Power Status Monitoring Method Applicable to Mini Computer Host

Abstract

The present invention discloses a power supply status monitoring method applicable to a microcomputer host, which relates to the technical field of power supply monitoring. The method includes: obtaining a first power supply temperature sequence at a moment to be analyzed; comparing the power supply temperatures at each moment in the first power supply temperature sequence with a theoretical temperature range to determine the abnormal frequency of abnormal power supply temperatures in the first power supply temperature sequence; in the case where the abnormal frequency is less than a preset frequency threshold, determining a first power supply normal probability according to the abnormal power supply temperatures in the first power supply temperature sequence; in the case where the abnormal frequency is not less than the preset frequency threshold, determining a first power supply normal probability according to the abnormal power supply temperatures in the first power supply temperature sequence and the ambient temperature of the power supply; comparing the first power supply normal probability with a preset probability threshold to determine the power supply operation status of the power supply. The power supply status monitoring method applicable to a microcomputer host provided by the present invention can improve the accuracy of power supply status monitoring.

Description

Technical Field

[0001] The present invention relates to the technical field of power supply monitoring, and particularly relates to a power supply status monitoring method applicable to a microcomputer host. Background Art

[0002] The microcomputer host is the core component of a microcomputer system. This type of computer host adopts a compact appearance design, which can greatly save space and is suitable for various office environments, so it has a wide range of application scenarios in enterprises and families. The power supply is an important component to ensure the normal operation of the microcomputer host. By monitoring the power supply status, the energy consumption problems of the microcomputer host can be detected and corrected in a timely manner.

[0003] In the existing method, by monitoring the temperature of the microcomputer host, when the temperature of the microcomputer host exceeds the theoretical temperature range, the operating state of the power supply is abnormal.

[0004] However, this method only simply compares the temperature of the microcomputer host with the normal temperature range, without considering the normal fluctuation phenomenon of the power supply temperature, resulting in low accuracy of power supply status monitoring. Summary of the Invention

[0005] An embodiment of the present invention provides a power supply status monitoring method applicable to a microcomputer host, which can improve the accuracy of power supply status monitoring.

[0006] In a first aspect of an embodiment of the present invention, there is provided a power supply status monitoring method applicable to a microcomputer host, including:

[0007] Obtain a first power supply temperature sequence at the moment to be analyzed, where the first power supply temperature sequence includes the power supply temperatures at the moment to be analyzed and each moment within a preset time period before the moment to be analyzed;

[0008] Compare the power supply temperatures at each moment in the first power supply temperature sequence with the theoretical temperature range, and determine the abnormal frequency of the abnormal power supply temperatures in the first power supply temperature sequence, where the abnormal power supply temperature is the power supply temperature not within the theoretical temperature range;

[0009] When the abnormal frequency is less than the preset frequency threshold, determine the first power supply normal probability according to the abnormal power supply temperatures in the first power supply temperature sequence;

[0010] When the abnormal frequency is not less than the preset frequency threshold, determine the first power supply normal probability according to the abnormal power supply temperatures in the first power supply temperature sequence and the ambient temperature of the power supply;

[0011] Compare the first power supply normal probability with the preset probability threshold to determine the power supply operating state of the power supply.

[0012] In the power supply status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention, a first power supply temperature sequence at the moment to be analyzed is obtained, and then the power supply temperatures at each moment in the first power supply temperature sequence are compared with a theoretical temperature range to determine the abnormal frequency of the abnormal power supply temperatures in the first power supply temperature sequence. By comparing the power supply temperatures at the moment to be analyzed and at each moment within a preset time period before the moment to be analyzed with the theoretical temperature range respectively, the normal fluctuation phenomenon of accidental temperatures can be excluded. Then, according to whether the abnormal frequency is greater than a preset frequency threshold, when the abnormal frequency is less than the preset frequency threshold, the first power supply normal probability is determined based on each abnormal power supply temperature in the first power supply temperature sequence; when the abnormal frequency is not less than the preset frequency threshold, the influence of the ambient temperature on the power supply temperature is further considered, and the first power supply normal probability is determined based on each abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply. Finally, the first power supply normal probability is compared with a preset probability threshold to determine the power supply operation status of the power supply. In this way, the normal fluctuation phenomenon of the temperature of the power supply in various situations is comprehensively considered, thereby improving the accuracy of power supply status monitoring. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present invention, and those of ordinary skill in the art can obtain other drawings without creative efforts based on these drawings.

[0014] Figure 1 It is a flowchart of the first power supply status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention;

[0015] Figure 2 It is a flowchart of the second power supply status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention;

[0016] Figure 3 It is a flowchart of the third power supply status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention;

[0017] Figure 4 It is a flowchart of the fourth power supply status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0018] In order to further elaborate on the technical means and effects adopted by the present invention to achieve the intended invention purpose, the following, in conjunction with the accompanying drawings and preferred embodiments, details a power status monitoring method applicable to a microcomputer host according to the present invention, including its specific implementation manner, structure, features, and effects, as follows. In the following description, different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. In addition, the specific features, structures, or characteristics in one or more embodiments can be combined in any suitable form.

[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present invention belongs.

[0020] It should be noted that the acquisition, storage, use, processing, etc. of data in the technical solution of the present invention all comply with the relevant regulations of laws and regulations.

[0021] It should be noted that in the embodiments of the present invention, some industry-existing solutions such as certain software, components, models, etc. may be mentioned. They should be regarded as exemplary, and their purpose is only to illustrate the feasibility in the implementation of the technical solution of the present invention, but it does not mean that the applicant has already or necessarily used this solution.

[0022] The microcomputer host is the core component of the microcomputer system. This type of computer host adopts a compact appearance design, which can greatly save space and is suitable for various office environments, thus having a wide range of application scenarios in enterprises and families. The power supply is an important component to ensure the normal operation of the microcomputer host. By monitoring the power status, the energy consumption problems of the microcomputer host can be detected and corrected in a timely manner.

[0023] In existing methods, by monitoring the temperature of the microcomputer host, when the temperature of the microcomputer host exceeds the theoretical temperature range, the operating state of the power supply is abnormal. However, this method only simply compares the temperature of the microcomputer host with the normal temperature range and does not take into account the normal fluctuation phenomenon of the power supply temperature, resulting in a low accuracy of power status monitoring.

[0024] The object of the present invention is to provide a power supply status monitoring method applicable to a microcomputer host. In the power supply status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention, a first power supply temperature sequence at a moment to be analyzed is obtained, and then the power supply temperature at each moment in the first power supply temperature sequence is compared with a theoretical temperature range to determine the abnormal frequency of the abnormal power supply temperature in the first power supply temperature sequence. By comparing the power supply temperature at the moment to be analyzed and the power supply temperature at each moment within a preset time period before the moment to be analyzed with the theoretical temperature range respectively, the normal fluctuation phenomenon of accidental temperature can be excluded. Then, according to whether the abnormal frequency is greater than a preset frequency threshold, when the abnormal frequency is less than the preset frequency threshold, the first power supply normal probability is determined according to each abnormal power supply temperature in the first power supply temperature sequence; when the abnormal frequency is not less than the preset frequency threshold, the influence of the ambient temperature on the power supply temperature is further considered, and the first power supply normal probability is determined according to each abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply. Finally, the first power supply normal probability is compared with a preset probability threshold to determine the power supply operation status of the power supply. In this way, the normal fluctuation phenomenon of the temperature of the power supply in various situations is comprehensively considered, so that the accuracy of power supply status monitoring can be improved.

[0025] The following introduces a specific embodiment of a power supply status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention.

[0026] Figure 1 A flowchart of a power supply status monitoring method applicable to a microcomputer host is provided. The power supply status monitoring method applicable to a microcomputer host can be applied to a server, and the power supply status monitoring method applicable to a microcomputer host may include the following S101 to S105.

[0027] S101, obtain a first power supply temperature sequence at a moment to be analyzed, where the first power supply temperature sequence includes the power supply temperature at the moment to be analyzed and the power supply temperature at each moment within a preset time period before the moment to be analyzed.

[0028] In this embodiment, the first power supply temperature sequence includes multiple power supply temperatures, specifically the power supply temperature at the moment to be analyzed and the power supply temperature at each moment within a preset time period before the moment to be analyzed. Exemplarily, the preset time period may be 5 minutes, then the first power supply temperature sequence includes the power supply temperature at the moment to be analyzed and the power supply temperature at each moment within 5 minutes before the moment to be analyzed.

[0029] As an example, the server obtains the power supply temperature at each moment from the temperature sensor of the power supply, where the temperature sensor can record the power supply temperature in real time. Then, the power supply temperature at the moment to be analyzed and the power supply temperature at each moment within 5 minutes before the moment to be analyzed are stored in the form of a time series to form a first power supply temperature sequence.

[0030] S102. Compare the power supply temperatures at each moment in the first power supply temperature sequence with the theoretical temperature range, and determine the abnormal frequency of the abnormal power supply temperatures in the first power supply temperature sequence. The abnormal power supply temperature is the power supply temperature that is not within the theoretical temperature range.

[0031] In this embodiment, the theoretical temperature range is a preset temperature range, which can be determined according to relevant parameters such as the specifications, models, and types of the power supply. Exemplarily, the theoretical temperature range can be 40 to 60 degrees.

[0032] The abnormal power supply temperature is the power supply temperature that is not within the theoretical temperature range. Specifically, the abnormal power supply temperature can be the power supply temperature higher than the theoretical temperature range or the power supply temperature lower than the theoretical temperature range.

[0033] As an example, the server traverses the first power supply temperature sequence and compares the power supply temperature at each moment with the theoretical temperature range. If the power supply temperature at a certain moment is not within the theoretical temperature range, it is marked as an abnormal power supply temperature.

[0034] Then, count the number of occurrences of the abnormal power supply temperature, and divide the number of occurrences by the total number of power supply temperatures in the first power supply temperature sequence to obtain the abnormal frequency.

[0035] S103. When the abnormal frequency is less than the preset frequency threshold, determine the first power supply normal probability according to the abnormal power supply temperatures in the first power supply temperature sequence.

[0036] In this embodiment, when the abnormal frequency is less than the preset frequency threshold, it indicates that the number of abnormal power supply temperatures is small. At this time, if the abnormal power supply temperature is near the normal power supply temperature, then the abnormal power supply temperature at this time is the temperature fluctuation generated by the normal heat dissipation of the power supply.

[0037] As an example, when the abnormal frequency is less than the preset frequency threshold, the server determines the first power supply normal probability according to the deviation degree of the abnormal power supply temperature from the theoretical temperature range, using statistical methods or machine learning models.

[0038] S104. When the abnormal frequency is not less than the preset frequency threshold, determine the first power supply normal probability according to the abnormal power supply temperatures in the first power supply temperature sequence and the ambient temperature of the power supply.

[0039] In this embodiment, when the abnormal frequency is not less than the preset frequency threshold, it indicates that the number of abnormal power supply temperatures is large, and the actual working state of the power supply cannot be accurately reflected at this time. Since the heat dissipation system is also affected by the difference in the external ambient temperature, it is possible that the number of normal temperatures monitored during this period is small or there is no normal temperature, which leads to an erroneous judgment of the power supply operation state. Therefore, for such a situation, it is necessary to combine the stability of the abnormal power supply temperature and the ambient temperature of the power supply to determine whether the temperature abnormality at this time is caused by normal environmental factors.

[0040] As an example, when the abnormal frequency is not less than a preset frequency threshold, the server combines the abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply, and uses multivariate regression analysis, machine learning algorithms and other comprehensive evaluations to obtain the probability that the first power supply is normal.

[0041] S105: Compare the first power supply normal probability with a preset probability threshold to determine the power supply operation state of the power supply.

[0042] In this embodiment, the server compares the calculated first power supply normal probability with a preset probability threshold. If the first power supply normal probability is higher than the preset probability threshold, the power supply is considered to be in a normal operating state; if the first power supply normal probability is lower than the preset threshold, the power supply is considered to be in an abnormal operating state and further inspection or maintenance is required.

[0043] In the power state monitoring method for a microcomputer host provided in this embodiment, a first power temperature sequence at a time to be analyzed is obtained, and then the power temperature at each time in the first power temperature sequence is compared with the theoretical temperature range to determine the abnormal frequency of the abnormal power temperature in the first power temperature sequence. By comparing the power temperature at each time in the preset time period before the time to be analyzed and the theoretical temperature range, respectively, the accidental normal fluctuation of temperature can be eliminated. Then, according to whether the abnormal frequency is greater than the preset frequency threshold, when the abnormal frequency is less than the preset frequency threshold, the normal probability of the first power supply is determined according to each abnormal power supply temperature in the first power temperature sequence; when the abnormal frequency is not less than the preset frequency threshold, the influence of the ambient temperature on the power supply temperature is further considered, and the normal probability of the first power supply is determined according to each abnormal power supply temperature in the first power temperature sequence and the ambient temperature of the power supply. Finally, the normal probability of the first power supply is compared with the preset probability threshold to determine the power supply operation state of the power supply. In this way, the phenomenon of normal fluctuation of the power supply temperature under various circumstances is comprehensively considered, so as to improve the accuracy of power state monitoring.

[0044] As an optional embodiment, S103 may specifically include:

[0045] When the abnormal frequency is less than the preset frequency threshold, the average values of each abnormal power supply temperature in the first power supply temperature sequence and each normal power supply temperature except the abnormal power supply temperature are calculated respectively to obtain the average value of abnormal power supply temperature and the average value of normal power supply temperature;

[0046] The average value of abnormal evaluation values of each abnormal power supply temperature in the first power supply temperature sequence is calculated to obtain the average value of abnormal evaluation. The abnormal evaluation value is the value of the abnormal power supply temperature higher or lower than the theoretical temperature range;

[0047] The normal probability of the first power supply is determined by using the average value of abnormal power supply temperature, the average value of normal power supply temperature and the average value of abnormal evaluation.

[0048] In this embodiment, the abnormal evaluation value is used to represent the value of the abnormal power supply temperature higher or lower than the theoretical temperature range. For example, assume that the theoretical temperature range is 40 to 60 degrees. If the abnormal power supply temperature is 80 degrees, its abnormal evaluation value is 20; if the abnormal power supply temperature is 20 degrees, its abnormal evaluation value is also 20.

[0049] As an example, when the abnormal frequency is less than the preset frequency threshold, the normal probability of the first power supply can be specifically determined by the following formula 1:

[0050] Formula 1

[0051] In formula 1, a is used to represent the normal probability of the first power supply, is used to represent the average value of abnormal evaluation, is used to represent the average value of normal power supply temperature, is used to represent the average value of abnormal power supply temperature, is used to represent the positive correlation normalization function.

[0052] Among them, The smaller it is, the closer the abnormal power supply temperature is to the normal power supply temperature, and the greater the normal probability of the first power supply; The smaller it is, the higher the similarity between the abnormal power supply temperature and the normal power supply temperature, and the greater the normal probability of the first power supply. It should be noted that to ensure the significance of the calculation results, in the case of encountering a denominator of 0 during the fractional operation in the embodiments of the present invention, a tuning parameter factor greater than 0 needs to be added to the denominator to prevent the denominator from being 0. The value of the tuning parameter factor is set by the implementer according to the actual situation, and this application does not make special restrictions.

[0053] Through this embodiment, when the abnormal frequency is less than the preset frequency threshold, the normal probability of the first power supply is accurately evaluated according to each abnormal power supply temperature in the first power supply temperature sequence. Thus, it can accurately judge the power supply operation state of the power supply when the abnormal frequency is less than the preset frequency threshold, and improve the accuracy of power supply state monitoring.

[0054] As an alternative embodiment, S104 may specifically include:

[0055] When the abnormal frequency is not less than the preset frequency threshold, obtain the average temperature increase of the first power supply temperature sequence and the average temperature of the target temperature set. The average temperature increase is the average of the temperature increases at adjacent times in the first power supply temperature sequence, and the target temperature set is the set composed of abnormal power supply temperatures greater than the theoretical temperature range;

[0056] Use the average temperature increase of the first power supply temperature sequence, the average temperature of the target temperature set, and the ambient temperature of the power supply to determine the stability of the power supply;

[0057] Determine the normal probability of the first power supply according to the stability of the power supply, the temperature standard deviation of the target temperature set, and the abnormal frequency.

[0058] In this embodiment, the average temperature increase is the average of the temperature increases at adjacent times in the first power supply temperature sequence. For example, assuming that the first power supply temperature sequence is {A1, A2, A3, A4}, the average temperature increase is the average of the temperature increase of A2 compared to A1, the temperature increase of A3 compared to A2, and the temperature increase of A4 compared to A3.

[0059] As an example, the stability of the power supply can be specifically determined by the following formula 2:

[0060] Formula 2

[0061] In formula 2, b is used to represent the stability of the power supply, is used to represent the average temperature increase of the first power supply temperature sequence, is used to represent the average temperature of the target temperature set, is used to represent the ambient temperature, is used to represent taking the maximum value, is used to represent the positive correlation normalization function.

[0062] Among them, reflects the power supply temperature change trend characteristic of the first power supply temperature sequence, The larger it is, the more obvious the upward trend of the power supply temperature in the first power supply temperature sequence, and the smaller the stability of the power supply; The larger it is, the less similar to the ambient temperature, and the smaller the stability of the power supply.

[0063] When the abnormal frequency is not less than the preset frequency threshold, the normal probability of the first power supply can be specifically determined by the following formula 3:

[0064] Formula 3

[0065] In Formula 3, a is used to represent the normal probability of the first power supply, and p is used to represent the abnormal frequency. is used to represent the temperature standard deviation of the target temperature set. is used to represent the stability of the power supply. is used to represent the positive correlation normalization function.

[0066] Among them, reflects the proportion of normal power supply temperatures. The larger the proportion of normal power supply temperatures, the greater the normal probability of the first power supply; reflects the fluctuation of abnormal power supply temperatures greater than the theoretical temperature range. The greater the fluctuation, the smaller the normal probability of the first power supply; the greater the stability of the power supply, the greater the normal probability of the first power supply.

[0067] Through this embodiment, when the abnormal frequency is not less than the preset frequency threshold, according to each abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply, the normal probability of the first power supply is accurately evaluated. Thus, it is possible to accurately judge the power supply operation state of the power supply when the abnormal frequency is not less than the preset frequency threshold, improving the accuracy of power supply state monitoring.

[0068] As an alternative embodiment, as Figure 2 shown, S105 may specifically include the following S201 to S203.

[0069] S201, when the normal probability of the first power supply is less than the preset probability threshold, perform a heat dissipation enhancement operation on the heat dissipation system of the microcomputer host to obtain a second power supply temperature sequence during the response time period, where the response time period is the time period during which the heat dissipation enhancement operation is performed;

[0070] S202, based on the second power supply temperature sequence, determine the feedback adjustment result of the power supply temperature;

[0071] S203, based on the feedback adjustment result of the power supply temperature, determine the power supply operation state of the power supply.

[0072] In this embodiment, the second power supply temperature sequence includes multiple power supply temperatures, specifically the power supply temperatures at each moment during the response time period, and the response time period is the time period during which the heat dissipation enhancement operation is performed.

[0073] The feedback adjustment result is used to measure whether the power supply temperature reaches an equilibrium state after performing the heat dissipation enhancement operation. Among them, the larger the feedback adjustment result, the more likely the power supply temperature is to reach an equilibrium state after performing the heat dissipation enhancement operation; the smaller the feedback adjustment result, the less likely the power supply temperature is to reach an equilibrium state after performing the heat dissipation enhancement operation.

[0074] As an example, when the normal probability of the first power supply is less than the preset probability threshold, the server sends a power supply temperature anomaly signal to the microcomputer main board. After receiving the power supply temperature anomaly signal, the microcomputer main board will increase the duty cycle of the PWM signal, so that the cooling system obtains a higher supply voltage, improves the working power of the cooling system, increases the heat dissipation capacity of the cooling system, and reduces the temperature of the power supply. Starting from the time when the power supply temperature anomaly signal is sent, the duration of the response time period is set to one minute. During this time period, the server will obtain the power supply temperature in real time to form a second power supply temperature sequence.

[0075] Then, the server compares and analyzes the first power supply temperature sequence and the second power supply temperature sequence to obtain the feedback adjustment result of the power supply temperature.

[0076] Finally, based on the feedback adjustment result of the power supply temperature after the heat dissipation enhancement operation and in combination with the preset safety threshold, the current operating state of the power supply is judged. If, after the heat dissipation enhancement operation, the feedback adjustment result is stable within the preset safety threshold, it is considered that the power supply is in a normal operating state; if, after the heat dissipation enhancement operation, the feedback adjustment result is not within the preset safety threshold, it is considered that the power supply may have a fault and immediate shutdown for inspection or repair is required.

[0077] Through this embodiment, when the normal probability of the first power supply is less than the preset probability threshold, a heat dissipation enhancement operation is performed on the cooling system of the microcomputer host to obtain the second power supply temperature sequence during the response time period. Thus, based on the second power supply temperature sequence, the power supply operating state of the power supply is determined. In this way, by further analyzing the change of the power supply temperature after performing the heat dissipation enhancement operation on the cooling system of the microcomputer host, the power supply operating state of the power supply can be accurately determined, and the accuracy of power supply state monitoring can be improved.

[0078] As an alternative embodiment, S202 may specifically include:

[0079] Based on the second power supply temperature sequence, determine the second temperature increase mean value of the second power supply temperature sequence and the temperature increase standard deviation of the second power supply temperature sequence. The second temperature increase mean value is the average value of the temperature increases at adjacent moments in the second power supply temperature sequence;

[0080] Using the second temperature increase mean value and the temperature increase standard deviation, determine the feedback adjustment result of the power supply temperature.

[0081] In this embodiment, the second temperature increase mean value is the average value of the temperature increases at adjacent moments in the second power supply temperature sequence. For example, assume that the second power supply temperature sequence is {B1, B2, B3, B4}, then the second temperature increase mean value is the average value of the temperature increase of B2 compared to B1, the temperature increase of B3 compared to B2, and the temperature increase of B4 compared to B3.

[0082] Exemplarily, the feedback regulation result of the power supply temperature can be specifically determined by the following formula 4:

[0083] Formula 4

[0084] In formula 4, is used to represent the feedback regulation result of the power supply temperature, is used to represent the average value of the second temperature increase of the second power supply temperature sequence, is used to represent the standard deviation of the temperature increase of the second power supply temperature sequence, is used to represent the positive correlation normalization function.

[0085] Among them, the larger the average value of the second temperature increase and the standard deviation of the temperature increase of the second power supply temperature sequence, the more unstable the second power supply temperature sequence is, that is, the feedback regulation of the power supply temperature at this time has not reached the equilibrium state, and the feedback regulation result is smaller.

[0086] The larger the feedback regulation result of the power supply temperature, the closer the feedback regulation of the power supply temperature is to the equilibrium state, and the more normal the power supply operation state of the power supply is; the smaller the feedback regulation result of the power supply temperature, the farther the feedback regulation of the power supply temperature is from the equilibrium state, and the more abnormal the power supply operation state of the power supply is.

[0087] Through this embodiment, by using the average value of the second temperature increase of the second power supply temperature sequence and the standard deviation of the temperature increase of the second power supply temperature sequence, the feedback regulation result of the power supply temperature is accurately determined. In this way, the power supply operation state of the power supply can be accurately judged through the feedback regulation result of the power supply temperature, and the accuracy of power supply state monitoring is improved.

[0088] As an alternative embodiment, as Figure 3 shown, S203 may specifically include the following S301 to S303.

[0089] S301, when the feedback regulation result of the power supply temperature is greater than the preset regulation threshold, determine the power supply abnormality index of the power supply according to the second power supply temperature sequence;

[0090] S302, when the power supply abnormality index of the power supply is greater than the preset abnormality threshold, determine that the power supply operation state of the power supply is an abnormal operation state;

[0091] S303, when the power supply abnormality index of the power supply is not greater than the preset abnormality threshold, determine that the power supply operation state of the power supply is a normal operation state.

[0092] In this embodiment, the power supply abnormality index is used to represent an index for quantifying the degree of power supply abnormality. Exemplarily, the power supply abnormality index may include the amplitude, rate, duration, etc. of the temperature change.

[0093] As an example, when the feedback adjustment result of the power supply temperature is greater than the preset adjustment threshold, the server analyzes the second power supply temperature sequence to obtain a power supply anomaly index.

[0094] Then, the power supply anomaly index is compared with a preset anomaly threshold. This preset anomaly threshold is set according to the characteristics of the power supply and the operating environment and is used to determine whether the anomaly index has reached the level that triggers an alarm or requires further measures.

[0095] If the power supply anomaly index is greater than the preset anomaly threshold, it is determined that the power supply operating state of the power supply is an abnormal operating state, which means that the power supply may have overheated or other temperature-related problems and immediate attention or measures are required; if the power supply anomaly index is not greater than the preset anomaly threshold, it is determined that the power supply operating state of the power supply is a normal operating state. This means that although there may be some minor temperature changes or fluctuations, they have not reached the level that triggers an alarm or requires further measures, and the power supply is still operating within the normal range.

[0096] Through this embodiment, when the feedback adjustment result of the power supply temperature is greater than the preset adjustment threshold, the power supply anomaly index of the power supply is determined according to the second power supply temperature sequence. In this way, the power supply operating state of the power supply can be accurately judged through the power supply anomaly index of the power supply, improving the accuracy of power supply state monitoring.

[0097] As an alternative embodiment, S301 may specifically include:

[0098] When the feedback adjustment result of the power supply temperature is greater than the preset adjustment threshold, for each power supply temperature in the second power supply temperature sequence, the corresponding second power supply normal probability is determined respectively;

[0099] Using each second power supply normal probability, the power supply anomaly index of the power supply is determined.

[0100] In this embodiment, for each power supply temperature in the second power supply temperature sequence, the corresponding second power supply normal probability is determined respectively according to the power supply state monitoring method in the above embodiment.

[0101] Then, using each second power supply normal probability, the power supply anomaly index of the power supply is determined through the following formula 5:

[0102] Formula 5

[0103] In formula 5, H is used to represent the power supply anomaly index, n is used to represent the number of power supply temperatures in the second power supply temperature sequence, is used to represent the second power supply normal probability of the power supply temperature. Used to represent the indicator function, if the normal probability of the second power supply is greater than the preset probability threshold, it is assigned a value of 0; if the normal probability of the second power supply is not greater than the preset probability threshold, it is assigned a value of 1.

[0104] Through this embodiment, when the feedback adjustment result of the power supply temperature is greater than the preset adjustment threshold, according to the second power supply temperature sequence, the power supply abnormality index of the power supply is determined. In this way, the power supply operation state of the power supply can be accurately judged through the power supply abnormality index of the power supply, improving the accuracy of power supply state monitoring.

[0105] As an alternative embodiment, as Figure 4 shown, S203 may specifically further include the following S401 to S403.

[0106] S401, when the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, according to the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period, the power supply performance evaluation value of the power supply is determined, and the target historical time period is the previous time period of the response time period;

[0107] S402, when the power supply performance evaluation value of the power supply is less than the preset performance threshold, determine that the power supply operation state of the power supply is an abnormal operation state;

[0108] S403, when the power supply performance evaluation value of the power supply is not less than the preset performance threshold, determine that the power supply operation state of the power supply is a normal operation state.

[0109] In this embodiment, the third power supply temperature sequence includes multiple power supply temperatures, specifically the power supply temperatures at each moment within the target historical time period, and the target historical time period is the previous time period of the response time period. Specifically, if the response time period is the time period when the heat dissipation enhancement operation is first executed, the target historical time period is the preset time period where the moment of sending the power supply temperature abnormality signal is located; if the response time period is not the time period when the heat dissipation enhancement operation is first executed, the target historical time period is the previous response time period.

[0110] The power supply performance evaluation value is used to measure the quality of the power supply performance. Among them, if the power supply performance evaluation value does not meet the preset performance threshold, it is considered that the feedback adjustment of the power supply temperature is abnormal during the execution of the heat dissipation enhancement operation, that is, the power supply operation state is an abnormal operation state; if the power supply performance evaluation value meets the preset performance threshold, it is considered that it belongs to the normal feedback adjustment of the power supply temperature during the execution of the heat dissipation enhancement operation, that is, the power supply operation state is a normal operation state.

[0111] As an example, when the feedback regulation result of the power supply temperature is not greater than the preset regulation threshold, the server analyzes the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period to obtain a power supply performance evaluation value.

[0112] Then, the power supply performance evaluation value is compared with a preset performance threshold. This preset performance threshold is set according to the characteristics of the power supply and the operating environment and is used to determine whether the abnormal index has reached the level of triggering an alarm or taking further measures.

[0113] If the power supply performance evaluation value is less than the preset performance threshold, it is determined that the power supply operating state of the power supply is an abnormal operating state, which means that the power supply may have overheated or other temperature-related problems and immediate attention or measures are required; if the power supply performance evaluation value is not less than the preset performance threshold, it is determined that the power supply operating state of the power supply is a normal operating state. This means that although there may be some minor temperature changes or fluctuations, they have not reached the level of triggering an alarm or taking further measures, and the power supply is still operating within the normal range.

[0114] Through this embodiment, when the feedback regulation result of the power supply temperature is not greater than the preset regulation threshold, the power supply performance evaluation value of the power supply is determined according to the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period. In this way, the power supply operating state of the power supply can be accurately judged through the power supply performance evaluation value of the power supply, improving the accuracy of power supply state monitoring.

[0115] As an alternative embodiment, S401 may specifically include:

[0116] Determine the second temperature increase average value of the second power supply temperature sequence and the third temperature increase average value of the third power supply temperature sequence according to the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period;

[0117] Use the second temperature increase average value, the third temperature increase average value, and the second power supply normal probability at the response end time of the response time period to determine the power supply performance evaluation value of the power supply.

[0118] In this embodiment, the power supply performance evaluation value of the power supply can be specifically determined by the following formula 6:

[0119] Formula 6

[0120] In formula 6, c is used to represent the power supply performance evaluation value, is used to represent the third temperature increase average value of the third power supply temperature sequence, is used to represent the second temperature increase average value of the second power supply temperature sequence. The second power supply normal probability used to characterize the end moment of the response, Used to characterize the positive correlation normalization function.

[0121] Wherein, Used to characterize the adjustment effect after the current response time feeds back and adjusts the power supply temperature; The larger it is, the better the adjustment effect after the feedback adjustment of the power supply temperature, that is, the larger the power supply performance evaluation value.

[0122] Through this embodiment, when the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, the power supply performance evaluation value of the power supply is determined according to the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period. In this way, the power supply operation state of the power supply can be accurately judged through the power supply performance evaluation value of the power supply, and the accuracy of power supply state monitoring can be improved.

[0123] As an optional embodiment, after S403, the power supply state monitoring method applicable to the microcomputer host may further include:

[0124] When the second power supply normal probability at the end moment of the response in the response time period is less than the preset probability threshold, perform a heat dissipation enhancement operation on the heat dissipation system of the microcomputer host in a loop;

[0125] When the heat dissipation enhancement operation reaches the preset number of times and the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, perform a power supply protection operation.

[0126] In this embodiment, when the power supply performance evaluation value of the power supply is not less than the preset performance threshold, it is considered that it belongs to the normal feedback adjustment of the power supply temperature during the heat dissipation enhancement operation, that is, the power supply operation state is the normal operation state.

[0127] Then, the server compares the second power supply normal probability at the end moment of the response in the response time period with the preset probability threshold. When the second power supply normal probability at the end moment of the response in the response time period is less than the preset probability threshold, it indicates that although it belongs to the normal feedback adjustment of the power supply temperature at this time, it has not been adjusted to the balanced state yet.

[0128] Therefore, it is necessary to perform a heat dissipation enhancement operation on the heat dissipation system of the microcomputer host in a loop according to the method in the above embodiment. If the feedback adjustment result of the power supply temperature is still not greater than the preset adjustment threshold after performing the heat dissipation enhancement operation 5 times in a loop, that is, the power supply temperature has not been adjusted to the balanced state yet, it is determined that there is an abnormality in the power supply temperature adjustment at this time, so it is necessary to start the power supply protection measure.

[0129] In this embodiment, after determining that the power supply operating state of the power supply is the normal operating state when the power performance evaluation value of the power supply is not less than the preset performance threshold, the heat dissipation enhancement operation is cyclically executed. And when the heat dissipation enhancement operation reaches the preset number of times and the feedback adjustment result of the power supply temperature is still not greater than the preset adjustment threshold, the power supply protection operation is executed. In this way, timely protection can be provided for the power supply, improving the power supply safety.

[0130] It should be clear that the present invention is not limited to the specific configurations and processes described above and shown in the figures. For the sake of brevity, the detailed descriptions of known methods are omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of the present invention is not limited to the specific steps described and shown. Those skilled in the art can make various changes, modifications, and additions, or change the order between steps after understanding the spirit of the present invention.

[0131] It should also be noted that the exemplary embodiments mentioned in the present invention describe some methods or systems based on a series of steps or devices. However, the present invention is not limited to the order of the above steps. That is, the steps can be executed in the order mentioned in the embodiments, or different from the order in the embodiments, or several steps can be executed simultaneously.

[0132] As described above, only the specific implementation manners of the present invention are provided. Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working processes of the systems, modules, and units described above can refer to the corresponding processes in the foregoing method embodiments, and will not be repeated here. It should be understood that the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of various equivalent modifications or substitutions, and these modifications or substitutions should be covered within the protection scope of the present invention.

Claims

1. A power status monitoring method suitable for a microcomputer host, characterized in that: The method comprises: Acquire a first power supply temperature sequence at a time to be analyzed, wherein the first power supply temperature sequence includes the power supply temperature at the time to be analyzed and at each time within a preset time period before the time to be analyzed; Compare the power supply temperature at each moment in the first power supply temperature sequence with the theoretical temperature range, and determine the abnormal frequency of abnormal power supply temperature in the first power supply temperature sequence, wherein the abnormal power supply temperature is a power supply temperature that is not within the theoretical temperature range; When the abnormal frequency is less than a preset frequency threshold, determining a probability that the first power supply is normal according to each of the abnormal power supply temperatures in the first power supply temperature sequence; When the abnormal frequency is not less than the preset frequency threshold, determining the probability that the first power supply is normal according to each of the abnormal power supply temperatures in the first power supply temperature sequence and the ambient temperature of the power supply; Comparing the first power supply normal probability with a preset probability threshold to determine the power supply operation state of the power supply; When the abnormal frequency is not less than the preset frequency threshold, determining the normal probability of the first power supply according to each of the abnormal power supply temperatures in the first power supply temperature sequence and the ambient temperature of the power supply includes: When the abnormal frequency is not less than the preset frequency threshold, obtaining a first temperature increase mean value of the first power supply temperature sequence and a temperature mean value of a target temperature set, wherein the first temperature increase mean value is an average value of temperature increases at adjacent moments in the first power supply temperature sequence, and the target temperature set is a set consisting of the abnormal power supply temperatures greater than the theoretical temperature range; Determine the stability of the power supply by using the first temperature increase mean, the temperature mean of the target temperature set, and the ambient temperature of the power supply; The first power supply normal probability is determined according to the stability of the power supply, the temperature standard deviation of the target temperature set, and the abnormal frequency.

2. The power status monitoring method for a microcomputer host according to claim 1, characterized in that: When the abnormal frequency is less than a preset frequency threshold, determining the probability that the first power supply is normal according to each of the abnormal power supply temperatures in the first power supply temperature sequence includes: When the abnormal frequency is less than a preset frequency threshold, respectively calculating the mean of each abnormal power supply temperature in the first power supply temperature sequence and each normal power supply temperature except the abnormal power supply temperature to obtain a mean value of the abnormal power supply temperature and a mean value of the normal power supply temperature; Calculating the mean of the abnormal evaluation values ​​of the abnormal power supply temperatures in the first power supply temperature sequence to obtain an abnormal evaluation mean, wherein the abnormal evaluation value is a value of the abnormal power supply temperature being higher or lower than the theoretical temperature range; The probability that the first power supply is normal is determined by using the abnormal power supply temperature mean, the normal power supply temperature mean, and the abnormal evaluation mean.

3. The power status monitoring method for a microcomputer host according to claim 1, characterized in that: The comparing the first power supply normal probability with a preset probability threshold to determine the power supply operation state of the power supply includes: When the probability of the first power supply being normal is less than the preset probability threshold, a heat dissipation enhancement operation is performed on the heat dissipation system of the microcomputer host to obtain a second power supply temperature sequence in a response time period, wherein the response time period is a time period for performing the heat dissipation enhancement operation; Determining a feedback adjustment result of the power supply temperature based on the second power supply temperature sequence; Based on the feedback adjustment result of the power supply temperature, the power supply operation state of the power supply is determined.

4. The power status monitoring method for a microcomputer host according to claim 3, characterized in that: The step of determining the feedback adjustment result of the power supply temperature based on the second power supply temperature sequence includes: Based on the second power supply temperature sequence, determining a second temperature increase mean value of the second power supply temperature sequence and a temperature increase standard deviation of the second power supply temperature sequence, wherein the second temperature increase mean value is an average value of temperature increases at adjacent moments in the second power supply temperature sequence; The feedback adjustment result of the power supply temperature is determined by using the second temperature increase mean value and the temperature increase standard deviation.

5. The power status monitoring method for a microcomputer host according to claim 3, characterized in that: The step of determining the power supply operation state of the power supply based on the feedback adjustment result of the power supply temperature includes: When the feedback adjustment result of the power supply temperature is greater than a preset adjustment threshold, determining a power supply abnormality index of the power supply according to the second power supply temperature sequence; When the power supply abnormality index of the power supply is greater than a preset abnormality threshold, determining that the power supply operation state of the power supply is an abnormal operation state; When the power supply abnormality index of the power supply is not greater than a preset abnormality threshold, it is determined that the power supply operation state of the power supply is a normal operation state.

6. The power status monitoring method for a microcomputer host according to claim 5, characterized in that: When the feedback adjustment result of the power supply temperature is greater than a preset adjustment threshold, determining the power supply abnormality index of the power supply according to the second power supply temperature sequence includes: When the feedback adjustment result of the power supply temperature is greater than a preset adjustment threshold, determining the corresponding second power supply normal probability for each power supply temperature in the second power supply temperature sequence; The power supply abnormality index of the power supply is determined by using each of the second power supply normal probabilities.

7. The power status monitoring method for a microcomputer host according to claim 3, characterized in that: The step of determining the power supply operation state of the power supply based on the feedback adjustment result of the power supply temperature includes: In the case where the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, determining the power supply performance evaluation value of the power supply according to the second power supply temperature sequence and a third power supply temperature sequence of a target historical time period corresponding to the response time period, wherein the target historical time period is a time period previous to the response time period; When the power performance evaluation value of the power supply is less than a preset performance threshold, determining that the power supply operation state of the power supply is an abnormal operation state; When the power performance evaluation value of the power supply is not less than a preset performance threshold, it is determined that the power supply operation state of the power supply is a normal operation state.

8. The power status monitoring method for a microcomputer host according to claim 7, characterized in that: The method of determining the power performance evaluation value of the power supply according to the second power supply temperature sequence and a third power supply temperature sequence of a target historical time period corresponding to the response time period when the feedback adjustment result of the power supply temperature is not greater than a preset adjustment threshold value includes: Determine a second temperature increase mean value of the second power supply temperature sequence and a third temperature increase mean value of the third power supply temperature sequence according to the second power supply temperature sequence and a third power supply temperature sequence of a target historical time period corresponding to the response time period; The power performance evaluation value of the power supply is determined by using the second temperature increase average value, the third temperature increase average value, and the second power supply normal probability at the response end time of the response time period.

9. The power status monitoring method for a microcomputer host according to claim 7, characterized in that: After determining that the power supply operation state of the power supply is a normal operation state when the power supply performance evaluation value of the power supply is not less than a preset performance threshold, the method further includes: When the probability of a second power supply being normal at the end of the response time period is less than the preset probability threshold, cyclically performing the heat dissipation enhancement operation on the heat dissipation system of the microcomputer host; When the heat dissipation enhancement operation reaches a preset number of times and the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, a power supply protection operation is performed.

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