Remote sensor integration time estimation device and method

Abstract

The application discloses a remote sensing detector integration time estimation device and method, and relates to the field of remote sensing detection. In the device, narrow-band filters in a narrow-band filter group correspond to light-receiving surfaces of photoresistors fixed in a photoresistor array; the spectral passbands of the narrow-band filters in the narrow-band filter group are uniformly distributed in a remote sensing observation spectral range; the combination of the narrow-band filter group and the photoresistor array is fixed at the edge of an optical path of a remote sensing instrument; the photoresistor array is connected with a resistance value measurement circuit; the resistance value measurement circuit is used for measuring the resistance value of the photoresistor array; a remote sensing detector driving circuit is connected with the resistance value measurement circuit and the remote sensing detector respectively; and the remote sensing detector driving circuit is used for adjusting the integration time of the remote sensing detector in real time according to the resistance value. The application can improve the efficiency of detector integration time adjustment, quickly obtain available remote sensing data, and further improve the accuracy of the remote sensing detector.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of remote sensing detection, and in particular to a remote sensing detector integration time estimation device and method. BACKGROUND

[0002] With the development of research fields such as climate change monitoring and land resource management, higher requirements are put forward for the quality of remote sensing measurement data. Fine observation means high resolution of remote sensing observation information, for example, the difference in digital values between two adjacent pixels is 10, which can calculate the light intensity difference of the remote sensing observation target corresponding to the two pixels according to the detector integration time, the gain setting of the detector output signal, the uniformity of the detector pixel and other parameters, and thus the characteristics of the observation target can be inverted in the remote sensing image. When the remote sensing image data is oversaturated or undersaturated, even if the characteristics of the observation target are quite different, the difference in digital values of the remote sensing image output by the detector is very small, and the characteristics of the observation target cannot be distinguished, therefore, the oversaturation and undersaturation of the remote sensing image data is unacceptable, which represents the loss of remote sensing observation information. In order to avoid this situation, the integration time of the remote sensing detector is often adjusted in real time with the change of the observation target.

[0003] The existing means often uses a detector integration time adaptive algorithm to achieve adaptive adjustment of the remote sensing image by obtaining the current output data of the detector and using a pre-determined integration time adjustment algorithm. However, if the light intensity of the observation target is extremely strong or weak, the detector integration time adaptive algorithm of the existing means cannot extract effective adjustment information from the oversaturated and undersaturated image data, and it will take longer to adjust the integration time, and even after the observation target changes, the process is still not completed, and it is difficult to obtain usable data.

[0004] Therefore, based on the above problems, it is necessary to provide a new adjustment structure or method to provide effective information for the adjustment of the detector integration time when the light intensity of the observation target is extremely strong or weak, so that the detector integration time can be quickly adjusted, and usable remote sensing data can be obtained, thereby improving the accuracy of the remote sensing detector observation. SUMMARY

[0005] The purpose of the present application is to provide a remote sensing detector integration time estimation device and method, which can improve the efficiency of detector integration time adjustment, quickly obtain usable remote sensing data, and thus improve the accuracy of the remote sensing detector.

[0006] To achieve the above purpose, the present application provides the following solutions:

[0007] In a first aspect, the application provides a remote sensor integration time estimation device, which comprises a narrow-band filter set, a photoresistor array, a resistance measurement circuit, and a remote sensor driving circuit.

[0008] The narrow-band filters in the narrow-band filter set correspond to the light-receiving surfaces of the photoresistors in the photoresistor array; the spectral passbands of the narrow-band filters in the narrow-band filter set are uniformly distributed in a remote sensing spectral range.

[0009] The combination of the narrow-band filter set and the photoresistor array is fixed to the edge of the light path of a remote sensing instrument.

[0010] The photoresistor array is connected to the resistance measurement circuit; the resistance measurement circuit is used to measure the resistance values of the photoresistor array.

[0011] The remote sensor driving circuit is connected to the resistance measurement circuit and the remote sensor respectively; the remote sensor driving circuit is used to adjust the integration time of the remote sensor in real time according to the resistance values.

[0012] Optionally, the number of narrow-band filters in the narrow-band filter set is equal to the number of photoresistors in the photoresistor array.

[0013] Optionally, the number of narrow-band filters and the number of photoresistors are both greater than 2.

[0014] In a second aspect, the application provides a remote sensor integration time estimation method, which is applied to the remote sensor integration time estimation device and comprises the following steps.

[0015] Setting an initial integration time of a remote sensor;

[0016] Pre-setting a remote sensing instrument with a fixed combination of a narrow-band filter set and a photoresistor array to obtain a corresponding relationship between an actual light intensity and an output value of the remote sensor; the actual light intensity is determined according to the spectral passbands of the narrow-band filter set and the resistance values of the photoresistor array;

[0017] When the remote sensing instrument with the fixed combination of the narrow-band filter set and the photoresistor array is used for remote sensing observation, the actual light intensity at the current time is determined according to the integration time of the remote sensor at the current time and the resistance values of the photoresistor array;

[0018] The integration time of the remote sensor after updating is determined according to the initial integration time, the corresponding relationship, and the actual light intensity at the current time.

[0019] Optionally, the remote sensing instrument of the combination of the fixed narrow-band filter set and the photoresistor array is pre-set to obtain a corresponding relationship between the actual light intensity and the output value of the remote sensing detector, and specifically includes:

[0020] The remote sensing instrument of the combination of the fixed narrow-band filter set and the photoresistor array is placed in front of the calibration lamp, so that the incident light emitted by the calibration lamp is incident into the light-receiving surface of the corresponding photoresistor through the narrow-band filter; the calibration lamp has m light intensity levels;

[0021] Starting from the lowest light intensity of the calibration lamp, the resistance value of the photoresistor array and the output value of the remote sensing detector at each light intensity level are recorded;

[0022] The actual light intensity at the photoresistor array under the current light intensity level is determined according to the spectral passband of the narrow-band filter set and the resistance value of the corresponding photoresistor;

[0023] The corresponding relationship between the actual light intensity at the photoresistor array under the current light intensity level and the output value of the remote sensing detector under the corresponding light intensity level is determined.

[0024] Optionally, the actual light intensity at the photoresistor array under the current light intensity level is determined according to the spectral passband of the narrow-band filter set and the resistance value of the corresponding photoresistor, and specifically includes:

[0025] The formula is used to determine the actual light intensity P i at the photoresistor R j under the jth light intensity level of the calibration lamp;

[0026] wherein n is the number of photoresistors, k i is the light response coefficient of the ith photoresistor, R i，j is the resistance value of the photoresistor R i under the jth light intensity level.

[0027] Optionally, the corresponding relationship between the actual light intensity at the photoresistor array under the current light intensity level and the output value of the remote sensing detector under the corresponding light intensity level is determined, and specifically includes:

[0028] The formula is used to determine the corresponding relationship between the actual light intensity P at the photoresistor array under the current light intensity level and the output value DN of the remote sensing detector under the corresponding light intensity level;

[0029] wherein DN max and DN min respectively represent the output value of the remote sensing detector under overexposure and underexposure, P1 and P2 respectively represent the actual light intensity at the photoresistor array under overexposure and underexposure, a0, a1, a2..a rare constant coefficients fitted by actual light intensity and output value of remote sensing detector respectively, r is the number of constant coefficients, r≥1.

[0030] Optionally, the determining the updated integration time of the remote sensing detector according to the initial integration time, the correspondence and the actual light intensity at the current moment specifically comprises:

[0031] If the output image of the remote sensing detector is overexposed or underexposed, the updated integration time t of the remote sensing detector is determined by using the formula . next ;

[0032] Wherein, t0 is the initial integration time, P now is the actual light intensity at the current moment.

[0033] 9. The remote sensing detector integration time estimation method according to claim 8, wherein the actual light intensity P now at the current moment is determined by using the formula .

[0034] Wherein, R i，now is the resistance value of the i th photoresistor of the photoresistor array at the current moment.

[0035] According to the specific embodiments provided in the present application, the present application has the following technical effects:

[0036] The present application provides a remote sensing detector integration time estimation device and method, by fixing the narrowband filter in the narrowband filter group to the light receiving surface of the photoresistor in the photoresistor array, and then establishing a light intensity response structure for the rapid change scene of the remote sensing observation target according to the characteristics of the photoresistor and the narrowband filter; the photoresistor array is connected to the resistance value measurement circuit, and the resistance value measurement result is input into the remote sensing detector driving circuit to adjust the integration time of the remote sensing detector in real time; thereby making up for the information loss problem of the detector output image data in the case of over-saturation and under-saturation, making the detector integration time adjustment more rapid, thereby quickly obtaining the available remote sensing data, and can be widely applied in the field of remote sensing detection of rapid change of observation target. BRIEF DESCRIPTION OF DRAWINGS

[0037] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0038] Figure 1 It is an embodiment of the present application.

[0039] Figure 2 This is a schematic flowchart of a remote sensing detector integration time prediction method in one embodiment of this application. Detailed Implementation

[0040] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0041] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0042] In one exemplary embodiment, such as Figure 1 As shown, a remote sensing detector integration time prediction device is provided, the remote sensing detector integration time prediction device includes: narrowband filter groups A1, A2...A n Photoresistor arrays R1, R2...R n Resistance measurement circuit and remote sensing detector drive circuit;

[0043] The narrowband filters in the narrowband filter group are fixed to the light-receiving surfaces of the photoresistors in the photoresistor array; the number of narrowband filters in the narrowband filter group is equal to the number of photoresistors in the photoresistor array. Both the number of narrowband filters and the number of photoresistors are greater than 2. For example, narrowband filter A1 is fixed to the light-receiving surface of photoresistor R1, narrowband filter A2 is fixed to the light-receiving surface of photoresistor R2, and so on until narrowband filter A... n Fixed to photoresistor R n The light-receiving surface;

[0044] The narrowband filter group contains narrowband filters with spectral passbands λ1, λ2...λ1. n The narrowband filters are uniformly distributed within the remote sensing spectral range; the narrowband filters in the narrowband filter group correspond to the light-receiving surfaces of the photoresistors fixed in the photoresistor array; the spectral passbands of the narrowband filters in the narrowband filter group are uniformly distributed within the remote sensing spectral range; the i-th photoresistor represents the i-th spectral passband; the resistance changes of different photoresistors indicate the changes in light intensity of the input light within that spectral passband;

[0045] The combination of the narrowband filter group and the photoresistor array is fixed at the edge of the optical path of the remote sensing instrument, so that there are no non-transparent objects blocking the photoresistor array and the target observed by the remote sensing instrument.

[0046] The light-sensitive resistance array is connected with the resistance value measurement circuit; the resistance value measurement circuit is used for measuring the resistance value of the light-sensitive resistance array;

[0047] The remote sensing detector driving circuit is connected with the resistance value measurement circuit and the remote sensing detector respectively; the remote sensing detector driving circuit is used for adjusting the integration time of the remote sensing detector in real time according to the resistance value.

[0048] Based on the same inventive concept, the embodiment of the present application also provides a remote sensing detector integration time estimation method. The implementation scheme for solving the problem provided by the method is similar to the implementation scheme described in the above method, so the specific limitations in one or more remote sensing detector integration time estimation method embodiments provided below can refer to the limitations of the remote sensing detector integration time estimation device in the foregoing, which will not be described here.

[0049] In an exemplary embodiment, as shown in Figure 2 A remote sensing detector integration time estimation method is provided, which includes:

[0050] S101, setting an initial integration time t0 of a remote sensing detector;

[0051] S102, pre-setting a remote sensing instrument of a combination of a fixed narrowband filter group and the light-sensitive resistance array to obtain a corresponding relationship between an actual light intensity and an output value of the remote sensing detector; the actual light intensity is determined according to the spectral passband of the narrowband filter group and the resistance value at the light-sensitive resistance array;

[0052] S102 specifically includes:

[0053] S201, placing the remote sensing instrument of the combination of the fixed narrowband filter group and the light-sensitive resistance array in front of a calibration lamp, so that the incident light emitted by the calibration lamp passes through the narrowband filter and enters the light-receiving surface of the corresponding light-sensitive resistance; the calibration lamp has m light intensity levels;

[0054] S202, starting from the lowest light intensity of the calibration lamp, recording the resistance value of the light-sensitive resistance array and the output value of the remote sensing detector at each light intensity level;

[0055] Let the resistance value of the light-sensitive resistance R i The resistance value measurement result at the jth light intensity level is R i，j , the output value of the remote sensing detector at the jth calibration lamp light intensity level is DN j , wherein 1≤i≤n, 1≤j≤m;

[0056] S203, according to the spectral passband λ1, λ2……λ nThe actual light intensity at the photosensitive resistance array under the current energy level light intensity is determined according to the resistance value of the corresponding photosensitive resistance;

[0057] The actual light intensity P at the photosensitive resistance R under the jth energy level light intensity is determined according to the formula i j ;

[0058] Wherein, n is the number of photosensitive resistances, k i is the light response coefficient of the ith photosensitive resistance, R i，j is the resistance value of the photosensitive resistance R i under the jth energy level light intensity.

[0059] S204, the corresponding relationship is determined according to the actual light intensity at the photosensitive resistance array under the current energy level light intensity and the output value of the remote sensing detector under the corresponding energy level light intensity.

[0060] The corresponding relationship between the actual light intensity P at the photosensitive resistance array under the current energy level light intensity and the output value DN of the remote sensing detector under the corresponding energy level light intensity is determined according to the formula

[0061] Wherein, DN max , DN min respectively represent the output value of the remote sensing detector under overexposure and underexposure, P1, P2 respectively represent the actual light intensity at the photosensitive resistance array under overexposure and underexposure, a0, a1, a2..a r are constant coefficients obtained by fitting the actual light intensity and the output value of the remote sensing detector, r is the number of constant coefficients, r≥1.

[0062] S103, when the remote sensing instrument using the combination of the fixed narrowband filter group and the photosensitive resistance array is used for remote sensing observation, the actual light intensity at the current time is determined according to the integration time of the remote sensing detector at the current time and the resistance value of the photosensitive resistance array;

[0063] S104, the updated integration time of the remote sensing detector is determined according to the initial integration time, the corresponding relationship and the actual light intensity at the current time.

[0064] If the output image of the remote sensing detector is overexposed or underexposed, the updated integration time t next of the remote sensing detector is determined according to the formula

[0065] Wherein, t0 is the initial integration time, P now is the actual light intensity at the current time.

[0066] The actual light intensity P at the current time is determined according to the formula now ;​​​​​

[0067] wherein R i，now is the resistance value of the i-th photoresistor of the photoresistor array at the current time.

[0068] The following is illustrated by specific examples, wherein the photoresistor array R1, R2, R3, R4 and the narrow-band filter group A1, A2, A3, A4 are composed; the photoresistor response spectrum in the photoresistor array covers the 1.3 μm-3 μm spectral range interval of remote sensing observation; the spectral passbands of the narrow-band filters in the narrow-band filter group are uniformly distributed in the remote sensing observation spectral range, and the spectral passbands of the narrow-band filter groups A1, A2, A3, A4 are 1.3 μm-1.7 μm, 1.8 μm-2.2 μm, 2.3 μm-2.7 μm, 2.6 μm-3 μm, respectively;

[0069] First, the initial integration time of the remote sensing detector is set to 300 ms, the combination of the narrow-band filter group and the photoresistor array is placed in front of the calibration lamp with adjustable light intensity, and the calibration lamp has a total of 10 light intensity levels;

[0070] Then, starting from the lowest light intensity of the calibration lamp, the resistance value measurement results of the photoresistor array R1, R2, R3, R4 and the digital value output by the remote sensing detector at each light intensity level are recorded, and the photoresistor R i The resistance value measurement result at the j-th calibration lamp light intensity level is R i，j The output value of the remote sensing detector at the j-th level is DN j , wherein 1≤i≤4, 1≤j≤10;

[0071] And according to the spectral passbands λ1, λ2……λ4 of the narrow-band filter group, the actual light intensity P j at the integration estimation structure of the remote sensing detector at the j-th level of the calibration lamp is calculated, and the calculation formula is as follows:

[0072] P j = 1.85R1+6.71R2+2.84R3+3.95R4;

[0073] Wherein the photoresponse coefficient of the photoresistor is obtained by calibration test;

[0074] After that, a 14-bit analog-to-digital converter is used for remote sensing data acquisition, and the maximum digital value output of the analog-to-digital converter is 2 14-1=16383, the minimum digital value output is 0, the actual light intensity at the remote sensing detector integration estimation structure under overexposure and underexposure is P1, P2 respectively, the value of constant coefficient a is obtained according to the fitting of the actual light intensity at the remote sensing detector integration estimation structure and the digital value output by the remote sensing detector, and the corresponding relationship between the actual light intensity P at the remote sensing detector integration estimation structure and the digital value output by the remote sensing detector is established:

[0075]

[0076] Finally, remote sensing observation is carried out using a remote sensing instrument, the current remote sensing detector integration time is 400 ms, at this time the remote sensing detector output image is overexposed, that is, the actual measured digital output value is 16383, at this time the resistance values of the resistance array are R1=9, R2=31, R3=5, R4=8, and the actual light intensity P at the position is calculated now :

[0077] P now =270.46;

[0078] The new remote sensing detector integration time t next :

[0079] t next =110.37 ms;

[0080] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (Read-Only Memory, ROM), magnetic tape, floppy disk, flash memory, optical storage, high-density embedded non-volatile memory, resistive memory (ReRAM), magnetoresistive random access memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric memory (Ferroelectric Random Access Memory, FRAM), phase change memory (Phase Change Memory, PCM), graphene memory, etc. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, etc. As an illustration but not limitation, RAM can be in various forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), etc.

[0081] The database involved in the embodiments provided in the present application can include at least one of a relational database and a non-relational database. The non-relational database can include a distributed database based on a blockchain, etc., without being limited thereto. The processor involved in the embodiments provided in the present application can be a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., without being limited thereto.

[0082] In the present application, all actions of obtaining signals, information or data are performed in accordance with the corresponding data protection regulations and policies of the country where the device is located, and with the authorization of the owner of the corresponding device.

[0083] The technical features of the above embodiments can be combined arbitrarily. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, but as long as the combination of the technical features does not exist, it should be considered as the scope of the present application.

[0084] The principles and implementation manners of the present application are described herein by using specific examples, and the above examples are only used to help understand the method of the present application and its core idea; meanwhile, for those skilled in the art, according to the idea of the present application, the specific implementation manners and application ranges will have changes. In conclusion, the content of the specification should not be understood as a limitation of the present application.

Claims

1. A method for predicting the integration time of a remote sensing detector, characterized in that, The method for estimating the integration time of the remote sensing detector includes: Set the initial integration time for the remote sensing detector; The remote sensing instrument, which is a combination of a fixed narrowband filter group and a photoresistor array, is pre-set to obtain the correspondence between the actual light intensity and the output value of the remote sensing detector; the actual light intensity is determined based on the spectral passband and resistance value of the narrowband filter group at the photoresistor array. When a remote sensing instrument using a combination of a fixed narrowband filter group and the photoresistor array performs remote sensing observation, the actual light intensity at the current moment is determined based on the integration time of the remote sensing detector and the resistance value of the photoresistor array at the current moment. The updated integration time of the remote sensing detector is determined based on the initial integration time, the correspondence, and the actual light intensity at the current moment; The remote sensing instrument, which combines a fixed narrowband filter group and a photoresistor array, is pre-set to determine the correspondence between the actual light intensity and the output value of the remote sensing detector. Specifically, this includes: A remote sensing instrument consisting of a fixed narrowband filter group and the photoresistor array is placed in front of a calibration lamp, so that the incident light emitted by the calibration lamp passes through the narrowband filter and enters the light-receiving surface of the corresponding photoresistor; the calibration lamp has a total of m light intensity levels; Starting from the lowest light intensity of the calibration lamp, record the resistance value of the photoresistor array and the output value of the remote sensing detector at each energy level light intensity. The actual light intensity at the photoresistor array under the current energy level light intensity is determined based on the spectral passband of the narrowband filter group and the resistance value of the corresponding photoresistor. The correspondence is determined by the actual light intensity at the photoresistor array under the current energy level light intensity and the output value of the remote sensing detector under the corresponding energy level light intensity. The process of determining the actual light intensity at the photoresistor array under the current energy level light intensity based on the spectral passband of the narrowband filter group and the corresponding resistance value of the photoresistor specifically includes: Using formula Determine the photoresistor R under the light intensity of the j-th energy level of the calibration lamp. i The actual light intensity P at the location j ; Where n is the number of photoresistors, k i R is the photoresponse coefficient of the i-th photoresistor. i，j Photoresistor R i The resistance value at the light intensity of the j-th energy level; The process of determining the correspondence between the actual light intensity at the photoresistor array under the current energy level and the output value of the remote sensing detector under the corresponding energy level specifically includes: Using formula Determine the correspondence between the actual light intensity P at the photoresistor array under the current energy level light intensity and the output value DN of the remote sensing detector under the corresponding energy level light intensity; Among them, DN max DN min P0, P1, P2 represent the output values ​​of the remote sensing detector under overexposure and underexposure conditions, respectively, and P1 and P2 represent the actual light intensity at the photoresistor array under overexposure and underexposure conditions, respectively. r These are the constant coefficients obtained by fitting the actual light intensity to the output value of the remote sensing detector, where r is the number of constant coefficients and r≥1; The process of determining the updated integration time of the remote sensing detector based on the initial integration time, the correspondence, and the actual light intensity at the current moment specifically includes: If the image output by the remote sensing detector is overexposed or underexposed, use the formula Determine the integration time t of the updated remote sensing detector next ; Where t0 is the initial integration time, P now This represents the actual light intensity at the current moment.

2. The method for predicting the integration time of a remote sensing detector according to claim 1, characterized in that, Using formula Determine the actual light intensity P at the current moment. now ; Among them, R i，now Let be the resistance value of the i-th photoresistor in the photoresistor array at the current moment.

3. A remote sensing detector integration time prediction device, applied to the remote sensing detector integration time prediction method according to any one of claims 1-2, characterized in that, The remote sensing detector integration time prediction device includes: a narrowband filter group, a photoresistor array, a resistance measurement circuit, and a remote sensing detector driving circuit. The narrowband filters in the narrowband filter group correspond to the light-receiving surfaces of the photoresistors fixed in the photoresistor array; the spectral passbands of the narrowband filters in the narrowband filter group are uniformly distributed in the remote sensing observation spectral range. The combination of the narrowband filter group and the photoresistor array is fixed at the optical path edge of the remote sensing instrument; The photoresistor array is connected to the resistance measurement circuit; the resistance measurement circuit is used to measure the resistance value of the photoresistor array. The remote sensing detector drive circuit is connected to the resistance measurement circuit and the remote sensing detector respectively; the remote sensing detector drive circuit is used to adjust the integration time of the remote sensing detector in real time according to the resistance value.

4. The remote sensing detector integration time prediction device according to claim 3, characterized in that, The number of narrowband filters in the narrowband filter group is equal to the number of photoresistors in the photoresistor array.

5. The remote sensing detector integration time prediction device according to claim 4, characterized in that, The number of narrowband filters and the number of photoresistors are both greater than 2.

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