All-solid-state fringe projection device and 3D structured light measurement system

Abstract

The embodiment of the application discloses a kind of full solid state stripe projection device and 3D structure light measurement system, it is related to optical measurement field.The full solid state stripe projection device of the application, comprising: light source and optical projection system;Light source includes VCSEL array, VCSEL array includes multiple VCSEL line groups, each VCSEL line group includes at least one VCSEL light emitting hole, each VCSEL light emitting hole is used to emit laser signal;Light source is used for driving each VCSEL line group in multiple VCSEL arrays to open or close according to pattern type, and laser signal is emitted based on all VCSEL line groups opened;Optical projection system is used for collimating processing to the laser signal from light source, transverse modulation and longitudinal modulation are carried out to the light field of laser signal, and processed laser signal is projected onto the object to be measured to form stripe pattern, proposed full solid state stripe projection device shows significant advantage in reliability, light weight and miniaturization, signal-to-noise ratio and measurement accuracy, environmental light interference ability, energy utilization efficiency, frame rate and cost etc.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of optical measurement, in particular to a full solid-state fringe projection device and a 3D structured light measurement system. BACKGROUND

[0002] As a cutting-edge non-contact optical three-dimensional measurement method, fringe structured light technology has shown great potential and value in scientific research and industrial application fields in recent years. This technology ingeniously combines optical measurement principles and advanced image processing algorithms, and through projecting a series of carefully designed fringe patterns with light and dark alternation onto the surface of the measured object, it realizes high-precision three-dimensional reconstruction of the object's surface topography. These fringes will deform when interacting with the object's surface, and the specific form of deformation, including bending, stretching or compression of the fringes, directly maps the three-dimensional geometric features of the object's surface. Subsequently, high-resolution image capture devices are used to capture images of these deformed fringes, and through complex image processing and analysis algorithms, the three-dimensional topography model of the object can be accurately analyzed and reconstructed.

[0003] The advantages of fringe structured light technology are obvious, mainly in the following aspects: first, its measurement accuracy is extremely high, which can meet the precise measurement needs of small deformations or complex surface structures; second, as a non-contact measurement technology, it avoids the physical damage that may be caused by traditional contact measurement, and also broadens the measurement range, suitable for objects of various shapes and materials; third, this technology can realize full-field measurement, i.e. three-dimensional data of the entire measurement area can be obtained at once, greatly improving the measurement efficiency.

[0004] Due to the above advantages, fringe structured light technology has been widely applied in many fields. In the industrial manufacturing field, it has become an indispensable tool for quality control and precision manufacturing, used for accurately detecting the size, shape accuracy and surface defects of parts; in the biomedical field, this technology provides strong support for human tissue morphology research, medical diagnosis and the development of personalized treatment plans, such as skin lesion analysis, tooth arrangement evaluation and bone structure reconstruction; in addition, in the field of cultural heritage protection and digital recording, fringe structured light technology also plays a key role, by accurately capturing and reconstructing the three-dimensional information of cultural relics surfaces, it opens up new ways for the digital archiving, restoration and display of cultural heritage.

[0005] However, despite the numerous advantages of striped structured light technology, the design and manufacturing of its core component—the striped projection device—still face many challenges. Currently, mainstream striped projection devices on the market are mainly based on DLP (Digital Light Processing) projectors or MEMS (Micro-Electro-Mechanical Systems) galvanometer scanning technology. While DLP projectors can provide high-quality image output, their system structure is relatively complex, their size is large, and their energy consumption is high, increasing the cost and maintenance difficulty of the equipment. While MEMS galvanometer-based projection devices have achieved miniaturization and weight reduction to some extent, their projection efficiency and light energy utilization still need improvement due to limitations in the scanning speed and accuracy of the galvanometer. These problems not only limit the further popularization and optimization of striped structured light technology but also hinder its application in more fields, especially in scenarios with strict requirements on device size and power consumption.

[0006] Therefore, developing a stripe projection device with a simpler structure, smaller size, higher power, better energy efficiency, and more reasonable cost has become the key to promoting the continuous development of stripe structured light technology. Summary of the Invention

[0007] This application provides an all-solid-state stripe projection device and a 3D structured light measurement system, which can solve the problems of complex structure and large size of existing stripe projection devices. The technical solution is as follows:

[0008] In a first aspect, embodiments of this application provide a light source and an optical projection system; the light source includes a VCSEL array, the VCSEL array includes a plurality of VCSEL line groups, each VCSEL line group includes at least one VCSEL light-emitting aperture, and each VCSEL light-emitting aperture is used to emit a laser signal;

[0009] The light source is used to drive each VCSEL line group in the multiple VCSEL arrays to turn on or off according to the pattern type, and to emit laser signals based on all the turned-on VCSEL line groups.

[0010] The optical projection system is used to collimate the laser signal from the light source, modulate the light field of the laser signal laterally and longitudinally, and project the processed laser signal onto the object to be tested to form a stripe pattern.

[0011] Secondly, embodiments of this application provide a 3D structured light measurement system, including: at least one camera and the all-solid-state stripe projection device.

[0012] The beneficial effects of the technical solutions provided in some embodiments of this application include at least the following:

[0013] One, high reliability: The full solid-state fringe projection device does not contain any moving parts, and completely relies on solid-state electronic components and optical components to achieve functions. This design greatly reduces the risk of failure caused by mechanical movement, improves the reliability and stability of the device. Therefore, the device can maintain good performance in long-term operation and complex environment.

[0014] Two, lightweight and miniaturization: The structure design of the fringe projection device is simple and clear, only including light source (VCSEL array) and optical projection system. This simple structure makes the device greatly reduce the weight and size while achieving the function. This has great advantages for application scenarios that require portability or limited space.

[0015] Three, high signal-to-noise ratio and measurement accuracy: Using the high brightness characteristics of VCSEL, the device can emit high-intensity laser signals. This not only improves the contrast of the fringe pattern, but also significantly increases the signal-to-noise ratio of the fringe projection. The high signal-to-noise ratio fringe pattern can more accurately reflect the surface topography of the measured object, thereby improving the measurement accuracy of the system.

[0016] Four, strong anti-environmental light interference ability: By selecting VCSEL in the infrared band and using optical filters, the device can significantly reduce the interference of ambient light on the fringe pattern. This design allows the device to maintain good measurement results in outdoor or complex light environments, expanding the application scenarios.

[0017] Five, high energy utilization efficiency: The laser energy emitted by VCSEL is fully utilized for fringe pattern projection, with no energy loss or waste. This high-efficiency energy utilization method not only improves the energy efficiency of the device, but also reduces the operating cost.

[0018] Six, high frame rate: VCSEL has extremely high response speed and can quickly turn on or off to form a fringe pattern. This feature allows the device to achieve high-frame-rate fringe projection, meeting the needs of fast measurement or dynamic measurement.

[0019] Seven, low cost: The fringe projection device only uses VCSEL and basic optical components, without introducing complex or expensive mechanical structures. This simple design effectively controls the cost of the device, making it low-cost. At the same time, due to the mass production capability of VCSEL and optical components, the cost of the device is expected to be further reduced in the future. BRIEF DESCRIPTION OF DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or prior art description will be briefly introduced. Obviously, the drawings in the following description only constitute some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor on the basis of these drawings.

[0021] Figure 1 is a structural schematic diagram of a full solid-state fringe projection device provided by the embodiments of the present application;

[0022] Figure 2 is a structural schematic diagram of a VCSEL array provided by the embodiments of the present application;

[0023] Figure 3 is a schematic diagram of the arrangement of VCSEL light emitting holes in a VCSEL line group provided by the embodiments of the present application;

[0024] Figure 4 is a structural schematic diagram of an optical projection system provided by the present application;

[0025] Figure 5 is a schematic diagram of the VCSEL array configuration and its projection process for realizing an eight-fringe four-step phase-shift fringe pattern projection provided by the present application;

[0026] Figure 6 is a schematic diagram of complementary Gray code projection provided by the present application. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solutions and advantages of the present application more clear, the embodiments of the present application will be further described in detail below with reference to the drawings.

[0028] Figure 1 A structural schematic diagram of a full solid-state fringe projection device that can be applied to the present application is shown, which includes a light emitting source and an optical projection system. The light emitting source includes a VCSEL array, which is a VCSEL light emitting hole array composed of a single or multiple VCSEL chips.

[0029] Referring to Figure 2 The structural schematic diagram of the VCSEL array is shown, which includes multiple VCSEL line groups, each of which includes at least one VCSEL light emitting hole, each of which is used to emit a laser signal. The light emitting source is used to drive each VCSEL line group in the multiple VCSEL arrays to be turned on or off according to the pattern type, and to emit a laser signal based on all the turned-on VCSEL line groups.

[0030] The core of the light-emitting light source is a VCSEL (Vertical Cavity Surface Emitting Laser) array. The array is composed of multiple VCSEL line groups, and each line group contains at least one VCSEL light-emitting hole.

[0031] Each VCSEL light-emitting hole can independently emit laser signals, which will be modulated and projected onto the object to be measured in the subsequent process. According to a specific pattern type (such as phase-shifted fringe, binary code, Gray code, etc.), the control system will accurately drive each VCSEL line group in the VCSEL array to turn on or off. The encoding method not only determines the style of the fringe pattern, but also directly affects the accuracy and efficiency of the subsequent three-dimensional reconstruction. Under the control of the pattern type, all the VCSEL line groups that are turned on will emit laser signals at the same time, and the laser signals will then be received and processed by the optical projection system.

[0032] The optical projection system is used to collimate the laser signals from the light-emitting light source, transversely and longitudinally modulate the light field of the laser signals, and project the processed laser signals onto the object to be measured to form a fringe pattern.

[0033] Firstly, the optical projection system collimates the laser signals from the light-emitting light source. The purpose of this step is to ensure that the laser signals have consistent propagation direction and divergence angle, thereby improving the clarity of the fringe pattern projected onto the object to be measured.

[0034] Transverse modulation refers to the modulation of the transverse energy distribution of the light field to change the intensity distribution of the laser signals in the cross section. In this technical solution, the purpose of transverse modulation is to make the transverse distribution of the light field close to a cosine function, forming a fringe pattern with alternating bright and dark areas. Transverse modulation is usually achieved through optical elements such as cylindrical lenses, wave mirrors, and line homogenizers. These elements can modulate the wavefront of the laser signals, thereby introducing a specific intensity distribution in the cross section. By accurately designing and manufacturing the optical elements, the light field distribution after transverse modulation can be ensured to conform to the expected cosine function shape. This helps to improve the contrast and clarity of the fringe pattern, thereby improving the accuracy of three-dimensional reconstruction.

[0035] Longitudinal modulation refers to the modulation of the longitudinal energy distribution of the light field to change the energy distribution of the laser signals in the propagation direction. In this technical solution, the purpose of longitudinal modulation is to make the laser energy emitted by each VCSEL light-emitting hole in the VCSEL line group expand longitudinally into a light ray and superimpose to increase the energy of the light ray. Longitudinal modulation can be achieved through cylindrical lenses, wave mirrors, and line homogenizers to expand and superimpose the longitudinal energy. After longitudinal modulation, the laser energy emitted by each VCSEL light-emitting hole will expand longitudinally and superimpose together to form a light ray with higher energy. This helps to improve the brightness and contrast of the fringe pattern projected onto the object to be measured, thereby enhancing the reliability and accuracy of three-dimensional reconstruction.

[0036] In some embodiments of the present application, referring to Figure 3 VCSEL light-emitting hole arrangement in the VCSEL line group shown in the schematic diagram, when the VCSEL line group includes multiple VCSEL light-emitting holes, the arrangement of the multiple VCSEL light-emitting holes includes but is not limited to single-column arrangement, staggered arrangement, inclined arrangement, or multi-column arrangement.

[0037] Single-column arrangement refers to that all VCSEL light-emitting holes are arranged along a straight line. Single-column arrangement is simple and clear, but there is only one column, and the upper limit of the light energy that can be achieved is low. At the same time, there is no transverse distribution of light-emitting holes, and the transverse energy distribution regulation of the light field can only be achieved by adjusting the design of the transverse modulation unit, which brings challenges to optical design.

[0038] Staggered arrangement refers to that the VCSEL light-emitting holes are arranged alternately in the transverse direction, forming a layout similar to a chessboard. Staggered arrangement can improve the arrangement density of the light-emitting holes in the column direction. By designing the transverse stagger of the staggered light-emitting holes, the transverse width of the projected fringe can be affected, and in combination with the transverse modulation unit, more flexible transverse energy distribution regulation of the fringe can be achieved.

[0039] Inclined arrangement refers to that the VCSEL light-emitting holes are arranged along a diagonal line or a curve. Inclined arrangement can improve the arrangement density of the light-emitting holes in the column direction. Compared with staggered arrangement, it can achieve wider fringe projection.

[0040] Multi-column arrangement refers to arranging multiple VCSEL light-emitting holes into multiple columns. Multi-column arrangement is used to improve the energy of the line group and significantly improve the measurement accuracy. It can be combined with staggered arrangement and inclined arrangement to improve the arrangement density of the light-emitting holes in the column direction, and in combination with the transverse modulation unit, more flexible transverse energy distribution regulation of the fringe can be achieved.

[0041] In some embodiments of the present application, referring to Figure 4 The structure schematic diagram of the optical projection system shown in the structure schematic diagram of the optical projection system, the optical projection system includes a collimation unit, a transverse modulation unit, and a longitudinal modulation unit.

[0042] The collimation mirror includes a collimation mirror composed of at least one lens, the transverse modulation unit includes a cylindrical mirror, a wave mirror, or a homogenizing plate, and the longitudinal modulation unit includes a cylindrical mirror, a wave mirror, or a homogenizing plate.

[0043] The collimation unit collimates the light field emitted by the VCSEL array to ensure that the light rays are projected to the target area in a parallel or approximately parallel state. It can be realized by a collimation mirror composed of a single or multiple lenses. The selection and design of the lenses need to be determined according to the light-emitting characteristics of the VCSEL array, the projection distance, and the size of the target area.

[0044] The transverse modulation unit modulates the transverse energy of the light field, making the transverse distribution of the light field close to a cosine function. It can be realized by a cylindrical lens, a wave lens or a homogenizing sheet. The cylindrical lens focuses or diverges light through its curved surface design, thereby forming a specific intensity distribution in the transverse direction. The wave lens introduces phase changes through its wavy surface to achieve transverse modulation of the light field. The homogenizing sheet scatters and redistributes light through its internal microstructure to achieve transverse modulation.

[0045] The longitudinal modulation unit modulates the longitudinal energy of the light field, making the light-emitting hole energy in the VCSEL line group expand into a stripe along the longitudinal direction, and the stripe energy increases after superposition. It can also be realized by a cylindrical lens, a wave lens or a homogenizing sheet, but the modulation direction is different from that of the transverse modulation unit. By adjusting the position, angle and focal length of the optical element, the longitudinal energy of the light field can be accurately controlled.

[0046] It should be noted that the order of the collimation unit, the transverse modulation unit and the longitudinal modulation unit in the optical system can be flexibly adjusted.

[0047] In addition to the above designs, there are many optical design schemes that achieve the same purpose:

[0048] 1. Merge the transverse and longitudinal modulation units: use a single cylindrical lens, wave lens or homogenizing sheet to simultaneously realize transverse and longitudinal modulation. The optical element needs to be precisely designed and manufactured to ensure that it can simultaneously meet the requirements of transverse and longitudinal modulation.

[0049] 2. Single element realizes multiple functions: use a single homogenizing sheet or super surface element to simultaneously realize the purposes of collimation, transverse modulation and longitudinal modulation. Super surface element is a new type of optical element that precisely controls the light field through its micro-nano structure on the surface. This design can greatly simplify the structure of the optical system, reduce cost and complexity.

[0050] 3. Cancel the transverse modulation unit: use the rotation angle between the longitudinal arrangement of the VCSEL line group and the longitudinal modulation unit for transverse modulation. By adjusting the arrangement of the VCSEL line group and the angle of the longitudinal modulation unit, the effect of transverse modulation can be achieved without adding additional optical elements. However, this design requires precise calculation and optimization of the overall layout of the VCSEL array and the optical system.

[0051] In summary, the design and implementation of the optical projection system have multiple possibilities, and the most suitable solution can be selected according to the specific application requirements and cost considerations. In actual application, the performance of the optical system needs to be tested and evaluated in detail to ensure that it can meet the expected measurement and reconstruction accuracy requirements.

[0052] Referring to Figure 5 the drawings,Figure 5 A VCSEL array configuration and its projection process for achieving an eight fringe four-step phase-shift fringe pattern projection are demonstrated. The diagram aims to visually demonstrate how the desired phase fringe pattern projection is achieved by precisely controlling different line groups in the VCSEL array.

[0053] Figure 5 In this configuration, the VCSEL array is divided into 32 VCSEL line groups, which are arranged along the horizontal direction. Each line group contains at least one VCSEL emitting aperture for emitting a laser signal. For ease of illustration, Figure 5 The line groups in are sequentially numbered from 1 to 32. These numbers help to precisely specify which line groups are turned on at a specific phase in the subsequent description.

[0054] When projecting a 0° phase fringe, Figure 5 The 1st, 5th, 9th,..., 29th column line groups (actually an arithmetic sequence) are turned on in. After being processed by the optical projection system, these turned-on line groups form column fringes with a nearly cosine-shaped transverse energy distribution and a phase of 0°.

[0055] When projecting a 90° phase fringe, the 2nd, 6th, 10th,..., 30th column line groups are turned on. Similar to the 0° phase projection, these line groups form a fringe pattern that, after being processed by the optical projection system, presents cosine-shaped column fringes with a phase difference of 90°.

[0056] When projecting a 180° phase fringe, the 3rd, 7th, 11th,..., 31st column line groups are activated. The fringe pattern produced by these line groups is the same as the 0° phase fringe pattern, but with a phase difference of 180°, i.e., the light and dark distribution of the fringes is reversed.

[0057] Finally, when projecting a 270° phase fringe, the 4th, 8th, 12th,..., 32nd column line groups are turned on. Similar to the 90° phase projection, the fringe pattern formed by these line groups has a phase difference of 270°, i.e., the light and dark distribution is reversed again relative to the 90° phase fringe.

[0058] Figure 5 Through simple diagrams and clear explanations, it is demonstrated how to achieve the projection of an eight fringe four-step phase-shift fringe pattern by precisely controlling the line groups in the VCSEL array. This projection method not only improves the accuracy and efficiency of three-dimensional reconstruction, but also provides strong support for the accurate measurement of complex object surfaces.

[0059] Figure 6 A diagram showing how to achieve complementary Gray code projection by recombining the on and off states of VCSEL line groups is presented. The diagram aims to illustrate how to precisely control the line groups in the VCSEL array to produce a complementary Gray code fringe pattern with uniform energy distribution.

[0060] Figure 6 VCSEL array in the VCSEL array is divided into multiple VCSEL line groups, which are arranged along the horizontal direction and numbered for easy control. Each line group contains at least one VCSEL light emitting hole for emitting a laser signal under certain conditions. Gray code is a binary coding system in which only one binary bit is different between two adjacent values. This feature allows gray code to reduce errors when converting digital systems. In this scheme, by precisely controlling the opening and closing of the line groups in the VCSEL array, a fringe pattern with gray code characteristics can be projected.

[0061] Specific projection process:

[0062] First-level gray code: open the 18th, 20th,..., 32nd line groups to form a first-level gray code fringe pattern.

[0063] Second-level gray code: open the 10th, 12th,..., 24th line groups to form a second-level gray code fringe pattern.

[0064] Third-level gray code: open the 6th, 8th, 10th, 12th, 22nd, 24th, 26th, 28th line groups to form a third-level gray code fringe pattern. Note that there is a combination of interval opening and continuous opening here, which reflects the flexibility of gray code encoding.

[0065] Fourth-level gray code: open the 4th, 6th, 12th, 14th, 20th, 22nd, 28th, 30th line groups to form a fourth-level gray code fringe pattern.

[0066] Since the cosine fringe energy with a phase difference of 180° is complementary, by precisely controlling the opening and closing of the line groups, a relatively uniform complementary gray code energy distribution can be obtained. The uniformity of this energy distribution helps to improve the robustness of the four-step phase shift fringe phase unwrapping, as well as the accuracy and stability of three-dimensional reconstruction or object surface measurement.

[0067] Figure 6 Although only four examples of gray code projection are shown, the present scheme is not limited to these specific fringe projections. By adjusting the configuration of the VCSEL array and the design of the optical projection system, different numbers of fringes, phase shifts, and other types of gray code or binary code fringe patterns can be projected. This scalability and flexibility makes the present scheme adaptable to a variety of application scenarios and needs, providing strong support for three-dimensional reconstruction, object surface measurement, and other fields.

[0068] The all-solid-state fringe projection device of the present application has the following technical effects:

[0069] The all-solid-state fringe projection device does not contain any moving parts, and relies entirely on solid-state electronic components and optical components to achieve functions. This design greatly reduces the risk of failure due to mechanical movement, improving the reliability and stability of the device. Therefore, the device can maintain good performance in long-term operation and complex environments.

[0070] The fringe projection device has a simple and clear structural design, only including a light source (VCSEL array) and an optical projection system. This simple structure allows the device to greatly reduce weight and size while achieving functionality. This has great advantages for applications that require portability or limited space.

[0071] Using the high brightness characteristics of VCSEL, the device can emit high-intensity laser signals. This not only improves the contrast of the fringe pattern, but also significantly increases the signal-to-noise ratio of the fringe projection. The high signal-to-noise ratio fringe pattern can more accurately reflect the surface topography of the object being measured, thereby improving the measurement accuracy of the system.

[0072] By selecting VCSEL in the infrared band and using a filter, the device can significantly reduce the interference of ambient light on the fringe pattern. This design allows the device to maintain good measurement results in outdoor or complex light environments, expanding the application scenarios.

[0073] The laser energy emitted by the VCSEL is fully utilized for fringe pattern projection, with no energy loss or waste. This efficient energy utilization not only improves the energy efficiency of the device, but also reduces operating costs. VCSEL has extremely high response speed and can quickly turn on or off to form a fringe pattern. This feature allows the device to achieve high-frame-rate fringe projection, meeting the needs of fast or dynamic measurement.

[0074] The fringe projection device only uses VCSEL and basic optical components, without introducing complex or expensive mechanical structures. This simple design effectively controls the cost of the device, making it cost-effective. At the same time, due to the mass production capabilities of VCSEL and optical components, the cost of the device is expected to be further reduced in the future.

[0075] In summary, the all-solid-state fringe projection device proposed in this technical solution has significant advantages in reliability, lightweight and miniaturization, signal-to-noise ratio and measurement accuracy, environmental light interference resistance, energy utilization efficiency, frame rate, and cost. These advantages make the device have a wide application prospect in the fields of three-dimensional measurement, object recognition, intelligent manufacturing, etc.

[0076] Furthermore, the all-solid-state stripe projection device proposed in this solution integrates an advanced VCSEL (Vertical-Cavity Surface-Emitting Laser) array and a precision optical projection system, enabling efficient and stable projection of stripe patterns with specific coding characteristics. This device not only features high brightness and high energy efficiency but is also compact and lightweight, facilitating integration into various 3D measurement systems.

[0077] The monocular 3D measurement system consists of a camera and an all-solid-state fringe projection device. The camera and fringe projection device are spaced a certain distance apart, forming a baseline for triangulation, which is crucial for depth measurement. The fringe projection device projects multiple fringe patterns with unique spatial codes onto the surface of the object being measured. The camera captures fringe images of the object's surface, which contain spatial code position differences caused by the object's shape. By matching and comparing the pre-recorded planar spatial code distribution with the spatial code of the object, the object's depth information can be calculated. Furthermore, the measurement accuracy is improved by combining the calibration relationship between the camera, fringe projection device, and reference plane.

[0078] A binocular 3D measurement system consists of two cameras and an all-solid-state fringe projection device. The two cameras are spaced a certain distance apart, forming a baseline for triangulation. The fringe projection device projects a spatially coded fringe pattern onto the surface of the object being measured. The two cameras capture fringe images of the object's surface, each image containing spatially uniquely coded positional differences. Based on the spatial relationship between the two cameras obtained through calibration, and the spatial coding differences obtained from decoding the projected fringe patterns, the object's depth information can be calculated. Compared to a monocular system, the binocular system, by adding a camera, further improves the reliability and accuracy of the measurement. The binocular system can more accurately handle objects with complex shapes and reduce measurement errors.

[0079] The monocular and binocular fringe 3D structured light measurement systems built upon the all-solid-state fringe projection device proposed in this solution possess multiple advantages, including high frame rate, high energy efficiency, small size, lightweight, high precision, and long measurement distance. These systems are not only suitable for industrial inspection, intelligent manufacturing, and cultural relic preservation, but can also be widely applied in various industries such as medicine, entertainment, and virtual reality, providing strong technical support for 3D measurement and reconstruction. Through continuous optimization and improvement, this solution is expected to play a significant role in a wider range of fields.

[0080] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. The storage medium can be a magnetic disk, optical disk, read-only memory, or random access memory, etc.

[0081] The above disclosure is merely the best embodiments of the present application, and of course cannot be used to limit the scope of the present application, so the equivalent changes made according to the claims of the present application are still within the scope of the present application.

Claims

1. A full solid state striped projection device, characterized by, include: A light source and an optical projection system; the light source includes a VCSEL array, the VCSEL array includes multiple VCSEL line groups, each VCSEL line group includes at least one VCSEL light-emitting aperture, and each VCSEL light-emitting aperture is used to emit a laser signal; The light source is used to drive each VCSEL line group in the multiple VCSEL arrays to turn on or off according to the pattern type, and to emit laser signals based on all the turned-on VCSEL line groups. The optical projection system is used to collimate the laser signal from the light source, modulate the light field of the laser signal laterally and longitudinally, and project the processed laser signal onto the object to be tested to form a stripe pattern. The optical projection system includes: a collimation unit, a transverse modulation unit, and a longitudinal modulation unit; The collimation unit is used to collimate the light field emitted by the VCSEL array, ensuring that the light rays are projected onto the target area in a parallel or nearly parallel state. The transverse modulation unit is used to modulate the transverse energy of the emitted light field of the VCSEL line group, so that the transverse distribution of the light field is close to the cosine function. The longitudinal modulation unit is used to modulate the longitudinal energy of the emitted light field of the VCSEL line group, so that the energy of the light-emitting aperture in the VCSEL line group is spread into stripes along the longitudinal direction. The collimating lens includes at least one collimating lens, the lateral modulation unit includes one or more of a cylindrical mirror, a wave mirror, and a light circulator, and the longitudinal modulation unit includes one or more of a cylindrical mirror, a wave mirror, and a light circulator.

2. The apparatus of claim 1, wherein, When a VCSEL line group includes multiple VCSEL light-emitting controls, the arrangement of the multiple VCSEL light-emitting holes can be: single-row arrangement, staggered arrangement, inclined arrangement, or multi-row arrangement.

3. The apparatus of claim 1, wherein, Pattern types include: four-step phase-shift stripes, Gray code stripes, and binary code stripes.

4. The apparatus of claim 3, wherein, The pattern type is a four-step phase-shifting stripe, and the VCSEL line group includes 32 VCSEL line groups; when projecting a 0° phase stripe, VCSEL line groups in columns 1, 5, ..., 29 are turned on; when projecting a 90° phase stripe, VCSEL line groups in columns 2, 6, ..., 30 are turned on; when projecting a 180° phase stripe, VCSEL line groups in columns 3, 7, ..., 31 are turned on; when projecting a 270° phase stripe, VCSEL line groups in columns 4, 8, ..., 32 are turned on.

5. The apparatus of claim 3, wherein, The pattern type is Gray code stripes, and the VCSEL line group includes 32 VCSEL line groups; when projecting Level 1 Gray code, VCSEL line groups in columns 18, 20, ..., 32 are turned on; when projecting Level 2 Gray code, VCSEL line groups in columns 10, 12, ..., 24 are turned on; when projecting Level 3 Gray code, VCSEL line groups in columns 6, 8, 10, 12, 22, 24, 26, 28 are turned on; when projecting Level 4 Gray code, VCSEL line groups in columns 4, 6, 12, 14, 20, 22, 28, 30 are turned on.

6. A 3D structured light measurement system, characterized by include: At least one camera and the all-solid-state stripe projection device as described in any one of claims 1-5.

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