Electrical test system

Abstract

The invention discloses an electrical testing system, which belongs to the field of electrical testing, and comprises a turntable device, which comprises a turntable and a carrier, the carrier can accommodate two substrates side by side, and each substrate comprises a first part and a second part; the first testing device is suitable for testing the substrates of the carrier at the first testing position and comprises a first testing mechanism, a second testing mechanism and a third testing mechanism, the first testing mechanism is located above the first part of one substrate at the first testing position, the second testing mechanism is located above the second part of the same substrate, and the third testing mechanism is located above the second part of the same substrate; the third testing mechanism is positioned above the second part of the other substrate of the first testing position; the third testing device and the first testing device are symmetrically arranged on the two sides of the center line of the rotating disc; the second testing device is located between the first testing device and the third testing device; the second part is close to the edge of the turntable, and the third testing mechanism is close to the second testing device. By the adoption of the structure, the testing efficiency is improved, and the testing devices are more compact.

Description

Technical Field

[0001] The present invention relates to the technical field of substrate electrical testing, and in particular to an electrical testing system. Background Art

[0002] After the electrical substrate (circuit board) is processed, its circuits, components, etc. need to be fully inspected to ensure that the substrate is qualified before leaving the factory. The substrate usually includes a rigid first part and a flexible second part, and both the first part and the second part need to be electrically tested. For example, Chinese invention patent CN202110758541.0 discloses a substrate detection system and detection method, which includes a turntable and several detection mechanisms distributed along the circumference of the turntable. The turntable is provided with a carrier for accommodating the substrate. The carrier can flow through each test position in sequence under the drive of the turntable. Several detection mechanisms are arranged at different test positions to perform tests on different items. However, the above-mentioned carrier can only accommodate one substrate, that is, only one substrate can be tested at each test position, resulting in low test efficiency.

[0003] Therefore, it is necessary to improve the prior art to overcome the above defects in the prior art. Summary of the invention

[0004] The object of the present invention is to provide an electrical testing system, which can improve the testing efficiency and make the testing devices located on the turntable more compact, so as to reduce the overall volume of the testing system as much as possible.

[0005] The object of the present invention is to achieve the following technical solution: an electrical testing system, comprising: A turntable device, comprising a turntable and a plurality of carriers arranged on the turntable, wherein the carriers can accommodate two substrates side by side along the tangential direction of the turntable, the substrates comprising a first part and a second part arranged along the radial direction of the turntable, and the turntable is suitable for driving the carriers to flow to a first test position, a second test position and a third test position; a first testing device, adapted to test the substrate of the carrier at the first testing position, comprising a first testing mechanism, a second testing mechanism and a third testing mechanism, wherein the first testing mechanism is located above a first portion of one of the substrates at the first testing position, the second testing mechanism is located above a second portion of the same substrate, and the third testing mechanism is located above a second portion of another substrate at the first testing position; A third testing device having the same structure as the first testing device and being suitable for testing the substrate of the carrier at the third testing position, wherein the third testing device and the first testing device are symmetrically arranged on both sides of the center line of the turntable; a second testing device, located between the first testing device and the third testing device, and adapted to test the substrate of the carrier at the second testing position; The second part is closer to the edge of the turntable than the first part, and the third testing mechanism is closer to the second testing device than the first testing mechanism and / or the second testing mechanism.

[0006] Further, the first testing mechanism and the second testing mechanism are arranged side by side along the radial direction of the turntable, and the second testing mechanism and the third testing mechanism are arranged side by side along the tangential direction of the turntable.

[0007] Further, the first testing mechanism, the second testing mechanism and the third testing mechanism each include: First alignment platform; A first lifting driving member, arranged at an output end of the first alignment platform; A first test head connected to an output end of the first lifting drive member; The first test head corresponds to the test point of the first part and / or the second part in response to the driving of the first alignment platform, and the first test head contacts or moves away from the test point in response to the driving of the first lifting drive member.

[0008] Furthermore, the first testing device further comprises a lifting mechanism located below the turntable, and the lifting mechanism comprises: Lifting drive parts; A magnetic member connected to the output end of the lifting drive member and arranged opposite to the third testing mechanism; Wherein, a Hall sensor is provided on the second part, and the magnetic component is suitable for being driven by the lifting driving component to approach the Hall sensor.

[0009] Furthermore, the second testing device comprises: A fourth testing mechanism, located above a first portion of one of the substrates at the second testing position; a fifth testing mechanism, located above the second portion of the same substrate, wherein the fifth testing mechanism and the fourth testing mechanism are arranged side by side along the radial direction of the turntable; A transfer mechanism, drivingly connected to the fourth testing mechanism and the fifth testing mechanism; The fourth testing mechanism and the fifth testing mechanism are suitable for moving to different substrates at the second testing position along the tangential direction of the turntable under the drive of the transfer mechanism.

[0010] Furthermore, the fourth testing mechanism and the fifth testing mechanism both include: Second counterpoint platform; A second lifting driving member, arranged at an output end of the second alignment platform; A second test head connected to an output end of the second lifting drive member; The second test head corresponds to the test point of the first part and / or the second part in response to the driving of the second alignment platform, and the second test head contacts or moves away from the test point in response to the driving of the second lifting drive member.

[0011] Furthermore, the electrical testing system includes a hanging frame, the hanging frame includes a hanging plate located above the turntable, and the first testing mechanism, the second testing mechanism, the third testing mechanism, the fourth testing mechanism and the fifth testing mechanism are all arranged on the hanging plate.

[0012] Further, the turntable is suitable for driving the carrier to flow to the loading and unloading position, the shooting position, the first test position, the second test position and the third test position in sequence, and the electrical testing system includes: A handling device, adapted to load and unload substrates from the carrier at the loading and unloading position; The visual device is suitable for visually positioning the substrate of the carrier at the shooting position.

[0013] Furthermore, the transport device comprises: A manipulator, the output end of which is provided with a mounting plate; A fixed pick-and-place mechanism, used for picking up and placing the substrate, which is arranged on the mounting plate; A movable pick-and-place mechanism, used for picking up and placing the substrate, which is arranged on the mounting plate and can be lifted and lowered in the vertical direction; Among them, the number of the fixed pick-and-place mechanism and the number of the movable pick-and-place mechanism are both two groups, and the two groups of the fixed pick-and-place mechanism are suitable for one-to-one correspondence with the substrates on the carrier under the drive of the robot, and the two groups of the movable pick-and-place mechanism are suitable for one-to-one correspondence with the substrates on the carrier under the drive of the robot.

[0014] Furthermore, the visual device includes two visual mechanisms, and the number of the visual mechanisms is two groups, and they correspond one to one with the two substrates on the carrier, and each of the visual mechanisms includes two visual cameras to correspond to the first part and the second part of the substrate respectively.

[0015] Compared with the prior art, the present invention has the following beneficial effects: the carrier in the present invention can accommodate two substrates at the same time, so that the test device at the test position can test the two substrates at the same time, thereby improving the test efficiency; the test system comprises a first test device, a second test device and a third test device which are sequentially arranged along the circumference of the turntable, the first part and the second part of the substrate on the carrier are arranged along the radial direction of the turntable, and the second part is close to the edge of the turntable, the first test device comprises a first test mechanism, a second test mechanism and a third test mechanism, the first test mechanism is located above the first part of one of the substrates at the first test position, the second test mechanism is located above the second part of the same substrate, and the third test mechanism is located above the second part of another substrate at the first test position, so that an avoidance space is formed above the first part of the other substrate, and since the third test mechanism is close to the second test device, the second test device The third test device and the first test device can be as close as possible without interference, and the test system as a whole is more compact; the third test device and the first test device have the same structure, and the third test device and the first test device are symmetrically arranged on both sides of the center line of the turntable, so that the third test device and the second test device can be as close as possible without interference, further improving the overall compactness of the test system. At the same time, the first test device and the second test device can complement each other, that is, one of the substrates that has not been tested by the first test mechanism and the second test mechanism at the first test position can be tested at the third test position, and another substrate that has not been tested by the third test mechanism at the first test position can be tested at the third test position; the present invention adopts the above structure, which can test a preset number of items on the substrate while greatly improving the test efficiency, and reducing the overall volume of the system as much as possible to improve spatial adaptability. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a structural schematic diagram of the electrical testing system of the present invention.

[0017] Figure 2 It is a structural schematic diagram of the turntable part of the present invention.

[0018] Figure 3 yes Figure 2 Schematic diagram of top view after removing the lifting frame.

[0019] Figure 4 yes Figure 2 Schematic diagram of the structure after removing the lifting frame.

[0020] Figure 5 It is a structural schematic diagram of the carrier in the present invention.

[0021] Figure 6 It is a structural schematic diagram of the first testing device in the present invention.

[0022] Figure 7 It is a structural schematic diagram of the jacking mechanism in the present invention.

[0023] Figure 8 It is a schematic structural diagram of the second testing device in the present invention.

[0024] Fig. 9 It is a schematic diagram of the structure of the transport device in the present invention.

[0025] Fig.10 It is a schematic diagram of the installation of the fixed pick-up and placement mechanism and the movable pick-up and placement mechanism in the present invention.

[0026] Fig.11 It is a structural schematic diagram of the visual mechanism in the present invention.

[0027] Description of reference numerals: 100, turntable device; 110, turntable; 111, center line; 120, carrier; 121, carrier plate; 122, positioning groove; 130, substrate; 131, first part; 132, second part; 133, Hall sensor; 200, first test device; 210, first test mechanism; 220, second test mechanism; 230, third test mechanism; 241, first alignment platform; 242, first lifting drive member; 243, first test head; 250, lifting mechanism; 251, lifting drive member; 252, magnetic member; 260, first connecting plate; 300, second test device; 310, fourth test mechanism; 320, fifth test mechanism; 330, transfer machine Structure; 341, second alignment platform; 342, second lifting drive member; 343, second test head; 350, second connecting plate; 400, third test device; 500, lifting frame; 510, column; 520, lifting plate; 600, handling device; 610, manipulator; 611, mounting plate; 620, fixed pick-up and placement mechanism; 630, movable pick-up and placement mechanism; 641, bracket; 6411, connecting part; 642, sliding plate; 643, suction head; 644, third lifting drive member; 645, elastic member; 700, visual device; 710, visual mechanism; 711, visual camera; 712, third connecting plate; 713, light source; 800, conveying device; 810, tray. DETAILED DESCRIPTION

[0028] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. It is to be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some structures related to the present application are shown in the accompanying drawings, rather than all structures. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0029] The terms "including" and "having" and any variations thereof in this application are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products or devices.

[0030] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0031] See also Figures 1 to 4 As shown, an electrical testing system corresponding to a preferred embodiment of the present invention includes: a turntable device 100, including a turntable 110 and a plurality of carriers 120 arranged on the turntable 110, the carrier 120 can accommodate two substrates 130 side by side along the tangent direction of the turntable 110, the substrate 130 includes a first part 131 and a second part 132 arranged along the radial direction of the turntable 110, and the turntable 110 is suitable for driving the carrier 120 to flow to a first test position, a second test position and a third test position; a first testing device 200, suitable for testing the substrate 130 on the carrier 120 at the first test position, which includes a first testing mechanism 210, a second testing mechanism 220 and a third testing mechanism 230, the first testing mechanism 210 is located above the first part 131 of one of the substrates 130 at the first test position, and the second testing mechanism 220 is located on the same substrate The third testing mechanism 230 is located above the second portion 132 of the plate 130 at the first testing position; the third testing device 400 has the same structure as the first testing device 200 and is suitable for testing the substrate 130 on the carrier 120 at the third testing position, and the third testing device 400 and the first testing device 200 are symmetrically arranged on both sides of the center line 111 of the turntable 110; the second testing device 300 is located between the first testing device 200 and the third testing device 400 and is suitable for testing the substrate 130 of the carrier 120 at the second testing position; wherein the second portion 132 is closer to the edge of the turntable 110 than the first portion 131, and the third testing mechanism 230 is closer to the second testing device 300 than the first testing mechanism 210 and / or the second testing mechanism 220.

[0032] The carrier 120 in the present invention can accommodate two substrates 130 at the same time, so that the test device at the test position can test the two substrates 130 at the same time, thereby improving the test efficiency; the test system includes a first test device 200, a second test device 300 and a third test device 400 which are sequentially arranged along the circumference of the turntable 110, the first part 131 and the second part 132 of the substrate 130 on the carrier 120 are arranged along the radial direction of the turntable 110, and the second part 132 is close to the edge of the turntable 110, the first test device 200 includes a first test mechanism 210, a second test mechanism 220 and a third test mechanism 230, the first test mechanism 210 is located above the first part 131 of one of the substrates 130 in the first test position, the second test mechanism 220 is located above the second part 132 of the same substrate 130, and the third test mechanism 230 is located above the second part 132 of another substrate 130 in the first test position, so that an avoidance space is formed above the first part 131 of the other substrate 130, and since the third test mechanism 230 is close to the second test mechanism The third test device 400 and the first test device 200 have the same structure, and the third test device 400 and the first test device 200 are symmetrically arranged on both sides of the center line 111 of the turntable 110, so that the third test device 400 and the second test device 300 can be as close as possible without interference, further improving the overall compactness of the test system. At the same time, the first test device 200 and the second test device 300 can complement each other, that is, one of the substrates 130 that has not been tested by the first test mechanism 210 and the second test mechanism 220 at the first test position can be tested at the third test position, and another substrate 130 that has not been tested by the third test mechanism 230 at the first test position can be tested at the third test position; the present invention adopts the above structure, which can test a preset number of items on the substrate 130, greatly improve the test efficiency, and reduce the overall volume of the system as much as possible to improve spatial adaptability.

[0033] Further, refer to Figure 5As shown, the first part 131 is a rigid plate, the second part 132 is a long strip of flexible plate, one end of the second part 132 is connected to the first part 131, and the other end extends along the radial direction of the turntable 110, and the first part 131 and the second part 132 are both provided with points to be measured. The carrier 120 includes a carrier plate 121 fixed to the turntable 110, the length direction of the carrier plate 121 is parallel to the tangent direction of the turntable 110, and the width direction is parallel to the radial direction of the turntable 110. The carrier plate 121 is recessed inward from its top surface to form a positioning groove 122, the contour of the positioning groove 122 is adapted to the first part 131, and the first part 131 is suitable for being embedded and positioned in the positioning groove 122. There are two positioning grooves 122, and they are arranged side by side and spaced along the length direction of the carrier plate 121, so that the carrier 120 can accommodate two substrates 130 at the same time. A vacuum channel (not shown) is formed in the carrier plate 121, and a plurality of adsorption holes (not shown) connected to the vacuum channel are opened on the top surface of the carrier plate 121. The adsorption holes correspond to the first part 131 and the second part 132 respectively to adsorb the first part 131 and the second part 132.

[0034] Further, refer to Figure 4 and Figure 6 As shown, the first test mechanism 210 and the second test mechanism 220 are arranged side by side along the radial direction of the turntable 110, and the second test mechanism 220 and the third test mechanism 230 are arranged side by side along the tangential direction of the turntable 110. The width direction of the carrier 120 in the first test position is parallel to the arrangement direction of the first test mechanism 210 and the second test mechanism 220, and the length direction of the carrier 120 in the first test position is parallel to the arrangement direction of the second test mechanism 220 and the third test mechanism 230.

[0035] The structures of the first test mechanism 210, the second test mechanism 220 and the third test mechanism 230 are the same or substantially the same, and all three include a first alignment platform 241, a first lifting drive 242 and a first test head 243. The first alignment platform 241 is specifically a UVW alignment platform, which can fine-tune the first test head 243 according to the actual position of the point to be tested on the substrate 130 on the carrier 120. The first lifting drive 242 is arranged at the output end of the first alignment platform 241. The first lifting drive 242 can adopt a linear cylinder or an electric cylinder, and is preferably a cylinder in the present embodiment. The first test head 243 is connected to the output end of the first lifting drive 242, and it can contact the point to be tested to achieve electrical connection. The first test head 243 is a known structure, and the present invention will not be repeated here. The first test head 243 corresponds to the test point of the first part 131 and / or the second part 132 in response to the driving of the first alignment platform 241 , and contacts or moves away from the test point in response to the driving of the first lifting drive member 242 .

[0036] In this embodiment, the first testing mechanism 210 is specifically used to test the partial circuit state on the first part 131, the second testing mechanism 220 is used to test the partial circuit state on the second part 132, and the third testing mechanism 230 is used to test another partial circuit state on the second part 132. The present invention will not be specifically expanded here, and the test items can be adjusted according to actual needs.

[0037] Furthermore, depending on the actual substrate 130, there is a case where the Hall sensor 133 is provided on the second portion 132, so another test item needs to test the operating state of the Hall sensor 133. As a preferred embodiment, the first test device 200 further includes a lifting mechanism 250 located below the turntable 110. Figure 7 As shown, the lifting mechanism 250 includes a lifting drive 251 and a magnetic member 252. The lifting drive 251 is a cylinder arranged in the vertical direction. The magnetic member 252 is a magnet, which is connected to the output end of the lifting drive 251. The magnetic member 252 is arranged opposite to the third testing mechanism 230. The magnetic member 252 is suitable for approaching the Hall sensor 133 under the drive of the lifting drive 251, and then cooperates with the third testing mechanism 230 to obtain the operating state of the Hall sensor 133. Preferably, the carrier plate 121 and the turntable 110 are both provided with avoidance holes for avoiding the Hall sensor 133 in the vertical direction, and the magnetic member 252 is suitable for passing through the avoidance holes to cooperate with the Hall sensor 133.

[0038] Further, in this embodiment, the second testing device 300 is used to test the inductance, capacitance and resistance of the electronic components on the substrate 130, and the time required for the second testing device 300 to test is less than the time required for the first testing device 200 and / or the second testing device 300 to test. Figure 4 and Figure 8 As shown, the second test device 300 includes a fourth test mechanism 310, a fifth test mechanism 320 and a transfer mechanism 330. The fourth test mechanism 310 and the fifth test mechanism 320 are arranged side by side along the radial direction of the turntable 110, the fourth test mechanism 310 is located above the first part 131 of one of the substrates 130 in the second test position, and the fifth test mechanism 320 is located above the second part 132 of the same substrate 130. The width direction of the carrier 120 in the second test position is parallel to the arrangement direction of the fourth test mechanism 310 and the fifth test mechanism 320. The transfer direction of the transfer mechanism 330 is parallel to the length direction of the carrier 120 in the second test position, and the transfer mechanism 330 is transmission-connected to the fourth test mechanism 310 and the fifth test mechanism 320. The transfer mechanism 330 is specifically a linear module composed of a motor and a lead screw. The fourth test mechanism 310 and the fifth test mechanism 320 are suitable for moving along the tangential direction of the turntable 110 to different substrates 130 at the second test position under the drive of the transfer mechanism 330 .

[0039] By adopting the above structure, when the test of one of the substrates 130 on the second test position carrier 120 is completed, the transfer mechanism 330 can transfer the fourth test mechanism 310 and the fifth test mechanism 320 to the top of another substrate 130 to continue the test, thereby avoiding the need to set up two sets of the fourth test mechanism 310 and the fifth test mechanism 320, thereby reducing production costs. Moreover, since the time required for the test of the second test device 300 is shorter, the overall test efficiency will not be greatly affected.

[0040] Furthermore, the structures of the fourth test mechanism 310 and the fifth test mechanism 320 are substantially the same, and both include a second alignment platform 341, a second lifting drive 342, and a second test head 343. The second alignment platform 341 is specifically a UVW alignment platform, which can fine-tune the second test head 343 according to the actual position of the point to be tested on the substrate 130 on the carrier 120. The second lifting drive 342 is arranged at the output end of the second alignment platform 341, and the second lifting drive 342 can adopt a linear cylinder or an electric cylinder, and is preferably a cylinder in the present embodiment. The second test head 343 is connected to the output end of the second lifting drive 342, and it can contact the point to be tested to achieve electrical connection. The second test head 343 is a known structure, and the present invention will not be repeated here. The second test head 343 corresponds to the test point of the first part 131 and / or the second part 132 in response to the driving of the second alignment platform 341 , and contacts or moves away from the test point in response to the driving of the second lifting drive member 342 .

[0041] Further, refer to Figure 2 , Figure 4 , Figure 6 and Figure 8 As shown, the electrical testing system includes a hanging frame 500, and the hanging frame 500 includes a column 510 and a hanging plate 520. The columns 510 are provided with a plurality of columns and are arranged around the outer periphery of the turntable 110. The hanging plate 520 is fixed to the top of the plurality of columns 510 and is located above the turntable 110. The first test mechanism 210, the second test mechanism 220, the third test mechanism 230, the fourth test mechanism 310 and the fifth test mechanism 320 are all arranged on the hanging plate 520.

[0042] Specifically, the first alignment platform 241, the first lifting drive 242 and the first test head 243 are arranged in sequence from top to bottom, and the multiple first alignment platforms 241 of the first test device 200 are fixed to the bottom of the hanging plate 520 through the first connecting plate 260. The outer contour of the first connecting plate 260 is adapted to the outer contour formed after the multiple first alignment platforms 241 are arranged, so as to prevent the first connecting plate 260 from obstructing the second test device 300. The second alignment platform 341, the second lifting drive 342 and the second test head 343 are arranged in sequence from top to bottom, and the transfer mechanism 330 is located above the second alignment platform 341 and fixed to the bottom of the hanging plate 520, and the two second alignment platforms 341 are fixed to the output end of the transfer mechanism 330 through the second connecting plate 350.

[0043] Further, return Figure 1 and Figure 2 As shown, the turntable 110 is suitable for driving the carrier 120 to flow to the loading and unloading position, the shooting position, the first test position, the second test position and the third test position in sequence and then return to the loading and unloading position. The electrical testing system also includes a transport device 600 and a visual device 700. The transport device 600, the visual device 700, the first test device 200, the second test device 300 and the third test device 400 are arranged in sequence along the circumference of the turntable 110. The transport device 600 is suitable for loading and unloading the substrate 130 of the carrier 120 at the loading and unloading position, and the visual device 700 is suitable for visual positioning of the substrate 130 on the carrier 120 at the shooting position, so that the first alignment platform 241 and the second alignment platform 341 can be fine-tuned according to the actual position of the test point of the substrate 130.

[0044] Further, refer to Fig. 9 and Fig.10 As shown, the handling device 600 includes a manipulator 610, a fixed pick-and-place mechanism 620 and a movable pick-and-place mechanism 630. The output end of the manipulator 610 is provided with a mounting plate 611. The fixed pick-and-place mechanism 620 and the movable pick-and-place mechanism 630 are both arranged on the mounting plate 611 and are used to pick and place the substrate 130. In this embodiment, the number of the fixed pick-and-place mechanism 620 and the movable pick-and-place mechanism 630 is two groups, and they are arranged alternately side by side. The two groups of fixed pick-and-place mechanisms 620 are suitable for one-to-one correspondence with the substrate 130 on the carrier 120 under the drive of the manipulator 610, and the two groups of movable pick-and-place mechanisms 630 are suitable for one-to-one correspondence with the substrate 130 on the carrier 120 under the drive of the manipulator 610. The movable pick-and-place mechanism 630 can be raised and lowered in the vertical direction to avoid mutual interference with the fixed pick-and-place mechanism 620. By adopting the above structure, one of the two fixed pick-and-place mechanisms 620 and the two movable pick-and-place mechanisms 630 can simultaneously remove two tested substrates 130 from the carrier 120, and use the other one to place the other two substrates 130 to be tested into the carrier 120, thereby improving the loading and unloading efficiency of the substrates 130.

[0045] Specifically, the fixed pick-and-place mechanism 620 and the movable pick-and-place mechanism 630 have similar structures, and both include a bracket 641, a sliding plate 642, and a suction head 643. The bracket 641 of the fixed pick-and-place mechanism 620 is fixed on the mounting plate 611, and the movable pick-and-place mechanism 630 also includes a third lifting drive member 644, which is a linear cylinder, which is connected to the mounting plate 611, and the output end is connected to the bracket 641, thereby driving the bracket 641 to rise and fall in the vertical direction. The sliding plate 642 can be slidably connected to the bracket 641 in the vertical direction, and specifically, a slide rail structure arranged in the vertical direction can be set between the sliding plate 642 and the bracket 641. The suction head 643 is fixed to the bottom of the sliding plate 642, which is suitable for adsorbing or releasing the substrate 130. The suction head 643 is an existing structure, and the present invention will not be repeated here.

[0046] Preferably, the bracket 641 has a connecting portion 6411 opposite to the top of the sliding plate 642, and the fixed pick-up and placement mechanism 620 and the movable pick-up and placement mechanism 630 also include an elastic member 645, which is specifically a spring, which is connected between the connecting portion 6411 and the top of the sliding plate 642. The elastic member 645 contracts in response to the sliding plate 642 sliding upward, so that the suction head 643 can be cushioned when it approaches the substrate 130 downward, thereby avoiding damage to the suction head 643 and / or the substrate 130.

[0047] Further, refer to Fig.11 As shown, the visual device 700 includes a visual mechanism 710 located above the turntable 110. The number of the visual mechanism 710 is two groups, and they correspond one to one to the two substrates 130 on the carrier 120 at the shooting position. Each visual mechanism 710 includes two visual cameras 711 to correspond to the first part 131 and the second part 132 of the substrate 130 respectively, so as to improve the shooting accuracy. The visual mechanism 710 also includes a third connecting plate 712 and a light source 713. The third connecting plate 712 is connected to the bottom of the hanging plate 520. The visual camera 711 and the light source 713 are both installed on the third connecting plate 712. The light source 713 is a ring light source, which is located below the two visual cameras 711 to illuminate the substrate 130 on the carrier 120.

[0048] Further, refer to Figure 1 As shown, the battery cell testing system further includes a conveying device 800 and a defective product collecting device (not shown), wherein the conveying device 800 is used to convey the substrate 130 to be tested to the handling device 600 and receive the substrate 130 that has passed the test, and the defective product collecting device is used to receive the substrate 130 that has failed the test. The conveying device 800 is specifically a conveying line for conveying a tray 810 loaded with substrates 130, which is a known structure and will not be described in detail in the present invention.

[0049] The working process of the electrical testing system of the present invention is as follows: the handling device 600 grabs two substrates 130 to be tested in the loading tray 810 of the conveying device 800, and carries them to the carrier 120 at the loading and unloading position; the carrier 120 is driven by the turntable 110 to flow to the shooting position, and at the shooting position, the visual device 700 can shoot the substrate 130 on the carrier 120 to obtain its position information, and then the first test device 200, the second test device 300 and the third test device 400 are fine-tuned according to the position information of the substrate 130 to ensure that they are accurately aligned with the substrate 130; then the carrier 120 is driven by the turntable 110 to flow to the first test position, and the first part of the substrate 130 located upstream 131 corresponds to the first test mechanism 210, the second part 132 corresponds to the second test mechanism 220, the second part 132 of the substrate 130 located downstream corresponds to the third test mechanism 230, the lifting mechanism 250 corresponds to the Hall sensor 133 of the substrate 130 located downstream, the first test mechanism 210, the second test mechanism 220 and the third test mechanism 230 move downward to electrically contact the corresponding parts to implement the test of some items, and at the same time the lifting mechanism 250 moves upward to approach the Hall sensor 133, so that the third test mechanism 230 can test the Hall sensor 133 at the same time; after the test is completed, the first test device 200 is reset, and the carrier 1 20 is driven by the turntable 110 to the second test position, the fourth test mechanism 310 and the fifth test mechanism 320 correspond to the first part 131 and the second part 132 of the upstream substrate 130 respectively, the fourth test mechanism 310 and the fifth test mechanism 320 move downward to electrically contact the corresponding parts to implement the test of some items, after the test is completed, the fourth test mechanism 310 and the fifth test mechanism 320 are reset upward, and are driven by the transfer mechanism 330 to move to the downstream substrate 130, so that the fourth test mechanism 310 and the fifth test mechanism 320 correspond to the first part 131 and the second part 132 of the downstream substrate 130 respectively, to implement the downstream substrate 130 After the test of the substrate 130 at the second test position is completed, the second test device 300 is reset, and the carrier 120 is driven by the turntable 110 to flow to the third test position. At this time, the second part 132 of the substrate 130 located upstream corresponds to the third test mechanism 230 of the third test device 400, and the Hall sensor 133 of the substrate 130 corresponds to the lifting mechanism 250. The first part 131 and the second part 132 of the substrate 130 located downstream correspond to the first test mechanism 210 and the second test mechanism 220 of the third test device 400, respectively, so that the first test device 200 and the third test device 400 complement each other to avoid omission of test items of the substrate 130;After the test of the substrate 130 at the third test position is completed, the carrier 120 is driven by the turntable 110 to flow to the loading and unloading position, the handling device 600 takes the tested substrate 130 off the carrier 120, and puts the substrate 130 to be tested back to the carrier 120, the handling device 600 puts the substrate 130 that has passed the test back to the conveying device 800, and puts the substrate 130 that has failed the test into the defective product collection device; repeat the above actions, thereby realizing continuous testing of the substrate 130. ;

[0050] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the description and drawings of this application, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. An electrical testing system, characterized in that: include: A turntable device (100) comprises a turntable (110) and a plurality of carriers (120) arranged on the turntable (110), wherein the carriers (120) can accommodate two substrates (130) side by side along a tangential direction of the turntable (110), the substrate (130) comprising a first part (131) and a second part (132) arranged radially along the turntable (110), and the turntable (110) is suitable for driving the carriers (120) to flow to a first test position, a second test position, and a third test position; A first testing device (200) is suitable for testing the substrate (130) of the carrier (120) at the first testing position, comprising a first testing mechanism (210), a second testing mechanism (220) and a third testing mechanism (230), wherein the first testing mechanism (210) is located above a first portion (131) of one of the substrates (130) at the first testing position, the second testing mechanism (220) is located above a second portion (132) of the same substrate (130), and the third testing mechanism (230) is located above a second portion (132) of another substrate (130) at the first testing position; A third testing device (400) having the same structure as the first testing device (200) and being suitable for testing the substrate (130) of the carrier (120) at the third testing position, the third testing device (400) and the first testing device (200) being symmetrically arranged on both sides of a center line (111) of the turntable (110); A second testing device (300) located between the first testing device (200) and the third testing device (400), and suitable for testing the substrate (130) of the carrier (120) at the second testing position; The second part (132) is closer to the edge of the turntable (110) than the first part (131), and the third testing mechanism (230) is closer to the second testing device (300) than the first testing mechanism (210) and / or the second testing mechanism (220).

2. The electrical testing system according to claim 1, characterized in that: The first testing mechanism (210) and the second testing mechanism (220) are arranged side by side in a radial direction of the rotating disk (110), and the second testing mechanism (220) and the third testing mechanism (230) are arranged side by side in a tangential direction of the rotating disk (110).

3. The electrical testing system according to claim 1, wherein: The first testing mechanism (210), the second testing mechanism (220) and the third testing mechanism (230) all comprise: First counterpoint platform (241); A first lifting drive member (242) is arranged at an output end of the first alignment platform (241); A first test head (243) connected to an output end of the first lifting drive component (242); The first test head (243) corresponds to a point to be tested of the first part (131) and / or the second part (132) in response to the driving of the first alignment platform (241), and the first test head (243) contacts or moves away from the point to be tested in response to the driving of the first lifting drive member (242).

4. The electrical testing system according to claim 1, wherein: The first testing device (200) further comprises a lifting mechanism (250) located below the turntable (110), the lifting mechanism (250) comprising: Lifting drive member (251); A magnetic member (252) connected to the output end of the lifting drive member (251) and arranged opposite to the third testing mechanism (230); Wherein, a Hall sensor (133) is provided on the second part (132), and the magnetic component (252) is suitable for being driven by the lifting driving component (251) to approach the Hall sensor (133).

5. The electrical testing system according to claim 1, wherein: The second testing device (300) comprises: A fourth testing mechanism (310) is located above a first portion (131) of one of the substrates (130) at the second testing position; a fifth testing mechanism (320) located above the second portion (132) of the same substrate (130), the fifth testing mechanism (320) and the fourth testing mechanism (310) being arranged side by side in a radial direction of the turntable (110); A transfer mechanism (330) is transmission-connected to the fourth testing mechanism (310) and the fifth testing mechanism (320); The fourth testing mechanism (310) and the fifth testing mechanism (320) are adapted to be moved along the tangential direction of the turntable (110) to a substrate (130) different from the second testing position under the drive of the transfer mechanism (330).

6. The electrical testing system according to claim 5, characterized in that: The fourth testing mechanism (310) and the fifth testing mechanism (320) both include: Second counterpoint platform (341); A second lifting drive member (342) is arranged at an output end of the second alignment platform (341); A second test head (343) connected to an output end of the second lifting drive member (342); The second test head (343) corresponds to a point to be tested of the first part (131) and / or the second part (132) in response to the driving of the second alignment platform (341), and the second test head (343) contacts or moves away from the point to be tested in response to the driving of the second lifting drive member (342).

7. The electrical testing system according to claim 5, characterized in that: The electrical testing system comprises a hanging frame (500), the hanging frame (500) comprises a hanging plate (520) located above the turntable (110), the first testing mechanism (210), the second testing mechanism (220), the third testing mechanism (230), the fourth testing mechanism (310) and the fifth testing mechanism (320) are all arranged on the hanging plate (520).

8. The electrical testing system according to claim 1, wherein: The turntable (110) is suitable for driving the carrier (120) to flow to the loading and unloading position, the shooting position, the first test position, the second test position and the third test position in sequence, and the electrical testing system comprises: A handling device (600) adapted to load and unload a substrate (130) from the carrier (120) at the loading and unloading position; The visual device (700) is suitable for visually positioning the substrate (130) of the carrier (120) at the shooting position.

9. The electrical testing system according to claim 8, characterized in that: The transport device (600) comprises: A manipulator (610), an output end of which is provided with a mounting plate (611); A fixed pick-and-place mechanism (620) for picking up and placing the substrate (130), which is arranged on the mounting plate (611); A movable pick-and-place mechanism (630) is used for picking up and placing the substrate (130), which is arranged on the mounting plate (611) and can be raised and lowered in a vertical direction; The number of the fixed pick-and-place mechanisms (620) and the number of the movable pick-and-place mechanisms (630) are both two groups, and the two groups of the fixed pick-and-place mechanisms (620) are suitable for one-to-one correspondence with the substrates (130) on the carrier (120) under the drive of the robot (610), and the two groups of the movable pick-and-place mechanisms (630) are suitable for one-to-one correspondence with the substrates (130) on the carrier (120) under the drive of the robot (610).

10. The electrical testing system according to claim 8, characterized in that: The visual device (700) comprises visual mechanisms (710), wherein the number of the visual mechanisms (710) is two groups, and the two groups correspond one to one with the two substrates (130) on the carrier (120), and each of the visual mechanisms (710) comprises two visual cameras (711) to correspond to the first part (131) and the second part (132) of the substrate (130), respectively.

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