power meter to measure the power of the output amplified signal of the sensor to be tested, and then determine the strength of the output amplified signal according to the power of the output amplified signal.

[0088] Furthermore, the computer device can compare the intensity of the output amplified signal with a preset intensity threshold. When it is determined that the intensity of the output amplified signal is greater than the preset intensity threshold, the output amplified signal may cause saturation distortion in subsequent processing. At this time, the output amplified signal of the sensor to be tested can be attenuated using an RF attenuator until the intensity of the output amplified signal after the screening process is less than the preset intensity threshold. The output amplified signal after the screening process is then determined as the screened signal.

[0089] Optionally, the preset intensity threshold may be user-defined or determined based on historical experience.

[0090] S212: Filter the attenuated signal to obtain a filtered signal.

[0091] Among them, computer equipment can use filtering circuits such as preselectors or low-pass filters to filter the attenuated signal to obtain a screened signal. This can filter out unnecessary frequency components in the attenuated signal and only retain the signal frequency band of interest, which helps to reduce interference and stray signals in the attenuated signal and lay the foundation for subsequent more accurate spectrum analysis.

[0092] The technical solution in the embodiment of the present application performs screening processing on the output amplified signal to determine the screened signal, performs conversion processing based on the screened signal to obtain the corresponding digital signal, and determines each performance measurement index based on the digital signal; the above method does not require a complex algorithm to determine each performance measurement index of the sensor to be tested, the processing process is relatively simple, and the amount of data processed in the performance measurement index determination process can be reduced, thereby improving the speed and accuracy of determining the performance measurement index.

[0093] In one embodiment, each performance metric includes a signal-to-noise ratio; Figure 5 As shown, the step of determining each performance measurement indicator according to the digital signal in the above S230 may include:

[0094] S231, performing spectrum analysis on the digital signal to determine the amplitude and phase information of the output amplified signal at different frequency points.

[0095] In practical applications, computer equipment can use spectrum analysis to perform spectrum analysis on digital signals to obtain the amplitude and phase information of the output amplified signal at different frequency points.

[0096] Optionally, the above-mentioned spectrum analysis method can be a power spectrum density estimation method, a time-frequency analysis method, a Fourier transform method, etc. The Fourier transform method can be a Fourier series expansion method or a discrete Fourier transform method, but in the embodiment of the present application, the Fourier transform method can be a fast Fourier transform method. Specifically, the computer device can filter the digital signal through a digital filter to obtain a filtered signal, and then perform a fast Fourier transform on the filtered signal to obtain a frequency domain signal, and then determine the amplitude and phase information of the output amplified signal at different frequency points according to the frequency domain signal.

[0097] In an embodiment of the present application, the computer device can directly input the output amplified signal of the sensor to be tested into a frequency analyzer to perform spectrum analysis on the digital signal to obtain the amplitude and phase information of the output amplified signal at different frequency points.

[0098] S232. Determine a signal-to-noise ratio according to the amplitude and phase information of the output amplified signal at different frequency points.

[0099] In one implementation, the computer device may perform at least one of conversion processing, arithmetic operation processing, analysis processing, and comparison processing on the amplitude and phase information of the output amplified signal at different frequency points, and determine the signal-to-noise ratio according to the operation result. Optionally, the arithmetic operation may be implemented by at least one of addition operation, subtraction operation, multiplication operation, logarithmic operation, exponential operation, and the like.

[0100] In another implementation, the computer device may also pre-train a signal-to-noise ratio calculation model, and then input the amplitude and phase information of the output amplified signal at different frequency points into the signal-to-noise ratio calculation model, and the signal-to-noise ratio calculation model outputs the signal-to-noise ratio. The signal-to-noise ratio calculation model may be a model constructed by a mathematical method.

[0101] The technical solution in the embodiment of the present application performs spectrum analysis on the digital signal to determine the amplitude and phase information of the output amplified signal at different frequency points, and determines the signal-to-noise ratio based on the amplitude and phase information of the output amplified signal at different frequency points. This process does not require the participation of complex algorithms and the processing process is relatively simple, thereby improving the speed of determining the signal-to-noise ratio.

[0102] In one embodiment, each performance metric includes total harmonic distortion; Figure 6 As shown, the step of determining each performance measurement indicator according to the digital signal in the above S230 may include:

[0103] S233. Obtain a transient noise signal corresponding to the digital signal.

[0104] Specifically, the computer device may input the digital signal into a digital oscilloscope so that the digital oscilloscope can capture the transient noise signal of the digital signal. Alternatively, the computer device may dynamically display the digital signal to capture the transient noise signal of the digital signal.

[0105] In an embodiment of the present application, the computer device may also directly input the digital signal into a digital oscilloscope to capture a transient noise signal corresponding to the digital signal.

[0106] S234: Analyze and process the transient noise signal to obtain total harmonic distortion.

[0107] The computer device may obtain the effective values ​​of all harmonic components except the fundamental frequency in the transient noise signal and the effective values ​​of the harmonic components of the fundamental frequency (i.e., the fundamental component), and then perform arithmetic operations on the effective values ​​of all harmonic components and the effective value of the fundamental component to complete the analysis and obtain the total harmonic distortion THD. Optionally, the arithmetic operation may be at least one of addition, multiplication, division, logarithm, exponential, trigonometric function, etc.

[0108] In the embodiment of the present application, the effective values ​​of all harmonic components and the effective value of the fundamental component can be subjected to arithmetic operation according to the expression in formula (1), that is:

[0109] (1)

[0110] in, It represents the effective value of the nth harmonic component in the transient noise signal, t represents the end time of the performance test of the sensor to be tested, Indicates the effective value of the fundamental component in the transient noise signal.

[0111] The technical solution in the embodiment of the present application obtains a transient noise signal corresponding to a digital signal, and analyzes and processes the transient noise signal to obtain a total harmonic distortion. This process does not require the participation of a complex algorithm, and the processing process is relatively simple, thereby increasing the speed of determining the total harmonic distortion.

[0112] The following describes the subsequent processing when the performance test of the sensor to be tested fails. In one embodiment, after executing the steps in S200 above, Figure 7 As shown, the above method may further include the following steps:

[0113] S400. When the performance test result of the sensor to be tested is that the test fails, control the replacement of a target component in the sensor to be tested to obtain a replaced sensor; the target component includes at least one of a power adapter, a cable, and a connector in the sensor to be tested.

[0114] Specifically, when it is determined that the performance test result of the sensor to be tested is test failure, the computer device can send a target component replacement message to the user terminal of the manufacturer of the sensor to be tested, instructing the manufacturer to replace the target component in the sensor to be tested to obtain a replaced sensor.

[0115] The target component may be at least one of a power adapter, a cable and a connector in the sensor to be tested. It should be noted that the target component has the same model before and after the replacement.

[0116] S500: Test the performance of the replaced sensor until the performance test result of the replaced sensor is that the sensor passes the test.

[0117] Furthermore, the performance of the replaced sensor can be tested. If the performance test result of the updated sensor is a passed test, it is determined that the replaced sensor has reached the factory standard of the fluxgate sensor, and the performance test ends at this time; otherwise, continue to replace at least one component of the replaced sensor, and then continue to test the performance of the latest replaced sensor until the performance test result of the latest replaced sensor is a passed test, and the latest replaced sensor is used as the sensor to be shipped. Optionally, the component here can also be at least one of a power adapter, a cable, and a connector.

[0118] In practical applications, batches of sensors to be tested can be uniformly tested according to the above sensor performance test method, which improves the wide applicability and versatility of the sensor performance test method.

[0119] The technical solution in the embodiment of the present application, when the performance test result of the sensor to be tested is test failure, controls the replacement of the target component in the sensor to be tested to obtain the replaced sensor, and the target component includes at least one of the power adapter, cable and connector in the sensor to be tested; the above method can replace the target component in the sensor to be tested that has failed the performance test to ensure that the sensor that has passed the performance test is used as the factory product, thereby improving the product yield of the sensor.

[0120] Based on the same inventive concept, the present application embodiment also provides a sensor performance testing system, see Figure 1 As shown, the system includes: computer equipment, a sensor to be tested, a signal amplifier, a shielding box and a signal generator;

[0121] The computer equipment is used to execute Figure 2-7 The steps of the method in any one of the embodiments.

[0122] In practical applications, the signal generator can generate various types of electrical signals, such as sine waves, square waves, triangle waves, etc., and then input the generated electrical signals to the sensor to be tested as a power supply signal for the sensor to be tested. Optionally, the signal amplifier can be a low-noise preamplifier, which can maximize the additional interference caused by the performance test.

[0123] In an embodiment of the present application, the above-mentioned sensor performance testing system may further include a temperature sensor and a humidity sensor, wherein the temperature sensor is used to detect the ambient temperature of the external environment in which the sensor to be tested is located, and the humidity sensor is used to detect the ambient humidity of the external environment in which the sensor to be tested is located.

[0124] Specifically, the computer device can start executing the steps in S100 above when it determines that the detected ambient temperature is within a preset temperature range and the ambient humidity is within a preset humidity range. This avoids the impact of temperature and humidity fluctuations on the performance of the sensor to be tested, and further increases the accuracy of the performance test results.

[0125] Among them, when it is determined that the ambient temperature is not within the preset temperature range, corresponding measures can be taken to adjust the ambient temperature within the temperature range; at the same time, when it is determined that the ambient humidity is within the preset humidity range, corresponding measures can be taken to adjust the ambient humidity within the humidity range.

[0126] At the same time, in the actual test environment, the sensor to be tested can be installed on a stable, shock-proof workbench, which can enhance the stability of the sensor to be tested during the test process. Shock-absorbing pads or vibration isolation devices can also be added to the workbench to reduce the impact of environmental equipment vibration on the sensor to be tested.

[0127] The sensor performance testing system provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0128] In one embodiment, the present application also provides a sensor performance testing method, which is applied to a computer device. The method includes the following process:

[0129] (1) Obtaining an output amplified signal of the sensor to be tested; the output amplified signal is generated after amplifying the output signal of the sensor to be tested, and the sensor to be tested is covered by a shielding box;

[0130] (2) When the intensity of the output amplified signal is greater than a preset intensity threshold, attenuating the output amplified signal to obtain an attenuated signal;

[0131] (3) Filtering the attenuated signal to obtain the filtered signal;

[0132] (4) Converting the filtered signal into an intermediate frequency signal, and converting the intermediate frequency signal into a digital signal;

[0133] (5) Perform spectrum analysis on the digital signal to determine the amplitude and phase information of the output amplified signal at different frequency points;

[0134] (6) Determine the signal-to-noise ratio based on the amplitude and phase information of the output amplified signal at different frequency points;

[0135] (7) Obtaining the transient noise signal corresponding to the digital signal;

[0136] (8) Analyze and process the transient noise signal to obtain the total harmonic distortion;

[0137] (9) If the signal-to-noise ratio is greater than a preset signal-to-noise ratio threshold and the total harmonic distortion is less than a preset distortion threshold, then it is determined that each performance measurement indicator meets the standard performance condition;

[0138] (10) Otherwise, it is determined that each performance measurement indicator does not meet the standard performance conditions;

[0139] (11) when each performance measurement index satisfies a preset standard performance condition, determining that the performance test result of the sensor to be tested is a test pass; when the performance test result of the sensor to be tested is a test fail, controlling the replacement of a target component in the sensor to be tested to obtain a replaced sensor; the target component includes at least one of a power adapter, a cable, and a connector in the sensor to be tested;

[0140] (12) Test the performance of the replaced sensor until the performance test result of the replaced sensor is passed.

[0141] The execution process of the above (1) to (12) can be specifically referred to the description of the above embodiment. The implementation principle and technical effect are similar and will not be repeated here.

[0142] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0143] Based on the same inventive concept, the embodiment of the present application also provides a sensor performance test device for implementing the sensor performance test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more sensor performance test device embodiments provided below can refer to the limitations of the sensor performance test method above, and will not be repeated here.

[0144] In one embodiment, Figure 8 This is a schematic diagram of the structure of a sensor performance test device in one embodiment of the present application. The sensor performance test device provided in the embodiment of the present application can be applied to computer equipment. Figure 8 As shown, the sensor performance testing device of the embodiment of the present application may include: a signal acquisition module 11, an indicator module 12 and a test result determination module 13, wherein:

[0145] The signal acquisition module 11 is used to acquire the output amplified signal of the sensor to be tested; the output amplified signal is generated after amplifying the output signal of the sensor to be tested, and the sensor to be tested is covered by the shielding box;

[0146] An indicator module 12, used to obtain multiple performance measurement indicators of the sensor to be tested based on the output amplified signal;

[0147] The test result determination module 13 is used to determine that the performance test result of the sensor to be tested is a test pass when each performance measurement indicator meets a preset standard performance condition.

[0148] The sensor performance testing device provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0149] In one embodiment, the indicator module 12 includes: a screening processing unit, a conversion processing unit and a determination unit, wherein:

[0150] A screening processing unit, used for screening the output amplified signal to determine a screened signal;

[0151] A conversion processing unit, used for performing conversion processing according to the filtered signal to obtain a corresponding digital signal;

[0152] The determination unit is used to determine various performance measurement indicators according to the digital signal.

[0153] The sensor performance testing device provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0154] In one embodiment, the screening processing unit is specifically used for:

[0155] When the intensity of the output amplified signal is greater than a preset intensity threshold, attenuating the output amplified signal to obtain an attenuated signal;

[0156] The attenuated signal is filtered to obtain a screened signal.

[0157] The sensor performance testing device provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0158] In one embodiment, the conversion processing unit is specifically used for:

[0159] The filtered signal is converted into an intermediate frequency signal, and the intermediate frequency signal is converted into a digital signal.

[0160] The sensor performance testing device provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0161] In one embodiment, each performance measurement indicator includes a signal-to-noise ratio; the determination unit includes: a spectrum analysis processing subunit and a determination subunit, wherein:

[0162] The spectrum analysis and processing subunit is used to perform spectrum analysis and processing on the digital signal to determine the amplitude and phase information of the output amplified signal at different frequency points;

[0163] The determination subunit is used to determine the signal-to-noise ratio according to the amplitude and phase information of the output amplified signal at different frequency points.

[0164] The sensor performance testing device provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0165] In one embodiment, each performance measurement indicator includes total harmonic distortion; the determination unit includes: an acquisition subunit and an analysis and processing subunit, wherein:

[0166] An acquisition subunit, used for acquiring a transient noise signal corresponding to the digital signal;

[0167] The analysis and processing subunit is used to analyze and process the transient noise signal to obtain the total harmonic distortion.

[0168] The sensor performance testing device provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0169] In one embodiment, each performance measurement indicator includes a signal-to-noise ratio and a total harmonic distortion; the sensor performance test device further includes: a first determination module and a second determination module, wherein:

[0170] A first determination module, configured to determine that each performance measurement indicator meets a standard performance condition when the signal-to-noise ratio is greater than a preset signal-to-noise ratio threshold and the total harmonic distortion is less than a preset distortion threshold;

[0171] The second determination module is used to determine that each performance measurement indicator does not meet the standard performance condition when at least one of the signal-to-noise ratio being greater than a preset signal-to-noise ratio threshold and the total harmonic distortion being less than a preset distortion threshold is not met.

[0172] The sensor performance testing device provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0173] In one embodiment, the sensor performance testing device further includes: a control module and a testing module, wherein:

[0174] A control module, used for controlling the replacement of a target component in the sensor to be tested to obtain a replaced sensor when the performance test result of the sensor to be tested is a test failure; the target component includes at least one of a power adapter, a cable and a connector in the sensor to be tested;

[0175] The test module is used to test the performance of the replaced sensor until the performance test result of the replaced sensor is that the test is passed.

[0176] The sensor performance testing device provided in the embodiment of the present application can be used to execute the technical solution in the above-mentioned sensor performance testing method embodiment of the present application. Its implementation principle and technical effect are similar and will not be repeated here.

[0177] For the specific definition of the sensor performance test device, please refer to the definition of the sensor performance test method above, which will not be repeated here. Each module in the above-mentioned sensor performance test device can be implemented in whole or in part by software, hardware and a combination thereof. The above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules.

[0178] In one embodiment, a computer device is also provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG. Fig. 9 As shown. The computer device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the computer device is used to provide processing capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store multiple performance measurement indicators and performance test results of the sensor to be tested. The network interface of the computer device is used to communicate with an external endpoint through a network connection. When the computer program is executed by the processor, a sensor performance test method is implemented.

[0179] Those skilled in the art will understand that Fig. 9 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0180] In one embodiment, a computer device is also provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the technical solution in the above-mentioned sensor performance testing method embodiment of the present application is implemented. The implementation principle and technical effect are similar and will not be repeated here.

[0181] In one embodiment, a computer-readable storage medium is also provided, on which a computer program is stored. When the computer program is executed by a processor, the technical solution of the sensor performance testing method mentioned above in the present application is implemented. The implementation principle and technical effect are similar and will not be repeated here.

[0182] In one embodiment, a computer program product is also provided, including a computer program. When the computer program is executed by a processor, the technical solution of the sensor performance testing method mentioned above in the present application is implemented. The implementation principle and technical effect are similar and will not be repeated here.

[0183] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), tape, floppy disk, flash memory or optical memory, etc. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0184] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0185] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A sensor performance testing method, characterized in that: The method comprises: Acquire an output amplified signal of the sensor to be tested; the output amplified signal is generated after amplifying the output signal of the sensor to be tested, and the sensor to be tested is covered by a shielding box; Based on the output amplified signal, obtaining a plurality of performance measurement indicators of the sensor to be tested; When each of the performance measurement indicators meets the preset standard performance conditions, it is determined that the performance test result of the sensor to be tested is a test pass.

2. The method according to claim 1, characterized in that The step of obtaining a plurality of performance measurement indicators of the sensor to be tested based on the output amplified signal includes: Performing screening processing on the output amplified signal to determine a screened signal; Performing conversion processing according to the filtered signal to obtain a corresponding digital signal; Each of the performance measurement indicators is determined based on the digital signal.

3. The method according to claim 2, characterized in that The step of screening the output amplified signal to determine a screened signal includes: When the intensity of the output amplified signal is greater than a preset intensity threshold, attenuating the output amplified signal to obtain an attenuated signal; Performing filtering processing on the attenuated signal to obtain the screened signal; Correspondingly, performing conversion processing according to the filtered signal to obtain a corresponding digital signal includes: The filtered signal is converted into an intermediate frequency signal, and the intermediate frequency signal is converted into the digital signal.

4. The method according to any one of claims 2 to 3, characterized in that: Each of the performance measurement indicators includes a signal-to-noise ratio; and determining each of the performance measurement indicators according to the digital signal includes: Performing spectrum analysis on the digital signal to determine the amplitude and phase information of the output amplified signal at different frequency points; The signal-to-noise ratio is determined according to the amplitude and phase information of the output amplified signal at different frequency points.

5. The method according to any one of claims 2 to 3, characterized in that: Each of the performance measurement indicators includes total harmonic distortion; and determining each of the performance measurement indicators according to the digital signal includes: Acquire a transient noise signal corresponding to the digital signal; The transient noise signal is analyzed and processed to obtain the total harmonic distortion.

6. The method according to any one of claims 1 to 3, characterized in that Each of the performance metrics includes signal-to-noise ratio and total harmonic distortion; the method further includes: If the signal-to-noise ratio is greater than a preset signal-to-noise ratio threshold and the total harmonic distortion is less than a preset distortion threshold, determining that each of the performance measurement indicators meets the standard performance condition; Otherwise, it is determined that each of the performance measurement indicators does not meet the standard performance condition.

7. The method according to any one of claims 1 to 3, characterized in that The method further comprises: When the performance test result of the sensor to be tested is that the test fails, control the replacement of a target component in the sensor to be tested to obtain a replaced sensor; the target component includes at least one of a power adapter, a cable and a connector in the sensor to be tested; The performance of the replaced sensor is tested until the performance test result of the replaced sensor is tested to be passed.

8. A sensor performance testing system, characterized in that: The system comprises: a computer device, a sensor to be tested, a signal amplifier, a shielding box and a signal generator; The computer device is used to execute the steps of the method described in any one of claims 1 to 7.

9. A sensor performance testing device, characterized in that: The device comprises: A signal acquisition module, used for acquiring an output amplified signal of a sensor to be tested; the output amplified signal is generated after amplifying the output signal of the sensor to be tested, and the sensor to be tested is covered by a shielding box; An indicator module, used for obtaining a plurality of performance measurement indicators of the sensor to be tested based on the output amplified signal; The test result determination module is used to determine that the performance test result of the sensor to be tested is a test pass when each of the performance measurement indicators meets a preset standard performance condition.

10. A computer device comprising a processing chip, a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processing chip executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

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