System and method for measuring sample size

Abstract

The sample measuring apparatus includes: a jig; a single actuator configured to control the clamp to position the sample with a clamping force; a measurement probe configured to contact the clamped sample with a detection force; and a single position sensor configured to measure the size of the clamped sample according to the detection of the position of the measurement probe.

Description

[0001] Related Applications

[0002] This application claims the benefit of U.S. Provisional Patent Application Serial No. 63 / 359,085, filed on July 7, 2022, and entitled “SYSTEM AND METHOD FOR MEASURING SAMPLE DIMENSIONS.” The entire contents of U.S. Provisional Patent Application Serial No. 63 / 359,085 are expressly incorporated herein by reference. Technical Field

[0003] The present disclosure relates generally to test sample measurement systems and, more particularly, to systems and methods for measuring sample dimensions. Background Art

[0004] Materials testing systems, such as those that test samples for tension, compression, torsion, strain, displacement, and / or other properties, often use the physical dimensions of the test sample to determine the measurement results. Conventional measurements of physical dimensions may involve calipers or similar devices.

[0005] The limitations and disadvantages of the conventional methods will become apparent to those skilled in the art by comparing the conventional methods with the present disclosure as set forth in the remainder of this application with reference to the accompanying drawings. Summary of the invention

[0006] The present disclosure is directed to systems and methods for measuring sample dimensions, substantially as shown and / or described in at least one of the figures and as more fully set forth in the claims.

[0007] These and other advantages, aspects and novel features of the present disclosure, as well as details of illustrated examples thereof, will be more fully understood from the following description and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] Figure 1 An example of an automated test measurement system including a sample measurement device according to various aspects of the present disclosure is shown.

[0009] Figure 2 It can be used to implement Figure 1 A perspective view of an example of a sample measuring device of a sample measuring device.

[0010] Figure 3 yes Figure 2 Side view of the sample width gauge in the open position.

[0011] Figure 4 yes Figure 2 Top view of the sample width gauge in the open position.

[0012] Figure 5 yes Figure 2Top view of the sample width gauge in the fully clamped position.

[0013] Figure 6 yes Figure 2 Front view of the sample thickness gauge in the open position.

[0014] Figure 7 yes Figure 2 Side view of the sample thickness gauge in the open position.

[0015] Figure 8 yes Figure 2 Side view of the sample thickness gauge in the fully clamped position.

[0016] Fig. 9 yes Figure 2 Front view of the sample thickness gauge in the fully clamped position.

[0017] Fig.10 is a flow chart of example machine-readable instructions, which may be executed by Figure 2 An example processing circuit is implemented to use Figure 2-9 The sample measuring device performs the measuring process.

[0018] Figure 11A-1 1 shows the execution Fig.10 Example instruction period Figure 2-9 The action sequence of the sample measuring device.

[0019] Figure 12 is Figure 2 A block diagram of an exemplary embodiment of a computing device.

[0020] These figures are not necessarily drawn to scale. Where appropriate, the same or similar reference numbers are used in the figures to refer to similar or identical elements. DETAILED DESCRIPTION

[0021] Materials testing systems are used to measure the physical properties of material samples, such as tensile strength or compressive strength. In order to determine accurate measurements, it is also necessary to measure the dimensions of the material sample. Traditionally, sample size measurements can be performed manually (for example, using calipers) or automatically. Certain standards (such as ASTM D5947-18) specify specific conditions under which dimensions must be measured. However, traditional manual methods are labor intensive, which can increase costs and reduce throughput for testing applications with large sample volumes. In addition, traditional automated measurement equipment may lack accuracy, have a small sample size range, and be costly.

[0022] The disclosed example sample measurement devices can align and center a material sample with a measurement axis over a range of sample thicknesses and / or widths. In some disclosed examples, each measurement axis is driven using a single motor and only a single encoder is used for measurement. Using a single motor and a single encoder for each axis, the disclosed example sample measurement devices can align and center a sample with a measurement axis, firmly clamp the sample in place, and apply a repeatable probing force to both axes. The disclosed example sample measurement devices can be used as a stand-alone measurement device and / or as part of an automated material testing system.

[0023] The disclosed example sample measurement device includes: a sample width measuring instrument configured to measure the width dimension of a sample, the sample width measuring instrument including: a first measurement probe; a first clamp and a second clamp configured to clamp the sample aligned with the first measurement probe in response to actuation of at least one of the first clamp or the second clamp; a first actuator configured to actuate at least one of the first clamp or the second clamp; and a first position sensor configured to determine the position of the first measurement probe. The example sample measurement device also includes a sample thickness measuring instrument configured to measure the thickness dimension of the sample, the sample thickness measuring instrument including: a second measurement probe oriented perpendicular to the first measurement probe; a third clamp and a fourth clamp configured to clamp the sample aligned with the second measurement probe in response to actuation of at least one of the third clamp or the fourth clamp; a second actuator configured to actuate at least one of the third clamp or the fourth clamp and the second measurement probe; and a second position sensor configured to determine the position of the second measurement probe. The example sample measuring device further includes a processing circuit configured to: control the first actuator to clamp the first and second clamps on the sample and engage the first measurement probe with the sample; control the second actuator to clamp the third and fourth clamps on the sample and engage the second measurement probe with the sample; determine the width of the sample based on the first position sensor; and determine the thickness of the sample based on the second position sensor.

[0024] In some example sample measurement devices, the first actuator includes a dual-lead screw configured to actuate the first fixture and the first measurement probe in a first direction and actuate the second fixture in a second direction opposite to the first direction. In some example sample measurement devices, the first actuator further includes a motor configured to rotate the dual-lead screw, and the first sensor includes a current sensor configured to detect a motor current to determine whether the first force exceeds a first threshold force.

[0025] In some example sample measurement devices, the first measurement probe includes a first spring configured to apply a predetermined engagement force on the first measurement probe toward the sample. In some example sample measurement devices, the sample width gauge is configured to constrain the sample and clamp the sample in a predetermined position relative to the sample thickness gauge for a range of sample widths using a single actuator.

[0026] In some example sample measurement devices, the sample width measuring instrument is configured to measure the width of the sample in a horizontal direction. In some example sample measurement devices, the first fixture includes first and second arms located on opposite sides of the first measurement probe. In some example sample measurement devices, each of the sample thickness measuring instrument and the sample width measuring instrument includes only one position sensor. In some example sample measurement devices, the first fixture and the second fixture are configured to align the sample with the second measurement probe.

[0027] In some example sample measurement devices, the second actuator includes a dual-lead screw configured to actuate the third fixture and the third measurement probe in a first direction and actuate the fourth fixture in a second direction opposite to the first direction. In some example sample measurement devices, the second actuator further includes a motor configured to rotate the dual-lead screw, and the second sensor includes a current sensor configured to detect motor current to determine whether the second force exceeds a second threshold force.

[0028] In some example sample measurement devices, the first clamp is located above the second clamp, the first clamp includes a first spring configured to provide a first clamping force, the second clamp includes a second spring configured to provide a second clamping force, the second spring is preloaded so that the first clamp is configured to clamp the sample on a support surface before the second clamp engages with the sample, and the second clamping force is greater than the first clamping force. Some example sample measurement devices also include a support surface configured to position the sample before measurement, and the second clamping force is set so that the second clamp lifts the sample above the support surface before the second measurement probe engages with the sample. In some example sample measurement devices, the second measurement probe is configured to engage with the sample after clamping the sample.

[0029] In some example sample measurement devices, the sample thickness meter is configured to constrain and clamp the sample in a predetermined position using a single actuator for a range of sample thicknesses. In some example sample measurement devices, the clamping force between the first clamp and the second clamp is greater than the probing force between the first measurement sensor and the sample. In some example sample measurement devices, the sample width meter further includes a third measurement probe opposite to the first measurement probe, and the first position sensor is configured to measure the position of the first measurement probe relative to the third measurement probe when the first measurement probe and the third measurement probe each exert a probing force on the sample.

[0030] In some example sample measurement devices, the clamping force between the third clamp and the fourth clamp is greater than the probing force between the second measurement sensor and the sample. In some example sample measurement devices, the sample width measuring instrument further includes a third measurement probe opposite to the second measurement probe, and the second position sensor is configured to measure the position of the second measurement probe relative to the third measurement probe when the second measurement probe and the third measurement probe each exert a probing force on the sample.

[0031] In certain example sample measurement devices, the processing circuit is configured to control the first actuator to clamp the first and second clamps on the sample so that the sample is aligned with the second measurement probe; control the second actuator to clamp the third and fourth clamps on the sample; in response to at least one of the third clamp or the fourth clamp having clamped the sample, control the first actuator to release the first and second clamps from the sample; control the second actuator to align the sample with the first measurement probe through the third and fourth clamps and bring the second measurement probe into contact with the sample; and control the first actuator to clamp the first and second clamps on the sample and engage the first measurement probe with the sample.

[0032] Some example sample measurement devices further include: a first sensor configured to determine whether a first force on at least one of the first measurement probe, the first fixture, or the second fixture satisfies a first threshold force; and a second sensor configured to determine whether a second force on at least one of the second measurement probe, the third fixture, or the fourth fixture satisfies a second threshold force. In some example sample measurement devices, the processing circuit is configured to control at least one of the first actuator or the second actuator based on at least one of the first position sensor or the second position sensor. In some example sample measurement devices, the sample measurement device is configured to be added to a test system.

[0033] The disclosed example sample measurement device includes: a clamp; a single actuator configured to control the clamp to position a sample with a clamping force; a measurement probe configured to contact the clamped sample with a detection force; and a single position sensor configured to measure a dimension of the clamped sample based on detecting a position of the measurement probe.

[0034] In some example sample measurement devices, a single actuator, a measurement probe, and a single position sensor are configured to measure the width of the sample. In some example sample measurement devices, the single actuator includes a dual lead screw configured to actuate the clamp and the measurement probe in a first direction and actuate the second clamp in a second direction opposite to the first direction.

[0035] In certain example sample measurement devices, the single actuator further comprises a motor configured to rotate the dual lead screw, and further comprises a current sensor configured to detect a motor current to determine whether the first force exceeds a first threshold force. In certain example sample measurement devices, the measurement probe comprises a spring configured to apply a predetermined engagement force on the measurement probe to the sample.

[0036] Some example sample measurement devices further include processing circuitry configured to: control a single actuator to clamp the first and second clamps onto the sample and engage the measurement probe with the sample; and determine a width of the sample based on a single position sensor.

[0037] In some example sample measurement devices, the fixture is configured to constrain the sample with respect to the sample thickness gauge and clamp the sample in a predetermined position over the width of the sample using a single actuator. In some example sample measurement devices, the first fixture includes first and second arms located on opposite sides of the first measurement probe.

[0038] In some example sample measurement devices, a single actuator, a measurement probe, and a single position sensor are configured to measure the thickness of a sample. In some example sample measurement devices, the single actuator includes a dual lead screw configured to actuate a clamp and a measurement probe in a first direction and actuate a second clamp in a second direction opposite to the first direction.

[0039] In some example sample measurement devices, the second actuator further includes a motor configured to rotate the dual lead screw, and the single position sensor includes a current sensor configured to detect motor current to determine whether the second force exceeds the second threshold force. In some example sample measurement devices, the clamp is positioned above the second clamp, the clamp includes a first spring configured to provide a first clamping force, the second clamp includes a second spring configured to provide a second clamping force, and the second spring is pre-tensioned so that the clamp is configured to clamp the sample on the support surface before the second clamp engages the sample, and so that the second clamping force is greater than the first clamping force.

[0040] Some sample measurement devices further include a support surface configured to position the sample prior to measurement, and the second clamping force is configured to cause the second clamp to lift the sample above the support surface before the second measurement probe engages the sample. In some example sample measurement devices, the second measurement probe is configured to engage the sample after clamping the sample.

[0041] An example testing system is disclosed that includes a sample testing device configured to determine at least one mechanical property of a sample and a sample measuring device that measures at least one dimension of the sample using a single actuator and a single position sensor.

[0042] In certain such testing systems, the sample measurement device is configured to measure at least one of a width or a thickness of the sample.

[0043] Figure 1 An example of an automated test measurement system 100 is shown, which includes a sample measurement device 102 as well as a sample holder 104 and a sample testing device 106. The example automated test measurement system 100 also includes a sample manipulator 108, such as a robotic arm, for moving test samples between the sample holder 104, the sample measurement device 102, and the sample testing device 106.

[0044] The example sample holder 104 can be a rack or similar device on which samples can be loaded in a manner accessible to the robot 108. The example sample testing device 106 is configured to perform one or more mechanical tests or other tests on the test samples in the sample holder 104. For example, the sample testing device 106 can be a universal testing machine for performing tensile strength tests, compression strength tests, torsion or bending tests, peel tests, tear tests, friction tests, shear tests, and / or any other type of test. Examples of testing machines that can be used to implement the sample testing device 106 include the one provided by a division of Illinois ToolWorks Inc. The company has a business location in Norwood, Massachusetts.

[0045] In certain embodiments, the sample manipulator 108 removes the sample from the sample holder 104 and places it in a predetermined position in the sample measurement device 102. The sample measurement device 102 measures the thickness and width of the sample, as disclosed in detail below. The sample manipulator 108 can then remove the sample from the sample measurement device 102 and place it in the sample testing device 106.

[0046] Figure 2 is a perspective view of an exemplary sample measurement device 200, which can be used to implement Figure 1 The sample measuring device 102 in the sample measuring device 200. The sample measuring device 200 measures the cross-sectional dimensions (e.g., thickness and width) of the sample 202 placed on the supporting surface 204 of the sample measuring device 200. To this end, the sample measuring device 200 includes a sample width measuring instrument 206 and a sample thickness measuring instrument 208. The sample width measuring instrument 206 and the sample thickness measuring instrument 208 each include a clamp and a measuring probe, as well as a sensor for detecting a clamping force and an encoder for performing position measurement.

[0047] As described in detail below, the sample measurement device 200 includes only one actuator for each measurement axis and uses mechanical sequencing for all alignment, constraint and measurement steps. In order to comply with relevant measurement standards (such as ASTM D5947-18), the measurement force provided by the sample measurement device 200 is independent of the clamping force, and uses electromechanical control and springs to precisely, accurately and repeatably control clamping and positioning. The exemplary sample measurement device 200 can center or align the sample along two measurement axes, regardless of its size (as long as it is within the measurement range). Therefore, the sample measurement device 200 is suitable for many different samples and geometries within the measurement range.

[0048] To implement mechanical sequencing and perform measurements, the example sample measurement device 200 includes a computing device 210, such as a computer or similar processing device, for controlling the actuation of the sample width measurement device 206 and the sample thickness measurement device 208, and receiving, processing and / or storing sensor data related to feedback and / or measurement input. The example computing device 210 can be a stand-alone computing device, integrated into the sample measurement device 200, and / or as part of another component in the system 100 (e.g., the sample testing device 106), in communication with the sample measurement device 102.

[0049] The example sample thickness gauge 208 provides an asymmetric preload on the clamps of the sample thickness gauge 208, so that the top clamp always contacts and clamps the sample 202 to the support surface 204 first, and then the bottom clamp lifts the sample 202 from the support surface 204 to a predetermined measurement position. The clamping force provided by the sample thickness gauge 208 is proportional to the thickness of the sample 202.

[0050] The sample width gauge 206 and the sample thickness gauge 208 constrain the sample 202 during measurement while reducing (eg, minimizing, eliminating) deformation and deflection of the sample 202, thereby reducing measurement errors.

[0051] Figure 3 yes Figure 2 Side view of the mid-sample width gauge 206 in the open position. Figure 4 is a top view of the sample width measurement instrument 206 in the open position. Figure 5 is a top view of the sample width measurement instrument 206 in the fully clamped position. Figure 2 , a sample width meter 206 is shown together with a support surface 204 and a sample 202 .

[0052] The sample width measuring instrument 206 includes measuring probes 302 a , 302 b and clamps 304 a , 304 b , which are located on opposite sides of the supporting surface 204 . Figure 3-5The example fixtures 304a, 304b in FIG. 3 each include a clamping arm 306a, 306b, 306c, 306d, with the measurement probe 302a, 302b being located between a respective pair of clamping arms 306a-306d.

[0053] The measuring probes 302a, 302b and the clamps 304a, 304b are mounted and supported by respective carriages 308a, 308b, which are connected to the mounting rails 310 by bearings. The measuring probes 302a, 302b and the clamps 304a, 304b are actuated simultaneously by a dual lead screw 312, which is driven by a motor 314 (e.g., directly driven by a belt and pulley system, a gear system, etc.). The threads of the dual lead screw 312 are fed in opposite directions on different ends of the dual lead screw 312. When the dual lead screw 312 rotates, the dual lead screw 312 drives the carriages 308a, 308b and the measuring arm in opposite directions (e.g., closer to or farther away from each other depending on the actuation direction of the dual lead screw 312). However, in other examples, the dual lead screw 312 may be replaced with a single lead screw, and the carriages 308a, 308b may have opposite thread directions.

[0054] Example measuring probes 302a, 302b extend through fixtures 304a, 304b (e.g., between clamping arms 306a and 306b and clamping arms 306c and 306d) to contact sample 202. Measuring probes 302a, 302b are equipped with springs 314a, 314b, which provide measuring force to measuring probes 302a, 302b. Springs 314a, 314b are compressed between measuring probes 302a, 302b and fixtures 304a, 304b. However, other elastic devices can be used instead of springs 314a, 314b to provide the required detection force.

[0055] exist Figure 3-5 In an example of, the position sensor 316 determines the position of at least one measuring probe 302a, such as the distance between two measuring probes 302a, 302b. For example, the position sensor 316 can be an encoder attached to the slide 308a, used to determine the position along a measuring belt or measuring column coupled to the slide 308b to determine the distance between the measuring probes 302a, 302b. Other example position sensors 316 may include capacitive sensors, linear variable displacement transducers (LVDTs), laser displacement sensors, and / or any other type of position sensors. In some examples, multiple measurements obtained by the position sensor 316 can be filtered (e.g., averaged) to determine the measured dimension. The position sensor 316 and / or the computing device 210 can send the measurement results to an external system for recording, sample tracking, and / or any other purpose.

[0056] In some embodiments, the sample width measuring instrument 206 further includes a force sensor for determining whether the detection force on one or both measuring probes 302a, 302b is within a predetermined force range. When the detection force is within the predetermined force range, the measurement output of the position sensor 316 can be determined and stored as the width of the sample 202.

[0057] In operation, the dual lead screw 312 is actuated to close the clamps 304a, 304b onto the sample 202 on the support surface 204, which causes the clamps 304a, 304b to align the sample 202 with the probes 302a, 302b and to center the sample 202 with the probe of the sample thickness gauge 208. Figure 5 The clamps 304a, 304b are depicted in a closed position.Depending on the thickness of the sample, the measurement probes 302a, 302b may not make full contact with the sample 202, or may not even make partial contact, when the sample 202 is located on the support surface 204.

[0058] When the clamp 604a of the sample thickness measuring instrument 208 clamps the sample 202 against the support surface 204, the example dual lead screw 312 can be actuated in the opposite direction to disengage the clamps 304a, 304b from the sample 202. By disengaging the clamps 304a, 304b, the clamp of the sample thickness measuring instrument 208 can lift the sample 202 to a measurement position above the support surface 204. Then, the dual lead screw 312 can be actuated in the first direction to re-clamp the sample 202 with the clamps 304a, 304b and apply a probing force to the measurement probes 302a, 302b to perform width measurement. The measurement probes 302a, 302b contact or disengage with the sample 202 as the clamps 304a, 304b move, and the springs 314a, 314b apply a force to the measurement probes 302a, 302b. When the clamps 304a, 304b are in contact with the sample 202, the springs 314a, 314b apply a repeatable probing force to the measurement probes 302a, 302b against the sample 202 (eg, according to an associated measurement standard) that is independent of the clamping force.

[0059] At the conclusion of the measurement, dual lead screw 312 is actuated in the opposite direction to loosen sample 202 and allow additional measurements to be taken and / or sample 202 to be removed from sample measurement device 200 (eg, for transfer to a sample testing device).

[0060] Although Figure 3-5 The example sample width measuring instrument 206 in FIG. 4 includes two carriages 308a, 308b for supporting the clamps 304a, 304b and the measuring probes 302a, 302b, but in other examples, the clamps 304a, 304b may be provided with other carriages separate from the carriages supporting the measuring probes 302a, 302b.

[0061] In some other embodiments, the sample width gauge 206 may include one clamp coupled to an actuator (e.g., a lead screw) and a second clamp in a stationary position, rather than having clamps 304a, 304b actuated from opposite directions. In such examples, the sample thickness gauge 208 may also be configured to move with the actuated clamps of the sample width gauge 206, so that the sample thickness gauge 208 is aligned with the sample 202 when the sample width gauge 206 clamps the sample 202.

[0062] Figure 6 yes Figure 2 Front view of the sample thickness gauge 208 in the open position. Figure 7 is a side view of the sample thickness gauge 208 in the open position. Figure 8 is a side view of the sample thickness gauge 208 in the fully clamped position, Fig. 9 2 is a front view of the sample thickness gauge 208 in the fully clamped position. Figure 3-5 The sample width measuring instrument 206 in the embodiment of the present invention cooperates to align, position and measure the sample 202.

[0063] The example sample thickness measuring instrument 208 includes measuring probes 602a, 602b and clamps 604a, 604b. The measuring probes 602a, 602b and the clamps 604a, 604b are aligned with a measuring axis 606 of the sample thickness measuring instrument 208, and the measuring probes 602a, 602b are configured to apply a probing force to the sample 202 located on the support surface 204, which is also aligned with the measuring axis 606 of the sample thickness measuring instrument 208 due to the clamping of the clamps 304a, 304b.

[0064] The upper fixture 604a includes a clamping column 608a, which is located at the center of the load balancing platform 610a. The load balancing platform 610a is coupled to three or more pistons 612a, which apply a balancing force to the load balancing platform 610a to reduce or eliminate the moment of the upper fixture 604a on the sample 202. In some examples, the clamping column 608a and the load balancing platform 610a are implemented as a single integrated component. However, the clamping column 608a and the load balancing platform 610a can also be assembled into a rigid assembly.

[0065] The piston 612a is coupled to a carriage 614a which is connected to a mounting rail 616 via a bearing to maintain alignment with the measurement axis 606. The piston 612a is provided with a corresponding spring 618a which together apply a balanced clamping force to the head of the piston 612a and thus to the load balancing platform 610a, the clamping column 608a and the sample 202.

[0066] The clamping column 608a has a hole 609a through which the measurement probe 602a extends to contact the sample 202. The measurement probe 602a includes a spring 622a configured to provide a detection force within a predetermined range on the measurement probe 602a, which can be the same or different from the detection force range on the measurement probes 302a, 302b. The measurement probe 602a is mounted on the mounting rail 616 by a separate slide 614b, and the spring 622a is squeezed between the measurement probe 602a and the body 628a of the clamp 604a so that the detection force provided by the spring 622a is independent of the clamping force applied by the clamp 604a through the spring 618a. To this end, a dual lead screw 620 is coupled to the slide 614a to control the clamp 604a, but is not directly coupled to the slide 614b. The spring 622a provides a detection force to the measuring probe 602a through the movement of the carriage 614a and the push against the main body 628a of the clamp 604a. In this way, the detection force can be continuously established and is substantially unaffected by the clamping force applied by the clamp 604a.

[0067] The example lower clamp 604b is located on the other side of the sample 202 opposite the upper clamp 604a and includes similar components, such as a clamping column 608b, a load balancing platform 610b, a piston 612b and a spring 618b, which are mounted on a slide 614c. The load balancing platform 610b includes a hole 609b through which the measurement probe 602b extends to contact the sample 202.

[0068] The measuring probe 602b includes a spring 622b configured to provide a detection force on the measuring probe 602b within a predetermined detection force range, which can be the same or different from the detection force range on the measuring probes 302a, 302b. The measuring probe 602b is mounted on the mounting rail 616 via the slide 614d, and the spring 622b is squeezed between the measuring probe 602b and the body 628b of the fixture 604b so that the detection force provided by the spring 622b is independent of the clamping force applied by the fixture 604b via the spring 618b. The dual lead screw 620 is coupled to the slide 614c to control the fixture 604b, but is not directly connected to the slide 614d. The spring 622b provides the detection force for the measuring probe 602b through the movement of the slide 614c and the pushing of the body 628b of the fixture 604b. In this way, the probing force can be built up continuously and is substantially independent of the clamping force applied by the clamp 604b.Other resilient devices may be used in place of the springs 618a, 618b, 622a, 622b to provide the desired clamping and / or probing force.

[0069] The carriages 614a-614d are driven by a dual lead screw 620 in the same manner as Figure 3-5The dual lead screw 312 is similar to the carriages 308a, 308b. Figure 6-9 In the example of FIG. 1 , in response to the rotation of the dual lead screw 620 in a first direction, the slides 614a, 614b (e.g., the upper measurement probe 602a and the upper fixture 604a) are driven in the first direction, while the slides 614c, 614d (e.g., the lower measurement probe 602b and the lower fixture 604b) are driven in a second direction opposite to the first direction (e.g., to move the slides 614a, 614b toward the slides 614c, 614d). The rotation of the dual lead screw 620 in opposite directions causes the slides 614a, 614b and the slides 614c, 614d to move in opposite directions (e.g., to move the slides 614a, 614b away from the slides 614c, 614d).

[0070] The example sample thickness gauge 208 further includes a position sensor 624. Figure 3-5 In an example of, the position sensor 624 determines the position of at least one of the measuring probes 602a, 602b, such as the distance between the two measuring probes 602a, 602b. For example, the position sensor 624 can be attached to the carriage 614c and determine the position along a measuring belt or a measuring column coupled to the carriage 614d to determine the distance between the measuring probes 602a, 602b. In some embodiments, the sample thickness meter 208 further includes a force sensor to determine whether the probing force on one or both measuring probes 602a, 602b is within a predetermined force range. When the probing force is within the predetermined force range, the measurement output of the position sensor 624 can be determined and stored as the thickness of the sample 202. The position sensor 624 can be implemented according to any of the above examples with reference to the position sensor 316.

[0071] Figure 6-9 The dual lead screw 620 in is driven by a motor 626 (eg, directly via a belt and pulley system, a gear system, etc.).

[0072] exist Figure 6-9In the example of the embodiment, the lower clamp 604b is preloaded. For example, the piston 612a, 612b can be implemented by tightening or bolting the piston 612a, 612b to the slide 614a, 614c, whereby the initial load on the spring 618a, 618b can be set by tightening or loosening the piston 612a, 612b. By preloading the lower clamp 604b, the clamps 604a, 604b are configured to perform the following sequence: wherein (in response to actuation by the dual lead screw 620) the upper clamp 604a (before the lower clamp 604b contacts) contacts the sample 202, then the lower clamp 604b contacts the sample 202, and the preload force on the lower clamp 604b causes the lower clamp 604b to lift the clamped sample 202 above the support surface 204, at which time the forces between the lower clamp 604b and the upper clamp 604a are partially or completely equal.

[0073] The sequence further includes: after the clamps 604a, 604b move the sample 202 to the measurement position (e.g., above the support surface 204), the measurement probes 602a, 602b engage the sample 202. The clamps 604a, 604b also orient the sample 202 perpendicularly to the measurement probes 602a, 602b at the position of the measurement probes 602a, 602b. The sequence can be coordinated with the actuation of the measurement probes 302a, 302b and / or the clamps 304a, 304b of the example sample width measurement instrument 206. Figure 8 and Fig. 9 The example measurement probes 602a, 602b and clamps 604a, 604b are shown in a fully closed position with the sample 202 in a measurement position.

[0074] Although Figure 2-9 The examples in use a dual lead screw, but in other examples, the dual lead screw can be replaced by other types of actuators, such as synchronous levers, pneumatic actuators, hydraulic actuators, opposed belt drives and / or gears, and / or any other type of mechanism. In addition, or, while it is advantageous to use one encoder per measurement axis, one or both axes can use multiple encoders (e.g., one encoder per measurement probe) to perform measurements.

[0075] In certain embodiments, the sample measurement device 200 may include a sample detection sensor to automatically detect the presence of the sample 202 (e.g., on the support surface 204). In certain embodiments, the sample detection sensor provides an output upon detecting that the sample 202 is in a measurement position. The output may trigger an alarm or other output to notify an operator that a sample has been detected and / or that a measurement procedure is about to begin, and / or may trigger the initiation of a measurement sequence (e.g., by the computing device 210).

[0076] Additionally or alternatively, the sample detection sensor can be interlocked with the actuator so that the sample measurement device 200 can only be actuated when a sample is required to be detected. In some embodiments, the sample detection sensor is configured to detect the presence of the sample 202 in a manner that is not easily replicated by an operator's hand or other non-sample objects, such as by performing image recognition and / or presence detection at multiple locations spaced apart.

[0077] In some embodiments, the support surface 204 may include a platform or other actuator that moves the support surface 204 in a length direction of the aligned sample (e.g., orthogonal to the axes of the sample width gauge 206 and the sample thickness gauge 208). By moving the support surface 204 in the width direction, the sample measurement device 200 can take width and / or thickness measurements at multiple locations throughout the length of the sample 202.

[0078] In some embodiments, the actuators (e.g., motors 314, 626) are further equipped with actuator force sensors for detecting whether the force on one or both actuators is higher than a threshold force (e.g., higher than a configured clamping force). When it is detected that the force exceeds the threshold, the computing device 210 may control the actuators (e.g., motors 314, 626) to stop and / or reverse.

[0079] In some embodiments, the computing device 210 can control the actuator (e.g., motor 314, motor 626) based on the position measurement of the position sensor 316, 624. For example, the computing device 210 can control the speed of the actuator (e.g., motor 314, motor 626) based on the position measurement, such as by operating the actuator at a faster speed at a farther distance and operating the actuator at a slower speed when the position sensor 316, 624 detects that the clamp 304a, 304b and / or 604a, 604b is approaching the sample 202. For example, the computing device 210 can have one or more distance or position thresholds for controlling the speed range of the actuator. In addition or alternatively, when the sample 202 is clamped, when a subsequent clamping (e.g., subsequent measurement) of the same sample 202 is required, the computing device 210 can limit the distance that the clamp 304a, 304b and / or 604a, 604b moves after releasing the sample 202. By controlling the actuator based on the position detected by the position sensor 316 , 624 , the disclosed examples may reduce the time required to obtain sample measurements.

[0080] Fig.10 An example is given which can be Figure 2 The example computing device 210 performs to use Figure 2-9 A flow chart of example machine readable instructions for executing a measurement process of a sample measurement device 200. Figures 11A-11FThe example instructions 1000 are discussed with reference to the actuation sequence of the sample measurement device 200 shown in FIG. Fig.11A The sample width gauge 206 and the sample thickness gauge 208 are shown in an initial open position and the sample 202 may be placed on the support surface 204 .

[0081] In block 1002, computing device 210 controls a width actuator (eg, Figure 3 The motor 314 in the apparatus rotates a width dual lead screw (eg, dual lead screw 312) to close the width clamp (eg, clamps 304a, 304b, clamping arms 306a-306d) onto a sample (eg, sample 202 placed on support surface 204).

[0082] In block 1004, the computing device 210 determines whether the threshold width clamping force has been reached. For example, the computing device 210 may read the motor current of the motor 314 to determine the amount of force applied by the clamps 304a, 304b. If the threshold width clamping force has not been reached (block 1004), control returns to block 1002 to continue closing the width clamps 304a, 304b.

[0083] If the threshold width clamping force is reached (block 1004 ), at block 1006 , the computing device 210 stops the width actuator (eg, the motor 314 ). Fig. 11B The example sample measurement device 200 is shown at the end of block 1006 , with the width clamps 304 a , 304 b clamped onto the sample 202 .

[0084] In block 1008, the computing device 210 controls the thickness actuator (eg, Figure 6 The motor 626 in the thickness controller rotates the thickness dual lead screw (e.g., Figure 6 The dual lead screw 620 is used to allow the thickness fixture (e.g., Figure 6 The clamps 604a, 604b) are closed onto the sample 202.

[0085] In block 1010, the computing device 210 determines that a threshold thickness clamping force has been reached. For example, the computing device 210 may monitor a current sensor connected to measure the current in the motor 626 to determine the load or force on the clamps 604a, 604b. If the threshold thickness clamping force has not been reached (block 1010), control returns to block 1008 to continue closing the clamps 604a, 604b.

[0086] If the threshold thickness clamp force is reached (block 1010 ), at block 1012 , the computing device 210 stops the motor 626 . Fig. 11C The example sample measurement device 200 is shown at the end of block 1012 with the thickness fixtures 604 a , 604 b clamped onto the sample 202 .

[0087] In block 1014 , the computing device 210 controls the width actuator (eg, the motor 314 ) to rotate the width lead screw 312 to open the width clamps 304 a , 304 b . The actuation direction in block 1014 is opposite to the actuation direction in block 1002 .

[0088] At block 1016, the computing device 210 determines whether a threshold detection distance has been reached. For example, the computing device 210 may determine based on the position sensor 316 that the distance of the carriages 308a, 308b has increased by at least a threshold amount and / or the distance between the carriages 308a, 308b has reached at least a threshold since block 1006. If the threshold detection distance has not been reached (block 1016), control returns to block 1014 to continue controlling the width actuator (e.g., motor 314).

[0089] When at least the threshold detection distance is not reached (block 1016 ), computing device 210 stops the width actuator (eg, motor 314 ) in block 1018 . Fig.11D The example sample measurement device 200 is shown at the end of block 1016 , when the width clamps 304 a , 304 b have been released from the sample 202 .

[0090] In box 1020, the computing device 210 controls the thickness actuator (e.g., the motor 626) to rotate the thickness dual-lead screw 620 to close the thickness clamps 604a, 604b on the sample 202, lift the sample 202 above the support surface 204 (e.g., when at least one threshold clamping force has been reached based on the thickness of the sample 202), and move the thickness probes 602a, 602b toward the sample 202 (e.g., when the sample 202 is raised above the support surface 204 due to the balance of the clamping forces of the clamps 604a, 604b). Fig.11E The example sample measurement apparatus 200 is shown at the end of block 1020 , with the thickness clamps 604 a , 604 b clamping the sample 202 and raising it above the support surface 204 , and the thickness probes 602 a , 602 b engaging the sample 202 .

[0091] In block 1022, the computing device 210 determines whether a threshold thickness detection force has been reached. For example, the computing device 210 may determine whether the threshold detection force has been reached when at least one threshold clamping force is reached (e.g., based on the current of the motor 626). Additionally or alternatively, the computing device 210 may receive a measurement from a force sensor configured to read the force on one or both of the measuring probes 602a, 602b. If the threshold thickness detection force has not been reached (block 1022), control returns to block 1020 to continue controlling the thickness actuator (e.g., the motor 626). When the threshold thickness detection force (block 1022) is reached, at block 1024, the computing device 210 stops the thickness actuator (e.g., the motor 626).

[0092] In block 1026 , the computing device 210 controls the width actuator (eg, the motor 314 ) to rotate the width dual lead screw 312 to close the width clamps 304 a , 304 b onto the sample 202 . Fig.11F The example sample measurement device 200 is shown at the end of block 1026 , with the width clamps 304 a , 304 b having clamped the sample 202 and the width probes 302 a , 302 b having engaged the sample 202 .

[0093] In block 1028, the computing device 210 determines whether the threshold width clamping force has been reached. Block 1028 may be performed in a manner similar or identical to block 1004. If the threshold width clamping force has not been reached (block 1028), control returns to block 1026 to continue controlling the width actuator (e.g., motor 314). When the threshold width clamping force is reached (block 1028), at block 1030, the computing device 210 stops the width actuator (e.g., motor 314).

[0094] In block 1032, the computing device 210 measures the width of the sample 202 based on the signal from the sample width position sensor 316. In block 1034, the computing device 210 measures the thickness of the sample 202 based on the signal from the sample thickness position sensor 624. The position sensors 316, 624 may be calibrated to convert the measured position or distance to a corresponding distance between the probes 302a, 302b or 602a, 602b, which may be further based on the probing force measured by the force sensor coupled to the probes 302a, 302b and / or the probes 602a, 602b.

[0095] The example instructions 1000 end here. In some examples, the computing device 210 can control the actuators (e.g., motors 314, 626) to reverse the above sequence to return the sample 202 to the workbench and release the sample 202 to remove the sample 202 (e.g., manually and / or by the sample manipulator 108).

[0096] Figure 12 is Figure 2 2 is a block diagram of an example implementation of a computing device 210. The example computing device 210 may be a general purpose computer, a laptop, a tablet, a mobile device, a server, an all-in-one computer, and / or any other type of computing device.

[0097] The example computing device 210 in FIG. 12 includes a processor 1202. The example processor 1202 may be any general-purpose central processing unit (CPU) from any manufacturer. In some other examples, the processor 1202 may include one or more special-purpose processing units, such as a RISC processor with an ARM core, a graphics processing unit, a digital signal processor, and / or a system on a chip (SoC). The processor 1202 executes machine-readable instructions 1204, which may be stored locally in the processor (e.g., in an included cache or SoC), in a random access memory 1206 (or other volatile memory), in a read-only memory 1208 (or other non-volatile memory, such as flash memory), and / or in a mass storage device 1210. The example mass storage device 1210 may be a hard disk drive, a solid-state storage drive, a hybrid drive, a RAID array, and / or any other mass data storage device.

[0098] The bus 1212 is used for communication between the processor 1202 , the RAM 1206 , the ROM 1208 , the mass storage device 1210 , the network interface 1214 , and / or the input / output interface 1216 .

[0099] The example network interface 1214 includes hardware, firmware, and / or software for connecting the computing device 210 to a communication network 1218 (e.g., the Internet). For example, the network interface 1214 may include wireless and / or wired communication hardware compliant with the IEEE 1202.X standard for sending and / or receiving communications.

[0100] The example I / O interface 1216 of FIG. 12 includes hardware, firmware, and / or software for connecting one or more input / output devices 1220 to the processor 1202 to provide input to and / or output from the processor 1202. For example, the I / O interface 1216 may include a graphics processing unit for interfacing with a display device, a universal serial bus port for interfacing with one or more USB compatible devices, a firewire, a fieldbus, and / or any other type of interface. The example computing device 210 includes a display device 1224 (e.g., a liquid crystal display) connected to the input / output interface 1216. Other example I / O devices 1220 may include a keyboard, a keypad, a mouse, a trackball, a pointing device, a microphone, an audio speaker, a display device, an optical media drive, a multi-touch screen, a gesture recognition interface, a magnetic media drive, and / or any other type of input and / or output device.

[0101] The example computing device 210 may access non-transitory machine-readable media 1222 via the I / O interface 1216 and / or the I / O device 1220. Examples of the machine-readable media 1222 in FIG. 12 include optical disks (e.g., compact disks (CDs), digital versatile / video disks (DVDs), Blu-ray disks, etc.), magnetic media (e.g., floppy disks), portable storage media (e.g., portable flash drives, secure digital (SD) cards, etc.), and / or any other type of removable and / or installed machine-readable media.

[0102] The disclosed sample measurement devices can be built into or integrated with a test system and / or can be used as an add-on module for a test system. For example, the example sample measurement devices disclosed herein can be mounted on the same frame as a general test device or other test system, so that the same computing device or other processing and / or control circuit can control both the sample measurement process and the sample testing process. Alternatively, the disclosed example sample measurement devices can be connected or placed near a test system to facilitate access to samples and transfer of samples between the sample measurement device and the test system.

[0103] The present method and / or system may be implemented in hardware, software, or a combination of hardware and software. The present method and / or system may be implemented in a centralized manner in at least one computing system, or in a distributed manner in which different elements are distributed in multiple interconnected computing and / or remote computing systems. Any type of computing system or other device suitable for executing the methods described herein is suitable. A typical combination of hardware and software may be a general-purpose computing system, which contains a program or other code, which, when loaded and executed, controls the computing system to execute the methods described herein. Another typical implementation may be a dedicated integrated circuit or chip. Certain implementations may include a non-temporary machine-readable (e.g., computer-readable) medium (e.g., a flash drive, an optical disk, a magnetic storage disk, or similar medium), in which one or more instructions (e.g., lines of code) executable by a machine are stored, so that the machine executes the process described herein.

[0104] As used herein, the terms "for example" and "such as" are used to list one or more non-limiting examples, instances, or illustrations.

[0105] As used herein, the terms "coupled", "coupled to", and "coupled with" refer to structural and / or electrical connections, including attaching, attaching, connecting, combining, fastening, associating, and / or otherwise securing, respectively. The term "attached" as used herein refers to attaching, connecting, connecting, combining, fastening, associating, and / or otherwise securing. The term "connected" as used herein refers to attaching, attaching, connecting, combining, fastening, associating, and / or otherwise securing.

[0106] As used herein, "circuit" and "circuitry" refer to physical electronic components (i.e., hardware) and any software and / or firmware ("code") that configure, are executed by, and / or are otherwise associated with the hardware. For example, a particular processor and memory as used herein may constitute a first "circuit" when executing a first line or more lines of code, and may constitute a second "circuit" when executing a second line or more lines of code. For purposes of this specification, a circuit is "operable" and / or "configurable" to perform a function so long as the circuit contains the necessary hardware and / or code (if necessary) to perform that function, regardless of whether the function is disabled or enabled (e.g., via a user-configurable setting, factory configuration, etc.).

[0107] As used herein, control circuitry may include digital and / or analog circuits, discrete and / or integrated circuits, microprocessors, DSPs, etc., software, hardware and / or firmware located on one or more circuit boards, which constitute part or all of a controller and / or are used to control a welding process and / or equipment such as a power supply or wire feeder.

[0108] The term "processor" as used herein refers to a processing device, apparatus, program, circuit, component, system and subsystem, whether implemented in the form of hardware, tangible software or both, and whether or not programmable. The term "processor" as used herein includes, but is not limited to, one or more computing devices, hard-wired circuits, signal modification devices and systems, devices and machines for controlling systems, central processing units, programmable devices and systems, field programmable gate arrays, application-specific integrated circuits, systems on chips, systems containing discrete components and / or circuits, state machines, virtual machines, data processors, processing facilities, and any combination thereof. The processor may be any type of general-purpose microprocessor or microcontroller, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a graphics processing unit (GPU), a reduced instruction set computer (RISC) processor with an advanced reduced instruction set computer (RISC) core, and the like. The processor may be connected and / or integrated with a storage device.

[0109] As used herein, "memory", "memory circuit" and / or "memory device" refers to computer hardware or circuitry for storing information for use by a processor and / or other digital device. The memory, storage circuit and / or storage device may be any suitable type of computer memory or any other type of electronic storage medium, such as read-only memory (ROM), random access memory (RAM), cache, compact disk read-only memory (CDROM), electro-optical memory, magneto-optical memory, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), computer-readable medium, or the like. The memory may include, for example, nonvolatile memory, nonvolatile processor-readable medium, nonvolatile computer-readable medium, nonvolatile memory, dynamic random access memory (DRAM), volatile memory, ferroelectric random access memory (FRAM), first-in, first-out (FIFO) memory, last-in, first-out (LIFO) memory, stack memory, nonvolatile random access memory (NVRAM), static random access memory (SRAM), cache, buffer, semiconductor memory, magnetic memory, optical memory, flash memory, flash memory card, compact flash memory card, memory card, secure digital memory card, micro card, mini card, expansion card, smart card, memory stick, multimedia card, picture card, flash memory, subscriber identity module (SIM) card, hard disk (HDD), solid state drive (SSD), etc. The memory may be configured to store code, instructions, applications, software, firmware, and / or data, and may be external to the processor, internal to the processor, or both.

[0110] In this specification, "and / or" means any one or more items in a list connected by "and / or". For example, "x and / or y" means any element in the three-element set {(x), (y), (x, y)}. In other words, "x and / or y" means "one or both of x and y". As another example, "x, y and / or z" refers to any element in the seven-tuple set {(x), (y), (z), (x, y), (x, z), (y, z), (x, y, z)}. In other words, "x, y and / or z" means "one or more of x, y and z". As used herein, the term "exemplary" refers to an example, instance or illustration that is non-limiting. As used herein, words such as "for example" and "for example" are used to introduce a list of one or more non-limiting examples, instances or illustrations.

[0111] Although the present method and / or system has been described with reference to certain embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the scope of the present method and / or system. For example, the modules and / or components of the disclosed embodiments may be combined, split, rearranged and / or otherwise modified. In addition, many modifications may be made to specific situations or materials to accommodate the contents of the present disclosure without exceeding the scope thereof. Therefore, the present method and / or system is not limited to the specific embodiments disclosed. On the contrary, the present method and / or system will include all embodiments within the scope of the appended claims, including embodiments in the literal sense and under the principle of equivalents.

Claims

1. A sample measuring device, comprising: Fixtures; a single actuator configured to control the clamp to position the sample with a clamping force; a measuring probe configured to contact the clamped sample with a probing force; as well as A single position sensor is configured to measure a dimension of a clamped sample based on detecting a position of the measurement probe.

2. The sample measuring device according to claim 1, wherein: The single actuator, the measurement probe, and the single position sensor are configured to measure a width of the sample.

3. The sample measuring device according to claim 2, wherein: The single actuator includes a dual lead screw configured to actuate the clamp and the measurement probe in a first direction and to actuate the second clamp in a second direction opposite to the first direction.

4. The sample measuring device according to claim 3, wherein: The single actuator further includes a motor configured to rotate the dual-lead screw, and further includes a current sensor configured to detect motor current to determine whether the first force exceeds the first threshold force.

5. The sample measuring device according to claim 2, wherein: The measurement probe comprises a spring configured to exert a predetermined engagement force on the measurement probe towards the sample.

6. The sample measurement device according to claim 2, further comprising a processing circuit, wherein the processing circuit is configured to: controlling the single actuator to clamp the first and second clamps onto a sample and engage the measurement probe with the sample; and The width of the sample is determined from the single position sensor.

7. The sample measurement apparatus of claim 2, wherein the fixture is configured to constrain and clamp the sample in a predetermined position relative to a sample thickness gauge using a single actuator to measure a range of sample widths.

8. The sample measurement device according to claim 2, wherein the first fixture includes a first arm and a second arm located on opposite sides of the first measurement probe.

9. The sample measuring device according to claim 1, wherein: The single actuator, the measurement probe, and the single position sensor are configured to measure a thickness of the sample.

10. The sample measuring device according to claim 9, wherein: The single actuator includes a dual lead screw for actuating the clamp and the measurement probe in a first direction and actuating the second clamp in a second direction opposite to the first direction.

11. The sample measurement device of claim 10, wherein the second actuator further comprises a motor configured to rotate a dual-lead screw, and the single position sensor comprises a current sensor configured to detect motor current to determine whether the second force exceeds the second threshold force.

12. The sample measurement device of claim 10, wherein the clamp is located above a second clamp, the clamp comprising a first spring configured to provide a first clamping force, and the second clamp comprising a second spring configured to provide a second clamping force, and the second spring is pre-tensioned so that the clamps are configured to clamp the sample to a support surface before the second clamp engages the sample, and the second clamping force is greater than the first clamping force.

13. The sample measurement device of claim 12, further comprising a support surface configured to place a sample prior to measurement, and the second clamping force is configured such that the second clamp lifts the sample above the support surface before the second measurement probe engages the sample.

14. The sample measurement device of claim 12, wherein the second measurement probe is configured to engage the sample after the sample is clamped.

15. A sample measuring device, comprising: A sample width measuring instrument, configured to measure the width dimension of the sample, the sample width measuring instrument comprising: A first measuring probe; a first clamp and a second clamp configured to clamp the sample in alignment with the first measurement probe in response to actuation of at least one of the first clamp or the second clamp; a first actuator configured to actuate at least one of the first clamp or the second clamp; and a first position sensor configured to determine a position of the first measurement probe; A sample thickness measuring instrument, configured to measure the thickness dimension of a sample, the sample thickness measuring instrument comprising: a second measuring probe oriented perpendicularly to the first measuring probe; a third clamp and a fourth clamp configured to clamp the sample in alignment with the second measurement probe in response to actuation of at least one of the third clamp or the fourth clamp; a second actuator configured to actuate at least one of the third fixture or the fourth fixture and the second measurement probe; and a second position sensor configured to determine a position of the second measurement probe; and Processing circuit, configured as: controlling the first actuator to clamp the first and second clamps on the sample and engage the first measurement probe with the sample; controlling the second actuator to clamp the third and fourth clamps on the sample and engage the second measurement probe with the sample; determining a width of the sample based on the first position sensor; and The thickness of the sample is determined based on the second position sensor. 16 . The sample measurement device of claim 15 , wherein the first actuator comprises a dual-lead screw configured to actuate the first clamp and the first measurement probe in a first direction and actuate the second clamp in a second direction opposite to the first direction.

17. The sample measurement device of claim 16, wherein the first actuator further comprises a motor configured to rotate a dual lead screw, and the first sensor comprises a current sensor configured to detect motor current to determine whether the first force exceeds the first threshold force.

18. The sample measurement device of claim 15, wherein the first measurement probe comprises a first spring configured to exert a predetermined engagement force on the first measurement probe toward the sample.

19. The sample measurement apparatus of claim 15, wherein the sample width gauge is configured to constrain and clamp the sample at a predetermined position relative to the sample thickness gauge using the single actuator to measure a range of sample widths.

20. The sample measuring device according to claim 15, wherein the sample width measuring instrument is configured to measure a width of the sample along a horizontal direction.

21. The sample measurement device of claim 15, wherein the first fixture comprises a first arm and a second arm located on opposite sides of the first measurement probe.

22. The sample measurement device of claim 15, wherein the sample thickness measurement instrument and the sample width measurement instrument each include only one position sensor.

23. The sample measurement device of claim 15, wherein the first fixture and the second fixture are configured to align the sample with the second measurement probe.

24. The sample measurement device of claim 15, wherein the second actuator comprises a dual-lead screw configured to actuate the third clamp and the third measurement probe in a first direction and actuate the fourth clamp in a second direction opposite to the first direction.

25. The sample measurement device of claim 24, wherein the second actuator further comprises a motor configured to rotate a dual lead screw, and the second sensor comprises a current sensor configured to detect motor current to determine whether the second force exceeds the second threshold force.

26. The sample measurement device of claim 15, wherein the first clamp is located above the second clamp, the first clamp comprises a first spring configured to provide a first clamping force, the second clamp comprises a second spring configured to provide a second clamping force, and the second spring is pre-tensioned, so that the first clamp is configured to clamp the sample to a support surface before the second clamp engages with the sample, and the second clamping force is greater than the first clamping force.

27. The sample measurement device of claim 26, further comprising a support surface configured to position the sample prior to measurement, and the second clamping force is configured such that the second clamp lifts the sample above the support surface before the second measurement probe engages the sample.

28. The sample measurement device of claim 26, wherein the second measurement probe is configured to engage the sample after the sample is clamped.

29. The sample measurement device of claim 15, wherein the sample thickness gauge is configured to constrain and clamp the sample in a predetermined position using a single actuator to measure a range of sample thicknesses.

30. The sample measurement device of claim 15, wherein a clamping force between the first clamp and the second clamp is greater than a detection force between the first measurement sensor and the sample.

31. The sample measuring device of claim 30, wherein the sample width measuring instrument further comprises a third measuring probe opposite to the first measuring probe, and the first position sensor is configured to measure a position of the first measuring probe relative to the third measuring probe when the first measuring probe and the third measuring probe each apply a probing force to the sample.

32. The sample measurement device of claim 15, wherein a clamping force between the third clamp and the fourth clamp is greater than a detection force between the second measurement sensor and the sample.

33. The sample measuring device according to claim 32, wherein the sample width measuring instrument further comprises a third measuring probe opposite to the second measuring probe, and the second position sensor is configured to measure the position of the second measuring probe relative to the third measuring probe when the second measuring probe and the third measuring probe each apply a probing force to the sample.

34. The sample measurement device of claim 15, wherein the processing circuit is configured to: controlling the first actuator to clamp the first and second clamps on the sample so as to align the sample with the second measurement probe; controlling the second actuator to clamp the third and fourth clamps onto the sample; In response to at least one of the third clamp or the fourth clamp clamping the sample, controlling the first actuator to release the first clamp and the second clamp from the sample; controlling the second actuator to align the sample with the first measurement probe through the third and fourth clamps and to move the second measurement probe to contact the sample; as well as The first actuator is controlled to clamp the first and second clamps onto the sample and engage the first measurement probe with the sample.

35. The sample measurement device of claim 15, further comprising: a first sensor configured to determine whether a first force applied to at least one of the first measurement probe, the first fixture, or the second fixture satisfies a first threshold force; as well as A second sensor is configured to determine whether a second force applied to at least one of the second measurement probe, the third fixture, or the fourth fixture satisfies a second threshold force.

36. The sample measurement device of claim 15, wherein the processing circuit is configured to control at least one of the first actuator or the second actuator based on at least one of the first position sensor or the second position sensor.

37. The sample measurement device of claim 15, wherein the sample measurement device is configured to be added to a testing system.

38. A testing system comprising: a sample testing device configured to determine at least one mechanical property of the sample; as well as A sample measurement device for measuring at least one dimension of a sample using a single actuator and a single position sensor for each measured dimension.

39. The testing system of claim 38, wherein the sample measurement device is configured to measure at least one of a width of the sample or a thickness of the sample.

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