Batch satellite thermal test dynamic allocation automatic test system and application method

By using a dynamic allocation automatic test system for batch satellite thermal testing, and utilizing automated test software and switch matrix board modules, the electrical functions and performance of various satellite subsystems were tested. This solved the problems of high cost and low efficiency in batch satellite thermal testing, and improved testing efficiency and satellite stability.

CN119803983BActive Publication Date: 2025-11-04CHANGGUANG SATELLITE TECH CO LTD
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Patent Information

Application Number
CN202411877227.4
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-12-19
Publication Date
2025-11-04
Estimated Expiration
2044-12-19

AI Technical Summary

Technical Problem

Existing technologies for batch satellite thermal testing systems are costly, require significant manpower, and have low testing efficiency. Furthermore, they neglect the importance of electrical testing, resulting in insufficient scalability and flexibility.

Method used

An automated test system for dynamic allocation of satellite thermal testing was designed. Through automated test software and switch matrix board modules, the system realizes the dynamic allocation of payload, telemetry and control, test interfaces and energy equipment groups. Combined with network communication interfaces and servers, it automates the control of satellite electrical function and performance testing.

Benefits of technology

It reduces testing costs and manpower input, improves testing efficiency, achieves comprehensive coverage of electrical testing, ensures the stability and reliability of satellites during on-orbit operation, and meets the needs of batch satellite thermal testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present application belongs to the technical field of satellite thermal test, in order to reduce the cost of thermal test system and improve the test efficiency, a kind of "batch satellite thermal test dynamic allocation automatic test system and application method" is provided, the automatic test system includes load test equipment group, measurement and control test equipment group, test interface equipment group, energy equipment group, through switch matrix board module and the interface flange plate on vacuum thermal test tank connection, and switch matrix board module, application / data server and test terminal are connected through network switch, under the arrangement of automatic test software task in application / data server, according to the mapping matrix of the number of satellites to be tested, the number of equipment resources, the connection relationship of each component and the test condition in configuration parameter, resource dynamic allocation is realized, and the efficiency of batch satellite thermal test automation test is improved.
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Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of satellite thermal test. BACKGROUND

[0002] In the process of satellite research and development, production and testing, due to the high cost of ground test system, how to carry out batch satellite thermal test under limited test resources is an important issue.

[0003] In the process of satellite thermal test, the functions and performances of its energy system, thermal control system, satellite platform and load system need to be fully verified, and due to the particularity of thermal test equipment, the correct connection between equipment resources and satellite needs to be completed before the start of thermal test, and the physical connection relationship cannot be changed during the test process. Therefore, in the prior art, a large number of test equipment and test personnel need to be configured according to the number of test satellites to complete the test work, which leads to serious lack of scalability and flexibility in the process of batch satellite thermal test, high test cost investment and limited test efficiency.

[0004] In the prior art, the research on batch satellite thermal test mainly focuses on how to cut the test and how to set the thermal test device and test conditions. For example, the patent "Batch Satellite Thermal Cycle Test Method, Device and Equipment" with publication number CN117147999A provides a thermal cycle test method for improving the fault detection accuracy of batch satellites; the patent "Batch Satellite Constellation System Vacuum Thermal Test Method and Process" with publication number CN111717425B improves the test efficiency by conducting thermal balance test and thermal vacuum test on batch satellites in parallel.

[0005] However, there is no mention of how to efficiently implement electrical testing in the process of batch satellite thermal test. Electrical testing can comprehensively detect the electrical functions and performances of each subsystem and instrument of the satellite, ensure its normal operation in extreme temperature environment, test the working state and performance of each component of the satellite by simulating various workloads and scenarios, effectively prevent potential failures, and ensure the stability and reliability of the satellite during on-orbit period. SUMMARY

[0006] In view of the high cost and labor input, low test efficiency and neglect of electrical testing in the process of batch satellite thermal test in the prior art, the present application proposes a "Batch Satellite Thermal Test Dynamic Allocation Automatic Test System and Application Method".

[0007] The batch satellite thermal test dynamic allocation automatic test system comprises a test system, a test device and a test personnel. Figure 1As shown, the satellite to be tested is placed in a vacuum thermal test tank, and a radio frequency interface flange, a test interface flange and an energy interface flange are installed outside the vacuum thermal test tank, and the switch matrix board module is connected to the vacuum thermal test tank through the radio frequency interface flange, the test interface flange and the energy interface flange;

[0008] The load test equipment group includes multiple load ground checks, each load ground check channel is connected to the input end of the switch matrix board 1 through a radio frequency cable, the output end of the switch matrix board 1 is connected to the radio frequency interface flange through a radio frequency cable, and then connected to the communication load of the satellite to be tested, for testing the uplink and downlink feeders, user link access states, uplink and downlink communication rates of the communication load of the satellite to be tested;

[0009] The TT&C test equipment group includes multiple TT&C ground checks, each TT&C ground check channel is connected to the input end of the switch matrix board 2 through a radio frequency cable, the output end of the switch matrix board 2 is connected to the radio frequency interface flange through a radio frequency cable, and then connected to the TT&C component of the satellite to be tested, for providing uplink and downlink paths of the TT&C link of the satellite to be tested, providing paths for receiving telemetry data and sending remote control data in the test process, so as to realize real-time tracking and state evaluation of the satellite to be tested;

[0010] The test interface equipment group includes multiple test interface equipments, each test interface equipment channel is connected to the input end of the switch matrix board 3 through a satellite test cable, the output end of the switch matrix board 3 is connected to the test interface flange through a satellite test cable, and then connected to the test interface of the satellite to be tested, for providing wired paths of the ground test process of the satellite to be tested, including wired command sending, wired measurement, RS422 path remote control and telemetry uplink and downlink, realizing control, data reading and command sending of the satellite to be tested by the batch satellite thermal test dynamic allocation automatic test system;

[0011] The energy equipment group includes multiple energy equipments, each energy equipment channel is connected to the input end of the switch matrix board 4 through a satellite energy cable, the output end of the switch matrix board 4 is connected to the energy interface flange through a satellite energy cable, and then connected to the energy component of the satellite to be tested, for providing energy in the test process, including a solar simulation array and a direct current power supply, accurately controlling voltage, current and power output of the power supply, so as to simulate energy demand of the satellite to be tested under different orbits and different working conditions;

[0012] The load test equipment group, the TT&C test equipment group, the test interface equipment group and the energy equipment group are all configured with network communication interfaces, and are connected to the switch matrix board module, the application / data server and the test terminal through a network switch;

[0013] The application / data server includes an automatic test software application and a database, and the automatic test software is accessed by a test terminal through a network switcher, which can generate an automatic control task sequence and output a time sequence task sheet, and monitor the running state of a satellite to be tested and a load test equipment group, a test control test equipment group, a test interface equipment group and an energy equipment group.

[0014] The application method of the batch satellite thermal test dynamic distribution automatic test system comprises the following steps as shown in the figure: Figure 2

[0015] Step 1: The automatic test software application in the application / data server is loaded and initialized, the configuration parameters of the automatic test software are accessed, and the network connection is correctly established.

[0016] Step 2: An initialization matrix is generated according to the configuration parameters in step 1, and the user configures the mapping matrix of the connection relationship between each ground test channel of the load test equipment group, the test control test equipment group, the test interface equipment group and the energy equipment group and the satellite to be tested in the initialization matrix according to the input and output physical connection relationship of the switch matrix card module.

[0017] Step 3: The start time and end time of the satellite thermal test, the test working condition distribution and the test working condition duration are configured, and the automatic test software distributes the thermal test working sequence for the satellite to be tested according to the above configuration content, so as to ensure the overall process coverage.

[0018] Step 4: The thermal test working sequence generated in step 3 is dynamically distributed, so that the load test equipment group, the test control test equipment group, the test interface equipment group and the energy equipment group are switched to the control strategy mode, which can control the corresponding ground test channels of each equipment group to access the corresponding satellite to be tested at the preset time, and generate the configuration file and the automatic control task sequence of the communication load, the test control component, the test interface and the energy component of the satellite to be tested and output the time sequence task sheet.

[0019] Step 5: Start the satellite thermal test, run the automatic control task sequence, dynamically control the switching and access of each ground test channel of the load test equipment group, the test control test equipment group, the test interface equipment group and the energy equipment group to the corresponding satellite to be tested according to the automatic control task sequence, and automatically monitor the running state of the satellite to be tested and each equipment group according to the configuration parameters until the preset thermal test end time is reached and the test is ended.

[0020] Technical effects:

[0021] ​In the batch satellite thermal test test process, the application provides a batch satellite thermal test dynamic allocation automatic test system and application method, through the arrangement of automatic test software task, according to the mapping matrix of the number of satellites to be tested, the number of equipment resources, the connection relationship of each component in the configuration parameter and the test working condition, the dynamic allocation of resources is realized, so as to replace the one-to-one test of satellite and equipment in the existing method, without the need of a large number of test equipment, saving the cost investment and labor input of thermal test, improving the efficiency of batch satellite thermal test automation test.

[0022] According to the automatic control task sequence, the load test equipment group, the test and control test equipment group, the test interface equipment group and the energy equipment group are dynamically controlled to switch and access the satellite to be tested, and then the automatic test in the test process is completed, the misjudgment caused by relying on manual interpretation is avoided, the comprehensive detection of the electrical test process in the thermal test process is realized, the safety of batch satellite thermal test is further improved, and the stability and reliability of the satellite in orbit are ensured. The application meets the needs and trends of current communication satellite constellation batch test, and plays an important role in accelerating the overall construction progress of communication satellite constellation. BRIEF DESCRIPTION OF DRAWINGS

[0023] Figure 1 It is a batch satellite thermal test dynamic allocation automatic test system connection structure schematic diagram.

[0024] Figure 2 It is a batch satellite thermal test dynamic allocation automatic test system application method overall flow schematic diagram.

[0025] Figure 3 It is a method embodiment flow chart. DETAILED DESCRIPTION

[0026] The technical solutions in the embodiments of the application will be described clearly and completely below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, not all the embodiments. All other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the application.

[0027] The load test equipment group in the batch satellite thermal test dynamic allocation automatic test system includes feeder link station equipment, Ka and C band user terminals.

[0028] The test and control test equipment group includes Ka and S band test and control ground detection and configuration frequency converter, which can adopt PXI case, PXIe controller and PXI board card, specifically, the PXI board card can be NIPXIe-5645R.

[0029] The test interface device group includes a test interface device terminal, which can be a research and development industrial computer in the embodiment of the application, and is configured with a CAN board card, an RS422 board card, an analog quantity acquisition board card and a network card.

[0030] The energy device group can adopt a Keysight E4360 and a large-power direct current power supply.

[0031] The switch matrix board card module includes a radio frequency switch matrix and a low-frequency signal switch matrix.

[0032] In the embodiment of the application, the application / data server adopts a PowerEdge T410 tower server, runs a Windows Server system, deploys a Jdk8, a Redis and a MySQL software environment to run the automatic test software program, and stores process data.

[0033] The network switcher adopts an S5700-10P-LI-AC switcher, which is used for constructing a local area network of the batch satellite thermal test dynamic allocation automatic test system.

[0034] The test terminal includes an operation terminal, a task arrangement terminal and a test task and resource display terminal, and adopts a Dell Precision 3660 workstation.

[0035] In step 1 of the application method of the batch satellite thermal test dynamic allocation automatic test system, the configuration parameters of the automatic test software are as follows: the number and identification number of the satellites to be tested, the number of configured payload ground detectors and the corresponding channel number, the number of configured TT&C ground detectors and the corresponding channel number, the number of configured test interface devices and the corresponding channel number, the number of configured energy devices and the corresponding channel number; and the IP and port number of all devices of each switch matrix board card, payload test device group, TT&C test device group, test interface device group and energy device group are configured.

[0036] The test working condition duration in step 3 includes the high-temperature working condition time, the low-temperature working condition time of each satellite to be tested, and the time of various satellite business modes under the high-temperature working condition and the low-temperature working condition, and the high-temperature working condition, the low-temperature working condition and the business modes under the high-temperature working condition and the low-temperature working condition of the satellites to be tested are dynamically and evenly allocated.

[0037] As shown in Figure 3 The specific working process of the application method of the batch satellite thermal test dynamic allocation automatic test system in the embodiment of the application is as follows:

[0038] The application / data server program is started and run, the automatic test software program is loaded and the initialization program is completed, the user accesses the front-end page through the browser in each test terminal, and starts to perform the pre-test configuration work.

[0039] Configure the number of satellites to be tested N, and set the satellite identification numbers of the N satellites; configure the number of payload ground tests X and the number of channels X1 in the payload test equipment group, set the IP and port of each payload ground test equipment, and establish network connection in sequence; configure the number of TT&C ground tests Y and the number of channels Y1 in the TT&C test equipment group, set the IP and port of each TT&C ground test equipment, and establish network connection in sequence; configure the number of test interface equipment Z and the number of channels Z1 in the test interface equipment group, set the IP and port of the test interface equipment, and establish network connection in sequence; configure the number of energy equipment S and the number of channels S1, set the IP and port of all energy equipment, and establish network connection in sequence; configure the IP and port of switch matrix board card modules 1-4 in the switch matrix board card module, and establish network connection in sequence, which only needs to be configured once at the beginning of the test, and the configuration data will be stored in the database.

[0040] The automatic test software automatically generates the initialization matrix of the switch matrix board cards 1-4 according to the number of satellites to be tested N, the number of payload ground tests X and the number of channels X1, the number of TT&C ground tests Y and the number of channels Y1, the number of test interface equipment Z and the number of channels Z1, and the number of energy equipment S and the number of channels S1, and sets a unique channel number identification for each channel generated in the switch matrix board cards 1-4, completing the initialization.

[0041] In the initialization matrix of the switch matrix board cards 1-4 after the system initialization is completed, the connection relationship mapping configuration is performed, according to the physical connection relationship of the payload channels in the switch matrix board card 1, the connection relationship mapping matrix of all channels of the payload ground test and the satellite payload assembly is configured; according to the physical connection relationship of the TT&C channels in the switch matrix board card 2, the connection relationship mapping matrix of all channels of the TT&C ground test and the satellite TT&C assembly is configured; according to the physical connection relationship of the test interface channels in the switch matrix board card 3, the connection relationship mapping matrix of all channels of the test interface equipment and the satellite test interface is configured; according to the physical connection relationship of the energy channels in the switch matrix board card 4, the connection relationship mapping matrix of all channels of the energy equipment and the satellite energy interface is configured.

[0042] Configure the start and end time of batch satellite thermal test, configure the number of test working conditions, configure the start and end time of each working condition, and configure the working state of the payload equipment group, the TT&C equipment group, the test interface equipment group, and the energy equipment group. The automatic program automatically generates a thermal test system working sequence according to all the above user configurations for the user to check and confirm.

[0043] After confirming the generation of the thermal test work sequence, the automated test software program completes the switching of the payload ground test channel and the access control strategy, generates a parameter configuration file; automatically completes the switching of the test control ground test channel and the tracking control strategy, and generates a parameter configuration file; automatically completes the switching control strategy of the test interface equipment channel access and generates a parameter configuration file; automatically completes the switching control strategy of the energy equipment channel output and generates a parameter configuration file, generates an automatic control task sequence, and outputs a timing task sheet.

[0044] The batch satellite whole-satellite thermal test starts, the user starts the automatic task sequence through the front-end page, and the program automatically switches and accesses the control according to the parameter configuration file of the payload ground test channel through the switch matrix; automatically switches and tracks the control according to the parameter configuration file of the test control ground test channel; automatically switches and accesses the control according to the parameter configuration file of the test interface equipment channel; and automatically switches and accesses the control according to the parameter configuration file of the energy equipment channel.

[0045] During the whole batch satellite thermal test process, the running state of each device group channel, the current stage state of the test, the key information such as resource usage and idle occupancy, and the like are displayed in a visual manner on the front-end page of the program in real time, and the key telemetry parameters of the satellite and the key running state of the equipment are automatically monitored and interpreted, so as to ensure the safety of the satellite during the whole test process. When the system runs to the specified time of the test, the automated test process is ended after the user confirms.

[0046] The contents not described in detail in the specification all belong to the prior art known by those skilled in the art, and for those skilled in the art, the specific implementation manners and application ranges will be changed according to the idea of the present application. In summary, the content of the specification should not be understood as a limitation of the present application.

Claims

1. A batch satellite thermal testing dynamic allocation automatic testing system, wherein the satellite under test is placed in a vacuum thermal test chamber, characterized in that, The vacuum thermal test chamber is equipped with an RF interface flange, a test interface flange, and an energy interface flange. The switch matrix board module is connected to the vacuum thermal test chamber through the RF interface flange, the test interface flange, and the energy interface flange. The load test equipment group includes multiple load ground testers. Each load ground tester channel is connected to the input terminal of switch matrix board 1 via an RF cable. The output terminal of switch matrix board 1 is connected to the RF interface flange via an RF cable, and then connected to the communication load of the satellite under test. It is used to test the uplink and downlink power supply, user link access status, and uplink and downlink communication rate of the communication load of the satellite under test. The telemetry and control test equipment group includes multiple telemetry and control ground testers. Each telemetry and control ground tester channel is connected to the input terminal of switch matrix board 2 via an RF cable. The output terminal of switch matrix board 2 is connected to the RF interface flange via an RF cable, and then connected to the telemetry and control components of the satellite under test. This provides uplink and downlink paths for the telemetry and control link of the satellite under test, and provides a path for receiving telemetry data and sending remote control data during the test, thereby realizing real-time tracking and status assessment of the satellite under test. The test interface equipment group includes multiple test interface devices. Each test interface device channel is connected to the input terminal of the switch matrix board 3 via a satellite test cable. The output terminal of the switch matrix board 3 is connected to the test interface flange via a satellite test cable, and then connected to the test interface of the satellite under test. This provides a wired path for the ground test process of the satellite under test, including wired command transmission, wired measurement, and RS422 remote control and telemetry uplink and downlink. This enables the batch satellite thermal test dynamic allocation automatic test system to control, read data, and send commands to the satellite under test. The energy equipment group includes multiple energy devices. Each energy device channel is connected to the input terminal of the switch matrix board 4 via a satellite energy cable. The output terminal of the switch matrix board 4 is connected to the energy interface flange via a satellite energy cable, and then connected to the energy components of the satellite under test. This is used to provide energy during the test, including the solar simulation array and DC power supply. The voltage, current and power output of the power supply are precisely controlled to simulate the energy requirements of the satellite under test in different orbits and under different operating conditions. The load testing equipment group, the measurement and control testing equipment group, the test interface equipment group, and the energy equipment group are all equipped with network communication interfaces and are connected to the switch matrix board module, the application / data server, and the test terminal through a network switch. The application / data server includes automated test software applications and databases. The automated test software is accessed through a network switch via a test terminal. It can generate automatic control task sequences and output time-series task lists, and monitor the operating status of the satellite under test, as well as the payload test equipment group, telemetry and control test equipment group, test interface equipment group, and energy equipment group.

2. The batch satellite thermal test dynamic allocation automatic test system according to claim 1, characterized in that, The load testing equipment group includes feeder switch station equipment and Ka and C band user terminals; the measurement and control testing equipment group includes Ka and S band measurement and control ground testing equipment and frequency converters, all using PXI chassis, PXIe controllers and PXI boards; the test interface equipment group includes test interface equipment terminals, which are Advantech industrial control computers, configured with CAN boards, RS422 boards, analog signal acquisition boards and network cards; The energy equipment group uses a Keysight E4360 and a high-power DC power supply; The switch matrix board module includes an RF switch matrix and a low-frequency signal switch matrix.

3. The batch satellite thermal test dynamic allocation automatic test system according to claim 1, characterized in that, The application / data server uses a PowerEdge T410 tower server, running a Windows Server system, and deploying JDK8, Redis, and MySQL software environments to run automated testing software programs and store process data; the network switch uses an S5700-10P-LI-AC switch to construct the local area network for the batch satellite thermal test dynamic allocation automated test system.

4. The batch satellite thermal test dynamic allocation automatic test system according to claim 1, characterized in that, The test terminal includes an operation terminal, a task orchestration terminal, and a test task and resource display terminal, and uses a Dell Precision3660 workstation.

5. The application method of the batch satellite thermal test dynamic allocation automatic test system according to claim 1, characterized in that, Includes the following steps: Step 1: The automated test software application in the application / data server has completed loading and initialization, accesses the automated test software configuration parameters, and correctly establishes a network connection; Step 2: Generate an initialization matrix based on the configuration parameters in Step 1. The user configures the mapping matrix of the connection relationship between the load test equipment group, the telemetry and control test equipment group, the test interface equipment group, the energy equipment group and the satellite under test in the initialization matrix according to the input and output physical connection relationship of the switch matrix board module. Step 3: Configure the start and end times of the thermal test for the satellite under test, the allocation of test conditions, and the duration of the test conditions. The automated test software will allocate the thermal test work sequence to the satellite under test according to the above configuration, thereby ensuring the overall process coverage. Step 4: Dynamically allocate the thermal test work sequence generated in Step 3, so that the load test equipment group, telemetry and control test equipment group, test interface equipment group and energy equipment group are switched to control strategy mode, which can control the corresponding ground test channel of each equipment group to access the corresponding satellite under test at a preset time, and generate configuration files and automatic control task sequences for the communication payload, telemetry and control components, test interface and energy components of the satellite under test, and output the timing task sheet. Step 5: Start the thermal test of the satellite under test, run the automatic control task sequence, and dynamically control the various ground inspection channels of the payload test equipment group, telemetry and control test equipment group, test interface equipment group and energy equipment group to switch to the corresponding satellite under test according to the automatic control task sequence. Automatically monitor the operating status of the satellite under test and each equipment group according to the configuration parameters until the preset thermal test end time is reached and the test ends.

6. The application method of the batch satellite thermal test dynamic allocation automatic test system according to claim 5, characterized in that, The specific configuration parameters of the automated testing software in step 1 are as follows: the number of satellites to be tested and their identification numbers, the number of payload ground testers and their corresponding channels, the number of telemetry and control ground testers and their corresponding channels, the number of test interface devices and their corresponding channels, and the number of energy devices and their corresponding channels; and the IP addresses and port numbers of all devices in each switch matrix board, payload test device group, telemetry and control test device group, test interface device group, and energy device group.

7. The application method of the batch satellite thermal test dynamic allocation automatic test system according to claim 5, characterized in that, The duration of the test conditions mentioned in step 3 includes the high temperature test time, the low temperature test time, and the time of various satellite service modes under the high temperature test and the low temperature test conditions for each satellite. The high and low temperature test conditions and the service modes under the high and low temperature test conditions of the satellites under test are dynamically and evenly distributed.

Citation Information

Patent Citations

  • Heat source isolation and automatic temperature control system based on multi-star parallel thermal vacuum experiment

    CN111717425B

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    CN117147999A

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