Optical power calibration method and system and electronic equipment

Abstract

The embodiment of the invention provides an optical power calibration method and system and electronic equipment, the method is applied to a controller in the optical power calibration system, and the method comprises the following steps: adjusting the temperature of an incubator and the wavelength of an input optical signal of an erbium-doped optical fiber amplifier (EDFA), so as to obtain a plurality of optical signals at a plurality of different to-be-measured temperatures, the signal optical power and the total optical power output by the EDFA are corresponding to different wavelengths to be measured, and the EDFA is located in the incubator; and calibrating the optical power according to the signal optical power output by the EDFA and the total optical power corresponding to the different wavelengths to be measured at the plurality of different temperatures to be measured.

Description

Technical Field

[0001] The present application relates to the field of optical communication technology, and in particular to an optical power calibration method, system and electronic equipment. Background Art

[0002] With the increasing demand for transmission capacity of optical communication systems, the bandwidth range of the traditional C band can no longer meet the demand, and a wider transmission band needs to be expanded. After a long period of research and exploration by personnel in the optical communication industry, it is basically determined that the best wavelength range for optical transmission is in the range of 1260nm-1625nm, where optical loss and signal distortion are minimal. The International Telecommunication Union telecommunication standard divides the frequency band of single-mode optical fiber above 1260nm into six bands: O, E, S, C, L, and U, among which the C band and L band are the better choices for dense wavelength division multiplexing (DWDM) systems.

[0003] Among them, in order to compensate for the loss of transmission optical fiber, an optical amplifier will be added to the optical system link. Generally, an erbium-doped optical fiber amplifier (EDFA) is used. EDFA consists of a pump laser diode (PLD), erbium-doped gain fiber and a wavelength division multiplexer. Using the principle of stimulated emission, the PLD provides energy to excite Er ions from the ground state to the upper energy level, and then transfers to the metastable state without radiation. In this state, when signal light enters, the erbium ions will fall to the ground state and radiate photons that are the same as the signal photons. When a large number of Er ions are pumped to the upper energy level, the signal light will be amplified after entering. On the contrary, if there is not enough pumping or no pumping, the signal light will be absorbed by the erbium ions. This is also called reabsorption.

[0004] At present, the gain spectrum of EDFA itself is very wide, covering the entire C-band, but the gain in the L-band drops sharply, especially the gain gap between different wavelengths. This leads to the difference in the intensity of spontaneous emission noise (Amplified Spontaneous Emission, ASE) at different wavelengths, which seriously affects the control of signal optical power. Summary of the invention

[0005] The purpose of the embodiments of the present application is to provide a method, system and electronic device for calibrating optical power, which can realize optical power calibration and thus realize effective control of signal optical power.

[0006] To solve the above technical problems, the embodiments of the present application are implemented through the following aspects.

[0007] In a first aspect, an embodiment of the present application provides a method for calibrating optical power, which is applied to a controller in an optical power calibration system, the method comprising: adjusting the temperature of an incubator and the wavelength of an input optical signal of an erbium-doped fiber amplifier EDFA to obtain the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at multiple different temperatures to be measured, wherein the EDFA is located in the incubator; calibrating the optical power according to the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at the multiple different temperatures to be measured.

[0008] In a second aspect, an embodiment of the present application provides an optical power calibration system, the optical power calibration system comprising: an EDFA; an incubator, the EDFA being placed in the incubator; a laser, for providing signal light of different wavelengths to the EDFA; and a controller; wherein the controller is connected to the input end of each stage of the pump laser in the EDFA for adjusting the input current of each stage of the pump laser, the controller is connected to the incubator for adjusting the temperature value of the incubator, the controller is connected to the laser for adjusting the wavelength band of the optical signal input into the EDFA, the controller is connected to the output of the EDFA for recording the signal optical power and total optical power of the EDFA corresponding to different wavelengths to be measured at different temperatures to be measured, and calibrating the optical power according to the recording results.

[0009] In a third aspect, an embodiment of the present application provides an electronic device comprising: a memory, a processor, and computer executable instructions stored in the memory and executable on the processor, wherein the computer executable instructions, when executed by the processor, implement the steps of the method described in the first aspect.

[0010] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the method described in the first aspect are implemented.

[0011] In the embodiment of the present application, the EDFA is placed in a temperature box, and then the temperature of the temperature box and the wavelength of the input optical signal of the EDFA are adjusted by a controller to obtain the signal optical power and total optical power output by the EDFA corresponding to different wavelengths to be tested at multiple different temperatures to be tested, and finally the optical power is calibrated according to the signal optical power and total optical power output by the EDFA corresponding to different wavelengths to be tested at the multiple different temperatures to be tested. Therefore, when the EDFA gain control or signal optical power is adjusted, the effect of adjusting and controlling the signal optical power can be indirectly achieved by adjusting or monitoring the total optical power according to the aforementioned calibration results, thereby reducing the difficulty of EDFA gain control. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0013] Figure 1 A schematic diagram of the structure of an optical power calibration system provided in an embodiment of the present application is shown.

[0014] Figure 2 A schematic diagram of the structure of a three-stage EDFA provided in an embodiment of the present application.

[0015] Figure 3a One of the flowcharts of the optical power calibration method provided in the embodiment of the present application is shown.

[0016] Figure 3b The second flowchart of the optical power calibration method provided in the embodiment of the present application is shown.

[0017] Figure 4 The third flowchart of the optical power calibration method provided in the embodiment of the present application is shown.

[0018] Figure 5 A schematic diagram of the hardware structure of an electronic device for executing the optical power calibration method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0019] In order to enable those skilled in the art to better understand the technical solutions in this application, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the drawings in the embodiments of this application. Obviously, the described embodiments are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of this application.

[0020] The applicant has found that, for the L-band, EDFA may generate different ASE at different temperatures, pump intensities, and wavelengths, which greatly increases the difficulty of EDFA gain control. In response to this, the present application provides an optical power calibration method, system, and electronic device, which calibrates the ASE of EDFA at different temperatures, wavelengths, and pump intensities to find the relationship between the deviation of total optical power and signal optical power and these variables, and then achieves the effect of adjusting and controlling the signal optical power based on the calibration results, thereby reducing the difficulty of EDFA gain control.

[0021] Based on this, Figure 1 The figure is a schematic diagram of the structure of an optical power calibration system provided by an exemplary embodiment of the present application. The optical power calibration system may include but is not limited to a controller, a temperature chamber, a laser, a Mach-Zehnder Modulator (MZM), an EDFA, a Variable Optical Attenuator (VOA), an optical power detector (PD), and an optical spectrum analyzer (OSA).

[0022] The temperature box is used to place the EDFA so that the EDFA can be at different temperatures, thereby achieving calibration of optical power under different temperature conditions.

[0023] The laser may be, but is not limited to, an Integrated Tunable Laser Assembly (ITLA), which is used to provide laser signals of different wavelengths or bands under the control of the controller. In this embodiment, the tunable laser can provide, but is not limited to, laser signals of other bands such as L-band and S-band.

[0024] The MZM is used to modulate the laser signal emitted by the tunable laser. It can be understood that after the signal light output by the tunable laser is adjusted by the MZM, the signal light power is greatly reduced due to the modulation insertion loss. For this, EDFA can be used but not limited to amplify it to compensate for the optical power loss caused by modulation.

[0025] The EDFA is used to compensate for the loss of transmission optical fiber, MZM, etc. In this embodiment, the EDFA may include but is not limited to a pump laser, an erbium-doped (Er) gain fiber, and a wavelength division multiplexer (WDM). Based on this, the EDFA uses the principle of stimulated emission of radiation to achieve light amplification.

[0026] It is worth noting that, depending on the optical communication scenario, the EFDA may be a multi-level structure. Figure 2 As shown in FIG. 1 , a three-stage EFDA or a three-stage amplification structure EDFA of the L band is shown. The WDM between each stage is responsible for multiplexing the signal light and the pump light into the erbium-doped gain fiber (EDF). At the same time, the WDM also has the function of an isolator, such as isolating the signal light of the subsequent stage to prevent it from damaging (reflected light damages) the previous stage device and filtering out the reverse ASE.

[0027] In this embodiment, Figure 2The pump shown in the figure adopts a forward pumping mode, and the forward pumping has better noise properties than the backward pumping. Optionally, the pump laser in the EDFA can adopt a 980nm laser, and the WDM can adopt a 980nm / 1550nm WDM.

[0028] In addition, for Figure 2 In the three-stage EFDA shown, a gain flattening filter (GFF) is added between the second and third stages, and an optical isolator (ISO) is added at the output of the third stage. The GFF is used to filter out the C-band ASE generated during the first two stages of amplification to compensate for the gain flatness of the L-band. The optical isolator is used to achieve the purpose of signal light isolation to prevent it from damaging (damaging reflected light) the previous stage devices.

[0029] The VOA is used to adjust or control the signal optical power.

[0030] The PD is used to detect the total optical power output by the VOA and input it into the controller.

[0031] The optical spectrum analyzer is connected to the output end of the EDFA and the controller respectively, and is used to obtain the signal optical power according to the total optical power input by the VOA, and input it into the controller for optical power calibration.

[0032] The controller is connected to the input end of each stage of the pump laser in the EDFA to adjust the input current of each stage of the pump laser, the controller is connected to the temperature box to adjust the temperature value of the temperature box, the controller is connected to the laser to adjust the wavelength band of the optical signal (also called laser signal, or signal light) input into the EDFA, and the controller is connected to the output of the EDFA to record the signal light power and total light power of the EDFA corresponding to different wavelengths to be measured at different temperatures to be measured, and calibrate the light power according to the recording results.

[0033] Optionally, the controller may be, but is not limited to, an electronic device such as a host computer. For example, when the controller is a host computer, it may be connected to the incubator via a serial port.

[0034] Of course, the optical power calibration system described above may include more or fewer devices / components than those described above. For example, in some embodiments, the optical power calibration system may not include the temperature box, etc.

[0035] For example, in some other embodiments, the calibration system may further include a temperature sensor, which is disposed in the last-stage pump laser in the EDFA, such as embedded in or arranged near or around the last-stage pump laser, and the temperature sensor is connected to the controller to measure the temperature of the last-stage pump laser and feed it back to the controller for calibration of optical power.

[0036] Based on the optical power calibration system provided above, the optical power calibration method is introduced below.

[0037] Figure 3a A schematic flow chart of a method 300 for calibrating optical power provided in an embodiment of the present application is shown. The method 300 may be executed by a controller. In other words, the method 300 may be executed by software and / or hardware installed in the controller. Figure 3a As shown, the method 300 may include but is not limited to the following steps.

[0038] S310, adjusting the temperature of the incubator and the wavelength of the input optical signal of the EDFA to obtain the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be tested at multiple different temperatures to be tested.

[0039] Among them, the temperature to be measured and the wavelength to be measured can be set according to actual needs. For example, the temperature to be measured can be set according to actual needs, such as the number of temperatures to be measured can be 5, 8, etc., and the size of the temperature to be measured can be greater than or equal to -10 degrees, less than or equal to 65 degrees, such as -10 degrees, 0 degrees, 25 degrees, 45 degrees, 65 degrees, etc., without limitation. The wavelength to be measured can be understood as the wavelength of the signal light provided by the tunable laser, which can be but not limited to the 14 wavelengths of the L band, etc., without limitation.

[0040] The EDFA may be a multi-stage structure, such as Figure 2 The tertiary structure shown, etc.

[0041] In this embodiment, considering that the gain control of the EDFA is at least related to the temperature, the EDFA is located in the temperature box. The temperature to be measured may be the temperature of the temperature box, that is, when the temperature box is adjusted by the controller so that the temperature box reaches the different temperature to be measured, it is determined that the EDFA temperature reaches the temperature to be measured, thereby reducing the difficulty of temperature adjustment and the measurement cost.

[0042] Alternatively, the temperature to be measured may also be the temperature of the EDFA. For example, a temperature sensor may be built into the EDFA, or a temperature sensor may be arranged around / near the EDFA. The temperature box may be adjusted by the controller so that when the temperature value measured by the temperature sensor is the temperature to be measured, it is determined that the EDFA temperature has reached the temperature to be measured. This improves the accuracy of the EDFA temperature adjustment and ensures the accuracy of the calibration result.

[0043] Optionally, according to different requirements for temperature measurement accuracy, there may be one or more temperature sensors, and the temperature sensor may be, but is not limited to, a thermistor, etc., which is not limited here.

[0044] S320, calibrating the optical power according to the signal optical power and the total optical power output by the EDFA corresponding to the different wavelengths to be tested under the multiple different temperatures to be tested.

[0045] Among them, when performing optical power calibration, the deviation relationship between the signal optical power and the total optical power can be calibrated according to the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at multiple different temperatures to be measured, and the correlation relationship between the input current value of the final pump laser in the EDFA and the total optical power can also be calibrated according to the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at multiple different temperatures to be measured. Therefore, when performing EDFA gain control or signal optical power adjustment, the effect of signal optical power adjustment control can be indirectly achieved by adjusting or monitoring the total optical power according to the aforementioned calibration results, thereby reducing the difficulty of EDFA gain control.

[0046] Especially for high-noise EDFA, since the present application can control and monitor the signal light power according to the calibration result without directly controlling or monitoring the signal light power, it is unnecessary to add additional filters, thereby reducing the design cost and complexity of the EDFA system.

[0047] In this case, in some implementations, there are multiple ways to adjust the temperature of the incubator and the wavelength of the input optical signal of the EDFA by the controller to obtain the signal optical power and total optical power output by the EDFA corresponding to different wavelengths under multiple different temperatures. Figure 3b As shown, in this embodiment, the implementation process may include S311-S314, the contents are as follows.

[0048] S311, adjusting the temperature of the temperature box to a first temperature value.

[0049] Wherein, when a temperature sensor is built into the EDFA, or a temperature sensor is arranged around / near the EDFA, the method of adjusting the temperature of the incubator to the first temperature value may include: adjusting the temperature of the incubator, and when the temperature value measured by the temperature sensor is the first temperature value, determining that the temperature of the incubator has been adjusted to the first temperature value; wherein the temperature sensor is arranged in the final-stage pump laser.

[0050] S312, adjusting the input current of the last-stage pump laser in the EDFA to a first current value, and adjusting the input current of other pump lasers in the EDFA except the last-stage pump laser to a predetermined value.

[0051] It is worth noting that, taking the range of 1600-1625nm as an example, in order to ensure sufficient gain at frequencies within the range of 1600-1625nm, for EDFA, if the pump intensity of other pump lasers and the length of the gain fiber other than the final structure are set at a high level, then the gain loss caused by temperature, time aging, etc. is mainly related to the final structure in EDFA. In other words, the gain loss caused by temperature, time aging, etc. is mainly compensated by the final pump laser. For example, for a three-stage EDFA, it is mainly compensated by the third-stage pump laser to ensure the accuracy and stability of the output signal optical power.

[0052] Therefore, in this embodiment, when calibrating the optical power, the input current of other pump lasers except the final-stage pump laser can be set to a predetermined value, that is, the pump intensity of other pump lasers and the length of the gain fiber are set at a higher level, so as to achieve gain compensation by adjusting the current of the final-stage pump laser, thereby ensuring the accuracy and stability of the output signal optical power.

[0053] The first current value can be determined according to the current value corresponding to the second temperature value, the current value corresponding to the third temperature value and the first temperature value, and the first temperature value is smaller than the second temperature value and larger than the third temperature value.

[0054] For example, the second temperature value can be considered as the actual maximum temperature value required, such as greater than or equal to 65 degrees, and the third temperature value can be considered as the actual minimum temperature value required, such as less than or equal to -10 degrees, and the first temperature value is between the second temperature value and the third temperature value. In this embodiment, the first temperature value can be multiple, such as 0 degrees, 25 degrees, 35 degrees, etc., which is not limited here. In addition, in this embodiment, there can be multiple ways to obtain the current value corresponding to the second temperature value and the current value corresponding to the third temperature value, such as determining it based on empirical values ​​or obtaining it through temperature testing, etc., which is not limited here.

[0055] In some embodiments, if the EDFA is a three-stage structure, then the process of determining the predetermined value corresponding to the second-stage pump laser in the aforementioned EDFA may include the following (11)-(13).

[0056] (11) Adjust the temperature of the temperature box to the second temperature value, such as 65 degrees, and adjust the incident light frequency of the laser to the worst gain frequency. For example, for the L band, the worst gain wavelength of EDFA is generally 1625nm.

[0057] It can be understood that the method for adjusting the temperature of the temperature box to the second temperature value is similar to the method for adjusting the first temperature value, and will not be described in detail here.

[0058] (12) According to the maximum carrying current of the first-stage pump laser in the EDFA, the input current of the first-stage pump laser is adjusted to a first predetermined value, for example, according to the maximum carrying current of the third-stage pump laser, the current of the third-stage pump laser is adjusted to a second current value.

[0059] For example, the first predetermined value may be the maximum carrying current of the first-stage pump laser or 80% of the maximum carrying current.

[0060] Similarly, the second current value may be 70% of the maximum carrying current of the third-stage pump laser, etc. It is worth noting that the second current value may also be understood as the current value corresponding to the aforementioned second temperature value, which is not limited here.

[0061] The maximum carrying current described in the context of this application may be understood as the maximum current in the fixed specification sheet corresponding to the pump laser.

[0062] (13) adjusting the input current of the second-stage pump laser until the signal light power output by the EDFA meets the first gain requirement, and taking the current value corresponding to the second-stage pump laser under the first gain requirement as the second predetermined value corresponding to the second-stage pump laser.

[0063] Based on this, after determining the second predetermined value corresponding to the second-stage pump laser, in some embodiments, the process of determining the current value corresponding to the third temperature value may include the following (21)-(23), as follows.

[0064] (21) Adjust the temperature of the temperature box to the third temperature value, such as -10 degrees, and keep the incident light frequency of the laser at the worst gain frequency. For example, for the L band, the worst gain wavelength of EDFA is generally 1625nm.

[0065] It can be understood that the method for adjusting the temperature of the temperature box to the second temperature value is similar to the method for adjusting the first temperature value, and will not be described in detail here.

[0066] (22) adjusting the input current of the first-stage pump laser to a first predetermined value according to the maximum carrying current of the first-stage pump laser, and adjusting the input current of the second-stage pump laser to the second predetermined value.

[0067] (23) Adjusting the input current value of the third-stage pump laser until the signal light power output by the EDFA meets the second gain requirement, thereby obtaining the current value of the third-stage pump laser corresponding to the third temperature value under the second gain requirement.

[0068] The current value of the third-stage pump laser corresponding to the third temperature value may also be understood as the current value corresponding to the aforementioned third temperature value.

[0069] Of course, in the process of obtaining the current value corresponding to the third temperature value, if the output signal optical power of the EDFA meets the second gain requirement, the input current of the third-stage pump laser is less than the third current value, and the current value of the third-stage pump laser at the third temperature value is determined to be the third current value, wherein the third current value is 10% of the maximum carrying current of the third-stage pump laser. Thus, the problem of unstable EDFA amplification performance caused by too low current value is avoided.

[0070] S313, adjusting the wavelength of the input optical signal of the EDFA to obtain the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at the first temperature value.

[0071] S314, repeating steps S311-S313 until the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at multiple different temperatures to be measured are obtained, and the first temperature value is one of the multiple temperatures to be measured.

[0072] Based on this, in some embodiments, the controller described in the aforementioned S320 performs optical power calibration according to the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at the multiple different temperatures to be measured, and may also include: based on the current value corresponding to the second-stage pump laser under the first gain requirement, adjusting the wavelength of the input optical signal of the EDFA to obtain the signal optical power and the total optical power output by the EDFA corresponding to the different wavelengths to be measured under the second temperature value; based on the current value of the third-stage pump laser corresponding to the third temperature value under the second gain requirement, adjusting the wavelength of the input optical signal of the EDFA to obtain the signal light power and the total light power output by the EDFA corresponding to different wavelengths to be measured at the third temperature value; the deviation relationship between the signal light power and the total light power, and / or the correlation relationship between the input current value of the final pump laser in the EDFA and the total light power are calibrated according to the signal light power and the total light power of the EDFA corresponding to different wavelengths to be measured at the second temperature value, the third temperature value and the multiple temperatures to be measured. Thus, the relationship between the deviation of the signal light power and the total light power and the temperature and wavelength is obtained by calibrating a small amount of data, which is very necessary for the signal light control loop, such as being able to greatly reduce the difficulty of controlling the signal light power.

[0073] In some embodiments, in the aforementioned calibration process, the optical signal output by the EDFA can be input into an optical spectrum analyzer to obtain the optical signal output by the EDFA, and the optical spectrum analyzer analyzes the input optical signal to obtain and record the optical signal power processed by the optical spectrum analyzer. The optical spectrum analyzer is configured in an integration mode, so that the range of the optical signal frequency can be selected to integrate and calculate the optical signal power, and the out-of-band ASE noise can be removed when measuring the optical signal power.

[0074] Of course, in addition to setting the spectrum analyzer to the integration mode to remove out-of-band ASE during signal light power measurement, out-of-band ASE can also be removed by using filters or wavelength selective switches (WSS), high-resolution optical link diagnostic systems (OCI) and other devices, or other methods that can filter out out-of-band ASE of the signal light can also be used to ensure the flexibility and applicability of the solution implementation.

[0075] Based on the description of the optical power calibration process, for ease of understanding, the following takes the three-level EDFA in the coherent optical module as an example, and combines Figure 4 The optical power calibration process provided in this embodiment is described as follows: The temperature value in this example is a measurement value of a temperature sensor (such as a thermistor) around the third-stage pump laser.

[0076] S401, such as Figure 1 As shown, the EDFA is placed in a temperature box, and the output of the EDFA is connected to the PD and the optical spectrum analyzer respectively, wherein the optical spectrum analyzer is configured in an integration mode to remove out-of-band ASE when measuring the signal optical power.

[0077] S402, adjust the temperature of the oven to the required maximum temperature value (i.e., the aforementioned second temperature value), such as 65 degrees, and switch the incident light frequency to the worst gain frequency or worst gain wavelength. For example, for the L band, the worst gain wavelength of EDFA is generally 1625nm.

[0078] S403, fixing the input current of pump1 to the maximum current value I1, ie, the first predetermined value mentioned above, and fixing the input current of Pump3 to the maximum current value, such as 70% of its maximum carrying current.

[0079] S404, adjust pump2 so that the signal optical power outputted by it meets the gain requirement (ie, the aforementioned first gain requirement), such as 16 dB, and record the current value corresponding to pump2 under the gain requirement, ie, I2.

[0080] At this time, the current value I2 of pump2 is the current value that needs to be set at other wavelengths and temperatures subsequently, that is, the current value I2 of pump2 is fixed and unchanged subsequently.

[0081] S405, fixing the input current value of pump2 to I2, adjusting the wavelength of the input optical signal of the EDFA, and obtaining the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured under the maximum temperature value.

[0082] S406, whether the measurement of all wavelengths to be measured at the maximum temperature value is completed, if completed, execute S407, otherwise, execute S405 again.

[0083] S407, adjust the temperature of the temperature box to the required minimum temperature value (i.e. the aforementioned third temperature value), such as -10 degrees, and switch the incident light frequency to the worst gain frequency or gain difference wavelength, fix the input current of pump1 to the maximum current value I1, and fix the input current of pump2 to the maximum current value I2.

[0084] S408 , referring to S403 , reducing the input current value of the Pump 3 until the gain requirement is met, and recording the current value I3 corresponding to the Pump 3 when the gain requirement is met.

[0085] Among them, if the current value of the Pump3 is lower than 10% of the maximum carrying current value, the gain requirement, that is, the aforementioned second gain requirement, is not met. Then, in order to avoid the instability of the EDFA amplification performance caused by the current being too low, the input current I3 of the Pump3 can be determined to be 10% of the maximum carrying current value.

[0086] S409, fixing the input current of pump1 to current value I3, adjusting the wavelength of the input optical signal of the EDFA, and obtaining the signal optical power and total optical power output by the EDFA corresponding to different wavelengths to be measured at the lowest temperature value.

[0087] S410, whether the measurement of all wavelengths to be measured at the lowest temperature value is completed, if completed, execute S411, otherwise, execute S409 again.

[0088] S411, determining current values ​​at multiple different temperatures to be measured, such as the current value corresponding to the first temperature value, according to the current value corresponding to the second temperature value and the current value corresponding to the third temperature value in combination with an interpolation method.

[0089] S412, continue to fix the input current of pump1 to the current value I1, and the input current of pump2 to the current value I2, and adjust the temperature value of the temperature box to the temperature to be measured, such as the first temperature value.

[0090] S413, obtaining total optical power and signal optical power corresponding to different wavelengths to be tested at different temperatures to be tested.

[0091] S414, whether the measurement of different wavelengths to be measured at different temperatures to be measured is completed, if it is completed, execute S415, otherwise, continue to execute S413.

[0092] S415, calibrating the optical power according to the total optical power and signal optical power corresponding to the different wavelengths to be measured at the different temperatures to be measured.

[0093] Then, after completing the measurement of the total optical power and signal optical power corresponding to different measured wavelengths at different measured temperatures, the deviation δP between the signal optical power and the total optical power is calculated based on the measurement results. If the temperature and wavelength are assumed to be T and λ respectively, then the δP(T,λ) relationship can be obtained by multivariate polynomial fitting. Of course, in addition to the multivariate polynomial fitting method, other methods such as exponential, trigonometric function, etc. can also be used to improve the fitting accuracy.

[0094] Based on this, in the actual use of EDFA, the temperature T can be obtained according to the thermistor, the pump current can be set, and the total optical power can be obtained through the PD. In addition, the wavelength λ is known, and the signal optical power can be calculated based on this. Then, when adjusting the signal optical power, the current value of pump3 can be adjusted based on the aforementioned calibration results for compensation, such as compensating for the problem of insufficient optical power due to temperature, time aging, etc. to ensure the accuracy and stability of the output signal optical power. Of course, before adjusting based on the calibration results, it can also be adjusted through VOA first. If it does not meet the requirements, it can be adjusted based on the calibration results. This embodiment is not limited here.

[0095] That is, in the present application, when the EDFA gain control or signal light power is adjusted based on the calibration results provided in the present application, it is considered that it is insensitive to factors such as temperature and device aging. Therefore, in addition to directly controlling or adjusting based on the calibration results, multi-level control can be used. For example, the VOA can be adjusted first, and if it is not satisfied, the current of the last stage pump can be adjusted. If it is still not satisfied, the current of the penultimate stage pump laser can be adjusted, and so on, until the preset EDFA gain control or signal light power adjustment effect is achieved.

[0096] It is worth noting that the technical solution provided in this application can be applied to multi-level EDFA scenarios, as well as other EDFA scenarios with high noise, without limitation. Among them, the EDFA noise factor in the aforementioned scenarios has a strong correlation with wavelength, temperature, pumping, and aging time, especially at the edge waves of the L band, where the ASE intensity is close to or even higher than the signal light intensity, and the difference between different bands will be more obvious. Therefore, the signal light power control needs to take into account the influence of ASE in order to meet the power flatness requirements at different wavelengths at the system level (such as DWDM application scenarios).

[0097] Figure 5 A schematic diagram of the hardware structure of an electronic device that implements the embodiment of the present application is shown. Referring to the figure, at the hardware level, the electronic device includes a processor, and optionally, an internal bus, a network interface, and a memory. Among them, the memory may include a memory, such as a high-speed random access memory (Random-Access Memory, RAM), and may also include a non-volatile memory (non-volatile memory), such as at least one disk storage, etc. Of course, the electronic device may also include hardware required for other services.

[0098] The processor, the network interface and the memory may be interconnected through an internal bus, which may be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one bidirectional arrow is used in the figure, but it does not mean that there is only one bus or one type of bus.

[0099] The memory is used to store the program. Specifically, the program may include a program code, and the program code includes a computer operation instruction. The memory may include a memory and a non-volatile memory, and provides instructions and data to the processor.

[0100] The processor reads the corresponding computer program from the non-volatile memory into the memory and then runs it, forming a device for locating the specified user at the logical level. The processor executes the program stored in the memory and is specifically used to execute: Figure 3a-Figure 3b The method disclosed in the illustrated embodiment realizes the functions and beneficial effects of each method described in the foregoing method embodiments, which will not be described in detail here.

[0101] The above application Figure 3a-Figure 3bThe method disclosed in the illustrated embodiment can be applied to a processor or implemented by a processor. The processor may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by an integrated logic circuit of hardware in the processor or an instruction in the form of software. The above processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components. The methods, steps and logic block diagrams disclosed in the embodiments of the present application can be implemented or executed. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc. The steps of the method disclosed in the embodiments of the present application can be directly embodied as a hardware decoding processor for execution, or a combination of hardware and software modules in the decoding processor for execution. The software module can be located in a storage medium mature in the art such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc. The storage medium is located in the memory, and the processor reads the information in the memory and completes the steps of the above method in combination with its hardware.

[0102] The electronic device can also execute the methods described in the foregoing method embodiments, and realize the functions and beneficial effects of the methods described in the foregoing method embodiments, which will not be repeated here.

[0103] Of course, in addition to software implementation methods, the electronic device of the present application does not exclude other implementation methods, such as logic devices or a combination of software and hardware, etc. That is to say, the execution subject of the following processing flow is not limited to each logic unit, but can also be hardware or logic devices.

[0104] The present application also provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the computer program can be executed Figure 3a-Figure 3b The methods disclosed in the illustrated embodiments realize the functions and beneficial effects of the methods described in the preceding method embodiments, which will not be described in detail here.

[0105] The computer-readable storage medium includes a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0106] Furthermore, an embodiment of the present application also provides a computer program product, the computer program product comprising a computer program stored on a non-transitory computer-readable storage medium, the computer program comprising program instructions, and when the program instructions are executed by a computer, the following process is implemented: Figure 3a-Figure 3b The method disclosed in the illustrated embodiment realizes the functions and beneficial effects of each method described in the foregoing method embodiments, which will not be described in detail here.

[0107] In short, the above description is only a preferred embodiment of the present application and is not intended to limit the protection scope of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

[0108] The systems, devices, modules or units described in the above embodiments may be implemented by computer chips or entities, or by products with certain functions. A typical implementation device is a computer. Specifically, the computer may be, for example, a personal computer, a laptop computer, a cellular phone, a camera phone, a smart phone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.

[0109] Computer readable media include permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. Information can be computer readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer readable media does not include temporary computer readable media (transitory media), such as modulated data signals and carrier waves.

[0110] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0111] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the system embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

Claims

1. A method for calibrating optical power, characterized in that: A controller applied to an optical power calibration system, the method comprising: Adjusting the temperature of the incubator and the wavelength of the input optical signal of the erbium-doped fiber amplifier EDFA to obtain the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be tested at multiple different temperatures to be tested, wherein the EDFA is located in the incubator; The optical power is calibrated according to the signal optical power and the total optical power output by the EDFA corresponding to the different wavelengths to be measured under the multiple different temperatures to be measured.

2. The method according to claim 1, characterized in that The temperature of the temperature chamber and the wavelength of the input optical signal of the EDFA are adjusted to obtain the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be tested at multiple different temperatures to be tested, including: S1: adjusting the temperature of the temperature box to a first temperature value; S2: adjusting the input current of the last-stage pump laser in the EDFA to a first current value, and adjusting the input current of other pump lasers in the EDFA except the last-stage pump laser to a predetermined value, wherein the EDFA is a multi-stage structure; S3: adjusting the wavelength of the input optical signal of the EDFA to obtain the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at the first temperature value; Repeat steps S1-S3 until the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured at multiple different temperatures to be measured are obtained, and the first temperature value is one of the multiple temperatures to be measured.

3. The method according to claim 2, characterized in that The first current value is determined according to a current value corresponding to a second temperature value, a current value corresponding to a third temperature value, and the first temperature value, and the first temperature value is smaller than the second temperature value and larger than the third temperature value.

4. The method according to claim 3, characterized in that In the case where the EDFA has a three-stage structure, the process of determining the predetermined value corresponding to the second-stage pump laser in the EDFA includes: Adjusting the temperature of the temperature box to the second temperature value, and adjusting the incident light frequency of the laser to the worst gain frequency; According to the maximum carrying current of the first-stage pump laser in the EDFA, the input current of the first-stage pump laser is adjusted to a first predetermined value, and according to the maximum carrying current of the third-stage pump laser, the current of the third-stage pump laser is adjusted to a second current value; The input current of the second-stage pump laser is adjusted until the signal light power output by the EDFA meets the first gain requirement, and the current value corresponding to the second-stage pump laser under the first gain requirement is used as the second predetermined value corresponding to the second-stage pump laser.

5. The method according to claim 4, characterized in that The process of determining the current value corresponding to the third temperature value includes: Adjusting the temperature of the incubator to the third temperature value; adjusting the input current of the first-stage pump laser to the first predetermined value according to the maximum carrying current of the first-stage pump laser, and adjusting the input current of the second-stage pump laser to the second predetermined value; The input current value of the third-stage pump laser is adjusted until the signal light power output by the EDFA meets the second gain requirement, and the current value of the third-stage pump laser corresponding to the third temperature value under the second gain requirement is obtained.

6. The method according to claim 5, characterized in that The process of obtaining the current value corresponding to the third temperature value further includes: If the output signal optical power of the EDFA meets the second gain requirement, the input current of the third-stage pump laser is less than a third current value, and the current value of the third-stage pump laser at a third temperature value is determined to be the third current value, wherein the third current value is not less than 10% of the maximum carrying current of the third-stage pump laser.

7. The method according to claim 5, characterized in that The optical power calibration is performed according to the signal optical power and the total optical power output by the EDFA corresponding to the different wavelengths to be measured under the multiple different temperatures to be measured, including: Based on the current value corresponding to the second-stage pump laser under the first gain requirement, adjusting the wavelength of the input optical signal of the EDFA, and obtaining the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured under the second temperature value; Based on the current value of the third-stage pump laser corresponding to the third temperature value under the second gain requirement, adjusting the wavelength of the input optical signal of the EDFA, and obtaining the signal optical power and the total optical power output by the EDFA corresponding to different wavelengths to be measured under the third temperature value; The optical power is calibrated according to the second temperature value, the third temperature value and the signal optical power and the total optical power of the EDFA corresponding to different wavelengths to be measured under the multiple temperatures to be measured.

8. The method according to any one of claims 1 to 7, characterized in that Calibration of optical power is performed according to the signal optical power and the total optical power of the EDFA corresponding to different wavelengths to be measured under the multiple temperatures to be measured, including: The optical power calibration is performed according to the signal optical power and the total optical power of the EDFA corresponding to different wavelengths to be measured under the multiple temperatures to be measured, including at least one of the following: Calibrate the deviation relationship between the signal optical power and the total optical power according to the signal optical power and the total optical power of the EDFA corresponding to different wavelengths to be measured at the multiple temperatures to be measured; The correlation between the input current value of the final pump laser in the EDFA and the total optical power is calibrated according to the signal optical power and the total optical power of the EDFA corresponding to different wavelengths to be measured under the multiple temperatures to be measured.

9. The method according to claim 2, characterized in that The step of adjusting the temperature of the thermostat to a first temperature value comprises: adjusting the temperature of the thermostat; When the temperature value measured by the temperature sensor is the first temperature value, determining that the temperature of the incubator has been adjusted to the first temperature value; Wherein, the temperature sensor is arranged on the final stage pump laser.

10. The method according to any one of claims 1 to 7, characterized in that The method further comprises: During the calibration process, the optical signal output by the EDFA is input into an optical spectrum analyzer; Recording the signal optical power obtained by processing by the optical spectrum analyzer; Wherein, the spectrum analyzer is configured in integration mode.

11. An optical power calibration system, characterized in that: The optical power calibration system comprises: EDFA; A temperature box, wherein the EDFA is placed in the temperature box; A laser, used for providing signal light of different wavelengths to the EDFA; Controller; The controller is connected to the input end of each stage of the pump laser in the EDFA to adjust the input current of each stage of the pump laser, the controller is connected to the temperature box to adjust the temperature value of the temperature box, the controller is connected to the laser to adjust the wavelength of the optical signal input into the EDFA, and the controller is connected to the output of the EDFA to record the signal optical power and total optical power of the EDFA corresponding to different wavelengths to be measured at different temperatures to be measured, and calibrate the optical power according to the recording results.

12. The system according to claim 11, characterized in that The calibration system further comprises a temperature sensor, which is arranged in the last-stage pump laser in the EDFA and connected to the controller.

13. The system according to claim 11, characterized in that The calibration system further comprises a spectrum analyzer, and the spectrum analyzer is connected to the output end of the EDFA and the controller respectively.

14. An electronic device, characterized in that: The method comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein when the computer program is executed by the processor, the steps of the optical power calibration method according to any one of claims 1 to 10 are implemented.

15. A computer readable medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the optical power calibration method according to any one of claims 1 to 10 are implemented.

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