Compatible board card test system

Abstract

The invention discloses a compatible board card test system, which belongs to the technical field of board card testing, and is characterized in that serial port data is generated according to a control instruction generated according to a test requirement, a test module is controlled to transmit the serial port data to a corresponding test channel, and the serial port data is transmitted to a message acquisition board through the test channel; the method comprises the following steps: transmitting serial port data to a to-be-tested board card, comparing the serial port data before and after transmission, and judging whether the communication function of the to-be-tested board card is normal or not according to a comparison result. The problem that the test efficiency is not high due to the fact that the test object switching step is tedious is solved, the test environment and the test object are switched through a simple switching circuit, the test case is automatically operated by an upper computer, an auxiliary function board or an independent test backboard does not need to be additionally developed, the operation steps of testers can be reduced, and the test efficiency is remarkably improved.

Description

Technical Field

[0001] The present invention relates to the technical field of board card testing, and in particular to a compatibility board card testing system. Background Art

[0002] The test fixture is an important unit for verifying the basic functions of the signal board after leaving the factory or returning for repair. Generally, a series of functional tests are performed on the board under test through the test cases configured by the host computer to ensure full coverage of functional verification. The existing test fixtures have the problem that the backplanes of the test fixture and the formal operation fixture are independent of each other and cannot be compatible with each other. In addition, without developing a new backplane, it is necessary to design auxiliary boards with sufficient interfaces to assist in testing and reserve slots for auxiliary boards. For example, if the tool contains a one-to-many serial port message acquisition board design, all serial ports need to be tested. Therefore, it is necessary to configure more functional boards in the test environment for auxiliary testing, or the test personnel need to manually change the slots, etc. The operation steps are cumbersome and increase human-computer interaction, which increases the testing cost. Therefore, a backplane that is compatible with both test and on-site environments, can automatically switch test objects, and reduces personnel operations is needed to reduce development costs.

[0003] Chinese patent, publication number: CN219715680U, publication date: September 19, 2023, discloses a board function test tooling, through a test system for functional testing of several boards and cards arranged on a rack; the test system includes an industrial computer for realizing test control; the industrial computer includes an RS232 interface, and the industrial computer is connected to several board test slots for inserting boards to be tested and connected by cables through the RS232 interface to realize the corresponding connection of the inserted boards to be tested; the industrial computer is also connected to a DC power supply, an electronic load and a switching board through the set RS232 interface; the output end of the DC power supply is disconnected from the input end of the switching board, the output end of the switching board is connected to the input end of the electronic load, and the switching board is also inserted in a board test slot. Although the test steps are simplified to a certain extent, the test tooling adopted by it is difficult to use the boards and cards normally under formal operating conditions and lacks compatibility. Summary of the invention

[0004] The present invention aims at the problem that a backplane used in the existing board test needs to be configured with more functional boards in the test environment for auxiliary testing, and the test object switching steps are relatively cumbersome, resulting in low test efficiency. A compatibility board test system is provided, which generates serial port data through control instructions generated according to test requirements and controls the test module to transmit the serial port data to the corresponding test path, and transmits the serial port data to the message acquisition board through the test path, and then compares the serial port data before and after the transmission, and judges whether the communication function of the board to be tested is normal according to the comparison result, switches the test environment and the test object through a simple switch circuit, and automatically runs the test case by the host computer, without the need to additionally develop an auxiliary function board or an independent test backplane, can reduce the operation steps of the tester, and significantly improves the test efficiency.

[0005] In a first aspect, a technical solution provided in an embodiment of the present invention is: a compatibility board test system, including a host computer, a core processing board, a test module and a message acquisition board; The host computer generates a control instruction based on the test requirements or test results, and the core processing board generates serial port data or a drive signal in response to the control instruction; The test module determines a corresponding test path in response to the serial port data or the drive signal; The message acquisition board acquires the serial port data sent by the test path and sends it to the host computer. The host computer determines the test result in response to the serial port data based on the data comparison strategy and generates a test report based on the test result.

[0006] In this solution, the test environment and test object are switched through the test module, and the test case is automatically run by the host computer. There is no need to develop additional auxiliary function boards or independent test backplanes, and there is no need to manually change the test object. The operation steps of the tester can be reduced, and the test efficiency is significantly improved. The test module is set in the core processing board and the message acquisition board, and the corresponding test path is selected through the serial port data or the drive signal. The serial port data is transmitted through the test path, and the serial port data before and after the transmission are compared. Based on the comparison result, it is judged whether the communication function of the board to be tested is normal. The test process has a high degree of automation, is less affected by external factors, has a high test accuracy, and can also be used normally without affecting the normal use of the board under formal operating conditions. The test state and the normal use state are compatible with each other, which improves the environmental adaptability of the system. There is no need to set up additional test equipment, the structure is relatively simple, and the production cost is low.

[0007] Preferably, the test module includes a function board, a switch device controlled by the function board, and a first dip switch and a second dip switch connected to the switch device.

[0008] In this solution, the test environment and test object of the test module are switched by setting the first switch circuit and the second switch circuit, without manual operation, and can be automatically switched according to the test requirements, thereby simplifying the test steps and improving the test efficiency.

[0009] Preferably, the switch device includes a double-row pin, a first switch circuit and a second switch circuit which are opened and closed to each other; the first pin of the double-row pin receives the serial port data and transmits it to the first dip switch through the first switch circuit; or the serial port data is received through the second pin of the double-row pin and transmitted to the second dip switch through the second switch circuit.

[0010] In the present solution, a first rotary switch is arranged on the first switch circuit, wherein the first switch circuit is controlled by a function board, and the first switch circuit corresponds to the normally closed state of the relay. When it is necessary to test the function of the board in the normally closed state of the relay, the function board controls the first switch circuit to be turned on and the second switch circuit to be turned off. The serial port data enters the message acquisition board through the first switch circuit, and the serial port data is detected. The test object is switched by opening and closing the first switch circuit and the second switch circuit. There is no need for multiple function boards to independently send messages for auxiliary testing, and the first data to be tested of the board can be synchronously tested at one time, which greatly improves the speed of board testing and thus improves the test efficiency.

[0011] Preferably, the function board receives the driving signal to control the first switch circuit and the second switch circuit to open and close each other.

[0012] In this solution, the first switch circuit and the second switch circuit are opened and closed with each other, which can increase the data volume of the serial port data originally transmitted by only one switch circuit, thereby increasing the test object during the one-time test. The test object is switched by opening and closing the second switch circuit and the first switch circuit. There is no need for multiple functional boards to independently send messages for auxiliary testing. The first data to be tested on the board can be synchronously tested at one time, which greatly improves the speed of board testing and thus improves test efficiency.

[0013] Preferably, the serial port data generated in response to the control instruction is used as the original serial port data, the serial port data sent by the test path acquired by the message acquisition board and sent to the host computer is used as the test serial port data, and the host computer compares the original serial port data with the test serial port data; If the comparison results of the original serial port data and the test serial port data are consistent, the communication function of the board corresponding to the test serial port data is normal; if the comparison results of the original serial port data and the test serial port data are inconsistent, the communication serial port number corresponding to the abnormal data will be marked, the data of the corresponding serial port communication will be detected and a test report will be generated.

[0014] In this scheme, by comparing the original serial port data with the test serial port data, it is compared whether there is a data difference between the two before and after the communication. If the data difference is greater, it means that the data is more affected during the communication process, that is, the communication function of the board is worse. Therefore, by comparing the difference between the two, it is possible to measure whether the function of the board to be tested is normal, which is convenient for testers to classify the boards to be tested based on the test results, and then adopt corresponding processing methods to find problems in the boards to be tested, thereby improving test efficiency.

[0015] Preferably, the operating state of the first dip switch includes a test state and an operation state, the first dip switch in the operation state is normally open; the first dip switch in the test state connects the corresponding serial port according to the number of times the first switch circuit is connected and based on the binary value sequence.

[0016] In this solution, since different functions of the board correspond to different serial ports for serial data input, it is necessary to switch the serial ports continuously during each test. In order to simplify the test steps, a dip switch is set. The switching sequence of the dip switch can be set based on the specific needs of the test. There is no need to manually adjust the number of connected serial ports. The serial ports can be automatically switched according to the test sequence and the number of tests, which reduces the workload of testers during testing, thereby improving test efficiency and reducing the probability of errors caused by manual operation.

[0017] Preferably, the operating state of the second dip switch includes a test state and an operation state, the second dip switch in the operation state is normally open; the second dip switch in the test state connects the corresponding serial port according to the number of times the second switch circuit is connected and based on the binary value sequence.

[0018] In this solution, in order to test more functions during testing, two groups of dip switches are set up, and the corresponding dip switches are started by connecting and disconnecting the switch circuit, thereby reducing the driving pressure during serial communication and improving the test efficiency without affecting the communication quality. At the same time, due to the existence of the dip switch, in the formal operation state, the dip switch is set to normally open. At this time, the full function of the board can communicate normally, and the circuit structure in the test state will not affect the normal operation of the board, thereby improving compatibility and practicality, and the startup state in different states can be achieved under the same structure, which can support testing and formal operation at the same time, reducing production costs.

[0019] Preferably, the number of serial ports connected to the first dip switch and the second dip switch does not exceed five.

[0020] In this solution, the number of serial ports of the first test serial port and the second test serial port does not exceed five, which can ensure the driving capability of the serial port communication, and can effectively avoid the serial port communication being too busy due to the excessive amount of test data, thereby causing poor communication effect and thus interfering with the test results. It not only ensures the driving capability of the serial port communication, but also reduces the test error caused by external influences and improves the test accuracy.

[0021] Preferably, the function board receives the driving signal and controls the start and stop of the coil through the IO port; If the coil is in a stopped state, the first switch circuit is turned on and the second switch circuit is turned off; If the coil is in the starting state, the first switch circuit is closed and the second switch circuit is opened.

[0022] In this solution, the function board is used to detect the test progress and control the opening and closing of the first switch circuit and the second switch circuit according to the test progress. Compared with the existing technology that uses the function board to correspond the test data of the test board to the receiving serial port of the message acquisition board according to different functions, and uses independent sending messages to test the test data, the action performed is simpler, and only two operations, judgment and control, need to be performed, which greatly reduces the number of function boards used, thereby reducing the test cost. At the same time, since the execution action of the function board is simple, the test process is also simplified, thereby improving the test efficiency.

[0023] Preferably, the abnormal data is partial data in which the test serial port data is inconsistent with the original serial port data.

[0024] In this scheme, in order to facilitate test personnel to quickly and accurately locate problems that occur when testing the board to be tested, the part of the test serial port data that is inconsistent with the original serial port data is taken as abnormal data, and the communication serial port number corresponding to the abnormal data is marked. The board is troubleshooted according to the board function corresponding to the serial port corresponding to the serial port number, which improves the speed of locating board faults and thus improves the efficiency of solving problems after testing.

[0025] Beneficial effects of the present invention: (1) The present invention switches the test environment and the test object through the test module, and the host computer automatically runs the test case, without the need to develop an additional auxiliary function board or an independent test backplane, and without the need to manually change the test object, which can reduce the operating steps of the tester and significantly improve the test efficiency; (2) The present invention sets a test module in the core processing board and the message acquisition board, selects a corresponding test path through serial port data or a driving signal, transmits the serial port data through the test path, and compares the serial port data before and after the transmission. Based on the comparison result, it is judged whether the communication function of the board to be tested is normal. The test process has a high degree of automation, is less affected by external factors, and has a high test accuracy. (3) The present invention can be used without affecting the normal use of the board under formal operating conditions. The test state and the normal use state are compatible with each other, which improves the environmental adaptability of the system. There is no need to set up additional test equipment, the structure is relatively simple, and the production cost is low.

[0026] The above invention content is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention, it can be implemented according to the contents of the specification. In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Other features, objects and advantages of the present invention will become more apparent by reading the detailed description of non-limiting embodiments made with reference to the following drawings. The drawings are only for the purpose of illustrating preferred embodiments and are not to be considered as limiting the present invention. Also, the same reference symbols are used throughout the drawings to represent the same parts.

[0028] Figure 1 A schematic diagram of a compatibility board test system of the present invention; Figure 2 This is a schematic diagram of an existing board test system. DETAILED DESCRIPTION

[0029] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific implementation method described herein is only an optimal embodiment of the present invention, which is only used to explain the present invention and does not limit the scope of protection of the present invention. All other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0030] Before discussing the exemplary embodiments in more detail, it should be mentioned that some exemplary embodiments are described as processes or methods depicted as flow charts. Although the flow charts describe the operations (or steps) as sequential processes, many of the operations (or steps) therein can be implemented in parallel, concurrently, or simultaneously. In addition, the order of the operations can be rearranged. The process can be terminated when its operation is completed, but can also have additional steps not included in the drawings; the process can correspond to a method, function, procedure, subroutine, subprogram, etc.

[0031] Example 1: Figure 1As shown, in order to solve the problem that the backplane used in the existing board test needs to be configured with more functional boards in the test environment for auxiliary testing, and the test object switching steps are relatively cumbersome, resulting in low test efficiency, this embodiment provides a compatibility board test system, including a host computer, a core processing board, a test module and a message acquisition board; the host computer generates a control instruction based on the test requirements or test results, and the core processing board generates serial port data or a drive signal in response to the control instruction; The test module determines a corresponding test path in response to the serial port data or the drive signal; The message acquisition board acquires the serial port data sent by the test path and sends it to the host computer. The host computer determines the test result corresponding to the serial port data based on the data comparison strategy and generates a test report based on the test result.

[0032] In this embodiment, the test module includes a function board, a switch device, and a first dip switch and a second dip switch; the switch device includes a double row of pins, a first switch circuit and a second switch circuit which are opened and closed to each other.

[0033] This embodiment switches the test environment and the test object of the test module by setting the first switch circuit and the second switch circuit. No manual operation is required and the test environment and the test object can be switched automatically according to the test requirements, which simplifies the test steps and improves the test efficiency.

[0034] In this embodiment, the first pin of the double-row pin receives the serial port data and transmits it to the first dip switch through the first switch circuit; or the second pin of the double-row pin receives the serial port data and transmits it to the second dip switch through the second switch circuit.

[0035] In this embodiment, a first dial switch is set on the first switch circuit, wherein the first switch circuit is controlled by the function board, and the first switch circuit corresponds to the normally closed state of the relay. When it is necessary to test the function of the board in the normally closed state of the relay, the function board controls the first switch circuit to be turned on and the second switch circuit to be turned off. The serial port data enters the message acquisition board through the first switch circuit, and the serial port data is detected. The test object is switched by opening and closing the first switch circuit and the second switch circuit. There is no need for multiple function boards to independently send messages for auxiliary testing, and the first data to be tested of the board can be synchronously tested at one time, which greatly improves the speed of board testing, thereby improving the test efficiency.

[0036] In this embodiment, the function board receives the driving signal to control the first switch circuit and the second switch circuit to open and close each other.

[0037] In this embodiment, the first switch circuit and the second switch circuit are opened and closed with each other, which can increase the data volume of the serial port data originally transmitted by only one switch circuit, thereby increasing the test object during a one-time test. The test object is switched by opening and closing the second switch circuit and the first switch circuit. There is no need for multiple functional boards to independently send messages for auxiliary testing. The first data to be tested on the board can be synchronously tested at one time, which greatly improves the speed of board testing and thus improves test efficiency.

[0038] In this embodiment, the serial port data generated in response to the control instruction is used as the original serial port data, the serial port data sent by the test path acquired by the message acquisition board and sent to the host computer is used as the test serial port data, and the host computer compares the original serial port data with the test serial port data; If the comparison results of the original serial port data and the test serial port data are consistent, the communication function of the board corresponding to the test serial port data is normal; if the comparison results of the original serial port data and the test serial port data are inconsistent, the communication serial port number corresponding to the abnormal data will be marked, the data of the corresponding serial port communication will be detected and a test report will be generated.

[0039] In this embodiment, by comparing the original serial port data with the test serial port data, it is compared whether there is a data difference between the two before and after the communication. If the data difference is greater, it means that the data is more affected during the communication process, that is, the communication function of the board is worse. Therefore, by comparing the difference between the two, it is possible to measure whether the function of the board to be tested is normal, which is convenient for testers to classify the board to be tested based on the test results, so as to adopt corresponding processing methods to find problems in the board to be tested, thereby improving test efficiency.

[0040] In this embodiment, the operating state of the first dip switch includes a test state and an operation state. The first dip switch in the operation state is normally open; the first dip switch in the test state connects the corresponding serial port according to the number of times the first switch circuit is connected and based on the binary value sequence.

[0041] In this embodiment, since different functions of the board card correspond to different serial ports for serial port data input, when conducting a test, it is necessary to switch the serial port continuously during each test. In order to simplify the test steps, a dip switch is provided, and the switching sequence of the dip switch can be set based on the specific needs during the test. There is no need to manually adjust the number of connected serial ports, and the serial port can be automatically switched according to the test sequence and the number of tests, which reduces the workload of the tester during the test, thereby improving the test efficiency and reducing the probability of errors caused by manual operation.

[0017] In this embodiment, the operating state of the second dip switch includes a test state and an operating state. The second dip switch in the operating state is normally open. The second dip switch in the test state connects the corresponding serial port according to the number of times the second switch circuit is connected and based on the binary value sequence.

[0042] In order to test more functions during testing, this embodiment sets two groups of dip switches, and starts the corresponding dip switches by connecting and disconnecting the switch circuit, thereby reducing the driving pressure during serial communication and improving the test efficiency without affecting the communication quality. At the same time, due to the existence of the dip switches, in the formal operation state, the dip switches are set to normally open. At this time, the full functions of the board can communicate normally, and the circuit structure in the test state will not affect the normal operation of the board, thereby improving compatibility and practicality. The startup states in different states can be realized under the same structure, which can support testing and formal operation at the same time, reducing production costs.

[0043] In this embodiment, the number of serial ports connected to the first dip switch and the second dip switch does not exceed five.

[0044] In this embodiment, the number of serial ports of the first test serial port and the second test serial port does not exceed five, which can ensure the driving capability of serial port communication, and can effectively avoid the serial port communication being too busy due to the excessive amount of test data, thereby causing poor communication effect and thus interfering with the test results. It not only ensures the driving capability of serial port communication, but also reduces the test error caused by external influences, thereby improving the test accuracy.

[0045] In this embodiment, the function board receives the driving signal and controls the start and stop of the coil through the IO port; If the coil is in a stopped state, the first switch circuit is turned on and the second switch circuit is turned off; If the coil is in the starting state, the first switch circuit is closed and the second switch circuit is opened.

[0046] The function board of this embodiment is used to detect the test progress and control the opening and closing of the first switch circuit and the second switch circuit according to the test progress. Figure 2As shown, if the existing test scheme is to test the multi-channel serial ports of the message acquisition board, the tester needs to insert the function board into slots 1 to n one by one, or fill the slots with multiple function boards to verify that all channel communication functions are normal. The host computer issues a test instruction through the debugging serial port. After receiving the instruction, the core processing board sends a message output instruction to the function board 1 to n through the communication bus. The message acquisition board receives the message and uploads it to the host computer through the debugging serial port. The host computer compares the sent and received data to determine the serial port signal acquisition function of the message acquisition board. Compared with the existing technology that uses the function board to correspond the test data of the board to be tested to the receiving serial port of the message acquisition board according to different functions, and the test data is tested by sending messages independently, the action performed is simpler, and only two operations, judgment and control, need to be performed, which greatly reduces the number of function boards used, thereby reducing the test cost. At the same time, due to the simple execution of the function board, the test process is also simplified, thereby improving the test efficiency.

[0047] In this embodiment, the abnormal data is a portion of data that is inconsistent between the test serial port data and the original serial port data.

[0048] In order to facilitate test personnel to quickly and accurately locate problems that occur when testing a board to be tested, this embodiment uses part of the test serial port data that is inconsistent with the original serial port data as abnormal data, and marks the communication serial port number corresponding to the abnormal data. The board is troubleshooted according to the board function corresponding to the serial port corresponding to the serial port number, thereby improving the speed of locating board faults and thus improving the efficiency of solving problems after testing.

[0049] In this embodiment, the test environment and the test object are switched by the test module, and the test case is automatically run by the host computer. There is no need to develop additional auxiliary function boards or independent test backplanes, and there is no need to manually change the test objects. The operation steps of the test personnel can be reduced, and the test efficiency is significantly improved. The test module is set in the core processing board and the message acquisition board, and the corresponding test path is selected through the serial port data or the drive signal. The serial port data is transmitted through the test path, and the serial port data before and after the transmission are compared. Based on the comparison result, it is judged whether the communication function of the board to be tested is normal. The test process has a high degree of automation, is less affected by external factors, has a high test accuracy, and can also be used normally without affecting the board under formal operating conditions. The test state and the normal use state are compatible with each other, which improves the environmental adaptability of the system, and there is no need to set up additional test equipment. The structure is relatively simple and the production cost is low.

[0050] Specifically, the specific test process of this embodiment is as follows: the host computer executes the test case, the core processing board sends the serial port data Test, at this time Test1 is connected to the normally closed node, the code switch is fully closed under the test environment, the serial ports 1-5 of the message acquisition board receive the message, and send it to the host computer through the debugging serial port for comparison; next, the host computer issues an instruction to operate the core board control function board to output the relay coil drive signal, the relay normally open node is closed, the normally closed node is disconnected, Test2 is turned on, Test1 is disconnected, and the 6-10 serial ports of the message acquisition board upload the received message in the same way. The number of double-row pins, code switches and external relays is flexibly configured according to the actual number of receiving paths of the message acquisition board.

[0051] In this embodiment, the system can be used in both formal operation and test environment. Under formal operation conditions, the double-row pins have no external wiring and do not occupy the serial port of the core processing board; the DIP switches are all in the open state and do not affect the serial port communication of the message collection board. Both devices can use DIP plug-ins, without adding additional SMT processes, reducing production costs.

[0052] It can be seen from the above embodiments that at least the following substantial effects are achieved: (1) The present invention switches the test environment and the test object through the test module, and the host computer automatically runs the test case, without the need to develop an additional auxiliary function board or an independent test backplane, and without the need to manually change the test object, which can reduce the operating steps of the tester and significantly improve the test efficiency; (2) The present invention sets a test module in the core processing board and the message acquisition board, selects a corresponding test path through serial port data or a driving signal, transmits the serial port data through the test path, and compares the serial port data before and after the transmission. Based on the comparison result, it is judged whether the communication function of the board to be tested is normal. The test process has a high degree of automation, is less affected by external factors, and has a high test accuracy. (3) The present invention can be used without affecting the normal use of the board under formal operating conditions. The test state and the normal use state are compatible with each other, which improves the environmental adaptability of the system. There is no need to set up additional test equipment, the structure is relatively simple, and the production cost is low.

[0053] The specific implementation described above is a preferred implementation of a compatibility board test system of the present invention, and is not intended to limit the specific implementation scope of the present invention. The scope of the present invention includes but is not limited to this specific implementation. All equivalent changes made in accordance with the shape and structure of the present invention are within the protection scope of the present invention.

Claims

1. A compatibility board test system, characterized in that: Including host computer, core processing board, test module and message collection board; The host computer generates a control instruction based on the test requirements or test results, and the core processing board generates serial port data or a drive signal in response to the control instruction; The test module determines a corresponding test path in response to the serial port data or the drive signal; The message acquisition board acquires the serial port data sent by the test path and sends it to the host computer. The host computer determines the test result in response to the serial port data based on the data comparison strategy and generates a test report based on the test result.

2. A compatibility board test system according to claim 1, characterized in that: The test module comprises a function board, a switch device controlled by the function board, and a first dial switch and a second dial switch connected to the switch device.

3. A compatibility board test system according to claim 2, characterized in that: The switch device comprises a double row of pins, a first switch circuit and a second switch circuit which are switched on and off with each other; The first pin of the double-row pin receives the serial port data and transmits it to the first dip switch through the first switch circuit; or the second pin of the double-row pin receives the serial port data and transmits it to the second dip switch through the second switch circuit.

4. A compatibility board test system according to claim 2, characterized in that: The function board receives the driving signal to control the first switch circuit and the second switch circuit to open and close each other.

5. The compatibility board test system according to claim 1, characterized in that: The serial port data generated in response to the control instruction is used as the original serial port data, the serial port data sent by the test path acquired by the message acquisition board and sent to the host computer is used as the test serial port data, and the host computer compares the original serial port data with the test serial port data; If the comparison results of the original serial port data and the test serial port data are consistent, the communication function of the board corresponding to the test serial port data is normal; If the comparison result between the original serial port data and the test serial port data is inconsistent, the communication serial port number corresponding to the abnormal data is marked, the data of the serial port communication with the corresponding number is detected and a test report is generated.

6. A compatibility board test system according to claim 3, characterized in that: The running state of the first dip switch includes a test state and an operation state. The first dip switch in the operation state is normally open. The first dip switch in the test state connects the corresponding serial port according to the number of times the first switch circuit is connected and based on the binary value sequence.

7. A compatibility board test system according to claim 3, characterized in that: The running state of the second dip switch includes a test state and an operation state. The second dip switch in the operation state is normally open. The second dip switch in the test state connects the corresponding serial port according to the number of times the second switch circuit is connected and based on the binary value sequence.

8. A compatibility board test system according to claim 3, characterized in that: The number of serial ports connected to the first dip switch and the second dip switch does not exceed five.

9. A compatibility board test system according to claim 4, characterized in that: The function board receives the driving signal and controls the start and stop of the coil through the IO port; If the coil is in a stopped state, the first switch circuit is turned on and the second switch circuit is turned off; if the coil is in a started state, the first switch circuit is turned off and the second switch circuit is turned on.

10. The compatibility board test system according to claim 5, characterized in that: The abnormal data is part of the data where the test serial port data is inconsistent with the original serial port data.

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