Single-frequency laser frequency drift testing device and method based on temperature-controlled wavelocker

Abstract

The present invention relates to the technical field of laser frequency drift testing, and more particularly to a single-frequency laser frequency drift testing device and method based on a temperature-controlled wavelocker. The testing device includes single-wavelocker and dual-wavelocker structures. The present invention utilizes temperature-controlled wavelockers to address issues such as ambient temperature fluctuations and the poor stability of optical devices such as external FP cavities, ensuring the stability of frequency drift measurements while significantly reducing equipment costs. The use of two phase-matched temperature-controlled wavelockers addresses the problem of a single wavelocker or FP cavity being unable to determine the direction of frequency drift when measuring frequency drift, thereby limiting the measurement range.

Description

Technical Field

[0001] The present invention relates to the technical field of laser frequency drift testing, and in particular to a single-frequency laser frequency drift testing device and method based on a temperature-controlled wave locker. Background Art

[0002] Methods for measuring laser frequency drift primarily include direct measurement, the dual-beam beat method, the single-beam self-heterodyne method, and the frequency standard reference method. The direct measurement method uses an optical spectrum analyzer to directly measure the laser output frequency, but its accuracy is limited by the spectrum analyzer's frequency resolution. The dual-beam method uses a beat signal between the laser under test and a highly stable reference laser, and infers the frequency of the measured source by measuring the beat signal. A disadvantage of this method is that the instability originates from both lasers, requiring the reference source to be more stable than the laser under test. Compared to the dual-beam beat method, the single-beam self-heterodyne method offers a simpler system structure and is easier to implement. However, achieving high-precision measurements typically requires fiber delay lines hundreds or even thousands of meters long. Long optical fibers can cause laser signal loss and instability, and are susceptible to environmental influences. Measuring frequency drift using frequency standard reference methods, such as the optical frequency comb principle, presents significant challenges in achieving extremely high measurement accuracy. This is because as measurement accuracy improves, higher requirements are placed on the performance indicators of the instrument, and accordingly, the measurement system will become more complex.

[0003] To this end, this application designs a single-frequency laser frequency drift testing device and method based on a temperature-controlled wave locker. By using a temperature-controlled wave locker system and a synchronous acquisition card, the hardware design is simplified, the system complexity is reduced, and frequency drift measurement can be achieved with simpler equipment. Summary of the Invention

[0004] In order to overcome the deficiencies in the prior art, the present invention provides a single-frequency laser frequency drift testing device and method based on a temperature-controlled wave locker.

[0005] A single-frequency laser frequency drift test device based on a temperature-controlled wave locker is a single-frequency laser frequency drift test device with a single wave locker:

[0006] The single-frequency laser frequency drift test device with a single wave locker comprises a single-frequency laser, the single-frequency laser is connected to the wave locker, the wave locker is connected to a synchronous acquisition card and a temperature control module, and the synchronous acquisition card is connected to a data processing module;

[0007] The wave locker includes a coupler, an FP cavity, a first photodetector and a second photodetector, and the synchronous acquisition card includes a first AD conversion port and a second AD conversion port.

[0008] A single-frequency laser frequency drift test method based on a temperature-controlled wave locker and a single-frequency laser frequency drift test device based on the single wave locker include the following steps: a single-frequency laser is input into the wave locker; an output port of the wave locker includes a filter output port, i.e., a first photodetector, and a reference output port, i.e., a second photodetector; an electrical signal outputted from the filter output port is connected to a first AD conversion port of a synchronous acquisition card for analog-to-digital conversion; and an electrical signal outputted from the reference output port is connected to a second AD conversion port of the synchronous acquisition card for analog-to-digital conversion; a temperature control module is used to control the temperature of the wave locker to a fixed value in advance so that the frequency spectrum of the wave locker remains stable during the measurement process; the frequency drift of the single-frequency laser measured by the wave locker is affected by the power and frequency of the single-frequency laser; to eliminate the influence of power variation of the single-frequency laser itself on the frequency drift measurement, data collected by the synchronous acquisition card is input into a data processing module, a voltage value collected by the first AD conversion port is divided by a voltage value collected by the second AD conversion port, thereby eliminating the influence of power fluctuation of the single-frequency laser itself and leaving only the influence of frequency variation, thereby calculating the magnitude of the frequency drift.

[0009] A single-frequency laser frequency drift test device based on a temperature-controlled wave locker is a single-frequency laser frequency drift test device with a dual wave locker. The dual wave locker single-frequency laser frequency drift test device includes a single-frequency laser, the single-frequency laser is connected to a first coupler, the first coupler is connected to a first wave locker and a second wave locker, the first wave locker is connected to a first synchronous acquisition card and a first temperature control module, the first synchronous acquisition card is connected to a data processing module, the second wave locker is connected to a second synchronous acquisition card and a second temperature control module, and the second synchronous acquisition card is connected to the data processing module; the first wave locker includes a second coupler, a first FP cavity, a first photodetector and a second photodetector; the first wave locker includes a second coupler, a first FP cavity, a first photodetector and a second photodetector; the first A synchronous acquisition card includes a first AD conversion port and a second AD conversion port; the second wave locker includes a third coupler, a second FP cavity, a third photodetector, and a fourth photodetector; the second synchronous acquisition card includes a third AD conversion port and a fourth AD conversion port; when the laser light emitted by a single-frequency laser is at a peak or a trough point of the FP cavity spectrum in the first wave locker and the frequency drift direction cannot be determined, a second wave locker is added, and a second temperature control module controls the FP cavity spectrum in the second wave locker so that the FP cavity spectrum in the first wave locker and the FP cavity spectrum in the second wave locker are staggered by a certain phase, thereby solving the problem that a single wave locker cannot determine the frequency drift direction.

[0010] A method for testing frequency drift of a single-frequency laser based on a temperature-controlled wavelocker and a device for testing frequency drift of a single-frequency laser based on the above-mentioned dual wavelocker are provided, comprising the following steps:

[0011] The output laser of the single-frequency laser enters the coupler and is split into two beams of light with equal intensity. One beam enters the first wave locker, and the other beam enters the second wave locker. The light entering the first wave locker is split by the internal second coupler into a beam of light with a stronger signal entering the first FP cavity. After being processed by the first photodetector, it is transferred to the first AD conversion port of the first synchronous acquisition card for analog-to-digital conversion. The other weaker beam of light is processed by the second photodetector and then transferred to the second AD conversion port of the first synchronous acquisition card for analog-to-digital conversion.

[0012] The data collected by the synchronous acquisition card is input into the data processing module. The voltage value collected by the first AD conversion port is divided by the voltage value collected by the second AD conversion port. This can eliminate the influence of the power fluctuation of the single-frequency laser itself, leaving only the influence of the frequency change, and then calculate the magnitude of the frequency drift. When the laser frequency of the single-frequency laser drifts to the peak or trough of the first FP cavity spectrum in the first wave locker, the data obtained by the data processing module cannot determine the direction of the laser frequency drift. At this time, the laser frequency is in the linear region of the second FP cavity spectrum in the second wave locker, so the direction of the single-frequency laser frequency drift and the magnitude of the frequency drift can be determined.

[0013] The beneficial effects of the present invention are:

[0014] This invention uses a temperature-controlled wavelocker to address the issues of ambient temperature fluctuations and the instability of optical components such as external FP cavities, ensuring stable frequency drift measurements while significantly reducing equipment costs. The use of two phase-matched temperature-controlled wavelockers solves the problem of a single wavelocker or FP cavity measuring frequency drift, where the laser frequency drifts to the peaks or valleys of the FP cavity spectrum and the inability to determine the frequency drift direction, thus limiting the measurement range. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic structural diagram of a single-frequency laser frequency drift test device based on a single temperature-controlled wave locker according to the present invention;

[0016] Figure 2 For the present invention Figure 1 The spectrum of the FP cavity in the wave locker of the single-frequency laser frequency drift test device based on a single temperature-controlled wave locker. At this time, the laser wavelength of the single-frequency laser is in the linear region of the FP cavity spectrum.

[0017] Figure 3 In the first embodiment, when R is 32%, n is 1.45, and d is 0.008m, V d The relationship diagram with the change of λ;

[0018] Figure 4This is a schematic structural diagram of another single-frequency laser frequency drift test device based on a dual temperature-controlled wave locker according to the present invention;

[0019] Figure 5 For the present invention Figure 4 The FP cavity spectrum in the wavelocker of another single-frequency laser frequency drift test device based on dual temperature-controlled wavelockers; (A) is the spectrum when the laser wavelength of the single-frequency laser is at the FP cavity peak of the first wavelocker, and (B) is the spectrum when the laser wavelength of the single-frequency laser is in the linear region of the FP cavity of the second wavelocker at the same moment.

[0020] Figure 6 This is an alternative to the second specific embodiment of the present invention; wherein (A) is the spectrum of the single-frequency laser when the laser wavelength is located at the FP cavity peak of the first wavelocker, and (B) is the transmission spectrum when the single-frequency laser wavelength is located in the spectral linear region of the fiber Bragg grating filter at the same moment.

[0021] In the figure,

[0022] 1. Single-frequency laser, 2. Wavelock, 3. Synchronous acquisition card, 4. Temperature control module, 5. Data processing module, 6. Coupler, 7. FP cavity, 8. First photodetector, 9. Second photodetector, 10. First AD conversion port, 11. Second AD conversion port;

[0023] 61. First coupler, 21. First wave locker, 31. First synchronous acquisition card, 22. Second wave locker, 32. Second synchronous acquisition card, 41. First temperature control module, 42. Second temperature control module, 62. Second coupler, 71. First FP cavity, 63. Third coupler, 72. Second FP cavity, 81. Third photodetector, 91. Fourth photodetector, 101. Third AD conversion port, 111. Fourth AD conversion port. DETAILED DESCRIPTION

[0024] The following will be combined with the accompanying drawings to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Generally, the components of the embodiments of the present invention described and shown in the drawings herein can be arranged and designed in a variety of different configurations.

[0025] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention as claimed, but is merely intended to represent selected embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative work are within the scope of protection of the present invention.

[0026] Figure 1This is the first specific embodiment of the present invention, which is a single-frequency laser frequency drift test device based on a temperature-controlled wave locker.

[0027] A single-frequency laser 1 emits a single-frequency laser that is incident on a wavelocker 2. The output ports of the wavelocker 2 include a filter output port (first photodetector 8) and a reference output port (second photodetector 9). The filter output port outputs an electrical signal connected to the first AD converter port 10 of the synchronous acquisition card 3 for analog-to-digital conversion, while the reference output port outputs an electrical signal connected to the second AD converter port 11 of the synchronous acquisition card 3 for analog-to-digital conversion. The temperature of the wavelocker 2 is pre-set to a fixed value using a temperature control module 4, ensuring that the spectrum of the FP cavity 7 in the wavelocker 2 remains stable during the measurement process. The voltage signal at the filter output port of the wavelocker 2, i.e., the first photodetector 8, is affected by both the power and frequency of the single-frequency laser 1. To eliminate the influence of power fluctuations of the single-frequency laser 1 on the frequency drift measurement, the data collected by the synchronous acquisition card 3 is input into the data processing module 5. The voltage value collected by the first AD converter port 10 is divided by the voltage value collected by the second AD converter port 11. This eliminates the influence of power fluctuations of the single-frequency laser 1, leaving only the influence of laser frequency fluctuations, allowing the magnitude of the frequency drift to be calculated.

[0028] like Figure 2 The figure shows a typical spectrum of the FP cavity in the wave locker 2. The single-frequency laser 1 in the 1550nm band outputs laser light into the wave locker 2. The laser light is divided into a beam of light by the coupler 6 inside the wave locker 2. The light signal with a relatively strong intensity enters the FP cavity 7 and then passes through the first photoelectric detector 8 for photoelectric conversion and then goes to the first AD conversion port 10 of the synchronous acquisition card 3 for analog-to-digital conversion. The first AD conversion port 10 of the synchronous acquisition card 3 can collect voltage in real time.

[0029] ,

[0030] Wherein A1 represents the photoelectric conversion coefficient of the first photodetector 8, C1 represents the coupling coefficient of the optical signal in the transmission path, I0 represents the intensity of the light incident on the wavelocker, λ is the wavelength of the light emitted by the single-frequency laser 1, and its change is to be measured, R is the plane reflectivity of the FP cavity 7, n is the refractive index of the FP cavity 7, d is the parallel cavity spacing of the FP cavity 7, and T(λ) represents the change of the transmittance of the FP cavity 7 with λ. , λ is the wavelength of light emitted by the single-frequency laser 1, and its change is to be measured. If the FP cavity 7 does not change, then R and n will not change either, and d will change with the adjustment of the temperature control module 4. Figure 2 Shown is a curve of the transmittance formula of the FP cavity 7 in the wavelock 2 where R is 32%, n is 1.45, and d is 0.008m, and a schematic diagram when the laser wavelength is in the linear region of the transmission spectrum.

[0031] Another weaker light intensity signal is processed by the second photodetector 9 and then sent to the second AD conversion port 11 of the synchronous acquisition card 3 for analog-to-digital conversion. The second AD conversion port 11 of the synchronous acquisition card 3 can collect voltage in real time. , where A2 represents the photoelectric conversion coefficient of the second photodetector 9, C2 represents the coupling coefficient of the optical signal in the transmission path, and I0 represents the intensity of the light incident on the wave locker. During the frequency drift measurement process, the frequency spectrum of the FP cavity 7 in the wave locker 2 may shift due to temperature changes, so a temperature control module 4 is added to keep the frequency spectrum of the FP cavity 7 in the wave locker 2 stable. For example, Figure 1 In the test device shown, A1, A2, C1, and C2 are all fixed values ​​(A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal on the transmission path, and C2 represents the coupling coefficient of the optical signal on the transmission path). After temperature control, it is considered that the parameters R, n, and d of the wavelocker (R is the plane reflectivity of the FP cavity 7, n is the refractive index of the FP cavity 7, and d is the parallel cavity spacing of the FP cavity 7) are fixed values ​​and do not change with time. Then V d1 and V d2 The data collected by the synchronous acquisition card 3 is input into the data processing module 5, and the voltage value collected by the first AD conversion port 10 is divided by the voltage value collected by the second AD conversion port 11, that is,

[0032] , the influence of the power fluctuation of the single-frequency laser 1 itself can be eliminated, leaving only the influence of the wavelength change. Where A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal on the transmission path, and C2 represents the coupling coefficient of the optical signal on the transmission path. According to the relationship between laser wavelength and frequency , C is the speed of light in vacuum, λ is the wavelength of light emitted by the single-frequency laser 1, its change is to be measured, n is the refractive index of the FP cavity 7, ν is the frequency of light emitted by the single-frequency laser 1, its change is to be measured, then V is obtained d It is only related to the frequency ν of the light emitted by the single-frequency laser 1.

[0033] The voltage ratio obtained at time t1 is V d The voltage ratio obtained at time (t1) and t2 is V d (t2), subtracting the two to get:

[0034] ,

[0035] In this formula, A1, A2, C1, and C2 (A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal in the transmission path, and C2 represents the coupling coefficient of the optical signal in the transmission path) are all fixed values. R, n, and d (R is the plane reflectivity of the FP cavity 7, n is the refractive index of the FP cavity 7, and d is the parallel cavity spacing of the FP cavity 7) are also fixed values ​​because the FP cavity 7 used is unchanged. Then, the change in λ from time t1 to time t2, Δλ=λ(t2)-λ(t1), can be inferred based on the formula. Then, the change in laser frequency, i.e., the frequency drift Δν, can be obtained based on the relationship between laser wavelength and frequency. Figure 3 The following is the V when R is 32%, n is 1.45, and d is 0.008m in Example 1. d The relationship between V and λ is shown in Figure 2. d The relationship with λ is periodic, and the V d The change of λ cannot be obtained by the change of . Only when the change range of λ is within the half cycle range from the peak to the trough (or from the trough to the peak) of the curve, there is a unique corresponding relationship. Therefore, this method can be used to test the laser frequency drift within this half cycle range.

[0036] Figure 4 This is a second specific embodiment of the present invention, a single-frequency laser frequency drift test device with dual wavelockers. When the laser frequency emitted by a single-frequency laser 1 is located at a peak or trough of the spectrum of the first FP cavity 71 in the first wavelocker 21, and the direction of frequency drift cannot be determined, a second wavelocker 22 is added. The second temperature control module 42 controls the spectrum of the second FP cavity 72 in the second wavelocker 22 so that the spectrum of the first FP cavity 71 in the first wavelocker 21 and the spectrum of the second FP cavity 72 in the second wavelocker 22 are offset by a certain phase. This solves the problem of being unable to determine the direction of frequency drift when the laser frequency drifts to a peak or trough of the FP cavity in the wavelocker when measuring frequency drift with a single wavelocker.

[0037] The specific implementation of this embodiment is as follows:

[0038] The output of a single-frequency laser 1 in the 1550nm band enters the coupler 6 and is split into two beams of light with equal intensity. One beam enters the first wave locker 21, and the other beam enters the second wave locker 22. The light entering the first wave locker 21 is split by the internal second coupler 62 into a beam of light with a relatively high intensity signal that enters the first FP cavity 71. After being processed by the first photodetector 8, it is then sent to the first AD conversion port 10 of the first synchronous acquisition card 31 for analog-to-digital conversion. The first AD conversion port 10 of the first synchronous acquisition card 31 can collect voltage in real time. , where A1 represents the photoelectric conversion coefficient of the first photodetector 8, C1 represents the coupling coefficient of the optical signal on the transmission path, I0 represents the intensity of the light incident on the wave locker, and T(λ) represents the change of the transmittance of the first FP cavity 71 with λ. The transmittance formula of the first FP cavity 71 is , where λ is the wavelength of the light emitted by the single-frequency laser 1 and its change is to be measured, R is the plane reflectivity of the first FP cavity 71, n is the refractive index of the first FP cavity 71, and d is the parallel cavity distance of the first FP cavity 71. Since the first FP cavity 71 does not change, R and n will not change either. d will change with the adjustment of the first temperature control module 41. Figure 5 (A) shows an image of the transmittance formula of the first FP cavity 71 in the first wavelock 21, where R is 32%, n is 1.45, and d is 0.008m. Another weaker beam of light is processed by the second photodetector 9 and then processed by the second AD conversion port 11 of the first synchronous acquisition card 31 for analog-to-digital conversion. The second AD conversion port 11 of the first synchronous acquisition card 31 can collect electrical signals in real time. , where A2 represents the photoelectric conversion coefficient of the second photodetector 9, C2 represents the coupling coefficient of the optical signal in the transmission path, and I0 represents the light intensity incident on the wave locker. The data collected by the first synchronous acquisition card 31 is input into the data processing module 5, and the voltage value collected by the first AD conversion port 10 is divided by the voltage value collected by the second AD conversion port 11, that is,

[0039] , eliminating the influence of the power fluctuation of the single-frequency laser 1 itself on the frequency drift measurement, leaving only the influence of the frequency change. Wherein, A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal in the transmission path, and C2 represents the coupling coefficient of the optical signal in the transmission path.

[0040] The voltage value obtained at time t1 is V d (t1), the voltage value obtained at time t2 is V d (t2), subtracting the two to get:

[0041] ,

[0042] In this formula, A1, A2, C1, and C2 are all fixed values ​​(A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal in the transmission path, and C2 represents the coupling coefficient of the optical signal in the transmission path), R, n, and d (R is the plane reflectivity of the first FP cavity 71, n is the refractive index of the first FP cavity 71, and d is the parallel cavity spacing of the first FP cavity 71). Since the first FP cavity 71 used is unchanged, they are all fixed values. Then, according to the above formula, the change of λ from time t1 to time t2 can be inferred as Δλ=λ(t2)-λ(t1). Then, according to the relationship between laser wavelength and frequency, , (C is the speed of light in vacuum, λ is the wavelength of light emitted by the single-frequency laser 1, whose change is to be measured, n is the refractive index of the first FP cavity 71, ν is the frequency of light emitted by the single-frequency laser 1, whose change is to be measured) to obtain the laser frequency change, that is, the frequency drift size Δν.

[0043] If it appears Figure 5 In the case of (A), that is, when the laser emitted by the single-frequency laser 1 is at the peak of the spectrum of the first FP cavity 71 in the first wave locker 21, the frequency drift direction cannot be determined based on the data collected by the data processing module 5, and the second wave locker 22 is required. The temperature of the second wave locker 22 is controlled and adjusted by the second temperature control module 42, that is, the temperature of the second wave locker 22 is changed. Where d is the size (λ is the wavelength of the light emitted by the single-frequency laser 1, the change of which is to be measured, R is the plane reflectivity of the second FP cavity 72, n is the refractive index of the second FP cavity 72, and d is the parallel cavity distance of the second FP cavity 72). Figure 5 (B) shows the transmittance formula for the second FP cavity 72 in the second wavelocker 22, where R is 32%, n is 1.45, and d is 0.008111 m. λ is the wavelength of light emitted by the single-frequency laser 1, whose variation is to be measured. The FP cavity spectra in the two wavelockers are phase-shifted, so that when the laser light emitted by the single-frequency laser 1 is at the peak of the spectrum of the first FP cavity 71 in the first wavelocker 21, it is in the hypotenuse linear region of the spectrum of the second FP cavity 72 in the second wavelocker 22. The data collected by the second synchronous acquisition card 32 is input into the data processing module 5. The voltage value collected by the third A / D converter port 101 is divided by the voltage value collected by the fourth A / D converter port 111 to obtain a ratio. This ratio is dependent only on wavelength, and the direction of laser frequency drift can be determined by the magnitude of this ratio. Therefore, an algorithm is designed to determine the magnitude of laser frequency drift based on the frequency drift direction and the voltage difference in the data processing module 5, thereby expanding the frequency drift test range.

[0044] Figure 6This is an alternative to the second specific embodiment of the present invention, which uses a wave locker and a filter instead of a double wave locker structure. For example, a fiber Bragg grating filter is used. The linear region of the fiber Bragg grating filter transmission spectrum can contain multiple peaks and valleys of the FP cavity spectrum in the wave locker, thereby being able to distinguish the direction of the frequency drift of the single frequency laser in a larger range. Figure 6 As shown, in Figure 6 The wavelength of the single-frequency laser in (A) is located at the peak of the FP cavity spectrum in the wave-locked device. Figure 6 In (B), the single-frequency laser wavelength is located in the hypotenuse linear region of the transmission spectrum of the fiber Bragg grating filter. However, the transmission spectrum of the fiber Bragg grating filter is wider than the FP cavity spectrum in the wave locker, and the sensitivity is lower. However, it can also avoid the problem that a wave locker cannot determine the direction of frequency drift.

[0045] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention and are not limiting. Other modifications or equivalent substitutions made to the technical solution of the present invention by ordinary technicians in this field should be included in the scope of the claims of the present invention as long as they do not depart from the spirit and scope of the technical solution of the present invention.

Claims

1. A single-frequency laser frequency drift test device based on a temperature-controlled wave locker, including a single-frequency laser frequency drift test device with a single wave locker and a double-frequency laser frequency drift test device, characterized in that: The single-frequency laser frequency drift test device with a single wave locker comprises a single-frequency laser (1), the single-frequency laser (1) is connected to the wave locker (2), the wave locker (2) is connected to a synchronous acquisition card (3) and a temperature control module (4), and the synchronous acquisition card (3) is connected to a data processing module (5); The wave locker (2) includes a coupler (6), an FP cavity (7), a first photodetector (8) and a second photodetector (9); the synchronous acquisition card (3) includes a first AD conversion port (10) and a second AD conversion port (11); The dual-wavelocked single-frequency laser frequency drift test device comprises a single-frequency laser (1), the single-frequency laser (1) is connected to a first coupler (61), the first coupler (61) is connected to a first wavelocker (21) and a second wavelocker (22), the first wavelocker (21) is connected to a first synchronous acquisition card (31) and a first temperature control module (41), the first synchronous acquisition card (31) is connected to a data processing module (5), the second wavelocker (22) is connected to a second synchronous acquisition card (32) and a second temperature control module (42), and the second synchronous acquisition card (32) is connected to the data processing module (5); The first wave locker (21) includes a second coupler (62), a first FP cavity (71), a first photodetector (8), and a second photodetector (9); the first synchronous acquisition card (31) includes a first AD conversion port (10) and a second AD conversion port (11); The second wave locker (22) includes a third coupler (63), a second FP cavity (72), a third photodetector (81), and a fourth photodetector (91); the second synchronous acquisition card (32) includes a third AD conversion port (101) and a fourth AD conversion port (111); when the laser light emitted by the single-frequency laser (1) is at the peak and valley point of the spectrum of the first FP cavity (71) in the first wave locker (21), and the frequency drift direction cannot be determined, a second wave locker (22) is added, and the second temperature control module (42) controls the spectrum of the second FP cavity (72) in the second wave locker (22) so that the spectrum of the first FP cavity (71) in the first wave locker (21) and the spectrum of the second FP cavity (72) in the second wave locker (22) are phase-shifted, thereby solving the problem that a single wave locker cannot determine the frequency drift direction.

2. A method for testing frequency drift of a single-frequency laser based on a temperature-controlled wave locker, based on the device for testing frequency drift of a single-frequency laser based on a temperature-controlled wave locker according to claim 1, characterized in that: The frequency drift test method of a single-frequency laser with a single wavelock includes the following steps: The single-frequency laser (1) inputs the single-frequency laser into the wave locker (2), and the output port of the wave locker (2) includes a filter output end, i.e., a first photodetector (8), and a reference output end, i.e., a second photodetector (9), wherein the filter output end, i.e., the first photodetector (8) outputs an electrical signal connected to a first AD conversion port (10) of a synchronous acquisition card (3) for analog-to-digital conversion, and the reference output end, i.e., the second photodetector (9) outputs an electrical signal connected to a second AD conversion port (11) of a synchronous acquisition card (3) for analog-to-digital conversion; the temperature of the wave locker (2) is controlled to a fixed value in advance using a temperature control module (4), so that the wave locker (2) The spectrum remains stable during the measurement process; the electrical signal value at the filter output end of the wave locker (2), i.e., the first photodetector (8), will be affected by both the power and frequency of the single-frequency laser (1). In order to eliminate the influence of the power change of the single-frequency laser (1) itself on the frequency drift measurement, the data collected by the synchronous acquisition card (3) is input into the data processing module (5), and the voltage value collected by the first AD conversion port (10) is divided by the voltage value collected by the second AD conversion port (11). This can eliminate the influence of the power fluctuation of the single-frequency laser (1) itself, leaving only the influence of the laser frequency change, and then calculate the magnitude of the frequency drift.

3. A method for testing frequency drift of a single-frequency laser based on a temperature-controlled wave locker, based on the device for testing frequency drift of a single-frequency laser based on a temperature-controlled wave locker according to claim 1, characterized in that: The frequency drift test method of a single-frequency laser with a dual-wavelocker includes the following steps: The output laser of the single-frequency laser (1) enters the coupler (6) and is divided into two beams of light with equal intensity, one of which enters the first wavelock (21) and the other enters the second wavelock (22). The light entering the first wavelock (21) is divided by the internal second coupler (62) into a beam of light with a relatively strong signal, which enters the first FP cavity (71) and then undergoes photoelectric conversion through the first photodetector (8) and then undergoes analog-to-digital conversion in the first AD conversion port (10) of the first synchronous acquisition card (31); the other weaker light enters the second photodetector (9) and undergoes photoelectric conversion and then undergoes analog-to-digital conversion in the second AD conversion port (11) of the first synchronous acquisition card (31); the first synchronous acquisition card (31) acquires the light. The data is input into the data processing module (5), and the voltage value collected by the first AD conversion port (10) is divided by the voltage value collected by the second AD conversion port (11), thereby eliminating the influence of the power fluctuation of the single-frequency laser (1) itself, leaving only the influence of the frequency change, and then calculating the magnitude of the frequency drift; when the laser frequency of the single-frequency laser (1) drifts to the peak or trough of the spectrum of the first FP cavity (71) in the first wave locker (21), the data obtained by the data processing module (5) cannot determine the direction of the laser frequency drift. At this time, the laser frequency is in the linear region of the spectrum of the second FP cavity (72) in the second wave locker (22), so that the direction of the frequency drift of the single-frequency laser (1) can be determined and the magnitude of the frequency drift can be measured.

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