Multi-channel calibration test system and calibration test method thereof

Abstract

The present application provides a multi-channel calibration test system and a calibration test method thereof, wherein the multi-channel calibration test system comprises a control unit, including a control host computer, a transfer host computer bidirectionally connected to the control host computer, and an industrial computer bidirectionally connected to the control host computer and the transfer host computer for providing an operating environment for the control host computer and the transfer host computer; a calibration test unit, including a calibration device bidirectionally connected to the industrial computer, a product bidirectionally connected to the calibration device, and a collection device for collecting test data of the product; an extension unit, including at least two extension chips connected between the industrial computer and the product, and connected between the industrial computer and the collection device; the present application can perform corresponding calibration processing or test processing on a number of products at the same time, thereby improving the calibration efficiency and test efficiency of the products.

Description

Technical Field

[0001] The present application belongs to the technical field of product calibration, and specifically relates to a multi-channel calibration test system and a calibration test method thereof. Background Art

[0002] Product calibration is the process of determining the measurement accuracy of a product. It primarily involves comparing and adjusting the product's measurement results with known standard values ​​to ensure the accuracy of the product's measurement results and that the product operates within the specified error range. Taking distance measurement products such as distance sensors as an example, most current distance measurement products require calibration during production to ensure accuracy. After calibration, corresponding product performance tests, such as linear accuracy testing, repeatability testing, and analog quantity testing, are performed.

[0003] In the actual process of product calibration, most of the time it needs to be implemented based on a third-party control platform host computer. However, in this process, the third-party control platform host computer can only directly output the test value of the product, and cannot perform data analysis, data display, and data judgment on the data output by the product during the test. In addition, the third-party control platform host computer often has only one or two output channels, and cannot calibrate and test several products at the same time, resulting in generally low product calibration efficiency and testing efficiency. Summary of the Invention

[0004] The present application provides a multi-channel calibration and testing system and a calibration and testing method thereof, which can expand the universal interface of a third-party control platform host computer and improve the calibration efficiency and testing efficiency of the product.

[0005] In order to solve the above technical problems, the present application provides a multi-channel calibration test system, comprising:

[0006] A control unit includes a control host computer, a transfer host computer bidirectionally connected to the control host computer, and an industrial computer bidirectionally connected to the control host computer and the transfer host computer for providing an operating environment for the control host computer and the transfer host computer;

[0007] A calibration test unit, comprising a calibration device bidirectionally connected to the industrial computer, a product bidirectionally connected to the calibration device, and a collection device for collecting test data of the product;

[0008] An expansion unit, comprising at least two expansion chips connected between the industrial computer and the product, and between the industrial computer and the acquisition device;

[0009] The expansion chip is used to expand the single interface of the control host computer into an asynchronous serial port that is compatible with the number of the products and the number of the acquisition devices.

[0010] As a further improvement of the present application, the transfer host computer includes a master mode and a slave mode;

[0011] When the transfer host computer is in host mode, the transfer host computer receives the instruction sent by the calibration device and sends the instruction to the product through the expansion unit;

[0012] When the transfer host computer is in slave mode, the control host computer forwards the instruction sent by the calibration device to the transfer host computer through the virtual serial port, so that the transfer host computer sends the instruction to the product through the expansion unit;

[0013] The instructions include calibration instructions or test instructions.

[0014] As a further improvement of the present application, when the instruction is a calibration instruction, the product responds to the calibration instruction, performs corresponding calibration processing according to the calibration data contained in the calibration instruction, and transmits the data generated after calibration to the control host computer.

[0015] As a further improvement of the present application, the control host computer is also used to transmit the calibration data to the transfer host computer, so that the transfer host computer analyzes and processes the calibration data, displays the calibration status and calibration progress of each product in real time, and determines whether the current product is calibrated abnormally.

[0016] As a further improvement of the present application, when the instruction is a test instruction, the product responds to the test instruction, performs corresponding test processing according to the test data included in the test instruction, and transmits the data generated after the test to the control host computer;

[0017] The calibration device is also used to send a trigger instruction to the control host computer, and forward the trigger instruction to the acquisition device through the transfer host computer to trigger the acquisition device to collect the data generated after the product test, and transmit the collected test data to the control host computer.

[0018] As a further improvement of the present application, the control host computer is also used to transmit the test data sent by the product and the test data collected by the acquisition device to the transit host computer, so that the transit host computer analyzes and compares the two sets of test data received, and displays the test status, test progress of each product and the acquisition status of each acquisition device in real time.

[0019] As a further improvement of the present application, the calibration status and calibration progress of the plurality of products in response to the same calibration instruction are the same;

[0020] Furthermore, the test status and test progress of the plurality of products in response to the same test instruction are the same.

[0021] As a further improvement of the present application, the number of the product is configured to be at least one, and the collection device is set in a one-to-one correspondence with the product.

[0022] As a further improvement of the present application, the present application also provides a multi-channel calibration test method, the method comprising the following steps:

[0023] Determine whether the current system mode is master mode or slave mode;

[0024] If it is in host mode, it responds to the initialization instruction sent by the calibration device and forwards the instruction sent by the calibration device to the product; if it is in slave mode, it responds to the initialization instruction forwarded by the control host computer through the virtual serial port and forwards the instruction to the product;

[0025] Determining whether the instruction is a calibration instruction or a test instruction;

[0026] If it is a calibration instruction, receiving calibration data generated after the product is calibrated;

[0027] If it is a test instruction, the collection instruction sent by the calibration device is forwarded to the collection device to trigger the collection device to collect the test data of the product, receive the test data generated after the product test and the test data sent by the collection device.

[0028] As a further improvement of the present application, after receiving the calibration data or receiving the test data, the method further includes:

[0029] Analyze and process the calibration data, display the calibration status and progress of each product in real time, and determine whether the calibration of the current product is abnormal;

[0030] Alternatively, the test data generated after the product test and the test data sent by the acquisition device are analyzed and compared, the test status, test progress and acquisition status of each product are displayed in real time, and the test data are graphically analyzed to display the final test results.

[0031] Compared with the existing technology, the multi-channel calibration test system and multi-channel calibration test method provided by the present application, by setting at least two expansion chips between the control unit and the calibration test unit, expand the single interface of the control host computer into an asynchronous serial port compatible with the number of products and the number of acquisition devices through the industrial computer and the expansion chip, so that the control unit can perform corresponding calibration or test processing on several products at the same time according to instructions, thereby improving the calibration efficiency and testing efficiency of the products. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0033] Figure 1 A schematic diagram of the structure of a third-party control platform system provided in the related art;

[0034] Figure 2 A schematic diagram of the structure of a multi-channel calibration test system provided in an embodiment of the present application;

[0035] Figure 3 A schematic diagram of the structure of the power supply circuit of the expansion chip in the multi-channel calibration test system provided in an embodiment of the present application;

[0036] Figure 4 A schematic diagram of the structure of the main control circuit of the expansion chip in the multi-channel calibration test system provided in an embodiment of the present application;

[0037] Figure 5 A schematic diagram of the structure of the RS485 conversion circuit of the expansion chip in the multi-channel calibration test system provided in an embodiment of the present application;

[0038] Figure 6 Flowchart of the multi-channel calibration test method provided in an embodiment of the present application;

[0039] Figure 7 A flowchart of determining the system mode in the multi-channel calibration test method provided in an embodiment of the present application;

[0040] Figure 8 A flowchart of the calibration process in the multi-channel calibration test method provided in an embodiment of the present application;

[0041] Figure 9 This is a flowchart of the test processing in the multi-channel calibration test method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0042] In order to make the purpose, technical solutions and advantages of the embodiments of the present application more clearly understood, the embodiments of the present application are further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only used to explain the embodiments of the present application and are not intended to limit the embodiments of the present application.

[0043] In the description of the embodiments of the present application, the meaning of "plurality" is at least two, for example, two, three, etc., unless otherwise clearly and specifically limited. In the embodiments of the present application, all directional indications (such as up, down, left, right, front, back...) are only used to explain the relative position relationship, movement, etc. between the components under a specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions.

[0044] To provide a more detailed and complete description of the present disclosure, the following provides illustrative descriptions of implementation methods and specific embodiments of the present disclosure; however, these descriptions are not intended to be the only way to implement or use the embodiments of the present disclosure. The implementation methods cover features of various specific embodiments, as well as the method steps and sequences for constructing and operating these specific embodiments. However, other specific embodiments may also be used to achieve the same or equivalent functionality and step sequences.

[0045] Product calibration is the process of determining the measurement accuracy of a product. It mainly involves comparing and adjusting the product's measurement results with known standard values ​​to ensure the accuracy of the product's measurement results and ensure that the product works within the specified error range.

[0046] Taking distance measurement products such as distance measurement sensors as an example, most of the current distance measurement products need to be calibrated for accuracy during production, and then corresponding product performance tests are carried out after calibration, such as linear accuracy test, repeatability test, analog quantity test, etc.

[0047] In the actual process of product calibration, the equipment used is mature and high-precision equipment on the market. Please refer to Figure 1 , which is a structural diagram of the third-party control platform system provided in the related art, usually includes a third-party control platform host computer, a calibration baffle and a product. The third-party control platform host computer performs high-precision fixed-point movement of the calibration baffle to perform multi-point calibration of the product at positions such as X1, X2, and X3.

[0048] After calibration, most test processes, such as linear accuracy test, repeatability test, and analog quantity test, need to be implemented based on a third-party control platform host computer. However, during this process, the third-party control platform host computer can only directly output the test value of the product and cannot perform data analysis, data display, and data judgment on the data output by the product during the test.

[0049] In order to solve the above problems in the related technology, there are usually two solutions. The first solution is to customize a dedicated third-party control platform system for the calibration equipment, but this customization method is costly, difficult to maintain and has low versatility; the second solution is based on a universal third-party control platform host computer, and various matching product test and judgment host computers are designed according to the type of test. However, the output channels of the third-party control platform host computer are often only one or two. If some special performance parameters are to be tested, the corresponding acquisition module needs to be added to achieve this, resulting in difficulty in communication between the additional acquisition equipment and the calibration equipment, and the calibration equipment and the acquisition module cannot respond to various instructions sent by the third-party control platform host computer in a timely manner, resulting in generally low product calibration efficiency and testing efficiency.

[0050] In view of this, please refer to Figure 2-Figure 9 The embodiment of the present application provides a multi-channel calibration and testing system and a calibration and testing method thereof, which can expand the universal interface of the host computer of a third-party control platform and improve the calibration efficiency and testing efficiency of the product.

[0051] It can be understood that in the embodiments of the present application, "or" describes the association relationship of associated objects, indicating that two relationships may exist. For example, A or B can represent: A exists alone, and B exists alone, where A and B can be singular or plural.

[0052] The term "connection" involved in this application describes the connection relationship between two objects and can represent two connection relationships. For example, the connection between A and B can represent two situations: A is directly connected to B, and A is connected to B through C.

[0053] In the embodiments of this application, the terms "exemplary," "in some embodiments," and "in another embodiment" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described in this application as "exemplary" should not be construed as preferred or advantageous over other embodiments or designs. Rather, the use of the word "exemplary" is intended to present concepts in a concrete manner.

[0054] It should be noted that the words "first" and "second" in the embodiments of the present application are only used for the purpose of distinguishing descriptions and should not be understood as indicating or implying relative importance or order. The words "equal to" in the embodiments of the present application can be used in conjunction with "greater than" and apply to the technical solution adopted when "greater than" is used, and can also be used in conjunction with "less than" and apply to the technical solution adopted when "less than" is used. It should be noted that when "equal to" is used in conjunction with "greater than", it should not be used in conjunction with "less than"; when "equal to" is used in conjunction with "less than", it should not be used in conjunction with "greater than".

[0055] Please refer to Figure 2, which is a structural diagram of the multi-channel calibration test system provided in an embodiment of the present application. It can be observed that the multi-channel calibration test system provided in an embodiment of the present application includes a control unit, a calibration test unit, and an expansion unit bidirectionally connected to the control unit and the calibration test unit.

[0056] As an optional implementation, the control unit provided in the present application includes a control host computer, a transit host computer bidirectionally connected to the control host computer, and an industrial computer bidirectionally connected to the control host computer and the transit host computer; wherein, the control host computer and the transit host computer are connected via a virtual serial port bidirectional communication, and the industrial computer provides an operating environment for the control host computer and the transit host computer.

[0057] In an embodiment of the present application, the transit host computer is provided with a host mode and a slave mode. When the transit host computer is in the host mode, the transit host computer is not restricted by the control host computer, directly exchanges information with the calibration test unit, and can independently perform calibration processing or test processing; when the transit host computer is in the slave mode, the transit host computer has no initiative and is controlled by the instructions sent by the control host computer. Only when it receives the corresponding instructions from the control host computer will it perform specific calibration processing or test processing.

[0058] Furthermore, the calibration test unit provided in the present application includes a calibration device bidirectionally connected to the industrial computer, a product connected to the calibration device, and a collection device for collecting product test data.

[0059] Specifically, when the transit host computer is in host mode, the transit host computer is not restricted by the control host computer, but directly interacts with the calibration equipment, product and acquisition equipment of the calibration test unit. At this time, the transit host computer in host mode is used to receive instructions sent by the calibration equipment, and send the instructions to the product through the expansion unit so that the product responds to the instructions.

[0060] When the transit host computer is in slave mode, it is restricted by the control host computer and cannot directly exchange information with the calibration equipment, products and acquisition equipment of the calibration test unit. At this time, the control host computer receives the instructions sent by the calibration equipment and forwards the instructions to the transit host computer through the virtual serial port. The transit host computer then further sends the instructions to the product so that the product responds to the instructions.

[0061] In an optional embodiment, the multi-channel calibration and testing system provided in the present application can perform calibration and testing on the product, so the instructions sent by the calibration device here include calibration instructions or test instructions.

[0062] Furthermore, since the control host computer often has only one or two output channels, and the control host computer alone is responsible for controlling the calibration test and analyzing and processing the generated data, it will result in a large amount of data calculation, making it impossible for the product and the acquisition module to respond to various instructions sent by the control host computer in a timely manner, resulting in generally low product calibration efficiency and testing efficiency.

[0063] Therefore, the present application bidirectionally connects an expansion unit between the control unit and the calibration test unit. The expansion unit specifically includes at least two expansion chips connected between the industrial computer and the product, and between the industrial computer and the acquisition device.

[0064] Since in actual calibration tests, it is necessary to calibrate and test several products at the same time, and trigger several acquisition devices to collect the test data of the products at the same time, the output channel of the control host computer of this application is not sufficient to control several products and several acquisition devices to perform corresponding actions at the same time. Therefore, an expansion chip is set between the industrial computer and the product, and the single interface of the control host computer is expanded to an asynchronous serial port that is compatible with the number of products and the number of acquisition devices through the industrial computer and the expansion chip.

[0065] It can be understood that at this time, the number of asynchronous serial ports of the expansion chip connected to the product should not be less than the number of products, and the number of asynchronous serial ports of the expansion chip connected to the acquisition device should not be less than the number of acquisition devices. Normally, the number of products and acquisition devices is one-to-one corresponding, that is, each product is equipped with a corresponding acquisition device, and the number of acquisition devices should not be less than the number of products.

[0066] By setting an extension unit between the control unit and the calibration and testing unit, the control unit can simultaneously perform corresponding calibration or testing on the product and the acquisition device according to specific instructions.

[0067] As an optional implementation, when the calibration device sends a calibration instruction, the product needs to be calibrated. Here, two situations are explained, namely, the host mode and the slave mode.

[0068] For details, please refer to Figure 8, which is a flowchart of the calibration processing in the multi-channel calibration test method provided in an embodiment of the present application. When the transit host computer is in slave mode, the control host computer receives the initialization calibration instruction sent by the calibration device, and sends the initialization calibration instruction to the transit host computer through the virtual serial port. At this time, the transit host computer enters the calibration state initialization according to the initialization calibration instruction, and then the control host computer receives the calibration instruction with calibration data recorded therein sent by the calibration device. After sending the calibration instruction to the transit host computer, the transit host computer sends the calibration instruction with calibration data recorded therein to the product through the expansion unit, so that the product responds to the calibration instruction, performs corresponding calibration processing inside the product according to the calibration data, and transmits the calibrated data to the control host computer, and then the control host computer sends the calibration data to the transit host computer through the virtual serial port.

[0069] When the intermediate host computer is in host mode, information interaction is directly carried out between the intermediate host computer and the calibration test unit. At this time, the intermediate host computer directly receives the initialization calibration instruction sent by the calibration device, and enters the calibration state initialization according to the initialization calibration instruction. After entering the calibration state initialization, it receives the calibration instruction with calibration data recorded from the calibration device, and sends the calibration instruction with calibration data recorded to the product through the expansion unit, so that the product responds to the calibration instruction, performs corresponding calibration processing inside the product according to the calibration data, and transmits the calibrated data to the intermediate host computer.

[0070] Furthermore, when the intermediate host computer obtains the calibration data sent by the product, it will analyze and process the calibration data, display the calibration status and calibration progress of each product in real time, and compare the calibration data with the preset calibration value to determine whether there are any products with calibration abnormalities among the current products.

[0071] It is understandable that, taking the product as a distance measuring sensor as an example, the calibration value here can be whether the product can detect the calibration baffle at a preset distance, or the accuracy with which the product can detect the calibration baffle in several tests. Therefore, the calibration values ​​corresponding to different products and different calibration data are different. Therefore, this application does not impose any further restrictions on the preset calibration value.

[0072] As an optional implementation, when the calibration device sends a test instruction, the product needs to be tested. Here, it is also divided into two modes: host mode and slave mode for explanation.

[0073] For details, please refer to Figure 9, which is a flow chart of the test processing in the multi-channel calibration test method provided in an embodiment of the present application. When the transit host computer is in slave mode, the control host computer receives the initialization test instruction sent by the calibration device, and sends the initialization test instruction to the transit host computer through the virtual serial port. At this time, the transit host computer enters the test state initialization according to the initialization test instruction, and then the control host computer receives the test instruction with test data recorded therein sent by the calibration device. After sending the test instruction to the transit host computer, the transit host computer sends the test instruction with test data recorded therein to the product through the expansion unit, so that the product responds to the test instruction, performs corresponding test processing inside the product according to the test data, and transmits the tested data to the control host computer, and then the control host computer sends the test data to the transit host computer through the virtual serial port.

[0074] When the calibration device sends a test instruction with test data recorded to the control host computer, it also sends a trigger instruction to the control host computer, which is forwarded to the acquisition device through the transit host computer to trigger the acquisition device to collect the data generated after the product test. The acquisition device transmits the collected test data to the control host computer, and the control host computer then sends the collected test data to the transit host computer through the virtual serial port.

[0075] When the intermediate host computer is in host mode, the intermediate host computer receives the initialization test instruction sent by the calibration device, enters the test state initialization according to the initialization test instruction, and then receives the test instruction sent by the calibration device after entering the test state initialization, and sends the test data recorded in the test instruction to the product through the expansion unit, so that the product responds to the test instruction, performs corresponding test processing inside the product according to the test data, and transmits the tested data to the intermediate host computer.

[0076] After the calibration device sends a test instruction containing test data to the transfer host computer, causing the transfer host computer to enter the test state and initialize according to the initialization test instruction, it will also send a trigger instruction to the transfer host computer, causing the transfer host computer to forward the trigger instruction to the acquisition device to trigger the acquisition device to collect the data generated after the product test, and the acquisition device will transmit the collected test data to the transfer host computer, thus completing the collection of product test data in host mode and slave mode.

[0077] As an optional implementation, when the transit host computer is in slave mode, the control host computer will obtain the calibration data, the test data transmitted by the product, and the test data transmitted by the acquisition device and transmit it to the transit host computer; when the transit host computer is in host mode, the above-mentioned calibration data, the test data transmitted by the product, and the test data transmitted by the acquisition device will be directly obtained by the transit host computer.

[0078] Furthermore, when the intermediate host computer obtains the test data transmitted by the product and the test data transmitted by the acquisition device, it will analyze and compare the two sets of test data received, such as drawing and analyzing the two sets of test data. At the same time, it will also display the test status, test progress of each product and the acquisition status of each acquisition device in real time. This application does not go into too much detail on the specific steps of how to analyze the test status, test progress and acquisition status of each product through test data.

[0079] It should be noted that since the single output interface of the traditional control host computer is expanded into an asynchronous serial port compatible with the number of products and acquisition equipment through at least two expansion chips, it is necessary to ensure that the calibration status and test status of multiple products that are calibrated or tested at the same time are unified, so as to ensure the consistency of product calibration and testing.

[0080] In an embodiment of the present application, the calibration status and calibration progress of several products in response to the same calibration instruction are the same, and the test status and test progress of several products in response to the same test instruction should also be the same.

[0081] Taking the photoelectric distance sensor as an example, it is necessary to ensure that the multiple photoelectric distance sensors being calibrated or tested at the same time are of the same model, the fixed positions of all photoelectric distance sensors are on the same plane, and the position of the calibration baffle set for each photoelectric distance sensor must also be on the same plane. In other words, the distance between each photoelectric distance sensor and the calibration baffle is the same, and the laser intensity emitted by the light source of each photoelectric distance sensor should also be kept consistent, so as to ensure that the calibration status and test status of multiple products being calibrated or tested at the same time are unified.

[0082] Of course, it is also necessary to ensure that the calibration progress and test progress of multiple products that are calibrated or tested at the same time are the same, that is, in the same time period, the distance between each photoelectric ranging sensor and the calibration baffle is the same. For example, calibration or testing at the first preset distance is performed. After all photoelectric ranging sensors are calibrated or tested at the first preset distance, the distance of the calibration baffle is uniformly adjusted so that all photoelectric ranging sensors start calibration or testing at the second preset distance, thereby ensuring that the calibration progress and test progress of multiple products that are calibrated or tested at the same time are the same.

[0083] As an optional implementation, the number of products in the calibration test unit provided in this application should be at least one, ensuring that the number of acquisition devices and products is set in a one-to-one correspondence. In principle, the number of acquisition devices should not be less than the number of products, and can be adjusted accordingly based on the number of asynchronous serial ports expanded by the actual expansion chip. This application does not impose further restrictions on the actual number of acquisition devices and products.

[0084] For example, in a specific embodiment provided in the present application, the expansion chip can be set as an interface chip integrating a 480Mbps high-speed USB2.0 protocol. The expansion chip can realize the conversion of a single chip to an 8-channel asynchronous serial port, and can expand 8 serial ports while occupying one USB interface.

[0085] Furthermore, the expansion chip includes a power supply circuit, a main control circuit, and an RS485 conversion circuit; among them, the power supply circuit is only used to achieve power supply protection, protect the hardware devices connected in the circuit, and ensure the stability of the signal, while providing power for the product or acquisition equipment.

[0086] For details, please refer to Figure 3 、 Figure 4 and Figure 5 ,in Figure 3 This is a schematic diagram of the structure of the power supply circuit of the expansion chip in the multi-channel calibration test system provided in an embodiment of the present application. Figure 4 This is a schematic diagram of the structure of the main control circuit of the expansion chip in the multi-channel calibration test system provided in an embodiment of the present application. Figure 5 A structural diagram of the RS485 conversion circuit of the expansion chip in the multi-channel calibration test system provided in an embodiment of the present application; the above is only a more preferred embodiment for the expansion chip provided in the present application, and other forms of expansion chips that can expand a single USB interface into an asynchronous serial port compatible with the number of products and the number of acquisition devices are also feasible. The present application does not impose further restrictions on the specific setting form of the expansion chip.

[0087] Based on the above-mentioned multi-channel calibration test system, the present application also provides a multi-channel calibration test method, through which several products can be calibrated or tested at the same time. The calibration process can output the calibration progress and calibration status to determine whether the current product is calibrated abnormally; the test process can output the test status, test progress, and acquisition status of each of the acquisition devices, and output the test results by drawing and analyzing the test data.

[0088] For details, please refer to Figure 6 , is a flow chart of a multi-channel calibration test method provided in an embodiment of the present application, the method comprising the following steps:

[0089] S1: Determine whether the current system mode is master mode or slave mode;

[0090] As an optional implementation, please refer to Figure 7, which is a flow chart for determining the system mode in the multi-channel calibration test method provided in an embodiment of the present application. The above-mentioned determination of whether the current system mode is the host mode or the slave mode requires determining the mode of the transit host computer before formally performing calibration or test processing, that is, determining whether the transit host computer is currently in the host mode or the slave mode.

[0091] S2: If it is the host mode, respond to the initialization instruction sent by the calibration device and forward the instruction sent by the calibration device to the product; if it is the slave mode, respond to the initialization instruction forwarded by the control host computer through the virtual serial port and forward the instruction to the product;

[0092] As an optional implementation, the above judgment of whether the current system mode is host mode or slave mode requires judging the mode of the transit host computer before formal calibration or test processing, that is, judging whether the transit host computer is currently in host mode or slave mode.

[0093] Furthermore, when the transfer host computer is judged to be in active mode, it receives the initialization command sent by the calibration device, please continue to refer to Figure 8 and Figure 9 The initialization instruction usually includes an initialization calibration instruction or an initialization test instruction sent by the calibration device. When the transit host computer is in host mode, the transit host computer directly receives the initialization calibration instruction sent by the calibration device, and enters the calibration state initialization according to the initialization calibration instruction, or the transit host computer directly receives the initialization test instruction sent by the calibration device, and enters the test state initialization according to the initialization test instruction.

[0094] When the transfer host computer is judged to be in slave mode, the control host computer receives the initialization calibration instruction sent by the calibration device, and sends the initialization calibration instruction to the transfer host computer through the virtual serial port. At this time, the transfer host computer enters the calibration state initialization according to the initialization calibration instruction; or, the control host computer receives the initialization test instruction sent by the calibration device, and sends the initialization test instruction to the transfer host computer through the virtual serial port. At this time, the transfer host computer enters the test state initialization according to the initialization test instruction.

[0095] After the transit host computer enters the calibration state initialization or test state initialization, the calibration device will send corresponding instructions according to the initialization instruction. For example, after sending the initialization calibration instruction, it will send a calibration instruction containing calibration data, and after sending the test initialization instruction, it will send a test instruction containing test data, and then forward the instruction to the product through the transit host computer; as for whether the calibration instruction or test instruction is sent directly to the transit host computer by the calibration device, or forwarded to the transit host computer through the control host computer, it depends on whether the transit host computer is in host mode or slave mode, and this application will not go into too much detail here.

[0096] S3: Determine whether the instruction is a calibration instruction or a test instruction;

[0097] As an optional implementation method, when forwarding the instruction to the product, the transfer host computer will further determine whether the instruction is a calibration instruction or a test instruction.

[0098] S4: If it is a calibration instruction, receiving calibration data generated after the product is calibrated;

[0099] As an optional implementation, when the instruction is a calibration instruction, since the calibration data is recorded in the calibration instruction, the product will respond to the calibration instruction, perform corresponding calibration processing inside the product according to the calibration data, and transmit the calibrated data directly to the transit host computer, or transmit it to the control host computer, and then the control host computer will send the calibration data to the transit host computer through the virtual serial port.

[0100] If it is a test instruction, the collection instruction sent by the calibration device is forwarded to the collection device to trigger the collection device to collect the test data of the product, receive the test data generated after the product test and the test data sent by the collection device.

[0101] As an optional implementation, after determining that the instruction is a test instruction, the calibration device will further send an acquisition instruction to the control host computer or directly to the transit host computer, and send the acquisition instruction to the acquisition device through the transit host computer to trigger the acquisition device to collect the test data of the product.

[0102] Since the test instruction records the test data, the product will respond to the test instruction, perform corresponding test processing inside the product according to the test data, and transmit the tested data directly to the transfer host computer or first to the control host computer.

[0103] At the same time, the acquisition device will also respond to the acquisition instruction to collect the data generated after the product test, and the acquisition device will transmit the collected test data directly to the transit host computer or first transmit it to the control host computer, and the transit host computer will receive the test data generated after the product test and the test data sent by the acquisition device.

[0104] As an optional implementation manner, after receiving the calibration data or receiving the test data, the method further includes:

[0105] Analyze and process the calibration data, display the calibration status and progress of each product in real time, and determine whether the calibration of the current product is abnormal;

[0106] Alternatively, the test data generated after the product test and the test data sent by the acquisition device are analyzed and compared, the test status, test progress and acquisition status of each product are displayed in real time, and the test data are graphically analyzed to display the final test results.

[0107] In the embodiment of the present application, after the transfer host computer receives the calibration data, it will also analyze and process the calibration data, display the calibration status and calibration progress of each product in real time, and determine whether the current product has calibration abnormalities.

[0108] When the intermediate host computer receives the test data generated after the product test and the test data sent by the acquisition device, it will display the test status, test progress and acquisition status of each product in real time, and perform graphical analysis on the received test data to display the final test results, thereby realizing the needs of simultaneous calibration or testing of multiple products, greatly improving the calibration and testing efficiency of products.

[0109] For other details about the multi-channel calibration test method to implement the above technical solution, please refer to the description of the multi-channel calibration test system provided in the above application embodiment, which will not be repeated here.

[0110] The multi-channel calibration test system and multi-channel calibration test method provided by the present application are configured with at least two expansion chips between the control unit and the calibration test unit. The single interface of the control host computer is expanded into an asynchronous serial port compatible with the number of products and the number of acquisition devices through the industrial computer and the expansion chip, so that the control unit can perform corresponding calibration or test processing on several products at the same time according to instructions, thereby improving the calibration efficiency and testing efficiency of the products.

[0111] It can be understood that the various technical features of the above embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the various technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0112] The above embodiments are merely exemplary embodiments for illustrating the principles of the embodiments of the present application, but the embodiments of the present application are not limited thereto. Those skilled in the art may make various modifications and improvements without departing from the spirit and essence of the embodiments of the present application, and such modifications and improvements are also considered to be within the scope of protection of the embodiments of the present application.

Claims

1. A multi-channel calibration test system, characterized in that: include: A control unit, comprising a control host computer, a transfer host computer bidirectionally connected to the control host computer, and an industrial computer bidirectionally connected to the control host computer and the transfer host computer and used to provide an operating environment for the control host computer and the transfer host computer; A calibration test unit, comprising a calibration device bidirectionally connected to the industrial computer, a product bidirectionally connected to the calibration device, and a collection device for collecting test data of the product; An expansion unit, comprising at least two expansion chips connected between the industrial computer and the product, and connected between the industrial computer and the acquisition device; The expansion chip is used to expand the single interface of the control host computer into an asynchronous serial port that is compatible with the number of the products and the number of the acquisition devices.

2. The multi-channel calibration test system according to claim 1, characterized in that: The transfer host computer includes a host mode and a slave mode; When the transfer host computer is in host mode, the transfer host computer receives the instruction sent by the calibration device, and sends the instruction to the product through the expansion unit; When the transfer host computer is in slave mode, the control host computer forwards the instruction sent by the calibration device to the transfer host computer through the virtual serial port, so that the transfer host computer sends the instruction to the product through the expansion unit; The instructions include calibration instructions or test instructions.

3. The multi-channel calibration test system according to claim 2, characterized in that: When the instruction is a calibration instruction, the product responds to the calibration instruction, performs corresponding calibration processing according to the calibration data contained in the calibration instruction, and transmits the data generated after the calibration to the control host computer.

4. The multi-channel calibration test system according to claim 3, characterized in that: The control host computer is also used to transmit the calibration data to the transfer host computer, so that the transfer host computer analyzes and processes the calibration data, displays the calibration status and calibration progress of each product in real time, and determines whether the calibration of the current product is abnormal.

5. The multi-channel calibration test system according to claim 2, characterized in that: When the instruction is a test instruction, the product responds to the test instruction, performs corresponding test processing according to the test data included in the test instruction, and transmits the data generated after the test to the control host computer; The calibration device is also used to send a trigger instruction to the control host computer, and forward the trigger instruction to the acquisition device through the transfer host computer to trigger the acquisition device to collect the data generated after the product test, and transmit the collected test data to the control host computer.

6. The multi-channel calibration test system according to claim 5, characterized in that: The control host computer is also used to transmit the test data sent by the product and the test data collected by the acquisition device to the transfer host computer, so that the transfer host computer analyzes and compares the two sets of test data received, and displays the test status, test progress of each product and the acquisition status of each acquisition device in real time.

7. The multi-channel calibration test system according to claim 2, characterized in that: The calibration status and calibration progress of the plurality of products in response to the same calibration instruction are the same; Furthermore, the test status and test progress of the plurality of products in response to the same test instruction are the same.

8. The multi-channel calibration test system according to claim 1, characterized in that: The number of the products is configured to be at least one, and the collection devices are arranged in a one-to-one correspondence with the products.

9. A multi-channel calibration test method, applied to the multi-channel calibration test system according to any one of claims 1 to 8, characterized in that: The method comprises the following steps: Determine whether the current system mode is the host mode or the slave mode; If it is in host mode, it responds to the initialization instruction sent by the calibration device and forwards the instruction sent by the calibration device to the product; if it is in slave mode, it responds to the initialization instruction forwarded by the control host computer through the virtual serial port and forwards the instruction to the product; Determining whether the instruction is a calibration instruction or a test instruction; If it is a calibration instruction, receiving calibration data generated after the product is calibrated; If it is a test instruction, the collection instruction sent by the calibration device is forwarded to the collection device to trigger the collection device to collect the test data of the product, receive the test data generated after the product is tested and the test data sent by the collection device.

10. The multi-channel calibration test method according to claim 9, characterized in that: After receiving the calibration data or receiving the test data, the method further includes: Analyze and process the calibration data, display the calibration status and calibration progress of each product in real time, and determine whether the calibration of the current product is abnormal; Or, analyze and compare the test data generated after the product is tested and the test data sent by the acquisition device, display the test status, test progress and acquisition status of each product in real time, and perform graphical analysis on the test data to display the final test results.

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