Reliability allocation method and device for design parameters, electronic equipment and storage medium

Abstract

The invention provides a reliability distribution method and device for design parameters, electronic equipment and a storage medium, and belongs to the technical field of computer simulation, and the method comprises the steps: determining all feasible design schemes of each design component in a to-be-designed system, and determining a fault-related stress change rate of each design scheme of each design component; determining a design parameter sensitivity score of each design component; determining a design score of each design part; and according to the design score of each design component, determining a reliability allocation weight of each design component, so as to execute reliability allocation according to the reliability allocation weight. According to the method, the fault-related stress change rate and the design parameter sensitivity score of the component are calculated, so that the improvement sensitivity of different design components is fully reflected, the influence of component simulation on reliability distribution is objectively ensured, the behavior of a complex system can be effectively simulated, and the reliability of the system is improved. On the premise of low cost, the characteristics of the product are conveniently and quickly provided, and a more reliable basis is provided for engineering design.

Description

Technical Field

[0001] The present invention relates to the field of computer simulation technology, and in particular to a reliability allocation method, device, electronic equipment and storage medium for design parameters. Background Art

[0002] Reliability Allocation refers to the process of reasonably allocating the reliability indicators specified by the system to the various components or subsystems that make up the system during the product design phase. This process is an important part of system reliability design, which involves how to refine the reliability requirements of the entire system to each component to ensure that the overall reliability of the final product meets the design requirements.

[0003] Currently, when it comes to reliability allocation, especially reliability allocation for improvements of existing products, people often only consider the historical data of existing products and the subjective scores of experts on various reliability indicators. They fail to fully consider the improvement sensitivity of components, which leads to deviations and large fluctuations in the reliability allocation results, and cannot effectively guide subsequent design, manufacturing and testing work.

[0004] In view of this, there is an urgent need to provide a new method to improve the reliability allocation of various components in the existing product design process. Summary of the invention

[0005] The present invention provides a reliability allocation method, device, electronic device and storage medium for design parameters, which are used to solve the problem of unreasonable reliability index allocation caused by only considering historical data of existing products and subjective scores of experts on various reliability indicators in the prior art. It is helpful to clarify the reliability goals of various components in the early stage of design, improve the rationality and feasibility of allocation results, and thus correctly guide subsequent design, manufacturing and testing work.

[0006] The present invention provides a reliability allocation method for design parameters, comprising the following steps: Determine all feasible design solutions for each design component in the system to be designed, each of the design solutions being a solution composed of at least one discretized design parameter of each design component; determining a failure-related stress change rate for each of the design solutions for each of the design components; Determine a design parameter sensitivity score of each design component by comprehensively analyzing the failure-related stress change rates corresponding to all design solutions of each design component; Determine a design score for each design component by combining scores of each scoring type for each design component, wherein the scores of each scoring type at least include the design parameter sensitivity score; According to the design score of each of the design components, a reliability allocation weight of each of the design components is determined, so that reliability allocation is performed according to the reliability allocation weight.

[0007] According to a reliability allocation method for design parameters provided by the present invention, the step of determining the failure-related stress change rate of each design solution of each design component comprises: Determine the improved failure-related stress of all design parameters in each design scheme after improvement according to the initial failure-related stress of all design parameters in each design scheme of each design component before improvement and the improveable change rate of all design parameters; The failure-related stress change rate of each design solution of each design component is determined according to the improved failure-related stress and the initial failure-related stress.

[0008] According to a reliability allocation method for design parameters provided by the present invention, before determining the failure-related stress change rate of each design scheme of each design component, the method further includes: Determine all design parameters related to each of the design components according to the failure mode and failure characteristics of each of the design components in the system to be designed; After discretization of the design parameters of each of the design components, finite element reliability simulation is performed using all the discretized design parameters to construct a stress response surface for each of the design components; the stress response surface includes a mapping relationship between different design schemes composed of different discretized design parameters and the failure-related stress values ​​of the design components obtained under each design scheme.

[0009] According to a reliability allocation method for design parameters provided by the present invention, the failure-related stress change rate of each design scheme of each design component is determined according to the improved failure-related stress and the initial failure-related stress, specifically: determining a stress difference between the improved failure-related stress and the initial failure-related stress; The absolute value of the ratio between the stress difference and the initial fault-related stress is taken as the fault-related stress change rate.

[0010] According to a reliability allocation method for design parameters provided by the present invention, the comprehensive failure-related stress change rate corresponding to all design schemes of each design component to determine the design parameter sensitivity score of each design component includes: determining the design parameter sensitivity of each of the design components according to the maximum fault-related stress change rate among the fault-related stress change rates corresponding to all design schemes of each of the design components; The design parameter sensitivity of all design components in the system to be designed is comprehensively evaluated to determine a design parameter sensitivity score of each design component.

[0011] According to a reliability allocation method for design parameters provided by the present invention, the scores of each scoring type of each design component include: At least one of the design parameter sensitivity score, parameter improvement difficulty score, and economic score.

[0012] According to a reliability allocation method for design parameters provided by the present invention, the reliability allocation weight of each design component is determined according to the design score of each design component, including: Determining a scoring coefficient for each of the design components according to the design score of each of the design components and the total design score of the system to be designed; Determining the allocation weight of each of the design components based on the scoring coefficient; The total design score is the sum of the design scores of all the design components in the system to be designed.

[0013] The present invention also provides a reliability allocation device for design parameters, comprising the following modules: A scheme delineation unit, used for determining all feasible design schemes for each design component in the system to be designed, each of the design schemes being a scheme composed of at least one discretized design parameter of each design component; A stress analysis unit, used to determine the failure-related stress change rate of each of the design solutions of each of the design components; A parameter sensitivity analysis unit, used to comprehensively analyze the failure-related stress change rates corresponding to all design schemes of each of the design components to determine a design parameter sensitivity score of each of the design components; A design scoring unit, configured to determine a design score for each design component by integrating scores of each scoring type of each design component, wherein the scores of each scoring type at least include the design parameter sensitivity score; The reliability allocation unit is used to determine the reliability allocation weight of each of the design components according to the design score of each of the design components, so as to perform reliability allocation according to the reliability allocation weight.

[0014] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the reliability allocation method for the design parameters as described above is implemented.

[0015] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the reliability allocation method of the design parameters as described in any one of the above is implemented.

[0016] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the reliability allocation method of the design parameters as described above is implemented.

[0017] The reliability allocation method, device, electronic device and storage medium of design parameters provided by the present invention fully reflect the improvement sensitivity of different design components by calculating the failure-related stress change rate of the component and the design parameter sensitivity score, objectively ensure the impact of component simulation on reliability allocation, can effectively simulate the behavior of complex systems, and provide product characteristics quickly and conveniently at a low cost, providing a more reliable basis for engineering design. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 It is one of the flow charts of the reliability allocation method of the design parameters provided by the present invention.

[0020] Figure 2 It is a schematic diagram of the architecture of the system to be designed provided by the present invention; Figure 3 This is the second flow chart of the reliability allocation method of design parameters provided by the present invention.

[0021] Figure 4 It is a structural schematic diagram of the reliability allocation device of the design parameters provided by the present invention.

[0022] Figure 5 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] It should be noted that in the description of the present invention, the terms "include", "comprise" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "include one..." do not exclude the existence of other identical elements in the process, method, article or device including the elements. The orientation or position relationship indicated by the terms "upper", "lower" and the like is based on the orientation or position relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present invention. Unless otherwise clearly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be a connection between the two elements. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0025] In the design process, the degree of influence of changes in one or more design parameters of a design component in the system to be designed on product performance or system response. Specifically, when a design parameter (such as material strength, size, temperature, etc.) changes slightly, if the product performance or system response (such as output force, efficiency, stability, etc.) changes significantly, then we say that this design parameter has a high sensitivity.

[0026] In the simulation-based design process, by simulating the system response under different design parameters, the sensitivity of each design parameter can be quantitatively evaluated. This helps engineers identify key design parameters in the design stage, so that they can pay more attention and adjust them in subsequent design optimization to improve product reliability and performance.

[0027] Reliability allocation of design parameters refers to the process of reasonably allocating reliability indicators predetermined according to the requirements to the various design components or subsystems that make up the system to be designed during its design phase as a product. This process is an important part of system reliability design, which involves how to refine the reliability requirements of the entire system to be designed into each component to ensure that the overall reliability of the final product meets the design requirements.

[0028] The results of reliability allocation are usually used as the basis for reliability prediction and reliability management, which helps to clarify the reliability targets of each design component in the early stage of design, thereby guiding the subsequent design, manufacturing and testing work. At the same time, reliability allocation sometimes needs to take into account factors such as economy and technical feasibility to ensure the rationality and feasibility of reliability allocation results.

[0029] Taking into account that the existing reliability allocation is largely subject to human subjective interference and has the defect of poor allocation accuracy, the present invention provides a reliability allocation method taking into account the sensitivity of design parameters, calculates the fault-related stress change rate and design parameter sensitivity score of each design component, fully reflects the improved sensitivity of different design components, and objectively ensures the impact of design component simulation on reliability allocation.

[0030] Combine the following Figure 1-Figure 5 The reliability allocation method, device, electronic device and storage medium of the design parameters provided by the present invention are described.

[0031] Figure 1 It is one of the flow charts of the reliability allocation method of the design parameters provided by the present invention, such as Figure 1 As shown, including but not limited to the following steps: Step 101 : determining all feasible design solutions for each design component in the system to be designed, wherein each design solution is a solution composed of at least one discretized design parameter of each design component.

[0032] The system to be designed refers to a product or system that has not yet been designed, or a product or system that needs to be improved. Design components refer to the various components or subsystems that constitute the system to be designed. The design scheme refers to a scheme that forms a complete system through all design parameters after setting the design parameters of each design component. When improving the system, one or more design parameters of one or several design components in the existing system can be adjusted to form a new design scheme.

[0033] In this step, by listing all the design components of the system to be designed and formulating multiple feasible design parameters for each design component, multiple different design schemes can be constructed through permutations and combinations.

[0034] Step 102: determining the failure-related stress change rate of each of the design solutions of each of the design components.

[0035] Among them, the failure-related stress change rate can be simply understood as the degree of influence of the change of design parameters in each design scheme on the failure rate of the designed components.

[0036] In this step, for each design scheme of each component, how the change of design parameters affects the failure rate can be analyzed, and the failure-related stress change rate can be calculated and recorded.

[0037] Step 103 , comprehensively analyzing the failure-related stress change rates corresponding to all design solutions of each design component to determine the design parameter sensitivity score of each design component.

[0038] The design parameter sensitivity score reflects the sensitivity of the design component to changes in the design parameters, that is, the impact of changes in the design parameters on the reliability of the component.

[0039] Step 104: Determine the design score of each design component by synthesizing the scores of each scoring type of each design component, wherein the scores of each scoring type at least include the design parameter sensitivity score.

[0040] There are many types of scoring for design components, such as reliability impact score, economic impact score, feasibility impact score, etc. The overall design score of a design component is the overall score of the component given after considering multiple scoring types (including design parameter sensitivity scores).

[0041] Step 105 : determining the reliability allocation weight of each of the design components according to the design score of each of the design components, so as to perform reliability allocation according to the reliability allocation weight.

[0042] The reliability allocation weight refers to a weight determined according to the design score and used to guide the allocation of reliability indicators among various design components. A reliability weight can be allocated to each component according to the design score to guide reliability allocation.

[0043] The following assumes that the system to be designed is an automobile braking system, and the reliability distribution of its design parameters can be implemented through the following steps.

[0044] Assume that the design components are the brake disc and brake pad of the automobile brake system. The design parameters of the two design components are discretized parameter values ​​related to the material and surface roughness. The corresponding design solutions include: Design A: The brake disc is made of cast iron with a surface roughness of Ra 6.3μm; the brake pad is made of semi-metal with a surface roughness of Ra 12.5μm.

[0045] Design B: The brake disc is made of ceramic with a surface roughness of Ra 1.6μm; the brake pad is made of organic material with a surface roughness of Ra 3.2μm.

[0046] Design C: The brake disc is made of cast iron with a surface roughness of Ra 1.6μm; the brake pad is made of semi-metal with a surface roughness of Ra 12.5μm.

[0047] Design D: The brake disc is made of ceramic with a surface roughness of Ra 6.3μm; the brake pad is made of organic material with a surface roughness of Ra 3.2μm.

[0048] There may be other design solutions according to the arrangement and combination of the materials of the brake disc and the brake pad. Some feasible ones may be selected in advance from all the design solutions for subsequent reliability analysis.

[0049] It should be noted that the fault-related stress proposed in the present invention is a generalized stress, including but not limited to stress, strain, temperature, etc. In this embodiment, it is assumed that the fault-related stress is contact stress and temperature.

[0050] For each material combination of the brake disc and brake pad, analyze the changes in contact stress and temperature during the braking process, and record the contact stress change rate and temperature change rate under different material combinations. The contact stress change rate and temperature change rate at this time are collectively referred to as the fault-related stress change rate.

[0051] Furthermore, the design parameter sensitivity scores of the brake disc and the brake pad are calculated based on the contact stress change rate and the temperature change rate. For example, a brake disc made of ceramic material may correspond to a lower contact stress change rate and temperature change rate, and thus obtain a lower design parameter sensitivity score.

[0052] The design parameter sensitivity score is combined with the scores of other possible scoring types (such as scoring results related to cost, wear resistance, braking effect, etc.) to calculate the design score of the brake disc and brake pad.

[0053] Finally, reliability weights are assigned to the brake disc and brake pad respectively according to their design scores, and these assigned reliability weights are used to perform reliability allocation to ensure that the reliability of the entire brake system meets the design requirements. For example, if the brake disc has a higher design score, then it may receive a larger weight in the reliability allocation to ensure its higher reliability.

[0054] The reliability allocation method of design parameters provided by the present invention fully reflects the improvement sensitivity of different design components by calculating the failure-related stress change rate of the component and the design parameter sensitivity score, objectively ensures the impact of component simulation on reliability allocation, can effectively simulate the behavior of complex systems, and provides product characteristics quickly and conveniently at low cost, providing a more reliable basis for engineering design.

[0055] Based on the content of the above embodiment, as an optional embodiment, determining the failure-related stress change rate of each design scheme of each design component includes: Determine the improved failure-related stress of all design parameters in each design scheme after improvement according to the initial failure-related stress of all design parameters in each design scheme of each design component before improvement and the improveable change rate of all design parameters; The failure-related stress change rate of each design solution of each design component is determined according to the improved failure-related stress and the initial failure-related stress.

[0056] For each design option of each design component, it is necessary to first understand the initial failure-related stresses of all design parameters before improvement. Then, consider the improveable change rate of all design parameters, that is, the range or degree to which these parameters can be adjusted in the actual design.

[0057] Combining the initial fault-related stress and the improveable change rate, the improved fault-related stress of the designed component after the parameter improvement can be predicted or calculated. With the improved fault-related stress (i.e., improved fault-related stress) and the fault-related stress before improvement (i.e., initial fault-related stress), the fault-related stress change rate can be calculated. The fault-related stress change rate reflects the degree of influence of the design parameter improvement on the fault stress, and is an important basis for subsequent reliability allocation.

[0058] As an optional embodiment, the fault-related stress change rate of each design solution of each design component is determined according to the improved fault-related stress and the initial fault-related stress, specifically: determining a stress difference between the improved failure-related stress and the initial failure-related stress; The absolute value of the ratio between the stress difference and the initial fault-related stress is taken as the fault-related stress change rate.

[0059] Specifically, the calculation formula of the fault-related stress change rate can be expressed as: ; in, is the failure-related stress change rate, is the initial failure related stress, To improve failure related stresses.

[0060] On the basis of the above-mentioned embodiments, still taking the brake disc in the automobile brake system as an example, how to calculate the failure-related stress change rate of each design solution is described.

[0061] The designed component is a brake disc, and the design scheme is scheme A, that is, the material is cast iron, and the surface roughness is Ra 6.3μm.

[0062] First, determine the improved failure-related stress after modification: Assume that under scheme A, the initial contact stress of the brake disc is 100 MPa and the initial temperature is 80 °C.

[0063] Considering the interchangeability of materials and the adjustability of surface roughness, assuming that by improving the material (such as using higher strength cast iron) and reducing the surface roughness (such as through finer processing), it can be experimentally detected that the improved contact stress will be reduced to 90MPa and the temperature will be reduced to 75°C.

[0064] Then, the corresponding failure-related stress change rate can be calculated:

[0065] The contact stress change rate and temperature change rate (both are failure-related stress change rates) of the brake disc scheme A are obtained. These change rates will be used for subsequent design parameter sensitivity score calculation and reliability allocation.

[0066] The reliability allocation method of design parameters provided by the present invention and the process of calculating the failure-related stress change rate have the following technical effects for the entire reliability allocation: (1) By calculating the fault-related stress change rate, we can clearly understand the specific impact of different design parameter improvements on the reliability of the design system. This can provide the design team with a clear direction for improvement, so that they can give priority to those design parameters that have a greater impact on the fault stress change rate, thereby more effectively improving the reliability of the system.

[0067] (2) By quantifying the fault-related stress change and obtaining the fault-related stress change rate, the improvement effect of the design parameters can be concretized into numerical values, which is convenient for comparison and evaluation between different design schemes. This helps the design team select the best scheme from multiple feasible schemes and ensure the maximum improvement of system reliability.

[0068] (3) In the reliability allocation process, it is necessary to reasonably allocate reliability indicators according to the reliability requirements and potential of each design component. As an important basis for evaluating the improvement effect of design components, the failure-related stress change rate can support more scientific and reasonable reliability allocation decisions and ensure that the reliability indicators of each design component match its importance in the system.

[0069] (4) By improving the design parameters with large failure-related stress change rates, the failure rate of the system can be significantly reduced, and the stability and durability of the system can be improved. This not only helps to improve user experience and satisfaction, but also reduces the maintenance cost and downtime of the system, thereby improving the economy and market competitiveness of the entire system to be designed.

[0070] Based on the content of the above embodiment, as an optional embodiment, before determining the failure-related stress change rate of each design scheme of each design component, it also includes: Determine all design parameters related to each of the design components according to the failure mode and failure characteristics of each of the design components in the system to be designed; After discretization processing is performed on the design parameters of each of the design components, finite element reliability simulation is performed using all the discretized design parameters to construct a stress response surface of each of the design components.

[0071] The stress response surface includes a mapping relationship between different design schemes composed of different discretized design parameters and the failure-related stress values ​​of the design component obtained under each design scheme.

[0072] Figure 2 is a schematic diagram of the architecture of the system to be designed provided by the present invention, such as Figure 2 As shown, it is assumed that there are a total of k Design components.

[0073] Figure 3 FIG. 2 is a flow chart of the reliability allocation method of the design parameters provided by the present invention. Figure 3 As shown, firstly, the corresponding design parameters are selected in combination with the failure mode and failure characteristics of each design component, and then the design parameters are discretized according to the value range of the design parameters.

[0074] Among them, for example, the failure mode is brake wear, and its corresponding design parameters may be brake material, surface roughness, etc., and the corresponding failure-related stress may be contact stress or temperature. For another example, the failure mode is bearing fatigue damage, and its corresponding design parameters may be bearing material, size, etc., and its corresponding failure-related stress is bearing stress, etc.

[0075] Parameter discretization is the process of converting continuous variables or attributes into discrete ones. This process helps to simplify complex problems and improve the efficiency of data analysis and modeling. In reliability analysis, the discretization of design parameters can make simulation analysis more efficient while retaining key design information. Taking the brake disc of an automobile braking system as an example, its design parameters may include material type (such as cast iron, ceramic, etc.) and surface roughness (such as Ra 6.3μm, Ra 1.6μm, etc.). These parameters are continuous or have multiple possible values ​​in their original state. Through discretization, the material types can be simplified into several typical categories and the surface roughness can be divided into several intervals. For example, the surface roughness is divided into three intervals: "low roughness" (Ra<3.2μm), "medium roughness" (3.2μm≤Ra ≤12.5μm) and "high roughness" (Ra>12.5μm).

[0076] Alternatively, the parameter discretization process may also be a process of sampling the design parameter variable within a given parameter value range, for example, sampling to obtain multiple point values ​​such as Ra=6.3μm, Ra=1.6μm, etc.

[0077] Finite element reliability simulation refers to a technical means of evaluating the reliability of the design system using the finite element analysis method. By simulating the working state of the system to be designed under different design parameters, the failure probability and performance of the system can be predicted. For example, in the design of the brake disc, the discretized design parameters are input into the finite element simulation software (such as ANSYS, Abaqus, etc.). Set the corresponding boundary conditions and loading conditions to simulate the stress distribution and temperature changes of the brake disc during the braking process. Through multiple simulation analyses, the failure-related stress values ​​under different design parameter combinations are collected.

[0078] After using finite element simulation to obtain the fault-related stress values ​​under different design parameter combinations, the stress response surface of the brake disc is constructed using response surface methods (such as quadratic polynomial regression, Kriging interpolation, etc.). With design parameters (such as material type, surface roughness) as independent variables and fault-related stress values ​​(such as contact stress, temperature) as dependent variables, an implicit relationship model is established.

[0079] After constructing the stress response surface of each design component, when the design parameters of the design component are determined, the failure-related stress value of the design component can be directly queried. j The stress response surface related to the design parameters of each component and the failure-related stress can be expressed as: ; in, For components j of m design parameters, and they are independent of each other; is the stress response surface of component j; For components j In the design parameters Failure-related stresses at the time of determination.

[0080] Design components j Take the following as an example, first select the design parameters that need to be changed for the design component, then the design components composed of different design parameters j The number of combinations is: ; in, m Design components j The number of design parameters that need to be changed, Design components j The number of feasible design options (assuming that each variation is a feasible design option).

[0081] Then, the improveable change rate of each design solution is determined, so as to calculate the improved failure-related stress of the design component after the design parameters are improved according to the improveable change rate.

[0082] Finally, the failure-related stress change rate can be calculated based on the improved failure-related stress and the initial failure-related stress of each design solution. , which has been fully introduced in the previous embodiments, will not be described in detail in this embodiment.

[0083] As an optional embodiment, the fault-related stress transformation rates under different design schemes can be recorded to form Table 1 as shown below, so that the corresponding fault-related stress transformation rates can be directly matched from the table according to the combination of design parameters under different design schemes.

[0084] Table 1 Statistics of fault-related stress transformation rates

[0085] The reliability allocation method of design parameters provided by the present invention, under the premise of conducting finite element simulation, proposes a reliability allocation method that considers the sensitivity of design parameters based on simulation, comprehensive improvement difficulty and other scores. This method first establishes the fault-related stress response surface of each design component to be allocated based on the simulation results, obtains the stress change of each design component under different design parameters, and then obtains the sensitivity score of the design parameters based on simulation of each component by comparing the stress change between each design component. After fully discussing the factors affecting the reliability allocation of the design components, the design score of each design component is calculated, thereby realizing the reliability allocation method that considers the sensitivity of the design parameters based on simulation.

[0086] Based on the content of the above embodiment, as an optional embodiment, the comprehensive fault-related stress change rate corresponding to all design schemes of each design component to determine the design parameter sensitivity score of each design component includes: determining the design parameter sensitivity of each of the design components according to the maximum fault-related stress change rate among the fault-related stress change rates corresponding to all design schemes of each of the design components; The design parameter sensitivity of all design components in the system to be designed is comprehensively evaluated to determine a design parameter sensitivity score of each design component.

[0087] The following steps can be used to calculate the sensitivity scores of the design parameters of each design component in the system to be designed based on simulation: First, take the maximum value of the failure-related stress change rate in each component is the design parameter sensitivity of each component, and its expression is: ; in, Design components j sensitivity of the design parameters; Design components j The failure-related stress change rate.

[0088] Then, by k The simulation of the designed components k Design parameter sensitivity of each design component In this way, the design parameter sensitivity score of each design component can be calculated according to the following formula: ; in, for exist The positions are sorted in ascending order. For rounding operation, Design components j The above formula is obtained by converting the design parameter sensitivity into a design parameter sensitivity score from 1 to 10 by ranking the design parameter sensitivity.

[0089] The next step is to score the design components based on their design parameter sensitivity, including: Determine the scoring type involved in each design component, which may include at least one of the following: design parameter sensitivity score, parameter improvement difficulty score, and economic score. In addition, other types of scores such as energy efficiency score, directional stability score, wear resistance score, thermal management score, environmental adaptability score, lightweight score, safety score, etc. may be comprehensively considered.

[0090] Then, the design score of the design component can be comprehensively determined according to the score of each scoring type of each design component.

[0091] Here is a calculation method for calculating the design score: ; in, For the j Design score of each design component; is the score of the jth design component under the Z scoring type.

[0092] The design score of each design component in the system to be designed can be recorded in a component score table as shown in Table 2 to facilitate subsequent query.

[0093] Table 2 Rating table for each component

[0094] Based on the content of the above embodiment, as an optional embodiment, the reliability allocation weight of each design component is determined according to the design score of each design component, including but not limited to: Determining a scoring coefficient for each of the design components according to the design score of each of the design components and the total design score of the system to be designed; Determining the allocation weight of each of the design components based on the scoring coefficient; The total design score is the sum of the design scores of all the design components in the system to be designed.

[0095] Specifically, according to the design score of each design component and the total design score of the system to be designed, the expression for determining the score coefficient of each design component may be: ; in, For the j Design score of each design component; For the j The scoring coefficient of each design component; z is an intermediate variable.

[0096] The expression for determining the assigned weight of each of the design components based on the scoring coefficient may be: ; in, is the total allocation weight of the system to be designed, For the j Assign weights to each design component.

[0097] After calculating the assigned weight for each design component, reliability assignment can be performed.

[0098] Figure 4 Schematic diagram of the reliability distribution device of the design parameters provided by the present invention. Figure 4 As shown, it mainly includes but is not limited to the following devices: The scheme delineation unit 41 is mainly used to determine all feasible design schemes for each design component in the system to be designed, each of which is a scheme composed of at least one discretized design parameter of each design component; A stress analysis unit 42, for determining a failure-related stress change rate of each of the design solutions of each of the design components; A parameter sensitivity analysis unit 43, used to comprehensively analyze the failure-related stress change rates corresponding to all design schemes of each design component to determine a design parameter sensitivity score of each design component; A design scoring unit 44, configured to determine a design score for each design component by integrating scores of each scoring type of each design component, wherein the scores of each scoring type at least include the design parameter sensitivity score; The reliability allocation unit 45 is used to determine the reliability allocation weight of each of the design components according to the design score of each of the design components, so as to perform reliability allocation according to the reliability allocation weight.

[0099] It should be noted that the reliability allocation device for design parameters provided by the present invention can execute the reliability allocation method for design parameters described in any of the above embodiments during specific operation, which will not be elaborated in this embodiment.

[0100] The reliability allocation device for design parameters provided by the present invention fully reflects the improvement sensitivity of different design components by calculating the failure-related stress change rate of the component and the design parameter sensitivity score, objectively ensures the impact of component simulation on reliability allocation, can effectively simulate the behavior of complex systems, and provides product characteristics quickly and conveniently at a low cost, providing a more reliable basis for engineering design.

[0101] Figure 5 is a schematic diagram of the structure of the electronic device provided by the present invention, such as Figure 5As shown, the electronic device may include: a processor 510, a communication interface 520, a memory 530 and a communication bus 540, wherein the processor 510, the communication interface 520 and the memory 530 communicate with each other through the communication bus 540. The processor 510 may call the logic instructions in the memory 530 to execute the reliability allocation method of the design parameters, the method comprising: determining all feasible design schemes of each design component in the system to be designed, each of the design schemes being a scheme composed of at least one discretized design parameter of each of the design components; determining the fault-related stress change rate of each of the design schemes of each of the design components; determining the design parameter sensitivity score of each of the design components by integrating the fault-related stress change rates corresponding to all the design schemes of each of the design components; determining the design score of each of the design components by integrating the scores of each score type of each of the design components, wherein the scores of each score type at least include the design parameter sensitivity score; determining the reliability allocation weight of each of the design components according to the design score of each of the design components, so as to perform reliability allocation according to the reliability allocation weight.

[0102] In addition, the logic instructions in the above-mentioned memory 530 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0103] On the other hand, the present invention also provides a computer program product, which includes a computer program stored on a non-transitory computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute the reliability allocation method of the design parameters provided in the above-mentioned embodiments, and the method includes: determining all feasible design schemes for each design component in the system to be designed, each design scheme is a scheme composed of at least one discretized design parameter of each design component; determining the fault-related stress change rate of each design scheme of each design component; comprehensively determining the fault-related stress change rate corresponding to all design schemes of each design component to determine the design parameter sensitivity score of each design component; comprehensively determining the score of each scoring type of each design component to determine the design score of each design component, and the score of each scoring type at least includes the design parameter sensitivity score; according to the design score of each design component, determining the reliability allocation weight of each design component, so as to perform reliability allocation according to the reliability allocation weight.

[0104] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the reliability allocation method of the design parameters provided in the above-mentioned embodiments, the method comprising: determining all feasible design schemes for each design component in the system to be designed, each design scheme being a scheme composed of at least one discrete design parameter of each design component; determining the fault-related stress change rate of each design scheme of each design component; determining the design parameter sensitivity score of each design component by integrating the fault-related stress change rates corresponding to all design schemes of each design component; determining the design score of each design component by integrating the scores of each scoring type of each design component, the scores of each scoring type at least including the design parameter sensitivity score; determining the reliability allocation weight of each design component according to the design score of each design component, so as to perform reliability allocation according to the reliability allocation weight.

[0105] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0106] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0107] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A reliability allocation method for design parameters, characterized in that: include: Determine all feasible design solutions for each design component in the system to be designed, each of the design solutions being a solution composed of at least one discretized design parameter of each design component; determining a failure-related stress change rate for each of the design solutions for each of the design components; Determine a design parameter sensitivity score of each design component by comprehensively analyzing the failure-related stress change rates corresponding to all design solutions of each design component; Determine a design score for each design component by combining scores of each scoring type for each design component, wherein the scores of each scoring type at least include the design parameter sensitivity score; According to the design score of each of the design components, a reliability allocation weight of each of the design components is determined, so that reliability allocation is performed according to the reliability allocation weight.

2. The reliability allocation method of design parameters according to claim 1, characterized in that: Determining the failure-related stress change rate of each of the design solutions of each of the design components includes: Determine the improved failure-related stress of all design parameters in each design scheme after improvement according to the initial failure-related stress of all design parameters in each design scheme of each design component before improvement and the improveable change rate of all design parameters; The failure-related stress change rate of each design solution of each design component is determined according to the improved failure-related stress and the initial failure-related stress.

3. The reliability allocation method of design parameters according to any one of claims 1 to 2, characterized in that: Before determining the failure-related stress change rate of each of the design solutions of each of the design components, the method further includes: Determine all design parameters related to each of the design components according to the failure mode and failure characteristics of each of the design components in the system to be designed; After discretization of the design parameters of each of the design components, finite element reliability simulation is performed using all the discretized design parameters to construct a stress response surface for each of the design components; the stress response surface includes a mapping relationship between different design schemes composed of different discretized design parameters and the failure-related stress values ​​of the design components obtained under each design scheme.

4. The reliability allocation method of design parameters according to claim 2, characterized in that: The determining of the failure-related stress change rate of each design solution of each design component according to the improved failure-related stress and the initial failure-related stress is specifically: determining a stress difference between the improved failure-related stress and the initial failure-related stress; The absolute value of the ratio between the stress difference and the initial fault-related stress is taken as the fault-related stress change rate.

5. The reliability allocation method of design parameters according to claim 1, characterized in that: The step of comprehensively analyzing the failure-related stress change rates corresponding to all design schemes of the design components to determine the design parameter sensitivity scores of the design components includes: determining the design parameter sensitivity of each of the design components according to the maximum fault-related stress change rate among the fault-related stress change rates corresponding to all design schemes of each of the design components; The design parameter sensitivity of all design components in the system to be designed is comprehensively evaluated to determine a design parameter sensitivity score of each design component.

6. The reliability allocation method of design parameters according to claim 1, characterized in that: The scores of each scoring type for each of the design components include: At least one of the design parameter sensitivity score, parameter improvement difficulty score, and economic score.

7. The reliability allocation method of design parameters according to claim 1, characterized in that: Determining the reliability allocation weight of each of the design components according to the design score of each of the design components includes: Determining a scoring coefficient for each of the design components according to the design score of each of the design components and the total design score of the system to be designed; Determining the allocation weight of each of the design components based on the scoring coefficient; The total design score is the sum of the design scores of all the design components in the system to be designed.

8. A reliability allocation device for design parameters, characterized in that: include: A scheme delineation unit, used for determining all feasible design schemes for each design component in the system to be designed, each of the design schemes being a scheme composed of at least one discretized design parameter of each design component; A stress analysis unit, used to determine the failure-related stress change rate of each of the design solutions of each of the design components; A parameter sensitivity analysis unit, used to comprehensively analyze the failure-related stress change rates corresponding to all design schemes of each of the design components to determine a design parameter sensitivity score of each of the design components; A design scoring unit, configured to determine a design score for each design component by integrating scores of each scoring type of each design component, wherein the scores of each scoring type at least include the design parameter sensitivity score; The reliability allocation unit is used to determine the reliability allocation weight of each of the design components according to the design score of each of the design components, so as to perform reliability allocation according to the reliability allocation weight.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the reliability allocation method for design parameters according to any one of claims 1 to 7 is implemented.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the reliability allocation method of the design parameters according to any one of claims 1 to 7 is implemented.

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