Method and system for testing digital-analog hybrid circuit
By designing a digital-analog hybrid circuit testing method and system that includes selecting test tasks, obtaining configuration items, executing test tasks and generating test reports, the problem of low testing efficiency in the prior art is solved, and a more efficient and accurate testing process is achieved.
Patent Information
- Application Number
- CN202510038680.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-10
- Publication Date
- 2025-04-25
AI Technical Summary
The existing digital-to-analog hybrid circuit testing methods have problems such as delay and adding new failure modes, resulting in low testing efficiency.
A test method and system for digital-analog hybrid circuits is proposed, including selecting test tasks, obtaining configuration items, executing test tasks, returning test data and automatically generating test reports. The system generates a detailed test report by detecting the connection situation, sending test commands, collecting signals and calculating results.
Improves the efficiency and accuracy of digital-to-analog hybrid circuit testing, and reduces the delay during the test process and the emergence of new failure modes.
Smart Images
Figure CN119882441A_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the field related to digital-analog hybrid circuits, and in particular, relates to a testing method and system for digital-analog hybrid circuits. Background Art
[0002] With the advancement of microelectronics technology and the development of integrated circuits, higher requirements are placed on circuit testing. Mixed-analog circuits account for more than 60% of integrated circuit circuits.
[0003] Mixed-analog circuits are widely used in electronic devices such as industry, communications, home appliances, and computers. The quality of the mixed-analog circuit test method affects the stability and reliability of electronic equipment, so the mixed-analog circuit test method has always been the focus of research. In order to meet the needs of massive testing of mixed-analog circuits, various mixed-analog circuit test methods and systems have emerged.
[0004] In the prior art, the testing methods for mixed analog and digital circuits are mainly based on boundary scan and built-in self-test technologies. However, boundary scan technology will introduce delays, and the test circuits added by built-in self-test technology will introduce new failure modes. Therefore, in order to improve the testing efficiency of mixed analog and digital circuits, it is necessary to explore more efficient testing methods and system designs. Summary of the invention
[0005] In order to solve the problems existing in the background technology, the present invention proposes a testing method and system for a digital-analog hybrid circuit.
[0006] According to the present invention, a method and system for testing a mixed digital-analog circuit are provided, comprising: selecting a test task; obtaining configuration items of the test task; executing the test task; returning test data; calculating results and automatically generating a test report.
[0007] Furthermore, selecting a test task includes: selecting a test task name, selecting a test environment for the test task, selecting a test time for the test task, editing a tester for the test task, and obtaining a test instruction and a SCIP test command corresponding to the test task.
[0008] Further, according to the above, obtaining the configuration items of the test task includes: the industrial computer obtains the IP address of the program-controlled instrument; obtains the setting output of the program-controlled instrument; obtains the serial port information of the program-controlled instrument; obtains the model and IP address of the signal acquisition module;
[0009] Further, according to the above, executing the test task includes: detecting the connectivity between the host computer and the program-controlled instrument; detecting the connectivity between the host computer and the single-chip test circuit baseboard; detecting the connectivity between the host computer and the acquisition module; executing all test items in sequence; displaying the test execution information of the test items;
[0010] Further, according to the above, executing all test items in sequence includes: sending a test SCIP control command corresponding to the test item; sending a test instruction corresponding to the test item.
[0011] Further, according to the above, returning the test data includes: the industrial computer receives the signal of the signal acquisition module.
[0012] Further, according to the above, a test report is automatically generated according to the test results, including: the industrial computer analyzes the collected signals and calculates the results; generates a test report of all test items; and the printer prints the test report; BRIEF DESCRIPTION OF THE DRAWINGS
[0013] Figure 1 The figure is a schematic diagram of the structure of a mixed digital-analog circuit testing method and system according to an embodiment of the present invention.
[0014] Figure 2 The figure is a flow chart of a method and system for testing a mixed analog and digital circuit according to an embodiment of the present invention. DETAILED DESCRIPTION
[0015] In order to make the purpose, technical solutions and advantages of this specification clearer, a digital-analog mixed circuit testing method and system are provided in this embodiment to clearly and completely describe the present invention.
[0016] Figure 1 A schematic diagram of the structure of a mixed-analog circuit testing method and system according to an embodiment of the present invention; Figure 2 Flow chart of the digital-analog hybrid circuit testing method and system in the embodiment of the present invention; Figure 2 A method and system for testing a mixed-analog circuit of the present invention includes the following steps:
[0017] Step S1, selecting a test task; Step S11: Select a test task name; Step S12: Select a test environment for the test task.
[0018] In this embodiment, the optional test environments include a normal temperature environment, a high temperature environment (60°C) and a low temperature environment (-30°C);
[0019] Step S13: Select the test time of the test task; Step S14: Edit the tester of the test task; Step S15: Obtain the test instructions and SCIP test commands corresponding to the test task.
[0020] Step S2, obtaining the configuration items of the test task, including: Step S21: the industrial computer obtains the IP address of the program-controlled instrument; Step S22: Obtaining the setting output of the program-controlled instrument; Step S23: Obtaining serial port information of the program-controlled instrument; Step S24: Obtain the model and IP address of the signal acquisition module.
[0021] Step S3, executing the test task, including: Step S31: Detect the connectivity between the host computer and the program-controlled instrument; Step S32: Detecting the connectivity between the host computer and the single-chip microcomputer test circuit baseboard; Step S33: Detect the connectivity between the host computer and the acquisition module; Step S34: Execute all test items in sequence, including: According to the configuration information, the SCIP command is sent to the program-controlled instrument, and the program-controlled instrument outputs the power signal and waveform signal to the single-chip circuit board. The circuit board inputs the stimulus to the digital-analog hybrid circuit to be tested, and the digital-analog hybrid circuit outputs the signal to the single-chip circuit board. The signal acquisition module collects the output signal of the single-chip circuit board.
[0022] Step S35: Display the test execution information of the test item, including: Step S351: displaying the execution step information of the test item, including the name of the executed test item and the test command; Step S352: Display the waveform signal output by the test item.
[0023] Step S4, returning test data, includes: the industrial computer receives the signal of the signal acquisition module;
[0024] Step S5, calculating the results and automatically generating a test report, including: S51: Calculate the test result according to the collected signal; S52: Generate a test report for all test items; S53: The printer prints a test report.
[0025] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, and they should be covered by the protection scope of the present invention.
Claims
1. A method and system for testing a mixed digital-analog circuit, characterized in that: include: Industrial computers, program-controlled instruments, single-chip circuit boards, signal acquisition modules, printers, and mixed digital-analog circuits that need to be tested. The industrial computer and the program-controlled instrument are connected through the network port, the industrial computer and the single-chip circuit board, the signal acquisition module, and the printer are all connected through the serial port, the program-controlled instrument and the signal acquisition module are connected through the signal line, and the digital-analog mixed circuit to be tested is directly plugged into the single-chip circuit board.
2. The method according to claim 1, characterized in that Testing of mixed analog and digital circuits: Select the test task; Get the configuration items of the test task; Execute test tasks; Return test data; Calculate results and automatically generate test reports.
3. The method according to claim 2, characterized in that Select test items, including: Select the test task name, select the test environment of the test task, select the test time of the test task, edit the tester of the test task, and obtain the test instructions and SCIP test commands corresponding to the test task.
4. The method according to claim 2, characterized in that: Get test configuration items, including: Get the IP address of the program-controlled instrument; Get the setting output of the program-controlled instrument; Get the serial port information of the program-controlled instrument; Get the model and IP address of the signal acquisition module.
5. The method according to claim 2, characterized in that: Perform testing tasks, including: Check the connectivity between the host computer and the program-controlled instrument; Check the connectivity between the host computer and the MCU test circuit board; Check the connectivity between the host computer and the acquisition module; Execute all test items in sequence; Displays test execution information for a test item.
6. The method according to claim 5, characterized in that Execute all tests in order, including: According to the configuration information, the SCIP command is sent to the program-controlled instrument, and the program-controlled instrument outputs the power signal and waveform signal to the single-chip circuit board. The circuit board inputs the stimulus to the digital-analog hybrid circuit to be tested, and the digital-analog hybrid circuit outputs the signal to the single-chip circuit board. The signal acquisition module collects the output signal of the single-chip circuit board.
7. The method according to claim 5, characterized in that Displays the test execution information of the test item, including: Display the execution step information of the test item, including the name of the executed test item and the test command; Displays the waveform signal output by the test item.
8. The method according to claim 2, characterized in that: Returns test data, including: The industrial computer receives the signal from the signal acquisition module.
9. The method according to claim 2, characterized in that: Calculate results and automatically generate test reports including: Calculate test results based on collected signals; Generate test reports for all test items; The printer prints a test report.