Automatic test system and method thereof

Abstract

The invention discloses an automatic testing system and a method thereof. The automatic testing system comprises a plurality of modules and a plurality of basic functions executed by the modules. The initial setting basic function obtains a test setting file corresponding to the tested device from the site, and reads device basic information from the test setting file; the basic function is reset in a test setting file in the previous test before the test; the test initialization basic function confirms whether the tested device is applied to a test item of the site according to the device basic information and initializes test data corresponding to the tested device according to the test item, and the site tests the tested device based on the test data to generate a test result; after the test, the basic function uploads a test result to the central server and confirms whether to receive an upload state from the central server. According to the automatic test system and the method thereof, the test development cost is saved and the development time interval is reduced by standardizing the process, and the reusability of program codes is improved.

Description

Technical Field

[0001] The present invention relates to an automatic testing system and method thereof, and in particular to an automatic testing system and method thereof having standardized basic functions and supporting various testing projects. Background Art

[0002] Currently, the number of programs that need to be maintained for projects that perform multiple tests on products is generally proportional to the number of test sites. For example, if a project has 7 test sites, the project's program code will have 7 source codes. During the product production process, if rework or sorting is required, the project staff / system engineers must derive other source codes to be responsible for rework or sorting. During this period, the project staff also need to write each test step and its sequence by themselves. In addition. Since the program code of each test site is developed and maintained separately, the same program code cannot be shared between different test sites, resulting in increased project development costs and delayed development schedules, and making the project too complicated in future maintenance and handover.

[0003] It can be seen that the market currently lacks a test system and method that can be applied to standardized test processes of different sites and provide the test processes required by each site at the same time, so relevant industry players are all looking for solutions.

[0004] Therefore, it is necessary to provide an automated testing system and method thereof to solve the above problems. Summary of the invention

[0005] Therefore, the object of the present invention is to provide an automated testing system and method thereof, which integrates the basic functions required for multiple site tests, and standardizes the basic process into multiple basic functions for use by all sites. In addition, in addition to standardizing the basic process, these basic functions can also be overwritten as multiple site functions for sites to perform product testing according to their own test items. Therefore, project personnel / system engineers do not need to spend time writing program codes for basic test processes, but only need to implement functions of test items related to their own sites. In summary, the present invention can solve the problem that the same program code in the known technology cannot be shared and used between different sites, so the development schedule can be greatly reduced, and the reusability of the program code can be improved. In addition, each site can share basic functions, further reducing the workload of project personnel and simplifying maintenance costs and the complexity of handover.

[0006] According to an embodiment of the structural aspect of the present invention, an automated testing system is provided, which is used to provide a test platform to perform multiple tests on a device under test, and the test platform includes multiple sites. The automated testing system includes an initial setting module, a pre-test module, a test module, and a post-test module. The initial setting module is used to execute an initial setting basic function, which obtains a test setting file corresponding to the device under test from one of the sites, reads a device basic information from the test setting file, and sets a platform setting data according to the device basic information. The pre-test module is used to execute a pre-test basic function, which resets the test setting file in the previous test. The test module is used to execute a test initialization basic function, which confirms whether the device under test is applied to a test item of one of these sites according to the device basic information, and initializes a test data corresponding to the device under test according to the test item, wherein one of these sites tests the device under test based on the test data to generate a test result. The post-test module is used to execute a post-test basic function, which uploads the test result to a central server and confirms whether an upload status is received from the central server.

[0007] According to another embodiment of the structural aspect of the present invention, an automated testing system is provided, which is used to provide a test platform to perform multiple tests on a device under test, and the test platform includes multiple sites. The automated testing system includes an initial setting module, a pre-test module, a test module, and a post-test module. The initial setting module is used to sequentially execute an initial setting basic function and an initial setting site function, the initial setting basic function obtains a test setting file corresponding to the device under test from one of the sites, and reads a device basic information from the test setting file and sets a platform setting data according to the device basic information, the initial setting site function sets an operation mode of a fixture and turns on the fixture. The pre-test module is used to sequentially execute a pre-test basic function and a pre-test site function, the pre-test basic function resets the test setting file in the previous test, and the pre-test site function confirms whether a device serial number of the device under test meets a serial number rule and confirms whether the device under test is in a retest state according to the device serial number. The test module is used to sequentially execute a test initialization site function, a test initialization basic function, and a test function. The test initialization site function resets a program parameter and closes the fixture. The test initialization basic function confirms whether the device under test is applied to a test item of one of these sites according to the basic information of the device and initializes a test data corresponding to the device under test according to the test item. The test function tests the device under test based on the test data to generate a test result. The post-test module is used to sequentially execute a post-test site function and a post-test basic function. The post-test site function turns on the fixture. The post-test basic function uploads the test result to a central server and confirms whether an upload status is received from the central server. Among them, one of these sites overwrites the initial setting basic function, the pre-test basic function, the test initialization basic function, and the post-test basic function according to the test item to generate the initial setting site function, the pre-test site function, the test initialization site function, and the post-test site function.

[0008] According to an embodiment of the method aspect of the present invention, an automated testing method is provided, which is used to provide a test platform to perform multiple tests on a device under test, and the test platform includes multiple sites. The automated testing method includes the following steps: a setting initialization step, a pre-test step, a test step, and a post-test step. The setting initialization step includes driving an initial setting module to sequentially execute an initial setting basic function and an initial setting site function, the initial setting basic function obtains a test setting file corresponding to the device under test from one of the sites, and reads a device basic information from the test setting file and sets a platform setting data according to the device basic information, the initial setting site function sets an operation mode of a fixture and turns on the fixture. The pre-test step includes driving a pre-test module to sequentially execute a pre-test basic function and a pre-test site function, the pre-test basic function resets the test setting file in the previous test, and the pre-test site function confirms whether a device serial number of the device under test meets a serial number rule and confirms whether the device under test is in a retest state according to the device serial number. The test step includes driving a test module to sequentially execute a test initialization site function, a test initialization basic function and a test function, wherein the test initialization site function resets a program parameter and closes the fixture, the test initialization basic function confirms whether the device under test is applied to a test item of one of these sites according to the basic information of the device and initializes a test data corresponding to the device under test according to the test item, and the test function tests the device under test based on the test data to generate a test result. The post-test step includes driving a post-test module to sequentially execute a post-test site function and a post-test basic function, the post-test site function turns on the fixture, the post-test basic function uploads the test result to a central server, and confirms whether an upload status is received from the central server. Wherein, one of these sites overwrites the initial setting basic function, the pre-test basic function, the test initialization basic function and the post-test basic function according to the test item to generate the initial setting site function, the pre-test site function, the test initialization site function and the post-test site function.

[0009] Thus, the automated testing system and method of the present invention can perform standardized testing procedures and exclusive testing items for each site on the device under test through different basic functions and site functions. When rework or selection occurs, it can greatly save development time and improve the reusability of program code. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 A schematic diagram of an automated testing system in a first embodiment of the first implementation mode of the present invention is shown;

[0011] Figure 2 A schematic diagram illustrating an automated testing system according to a second embodiment of the first embodiment of the present invention; and

[0012] Figure 3 FIG. 4 is a flow chart of an automated testing method according to a second embodiment of the present invention.

[0013] Main component symbols:

[0014] 100, 100a Automated Test System

[0015] 110 Test Scheduling

[0016] 111 Project Judgment Module

[0017] 112 Initial setting module

[0018] 113 Pre-test module

[0019] 114 Test Module

[0020] 115 Post-test module

[0021] 120 Function Library

[0022] 121 Project Judgment Basic Function

[0023] 122 Initial setting basic function

[0024] 123 Basic functions before testing

[0025] 124 Test initialization basic function

[0026] 125 Post-test basic functions

[0027] 130 Status display interface

[0028] 200 Test Platform

[0029] 210 Stations

[0030] 211 Test Function

[0031] 212 Initial setting site function

[0032] 213 Pre-test site functions

[0033] 214 Test initialization site function

[0034] 215 Post-test site functions

[0035] 220 Operation parameters

[0036] 300 DUT

[0037] 310 Test setup file

[0038] 311 Device Basic Information

[0039] 312 Platform setting data

[0040] 3121 Status display configuration

[0041] 313 Device Identifier

[0042] 320 Test data

[0043] 330 Test Results

[0044] 331 Test failure records

[0045] 400 Central Server

[0046] 410 Upload Status

[0047] 500 Automated Testing Methods

[0048] S01 Project Judgment Steps

[0049] S02 Set initialization steps

[0050] S03 Pre-test steps

[0051] S04 Test Steps

[0052] S05 Post-test steps DETAILED DESCRIPTION

[0053] See also Figure 1 , which is a schematic diagram of an automated testing system 100 in a first embodiment according to a first embodiment of the present invention. Figure 1 As shown, the automated test system 100 is used to provide a test platform 200 to perform multiple tests on a device under test 300. The automated test system 100 can be stored in a cloud server, and the test platform 200 includes multiple sites 210 for testing multiple specific functions, and each site 210 can be connected to the cloud server via a network signal, and download the automated test system 100 from the cloud server to test the device under test 300.

[0054] The automated test system 100 includes a test scheduler 110 and a function library 120. The test scheduler 110 is configured with a project determination module 111, an initial setting module 112, a pre-test module 113, a test module 114, and a post-test module 115. Each of the aforementioned modules may be a system software and signally connected to the function library 120, and each of the aforementioned modules may be executed by a processor inside each station 210. The function library 120 stores a plurality of basic functions, and these basic functions may include a project determination basic function 121, an initial setting basic function 122, a pre-test basic function 123, a test initialization basic function 124, and a post-test basic function 125.

[0055] The project determination module 111 is used to execute a project determination basic function 121, which determines whether a test project of one of the sites 210 includes a robot arm test. The initial setting module 112 is used to execute an initial setting basic function 122, which obtains a test setting file 310 corresponding to the device under test 300 from the aforementioned site 210, reads a device basic information 311 from the test setting file 310, and sets a platform setting data 312 according to the device basic information 311. The pre-test module 113 is used to execute a pre-test basic function 123, which resets the test setting file 310 of the aforementioned site 210 in the previous test. The test module 114 is used to execute a test initialization basic function 124, which confirms whether the device under test 300 is applied to the test project of the aforementioned site 210 according to the device basic information 311, and initializes a test data 320 corresponding to the device under test 300 according to the test project. The aforementioned site 210 may store a test function, and execute the test function through the test module 114 and test the device under test 300 based on the test data 320 to generate a test result 330. The post-test module 115 is used to execute the post-test basic function 125, and the post-test basic function 125 uploads the test result 330 to a central server 400 and confirms whether an upload status 410 is received from the central server 400.

[0056] Thus, the automated test system 100 of the present invention standardizes the basic functions required for the test items of each site 210 into the project judgment basic function 121, the initial setting basic function 122, the pre-test basic function 123, the test initialization basic function 124 and the post-test basic function 125 in the test schedule 110 for use by all sites 210. Therefore, in product testing, project personnel / system engineers do not need to spend time writing program codes for basic test processes, but only need to implement test functions for test items related to the site 210, thereby saving test development costs and reducing development time.

[0057] In detail, the device under test 300 may be an electronic device, and the electronic device may include a printed circuit board assembly (PCBA). One of these sites 210 may be a PCBA site, and its main test items include program burning, circuit testing, functional testing, fatigue testing, aging testing, and harsh environment testing, and the corresponding test function is imported into a mechanical arm and a fixture in the PCBA site to start the PCBA test. In addition, these sites 210 of the present invention may also be, but not limited to, a wireless radio frequency (RF) site, a throughput site, a yield site, and a controller configuration tool (Controller Configuration Tool, CCT) site. The following paragraphs will take the PCBA site as an example to explain in detail the detailed operation of the basic functions executed by each module in the test schedule 110.

[0058] In the project judgment basic function 121, when the test project includes a robot arm test, which means that when the test project will use a robot control system (RCS), the project judgment basic function 121 initializes an operation parameter 220 of the robot arm test, initializes RCS related settings and registers with the RCS server.

[0059] In the initial setting basic function 122, the device basic information 311 read from the test setting file 310 may include a device name, a device model, a device serial number, and a device test log corresponding to the device under test 300. The initial setting basic function 122 may also read a site name corresponding to the PCBA site from the test setting file 310, and set a variable for how to obtain a device identifier 313, and this variable may include the following two ways of obtaining: one is to obtain the device identifier 313 from the device under test 300; the other is to obtain the device identifier 313 by manually scanning a barcode.

[0060] In addition, the platform setting data 312 may include a status display configuration 3121 corresponding to the test item and a server transmission configuration corresponding to the central server 400, and the central server 400 may be a production site management system (Shop Floor Control System, SFCS) server. The automated test system 100 may further include a status display interface 130. The status display interface 130 is connected to the initial setting module 112 by signal, and is used to display the status display configuration 3121. In detail, the initial setting basic function 122 may set the status display configuration 3121 according to the device basic information 311, and initialize the server transmission configuration, wherein the server transmission configuration may include a server address. Furthermore, the initial setting module 112 executes the initial setting basic function 122, and the initial setting basic function 122 may enable the automated test system 100 downloaded to the site 210 to connect to the central server 400 by signal through the server address of the server transmission configuration, and obtain a device material number of the device under test 300 from the central server 400.

[0061] In the pre-test basic function 123 , the pre-test basic function 123 resets / clears a test failure record 331 of the test setting file 310 in the previous test, and the test failure record 331 may include a test failure item and a failed device serial number.

[0062] In the test initialization basic function 124, the test initialization basic function 124 can first determine whether the test item of the PCBA site is a golden sample test, and confirm whether the device under test 300 can be tested at the PCBA site according to the device serial number of the device basic information 311. As can be seen from the above, the main test items of the PCBA test do not contain the golden sample test, so the test initialization basic function 124 determines that the test items in the PCBA site are not the golden sample test. Then, after confirming that the device under test 300 can be tested at the PCBA site, the test initialization basic function 124 initializes the test data 320 corresponding to the device under test 300 according to the test item, wherein the test data 320 can include a fixture number of the fixture of the PCBA site and the server address of the central server 400. Different from the initial setting basic function 122 obtaining the device material number of the corresponding device under test 300 from the central server 400, the test initialization basic function 124 can directly obtain the device material number of the corresponding device under test 300 according to the device serial number of the device basic information 311. Furthermore, the test initialization basic function 124 can integrate the server address of the test data 320, the device serial number, device material number and device name of the device basic information 311 and the site name of the corresponding PCBA site into a test basic data for site personnel to review. It should be noted that when the PCBA site changes the test item or the device under test 300, the pre-test basic function 123 resets the test basic data in the previous test.

[0063] In the post-test basic function 125, the test result 330 can be divided into the following three results: a test pass (Pass), a test failure (NG) or a retest (Retest). After the PCBA site test is completed, the post-test basic function 125 determines whether the test result 330 is a test failure. When the test result 330 is a test failure, the post-test basic function 125 generates a test failure record 331 according to the test result 330 of the test failure, and the test failure record 331 lists the test failure items and the failed device serial number. In addition, the post-test basic function 125 generates a device test log for the current test, and uploads the device test log to the central server 400, a file server (File server), or other data management systems.

[0064] See also Figure 2, which illustrates a schematic diagram of an automated test system 100a in a second embodiment according to the first embodiment of the present invention. The automated test system 100a includes a test scheduler 110, a function library 120, and a status display interface 130. Different from the first embodiment, the function library 120 of the automated test system 100a may further store a test function 211 and a plurality of site functions, and these site functions may include an initial setting site function 212, a pre-test site function 213, a test initialization site function 214, and a post-test site function 215.

[0065] Specifically, each site 210 may include a processor, which may be a digital signal processor (DSP), a microprocessing unit (MPU), a central processing unit (CPU) or other electronic processors. The processor of each site 210 establishes a test function 211 according to its own test items. After downloading the automated test system 100a from the cloud server, the processor of each site 210 can overwrite the initial setting basic function 122, pre-test basic function 123, test initialization basic function 124 and post-test basic function 125 originally stored in the function library 120 according to its own test items to generate the initial setting site function 212, pre-test site function 213, test initialization site function 214 and post-test site function 215, and then store the test function 211 and the aforementioned site functions in the function library 120 for use by the project judgment module 111, the initial setting module 112, the pre-test module 113, the test module 114 and the post-test module 115 of the test scheduler 110 (i.e., for the processor of each site 210 to run). The operation of the test function 211 and the aforementioned site functions will be described in detail below, and the multiple basic functions originally stored in the function library 120 are the same as those in the first embodiment, so they are not repeated.

[0066] The initial setting module 112 is used to sequentially execute the initial setting basic function 122 and the initial setting site function 212, wherein the initial setting site function 212 sets an operation mode of a fixture of the site 210 and turns on the fixture so that the robot arm can place the device under test 300 in the fixture. The pre-test module 113 is used to sequentially execute the pre-test basic function 123 and the pre-test site function 213, wherein the pre-test site function 213 confirms whether the device serial number of the device under test 300 meets a serial number rule and confirms whether the device under test 300 is in a retest state according to the device serial number. The test module 114 is used to sequentially execute the test initialization site function 214, the test initialization basic function 124 and the test function 211, wherein the test initialization site function 214 resets a program parameter in the test function 211 (i.e., a parameter related to the previous test, such as the device serial number of the previous device under test or the test data that needs to be written to the previous device under test) and closes the fixture, and the test function 211 tests the device under test 300 based on the test data 320 to generate a test result 330. The post-test module 115 is used to sequentially execute the post-test site function 215 and the post-test basic function 125, wherein the post-test site function 215 opens the fixture so that the robot arm can take out the device under test 300 from the fixture.

[0067] Thus, the automated test system 100a of the present invention can not only integrate the basic functions required for testing different sites 210 into the initial setting basic function 122, pre-test basic function 123, test initialization basic function 124 and post-test basic function 125 in the test schedule 110 for use by all sites 210, but can also overwrite these aforementioned basic functions into the initial setting site function 212, pre-test site function 213, test initialization site function 214 and post-test site function 215 for each site 210 to perform tests according to its own test items. Therefore, the present invention can solve the problem in the known technology that the same program code cannot be shared and used between different sites 210, so it can greatly reduce the development schedule and improve the reusability of the program code. In addition, each site 210 can share these aforementioned basic functions, further reducing the workload of site personnel and simplifying the maintenance cost and the complexity of handover.

[0068] The following paragraphs will take the RF site as an example to explain in detail the detailed operation of the site function executed by each module in the test schedule 110 .

[0069] In detail, the device under test 300 may be a communication device, and the main test item of the RF site may be a wireless radio frequency calibration (RF Calibration), and the remaining test items may be but are not limited to, transmit / receive detection, output power, adjacent channel power ratio (ACPR), channel bandwidth, spectrum density and sensitivity.

[0070] In the initial setting site function 212 , the initial setting site function 212 may initialize various prompt character settings and RF parameter settings of the device under test 300 .

[0071] In the pre-test site function 213, if the device identifier 313 of the device under test 300 is obtained by manually scanning a barcode, the pre-test site function 213 will not only check the serial number rule, but also determine whether the device serial number complies with the Golden special serial number rule.

[0072] In the test initialization site function 214 , the test initialization site function 214 starts the power supply of the device under test 300 , ie, powers on the device under test 300 , and obtains the device name and the corresponding Media Access Control (MAC) address of the device under test 300 from the central server 400 through the device serial number.

[0073] In the test function 211, the test function 211 calibrates the device under test 300 by using a golden sample. If the calibration fails, the calibration data configured for the device under test 300 in the calibration test is cleared.

[0074] In the post-test site function 215, the post-test site function 215 turns off the power of the device under test 300, that is, the device under test 300 is powered off, and confirms whether there is at least one special test item (such as ACPR) that fails the test. When at least one special test item is determined to be a test failure, the post-test site function 215 directly uploads the test result 330 to the central server 400.

[0075] Please also read Figure 2 and Figure 3 ,in Figure 3 FIG. 5 is a flow chart of an automated testing method 500 according to a second embodiment of the present invention. Figure 2 and Figure 3As shown, the automated testing method 500 can be applied to the automated testing system 100a, and is used to provide the testing platform 200 to perform multiple tests on the device under test 300. The automated testing method 500 includes the following steps: an item determination step S01, a setting initialization step S02, a pre-test step S03, a test step S04, and a post-test step S05.

[0076] The project determination step S01 includes driving the project determination module 111 to execute the project determination basic function 121. The project determination basic function 121 determines whether the test project of the site 210 includes a robotic arm test. When the test project includes a robotic arm test, the project determination basic function 121 initializes the operation parameters 220 of the robotic arm test, initializes the RCS related settings and registers with the RCS server.

[0077] The setting initialization step S02 includes driving the initial setting module 112 to sequentially execute the initial setting basic function 122 and the initial setting site function 212. The initial setting basic function 122 obtains the test setting file 310 corresponding to the device under test 300 from the site 210, reads the device basic information 311 from the test setting file 310 and sets the platform setting data 312 according to the device basic information 311, and the initial setting site function 212 sets the operation mode of the fixture of the site 210 and turns on the fixture.

[0078] The pre-test step S03 includes driving the pre-test module 113 to sequentially execute the pre-test basic function 123 and the pre-test site function 213. The pre-test basic function 123 resets the test setting file 310 of the site 210 in the previous test. The pre-test site function 213 confirms whether the device serial number of the device under test 300 complies with the serial number rule and confirms whether the device under test 300 is in a retest state according to the device serial number.

[0079] The test step S04 includes driving the test module 114 to sequentially execute the test initialization site function 214, the test initialization basic function 124, and the test function 211. The test initialization site function 214 resets the program parameters in the test function 211 and closes the fixture. The test initialization basic function 124 confirms whether the device under test 300 is applied to the test items of the site 210 according to the device basic information 311 and initializes the test data 320 corresponding to the device under test 300 according to the test items. The test function 211 tests the device under test 300 based on the test data 320 and generates a test result 330.

[0080] The post-test step S05 includes driving the post-test module 115 to sequentially execute the post-test site function 215 and the post-test basic function 125. The post-test site function 215 turns on the fixture. The post-test basic function 125 uploads the test result 330 to the central server 400 and confirms whether the upload status 410 is received from the central server 400.

[0081] Each site 210 can overwrite the initial setting basic function 122, the pre-test basic function 123, the test initialization basic function 124 and the post-test basic function 125 according to its own test items to generate the initial setting site function 212, the pre-test site function 213, the test initialization site function 214 and the post-test site function 215. In this way, the automated testing method 500 of the present invention can perform standardized test processes and exclusive test items of each site 210 on the device under test 300 through different basic functions and site functions. When rework or sorting occurs, the development time can be greatly saved and the reusability of the program code can be improved.

[0082] In summary, the present invention has the following advantages: First, by standardizing multiple basic functions, the development cost in the initial stage of testing can be saved and the development schedule can be reduced. Second, by overwriting the basic functions to generate site functions, the problem that the same program code cannot be shared between different sites in the known technology can be solved, which can not only greatly reduce the development schedule, but also improve the reusability of the program code. Third, each site can share the basic functions, further reducing the workload of site personnel and simplifying the maintenance cost and the complexity of handover.

[0083] Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Any technician in this field should be able to make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the attached claims.

Claims

1. An automated testing system, the automated testing system is used to provide a testing platform to perform multiple tests on a device under test, the testing platform includes multiple sites, and the automated testing system includes: an initial setting module, the initial setting module is used to execute an initial setting basic function, the initial setting basic function obtains a test setting file corresponding to the device under test from one of the sites, reads a device basic information from the test setting file and sets a platform setting data according to the device basic information; a pre-test module, the pre-test module is used to execute a pre-test basic function, the pre-test basic function resets the test setting file in the previous test; a test module, the test module is used to execute a test initialization basic function, the test initialization basic function confirms whether the device under test is applied to a test item of the one of the sites according to the basic information of the device, and initializes a test data corresponding to the device under test according to the test item, wherein the one of the sites tests the device under test based on the test data to generate a test result; as well as A post-test module is used to execute a post-test basic function, and the post-test basic function uploads the test result to a central server and confirms whether an upload status is received from the central server.

2. The automated testing system according to claim 1, further comprising: an item determination module, the item determination module is used to execute an item determination basic function, the item determination basic function determines whether the test item includes a robot arm test; When the test item includes the robotic arm test, the item determines that a basic function initializes an operating parameter of the robotic arm test.

3. The automated testing system as claimed in claim 2, further comprising: a function library, the function library signal connecting the project determination module, the initial setting module, the pre-test module, the test module and the post-test module, and storing a plurality of basic functions; Among them, the basic functions include the project judgment basic function, the initial setting basic function, the pre-test basic function, the test initialization basic function and the post-test basic function.

4. The automated testing system of claim 1 , wherein the initial setting basic function reads a site name corresponding to the sites from the test setting file, and obtains a device identifier from the device under test, and the device basic information includes a device name corresponding to the device under test, a device model, a device serial number, and a device test log.

5. The automated testing system of claim 1, wherein the platform setting data includes a status display configuration corresponding to the test item and a server transmission configuration corresponding to the central server, and the automated testing system further includes: A status display interface, the status display interface signal is connected to the initial setting module and is used to display the status display configuration; The initial setting basic function sets the status display configuration and initializes the server transmission configuration according to the basic information of the device, and obtains a device material number of the device under test from the central server through the server transmission configuration. 6 . The automated testing system of claim 1 , wherein the pre-test basic function resets a test failure record of the test setting file in the previous test, the test failure record comprising a test failure item and a failed device serial number.

7. An automated testing system as described in claim 1, wherein the test data includes a fixture number and a server address, the test initialization basic function obtains a device material number corresponding to the device under test according to a device serial number of the device basic information, and integrates the server address of the test data and the device serial number, the device material number and a device name of the device basic information into a test basic data.

8. The automated testing system of claim 1, wherein the post-test basic function determines whether the test result is a test failure, and when the test result is the test failure, the post-test basic function generates a test failure record according to the test result.

9. An automated testing system, the automated testing system is used to provide a testing platform to perform multiple tests on a device under test, the testing platform includes multiple sites, and the automated testing system includes: an initial setting module, the initial setting module is used to sequentially execute an initial setting basic function and an initial setting site function, the initial setting basic function obtains a test setting file corresponding to the device under test from one of the sites, reads a device basic information from the test setting file and sets a platform setting data according to the device basic information, and the initial setting site function sets an operation mode of a fixture and turns on the fixture; a pre-test module, the pre-test module is used to sequentially execute a pre-test basic function and a pre-test station function, the pre-test basic function resets the test setting file in the previous test, the pre-test station function confirms whether a device serial number of the device under test meets a serial number rule and confirms whether the device under test is in a retest state according to the device serial number; a test module, the test module being used to sequentially execute a test initialization site function, a test initialization basic function, and a test function, the test initialization site function resetting a program parameter and closing the fixture, the test initialization basic function confirming whether the device under test is applied to a test item of the one of the sites according to the basic information of the device and initializing a test data corresponding to the device under test according to the test item, and the test function testing the device under test based on the test data to generate a test result; as well as a post-test module, the post-test module is used to sequentially execute a post-test site function and a post-test basic function, the post-test site function turns on the fixture, the post-test basic function uploads the test result to a central server, and confirms whether an upload status is received from the central server; Among them, the ones of the sites overwrite the initial setting basic function, the pre-test basic function, the test initialization basic function and the post-test basic function according to the test item to generate the initial setting site function, the pre-test site function, the test initialization site function and the post-test site function.

10. The automated testing system according to claim 9, further comprising: an item determination module, the item determination module is used to execute an item determination basic function, the item determination basic function determines whether the test item includes a robot arm test; When the test item includes the robotic arm test, the item determines that a basic function initializes an operating parameter of the robotic arm test.

11. The automated testing system according to claim 10, further comprising: a function library, the function library signal connecting the project determination module, the initial setting module, the pre-test module, the test module and the post-test module, and storing a plurality of basic functions; Among them, the basic functions include the project judgment basic function, the initial setting basic function, the pre-test basic function, the test initialization basic function and the post-test basic function.

12. An automated testing system as described in claim 9, wherein the initial setting basic function reads a site name corresponding to the sites from the test setting file, and obtains a device identifier from the device under test, and the device basic information includes a device name corresponding to the device under test, a device model, the device serial number and a device test log.

13. The automated testing system of claim 9, wherein the platform setting data includes a status display configuration corresponding to the test item and a server transmission configuration corresponding to the central server, and the automated testing system further includes: A status display interface, the status display interface signal is connected to the initial setting module and is used to display the status display configuration; The initial setting basic function sets the status display configuration and initializes the server transmission configuration according to the basic information of the device, and obtains a device material number of the device under test from the central server through the server transmission configuration. 14 . The automated testing system of claim 9 , wherein the pre-test basic function resets a test failure record of the test setting file in the previous test, the test failure record comprising a test failure item and a failed device serial number.

15. An automated testing system as described in claim 9, wherein the test data includes a fixture number and a server address, the test initialization basic function obtains a device material number corresponding to the device under test according to the device serial number, and integrates the server address of the test data and the device serial number, the device material number and a device name of the device basic information into a test basic data.

16. The automated testing system of claim 9, wherein the post-test basic function determines whether the test result is a test failure, and when the test result is the test failure, the post-test basic function generates a test failure record according to the test result.

17. An automated testing method, the automated testing method is used to provide a testing platform to perform multiple tests on a device under test, the testing platform comprising multiple sites, the automated testing method comprising the following steps: a setting initialization step, the setting initialization step comprising driving an initial setting module to sequentially execute an initial setting basic function and an initial setting site function, the initial setting basic function obtaining a test setting file corresponding to the device under test from one of the sites, reading a device basic information from the test setting file and setting a platform setting data according to the device basic information, the initial setting site function setting an operation mode of a fixture and starting the fixture; a pre-test step, the pre-test step comprising driving a pre-test module to sequentially execute a pre-test basic function and a pre-test station function, the pre-test basic function resetting the test setting file in the previous test, the pre-test station function confirming whether a device serial number of the device under test conforms to a serial number rule and confirming whether the device under test is in a retest state according to the device serial number; a test step, the test step comprising driving a test module to sequentially execute a test initialization site function, a test initialization basic function, and a test function, the test initialization site function resets a program parameter and closes the fixture, the test initialization basic function confirms whether the device under test is applied to a test item of the sites according to the basic information of the device and initializes a test data corresponding to the device under test according to the test item, and the test function tests the device under test based on the test data to generate a test result; as well as a post-test step, the post-test step comprising driving a post-test module to sequentially execute a post-test site function and a post-test basic function, the post-test site function turns on the fixture, the post-test basic function uploads the test result to a central server, and confirms whether an upload status is received from the central server; Among them, the ones of the sites overwrite the initial setting basic function, the pre-test basic function, the test initialization basic function and the post-test basic function according to the test item to generate the initial setting site function, the pre-test site function, the test initialization site function and the post-test site function.

18. The automated testing method according to claim 17, further comprising: an item judgment step, the item judgment step comprising driving an item judgment module to execute an item judgment basic function, the item judgment basic function judging whether the test item comprises a robot arm test; When the test item includes the robotic arm test, the item determines that a basic function initializes an operating parameter of the robotic arm test.

19. The automated testing method of claim 17, wherein the initial setting basic function reads a site name corresponding to the sites from the test setting file, and obtains a device identifier from the device under test, and the device basic information includes a device name corresponding to the device under test, a device model, the device serial number, and a device test log.

20. An automated testing method as described in claim 17, wherein the platform setting data includes a status display configuration corresponding to the test item and a server transmission configuration corresponding to the central server, the initial setting basic function sets the status display configuration and initializes the server transmission configuration according to the basic information of the device, and obtains a device material number of the device under test from the central server through the server transmission configuration.

21. The automated testing method of claim 17, wherein the pre-test basic function resets a test failure record of the test setting file in the previous test, the test failure record comprising a test failure item and a failed device serial number.

22. An automated testing method as described in claim 17, wherein the test data includes a fixture number and a server address, the test initialization basic function obtains a device material number corresponding to the device under test according to the device serial number, and integrates the server address of the test data and the device serial number, the device material number and a device name of the device basic information into a test basic data.

23. The automated testing method of claim 17, wherein the post-test basic function determines whether the test result is a test failure, and when the test result is the test failure, the post-test basic function generates a test failure record according to the test result.

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