Fixed target sample scanning method and system for x-ray free electron laser

Abstract

The application provides a fixed target sample scanning method and system of an X-ray free electron laser, and the method comprises the following steps: acquiring a fixed target sample image of the X-ray free electron laser; performing sample identification based on the fixed target sample image to acquire a sample identification image; acquiring a pulse point of the X-ray free electron laser to sort sample coordinates in the sample identification image based on coordinates of the pulse point, and determine a scanning path of the fixed target sample; and performing fixed-point scanning on the fixed target sample based on the scanning path. The application realizes identification and fixed-point scanning of the fixed target sample of the X-ray free electron laser, improves utilization, and also improves experimental efficiency and data quality.

Description

Technical Field

[0001] The present application belongs to the field of free electron laser technology, and in particular relates to a fixed target sample scanning method and system of an X-ray free electron laser. Background Art

[0002] X-ray free electron lasers (XFELs) are advanced, large-scale scientific research devices capable of generating X-ray pulses with high brightness and high spatial and temporal resolution. With its powerful performance and broad potential for application, X-ray free electron laser technology is becoming an important tool in scientific research.

[0003] In XFEL experiments, the goal of fixed-target sample scanning is to ensure that the sample is within the focal area of ​​the laser beam and to precisely position and manipulate it so that X-rays can be irradiated from multiple angles and positions, thereby obtaining sufficient sample information for structural analysis. During the experiment, a fixed-target sample transport device is required to place the sample at the focal point of the XFEL pulse. The XFEL pulse irradiates the film point by point, and the downstream detector records the diffraction pattern of the single pulse. However, the simple periodic point scanning method leads to problems of random irradiation and a low effective hit rate. Summary of the Invention

[0004] The purpose of this application is to provide a fixed target sample scanning method, system, equipment and storage medium for X-ray free electron laser, which can realize the identification and fixed-point scanning of fixed target samples, improve utilization while also improving experimental efficiency and data quality.

[0005] In a first aspect, the present application provides a method for scanning a fixed target sample using an X-ray free electron laser, the method comprising:

[0006] Acquire images of fixed target samples with X-ray free electron laser;

[0007] Performing sample identification based on the fixed target sample image to obtain a sample identification image;

[0008] Obtaining pulse points of an X-ray free electron laser to sort sample coordinates in the sample identification image based on the coordinates of the pulse points and determine a scanning path of a fixed target sample;

[0009] The fixed target sample is scanned at a fixed point based on the scanning path.

[0010] In an implementation of the first aspect, acquiring an image of a fixed target sample by an X-ray free electron laser includes:

[0011] Acquire the appearance image of a fixed target sample of an X-ray free electron laser;

[0012] splicing the collected appearance images to obtain a complete fixed target sample image;

[0013] The complete fixed target sample image is preprocessed to obtain the fixed target sample image.

[0014] In an implementation of the first aspect, performing sample identification based on the fixed target sample image, obtaining the sample identification image includes:

[0015] acquiring a plurality of template images of a fixed target sample;

[0016] Calculating the regional matching degree of each template image and the fixed target sample image using a normalized matching method to obtain a sample target frame, and filtering the overlapping sample target frames based on non-maximum suppression;

[0017] The sample target frame is added to the fixed target sample image to obtain the sample identification image.

[0018] In an implementation of the first aspect, sorting the coordinates of the sample points in the sample identification image based on the pulse points to determine the scanning path of the fixed target sample includes:

[0019] adding the coordinates of the pulse point to the sample identification image, and using the coordinates of the pulse point as an original starting point to sort the sample coordinates in the sample identification image by a nearest neighbor sorting algorithm;

[0020] Two-dimensional scanning coordinate points are acquired based on the sorted sample coordinates to determine a scanning path of the fixed target sample.

[0021] In an implementation of the first aspect, performing fixed-point scanning on the fixed target sample based on the scanning path includes:

[0022] Based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in a two-dimensional position to achieve fixed-point scanning.

[0023] In a second aspect, the present application provides a fixed target sample scanning system for an X-ray free electron laser, the system comprising:

[0024] an acquisition module configured to acquire an image of a fixed target sample of an X-ray free electron laser;

[0025] an identification module configured to perform sample identification based on the fixed target sample image and obtain a sample identification image;

[0026] a path determination module configured to obtain pulse points of an X-ray free electron laser, to sort sample coordinates in the sample identification image based on the pulse point coordinates, and to determine a scanning path of a fixed target sample;

[0027] The scanning module is configured to perform a fixed-point scan on the fixed target sample based on the scanning path.

[0028] In an implementation of the second aspect, the acquisition module is configured to:

[0029] Acquire the appearance image of a fixed target sample of an X-ray free electron laser;

[0030] splicing the collected appearance images to obtain a complete fixed target sample image;

[0031] The complete fixed target sample image is preprocessed to obtain the fixed target sample image.

[0032] In an implementation of the second aspect, the identification module is configured to:

[0033] acquiring a plurality of template images of a fixed target sample;

[0034] Calculating the regional matching degree of each template image and the fixed target sample image using a normalized matching method to obtain a sample target frame, and filtering the overlapping sample target frames based on non-maximum suppression;

[0035] The sample target frame is added to the fixed target sample image to obtain the sample identification image.

[0036] In an implementation of the second aspect, the path determination module is configured to include:

[0037] adding the coordinates of the pulse point to the sample identification image, and using the coordinates of the pulse point as an original starting point to sort the sample coordinates in the sample identification image by a nearest neighbor sorting algorithm;

[0038] Two-dimensional scanning coordinate points are acquired based on the sorted sample coordinates to determine a scanning path of the fixed target sample.

[0039] In an implementation of the second aspect, the scanning module is configured to:

[0040] Based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in a two-dimensional position to achieve fixed-point scanning.

[0041] As described above, the fixed target sample scanning method and system of X-ray free electron laser described in this application have the following beneficial effects: This application realizes the identification and fixed-point scanning of fixed target samples of X-ray free electron laser, improves the utilization rate while also improving the experimental efficiency and data quality, and has wide application in the field of X-ray free electron laser experiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] Figure 1A Shown is a schematic diagram of an application scenario of the fixed target sample scanning method of the X-ray free electron laser described in this application.

[0043] Figure 1A Shown are structural diagrams of the client-cloud interaction scenarios in these implementations.

[0044] Figure 2 FIG2 is a flow chart of a fixed target sample scanning method using an X-ray free electron laser according to an embodiment of the present application.

[0045] Figure 3 FIG2 is a flow chart of a fixed target sample scanning method using an X-ray free electron laser according to an embodiment of the present application.

[0046] Figure 4 FIG2 is a flow chart of a fixed target sample scanning method using an X-ray free electron laser according to an embodiment of the present application.

[0047] Figure 5 Shown is a schematic structural diagram of a fixed target sample scanning system for an X-ray free electron laser according to an embodiment of the present application. DETAILED DESCRIPTION

[0048] The following describes the embodiments of the present application through specific examples. Those skilled in the art can easily understand the other advantages and effects of the present application from the content disclosed in this specification. The present application can also be implemented or applied through other different specific embodiments. The details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments can be combined with each other unless they conflict.

[0049] It should be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present application. Therefore, the illustrations only show components related to the present application and are not drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component can be changed at will, and the component layout type may also be more complicated.

[0050] In addition, the descriptions of "first", "second", etc. in this application are for descriptive purposes only and should not be understood as indicating or implying their relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined as "first" or "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between the various embodiments can be combined with each other, but this must be based on the fact that they can be implemented by ordinary technicians in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0051] Scanning fixed target samples in XFEL experiments is a highly precise process that involves fine control and transformation of the sample position, including operations such as translation, rotation, and scaling. Through these operations, it can be ensured that the sample is in the appropriate position during each X-ray pulse irradiation to obtain the best experimental data. At present, a simple periodic grid point scanning method is usually used to scan fixed target samples. This method is to scan a predetermined area according to a uniform grid point spacing (i.e., a grid). For example, the coordinates of each scanning point in a certain area can be arranged according to a specific step size and interval pattern to form a grid-like scanning path. This scanning method is prone to problems such as random irradiation and low effective hit rate, which not only reduces the utilization rate of fixed target samples, but also affects the efficiency and data quality of XFEL experiments.

[0052] In order to at least solve the above problems, an embodiment of the present application provides a fixed target sample scanning method of an X-ray free electron laser, which can realize the identification and fixed-point scanning of the fixed target sample of the X-ray free electron laser, thereby improving utilization while also improving experimental efficiency and data quality.

[0053] In some embodiments, the fixed target sample scanning method of the X-ray free electron laser provided in the embodiments of the present application can be applied to Figure 1A The fixed target sample scanning device of the X-ray free electron laser is shown. Figure 1A As shown, the fixed target sample scanning device 1 of the X-ray free electron laser includes a processor 11 and a database 12. The fixed target sample scanning method of the X-ray free electron laser provided in the embodiment of the present application can be applied to the processor 11.

[0054] in, Figure 1A The processor 11 in the embodiment can be a single processor or a processor cluster or a cloud computing center composed of multiple processors, and the specific details are not limited here. Figure 1A Only one processor 11 and one database 12 are shown, but it should be understood that Figure 1A The examples are only used to understand this solution, and the specific numbers of processors 11 and databases 12 should be flexibly determined based on actual conditions.

[0055] In other embodiments, the fixed target sample scanning device 1 for an X-ray free electron laser may not include the database 12, but may only include a processor 11 with a storage function. The fixed target sample scanning method for an X-ray free electron laser provided in the embodiments of the present application may be applied to the processor 11. The processor 11 with a storage function may include a computer, a mobile phone, etc., which is not limited here.

[0056] In yet other embodiments, the fixed target sample scanning method of the X-ray free electron laser described in this application can be applied to end-cloud interaction scenarios. Figure 1B Shown is a schematic diagram of the structure of the end-cloud interaction scenario in these implementation methods. Figure 1B As shown, the terminal-cloud interaction system 2 includes a terminal 20 and a cloud server 21. The terminal 20 and the cloud server 21 can communicate with each other, and the communication method is not limited to wired or wireless.

[0057] Among them, the terminal 20 can be mobile or fixed, for example, the terminal 20 can be a wireless terminal or a wired terminal. The wireless terminal can refer to a device with wireless transceiver function, which can be deployed in the XFEL experimental scene. The terminal 20 can be a mobile phone, a laptop computer, etc., which is not limited here. The cloud server 21 can include one or more servers, or one or more processing nodes, or one or more virtual machines running on the server. The cloud server 21 can also be called a server cluster, a management platform, a fixed target sample scanning center of an X-ray free electron laser, etc., which is not limited in the embodiments of the present application.

[0058] The technical solutions in the embodiments of the present application will be described in detail below with reference to the accompanying drawings in the embodiments of the present application.

[0059] The following embodiments of the present application provide a method for scanning a fixed target sample using an X-ray free electron laser. For example, the method can be performed by Figure 1A The processor 11 shown or Figure 1B It is implemented by the cloud server 21 shown. Figure 2 The flow chart of the fixed target sample scanning method of the X-ray free electron laser according to the embodiment of the present application is shown as follows: Figure 2 As shown, the fixed target sample scanning method of the X-ray free electron laser includes steps S1 to S4.

[0060] S1. Acquire an image of a fixed target sample using an X-ray free electron laser.

[0061] Specifically, obtaining a fixed target sample image of an X-ray free electron laser includes: obtaining an appearance image of a fixed target sample of an X-ray free electron laser; splicing the collected appearance image to obtain a complete fixed target sample image; and preprocessing the complete fixed target sample image to obtain a fixed target sample image with more obvious sample features.

[0062] In some embodiments, a fixed target sample can be photographed using a high-resolution CCD camera or a 3D profilometer to capture the sample's appearance features and generate an appearance image. The captured appearance images are then stitched together to obtain a complete fixed target sample image, including the sample coordinate points used for positioning calculations. Furthermore, the complete fixed target sample image is preprocessed using image denoising and enhancement techniques to enhance the sample's features and provide a clearer, more distinct image.

[0063] S2. Perform sample identification based on the fixed target sample image to obtain a sample identification image.

[0064] Specifically, Figure 3 The flow chart of the fixed target sample scanning method of the X-ray free electron laser according to the embodiment of the present application is shown as follows: Figure 3 As shown, step S2 includes steps S21 to S23.

[0065] S21. Acquire multiple template images of the fixed target sample.

[0066] In some embodiments, multiple different template images are loaded to represent possible target fixed target samples. These templates can be target images at different scales and angles (rotations). The purpose is to enhance the flexibility of template matching so that it can adapt to targets of different positions, directions, and sizes in the image. In addition, in order to adapt to the different possible sizes and angles of the target (fixed target sample) in the image, the template image will be scaled (different scales) and rotated (different angles). This processing method can improve the accuracy of template matching and increase the possibility of detecting the target.

[0067] S22. Calculate the regional matching degree of each template image and the fixed target sample image using a normalized matching method to obtain a sample target frame, and filter the overlapping sample target frames based on non-maximum suppression.

[0068] Specifically, a sliding window template matching is performed on the fixed target sample image, and the normalized correlation is calculated. That is, the matching degree of each template with different areas in the fixed target sample image is calculated. This method reduces the impact of illumination changes on the matching results by eliminating the difference in image brightness. In addition, during the matching process, there may be multiple positions and templates that match the target, that is, there are overlapping sample target frames. Therefore, the non-maximum suppression (NMS) method is used to filter out repeatedly detected targets (overlapping sample target frames). That is, among multiple overlapping detection frames, the detection frame with the highest score is retained, and the frames with lower scores or excessive overlap with high-scoring frames are deleted, thereby removing redundancy.

[0069] S23 , adding the sample target frame to the fixed target sample image to obtain the sample identification image.

[0070] Specifically, the matched areas are marked with target frames, and these sample target frames are added to the fixed target sample image to obtain the sample identification image.

[0071] S3. Acquire pulse points of the X-ray free electron laser, sort the sample coordinates in the sample identification image based on the pulse point coordinates, and determine the scanning path of the fixed target sample.

[0072] Specifically, Figure 4 The flow chart of the fixed target sample scanning method of the X-ray free electron laser according to the embodiment of the present application is shown as follows: Figure 4 As shown, step S3 includes steps S31 to S32.

[0073] S31. Add the coordinates of the pulse points to the sample identification image, and use the coordinates of the pulse points as the original starting point to sort the sample coordinates in the sample identification image by a nearest neighbor sorting algorithm.

[0074] Specifically, the XFEL pulse point is marked and added to the sample identification image, so that the coordinates of the pulse point are used as the original starting point, and the sample coordinates in the sample identification image are sorted by the nearest neighbor sorting algorithm. Among them, the nearest neighbor sorting algorithm is a common sorting method, which is usually used to process coordinate data in two-dimensional or high-dimensional space. The core idea of ​​the algorithm is to start from a starting point (usually the coordinates of the pulse point) and gradually select the next point for sorting in a nearest neighbor manner until all points have been traversed.

[0075] In some embodiments, the XFEL pulse point is selected as the starting point, and starting from the current point, the Euclidean distances of all unsorted sample coordinate points and the current point are calculated, and the point closest to the current point is selected and added to the sorting list, and this is repeated until all sample coordinates are sorted.

[0076] S32. Acquire two-dimensional scanning coordinate points based on the sorted sample coordinates to determine a scanning path for the fixed target sample.

[0077] Furthermore, it is necessary to determine the scanning order of the samples to generate a scanning path for the fixed target sample, thereby guiding the scanning device or laser beam to scan various areas of the sample in a reasonable order, thereby ensuring efficient and comprehensive data acquisition. The sorted sample coordinates are then used to calculate the sample's two-dimensional scanning coordinate points through coordinate translation, rotation, scaling, and other methods to determine the scanning path for the fixed target sample.

[0078] In practice, after sorting the sample coordinates, each sample can be directly connected, simply connecting adjacent samples in the sorted coordinate order to form a path. Alternatively, path optimization can be considered, using a path planning algorithm to obtain the optimal scanning path. In this case, the scanning path needs to be defined as a series of two-dimensional coordinate points, representing the movement trajectory of the device or the order of the beam during the scanning process.

[0079] S4. Performing fixed-point scanning on the fixed target sample based on the scanning path.

[0080] Specifically, based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in a two-dimensional position to achieve fixed-point scanning.

[0081] In some embodiments, a high-precision motor-driven two-dimensional scanning platform can be used as a motion scanning device for a fixed target sample. This platform reads the two-dimensional scanning coordinates to precisely move the fixed target sample in two dimensions. XFEL pulses irradiate the sample point by point, achieving high-precision, fixed-point scanning of the fixed target sample, thereby avoiding crosstalk and duplicate irradiation between samples.

[0082] Therefore, the present application can identify and match multiple targets in the fixed target sample image, and use this to plan the scanning path to avoid interference and repeated irradiation between fixed target samples. The present application realizes the identification and fixed-point scanning of fixed target samples of X-ray free electron laser, improving utilization while also improving experimental efficiency and data quality.

[0083] The protection scope of the fixed target sample scanning method of the X-ray free electron laser described in the embodiment of the present application is not limited to the execution order of the steps listed in this embodiment. All solutions implemented by adding, reducing or replacing steps in the existing technology based on the principles of the present application are included in the protection scope of the present application.

[0084] An embodiment of the present application also provides a fixed target sample scanning system for an X-ray free electron laser. The fixed target sample scanning system for an X-ray free electron laser can implement the fixed target sample scanning method for an X-ray free electron laser described in the present application. However, the implementation device of the fixed target sample scanning system for an X-ray free electron laser described in the present application includes but is not limited to the structure of the fixed target sample scanning system for an X-ray free electron laser listed in the present embodiment. All structural deformations and replacements of the prior art made according to the principles of the present application are included in the scope of protection of the present application.

[0085] Figure 5 The structure diagram of the fixed target sample scanning system of the X-ray free electron laser described in the embodiment of the present application is shown as follows: Figure 5 As shown, the X-ray free electron laser fixed target sample scanning system 4 includes an acquisition module 41 , an identification module 42 , a path determination module 43 and a scanning module 44 .

[0086] An acquisition module 41 is configured to acquire an image of a fixed target sample of an X-ray free electron laser;

[0087] an identification module 42 configured to perform sample identification based on the fixed target sample image and obtain a sample identification image;

[0088] a path determination module 43 configured to obtain pulse points of the X-ray free electron laser, to sort the sample coordinates in the sample identification image based on the coordinates of the pulse points, and to determine a scanning path of the fixed target sample;

[0089] The scanning module 44 is configured to perform a fixed-point scan on the fixed target sample based on the scanning path.

[0090] The acquisition module 41 is configured to:

[0091] Acquire an appearance image of a fixed target sample from an X-ray free electron laser; stitch the acquired appearance images to obtain a complete fixed target sample image; and preprocess the complete fixed target sample image to obtain the fixed target sample image, wherein the fixed target sample image has more distinct and clear sample features.

[0092] The identification module 42 is configured to:

[0093] Acquire multiple template images of fixed target samples; use a normalized matching method to calculate the regional matching degree of each template image and the fixed target sample image to obtain a sample target frame, and filter the overlapping sample target frames based on non-maximum suppression; add the sample target frame to the fixed target sample image to obtain the sample identification image.

[0094] The path determination module 43 is configured to include:

[0095] The coordinates of the pulse point are added to the sample identification image, and the coordinates of the pulse point are used as the original starting point to sort the sample coordinates in the sample identification image through a nearest neighbor sorting algorithm; two-dimensional scanning coordinate points are obtained based on the sorted sample coordinates to determine the scanning path of the fixed target sample.

[0096] The scanning module 44 is configured to:

[0097] Based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in a two-dimensional position to achieve fixed-point scanning.

[0098] It should be noted that the structures and principles of the acquisition module 41, identification module 42, path determination module 43 and scanning module 44 correspond one-to-one to the steps in the above-mentioned X-ray free electron laser fixed target sample scanning method, so they are not described in detail here.

[0099] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices or methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of modules / units is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or units can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or modules or units, which can be electrical, mechanical or other forms.

[0100] The modules / units described as separate components may or may not be physically separate, and the components displayed as modules / units may or may not be physical modules, that is, they may be located in one place or distributed across multiple network elements. Some or all of the modules / units may be selected according to actual needs to achieve the purpose of the embodiments of the present application. For example, the functional modules / units in the various embodiments of the present application may be integrated into a processing module, or each module / unit may exist physically separately, or two or more modules / units may be integrated into a single module / unit.

[0101] Those skilled in the art should further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the composition and steps of each example according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0102] The descriptions of the processes or structures corresponding to the above figures have different emphases. For parts that are not described in detail in a certain process or structure, please refer to the relevant descriptions of other processes or structures.

[0103] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by one of ordinary skill in the art without departing from the spirit and technical concepts disclosed in this application shall be covered by the claims of this application.

Claims

1. A method for scanning a fixed target sample using an X-ray free electron laser, characterized in that: The method comprises: Acquiring an image of a fixed target sample of an X-ray free electron laser, comprising: acquiring an appearance image of the fixed target sample of the X-ray free electron laser; splicing the acquired appearance image to acquire a complete image of the fixed target sample; and preprocessing the complete image of the fixed target sample to acquire the fixed target sample image; Performing sample identification based on the fixed target sample image to obtain a sample identification image, including: obtaining multiple template images of the fixed target sample; calculating the regional matching degree between each template image and the fixed target sample image using a normalized matching method to obtain a sample target frame, and filtering the overlapping sample target frames based on non-maximum suppression; adding the sample target frame to the fixed target sample image to obtain the sample identification image; Obtaining pulse points of an X-ray free electron laser to sort sample coordinates in the sample identification image based on the coordinates of the pulse points and determine a scanning path for the fixed target sample, comprising: adding the coordinates of the pulse points to the sample identification image and using the coordinates of the pulse points as original starting points to sort the sample coordinates in the sample identification image using a nearest neighbor sorting algorithm; obtaining two-dimensional scanning coordinate points based on the sorted sample coordinates to determine a scanning path for the fixed target sample; The fixed target sample is subjected to fixed-point scanning based on the scanning path, including reading the two-dimensional scanning coordinate points based on the scanning path to move the fixed target sample in a two-dimensional position to achieve fixed-point scanning.

2. A fixed target sample scanning system for an X-ray free electron laser, characterized in that: The system comprises: An acquisition module is configured to acquire an image of a fixed target sample of an X-ray free electron laser, comprising: acquiring an appearance image of the fixed target sample of the X-ray free electron laser; stitching the acquired appearance images to acquire a complete image of the fixed target sample; and preprocessing the complete image of the fixed target sample to acquire the fixed target sample image; The recognition module is configured to perform sample recognition based on the fixed target sample image to obtain a sample recognition image, including: obtaining multiple template images of the fixed target sample; using a normalized matching method to calculate the regional matching degree between each template image and the fixed target sample image to obtain a sample target frame, and filtering the overlapping sample target frames based on non-maximum suppression; adding the sample target frame to the fixed target sample image to obtain the sample recognition image; A path determination module is configured to obtain pulse points of an X-ray free electron laser, sort the sample coordinates in the sample identification image based on the coordinates of the pulse points, and determine the scanning path of the fixed target sample, including: adding the coordinates of the pulse points to the sample identification image, and using the coordinates of the pulse points as the original starting point to sort the sample coordinates in the sample identification image using a nearest neighbor sorting algorithm; and obtaining two-dimensional scanning coordinate points based on the sorted sample coordinates to determine the scanning path of the fixed target sample; The scanning module is configured to perform fixed-point scanning on the fixed target sample based on the scanning path, including reading the two-dimensional scanning coordinate points based on the scanning path to move the fixed target sample in a two-dimensional position to achieve fixed-point scanning.

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