Parameter configuration method and device for overcurrent protection chip

Abstract

The present application discloses a parameter configuration method and device for an overcurrent protection chip, and relates to the field of power electronics technology. The method includes: calculating the maximum initial sampling voltage and the minimum initial sampling voltage at both ends of the sampling resistor under the target current based on the calibrated resistance value and the resistance calibration error of the sampling resistor; calculating the maximum sampling current and the minimum sampling current based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameters of the controller, and the corresponding analog-to-digital conversion parameter calibration error; calculating the first current sampling accuracy and the second current sampling accuracy according to the maximum sampling current, the minimum sampling current and the target current; configuring at least one of the preset overcurrent protection curve of the overcurrent protection chip and the selection parameters of the target wiring harness according to at least one of the first current sampling accuracy and the second current sampling accuracy. According to the embodiment of the present application, the wiring harness cost can be reduced as much as possible while fully ensuring the reliability of the overcurrent protection.

Description

Technical Field

[0001] The present application belongs to the field of power electronics technology, and in particular, relates to a parameter configuration method and device for an overcurrent protection chip. Background Art

[0002] With the development of automotive electronic technology and the upgrade of electronic and electrical architecture, the types of vehicle functions are constantly improving. The traditional physical fuse combined with relay as a wiring harness protection solution has disadvantages such as high maintenance cost and poor flexibility. It can no longer fully adapt to the current highly integrated regional vehicle architecture. Therefore, there are currently a variety of overcurrent protection chips on the market, such as EFUSE (electronic fuse) chip driving MOSFET (Metal-Oxide-SemiconductorField-Effect Transistor) as a solution for distributing power to downstream loads. This solution uses electronic fuses instead of traditional fuses to fuse and protect wiring harnesses, which can better match the needs of various scenarios such as the upgrade of the vehicle's power distribution architecture, and is of great significance for realizing current protection in different scenarios.

[0003] However, in the field of power distribution, electronic fuses EFUSE are usually used to protect the power supply using overcurrent protection curves (such as I 2 T protection curve) to simulate fusing after the current over-current for a period of time to protect the wiring harness, thereby ensuring the safety of the entire system. However, due to the current recovery in the circuit being inaccurate, the effect of using the over-current protection curve for current protection is poor, which often easily leads to the wiring harness burning or false triggering and shutting down. In order to ensure the safety of the wiring harness, it is possible to consider increasing the wiring harness margin when selecting the wiring harness. However, too large a wiring harness margin will increase the wiring harness cost.

[0004] Based on this, the industry is still in urgent need of a new parameter configuration scheme for overcurrent protection chips (such as overcurrent protection curves and related wiring harness selection, etc.) to achieve the goal of reducing wiring harness costs as much as possible while fully ensuring the reliability of overcurrent protection. Summary of the invention

[0005] The embodiments of the present application provide a parameter configuration method and device for an overcurrent protection chip, which can effectively achieve the purpose of reducing the wiring harness cost as much as possible while fully ensuring the reliability of overcurrent protection.

[0006] In a first aspect, an embodiment of the present application provides a parameter configuration method of an overcurrent protection chip, wherein the overcurrent protection chip includes at least a sampling resistor and a controller; the controller is used to obtain an initial sampling voltage across the sampling resistor, and calculate a sampling current flowing through the sampling resistor based on the initial sampling voltage, so as to perform overcurrent protection on a target wiring harness according to the sampling current and a preset overcurrent protection curve; the parameter configuration method of the overcurrent protection chip includes:

[0007] Based on the calibrated resistance value of the sampling resistor and the resistance calibration error, a maximum initial sampling voltage and a minimum initial sampling voltage across the sampling resistor at the target current are calculated;

[0008] Based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameter of the controller and the corresponding analog-to-digital conversion parameter calibration error, the maximum sampling current and the minimum sampling current of the sampling resistor are calculated;

[0009] Calculate a first current sampling accuracy and a second current sampling accuracy according to the maximum sampling current, the minimum sampling current and the target current, the first current sampling accuracy corresponds to the maximum sampling current, and the second current sampling accuracy corresponds to the minimum sampling current;

[0010] At least one of a preset overcurrent protection curve of the overcurrent protection chip and a selection parameter of the target wiring harness is configured according to at least one of the first current sampling accuracy and the second current sampling accuracy.

[0011] In some possible implementations, at least one of a preset overcurrent protection curve of an overcurrent protection chip and a selection parameter of a target wiring harness is configured according to at least one of a first current sampling accuracy and a second current sampling accuracy, including:

[0012] Based on the first current sampling accuracy and the actual load current curve, a preset overcurrent protection curve of the overcurrent protection chip is configured;

[0013] Based on the configured preset overcurrent protection curve and the second current sampling accuracy, the selection parameters of the target wiring harness are configured.

[0014] In some possible implementations, configuring a preset overcurrent protection curve of an overcurrent protection chip based on the first current sampling accuracy and the actual load current curve includes:

[0015] Based on the first current sampling accuracy and the actual load current curve, a first reference curve is determined, where the first reference curve is (1+A%) times the actual load current curve, and A% is the first current sampling accuracy;

[0016] According to the first reference curve, a preset overcurrent protection curve of the overcurrent protection chip is configured.

[0017] In some possible implementations, based on the configured preset overcurrent protection curve and the second current sampling accuracy, the selection parameters of the target wiring harness are configured, including:

[0018] Determine a second reference curve according to the configured preset overcurrent protection curve and the second current sampling accuracy, where the second reference curve is (1+B%) times the preset overcurrent protection curve, where B% is the absolute value of the second current sampling accuracy;

[0019] According to N calibrated overcurrent protection curves corresponding one to one to the second reference curve and N candidate wiring harnesses, a target overcurrent protection curve is determined from the N calibrated overcurrent protection curves, and the selection parameters of the candidate wiring harness corresponding to the target overcurrent protection curve are configured as the selection parameters of the target wiring harness, where N is a positive integer.

[0020] In some possible implementations, the overcurrent protection chip further includes an operational amplifier; the operational amplifier is used to amplify the initial sampling voltage to obtain an output voltage after amplification by the operational amplifier, and send the output voltage to the controller; the controller is used to obtain an actual sampling voltage based on the output voltage conversion, and calculate the sampling current according to the calibrated resistance value and the actual sampling voltage;

[0021] Based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameters of the controller, and the corresponding analog-to-digital conversion parameter calibration error, the maximum sampling current and the minimum sampling current of the sampling resistor are calculated, including:

[0022] Based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated operational amplifier parameters of the operational amplifier, and the corresponding operational amplifier parameter calibration error, the maximum output voltage and the minimum output voltage after the operational amplifier amplification are calculated;

[0023] Based on the maximum output voltage, the minimum output voltage, the calibrated analog-to-digital conversion parameter, and the calibration error of the analog-to-digital conversion parameter, the maximum actual sampling voltage and the minimum actual sampling voltage are calculated;

[0024] Based on the maximum actual sampling voltage, the minimum actual sampling voltage and the calibration resistance value, the maximum sampling current and the minimum sampling current are calculated.

[0025] In some possible implementations, the maximum output voltage and the minimum output voltage after amplification by the operational amplifier are calculated based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated operational amplifier parameters of the operational amplifier, and the corresponding operational amplifier parameter calibration error, including:

[0026] Based on the first calculation formula, a maximum output voltage is calculated; and based on the second calculation formula, a minimum output voltage is calculated;

[0027] The first calculation formula includes:

[0028] Vop_max=V_ref_max+(V_offset_max+VR_max)*GAIN_max;

[0029] Wherein, Vop_max is the maximum output voltage, V_ref_max is the maximum value of the op amp reference voltage under the corresponding op amp parameter calibration error, V_offset_max is the maximum value of the op amp compensation voltage under the corresponding op amp parameter calibration error, VR_max is the maximum initial sampling voltage, GAIN_max is the maximum value of the op amp gain under the corresponding op amp parameter calibration error;

[0030] The second calculation formula includes:

[0031] Vop_min=V_ref_min+(V_offset_min+VR_min)*GAIN_min;

[0032] Among them, Vop_min is the minimum output voltage, V_ref_min is the minimum value of the op amp reference voltage under the corresponding op amp parameter calibration error, V_offset_min is the minimum value of the op amp compensation voltage under the corresponding op amp parameter calibration error, VR_min is the minimum initial sampling voltage, and GAIN_min is the minimum value of the op amp gain under the corresponding op amp parameter calibration error.

[0033] In some possible implementations, the maximum actual sampled voltage and the minimum actual sampled voltage are calculated based on the maximum output voltage, the minimum output voltage, the calibrated analog-to-digital conversion parameter, and the analog-to-digital conversion parameter calibration error, including:

[0034] Based on the third calculation formula, a maximum actual sampling voltage is calculated; and based on the fourth calculation formula, a minimum actual sampling voltage is calculated;

[0035] The third calculation formula includes:

[0036] Vmcu_max=Vop_max+V_AD_err_max;

[0037] Among them, Vmcu_max is the maximum actual sampling voltage, Vop_max is the maximum output voltage, and V_AD_err_max is the maximum accuracy conversion voltage value of the controller's analog-to-digital conversion ADC;

[0038] The fourth calculation formula includes:

[0039] Vmcu_min=Vop_min+V_AD_err_min;

[0040] Among them, Vmcu_min is the minimum actual sampling voltage, Vop_min is the minimum output voltage, and V_AD_err_min is the minimum accuracy conversion voltage value of the controller's ADC.

[0041] In some possible implementations, the maximum sampling current and the minimum sampling current are calculated based on the maximum actual sampling voltage, the minimum actual sampling voltage, and the calibration resistance value, including:

[0042] Based on the fifth calculation formula, a maximum sampling current is calculated; and based on the sixth calculation formula, a minimum sampling current is calculated;

[0043] The fifth calculation formula includes:

[0044] I_max=(Vmcu_max-V_ref_type) / (R_type*GAIN_type);

[0045] Among them, I_max is the maximum sampling current, Vmcu_max is the maximum actual sampling voltage, V_ref_type is the standard value of the op amp reference voltage, R_type is the calibration resistance value, and GAIN_type is the standard value of the op amp gain;

[0046] The sixth calculation formula includes:

[0047] I_min=(Vmcu_min-V_ref_type) / (R_type*GAIN_type);

[0048] Among them, I_min is the minimum sampling current, Vmcu_min is the minimum actual sampling voltage, V_ref_type is the standard value of the op amp reference voltage, R_type is the calibration resistance value, and GAIN_type is the standard value of the op amp gain.

[0049] In some possible implementations, calculating the maximum initial sampling voltage and the minimum initial sampling voltage across the sampling resistor at the target current based on the calibrated resistance value and the resistance calibration error of the sampling resistor includes:

[0050] The maximum initial sampling voltage is calculated according to the product of the target current and the maximum resistance value of the sampling resistor under the resistor calibration error;

[0051] The minimum initial sampling voltage is calculated based on the product of the target current and the minimum resistance value of the sampling resistor under the resistor calibration error.

[0052] Based on the same inventive concept, in a second aspect, an embodiment of the present application provides a parameter configuration device for an overcurrent protection chip, wherein the overcurrent protection chip at least includes a sampling resistor and a controller; the controller is used to obtain an initial sampling voltage across the sampling resistor, and calculate a sampling current flowing through the sampling resistor based on the initial sampling voltage, so as to perform overcurrent protection on a target wiring harness according to the sampling current and a preset overcurrent protection curve; the parameter configuration device for the overcurrent protection chip includes:

[0053] A first calculation module, used for calculating a maximum initial sampling voltage and a minimum initial sampling voltage at both ends of the sampling resistor under a target current based on a calibrated resistance value and a resistance calibration error of the sampling resistor;

[0054] A second calculation module is used to calculate the maximum sampling current and the minimum sampling current of the sampling resistor based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameter of the controller and the corresponding analog-to-digital conversion parameter calibration error;

[0055] A third calculation module, used to calculate a first current sampling accuracy and a second current sampling accuracy according to the maximum sampling current, the minimum sampling current and the target current, the first current sampling accuracy corresponding to the maximum sampling current, and the second current sampling accuracy corresponding to the minimum sampling current;

[0056] The first configuration module is used to configure at least one of a preset overcurrent protection curve of the overcurrent protection chip and a selection parameter of a target wiring harness according to at least one of a first current sampling accuracy and a second current sampling accuracy.

[0057] In a third aspect, an embodiment of the present application provides a parameter configuration device for an overcurrent protection chip, the parameter configuration device for the overcurrent protection chip comprising:

[0058] a processor and a memory storing computer program instructions;

[0059] When the processor executes the computer program instructions, it implements the parameter configuration method of the overcurrent protection chip provided in any one of the above-mentioned embodiments of the present application.

[0060] In a fourth aspect, an embodiment of the present application provides a computer storage medium, on which computer readable storage medium is stored computer program instructions, and when the computer program instructions are executed by a processor, a parameter configuration method for an overcurrent protection chip as provided in any one of the above-mentioned embodiments of the present application is implemented.

[0061] In a fifth aspect, an embodiment of the present application provides a computer program product. When the instructions in the computer program product are executed by a processor of an electronic device, the electronic device executes a parameter configuration method for an overcurrent protection chip as provided in any one of the above-mentioned embodiments of the present application.

[0062] It can be seen from the above description that a parameter configuration method and device of an overcurrent protection chip in an embodiment of the present application calculates the maximum initial sampling voltage and the minimum initial sampling voltage of the sampling resistor under the resistance calibration error when the target current flows through, and combines the calibration analog-to-digital conversion parameters of the controller involved in the actual current acquisition process and the corresponding analog-to-digital conversion parameter calibration error to calculate the maximum sampling current and the minimum sampling current that can be achieved under various errors, so that the maximum current sampling accuracy and the minimum current sampling accuracy that may be generated in the current acquisition process can be calculated based on the maximum sampling current, the minimum sampling current and the target current. In this way, when performing the preset overcurrent protection curve of the actual overcurrent protection chip and the target wiring harness selection in the system, the embodiment of the present application can use the maximum current sampling accuracy and the minimum current sampling accuracy to realize the reasonable configuration of the above-mentioned preset overcurrent protection curve and the target wiring harness selection, which can effectively achieve the purpose of reducing the wiring harness cost as much as possible while fully ensuring the reliability of overcurrent protection. BRIEF DESCRIPTION OF THE DRAWINGS

[0063] In order to more clearly illustrate the technical solution of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0064] Figure 1 It is a flow chart of a parameter configuration method of an overcurrent protection chip provided in an embodiment of the present application;

[0065] Figure 2 This is a protection working model of an overcurrent protection chip provided in an embodiment of the present application;

[0066] Figure 3 It is a schematic diagram of the configuration process of the overcurrent protection curve of the overcurrent protection chip provided in one embodiment of the present application;

[0067] Figure 4 It is a scenario flow diagram of a parameter configuration method of an overcurrent protection chip provided in an embodiment of the present application;

[0068] Figure 5 It is a scenario flow diagram of a parameter configuration method of an overcurrent protection chip provided in an embodiment of the present application;

[0069] Figure 6 It is a structural schematic diagram of a parameter configuration device of an overcurrent protection chip provided in an embodiment of the present application;

[0070] Figure 7 It is a structural diagram of a parameter configuration device for an overcurrent protection chip provided in one embodiment of the present application. DETAILED DESCRIPTION

[0071] The features and exemplary embodiments of various aspects of the present application will be described in detail below. In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only intended to explain the present application, rather than to limit the present application. For those skilled in the art, the present application can be implemented without the need for some of these specific details. The following description of the embodiments is only to provide a better understanding of the present application by illustrating the examples of the present application.

[0072] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the statement "include..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0073] As described in the background technology section, it is common to use overcurrent protection chips such as EFUSE to replace traditional fuses to protect wiring harnesses. However, EFUSE is currently widely used in the field of power distribution. It may burn the wiring harness or trigger shutdown by mistake due to inaccurate current recovery; too much margin wastes money on the wiring harness and does not play the role of EFUSE. Therefore, how to fully ensure the reliability of overcurrent protection while reducing the cost of the wiring harness as much as possible is of great significance for realizing current protection of overcurrent protection chips such as EFUSE in different scenarios.

[0074] In view of the above, in order to solve the problems of the prior art, the embodiments of the present application provide a parameter configuration method and device for an overcurrent protection chip. It should be noted that the embodiments provided in the present application are not intended to limit the scope of the present application.

[0075] The following first introduces the parameter configuration method of the overcurrent protection chip provided in the embodiment of the present application. The overcurrent protection chip in the present application can be integrated with I 2T protection curve. Or considering the wide variety of EFUSE, in addition to the pre-drive EFUSE chip, the overcurrent protection chip can also be an HSD chip with a switch integrated inside to be suitable for various current scenarios, and this application does not impose strict restrictions on this. The principle of the overcurrent protection chip is: through a system that detects current in real time and combines a reasonable fusing algorithm (overcurrent protection curve), the electronic fuse, like the physical fuse, can control the switch to disconnect after a period of time in the case of system overcurrent to simulate fusing, thereby protecting the wiring harness and related load safety in the system.

[0076] Figure 1 A flow chart of a parameter configuration method of an overcurrent protection chip provided in an embodiment of the present application is shown. The overcurrent protection chip includes at least a sampling resistor and a controller. The controller may include but is not limited to an analog chip, a DSP (Digital Signal Process) chip, an MCU (Microcontroller Unit) chip, etc.

[0077] The controller can be used to obtain the initial sampling voltage across the sampling resistor, calculate the sampling current flowing through the sampling resistor based on the initial sampling voltage, and perform overcurrent protection on the target wiring harness according to the sampling current and the preset overcurrent protection curve. The preset overcurrent protection curve can be, for example, 2 T protection curve.

[0078] like Figure 1 As shown, the parameter configuration method of the overcurrent protection chip includes the following steps:

[0079] S110, calculating a maximum initial sampling voltage and a minimum initial sampling voltage across the sampling resistor at a target current based on a calibrated resistance value and a resistance calibration error of the sampling resistor;

[0080] S120, calculating a maximum sampling current and a minimum sampling current of the sampling resistor based on a maximum initial sampling voltage, a minimum initial sampling voltage, a calibrated analog-to-digital conversion parameter of the controller, and a corresponding analog-to-digital conversion parameter calibration error;

[0081] S130, calculating a first current sampling accuracy and a second current sampling accuracy according to the maximum sampling current, the minimum sampling current and the target current, the first current sampling accuracy corresponding to the maximum sampling current, and the second current sampling accuracy corresponding to the minimum sampling current;

[0082] S140: Configure at least one of a preset overcurrent protection curve of the overcurrent protection chip and a selection parameter of a target wiring harness according to at least one of the first current sampling accuracy and the second current sampling accuracy.

[0083] From the above description, it can be seen that a parameter configuration method of an overcurrent protection chip in an embodiment of the present application calculates the maximum initial sampling voltage and the minimum initial sampling voltage of the sampling resistor under the resistance calibration error when the target current flows through, and combines the calibration analog-to-digital conversion parameters of the controller involved in the actual current acquisition process and the corresponding analog-to-digital conversion parameter calibration error to calculate the maximum sampling current and the minimum sampling current that can be achieved under various errors, so that the maximum current sampling accuracy and the minimum current sampling accuracy that may be generated in the current acquisition process can be calculated based on the maximum sampling current, the minimum sampling current and the target current.

[0084] In this way, when performing the preset overcurrent protection curve of the actual overcurrent protection chip and the target wiring harness selection in the system, the embodiment of the present application can utilize the maximum current sampling accuracy and the minimum current sampling accuracy to achieve the reasonable configuration of the above-mentioned preset overcurrent protection curve and the target wiring harness selection, which can effectively achieve the purpose of reducing the wiring harness cost as much as possible while fully ensuring the reliability of overcurrent protection.

[0085] The specific implementation of the above steps 110 to 140 is described in detail below.

[0086] In S110, when specifically implemented, the maximum initial sampling voltage and the minimum initial sampling voltage at both ends of the sampling resistor under the target current can be calculated based on the calibrated resistance value and the resistance calibration error of the sampling resistor. The above-mentioned resistance calibration error can be, for example, the positive and negative error range of the sampling resistor, such as (-0.005%, +0.005%). Alternatively, the resistance calibration error can specifically be the most positive resistance calibration error of 0.005% and the most negative resistance calibration error of -0.005% that may exist in the calibrated resistance value of the sampling resistor, and this embodiment does not impose strict restrictions on this.

[0087] According to some embodiments of the present application, optionally, in order to more reasonably and effectively realize the accurate calculation of the above-mentioned maximum initial sampling voltage and the minimum initial sampling voltage, the above-mentioned calibration resistance value and the resistance calibration error based on the sampling resistor are used to calculate the maximum initial sampling voltage and the minimum initial sampling voltage across the sampling resistor at the target current, including:

[0088] The maximum initial sampling voltage is calculated according to the product of the target current and the maximum resistance value of the sampling resistor under the resistor calibration error;

[0089] The minimum initial sampling voltage is calculated based on the product of the target current and the minimum resistance value of the sampling resistor under the resistor calibration error.

[0090] In this embodiment, the maximum resistance and the minimum resistance corresponding to the most positive and the most negative resistances can be determined according to the resistance calibration error of the sampling resistor, and the target current is given, for example, 10 A. In this way, the maximum initial sampling voltage and the minimum initial sampling voltage at both ends of the sampling resistor under the target current can be calculated, the maximum initial sampling voltage is for example 10.2 mV, and the minimum initial sampling voltage is for example 9.8 mV.

[0091] In S120 , based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameters of the controller, and the corresponding analog-to-digital conversion parameter calibration errors, the maximum sampling current and the minimum sampling current of the sampling resistor are calculated.

[0092] The above-mentioned calibrated analog-to-digital conversion parameters can be, for example, the ADC (Analog-to-Digital Converter) conversion voltage value of the controller, and the above-mentioned corresponding analog-to-digital conversion parameter calibration error can be the most positive calibration error and the most negative calibration error of the above-mentioned ADC conversion voltage value, or the calibration error range of the above-mentioned ADC conversion accuracy. This embodiment does not impose strict restrictions on this.

[0093] In a specific implementation, combined with the actual situation of the controller under different calibration errors of the analog-to-digital conversion parameters (for example, the maximum analog-to-digital conversion parameters and the minimum analog-to-digital conversion parameters of the calibrated analog-to-digital conversion parameters under the calibration error of the analog-to-digital conversion parameters), the maximum sampling current of the sampling resistor that can be ultimately calculated based on the maximum initial sampling voltage is calculated, and the minimum sampling current of the sampling resistor that can ultimately be calculated based on the minimum initial sampling voltage is calculated.

[0094] It should be added that, in some other embodiments, the overcurrent protection chip may also be integrated with other functional devices, such as operational amplifiers, comparators or filters, etc., which are not strictly limited in this embodiment. Also, in this case, the calibration accuracy errors of the above-mentioned components are also combined for calculation, so as to screen out the maximum sampling current and the minimum sampling current of the sampling resistor that can be finally calculated, which are not strictly limited in this embodiment.

[0095] According to some embodiments of the present application, optionally, more specifically, considering that in some overcurrent protection chips, in order to fully reduce signal loss, an operational amplifier can be set to amplify the initial sampling voltage across the sampling resistor to ensure that the signal acquisition deviation caused by the initial sampling voltage being too small is avoided. Based on this, the above-mentioned overcurrent protection chip also includes an operational amplifier.

[0096] The operational amplifier is used to amplify the initial sampling voltage to obtain an output voltage after the operational amplifier amplification, and send the output voltage to the controller. The controller is used to obtain the actual sampling voltage based on the output voltage conversion, and calculate the sampling current according to the calibrated resistance value and the actual sampling voltage.

[0097] In this case, the above step 120, based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameter of the controller and the corresponding analog-to-digital conversion parameter calibration error, calculates the maximum sampling current and the minimum sampling current of the sampling resistor, which may specifically include:

[0098] Based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated operational amplifier parameters of the operational amplifier, and the corresponding operational amplifier parameter calibration error, the maximum output voltage and the minimum output voltage after the operational amplifier amplification are calculated;

[0099] Based on the maximum output voltage, the minimum output voltage, the calibrated analog-to-digital conversion parameter, and the calibration error of the analog-to-digital conversion parameter, the maximum actual sampling voltage and the minimum actual sampling voltage are calculated;

[0100] Based on the maximum actual sampling voltage, the minimum actual sampling voltage and the calibration resistance value, the maximum sampling current and the minimum sampling current are calculated.

[0101] In this embodiment, the calibrated analog-to-digital conversion parameters of the above-mentioned controller can be, for example, the ADC conversion voltage value of the controller, the calibrated op amp parameters of the above-mentioned operational amplifier can include a calibrated op amp reference voltage standard value, an op amp compensation voltage standard value or an op amp gain standard value, and the above-mentioned op amp parameter calibration error can be the calibration error range corresponding to the above-mentioned different types of calibrated op amp parameters, or directly the most positive calibration error and the most negative calibration error corresponding to the different types of calibrated op amp parameters.

[0102] Correspondingly, the above-mentioned op amp reference voltage standard value corresponds to the maximum value of the op amp reference voltage and the minimum value of the op amp reference voltage under the corresponding op amp parameter calibration error, the above-mentioned op amp compensation voltage standard value corresponds to the maximum value of the op amp compensation voltage and the minimum value of the op amp compensation voltage under the corresponding op amp parameter calibration error, and the above-mentioned op amp gain standard value corresponds to the maximum value of the op amp gain and the minimum value of the op amp gain under the corresponding op amp parameter calibration error, all of which can be used to obtain the maximum output voltage and the minimum output voltage of the actual operational amplifier op amp.

[0103] After obtaining the above-mentioned maximum output voltage and minimum output voltage, the maximum actual sampling voltage and minimum actual sampling voltage finally obtained by the above-mentioned controller are calculated by combining the calibrated analog-to-digital conversion parameters of the controller and the corresponding analog-to-digital conversion parameter calibration error, and the controller itself performs data operations based on the calibrated analog-to-digital conversion parameters.

[0104] In this way, the maximum sampling current and the minimum sampling current are calculated based on the maximum actual sampling voltage, the minimum actual sampling voltage and the calibration resistance value. For example, the maximum actual sampling voltage flowing through the calibration resistance value at the maximum actual sampling voltage can be determined based on Ohm's law, and the minimum actual sampling voltage flowing through the calibration resistance value at the minimum actual sampling voltage can be determined.

[0105] According to some embodiments of the present application, optionally, more specifically, in combination with actual operational amplifier processing scenarios, in order to more reasonably obtain the above-mentioned maximum output voltage and minimum output voltage, the above-mentioned maximum output voltage and minimum output voltage after amplification by the operational amplifier are calculated based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated operational amplifier parameters of the operational amplifier, and the corresponding operational amplifier parameter calibration error, which may specifically include:

[0106] Based on the first calculation formula, a maximum output voltage is calculated; and based on the second calculation formula, a minimum output voltage is calculated;

[0107] The first calculation formula includes:

[0108] Vop_max=V_ref_max+(V_offset_max+VR_max)*GAIN_max;

[0109] Wherein, Vop_max is the maximum output voltage, V_ref_max is the maximum value of the op amp reference voltage under the corresponding op amp parameter calibration error, V_offset_max is the maximum value of the op amp compensation voltage under the corresponding op amp parameter calibration error, VR_max is the maximum initial sampling voltage, GAIN_max is the maximum value of the op amp gain under the corresponding op amp parameter calibration error;

[0110] The second calculation formula includes:

[0111] Vop_min=V_ref_min+(V_offset_min+VR_min)*GAIN_min;

[0112] Among them, Vop_min is the minimum output voltage, V_ref_min is the minimum value of the op amp reference voltage under the corresponding op amp parameter calibration error, V_offset_min is the minimum value of the op amp compensation voltage under the corresponding op amp parameter calibration error, VR_min is the minimum initial sampling voltage, and GAIN_min is the minimum value of the op amp gain under the corresponding op amp parameter calibration error.

[0113] According to some embodiments of the present application, optionally, more specifically, in combination with the actual data processing means of the actual controller, in order to fully realize the calculation of the above-mentioned maximum actual sampling voltage and the minimum actual sampling voltage, the above-mentioned calculation based on the maximum output voltage, the minimum output voltage, the calibrated analog-to-digital conversion parameter and the analog-to-digital conversion parameter calibration error to obtain the maximum actual sampling voltage and the minimum actual sampling voltage may specifically include:

[0114] Based on the third calculation formula, a maximum actual sampling voltage is calculated; and based on the fourth calculation formula, a minimum actual sampling voltage is calculated;

[0115] The third calculation formula includes:

[0116] Vmcu_max=Vop_max+V_AD_err_max;

[0117] Among them, Vmcu_max is the maximum actual sampling voltage, Vop_max is the maximum output voltage, and V_AD_err_max is the maximum accuracy conversion voltage value of the controller's analog-to-digital conversion ADC;

[0118] The fourth calculation formula includes:

[0119] Vmcu_min=Vop_min+V_AD_err_min;

[0120] Among them, Vmcu_min is the minimum actual sampling voltage, Vop_min is the minimum output voltage, and V_AD_err_min is the minimum accuracy conversion voltage value of the controller's ADC.

[0121] According to some embodiments of the present application, optionally, more specifically, in order to fully realize the determination of the maximum actual sampling voltage and the minimum actual sampling voltage of the sampling resistor determined under the influence of various errors, the above-mentioned calculation based on the maximum actual sampling voltage, the minimum actual sampling voltage and the calibration resistance value to obtain the maximum sampling current and the minimum sampling current may specifically include:

[0122] Based on the fifth calculation formula, a maximum sampling current is calculated; and based on the sixth calculation formula, a minimum sampling current is calculated;

[0123] The fifth calculation formula includes:

[0124] I_max=(Vmcu_max-V_ref_type) / (R_type*GAIN_type);

[0125] Among them, I_max is the maximum sampling current, Vmcu_max is the maximum actual sampling voltage, V_ref_type is the standard value of the op amp reference voltage, R_type is the calibration resistance value, and GAIN_type is the standard value of the op amp gain;

[0126] The sixth calculation formula includes:

[0127] I_min=(Vmcu_min-V_ref_type) / (R_type*GAIN_type);

[0128] Among them, I_min is the minimum sampling current, Vmcu_min is the minimum actual sampling voltage, V_ref_type is the standard value of the op amp reference voltage, R_type is the calibration resistance value, and GAIN_type is the standard value of the op amp gain.

[0129] In S130, when implemented specifically, a first current sampling accuracy and a second current sampling accuracy are calculated according to the maximum sampling current, the minimum sampling current and the target current, the first current sampling accuracy corresponds to the maximum sampling current, and the second current sampling accuracy corresponds to the minimum sampling current. The first current sampling accuracy is usually a positive value, and the second current sampling accuracy is usually a negative value.

[0130] More specifically, the first current sampling accuracy can be calculated based on the ratio of the first current difference to the target current, where the first current difference is the current difference between the maximum sampling current and the target current. The second current sampling accuracy can be calculated based on the ratio of the second current difference to the target current, where the second current difference is the current difference between the minimum sampling current and the target current, which is not strictly limited in this embodiment.

[0131] In S140, during specific implementation, at least one of a preset overcurrent protection curve of the overcurrent protection chip and a selection parameter of the target wiring harness is configured according to at least one of the first current sampling accuracy and the second current sampling accuracy.

[0132] More specifically, configuring at least one of a preset overcurrent protection curve of the overcurrent protection chip and a selection parameter of the target wiring harness according to at least one of the first current sampling accuracy and the second current sampling accuracy may include:

[0133] Based on the first current sampling accuracy and the actual load current curve, a preset overcurrent protection curve of the overcurrent protection chip is configured;

[0134] Based on the configured preset overcurrent protection curve and the second current sampling accuracy, the selection parameters of the target wiring harness are configured.

[0135] When the actual overcurrent protection chip is working, the overcurrent protection chip is electrically connected to the load through the target wiring harness, and is used to perform a fusing simulation in the case of overcurrent to protect the wiring harness and the load. Based on this background, the above-mentioned actual load current curve can be a current and time curve determined by testing or simulating the current and overcurrent time borne by the load in advance.

[0136] According to some embodiments of the present application, optionally, based on the first current sampling accuracy and the actual load current curve, a preset overcurrent protection curve of the overcurrent protection chip is configured, including:

[0137] Based on the first current sampling accuracy and the actual load current curve, a first reference curve is determined, where the first reference curve is (1+A%) times the actual load current curve, and A% is the first current sampling accuracy;

[0138] According to the first reference curve, a preset overcurrent protection curve of the overcurrent protection chip is configured.

[0139] According to some embodiments of the present application, optionally, based on the configured preset overcurrent protection curve and the second current sampling accuracy, the selection parameters of the target wiring harness are configured, including:

[0140] Determine a second reference curve according to the configured preset overcurrent protection curve and the second current sampling accuracy, where the second reference curve is (1+B%) times the preset overcurrent protection curve, where B% is the absolute value of the second current sampling accuracy;

[0141] According to N calibrated overcurrent protection curves corresponding one to one to the second reference curve and N candidate wiring harnesses, a target overcurrent protection curve is determined from the N calibrated overcurrent protection curves, and the selection parameters of the candidate wiring harness corresponding to the target overcurrent protection curve are configured as the selection parameters of the target wiring harness, where N is a positive integer.

[0142] It should be noted that the above method of determining the preset overcurrent protection curve and the target wiring harness selection is only an example and does not limit the actual protection scope of the present application. In some other possible embodiments, the above preset overcurrent protection curve can also be determined according to the first current sampling accuracy and the second current sampling accuracy, and then the actual wiring harness with a higher overcurrent resistance than the preset overcurrent protection curve can be selected according to the preset overcurrent protection curve, and no strict limitation is made here.

[0143] In order to facilitate understanding of the parameter configuration method of the overcurrent protection chip provided in the above embodiment, the above method is described below with a specific scenario embodiment. Figure 2 , Figure 2 This is the protection working model of the overcurrent protection chip provided in one embodiment of the present application. Figure 2As shown in the figure, in the actual working scenario of the overcurrent protection chip, the overcurrent protection chip includes part 1, part 2 and part 3. Part 1 is the current acquisition unit (sampling resistor) of the hardware circuit; Part 2 is the logic processing unit, which includes an operational amplifier and a controller (MCU). The overcurrent protection curve (in I 2 T protection curve as an example); part 3 is a switch (such as a MOSFET); part 4 is a wiring harness (target wiring harness); and part 5 is a downstream load.

[0144] exist Figure 2 The actual working mode of the overcurrent protection chip is to read the actual current of the load through the sampling resistor, and then send the signal to the logic processing unit for operational amplification and analog-to-digital conversion to obtain the final collection current, and then the final collection current and the time the current is maintained can be compared with I 2 Comparison of T protection curves. 2 The T protection curve needs to be set according to the load current and acquisition accuracy. 2 The T protection curve represents the setting of an upper limit of thermal work. When the above-mentioned final collection current reaches the upper limit of thermal work, the disconnect switch plays a role in protecting the wiring harness.

[0145] Part 1 The current value of the recovery directly affects I 2 If the current value collected is larger than the actual current, it may cause an error. 2 T protection, resulting in false shutdown; if the collected current value is smaller than the actual current, it may fail to protect in time and cause the wiring harness to burn out. Therefore, the accuracy of current collection needs to be calculated to achieve a more accurate I 2 T parameter configuration and wiring harness selection.

[0146] See below Figure 3 , Figure 3 FIG. 1 is a schematic diagram of a configuration flow of an overcurrent protection curve of an overcurrent protection chip provided in an embodiment of the present application. Figure 3 As shown in the figure, when the current flows through the sampling resistor, the calibrated resistance value of the sampling resistor itself has a certain positive and negative error during the accuracy calculation. First, the maximum initial sampling voltage and the minimum initial sampling voltage that can be obtained under the positive and negative errors of the resistance value of the sampling resistor under the given actual target current are calculated, and then the voltage is sent to the operational amplifier. The operational amplifier amplifies the voltage signal (maximum initial sampling voltage and minimum initial sampling voltage) of the sampling resistor in combination with its own operational amplifier error, and then sends the maximum output voltage and the minimum output voltage after the operational amplifier amplification to the MCU for collection.

[0147] In this way, combined with the digital acquisition error of the MCU, the maximum actual sampling voltage and the minimum actual sampling voltage finally acquired are obtained to reversely infer the maximum and minimum currents of the acquired current (i.e., the aforementioned maximum sampling current and minimum sampling current). After obtaining the maximum sampling current and the minimum sampling current, the maximum sampling current and the minimum sampling current are calculated with the starting target current respectively, and finally the maximum current sampling accuracy (first current sampling accuracy) and the minimum current sampling accuracy (second current sampling accuracy) can be obtained: +A% and -B%, which are the total accuracy of the sampling resistor error after amplification by the operational amplifier and its own error, and then processed by the ADC of the error of the MCU in the logic processing unit, representing the maximum positive bias accuracy and the minimum negative bias accuracy of the overcurrent protection chip to achieve current acquisition.

[0148] After the first current sampling accuracy and the second current sampling accuracy are calculated, the I 2 T parameter configuration and wiring harness selection. Figure 4 and Figure 5 As shown, Figure 4 It is a scenario flow diagram of a parameter configuration method of an overcurrent protection chip provided in an embodiment of the present application; Figure 5 It is a scenario flow diagram of a parameter configuration method of an overcurrent protection chip provided in an embodiment of the present application.

[0149] Figure 4 It is based on the calculation of the total accuracy +A% and -B%, and the generated I 2 T configuration result diagram. Figure 4 The solid blue line in the middle is the actual load current curve, corresponding to Figure 5 The actual current and time curve L in; Figure 4 The blue dotted line in the middle is the load current*(1+A%), corresponding to Figure 5 The current time curve L1 after increasing the accuracy; according to the load current * (1 + A%), the margin is increased to configure the preset overcurrent protection curve. The configured preset overcurrent protection curve corresponds to Figure 4 The black solid line in: I 2 T curve; Figure 4 The red dotted line in the figure is the load current = I 2 T*(1+B%), corresponding to Figure 5 L2 in.

[0150] When configuring parameters, first check the overcurrent protection curve (I 2 T protection curve) is configured when the total accuracy is the first current sampling accuracy + A%. 2 The T curve can be configured as 1+(+C%+A%) times the actual load current, where +C% is I 2T curve margin; if overcurrent occurs at this time, the current will be 1+(+C%+A%) times the actual current, which will trigger I 2 T protection; when the load is working normally, there will be no error. 2 T is turned off. The wiring harness can now be completely close to I 2 T protection curve selection; the larger the +C%, the thicker the wire diameter will be; the smaller the +C%, the thinner the wire diameter can be selected, thus saving the wiring harness cost.

[0151] Secondly, the wiring harness selection can refer to the second current sampling accuracy -B% and the determined overcurrent protection curve. When the total accuracy is -B%, the worst case is that the actual overcurrent reaches the smoking current of the wiring harness, but the accuracy is -B%, and the current read back is not enough to trigger I 2 T protection, thus burning the wiring harness; at this time, you need to follow I 2 The T curve is used as the actual current to calculate the wiring harness. 2 The T parameter * (1 + B%) can be used as the basis for wire harness selection. 2 T fuse curve LN, and enter each of them into the wire harness I of the wire harness 2 T fuse curve LN and I 2 T parameter * (1 + B%) for comparison, as long as it is close to I 2 Just select T parameter * (1 + B%). The closer it is, the thinner the wire harness is, the more it can save the wire harness cost, and in this case the wire harness will not be burned.

[0152] In this scenario, only the actual load current information needs to be entered, and the final accuracy (+A% and -B%) of the theoretical calculation and the I 2 T fuse curve can be configured to have a reasonable I 2 T protection curve and automatically identify the appropriate wiring harness selection, so as to effectively achieve the purpose of fully ensuring the reliability of overcurrent protection while reducing the wiring harness cost as much as possible.

[0153] Based on the parameter configuration method of the overcurrent protection chip provided in the above embodiment, out of the same inventive concept, the present application also provides a parameter configuration device of an overcurrent protection chip corresponding to the parameter configuration method of the overcurrent protection chip. Figure 6 The parameter configuration device of the overcurrent protection chip is introduced in detail.

[0154] Figure 6A structural schematic diagram of a parameter configuration device of an overcurrent protection chip provided in an embodiment of the present application is shown. The overcurrent protection chip includes at least a sampling resistor and a controller; the controller is used to obtain an initial sampling voltage across the sampling resistor, and calculate a sampling current flowing through the sampling resistor based on the initial sampling voltage, so as to perform overcurrent protection on the target wiring harness according to the sampling current and a preset overcurrent protection curve.

[0155] Figure 6 The parameter configuration device 600 of the overcurrent protection chip shown includes:

[0156] A first calculation module 610 is used to calculate a maximum initial sampling voltage and a minimum initial sampling voltage across the sampling resistor at a target current based on a calibrated resistance value and a resistance calibration error of the sampling resistor;

[0157] A second calculation module 620, configured to calculate a maximum sampling current and a minimum sampling current of the sampling resistor based on a maximum initial sampling voltage, a minimum initial sampling voltage, a calibration analog-to-digital conversion parameter of the controller, and a corresponding analog-to-digital conversion parameter calibration error;

[0158] A third calculation module 630, configured to calculate a first current sampling accuracy and a second current sampling accuracy according to the maximum sampling current, the minimum sampling current and the target current, wherein the first current sampling accuracy corresponds to the maximum sampling current, and the second current sampling accuracy corresponds to the minimum sampling current;

[0159] The first configuration module 640 is used to configure at least one of a preset overcurrent protection curve of the overcurrent protection chip and a selection parameter of a target wiring harness according to at least one of a first current sampling accuracy and a second current sampling accuracy.

[0160] It can be seen from the above description that the parameter configuration device of an overcurrent protection chip provided in the embodiment of the present application calculates the maximum initial sampling voltage and the minimum initial sampling voltage of the sampling resistor under the resistance calibration error when the target current flows through by setting the corresponding functional modules, and combines the calibration analog-to-digital conversion parameters of the controller involved in the actual current acquisition process and the corresponding analog-to-digital conversion parameter calibration error to calculate the maximum sampling current and the minimum sampling current that can be achieved under each error, so that the maximum current sampling accuracy and the minimum current sampling accuracy that may be generated in the current acquisition process can be calculated according to the maximum sampling current, the minimum sampling current and the target current. In this way, when performing the preset overcurrent protection curve of the actual overcurrent protection chip and the target wiring harness selection in the system, the embodiment of the present application can use the maximum current sampling accuracy and the minimum current sampling accuracy to realize the reasonable configuration of the above-mentioned preset overcurrent protection curve and the target wiring harness selection, which can effectively achieve the purpose of fully ensuring the reliability of overcurrent protection while reducing the wiring harness cost as much as possible.

[0161] In some possible implementations, the first configuration module 640 configures at least one of a preset overcurrent protection curve of the overcurrent protection chip and a selection parameter of the target wiring harness according to at least one of the first current sampling accuracy and the second current sampling accuracy, including:

[0162] A first configuration submodule may be used to configure a preset overcurrent protection curve of the overcurrent protection chip based on a first current sampling accuracy and an actual load current curve;

[0163] The second configuration submodule can be used to configure the selection parameters of the target wiring harness based on the configured preset overcurrent protection curve and the second current sampling accuracy.

[0164] In some possible implementations, the first configuration submodule configures a preset overcurrent protection curve of the overcurrent protection chip based on the first current sampling accuracy and the actual load current curve, including:

[0165] A first determination unit may be used to determine a first reference curve based on a first current sampling accuracy and an actual load current curve, wherein the first reference curve is (1+A%) times the actual load current curve, and A% is the first current sampling accuracy;

[0166] The first configuration unit can be used to configure a preset overcurrent protection curve of the overcurrent protection chip according to a first reference curve.

[0167] In some possible implementations, the second configuration submodule configures the selection parameters of the target wiring harness based on the configured preset overcurrent protection curve and the second current sampling accuracy, including:

[0168] A second determination unit may be used to determine a second reference curve according to a configured preset overcurrent protection curve and a second current sampling accuracy, wherein the second reference curve is (1+B%) times the preset overcurrent protection curve, and B% is an absolute value of the second current sampling accuracy;

[0169] The second configuration unit can be used to determine the target overcurrent protection curve from the N calibrated overcurrent protection curves according to the second reference curve and the N candidate wiring harnesses that correspond one to one, and configure the selection parameters of the candidate wiring harness corresponding to the target overcurrent protection curve as the selection parameters of the target wiring harness, where N is a positive integer.

[0170] In some possible implementations, the overcurrent protection chip further includes an operational amplifier; the operational amplifier is used to amplify the initial sampling voltage to obtain an output voltage after amplification by the operational amplifier, and send the output voltage to the controller; the controller is used to obtain an actual sampling voltage based on the output voltage conversion, and calculate the sampling current according to the calibrated resistance value and the actual sampling voltage;

[0171] The second calculation module 620 calculates the maximum sampling current and the minimum sampling current of the sampling resistor based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameters of the controller, and the corresponding analog-to-digital conversion parameter calibration error, including:

[0172] The first calculation submodule can be used to calculate the maximum output voltage and the minimum output voltage after amplification by the operational amplifier based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated operational amplifier parameters of the operational amplifier, and the corresponding operational amplifier parameter calibration error;

[0173] The second calculation submodule can be used to calculate the maximum actual sampling voltage and the minimum actual sampling voltage based on the maximum output voltage, the minimum output voltage, the calibration analog-to-digital conversion parameter, and the calibration error of the analog-to-digital conversion parameter;

[0174] The third calculation submodule can be used to calculate the maximum sampling current and the minimum sampling current based on the maximum actual sampling voltage, the minimum actual sampling voltage and the calibration resistance value.

[0175] In some possible implementations, the first calculation submodule calculates the maximum output voltage and the minimum output voltage after amplification by the operational amplifier based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated operational amplifier parameters of the operational amplifier, and the corresponding operational amplifier parameter calibration error, and is specifically used for:

[0176] Based on the first calculation formula, a maximum output voltage is calculated; and based on the second calculation formula, a minimum output voltage is calculated;

[0177] The first calculation formula includes:

[0178] Vop_max=V_ref_max+(V_offset_max+VR_max)*GAIN_max;

[0179] Wherein, Vop_max is the maximum output voltage, V_ref_max is the maximum value of the op amp reference voltage under the corresponding op amp parameter calibration error, V_offset_max is the maximum value of the op amp compensation voltage under the corresponding op amp parameter calibration error, VR_max is the maximum initial sampling voltage, GAIN_max is the maximum value of the op amp gain under the corresponding op amp parameter calibration error;

[0180] The second calculation formula includes:

[0181] Vop_min=V_ref_min+(V_offset_min+VR_min)*GAIN_min;

[0182] Among them, Vop_min is the minimum output voltage, V_ref_min is the minimum value of the op amp reference voltage under the corresponding op amp parameter calibration error, V_offset_min is the minimum value of the op amp compensation voltage under the corresponding op amp parameter calibration error, VR_min is the minimum initial sampling voltage, and GAIN_min is the minimum value of the op amp gain under the corresponding op amp parameter calibration error.

[0183] In some possible implementations, the second calculation submodule calculates the maximum actual sampled voltage and the minimum actual sampled voltage based on the maximum output voltage, the minimum output voltage, the calibrated analog-to-digital conversion parameter, and the analog-to-digital conversion parameter calibration error, and is specifically used to:

[0184] Based on the third calculation formula, a maximum actual sampling voltage is calculated; and based on the fourth calculation formula, a minimum actual sampling voltage is calculated;

[0185] The third calculation formula includes:

[0186] Vmcu_max=Vop_max+V_AD_err_max;

[0187] Among them, Vmcu_max is the maximum actual sampling voltage, Vop_max is the maximum output voltage, and V_AD_err_max is the maximum accuracy conversion voltage value of the controller's analog-to-digital conversion ADC;

[0188] The fourth calculation formula includes:

[0189] Vmcu_min=Vop_min+V_AD_err_min;

[0190] Among them, Vmcu_min is the minimum actual sampling voltage, Vop_min is the minimum output voltage, and V_AD_err_min is the minimum accuracy conversion voltage value of the controller's ADC.

[0191] In some possible implementations, the third calculation submodule calculates the maximum sampling current and the minimum sampling current based on the maximum actual sampling voltage, the minimum actual sampling voltage and the calibration resistance value, which is specifically used for:

[0192] Based on the fifth calculation formula, a maximum sampling current is calculated; and based on the sixth calculation formula, a minimum sampling current is calculated;

[0193] The fifth calculation formula includes:

[0194] I_max=(Vmcu_max-V_ref_type) / (R_type*GAIN_type);

[0195] Among them, I_max is the maximum sampling current, Vmcu_max is the maximum actual sampling voltage, V_ref_type is the standard value of the op amp reference voltage, R_type is the calibration resistance value, and GAIN_type is the standard value of the op amp gain;

[0196] The sixth calculation formula includes:

[0197] I_min=(Vmcu_min-V_ref_type) / (R_type*GAIN_type);

[0198] Among them, I_min is the minimum sampling current, Vmcu_min is the minimum actual sampling voltage, V_ref_type is the standard value of the op amp reference voltage, R_type is the calibration resistance value, and GAIN_type is the standard value of the op amp gain.

[0199] In some possible implementations, the first calculation module 610 calculates the maximum initial sampling voltage and the minimum initial sampling voltage across the sampling resistor at the target current based on the calibrated resistance value and the resistance calibration error of the sampling resistor, including:

[0200] The fourth calculation submodule may be used to calculate the maximum initial sampling voltage according to the product between the target current and the maximum resistance value of the sampling resistor under the resistance calibration error;

[0201] The fifth calculation submodule can be used to calculate the minimum initial sampling voltage according to the product of the target current and the minimum resistance value of the sampling resistor under the resistance calibration error.

[0202] Based on the parameter configuration method of the overcurrent protection chip provided in the above embodiment, for the same inventive concept, the present application also provides a parameter configuration device of an overcurrent protection chip corresponding to the parameter configuration method of the overcurrent protection chip. Figure 7 A detailed introduction to the parameter configuration equipment of the overcurrent protection chip.

[0203] See below Figure 7 , Figure 7 It is a structural diagram of a parameter configuration device for an overcurrent protection chip provided in one embodiment of the present application.

[0204] The parameter configuration device of the overcurrent protection chip may include a processor 701 and a memory 702 storing computer program instructions.

[0205] Specifically, the processor 701 may include a central processing unit (CPU), or an application specific integrated circuit (ASIC), or may be configured to implement one or more integrated circuits of the embodiments of the present application.

[0206] The memory 702 may include a large capacity memory for data or instructions. By way of example and not limitation, the memory 702 may include a hard disk drive (HDD), a floppy disk drive, a flash memory, an optical disk, a magneto-optical disk, a magnetic tape, or a universal serial bus (USB) drive or a combination of two or more of these. In appropriate cases, the memory 702 may include a removable or non-removable (or fixed) medium. In appropriate cases, the memory 702 may be inside or outside the integrated gateway disaster recovery device. In a specific embodiment, the memory 702 is a non-volatile solid-state memory.

[0207] The memory may include read-only memory (ROM), random access memory (RAM), magnetic disk storage media devices, optical storage media devices, flash memory devices, electrical, optical or other physical / tangible memory storage devices. Thus, typically, the memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or more processors), it is operable to perform the operations described with reference to the method according to an aspect of the present disclosure.

[0208] The processor 701 reads and executes the computer program instructions stored in the memory 702 to implement any one of the parameter configuration methods of the overcurrent protection chip in the above embodiments.

[0209] In one example, the parameter configuration device of the data overcurrent protection chip may further include a communication interface 703 and a bus 710. Figure 7 As shown, the processor 701, the memory 702, and the communication interface 703 are connected via a bus 710 and communicate with each other.

[0210] The communication interface 703 is mainly used to implement communication between various modules, devices, units and / or equipment in the embodiments of the present application.

[0211] Bus 710 includes hardware, software or both, and the parts of the parameter configuration device of the overcurrent protection chip are coupled to each other. For example, but not limitation, the bus may include accelerated graphics port (AGP) or other graphics bus, enhanced industrial standard architecture (EISA) bus, front-end bus (FSB), hypertransport (HT) interconnection, industrial standard architecture (ISA) bus, infinite bandwidth interconnection, low pin count (LPC) bus, memory bus, micro channel architecture (MCA) bus, peripheral component interconnection (PCI) bus, PCI-Express (PCI-X) bus, serial advanced technology attachment (SATA) bus, video electronics standard association local (VLB) bus or other suitable bus or two or more of these combinations. In appropriate cases, bus 710 may include one or more buses. Although the present application embodiment describes and shows a specific bus, the application considers any suitable bus or interconnection.

[0212] The parameter configuration device of the overcurrent protection chip executes the parameter configuration method of the overcurrent protection chip in the embodiment of the present application, thereby realizing the parameter configuration method of the overcurrent protection chip described in the embodiment of the present application.

[0213] In addition, in combination with the parameter configuration method of the overcurrent protection chip in the above embodiment, the embodiment of the present application can provide a computer storage medium for implementation. The computer storage medium stores computer program instructions; when the computer program instructions are executed by the processor, any one of the parameter configuration methods of the overcurrent protection chip in the above embodiment is implemented.

[0214] Based on the parameter configuration method of the overcurrent protection chip in the above-mentioned embodiments, an embodiment of the present application provides a computer program product. When the instructions in the computer program product are executed by a processor of an electronic device, the electronic device executes the parameter configuration method of the overcurrent protection chip provided in any one of the above-mentioned embodiments of the present application.

[0215] It should be clear that the present application is not limited to the specific configuration and processing described above and shown in the figures. For the sake of simplicity, a detailed description of the known method is omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of the present application is not limited to the specific steps described and shown, and those skilled in the art can make various changes, modifications and additions, or change the order between the steps after understanding the spirit of the present application.

[0216] The functional blocks shown in the above-described block diagram can be implemented as hardware, software, firmware or a combination thereof. When implemented in hardware, it can be, for example, an electronic circuit, an application specific integrated circuit (ASIC), appropriate firmware, a plug-in, a function card, etc. When implemented in software, the elements of the present application are programs or code segments that are used to perform the required tasks. The program or code segment can be stored in a machine-readable medium, or transmitted on a transmission medium or a communication link by a data signal carried in a carrier wave. "Machine-readable medium" can include any medium capable of storing or transmitting information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, optical fiber media, radio frequency (RF) links, etc. The code segment can be downloaded via a computer network such as the Internet, an intranet, etc.

[0217] It should also be noted that the exemplary embodiments mentioned in this application describe some methods or systems based on a series of steps or devices. However, this application is not limited to the order of the above steps, that is, the steps can be performed in the order mentioned in the embodiment, or in a different order from the embodiment, or several steps can be performed simultaneously.

[0218] Aspects of the present disclosure are described above with reference to the flowchart and / or block diagram of the method, device (system) and computer program product according to the embodiment of the present disclosure. It should be understood that each box in the flowchart and / or block diagram and the combination of each box in the flowchart and / or block diagram can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device to produce a machine so that these instructions executed by the processor of the computer or other programmable data processing device enable the implementation of the function / action specified in one or more boxes of the flowchart and / or block diagram. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor, or a field programmable logic circuit. It can also be understood that each box in the block diagram and / or flowchart and the combination of boxes in the block diagram and / or flowchart can also be implemented by dedicated hardware that performs a specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions.

[0219] The above is only a specific implementation of the present application. Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working processes of the systems, modules and units described above can refer to the corresponding processes in the aforementioned method embodiments, and will not be repeated here. It should be understood that the protection scope of the present application is not limited to this. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in this application, and these modifications or replacements should be included in the protection scope of this application.

Claims

1. A parameter configuration method for an overcurrent protection chip, characterized in that: The overcurrent protection chip at least includes a sampling resistor and a controller; The controller is used to obtain an initial sampling voltage across the sampling resistor, and calculate a sampling current flowing through the sampling resistor based on the initial sampling voltage, so as to perform overcurrent protection on the target wiring harness according to the sampling current and a preset overcurrent protection curve; the method includes: Calculating a maximum initial sampling voltage and a minimum initial sampling voltage across the sampling resistor at a target current based on a calibrated resistance value and a resistance calibration error of the sampling resistor; Based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameter of the controller and the corresponding analog-to-digital conversion parameter calibration error, the maximum sampling current and the minimum sampling current of the sampling resistor are calculated; Calculate a first current sampling accuracy and a second current sampling accuracy according to the maximum sampling current, the minimum sampling current and the target current, wherein the first current sampling accuracy corresponds to the maximum sampling current, and the second current sampling accuracy corresponds to the minimum sampling current; At least one of the preset overcurrent protection curve of the overcurrent protection chip and the selection parameters of the target wiring harness is configured according to at least one of the first current sampling accuracy and the second current sampling accuracy.

2. The method according to claim 1, characterized in that The configuring, according to at least one of the first current sampling accuracy and the second current sampling accuracy, at least one of the preset overcurrent protection curve of the overcurrent protection chip and the selection parameters of the target wiring harness comprises: Based on the first current sampling accuracy and the actual load current curve, configuring the preset overcurrent protection curve of the overcurrent protection chip; Based on the configured preset overcurrent protection curve and the second current sampling accuracy, the selection parameters of the target wiring harness are configured.

3. The method according to claim 2, characterized in that The configuring the preset overcurrent protection curve of the overcurrent protection chip based on the first current sampling accuracy and the actual load current curve includes: Based on the first current sampling accuracy and the actual load current curve, determine a first reference curve, where the first reference curve is (1+A%) times the actual load current curve, where A% is the first current sampling accuracy; The preset overcurrent protection curve of the overcurrent protection chip is configured according to the first reference curve.

4. The method according to claim 2, characterized in that: The configuring of the selection parameters of the target wiring harness based on the configured preset overcurrent protection curve and the second current sampling accuracy includes: Determine a second reference curve according to the configured preset overcurrent protection curve and the second current sampling accuracy, wherein the second reference curve is (1+B%) times the preset overcurrent protection curve, where B% is the absolute value of the second current sampling accuracy; According to N calibrated overcurrent protection curves corresponding one-to-one to the second reference curve and N candidate wiring harnesses, a target overcurrent protection curve is determined from the N calibrated overcurrent protection curves, and the selection parameters of the candidate wiring harness corresponding to the target overcurrent protection curve are configured as the selection parameters of the target wiring harness, where N is a positive integer.

5. The method according to claim 1, characterized in that The overcurrent protection chip also includes an operational amplifier; the operational amplifier is used to amplify the initial sampling voltage to obtain an output voltage after amplification by the operational amplifier, and send the output voltage to the controller; The controller is used to obtain the actual sampling voltage based on the output voltage conversion, and calculate the sampling current according to the calibration resistance value and the actual sampling voltage; The method of calculating the maximum sampling current and the minimum sampling current of the sampling resistor based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated analog-to-digital conversion parameter of the controller, and the corresponding analog-to-digital conversion parameter calibration error includes: Based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated operational amplifier parameters of the operational amplifier, and the corresponding operational amplifier parameter calibration error, the maximum output voltage and the minimum output voltage after the operational amplifier amplification are calculated; Based on the maximum output voltage, the minimum output voltage, the calibrated analog-to-digital conversion parameter, and the analog-to-digital conversion parameter calibration error, a maximum actual sampling voltage and a minimum actual sampling voltage are calculated; The maximum sampling current and the minimum sampling current are calculated based on the maximum actual sampling voltage, the minimum actual sampling voltage and the calibration resistance value.

6. The method according to claim 5, characterized in that The maximum output voltage and the minimum output voltage after amplification by the operational amplifier are calculated based on the maximum initial sampling voltage, the minimum initial sampling voltage, the calibrated operational amplifier parameters of the operational amplifier, and the corresponding operational amplifier parameter calibration error, including: Based on the first calculation formula, the maximum output voltage is calculated; and based on the second calculation formula, the minimum output voltage is calculated; The first calculation formula includes: Vop_max=V_ref_max+(V_offset_max+VR_max)*GAIN_max; Wherein, Vop_max is the maximum output voltage, V_ref_max is the maximum value of the op amp reference voltage under the corresponding calibration error of the op amp parameter, V_offset_max is the maximum value of the op amp compensation voltage under the corresponding calibration error of the op amp parameter, VR_max is the maximum initial sampling voltage, and GAIN_max is the maximum value of the op amp gain under the corresponding calibration error of the op amp parameter; The second calculation formula includes: Vop_min=V_ref_min+(V_offset_min+VR_min)*GAIN_min; Among them, Vop_min is the minimum output voltage, V_ref_min is the minimum value of the op amp reference voltage under the corresponding op amp parameter calibration error, V_offset_min is the minimum value of the op amp compensation voltage under the corresponding op amp parameter calibration error, VR_min is the minimum initial sampling voltage, and GAIN_min is the minimum value of the op amp gain under the corresponding op amp parameter calibration error.

7. The method according to claim 5, characterized in that The calculating the maximum actual sampling voltage and the minimum actual sampling voltage based on the maximum output voltage, the minimum output voltage, the calibrated analog-to-digital conversion parameter, and the analog-to-digital conversion parameter calibration error includes: Based on the third calculation formula, the maximum actual sampling voltage is calculated; and based on the fourth calculation formula, the minimum actual sampling voltage is calculated; The third calculation formula includes: Vmcu_max=Vop_max+V_AD_err_max; Wherein, Vmcu_max is the maximum actual sampling voltage, Vop_max is the maximum output voltage, and V_AD_err_max is the maximum precision conversion voltage value of the analog-to-digital conversion ADC of the controller; The fourth calculation formula includes: Vmcu_min=Vop_min+V_AD_err_min; Among them, Vmcu_min is the minimum actual sampling voltage, Vop_min is the minimum output voltage, and V_AD_err_min is the ADC minimum precision conversion voltage value of the controller.

8. The method according to claim 5, characterized in that The calculating the maximum sampling current and the minimum sampling current based on the maximum actual sampling voltage, the minimum actual sampling voltage and the calibration resistance value includes: Based on the fifth calculation formula, the maximum sampling current is calculated; and based on the sixth calculation formula, the minimum sampling current is calculated; The fifth calculation formula includes: I_max=(Vmcu_max-V_ref_type) / (R_type*GAIN_type); Wherein, I_max is the maximum sampling current, Vmcu_max is the maximum actual sampling voltage, V_ref_type is the standard value of the operational amplifier reference voltage, R_type is the calibration resistance value, and GAIN_type is the standard value of the operational amplifier gain; The sixth calculation formula includes: I_min=(Vmcu_min-V_ref_type) / (R_type*GAIN_type); Among them, I_min is the minimum sampling current, Vmcu_min is the minimum actual sampling voltage, V_ref_type is the standard value of the operational amplifier reference voltage, R_type is the calibration resistance value, and GAIN_type is the standard value of the operational amplifier gain.

9. The method according to any one of claims 1 to 8, characterized in that: The step of calculating the maximum initial sampling voltage and the minimum initial sampling voltage across the sampling resistor at the target current based on the calibrated resistance value and the resistance calibration error of the sampling resistor comprises: The maximum initial sampling voltage is calculated according to the product of the target current and the maximum resistance value of the sampling resistor under the resistance calibration error; The minimum initial sampling voltage is calculated according to the product of the target current and the minimum resistance value of the sampling resistor under the resistance calibration error.

10. A parameter configuration device for an overcurrent protection chip, characterized in that: The overcurrent protection chip at least includes a sampling resistor and a controller; The controller is used to obtain an initial sampling voltage across the sampling resistor, and calculate a sampling current flowing through the sampling resistor based on the initial sampling voltage, so as to perform overcurrent protection on the target wiring harness according to the sampling current and a preset overcurrent protection curve; the device includes: A first calculation module, configured to calculate a maximum initial sampling voltage and a minimum initial sampling voltage across the sampling resistor at a target current based on a calibrated resistance value and a resistance calibration error of the sampling resistor; A second calculation module, configured to calculate a maximum sampling current and a minimum sampling current of the sampling resistor based on the maximum initial sampling voltage, the minimum initial sampling voltage, a calibrated analog-to-digital conversion parameter of the controller, and a corresponding analog-to-digital conversion parameter calibration error; A third calculation module, configured to calculate a first current sampling accuracy and a second current sampling accuracy according to the maximum sampling current, the minimum sampling current and the target current, wherein the first current sampling accuracy corresponds to the maximum sampling current, and the second current sampling accuracy corresponds to the minimum sampling current; The first configuration module is used to configure at least one of the preset overcurrent protection curve of the overcurrent protection chip and the selection parameters of the target wiring harness according to at least one of the first current sampling accuracy and the second current sampling accuracy.

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