Dust collector circuit board test method and system

Through dust testing and fast Fourier transform technology, stability and fault evaluation models are built, which solves the problems of difficulty in safety circuit board stability and fault positioning of the vacuum cleaner circuit board, and achieves accurate positioning and effective maintenance of circuit board fault areas.

CN119716489AActive Publication Date: 2025-03-28SUZHOU HANWA ELECTRONIC TECH CO LTD
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Patent Information

Application Number
CN202411994991.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-31
Publication Date
2025-03-28
Estimated Expiration
2044-12-31

AI Technical Summary

Technical Problem

Existing circuit board fault detection technology is difficult to accurately judge the operating stability and fault positioning of the vacuum cleaner circuit board, which affects the maintenance and maintenance work.

Method used

Through dust test, simulate the normal operation of the circuit board, collect current, voltage and other signal data, use fast Fourier transform to extract frequency domain characteristics, combine power information and signal information to build a stable evaluation model, and judge whether the circuit board generates unstable signals. If an unstable signal is detected, divide multiple areas and set up test points, collect environmental and electrical information, build an area fault assessment model, and narrow the fault area.

Benefits of technology

It realizes an accurate assessment of the stability and failure risk of the vacuum cleaner circuit board in a dusty environment, accurately locates the fault area, and improves the efficiency of maintenance and maintenance.

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Abstract

The invention discloses a dust collector circuit board testing method and system, and particularly relates to the technical field of circuit testing, and the method specifically comprises the steps: simulating the normal operation process of a dust collector circuit board after the dust collector circuit board passes a dust test, and obtaining the power information of the dust collector circuit board according to the current and voltage of the dust collector circuit board; signal information of the dust collector circuit board is determined by using fast Fourier transform, a stability evaluation model is constructed, whether the circuit board generates unstable signals or not is judged, when the unstable signals are generated, the dust collector circuit board is divided into a plurality of areas, and a test point is arranged in each area; according to the method, the environment information and the electrical information of the test points in the area are determined, the area fault assessment model is constructed, the possible fault range of the circuit board is narrowed, the stability and the fault risk of the circuit board can be simulated and assessed under the condition that the dust collector circuit board is interfered by dust, and the fault source can be found accurately.
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