A device for measuring high-frequency magnetic properties of nanocrystalline alloys

Abstract

The application discloses a device for measuring high-frequency magnetic characteristics of nanocrystalline alloys, which adopts a double U-shaped magnetic yoke to construct a closed magnetic circuit, can effectively reduce leakage magnetic flux and normal eddy current, improve measurement accuracy, and solves the problem of the double U-shaped magnetic yoke blocking the light path by building an L-shaped light path through a reflecting component. Considering that the gravity of the upper magnetic yoke and the reflecting component will affect the measurement results, the above problems are solved by designing an acrylic supporting component and an independent supporting double-layer supporting bridge structure, and the device can be used for measuring the high-frequency magnetic characteristics of nanocrystalline alloys to obtain relatively accurate measurement results.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing the magnetic properties of magnetostrictive materials, and particularly relates to a device for measuring the high-frequency magnetic properties of nanocrystalline alloys. BACKGROUND

[0002] With the rapid development of wind power and photovoltaic power generation in China, the construction of direct current power grids and large-scale distributed renewable energy systems is particularly important. The popularity of wind farms and photovoltaic power stations has increased the demand for high-voltage and high-capacity DC-DC converters and solid-state transformers. As a key component, the performance of high-frequency transformers directly affects the efficiency and stability of the overall power system.

[0003] To meet the growing energy demand, power systems need to increase the power of transformers and effectively reduce the volume and weight. By increasing the operating frequency of transformers, these requirements can be met to some extent, which makes the application of high-frequency transformers increasingly common. However, the increase in frequency also brings new challenges - as the operating frequency increases, the vibration and loss problems of the transformer become more prominent. This not only affects the safety and comfort of the surrounding environment, but also can accelerate the aging of the equipment, seriously threatening the safe and stable operation of the power system. Therefore, it is necessary to conduct in-depth research on the vibration and loss problems of high-frequency transformers to ensure the efficiency and reliability of the power system.

[0004] Using nanocrystalline alloys with high magnetic permeability as the main material for the core of high-frequency transformers can make the core leakage very small and effectively reduce the core vibration. The vibration of the core is mainly caused by magnetostriction, so it is necessary to test the magnetostriction properties of nanocrystalline alloys, which can provide data basis for the core vibration calculation of high-frequency transformers.

[0005] Due to the low magnetostriction coefficient of nanocrystalline alloys and the high operating frequency of high-frequency transformer cores, higher accuracy and frequency are required for the sensor. Therefore, the laser method is often used to measure the magnetostriction properties of nanocrystalline alloys. Currently, the device for testing the magnetic properties of magnetic materials using the laser method is mainly a single yoke excitation device, which is more conducive to the construction of the optical path. However, when using a single yoke excitation device, the test accuracy is often not ideal due to the influence of leakage flux and normal eddy current. SUMMARY

[0006] To solve the problem of unsatisfactory test accuracy in the prior art, the present application provides a device for measuring the high-frequency magnetic properties of nanocrystalline alloys. The device can construct a closed magnetic circuit to improve the measurement accuracy.

[0007] The technical scheme for solving the technical problem of the present application is: a device for measuring high-frequency magnetic characteristics of nanocrystalline alloy is designed, characterized in that the device adopts a double-U-shaped magnetic yoke, and specifically comprises a bottom plate, a lower magnetic yoke, a left baffle, a right baffle, a first supporting part, a second supporting part, an induction winding, an excitation winding, a resin framework, a third supporting part, a fourth supporting part, a double-layer supporting bridge, a clamp, a reflecting part, a fifth supporting part, a sixth supporting part, and an upper magnetic yoke.

[0008] The bottom plate is fixed on the vibration isolation platform using bolts, and the left baffle and the right baffle are fixed on the left and right sides of the bottom plate, respectively, and face each other. A slot penetrating in the vertical direction is arranged on the right side surface of the left baffle and the left side surface of the right baffle, respectively, and faces each other. The lower magnetic yoke of the "U" shape is arranged between the right baffle and the left baffle with the opening facing upward, and the left branch of the lower magnetic yoke is located in the slot on the right side surface of the left baffle, and the right branch of the lower magnetic yoke is located in the slot on the left side surface of the right baffle. The height of the lower magnetic yoke in the vertical direction is not less than the vertical height of the baffle part at the two slots.

[0009] A first supporting part is fixed on the front and rear sides of the end of the lower magnetic yoke close to the left baffle, and the two first supporting parts are arranged in front of and behind each other and parallel to the lower magnetic yoke, and the lower magnetic yoke is located in the middle position of the two first supporting parts. The second supporting part is a "mouth" shaped frame structure part, which is fixed horizontally on the top surface of the two first supporting parts by screws.

[0010] A third supporting part is fixed on the front and rear sides between the two first supporting parts and the right baffle, and the two third supporting parts are arranged in front of and behind each other and parallel to the lower magnetic yoke, and the lower magnetic yoke is located in the middle position of the two third supporting parts. The fourth supporting part is a strip-shaped plate, which is fixed horizontally on the top surface of the two third supporting parts by screws. The double-layer supporting bridge is a plate structure with a rectangular through hole in the left-right direction in the middle position, which is fixed on the top surface of the fourth supporting part by screws. The bottom surface of the rectangular through hole of the double-layer supporting bridge is the first layer supporting bridge, and the top surface of the whole double-layer supporting bridge is the second layer supporting bridge. The first layer supporting bridge and the second layer supporting bridge are parallel, and the front-rear direction length of the first layer supporting bridge is not less than the front-rear direction length of the top surface of the lower magnetic yoke, and the up-down direction height of the rectangular through hole is not less than the thickness of the nanocrystalline alloy sample.

[0011] The top surface of the left side part of the left baffle is a horizontal surface, the height of the top surface is equal to the height of the lower magnetic yoke in the vertical direction, the front-rear direction length of the top surface is greater than the front-rear direction length of the top surface of the lower magnetic yoke and is located on the same horizontal surface; screw holes are arranged at the front and rear ends of the top surface of the left side part of the left baffle, and the distance between the screw holes at the front and rear ends is not less than the front-rear direction length of the top surface of the lower magnetic yoke; the clamp is fixed on the top surface of the left side part of the left baffle by screws to clamp the nanocrystalline alloy sample piece;

[0012] The resin skeleton is a cuboid structure with a smaller middle size than two end sizes, the induction winding is wound at the middle position of the resin skeleton in the front-rear direction, and the excitation winding is wound at the middle position of the induction winding in the front-rear direction; the resin skeleton provided with the induction winding and the excitation winding is fixed on the top surface of the second support part in the left-right direction, and the left-right direction length of the resin skeleton is equal to the left-right direction length of the second support part;

[0013] The top surface of the left side part of the left baffle, the top surface of the lower magnetic yoke and the first layer support bridge of the double-layer support bridge are located on the same horizontal surface and are opposite in the left-right direction;

[0014] The fifth support part is fixed on the top surface of the resin skeleton by bolts, and the fifth support part does not contact the excitation winding; the sixth support part is fixed on the top surface of the fifth support part by bolts, and the upper magnetic yoke of the U shape is placed on the sixth support part with the opening downward; the upper magnetic yoke has the same size as the lower magnetic yoke, and the two are arranged opposite in the vertical direction, and a gap for accommodating the thickness of the nanocrystalline alloy sample piece is reserved between the two;

[0015] The reflection part is placed on the second layer support bridge, and the reflection surface thereof is arranged towards the front side, the reflection surface is perpendicular to the second layer support bridge and forms a 45° angle with the vertical surface in the front-rear direction.

[0016] Compared with the prior art, the device for measuring the high-frequency magnetic characteristics of the nanocrystalline alloy has the beneficial effects that the device adopts a double-U-shaped magnetic yoke to build a closed magnetic circuit, which can effectively reduce the leakage magnetic flux and the normal eddy current, improve the measurement accuracy, and solve the problem of blocking the light path by the double-U-shaped magnetic yoke through a reflection part to build an L-shaped light path. Considering that the gravity of the upper magnetic yoke and the reflection part will affect the measurement result, the above problems are solved by designing the acrylic support part and the double-layer support bridge structure with independent support, and the device can obtain more accurate measurement results for measuring the high-frequency magnetic characteristics of the nanocrystalline alloy. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 The assembly schematic view of the nanocrystalline alloy sample piece of one embodiment of the device for measuring the high-frequency magnetic characteristics of the nanocrystalline alloy.

[0018] Figure 2 Structure diagram of upper magnetic yoke of one embodiment of the device for measuring high-frequency magnetic characteristics of nanocrystalline alloy according to the present application.

[0019] Figure 3 Assembly diagram of lower magnetic yoke of one embodiment of the device for measuring high-frequency magnetic characteristics of nanocrystalline alloy according to the present application.

[0020] Figure 4 Structure diagram of left baffle of one embodiment of the device for measuring high-frequency magnetic characteristics of nanocrystalline alloy according to the present application.

[0021] Figure 5 Structure diagram of right baffle of one embodiment of the device for measuring high-frequency magnetic characteristics of nanocrystalline alloy according to the present application.

[0022] Figure 6 Laser light path diagram of one embodiment of the device for measuring high-frequency magnetic characteristics of nanocrystalline alloy according to the present application (in the diagram, a is a laser emitter, b is a nanocrystalline alloy sample, c is a reflecting component, and d is an optical target).

[0023] Figure 7 Magnetic strain peak-peak value curve of a nanocrystalline alloy sample of one embodiment under the same frequency and different magnetic flux densities (5 KHz, 0.1 T-0.9 T) using the device for measuring high-frequency magnetic characteristics of nanocrystalline alloy according to the present application (horizontal axis B-magnetic flux density, unit T, vertical axis λpp-magnetic strain peak-peak value, unit μm / m).

[0024] Figure 8 Loss curve of a nanocrystalline alloy sample of one embodiment under the same frequency and different magnetic flux densities (5 KHz, 0.1 T-0.9 T) using the device for measuring high-frequency magnetic characteristics of nanocrystalline alloy according to the present application (horizontal axis B-magnetic flux density, unit T, vertical axis P-loss, unit W / kg). DETAILED DESCRIPTION

[0025] The following gives a specific embodiment of the present application. The specific embodiment is only used to further illustrate the present application and does not limit the protection scope of the claims of the present application.

[0026] The present application provides a device for measuring high-frequency magnetic characteristics of nanocrystalline alloy, characterized in that the device adopts a double U-shaped magnetic yoke, which specifically comprises a bottom plate 1, a lower magnetic yoke 2, a left baffle 3, a right baffle 4, a first supporting component 5, a second supporting component 6, an induction winding 7, an excitation winding 8, a resin skeleton 9, a third supporting component 10, a fourth supporting component 11, a double-layer supporting bridge 12, a clamp 14, a reflecting component 15, a fifth supporting component 16, a sixth supporting component 17, and an upper magnetic yoke 18.

[0027] The bottom plate 1 is fixed on the vibration isolation platform by bolts, and the left baffle 3 and the right baffle 4 are fixed on the left and right sides of the bottom plate 1 respectively and face each other. A slot penetrating in the vertical direction is arranged on the right side surface of the left baffle 3 and the left side surface of the right baffle 4 respectively and faces each other. The U-shaped lower magnetic yoke 2 is arranged between the right baffle 4 and the left baffle 3 with the opening facing upward, and the left branch of the lower magnetic yoke 2 is located in the slot on the right side surface of the left baffle 3, and the right branch of the lower magnetic yoke 2 is located in the slot on the left side surface of the right baffle 4. The height of the lower magnetic yoke 2 in the vertical direction is not less than the vertical height of the baffle part at the slot. As an embodiment, the height of the slot of the left baffle 3 and the height of the slot of the right baffle 4 are both less than the height of the lower magnetic yoke 2 in the vertical direction.

[0028] As an embodiment, the right side part of the right baffle 4 is lower than the left side part, and the joint surface of the right side part and the left side part is the bottom surface of the slot of the right baffle 4, which is convenient for the assembly and disassembly of the lower magnetic yoke 2.

[0029] A first support part 5 is arranged on the front and back sides of the end of the lower magnetic yoke 2 close to the left baffle 3, and the two first support parts 5 are arranged in front of and behind each other and parallel to the lower magnetic yoke 2. The lower magnetic yoke 2 is located in the middle position of the two first support parts 5. The second support part 6 is a "mouth" type frame structure part, which is fixed horizontally on the top surface of the two first support parts 5 by screws.

[0030] A third support part 10 is arranged on the front and back sides between the two first support parts 5 and the right baffle 4, and the two third support parts 10 are arranged in front of and behind each other and parallel to the lower magnetic yoke 2. The lower magnetic yoke 2 is located in the middle position of the two third support parts 10. The fourth support part 11 is a strip-shaped plate, which is fixed horizontally on the top surface of the two third support parts 10 by screws. The double-layer support bridge 12 is a plate-shaped structure with a rectangular through hole in the left-right direction arranged in the middle position, which is fixed on the top surface of the fourth support part 11 by screws. The bottom surface of the rectangular through hole of the double-layer support bridge 12 is the first layer support bridge, and the top surface of the whole double-layer support bridge 12 is the second layer support bridge. The first layer support bridge and the second layer support bridge are parallel, and the length of the first layer support bridge in the front-back direction is not less than the length of the top surface of the lower magnetic yoke 2 in the front-back direction. The height of the rectangular through hole in the up-down direction is not less than the thickness of the nanocrystalline alloy sample.

[0031] The top surface of the left side portion of the left baffle 3 is a horizontal surface, the height of the top surface is equal to the height of the lower magnetic yoke 2 in the vertical direction, the front-rear direction length of the top surface is greater than the front-rear direction length of the top surface of the lower magnetic yoke 2 and they are located on the same horizontal surface; screw holes are arranged at the front and rear ends of the top surface of the left side portion of the left baffle 3, the distance between the screw holes at the front and rear ends is not less than the front-rear direction length of the top surface of the lower magnetic yoke 2; the clamp 14 is fixed on the top surface of the left side portion of the left baffle 3 by screws to clamp the nanocrystalline alloy sample sheet 13.

[0032] The resin skeleton 9 is a cuboid structure with a smaller middle size than the two end sizes, the induction winding 7 is wound at the middle position of the resin skeleton 9 in the front-rear direction, and the excitation winding 8 is wound at the middle position of the induction winding 7 in the front-rear direction; the resin skeleton 9 provided with the induction winding 7 and the excitation winding 8 is fixed on the top surface of the second support member 6 in the left-right direction, and the left-right direction length thereof is equal to the left-right direction length of the second support member 6.

[0033] The induction winding is composed of 25 turns of enameled wire, and the excitation winding is composed of 65 turns of enameled wire, which can realize the measurement of magnetic properties from 1 kHz to 20 kHz. Through formulas (1) and (2), the magnetic field strength and the magnetic flux density can be calculated according to the current of the excitation coil and the induced voltage of the induction winding. The current of the excitation coil and the induced voltage of the induction winding are collected by the voltage probe and the current transformer.

[0034]

[0035] N1 and N2 are the number of turns of the excitation winding and the induction winding, A e is the cross-sectional area in the thickness direction of the sample sheet, l e is the equivalent magnetic path length, and T is the magnetization period.

[0036] The top surface of the left side portion of the left baffle 3, the top surface of the lower magnetic yoke 2 and the first layer support bridge of the double-layer support bridge 12 are all on the same horizontal surface and are located opposite in the left-right direction.

[0037] The fifth support member 16 is fixed on the top surface of the resin skeleton 9 by bolts, and the fifth support member 16 does not contact the excitation winding 8; the sixth support member 17 is fixed on the top surface of the fifth support member 16 by bolts, and the “U”-shaped upper magnetic yoke 18 is placed on the sixth support member 17 with the opening downward; the upper magnetic yoke 18 has the same size as the lower magnetic yoke 2, and the two are arranged opposite in the vertical direction, and a gap for accommodating the thickness of the nanocrystalline alloy sample sheet 13 is reserved between them.

[0038] The reflecting member 15 is placed on the second layer support bridge, and the reflecting surface thereof is arranged towards the front side, which is perpendicular to the second layer support bridge and forms a 45° angle with the vertical surface in the front-rear direction.

[0039] During measurement, the nanocrystalline alloy sample 13 is arranged from left to right on the top surface of the left side of the left baffle 3, the top surface of the left side of the lower magnetic yoke 2, the inside of the induction winding 7, the first layer of the double-layer support bridge 12, and the top surface of the right side of the lower magnetic yoke 2. The left end of the nanocrystalline alloy sample 13 is fixed to the top surface of the left side of the left baffle 3 by the clamp 14, and the rest is horizontally unfolded. There is no pressure contact between the top surface of the lower magnetic yoke 2 and the bottom surface of the nanocrystalline alloy sample 13, and there is also no pressure contact between the bottom surface of the upper magnetic yoke 18 and the top surface of the nanocrystalline alloy sample 13.

[0040] The fifth support component 16 and the sixth support component 17 are made of acrylic material.

[0041] This invention employs a double U-shaped magnetic yoke to construct a closed magnetic circuit, which can effectively reduce leakage flux and normal eddy currents, thereby improving measurement accuracy. Both the lower magnetic yoke 2 and the upper magnetic yoke 18 are made of nanocrystalline alloy strips wound together, with a cross-sectional area of ​​35mm × 10mm. To ensure that the nanocrystalline alloy is placed horizontally, it is placed within a resin skeleton fixed between the magnetic yoke pillars.

[0042] The magnetization device constructed using a double U-shaped structure can lead to the closure of an open optical path. Therefore, this invention constructs an L-shaped optical path using a reflective component, ensuring that the laser emitted by the laser successfully reaches the optical target and returns. The specific optical path is shown in the attached diagram. Figure 6 As shown, a vertically incident laser first passes through a reflective component, then is guided and redirected to a path parallel to the length of the sample, ultimately illuminating an optical target fixed to the sample surface. This optical target has reflective properties, allowing the laser to return along its original path. The reflective component consists of an aluminum-coated mirror and an isosceles right-angled triangular prism-shaped base made of non-conductive and non-magnetic acrylic material, where the reflecting surface of the aluminum-coated mirror is the reflecting surface of the reflective component.

[0043] Considering that the weight of the upper magnetic yoke and the reflective component will affect the measurement results, acrylic material is used to fabricate support components that do not obstruct the optical path to avoid the weight of the upper magnetic yoke and the reflective component acting on the sample. First, some support components are built to support the upper magnetic yoke, leaving an air gap between it and the sample to avoid squeezing the sample. Second, a double-layer support bridge is designed, with the distance between the two layers greater than the thickness of the sample. The sample is placed on top of the first layer of the bridge, and the reflective component is placed on top of the second layer of the bridge. The weight of the reflective component only acts on the second layer of the bridge, avoiding any impact on the sample.

[0044] All the surfaces of the device which contact the sample are pasted with PTFE film with very low friction coefficient to reduce the hindrance of the device to the displacement of the nanocrystalline alloy and improve the measurement accuracy. That is, the top surface of the lower magnetic yoke 2, the first layer of the double-layer support bridge 12 and the bottom surface of the upper magnetic yoke 18 are all pasted with PTFE film.

[0045] The working principle and working process of the device of the present application are as follows:

[0046] An optical target is pasted on the nanocrystalline alloy sample, and then the nanocrystalline alloy sample is fixed on the device of the present application. Then, the two wire ends of the induction winding 7 are connected with a data acquisition card, and the two wire ends of the excitation winding 8 are connected with a power amplifier which is connected with a central control system. Then, the laser vibration tester is turned on, and the laser emitted by the laser vibration tester hits the reflecting surface of the reflecting part 15 in the front-back direction, and the reflecting surface reflects the laser to the inside of the induction winding 7 in the left-right direction. The front-back position of the reflecting part 15 and the up-down position of the laser emitted by the laser vibration tester hitting the reflecting surface of the reflecting part 15 are adjusted so that the reflecting surface reflects the laser to the optical target on the surface of the nanocrystalline alloy sample in the inside of the induction winding 7 and returns smoothly, and then the reflected signal quality is detected and adjusted until the experimental requirements are met.

[0047] Then, the central control system is used to control the power amplifier to apply current signals to the excitation winding 8 to magnetize the nanocrystalline alloy sample, and a voltage signal is induced in the induction winding. The current and voltage signals are stored in the computer through the data acquisition card, and the magnetic flux density B is maintained as a sinusoidal signal through the feedback system. When the magnetic flux density reaches the set value, the excitation signal remains unchanged, and at this time, the vibration acceleration signal of the nanocrystalline alloy sample is collected through the laser vibration tester, and the high-frequency magnetic properties of the nanocrystalline alloy are obtained.

[0048] The nanocrystalline alloy sample used in the experiment is a stack formed by bonding 13 identical nanocrystalline alloy single pieces. The model of the single nanocrystalline alloy is 1K107B (Fe74.5CuxNb3Si13.5B9). The laser vibration tester used is a PSV-500 full-field scanning laser vibration tester of Ploytec Company in Germany.

[0049] The device of the present application can realize the measurement of the high-frequency magnetic properties of the nanocrystalline alloy in cooperation with the laser vibration tester and the external control system.

[0050] The unmentioned parts of the present application are applicable to the prior art.

Claims

1. A device for measuring the high-frequency magnetic properties of nanocrystalline alloys, characterized in that, The device employs a double U-shaped magnetic yoke, which specifically includes a base plate, a lower magnetic yoke, a left baffle, a right baffle, a first support component, a second support component, an induction winding, an excitation winding, a resin skeleton, a third support component, a fourth support component, a double-layer support bridge, a clamp, a reflective component, a fifth support component, a sixth support component, and an upper magnetic yoke. The base plate is fixed to the vibration isolation platform using bolts. A left baffle and a right baffle are fixedly installed on the left and right sides of the base plate, respectively. A vertical through slot is provided in the center on the right side of the left baffle and the left side of the right baffle. A U-shaped lower magnetic yoke with its opening facing upward is set between the right baffle and the left baffle. Its left branch is located in the slot on the right side of the left baffle, and its right branch is located in the slot on the left side of the right baffle. The vertical height of the lower magnetic yoke is not lower than the vertical height of the baffle part at the above two slots. A first support component is fixedly installed on the front and rear sides of the lower magnetic yoke near the left baffle. The two first support components are arranged facing each other and parallel to the lower magnetic yoke. The lower magnetic yoke is located in the middle of the two first support components. The second support component is a "U"-shaped frame structure component, which is horizontally fixed to the top surface of the two first support components by screws. A third support component is fixedly installed on the front and rear sides between the two first support components and the right baffle. The two third support components are arranged facing each other and parallel to the lower magnetic yoke, with the lower magnetic yoke located in the middle of the two third support components. The fourth support component is a strip plate, which is horizontally fixed to the top surface of the two third support components by screws. The double-layer support bridge is a plate-like structure with a rectangular through hole in the middle along the left and right direction, which is fixed to the top surface of the fourth support component by screws. The bottom surface of the rectangular through hole of the double-layer support bridge is the first layer support bridge, and the top surface of the entire double-layer support bridge is the second layer support bridge. The first layer support bridge and the second layer support bridge are parallel, and the front-back length of the first layer support bridge is not less than the front-back length of the top surface of the lower magnetic yoke. The vertical height of the rectangular through hole is not less than the thickness of the nanocrystalline alloy sample. The top surface of the left side portion of the left baffle is a horizontal plane, and the height of this top surface is equal to the vertical height of the lower magnetic yoke. The front-to-back length of this top surface is greater than the front-to-back length of the top surface of the lower magnetic yoke, and both are located on the same horizontal plane. Screw holes are provided at both the front and back ends of the top surface of the left side portion of the left baffle, and the distance between the screw holes at the front and back ends is not less than the front-to-back length of the top surface of the lower magnetic yoke. The clamp is fixed to the top surface of the left side portion of the left baffle by screws to hold the nanocrystalline alloy sample. The resin skeleton is a cuboid structure with a smaller middle dimension than the two ends. The induction winding is wound in the middle of the resin skeleton along the front-back direction, and the excitation winding is wound in the middle of the induction winding along the front-back direction. The resin skeleton with the induction winding and the excitation winding is fixed to the top surface of the second support component along the left-right direction, and its length in the left-right direction is equal to the length in the left-right direction of the second support component. The top surface of the left side of the left baffle, the top surface of the lower magnetic yoke, and the first layer of the double-layer support bridge are all on the same horizontal plane and are directly opposite each other in the left-right direction. The fifth support component is fixed to the top surface of the resin skeleton by bolts, and the fifth support component does not contact the excitation winding; The sixth support component is fixed to the top surface of the fifth support component by bolts. The U-shaped upper magnetic yoke with its opening facing downwards is placed on the sixth support component. The upper and lower magnetic yokes are the same size and are arranged vertically opposite each other. A gap is reserved between them to accommodate the thickness of the nanocrystalline alloy sample. The reflective component is placed on the second layer of support bridge, with its reflective surface facing forward. This reflective surface is perpendicular to the second layer of support bridge and forms a 45° angle with the vertical plane along the front-back direction.

2. The device for measuring the high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that, The height of the slot on the left baffle and the height of the slot on the right baffle are both lower than the height of the lower magnetic yoke in the vertical direction.

3. The device for measuring the high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that, The reflective component consists of an aluminum-plated reflector and an isosceles right-angled triangular prism-shaped base made of non-conductive and non-magnetic acrylic material, wherein the reflective surface of the aluminum-plated reflector is the reflective surface of the reflective component.

4. The device for measuring the high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that, The induction winding consists of 25 turns of enameled wire, and the excitation winding consists of 65 turns of enameled wire.

5. The apparatus for measuring the high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that, The fifth and sixth support components are made of acrylic material.

6. The apparatus for measuring the high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that, That is, the top surface of the lower magnetic yoke, the first layer of the double-layer support bridge, and the bottom surface of the upper magnetic yoke are all covered with PTFE film.

7. The apparatus for measuring the high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that, Both the lower and upper magnetic yokes are made of nanocrystalline alloy strips wound together.

8. The apparatus for measuring the high-frequency magnetic properties of nanocrystalline alloys according to claim 1, characterized in that, The right side of the right baffle is lower than its left side, and the connecting surface between the right and left sides is the plane where the bottom surface of the slot of the right baffle is located.

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