Electronic component appearance defect detection system and method

Abstract

The invention relates to the technical field of appearance defect detection, in particular to an electronic component appearance defect detection system and method, and the system comprises an appearance defect detection platform, an image recognition unit, a scanning recognition unit, an illumination verification analysis unit, a tracking self-inspection unit and a display feedback unit. Whether each surface of the to-be-detected electronic component has a suspicious defect or not is known through preliminary image analysis, so that defect detection is further performed on the appearance of the to-be-detected electronic component, and the suspicious surface of the to-be-detected electronic component is analyzed in two modes of laser scanning and light detection in an information feedback mode; the appearance defect condition of each surface of the to-be-detected electronic component is accurately analyzed, repeated redetection is performed by adjusting the illumination angle in the light detection process, occurrence of detection contingency is reduced, whether the suspicious surface has the appearance defect or not is accurately analyzed through an information interaction analysis mode, and the detection efficiency is improved. And the defect detection efficiency can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of appearance defect detection, and in particular to a system and method for detecting appearance defects of electronic components. Background Art

[0002] As the cornerstone of modern high-tech products, the quality control of electronic components is particularly important. In the electronic manufacturing industry, appearance inspection is one of the key links to ensure product quality. Through effective appearance inspection, not only can defects in the manufacturing process be discovered in time, but also the high costs caused by quality problems can be effectively avoided.

[0003] Appearance inspection can timely discover defects in the manufacturing process, avoid failures of these components during use, and prevent unqualified products from entering the market; however, in the prior art, a single inspection method is used for inspection, and the inspection results are accidental, which leads to a decrease in the accuracy of electronic component appearance defect inspection, is not conducive to the rational management of electronic components, and reduces the efficiency of electronic component appearance defect inspection;

[0004] In view of the above technical defects, a solution is now proposed. Summary of the invention

[0005] The object of the present invention is to provide an electronic component appearance defect detection system and method to solve the above-mentioned technical defects. The present invention uses preliminary image analysis to understand whether there are suspicious defects on each surface of the electronic component to be detected, so as to further perform defect detection on the appearance of the electronic component to be detected, and uses information feedback to analyze the suspicious surface of the electronic component to be detected by laser scanning and optical inspection, so as to accurately analyze the appearance defects of each surface of the electronic component to be detected, and in the process of optical inspection, the illumination angle is adjusted to perform repeated re-inspections, which helps to reduce the occurrence of detection contingency and improve the accuracy of the analysis results. Through information interaction analysis, it is possible to accurately analyze whether there are appearance defects on the suspicious surface, and through information feedback, the appearance defects of each surface of the electronic component to be detected can be intuitively understood, which helps to carry out targeted management of the defective surface and improve the defect detection efficiency. At the same time, the illumination information is subjected to parameter deviation interference self-inspection analysis to understand whether the operating status of the parallel light source is consistent during the detection process, so as to reduce the interference of the parallel light source on the detection.

[0006] The object of the present invention can be achieved by the following technical solutions: an electronic component appearance defect detection system, comprising an appearance defect detection platform, an image recognition unit, a scanning recognition unit, an illumination verification and analysis unit, a tracking self-checking unit, and a display feedback unit;

[0007] The appearance defect detection platform is used to collect surface data of electronic components to be detected and send the surface data to the image recognition unit;

[0008] After receiving the surface data, the image recognition unit immediately performs a surface preliminary recognition supervision feedback analysis on the surface data to obtain a suspicious signal;

[0009] The scanning and identification unit is used to respond to suspicious signals and perform surface scanning comparison and analysis by laser scanning to obtain defect signals or false defect signals;

[0010] The illumination verification and analysis unit is used to respond to suspicious signals and standard signals, and perform illumination view comparison verification and analysis, and send the obtained normal output signal or re-inspection signal or defect output signal to the display feedback unit;

[0011] The tracking self-checking unit is used to collect the illumination information of the parallel light source, and perform parameter deviation interference self-checking analysis on the illumination information, and compare and analyze the obtained actual illumination information with the standard illumination information to obtain a standard signal or an interference signal.

[0012] Preferably, the surface preliminary recognition supervision feedback analysis process of the image recognition unit is as follows:

[0013] Take appearance images of the electronic components to be inspected according to the set shooting plan;

[0014] The appearance feature images of each view of the electronic component to be inspected are obtained, and the appearance feature images of each view are compared with the corresponding preset standard appearance feature images:

[0015] If there is a difference between the appearance feature image and the preset standard appearance feature image, a suspicious signal is generated;

[0016] If there is no difference between the appearance feature image and the preset standard appearance feature image, no signal is generated.

[0017] Preferably, the surface scanning comparison and analysis process of the scanning identification unit is as follows:

[0018] The appearance feature image corresponding to the suspicious signal is set as the suspicious appearance view, and the appearance scanning image of the suspicious appearance view is further obtained by laser scanning;

[0019] A standard scan image corresponding to the suspicious appearance view is acquired, and the standard scan image corresponding to the suspicious appearance view is set as a comparison scan image.

[0020] Preferably, the appearance scanning images of each view of the standard electronic component obtained by laser scanning are obtained, and the appearance scanning images of each view of the standard electronic component obtained by laser scanning are set as standard scanning images, and the appearance scanning images are compared and analyzed with the comparison scanning images:

[0021] If there is a difference between the appearance scan image and the comparison scan image, a defect signal is generated;

[0022] If there is no difference between the appearance scan image and the comparison scan image, a false defect signal is generated.

[0023] Preferably, the illumination view comparison verification analysis process of the illumination verification analysis unit is as follows:

[0024] Obtain the suspicious surface of the electronic component to be detected corresponding to the suspicious signal, place the suspicious surface of the electronic component to be detected upward, illuminate the suspicious surface of the electronic component to be detected by obliquely irradiating a parallel light source, and move and illuminate the suspicious surface of the electronic component to be detected at a set speed and at a maintained oblique angle of the parallel light source. During the irradiation process, obtain continuous frame feature images and set them as the illuminated appearance image;

[0025] In the same way, a parallel light source is irradiated on the same surface of the standard electronic component corresponding to the suspicious appearance view, and the same surface of the standard electronic component is moved and irradiated at a set speed and at a maintained oblique angle of the parallel light source. During the irradiation process, a continuous frame feature image is obtained and set as the standard illumination appearance image;

[0026] The illuminated appearance image and the standard illuminated appearance image are compared and analyzed one by one in the shooting order to determine whether there are differences between the illuminated appearance image and the standard illuminated appearance image, and the number of images with differences between the illuminated appearance image and the standard illuminated appearance image is obtained and set as the defect comparison index.

[0027] Preferably, the oblique angle of the parallel light source is changed according to the set angle, and the same surface of the standard electronic component is moved and irradiated again at the set speed and while maintaining the oblique angle of the parallel light source, and continuous frame feature images are obtained during the irradiation process and set as the appearance verification image;

[0028] Perform one-to-one comparison analysis on the verified appearance image and the standard lighting appearance image in the shooting order, obtain the number of differences between the verified appearance image and the standard lighting appearance image, and set it as the re-inspection comparison index, obtain the maximum value of the defect comparison index and the re-inspection comparison index, and set the maximum value of the defect comparison index and the re-inspection comparison index as the maximum defect index, perform discriminant analysis on the maximum defect index, and generate a surface normal signal or a surface defect signal;

[0029] Interactively analyze the surface normal signal, surface defect signal, defect signal and false defect signal to obtain the normal output signal or re-inspection signal or defect output signal.

[0030] Preferably, the parameter deviation interference self-check analysis process of the tracking self-check unit is as follows:

[0031] The illumination information corresponding to the standard illumination appearance image acquisition period is set as the standard illumination information, and the illumination information includes light intensity and light brightness. The illumination information corresponding to the illumination appearance image or verification appearance image acquisition period is set as the actual illumination information. The actual illumination information is compared and analyzed with the standard illumination information. If there is a difference between the actual illumination information and the standard illumination information, an interference signal is generated. If there is no difference between the actual illumination information and the standard illumination information, a standard signal is generated.

[0032] The beneficial effects of the present invention are as follows:

[0033] (1) The present invention uses preliminary image analysis to understand whether there are suspected defects on each surface of the electronic component to be detected, so as to further perform defect detection on the appearance of the electronic component to be detected, and uses information feedback to analyze the suspected surface of the electronic component to be detected by laser scanning and optical inspection, thereby accurately analyzing the appearance defects of each surface of the electronic component to be detected;

[0034] (2) The present invention analyzes whether there are defects on the suspicious surface by optical inspection, thereby helping to improve the accuracy and effectiveness of the appearance defect detection of the electronic components to be inspected, and repeats the inspection by adjusting the illumination angle during the optical inspection, thereby helping to reduce the occurrence of randomness in the detection and improve the accuracy of the analysis results. Through information interaction analysis, it is possible to accurately analyze whether there are appearance defects on the suspicious surface, and through information feedback, the appearance defect conditions of each surface of the electronic components to be inspected can be intuitively understood, thereby helping to carry out targeted management of the defective surfaces and improving the defect detection efficiency. At the same time, the illumination information is subjected to parameter deviation interference self-inspection analysis to understand whether the operating status of the parallel light source is consistent during the detection process, so as to reduce the interference of the parallel light source on the detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] The present invention will be further described below in conjunction with the accompanying drawings;

[0036] Figure 1 It is a flowchart of the system of the present invention;

[0037] Figure 2 It is a reference schematic diagram of the method of the present invention;

[0038] Figure 3This is a reference analysis diagram for implementing the second embodiment of the present invention. DETAILED DESCRIPTION

[0039] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0040] Embodiment 1:

[0041] See also Figure 1 to Figure 2 As shown, the present invention is an electronic component appearance defect detection system, including an appearance defect detection platform, an image recognition unit, a scanning recognition unit, an illumination verification and analysis unit, a tracking self-inspection unit and a display feedback unit, the appearance defect detection platform is connected to the image recognition unit in a one-way communication, the image recognition unit is connected to the scanning recognition unit in a one-way communication, the scanning recognition unit is connected to the illumination verification and analysis unit in a one-way communication, the tracking self-inspection unit is connected to the illumination verification and analysis unit and the display feedback unit in a one-way communication, and the illumination verification and analysis unit is connected to the display feedback unit in a one-way communication;

[0042] The appearance defect detection platform is used to collect surface data of electronic components to be detected, and send the surface data to the image recognition unit. After receiving the surface data, the image recognition unit immediately performs a surface preliminary identification supervision feedback analysis on the surface data to understand whether there are suspicious defects on each surface of the electronic components to be detected, so as to further perform defect detection on the appearance of the electronic components to be detected. The specific surface preliminary identification supervision feedback analysis process is as follows:

[0043] Take appearance images of the electronic components to be inspected according to the set shooting plan;

[0044] The appearance feature images of each view of the electronic component to be inspected are obtained, and the appearance feature images of each view are compared with the corresponding preset standard appearance feature images:

[0045] If there is a difference between the appearance feature image and the preset standard appearance feature image, a suspicious signal is generated;

[0046] If there is no difference between the appearance feature image and the preset standard appearance feature image, no signal is generated;

[0047] When a suspicious signal is generated, the scanning and identification unit is used to respond to the suspicious signal and perform surface scanning comparison analysis by laser scanning, so as to further analyze whether there are defects on the suspicious surface of the electronic component to be inspected by laser scanning, so as to further determine the accuracy of the inspection result. The specific surface scanning comparison analysis process is as follows:

[0048] The appearance feature image corresponding to the suspicious signal is set as the suspicious appearance view, and the appearance scanning image of the suspicious appearance view is further obtained by laser scanning;

[0049] Obtaining appearance scanning images of various views of standard electronic components obtained by laser scanning, and setting the appearance scanning images of various views of standard electronic components obtained by laser scanning as standard scanning images;

[0050] Obtain the standard scan image corresponding to the suspicious appearance view, set the standard scan image corresponding to the suspicious appearance view as the comparison scan image, and perform a difference comparison analysis between the appearance scan image and the comparison scan image:

[0051] If there is a difference between the appearance scan image and the comparison scan image, a defect signal is generated;

[0052] If there is no difference between the appearance scan image and the comparison scan image, a false defect signal is generated.

[0053] Embodiment 2:

[0054] When a suspicious signal is generated, the illumination verification and analysis unit is used to respond to the suspicious signal and the standard signal, and perform illumination view comparison verification and analysis, so as to analyze whether there are defects on the suspicious surface by optical inspection, thereby helping to improve the accuracy and effectiveness of the appearance defect detection of the electronic components to be inspected. The specific illumination view comparison verification and analysis process is as follows:

[0055] Obtain the suspicious surface of the electronic component to be detected corresponding to the suspicious signal, place the suspicious surface of the electronic component to be detected upward, illuminate the suspicious surface of the electronic component to be detected by obliquely irradiating a parallel light source, and move and illuminate the suspicious surface of the electronic component to be detected at a set speed and at a maintained oblique angle of the parallel light source. During the irradiation process, obtain continuous frame feature images and set them as the illuminated appearance image;

[0056] In the same way, a parallel light source is irradiated on the same surface of the standard electronic component corresponding to the suspicious appearance view, and the same surface of the standard electronic component is moved and irradiated at a set speed and at a maintained oblique angle of the parallel light source. During the irradiation process, a continuous frame feature image is obtained and set as the standard illumination appearance image;

[0057] Perform one-to-one comparison analysis on the illuminated appearance image and the standard illuminated appearance image in the order of shooting, determine whether there is a difference between the illuminated appearance image and the standard illuminated appearance image, obtain the number of images with differences between the illuminated appearance image and the standard illuminated appearance image, and set it as the defect comparison index;

[0058] The oblique angle of the parallel light source is changed according to the set angle, and the same surface of the standard electronic component is moved and irradiated again at the set speed and while maintaining the oblique angle of the parallel light source. During the irradiation process, continuous frame feature images are obtained and set as the appearance verification image;

[0059] In the embodiment of the present invention, the oblique angle of the parallel light source is changed to be 0° to 90°, and is different from the first angle. The specific change angle is subject to the setting of the person.

[0060] Perform one-to-one comparison analysis on the appearance verification image and the appearance image under standard lighting according to the shooting order, obtain the number of differences between the appearance verification image and the appearance image under standard lighting, and set it as the re-inspection comparison index, obtain the maximum value of the defect comparison index and the re-inspection comparison index, and set the maximum value of the defect comparison index and the re-inspection comparison index as the maximum defect index, and perform discriminant analysis on the maximum defect index:

[0061] If the maximum defect index is equal to zero, a surface normal signal is generated;

[0062] If the maximum defect index is not equal to zero, a surface defect signal is generated;

[0063] Interactive analysis of normal surface signals, surface defect signals, defect signals, and false defect signals:

[0064] If a surface normal signal and a false defect signal are generated, a normal output signal is obtained;

[0065] If a surface normal signal and a defect signal or a surface defect signal and a false defect signal are generated, a retest signal is obtained;

[0066] If a surface defect signal and a defect signal are generated, a defect output signal is obtained, and the normal output signal, the re-inspection signal and the defect output signal are sent to the display feedback unit. After receiving the normal output signal, the re-inspection signal and the defect output signal, the display feedback unit immediately displays the preset warning text corresponding to the normal output signal, the re-inspection signal and the defect output signal, so as to intuitively understand the appearance defect conditions of each surface of the electronic components to be detected, thereby facilitating targeted management of the surfaces with defects and helping to improve the efficiency of defect detection;

[0067] The tracking self-test unit is used to collect the irradiation information of the parallel light source and perform parameter deviation interference self-test analysis on the irradiation information to understand whether the operation of the parallel light source is consistent during the detection process, so as to reduce the interference of the parallel light source on the detection. The specific parameter deviation interference self-test analysis process is as follows:

[0068] The illumination information corresponding to the standard illumination appearance image acquisition period is set as the standard illumination information, and the illumination information includes light intensity, light brightness, etc. The illumination information corresponding to the illumination appearance image or verification appearance image acquisition period is set as the actual illumination information, and the actual illumination information is compared and analyzed with the standard illumination information. If there is a difference between the actual illumination information and the standard illumination information, an interference signal is generated. If there is no difference between the actual illumination information and the standard illumination information, a standard signal is generated, and the standard signal is sent to the illumination verification and analysis unit, and the interference signal is sent to the display feedback unit. After receiving the interference signal, the display feedback unit immediately displays the preset warning text corresponding to the interference signal, so as to manage and adjust the interference existing in the detection process, so as to reduce the influence of interference factors on the detection results, thereby helping to improve the accuracy of the detection results.

[0069] Embodiment three:

[0070] A method for detecting appearance defects of electronic components comprises the following steps:

[0071] Step 1: Collect surface data of the electronic components to be tested and substitute it into step 2 for preliminary surface identification and supervision feedback analysis;

[0072] Step 2: Perform preliminary surface recognition and supervision feedback analysis by means of information feedback, compare the appearance feature images of each view with the corresponding preset standard appearance feature images, and obtain suspicious signals, then proceed to steps 3 and 4;

[0073] Step 3: Perform surface scanning comparison analysis by laser scanning, compare and analyze the appearance scanning image with the comparison scanning image to obtain defect signals or false defect signals;

[0074] Step 4: Perform illumination view comparison and verification analysis in a progressive manner to obtain the number of images with differences between the illumination appearance image and the standard illumination appearance image, and set it as the defect comparison index. Further repeatability monitoring and analysis is performed to obtain a surface normal signal or a surface defect signal.

[0075] Step 5: Interactively analyze the surface normal signal, surface defect signal, defect signal and false defect signal. If a normal output signal, a re-inspection signal or a defect output signal is obtained, input feedback management;

[0076] Step 6: Collect the irradiation information of the parallel light source and perform parameter deviation interference self-check analysis to determine whether the operating status of the parallel light source is consistent. If a standard signal or interference signal is obtained, input feedback management;

[0077] In summary, the present invention uses preliminary image analysis to understand whether there are suspicious defects on each surface of the electronic component to be detected, so as to further perform defect detection on the appearance of the electronic component to be detected, and uses information feedback to analyze the suspicious surface of the electronic component to be detected by laser scanning and optical inspection, so as to accurately analyze the appearance defects of each surface of the electronic component to be detected, and uses laser scanning to perform surface scanning comparison analysis on the suspicious surface of the electronic component to be detected, so as to further determine the accuracy of the detection result, and uses optical inspection to analyze whether there are defects on the suspicious surface, so as to help improve the accuracy and effectiveness of the appearance defect detection of the electronic component to be detected, and in the process of optical inspection, the illumination angle is adjusted to perform repeated re-inspections, so as to help reduce the occurrence of accidental detection, and help improve the accuracy of the analysis results, and uses information interaction analysis to accurately analyze whether there are appearance defects on the suspicious surface, and uses information feedback to intuitively understand the appearance defects of each surface of the electronic component to be detected, so as to help carry out targeted management of the defective surface, and at the same time help to improve the defect detection efficiency, and at the same time, the illumination information is subjected to parameter deviation interference self-inspection analysis to understand whether the operating state of the parallel light source is consistent during the detection process, so as to reduce the interference of the parallel light source on the detection.

[0078] The threshold is set to facilitate comparison. The size of the threshold depends on the amount of sample data and the number of bases set by technicians in this field for each group of sample data; as long as it does not affect the proportional relationship between the parameter and the quantized value.

[0079] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. An electronic component appearance defect detection system, characterized in that: It includes appearance defect detection platform, image recognition unit, scanning recognition unit, illumination verification and analysis unit, tracking self-inspection unit and display feedback unit; The appearance defect detection platform is used to collect surface data of electronic components to be detected and send the surface data to the image recognition unit; After receiving the surface data, the image recognition unit immediately performs a surface preliminary recognition supervision feedback analysis on the surface data to obtain a suspicious signal; The scanning and identification unit is used to respond to suspicious signals and perform surface scanning comparison and analysis by laser scanning to obtain defect signals or false defect signals; The illumination verification and analysis unit is used to respond to suspicious signals and standard signals, and perform illumination view comparison verification and analysis, and send the obtained normal output signal or re-inspection signal or defect output signal to the display feedback unit; The tracking self-checking unit is used to collect the illumination information of the parallel light source, and perform parameter deviation interference self-checking analysis on the illumination information, and compare and analyze the obtained actual illumination information with the standard illumination information to obtain a standard signal or an interference signal.

2. The electronic component appearance defect detection system according to claim 1, characterized in that: The surface preliminary recognition supervision feedback analysis process of the image recognition unit is as follows: Take appearance images of the electronic components to be inspected according to the set shooting plan; The appearance feature images of each view of the electronic component to be inspected are obtained, and the appearance feature images of each view are compared with the corresponding preset standard appearance feature images: If there is a difference between the appearance feature image and the preset standard appearance feature image, a suspicious signal is generated; If there is no difference between the appearance feature image and the preset standard appearance feature image, no signal is generated.

3. The electronic component appearance defect detection system according to claim 2, characterized in that: The surface scanning comparison and analysis process of the scanning identification unit is as follows: The appearance feature image corresponding to the suspicious signal is set as the suspicious appearance view, and the appearance scanning image of the suspicious appearance view is further obtained by laser scanning; A standard scan image corresponding to the suspicious appearance view is acquired, and the standard scan image corresponding to the suspicious appearance view is set as a comparison scan image.

4. The electronic component appearance defect detection system according to claim 3, characterized in that: Obtain appearance scan images of various views of standard electronic components obtained by laser scanning, set the appearance scan images of various views of standard electronic components obtained by laser scanning as standard scan images, and perform difference comparison analysis between the appearance scan images and the comparison scan images: If there is a difference between the appearance scan image and the comparison scan image, a defect signal is generated; If there is no difference between the appearance scan image and the comparison scan image, a false defect signal is generated.

5. The electronic component appearance defect detection system according to claim 4, characterized in that: The illumination view comparison verification and analysis process of the illumination verification and analysis unit is as follows: Obtain the suspicious surface of the electronic component to be detected corresponding to the suspicious signal, place the suspicious surface of the electronic component to be detected upward, illuminate the suspicious surface of the electronic component to be detected by obliquely irradiating a parallel light source, and move and illuminate the suspicious surface of the electronic component to be detected at a set speed and at a maintained oblique angle of the parallel light source. During the irradiation process, obtain continuous frame feature images and set them as the illuminated appearance image; In the same way, a parallel light source is irradiated on the same surface of the standard electronic component corresponding to the suspicious appearance view, and the same surface of the standard electronic component is moved and irradiated at a set speed and at a maintained oblique angle of the parallel light source. During the irradiation process, a continuous frame feature image is obtained and set as the standard illumination appearance image; The illuminated appearance image and the standard illuminated appearance image are compared and analyzed one by one in the shooting order to determine whether there are differences between the illuminated appearance image and the standard illuminated appearance image, and the number of images with differences between the illuminated appearance image and the standard illuminated appearance image is obtained and set as the defect comparison index.

6. The electronic component appearance defect detection system according to claim 5, characterized in that: The oblique angle of the parallel light source is changed according to the set angle, and the same surface of the standard electronic component is moved and irradiated again at the set speed and while maintaining the oblique angle of the parallel light source. During the irradiation process, continuous frame feature images are obtained and set as the appearance verification image; Perform one-to-one comparison analysis on the verified appearance image and the standard lighting appearance image in the shooting order, obtain the number of differences between the verified appearance image and the standard lighting appearance image, and set it as the re-inspection comparison index, obtain the maximum value of the defect comparison index and the re-inspection comparison index, and set the maximum value of the defect comparison index and the re-inspection comparison index as the maximum defect index, perform discriminant analysis on the maximum defect index, and generate a surface normal signal or a surface defect signal; Interactively analyze the surface normal signal, surface defect signal, defect signal and false defect signal to obtain the normal output signal or re-inspection signal or defect output signal.

7. The electronic component appearance defect detection system according to claim 6, characterized in that: The parameter deviation interference self-check analysis process of the tracking self-check unit is as follows: The illumination information corresponding to the standard illumination appearance image acquisition period is set as the standard illumination information, and the illumination information includes light intensity and light brightness. The illumination information corresponding to the illumination appearance image or verification appearance image acquisition period is set as the actual illumination information. The actual illumination information is compared and analyzed with the standard illumination information. If there is a difference between the actual illumination information and the standard illumination information, an interference signal is generated. If there is no difference between the actual illumination information and the standard illumination information, a standard signal is generated.

8. A method for detecting appearance defects of electronic components, the method being applied to an electronic component appearance defect detection system as claimed in claim 7, characterized in that: The following steps are involved: Step 1: Collect surface data of the electronic components to be tested and substitute it into step 2 for preliminary surface identification and supervision feedback analysis; Step 2: Perform preliminary surface recognition supervision feedback analysis by means of information feedback, compare the appearance feature images of each view obtained with the corresponding preset standard appearance feature images, and obtain suspicious signals, then proceed to steps 3 and 4; Step 3: Perform surface scanning comparison analysis by laser scanning, compare and analyze the appearance scanning image with the comparison scanning image to obtain defect signals or false defect signals; Step 4: Perform illumination view comparison and verification analysis in a progressive manner to obtain the number of images with differences between the illumination appearance image and the standard illumination appearance image, and set it as the defect comparison index. Further repeatability monitoring and analysis is performed to obtain a surface normal signal or a surface defect signal. Step 5: Interactively analyze the surface normal signal, surface defect signal, defect signal and false defect signal. If a normal output signal, a re-inspection signal or a defect output signal is obtained, input feedback management; Step 6: Collect the illumination information of the parallel light source and perform parameter deviation interference self-check analysis to determine whether the operating status of the parallel light source is consistent. If a standard signal or an interference signal is obtained, input feedback management.

Images