Quantum operation door performance evaluation method and device, electronic equipment and storage medium
By constructing a sequence of random purity benchmark test sequences and insertion delays, the incoherence error of the quantum operation gate is measured, which solves the problem of great influence of coherence errors in the prior art and improves the accuracy of the performance evaluation of quantum operation gates.
Patent Information
- Application Number
- CN202411998642.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2025-04-18
AI Technical Summary
The prior art cannot effectively eliminate coherence errors when measuring incoherence errors of quantum operation gates, resulting in poor accuracy in the performance evaluation of quantum operation gates.
By constructing a purity random benchmark sequence and an insertion delay purity random benchmark sequence, the incoherence error caused by environmental noise is measured, and the purity random benchmark sequence completely eliminates the influence of coherence error.
The accuracy of quantum operation gate performance evaluation and the accuracy of qubit environmental noise evaluation are improved.
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Figure CN119849650A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of quantum computing technology, and more specifically, to a method and device for evaluating the performance of a quantum operation gate, as well as electronic equipment and storage media. Background Art
[0002] The total error of a quantum operation gate includes coherent error and incoherent error. Coherent error refers to the error caused by the system being affected by predictable but incorrect operations or noise, and incoherent error refers to the information loss or decoherence caused by the random interaction of the quantum state with the environment during its evolution. It is very important to distinguish between these two errors in the process of realizing quantum operation gates.
[0003] In the related art, incoherent errors are measured by randomized benchmarking sequences and Ramsey randomized benchmarking sequences with inserted delays. This method cannot eliminate the coherent errors caused by the detuning of the control frequency and the bit frequency, that is, the accuracy of measuring incoherent errors is poor, resulting in poor accuracy in the evaluation of quantum operation gate performance and poor accuracy in the evaluation of quantum bit environmental noise.
[0004] Therefore, how to improve the accuracy of quantum operation gate performance evaluation and the accuracy of quantum bit environmental noise evaluation is a technical problem that technicians in this field need to solve. Summary of the invention
[0005] The purpose of the present application is to provide a quantum operation gate performance evaluation method, device, electronic device and computer-readable storage medium, which improves the accuracy of quantum operation gate performance evaluation and the accuracy of quantum bit environmental noise evaluation.
[0006] To achieve the above objectives, the present application provides a method for evaluating the performance of a quantum operation gate, comprising:
[0007] Constructing a purity random benchmark test sequence, initializing the qubits of the purity random benchmark test sequence in the |0> state, determining a first decay curve of purity based on the purity random benchmark test sequence, and determining a first unitary degree according to the first decay curve; wherein the Clifford gate in the purity random benchmark test sequence is randomly selected;
[0008] Inserting a delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a delay-inserted purity random benchmark test sequence;
[0009] Initializing the quantum bits of the purity random benchmark test sequence with the inserted delay to the |0> state, determining a second decay curve of purity based on the purity random benchmark test sequence with the inserted delay, and determining a second unitary degree according to the second decay curve;
[0010] An incoherent error is determined based on the first unitary degree and the second unitary degree, and a performance evaluation of a quantum operation gate is performed based on the incoherent error.
[0011] The purity random benchmark test sequence includes a plurality of first subsequence groups, each of the first subsequence groups includes a plurality of first subsequences, the first subsequence includes a Clifford gate sequence and a measurement gate, the Clifford gate in the Clifford gate sequence is randomly selected, the sequence lengths of the Clifford gate sequences of different first subsequences in the same first subsequence group are the same, the measurement gate of each first subsequence in the same first subsequence group includes a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the first subsequences in different first subsequence groups are different;
[0012] Accordingly, the qubits of the purity random benchmark test sequence are initialized in the |0> state, and a first decay curve of purity is determined based on the purity random benchmark test sequence, including:
[0013] Sequentially measure the purity of the quantum bits corresponding to each of the first subsequence groups; wherein, in the process of measuring the purity of the quantum bits corresponding to the target first subsequence group, the quantum bits of multiple target first subsequences in the target first subsequence group are initialized to the |0> state, and the purity of the quantum bits under the action of each of the target first subsequences is measured respectively, and the average value of the purity of the quantum bits under the action of the multiple target first subsequences is taken as the purity of the quantum bits corresponding to the target first subsequence group;
[0014] Based on the purity of the quantum bits corresponding to each of the first subsequence groups and the sequence length of the Clifford gate sequence of the first subsequence in each of the first subsequence groups, a curve of the purity with respect to the sequence length is fitted to obtain a first attenuation curve; wherein the first attenuation curve is P(m)=A(u ref ) m-1 +B, m is the length of the sequence, A and B are the parameters of the fitting curve, u ref is the first unitary degree, and P(m) is the purity corresponding to the sequence length of m.
[0015] The method of inserting a delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a purity random benchmark test sequence with an inserted delay comprises:
[0016] Delays of the same length are respectively inserted between adjacent Clifford gates in each of the first subsequences to obtain a plurality of second subsequence groups, each of the second subsequence groups includes a plurality of second subsequences, the second subsequence includes a Clifford gate sequence and a measurement gate, the Clifford gates in the Clifford gate sequence are randomly selected, the sequence lengths of the Clifford gate sequences of different second subsequences in the same second subsequence group are the same, the measurement gates of each second subsequence in the same second subsequence group include a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the second subsequences in different second subsequence groups are different.
[0017] The method of initializing the quantum bits of the purity random benchmark test sequence with the inserted delay to the |0> state and determining the second decay curve of purity based on the purity random benchmark test sequence with the inserted delay comprises:
[0018] Sequentially measure the purity of the quantum bits corresponding to each second subsequence group; wherein, in the process of measuring the purity of the quantum bits corresponding to the target second subsequence group, the quantum bits of multiple target second subsequences in the target second subsequence group are initialized to the |0> state, and the purity of the quantum bits under the action of each target second subsequence is measured respectively, and the average value of the purity of the quantum bits under the action of the multiple target second subsequences is taken as the purity of the quantum bits corresponding to the target second subsequence group;
[0019] Based on the purity of the quantum bits corresponding to each of the second subsequence groups and the sequence length of the Clifford gate sequence of the second subsequence in each of the second subsequence groups, a curve of the purity with respect to the sequence length is fitted to obtain a second attenuation curve; wherein the second attenuation curve is P(m)= A'(u) m-1 +B', m is the sequence length, A' and B' are parameters of the fitting curve, u is the second unitary degree, and P(m) is the purity corresponding to the sequence length of m.
[0020] Wherein, determining the incoherent error based on the first unitary degree and the second unitary degree includes:
[0021] The incoherent error is determined according to the incoherent error calculation formula; wherein the incoherent error calculation formula is:
[0022] ;
[0023] in, is the length of the inserted delay, For the insertion time The corresponding incoherent error under the delay condition, d is the dimension of the quantum bit system, and the dimension of the quantum bit system d=2 n , n is the number of quantum bits, u ref is the first unitary degree, u is the insertion time The corresponding second unitary degree in the case of delay.
[0024] Wherein, the performance evaluation of the quantum operation gate based on the incoherent error includes:
[0025] Based on the incoherent error, the noise power spectrum of the environment where the quantum bit is located is determined as a performance evaluation result of the quantum operation gate.
[0026] Wherein, the determining of the noise power spectrum of the environment where the quantum bit is located based on the incoherent error as the performance evaluation result of the quantum operation gate includes:
[0027] Determine the noise power spectrum of the environment where the quantum bit is located based on the incoherent error and the relationship between the incoherent error and the noise power spectrum, and use the noise power spectrum as a performance evaluation result of the quantum operation gate;
[0028] Among them, the relationship between the incoherent error and the noise power spectrum is:
[0029] ;
[0030] in, is the length of the inserted delay, For the insertion time The corresponding incoherent error in the case of a delay of is the angular frequency, is the noise power spectrum.
[0031] To achieve the above objectives, the present application provides a quantum operation gate performance evaluation device, comprising:
[0032] A first test module is used to construct a purity random benchmark test sequence, initialize the qubits of the purity random benchmark test sequence in the |0> state, determine a first decay curve of purity based on the purity random benchmark test sequence, and determine a first unitary degree according to the first decay curve; wherein the Clifford gate in the purity random benchmark test sequence is randomly selected;
[0033] An inserting module, used for inserting a delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a purity random benchmark test sequence with an inserted delay;
[0034] A second test module, configured to initialize the quantum bits of the purity random benchmark test sequence with inserted delay to the |0> state, determine a second decay curve of purity based on the purity random benchmark test sequence with inserted delay, and determine a second unitary degree according to the second decay curve;
[0035] A performance evaluation module is used to determine an incoherent error based on the first unitary degree and the second unitary degree, and to perform a performance evaluation on a quantum operation gate based on the incoherent error.
[0036] To achieve the above objectives, the present application provides an electronic device, including:
[0037] Memory for storing computer programs;
[0038] A processor is used to implement the steps of the above-mentioned quantum operation gate performance evaluation method when executing the computer program.
[0039] To achieve the above objectives, the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the above-mentioned quantum operation gate performance evaluation method are implemented.
[0040] It can be seen from the above scheme that a quantum operation gate performance evaluation method provided by the present application includes: constructing a purity random benchmark test sequence, initializing the quantum bits of the purity random benchmark test sequence in the |0> state, determining a first decay curve of purity based on the purity random benchmark test sequence, and determining a first unitary degree according to the first decay curve; wherein the Clifford gate in the purity random benchmark test sequence is randomly selected; inserting a delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a purity random benchmark test sequence with inserted delay; initializing the quantum bits of the purity random benchmark test sequence with inserted delay in the |0> state, determining a second decay curve of purity based on the purity random benchmark test sequence with inserted delay, and determining a second unitary degree according to the second decay curve; determining an incoherent error based on the first unitary degree and the second unitary degree, and performing performance evaluation on the quantum operation gate based on the incoherent error.
[0041] The quantum operation gate performance evaluation method provided by the present application uses a purity random benchmark test sequence and a purity random benchmark test sequence with an inserted delay to measure the incoherent error caused by environmental noise. Compared with the ordinary random benchmark test sequence, the purity random benchmark test sequence completely eliminates the influence of coherent errors, improves the accuracy of measuring incoherent errors, and thus improves the accuracy of quantum operation gate performance evaluation and the accuracy of quantum bit environmental noise evaluation. The present application also discloses a quantum operation gate performance evaluation device, an electronic device, and a computer-readable storage medium, which can also achieve the above technical effects.
[0042] It should be understood that the foregoing general description and the following detailed description are exemplary only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0043] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. The drawings are used to provide a further understanding of the present disclosure and constitute a part of the specification. Together with the following specific implementation methods, they are used to explain the present disclosure, but do not constitute a limitation to the present disclosure. In the drawings:
[0044] Figure 1 The present invention is a flow chart of a method for evaluating the performance of a quantum operation gate according to an exemplary embodiment;
[0045] Figure 2 is a schematic diagram of a first subsequence according to an exemplary embodiment;
[0046] Figure 3 is a schematic diagram of a second subsequence according to an exemplary embodiment;
[0047] Figure 4 The present invention is a flow chart of another method for evaluating the performance of a quantum operation gate according to an exemplary embodiment;
[0048] Figure 5 is a structural diagram of a quantum operation gate performance evaluation device according to an exemplary embodiment;
[0049] Figure 6 The figure is a structural diagram of an electronic device according to an exemplary embodiment. DETAILED DESCRIPTION
[0050] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application. In addition, in the embodiments of the present application, "first", "second", etc. are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.
[0051] The embodiment of the present application discloses a method for evaluating the performance of a quantum operation gate, which improves the accuracy of the evaluation of the performance of a quantum operation gate and the evaluation accuracy of the quantum bit environmental noise.
[0052] See also Figure 1 , a flowchart of a method for evaluating the performance of a quantum operation gate is shown according to an exemplary embodiment, such as Figure 1 As shown, including:
[0053] S101: construct a purity random benchmark test sequence, initialize the quantum bits of the purity random benchmark test sequence in the |0> state, determine a first decay curve of purity based on the purity random benchmark test sequence, and determine a first unitary degree according to the first decay curve; wherein the Clifford gate in the purity random benchmark test sequence is randomly selected;
[0054] The execution subject of this embodiment may be a quantum computer. The purpose of this embodiment is to measure the incoherent error in the quantum operation gate, and then to evaluate the performance of the quantum operation gate.
[0055] In this step, we first construct a purity random benchmarking sequence, which evaluates the nature of the error caused by the quantum gate by measuring the purity change of the quantum state under the action of the random gate sequence. Purity is defined as:
[0056] ;
[0057] Where P is the purity, d is the dimension of the quantum bit system, and the dimension of the quantum bit system is d=2 n , n is the number of quantum bits, is the density matrix of the quantum state, and tr is the trace.
[0058] Purity benchmarking is a technique for evaluating the quality of quantum gate operations. Purity benchmarking can be used to measure incoherent errors in quantum operation gates. Incoherent errors mainly include errors caused by relaxation processes, errors caused by dephasing processes, and errors caused by random jitter and instability of microwave pulse amplitude. The incoherent errors measured in this embodiment include errors caused by relaxation processes and errors caused by dephasing processes.
[0059] The purity random benchmark test sequence includes multiple first subsequence groups, each of which includes multiple first subsequences, and the first subsequence includes a Clifford gate sequence and a measurement gate. The Clifford gate in the Clifford gate sequence is randomly selected, and the sequence lengths of the Clifford gate sequences of different first subsequences in the same first subsequence group are the same. The measurement gate of each first subsequence in the same first subsequence group includes a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction. The sequence lengths of the Clifford gate sequences of the first subsequences in different first subsequence groups are different.
[0060] In a specific implementation, multiple first subsequence groups are constructed, each of which contains several first subsequences. The schematic diagram of the first subsequence is as follows: Figure 2 As shown, Figure 2 In , C represents a Clifford gate, each Clifford gate is randomly selected, M represents a measurement gate, and M can be I (no operation gate), X (90° rotation pulse operation gate in the X direction), or Y (90° rotation pulse operation gate in the Y direction). The sequence lengths of the Clifford gate sequences of different first subsequences in the same first subsequence group are the same, the measurement gates include no operation gate, 90° rotation pulse operation gate in the X direction, and 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the first subsequences in different first subsequence groups are different.
[0061] For example, the first subsequence group 1 includes the first subsequence 11, the first subsequence 12, and the first subsequence 13. The sequence lengths of the Clifford gate sequences in the first subsequence 11, the first subsequence 12, and the first subsequence 13 are all 5. The first subsequence 11 needs to be run three times. The first measurement gate takes the non-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction. The first subsequence 12 needs to be run three times. The first measurement gate takes the non-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction; the first subsequence 13 needs to be run three times. The first measurement gate takes the non-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction. The first subsequence group 2 includes a first subsequence 21, a first subsequence 22, and a first subsequence 23. The sequence lengths of the Clifford gate sequences in the first subsequence 21, the first subsequence 22, and the first subsequence 23 are all 10. The first subsequence 21 needs to be run three times. The first measurement gate takes the no-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction. The first subsequence 22 needs to be run three times. The first measurement gate takes the no-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction. The first subsequence 23 needs to be run three times. The first measurement gate takes the no-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction. The first subsequence group 3 includes a first subsequence 31, a first subsequence 32, and a first subsequence 33. The sequence lengths of the Clifford gate sequences in the first subsequence 31, the first subsequence 32, and the first subsequence 33 are all 15. The first subsequence 31 needs to be run three times. The first measurement gate takes the no-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction. The first subsequence 32 needs to be run three times. The first measurement gate takes the no-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction. The first subsequence 33 needs to be run three times. The first measurement gate takes the no-operation gate, the second measurement gate takes the 90° rotation pulse operation gate in the X direction, and the third measurement gate takes the 90° rotation pulse operation gate in the Y direction.
[0062] Secondly, the qubits of the purity random benchmark sequence are initialized in the |0> state, which is a standard starting state in quantum computing. By executing the purity random benchmark sequence and measuring the decay of the purity of the quantum state as the number of Clifford gates increases, the decay curve of purity, i.e., the first decay curve, can be determined.
[0063] As a feasible implementation manner, the quantum bits of the purity random benchmark test sequence are initialized in the |0> state, and a first attenuation curve of purity is determined based on the purity random benchmark test sequence, including: measuring the purity of the quantum bits corresponding to each of the first subsequence groups in turn; wherein, in the process of measuring the purity of the quantum bits corresponding to the target first subsequence group, the quantum bits of multiple target first subsequences in the target first subsequence group are initialized in the |0> state, and the purity of the quantum bits under the action of each of the target first subsequences is measured respectively, and the average value of the purity of the quantum bits under the action of the multiple target first subsequences is used as the purity of the quantum bits corresponding to the target first subsequence group; based on the purity of the quantum bits corresponding to each of the first subsequence groups and the sequence length of the Clifford gate sequence of the first subsequence in each of the first subsequence groups, the curve of the purity with respect to the sequence length is fitted to obtain a first attenuation curve; wherein, the first attenuation curve is P(m)=A(u ref ) m-1 +B, m is the length of the sequence, A and B are the parameters of the fitting curve, u ref is the first unitary degree, and P(m) is the purity corresponding to the sequence length of m.
[0064] In a specific implementation, the purity of the quantum bits corresponding to each first subsequence group is measured in turn. Taking the target first subsequence group as an example, the target first subsequence group includes multiple target first subsequences. The quantum bits of the multiple target first subsequences are initialized in the |0> state. The purity of the quantum bits under the action of each target first subsequence is measured by using the measurement gate without operation gate, the 90° rotation pulse operation gate in the X direction, and the 90° rotation pulse operation gate in the Y direction. The purity of the quantum bits under the action of the multiple target first subsequences is averaged and processed as the purity of the quantum bits corresponding to the target first subsequence group. According to the measured purity of the quantum bits corresponding to each first subsequence group and the sequence length of the Clifford gate sequence of the first subsequence in each first subsequence group, the first attenuation curve is obtained by fitting the curve of the purity with respect to the sequence length of the Clifford gate sequence. The first attenuation curve describes how the purity of the quantum state decays with the increase of the sequence length. The first attenuation curve can be expressed as P(m)=A(u ref ) m-1 +B, m is the sequence length of the Clifford gate sequence in the first subsequence, A and B are the parameters obtained when fitting the curve, uref is the first unitary degree, and P(m) is the purity measured for the first subsequence of the Clifford gate sequence with a sequence length of m.
[0065] Furthermore, based on the first decay curve, the first unitary degree can be calculated to measure the ability of the quantum operation gate operation to maintain the purity of the quantum state. The higher the unitary degree, the smaller the incoherent error of the quantum operation gate operation and the higher the quality of the quantum operation gate operation. In a specific implementation, the first decay curve “P(m)=A(u ref ) m-1 +B" determines the first unitary degree u ref .
[0066] S102: inserting a delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a purity random benchmark test sequence with a delay inserted;
[0067] In this step, a certain delay is inserted between adjacent Clifford gates randomly selected in the purity random benchmark test sequence, which makes it easier to observe the impact of incoherent errors caused by environmental noise in the quantum system on the quantum gates.
[0068] As a feasible implementation manner, a delay is inserted between adjacent Clifford gates in the purity random benchmark test sequence to obtain a purity random benchmark test sequence with inserted delay, including: inserting delays of the same length between adjacent Clifford gates in each of the first subsequences to obtain multiple second subsequence groups, each of the second subsequence groups includes multiple second subsequences, the second subsequence includes a Clifford gate sequence and a measurement gate, the Clifford gates in the Clifford gate sequence are randomly selected, the sequence lengths of the Clifford gate sequences of different second subsequences in the same second subsequence group are the same, the measurement gates of each second subsequence in the same second subsequence group include a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the second subsequences in different second subsequence groups are different.
[0069] In a specific implementation, a delay of the same length is inserted between adjacent Clifford gates in each first subsequence to obtain a corresponding second subsequence. The second subsequence is as follows: Figure 3 As shown, is the length of the inserted delay. That is, after the delay is inserted, multiple second subsequence groups are obtained, each second subsequence group contains several second subsequences, the second subsequence includes a Clifford gate sequence and a measurement gate, and the Clifford gate in the Clifford gate sequence is randomly selected. The sequence lengths of the Clifford gate sequences of different second subsequences in the same second subsequence group are the same, the measurement gate includes a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the second subsequences in different second subsequence groups are different.
[0070] S103: Initializing the quantum bits of the purity random benchmark test sequence with the inserted delay to the |0> state, determining a second decay curve of purity based on the purity random benchmark test sequence with the inserted delay, and determining a second unitary degree according to the second decay curve;
[0071] In this step, the quantum bits of the random benchmark test sequence with inserted delay are first initialized to the |0> state, which is a standard starting state in quantum computing. By executing the random benchmark test sequence with inserted delay and measuring the purity of the quantum state, the decay curve of the purity, i.e., the second decay curve, can be determined.
[0072] As a feasible implementation, the quantum bits of the purity random benchmark test sequence with inserted delay are initialized in the |0> state, and a second attenuation curve of purity is determined based on the purity random benchmark test sequence with inserted delay, including: measuring the purity of the quantum bits corresponding to each second subsequence group in turn; wherein, in the process of measuring the purity of the quantum bits corresponding to the target second subsequence group, the quantum bits of multiple target second subsequences in the target second subsequence group are initialized in the |0> state, and the purity of the quantum bits under the action of each target second subsequence is measured respectively, and the average value of the purity of the quantum bits under the action of multiple target second subsequences is used as the purity of the quantum bits corresponding to the target second subsequence group; based on the purity of the quantum bits corresponding to each second subsequence group and the sequence length of the Clifford gate sequence of the second subsequence in each second subsequence group, the curve of the purity with respect to the sequence length is fitted to obtain a second attenuation curve; wherein, the second attenuation curve is P(m)= A'(u) m-1 +B', m is the sequence length, A' and B' are parameters of the fitting curve, u is the second unitary degree, and P(m) is the purity corresponding to the sequence length of m.
[0073] In a specific implementation, the purity of the quantum bits corresponding to each second subsequence group is measured in turn. Taking the target second subsequence group as an example, the target second subsequence group includes multiple target second subsequences. The quantum bits of the multiple target second subsequences are initialized in the |0> state. The purity of the quantum bits under the action of each target second subsequence is measured by using the measurement gate without operation gate, the 90° rotation pulse operation gate in the X direction, and the 90° rotation pulse operation gate in the Y direction. The purity of the quantum bits under the action of the multiple target second subsequences is averaged and processed as the purity of the quantum bits corresponding to the target second subsequence group. According to the measured purity of the quantum bits corresponding to each second subsequence group and the sequence length of the Clifford gate sequence of the second subsequence in each second subsequence group, the second attenuation curve is obtained by fitting the curve of the purity with respect to the sequence length of the Clifford gate sequence. The second attenuation curve describes how the purity of the quantum state decays with the increase of the sequence length. The second attenuation curve can be expressed as P(m)= A'(u) m-1 +B', m is the sequence length of the Clifford gate sequence in the second subsequence, A' and B' are parameters obtained when fitting the curve, u is the second unitary degree, and P(m) is the purity measured for the second subsequence containing the Clifford gate sequence with a sequence length of m.
[0074] Secondly, the second unitary degree can be calculated based on the second decay curve, which is used to measure the ability of the quantum operation gate operation to maintain the purity of the quantum state. In a specific implementation, the second decay curve "P(m)= A'(u) can be fitted to the second unitary degree. m-1 +B'" determines the second unitary degree.
[0075] S104: Determine an incoherent error based on the first unitary degree and the second unitary degree, and perform a performance evaluation on a quantum operation gate based on the incoherent error.
[0076] In this step, by comparing the first unitary degree (unitary degree without delay) and the second unitary degree (unitary degree after inserting the delay), the incoherent error caused by the environmental noise can be determined. The incoherent error includes the error caused by the relaxation process and the error caused by the dephasing process.
[0077] As a feasible implementation manner, determining the incoherent error based on the first unitary degree and the second unitary degree includes: determining the incoherent error according to an incoherent error calculation formula; wherein the incoherent error calculation formula is:
[0078] ;
[0079] in, is the length of the inserted delay, For the insertion time The corresponding incoherent error under the delay condition, d is the dimension of the quantum bit system, and the dimension of the quantum bit system d=2 n , n is the number of quantum bits, u ref is the first unitary degree, u is the insertion time The corresponding second unitary degree in the case of delay.
[0080] Furthermore, the performance evaluation result of the quantum operation gate can be determined based on the incoherent error. In a specific implementation, the calculated incoherent error can be directly used as the performance evaluation result of the quantum operation gate, or other indicators for evaluating the performance of the quantum operation gate can be further calculated based on the incoherent error, which is not specifically limited in this embodiment.
[0081] The quantum operation gate performance evaluation method provided in the embodiment of the present application uses a purity random benchmark test sequence and a purity random benchmark test sequence with an inserted delay to measure the incoherent error caused by environmental noise. Compared with an ordinary random benchmark test sequence, the purity random benchmark test sequence completely eliminates the influence of coherent errors, improves the accuracy of measuring incoherent errors, and thus improves the accuracy of quantum operation gate performance evaluation and the accuracy of quantum bit environmental noise evaluation.
[0082] The embodiment of the present application discloses a method for evaluating the performance of a quantum operation gate. Compared with the previous embodiment, this embodiment further explains and optimizes the technical solution. Specifically:
[0083] See also Figure 4 , a flow chart of another method for evaluating the performance of a quantum operation gate according to an exemplary embodiment is shown, such as Figure 4 As shown, including:
[0084] S201: construct a purity random benchmark test sequence, initialize the qubits of the purity random benchmark test sequence in the |0> state, determine a first decay curve of purity based on the purity random benchmark test sequence, and determine a first unitary degree according to the first decay curve; wherein the Clifford gate in the purity random benchmark test sequence is randomly selected;
[0085] S202: inserting a delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a delay-inserted purity random benchmark test sequence;
[0086] S203: Initializing the quantum bits of the purity random benchmark test sequence with the inserted delay to the |0> state, determining a second decay curve of purity based on the purity random benchmark test sequence with the inserted delay, and determining a second unitary degree according to the second decay curve;
[0087] S204: determining an incoherent error based on the first unitary degree and the second unitary degree;
[0088] S205: Determine the noise power spectrum of the environment where the quantum bit is located based on the incoherent error as a performance evaluation result of the quantum operation gate.
[0089] In this embodiment, the noise power spectrum of the environment where the quantum bit is located is further calculated based on the calculated incoherent error as the performance evaluation result of the quantum operation gate. The noise power spectrum is a function that describes the power distribution of the noise signal in different frequency ranges. It reflects the power intensity of the noise at each frequency component. It can provide detailed information about the noise characteristics of the environment where the quantum bit is located.
[0090] As a feasible implementation manner, the determining the noise power spectrum of the environment where the quantum bit is located based on the incoherent error as the performance evaluation result of the quantum operation gate includes: determining the noise power spectrum of the environment where the quantum bit is located based on the incoherent error and the relationship between the incoherent error and the noise power spectrum, and using the noise power spectrum as the performance evaluation result of the quantum operation gate;
[0091] Among them, the relationship between the incoherent error and the noise power spectrum is:
[0092] ;
[0093] in, is the length of the inserted delay, For the insertion time The corresponding incoherent error in the case of a delay of is the angular frequency, is the noise power spectrum.
[0094] According to the above, this embodiment continuously changes the length of the inserted delay. Repeat steps S201-S204 to test different insertion durations. The incoherent error corresponding to the delay , and calculate the noise power spectrum as above.
[0095] It can be seen that this embodiment achieves the measurement of incoherent errors caused by relaxation processes and dephasing processes and the noise characteristics of the quantum bit environment on a time scale related to quantum operation gates, which can completely eliminate the interference caused by coherent errors and further evaluate the performance of the quantum chip.
[0096] A quantum operation gate performance evaluation device provided in an embodiment of the present application is introduced below. The quantum operation gate performance evaluation device described below and the quantum operation gate performance evaluation method described above can be referenced to each other.
[0097] See also Figure 5 , according to an exemplary embodiment, a structure diagram of a quantum operation gate performance evaluation device is shown, such as Figure 5 As shown, including:
[0098] A first test module 100 is used to construct a purity random benchmark test sequence, initialize the qubits of the purity random benchmark test sequence in the |0> state, determine a first decay curve of purity based on the purity random benchmark test sequence, and determine a first unitary degree according to the first decay curve; wherein the Clifford gate in the purity random benchmark test sequence is randomly selected;
[0099] Insertion module 200, used for inserting delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a purity random benchmark test sequence with inserted delay;
[0100] A second test module 300 is used to initialize the quantum bits of the purity random benchmark test sequence with inserted delay in the |0> state, determine a second decay curve of purity based on the purity random benchmark test sequence with inserted delay, and determine a second unitary degree according to the second decay curve;
[0101] The performance evaluation module 400 is used to determine the incoherent error based on the first unitary degree and the second unitary degree, and to perform performance evaluation on the quantum operation gate based on the incoherent error.
[0102] The quantum operation gate performance evaluation device provided in the embodiment of the present application uses a purity random benchmark test sequence and a purity random benchmark test sequence with an inserted delay to measure the incoherent error caused by environmental noise. Compared with an ordinary random benchmark test sequence, the purity random benchmark test sequence completely eliminates the influence of coherent errors, improves the accuracy of measuring incoherent errors, and thus improves the accuracy of quantum operation gate performance evaluation and the accuracy of quantum bit environmental noise evaluation.
[0103] On the basis of the above embodiment, as a preferred implementation manner, the purity random benchmark test sequence includes multiple first subsequence groups, each of the first subsequence groups includes multiple first subsequences, the first subsequence includes a Clifford gate sequence and a measurement gate, the Clifford gate in the Clifford gate sequence is randomly selected, the sequence lengths of the Clifford gate sequences of different first subsequences in the same first subsequence group are the same, the measurement gate of each first subsequence in the same first subsequence group includes a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the first subsequences in different first subsequence groups are different;
[0104] Correspondingly, the first test module 100 is specifically used to: measure the purity of the quantum bits corresponding to each of the first subsequence groups in turn; wherein, in the process of measuring the purity of the quantum bits corresponding to the target first subsequence group, the quantum bits of multiple target first subsequences in the target first subsequence group are initialized to the |0> state, and the purity of the quantum bits under the action of each of the target first subsequences is measured respectively, and the average value of the purity of the quantum bits under the action of the multiple target first subsequences is used as the purity of the quantum bits corresponding to the target first subsequence group; based on the purity of the quantum bits corresponding to each of the first subsequence groups and the sequence length of the Clifford gate sequence of the first subsequence in each of the first subsequence groups, fit the curve of the purity with respect to the sequence length to obtain a first attenuation curve; wherein, the first attenuation curve is P(m)=A(u ref ) m-1 +B, m is the length of the sequence, A and B are the parameters of the fitting curve, u ref is the first unitary degree, and P(m) is the purity corresponding to the sequence length of m.
[0105] On the basis of the above embodiment, as a preferred implementation mode, the insertion module 200 is specifically used to: insert delays of the same length between adjacent Clifford gates in each of the first subsequences, respectively, to obtain multiple second subsequence groups, each of the second subsequence groups includes multiple second subsequences, the second subsequence includes a Clifford gate sequence and a measurement gate, the Clifford gates in the Clifford gate sequence are randomly selected, the sequence lengths of the Clifford gate sequences of different second subsequences in the same second subsequence group are the same, the measurement gates of each second subsequence in the same second subsequence group include a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the second subsequences in different second subsequence groups are different.
[0106] On the basis of the above embodiment, as a preferred implementation manner, the second test module 300 is specifically used to: sequentially measure the purity of the quantum bits corresponding to each second subsequence group; wherein, in the process of measuring the purity of the quantum bits corresponding to the target second subsequence group, the quantum bits of multiple target second subsequences in the target second subsequence group are initialized to the |0> state, and the purity of the quantum bits under the action of each target second subsequence is measured respectively, and the average value of the purity of the quantum bits under the action of multiple target second subsequences is used as the purity of the quantum bits corresponding to the target second subsequence group; based on the purity of the quantum bits corresponding to each second subsequence group and the sequence length of the Clifford gate sequence of the second subsequence in each second subsequence group, fit the curve of the purity with respect to the sequence length to obtain a second attenuation curve; wherein, the second attenuation curve is P(m)= A'(u) m-1 +B', m is the sequence length, A' and B' are parameters of the fitting curve, u is the second unitary degree, and P(m) is the purity corresponding to the sequence length of m.
[0107] Based on the above embodiment, as a preferred implementation, the performance evaluation module 400 is specifically used to: determine the incoherent error according to the incoherent error calculation formula; wherein the incoherent error calculation formula is:
[0108] ;
[0109] in, is the length of the inserted delay, For the insertion time The corresponding incoherent error under the delay condition, d is the dimension of the quantum bit system, and the dimension of the quantum bit system d=2 n , n is the number of quantum bits, u ref is the first unitary degree, u is the insertion time The corresponding second unitary degree in the case of delay.
[0110] Based on the above embodiment, as a preferred implementation mode, the performance evaluation module 400 is specifically used to: determine the noise power spectrum of the environment where the quantum bit is located based on the incoherent error as the performance evaluation result of the quantum operation gate.
[0111] Based on the above embodiment, as a preferred implementation, the performance evaluation module 400 is specifically used to: determine the noise power spectrum of the environment where the quantum bit is located based on the incoherent error and the relationship between the incoherent error and the noise power spectrum, and use the noise power spectrum as the performance evaluation result of the quantum operation gate;
[0112] Among them, the relationship between the incoherent error and the noise power spectrum is:
[0113] ;
[0114] in, is the length of the inserted delay, For the insertion time The corresponding incoherent error in the case of a delay of is the angular frequency, is the noise power spectrum.
[0115] Regarding the device in the above embodiment, the specific manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be elaborated here.
[0116] Based on the hardware implementation of the above program module, and in order to implement the method of the embodiment of the present application, the embodiment of the present application also provides an electronic device, Figure 6 FIG. 1 is a structural diagram of an electronic device according to an exemplary embodiment. Figure 6 As shown, the electronic equipment includes:
[0117] Communication interface 1, capable of exchanging information with other devices such as network devices;
[0118] The processor 2 is connected to the communication interface 1 to realize information exchange with other devices, and is used to execute the quantum operation gate performance evaluation method provided by one or more technical solutions when running a computer program. The computer program is stored in the memory 3.
[0119] Of course, in actual application, the various components in the electronic device are coupled together through the bus system 4. It can be understood that the bus system 4 is used to realize the connection and communication between these components. In addition to the data bus, the bus system 4 also includes a power bus, a control bus and a status signal bus. However, for the sake of clarity, Figure 5 Various buses are labeled as bus system 4.
[0120] The memory 3 in the embodiment of the present application is used to store various types of data to support the operation of the electronic device. Examples of such data include: any computer program used to operate on the electronic device.
[0121] It can be understood that the memory 3 can be a volatile memory or a non-volatile memory, and can also include both volatile and non-volatile memories. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a magnetic random access memory (FRAM), a flash memory, a magnetic surface memory, an optical disc, or a compact disc read-only memory (CD-ROM); the magnetic surface memory can be a disk memory or a tape memory. The volatile memory can be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of RAM are available, such as static random access memory (SRAM), synchronous static random access memory (SSRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDRSDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM, SyncLink Dynamic Random Access Memory), and direct RAMbus random access memory (DRRAM, Direct Rambus Random Access Memory).The memory 3 described in the embodiments of the present application is intended to include but is not limited to these and any other suitable types of memories.
[0122] The method disclosed in the above embodiment of the present application can be applied to the processor 2, or implemented by the processor 2. The processor 2 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the hardware integrated logic circuit in the processor 2 or the instruction in the form of software. The above processor 2 may be a general-purpose processor, a DSP, or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. The processor 2 can implement or execute the methods, steps and logic block diagrams disclosed in the embodiments of the present application. The general-purpose processor may be a microprocessor or any conventional processor, etc. In combination with the steps of the method disclosed in the embodiment of the present application, it can be directly embodied as a hardware decoding processor to execute, or it can be executed by a combination of hardware and software modules in the decoding processor. The software module may be located in a storage medium, which is located in the memory 3, and the processor 2 reads the program in the memory 3 and completes the steps of the above method in combination with its hardware.
[0123] When the processor 2 executes the program, the corresponding processes in the various methods of the embodiments of the present application are implemented, which will not be repeated here for the sake of brevity.
[0124] In an exemplary embodiment, the present application also provides a storage medium, namely a computer storage medium, specifically a computer-readable storage medium, for example, a memory 3 storing a computer program, and the computer program can be executed by a processor 2 to complete the steps of the aforementioned method. The computer-readable storage medium can be a memory such as FRAM, ROM, PROM, EPROM, EEPROM, Flash Memory, magnetic surface memory, optical disk, CD-ROM, etc.
[0125] A person of ordinary skill in the art can understand that: all or part of the steps of implementing the above-mentioned method embodiment can be completed by hardware related to program instructions, and the aforementioned program can be stored in a computer-readable storage medium, which, when executed, executes the steps of the above-mentioned method embodiment; and the aforementioned storage medium includes: various media that can store program codes, such as mobile storage devices, ROM, RAM, disks or optical disks.
[0126] Alternatively, if the above-mentioned integrated unit of the present application is implemented in the form of a software function module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the embodiment of the present application can essentially or in other words, the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium and includes a number of instructions for an electronic device (which can be a personal computer, server, network device, etc.) to execute all or part of the methods described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as mobile storage devices, ROM, RAM, magnetic disks or optical disks.
[0127] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.
Claims
1. A method for evaluating the performance of a quantum operation gate, characterized in that: include: Constructing a purity random benchmark test sequence, initializing the qubits of the purity random benchmark test sequence in the |0> state, determining a first decay curve of purity based on the purity random benchmark test sequence, and determining a first unitary degree according to the first decay curve; wherein the Clifford gate in the purity random benchmark test sequence is randomly selected; Inserting delays between adjacent Clifford gates in the purity random benchmark test sequence to obtain a purity random benchmark test sequence with inserted delays; Initializing the quantum bits of the purity random benchmark test sequence with the inserted delay to the |0> state, determining a second decay curve of purity based on the purity random benchmark test sequence with the inserted delay, and determining a second unitary degree according to the second decay curve; An incoherent error is determined based on the first unitary degree and the second unitary degree, and a performance evaluation of a quantum operation gate is performed based on the incoherent error.
2. The method for evaluating the performance of a quantum operation gate according to claim 1, characterized in that: The purity random benchmark test sequence includes a plurality of first subsequence groups, each of the first subsequence groups includes a plurality of first subsequences, the first subsequence includes a Clifford gate sequence and a measurement gate, the Clifford gate in the Clifford gate sequence is randomly selected, the sequence lengths of the Clifford gate sequences of different first subsequences in the same first subsequence group are the same, the measurement gates of each first subsequence in the same first subsequence group include a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the first subsequences in different first subsequence groups are different; Accordingly, the qubits of the purity random benchmark test sequence are initialized in the |0> state, and a first decay curve of purity is determined based on the purity random benchmark test sequence, including: Sequentially measure the purity of the quantum bits corresponding to each of the first subsequence groups; wherein, in the process of measuring the purity of the quantum bits corresponding to the target first subsequence group, the quantum bits of multiple target first subsequences in the target first subsequence group are initialized to the |0> state, and the purity of the quantum bits under the action of each of the target first subsequences is measured respectively, and the average value of the purity of the quantum bits under the action of the multiple target first subsequences is taken as the purity of the quantum bits corresponding to the target first subsequence group; Based on the purity of the quantum bits corresponding to each of the first subsequence groups and the sequence length of the Clifford gate sequence of the first subsequence in each of the first subsequence groups, a curve of the purity with respect to the sequence length is fitted to obtain a first attenuation curve; wherein the first attenuation curve is P(m)=A(u ref ) m-1 +B, m is the length of the sequence, A and B are the parameters of the fitting curve, u ref is the first unitary degree, and P(m) is the purity corresponding to the sequence length of m.
3. The method for evaluating the performance of a quantum operation gate according to claim 2, characterized in that: Inserting a delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a delay-inserted purity random benchmark test sequence, comprising: Delays of the same length are respectively inserted between adjacent Clifford gates in each of the first subsequences to obtain a plurality of second subsequence groups, each of the second subsequence groups includes a plurality of second subsequences, the second subsequence includes a Clifford gate sequence and a measurement gate, the Clifford gates in the Clifford gate sequence are randomly selected, the sequence lengths of the Clifford gate sequences of different second subsequences in the same second subsequence group are the same, the measurement gates of each second subsequence in the same second subsequence group include a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, and the sequence lengths of the Clifford gate sequences of the second subsequences in different second subsequence groups are different.
4. The method for evaluating the performance of a quantum operation gate according to claim 3, characterized in that: Initializing the quantum bits of the purity random benchmark test sequence with the inserted delay in the |0> state, and determining a second decay curve of purity based on the purity random benchmark test sequence with the inserted delay, comprising: Sequentially measure the purity of the quantum bits corresponding to each second subsequence group; wherein, in the process of measuring the purity of the quantum bits corresponding to the target second subsequence group, the quantum bits of multiple target second subsequences in the target second subsequence group are initialized to the |0> state, and the purity of the quantum bits under the action of each target second subsequence is measured respectively, and the average value of the purity of the quantum bits under the action of the multiple target second subsequences is taken as the purity of the quantum bits corresponding to the target second subsequence group; Based on the purity of the quantum bits corresponding to each of the second subsequence groups and the sequence length of the Clifford gate sequence of the second subsequence in each of the second subsequence groups, a curve of the purity with respect to the sequence length is fitted to obtain a second attenuation curve; wherein the second attenuation curve is P(m)= A'(u) m-1 +B', m is the sequence length, A' and B' are parameters of the fitting curve, u is the second unitary degree, and P(m) is the purity corresponding to the sequence length of m.
5. The method for evaluating the performance of a quantum operation gate according to claim 1, characterized in that: The determining of the incoherent error based on the first unitary degree and the second unitary degree comprises: The incoherent error is determined according to the incoherent error calculation formula; wherein the incoherent error calculation formula is: ； in, is the length of the inserted delay, For the insertion time The corresponding incoherent error under the delay condition, d is the dimension of the quantum bit system, and the dimension of the quantum bit system d=2 n , n is the number of quantum bits, u ref is the first unitary degree, u is the insertion time The corresponding second unitary degree in the case of delay.
6. The method for evaluating the performance of a quantum operation gate according to claim 1, characterized in that: The performance evaluation of the quantum operation gate based on the incoherent error includes: Based on the incoherent error, the noise power spectrum of the environment where the quantum bit is located is determined as a performance evaluation result of the quantum operation gate.
7. The method for evaluating the performance of a quantum operation gate according to claim 6, characterized in that: The step of determining the noise power spectrum of the environment where the quantum bit is located based on the incoherent error as the performance evaluation result of the quantum operation gate includes: Determine the noise power spectrum of the environment where the quantum bit is located based on the incoherent error and the relationship between the incoherent error and the noise power spectrum, and use the noise power spectrum as a performance evaluation result of the quantum operation gate; Among them, the relationship between the incoherent error and the noise power spectrum is: ； in, is the length of the inserted delay, For the insertion time The corresponding incoherent error in the case of a delay of is the angular frequency, is the noise power spectrum.
8. A quantum operation gate performance evaluation device, characterized in that: include: A first test module is used to construct a purity random benchmark test sequence, initialize the qubits of the purity random benchmark test sequence in the |0> state, determine a first decay curve of purity based on the purity random benchmark test sequence, and determine a first unitary degree according to the first decay curve; wherein the Clifford gate in the purity random benchmark test sequence is randomly selected; An inserting module, used for inserting a delay between adjacent Clifford gates in the purity random benchmark test sequence to obtain a purity random benchmark test sequence with an inserted delay; A second test module, configured to initialize the quantum bits of the purity random benchmark test sequence with inserted delay to the |0> state, determine a second decay curve of purity based on the purity random benchmark test sequence with inserted delay, and determine a second unitary degree according to the second decay curve; A performance evaluation module is used to determine an incoherent error based on the first unitary degree and the second unitary degree, and to perform a performance evaluation on a quantum operation gate based on the incoherent error.
9. An electronic device, characterized in that: include: Memory for storing computer programs; A processor, configured to implement the steps of the method for evaluating the performance of a quantum operation gate as claimed in any one of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed, the steps of the method for evaluating the performance of a quantum operation gate according to any one of claims 1 to 7 are implemented.