Light attenuation value determination method and device, computer equipment and storage medium

By collecting optical power of PON devices, identifying and supplementing optical power parameters of abnormal devices, optimizing the optical power acquisition sequence, the problem of low efficiency in determining optical fade value is solved, and high-efficiency determination of optical fade value and data integrity are achieved.

CN119814141APending Publication Date: 2025-04-11CHINA TELECOM CORP LTD TECHNOLOGY INNOVATION CENTER +1
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Patent Information

Application Number
CN202411872941.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-18
Publication Date
2025-04-11

AI Technical Summary

Technical Problem

In PON equipment, when there are many ONUs or the equipment load is high, the efficiency of determining the light fade value is low, and the lack of light fade index in the prior art leads to cumbersome collection work, which affects the efficiency of determining the light fade value.

Method used

By collecting optical power of the target device, identifying the missing optical power parameters of the abnormal device, and performing targeted optical power acquisition, combining the current optical fade value sorting and effective acquisition period, the optical power acquisition sequence is optimized.

Benefits of technology

The efficiency of determining the optical fade value is improved, the operation is complicated, the resource waste is avoided, and the data integrity of the optical power parameters is ensured.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to the technical field of data processing, in particular to a light attenuation value determination method and device, computer equipment and a storage medium. The method comprises the following steps: carrying out optical power acquisition on at least one target device to obtain optical power parameters corresponding to each target device; if it is determined that abnormal equipment with missing optical power parameters exists in the target equipment according to the obtained optical power parameters, optical power collection is carried out on the missing optical power parameters of the abnormal equipment; and after the missing optical power parameter of the abnormal equipment is obtained, determining the current optical attenuation value corresponding to each target equipment according to the optical power parameter corresponding to each target equipment. According to the method and the device, the operation complexity of collecting the optical power of the target devices is reduced, time waste and resource waste caused by repeatedly collecting the optical power of the target devices when abnormal devices with missing optical power parameters exist in the target devices are avoided, and the efficiency of determining the current optical attenuation values corresponding to the target devices is improved.
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Description

Technical Field

[0001] The present application relates to the field of data processing technology, and in particular to a method, device, computer equipment and storage medium for determining a light attenuation value. Background Art

[0002] In the existing scheme for collecting optical attenuation data of PON (Passive Optical Network) equipment through the SNMP (Simple Network Management Protocol) protocol, the data collection scheduling task is received at regular intervals, and the thread is started to traverse the optical power index through the SNMPwalk (a practical tool). The optical attenuation index is obtained by analyzing and calculating the emitting power and receiving power, and then the optical attenuation value is sent to the upper-layer business system for optical attenuation control.

[0003] However, in the prior art, when there are a large number of ONUs (Optical Network Units) under the OLT (Optical Line Terminal) or the equipment is under a high operating load, the receiving / emitting power collection of the MIB (Management Information Base) node may time out, resulting in the inability to calculate the optical attenuation through the receiving and emitting power, causing the optical attenuation indicator to be missing. At this time, it is necessary to re-collect the receiving and emitting power of each device, which also makes the collection work cumbersome and labor-intensive, affecting the efficiency of determining the optical attenuation value. Summary of the invention

[0004] Based on this, it is necessary to provide a method, device, computer equipment and storage medium for determining a light attenuation value that can improve the efficiency of determining the light attenuation value in order to solve the above technical problems.

[0005] In a first aspect, the present application provides a method for determining a light attenuation value. The method comprises:

[0006] Collecting optical power of at least one target device to obtain optical power parameters corresponding to each target device;

[0007] If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device;

[0008] After the optical power parameters missing from the abnormal device are obtained, the current optical attenuation values ​​corresponding to the target devices are determined according to the optical power parameters corresponding to the target devices.

[0009] In one of the embodiments, the optical power acquisition of the optical power parameters missing from the abnormal device includes:

[0010] Obtaining a device logical identifier of the abnormal device and an optical power identifier of the missing optical power parameter;

[0011] According to the device logic identifier and the optical power identifier, optical power collection is performed on the optical power parameters missing from the abnormal device.

[0012] In one of the embodiments, the optical power parameters include a receiving optical power parameter and a transmitting optical power parameter;

[0013] The step of collecting optical power parameters missing from the abnormal device according to the device logic identifier and the optical power identifier to obtain the optical power parameters missing from the abnormal device includes:

[0014] If the received optical power parameter of the abnormal device is missing, then according to the device logical identifier and the received optical power identifier corresponding to the received optical power parameter, optical power collection is performed for the missing optical power parameter of the abnormal device to obtain the missing received optical power parameter of the abnormal device;

[0015] If the transmitting optical power parameter of the abnormal device is missing, optical power collection is performed on the missing optical power parameter of the abnormal device according to the device logical identifier and the transmitting optical power identifier corresponding to the transmitting optical power parameter to obtain the missing transmitting optical power parameter of the abnormal device.

[0016] In one embodiment, the method further comprises:

[0017] According to the current optical attenuation value corresponding to each target device, the optical power collection order for performing optical power collection on each target device next time is determined.

[0018] In one of the embodiments, determining the optical power collection order for performing optical power collection on each target device next time according to the current optical attenuation value corresponding to each target device includes:

[0019] Sorting the target devices in descending order according to the current light attenuation values ​​to obtain a sorting result;

[0020] The ranking result is used as the optical power collection order for the next optical power collection of each target device.

[0021] In one of the embodiments, determining, based on the obtained optical power parameters, that there is an abnormal device with missing optical power parameters in each target device includes:

[0022] For each target device, determining an effective collection period according to the optical power collection time of the target device;

[0023] If the optical power parameters corresponding to the target device are not received within the valid collection period, or the receiving time of the optical power parameters corresponding to the target device does not belong to the valid collection period, the target device is regarded as an abnormal device with missing optical power parameters.

[0024] In a second aspect, the present application also provides a device for determining a light attenuation value. The device comprises:

[0025] A collection module, used to collect optical power of at least one target device to obtain optical power parameters corresponding to each target device;

[0026] A first determination module is used for, if it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, then collecting optical power of the missing optical power parameters of the abnormal device;

[0027] The second determination module is used to determine the current optical attenuation value corresponding to each target device according to the optical power parameter corresponding to each target device after obtaining the optical power parameter missing from the abnormal device.

[0028] In a third aspect, the present application further provides a computer device. The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the following steps when executing the computer program:

[0029] Collecting optical power of at least one target device to obtain optical power parameters corresponding to each target device;

[0030] If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device;

[0031] After the optical power parameters missing from the abnormal device are obtained, the current optical attenuation values ​​corresponding to the target devices are determined according to the optical power parameters corresponding to the target devices.

[0032] In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0033] Collecting optical power of at least one target device to obtain optical power parameters corresponding to each target device;

[0034] If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device;

[0035] After the optical power parameters missing from the abnormal device are obtained, the current optical attenuation values ​​corresponding to the target devices are determined according to the optical power parameters corresponding to the target devices.

[0036] In a fifth aspect, the present application further provides a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0037] Collecting optical power of at least one target device to obtain optical power parameters corresponding to each target device;

[0038] If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device;

[0039] After the optical power parameters missing from the abnormal device are obtained, the current optical attenuation values ​​corresponding to the target devices are determined according to the optical power parameters corresponding to the target devices.

[0040] The above-mentioned optical attenuation value determination method, device, computer equipment and storage medium obtain the optical power parameters corresponding to each target device, and when there is an abnormal device with missing optical power parameters in each target device, the optical power parameters missing from the abnormal device are collected; and then, after obtaining the optical power parameters missing from the abnormal device, the current optical attenuation value corresponding to each target device is determined according to the optical power parameters corresponding to each target device. According to the above content, in the process of determining the current optical attenuation value corresponding to each target device, if there is an abnormal device with missing optical power parameters in each target device, the optical power can be collected for the optical power parameters missing from the abnormal device. In this process, it is not necessary to collect optical power for each target device, and separate optical power collection is performed for the optical power parameters missing from the abnormal device at the time, which reduces the cumbersomeness of the operation of collecting optical power for the target device, avoids the time and resource waste caused by repeated optical power collection for each target device when there is an abnormal device with missing optical power parameters in each target device, improves the efficiency of determining the current optical attenuation value corresponding to each target device, and ensures the data integrity of the optical power parameters corresponding to each target device under the premise of improving the optical power collection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 An application environment diagram of a method for determining a light attenuation value provided in an embodiment of the present application;

[0042] Figure 2 A schematic diagram of a flow chart of a first method for determining a light attenuation value provided in an embodiment of the present application;

[0043] Figure 3 A schematic diagram of a flow chart of a second method for determining a light attenuation value provided in an embodiment of the present application;

[0044] Figure 4 A schematic diagram of a flow chart of a third method for determining a light attenuation value provided in an embodiment of the present application;

[0045] Figure 5 A schematic flow chart of a fourth method for determining a light attenuation value provided in an embodiment of the present application;

[0046] Figure 6 A structural block diagram of a device for determining a light attenuation value provided in an embodiment of the present application;

[0047] Figure 7 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0048] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0049] The light attenuation value determination method provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown. Among them, the terminal 102 communicates with the server 104 through the network. The data storage system can store the data that the server 104 needs to process. The data storage system can be integrated on the server 104, or it can be placed on the cloud or other network servers. By obtaining the optical power parameters corresponding to each target device, and in the case that there is an abnormal device with missing optical power parameters in each target device, the optical power parameters missing from the abnormal device are collected; then, after obtaining the optical power parameters missing from the abnormal device, the current optical attenuation value corresponding to each target device is determined according to the optical power parameters corresponding to each target device. Among them, the terminal 102 can be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, Internet of Things devices and portable wearable devices. The Internet of Things devices can be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, etc. Portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc. The server 104 can be implemented with an independent server or a server cluster consisting of multiple servers.

[0050] In one embodiment, Figure 2 As shown, a method for determining a light attenuation value is provided, and the method is applied to Figure 1The terminal 102 in the example is used as an example to illustrate, and the following steps are included:

[0051] S201: Collect optical power of at least one target device to obtain optical power parameters corresponding to each target device.

[0052] It should be noted that when it is necessary to collect optical power for at least one target device, an optical power collection instruction can be sent to the optical power collection element corresponding to each target device to control each optical power collection element to perform optical power collection operations on each target device and obtain the optical power parameters corresponding to each target device.

[0053] The optical power parameters include receiving optical power parameters and sending optical power parameters.

[0054] In one embodiment of the present application, for each target device, the optical power collection element may include a receiving optical power collection element and a sending optical power collection element. Then, in the process of collecting optical power for the target device according to the receiving optical power collection element, an optical power collection instruction can be sent to the receiving optical power collection element and the sending optical power collection element, so that the receiving optical power collection element is controlled to obtain the receiving optical power parameters corresponding to the target device, and the sending optical power collection element is controlled to obtain the sending optical power parameters corresponding to the target device, thereby realizing the operation of obtaining the optical power parameters corresponding to the target device.

[0055] S202: If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device.

[0056] It should be noted that after obtaining the optical power parameters corresponding to each target device, it is possible to verify whether there are any missing optical power parameters corresponding to each target device. If so, it is determined that there are abnormal devices with missing optical power parameters in each target device, and then optical power collection is performed on the missing optical power parameters of the abnormal device.

[0057] In one embodiment of the present application, when it is necessary to determine whether there are abnormal devices with missing optical power parameters among the target devices, the optical power parameters corresponding to each target device can be traversed as a whole to verify whether the acquired optical power parameters include the optical power parameters corresponding to each target device. If so, it is determined that there are no abnormal devices with missing optical power parameters among the target devices; if not, the target devices with missing optical power parameters are regarded as abnormal devices.

[0058] To further illustrate, when it is necessary to perform optical power collection on the optical power parameters that are missing from an abnormal device, the optical power parameters that are missing from the abnormal device that need to be obtained can be pre-specified, and further, when it is necessary to perform optical power collection on the optical power parameters that are missing from the abnormal device, the device identification of the abnormal device can be determined, and further, based on the device identification of the abnormal device, an optical power collection instruction can be accurately sent to the optical power collection element corresponding to the abnormal device, so as to control each optical power collection element to perform an optical power collection operation on each target device, and obtain the optical power parameters corresponding to each target device.

[0059] S203, after obtaining the optical power parameters missing from the abnormal device, determine the current optical attenuation value corresponding to each target device according to the optical power parameters corresponding to each target device.

[0060] In one embodiment of the present application, when it is necessary to determine the current optical attenuation value corresponding to each target device based on the optical power parameters corresponding to each target device, for each target device, since the optical power parameters include a received optical power parameter and a transmitted optical power parameter, when it is necessary to determine the current optical attenuation value of the target device, the absolute value of the received optical power parameter and the absolute value of the transmitted optical power parameter can be summed, and the obtained calculation result is the current optical attenuation value corresponding to the target device.

[0061] The above-mentioned method for determining the optical attenuation value obtains the optical power parameters corresponding to each target device, and when there is an abnormal device with missing optical power parameters in each target device, the optical power parameters missing from the abnormal device are collected; and then, after obtaining the optical power parameters missing from the abnormal device, the current optical attenuation value corresponding to each target device is determined according to the optical power parameters corresponding to each target device. According to the above content, in the process of determining the current optical attenuation value corresponding to each target device, if there is an abnormal device with missing optical power parameters in each target device, the optical power can be collected for the optical power parameters missing from the abnormal device. In this process, it is not necessary to collect optical power for each target device, and separate optical power collection is performed for the optical power parameters missing from the abnormal device at the time, which reduces the cumbersomeness of the operation of collecting optical power for the target device, avoids the time and resource waste caused by repeatedly collecting optical power for each target device when there is an abnormal device with missing optical power parameters in each target device, improves the efficiency of determining the current optical attenuation value corresponding to each target device, and ensures the data integrity of the optical power parameters corresponding to each target device under the premise of improving the efficiency of optical power collection.

[0062] In one embodiment, if Figure 3 As shown in the figure, when it is necessary to collect the optical power parameters missing from the abnormal device, the following contents may be specifically included:

[0063] S301, obtaining a device logic identifier of an abnormal device and an optical power identifier of a missing optical power parameter.

[0064] It should be noted that the device logical identification determination rules for the target device and the optical power parameter identification determination rules for the optical power parameters can be pre-specified; then, according to the device logical identification determination rules and the optical power parameter identification determination rules, the device logical identification of each target device and the optical power identification corresponding to each optical power parameter are determined respectively; to ensure that after determining the abnormal device and the optical power parameter missing of the abnormal device, the device logical identification of the abnormal device and the optical power identification of the missing optical power parameter can be determined according to the device logical identification of each target device and the optical power identification corresponding to each optical power parameter.

[0065] In one embodiment of the present application, the device logical identification determination rules may record setting rules for identification content and identification number, wherein the identification content may include but is not limited to: (1) basic information: device name, model, number, production date, manufacturer, etc.; (2) status information: the operating status of the device (such as normal, under maintenance, disabled, etc.); (3) safety information: safety warning signs, operating precautions, etc.; (4) responsible person information: equipment responsible person, contact information, etc.; wherein the identification number means that each device should have a unique number to avoid confusion.

[0066] S302: Collect optical power parameters of the abnormal device that are missing according to the device logic identifier and the optical power identifier.

[0067] It should be noted that since the optical power parameters include received optical power parameters and transmitted optical power parameters, when optical power collection is performed on the optical power parameters that are missing from the abnormal device based on the device logical identifier and the optical power identifier, the optical power parameters that are missing from the abnormal device can be collected respectively for the device logical identifier and the received optical power identifier corresponding to the received optical power parameter, and for the device logical identifier and the transmitted optical power identifier corresponding to the transmitted optical power parameter.

[0068] Specifically, if the receiving optical power parameter of the abnormal device is missing, optical power collection is performed on the missing optical power parameter of the abnormal device according to the device logical identifier and the receiving optical power identifier corresponding to the receiving optical power parameter, so as to obtain the missing receiving optical power parameter of the abnormal device; if the transmitting optical power parameter of the abnormal device is missing, optical power collection is performed on the missing optical power parameter of the abnormal device according to the device logical identifier and the transmitting optical power identifier corresponding to the transmitting optical power parameter, so as to obtain the missing transmitting optical power parameter of the abnormal device.

[0069] In one embodiment of the present application, when it is necessary to determine the current optical attenuation value corresponding to the target device, the following contents may be included: the optical attenuation data collection service is started and registered to xxl-job; a snmpwalk collection is executed, and the device logical identification of all target devices is obtained and cached by executing a command once; the PON port optical power data collection scheduling task from xxl-job is received regularly; the optical power collection command is executed through snmpwalk to obtain the optical power parameters corresponding to each target device;

[0070] Among them, the device logical identification can be as follows:

[0071] .1.3.6.1.4.1.3902.1015.1010.1.7.4.1.21.807470848 = "0898280508221"

[0072] The OLT received optical power can be shown as follows:

[0073] .1.3.6.1.4.1.3902.1082.500.1.2.4.2.1.2.285278721.1 = -22.14

[0074] The ONU transmit optical power can be as follows:

[0075] .1.3.6.1.4.1.3902.1015.1010.1.1.1.29.1.4.807470848 = 5.69

[0076] If the optical power parameter of the target device is missing, it is marked as an abnormal device and 807470848 and / or 285278721.1 and / or 807470848 are recorded. When re-sampling, only the optical power parameter of the abnormal device corresponding to the index needs to be snmpgeted, and all nodes do not need to be traversed repeatedly. Then, the location information of the target device and the current optical attenuation value are calculated by the emitting power and receiving power, which are 2 frames, 1 slots, 3 ports and 27.83dBm.

[0077] The above-mentioned method for determining the optical attenuation value obtains the device logical identifier of the abnormal device and the optical power identifier of the missing optical power parameter; then, based on the device logical identifier and the optical power identifier, the optical power parameters missing from the abnormal device are collected, so as to avoid the waste of time and resources caused by repeatedly collecting optical power for each target device when there is an abnormal device with missing optical power parameters in each target device, thereby improving the efficiency of determining the current optical attenuation value corresponding to each target device, and ensuring the data integrity of the optical power parameters corresponding to each target device while improving the optical power collection efficiency.

[0078] In one embodiment, when it is necessary to determine the optical power collection order for each target device for the next optical power collection, it may specifically include the following contents: according to the current optical attenuation value corresponding to each target device, determine the optical power collection order for each target device for the next optical power collection.

[0079] Further explanation: in order to ensure that the optical power collection of each target device is carried out smoothly and reasonably, the optical power collection order of each target device for the next optical power collection can be determined according to the current optical attenuation value from large to small. Specifically: each target device is sorted in the order from large to small according to the current optical attenuation value to obtain the sorting result; then, the sorting result is used as the optical power collection order for the next optical power collection of each target device.

[0080] In another embodiment of the present application, the present application may further include the following: obtaining an optical power index list; performing optical power collection on at least one device to be collected according to the parameter type included in the optical power index list, and obtaining optical power parameters corresponding to each device to be collected. The parameter type may include but is not limited to: receiving optical power parameters and sending optical power parameters.

[0081] In another embodiment of the present application, if it is determined that the current optical attenuation value of a certain target device is abnormal based on the current optical attenuation value corresponding to each target device, the device logical identifier of the target device is stored in the exception list, and then, when the optical power of each target device is collected next time and the next optical attenuation value corresponding to each target device is determined, if there is no abnormality in the next optical attenuation value of the target device, the device logical identifier of the target device is deleted from the exception list.

[0082] The above-mentioned method for determining the optical attenuation value determines the optical power collection order for each target device for the next optical power collection by sorting the current optical attenuation values ​​from large to small, thereby achieving a smooth and reasonable arrangement for the optical power collection of each target device for the next time and ensuring the continuous and stable operation of the optical power parameter collection.

[0083] In one embodiment, if Figure 4 As shown, when it is necessary to determine, based on the obtained optical power parameters, whether there is an abnormal device with missing optical power parameters among the target devices, the following contents may be specifically included:

[0084] S401, for each target device, determining an effective collection period according to the optical power collection time of the target device.

[0085] It should be noted that when determining the effective collection period according to the optical power collection moment of the target device, the period length corresponding to the effective collection period can be pre-specified, and then the effective collection period is determined according to the period length and the optical power collection moment of the target device.

[0086] The cycle length may be set or adjusted according to the actual situation of the target device, the frequency of collecting optical power parameters, and the historical collection experience of the operation and maintenance personnel. The cycle length is not limited here.

[0087] In one embodiment of the present application, when it is necessary to determine the effective collection period, the optical power collection moment can be used as the period start time, and the sum of the period start time and the period length can be used as the period end time. Then, the time period between the period start time and the period end time can be used as the effective collection period.

[0088] S402: If the optical power parameters corresponding to the target device are not received within the valid collection period, or the receiving time of the optical power parameters corresponding to the target device does not belong to the valid collection period, the target device is regarded as an abnormal device with missing optical power parameters.

[0089] In one embodiment of the present application, if a target device is an abnormal device, it can be determined that the optical power parameters corresponding to the abnormal device are not received within the valid collection period, and / or the reception time of the optical power parameters of the abnormal device does not belong to the valid collection period.

[0090] The above-mentioned method for determining the optical attenuation value determines the effective collection period to determine whether there are abnormal devices with missing optical power parameters in each target device, thereby ensuring that the optical power parameters missing from the abnormal devices can be collected in a targeted manner, ensuring the smooth progress of subsequent processes, and reducing the time cost required for optical power collection.

[0091] In one embodiment, if Figure 5 As shown, when it is necessary to determine the current optical attenuation value corresponding to each target device, the following contents may be specifically included:

[0092] S501: Collect optical power of at least one target device to obtain optical power parameters corresponding to each target device.

[0093] S502: If it is determined that an abnormal device with missing optical power parameters exists among the target devices according to the obtained optical power parameters, a device logical identifier of the abnormal device and an optical power identifier of the missing optical power parameters are obtained.

[0094] S503, if the received optical power parameter of the abnormal device is missing, then according to the device logical identifier and the received optical power identifier corresponding to the received optical power parameter, optical power collection is performed for the missing optical power parameter of the abnormal device to obtain the missing received optical power parameter of the abnormal device.

[0095] S504, if the transmit optical power parameter of the abnormal device is missing, then according to the device logical identifier and the transmit optical power identifier corresponding to the transmit optical power parameter, perform optical power collection for the missing optical power parameter of the abnormal device to obtain the missing transmit optical power parameter of the abnormal device.

[0096] S505, after obtaining the missing optical power parameters of the abnormal device, determine the current optical attenuation value corresponding to each target device according to the optical power parameters corresponding to each target device.

[0097] The above-mentioned method for determining the optical attenuation value obtains the optical power parameters corresponding to each target device, and when there is an abnormal device with missing optical power parameters in each target device, the optical power parameters missing from the abnormal device are collected; and then, after obtaining the optical power parameters missing from the abnormal device, the current optical attenuation value corresponding to each target device is determined according to the optical power parameters corresponding to each target device. According to the above content, in the process of determining the current optical attenuation value corresponding to each target device, if there is an abnormal device with missing optical power parameters in each target device, the optical power can be collected for the optical power parameters missing from the abnormal device. In this process, it is not necessary to collect optical power for each target device, and separate optical power collection is performed for the optical power parameters missing from the abnormal device at the time, which reduces the cumbersomeness of the operation of collecting optical power for the target device, avoids the time and resource waste caused by repeatedly collecting optical power for each target device when there is an abnormal device with missing optical power parameters in each target device, improves the efficiency of determining the current optical attenuation value corresponding to each target device, and ensures the data integrity of the optical power parameters corresponding to each target device under the premise of improving the efficiency of optical power collection.

[0098] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0099] Based on the same inventive concept, the embodiment of the present application also provides a light attenuation value determination device for implementing the light attenuation value determination method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations of one or more light attenuation value determination device embodiments provided below can refer to the limitations of the light attenuation value determination method above, and will not be repeated here.

[0100] In one embodiment, Figure 6 As shown, a device for determining a light attenuation value is provided, comprising: a collection module 10, a first determination module 20 and a second determination module 30, wherein:

[0101] The acquisition module 10 is used to acquire optical power of at least one target device to obtain optical power parameters corresponding to each target device.

[0102] The first determining module 20 is configured to collect optical power data for the optical power parameters missing from the abnormal device if it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters.

[0103] The second determination module 30 is used to determine the current optical attenuation value corresponding to each target device according to the optical power parameter corresponding to each target device after obtaining the optical power parameter missing from the abnormal device.

[0104] In one embodiment, obtaining a device logic identifier of the abnormal device and an optical power identifier of the missing optical power parameter;

[0105] According to the device logic identifier and optical power identifier, optical power collection is performed on the optical power parameters missing from the abnormal device.

[0106] In one embodiment, if the received optical power parameter of the abnormal device is missing, optical power collection is performed for the missing optical power parameter of the abnormal device according to the device logical identifier and the received optical power identifier corresponding to the received optical power parameter, so as to obtain the missing received optical power parameter of the abnormal device;

[0107] If the transmit optical power parameter of the abnormal device is missing, optical power collection is performed for the missing optical power parameter of the abnormal device according to the device logical identifier and the transmit optical power identifier corresponding to the transmit optical power parameter to obtain the missing transmit optical power parameter of the abnormal device.

[0108] In one embodiment, the optical power collection order for collecting optical powers of the target devices next time is determined according to the current optical attenuation value corresponding to each target device.

[0109] In one embodiment, the target devices are sorted in descending order according to the current optical attenuation values ​​to obtain a sorting result;

[0110] The sorting result is used as the optical power collection order for the next optical power collection of each target device.

[0111] In one embodiment, for each target device, an effective collection period is determined according to the optical power collection time of the target device;

[0112] If the optical power parameters corresponding to the target device are not received within the valid collection period, or the receiving time of the optical power parameters corresponding to the target device does not belong to the valid collection period, the target device is regarded as an abnormal device with missing optical power parameters.

[0113] The above-mentioned optical attenuation value determination device obtains the optical power parameters corresponding to each target device, and when there is an abnormal device with missing optical power parameters in each target device, the optical power parameters missing from the abnormal device are collected; and then, after obtaining the optical power parameters missing from the abnormal device, the current optical attenuation value corresponding to each target device is determined according to the optical power parameters corresponding to each target device. According to the above content, in the process of determining the current optical attenuation value corresponding to each target device, if there is an abnormal device with missing optical power parameters in each target device, the optical power can be collected for the optical power parameters missing from the abnormal device. In this process, it is not necessary to collect optical power for each target device, and separate optical power collection is performed for the optical power parameters missing from the abnormal device at the time, which reduces the cumbersomeness of the operation of collecting optical power for the target device, avoids the time and resource waste caused by repeatedly collecting optical power for each target device when there is an abnormal device with missing optical power parameters in each target device, improves the efficiency of determining the current optical attenuation value corresponding to each target device, and ensures the data integrity of the optical power parameters corresponding to each target device under the premise of improving the optical power collection efficiency.

[0114] Each module in the above-mentioned optical attenuation value determination device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0115] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Figure 7As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. The processor, the memory and the input / output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be realized through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a method for determining a light attenuation value is realized. The display unit of the computer device is used to form a visually visible picture, which can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0116] Those skilled in the art will understand that Figure 7 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0117] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0118] Collecting optical power of at least one target device to obtain optical power parameters corresponding to each target device;

[0119] If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device;

[0120] After the missing optical power parameters of the abnormal device are obtained, the current optical attenuation value corresponding to each target device is determined according to the optical power parameters corresponding to each target device.

[0121] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0122] Obtain the device logical identifier of the abnormal device and the optical power identifier of the missing optical power parameter;

[0123] According to the device logic identifier and optical power identifier, optical power collection is performed on the optical power parameters missing from the abnormal device.

[0124] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0125] If the received optical power parameter of the abnormal device is missing, optical power collection is performed for the missing optical power parameter of the abnormal device according to the device logical identifier and the received optical power identifier corresponding to the received optical power parameter, so as to obtain the missing received optical power parameter of the abnormal device;

[0126] If the transmit optical power parameter of the abnormal device is missing, optical power collection is performed for the missing optical power parameter of the abnormal device according to the device logical identifier and the transmit optical power identifier corresponding to the transmit optical power parameter to obtain the missing transmit optical power parameter of the abnormal device.

[0127] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0128] According to the current optical attenuation value corresponding to each target device, the optical power collection order for performing optical power collection on each target device next time is determined.

[0129] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0130] Sort each target device in descending order according to the current light attenuation value to obtain the sorting result;

[0131] The sorting result is used as the optical power collection order for the next optical power collection of each target device.

[0132] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0133] For each target device, determine the effective collection period according to the optical power collection time of the target device;

[0134] If the optical power parameters corresponding to the target device are not received within the valid collection period, or the receiving time of the optical power parameters corresponding to the target device does not belong to the valid collection period, the target device is regarded as an abnormal device with missing optical power parameters.

[0135] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0136] Collecting optical power of at least one target device to obtain optical power parameters corresponding to each target device;

[0137] If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device;

[0138] After the missing optical power parameters of the abnormal device are obtained, the current optical attenuation value corresponding to each target device is determined according to the optical power parameters corresponding to each target device.

[0139] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0140] Obtain the device logical identifier of the abnormal device and the optical power identifier of the missing optical power parameter;

[0141] According to the device logic identifier and optical power identifier, optical power collection is performed on the optical power parameters missing from the abnormal device.

[0142] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0143] If the received optical power parameter of the abnormal device is missing, optical power collection is performed for the missing optical power parameter of the abnormal device according to the device logical identifier and the received optical power identifier corresponding to the received optical power parameter, so as to obtain the missing received optical power parameter of the abnormal device;

[0144] If the transmit optical power parameter of the abnormal device is missing, optical power collection is performed for the missing optical power parameter of the abnormal device according to the device logical identifier and the transmit optical power identifier corresponding to the transmit optical power parameter to obtain the missing transmit optical power parameter of the abnormal device.

[0145] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0146] According to the current optical attenuation value corresponding to each target device, the optical power collection order for performing optical power collection on each target device next time is determined.

[0147] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0148] Sort each target device in descending order according to the current light attenuation value to obtain the sorting result;

[0149] The sorting result is used as the optical power collection order for the next optical power collection of each target device.

[0150] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0151] For each target device, determine the effective collection period according to the optical power collection time of the target device;

[0152] If the optical power parameters corresponding to the target device are not received within the valid collection period, or the receiving time of the optical power parameters corresponding to the target device does not belong to the valid collection period, the target device is regarded as an abnormal device with missing optical power parameters.

[0153] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0154] Collecting optical power of at least one target device to obtain optical power parameters corresponding to each target device;

[0155] If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device;

[0156] After the missing optical power parameters of the abnormal device are obtained, the current optical attenuation value corresponding to each target device is determined according to the optical power parameters corresponding to each target device.

[0157] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0158] Obtain the device logical identifier of the abnormal device and the optical power identifier of the missing optical power parameter;

[0159] According to the device logic identifier and optical power identifier, optical power collection is performed on the optical power parameters missing from the abnormal device.

[0160] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0161] If the received optical power parameter of the abnormal device is missing, optical power collection is performed for the missing optical power parameter of the abnormal device according to the device logical identifier and the received optical power identifier corresponding to the received optical power parameter, so as to obtain the missing received optical power parameter of the abnormal device;

[0162] If the transmit optical power parameter of the abnormal device is missing, optical power collection is performed for the missing optical power parameter of the abnormal device according to the device logical identifier and the transmit optical power identifier corresponding to the transmit optical power parameter to obtain the missing transmit optical power parameter of the abnormal device.

[0163] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0164] According to the current optical attenuation value corresponding to each target device, the optical power collection order for performing optical power collection on each target device next time is determined.

[0165] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0166] Sort each target device in descending order according to the current light attenuation value to obtain the sorting result;

[0167] The sorting result is used as the optical power collection order for the next optical power collection of each target device.

[0168] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0169] For each target device, determine the effective collection period according to the optical power collection time of the target device;

[0170] If the optical power parameters corresponding to the target device are not received within the valid collection period, or the receiving time of the optical power parameters corresponding to the target device does not belong to the valid collection period, the target device is regarded as an abnormal device with missing optical power parameters.

[0171] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant laws, regulations and standards of relevant countries and regions.

[0172] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0173] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0174] The above embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for determining a light attenuation value, characterized in that: The method comprises: Collecting optical power of at least one target device to obtain optical power parameters corresponding to each target device; If it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, optical power collection is performed on the missing optical power parameters of the abnormal device; After the optical power parameters missing from the abnormal device are obtained, the current optical attenuation values ​​corresponding to the target devices are determined according to the optical power parameters corresponding to the target devices.

2. The method according to claim 1, characterized in that The performing optical power acquisition on the optical power parameters missing from the abnormal device includes: Obtaining a device logical identifier of the abnormal device and an optical power identifier of the missing optical power parameter; According to the device logic identifier and the optical power identifier, optical power collection is performed on the optical power parameters missing from the abnormal device.

3. The method according to claim 2, characterized in that The optical power parameters include receiving optical power parameters and sending optical power parameters; The step of collecting optical power parameters missing from the abnormal device according to the device logic identifier and the optical power identifier to obtain the optical power parameters missing from the abnormal device includes: If the received optical power parameter of the abnormal device is missing, then according to the device logical identifier and the received optical power identifier corresponding to the received optical power parameter, optical power collection is performed for the missing optical power parameter of the abnormal device to obtain the missing received optical power parameter of the abnormal device; If the transmitting optical power parameter of the abnormal device is missing, optical power collection is performed on the missing optical power parameter of the abnormal device according to the device logical identifier and the transmitting optical power identifier corresponding to the transmitting optical power parameter to obtain the missing transmitting optical power parameter of the abnormal device.

4. The method according to claim 1, characterized in that: The method further comprises: According to the current optical attenuation value corresponding to each target device, the optical power collection order for performing optical power collection on each target device next time is determined.

5. The method according to claim 4, characterized in that The step of determining the optical power collection order for performing optical power collection on each target device next time according to the current optical attenuation value corresponding to each target device comprises: Sorting the target devices in descending order according to the current light attenuation values ​​to obtain a sorting result; The ranking result is used as the optical power collection order for the next optical power collection of each target device.

6. The method according to claim 1, characterized in that The step of determining, based on the obtained optical power parameters, whether there is an abnormal device with missing optical power parameters in each target device comprises: For each target device, determining an effective collection period according to the optical power collection time of the target device; If the optical power parameters corresponding to the target device are not received within the valid collection period, or the receiving time of the optical power parameters corresponding to the target device does not belong to the valid collection period, the target device is regarded as an abnormal device with missing optical power parameters.

7. A device for determining a light attenuation value, characterized in that: The device comprises: A collection module, used to collect optical power of at least one target device to obtain optical power parameters corresponding to each target device; A first determination module is used for, if it is determined that there is an abnormal device with missing optical power parameters among the target devices according to the obtained optical power parameters, then collecting optical power of the missing optical power parameters of the abnormal device; The second determination module is used to determine the current optical attenuation value corresponding to each target device according to the optical power parameter corresponding to each target device after obtaining the optical power parameter missing from the abnormal device.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.